CSD16408Q5
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SLPS228A – OCTOBER 2009 – REVISED SEPTEMBER 2010
N-Channel NexFET™ Power MOSFET
FEATURES
1
•
•
•
•
2
PRODUCT SUMMARY
Ultralow Qg and Qgd
Low Thermal Resistance
Avalanche Rated
SON 5-mm × 6-mm Plastic Package
APPLICATIONS
•
•
VDS
Drain-to-source voltage
25
V
Qg
Gate charge, total (4.5 V)
6.7
nC
Qgd
Gate charge, gate-to-drain
rDS(on)
Drain-to-source on-resistance
VGS(th)
Threshold voltage
Point-of-Load Synchronous Buck in
Networking, Telecom and Computing Systems
Optimized for Control FET Applications
DESCRIPTION
S
8
1
D
7
2
mΩ
Package
Media
CSD16408Q5
13-inch
(33-cm)
reel
D
6
3
5
4
V
Qty
Ship
2500
Tape and
reel
ABSOLUTE MAXIMUM RATINGS
VALUE
UNIT
VDS
Drain-to-source voltage
25
V
VGS
Gate-to-source voltage
–12 to 16
V
Continuous drain current, TC = 25°C
113
A
Continuous drain current (1)
22
A
IDM
Pulsed drain current, TA = 25°C (2)
141
A
PD
Power dissipation (1)
3.1
W
TJ,
TSTG
Operating junction and storage temperature
range
–55 to 150
°C
EAS
Avalanche energy, single-pulse
ID = 23 A, L = 0.1 mH, RG = 25 Ω
126
mJ
D
P0094-01
(1)
(2)
Typical RqJA = 41°C/W on 1-inch2 (6.45-cm2), 2-oz.
(0.071-mm thick) Cu pad on a 0.06-inch (1.52-mm) thick FR4
PCB.
Pulse duration ≤300 ms, duty cycle ≤2%
put a break here is force notes closer to the table
put a break here is force notes closer to the table
rDS(on) vs VGS
GATE CHARGE
12
16
ID = 25A
14
VGS − Gate to Source Voltage − V
RDS(on) − On-State Resistance − mΩ
3.6
1.8
SON 5-mm × 6-mm
plastic package
D
D
G
VGS = 10 V
ORDERING INFORMATION
ID
S
mΩ
TA = 25°C unless otherwise stated
Top View
nC
5.4
Device
The NexFET™ power MOSFET has been designed
to minimize losses in power conversion applications.
S
1.9
VGS = 4.5 V
12
10
TC = 125°C
8
6
4
2
TC = 25°C
0
ID = 25A
VDS = 12.5V
10
8
6
4
2
0
0
2
4
6
8
VGS − Gate to Source Voltage − V
10
12
G006
0
5
10
Qg − Gate Charge − nC
15
20
G003
1
2
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NexFET is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2009–2010, Texas Instruments Incorporated
CSD16408Q5
SLPS228A – OCTOBER 2009 – REVISED SEPTEMBER 2010
www.ti.com
ELECTRICAL CHARACTERISTICS
TA = 25°C unless otherwise stated
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Static Characteristics
BVDSS
Drain-to-source voltage
VGS = 0 V, ID = 250 mA
IDSS
Drain-to-source leakage
VGS = 0 V, VDS = 20 V
IGSS
Gate-to-source leakage
VDS = 0 V, VGS = –12 V to 16 V
VGS(th)
Gate-to-source threshold voltage
VDS = VGS, ID = 250 mA
rDS(on)
Drain-to-source on-resistance
gfs
Transconductance
25
V
1
mA
100
nA
1.8
2.1
V
VGS = 4.5 V, ID = 25 A
5.4
6.8
mΩ
VGS = 10 V, ID = 25 A
3.6
4.5
mΩ
VDS = 15 V, ID = 25 A
60
1.4
S
Dynamic Characteristics
CISS
Input capacitance
COSS
Output capacitance
990
1300
pF
760
1000
pF
CRSS
Rg
Reverse transfer capacitance
75
100
pF
Series gate resistance
0.8
1.6
Ω
Qg
Gate charge total (4.5 V)
6.7
8.9
nC
Qgd
Gate charge, gate-to-drain
Qgs
Gate charge, gate-to-source
Qg(th)
Gate charge at Vth
QOSS
Output charge
td(on)
Turnon delay time
tr
Rise time
td(off)
Turnoff delay time
tf
Fall time
VGS = 0 V, VDS = 12.5 V , f = 1 MHz
VDS = 12.5 V, ID = 25 A
VDS = 13 V, VGS = 0 V
VDS = 12.5 V, VGS = 4.5 V,
ID = 20 A, RG = 2 Ω
1.9
nC
3.1
nC
1.8
nC
15.7
nC
11.3
ns
25
ns
11
ns
10.8
ns
Diode Characteristics
VSD
Diode forward voltage
IS = 25 A, VGS = 0 V
0.8
Qrr
Reverse recovery charge
VDD = 13 V, IF = 2 5A, di/dt = 300 A/ms
17
1
nC
V
trr
Reverse recovery time
VDD = 13 V, IF = 25 A, di/dt = 300 A/ms
21
ns
THERMAL CHARACTERISTICS
TA = 25°C unless otherwise stated
PARAMETER
RqJC
Thermal Resistance Junction to Case (1)
RqJA
Thermal Resistance Junction to Ambient (1)
(1)
(2)
2
MIN
(2)
2
TYP
MAX
UNIT
1.9
°C/W
51
°C/W
2
RqJC is determined with the device mounted on a 1-inch (6.45-cm ), 2-oz. (0.071-mm thick) Cu pad on a 1.5-inch × 1.5-inch (3.81-cm ×
3.81-cm), 0.06-inch (1.52-mm) thick FR4 PCB. RqJC is specified by design, whereas RqJA is determined by the user’s board design.
Device mounted on FR4 material with 1-inch2 (6.45-cm2), 2-oz. (0.071-mm thick) Cu.
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Copyright © 2009–2010, Texas Instruments Incorporated
CSD16408Q5
www.ti.com
SLPS228A – OCTOBER 2009 – REVISED SEPTEMBER 2010
GATE
GATE
Source
N-Chan 5x6 QFN TTA MIN Rev3
N-Chan 5x6 QFN TTA MAX Rev3
Max RqJA = 51ºC/W
when mounted on
1 inch2 (6.45 cm2) of
2-oz. (0.071-mm thick)
Cu.
Source
Max RqJA = 125ºC/W
when mounted on
minimum pad area of
2-oz. (0.071-mm thick)
Cu.
DRAIN
DRAIN
M0137-02
M0137-01
break
break
break
break
TYPICAL MOSFET CHARACTERISTICS
TA = 25°C unless otherwise stated
ZθJA − Normalized Thermal Impedance
10
1
0.5
0.3
0.1
Duty Cycle = t1/t2
0.1
0.05
P
0.02
0.01
t1
0.01
t2
o
Typical RqJA = 100 C/W (min Cu)
TJ = P x ZqJA x RqJA
Single Pulse
0.001
0.001
0.01
0.1
1
10
100
t P − Pulse Duration − s
1k
G012
Figure 1. Transient Thermal Impedance
Copyright © 2009–2010, Texas Instruments Incorporated
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CSD16408Q5
SLPS228A – OCTOBER 2009 – REVISED SEPTEMBER 2010
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TYPICAL MOSFET CHARACTERISTICS (continued)
TA = 25°C unless otherwise stated
break
60
IDS − Drain to Source Current − A
IDS − Drain to Source Current − A
60
50
VGS = 3.5V
VGS = 10V
40
VGS = 4.5V
30
VGS = 3V
VGS = 4V
20
10
0
0.0
0.5
1.0
1.5
2.0
2.5
TC = 125°C
40
30
TC = 25°C
20
10
TC = −55°C
0
1.5
3.0
VDS − Drain to Source Voltage − V
VDS = 5V
50
G001
3.5
4.0
G002
3.0
ID = 25A
VDS = 12.5V
f = 1MHz
VGS = 0V
2.5
C − Capacitance − nF
10
8
6
4
2
2.0
COSS = CDS + CGD
CISS = CGD + CGS
1.5
1.0
CRSS = CGD
0.5
0
0.0
0
5
10
15
20
Qg − Gate Charge − nC
0
5
G003
15
20
25
G004
Figure 5. Capacitance
2.25
RDS(on) − On-State Resistance − mΩ
16
ID = 250µA
2.00
1.75
1.50
1.25
1.00
0.75
0.50
0.25
0.00
−75
10
VDS − Drain to Source Voltage − V
Figure 4. Gate Charge
VGS(th) − Threshold Voltage − V
3.0
Figure 3. Transfer Characteristics
12
ID = 25A
14
12
10
TC = 125°C
8
6
4
2
TC = 25°C
0
−25
25
75
125
175
TC − Case Temperature − °C
Figure 6. Threshold Voltage vs. Temperature
4
2.5
VGS − Gate to Source Voltage − V
Figure 2. Saturation Characteristics
VGS − Gate to Source Voltage − V
2.0
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G005
0
2
4
6
8
VGS − Gate to Source Voltage − V
10
12
G006
Figure 7. On-State Resistance vs. Gate-to-Source Voltage
Copyright © 2009–2010, Texas Instruments Incorporated
CSD16408Q5
www.ti.com
SLPS228A – OCTOBER 2009 – REVISED SEPTEMBER 2010
TYPICAL MOSFET CHARACTERISTICS (continued)
TA = 25°C unless otherwise stated
100
ID = 20A
VGS = 10V
1.6
ISD − Source to Drain Current − A
Normalized On-State Resistance
1.8
1.4
1.2
1.0
0.8
0.6
0.4
−75
10
1
TC = 125°C
0.1
0.01
TC = 25°C
0.001
0.0001
−25
25
75
125
175
TC − Case Temperature − °C
0.0
0.4
0.6
0.8
1.0
VSD − Source to Drain Voltage − V
G007
Figure 8. Normalized On-State Resistance vs. Temperature
G008
Figure 9. Typical Diode Forward Voltage
1k
I(AV) − Peak Avalanche Current − A
1k
IDS − Drain to Source Current − A
0.2
100
1ms
10
10ms
1
100ms
Area Limited
by RDS(on)
1s
0.1
Single Pulse
o
Typical RqJA = 100 C/W (min Cu)
0.01
0.01
0.1
DC
1
10
TC = 25°C
10
TC = 125°C
1
0.001
100
VDS - Drain to Source Voltage - V
100
0.01
0.1
1
10
100
t(AV) − Time in Avalanche − ms
G009
Figure 10. Maximum Safe Operating Area
G010
Figure 11. Single-Pulse Unclamped Inductive Switching
IDS − Drain to Source Current − A
120
100
80
60
40
20
0
−50
−25
0
25
50
75
100
TC − Case Temperature − °C
125
150
175
G011
Figure 12. Maximum Drain Current vs. Temperature
Copyright © 2009–2010, Texas Instruments Incorporated
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CSD16408Q5
SLPS228A – OCTOBER 2009 – REVISED SEPTEMBER 2010
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MECHANICAL DATA
Q5 Package Dimensions
K
L
L
c1
E1
E2
b
D2
4
4
5
5
e
3
6
3
6
E
D1
7
7
2
2
8
8
1
1
q
Top View
Bottom View
Side View
c
E1
A
q
Front View
M0140-01
DIM
MILLIMETERS
MAX
MIN
MAX
A
0.950
1.050
0.037
0.039
b
0.360
0.460
0.014
0.018
c
0.150
0.250
0.006
0.010
c1
0.150
0.250
0.006
0.010
D1
4.900
5.100
0.193
0.201
D2
4.320
4.520
0.170
0.178
E
4.900
5.100
0.193
0.201
E1
5.900
6.100
0.232
0.240
E2
3.920
4.12
0.154
e
6
INCHES
MIN
1.27 typ
0.162
0.050
L
0.510
0.710
0.020
0.028
q
0.00
–
–
–
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Copyright © 2009–2010, Texas Instruments Incorporated
CSD16408Q5
www.ti.com
SLPS228A – OCTOBER 2009 – REVISED SEPTEMBER 2010
DIM
Recommended PCB Pattern
F1
F7
F3
8
1
F2
F11
F5
F9
5
4
F6
INCHES
MAX
MIN
MAX
F1
6.205
6.305
0.244
0.248
F2
4.46
4.56
0.176
0.18
F3
4.46
4.56
0.176
0.18
F4
0.65
0.7
0.026
0.028
F5
0.62
0.67
0.024
0.026
F6
0.63
0.68
0.025
0.027
F7
0.7
0.8
0.028
0.031
F8
0.65
0.7
0.026
0.028
F9
0.62
0.67
0.024
0.026
F10
4.9
5
0.193
0.197
F11
4.46
4.56
0.176
0.18
F4
F8
F10
MILLIMETERS
MIN
M0139-01
For recommended circuit layout for PCB designs, see application note Reducing Ringing Through PCB Layout
Techniques (SLPA005).
K0
4.00 ±0.10 (See Note 1)
0.30 ±0.05
2.00 ±0.05
+0.10
–0.00
12.00 ±0.30
Ø 1.50
1.75 ±0.10
Q5 Tape and Reel Information
5.50 ±0.05
B0
R 0.30 MAX
A0
8.00 ±0.10
Ø 1.50 MIN
A0 = 6.50 ±0.10
B0 = 5.30 ±0.10
K0 = 1.40 ±0.10
R 0.30 TYP
M0138-01
Notes:
1. 10-sprocket hole-pitch cumulative tolerance ±0.2
2. Camber not to exceed 1 mm in 100 mm, noncumulative over 250 mm
3. Material: black static-dissipative polystyrene
4. All dimensions are in mm, unless otherwise specified.
5. A0 and B0 measured on a plane 0.3 mm above the bottom of the pocket
6. MSL1 260°C (IR and convection) PbF reflow compatible
Copyright © 2009–2010, Texas Instruments Incorporated
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CSD16408Q5
SLPS228A – OCTOBER 2009 – REVISED SEPTEMBER 2010
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REVISION HISTORY
Changes from Revision Original (October 2009) to Revision A
Page
•
Deleted environmental bullets from features list ................................................................................................................... 1
•
Deleted package marking section from end of data sheet ................................................................................................... 7
8
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Copyright © 2009–2010, Texas Instruments Incorporated
PACKAGE OPTION ADDENDUM
www.ti.com
10-Dec-2020
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
(4/5)
(6)
CSD16408Q5
ACTIVE
VSON-CLIP
DQH
8
2500
RoHS-Exempt
& Green
SN
Level-1-260C-UNLIM
-55 to 150
CSD16408
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of