CD40109BQNSRQ1

CD40109B-Q1 SCHS380 A – JUNE 2010 – REVISED AUGUST 2011 www.ti.com CMOS QUAD LOW-TO-HIGH VOLTAGE SHIFTER Check for Samples: CD40109B-Q1 FEATURES 1 • • • • • • • • • • Qualified for Automotive Applications Independent of Power Supply Sequence Considerations – VCC Can Exceed VDD – Input Signals can Exceed Both VCC and VDD Up and Down Level-Shifting Capability Three-State Outputs With Separate Enable Controls Standardized Symmetrical Output Characteristics 100% Tested for Quiescent Current at 20 V Maximum Input Current: – 1 µA at 18 V Over Full Package-Temperature Range – 100 nA at 18 V and 25°C Noise Margin (Full Package-Temperature Range): – 1 V at VCC = 5 V, VDD = 10 V – 2 V at VCC = 10 V, VDD = 15 V 5-V, 10-V, and 15-V Parametric Ratings Meets All Requirements of JEDEC Tentative Standard No. 13B, "Standard specifications for • Description of 'B' Series CMOS Devices" Latch-Up Performance Meets 50 mA per JESD 78, Class I APPLICATIONS • • High-or-Low Level-Shifting With Three-State Outputs for Unidirectional or Bidirectional Bussing Isolation of Logic Subsystem Using Separate Power Supplies from Supply Sequencing, Supply Loss, and Supply Regulation Considerations NS PACKAGE (TOP VIEW) DESCRIPTION CD40109B contains four low-to-high-voltage level-shifting circuits. Each circuit will shift a low-voltage digital-logic input signal (A, B, C, D) with logical 1 = VCC and logical 0 = VSS to a high-voltage output signal (E, F, G, H) with logical 1 = VDD and logical 0 = VSS. The RCA-CD40109, unlike other low-to-high level-shifting circuits, does not require the presence of the high-voltage supply (VDD) before the application of either the low-voltage supply (VCC) or the input signals. There are no restrictions on the sequence of application of VDD, VCC, or the input signals. In addition, with one exception there are no restrictions on the relative magnitudes of the supply voltages or input signals within the device maximum ratings, provided that the input signal swings between VSS and at least 0.7 VCC; VCC may exceed VDD, and input signals may exceed VCC and VDD. When operated in the mode VCC > VDD, the CD40109 will operate as a high-to-low level-shifter. The CD40109 also features individual three-state output capability. A low level on any of the separately enabled three-state output controls produces a high-impedance state in the corresponding output. ORDERING INFORMATION (1) PACKAGE (2) TA –40°C to 125°C (1) (2) SOIC – NS Reel of 2000 ORDERABLE PART NUMBER CD40109BQNSRQ1 TOP-SIDE MARKING CD40109BQ For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI web site at www.ti.com. Package drawings, thermal data, and symbolization are available at www.ti.com/packaging. 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2010–2011, Texas Instruments Incorporated CD40109B-Q1 SCHS380 A – JUNE 2010 – REVISED AUGUST 2011 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. TRUTH TABLE (1) INPUTS (1) OUTPUTS A, B, C, D ENABLE A, B, C, D E, F, G, H 0 1 0 1 1 1 X 0 Z 0 = VSS, 1 = VCC at inputs and VDD at outputs, X = Don't care, Z = High impedance Functional Diagram (1 of 4 Units) Logic Diagram (1 of 4 Units) 2 Copyright © 2010–2011, Texas Instruments Incorporated CD40109B-Q1 SCHS380 A – JUNE 2010 – REVISED AUGUST 2011 www.ti.com ABSOLUTE MAXIMUM RATINGS (1) over operating free-air temperature range (unless otherwise noted) VDD PD DC supply voltage range Voltages referenced to VSS terminal Output voltage range All outputs DC input current Power dissipation per package VALUE UNIT –0.5 to +20 V –0.5 to VDD + 0.5 V Any one input ±10 mA TA = –40°C to + 100°C 500 mW TA = 100°C to + 125°C Derate linearly at 12 mW/°C to 200 mW Device dissipation per output transistor (for TA = full package-temperature range, all package types) 100 mW °C TA Operating-temperature range –40 to +125 Tstg Storage temperature range –65 to +150 °C 50 mA Latch-Up Performance per JESD 78, Class I (1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. RECOMMENDED OPERATING CONDITIONS VDD Supply-voltage range (for TA = full package-temperature range) MIN MAX 3 18 UNIT V STATIC ELECTRICAL CHARACTERISTICS CONDITIONS PARAMETER IDD Max IOL Min IOH Min VOL Max VOH Min IIN Max VO (V) Quiescent device current Output low (sink) current VIH Min –40 +85 +125 0, 5 5 1 30 0, 10 10 2 0, 15 15 4 +25 MIN TYP MAX 30 0.02 1 60 60 0.02 2 120 120 0.02 4 0.04 20 0, 20 20 20 600 600 0, 5 5 0.61 0.42 0.36 0.51 1 0.5 0, 10 10 1.5 1.1 0.9 1.3 2.6 1.5 0, 15 15 4 2.8 2.4 3.4 6.8 4.6 0, 5 5 –0.61 –0.42 –0.36 –0.51 –1 0, 5 5 –1.8 –1.3 –1.15 –1.6 –3.2 9.5 0, 10 10 –1.5 –1.1 –0.9 –1.3 –2.6 13.5 0, 15 15 –4 –2.8 –2.4 –3.4 –6.8 Output voltage: low-level Output voltage: high-level Input current Input high voltage VDD (V) 2.5 Output high (source) current Input low voltage VIN (V) 0.4 IOUT Max VIL Max LIMITS AT INDICATED TEMPERATURES (°C) 0, 5 5 0.05 0 0.05 10 0.05 0 0.05 0, 15 15 0.05 0 0.05 0, 5 5 4.95 0, 10 10 0, 15 15 0, 18 18 ±0.1 ±0.4 5 9.95 9.95 10 14.95 14.95 ±1 ±12 0, 18 18 1, 9 5 10 1.5 1.5, 13.5 10 15 3 1, 9 5 10 3.5 1.5, 13.5 10 15 7 Copyright © 2010–2011, Texas Instruments Incorporated ±1 ±12 µA mA 0, 10 4.95 UNIT V 15 ±10–5 ±0.1 µA –4 ±0.4 µA ±10 1.5 3 3.5 V 7 3 CD40109B-Q1 SCHS380 A – JUNE 2010 – REVISED AUGUST 2011 www.ti.com DYNAMIC ELECTRICAL CHARACTERISTICS TA = 25°C, Input tr/tf = 20 ns, CL = 50 pF, RL = 200 kΩ (unless otherwise noted) PARAMETER TEST CONDITIONS SHIFTING MODE L–H tPHL Propagation delay time, high-to-low level, data input to output H–L L–H tPLH Propagation delay time, low-to-high level, data input to output H–L tPHZ tPLZ tPZH tPZL Propagation delay time, 3-state disable, delay, output high to high impedance Propagation delay time, 3-state disable, delay, output low to high impedance Propagation delay time, 3-state disable, delay, output high impedance to high Propagation delay time, 3-state disable, delay, output high impedance to low L–H RL = 1 kΩ H–L L–H RL = 1 kΩ H–L L–H RL = 1 kΩ H–L L–H RL = 1 kΩ H–L L–H tTHL, tTLH Transition time H–L Ci 4 Input capacitance VCC (V) VDD (V) MIN MAX 5 10 300 600 5 15 220 440 10 15 180 360 10 5 250 500 15 5 250 500 15 10 120 240 5 10 130 260 5 15 120 240 10 15 70 140 10 5 230 460 15 5 230 460 15 10 80 160 5 10 60 120 150 5 15 75 10 15 35 70 10 5 200 400 15 5 200 400 15 10 40 80 5 10 370 740 5 15 300 600 10 15 250 500 10 5 250 500 15 5 250 500 15 10 130 260 5 10 320 640 5 15 230 460 10 15 180 360 10 5 300 600 15 5 300 600 15 10 130 260 5 10 100 200 5 15 80 160 10 15 40 80 10 5 200 400 15 5 200 400 15 10 40 80 5 10 50 100 5 15 40 80 10 15 40 80 10 5 100 200 15 5 100 200 15 10 50 100 5 7.5 Any input UNIT ns ns ns ns ns ns ns pF Copyright © 2010–2011, Texas Instruments Incorporated CD40109B-Q1 SCHS380 A – JUNE 2010 – REVISED AUGUST 2011 www.ti.com TYPICAL CHARACTERISTICS Figure 1. Typical Output Low (Sink) Current Characteristics Figure 2. Minimum Output Low (Sink) Current Characteristics Figure 3. Typical Output High (Source) Current Characteristics Figure 4. Minimum Output High (Source) Current Characteristics Figure 5. Typical Transition Time as a Function of Load Capacitance Figure 6. Typical High-to-Low Propagation Delay Time as a Function of Load Capacitance Copyright © 2010–2011, Texas Instruments Incorporated 5 CD40109B-Q1 SCHS380 A – JUNE 2010 – REVISED AUGUST 2011 www.ti.com TYPICAL CHARACTERISTICS (continued) 6 Figure 7. Typical Low-to-High Propagation Delay Time as a Function of Load Capacitance Figure 8. Typical Input Switching as a Function of High-Level Supply Voltage Figure 9. High-Level Supply Voltage vs Low-Level Supply Voltage Figure 10. Typical Dynamic Power Dissipation as a Function of Input Frequency Copyright © 2010–2011, Texas Instruments Incorporated CD40109B-Q1 SCHS380 A – JUNE 2010 – REVISED AUGUST 2011 www.ti.com PARAMETER MEASUREMENT INFORMATION Figure 11. Output Enable Delay Times Test Circuit and Waveforms Figure 12. Quiescent Device Current Test Circuit Figure 13. Input Voltage Test Circuit Figure 14. Input Current Test Circuit Figure 15. Dynamic Power Dissipation Test Circuit Copyright © 2010–2011, Texas Instruments Incorporated 7 CD40109B-Q1 SCHS380 A – JUNE 2010 – REVISED AUGUST 2011 Note: www.ti.com Dimensions in parentheses are in millimeters and are derived from the basic inch dimensions as indicated. Grid graduations are in mils (10–3 inch). Figure 16. Dimensions and Pad Layout 8 Copyright © 2010–2011, Texas Instruments Incorporated PACKAGE OPTION ADDENDUM www.ti.com 10-Dec-2020 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan (2) Lead finish/ Ball material MSL Peak Temp Op Temp (°C) (3) Device Marking (4/5) (6) CD40109BQNSRQ1 ACTIVE SO NS 16 2000 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 125 CD40109BQ (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of