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CSD19538Q2
SLPS582A – JULY 2016 – REVISED JANUARY 2017
CSD19538Q2 100-V N-Channel NexFET™ Power MOSFET
1 Features
•
•
•
•
•
•
•
1
Product Summary
Ultra-Low Qg and Qgd
Low-Thermal Resistance
Avalanche Rated
Lead Free
RoHS Compliant
Halogen Free
SON 2-mm × 2-mm Plastic Package
TA = 25°C
TYPICAL VALUE
Drain-to-Source Voltage
100
V
Qg
Gate Charge Total (10 V)
4.3
nC
Qgd
Gate Charge Gate-to-Drain
RDS(on)
Drain-to-Source On Resistance
VGS(th)
Threshold Voltage
Power Over Ethernet (PoE)
Power Sourcing Equipment (PSE)
Motor Control
DEVICE
QTY
CSD19538Q2
3000
CSD19538Q2T
This 100-V, 49-mΩ, SON 2-mm × 2-mm NexFET™
power MOSFET is designed to minimize losses in
power conversion applications.
Top View
1
6
3.2
V
5
2
S
250
MEDIA
PACKAGE
SHIP
7-Inch Reel
SON
2.00-mm x 2.00-mm
Plastic Package
Tape
and
Reel
VALUE
UNIT
Drain-to-Source Voltage
100
V
VGS
Gate-to-Source Voltage
±20
V
Continuous Drain Current (Package Limited)
14.4
Continuous Drain Current (Silicon Limited),
TC = 25°C
13.1
D
4
D
PD
S
P0108-01
Continuous Drain Current(1)
4.6
Pulsed Drain Current(2)
34.4
Power Dissipation(1)
2.5
Power Dissipation, TC = 25°C
20.2
TJ,
Tstg
Operating Junction Temperature,
Storage Temperature
EAS
Avalanche Energy, Single Pulse
ID = 12.6 A, L = 0.1 mH, RG = 25 Ω
A
A
W
–55 to 150
°C
8
mJ
(1) Typical RθJA = 50°C/W on a 1-in2, 2-oz Cu pad on a 0.06-in
thick FR4 PCB.
(2) Max RθJC = 6.2°C/W, pulse duration ≤ 100 μs, duty cycle ≤
1%.
.
.
RDS(on) vs VGS
Gate Charge
10
200
TC = 25qC, ID = 5 A
TC = 125qC, ID = 5 A
180
VGS - Gate-to-Source Voltage (V)
RDS(on) - On-State Resistance (m:)
mΩ
VDS
IDM
3
49
Absolute Maximum Ratings
D
G
VGS = 10 V
TA = 25°C
ID
D
nC
58
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
3 Description
D
0.8
VGS = 6 V
Device Information(1)
2 Applications
•
•
•
UNIT
VDS
160
140
120
100
80
60
40
20
0
ID = 5 A
9 VDS = 50 V
8
7
6
5
4
3
2
1
0
0
2
4
6
8
10
12
14
16
VGS - Gate-to-Source Voltage (V)
18
20
D007
0
0.5
1
1.5
2
2.5
3
3.5
Qg - Gate Charge (nC)
4
4.5
5
D004
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
CSD19538Q2
SLPS582A – JULY 2016 – REVISED JANUARY 2017
www.ti.com
Table of Contents
1
2
3
4
5
Features ..................................................................
Applications ...........................................................
Description .............................................................
Revision History.....................................................
Specifications.........................................................
1
1
1
2
3
5.1 Electrical Characteristics........................................... 3
5.2 Thermal Information .................................................. 3
5.3 Typical MOSFET Characteristics.............................. 4
6
Device and Documentation Support.................... 7
6.1
6.2
6.3
6.4
6.5
7
Receiving Notification of Documentation Updates....
Community Resources..............................................
Trademarks ...............................................................
Electrostatic Discharge Caution ................................
Glossary ....................................................................
7
7
7
7
7
Mechanical, Packaging, and Orderable
Information ............................................................. 8
7.1 Q2 Package Dimensions .......................................... 8
7.2 Q2 Tape and Reel Information................................ 11
4 Revision History
Changes from Original (July 2016) to Revision A
Page
•
Changed test voltage VDS from 100 V : to 50 V in Gate Charge curve.................................................................................. 1
•
Changed test voltage VDS from 100 V : to 50 V in Figure 4 ................................................................................................... 4
2
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SLPS582A – JULY 2016 – REVISED JANUARY 2017
5 Specifications
5.1 Electrical Characteristics
TA = 25°C (unless otherwise stated)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
STATIC CHARACTERISTICS
BVDSS
Drain-to-source voltage
VGS = 0 V, ID = 250 μA
IDSS
Drain-to-source leakage current
VGS = 0 V, VDS = 80 V
1
μA
IGSS
Gate-to-source leakage current
VDS = 0 V, VGS = 20 V
100
nA
VGS(th)
Gate-to-source threshold voltage
VDS = VGS, ID = 250 μA
V
RDS(on)
Drain-to-source on resistance
gfs
Transconductance
100
2.8
V
3.2
3.8
VGS = 6 V, ID = 5 A
58
72
VGS = 10 V, ID = 5 A
49
59
VDS = 10 V, ID = 5 A
19
mΩ
S
DYNAMIC CHARACTERISTICS
Ciss
Input capacitance
Coss
Output capacitance
Crss
Reverse transfer capacitance
RG
Series gate resistance
Qg
Gate charge total (10 V)
Qgd
Gate charge gate-to-drain
Qgs
Gate charge gate-to-source
Qg(th)
Gate charge at Vth
Qoss
Output charge
td(on)
Turnon delay time
tr
Rise time
td(off)
Turnoff delay time
tf
Fall time
VGS = 0 V, VDS = 50 V, ƒ = 1 MHz
VDS = 50 V, ID = 5 A
VDS = 50 V, VGS = 0 V
VDS = 50 V, VGS = 10 V,
IDS = 5 A, RG = 0 Ω
349
454
pF
69
90
pF
12.6
16.4
pF
4.6
9.2
Ω
4.3
5.6
nC
0.8
nC
1.6
nC
1.0
nC
12.3
nC
5
ns
3
ns
7
ns
2
ns
DIODE CHARACTERISTICS
VSD
Diode forward voltage
ISD = 5 A, VGS = 0 V
0.85
1.0
V
Qrr
Reverse recovery charge
nC
Reverse recovery time
VDS= 50 V, IF = 5 A,
di/dt = 300 A/μs
94
trr
32
ns
5.2 Thermal Information
TA = 25°C (unless otherwise stated)
MAX
UNIT
RθJC
Junction-to-case thermal resistance (1)
THERMAL METRIC
6.2
°C/W
RθJA
Junction-to-ambient thermal resistance (1) (2)
65
°C/W
(1)
(2)
MIN
TYP
RθJC is determined with the device mounted on a 1-in2 (6.45-cm2), 2-oz (0.071-mm) thick Cu pad on a 1.5-in × 1.5-in (3.81-cm × 3.81cm), 0.06-in (1.52-mm) thick FR4 PCB. RθJC is specified by design, whereas RθJA is determined by the user’s board design.
Device mounted on FR4 material with 1-in2 (6.45-cm2), 2-oz (0.071-mm) thick Cu.
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CSD19538Q2
SLPS582A – JULY 2016 – REVISED JANUARY 2017
GATE
www.ti.com
GATE
Source
Source
Max RθJA = 250°C/W
when mounted on a
minimum pad area of
2-oz (0.071-mm) thick
Cu.
Max RθJA = 65°C/W
when mounted on 1 in2
(6.45 cm2) of 2-oz
(0.071-mm) thick Cu.
DRAIN
DRAIN
M0161-02
M0161-01
5.3 Typical MOSFET Characteristics
TA = 25°C (unless otherwise stated)
Figure 1. Transient Thermal Impedance
4
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SLPS582A – JULY 2016 – REVISED JANUARY 2017
Typical MOSFET Characteristics (continued)
30
30
27
27
IDS - Drain-to-Source Current (A)
IDS - Drain-to-Source Current (A)
TA = 25°C (unless otherwise stated)
24
21
18
15
12
9
6
VGS = 6 V
VGS = 8 V
VGS = 10 V
3
TC = 125° C
TC = 25° C
TC = -55° C
24
21
18
15
12
9
6
3
0
0
0
0.5
1
1.5
2
2.5
3
3.5
4
VDS - Drain-to-Source Voltage (V)
4.5
5
1
2
3
4
5
VGS - Gate-to-Source Voltage (V)
D002
6
7
D003
VDS = 5 V
Figure 2. Saturation Characteristics
Figure 3. Transfer Characteristics
10000
Ciss = Cgd + Cgs
Coss = Cds + Cgd
Crss = Cgd
9
8
C - Capacitance (pF)
VGS - Gate-to-Source Voltage (V)
10
7
6
5
4
3
1000
100
10
2
1
1
0
0
0.5
1
1.5
2
2.5
3
3.5
Qg - Gate Charge (nC)
ID = 5 A
4
4.5
0
5
10
20
D004
100
D005
Figure 5. Capacitance
200
RDS(on) - On-State Resistance (m:)
3.8
VGS(th) - Threshold Voltage (V)
90
VDS = 50 V
Figure 4. Gate Charge
3.6
3.4
3.2
3
2.8
2.6
2.4
2.2
-75
30
40
50
60
70
80
VDS - Drain-to-Source Voltage (V)
TC = 25qC, ID = 5 A
TC = 125qC, ID = 5 A
180
160
140
120
100
80
60
40
20
0
-50
-25
0
25
50
75 100
TC - Case Temperature (qC)
125
150
175
0
2
D006
4
6
8
10
12
14
16
VGS - Gate-to-Source Voltage (V)
18
20
D007
ID = 250 µA
Figure 6. Threshold Voltage vs Temperature
Figure 7. On-State Resistance vs Gate-to-Source Voltage
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Typical MOSFET Characteristics (continued)
TA = 25°C (unless otherwise stated)
100
2
VGS = 6 V
VGS = 10 V
ISD - Source-to-Drain Current (A)
Normalized On-State Resistance
2.2
1.8
1.6
1.4
1.2
1
0.8
0.6
0.4
-75
TC = 25° C
TC = 125° C
10
1
0.1
0.01
0.001
0.0001
-50
-25
0
25
50
75 100
TC - Case Temperature (° C)
125
150
175
0
0.2
D008
0.4
0.6
0.8
VSD - Source-to-Drain Voltage (V)
1
1.2
D009
ID = 5 A
Figure 8. Normalized On-State Resistance vs Temperature
Figure 9. Typical Diode Forward Voltage
100
IAV - Peak Avalanche Current (A)
IDS - Drain-to-Source Current (A)
100
10
1
0.1
DC
10 ms
1 ms
0.01
0.1
100 µs
10 µs
1
10
100
VDS - Drain-to-Source Voltage (V)
1000
TC = 25q C
TC = 125q C
10
1
0.01
0.1
TAV - Time in Avalanche (ms)
D010
1
D011
Single pulse, max RθJC = 6.2°C/W
Figure 10. Maximum Safe Operating Area
Figure 11. Single Pulse Unclamped Inductive Switching
IDS - Drain-to-Source Current (A)
16
14
12
10
8
6
4
2
0
-50
-25
0
25
50
75
100 125
TC - Case Temperature (qC)
150
175
D012
Figure 12. Maximum Drain Current vs Temperature
6
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SLPS582A – JULY 2016 – REVISED JANUARY 2017
6 Device and Documentation Support
6.1 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper
right corner, click on Alert me to register and receive a weekly digest of any product information that has
changed. For change details, review the revision history included in any revised document.
6.2 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
6.3 Trademarks
NexFET, E2E are trademarks of Texas Instruments.
All other trademarks are the property of their respective owners.
6.4 Electrostatic Discharge Caution
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
6.5 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
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CSD19538Q2
SLPS582A – JULY 2016 – REVISED JANUARY 2017
www.ti.com
7 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
7.1 Q2 Package Dimensions
2.1
1.9
A
B
PIN 1 INDEX AREA
2.1
1.9
0.8 MAX
C
SEATING PLANE
0.05
0.00
0.75±0.1
PKG
(0.2)
(0.2) TYP
(0.47)
0.3±0.05
3
4
7
4X
0.65
(0.5)
PKG
2X
1.3
8
0.95±0.1
6
1
(0.2)
PIN 1 ID
(45 X0.3)
6X
1±0.1
6X
0.3
0.2
0.35
0.25
0.1
0.05
C A
C
B
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning
and tolerancing per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. The package thermal pads must be soldered to the printed circuit board for thermal and mechanical
performance.
8
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Q2 Package Dimensions (continued)
7.1.1 Recommended PCB Pattern
(1)
PKG
6X (0.45)
1
6
8
6X (0.3)
(0.95)
(0.325)
PKG
4X (0.65)
(0.65)
7
4
3
(0.3)
(R0.05) TYP
(0.095)
(0.75)
(1.95)
0.05 MIN
ALL AROUND
0.05 MAX
ALL AROUND
SOLDER MASK
OPENING
METAL
NON SOLDER MASK
DEFINED
(PREFERRED)
SOLDER MASK
OPENING
METAL UNDER
SOLDER MASK
SOLDER MASK
DEFINED
1. For recommended circuit layout for PCB designs, see Reducing Ringing Through PCB Layout Techniques
(SLPA005).
2. This package is designed to be soldered to a thermal pad on the board. For more information, see QFN/SON
PCB Attachment (SLUA271).
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Q2 Package Dimensions (continued)
7.1.2 Recommended Stencil Pattern
(0.9)
METAL
ALL AROUND, TYP
PKG
6X (0.45)
1
6
6X (0.3)
8
(0.86)
(0.325)
PKG
4X (0.65)
(0.65)
3
(R0.05) TYP
7
(0.29)
4
(0.095)
(0.7)
(1.95)
1. All linear dimensions are in millimeters.
2. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525
may have alternate design recommendations.
10
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7.2 Q2 Tape and Reel Information
4.00 ±0.10
Ø 1.50 ±0.10
4.00 ±0.10
Ø 1.00 ±0.25
1.00 ±0.05
2.30 ±0.05
10° Max
3.50 ±0.05
8.00
+0.30
–0.10
1.75 ±0.10
2.00 ±0.05
0.254 ±0.02
2.30 ±0.05
10° Max
M0168-01
Notes: 1. Measured from centerline of sprocket hole to centerline of pocket.
2. Cumulative tolerance of 10 sprocket holes is ±0.2.
3. Other material available.
4. Typical SR of form tape Max 109 OHM/SQ.
5. All dimensions are in mm, unless otherwise specified.
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PACKAGE OPTION ADDENDUM
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30-Jan-2022
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
(4/5)
(6)
CSD19538Q2
ACTIVE
WSON
DQK
6
3000
RoHS & Green
NIPDAU | SN
Level-1-260C-UNLIM
-55 to 150
1958
CSD19538Q2T
ACTIVE
WSON
DQK
6
250
RoHS & Green
NIPDAU | SN
Level-1-260C-UNLIM
-55 to 150
1958
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of