CY29FCT818T
DIAGNOSTIC SCAN REGISTER
WITH 3-STATE OUTPUTS
SCCS012B – MAY 1994 – REVISED NOVEMBER 2001
D
D
D
D
D
D
D
D
D
D
D
D, P, Q, OR SO PACKAGE
(TOP VIEW)
Function, Pinout, and Drive Compatible
With FCT, F Logic, and AM29818
Reduced VOH (Typically = 3.3 V) Version of
Equivalent FCT Functions
Edge-Rate Control Circuitry for
Significantly Improved Noise
Characteristics
Ioff Supports Partial-Power-Down Mode
Operation
Matched Rise and Fall Times
Fully Compatible With TTL Input and
Output Logic Levels
8-Bit Pipeline and Shadow Register
ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
CY29FCT818CT
– 64-mA Output Sink Current
– 32-mA Output Source Current
CY29FCT818ATDMB
– 20-mA Output Sink Current
– 3-mA Output Source Current
3-State Outputs
OE
DCLK
D0
D1
D2
D3
D4
D5
D6
D7
SDI
GND
1
24
2
23
3
22
4
21
5
20
6
19
7
18
8
17
9
16
10
15
11
14
12
13
VCC
MODE
Y0
Y1
Y2
Y3
Y4
Y5
Y6
Y7
SDO
PCLK
description
The CY29FCT818T contains a high-speed 8-bit general-purpose data pipeline register and a high-speed 8-bit
shadow register. The general-purpose register can be used in an 8-bit-wide data path for a normal system
application. The shadow register is designed for applications such as diagnostics in sequential circuits, where
it is desirable to load known data at a specific location in the circuit and to read the data at that location.
The shadow register can load data from the output of the device, and can be used as a right-shift register with
bit-serial input (SDI) and output (SDO), using DCLK. The data register input is multiplexed to enable loading
from the shadow register or from the data input pins, using PCLK. Data can be loaded simultaneously from the
shadow register to the pipeline register, and from the pipeline register to the shadow register, provided
setup-time and hold-time requirements are satisfied, with respect to the two independent clock inputs.
In a typical application, the general-purpose register in this device replaces an 8-bit data register in the normal
data path of a system. The shadow register is placed in an auxiliary bit-serial loop that is used for diagnostics.
During diagnostic operation, data is shifted serially into the shadow register, then transferred to the
general-purpose register to load a known value into the data path. To read the contents at that point in the data
path, the data is transferred from the data register into the shadow register, then shifted serially in the auxiliary
diagnostic loop to make it accessible to the diagnostics controller. This data then is compared with the expected
value to diagnose faulty operation of the sequential circuit.
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs,
preventing damaging current backflow through the device when it is powered down.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright 2001, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
POST OFFICE BOX 655303
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1
CY29FCT818T
DIAGNOSTIC SCAN REGISTER
WITH 3-STATE OUTPUTS
SCCS012B – MAY 1994 – REVISED NOVEMBER 2001
ORDERING INFORMATION
SPEED
(ns)
PACKAGE†
TA
–40°C
40°C to 85°C
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
DIP – P
Tube
6
CY29FCT818CTPC
CY29FCT818CTPC
QSOP – Q
Tape and reel
6
CY29FCT818CTQCT
29FCT818C
Tube
6
CY29FCT818CTSOC
Tape and reel
6
CY29FCT818CTSOCT
SOIC – SO
29FCT818C
–55°C to 125°C
CDIP – D
Tube
12
CY29FCT818ATDMB
† Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
FUNCTION TABLE
INPUTS
MODE
SDI
DCLK
PCLK
OUTPUT
SDO
SHADOW
REGISTER
PIPELINE
REGISTER
L
X
↑
X
S7
S0←SDI
Si←Si–1
NA
L
X
X
↑
H
L
↑
X
S7
L
H
H
↑
X
H
NA
Si←Yi
Hold
Pi←Di
NA
NA
OPERATION
Serial shift; D7–D0 output disabled
Load pipeline register from data input
Load shadow register from Y output
Hold shadow register; D7–D0 output enabled
H
X
X
↑
SDI
NA
Pi←Si
Load pipeline register from shadow register
H = High logic level, L = Low logic level, X = Don’t care, ↑ Low-to-high transition, ← = Transfer direction, NA = Not applicable
2
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CY29FCT818T
DIAGNOSTIC SCAN REGISTER
WITH 3-STATE OUTPUTS
SCCS012B – MAY 1994 – REVISED NOVEMBER 2001
logic diagram
SDI
DCLK
D0–D7
11
8-Bit
Shadow
Register
2
14
SD0
CLK
S0–S7 8
D
MODE
Q
23
MUX
8
PCLK
8-Bit
Pipeline
Register
13
8
OE
P0–P7
1
8
Y0–Y7
absolute maximum rating over operating free-air temperature range (unless otherwise noted)†
Supply voltage range to ground potential . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V
DC input voltage range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V
DC output voltage range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V
DC output current (maximum sink current/pin) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120 mA
Package thermal impedance, qJA (see Note 1): P package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67°C/W
(see Note 2): Q package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61°C/W
(see Note 2): SO package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46°C/W
Ambient temperature range with power applied, TA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 135°C
Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150_C
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The package thermal impedance is calculated in accordance with JESD 51-3.
2. The package thermal impedance is calculated in accordance with JESD 51-7.
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3
CY29FCT818T
DIAGNOSTIC SCAN REGISTER
WITH 3-STATE OUTPUTS
SCCS012B – MAY 1994 – REVISED NOVEMBER 2001
recommended operating conditions (see Note 3)
CY29FCT818ATDMB
CY29FCT818T
MIN
NOM
MAX
MIN
NOM
MAX
4.5
5
5.5
4.75
5
5.25
UNIT
VCC
VIH
Supply voltage
VIL
IOH
Low-level input voltage
0.8
0.8
V
High-level output current
–3
–32
mA
IOL
TA
Low-level output current
20
64
mA
85
°C
High-level input voltage
2
Operating free-air temperature
2
–55
125
V
V
–40
NOTE 3: All unused inputs of the device must be held at VCC or GND to ensure proper device operation.
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
TEST CONDITIONS
CY29FCT818ATDMB
MIN TYP†
MAX
VCC = 4.5 V,
IIN = –18 mA
–0.7
VCC = 4.75 V,
IIN = –18 mA
VCC = 4.5 V,
IOH = –3 mA
PARAMETER
VIK
VOH
VOL
Vhys
VCC = 4
4.75
75 V
2.4
2
IOH = –15 mA
2.4
VCC = 4.5 V,
IOL = 20 mA
VCC = 4.75 V,
IOL = 64 mA
0.3
VIN = VCC
VCC = 5.5 V,
VIN = 2.7 V
VCC = 5.25 V,
VIN = 2.7 V
VCC = 5.5 V,
VIN = 0.5 V
VCC = 5.25 V,
VIN = 0.5 V
VCC = 5.5 V,
VOUT = 2.7 V
VCC = 5.25 V,
VOUT = 2.7 V
VCC = 5.5 V,
VOUT = 0.5 V
VCC = 5.25 V,
VCC = 5.5 V,
VOUT = 0.5 V
VOUT = 0 V
VCC = 5.25 V,
VOUT = 0 V
Ioff
VCC = 0 V,
VOUT = 4.5 V
ICC
VCC = 5.5 V,
VCC = 5.25 V,
VIN ≤ 0.2 V,
VIN ≤ 0.2 V,
∆ICC
VCC = 5.5 V, VIN = 3.4 V§, f1 = 0, Outputs open
VCC = 5.25 V, VIN = 3.4 V§, f1 = 0, Outputs open
IIL
IOZH
IOZL
IOS‡
V
0.55
0.2
VIN = VCC
0.55
0.2
5
±1
±1
±1
±1
10
10
–10
–10
–120
–225
–60
–120
±1
VIN ≥ VCC – 0.2 V
VIN ≥ VCC – 0.2 V
0.2
0.5
V
V
5
–60
V
3.3
0.3
All inputs
–1.2
UNIT
3.3
IOH = –32 mA
VCC = 5.25 V,
IIH
–1.2
–0.7
VCC = 5.5 V,
II
CY29FCT818T
TYP†
MAX
MIN
–225
±1
1.5
0.2
1.5
0.5
2
2
µA
µA
µA
µA
µA
mA
µA
mA
mA
† Typical values are at VCC = 5 V, TA = 25°C.
‡ Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus
and/or sample-and-hold techniques are preferable to minimize internal chip heating and more accurately reflect operational values. Otherwise,
prolonged shorting of a high output can raise the chip temperature well above normal and cause invalid readings in other parametric tests. In
any sequence of parameter tests, IOS tests should be performed last.
§ Per TTL-driven input (VIN = 3.4 V); all other inputs at VCC or GND
4
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CY29FCT818T
DIAGNOSTIC SCAN REGISTER
WITH 3-STATE OUTPUTS
SCCS012B – MAY 1994 – REVISED NOVEMBER 2001
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted) (continued)
PARAMETER
ICCD¶
CY29FCT818ATDMB
MIN TYP†
MAX
TEST CONDITIONS
VCC = 5.5 V, Outputs open, One input switching at 50% duty
cycle, OE = GND, VIN ≤ 0.2 V or VIN ≥ VCC – 0.2 V
CY29FCT818T
TYP†
MAX
MIN
0.25
VCC = 5.25 V, Outputs open, One input switching at 50%
duty cycle, OE = GND, VIN ≤ 0.2 V or VIN ≥ VCC – 0.2 V
VCC = 5.5 V,
Out
uts o
en,
Outputs
open
f0 = 10 MHz,
OE = GND
IC#
VCC = 5.25 V,
Out
uts o
en,
Outputs
open
f0 = 10 MHz,
OE = GND
One bit switching
at f1 = 5 MHz
at 50% duty cycle
Eight bits and four
controls switching
at f1 = 5 MHz
at 50% duty cycle
One bit switching
at f1 = 5 MHz
at 50% duty cycle
Eight bits and four
controls switching
at f1 = 5 MHz
at 50% duty cycle
0.25
VIN ≤ 0.2 V or
VIN ≥ VCC – 0.2 V
5.3
VIN = 3.4 V or GND
7.3
VIN ≤ 0.2 V or
VIN ≥ VCC – 0.2 V
17.8||
VIN = 3.4 V or GND
30.8||
UNIT
mA/
MHz
mA
VIN ≤ 0.2 V or
VIN ≥ VCC – 0.2 V
5.3
VIN = 3.4 V or GND
7.3
VIN ≤ 0.2 V or
VIN ≥ VCC – 0.2 V
17.8||
VIN = 3.4 V or GND
30.8||
Ci
5
10
5
10
pF
Co
9
12
9
12
pF
† Typical values are at VCC = 5 V, TA = 25°C.
¶ This parameter is derived for use in total power-supply calculations.
# IC
= ICC + ∆ICC × DH × NT + ICCD (f0/2 + f1 × N1)
Where:
IC
= Total supply current
ICC = Power-supply current with CMOS input levels
∆ICC = Power-supply current for a TTL high input (VIN = 3.4 V)
DH
= Duty cycle for TTL inputs high
NT
= Number of TTL inputs at DH
ICCD = Dynamic current caused by an input transition pair (HLH or LHL)
f0
= Clock frequency for registered devices, otherwise zero
f1
= Input signal frequency
N1
= Number of inputs changing at f1
All currents are in milliamperes and all frequencies are in megahertz.
|| Values for these conditions are examples of the ICC formula.
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CY29FCT818T
DIAGNOSTIC SCAN REGISTER
WITH 3-STATE OUTPUTS
SCCS012B – MAY 1994 – REVISED NOVEMBER 2001
timing requirements over recommended operating free-air temperature range (unless otherwise
noted) (see Figure 1)
CY29FCT818AT
PARAMETER
tw
Pulse width
MIN
15
5
25
5
6
2
15
3.5
5
2
MODE before DCLK↑
12
3.5
SDI before DCLK↑
10
3.5
DCLK before PCLK↑
15
3.5
PCLK before DCLK↑
Y before DCLK↑
th
Hold time
MIN
DCLK high and low
MODE before PCLK↑
Setup time
CY29FCT818CT
PCLK high and low
D before PCLK↑
tsu
MAX
45
8.5
D after PCLK↑
2
1.5
MODE after PCLK↑
0
0
Y after DCLK↑
5
1.5
MODE after DCLK↑
5
1.5
SDI after DCLK↑
0
0
MAX
UNIT
ns
ns
ns
switching characteristics over operating free-air temperature range (see Figure 1)
PARAMETER
tpd
d
tPZL
tPZH
tPLZ
tPHZ
6
FROM
(INPUT)
TO
(OUTPUT)
CY29FCT818AT
MIN
MAX
CY29FCT818CT
MIN
MAX
PCLK
Y
12
6
MODE
SDO
18
7.2
SDI
SDO
18
7.1
DCLK
SDO
30
7.2
OE
Y
20
8
DCLK
D
35
9
OE
Y
20
8.5
DCLK
D
30
9
OE
Y
20
5.5
DCLK
D
45
5.5
OE
Y
30
8
DCLK
D
90
8
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UNIT
ns
ns
ns
ns
ns
CY29FCT818T
DIAGNOSTIC SCAN REGISTER
WITH 3-STATE OUTPUTS
SCCS012B – MAY 1994 – REVISED NOVEMBER 2001
PARAMETER MEASUREMENT INFORMATION
7V
From Output
Under Test
From Output
Under Test
Test
Point
CL = 50 pF
(see Note A)
Open
TEST
GND
CL = 50 pF
(see Note A)
500 Ω
S1
500 Ω
S1
Open
7V
Open
tPLH/tPHL
tPLZ/tPZL
tPHZ/tPZH
500 Ω
LOAD CIRCUIT FOR
3-STATE OUTPUTS
LOAD CIRCUIT FOR
TOTEM-POLE OUTPUTS
3V
1.5 V
Timing Input
0V
tw
tsu
3V
1.5 V
Input
1.5 V
th
3V
1.5 V
Data Input
1.5 V
0V
0V
VOLTAGE WAVEFORMS
PULSE DURATION
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
3V
1.5 V
Input
1.5 V
0V
tPLH
tPHL
1.5 V
1.5 V
VOL
tPHL
Out-of-Phase
Output
tPLZ
≈3.5 V
1.5 V
tPZH
VOH
1.5 V
VOL
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
INVERTING AND NONINVERTING OUTPUTS
1.5 V
0V
Output
Waveform 1
(see Note B)
tPLH
1.5 V
1.5 V
tPZL
VOH
In-Phase
Output
3V
Output
Control
Output
Waveform 2
(see Note B)
VOL + 0.3 V
VOL
tPHZ
1.5 V
VOH – 0.3 V
VOH
≈0 V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. The outputs are measured one at a time with one input transition per measurement.
Figure 1. Load Circuit and Voltage Waveforms
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PACKAGE OPTION ADDENDUM
www.ti.com
4-Feb-2021
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
(4/5)
(6)
5962-9682701QLA
ACTIVE
CDIP
JT
24
1
Non-RoHS
& Green
SNPB
N / A for Pkg Type
-55 to 125
5962-9682701QL
A
CY29FCT818ATDM
B
CY29FCT818ATDMB
ACTIVE
CDIP
JT
24
1
Non-RoHS
& Green
SNPB
N / A for Pkg Type
-55 to 125
5962-9682701QL
A
CY29FCT818ATDM
B
CY29FCT818CTSOCT
ACTIVE
SOIC
DW
24
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
29FCT818C
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of