0
登录后你可以
  • 下载海量资料
  • 学习在线课程
  • 观看技术视频
  • 写文章/发帖/加入社区
创作中心
发布
  • 发文章

  • 发资料

  • 发帖

  • 提问

  • 发视频

创作活动
CDCVF855PW

CDCVF855PW

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    TSSOP28_9.7X4.4MM

  • 描述:

    IC PLL CLOCK DVR 2.5V 28-TSSOP

  • 数据手册
  • 价格&库存
CDCVF855PW 数据手册
CDCVF855 www.ti.com SCAS839A – APRIL 2007 – REVISED MAY 2007 2.5-V PHASE-LOCKED-LOOP CLOCK DRIVER FEATURES • • • • • • • • • • • • • • DESCRIPTION Spread-Spectrum Clock Compatible Operating Frequency: 60 MHz to 220 MHz Low Jitter (Cycle-Cycle): ±60 ps (±40 ps at 200 MHz) Low Static Phase Offset: ±50 ps Low Jitter (Period): ±60 ps (±30 ps at 200 MHz) 1-to-4 Differential Clock Distribution (SSTL2) Best in Class for VOX = VDD/2 ±0.1 V Operates From Dual 2.6-V or 2.5-V Supplies Available in a 28-Pin TSSOP Package Consumes < 100-µA Quiescent Current External Feedback Pins (FBIN, FBIN) Are Used to Synchronize the Outputs to the Input Clocks Meets/Exceeds JEDEC Standard (JESD82-1) For DDRI-200/266/333 Specification Meets/Exceeds Proposed DDRI-400 Specification (JESD82-1A) Enters Low-Power Mode When No CLK Input Signal Is Applied or PWRDWN Is Low APPLICATIONS • • DDR Memory Modules (DDR400/333/266/200) Zero-Delay Fan-Out Buffer The CDCVF855 is a high-performance, low-skew, low-jitter, zero-delay buffer that distributes a differential clock input pair (CLK, CLK) to 4 differential pairs of clock outputs (Y[0:3], Y[0:3]) and one differential pair of feedback clock outputs (FBOUT, FBOUT). The clock outputs are controlled by the clock inputs (CLK, CLK), the feedback clocks (FBIN, FBIN), and the analog power input (AVDD). When PWRDWN is high, the outputs switch in phase and frequency with CLK. When PWRDWN is low, all outputs are disabled to a high-impedance state (3-state) and the PLL is shut down (low-power mode). The device also enters this low-power mode when the input frequency falls below a suggested detection frequency that is below 20 MHz (typical 10 MHz). An input frequency-detection circuit detects the low-frequency condition and, after applying a >20-MHz input signal, this detection circuit turns the PLL on and enables the outputs. When AVDD is strapped low, the PLL is turned off and bypassed for test purposes. The CDCVF855 is also able to track spread-spectrum clocking for reduced EMI. Because the CDCVF855 is based on PLL circuitry, it requires a stabilization time to achieve phase-lock of the PLL. This stabilization time is required following power up. The CDCVF855 is characterized for both commercial and industrial temperature ranges. AVAILABLE OPTIONS TA TSSOP (PW) –40°C to 85°C CDCVF855PW Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2007, Texas Instruments Incorporated CDCVF855 www.ti.com SCAS839A – APRIL 2007 – REVISED MAY 2007 FUNCTION TABLE (Select Functions) INPUTS OUTPUTS PLL AVDD PWRDWN CLK CLK Y[0:3] Y[0:3] FBOUT FBOUT GND H L H L H L H Bypassed/off GND H H L H L H L Bypassed/off X L L H Z Z Z Z Off X L H L Z Z Z Z Off 2.5 V (nom) H L H L H L H On 2.5 V (nom) H H L H L H L On 2.5 V (nom) X VDDQ ±50 mA IO Continuous output current VO = 0 to VDDQ IDDS Continuous current to GND or VDDQ Tstg Storage temperature range (1) (2) (3) 0.5 V to 3.6 V –0.5 V to VDDQ + 0.5 V –0.5 V to VDDQ + 0.5 V ±50 mA ±100 mA –65°C to 150°C Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed. This value is limited to 3.6 V maximum. THERMAL CHARACTERISTICS RθJA for TSSOP Package (1) (1) Airflow High K 0 ft/min (0 m/min) 94.4°C/W 150 ft/min (45.72 m/min) 82.8°C/W The package thermal impedance is calculated in accordance with JESD 51. Submit Documentation Feedback 3 CDCVF855 www.ti.com SCAS839A – APRIL 2007 – REVISED MAY 2007 RECOMMENDED OPERATING CONDITIONS MIN VDDQ PC1600 – PC3200 Supply voltage VIL Low-level input voltage VIH High-level input voltage AVDD MAX 2.3 2.7 VDDQ – 0.12 2.7 CLK, CLK, FBIN, FBIN VDDQ/2 – 0.18 PWRDWN –0.3 CLK, CLK, FBIN, FBIN DC CLK, FBIN Differential input signal voltage (2) AC CLK, FBIN 0.7 VDDQ/2 + 0.18 PWRDWN DC input signal voltage (1) VID NOM 1.7 VDDQ + 0.3 –0.3 VDDQ + 0.3 VDDQ = 2.3 V – 2.7V 0.36 VDDQ + 0.6 VDDQ = 2.425 V – 2.7 V 0.25 VDDQ + 0.6 0.7 VDDQ + 0.6 0.49 VDDQ + 0.6 VDDQ/2 – 0.2 VDDQ/2 + 0.2 VDDQ = 2.3 V – 2.7 V VDDQ = 2.425 V – 2.7 V UNIT V V V V V VIX Input differential pair cross voltage (3) (4) IOH High-level output current –12 IOL Low-level output current 12 mA SR Input slew rate 1 4 V/ns TA Operating free-air temperature –40 85 °C (1) (2) (3) (4) V mA The unused inputs must be held high or low to prevent them from floating. The dc input signal voltage specifies the allowable dc execution of the differential input. The differential input signal voltage specifies the differential voltage |VTR – VCP| required for switching, where VTR is the true input level and VCP is the complementary input level. The differential cross-point voltage is expected to track variations of VCC and is the voltage at which the differential signals must cross. ELECTRICAL CHARACTERISTICS over recommended operating free-air temperature range (unless otherwise noted) PARAMETER VIK Input voltage, all inputs VOH High-level output voltage VOL Low-level output voltage VOD Output voltage swing (2) MIN TYP (1) VDDQ = 2.3 V, II = –18 mA VDDQ = min to max, IOH = –1 mA VDDQ = 2.3 V, IOH = –12 mA MAX UNIT –1.2 V VDDQ – 0.1 V 1.7 VDDQ = min to max, IOL = 1 mA 0.1 VDDQ = 2.3 V, IOL = 12 mA 0.6 1.1 V VDDQ – 0.4 V VDDQ/2 + 0.1 V (3) Differential outputs are terminated with 120 Ω, CL = 14 pF (See Figure 3) II Input current VDDQ = 2.7 V, VI = 0 V to 2.7 V ±10 µA IOZ High-impedance-state output current VDDQ = 2.7 V, VO = VDDQ or GND ±10 µA IDDPD Power-down current on VDDQ + AVDD CLK and CLK = 0 MHz; PWRDWN = Low; Σ of IDD and AIDD 100 µA AIDD Supply current on AVDD CI Input capacitance Output differential cross-voltage VOX (1) (2) (3) 4 TEST CONDITIONS VDDQ/2 – 0.1 VDDQ/2 20 fO = 170 MHz 6 8 fO = 200 MHz 8 10 2.5 3.5 VDDQ = 2.5 V, VI = VDDQ or GND 2 mA pF All typical values are at a nominal VDDQ. The differential output signal voltage specifies the differential voltage |VTR – VCP|, where VTR is the true output level and VCP is the complementary output level. The differential cross-point voltage tracks variations of VDDQ and is the voltage at which the differential signals must cross. Submit Documentation Feedback CDCVF855 www.ti.com SCAS839A – APRIL 2007 – REVISED MAY 2007 ELECTRICAL CHARACTERISTICS (continued) over recommended operating free-air temperature range (unless otherwise noted) (1) MAX fO = 170 MHz 65 80 fO = 200 MHz 75 90 Differential outputs terminated with 120 Ω, CL = 0 pF fO = 170 MHz 110 140 fO = 200 MHz 120 150 Differential outputs terminated with 120 Ω, CL = 14 pF fO = 170 MHz 130 160 fO = 200 MHz 140 170 PARAMETER TEST CONDITIONS Without load IDD Dynamic current on VDDQ MIN TYP UNIT mA ∆C Part-to-part input capacitance variation VDDQ = 2.5 V, VI = VDDQ or GND 1 pF CI(∆) Input capacitance difference between CLK and CLK, FBIN and FBIN VDDQ = 2.5 V, VI = VDDQ or GND 0.25 pF TIMING REQUIREMENTS over recommended ranges of supply voltage and operating free-air temperature PARAMETER fCLK MIN MAX Operating clock frequency 60 220 Application clock frequency 90 220 40% 60% Input clock duty cycle Stabilization time (PLL mode) (1) Stabilization time (bypass mode) (2) (1) (2) UNIT MHz 10 µs 30 ns The time required for the integrated PLL circuit to obtain phase lock of its feedback signal to its reference signal. For phase lock to be obtained, a fixed-frequency, fixed-phase reference signal must be present at CLK and VDD must be applied. Until phase lock is obtained, the specifications for propagation delay, skew, and jitter parameters given in the switching characteristics table are not applicable. This parameter does not apply for input modulation under SSC application. A recovery time is required when the device goes from power-down mode into bypass mode (AVDD at GND). Submit Documentation Feedback 5 CDCVF855 www.ti.com SCAS839A – APRIL 2007 – REVISED MAY 2007 SWITCHING CHARACTERISTICS over operating free-air temperature range (unless otherwise noted) PARAMETER tPLH (1) (1) tPHL tjit(per) (2) tjit(cc) (2) tjit(hper) (2) TEST CONDITIONS MIN High- to low-level propagation delay time 3.5 ns Jitter (period), see Figure 7 Jitter (cycle-to-cycle), see Figure 4 Test mode/CLK to any output 100/133/167 MHz (PC1600/2100/2700) –65 65 200 MHz (PC3200) –30 30 100/133/167 MHz (PC1600/2100/2700) –60 60 200 MHz (PC3200) –40 40 –100 100 –75 75 100/133/167 MHz (PC1600/2100/2700) Half-period jitter, see Figure 8 Output clock slew rate, see Figure 9 Load: 120 Ω, 14 pF t(φ) Static phase offset, see Figure 5 100/133/167/200 MHz Output skew, see Figure 6 Load: 120 Ω, 14 pF; 100/133/167/200 MHz 2 V/ns ps 40 ps VYx R = 60 W VDD/2 VYx CDCVF855 GND S0229-02 Submit Documentation Feedback ps 50 VDD Figure 1. IBIS Model Output Load ps 1 Refers to the transition of the noninverting output. This parameter is assured by design but cannot be 100% production tested. R = 60 W ps –50 PARAMETER MEASUREMENT INFORMATION 6 UNIT ns tslr(o) (1) (2) MAX 3.5 200 MHz (PC3200) tsk(o) TYP Low- to high-level propagation delay Test mode/CLK to any output time CDCVF855 www.ti.com SCAS839A – APRIL 2007 – REVISED MAY 2007 PARAMETER MEASUREMENT INFORMATION (continued) VDD/2 C = 14 pF R = 10 W Z = 60 W Scope –VDD/2 Z = 50 W R = 50 W V(TT) Z = 60 W R = 10 W Z = 50 W R = 50 W C = 14 pF V(TT) CDCVF855 –VDD/2 –VDD/2 V(TT) = GND S0230-02 Figure 2. Output Load Test Circuit VDD C = 14 pF Probe GND Z = 60 W C = 1 pF R = 120 W R = 1 MW V(TT) Z = 60 W C = 14 pF C = 1 pF CDCVF855 V(TT) GND GND R = 1 MW V(TT) = GND S0231-02 Figure 3. Output Load Test Circuit for Crossing Point Yx, FBOUT Yx, FBOUT tc(n) tc(n +1) tjit(cc) = tc(n) – tc(n+1) T0174-01 Figure 4. Cycle-to-Cycle Jitter Submit Documentation Feedback 7 CDCVF855 www.ti.com SCAS839A – APRIL 2007 – REVISED MAY 2007 PARAMETER MEASUREMENT INFORMATION (continued) CLK CLK FBIN FBIN t(f)n t(f)n+1 t(f) = S n=N t(f)n 1 N (N > 1000 Samples) T0175-01 Figure 5. Phase Offset Yx Yx Yx, FBOUT Yx, FBOUT tsk(o) T0176-01 Figure 6. Output Skew Yx, FBOUT Yx, FBOUT tc(n) Yx, FBOUT Yx, FBOUT 1 f0 tjit(per) = tc(n) – 1 f0 f0 = Average Input Frequency Measured at CLK/CLK T0177-01 Figure 7. Period Jitter 8 Submit Documentation Feedback CDCVF855 www.ti.com SCAS839A – APRIL 2007 – REVISED MAY 2007 PARAMETER MEASUREMENT INFORMATION (continued) Yx, FBOUT Yx, FBOUT t(hper_n) t(hper_n+1) 1 f0 n = Any Half Cycle 1 2´f0 tjit(hper) = t(hper_n) – f0 = Average Input Frequency Measured at CLK/CLK T0178-01 Figure 8. Half-Period Jitter VOH, VIH 80% Clock Inputs and Outputs 80% 20% 20% VOL, VIL tr tslr(I/O) = tf V80% – V20% tslf(I/O) = tr V80% – V20% tf T0179-01 Figure 9. Input and Output Slew Rates (2) Card Via Bead 0603 AVDD VDDQ 4.7 mF 1206 0.1 mF 0603 GND Card Via (1) 2200 pF 0603 PLL AGND S0232-01 (1) Place the 2200-pF capacitor close to the PLL. (2) Recommended bead: Fair-Rite P/N 2506036017Y0 or equilvalent (0.8 Ω dc maximum, 600 Ω at 100 MHz). NOTE: Use a wide trace for the PLL analog power and ground. Connect PLL and capacitors to AGND trace and connect trace to one GND via (farthest from the PLL). Figure 10. Recommended AVDD Filtering Submit Documentation Feedback 9 PACKAGE OPTION ADDENDUM www.ti.com 14-Oct-2022 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan (2) Lead finish/ Ball material MSL Peak Temp Op Temp (°C) Device Marking (3) Samples (4/5) (6) CDCVF855PW ACTIVE TSSOP PW 28 50 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 CDCVF855 Samples CDCVF855PWG4 ACTIVE TSSOP PW 28 50 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 CDCVF855 Samples CDCVF855PWR ACTIVE TSSOP PW 28 2000 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 85 CDCVF855 Samples (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
CDCVF855PW 价格&库存

很抱歉,暂时无法提供与“CDCVF855PW”相匹配的价格&库存,您可以联系我们找货

免费人工找货