CD54HC367, CD74HC367, CD54HCT367
CD74HCT367, CD54HC368, CD74HC368, CD74HCT368
SCHS181E – NOVEMBER 1997 – REVISED FEBRUARY 2022
CDx4HC367, CDx4HC368, CDx4HCT367, CD74HCT368 High-Speed CMOS Logic Hex
Buffer/Line Driver, Three-State Non-Inverting and Inverting
1 Features
2 Description
•
•
•
•
The ’HC367, ’HCT367, ’HC368, and CD74HCT368
silicon gate CMOS three-state buffers are general
purpose high-speed non-inverting and inverting
buffers. The ’HC367 and ’HCT367 are non-inverting
buffers, whereas the ’HC368 and CD74HCT368 are
inverting buffers. They have high drive current outputs
which enable high speed operation even when driving
large bus capacitances. These circuits possess the
low power dissipation of CMOS circuitry, yet have
speeds comparable to low power Schottky TTL
circuits. Both circuits are capable of driving up to 15
low power Schottky inputs.
•
•
•
•
•
•
Buffered inputs
High current bus driver outputs
Two independent three-state enable controls
Typical propagation delay tPLH, tPHL = 8 ns
at VCC = 5 V, CL =15 pF, TA = 25℃
Fanout (over temperature range)
– Standard outputs: 10 LSTTL Loads
– Bus driver outputs: 15 LSTTL Loads
Wide operating temperature range: -55℃ to 125℃
Balanced propagation delay and transition times
Significant power reduction compared to LSTTL
Logic ICs
HC Types
– 2 V to 6 V operation
– High noise immunity: NIL = 30%,
NIH = 30% of VCC at VCC = 5 V
HCT Types
– 4.5 V to 5.5 V operation
– Direct LSTTL input logic compatibility,
VIL = 0.8 V (Max), VIH = 2 V (Min)
– CMOS input compatibility, II ≤ 1 μA at VOL, VOH
Device Information
PACKAGE
BODY SIZE (NOM)
CD74HC367M
SOIC (16)
9.90 mm × 3.90 mm
CD74HC368M
SOIC (16)
9.90 mm × 3.90 mm
CD74HCT367M
SOIC (16)
9.90 mm × 3.90 mm
CD74HCT368M
SOIC (16)
9.90 mm × 3.90 mm
CD74HC367E
PDIP (16)
19.31 mm × 6.35 mm
CD74HC368E
PDIP (16)
19.31 mm × 6.35 mm
CD74HCT367E
PDIP (16)
19.31 mm × 6.35 mm
CD74HCT368E
PDIP (16)
19.31 mm × 6.35 mm
CD54HC367F3A
CDIP (16)
24.38 mm × 6.92 mm
CD54HC368F3A
CDIP (16)
24.38 mm × 6.92 mm
CD54HCT367F3A
CDIP (16)
24.38 mm × 6.92 mm
(1)
1OE
1A1
1A2
1A3
1A4
1
2OE
2
3
4
5
6
7
9
10
(1)
PART NUMBER
1Y1
2A1
1Y2
2A2
For all available packages, see the orderable addendum at
the end of the data sheet.
15
12
11
14
13
2Y1
2Y2
1Y3
1Y4
Functional Block Diagram
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
CD54HC367, CD74HC367, CD54HCT367
CD74HCT367, CD54HC368, CD74HC368, CD74HCT368
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SCHS181E – NOVEMBER 1997 – REVISED FEBRUARY 2022
Table of Contents
1 Features............................................................................1
2 Description.......................................................................1
3 Revision History.............................................................. 2
4 Pin Configuration and Functions...................................3
5 Specifications.................................................................. 4
5.1 Absolute Maximum Ratings........................................ 4
5.2 Recommended Operating Conditions.........................4
5.3 Thermal Information....................................................4
5.4 Electrical Characteristics.............................................5
5.5 Switching Characteristics............................................6
6 Parameter Measurement Information............................ 7
7 Detailed Description........................................................8
7.1 Overview..................................................................... 8
7.2 Functional Block Diagram........................................... 8
7.3 Device Functional Modes............................................8
8 Power Supply Recommendations..................................9
9 Layout...............................................................................9
9.1 Layout Guidelines....................................................... 9
10 Device and Documentation Support..........................10
10.1 Receiving Notification of Documentation Updates..10
10.2 Support Resources................................................. 10
10.3 Trademarks............................................................. 10
10.4 Electrostatic Discharge Caution..............................10
10.5 Glossary..................................................................10
11 Mechanical, Packaging, and Orderable
Information.................................................................... 10
3 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision D (October 2003) to Revision E (February 2022)
Page
• Updated the numbering, formatting, tables, figures, and cross-references throughout the document to reflect
modern data sheet standards............................................................................................................................. 1
2
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SCHS181E – NOVEMBER 1997 – REVISED FEBRUARY 2022
4 Pin Configuration and Functions
'HC367, 'HCT367
J, D, or N package
16-Pin CDIP, SOIC, PDIP
Top View
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'HC368, CD74HCT368
J, D, or N package
16-Pin CDIP, SOIC, PDIP
Top View
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SCHS181E – NOVEMBER 1997 – REVISED FEBRUARY 2022
5 Specifications
5.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)
MIN
MAX
-0.5
7
UNIT
VCC
Supply voltage range
IIK
Input clamp current
(VI < -0.5 V or VI > VCC + 0.5 V)
±20
mA
IOK
Output clamp current
(VO < -0.5 V or VO > VCC + 0.5 V)
±20
mA
IO
Continuous output current
(-0.5 V < VO < VCC + 0.5 V)
±35
mA
±50
mA
150
°C
150
°C
300
°C
Continuous current through VCC or GND
TJ
Junction temperature
Tstg
Storage temperature
-65
Lead Temperature (Soldering 10s)
(1)
V
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
5.2 Recommended Operating Conditions
TA
Temperature range
VCC
Supply voltage range
VI,VO
Input or output voltage
HC Types
HCT Types
MIN
MAX
UNIT
–55
125
℃
2
6
V
4.5
5.5
V
0
VCC
V
1000
ns
4.5 V
500
ns
6V
400
ns
2V
tt
Input rise and fall time
5.3 Thermal Information
THERMAL METRIC
RθJA
(1)
4
Junction-to-ambient thermal resistance
(1)
D (SOIC)
N (PDIP)
16 PINS
16 PINS
UNIT
73
67
°C/W
For more information about traditional and new thermal metrics, see the Semiconductor and IC package thermal metrics application
report.
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SCHS181E – NOVEMBER 1997 – REVISED FEBRUARY 2022
5.4 Electrical Characteristics
PARAMETER
TEST
CONDITIONS (2)
VCC
(V)
25℃
MIN
TYP
-40℃ to 85℃
MAX
MIN
-55℃ to 125℃
MAX
MIN
MAX
UNIT
HC TYPES
High level input
voltage
VIH
Low level input
voltage
VIL
High level output
voltage
VOH
High level output
voltage
Low level output
voltage
VOL
Low level output
voltage
II
Input leakage
current
ICC
Supply current
IOZ
Three-state leakage
current
2
1.5
1.5
1.5
V
4.5
3.15
3.15
3.15
V
6
4.2
4.2
4.2
V
2
0.5
0.5
0.5
V
4.5
1.35
1.35
1.35
V
6
1.8
1.8
1.8
V
IOH = – 20 μA
2
1.9
1.9
1.9
V
IOH = – 20 μA
4.5
4.4
4.4
4.4
V
IOH = – 20 μA
6
5.9
5.9
5.9
V
IOH = – 6 mA
4.5
3.98
3.84
3.7
V
IOH = – 7.8 mA
6
5.48
IOL = 20 μA
2
0.1
0.1
0.1
V
IOL = 20 μA
4.5
0.1
0.1
0.1
V
IOL = 20 μA
6
0.1
0.1
0.1
V
IOL = 6 mA
4.5
0.26
0.33
0.4
V
IOL = 7.8 mA
6
0.26
0.33
0.4
V
6
±0.1
±1
±1
μA
0
6
8
80
160
μA
VO = VCC or GND
6
±0.5
±5.0
±10
μA
5.34
5.2
V
HCT TYPES
VIH
High level input
voltage
4.5 to
5.5
VIL
Low level input
voltage
4.5 to
5.5
VOH
VOL
0.8
V
0.8
V
4.5
4.4
4.4
4.4
V
High level output
voltage
IOH = – 4 mA
4.5
3.98
3.84
3.7
V
Low level output
voltage
IOL = 20 μA
4.5
0.1
0.1
0.1
V
Low level output
voltage
IOL = 4 mA
4.5
0.26
0.33
0.4
V
VI = VCC to GND
5.5
±0.1
±1
±1
μA
8
80
160
μA
ICC
Supply current
(1)
(2)
0.8
2
IOH = – 20 μA
Input leakage
current
IOZ
2
High level output
voltage
II
ΔICC (1)
2
Additional supply
current per input pin
Three-state leakage
current
VI = VCC to GND
5.5
OE1 input held at
VCC – 2.1
4.5 to
5.5
100
216
270
294
All other inputs
held at VCC – 2.1
4.5 to
5.5
100
198
247.5
269.5
VO = VCC or GND
5.5
±0.5
±5.0
±10
μA
μA
For dual-supply systems theoretical worst case (VI = 2.4 V, VCC = 5.5 V) specification is 1.8 mA.
VI = VIH or VIL, unless otherwise noted.
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SCHS181E – NOVEMBER 1997 – REVISED FEBRUARY 2022
5.5 Switching Characteristics
Input tr, tf = 6 ns. Unless otherwise specified, CL = 50pF
PARAMETER
25℃
VCC (V)
TYP
MAX
-40℃ to
85℃
-55℃ to
125℃
MAX
MAX
UNIT
HC TYPES
Data to outputs
HC/HCT367
2
105
130
160
ns
4.5
21
26
32
ns
6
8(3)
18
24
27
ns
105
130
160
ns
21
26
32
ns
18
24
27
ns
2
150
190
225
ns
4.5
30
38
45
ns
2
Data to outputs
HC/HCT368
tpd
4.5
6
Output enable and disable to
outputs
tt
Output transition time
6
9(3)
12(3)
26
33
38
ns
2
60
75
90
ns
4.5
12
15
18
ns
6
10
13
15
ns
CI
Input capacitance
10
10
10
pF
CO
Three-state output capacitance
20
20
20
pF
Power dissipation
CPD
capacitance(1)
5
40
Data to outputs
HC/HCT367
4.5
9(3)
25
31
38
ns
Data to outputs
HC/HCT368
4.5
11(3)
30
38
45
ns
Output enable and disable to
outputs
4.5
14(3)
35
44
53
ns
tt
Output transition time
4.5
12
15
18
ns
CIN
Input capacitance
10
10
10
pF
CO
Three-state capacitance
20
20
20
pF
(2)
pF
HCT TYPES
tpd
CPD
(1)
(2)
(3)
6
Power dissipation
(2)
capacitance(1)
5
42
pF
CPD is used to determine the dynamic power consumption, per buffer.
PD = VCC 2 fi (CPD + CL) where fi = input frequency, CL = output load capacitance, VCC = supply voltage.
CL = 15 pF and VCC = 5 V.
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SCHS181E – NOVEMBER 1997 – REVISED FEBRUARY 2022
6 Parameter Measurement Information
tpd is the maximum between tPLH and tPHL
tt is the maximum between tTLH and tTHL
Figure 6-1. HC Transition Times and Propagation
Delay Times, Combination Logic
Figure 6-2. HCT Transition Times and Propagation
Delay Times, Combination Logic
Figure 6-3. HC Three-State Propagation Delay
Waveform
Figure 6-4. HCT Three-State Propagation Delay
Waveform
Note
Open drain waveforms tPLZ and tPZL are the same as those for three-state shown on the left. The test
circuit is Output RL = 1 kΩ to VCC, CL = 50 pF.
Figure 6-5. HC and HCT Three-State Propagation Delay Test Circuit
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SCHS181E – NOVEMBER 1997 – REVISED FEBRUARY 2022
7 Detailed Description
7.1 Overview
The ’HC367, ’HCT367, ’HC368, and CD74HCT368 silicon gate CMOS three-state buffers are general purpose
high-speed non-inverting and inverting buffers. They have high drive current outputs which enable high speed
operation even when driving large bus capacitances. These circuits possess the low power dissipation of CMOS
circuitry, yet have speeds comparable to low power Schottky TTL circuits. Both circuits are capable of driving up
to 15 low power Schottky inputs.
The ’HC367 and ’HCT367 are non-inverting buffers, whereas the ’HC368 and CD74HCT368 are inverting
buffers. These devices have two output enables, one enable (OE1) controls 4 gates and the other (OE2) controls
the remaining 2 gates.
The ’HCT367 and CD74HCT368 logic families are speed, function and pin compatible with the standard LS logic
family.
7.2 Functional Block Diagram
1
1OE
1A1
1A2
1A3
1A4
15
2OE
2
3
4
5
6
7
9
10
1Y1
2A1
1Y2
2A2
12
11
14
13
2Y1
2Y2
1Y3
1Y4
7.3 Device Functional Modes
Table 7-1. Truth Table(1)
INPUTS
OE
(1)
8
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OUTPUTS (Y)
A
HC/HCT367
HC/HCT368
L
L
L
H
L
H
H
L
H
X
(Z)
(Z)
H = High Voltage Level, L = Low Voltage Level, X = Don’t Care,
Z = High Impedance (OFF) State
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SCHS181E – NOVEMBER 1997 – REVISED FEBRUARY 2022
8 Power Supply Recommendations
The power supply can be any voltage between the minimum and maximum supply voltage rating located in the
Recommended Operating Conditions. Each VCC terminal should have a good bypass capacitor to prevent power
disturbance. A 0.1-μF capacitor is recommended for this device. It is acceptable to parallel multiple bypass caps
to reject different frequencies of noise. The 0.1-μF and 1-μF capacitors are commonly used in parallel. The
bypass capacitor should be installed as close to the power terminal as possible for best results.
9 Layout
9.1 Layout Guidelines
When using multiple-input and multiple-channel logic devices inputs must not ever be left floating. In many
cases, functions or parts of functions of digital logic devices are unused; for example, when only two inputs of a
triple-input AND gate are used or only 3 of the 4 buffer gates are used. Such unused input pins must not be left
unconnected because the undefined voltages at the outside connections result in undefined operational states.
All unused inputs of digital logic devices must be connected to a logic high or logic low voltage, as defined by the
input voltage specifications, to prevent them from floating. The logic level that must be applied to any particular
unused input depends on the function of the device. Generally, the inputs are tied to GND or VCC, whichever
makes more sense for the logic function or is more convenient.
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SCHS181E – NOVEMBER 1997 – REVISED FEBRUARY 2022
10 Device and Documentation Support
TI offers an extensive line of development tools. Tools and software to evaluate the performance of the device,
generate code, and develop solutions are listed below.
10.1 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on
Subscribe to updates to register and receive a weekly digest of any product information that has changed. For
change details, review the revision history included in any revised document.
10.2 Support Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
10.3 Trademarks
TI E2E™ is a trademark of Texas Instruments.
All trademarks are the property of their respective owners.
10.4 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
10.5 Glossary
TI Glossary
This glossary lists and explains terms, acronyms, and definitions.
11 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
10
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PACKAGE OPTION ADDENDUM
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14-Oct-2022
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
Samples
(4/5)
(6)
5962-9070601MEA
ACTIVE
CDIP
J
16
1
Non-RoHS
& Green
SNPB
N / A for Pkg Type
-55 to 125
5962-9070601ME
A
CD54HCT367F3A
CD54HC367F3A
ACTIVE
CDIP
J
16
1
Non-RoHS
& Green
SNPB
N / A for Pkg Type
-55 to 125
8500201EA
CD54HC367F3A
Samples
CD54HC368F3A
ACTIVE
CDIP
J
16
1
Non-RoHS
& Green
SNPB
N / A for Pkg Type
-55 to 125
5962-8681201EA
CD54HC368F3A
Samples
CD54HCT367F3A
ACTIVE
CDIP
J
16
1
Non-RoHS
& Green
SNPB
N / A for Pkg Type
-55 to 125
5962-9070601ME
A
CD54HCT367F3A
CD74HC367E
ACTIVE
PDIP
N
16
25
RoHS & Green
NIPDAU
N / A for Pkg Type
-55 to 125
CD74HC367E
Samples
CD74HC367M
ACTIVE
SOIC
D
16
40
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
HC367M
Samples
CD74HC367M96
ACTIVE
SOIC
D
16
2500
RoHS & Green
NIPDAU | SN
Level-1-260C-UNLIM
-55 to 125
HC367M
Samples
CD74HC367MT
ACTIVE
SOIC
D
16
250
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
HC367M
Samples
CD74HC368E
ACTIVE
PDIP
N
16
25
RoHS & Green
NIPDAU
N / A for Pkg Type
-55 to 125
CD74HC368E
Samples
CD74HC368M
ACTIVE
SOIC
D
16
40
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
HC368M
Samples
CD74HCT367E
ACTIVE
PDIP
N
16
25
RoHS & Green
NIPDAU
N / A for Pkg Type
-55 to 125
CD74HCT367E
Samples
CD74HCT367M
ACTIVE
SOIC
D
16
40
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
HCT367M
Samples
CD74HCT367M96
ACTIVE
SOIC
D
16
2500
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
HCT367M
Samples
CD74HCT367MT
ACTIVE
SOIC
D
16
250
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
HCT367M
Samples
CD74HCT368E
ACTIVE
PDIP
N
16
25
RoHS & Green
NIPDAU
N / A for Pkg Type
-55 to 125
CD74HCT368E
Samples
CD74HCT368M
ACTIVE
SOIC
D
16
40
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
HCT368M
Samples
CD74HCT368M96
ACTIVE
SOIC
D
16
2500
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
HCT368M
Samples
CD74HCT368MT
ACTIVE
SOIC
D
16
250
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
HCT368M
Samples
Addendum-Page 1
Samples
Samples
PACKAGE OPTION ADDENDUM
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14-Oct-2022
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of