CD74HCT125, CD54HCT125
SCHS415 – JUNE 2020
CDx4HCT125 Quadruple Buffers with 3-State Outputs
1 Features
3 Description
•
This device contains four independent buffers with
3-state outputs. Each gate performs the Boolean
function Y = A in positive logic.
•
•
•
•
•
•
LSTTL input logic compatible
– VIL(max) = 0.8 V, VIH(min) = 2 V
CMOS input logic compatible
– II ≤ 1 µA at VOL, VOH
Buffered inputs
4.5 V to 5.5 V operation
Wide operating temperature range:
-55°C to +125°C
Supports fanout up to 10 LSTTL loads
Significant power reduction compared to LSTTL
logic ICs
Device Information(1)
PART NUMBER
PACKAGE
BODY SIZE (NOM)
CD74HCT125M
SOIC (14)
8.70 mm × 3.90 mm
CD74HCT125E
PDIP (14)
19.30 mm × 6.40 mm
CD54HCT125F
CDIP (14)
21.30 mm × 7.60 mm
(1)
For all available packages, see the orderable addendum at
the end of the data sheet.
2 Applications
•
Enable digital signals
1
14
VCC
2
13
4OE
3
4
12
11
4A
2A
5
10
3OE
2Y
6
7
9
8
1OE
1A
1Y
2OE
GND
4Y
3A
3Y
Functional pinout
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
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SCHS415 – JUNE 2020
Table of Contents
1 Features............................................................................1
2 Applications..................................................................... 1
3 Description.......................................................................1
4 Revision History.............................................................. 2
5 Pin Configuration and Functions...................................3
Pin Functions.................................................................... 3
6 Specifications.................................................................. 4
6.1 Absolute Maximum Ratings........................................ 4
6.2 Recommended Operating Conditions.........................4
6.3 Thermal Information....................................................4
6.4 Electrical Characteristics.............................................5
6.5 Switching Characteristics............................................5
6.6 Operating Characteristics........................................... 5
6.7 Typical Characteristics................................................ 5
7 Parameter Measurement Information............................ 7
8 Detailed Description........................................................8
8.1 Overview..................................................................... 8
8.2 Functional Block Diagram........................................... 8
8.3 Feature Description.....................................................8
8.4 Device Functional Modes............................................9
9 Application and Implementation.................................. 10
9.1 Application Information............................................. 10
9.2 Typical Application.................................................... 10
10 Power Supply Recommendations..............................12
11 Layout........................................................................... 13
11.1 Layout Guidelines................................................... 13
11.2 Layout Example...................................................... 13
12 Device and Documentation Support..........................14
12.1 Documentation Support.......................................... 14
12.2 Support Resources................................................. 14
12.3 Trademarks............................................................. 14
12.4 Electrostatic Discharge Caution..............................14
12.5 Glossary..................................................................14
13 Mechanical, Packaging, and Orderable
Information.................................................................... 14
4 Revision History
2
DATE
REVISION
NOTES
June 2020
*
Initial release. Moved the HCT devices from
the SCHS143 to a standalone data sheet.
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5 Pin Configuration and Functions
1
14
VCC
2
13
4OE
3
4
12
11
4A
2A
5
10
3OE
2Y
6
7
9
8
1OE
1A
1Y
2OE
GND
4Y
3A
3Y
Figure 5-1. D, N, or J Package 14-Pin SOIC, PDIP, or CDIP Top View
Pin Functions
PIN
NAME
NO.
I/O
DESCRIPTION
1 OE
1
Input
Channel 1, Output Enable, Active Low
1A
2
Input
Channel 1, Input A
1Y
3
Output
2 OE
4
Input
Channel 2, Output Enable, Active Low
2A
5
Input
Channel 2, Input A
2Y
6
Output
GND
7
—
3Y
8
Output
3A
9
Input
Channel 3, Input A
3 OE
10
Input
Channel 3, Output Enable, Active Low
4Y
11
Output
4A
12
Input
Channel 4, Input A
4 OE
13
Input
Channel 4, Output Enable, Active Low
VCC
14
—
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Channel 1, Output Y
Channel 2, Output Y
Ground
Channel 3, Output Y
Channel 4, Output Y
Positive Supply
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6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)
MIN
MAX
–0.5
7
UNIT
VCC
Supply voltage
IIK
Input clamp current(2)
VI < –0.5 V or VI > VCC +
0.5 V
±20
mA
IOK
Output clamp current(2)
VO < –0.5 V or VO > VCC +
0.5 V
±20
mA
IO
Continuous output current
VO > –0.5 V or VO < VCC +
0.5 V
±35
mA
±70
mA
Continuous current through VCC or GND
TJ
Junction
temperature(3)
Lead temperature (soldering 10s)
Tstg
(1)
(2)
(3)
SOIC - lead tips only
Storage temperature
–65
V
150
°C
300
°C
150
°C
Stresses beyond those listed under Absolute Maximum Rating may cause permanent damage to the device. These are stress
ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated
under Recommended Operating Condition. Exposure to absolute-maximum-rated conditions for extended periods may affect device
reliability.
The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
Guaranteed by design.
6.2 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN
VCC
Supply voltage
4.5
VIH
High-level input voltage
VCC = 4.5 V to 5.5 V
VIL
Low-level input voltage
VCC = 4.5 V to 5.5 V
NOM
MAX
UNIT
5.5
V
0.8
V
2
V
VI
Input voltage
0
VCC
V
VO
Output voltage
0
VCC
V
tt
Input transition time
TA
Operating free-air temperature
VCC = 4.5 V
500
VCC = 5.5 V
400
–55
125
ns
°C
6.3 Thermal Information
CD74HCT125
THERMAL
N (PDIP)
D (SOIC)
14 PINS
14 PINS
UNIT
RθJA
Junction-to-ambient thermal resistance
61.5
96.7
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
49.3
53.3
°C/W
RθJB
Junction-to-board thermal resistance
41.3
52.4
°C/W
ΨJT
Junction-to-top characterization parameter
28.9
15.8
°C/W
ΨJB
Junction-to-board characterization parameter
41.0
52.1
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
N/A
N/A
°C/W
(1)
4
METRIC(1)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
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6.4 Electrical Characteristics
over operating free-air temperature range; typical values measured at TA = 25°C (unless otherwise noted).
Operating free-air temperature (TA)
PARAMETER
TEST CONDITIONS
VCC
25°C
MIN
VOH
VOL
High-level
output voltage
IOH = –20
VI = VIH or µA
VIL
IOH = –4
mA
TYP
–40°C to 85°C
MAX
MIN
TYP
–55°C to 125°C
MAX
MIN
4.5 V
4.4
4.4
4.4
4.5 V
3.98
3.84
3.7
TYP
UNIT
MAX
V
IOL = 20
4.5 V
Low-level output VI = VIH or µA
voltage
VIL
IOL = 4 mA 4.5 V
0.1
0.1
0.1
0.26
0.33
0.4
5.5 V
±0.1
±1
±1
µA
V
II
Input leakage
current
VI = VCC
and GND
IOZ
Three-state
leakage current
VI = VIH or
VIL
5.5 V
±0.5
±5
±10
µA
ICC
Supply current
VI = VCC or
IO = 0
GND
5.5 V
8
80
160
µA
(1)
Additional
Quiescent
Device Current
Per Input Pin.
VI = VCC –
2.1
4.5 V
to 5.5
V
360
450
490
µA
Ci
Input
capacitance
10
10
10
pF
Co
Three-state
output
capacitance
20
20
20
pF
ΔICC
(1)
IO = 0
100
For dual-supply systems theoretical worst case (VI = 2.4 V, VCC = 5.5 V) specification is 1.8 mA.
6.5 Switching Characteristics
over operating free-air temperature range; typical values measured at TA = 25°C (unless otherwise noted).
PARAMETER
FROM
TO
tpd
Propagation delay
A
Y
ten
Enable delay
OE
Y
tdis
Disable delay
OE
Y
tt
Transition-time
Y
Operating free-air temperature (TA)
TEST
CONDITIO
NS
VCC
CL = 50 pF
4.5 V
CL = 15 pF
5V
CL = 50 pF
4.5 V
CL = 15 pF
5V
CL = 50 pF
4.5 V
CL = 15 pF
5V
CL = 50 pF
4.5 V
25°C
–40°C to 85°C
–55°C to 125°C
MIN TYP MAX
MIN TYP MAX
MIN TYP MAX
25
31
38
25
31
38
28
35
42
12
15
18
UNIT
ns
10
ns
10
ns
11
ns
6.6 Operating Characteristics
over operating free-air temperature range; typical values measured at TA = 25°C (unless otherwise noted).
PARAMETER
Cpd
TEST CONDITIONS
Power dissipation capacitance
No load
per gate
VCC
5V
MIN
TYP
34
MAX UNIT
pF
6.7 Typical Characteristics
TA = 25°C
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7
0.3
6
0.25
VOL Output Low Voltage (V)
VOH Output High Voltage (V)
SCHS415 – JUNE 2020
5
4
3
2
2-V
4.5-V
6-V
1
0
0.2
0.15
0.1
0.05
0
0
1
2
3
4
IOH Output High Current (mA)
5
6
Figure 6-1. Typical output voltage in the high state
(VOH)
6
2-V
4.5-V
6-V
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0
1
2
3
4
IOL Output Low Current (mA)
5
6
Figure 6-2. Typical output voltage in the low state
(VOL)
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7 Parameter Measurement Information
•
•
Phase relationships between waveforms were chosen arbitrarily. All input pulses are supplied by generators
having the following characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tt < 6 ns.
The outputs are measured one at a time, with one input transition per measurement.
VCC
Test
Point
90%
Input
10%
10%
S1
tr(1)
RL
From Output
Under Test
CL(1)
90%
S2
0V
tf(1)
VOH
90%
Output
10%
A.
VCC
90%
10%
tr(1)
CL= 50 pF and includes probe and jig capacitance.
A.
Figure 7-1. Load Circuit
tf(1)
VOL
tt is the greater of tr and tf.
Figure 7-2. Voltage Waveforms Transition Times
VCC
Output
Control
50%
50%
0V
tPZL(3)
Output
Waveform 1
S1 at VLOAD(1)
§ 9CC
50%
10%
VOL
tPZH(3)
Output
Waveform 2
S1 at GND(2)
A.
tPLZ(4)
tPHZ(4)
90%
VOH
50%
§0V
The maximum between tPLH and tPHL is used for tpd.
Figure 7-3. Voltage Waveforms Propagation Delays
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8 Detailed Description
8.1 Overview
This device contains four independent buffers with 3-state outputs. Each gate performs the Boolean function Y =
A in positive logic.
8.2 Functional Block Diagram
xOE
xA
xY
8.3 Feature Description
8.3.1 Balanced CMOS 3-State Outputs
A balanced output allows the device to sink and source similar currents. The drive capability of this device
may create fast edges into light loads so routing and load conditions should be considered to prevent ringing.
Additionally, the outputs of this device are capable of driving larger currents than the device can sustain without
being damaged. It is important for the output power of the device to be limited to avoid damage due to
over-current. The electrical and thermal limits defined in the Section 6.1 must be followed at all times.
The CD74HCT125 can drive a load with a total capacitance less than or equal to the maximum load listed in the
Section 6.5 connected to a high-impedance CMOS input while still meeting all of the datasheet specifications.
Larger capacitive loads can be applied, however it is not recommended to exceed the provided load value. If
larger capacitive loads are required, it is recommended to add a series resistor between the output and the
capacitor to limit output current to the values given in the Section 6.1.
3-State outputs can be placed into a high-impedance state. In this state, the output will neither source nor sink
current, and leakage current is defined by the IOZ specification in the Section 6.4. A pull-up or pull-down resistor
can be used to ensure that the output remains HIGH or LOW, respectively, during the high-impedance state.
8.3.2 TTL-Compatible CMOS Inputs
TTL-Compatible CMOS inputs are high impedance and are typically modeled as a resistor from the input to
ground in parallel with the input capacitance given in the Section 6.4. The worst case resistance is calculated
with the maximum input voltage, given in the Section 6.1, and the maximum input leakage current, given in the
Section 6.4, using ohm's law (R = V ÷ I).
Signals applied to the inputs need to have fast edge rates, as defined by Δt/Δv in the Section 6.2 to avoid
excessive current consumption and oscillations. If a slow or noisy input signal is required, a device with a
Schmitt-trigger input should be used to condition the input signal prior to the TTL-compatible CMOS input.
TTL-Compatible CMOS inputs have a lower threshold voltage than standard CMOS inputs to allow for
compatibility with older bipolar logic devices. See the Section 6.2 for the valid input voltages for the
CD74HCT125.
8
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8.3.3 Clamp Diode Structure
The inputs and outputs to this device have both positive and negative clamping diodes as depicted in Figure 8-1.
CAUTION
Voltages beyond the values specified in the Section 6.1 table can cause damage to the device.
The recommended input and output voltage ratings may be exceeded if the input and output clampcurrent ratings are observed.
Device
VCC
+IIK
+IOK
Logic
Input
-IIK
Output
-IOK
GND
Figure 8-1. Electrical Placement of Clamping Diodes for Each Input and Output
8.4 Device Functional Modes
Table 8-1. Function Table
INPUTS
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OUTPUT
OE
A
Y
L
H
H
L
L
L
H
X
Z
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9 Application and Implementation
Note
Information in the following applications sections is not part of the TI component specification,
and TI does not warrant its accuracy or completeness. TI’s customers are responsible for
determining suitability of components for their purposes, as well as validating and testing their design
implementation to confirm system functionality.
9.1 Application Information
In this application, a 3-state buffer is used to enable or disable a data connection as shown in Figure 9-1. It
is common to see all four channels of a device used together for controlling a 4-bit data bus, however each
channel of the device can be used independently. Unused channels should have the inputs terminated at ground
or VCC and the output left unconnected.
When the output of the device is active, the data signal will be replicated at the output. When the output of
the device is disabled, the output will be in a high-impedance state, and the output voltage will be determined
by the circuit connected to the output pin. This circuit is most commonly used when a bus must be completely
disabled. One example of this situation is when the circuitry connected to the output is to be powered off for an
extended period of time to save system power, and the inputs to that circuitry cannot have a voltage present due
to protective clamp diodes.
9.2 Typical Application
System
Controller
OE
Data
A
Y
Output
Figure 9-1. Typical application schematic
9.2.1 Design Requirements
9.2.1.1 Power Considerations
Ensure the desired supply voltage is within the range specified in the Section 6.2. The supply voltage sets the
device's electrical characteristics as described in the Section 6.4.
The supply must be capable of sourcing current equal to the total current to be sourced by all outputs of the
CD74HCT125 plus the maximum supply current, ICC, listed in the Section 6.4. The logic device can only source
or sink as much current as it is provided at the supply and ground pins, respectively. Be sure not to exceed the
maximum total current through GND or VCC listed in the Section 6.1.
Total power consumption can be calculated using the information provided in CMOS Power Consumption and
Cpd Calculation.
Thermal increase can be calculated using the information provided in Thermal Characteristics of Standard Linear
and Logic (SLL) Packages and Devices.
CAUTION
The maximum junction temperature, TJ(max) listed in the Section 6.1, is an additional limitation to
prevent damage to the device. Do not violate any values listed in the Section 6.1. These limits are
provided to prevent damage to the device.
10
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9.2.1.2 Input Considerations
Unused inputs must be terminated to either VCC or ground. These can be directly terminated if the input is
completely unused, or they can be connected with a pull-up or pull-down resistor if the input is to be used
sometimes, but not always. A pull-up resistor is used for a default state of HIGH, and a pull-down resistor is used
for a default state of LOW. The resistor size is limited by drive current of the controller, leakage current into the
CD74HCT125, as specified in the Section 6.4, and the desired input transition rate. A 10-kΩ resistor value is
often used due to these factors.
Refer to the Section 8.3 for additional information regarding the inputs for this device.
9.2.1.3 Output Considerations
The positive supply voltage is used to produce the output HIGH voltage. Drawing current from the output will
decrease the output voltage as specified by the VOH specification in the Section 6.4. Similarly, the ground voltage
is used to produce the output LOW voltage. Sinking current into the output will increase the output voltage as
specified by the VOL specification in the Section 6.4.
Unused outputs can be left floating. Do not connect outputs directly to VCC or ground.
Refer to Section 8.3 for additional information regarding the outputs for this device.
9.2.2 Detailed Design Procedure
1. Add a decoupling capacitor from VCC to GND. The capacitor needs to be placed physically close to the
device and electrically close to both the VCC and GND pins. An example layout is shown in the Section 11.
2. Ensure the capacitive load at the output is ≤ 70 pF. This is not a hard limit, however it will ensure
optimal performance. This can be accomplished by providing short, appropriately sized traces from the
CD74HCT125 to the receiving device.
3. Ensure the resistive load at the output is larger than (VCC / IO(max)) Ω. This will ensure that the maximum
output current from the Section 6.1 is not violated. Most CMOS inputs have a resistive load measured in
megaohms; much larger than the minimum calculated above.
4. Thermal issues are rarely a concern for logic gates, however the power consumption and thermal increase
can be calculated using the steps provided in the application report, CMOS Power Consumption and Cpd
Calculation
9.2.3 Application Curves
OE
Data
Output
Figure 9-2. Typical application timing diagram
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10 Power Supply Recommendations
The power supply can be any voltage between the minimum and maximum supply voltage rating located in
the Section 6.2. Each VCC terminal should have a bypass capacitor to prevent power disturbance. A 0.1-μF
capacitor is recommended for this device. It is acceptable to parallel multiple bypass caps to reject different
frequencies of noise. The 0.1-μF and 1-μF capacitors are commonly used in parallel. The bypass capacitor
should be installed as close to the power terminal as possible for best results, as shown in Figure 11-1.
12
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11 Layout
11.1 Layout Guidelines
When using multiple-input and multiple-channel logic devices inputs must not ever be left floating. In many
cases, functions or parts of functions of digital logic devices are unused; for example, when only two inputs of
a triple-input AND gate are used. Such unused input pins must not be left unconnected because the undefined
voltages at the outside connections result in undefined operational states. All unused inputs of digital logic
devices must be connected to a logic high or logic low voltage, as defined by the input voltage specifications, to
prevent them from floating. The logic level that must be applied to any particular unused input depends on the
function of the device. Generally, the inputs are tied to GND or VCC, whichever makes more sense for the logic
function or is more convenient.
11.2 Layout Example
GND VCC
Recommend GND flood fill for
improved signal isolation, noise
reduction, and thermal dissipation
0.1 F
Avoid 90°
corners for
signal lines
Bypass capacitor
placed close to the
device
1OE
1
14
VCC
1A
2
13
4OE
1Y
3
12
4A
2OE
4
11
4Y
2A
5
10
3OE
2Y
6
9
3A
GND
7
8
3Y
Unused
inputs tied
to VCC
Unused
output left
floating
Figure 11-1. Example layout for the CD74HCT125
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12 Device and Documentation Support
12.1 Documentation Support
12.1.1 Related Documentation
For related documentation see the following:
• HCMOS Design Considerations
• CMOS Power Consumption and CPD Calculation
• Designing with Logic
12.2 Support Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
12.3 Trademarks
TI E2E™ is a trademark of Texas Instruments.
All trademarks are the property of their respective owners.
12.4 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
12.5 Glossary
TI Glossary
This glossary lists and explains terms, acronyms, and definitions.
13 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
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PACKAGE OPTION ADDENDUM
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17-Jun-2022
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
Samples
(4/5)
(6)
CD54HCT125F3A
ACTIVE
CDIP
J
14
1
Non-RoHS
& Green
SNPB
N / A for Pkg Type
-55 to 125
CD54HCT125F3A
Samples
CD74HCT125E
ACTIVE
PDIP
N
14
25
RoHS & Green
NIPDAU
N / A for Pkg Type
-55 to 125
CD74HCT125E
Samples
CD74HCT125M
ACTIVE
SOIC
D
14
50
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
HCT125M
Samples
CD74HCT125M96
ACTIVE
SOIC
D
14
2500
RoHS & Green
NIPDAU | SN
Level-1-260C-UNLIM
-55 to 125
HCT125M
Samples
CD74HCT125M96E4
ACTIVE
SOIC
D
14
2500
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
HCT125M
Samples
CD74HCT125MT
ACTIVE
SOIC
D
14
250
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
HCT125M
Samples
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
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