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DAC2814AP

DAC2814AP

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    DIP24

  • 描述:

    DAC, 2 FUNC, PARALLEL INPUT

  • 数据手册
  • 价格&库存
DAC2814AP 数据手册
® DAC2814 DUAL 12-BIT DIGITAL-TO-ANALOG CONVERTER (Serial Interface) FEATURES ● COMPLETE DUAL DAC — INCLUDES INTERNAL REFERENCES AND OUTPUT AMPLIFIERS ● GUARANTEED SPECIFICATIONS OVER TEMPERATURE ● GUARANTEED MONOTONIC OVER TEMPERATURE ● HIGH-SPEED SERIAL INTERFACE (10MHz CLOCK) ● LOW POWER: 300mW (150mW/DAC) ● LOW GAIN DRIFT: 5ppm/°C ● LOW NONLINEARITY: ±1/2 LSB max ● UNIPOLAR OR BIPOLAR OUTPUT ● CLEAR/RESET TO UNIPOLAR OR BIPOLAR ZERO DESCRIPTION DAC2814 The DAC2814 is one in a family of dual and quad 12bit digital-to-analog converters. Serial, 8-bit, 12-bit interfaces are available. The DAC2814 is complete. It contains CMOS logic, switches, a high-performance buried-zener reference, and low-noise bipolar output amplifiers. No external components are required for either unipolar 0 to 10V, 0 to –10V, or bipolar ±10V output ranges. The DAC2814 has a high-speed serial interface capable of being clocked at 10MHz. Serial data are clocked DAC B MSB first into a 24-bit shift register, then strobed into each DAC separately or simultaneously as required. The DAC has an asynchronous clear control for reset to unipolar or bipolar zero depending on the mode selected. This feature is useful for power-on reset or system calibration. The DAC2814 is packaged in a 24-pin plastic DIP rated for the –40°C to +85°C extended industrial temperature range. 16 +VREF Out +VL 6 15 Inv In +VS 10 –VS 7 AGND 8 DGND 1 10V Ref 10kΩ A3 12 Inv Out 11 VREF In 20kΩ 19 BPO A 20kΩ DAC A A1 Serial Data and Control In Logic 14 VOUT A 20kΩ 18 BPO B High-stability laser-trimmed thin film resistors assure high reliability and true 12-bit integral and differential linearity over the full specified temperature range. 20kΩ DAC B A2 Serial Data Out SBAS008 10kΩ 17 VOUT B 5 International Airport Industrial Park • Mailing Address: PO Box 11400 Tel: (520) 746-1111 • Twx: 910-952-1111 • Cable: BBRCORP • • Tucson, AZ 85734 • Street Address: 6730 S. Tucson Blvd. • Tucson, AZ 85706 Telex: 066-6491 • FAX: (520) 889-1510 • Immediate Product Info: (800) 548-6132 © 1991 Burr-Brown Corporation PDS-1103B Printed in U.S.A. October, 1993 SPECIFICATIONS, Guaranteed over TA = –40°C to +85°C unless otherwise specified. ELECTRICAL Specifications as shown for VS = ±12V or ±15V, VL = +5V, and RL = 2kΩ unless otherwise noted. DAC2814AP PARAMETER CONDITIONS DIGITAL INPUTS Resolution VIH (Input High Voltage) VIL (Input Low Voltage) IIN ( Input Current) MIN 12 +2 0 ACCURACY Integral, Relative Linearity (1) Differential Nonlinearity (2) Unipolar Offset Error Bipolar Zero Error Gain Error Unipolar, Bipolar Power Supply Sensitivity (3) ISINK = 1.6mA ISOURCE = 500µA 0 +2.4 +9.980 ±5 ±0.1 ±5 ±30 ±5 ±15 +10 ±2 +10.020 ±30 Bits V V µA µA pF * * V V ±1/2 * ±1 ±0.5 * ±10 ±0.15 * LSB LSB LSB mV mV mV % ppmFSR/V * * * ±20 * ±8 ppm/°C ppmFSR/°C ppmFSR/°C * * +10.015 ±20 * * 40 * V ppm/°C mA mA pF mA ppm/mA ±5 * ppm/V –9.985 ±20 V ppm/°C Ω mA pF mA +10/–5 +6.5/–5 +9.985 * * 500 ±20 –10.020 –10 * * –9.980 ±30 –10.015 0.1 * 200 ±30 3.5 7 14 * * ±7 * * 5 10 20 * * * * * * ±10 –VS + 1.4 +VS – 1.4 * * 0.1 CL = 100pF To 1/2 LSB of Full Scale To 1/2 LSB of Full Scale 2.5 3.5 10 3 Full Scale Transition CL= 100pF ® 2 V Ω mA pF mA * * µs µs V/µs MHz * 500 ±30 * * 10 10 * * * * kΩ kΩ kΩ V * * ±5 VOUT D/A GLITCH IMPULSE DAC2814 * * * * * * * ±1 ±3 ±20 ±0.2 30 ANALOG GROUND CURRENT (Code Dependent) DIGITAL CROSSTALK UNITS +1.5/–1 REFERENCE INPUT Reference Input Resistance Inverter Input Resistance BPO Input Resistance Reference Input Range DYNAMIC PERFORMANCE(5) Unipolar Mode Settling Time Bipolar Mode Settling Time Slew Rate Small-Signal Bandwidth MAX * +0.4 +5 With Internal or External 10.0V Ref VS = ±11.4V to ±18V VL = +4.5V to +5.5V TA = 25°C TA = –40°C to +85°C TYP ±1 ±1 TA = 25°C TA = –40°C to +85°C TA = +25°C TA = –40°C TO +85°C Max Load Capacitance (For Stability) Short Circuit Current Load Regulation (∆ VOUT vs ∆ ILOAD) Supply Regulation (∆ VOUT vs ∆ VS) INVERTER –10V Reference(4), Inverter Output –10V Reference Drift DC Output Impedance Output Current Max Load Capacitance (For Stability) Short Circuit Current ANALOG SIGNAL OUTPUTS Voltage Range DC Output Impedance Output Current Max Load Capacitance (For Stability) Short Circuit Current MIN 0.8 TEMPERATURE DRIFT Gain Drift Unipolar, Bipolar Unipolar Offset Drift Bipolar Zero Drift REFERENCE OUTPUT Output Voltage Reference Drift Output Current DAC2814BP MAX +5 +0.8 ±1 ±10 TA = 25°C TA = –40°C to +85°C CIN (Input Capacitance) DIGITAL OUTPUT Data Out VOL VOH TYP ±2 * mA 3 * nV-s 30 * nV-s SPECIFICATIONS (CONT), Guaranteed over TA = –40°C to +85°C unless otherwise specified. ELECTRICAL Specifications as shown for VS = ±12V or ±15V, VL = +5V, and RL = 2kΩ unless otherwise noted. DAC2814AP PARAMETER POWER SUPPLY +VS and –VS +VL +IS –IS +IL +IL Total Power, All DACs CONDITIONS TYP MAX MIN TYP MAX UNITS ±11.4 4.5 ±15 5 +10 –10 0.2 ±18 5.5 +13.5 –13.5 1 5 410 * * * * * * * * * * * * * * V V mA mA mA mA mW +85 +85 * * * * °C °C °C/W Digital Inputs = 0V or +VL Digital Inputs = VIL or VIH TEMPERATURE RANGE Specified Operating Thermal Resistance θJA DAC2814BP MIN 300 –40 –40 * 75 * NOTES: (1) End point linearity. (2) Guaranteed monotonic. (3) Change in bipolar full scale output. Includes voltage output DAC, voltage reference, and reference inverter. (4) Inverter output with inverter input connected to +VREF. (5) Guaranteed but not tested. ABSOLUTE MAXIMUM RATINGS PACKAGE INFORMATION +VL to AGND ................................................................................. 0V, +7V +VL to DGND ................................................................................ 0V, +7V +VS to AGND .............................................................................. 0V, +18V –VS to AGND ............................................................................... 0V,–18V AGND to DGND ................................................................................ ±0.3V Any digital input to DGND .............................................. –0.3V, +VL +0.3V Ref In to AGND .................................................................................. ±25V Ref In to DGND .................................................................................. ±25V Storage Temperature Range .......................................... –55°C to +125°C Operating Temperature Range ......................................... –40°C to +85°C Lead Temperature (soldering, 10s) ................................................ +300°C Junction Temperature .................................................................... +155°C Output Short Circuit ................................... Continuous to common or ±VS Reference Short Circuit .............................. Continuous to common or +VS MODEL DAC2814AP DAC2814BP PACKAGE PACKAGE DRAWING NUMBER(1) 24-Pin Plastic DIP 24-Pin Plastic DIP 167 167 NOTE: (1) For detailed drawing and dimension table, please see end of data sheet, or Appendix D of Burr-Brown IC Data Book. ELECTROSTATIC DISCHARGE SENSITIVITY Electrostatic discharge can cause damage ranging from performance degradation to complete device failure. BurrBrown Corporation recommends that all integrated circuits be handled and stored using appropriate ESD protection methods. The information provided herein is believed to be reliable; however, BURR-BROWN assumes no responsibility for inaccuracies or omissions. BURR-BROWN assumes no responsibility for the use of this information, and all use of such information shall be entirely at the user’s own risk. Prices and specifications are subject to change without notice. No patent rights or licenses to any of the circuits described herein are implied or granted to any third party. BURR-BROWN does not authorize or warrant any BURR-BROWN product for use in life support devices and/or systems. ® 3 DAC2814 PIN DESIGNATIONS PIN 1 2 3 4 5 6 7 8 9 10 11 12 DESCRIPTOR FUNCTION PIN DESCRIPTOR FUNCTION DGND LATCH B CLR MODE Data Out +VL –VS AGND NC +VS VREF In Inv Out Digital common Latch data update, logic input, DAC B Asychronous input reset to zero Selection input for unipolar or bipolar reset to zero Serial data output Positive logic power supply, +5V input Negative analog power supply , –15V input Analog common No internal connection Positive analog power supply, +15V input ± Reference voltage input Inverter (A3) output 24 23 22 21 20 19 18 17 16 15 14 13 CS Data In LATCH A CLK NC BPO A BPO B VOUT B +VREF Out Inv In VOUT A NC Chip select enable, DAC A and DAC B Serial data input Latch data update, logic input, DAC A Clock input No internal connection Bipolar offset input, DAC A Bipolar offset input, DAC B Analog output voltage, DAC B Reference voltage, +10V output Inverter (A3) input Analog output voltage, DAC A No internal connection PIN CONFIGURATIONS Top View DGND 1 24 CS LATCH B 2 23 Data In CLR 3 22 LATCH A MODE 4 21 CLK Data Out 5 20 NC DAC2814 +VL 6 –VS 7 18 BPO B AGND 8 17 VOUT B NC 9 16 +VREF Out 19 BPO A +VS 10 15 Inv In VREF In 11 14 VOUT A Inv Out 12 13 NC NC = No Internal Connection TYPICAL PERFORMANCE CURVES TA = +25°C, V S = ±12V or ±15V, VL = +5V unless otherwise noted. NOISE vs BANDWIDTH (Bipolar Mode) PSRR vs FREQUENCY (Bipolar Mode) 250 80 Voltage Noise (µVrms) 70 PSRR (dB) 60 50 40 VOUT = 0V 30 20 200 150 VOUT = +10V FFFHEX 100 50 VOUT = +10V 10 VOUT = 0V 800HEX 0 0 1k 10k 100k 100 1M Frequency (Hz) 10k Frequency (Hz) ® DAC2814 1k 4 100k 1M TYPICAL PERFORMANCE CURVES (CONT) TA = +25°C, VS = ±12V or ±15V, VL = +5V unless otherwise noted. POWER SUPPLY CURRENT vs TEMPERATURE +0.005 Bipolar Zero 0 0 –0.5 –0.005 Bipolar Offset –1.0 –1.5 –40 –20 ±IS (mA) Analog Supply +0.5 0 20 40 60 +IL (All Logic Inputs = 2V) 11.6 +0.01 Gain Error ∆ Gain Error (%) +1.0 1.4 11.8 1 11.4 11.2 0.8 IS 0.6 11 0.4 10.8 –0.01 10.6 –0.015 10.4 80 1.2 +IL (All Logic Inputs = 0V or VL) +IL (mA) Logic Supply +0.015 +1.5 0.2 0 –40 Temperature (°C) –20 0 20 40 60 80 Temperature (°C) CROSSTALK (Bipolar Mode) OUTPUT VOLTAGE SWING vs RESISTOR LOAD 25 VS = ±15V 10V REF 0V VL = 5V 15 VOUT B VOUT VOUT (Vp-p) 20 VOUT A 10 LATCH A +5V 5 0V 0 Time (500ns/div) 10 100 1k 10k NOTE: Crosstalk is dominated by digital crosstalk/ feedthrough of the LATCH signal. Load Resistance (Ω ) FULL-SCALE OUTPUT SWING BIPOLAR (20V Step) FULL-SCALE OUTPUT SWING UNIPOLAR (10V Step) 0V VOUT (5V/div) VOUT (5V/div) ∆ Bipolar Offset and Zero Error (mV) CHANGE OF GAIN, BIPOLAR OFFSET AND ZERO ERROR vs TEMPERATURE VOUT 0V VOUT LATCH +5V 0V Time (2µs/div) Time (2µs/div) ® 5 DAC2814 TYPICAL PERFORMANCE CURVES (CONT) TA = +25°C, VS = ±12V or ±15V, VL = +5V unless otherwise noted. VOUT –10V +10V VOUT +5V LATCH 0V 0V Time (2µs/div) SETTLING TIME UNIPOLAR (+10V to 0V STEP) SETTLING TIME UNIPOLAR (0V to +10V Step) 0V VOUT LATCH +5V 0V +10V VOUT +5V LATCH 0V Time (1µs/div) Time (1µs/div) MAJOR CARRY GLITCH DIGITAL FEEDTHROUGH 0V VOUT (5mV/div) VOUT (20mV/div) LATCH +5V Time (1µs/div) ∆V Around +10V (1mV/div) ∆V Around 0V (1mV/div) SETTLING TIME BIPOLAR (+10V to –10V Step) ∆V Around –10V (2mV/div) ∆V Around +10V (2mV/div) SETTLING TIME BIPOLAR (–10V to +10V) VOUT +5V LATCH 0V VOUT 0V Time (1µs/div) Time (500ns/div) NOTE: Data transition 800HEX to 7FFHEX. DAC output noise due to activity on digital inputs with latch disabled. ® DAC2814 6 TIMING CHARACTERISTICS VL = +5V, TA = –40°C to +85°C. t5 PARAMETER MINIMUM CLK 15ns 15ns 15ns Data t1—Data Setup Time t2—Data Hold time t3—Chip Select to CLK, Latch, Data Setup Time t4—Chip Select to CLK, Latch, Data Hold Time t5—CLK Pulse Width t6—Clear Pulse Width t7—Latch Pulse Width t8—CLK Edge to LATCH A or LATCH B 0V t1 t3 5V 0V t2 5V CS t8 40ns t7 t4 LATCH A LATCH B 40ns 40ns 40ns 15ns 5V t6 5V CLR NOTES: (1) All input signal rise and fall times are measured from 10% to 90% of +5V • t R = tF = 5ns. (2) Timing measurement reference level is VIH + VIL . 2 INTERFACE LOGIC TRUTH TABLE MODE CLR CLK CS LATCH A LATCH B X X X X X 0 1 1 1 1 1 1 0 0 ↓ X X X X X X 0 1 0 0 0 X X X X 0 1 0 X X X X 1 0 0 X X NOTE: X = Don’t care FUNCTION Data Clocked In No Data Transfer DAC A Register Updated DAC B Register Updated DAC A and DAC B Updated Together All Registers Cleared Shift Registers Cleared = 000HEX, DAC Registers = 800HEX ↓ = Falling edge triggered. FUNCTIONAL BLOCK DIAGRAM , DAC2814 — Dual, 12-bit DAC, Serial Port Data In VREF In 23 11 20kΩ 19 BPO A LATCH A 22 LATCH B 12-Bit Shift Register 2 20kΩ 0-11 12-Bit Latch Register Bits 0-11 DAC A A1 Bit 11 CLK 21 14 VOUT A 20kΩ 18 BPO B Control Logic 12-Bit Shift Register CS 24 CLR MODE 20kΩ 0-11 12-Bit Latch Register DAC B Bits 0-11 A2 3 17 VOUT B 10kΩ 10kΩ +10V Voltage Reference 4 A3 12 Inv Out Bit 11 5 8 6 10 7 Data Out AGND +VL +VS –VS 1 16 15 DGND +VREF Out Inv In ® 7 DAC2814 DISCUSSION OF SPECIFICATIONS DIGITAL CROSSTALK Digital crosstalk is the glitch impulse measured at the output of one DAC due to a full scale transition on the other DAC—see Typical Performance Curves. It is dominated by digital coupling. Also, the integrated area of the glitch pulse is specified in nV–s. See table of electrical specifications. INPUT CODES All digital inputs of the DAC2814 are TTL and 5V CMOS compatible. Input codes for the DAC2814 are either USB (Unipolar Straight Binary) or BOB (Bipolar Offset Binary) depending on the mode of operation. See Figure 3 for ±10V bipolar connection. See Figures 4 and 5 for 0 to 10V and 0 to –10V unipolar connections. DIGITAL FEEDTHROUGH Digital feedthrough is the noise at a DAC output due to activity on the digital inputs—see Typical Performance Curves. UNIPOLAR AND BIPOLAR OUTPUTS FOR SELECTED INPUT DIGITAL INPUT FFFHEX 800HEX 7FFHEX 000HEX OPERATION UNIPOLAR (USB) BIPOLAR (BOB) +Full scale +1/2 Full scale +1/2 Full scale – 1 LSB Zero +Full scale Zero Zero – 1 LSB –Full scale DACs can be updated simultaneously or independently as required. Data are transferred on falling clock edges into a 24-bit shift register. DAC B MSB is loaded first. Data are transferred to the DAC registers when the LATCH signals are brought low. The data are latched when the LATCH signals are brought high. Both LATCH signals may be tied together to allow simultaneous update of the DACs if required. The output of the DAC shift register is provided to allow cascading of several DACS on the same bit stream. By using separate signals for LATCH A and LATCH B, it is possible to update either one of the two DACs every 12 clock cycles. When CLR is brought low, the input shift registers are cleared to 000HEX, while the DAC registers = 800HEX. If LATCH is brought low after CLR, the DACs are updated with 000HEX resulting in –10V (Bipolar) or 0V (Unipolar) on the output. INTEGRAL OR RELATIVE LINEARITY This term, also know as end point linearity, describes the transfer function of analog output to digital input code. Integral linearity error is the deviation of the analog output versus code transfer function from a straight line drawn through the end points. DIFFERENTIAL NONLINEARITY Differential nonlinearity is the deviation from an ideal 1 LSB change in the output voltage when the input code changes by 1 LSB. A differential nonlinearity specification of ±1 LSB maximum guarantees monotonicity. CIRCUIT DESCRIPTION UNIPOLAR OFFSET ERROR The output voltage for code 000HEX when the DAC is in unipolar mode of operation. Each of the two DACs in the DAC2814 consists of a CMOS logic section, a CMOS DAC cell, and an output amplifier. One buried-zener +10.0V reference and a reference inverter (for a –10.0V reference) are shared by both DACs. Figure 1 is a simplified circuit for a DAC cell. An R, 2R ladder network is driven by a voltage reference at VREF. Current from the ladder is switched either to IOUT or AGND by 12 single-pole double-throw CMOS switches. This maintains constant current in each leg of the ladder regardless of digital input code. This makes the resistance at VREF constant (it can be driven by either a voltage or current reference). The reference can be either positive or negative polarity with a range of up to ±10V. BIPOLAR ZERO ERROR The output voltage for code 800HEX when the DAC is in the bipolar mode of operation. GAIN ERROR The deviation of the output voltage span (VMAX – VMIN) from the ideal span of 10V – 1 LSB (unipolar mode) or 20V – 1 LSB (bipolar mode). The gain error is specified with and without the internal +10V reference error included. R OUTPUT SETTLING TIME R R VREF The time required for the output voltage to settle within a percentage-of-full-scale error band for a full scale transition. Settling to ±0.012% (1/2 LSB) is specified for the DAC2814. 2R 2R 2R 2R R R FB IOUT DIGITAL-TO-ANALOG GLITCH D11 (MSB) Ideally, the DAC output would make a clean step change in response to an input code change. In reality glitches occur during the transition. See Typical Performance Curves. D10 D9 D0 (LSB) AGND FIGURE 1. Simplified Circuit Diagram of DAC Cell. ® DAC2814 2R 8 DAC2814 DAC2814 DAC A DAC A VOUT A VOUT A DAC B DAC B VOUT B VOUT B AGND AGND R GND R GND NOTE: Ideally RGND = 0Ω FIGURE 2. Recommended Ground Connections for Multiple DAC packages. OUTPUT RANGE CONNECTIONS CMOS switches included in series with the ladder terminating resistor and the feedback resistor, RFB, compensate for the temperature drift of the ladder switch ON resistance. ±10V Output Range For a ±10V bipolar outputs connect the DAC2814 as shown in Figure 3. Connect the MODE to logic high (+5V) for reset to bipolar zero. With MODE connected low (GND) reset will be to –Full-Scale. The output op amps are connected as transimpedance amplifiers to convert the DAC-cell output current into an output voltage. They have been specially designed and compensated for precision and fast settling in this application. 0 To +10V Output Range For 0 to +10V unipolar outputs connect the DAC2814 as shown in Figure 4. Connect the MODE to logic low (GND) for reset to unipolar zero. POWER SUPPLY CONNECTIONS The DAC2814 is specified for operation with power supplies of VL = +5V and VS = either ±12V or ±15V. Even with the VS supplies at ±11.4V the DACs can swing a full ±10V. Power supply decoupling capacitors (1µF tantalum) should be located close to the DAC power supply connections. 0 To –10V Output Range For 0 to –10V unipolar outputs connect the DAC2814 as shown in Figure 5. Connect the MODE to logic low (GND) for reset to unipolar zero. Separate digital and analog ground pins are provided to permit separate current returns. They should be connected together at one point. Proper layout of the two current returns will prevent digital logic switching currents from degrading the analog output signal. The analog ground current is code dependent so the impedance to the system reference ground must be kept to a minimum. Connect DACs as shown in Figure 2 or use a ground plane to keep ground impedance less than 0.1Ω for less than 0.1LSB error. CONNECTION TO DIGITAL BUS Cascaded Bus Connection Multiple DAC2814s can be connected to the same CLK and DATA input lines in two ways. Since the output of the DAC shift register is available, any number of DAC2814s can be cascaded on the same input bit stream as shown in Figure 6. This arrangement allows all DACs in the system to be updated simultaneously and requires a minimum number of control signal inputs. However, up to 24N CLK cycles may be required to update any given DAC, where N = number of DAC2814s. –10V REFERENCE An internal inverting amplifier (Gain = –1.0V/V) is provided to invert the +10V reference. Connect +VREF Out to Inv In for a –10V reference at Inv Out. Parallel Bus Connection Several DAC2814s can also have their DATA inputs connected in parallel as shown in Figure 7. This allows any DAC in the system to be updated in a maximum of 24 CLK cycles. ® 9 DAC2814 +5V 6 DAC2814 16 + 1µF 10kΩ 10 +15V 1µF 10V Ref + 10kΩ A3 12 7 –15V 1µF 15 + 11 20kΩ 19 20kΩ DAC A A1 Serial Data and Control In 20kΩ 14 VOUT A 18 20kΩ DAC B A2 MODE 4 1 VOUT B 8 DGND +5V 17 AGND FIGURE 3. Analog Connections for ±10V DAC Output. +5V 6 DAC2814 16 + 1µF 10kΩ 10 +15V 1µF + 10V Ref 10kΩ A3 12 7 –15V 1µF 15 + 11 20kΩ 19 20kΩ DAC A A1 Serial Data and Control In 20kΩ 14 VOUT A 18 20kΩ DAC B A2 MODE 4 1 8 DGND FIGURE 4. Analog Connections for 0 to +10V DAC Output. ® DAC2814 10 AGND 17 VOUT B +5V 6 DAC2814 + 1µF 10 +15V 1µF 16 7 –15V 1µF 10V Ref + + 11 20kΩ 19 20kΩ DAC A 14 A1 Serial Data and Control In 20kΩ VOUT A 18 20kΩ DAC B 17 A2 MODE 4 1 VOUT B 8 DGND AGND FIGURE 5. Analog Connections for 0 to –10V DAC Output. Multiple DAC2814s Cascaded Data LATCH 23 22 2 CLK 21 23 22 2 21 23 22 2 21 Data In CS Multiple DAC2814s Paralleled 24 Data LATCH A LATCH 1 Data In Data Out CS 5 CLK 24 LATCH 2 Data Out CS 5 21 24 23 LATCH A LATCH 3 22 2 LATCH B CLK 22 2 LATCH B Data In 21 23 LATCH A CLK 22 2 LATCH B CLK 23 Data Out 5 21 To Other DACs Data In CS 24 LATCH A LATCH B CLK Data In Data Out CS 5 24 LATCH A LATCH B CLK Data In Data Out CS 5 24 LATCH A LATCH B CLK Data Out 5 FIGURE 7. Parallel Bus Connection for Multiple DAC packages. FIGURE 6. Cascaded Serial Bus Connection for Multiple DAC packages. ® 11 DAC2814 IMPORTANT NOTICE Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgment, including those pertaining to warranty, patent infringement, and limitation of liability. TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements. Customers are responsible for their applications using TI components. In order to minimize risks associated with the customer’s applications, adequate design and operating safeguards must be provided by the customer to minimize inherent or procedural hazards. TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. TI’s publication of information regarding any third party’s products or services does not constitute TI’s approval, warranty or endorsement thereof. Copyright  2000, Texas Instruments Incorporated
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