CD54HC374, CD74HC374, CD54HCT374, CD74HCT374, CD54HC574, CD74HC574, CD54HCT574,
CD74HCT574
SCHS183E – NOVEMBER 1998 – REVISED OCTOBER 2022
CDx4HC374 High-Speed CMOS Logic Octal D-Type
Flip-Flop, 3-State Positive-Edge Triggered
1 Features
2 Description
•
•
•
•
•
The ’HC374, ’HCT374, ’HC574, and ’HCT574 are
octal D-type flip-flops with 3-state outputs and the
capability to drive 15 LSTTL loads. The eight edgetriggered flip-flops enter data into their registers on
the LOW to HIGH transition of clock (CP). The
output enable (OE) controls the 3-state outputs and
is independent of the register operation. When OE is
HIGH, the outputs are in the high-impedance state.
The 374 and 574 are identical in function and differ
only in their pinout arrangements.
•
•
•
•
•
•
Buffered inputs
Common three-state output enable control
Three-state outputs
Bus line driving capability
Typical propagation delay (clock to Q) = 15 ns at
VCC = 5 V, CL = 15 pF, TA = 25℃
Fanout (over temperature range)
– Standard outputs: 10 LSTTL loads
– Bus driver outputs: 15 LSTTL loads
Wide operating temperature range: –55℃ to 125℃
Balanced propagation delay and transition times
Significant power reduction compared to LSTTL
Logic ICs
HC types
– 2-V to 6-V operation
– High noise immunity: NIL = 30%, NIH = 30% of
VCC at VCC = 5 V
HCT types
– 4.5-V to 5.5-V Operation
– Direct LSTTL input logic compatibility,
VIL = 0.8 V (max), VIH = 2 V (min)
– CMOS input compatibility, II ≤ 1μA at VOL, VOH
Device Information
(1)
PART NUMBER
PACKAGE
BODY SIZE (NOM)
CD54HC374F3A
CDIP (20)
26.92 mm × 6.92 mm
CD54HC574F
CDIP (20)
26.92 mm × 6.92 mm
CD54HCT374F3A
CDIP (20)
26.92 mm × 6.92 mm
CD54HCT574F
CDIP (20)
26.92 mm × 6.92 mm
CD74HC374M
SOIC (20)
12.80 mm × 7.50 mm
CD74HC574M
SOIC (20)
12.80 mm × 7.50 mm
CD74HCT374M
SOIC (20)
12.80 mm × 7.50 mm
CD74HCT574M
SOIC (20)
12.80 mm × 7.50 mm
CD74HC374E
PDIP (20)
25.40 mm × 6.35 mm
CD74HC574E
PDIP (20)
25.40 mm × 6.35 mm
CD74HCT374E
PDIP (20)
25.40 mm × 6.35 mm
CD74HCT574E
PDIP (20)
25.40 mm × 6.35 mm
CD74HCT574PWR
TSSOP (20)
6.50 mm × 4.40 mm
(1)
For all available packages, see the orderable addendum at
the end of the data sheet.
Functional Diagram
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
CD54HC374, CD74HC374, CD54HCT374, CD74HCT374, CD54HC574, CD74HC574, CD54HCT574,
CD74HCT574
SCHS183E – NOVEMBER 1998 – REVISED OCTOBER 2022
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Table of Contents
1 Features............................................................................1
2 Description.......................................................................1
3 Revision History.............................................................. 2
4 Pin Configuration and Functions...................................3
5 Specifications.................................................................. 4
5.1 Absolute Maximum Ratings........................................ 4
5.2 Recommended Operating Conditions.........................4
5.3 Thermal Information....................................................4
5.4 Electrical Characteristics.............................................5
5.5 Prerequisite for Switching Characteristics.................. 6
5.6 Switching Characteristics ...........................................7
6 Parameter Measurement Information............................ 8
7 Detailed Description......................................................10
7.1 Overview................................................................... 10
7.2 Functional Block Diagram......................................... 10
7.3 Device Functional Modes..........................................10
8 Power Supply Recommendations................................11
9 Layout............................................................................. 11
9.1 Layout Guidelines..................................................... 11
10 Device and Documentation Support..........................12
10.1 Receiving Notification of Documentation Updates..12
10.2 Support Resources................................................. 12
10.3 Trademarks............................................................. 12
10.4 Electrostatic Discharge Caution..............................12
10.5 Glossary..................................................................12
11 Mechanical, Packaging, and Orderable
Information.................................................................... 12
3 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision D (January 2022) to Revision E (October 2022)
Page
• Increased RθJA for packages: DW (58 to 109.1); N ( 69 to 84.6); PW (83 to 131.8)......................................... 4
Changes from Revision C (May 2004) to Revision D (January 2022)
Page
• Updated the numbering, formatting, tables, figures, and cross-refrences throughout the document to reflect
modern data sheet standards............................................................................................................................. 1
2
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CD74HCT574
SCHS183E – NOVEMBER 1998 – REVISED OCTOBER 2022
4 Pin Configuration and Functions
HC(T) 374
J, DW, or N package
20-Pin CDIP, SOIC, or PDIP
Top View
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HC(T) 574
J, DW, N, or PW package
20-Pin CDIP, SOIC, PDIP, or TSSOP
Top View
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SCHS183E – NOVEMBER 1998 – REVISED OCTOBER 2022
5 Specifications
5.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)
(1)
MIN
MAX
– 0.5
7
UNIT
VCC
Supply voltage
V
IIK
Input diode current
For VI < –0.5 V or VI > VCC + 0.5 V
±20
mA
IOK
Output diode current
For VO < –0.5 V or VO > VCC + 0.5 V
±20
mA
IO
Drain current, per output
For –0.5 V < VO < VCC + 0.5 V
±35
mA
IO
Output source or sink current per output pin
For VO > –0.5 V or VO < VCC + 0.5 V
±25
mA
Continuous current through VCC or ground current
±50
mA
TJ
Junction temperature
150
°C
Tstg
Storage temperature range
150
°C
300
°C
– 65
Lead temperature (Soldering 10s) (SOIC - Lead Tips Only)
(1)
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
5.2 Recommended Operating Conditions
MIN
VCC
Supply voltage range
VI, VO
DC input or output voltage
HC types
HCT types
MAX
2
6
4.5
5.5
0
VCC
2V
Input rise and fall time
TA
UNIT
V
V
1000
4.5 V
500
6V
400
Temperature range
–55
125
ns
℃
5.3 Thermal Information
THERMAL METRIC
N (PDIP)
PW (TSSOP)
20 PINS
20 PINS
20 PINS
UNIT
109.1
84.6
131.8
°C/W
76
72.5
72.2
°C/W
RθJA
Junction-to-ambient thermal resistance
RθJC(top)
Junction-to-case (top) thermal resistance
RθJB
Junction-to-board thermal resistance
77.6
65.3
82.8
°C/W
ψJT
Junction-to-top characterization
parameter
51.5
55.3
21.5
°C/W
ψJB
Junction-to-board characterization
parameter
77.1
65.2
82.4
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal
resistance
N/A
N/A
N/A
°C/W
(1)
4
(1)
DW (SOIC)
For more information about traditional and new thermal metrics, see the Semiconductor and IC package thermal metrics application
report.
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SCHS183E – NOVEMBER 1998 – REVISED OCTOBER 2022
5.4 Electrical Characteristics
PARAMETER
TEST
(2)
CONDITIONS
VCC
(V)
25℃
MIN
TYP
–40℃ to 85℃
MAX
MIN
MAX
–55℃ to 125℃
MIN
MAX
UNIT
HC TYPES
VIH
VIL
VOH
VOL
High level input voltage
Low level input voltage
2
1.5
1.5
1.5
4.5
3.15
3.15
3.15
6
4.2
4.2
V
4.2
2
0.5
0.5
0.5
4.5
1.35
1.35
1.35
6
1.8
1.8
1.8
High level output
voltage
CMOS loads
IOH = – 20 μA
2
1.9
1.9
1.9
IOH = – 20 μA
4.5
4.4
4.4
4.4
IOH = – 20 μA
6
5.9
5.9
5.9
High level output
voltage
TTL loads
IOH = – 6 mA
4.5
3.98
3.84
3.7
IOH = –7.8 mA
6
5.48
5.34
5.2
Low level output
voltage
CMOS loads
IOL = 20 μA
2
0.1
0.1
0.1
IOL = 20 μA
4.5
0.1
0.1
0.1
IOL = 20 μA
6
0.1
0.1
0.1
Low level output
voltage
TTL loads
IOL = 6 mA
4.5
0.26
0.33
0.4
IOL = 7.8 mA
6
0.26
0.33
0.4
V
V
V
V
V
II
Input leakage current
VI = VCC or GND
6
±0.1
±1
±1
μA
ICC
Quiescent device
current
VI = VCC or GND
6
8
80
160
μA
VIL or
VIH
Three-state leakage
current
VO = VCCor GND
6
±0.5
±5.0
±10
μA
HCT TYPES
VIH
High level input voltage
4.5 to
5.5
VIL
Low level input voltage
4.5 to
5.5
VOH
VOL
2
2
0.8
2
0.8
V
0.8
High level output
voltage
CMOS loads
IOH = – 20 μA
High level output
voltage
TTL loads
IOH = – 6 mA
4.5
Low level output
voltage
CMOS loads
IOL = 20 μA
4.5
Low level output
voltage
TTL loads
IOL = 6 mA
4.5
0.26
0.33
0.4
4.5
4.4
4.4
V
4.4
V
3.98
3.84
0.1
3.7
0.1
0.1
V
II
Input leakage current
VI = VCC or GND
5.5
±0.1
±1
±1
μA
ICC
Quiescent device
current
VI = VCC or GND
5.5
8
80
160
μA
VIL or
VIH
Three-state leakage
current
VO = VCCor GND
6
±0.5
±5.0
±10
μA
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SCHS183E – NOVEMBER 1998 – REVISED OCTOBER 2022
5.4 Electrical Characteristics (continued)
TEST
(2)
CONDITIONS
PARAMETER
HCT374
Additional quiescent
device current per
input pin
ΔICC
(1)
(2)
MIN
D0 - D7 inputs held 4.5 to
at VCC – 2.1
5.5
–40℃ to 85℃
MIN
–55℃ to 125℃
MAX
MIN
MAX
UNIT
TYP
MAX
100
108
135
147
μA
CP input held at
VCC – 2.1
4.5 to
5.5
100
324
405
441
μA
OE input held at
VCC – 2.1
4.5 to
5.5
100
468
585
637
μA
D0 - D7 inputs held 4.5 to
at VCC – 2.1
5.5
100
144
180
196
μA
(1)
HCT574
Additional quiescent
device current per
input pin
25℃
VCC
(V)
CP input held at
VCC – 2.1
4.5 to
5.5
100
270
337.5
367.5
μA
OE input held at
VCC – 2.1
4.5 to
5.5
100
216
270
294
μA
For dual-supply systems, theoretical worst case (VI = 2.4 V, VCC = 5.5 V) specificationis 1.8mA.
VI = VIH or VIL, unless otherwise noted.
5.5 Prerequisite for Switching Characteristics
PARAMETER
VCC (V)
25℃
MIN
TYP
–40℃ to 85℃
MAX
MIN
TYP
–55℃ to 125℃
MAX
MIN
TYP
MAX
UNIT
HC TYPES
fMAX
tW
tSU
tH
Maximum clock frequency
Clock pulse width
Setup time data to clock
Hold time data to clock
2
6
5
4
4.5
30
25
20
6
35
29
23
2
80
100
120
4.5
16
20
24
6
14
17
20
2
60
75
90
4.5
12
15
18
6
10
13
15
2
5
5
5
4.5
5
5
5
6
5
5
5
MHz
ns
ns
ns
HCT TYPES
6
fMAX
Maximum clock frequency
4.5
30
25
20
MHz
tW
Clock pulse width
4.5
16
20
24
ns
tSU
Setup time data to clock
4.5
12
15
18
ns
tH
Hold time data to clock
4.5
5
5
5
ns
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SCHS183E – NOVEMBER 1998 – REVISED OCTOBER 2022
5.6 Switching Characteristics
CL = 50 pF, Input tr, tf = 6 ns
PARAMETER
TEST
VCC (V)
CONDITIONS
25℃
MIN
TYP
–40℃ to 85℃ –55℃ to 125℃
MAX
MIN
MAX
MIN
MAX
UNIT
HC TYPES
tPLH,
tPHL
tPLZ,
tPHZ
tPZL,
tPZH
CL = 50 pF
Propagation delay
Clock to output
205
250
33
41
50
CL = 15 pF
5
6
28
35
43
2
135
170
205
4.5
27
34
41
15
CL = 15 pF
5
CL = 50 pF
6
23
29
35
2
150
190
225
4.5
30
38
45
26
33
38
CL = 50 pF
Output enable to Q
165
CL = 50 pF
CL = 50 pF
Output disable to Q
2
4.5
CL = 15 pF
5
CL = 50 pF
6
11
12
60
ns
ns
ns
ns
ns
ns
fMAX
Maximum clock frequency
CL = 15 pF
5
2
60
75
90
tTHL,
tTLH
Output transition time
CL = 50 pF
4.5
12
15
18
10
13
15
CI
Input capacitance
CL = 50 pF
10
10
10
pF
CO
Three-state output capacitance
20
20
20
pF
CPD
Power dissipation capacitance(1) (2)
6
10
20
CL = 15 pF
5
CL = 50 pF
4.5
CL = 15 pF
5
CL = 50pF
4.5
CL = 15 pF
5
CL = 50 pF
4.5
CL = 15 pF
5
12
60
MHz
39
ns
pF
HCT TYPES
tPHL,
tPLH
Propagation delay
Clock to output
tPLZ,
tPHZ
Output disable to Q
tPZL,
tPZH
Output enable to Q
fMAX
Maximum clock frequency
CL = 15 pF
5
tTLH,
tTHL
Output transition time
CL = 50 pF
4.5
CI
Input capacitance
CL = 50 pF
CO
Three-state output capacitance
CPD
(1)
(2)
Power dissipation
capacitance(1) (2)
CL = 15 pF
5
33
41
50
28
35
42
30
38
45
15
11
ns
ns
ns
MHz
12
15
18
ns
10
10
10
10
pF
20
20
20
20
pF
47
pF
CPD is used to determine the dynamic power consumption, per package.
PD = CPD VCC 2 fi + Σ VCC 2 fO CL where fi = input frequency, fO = output frequency, CL = output load capacitance, VCC = supply voltage.
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SCHS183E – NOVEMBER 1998 – REVISED OCTOBER 2022
6 Parameter Measurement Information
Phase relationships between waveforms were chosen arbitrarily. All input pulses are supplied by generators
having the following characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tt < 6 ns.
For clock inputs, fmax is measured when the input duty cycle is 50%.
The outputs are measured one at a time with one input transition per measurement.
VCC
Test
Point
Test
Point
S1
RL
From Output
Under Test
CL(1)
From Output
Under Test
CL(1)
S2
(1) CL includes probe and test-fixture capacitance.
(1) CL includes probe and test-fixture capacitance.
Figure 6-2. Load Circuit for Push-Pull Outputs
Figure 6-1. Load Circuit for 3-State Outputs
VCC
Input
50%
VCC
Output
Control
50%
50%
50%
0V
0V
tPHL(1)
tPLH(1)
tPZL(3)
VOH
Output
50%
VOL
tPHL
(1)
tPLH
50%
50%
10%
VOL
(1)
tPZH
VOH
Output
§ 9CC
Output
Waveform 1
S1 at VLOAD(1)
50%
Output
Waveform 2
S1 at GND(2)
50%
VOL
(1) The greater between tPLH and tPHL is the same as tpd.
tPLZ(4)
(3)
tPHZ
(4)
90%
VOH
50%
§0V
(1) S1 = CLOSED; S2 = OPEN.
(2) S1 = OPEN; s2 = CLOSED.
(3) tPLZ and tPHZ are the same as tdis.
(4) tPZL and tPZH are the same as ten.
Figure 6-3. Voltage Waveforms, Propagation
Delays for Standard CMOS Inputs
Figure 6-4. Voltage Waveforms, Standard CMOS
Inputs Propagation Delays
90%
VCC
90%
Input
10%
10%
tr(1)
0V
tf(1)
90%
VOH
90%
Output
10%
10%
tr(1)
tf(1)
VOL
(1) The greater between tr and tf is the same as tt.
Figure 6-5. Voltage Waveforms, Input and Output Transition Times for Standard CMOS Inputs
8
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SCHS183E – NOVEMBER 1998 – REVISED OCTOBER 2022
3V
Input
1.3V
1.3V
3V
Input
1.3V
1.3V
0V
tPLH(1)
VOH
Output
Waveform 1
50%
50%
VOL
50%
VOL
(1) The greater between tPLH and tPHL is the same as tpd.
Figure 6-6. Voltage Waveforms, Propagation
Delays for TTL-Compatible Inputs
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Output
Waveform 2
S1 OPEN,
S2 CLOSED
tPLZ(2)
VCC
50%
10%
VOL
tPZH(1)
VOH
50%
Output
Waveform 1
S1 CLOSED,
S2 OPEN
tPLH(1)
tPHL(1)
Output
Waveform 2
0V
tPZL(1)
tPHL(1)
tPHZ(2)
90%
VOH
50%
0V
(1) tPLZ and tPHZ are the same as tdis.
(2) tPZL and tPZH are the same as ten.
Figure 6-7. Voltage Waveforms, TTL-Compatible
CMOS Inputs Propagation Delays
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7 Detailed Description
7.1 Overview
The ’HC374, ’HCT374, ’HC574, and ’HCT574 are octal D-type flip-flops with 3-state outputs and the capability
to drive 15 LSTTL loads. The eight edge-triggered flip-flops enter data into their registers on the LOW to HIGH
transition of clock (CP). The output enable (OE) controls the 3-state outputs and is independent of the register
operation. When OE is HIGH, the outputs are in the high-impedance state. The 374 and 574 are identical in
function and differ only in their pinout arrangements.
7.2 Functional Block Diagram
7.3 Device Functional Modes
Table 7-1. Truth Table(1)
INPUTS
(1)
10
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OUTPUT
OE
CP
Dn
Qn
L
↑
H
H
L
↑
L
L
L
L
X
Q0
H
X
X
Z
H = high level (steady state), L = low level (steady state), X =
don’t care, ↑ = transition from low to high level, Q0 = the level
of Q before the indicated steady-state input conditions were
established, Z= high impedance state
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SCHS183E – NOVEMBER 1998 – REVISED OCTOBER 2022
8 Power Supply Recommendations
The power supply can be any voltage between the minimum and maximum supply voltage rating located in
the Recommended Operating Conditions. Each VCC terminal should have a good bypass capacitor to prevent
power disturbance. A 0.1-μF capacitor is recommended for this device. It is acceptable to parallel multiple
bypass capacitors to reject different frequencies of noise. The 0.1-μF and 1-μF capacitors are commonly used in
parallel. The bypass capacitor should be installed as close to the power terminal as possible for best results.
9 Layout
9.1 Layout Guidelines
When using multiple-input and multiple-channel logic devices, inputs must not ever be left floating. In many
cases, functions or parts of functions of digital logic devices are unused; for example, when only two inputs of a
triple-input AND gate are used or only 3 of the 4 buffer gates are used. Such unused input pins must not be left
unconnected because the undefined voltages at the outside connections result in undefined operational states.
All unused inputs of digital logic devices must be connected to a logic high or logic low voltage, as defined by the
input voltage specifications, to prevent them from floating. The logic level that must be applied to any particular
unused input depends on the function of the device. Generally, the inputs are tied to GND or VCC, whichever
makes more sense for the logic function or is more convenient.
Copyright © 2022 Texas Instruments Incorporated
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Product Folder Links: CD54HC374 CD74HC374 CD54HCT374 CD74HCT374 CD54HC574 CD74HC574
CD54HCT574 CD74HCT574
11
CD54HC374, CD74HC374, CD54HCT374, CD74HCT374, CD54HC574, CD74HC574, CD54HCT574,
CD74HCT574
SCHS183E – NOVEMBER 1998 – REVISED OCTOBER 2022
www.ti.com
10 Device and Documentation Support
TI offers an extensive line of development tools. Tools and software to evaluate the performance of the device,
generate code, and develop solutions are listed below.
10.1 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on
Subscribe to updates to register and receive a weekly digest of any product information that has changed. For
change details, review the revision history included in any revised document.
10.2 Support Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
10.3 Trademarks
TI E2E™ is a trademark of Texas Instruments.
All trademarks are the property of their respective owners.
10.4 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
10.5 Glossary
TI Glossary
This glossary lists and explains terms, acronyms, and definitions.
11 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
12
Submit Document Feedback
Copyright © 2022 Texas Instruments Incorporated
Product Folder Links: CD54HC374 CD74HC374 CD54HCT374 CD74HCT374 CD54HC574 CD74HC574
CD54HCT574 CD74HCT574
PACKAGE OPTION ADDENDUM
www.ti.com
15-Oct-2022
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
Samples
(4/5)
(6)
5962-8974201RA
ACTIVE
CDIP
J
20
1
Non-RoHS
& Green
SNPB
N / A for Pkg Type
-55 to 125
5962-8974201RA
CD54HCT574F3A
Samples
CD54HC374F3A
ACTIVE
CDIP
J
20
1
Non-RoHS
& Green
SNPB
N / A for Pkg Type
-55 to 125
8407101RA
CD54HC374F3A
Samples
CD54HC574F
ACTIVE
CDIP
J
20
1
Non-RoHS
& Green
SNPB
N / A for Pkg Type
-55 to 125
CD54HC574F
Samples
CD54HC574F3A
ACTIVE
CDIP
J
20
1
Non-RoHS
& Green
SNPB
N / A for Pkg Type
-55 to 125
CD54HC574F3A
Samples
CD54HCT374F3A
ACTIVE
CDIP
J
20
1
Non-RoHS
& Green
SNPB
N / A for Pkg Type
-55 to 125
8550701RA
CD54HCT374F3A
Samples
CD54HCT574F
ACTIVE
CDIP
J
20
1
Non-RoHS
& Green
SNPB
N / A for Pkg Type
-55 to 125
CD54HCT574F
Samples
CD54HCT574F3A
ACTIVE
CDIP
J
20
1
Non-RoHS
& Green
SNPB
N / A for Pkg Type
-55 to 125
5962-8974201RA
CD54HCT574F3A
Samples
CD74HC374E
ACTIVE
PDIP
N
20
20
RoHS & Green
NIPDAU
N / A for Pkg Type
-55 to 125
CD74HC374E
Samples
CD74HC374M
ACTIVE
SOIC
DW
20
25
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
HC374M
Samples
CD74HC374M96
ACTIVE
SOIC
DW
20
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
HC374M
Samples
CD74HC374M96E4
ACTIVE
SOIC
DW
20
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
HC374M
Samples
CD74HC574E
ACTIVE
PDIP
N
20
20
RoHS & Green
NIPDAU
N / A for Pkg Type
-55 to 125
CD74HC574E
Samples
CD74HC574M
ACTIVE
SOIC
DW
20
25
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
HC574M
Samples
CD74HC574M96
ACTIVE
SOIC
DW
20
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
HC574M
Samples
CD74HCT374E
ACTIVE
PDIP
N
20
20
RoHS &
Non-Green
NIPDAU
N / A for Pkg Type
-55 to 125
CD74HCT374E
Samples
CD74HCT374EE4
ACTIVE
PDIP
N
20
20
RoHS &
Non-Green
NIPDAU
N / A for Pkg Type
-55 to 125
CD74HCT374E
Samples
CD74HCT374M
ACTIVE
SOIC
DW
20
25
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
HCT374M
Samples
CD74HCT374M96
ACTIVE
SOIC
DW
20
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
HCT374M
Samples
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com
Orderable Device
15-Oct-2022
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
Samples
(4/5)
(6)
CD74HCT574E
ACTIVE
PDIP
N
20
20
RoHS &
Non-Green
NIPDAU
N / A for Pkg Type
-55 to 125
CD74HCT574E
Samples
CD74HCT574M
ACTIVE
SOIC
DW
20
25
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
HCT574M
Samples
CD74HCT574M96
ACTIVE
SOIC
DW
20
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
HCT574M
Samples
CD74HCT574ME4
ACTIVE
SOIC
DW
20
25
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
HCT574M
Samples
CD74HCT574PWR
ACTIVE
TSSOP
PW
20
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
HK574
Samples
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of