DAC53202, DAC63202
SLASF47 – MAY 2022
DACx3202 12-Bit and 10-Bit, Dual, Voltage and Current Output Smart DACs With
Auto-Detected I2C, PMBus™, or SPI Interface
1 Features
2 Applications
•
•
•
•
•
•
•
•
•
•
•
•
•
•
Rack server
Optical module
Inter-DC interconnect (metro)
High performance computing
Standard notebook PC
3 Description
The 12-bit DAC63202 and 10-bit DAC53202
(DACx3202) are a pin-compatible family of dualchannel, buffered, voltage-output and current-output
smart digital-to-analog converters (DACs). The
DACx3202 devices support Hi-Z power-down mode
and Hi-Z output during power-off conditions. The
DAC outputs provide a force-sense option for
use as a programmable comparator and current
sink. The multifunction GPIO, function generation,
and NVM enable these smart DACs for processorless applications and design reuse. These devices
automatically detect I2C, PMBus, and SPI interfaces
and contain an internal reference.
The feature set combined with the tiny package and
low power make these smart DACs an excellent
choice for applications such as voltage margining and
scaling, dc set-point for biasing and calibration, and
waveform generation.
Device Information
PART NUMBER
PACKAGE(1)
BODY SIZE (NOM)
DACx3202
WQFN (16)
3.00 mm x 3.00 mm
(1)
For all available packages, see the orderable addendum at
the end of the data sheet.
VDD
10 kΩ
0.1 μ
VREF
CAP
1.5 μF
LDO
L
VIN
PH
IN
SMPS / LDO
VOUT
BOOT
CB
SENSE
CL
Internal
Reference
R1
VFB
R3
R2
R3
GND
Power-supply: 0
NVM
VOUT/
IOUT
DAC
REG
DAC
BUF
VOUT/
IOUT
DAC
REG
DAC
BUF
Output Configuration
Logic
Power-supply: 1
SCL/SYNC
Digital Interface
•
•
•
Programmable voltage or current outputs with
flexible configuration:
– Voltage outputs:
• 1 LSB INL and DNL (10-bit and 8-bit)
• Gains of 1x, 1.5x, 2x, 3x, and 4x
– Current outputs:
• 1 LSB INL and DNL (8-bit)
• ±25 μA, ±50 μA, ±125 μA, ±250 μA output
range options
Programmable comparator mode for all channels
High-impedance output when VDD is off
High-impedance and resistive pulldown powerdown modes
50-MHz SPI-compatible interface
Automatically detected I2C, PMBus™, or SPI
interface
– 1.62-V VIH with VDD = 5.5 V
General-purpose input/output (GPIO) configurable
as multiple functions
Predefined waveform generation: sine, cosine,
triangular, sawtooth
User-programmable nonvolatile memory (NVM)
Internal, external, or power-supply as reference
Wide operating range:
– Power supply: 1.8 V to 5.5 V
– Temperature: –40˚C to +125˚C
Tiny package: 16-pin WQFN (3 mm × 3 mm)
SDA/SCLK
A0/SDI
PROTECT
DACx3202
AGND
Voltage Margining and Scaling Using the DACx3202
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
DAC53202, DAC63202
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SLASF47 – MAY 2022
Table of Contents
1 Features............................................................................1
2 Applications..................................................................... 1
3 Description.......................................................................1
4 Revision History.............................................................. 2
5 Pin Configuration and Functions...................................3
6 Specifications.................................................................. 4
6.1 Absolute Maximum Ratings........................................ 4
6.2 ESD Ratings............................................................... 4
6.3 Recommended Operating Conditions.........................4
6.4 Thermal Information....................................................4
6.5 Electrical Characteristics: Voltage Output...................5
6.6 Electrical Characteristics: Current Output...................7
6.7 Electrical Characteristics: Comparator Mode..............8
6.8 Electrical Characteristics: General..............................9
6.9 Timing Requirements: I2C Standard Mode............... 10
6.10 Timing Requirements: I2C Fast Mode.....................10
6.11 Timing Requirements: I2C Fast Mode Plus............. 10
6.12 Timing Requirements: SPI Write Operation............ 11
6.13 Timing Requirements: SPI Read and Daisy
Chain Operation (FSDO = 0)....................................... 11
6.14 Timing Requirements: SPI Read and Daisy
Chain Operation (FSDO = 1)....................................... 11
6.15 Timing Requirements: GPIO................................... 12
6.16 Timing Diagrams..................................................... 12
6.17 Typical Characteristics: Voltage Output.................. 14
6.18 Typical Characteristics: Current Output.................. 19
6.19 Typical Characteristics: Comparator....................... 23
6.20 Typical Characteristics: General............................. 24
7 Detailed Description......................................................25
7.1 Overview................................................................... 25
7.2 Functional Block Diagram......................................... 25
7.3 Feature Description...................................................26
7.4 Device Functional Modes..........................................27
7.5 Programming............................................................ 44
7.6 Register Map.............................................................52
8 Application and Implementation.................................. 70
8.1 Application Information............................................. 70
8.2 Typical Application.................................................... 70
9 Power Supply Recommendations................................73
10 Layout...........................................................................73
10.1 Layout Guidelines................................................... 73
10.2 Layout Example...................................................... 73
11 Device and Documentation Support..........................74
11.1 Documentation Support.......................................... 74
11.2 Receiving Notification of Documentation Updates.. 74
11.3 Support Resources................................................. 74
11.4 Trademarks............................................................. 74
11.5 Electrostatic Discharge Caution.............................. 74
11.6 Glossary.................................................................. 74
12 Mechanical, Packaging, and Orderable
Information.................................................................... 74
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
2
DATE
REVISION
NOTES
May 2022
*
Initial Release
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AGND
CAP
13
3
10
NC
4
9
NC
7
8
SDA/SCLK
NC
14
OUT1
A0/SDI
NC
VDD
11
Thermal Pad
6
2
15
FB1
SCL/SYNC
OUT0
VREF
12
5
1
GPIO/SDO
FB0
16
5 Pin Configuration and Functions
Not to scale
Figure 5-1. RTE (16-pin WQFN) Package, Top View
Table 5-1. Pin Functions
PIN
NO.
NAME
TYPE
DESCRIPTION
Voltage feedback pin for channel 0.
In voltage-output mode, connect to OUT0 for closed-loop amplifier output.
In current-output mode, keep the FB0 pin unconnected to minimize leakage current.
1
FB0
Input
2
OUT0
Output
Analog output voltage from DAC channel 0.
3
NC
NC
No connection. Leave the pin unconnected.
4
NC
NC
No connection. Leave the pin unconnected.
5
GPIO/SDO
Input/Output
General-purpose input/output configurable as LDAC, PD, PROTECT, RESET, SDO, and STATUS.
For STATUS and SDO, connect the pin to the IO voltage with an external pullup resistor.
If unused, connect the GPIO pin to VDD or AGND using an external resistor. This pin can ramp up before VDD.
6
SCL/SYNC
Output
I2C serial interface clock or SPI chip select input. This pin must be connected to the IO voltage using an external
pullup resistor. This pin can ramp up before VDD.
7
A0/SDI
Input
8
SDA/SCLK
Input/Output
9
NC
NC
No connection. Leave the pin unconnected.
10
NC
NC
No connection. Leave the pin unconnected.
11
OUT1
Output
Analog output voltage from DAC channel 1.
12
FB1
Input
Address configuration pin for I2C or serial data input for SPI.
For A0, connect this pin to VDD, AGND, SDA, or SCL for address configuration (Section 7.5.2.2.1).
For SDI, this pin does not need to be pulled up or pulled down. This pin can ramp up before VDD.
Bidirectional I2C serial data bus or SPI clock input. This pin must be connected to the IO voltage using an external
pullup resistor in I2C mode. This pin can ramp up before VDD.
Voltage feedback pin for channel 1.
In voltage-output mode, connect to OUT1 for closed-loop amplifier output.
In current-output mode, keep the FB1 pin unconnected to minimize leakage current.
13
CAP
Power
External bypass capacitor for the internal LDO. Connect a capacitor (approximately 1.5 μF) between CAP and AGND.
14
AGND
Ground
Ground reference point for all circuitry on the device.
15
VDD
Power
Supply voltage.
16
VREF
Power
External reference input. Connect a capacitor (approximately 0.1 μF) between VREF and AGND.
Use a pullup resistor to VDD when the external reference is not used. This pin must not ramp up before VDD. In case
an external reference is used, make sure the reference ramps up after VDD.
Ground
Connect the thermal pad to AGND.
Thermal
Thermal Pad
pad
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6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)
MIN
VDD
VREF
MAX
UNIT
Supply voltage, VDD to AGND
–0.3
6
V
Digital inputs to AGND
–0.3
VDD + 0.3
V
CAP to AGND
–0.3
1.65
V
VFBX to AGND
–0.3
VDD + 0.3
V
VOUTX to AGND
–0.3
VDD + 0.3
V
External reference, VREF to AGND
–0.3
VDD + 0.3
V
Current into any pin except the OUTx pins
–10
10
mA
TJ
Junction temperature
–40
150
°C
Tstg
Storage temperature
–65
150
°C
(1)
Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute Maximum Ratings do not imply
functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions.
If used outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not be fully
functional, and this may affect device reliability, functionality, performance, and shorten the device lifetime.
6.2 ESD Ratings
VALUE
V(ESD)
(1)
(2)
Electrostatic
discharge
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all
pins(1)
UNIT
±2000
Charged device model (CDM), per ANSI/ESDA/JEDEC JS-002, all pins(2)
V
±500
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN
NOM
MAX
UNIT
VDD
Positive supply voltage to ground (AGND)
1.7
5.5
V
VREF
External reference to ground (AGND)
VIH
Digital input high voltage, 1.7 V < VDD ≤ 5.5 V
1.7
VDD
V
VIL
Digital input low voltage
0.4
V
CCAP
External capacitor on CAP pin
0.5
15
μF
TA
Ambient temperature
–40
125
°C
1.62
V
6.4 Thermal Information
DACx3202
THERMAL
METRIC(1)
RTE (WQFN)
UNIT
16 PINS
RθJA
Junction-to-ambient thermal resistance
49
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
50
°C/W
RθJB
Junction-to-board thermal resistance
24.1
°C/W
ΨJT
Junction-to-top characterization parameter
1.1
°C/W
ΨJB
Junction-to-board characterization parameter
24.1
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
8.7
°C/W
(1)
4
For information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report.
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6.5 Electrical Characteristics: Voltage Output
at 1.7 V ≤ VDD ≤ 5.5 V, DAC reference tied to VDD, gain = 1x, DAC output pin (OUT) loaded with resistive load (RL =
5 kΩ to AGND) and capacitive load (CL = 200 pF to AGND), digital inputs at VDD or AGND, and all minimum and maximum
specifications at –40°C ≤ TA ≤ +125°C and typical specifications at TA = 25°C (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
STATIC PERFORMANCE
Resolution
INL
Integral nonlinearity(1)
DAC63202
12
DAC53202
10
DAC63202
–4
4
DAC53202
–1
1
–1
1
DNL Differential nonlinearity(1)
Zero-code error(4)
Zero-code error temperature
coefficient(4)
Code 0d into DAC, external reference, VDD = 5.5 V
6
12
Code 0d into DAC, internal VREF, gain = 4x,
VDD = 5.5 V
6
15
Code 0d into DAC
1.7 V ≤ VDD < 2.7 V, FBx pin shorted to OUTx, DAC
code: 32d for 12-bit resolution, 8d for 10-bit resolution
Offset error(4) (6)
2.7 V ≤ VDD ≤ 5.5 V, FBx pin shorted to OUTx,
DAC code: 32d for 12-bit resolution, 8d for 10-bit
resolution
Offset-error temperature
coefficient(4)
FBx pin shorted to OUTx, DAC code: 32d for
12-bit resolution, 8d for 10-bit resolution
Gain error(4)
Between end-point codes: 32d to 4064d for 12-bit
resolution, 8d to 1016d for 10-bit resolution
Gain-error temperature
coefficient(4)
Between end-point codes: 32d to 4064d for 12-bit
resolution, 8d to 1016d for 10-bit resolution
Full-scale error(4) (6)
Full-scale-error temperature
coefficient(4)
Bits
±10
LSB
LSB
mV
µV/°C
–0.75
0.3
0.75
–0.5
0.25
0.5
%FSR
±0.0003
–0.5
0.25
%FSR/°C
0.5
±0.0008
%FSR/°C
1.7 V ≤ VDD < 2.7 V, DAC at full-scale
–1
1
2.7 V ≤ VDD ≤ 5.5 V, DAC at full-scale
–0.5
0.5
DAC at full-scale
%FSR
±0.0008
%FSR
%FSR/°C
OUTPUT
Output voltage
CL
Capacitive load(2)
Short-circuit current
Output-voltage headroom(2)
ZO
VFB dc output impedance(3)
Reference tied to VDD
0
VDD
RL = infinite, phase margin = 30°
200
Phase margin = 30°
1000
VDD = 1.7 V, full-scale output shorted to AGND or
zero-scale output shorted to VDD
15
VDD = 2.7 V, full-scale output shorted to AGND or
zero-scale output shorted to VDD
50
VDD = 5.5 V, full-scale output shorted to AGND or
zero-scale output shorted to VDD
60
To VDD (DAC output unloaded, internal reference =
1.21 V), VDD ≥ 1.21 V ☓ gain + 0.2 V
0.2
To VDD and AGND (DAC output unloaded, external
reference at VDD, gain = 1x, the VREF pin is not
shorted to VDD)
0.8
V
pF
mA
V
%FSR
To VDD and AGND (ILOAD = 10 mA at VDD = 5.5 V, ILOAD
= 3 mA at VDD = 2.7 V, ILOAD = 1 mA at VDD = 1.8 V),
external reference at VDD, gain = 1x, the VREF pin is
not shorted to VDD
10
DAC output enabled, internal reference (gain = 1.5x or
2x) or external reference at VDD (gain = 1x), the VREF
pin is not shorted to VDD
400
500
600
DAC output enabled, internal VREF, gain = 3x or 4x
325
400
485
kΩ
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6.5 Electrical Characteristics: Voltage Output (continued)
at 1.7 V ≤ VDD ≤ 5.5 V, DAC reference tied to VDD, gain = 1x, DAC output pin (OUT) loaded with resistive load (RL =
5 kΩ to AGND) and capacitive load (CL = 200 pF to AGND), digital inputs at VDD or AGND, and all minimum and maximum
specifications at –40°C ≤ TA ≤ +125°C and typical specifications at TA = 25°C (unless otherwise noted)
PARAMETER
Power supply rejection ratio
(dc)
TEST CONDITIONS
Internal VREF, gain = 2x, DAC at midscale,
VDD = 5 V ±10%
MIN
TYP
0.25
MAX
UNIT
mV/V
DYNAMIC PERFORMANCE
tsett
Output voltage settling time
Slew rate
Power-on glitch magnitude
Output-enable glitch
magnitude
Vn
Output noise voltage (peak to
peak)
1/4 to 3/4 scale and 3/4 to 1/4 scale settling to
10%FSR, VDD = 5.5 V
20
1/4 to 3/4 scale and 3/4 to 1/4 scale settling to
10%FSR, VDD = 5.5 V, internal VREF, gain = 4x
25
VDD = 5.5 V
0.3
At startup (DAC output disabled)
75
At startup (DAC output disabled), RL = 100 kΩ
200
DAC output disabled to enabled (DAC registers at zero
scale), RL = 100 kΩ
250
f = 0.1 Hz to 10 Hz, DAC at midscale, VDD = 5.5 V
50
Internal VREF, gain = 4x, f = 0.1 Hz to 10 Hz,
DAC at midscale, VDD = 5.5 V
90
f = 1 kHz, DAC at midscale, VDD = 5.5 V
Output noise density
µs
V/µs
mV
mV
µVPP
0.35
µV/√Hz
Internal VREF, gain = 4x, f = 1 kHz, DAC at midscale,
VDD = 5.5 V
0.9
Power supply rejection ratio
(ac)(3)
Internal VREF, gain = 4x, 200-mV 50-Hz or 60-Hz sine
wave superimposed on power supply voltage, DAC at
midscale
-68
dB
Code change glitch impulse
±1-LSB change around midscale (including
feedthrough)
10
nV-s
Code change glitch impulse
magnitude
±1-LSB change around midscale (including
feedthrough)
15
mV
150
µA/ch
POWER
IDD
(1)
(2)
(3)
(4)
(5)
(6)
6
Current flowing into VDD(4) (5)
Normal operation, DACs at full scale, digital pins static,
external reference at VDD but the VREF pin is not
shorted to VDD
Measured with DAC output unloaded. For external reference and internal reference VDD ≥ 1.21 x gain + 0.2 V, between end-point
codes: 32d to 4064d for 12-bit resolution, 8d to 1016d for 10-bit resolution.
Specified by design and characterization, not production tested.
Specified with 200-mV headroom with respect to reference value when internal reference is used.
Measured with DAC output unloaded.
The total power consumption is calculated by IDD x (total number of channels powered on) + (sleep-mode current).
When a DAC channel is configured in IOUT mode for long term and then switched to VOUT mode, the VOUT mode can show
parametric drift.
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6.6 Electrical Characteristics: Current Output
at 1.7 V ≤ VDD ≤ 5.5 V, ±250-µA output range, digital inputs at VDD or AGND, and all minimum and maximum specifications
at –40°C ≤ TA ≤ +125°C and typical specifications at TA = 25°C (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
1
LSB
STATIC PERFORMANCE
Resolution
INL
8
Integral nonlinearity
DNL Differential nonlinearity
DAC codes between 0d and 255d
–1
DAC codes between 0d and 255d
–1
Offset error
DAC at midscale
Gain error
DAC codes between 0d and 255d
Bits
1
LSB
±1
%FSR
±1.3
%FSR
OUTPUT
Output compliance voltage(1)
ZO
IOUT dc output
impedance(2)
Power supply rejection ratio
(dc)
To VDD and AGND
DAC at midscale, DAC output kept at VDD/2
400
mV
60
MΩ
DAC at midscale, all bipolar ranges, VDD changed from
4.5 V to 5.5 V
0.23
60
µs
nAPP
LSB/V
DYNAMIC PERFORMANCE
tsett
Output current settling time
1/4 to 3/4 scale and 3/4 to 1/4 scale settling to 1 LSB
at 8-bit resolution, VDD = 5.5 V, common-mode voltage
at OUTx pin is VDD/2
Vn
Output noise current (peak to
peak)
0.1 Hz to 10 Hz, DAC at midscale,
VDD = 5.5 V, ±250-µA output range
150
Output noise density
f = 1 kHz, DAC at midscale,
VDD = 5.5 V, ±250-µA output range
1
nA/√Hz
Power supply rejection ratio
(ac)(3)
±250-µA output range, 200-mV 50-Hz or 60-Hz sine
wave superimposed on power-supply voltage, DAC at
midscale
0.65
LSB/V
POWER
IDD
(1)
(2)
(3)
(4)
Current flowing into
VDD(3) (4)
Normal operation, DACs at full scale, ±25-µA output
range, digital pins static
42
50
Normal operation, DACs at full scale, ±50-µA output
range, digital pins static
56
70
Normal operation, DACs at full scale, ±125-µA output
range, digital pins static
98
120
Normal operation, DACs at full scale, ±250-µA output
range, digital pins static
167
200
µA/ch
Measured between DAC codes 0d and 255d.
Specified by design and characterization, not production tested.
The current flowing into VDD does not account for the load current sourced or sinked on the OUTx pins. The VREF pin is connected to
VDD.
The total power consumption is calculated by IDD x (total number of channels powered on) + (sleep-mode current).
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6.7 Electrical Characteristics: Comparator Mode
at 1.7 V ≤ VDD ≤ 5.5 V, DAC reference tied to VDD, gain = 1x in voltage output mode, DAC output pin (OUT) loaded with
resistive load (RL = 5 kΩ to AGND) and capacitive load (CL = 200 pF to AGND), digital inputs at VDD or AGND, and all
minimum and maximum specifications at –40°C ≤ TA ≤ +125°C and typical specifications at TA = 25°C (unless otherwise
noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
–5
0
5
UNIT
STATIC PERFORMANCE
1.7 V ≤ VDD ≤ 5.5 V, DAC at midscale, comparator
input at Hi-Z, and DAC operating with external
reference
Offset error(1) (2)
Offset error time
drift(1)
VDD = 5.5 V, external reference, TA = 125°C, FBx in
Hi-Z mode, DAC at full scale and VFB at 0 V or DAC
at zero scale and VFB at 1.84 V, drift specified for 10
years of continuous operation
4
mV
mV
OUTPUT
Input voltage
VOL
Logic low output voltage
VREF connected to VDD, FBx resistor network
connected to ground
0
VDD
VREF connected to VDD, FBx resistor network
disconnected from ground
0
VDD (1/3 – 1/100)
V
ILOAD = 100 μA, output in open-drain mode
0.1
V
DAC at midscale with 10-bit resolution, FBx input at
Hi-Z, and transition step at FBx node is
(VDAC – 2 LSB) to (VDAC + 2 LSB), transition time
measured between 10% and 90% of output, output
current of 100 µA, comparator output configured in
push-pull mode, load capacitor at DAC output is
25 pF
10
µs
DYNAMIC PERFORMANCE
tresp
(1)
(2)
8
Output response time
Specified by design and characterization, not production tested.
This specification does not include the total unadjusted error (TUE) of the DAC.
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6.8 Electrical Characteristics: General
at 1.7 V ≤ VDD ≤ 5.5 V, DAC reference tied to VDD, gain = 1x in voltage output mode or ±250-µA output range in current
output mode, DAC output pin (OUT) loaded with resistive load (RL = 5 kΩ to AGND) in voltage-output mode and capacitive
load (CL = 200 pF to AGND), digital inputs at VDD or AGND, and all minimum and maximum specifications at
–40°C ≤ TA ≤ +125°C and typical specifications at TA = 25°C (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
1.1979
1.212
1.224
V
INTERNAL REFERENCE
Initial accuracy
TA = 25°C
Reference output temperature
coefficient(1) (2)
50
ppm/°C
EXTERNAL REFERENCE
VREF input impedance(1) (3)
192
kΩ/ch
EEPROM
Endurance(1)
Data retention(1)
–40°C ≤ TA ≤ +85°C
TA = 125°C
TA = 25°C
20000
50
EEPROM programming write
cycle time(1)
Device boot-up time(1)
Cycles
1000
Years
200
Time taken from power valid (VDD ≥ 1.7 V) to output
valid state (output state as programmed in EEPROM),
0.5-µF capacitor on the CAP pin
ms
5
ms
DIGITAL INPUTS
Digital feedthrough
Voltage output mode, DAC output static at midscale,
fast mode plus, SCL toggling
20
nV-s
Pin capacitance
Per pin
10
pF
POWER-DOWN MODE
DAC in sleep mode, internal reference powered down,
external reference at 5.5 V
IDD
Current flowing into VDD(1)
28
DAC in sleep mode, internal reference
enabled, additional current through internal reference
10
DAC channels enabled, internal reference enabled,
additional current through internal reference per DAC
channel in voltage-output mode
12.5
µA
HIGH-IMPEDANCE OUTPUT
DAC in Hi-Z output mode, 1.7 V ≤ VDD ≤ 5.5 V
VDD = 0 V, VOUT ≤ 1.5 V, decoupling capacitor between
VDD and AGND = 0.1 μF
ILEAK
Current flowing into VOUTX and
VDD = 0 V, 1.5 V < VOUT ≤ 5.5 V, decoupling capacitor
VFBX
between VDD and AGND = 0.1 μF
100 kΩ between VDD and AGND, VOUT ≤ 1.25 V, series
resistance of 10 kΩ at OUTx pin
(1)
(2)
(3)
10
200
nA
500
±2
µA
Specified by design and characterization, not production tested.
Measured at –40°C and +125°C and calculated the slope.
Impedances for the DAC channels are connected in parallel.
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6.9 Timing Requirements: I2C Standard Mode
all input signals are timed from VIL to 70% of Vpull-up, 1.7 V ≤ VDD ≤ 5.5 V, –40°C ≤ TA ≤ +125°C, and 1.7 V ≤ Vpull-up ≤ VDD V
MIN
fSCLK
SCL frequency
tBUF
Bus free time between stop and start conditions
tHDSTA
Hold time after repeated start
tSUSTA
NOM
MAX
UNIT
100
kHz
4.7
µs
4
µs
Repeated start setup time
4.7
µs
tSUSTO
Stop condition setup time
4
µs
tHDDAT
Data hold time
0
ns
tSUDAT
Data setup time
250
ns
tLOW
SCL clock low period
4700
ns
tHIGH
SCL clock high period
4000
ns
tF
Clock and data fall time
300
tR
Clock and data rise time
1000
ns
tVD_DAT
Data valid time
3.45
µs
tVD_ACK
Data valid acknowledge time
3.45
µs
ns
6.10 Timing Requirements: I2C Fast Mode
all input signals are timed from VIL to 70% of Vpull-up, 1.7 V ≤ VDD ≤ 5.5 V, –40°C ≤ TA ≤ +125°C, and 1.7 V ≤ Vpull-up ≤ VDD V
MIN
NOM
MAX
UNIT
400
kHz
fSCLK
SCL frequency
tBUF
Bus free time between stop and start conditions
1.3
µs
tHDSTA
Hold time after repeated start
0.6
µs
tSUSTA
Repeated start setup time
0.6
µs
tSUSTO
Stop condition setup time
0.6
µs
tHDDAT
Data hold time
0
ns
tSUDAT
Data setup time
100
ns
tLOW
SCL clock low period
1300
ns
tHIGH
SCL clock high period
600
tF
Clock and data fall time
300
tR
Clock and data rise time
300
ns
tVD_DAT
Data valid time
0.9
µs
tVD_ACK
Data valid acknowledge time
0.9
µs
ns
ns
6.11 Timing Requirements: I2C Fast Mode Plus
all input signals are timed from VIL to 70% of Vpull-up, 1.7 V ≤ VDD ≤ 5.5 V, –40°C ≤ TA ≤ +125°C, and 1.7 V ≤ Vpull-up ≤ VDD V
MIN
fSCLK
SCL frequency
tBUF
Bus free time between stop and start conditions
tHDSTA
NOM
MAX
UNIT
1
MHz
0.5
µs
Hold time after repeated start
0.26
µs
tSUSTA
Repeated start setup time
0.26
µs
tSUSTO
Stop condition setup time
0.26
µs
tHDDAT
Data hold time
0
ns
tSUDAT
Data setup time
50
ns
tLOW
SCL clock low period
0.5
µs
tHIGH
SCL clock high period
0.26
tF
Clock and data fall time
tR
Clock and data rise time
120
ns
tVD_DAT
Data valid time
0.45
µs
tVD_ACK
Data valid acknowledge time
0.45
µs
10
µs
120
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6.12 Timing Requirements: SPI Write Operation
all input signals are specified with tr = tf = 1 V/ns (10% to 90% of VIO) and timed from a voltage level of (VIL + VIH) / 2,
1.7 V ≤ VIO ≤ 5.5 V, 1.7 V ≤ VDD ≤ 5.5 V, and –40°C ≤ TA ≤ +125°C
MIN
NOM
MAX
UNIT
50
MHz
f(SCLK)
Serial clock frequency
tSCLKHIGH
SCLK high time
9
ns
tSCLKLOW
SCLK low time
9
ns
tSDIS
SDI setup time
8
ns
tSDIH
SDI hold time
8
ns
tCSS
CS to SCLK falling edge setup time
18
ns
tCSH
SCLK falling edge to CS rising edge
10
ns
tCSHIGH
CS hight time
50
ns
tDACWAIT
Sequential DAC update wait time for same channel
2
µs
tBCASTWAIT
Broadcast DAC update wait time
2
µs
6.13 Timing Requirements: SPI Read and Daisy Chain Operation (FSDO = 0)
all input signals are specified with tr = tf = 1 V/ns (10% to 90% of VIO) and timed from a voltage level of (VIL + VIH) / 2,
1.7 V ≤ VIO ≤ 5.5 V, 1.7 V ≤ VDD ≤ 5.5 V, –40°C ≤ TA ≤ +125°C, and FSDO = 0
MIN
NOM
MAX
UNIT
1.25
MHz
f(SCLK)
Serial clock frequency
tSCLKHIGH
SCLK high time
350
ns
tSCLKLOW
SCLK low time
350
ns
tSDIS
SDI setup time
8
ns
tSDIH
SDI hold time
8
ns
tCSS
SYNC to SCLK falling edge setup time
400
ns
tCSH
SCLK falling edge to SYNC rising edge
400
ns
tCSHIGH
SYNC hight time
1
µs
tSDODLY
SCLK rising edge to SDO falling edge, IOL ≤ 5 mA, CL = 20 pF.
300
ns
6.14 Timing Requirements: SPI Read and Daisy Chain Operation (FSDO = 1)
all input signals are specified with tr = tf = 1 V/ns (10% to 90% of VIO) and timed from a voltage level of (VIL + VIH) / 2,
1.7 V ≤ VIO ≤ 5.5 V, 1.7 V ≤ VDD ≤ 5.5 V, –40°C ≤ TA ≤ +125°C, and FSDO = 1
MIN
NOM
MAX
UNIT
2.5
MHz
f(SCLK)
Serial clock frequency
tSCLKHIGH
SCLK high time
175
ns
tSCLKLOW
SCLK low time
175
ns
tSDIS
SDI setup time
8
ns
tSDIH
SDI hold time
8
ns
tCSS
SYNC to SCLK falling edge setup time
300
ns
tCSH
SCLK falling edge to SYNC rising edge
300
ns
tCSHIGH
SYNC hight time
tSDODLY
SCLK rising edge to SDO falling edge, IOL ≤ 5 mA, CL = 20 pF.
1
µs
300
ns
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6.15 Timing Requirements: GPIO
all input signals are specified with tr = tf = 1 V/ns (10% to 90% of VIO) and timed from a voltage level of (VIL + VIH) / 2,
1.7 V ≤ VIO ≤ 5.5 V, 1.7 V ≤ VDD ≤ 5.5 V, and –40°C ≤ TA ≤ +125°C
MIN
GPI high time(1)
tGPIHIGH
NOM
MAX
2
time(1)
UNIT
µs
tGPILOW
GPI low
tGPAWGD
LDAC falling edge to DAC update delay(2)
tCS2LDAC
SYNC rising edge to LDAC falling edge
1
µs
tSTP2LDAC
I2C stop bit rising edge to LDAC falling edge
1
µs
tLDACW
LDAC low time
2
µs
(1)
2
µs
2
µs
The SCL, SDA, A0, and A1 pins can be configured as GPIOs that perform different channel-specific or independent operations. The
actual response time of the GPIO is determined by the delay provided by the configured function and the settling time of the DAC.
The GPIOs can be configured as channel-specific or global LDAC function.
(2)
6.16 Timing Diagrams
Low byte ACK cycle
tR
tLOW
tF
SCL
tHDSTA
tHIGH
tHDDAT
tSUSTA
tSUSTO
tSUDAT
tHDSTA
SDA
tBUF
P
S
S
P
Figure 6-1. I2C Timing Diagram
tCSHIGH
tCSS
tCSH
SYNC
tSCLKLOW
SCLK
tSCLKHIGH
tSDIS
SDI
tSDIH
Bit 23
Bit 1
Bit 0
GPIO/
LDAC
tCS2LDAC tLDACW
Figure 6-2. SPI Write Timing Diagram
12
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tCSHIGH
tCSS
tCSH
SYNC
tSCLKLOW tSCLKHIGH
SCLK
FIRST READ COMMAND
SDI
Bit 23
tSDIS
Bit 22
ANY COMMAND
Bit 0
Bit 23
Bit 1
Bit 0
Bit 23
Bit 1
Bit 0
tSDIH
SDO
FSDO = 0
tSDODLY
DATA FROM FIRST READ COMMAND
SDO
FSDO = 1
Bit 23
Bit 1
tSDODZ
Bit 0
tSDODLY
DATA FROM FIRST READ COMMAND
Figure 6-3. SPI Read Timing Diagram
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6.17 Typical Characteristics: Voltage Output
4
4
3.2
3.2
2.4
2.4
Voltage Output INL (LSB)
Voltage Output INL (LSB)
at TA = 25°C, VDD = 5.5 V, external reference = 5.5 V, gain = 1x, 12-bit resolution, and DAC outputs unloaded (unless
otherwise noted)
1.6
0.8
0
-0.8
-1.6
-2.4
Channel 1
Channel 0
-3.2
-4
32
544
1056
1568
2080
Code
2592
3104
1.6
0.8
0
-0.8
-1.6
-2.4
Channel 1
Channel 0
-3.2
-4
32
3616 4064
544
1056
1568
2080
Code
2592
3104
3616 4064
Internal reference, gain = 4x
Figure 6-5. Voltage Output INL vs Digital Input Code
4
4
3.2
3.2
2.4
2.4
1.6
0.8
0
-0.8
-1.6
CH1
CH0
CH1
CH0
-2.4
-3.2
-4
-40
-25
-10
5
20
35
50
65
Temperature (C)
80
95
MAX
MAX
MIN
MIN
Voltage Output INL (LSB)
Voltage Output INL (LSB)
Figure 6-4. Voltage Output INL vs Digital Input Code
0
-0.8
-1.6
CH1
CH0
CH1
CH0
-2.4
-4
1.8
110 125
Figure 6-6. Voltage Output INL vs Temperature
2.725
3.65
Supply Voltage (V)
MAX
MAX
MIN
MIN
4.575
5.5
Figure 6-7. Voltage Output INL vs Supply Voltage
1
Channel 1
Channel 0
0.8
0.6
0.4
0.2
0
-0.2
-0.4
-0.6
Channel 1
Channel 0
0.8
Voltage Output DNL (LSB)
Voltage Output DNL (LSB)
0.8
-3.2
1
0.6
0.4
0.2
0
-0.2
-0.4
-0.6
-0.8
-0.8
-1
32
1.6
544
1056
1568
2080
Code
2592
3104
3616 4064
-1
32
544
1056
1568
2080
Code
2592
3104
3616 4064
Internal reference, gain = 4x
Figure 6-8. Voltage Output DNL vs Digital Input Code
14
Figure 6-9. Voltage Output DNL vs Digital Input Code
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6.17 Typical Characteristics: Voltage Output (continued)
1
1
0.8
0.8
0.6
0.6
0.4
0.2
0
-0.2
-0.4
CH1
CH0
CH1
CH0
-0.6
-0.8
-1
-40
-25
-10
5
20
35
50
65
Temperature (C)
80
95
MAX
MAX
MIN
MIN
Voltage Output DNL (LSB)
Voltage Output DNL (LSB)
at TA = 25°C, VDD = 5.5 V, external reference = 5.5 V, gain = 1x, 12-bit resolution, and DAC outputs unloaded (unless
otherwise noted)
0.2
0
-0.2
-0.4
-1
1.8
110 125
2.725
3.65
Supply Voltage (V)
MAX
MAX
MIN
MIN
4.575
5.5
Figure 6-11. Voltage Output DNL vs Supply Voltage
1.5
1.2
1.2
Voltage Output TUE (%FSR)
1.5
0.9
0.6
0.3
0
-0.3
-0.6
-0.9
Channel 1
Channel 0
-1.2
CH1
CH0
CH1
CH0
-0.6
-0.8
Figure 6-10. Voltage Output DNL vs Temperature
Voltage Output TUE (%FSR)
0.4
0.9
0.6
0.3
0
-0.3
-0.6
-0.9
Channel 1
Channel 0
-1.2
-1.5
-1.5
0
512
1024
1536
2048
Code
2560
3072
3584
4095
0
512
1024
1536
2048
Code
2560
3072
3584
4095
Internal reference, gain = 4x
Figure 6-13. Voltage Output TUE vs Digital Input Code
1.5
1.5
1.2
1.2
Voltage Output TUE (%FSR)
Voltage Output TUE (%FSR)
Figure 6-12. Voltage Output TUE vs Digital Input Code
0.9
0.6
0.3
0
-0.3
-0.6
-0.9
Channel 1
Channel 0
-1.2
-1.5
-40
-25
-10
5
20
35
50
65
Temperature (C)
80
95
110 125
0.9
0.6
0.3
0
-0.3
-0.6
-0.9
Channel 1
Channel 0
-1.2
-1.5
1.8
2.725
DAC channels at midscale
Figure 6-14. Voltage Output TUE vs Temperature
3.65
Supply Voltage (V)
4.575
5.5
DAC channels at midscale
Figure 6-15. Voltage Output TUE vs Supply Voltage
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6.17 Typical Characteristics: Voltage Output (continued)
0.5
0.5
0.4
0.4
Voltage Output Gain Error (%FSR)
Voltage Output Offset Error (%FSR)
at TA = 25°C, VDD = 5.5 V, external reference = 5.5 V, gain = 1x, 12-bit resolution, and DAC outputs unloaded (unless
otherwise noted)
0.3
0.2
0.1
0
-0.1
-0.2
-0.3
Channel 1
Channel 0
-0.4
-0.5
-40
-25
-10
5
20
35
50
65
Temperature (C)
80
95
110 125
0.1
0
-0.1
-0.2
-0.3
Channel 1
Channel 0
-0.4
-25
-10
5
20
35
50
65
Temperature (C)
80
95
110 125
Figure 6-17. Voltage Output Gain Error vs Temperature
2.76
AC Power-Supply Rejection Ratio (dB)
10
2.758
2.756
Voltage Output (V)
0.2
-0.5
-40
Figure 6-16. Voltage Output Offset Error vs Temperature
2.754
2.752
2.75
2.748
2.746
2.744
Channel 1
Channel 0
2.742
2.74
-5
0.3
-3.75
-2.5
-1.25
0
1.25
Load Current (mA)
2.5
3.75
0
-10
-20
-30
-40
-50
-60
-70
10
5
2030 50 100 200
500 1000
Frequency (Hz)
10000
100000
DAC channels at midscale
Figure 6-19. Voltage Output AC PSRR vs Frequency
Figure 6-18. Voltage Output vs Load Current
LDAC (1 V/div)
VOUT (1 LSB/div)
0
10
20
30
40
50
Time (s)
0
10
20
30
40
50
Time (s)
Figure 6-20. Voltage Output Code-to-Code Glitch - Rising Edge
16
LDAC (1 V/div)
VOUT (1 LSB/div)
Figure 6-21. Voltage Output Code-to-Code Glitch - Falling Edge
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6.17 Typical Characteristics: Voltage Output (continued)
at TA = 25°C, VDD = 5.5 V, external reference = 5.5 V, gain = 1x, 12-bit resolution, and DAC outputs unloaded (unless
otherwise noted)
Trigger (1 V/div)
VOUT (1 V/div)
Settling Band (+10% FSR)
Settling Band (-10% FSR)
Trigger (1 V/div)
VOUT (1 V/div)
Settling Band (+10% FSR)
Settling Band (-10% FSR)
0
10
20
30
40
50
Time (s)
0
10
20
30
40
50
Time (s)
Zero scale to full scale swing
Full scale to zero scale swing
Figure 6-22. Voltage Output Setting Time - Rising Edge
Figure 6-23. Voltage Output Setting Time - Falling Edge
VDD (1 V/div)
VOUT (1 mV/div)
VDD (1 V/div)
VOUT (15 mV/div)
0
200
400
600
800
1000
Time (s)
1200
1400
1600
0
200
400
DAC in Hi-Z power-down mode
2.7
1.8
2.4
1.6
2.1
1.8
1.5
1.2
0.9
1600
1.2
1
0.8
0.6
0.4
0.3
0.2
10000
1400
1.4
0.6
500 1000
Frequency (Hz)
1200
Figure 6-25. Voltage Output Power-Off Glitch
2
Noise Density (V/Hz)
Noise Density (V/Hz)
Figure 6-24. Voltage Output Power-On Glitch
2030 50 100 200
800
1000
Time (s)
DAC at zero scale
3
0
10
600
100000
0
10
2030 50 100 200
500 1000
Frequency (Hz)
10000
100000
Internal reference, gain = 4x
Figure 6-26. Voltage Output Noise Density
Figure 6-27. Voltage Output Noise Density
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6.17 Typical Characteristics: Voltage Output (continued)
35
30
25
20
15
10
5
0
-5
-10
-15
-20
-25
-30
-35
25
20
15
Noise Voltage (V)
Noise Voltage (V)
at TA = 25°C, VDD = 5.5 V, external reference = 5.5 V, gain = 1x, 12-bit resolution, and DAC outputs unloaded (unless
otherwise noted)
10
5
0
-5
-10
-15
-20
-25
0
1
2
3
4
5
6
Time (s)
7
8
9
10
0
1
2
Internal reference, gain = 4x, f = 0.1 Hz to 10 Hz
Figure 6-28. Voltage Output Flicker Noise
18
3
4
5
6
Time (s)
7
8
9
10
f = 0.1 Hz to 10 Hz
Figure 6-29. Voltage Output Flicker Noise
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6.18 Typical Characteristics: Current Output
1
1
0.8
0.8
0.6
0.6
Current Output INL (LSB)
Current Output INL (LSB)
at TA = 25°C, VDD = 5.5 V, output range: ±250 μA (unless otherwise noted)
0.4
0.2
0
-0.2
-0.4
-0.6
Channel 1
Channel 0
-0.8
32
64
96
128
Code
160
192
224
-0.4
1
1
0.8
0.8
0.6
0.6
0.4
0.2
0
-0.2
-0.4
CH1
CH0
CH1
CH0
-0.6
-0.8
-1
1.8
2.725
3.65
Supply Voltage (V)
MAX
MAX
MIN
MIN
4.575
0
0
-0.2
-0.4
80
95
MAX
MAX
MIN
MIN
110 125
Figure 6-34. Current Output DNL vs Temperature
32
64
96
128
Code
160
192
224
255
Figure 6-33. Current Output DNL vs Digital Input Code
Current Output DNL (LSB)
0.2
Channel 1
Channel 0
-1
0.6
0.4
20
35
50
65
Temperature (C)
110 125
-0.6
0.6
5
95
-0.4
1
-10
80
0
0.8
-25
20
35
50
65
Temperature (C)
-0.2
1
-1
-40
5
0.2
0.8
-0.8
-10
MAX
MAX
MIN
MIN
0.4
5.5
CH1
CH0
CH1
CH0
-25
-0.8
Figure 6-32. Current Output INL vs Supply Voltage
-0.6
CH1
CH0
CH1
CH0
-0.6
Figure 6-31. Current Output INL vs Temperature
Current Output DNL (LSB)
Current Output INL (LSB)
0
-0.2
-1
-40
255
Figure 6-30. Current Output INL vs Digital Input Code
Current Output DNL (LSB)
0.2
-0.8
-1
0
0.4
0.4
0.2
0
-0.2
-0.4
CH1
CH0
CH1
CH0
-0.6
-0.8
-1
1.8
2.725
3.65
Supply Voltage (V)
MAX
MAX
MIN
MIN
4.575
5.5
Figure 6-35. Current Output DNL vs Supply Voltage
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6.18 Typical Characteristics: Current Output (continued)
2
2
1.6
1.6
Current Output TUE (%FSR)
Current Output TUE (%FSR)
at TA = 25°C, VDD = 5.5 V, output range: ±250 μA (unless otherwise noted)
1.2
0.8
0.4
0
-0.4
-0.8
-1.2
Channel 1
Channel 0
-1.6
32
64
96
128
Code
160
192
224
0.8
0.4
0
-0.4
-0.8
-1.2
Channel 1
Channel 0
-1.6
-2
0
1.2
-2
-40
255
-25
-10
5
20
35
50
65
Temperature (C)
80
95
110 125
DAC channels at midscale
Figure 6-36. Current Output TUE vs Digital Input Code
Figure 6-37. Current Output TUE vs Temperature
Current Output Offset Error (%FSR)
1.5
1.2
0.9
0.6
0.3
0
-0.3
-0.6
-0.9
Channel 1
Channel 0
-1.2
-1.5
-40
-25
-10
5
20
35
50
65
Temperature (C)
80
95
110 125
DAC channels at midscale
Figure 6-39. Current Output Offset Error vs Temperature
1.5
1000
1.2
800
0.9
600
0.6
400
Current Output (A)
Current Output Gain Error (%FSR)
Figure 6-38. Current Output TUE vs Supply Voltage
0.3
0
-0.3
-0.6
Channel 1
Channel 0
-1.2
-25
-10
5
20
35
50
65
Temperature (C)
80
95
110 125
Figure 6-40. Current Output Gain Error vs Temperature
20
0
-200
-400
CH1,
CH0,
CH1,
CH0,
-600
-0.9
-1.5
-40
200
-800
DAC Code
DAC Code
DAC Code
DAC Code
=
=
=
=
0
0
255
255
-1000
0
0.5
1
1.5
2
2.5
3
3.5
Load Voltage (V)
4
4.5
5
5.5
Figure 6-41. Current Output vs Load Voltage
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6.18 Typical Characteristics: Current Output (continued)
at TA = 25°C, VDD = 5.5 V, output range: ±250 μA (unless otherwise noted)
Trigger (1 V/div)
IOUT (Zoomed, 10A/div)
Settling Band (−1 LSB)
Settling Band (+1 LSB)
Trigger (1 V/div)
IOUT (Zoomed, 10 A/div)
Settling Band (−1 LSB)
Settling Band (+1 LSB)
0
10
20
30
40
50
0
10
20
30
40
50
Time (s)
Time (s)
Figure 6-42. Current Output Setting Time, Rising Edge
Figure 6-43. Current Output Setting Time, Falling Edge
VDD ( 1 V/div)
IOUT (40 A/div)
VDD (1 V/div)
IOUT (20 A/div)
0
500
1000
1500
Time (s)
2000
2500
3000
0
500
1000
DAC at mid scale (0 μA) stored in EEPROM
2500
3000
Figure 6-45. Current Output Power-Off Glitch
2
30
1.8
25
1.6
20
1.4
15
Noise Current (nA)
Noise Density (nA/Hz)
2000
DAC at mid scale (0 μA)
Figure 6-44. Current Output Power-On Glitch
1.2
1
0.8
0.6
0.4
10
5
0
-5
-10
-15
0.2
0
10
1500
Time (s)
-20
2030 50 100 200
500 1000
Frequency (Hz)
10000
100000
-25
0
1
2
3
4
5
6
Time (s)
7
8
9
10
f = 0.1 Hz to 10 Hz
Figure 6-46. Current Output Noise Density
Figure 6-47. Current Output Flicker Noise
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6.18 Typical Characteristics: Current Output (continued)
AC Power-Supply Rejection Ratio (LSB/V)
at TA = 25°C, VDD = 5.5 V, output range: ±250 μA (unless otherwise noted)
500
200
100
50
20
10
5
2
1
0.5
0.2
10
20 30 50
100 200
500 1000 2000
Frequency (Hz)
10000
30000
Figure 6-48. Current Output AC PSRR vs Frequency
22
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6.19 Typical Characteristics: Comparator
at TA = 25°C, VDD = 5.5 V, external reference = 5.5 V, gain = 1x, 12-bit resolution, FBx pin in Hi-Z mode, and DAC outputs
unloaded (unless otherwise noted)
VOUT (1 V/div)
VFB (1 LSB/div)
0
2
4
6
8
10
VOUT (1 V/div)
VFB (1 LSB/div)
0
2
4
Time (s)
6
8
10
Time (s)
Comparator output in push-pull mode
Comparator output in push-pull mode
Figure 6-49. Comparator Response Time:
Low‑to‑High Transition
Figure 6-50. Comparator Response Time:
High‑to‑Low Transition
5
Comparator Offset Error (mV)
4
3
2
1
0
-1
-2
-3
Channel 1
Channel 0
-4
-5
-40
-25
-10
5
20
35
50
65
Temperature (C)
80
95
110 125
Figure 6-51. Comparator Offset Error vs Temperature
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6.20 Typical Characteristics: General
1.22
1.21314
1.219
1.213126
1.218
1.213112
Internal Reference (V)
Internal Reference (V)
at TA = 25°C, VDD = 5.5 V, and DAC outputs unloaded (unless otherwise noted)
1.217
1.216
1.215
1.214
1.213
1.213098
1.213084
1.21307
1.213056
1.213042
1.212
1.213028
1.211
1.213014
1.21
-40
-25
-10
5
20
35
50
65
Temperature (C)
80
95
1.213
1.8
110 125
2.725
3.65
Supply Voltage (V)
4.575
5.5
Internal reference
Internal reference
Figure 6-53. Internal Reference vs Supply Voltage
Figure 6-52. Internal Reference vs Temperature
5
30
24
4
21
Boot-up Time (ms)
Sleep Mode PD Current (A)
27
18
15
12
9
6
VDD = 1.8 V
VDD = 3.3 V
VDD = 5.5 V
3
0
-40
-25
-10
5
20
35
50
65
Temperature (C)
80
95
110 125
Sleep mode, internal reference disabled
Figure 6-54. Power-Down Current vs Temperature
24
3
2
1
0
0.5
3.5
6.5
9.5
12.5
External Capacitance on CAP Pin (F)
15
Figure 6-55. Boot-Up Time vs Capacitance on CAP pin
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7 Detailed Description
7.1 Overview
The 12-bit DAC63202 and 10-bit DAC53202 (DACx3202) are a pin-compatible family of dual-channel
buffered voltage-output and current-output smart digital-to-analog converters (DACs). The DAC channels are
independently configurable as voltage or current output. The DAC outputs change to Hi-Z when VDD is off;
a feature useful in voltage-margining applications. These smart DACs contain nonvolatile memory (NVM), an
internal reference, automatically detectable I2C or SPI interface, PMBus-compatibility in I2C mode, force-sense
output, and a general-purpose input. These devices support Hi-Z power-down modes by default, which can be
configured to 10 kΩ-GND or 100 kΩ-GND using the NVM. The DACx3202 have a power-on-reset (POR) circuit
that makes sure all the registers start with default or user-programmed settings using NVM. The DACx3202
operate with either an internal reference, external reference, or with a power supply as the reference, and
provide a full-scale output of 1.8 V to 5.5 V.
The DACx3202 devices support I2C standard mode (100 kbps), fast mode (400 kbps), and fast mode plus
(1 Mbps). The I2C interface can be configured with four target addresses using the A0 pin. These devices also
support specific PMBus commands such as turn on/off, margin high or low, and more. SPI mode supports a
3-wire interface by default with up to 50-MHz SCLK input. The GPIO input can be configured as SDO in the NVM
for SPI read capability. The GPIO input can alternatively be configurable as LDAC, PD, STATUS, FAULT-DUMP,
RESET, and PROTECT functions.
The DACx3202 also include digital slew rate control, and support standard waveform generation such as sine,
cosine, triangular, and sawtooth waveforms. These devices can generate pulse-width modulation (PWM) output
with the combination of the triangular or sawtooth waveform and the FB pin. The force-sense outputs of the DAC
channels can be used as programmable comparators. The comparator mode allows programmable hysteresis,
latching comparator, window comparator, and fault-dump to the NVM. These features enable the DACx3202
to go beyond the limitations of a conventional DAC that depends on a processor to function. As a result of
processor-less operation and the smart feature set, the DACx3202 are called smart DACs.
7.2 Functional Block Diagram
CAP
VDD
VREF
LDO
Internal
Reference
GPIO
Configuration
GPIO/SDO
Nonvolatile
Memory
DAC
Buffer
MUX
DAC
Register
DAC
+
BUF
-
OUT0-1
FB0-1
Power On Reset
R1
R2
SDA/SCLK
GPIO
Handler
SCL/SYNC
I2C / SPI
Interface
A0/SDI
Function Generation
Output
Configuration
Power Down Logic
Channel 0
Channel 1
AGND
Figure 7-1. Functional Block Diagram
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7.3 Feature Description
7.3.1 Smart Digital-to-Analog Converter (DAC) Architecture
The DACx3202 devices consist of a string architecture with a voltage-output amplifier, as well as an external FB
pin and voltage-to-current converter for each channel. Section 7.2 shows the DAC architecture within the block
diagram that operates from a 1.8-V to 5.5-V power supply. The DAC has an internal voltage reference of 1.21 V.
Optionally, use an external reference on the VREF pin, or use the power supply as a reference. Voltage output
mode uses one of these three reference options. Current output mode uses an internal band gap to generate the
current outputs. Both the voltage- and current-output modes support multiple programmable output ranges.
The DACx3202 devices support Hi-Z output when VDD is off, maintaining very low leakage current at the
output pins with up to 1.25 V of forced voltage. The DAC output pin also starts up in high-impedance mode
by default, making these devices an excellent choice for voltage margining and scaling applications. To change
the power-up mode to 10 kΩ-GND or 100 kΩ-GND, program the corresponding VOUT-PDN-X field in the
COMMON-CONFIG register and load these bits in the device NVM.
The DACx3202 devices support an independent comparator mode for each channel. The respective FBx pin
acts as an input for the comparator. The DAC architecture supports inversion of the comparator output using
register settings. The comparator outputs can be push-pull or open-drain. The comparator mode supports
programmable hysteresis using the margin-high and margin-low register fields, latching comparator, and window
comparator. The comparator outputs are accessible internally by the device.
The DACx3202 devices include a smart feature set to enable processor-less operation and high integration. The
NVM enables a predictable start-up. In the absence of a processor or when the processor or software fails, the
GPIO triggers the DAC output without the I2C interface. The integrated functions and the FBx pin enable PWM
output for control applications. The FBx pin enables this device to be used as a programmable comparator. The
digital slew-rate control and the Hi-Z power-down modes enable a hassle-free voltage margining and scaling
function.
7.3.2 Digital Input/Output
The DACx3202 have four digital IO pins that include I2C, SPI, PMBus, and GPIO interfaces. These devices
automatically detect I2C and SPI protocols at the first successful communication after power-on, and then
connect to the detected interface. After an interface protocol is connected, any change in the protocol is ignored.
The I2C interface uses the A0 pin to select from among four address options. The SPI interface is a 3-wire
interface by default. No readback capability is available in this mode. The GPIO pin can be configured in the
register map and then programmed in to the NVM as the SDO pin. The SPI readback mode is slower than the
write mode. The programming interface pins are:
• I2C: SCL, SDA, A0
• SPI: SCLK, SDI, SYNC, SDO/GPIO
The GPIO can be configured as multiple functions other than SDO. These are LDAC, PD, STATUS, PROTECT,
FAULT-DUMP, and RESET. All the digital pins are open-drain when used as outputs. Therefore, all the output
pins must be pulled up to the desired IO voltage using external resistors.
7.3.3 Nonvolatile Memory (NVM)
The DACx3202 contain nonvolatile memory (NVM) bits. These memory bits are user programmable and
erasable, and retain the set values in the absence of a power supply. All the register bits, shown in the
highlighted gray cells in Section 7.6, can be stored in the NVM by setting NVM-PROG = 1 in the COMMONTRIGGER register. The NVM-PROG is an autoresetting bit. The default values for all the registers in the
DACx3202 are loaded from NVM as soon as a POR event is issued.
The DACx3202 also implement NVM-RELOAD bit in the COMMON-TRIGGER register. Set this bit to 1 and
the device starts an NVM-reload operation. After completion, the device autoresets the NVM-RELOAD bit to
0. During the NVM write or reload operation, all read/write operations to the device are blocked. Section 6.8
provides the timing specification for the NVM write cycle. The processor must wait for the specified duration
before resuming any read or write operation on the SPI or I2C interface.
26
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7.4 Device Functional Modes
7.4.1 Voltage-Output Mode
The voltage-output mode for each DAC channel can be entered by selecting the power-up option in the VOUTPDN-X fields in the COMMON-CONFIG register and simultaneously powering down the current output option
for the respective channels using the IOUT-PDN-X bits in the same register. Short the OUTx and FBx pins of
respective channels externally for closed-loop amplifier output. An open FBx pin saturates the amplifier output.
To achieve the desired voltage output, select the correct reference option, select the amplifier gain for the
required output range, and program the DAC code in the DAC-X-DATA register of the respective channels.
7.4.1.1 Voltage Reference and DAC Transfer Function
Figure 7-2 shows that there are three voltage reference options possible with the DACx3202: internal reference,
external reference, and the power supply as reference. The DAC transfer function in the voltage-output and
comparator modes changes based on the voltage reference selection.
VDD
VREF
EN-INT-REF
Internal
Reference
DIS-MODE-IN
MUX
VOUT-GAIN-X
IOUT-RANGE-X
VOUT-PDN-X
DAC Ladder
Digital
IO
IOUT-PDN-X
VOUT-PDN-X
+
OUTx
–
10k/100k
IOUT-PDN-X
Internal
Bandgap
FBx
R1
R2
CMP-X-HIZ-IN-DIS or
VOUT-PDN-X (Hi-Z)
AGND
Figure 7-2. Voltage Reference Selection and Power-Down Logic
7.4.1.1.1 Internal Reference
The DACx3202 contain an internal reference that is disabled by default. To enable the internal reference, write
1 to bit EN-INT-REF in the COMMON-CONFIG register. The internal reference generates a fixed 1.21-V voltage
(typical). Use the VOUT-GAIN-X bit in the DAC-X-VOUT-CMP-CONFIG register to achieve gains of 1.5x, 2x, 3x,
or 4x for the DAC output voltage (VOUT). Equation 1 shows DAC transfer function using the internal reference.
where:
•
•
•
•
VOUT = DAC_DATA
× VREF × GAIN
N
(1)
2
N is the resolution in bits, 10 (DAC53202), or 12 (DAC63202).
DAC_DATA is the decimal equivalent of the binary code that is loaded to the DAC-X-DATA bit in the
DAC-X-DATA register. DAC_DATA ranges from 0 to 2N – 1.
VREF is the internal reference voltage = 1.21 V (typical).
GAIN = 1.5x, 2x, 3x, or 4x, based on VOUT-X-GAIN bits.
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7.4.1.1.2 External Reference
By default, the DACx3202 operate from an external reference input. The external reference option can also be
selected by configuring the VOUT-GAIN-X field in the DAC-X-VOUT-CMP-CONFIG register appropriately. Write
1 to the DIS-MODE-IN bit in the DEVICE-MODE-CONFIG register to minimize IDD. The external reference can
be between 1.7 V and VDD. Equation 2 shows DAC transfer function when the external reference is used. The
gain at the output stage of the DAC is always 1x in the external reference mode.
Note
The external reference must be less than VDD in both transient and steady-state conditions.
Therefore, the external reference must ramp up after VDD and ramp down before VDD.
where:
•
•
•
VOUT = DAC_DATA
× VREF
N
(2)
2
N is the resolution in bits, 10 (DAC53202), or 12 (DAC63202).
DAC_DATA is the decimal equivalent of the binary code that is loaded to the DAC-X-DATA field in the
DAC-X-DATA register. DAC_DATA ranges from 0 to 2N – 1.
VREF is the external reference voltage.
7.4.1.1.3 Power-Supply as Reference
The DACx3202 can operate with the power-supply pin (VDD) as a reference. Equation 3 shows DAC transfer
function when the power-supply pin is used as reference. The gain at the output stage is always 1x.
where:
•
•
•
•
VOUT = DAC_DATA
× VDD
N
(3)
2
N is the resolution in bits, either 10 (DAC53202), or 12 (DAC63202).
DAC_DATA is the decimal equivalent of the binary code that is loaded to the DAC-X-DATA bit in the
DAC-X-DATA register.
DAC_DATA ranges from 0 to 2N – 1.
VDD is used as the DAC reference voltage.
7.4.2 Current-Output Mode
To enter current-output mode for each DAC channel, disable the respective IOUT-PDN-X bits in the COMMONCONFIG register, and set the respective VOUT-PDN-X bits in the same register to Hi-Z power-down mode.
Select the desired current-output range by writing to the IOUT-RANGE-X bit in the DAC-X-IOUT-MISC-CONFIG
register. To minimize leakage in current-output mode, disconnect the FBx pin. For the best power-on glitch
performance, program the NVM with IOUT mode using the smallest output range before powering on the output
channel, and then immediately program the DAC code and desired output range. The transfer function of the
output current is shown in Equation 4.
where:
•
•
•
28
IOUT =
DAC_DATA × IMAX − IMIN
+ IMIN
28
(4)
DAC_DATA is the decimal equivalent of the binary code that is loaded to the DAC-X-DATA bit as specified in
Section 7.6.8. DAC_DATA ranges from 0 to 255.
IMAX is the signed maximum current in the IOUT-RANGE-X setting as specified in Section 7.6.5.
IMIN is the signed minimum current in the IOUT-RANGE-X setting as specified in Section 7.6.5.
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7.4.3 Comparator Mode
All the DAC channels can be configured as programmable comparators in the voltage-output mode. To enter
the comparator mode for a channel, write 1 to the CMP-X-EN bit in the respective DAC-X-VOUT-CMP-CONFIG
register. The comparator output can be configured as push-pull or open-drain using the CMP-X-OD-EN bit. To
enable the comparator output on the output pin, write 1 to the CMP-X-OUT-EN bit. To invert the comparator
output, write 1 to the CMP-X-INV-EN bit. The FBx pin has a finite impedance. By default, the FBx pin is in the
high-impedance mode. To disable high-impedance on the FBx pin, write 1 to the CMP-X-HIZ-IN-DIS bit. Table
7-1 shows the comparator output at the pin for different bit settings.
Note
In the Hi-Z input mode, the comparator input range is limited to:
• For GAIN = 1x, 1.5x, or 2x: VFB ≤ (VREF × GAIN) / 3
• For GAIN = 3x, or 4x: VFB ≤ (VREF × GAIN) / 6
Any higher input voltage is clipped.
Table 7-1. Comparator Output Configuration
CMP-X-EN
CMP-X-OUT-EN
CMP-X-OD-EN
CMP-X-INV-EN
0
X
X
X
Comparator not enabled
CMPX-OUT PIN
1
0
X
X
No output
1
1
0
0
Push-pull output
1
1
0
1
Push-pull and inverted output
1
1
1
0
Open-drain output
1
1
1
1
Open-drain and inverted output
Figure 7-3 shows the interface circuit when all the DAC channels are configured as comparators. The
programmable comparator operation is as shown in Figure 7-4. Individual comparator channels can be
configured in no-hysteresis, with-hysteresis, and window-comparator modes using the CMP-X-MODE bit in the
respective DAC-X-CMP-MODE-CONFIG register, as shown in Table 7-2.
VDD
10 k
0.1 μF
VDD
VREF
CMP0-OUT
+
-
CMP0
1.5 μF
CAP
CMP1
+
-
CMP1-OUT
FB0/AIN0
(0 V to VFS/3 or 0 V to VFS)
FB1/AIN1
(0 V to VFS/3 or 0 V to VFS)
AGND
SCL/SYNC
GPIO/SDO
A0/SDI
SDA/SCLK
VIO
10 k
Figure 7-3. Comparator Interface
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DAC-X-DATA
FBx/AINx
OUT-X
CMP-X-INV-EN = 0
OUT-X
CMP-X-INV-EN = 1
Figure 7-4. Programmable Comparator Operation
Table 7-2. Comparator Mode Selection
CMP-X-MODE BIT FIELD
30
COMPARATOR CONFIGURATION
00
Normal comparator mode. No hysteresis or window operation.
01
Hysteresis comparator mode. DAC-X-MARGIN-HIGH and DAC-X-MARGIN-LOW registers set the hysteresis.
10
Window comparator mode. DAC-X-MARGIN-HIGH and DAC-X-MARGIN-LOW registers set the window
bounds.
11
Invalid setting
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7.4.3.1 Programmable Hysteresis Comparator
Table 7-2 shows that comparator mode provides hysteresis when the CMP-X-MODE bit is set to 01b. Figure 7-5
shows that the hysteresis is provided by the DAC-X-MARGIN-HIGH and DAC-X-MARGIN-LOW registers.
When the DAC-X-MARGIN-HIGH is set to full-code or the DAC-X-MARGIN-LOW is set to zero-code, the
comparator works as a latching comparator that is, the output is latched after the threshold is crossed. The
latched output can be reset by writing to the corresponding RST-CMP-FLAG-X bit in the COMMON-DAC-TRIG
register. Figure 7-6 shows the behavior of a latching comparator with active low output, and Figure 7-7 shows
the behavior of a latching comparator with active high output.
Note
The value of the DAC-X-MARGIN-HIGH register must be greater than the value of the DAC-XMARGIN-LOW register. The comparator output in the hysteresis mode can only be noninverting;
that is, the CMP-X-INV-EN bit in the DAC-X-VOUT-CMP-CONFIG register must be set to 0. For the
reset to take effect in latching mode, the input voltage must be within DAC-X-MARGIN-HIGH and
DAC-X-MARGIN-LOW.
DAC-X-MARGIN-HIGH
FBx/AINx
Hysteresis
DAC-X-MARGIN-LOW
OUT-X
CMP-X-INV-EN = 0
Figure 7-5. Programmable Hysteresis Without Latching Output
DAC-X-MARGIN-HIGH
FBx/AINx
DAC-X-MARGIN-LOW
(ZERO-CODE)
OUT-X
CMP-X-INV-EN = 0
RST-CMP-FLAG-X
Figure 7-6. Latching Comparator With Active Low Output
DAC-X-MARGIN-HIGH
(FULL-CODE)
FBx/AINx
DAC-X-MARGIN-LOW
OUT-X
CMP-X-INV-EN = 0
RST-CMP-FLAG-X
Figure 7-7. Latching Comparator With Active High Output
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7.4.3.2 Programmable Window Comparator
Window comparator mode is enabled by setting the CMP-X-MODE bit to 10b (see also Table 7-2). Figure 7-8
shows that the window bounds are set by the DAC-X-MARGIN-HIGH and the DAC-X-MARGIN-LOW registers.
The output of the window comparator for a given channel is indicated by the respective WIN-CMP-X bit in
the CMP-STATUS register. The comparator output (WIN-CMP-X) can be latched by writing 1 to the WIN-LATCHEN bit in the COMMON-CONFIG register. After being latched, the comparator output can be reset using the
corresponding RST-CMP-FLAG-X bit in the COMMON-DAC-TRIG register. For the reset to take effect, the input
must be within the window bounds.
DAC-X-MARGIN-HIGH
FBx/AINx
DAC-X-MARGIN-LOW
WIN-CMP-X
WIN-LATCH-EN = 0
WIN-CMP-X
WIN-LATCH-EN = 1
RST-CMP-FLAG-X
Figure 7-8. Window Comparator Operation
A single comparator is used per channel to check both the margin-high and margin-low limits of the window.
Therefore, the window comparator function has a finite response time (see also Section 6.7). The static behavior
of the WIN-CMP-X bit is not reflected at the output pins. Set the CMP-X-OUT-EN bit to 0. The WIN-CMP-X bit
must be read digitally using the communication interface. This bit can also be mapped to the GPIO pin (see also
Table 7-19).
•
•
•
32
Note
The value of the DAC-X-MARGIN-HIGH register must be greater than that of the DAC-X-MARGINLOW register.
Set the SLEW-RATE-X bit to 0000b (no-slew) and LOG-SLEW-EN-X bit to 0b in the DAC-X-FUNCCONFIG register to get the best response time from the window comparator.
The CMP-X-OUT-EN bit in the DAC-X-VOUT-CMP-CONFIG register can be set to 0b to eliminate
undesired toggling of the OUT pin.
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7.4.4 Fault-Dump Mode
The DACx3202 provides a feature to save a few registers into the NVM when the FAULT-DUMP bit is triggered
or when the GPIO mapped to fault-dump is triggered (see also Table 7-18). This feature is useful in system-level
fault management to capture the state of the device or system just before a fault is triggered, and to allow
diagnosis after the fault has occurred. The registers saved when fault-dump is triggered, are:
• CMP-STATUS[7:0]
• DAC-0-DATA[15:8]
• DAC-1-DATA[15:8]
Note
When the fault-dump cycle is in progress, any change in the data can corrupt the final outcome. Make
sure the comparator and the DAC codes are stable during the NVM write cycle.
Table 7-3 shows the storage format of the registers in the NVM.
Table 7-3. Fault-Dump NVM Storage Format
NVM ROWS
B31-B24
Row1
CMP-STATUS[7:0]
B23-B16
Row2
DAC-1-DATA[15:8]
B15-B8
B7-B0
Don't care
Don't care
DAC-1-DATA[15:8]
The data captured in the NVM after the fault dump can be read in a specific sequence:
1. Set the EE-READ-ADDR bit to 0b in the COMMON-CONFIG register, to select row1 of the NVM.
2. Trigger the read of the selected NVM row by writing 1 to the READ-ONE-TRIG in the COMMON-TRIGGER
register; this bit autoresets. This action copies that data from the selected NVM row to SRAM addresses
0x9D (LSB 16 bits from the NVM) and 0x9E (MSB 16 bits from the NVM).
3. To read the SRAM data:
a. Write 0x009D to the SRAM-CONFIG register.
b. Read the data from the SRAM-DATA register to get the LSB 16 bits.
c. Write 0x009E to the SRAM-CONFIG register.
d. Read the data from the SRAM-DATA register again to get the MSB bits.
4. Set the EE-READ-ADDR bit to 1b in the COMMON-CONFIG register, to select row2 of the NVM. Repeat
steps 2 and 3.
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7.4.5 Application-Specific Modes
This section provides the details of application-specific functional modes available in the DACx3202.
7.4.5.1 Voltage Margining and Scaling
Voltage margining or scaling is a primary application for the DACx3202. This section provides specific features
available for this application such as Hi-Z output, slew-rate control, PROTECT input, and PMBus compatibility.
7.4.5.1.1 High-Impedance Output and PROTECT Input
All the DAC output channels remain in a high-impedance state (Hi-Z) when VDD is off. Figure 7-9 shows
a simplified schematic of the DACx3202 used in a voltage-margining application. The series resistor RS is
needed in voltage-output mode, but is optional in current-output mode. Almost all linear regulators and DC/DC
converters have a feedback voltage of ≤ 1.25 V. The low-leakage currents at the outputs are maintained for VFB
of ≤ 1.25 V. Thus, for all practical purposes, the DAC outputs appear as Hi-Z when VDD of the DAC is off in
voltage margining and scaling applications. This feature allows for seamless integration of the DACx3202 into a
system without any need for additional power-supply sequencing for the DAC.
VIN
VREG
VDD
R1
RS
PROTECT
ILEAK
DAC
VFB
1.25 V
ZOUT
R2
Linear
Regulator
or
DC/DC
Converter
Figure 7-9. High-Impedance (Hi-Z) Output and PROTECT Input
The DAC channels power down to Hi-Z at boot up. The outputs can power up with a preprogrammed code that
corresponds to the nominal output of the DC/DC converter or the linear regulator. This feature allows for smooth
power up and power down of the DAC without impacting the feedback loop of the DC/DC converter or the linear
regulator.
Table 7-18 shows how the GPIO pin of the DACx3202 can be configured as a PROTECT function. PROTECT
takes the DAC outputs to a predictable state with a slewed or direct transition. This function is useful in systems
where a fault condition (such as a brownout), a subsystem failure, or a software crash requires that the DAC
outputs reach a predefined state without the involvement of a processor. The detected event can be fed to
the GPIO pin that is configured as the PROTECT input. The PROTECT function can also be triggered using
the PROTECT bit in the COMMON-TRIGGER register. Table 7-4 shows how to configure the behavior of the
PROTECT function in the PROTECT-CONFIG field in the DEVICE-MODE-CONFIG register.
•
•
Note
After the PROTECT function is triggered, the write functionality is disabled on the communication
interface until the function is completed.
The PROTECT-FLAG bit in the CMP-STATUS register is set to 1 when the PROTECT function
is triggered. This bit can be polled by reading the CMP-STATUS register. After the PROTECT
function is complete, a read command on the CMP-STATUS register resets the PROTECT-FLAG
bit.
Table 7-4. PROTECT Function Configuration
PROTECT-CONFIG FIELD
34
FUNCTION
00
Switch to Hi-Z power-down (no slew).
01
Switch to DAC code stored in NVM (no slew) and then switch to Hi-Z power-down.
10
Slew to margin-low code and then switch to Hi-Z power-down.
11
Slew to margin-high code and then switch to Hi-Z power-down.
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7.4.5.1.2 Programmable Slew-Rate Control
When the DAC data registers are written, the voltage on DAC output (VOUT) immediately transitions to the new
code following the slew rate and settling time specified in the Electrical Characteristics.
The slew rate control feature allows the user to control the rate at which the output voltage (VOUT) changes.
When this feature is enabled (using the SLEW-RATE-X[3:0] bits), the DAC output changes from the current
code to the code in the DAC-X-MARGIN-HIGH or DAC-X-MARGIN-LOW registers (when margin high or low
commands are issued to the DAC) using the step size and time-period per step set in CODE-STEP-X and
SLEW-RATE-X bits in the DAC-X-FUNC-CONFIG register:
• SLEW-RATE-X defines the time-period per step at which the digital slew updates.
• CODE-STEP-X defines the number of LSBs by which the output value changes at each update, for the
corresponding channels.
Table 7-5 and Table 7-6 show different settings available for CODE-STEP-X and SLEW-RATE-X. With the
default slew rate control setting of no-slew, the output changes immediately at a rate limited by the output drive
circuitry and the attached load.
When the slew rate control feature is used, the output changes happen at the programmed slew rate. Figure
7-10 shows that this configuration results in a staircase formation at the output. Do not write to CODE-STEP-X,
SLEW-RATE-X, or DAC-X-DATA during the output slew operation. Equation 5 provides the equation for the
calculating the slew time (tSLEW).
MARGIN-HIGH
CODE-STEP
MARGIN-LOW
TIME PERIOD
tSLEW
Figure 7-10. Programmable Slew-Rate Control
where:
•
•
•
•
tSLEW =
SLEW_RATE × MARGIN_HIGH − MARGIN_LOW + 1
CODE_STEP
(5)
SLEW_RATE is the SLEW-RATE-X setting specified in Table 7-6.
CODE_STEP is the CODE-STEP-X setting specified in Table 7-5.
MARGIN_HIGH is the DAC-X-MAGIN-HIGH specified in Section 7.6.2.
MARGIN_LOW is the DAC-X-MAGIN-LOW specified in Section 7.6.3.
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Table 7-5. Code Step
REGISTER
CODE-STEP-X[2]
CODE-STEP-X[1]
CODE-STEP-X[0]
CODE STEP SIZE
0
0
0
1 LSB (default)
0
0
1
2 LSB
0
1
0
3 LSB
0
1
1
4 LSB
1
0
0
6 LSB
1
0
1
8 LSB
1
1
0
16 LSB
1
1
1
32 LSB
DAC-X-FUNC-CONFIG
Table 7-6. Slew Rate
REGISTER
SLEW-RATE-X[3]
SLEW-RATE-X[2]
SLEW-RATE-X[1]
SLEW-RATE-X[0]
TIME PERIOD
(PER STEP)
0
0
0
0
No slew (default)
0
0
0
1
4 µs
0
0
1
0
8 µs
0
0
1
1
12 µs
0
1
0
0
18 µs
0
1
0
1
27 µs
0
1
1
0
40.5 µs
0
1
1
1
60.75 µs
1
0
0
0
91.13 µs
1
0
0
1
136.69 µs
1
0
1
0
239.2 µs
1
0
1
1
418.61 µs
1
1
0
0
732.56 µs
1
1
0
1
1281.98 µs
1
1
1
0
2563.96 µs
1
1
1
1
5127.92 µs
DAC-X-FUNC-CONFIG
36
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7.4.5.1.3 PMBus Compatibility Mode
The PMBus protocol is an I2C-based communication standard for power-supply management. PMBus contains
standard command codes tailored to power supply applications. The DACx3202 implement some PMBus
commands such as Turn Off, Turn On, Margin Low, Margin High, Communication Failure Alert Bit (CML), as
well as PMBUS revision. Figure 7-11 shows typical PMBus connections. The EN-PMBUS bit in the INTERFACECONFIG register must be set to 1 to enable the PMBus protocol.
ALERT
PMBus-compatible device #1
DATA
ALERT
PMBus-compatible device #2
Control signal
DATA
Clock
CLOCK
ADDRESS
CONTROL
Data
WP
System Host
—
Bus Controller
Alert signal
WP
CLOCK
ADDRESS
CONTROL
Optional
Required
ALERT
PMBus-compatible device #3
WP
DATA
CLOCK
ADDRESS
CONTROL
Figure 7-11. PMBus Connections
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Similar to I2C, PMBus is a variable length packet of 8-bit data bytes, each with a receiver acknowledge,
wrapped between a start and stop bit. The first byte is always a 7-bit target address followed by a write bit,
sometimes called the even address, that identifies the intended receiver of the packet. The second byte is an
8-bit command byte, identifying the PMBus command being transmitted using the respective command code.
After the command byte, the transmitter either sends data associated with the command to write to the receiver
command register (from least significant byte to most significant byte; see also Table 7-7), or sends a new start
bit indicating the desire to read the data associated with the command register from the receiver. Then the
receiver transmits the data following the same least significant byte first format; see also Table 7-8.
Table 7-7. PMBus Update Sequence
MSB
....
LSB
ACK
MSB
...
LSB
ACK
MSB
...
LSB
ACK
MSB
...
LSB
Address (A) byte
Section 7.5.2.2.1
Command byte
Section 7.5.2.2.2
Data byte - LSDB
Data byte - MSDB
(Optional)
DB [31:24]
DB [23:16]
DB [15:8]
DB [7:0]
ACK
Table 7-8. PMBus Read Sequence
S
MSB
…
R/W
(0)
ACK
Address byte
Section 7.5.2.2.1
From controller
MSB
…
LSB
ACK
Command byte
Section 7.5.2.2.2
Target
From controller
Target
R/W
(1)
Sr
MSB …
Sr
Address byte
Section 7.5.2.2.1
From controller
ACK
MSB
…
LSB
ACK
MSB
LSDB
Target
From target
…
LSB
ACK
MSDB (Optional)
Controller
From target
Controller
The DACx3202 I2C interface implements some of the PMBus commands. Table 7-9 shows the supported
PMBus commands that are implemented in DACx3202.The DAC uses DAC-X-MARGIN-LOW, DAC-X-MARGINHIGH bits, SLEW-RATE-X, and CODE-STEP-X bits for PMBUS-OPERATION-CMD-X. To access multiple
channels, write the PMBus page address specified in Table 7-21 to the PMBUS-PAGE register first, followed
by a write to the channel-specific register.
Table 7-9. PMBus Operation Commands
REGISTER
PMBUS-OP-CMD-X
PMBUS-OPERATION-CMD-X[15:8]
DESCRIPTION
00h
Turn off
80h
Turn on
94h
Margin low
A4h
Margin high
The DACx3202 also implement PMBus features such as group command protocol and communication timeout
failure. The CML bit in the PMBUS-CML register indicates a communication fault in the PMBus. This bit is reset
by writing 1.
To get the PMBus version, read the PMBUS-VERSION register.
38
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7.4.5.2 Function Generation
The DACx3202 implement a continuous function or waveform generation feature. These devices can generate a
triangular wave, sawtooth wave, and sine wave independently for every channel.
7.4.5.2.1 Triangular Waveform Generation
The triangular waveform uses the DAC-X-MARGIN-LOW and DAC-X-MARGIN-HIGH registers for minimum
and maximum levels, respectively. Equation 6 shows that the frequency of the waveform depends on the min
and max levels, CODE-STEP and SLEW-RATE settings. An external RC load with a time-constant larger than
the slew-rate settings can be dominant over the internal frequency calculation. The CODE-STEP-X and SLEWRATE-X settings are available in the DAC-X-FUNC-CONFIG register. Writing 0b000 to the FUNC-CONFIG-X bit
field in the DAC-X-FUNC-CONFIG register selects triangular waveform.
f TRIANGLE_WAVE =
where:
•
•
•
•
2 × SLEW_RATE ×
1
MARGIN_HIGH − MARGIN_LOW + 1
CODE_STEP
(6)
SLEW_RATE is the SLEW-RATE-X setting specified in Table 7-6.
CODE_STEP is the CODE-STEP-X setting specified in Table 7-5.
MARGIN_HIGH is the DAC-X-MAGIN-HIGH specified in Section 7.6.2.
MARGIN_LOW is the DAC-X-MAGIN-LOW specified in Section 7.6.3.
7.4.5.2.2 Sawtooth Waveform Generation
The sawtooth and the inverse sawtooth waveforms use the DAC-X-MARGIN-LOW and DAC-X-MARGIN-HIGH
registers for minimum and maximum levels, respectively. Equation 7 shows that the frequency of the waveform
depends on the min and max levels, CODE-STEP and SLEW-RATE settings. An external RC load with a
time constant larger than the slew-rate settings can be dominant over the internal frequency calculation. The
CODE-STEP-X and SLEW-RATE-X settings are available in the DAC-X-FUNC-CONFIG register. Write 0b001
to the FUNC-CONFIG-X bit field in the DAC-X-FUNC-CONFIG register to select sawtooth waveform, and write
0b010 to select inverse sawtooth waveform.
f SAWTOOTH_WAVE =
where:
•
•
•
•
SLEW_RATE ×
1
MARGIN_HIGH − MARGIN_LOW + 1
CODE_STEP
(7)
SLEW_RATE is the SLEW-RATE-X setting specified in Table 7-6.
CODE_STEP is the CODE-STEP-X setting specified in Table 7-5.
MARGIN_HIGH is the DAC-X-MAGIN-HIGH specified in Section 7.6.2.
MARGIN_LOW is the DAC-X-MAGIN-LOW specified in Section 7.6.3.
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7.4.5.2.3 Sine Waveform Generation
The sine wave function uses 24 preprogrammed points per cycle. Equation 8 shows that the frequency of the
sine wave depends on the SLEW-RATE settings:
1
f SINE_WAVE = 24 × SLEW_RATE
(8)
where SLEW_RATE is the SLEW-RATE-X setting specified in Table 7-6.
An external RC load with a time constant greater than the slew-rate settings can be dominant over the internal
frequency calculation. The SLEW-RATE-X setting is available in the DAC-X-FUNC-CONFIG register. Writing
0b100 to the FUNC-CONFIG-X bit field in the DAC-X-FUNC-CONFIG register selects sine wave. The codes
for the sine wave are fixed. Use the gain settings at the output amplifier for changing the full-scale output
using the internal reference option. The gain settings are accessible through the VOUT-GAIN-X bits in the
DAC-X-VOUT-CMP-CONFIG register. Table 7-10 shows the list of hard-coded discrete points for the sine wave
with 12-bit resolution and Figure 7-12 shows the pictorial representation of the sine wave. There are four phase
settings available for the sine wave that are selected using the PHASE-SEL-X bit in the DAC-X-FUNC-CONFIG
register.
Table 7-10. Sine Wave Data Points
SEQUENCE
12-BIT VALUE
SEQUENCE
12-BIT VALUE
0
0x800
12
0x800
1
0x9A8
13
0x658
2
0xB33
14
0x4CD
3
0xC87
15
0x379
4
0xD8B
16
0x275
5
0xE2F
17
0x1D1
6
0xE66
18
0x19A
7
0xE2F
19
0x1D1
8
0xD8B
20
0x275
9
0xC87
21
0x379
10
0xB33
22
0x4CD
11
0x9A8
23
0x658
5
6
7
4
8
3
9
2
10
1
0
11
TIME PERIOD
12
0
13
23
14
22
15
21
16
20
17
18
19
Figure 7-12. Sine Wave Generation
40
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7.4.6 Device Reset and Fault Management
This section provides the details of power-on-reset (POR), software reset, and other diagnostics and faultmanagement features of DACx3202.
7.4.6.1 Power-On Reset (POR)
The DACx3202 family of devices includes a power-on reset (POR) function that controls the output voltage at
power up. After the VDD supply has been established, a POR event is issued. The POR causes all registers
to initialize to default values, and communication with the device is valid only after a POR (boot-up) delay. The
default value for all the registers in the DACx3202 is loaded from NVM as soon as the POR event is issued.
When the device powers up, a POR circuit sets the device to the default mode. Figure 7-13 indicates that the
POR circuit requires specific VDD levels to make sure that the internal capacitors discharge and reset the device
at power up. To make sure that a POR occurs, VDD must be less than 0.7 V for at least 1 ms. When VDD drops
to less than 1.65 V, but remains greater than 0.7 V (shown as the undefined region), the device may or may
not reset under all specified temperature and power-supply conditions. In this case, initiate a POR. When VDD
remains greater than 1.65 V, a POR does not occur.
VDD (V)
5.5 V
No power-on reset
Spe cified supply
voltage range
1.71 V
1.65 V
Undefined
0.7 V
Power-on reset
0V
Figure 7-13. Threshold Levels for VDD POR Circuit
7.4.6.2 External Reset
An external reset to the device can be triggered through the GPIO pin or through the register map. To initiate
a device software reset event, write the reserved code 1010 to the RESET field in the COMMON-TRIGGER
register. A software reset initiates a POR event. Table 7-18 shows how the GPIO pin can be configured as a
RESET pin. This configuration must be programmed into the NVM so that the setting is not cleared after the
device reset. The RESET input must be a low pulse. The device starts the boot-up sequence after the falling
edge of the RESET input. The rising edge of the RESET input does not have any effect.
7.4.6.3 Register-Map Lock
The DACx3202 implement a register-map lock feature that prevents an accidental or unintended write to the
DAC registers. The device locks all the registers when the DEV-LOCK bit in the COMMON-CONFIG register
is set to 1. However, the software reset function through the COMMON-TRIGGER register is not blocked
when using the I2C interface. To bypass the DEV-LOCK setting, write 0101 to the DEV-UNLOCK bits in the
COMMON-TRIGGER register.
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7.4.6.4 NVM Cyclic Redundancy Check (CRC)
The DACx3202 implement a cyclic redundancy check (CRC) feature for the NVM to make sure that the data
stored in the NVM is uncorrupted. There are two types of CRC alarm bits implemented in DACx3202:
• NVM-CRC-FAIL-USER
• NVM-CRC-FAIL-INT
The NVM-CRC-FAIL-USER bit indicates the status of user-programmable NVM bits, and the NVM-CRC-FAILINT bit indicates the status of internal NVM bits The CRC feature is implemented by storing a 16-bit CRC
(CRC-16-CCITT) along with the NVM data each time NVM program operation (write or reload) is performed and
during the device start up. The device reads the NVM data and validates the data with the stored CRC. The
CRC alarm bits (NVM-CRC-FAIL-USER and NVM-CRC-FAIL-INT in the GENERAL-STATUS register) report any
errors after the data are read from the device NVM. The alarm bits are set only at boot up.
7.4.6.4.1 NVM-CRC-FAIL-USER Bit
A logic 1 on NVM-CRC-FAIL-USER bit indicates that the user-programmable NVM data are corrupt. During this
condition, all registers in the DAC are initialized with factory reset values, and any DAC registers can be written
to or read from. To reset the alarm bits to 0, issue a software reset (see also Section 7.4.6.2) command, or cycle
power to the DAC. A software reset or power-cycle also reloads the user-programmable NVM bits. In case the
failure persists, reprogram the NVM.
7.4.6.4.2 NVM-CRC-FAIL-INT Bit
A logic 1 on NVM-CRC-FAIL-INT bit indicates that the internal NVM data are corrupt. During this condition, all
registers in the DAC are initialized with factory reset values, and any DAC registers can be written to or read
from. In case of a temporary failure, to reset the alarm bits to 0, issue a software reset (see also Section 7.4.6.2)
command or cycle power to the DAC. A permanent failure in the NVM makes the device unusable.
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7.4.7 Power-Down Mode
The DACx3202 output amplifier and internal reference can be independently powered down through the ENINT-REF, VOUT-PDN-X, and IOUT-PDN-X bits in the COMMON-CONFIG register (see also Figure 7-2). At
power up, the DAC output and the internal reference are disabled by default. In power-down mode, the DAC
outputs (OUTx pins) are in a high-impedance state. To change this state to 10 kΩ-AGND or 100 kΩ-AGND in the
voltage-output mode (at power up), use the VOUT-PDN-X bits. The power-down state for current-output mode is
always high-impedance.
The DAC power-up state can be programmed to any state (power-down or normal mode) using the NVM. Table
7-11 shows the DAC power-down bits. The individual channel power-down bits or the global device power-down
function can be mapped to the GPIO pin using the GPIO-CONFIG register.
Table 7-11. DAC Power-Down Bits
REGISTER
COMMON-CONFIG
VOUT-PDN-X[1]
VOUT-PDN-X[0]
IOUT-PDN-X
DESCRIPTION
0
0
1
Power up VOUT-X.
0
1
1
Power down VOUT-X with 10 kΩ to AGND.
Power down IOUT-X to Hi-Z.
1
0
1
Power down VOUT-X with 100 kΩ to AGND.
Power down IOUT-X to Hi-Z.
1
1
1
Power down VOUT-X to Hi-Z.
Power down IOUT-X to Hi-Z (default).
1
1
0
Power down VOUT-X to Hi-Z.
Power up IOUT-X.
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7.5 Programming
The DACx3202 are programmed through either a 3-wire SPI or 2-wire I2C interface. A 4-wire SPI mode is
enabled by mapping the GPIO pin as SDO. The SPI readback operates at a lower SCLK than the standard
SPI write operation. The type of interface is determined based on the first protocol to communicate after device
power up. After the interface type is determined, the device ignores any change in the type while the device is
on. The interface type can be changed after a power cycle.
7.5.1 SPI Programming Mode
An SPI access cycle for DACx3202 is initiated by asserting the SYNC pin low. The serial clock, SCLK, can be
a continuous or gated clock. SDI data are clocked on SCLK falling edges. The SPI frame for DACx3202 is 24
bits long. Therefore, the SYNC pin must stay low for at least 24 SCLK falling edges. The access cycle ends
when the SYNC pin is deasserted high. If the access cycle contains less than the minimum clock edges, the
communication is ignored. By default, the SDO pin is not enabled (three-wire SPI). In the three-wire SPI mode,
if the access cycle contains more than the minimum clock edges, only the first 24 bits are used by the device.
When SYNC is high, the SCLK and SDI signals are blocked, and SDO becomes Hi-Z to allow data readback
from other devices connected on the bus.
Table 7-12 and Figure 7-14 describe the format for the 24-bit SPI access cycle. The first byte input to SDI is the
instruction cycle. The instruction cycle identifies the request as a read or write command and the 7-bit address
that is to be accessed. The last 16 bits in the cycle form the data cycle.
Table 7-12. SPI Read/Write Access Cycle
BIT
FIELD
DESCRIPTION
23
R/W
Identifies the communication as a read or write command to the address register: R/W = 0 sets a write
operation. R/W = 1 sets a read operation
22-16
A[6:0]
Register address: specifies the register to be accessed during the read or write operation
15-0
DI[15:0]
Data cycle bits: If a write command, the data cycle bits are the values to be written to the register with
address A[6:0]. If a read command, the data cycle bits are don't care values.
SYNC
1
8
9
24
1
8
9
24
D15
D0
SCLK
Write command
D23
SDI
D16
HiZ
Any command
D15
D0
D23
D16
Write command echo
HiZ
SDO
D16
D23
D15
HiZ
D0
Figure 7-14. SPI Write Cycle
Read operations require that the SDO pin is first enabled by setting the SDO-EN bit in the INTERFACE-CONFIG
register. This configuration is called four-wire SPI. A read operation is initiated by issuing a read command
access cycle. After the read command, a second access cycle must be issued to get the requested data. Table
7-13 and Figure 7-15 show the output data format. Data are clocked out on the SDO pin either on the falling
edge or rising edge of SCLK according to the FSDO bit (see also Figure 6-3).
Table 7-13. SDO Output Access Cycle
44
BIT
FIELD
23
R/W
22-16
A[6:0]
15-0
DI[15:0]
DESCRIPTION
Echo R/W from previous access cycle
Echo register address from previous access cycle
Readback data requested on previous access cycle
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SYNC
1
8
9
24
1
8
9
24
D15
D0
SCLK
Any command
Read command
D23
SDI
D16
D15
D23
D0
HiZ
D16
Read Data
HiZ
SDO
D16
D23
D15
HiZ
D0
Figure 7-15. SPI Read Cycle
The daisy-chain operation is also enabled with the SDO pin. Figure 7-16 shows that in daisy-chain mode,
multiple devices are connected in a chain with the SDO pin of one device is connected to SDI pin of the following
device. The SPI host drives the SDI pin of the first device in the chain. The SDO pin of the last device in
the chain is connected to the POCI pin of the SPI host. In four-wire SPI mode, if the access cycle contains
multiples of 24 clock edges, only the last 24 bits are used by the device first device in the chain. If the access
cycle contains clock edges that are not in multiples of 24, the SPI packet is ignored by the device. Figure 7-17
describes the packet format for the daisy-chain write cycle.
VIO
VIO
C
TI SPI Device
SDI
VIO
B
A
RPULL-UP
RPULL-UP
TI SPI Device
SDO
RPULL-UP
TI SPI Device
SDO
SDI
SDO
SDI
SCLK
SCLK
SCLK
SYNC
SYNC
SYNC
Figure 7-16. SPI Daisy-Chain Connection
SYNC
1
8
9
24
25
48
49
72
SCLK
Device A command
SDI-C
D23
D16
SDO-C
D15
Device B command
D0
D23 – D1
Device C command
D0
Device A command
D23 – D1
D0
Device B command
Figure 7-17. SPI Daisy-Chain Write Cycle
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7.5.2 I2C Programming Mode
The DACx3202 devices have a 2-wire serial interface (SCL and SDA), and one address pin (A0); see also
Figure 5-1. The I2C bus consists of a data line (SDA) and a clock line (SCL) with pullup structures. When the bus
is idle, both SDA and SCL lines are pulled high. All the I2C-compatible devices connect to the I2C bus through
the open drain I/O pins, SDA and SCL.
The I2C specification states that the device that controls communication is called a controller, and the devices
that are controlled by the controller are called targets. The controller generates the SCL signal. The controller
also generates special timing conditions (start condition, repeated start condition, and stop condition) on the bus
to indicate the start or stop of a data transfer. Device addressing is completed by the controller. The controller
on an I2C bus is typically a microcontroller or digital signal processor (DSP). The DACx3202 family operates as
a target on the I2C bus. A target acknowledges controller commands, and upon controller control, receives or
transmits data.
Typically, the DACx3202 family operates as a target receiver. A controller writes to the DACx3202, a target
receiver. However, if a controller requires the DACx3202 internal register data, the DACx3202 operate as a
target transmitter. In this case, the controller reads from the DACx3202. According to I2C terminology, read and
write refer to the controller.
The DACx3202 family supports the following data transfer modes:
•
•
•
Standard mode (100 kbps)
Fast mode (400 kbps)
Fast mode plus (1.0 Mbps)
The data transfer protocol for standard and fast modes is exactly the same; therefore, both modes are referred
to as F/S-mode in this document. The fast mode plus protocol is supported in terms of data transfer speed,
but not output current. The low-level output current would be 3 mA; similar to the case of standard and fast
modes. The DACx3202 family supports 7-bit addressing. The 10-bit addressing mode is not supported. The
device supports the general call reset function. Sending the following sequence initiates a software reset within
the device: start or repeated start, 0x00, 0x06, stop. The reset is asserted within the device on the rising edge of
the ACK bit, following the second byte.
Other than specific timing signals, the I2C interface works with serial bytes. At the end of each byte, a ninth clock
cycle generates and detects an acknowledge signal. An acknowledge is when the SDA line is pulled low during
the high period of the ninth clock cycle. Figure 7-18 depicts a not-acknowledge, when the SDA line is left high
during the high period of the ninth clock cycle.
Data output
by transmitter
Not acknowledge
Data output
by receiver
Acknowledge
1
SCL from
controller
2
8
9
S
Clock pulse for
acknowledgement
Start
condition
Figure 7-18. Acknowledge and Not Acknowledge on the I2C Bus
46
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7.5.2.1 F/S Mode Protocol
The following steps explain a complete transaction in F/S mode.
1. The controller initiates data transfer by generating a start condition. Figure 7-19 shows that the start
condition is when a high-to-low transition occurs on the SDA line while SCL is high. All I2C-compatible
devices recognize a start condition.
2. The controller then generates the SCL pulses, and transmits the 7-bit address and the read/write direction
bit (R/W) on the SDA line. During all transmissions, the controller makes sure that data are valid. Figure
7-20 shows that a valid data condition requires the SDA line to be stable during the entire high period of
the clock pulse. All devices recognize the address sent by the controller and compare the address to the
respective internal fixed address. Only the target device with a matching address generates an acknowledge
by pulling the SDA line low during the entire high period of the 9th SCL cycle (see also Figure 7-18). When
the controller detects this acknowledge, the communication link with a target has been established.
3. The controller generates further SCL cycles to transmit (R/W bit 0) or receive (R/W bit 1) data to the target.
In either case, the receiver must acknowledge the data sent by the transmitter. The acknowledge signal can
be generated by the controller or by the target, depending on which is the receiver. The 9-bit valid data
sequences consists of eight data bits and one acknowledge-bit, and can continue as long as necessary.
4. Figure 7-19 shows that to signal the end of the data transfer, the controller generates a stop condition by
pulling the SDA line from low-to-high while the SCL line is high. This action releases the bus and stops the
communication link with the addressed target. All I2C-compatible devices recognize the stop condition. Upon
receipt of a stop condition, the bus is released, and all target devices then wait for a start condition followed
by a matching address.
SDA
SDA
SCL
SCL
S
Start
condition
P
Stop
condition
Figure 7-19. Start and Stop Conditions
Data line stable
Data valid
Change of data
allowed
Figure 7-20. Bit Transfer on the I2C Bus
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7.5.2.2 I2C Update Sequence
Table 7-14 shows that for a single update, the DACx3202 require a start condition, a valid I2C address byte, a
command byte, and two data bytes.
Table 7-14. Update Sequence
MSB
....
LSB
ACK
MSB
...
LSB
ACK
MSB
...
LSB
ACK
MSB
...
LSB
Address (A) byte
Section 7.5.2.2.1
Command byte
Section 7.5.2.2.2
Data byte - MSDB
Data byte - LSDB
DB [31:24]
DB [23:16]
DB [15:8]
DB [7:0]
ACK
Figure 7-21 shows that after each byte is received, the DACx3202 family acknowledges the byte by pulling the
SDA line low during the high period of a single clock pulse. These four bytes and acknowledge cycles make up
the 36 clock cycles required for a single update to occur. A valid I2C address byte selects the DACx3202.
Recognize
START or
REPEATED
START
condition
Recognize
STOP or
REPEATED
START
condition
Generate ACKNOWLEDGE
signal
P
SDA
MSB
Address
SCL
Sr
Acknowledgement
signal from target
1
R/W
7
8
9
1
2-8
9
Sr
or
P
S
or
Sr
ACK
START or
REPEATED
START
condition
ACK
REPEATED
START or
STOP
condition
Figure 7-21. I2C Bus Protocol
The command byte sets the operating mode of the selected DACx3202 device. For a data update to occur
when the operating mode is selected by this byte, the DACx3202 device must receive two data bytes: the most
significant data byte (MSDB) and least significant data byte (LSDB). The DACx3202 device performs an update
on the falling edge of the acknowledge signal that follows the LSDB.
When using fast mode (clock = 400 kHz), the maximum DAC update rate is limited to 10 kSPS. Using fast mode
plus (clock = 1 MHz), the maximum DAC update rate is limited to 25 kSPS. When a stop condition is received,
the DACx3202 device releases the I2C bus and awaits a new start condition.
48
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7.5.2.2.1 Address Byte
Table 7-15 depicts the address byte, the first byte received from the controller device following the start
condition. The first four bits (MSBs) of the address are factory preset to 1001. The next three bits of the address
are controlled by the A0 pin. The A0 pin input can be connected to VDD, AGND, SCL, or SDA. The A0 pin is
sampled during the first byte of each data frame to determine the address. The device latches the value of the
address pin, and consequently responds to that particular address according to Table 7-16.
Table 7-15. Address Byte
COMMENT
—
MSB
AD6
AD5
AD4
AD3
General address
1
0
0
1
Broadcast address
1
0
0
0
LSB
AD2
AD1
AD0
See Table 7-16
(target address column)
1
1
R/W
0 or 1
1
0
Table 7-16. Address Format
TARGET ADDRESS
A0 PIN
000
AGND
001
VDD
010
SDA
011
SCL
The DACx3202 supports broadcast addressing, which is used for synchronously updating or powering down
multiple DACx3202 devices. When the broadcast address is used, the DACx3202 responds regardless of the
address pin state. Broadcast is supported only in write mode.
7.5.2.2.2 Command Byte
Table 7-21 lists the command byte in the ADDRESS column.
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7.5.2.3 I2C Read Sequence
To read any register the following command sequence must be used:
1. Send a start or repeated start command with a target address and the R/W bit set to 0 for writing. The device
acknowledges this event.
2. Send a command byte for the register to be read. The device acknowledges this event again.
3. Send a repeated start with the target address and the R/W bit set to 1 for reading. The device acknowledges
this event.
4. The device writes the MSDB byte of the addressed register. The controller must acknowledge this byte.
5. Finally, the device writes out the LSDB of the register.
The broadcast address cannot be used for reading.
Table 7-17. Read Sequence
S
MSB
…
R/W
(0)
ACK
Address byte
Section 7.5.2.2.1
From controller
MSB
…
LSB
ACK
Command byte
Section 7.5.2.2.2
Target
From controller
Target
R/W
(1)
Sr
MSB …
Sr
Address byte
Section 7.5.2.2.1
From controller
ACK
MSB
…
LSB
ACK
MSDB
Target
From target
MSB
…
LSB
ACK
LSDB
Controller
From target
Controller
7.5.3 General-Purpose Input/Output (GPIO) Modes
Together with I2C and SPI, the DACx3202 also support a GPIO that can be configured in the NVM for multiple
functions. This pin allows for updating the DAC output channels and reading status bits without using the
programming interface, thus enabling processor-less operation. In the GPIO-CONFIG register, write 1 to the
GPI-EN bit to set the GPIO pin as an input, or write 1 to the GPO-EN bit to set the pin as output. There
are global and channel-specific functions mapped to the GPIO pin. For channel-specific functions, select the
channels using the GPI-CH-SEL field in the GPIO-CONFIG register. Table 7-18 lists the functional options
available for the GPIO as input and Table 7-19 lists the options for the GPIO as output. Some of the GP input
operations are edge-triggered after the device boots up. After the power supply ramps up, the device registers
the GPI level and executes the associated command. This feature allows the user to configure the initial output
state at power-on. By default, the GPIO pin is not mapped to any operation. When the GPIO pin is mapped to
a specific input function, the corresponding software bit functionality is disabled to avoid a race condition. When
used as a RESET input, the GPIO pin must transmit an active-low pulse for triggering a device reset. All other
constraints of the functions are applied to the GPIO-based trigger.
Note
Pull the GPIO pin high or low when not used. When the GPIO pin is used as RESET, the configuration
must be programmed into the NVM. Otherwise, the setting is cleared after the device resets.
50
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Table 7-18. General-Purpose Input Function Map
REGISTER
BIT FIELD
CHANNELS
0010
All
0011
As per GPI-CH-SEL
0100
As per GPI-CH-SEL
0101
GPIO-CONFIG
GPIO EDGE /
LEVEL
VALUE
All
0111
All
1000
As per GPI-CH-SEL, both
the SYNC-CONFIG-X and
the GPI-CH-SEL must be
configured for every channel.
1001
As per GPI-CH-SEL
GPI-CONFIG
1010
As per GPI-CH-SEL
1011
1100
All
1101
All
Others
N/A
Falling edge
Trigger FAULT-DUMP
Rising edge
No effect
Falling edge
IOUT power-down
Rising edge
IOUT power-up
Falling edge
VOUT power-down. Pulldown
resistor as per the VOUT-PDN-X
setting
Rising edge
VOUT power-up
Falling edge
Trigger PROTECT function
Rising edge
No effect
Falling edge
Trigger CLR function
Rising edge
No effect
Falling edge
Trigger LDAC function
Rising edge
No effect
Falling edge
Stop function generation
Rising edge
Start function generation
Falling edge
Trigger margin-low
Rising edge
Trigger margin-high
Low pulse
All
FUNCTION
Trigger device RESET. The RESET
configuration must be programmed
into the NVM.
Rising edge
No effect
Falling edge
Allows NVM programming
Rising edge
Blocks NVM programming
Falling edge
Allows register map update
Rising edge
Blocks register map write except
a write to the DEV-UNLOCK field
through I2C or SPI and the RESET
fields through I2C
N/A
Not applicable
Table 7-19. General-Purpose Output (STATUS) Function Map
REGISTER
GPIO-CONFIG
BIT FIELD
GPO-CONFIG
VALUE
FUNCTION
0001
NVM-BUSY
0100
DAC-1-BUSY
0111
DAC-0-BUSY
1000
WIN-CMP-1
1011
WIN-CMP-0
Others
Not applicable
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7.6 Register Map
Table 7-20. Register Map
REGISTER(1) (2)
MOST SIGNIFICANT DATA BYTE (MSDB)
BIT15
BIT14
BIT13
BIT12
BIT11
LEAST SIGNIFICANT DATA BYTE (LSDB)
BIT10
BIT9
BIT8
NOP
BIT7
BIT6
BIT5
BIT4
BIT3
BIT2
BIT1
DAC-X-MARGINHIGH
DAC-X-MARGIN-HIGH
X
DAC-X-MARGINLOW
DAC-X-MARGIN-LOW
X
DAC-X-VOUTCMP-CONFIG
X
DAC-X-IOUT-MISCCONFIG
X
DAC-X-CMPMODE-CONFIG
DAC-X-FUNCCONFIG
VOUT-X-GAIN
IOUT-X-RANGE
X
CLR-SEL-X
BRDCONFIG-X
DEV-LOCK
EE-READADDR
EN-INT-REF
VOUT-PDN-0
DEV-UNLOCK
TRIG-MARHI-1
STARTFUNC-1
GENERAL-STATUS
NVM-CRCFAIL-INT
NVM-CRCFAIL-USER
X
DACBUSY-0
CMP-STATUS
IOUT-PDN-0
DACBUSY-1
X
RESERVED
TIMEOUTEN
(1)
(2)
52
X
PROTECT
NVMRELOAD
RST-CMPFLAG-0
TRIG-MARLO-0
STARTFUNC-0
WIN-CMP-1
CMPFLAG-0
TRIG-MARHI-0
EN-PMBUS
CMPFLAG-1
X
GPI-CONFIG
RESERVED
X
GPI-EN
X
FAST-SDOEN
X
X
SDO-EN
SRAM-ADDR
SRAM-DATA
BRDCAST-DATA
PMBUS-PAGE
PMBUS-VERSION
WIN-CMP-0
PROTECT-CONFIG
SRAM-DATA
PMBUS-CML
IOUT-PDN-1
GPI-CH-SEL
X
BRDCAST-DATA
PMBUS-OP-CMD
VOUT-PDN-1
READ-ONENVM-PROG
TRIG
DEVICE-ID
GPO-CONFIG
SRAM-CONFIG
X
NVM-BUSY
PROTECTFLAG
GPO-EN
X
CLR
FAULTDUMP
X
DIS-MODEIN
RESERVED
X
LDAC
X
X
X
RESET
TRIG-MARLO-1
GF-EN
CMP-X-EN
X
DAC-X-DATA
WINLATCH-EN
RST-CMPFLAG-1
INTERFACECONFIG
CMP-X-HIZ- CMP-X-INVIN-DIS
EN
FUNC-GEN-CONFIG-BLOCK-X
COMMON-DACTRIG
GPIO-CONFIG
CMP-XOUT-EN
X
CMP-X-MODE
SYNCCONFIG-X
COMMONTRIGGER
DEVICE-MODECONFIG
CMP-X-ODEN
X
DAC-X-DATA
COMMON-CONFIG
BIT0
NOP
X
PMBUS-PAGE
Not applicable
PMBUS-OPERATION-CMD-X
X
Not applicable
CML
X
PMBUS-VERSON
Not applicable
Not applicable
The highlighted gray cells indicate the register bits or fields that are stored in the NVM.
X = Don't care.
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Table 7-21. Register Names
I2C/SPI ADDRESS
PMBUS PAGE ADDR
PMBUS REGISTER ADDR
REGISTER NAME
SECTION
00h
FFh
D0h
NOP
Section 7.6.1
01h
00h
25h
DAC-1-MARGIN-HIGH
Section 7.6.2
02h
00h
26h
DAC-1-MARGIN-LOW
Section 7.6.3
03h
FFh
D1h
DAC-1-VOUT-CMP-CONFIG
Section 7.6.4
04h
FFh
D2h
DAC-1-IOUT-MISC-CONFIG
Section 7.6.5
05h
FFh
D3h
DAC-1-CMP-MODE-CONFIG
Section 7.6.6
06h
FFh
D4h
DAC-1-FUNC-CONFIG
Section 7.6.7
13h
03h
25h
DAC-0-MARGIN-HIGH
Section 7.6.1
14h
03h
26h
DAC-0-MARGIN-LOW
Section 7.6.2
15h
FFh
DDh
DAC-0-VOUT-CMP-CONFIG
Section 7.6.3
16h
FFh
DEh
DAC-0-IOUT-MISC-CONFIG
Section 7.6.4
17h
FFh
DFh
DAC-0-CMP-MODE-CONFIG
Section 7.6.5
18h
FFh
E0h
DAC-0-FUNC-CONFIG
Section 7.6.6
19h
00h
21h
DAC-1-DATA
Section 7.6.8
1Ch
03h
21h
DAC-0-DATA
Section 7.6.8
1Fh
FFh
E3h
COMMON-CONFIG
Section 7.6.9
20h
FFh
E4h
COMMON-TRIGGER
Section 7.6.10
21h
FFh
E5h
COMMON-DAC-TRIG
Section 7.6.11
22h
FFh
E6h
GENERAL-STATUS
Section 7.6.12
23h
FFh
E7h
CMP-STATUS
Section 7.6.13
24h
FFh
E8h
GPIO-CONFIG
Section 7.6.14
25h
FFh
E9h
DEVICE-MODE-CONFIG
Section 7.6.15
26h
FFh
EAh
INTERFACE-CONFIG
Section 7.6.16
2Bh
FFh
EFh
SRAM-CONFIG
Section 7.6.17
2Ch
FFh
F0h
SRAM-DATA
Section 7.6.18
50h
FFh
F1h
BRDCAST-DATA
Section 7.6.19
NA
All pages
00h
PMBUS-PAGE
Section 7.6.20
NA
00h
01h
PMBIS-OP-CMD-0
Section 7.6.21
NA
01h
01h
PMBUS-OP-CMD-1
Section 7.6.21
NA
02h
01h
PMBUS-OP-CMD-2
Section 7.6.21
NA
03h
01h
PMBUS-OP-CMD-3
Section 7.6.21
NA
All pages
78h
PMBUS-CML
Section 7.6.22
NA
All pages
98h
PMBUS-VERSION
Section 7.6.23
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Table 7-22. Access Type Codes
Access Type
Code
Description
X
X
Don't care
R
Read
W
Write
Read Type
R
Write Type
W
Reset or Default Value
-n
54
Value after reset or the default value
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7.6.1 NOP Register (address = 00h) [reset = 0000h]
PMBus page address = FFh, PMBus register address = D0h
Figure 7-22. NOP Register
15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
0
3
2
1
0
1
0
NOP
R-0h
Table 7-23. NOP Register Field Descriptions
Bit
Field
Type
Reset
Description
15-0
NOP
R
0000h
No operation
7.6.2 DAC-X-MARGIN-HIGH Register (address = 13h, 01h) [reset = 0000h]
PMBus page address = 03h, 00h, PMBus register address = 25h
Figure 7-23. DAC-X-MARGIN-HIGH Register (X = 0, 1)
15
14
13
12
11
10
9
8
7
6
5
4
DAC63202: DAC-X-MARGIN-HIGH[11:0]
DAC53202: DAC-X-MARGIN-HIGH[9:0]
X
R/W-0h
X-0h
Table 7-24. DAC-X-MARGIN-HIGH Register Field Descriptions
Field
Type
Reset
Description
15-4
Bit
DAC63202:
DAC-X-MARGIN-HIGH[11:0]
DAC53202:
DAC-X-MARGIN-HIGH[9:0]
R/W
000h
Margin-high code for DAC output
Data are in straight-binary format. MSB left aligned.
Use the following bit alignment:
DAC63202: {DAC-X-MARGIN-HIGH[11:0]}
DAC53202: {DAC-X-MARGIN-HIGH[9:0], X, X}
X = Don't care bits.
3-0
X
X
0
Don't care
7.6.3 DAC-X-MARGIN-LOW Register (address = 14h, 02h) [reset = 0000h]
PMBus page address = 03h, 00h, PMBus register address = 26h
Figure 7-24. DAC-X-MARGIN-LOW Register (X = 0, 1)
15
14
13
12
11
10
9
8
7
6
5
4
3
2
DAC63202: DAC-X-MARGIN-LOW[11:0]
DAC53202: DAC-X-MARGIN-LOW[9:0]
X
R/W-0h
X-0h
Table 7-25. DAC-X-MARGIN-LOW Register Field Descriptions
Bit
Field
Type
Reset
Description
15-4
DAC63202: DAC-X-MARGIN-LOW[11:0]
DAC53202: DAC-X-MARGIN-LOW[9:0]
R/W
000h
Margin-low code for DAC output
Data are in straight-binary format. MSB left aligned.
Use the following bit alignment:
DAC63202: {DAC-X-MARGIN-HIGH[11:0]}
DAC53202: {DAC-X-MARGIN-HIGH[9:0], X, X}
X = Don't care bits.
3-0
X
X
0
Don't care
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7.6.4 DAC-X-VOUT-CMP-CONFIG Register (address = 15h, 03h) [reset = 0000h]
PMBus page address = FFh, PMBus register address = DDh, D1h
Figure 7-25. DAC-X-VOUT-CMP-CONFIG Register (X = 0, 1)
15
14
2
1
0
X
13
12
VOUT-GAIN-X
11
10
9
8
X
7
6
5
CMP- CMPX-OD- X-OUTEN
EN
4
3
CMP-XHIZ-INDIS
CMPX-INVEN
CMPX-EN
X-0h
R/W-0h
X-0h
R/W-0h R/W-0h
R/W-0h
R/W-0h R/W-0h
Table 7-26. DAC-X-VOUT-CMP-CONFIG Register Field Descriptions
Bit
Field
Type
Reset
Description
15-13
X
X
0h
Don't care
12-10
VOUT-GAIN-X
R/W
0h
000: Gain = 1x, external reference on VREF pin
001: Gain = 1x, VDD as reference
010: Gain = 1.5x, internal reference
011: Gain = 2x, internal reference
100: Gain = 3x, internal reference
101: Gain = 4x, internal reference
Others: Invalid
X
X
0h
Don't care
4
CMP-X-OD-EN
R/W
0
0: Set OUTx pin as push-pull
1: Set OUTx pin as open-drain in comparator mode (CMP-X-EN =
1 and CMP-X-OUT-EN = 1)
3
CMP-X-OUT-EN
R/W
0
0: Generate comparator output but consume internally
1: Bring comparator output to the respective OUTx pin
2
CMP-X-HIZ-IN-DIS
R/W
0
0: FBx input has high-impedance. Input voltage range is limited.
1: FBx input is connected to resistor divider and has finite
impedance. Input voltage range is same as full-scale.
1
CMP-X-INV-EN
R/W
0
0: Don't invert the comparator output
1: Invert the comparator output
0
CMP-X-EN
R/W
0
0: Disable comparator mode
1: Enable comparator mode. Current-output must be in powerdown. Voltage-output mode must be enabled.
9-5
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7.6.5 DAC-X-IOUT-MISC-CONFIG Register (address = 16h, 04h) [reset = 0000h]
PMBus page address = FFh, PMBus register address = DEh, D2h
Figure 7-26. DAC-X-IOUT-MISC-CONFIG Register (X = 0, 1)
15
14
13
12
11
10
9
8
7
6
5
4
X
IOUT-RANGE-X
X
X-0h
R/W-0h
X-0h
3
2
1
0
2
1
0
Table 7-27. DAC-X-IOUT-MISC-CONFIG Register Field Descriptions
Bit
Field
Type
Reset
Description
15-13
X
X
0h
Don't care
12-9
IOUT-RANGE-X
R/W
0000
1000: ‒25 μA to +25 μA
1001: ‒50 μA to +50 μA
1010: ‒125 μA to +125 μA
1011: ‒250 μA to +250 μA
Others: Invalid
8-0
X
X
000h
Don't care
7.6.6 DAC-X-CMP-MODE-CONFIG Register (address = 17h, 05h) [reset = 0000h]
PMBus page address = FFh, PMBus register address = DFh, D3h
Figure 7-27. DAC-X-CMP-MODE-CONFIG Register (X = 0, 1)
15
14
13
12
11
10
9
8
7
6
5
4
X
CMP-X-MODE
X
X-0h
R/W-0h
X-0h
3
Table 7-28. DAC-X-CMP-MODE-CONFIG Register Field Descriptions
Bit
Field
Type
Reset
Description
15-12
X
X
00h
Don't care
11-10
CMP-X-MODE
R/W
00
00: No hysteresis or window function
01: Hysteresis provided using DAC-X-MARGIN-HIGH and DACX-MARGIN-LOW registers
10: Window comparator mode with DAC-X-MARGIN-HIGH and
DAC-X-MARGIN-LOW registers setting window bounds
11: Invalid
X
X
000h
Don't care
9-0
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7.6.7 DAC-X-FUNC-CONFIG Register (address = 18h, 06h) [reset = 0000h]
PMBus page address = FFh, PMBus register address = E0h, D4h
Figure 7-28. DAC-X-FUNC-CONFIG Register (X = 0, 1)
15
14
13
CLR-SEL-X
SYNCCONFIG-X
BRDCONFIG-X
12
11
10
9
8
FUNC-GEN-CONFIG-BLOCK
7
6
5
4
R/W-0h
R/W-0h
R/W-0h
R/W-0h
3
2
1
0
Table 7-29. DAC-X-FUNC-CONFIG Register Field Descriptions
Bit
Field
Type
Reset
Description
15
CLR-SEL-X
R/W
0
0: Clear DAC-X to zero-scale
1: Clear DAC-X to mid-scale
14
SYNC-CONFIG-X
R/W
0
0: DAC-X output updates immediately after a write command
1: DAC-X output updates with LDAC pin falling-edge or when the
LDAC bit in the COMMON-TRIGGER register is set to 1
13
BRD-CONFIG-X
R/W
0
0: Don't update DAC-X with broadcast command
1: Update DAC-X with broadcast command
Table 7-30. Linear-Slew Mode: FUNC-GEN-CONFIG-BLOCK Field Descriptions
Bit
58
Field
Type
Reset
Description
12-11
PHASE-SEL-X
R/W
0
00: 0°
01: 120°
10: 240°
11: 90°
10-8
FUNC-CONFIG-X
R/W
0
000: Triangular wave
001: Sawtooth wave
010: Inverse sawtooth wave
100: Sine wave
111: Disable function generation
Others: Invalid
7
LOG-SLEW-EN-X
R/W
0
0: Enable linear slew
6-4
CODE-STEP-X
R/W
0
CODE-STEP for linear slew mode:
000: 1-LSB
001: 2-LSB
010: 3-LSB
011: 4-LSB
100: 6-LSB
101: 8-LSB
110: 16-LSB
111: 32-LSB
3-0
SLEW-RATE-X
R/W
0
SLEW-RATE for linear slew mode:
0000: No slew for margin-high and margin-low. Invalid for
waveform generation.
0001: 4 µs/step
0010: 8 µs/step
0011: 12 µs/step
0100: 18 µs/step
0101: 27.04 µs/step
0110: 40.48 µs/step
0111: 60.72 µs/step
1000: 91.12 µs/step
1001: 136.72 µs/step
1010: 239.2 µs/step
1011: 418.64 µs/step
1100: 732.56 µs/step
1101: 1282 µs/step
1110: 2563.96 µs/step
1111: 5127.92 µs/step
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Table 7-31. Logarithmic-Slew Mode: FUNC-GEN-CONFIG-BLOCK Field Descriptions
Bit
Field
Type
Reset
Description
12-11
PHASE-SEL-X
R/W
0
00: 0°
01: 120°
10: 240°
11: 90°
10-8
FUNC-CONFIG-X
R/W
0
000: Triangular wave
001: Sawtooth wave
010: Inverse sawtooth wave
100: Sine wave
111: Disable function generation
Others: Invalid
7
LOG-SLEW-EN-X
R/W
0
1: Enable logarithmic slew.
In logarithmic slew mode, the DAC output moves from the DACX-MARGIN-LOW code to the DAC-X-MARGIN-HIGH code, or
vice versa, in 3.125% steps.
When slewing in the positive direction, the next step is
(1 + 0.03125) times the current step.
When slewing in the negative direction, the next step is
(1 – 0.03125) times the current step.
When DAC-X-MARGIN-LOW is 0, the slew starts from code 1.
The time interval for each step is defined by RISE-SLEW-X and
FALL-SLEW-X.
6-4
RISE-SLEW-X
R/W
0
SLEW-RATE for logarithmic slew mode (DAC-X-MARGIN-LOW to
DAC-X-MARGIN-HIGH):
000: 4 µs/step
001: 12 µs/step
010: 27.04 µs/step
011: 60.72 µs/step
100: 136.72 µs/step
101: 418.64 µs/step
110: 1282 µs/step
111: 5127.92 µs/step
3-1
FALL-SLEW-X
R/W
0
SLEW-RATE for logarithmic slew mode (DAC-X-MARGIN-HIGH
to DAC-X-MARGIN-LOW):
000: 4 µs/step
001: 12 µs/step
010: 27.04 µs/step
011: 60.72 µs/step
100: 136.72 µs/step
101: 418.64 µs/step
110: 1282 µs/step
111: 5127.92 µs/step
X
X
0
Don't care
0
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7.6.8 DAC-X-DATA Register (address = 1Ch, 19h) [reset = 0000h]
PMBus page address = 03h, 00h, PMBus register address = 21h
Figure 7-29. DAC-X-DATA Register (X = 0, 1)
15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
DAC63202: DAC-X-DATA[11:0]
DAC53202: DAC-X-DATA[9:0]
X
R/W-0h
X-0h
0
Table 7-32. DAC-X-DATA Register Field Descriptions
Bit
15-4
Field
Type
Reset
Description
DAC63202: DAC-X-DATA[11:0]
DAC53202: DAC-X-DATA[9:0]
R/W
000h
Data for DAC output
Data are in straight-binary format. MSB left-aligned. MSB leftaligned. Use the following bit-alignment:
DAC63202: {DAC-X-MARGIN-HIGH[11:0]}
DAC53202: {DAC-X-MARGIN-HIGH[9:0], X, X}
X = Don't care bits.
3-0
X
X
0h
Don't care
7.6.9 COMMON-CONFIG Register (address = 1Fh) [reset = 0FFFh]
PMBus page address = FFh, PMBus register address = E3h
Figure 7-30. COMMON-CONFIG Register
15
14
13
12
WINLATCHEN
DEVLOCK
EE-READADDR
EN-INTREF
VOUT-PDN-0
IOUTPDN-0
Don't care
VOUT-PDN-1
IOUTPDN-1
R/W-0h
R/W-0h
R/W-11b
R/W-1b
X-11h
R/W-11b
R/W-1b
R/W-0h R/W-0h
11
10
9
8
7
6
5
4
3
2
1
0
Table 7-33. COMMON-CONFIG Register Field Descriptions
Bit
Field
Type
Reset
Description
15
WIN-LATCH-EN
R/W
0
0: Non-latching window-comparator output
1: Latching window-comparator output
14
DEV-LOCK
R/W
0
0: Device not locked
1: Device locked, the device locks all the registers. To set this
bit back to 0 (unlock device), write to the unlock code to the DEVUNLOCK field in the COMMON-TRIGGER register first, followed
by a write to the DEV-LOCK bit as 0.
13
EE-READ-ADDR
R/W
0
0: Fault-dump read enable at address 0x00
1: Fault-dump read enable at address 0x01
12
EN-INT-REF
R/W
0
0: Disable internal reference
1: Enable internal reference. This bit must be set before using
internal reference gain settings.
R/W
11
00: Power-up VOUT-X
01: Power-down VOUT-X with 10 kΩ to AGND
10: Power-down VOUT-X with 100 kΩ to AGND
11: Power-down VOUT-X with Hi-Z to AGND
11-10, 2-1 VOUT-PDN-X
60
9, 0
IOUT-PDN-X
R/W
1
0: Power-up IOUT-X
1: Power-down IOUT-X
8-3
X
X
11h
Don't care
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7.6.10 COMMON-TRIGGER Register (address = 20h) [reset = 0000h]
PMBus page address = FFh, PMBus register address = E4h
Figure 7-31. COMMON-TRIGGER Register
15
14
13
12
11
10
9
DEV-UNLOCK
RESET
R/W-0h
R/W-0h
8
7
6
5
4
3
2
1
0
LDAC
CLR
X
FAULTDUMP
PROTECT
READONETRIG
NVMPROG
NVMRELOAD
X-0h
R/W-0h
R/W-0h
R/W-0h
R/W-0h
R/W-0h
R/W-0h R/W-0h
Table 7-34. COMMON-TRIGGER Register Field Descriptions
Bit
Field
Type
Reset
Description
DEV-UNLOCK
R/W
0000
0101: Device unlocking password
Others: Don't care
RESET
W
0000
1010: POR reset triggered. This bit self-resets.
Others: Don't care
7
LDAC
R/W
0
0: LDAC operation not triggered
1: LDAC operation triggered if the respective SYNC-CONFIG-X
bit in the DAC-X-FUNC-CONFIG register is 1. This bit self-resets.
6
CLR
R/W
0
0: DAC registers and outputs unaffected
1: DAC registers and outputs set to zero-code or mid-code based
on the respective CLR-SEL-X bit in the DAC-X-FUNC-CONFIG
register. This bit self-resets.
5
X
X
0
Don't care
4
FAULT-DUMP
R/W
0
0: Fault-dump is not triggered
1: Triggers fault-dump sequence. This bit self-resets.
3
PROTECT
R/W
0
0: PROTECT function not triggered
1: Trigger PROTECT function. This bit is self-resetting.
2
READ-ONE-TRIG
R/W
0
0: Fault-dump read not triggered
1: Read one row of NVM for fault-dump. This bit self-resets.
1
NVM-PROG
R/W
0
0: NVM write not triggered
1: NVM write triggered. This bit self-resets.
0
NVM-RELOAD
R/W
0
0: NVM reload not triggered
1: Reload data from NVM to register map. This bit self-resets.
15-12
11-8
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7.6.11 COMMON-DAC-TRIG Register (address = 21h) [reset = 0000h]
PMBus page address = FFh, PMBus register address = E5h
Figure 7-32. COMMON-DAC-TRIG Register
15
14
13
12
RESETCMPFLAG-1
TRIGMARLO-1
TRIGMARHI-1
STARTFUNC-1
W-0h
W-0h
W-0h
R/W-0h
11
10
9
8
7
6
5
4
3
2
1
0
Don't care
RESETCMPFLAG-0
TRIGMARLO-0
TRIGMARHI-0
STARTFUNC-0
X-0h
W-0h
W-0h
W-0h
R/W-0h
Table 7-35. COMMON-DAC-TRIG Register Field Descriptions
Bit
62
Field
Type
Reset
Description
15, 3
RESET-CMP-FLAG-X
W
0
0: Latching-comparator output unaffected
1: Reset latching-comparator and window-comparator output.
This bit self-resets.
14, 2
TRIG-MAR-LO-X
W
0
0: Don't care
1: Trigger margin-low command. This bit self-resets.
13, 1
TRIG-MAR-HI-X
W
0
0: Don't care
1: Trigger margin-high command. This bit self-resets.
12, 0
START-FUNC-X
R/W
0
0: Stop function generation
1: Start function generation as per FUNC-GEN-CONFIG-X in the
DAC-X-FUNC-CONFIG register.
11-4
X
X
0h
Don't care
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7.6.12 GENERAL-STATUS Register (address = 22h) [reset = 00h, DEVICE-ID, VERSION-ID]
PMBus page address = FFh, PMBus register address = E6h
Figure 7-33. GENERAL-STATUS Register
15
14
13
12
NVMCRCFAIL-INT
NVMCRCFAILUSER
X
DAC-0BUSY
R-0h
R-0h
R-0h
R-0h
11
10
9
8
7
6
5
4
3
2
1
0
X
DAC-1BUSY
X
DEVICE-ID
VERSION-ID
X-0h
R-0h
X-0h
R
R-0h
Table 7-36. GENERAL-STATUS Register Field Descriptions
Bit
Field
Type
Reset
Description
15
NVM-CRC-FAIL-INT
R
0
0: No CRC error in OTP
1: Indicates a failure in OTP loading. A software
reset or power-cycle can bring the device out of
this condition in case of temporary failure.
14
NVM-CRC-FAIL-USER
R
0
0: No CRC error in NVM loading
1: Indicates a failure in NVM loading. The register
settings are corrupted. The device allows all
operations during this error condition. Reprogram
the NVM to get original state. A software reset
brings the device out of this temporary error
condition.
13
X
R
0
Don't care
12
DAC-0-BUSY
R
0
0: DAC-0 channel can accept commands
1: DAC-0 channel does not accept commands
X
X
0
Don't care
9
DAC-1-BUSY
R
0
0: DAC-1 channel can accept commands
1: DAC-1 channel does not accept commands
8
11-10
X
R
0
Don't care
7-2
DEVICE-ID
R
DAC63202: 06h
DAC53202: 07h
Device identifier.
1-0
VERSION-ID
R
00
Version identifier.
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7.6.13 CMP-STATUS Register (address = 23h) [reset = 0000h]
PMBus page address = FFh, PMBus register address = E7h
Figure 7-34. CMP-STATUS Register
15
14
13
12
11
10
9
X
8
7
6
5
PROTECT- WINFLAG
CMP-0
X-0h
R-0h
X
R-0h
4
3
2
WIN- CMPCMP-1 FLAG0
X-0h
R-0h
R-0h
1
0
X
CMPFLAG1
X-0h
R-0h
Table 7-37. CMP-STATUS Register Field Descriptions
Bit
Field
Type
Reset
Description
X
0
Don't care
PROTECT-FLAG
R
0
0: PROTECT operation not triggered.
1: PROTECT function is completed or in progress. This bit resets
to 0 when read.
7, 4
WIN-CMP-X
R
0
Window comparator output from respective channels. The output
is latched or unlatched based on the WINDOW-LATCH-EN
setting in the COMMON-CONFIG register.
3, 0
CMP-FLAG-X
R
0
Synchronized comparator output from respective channels.
15-9, 6-5, X
2-1
8
7.6.14 GPIO-CONFIG Register (address = 24h) [reset = 0000h]
PMBus page address = FFh, PMBus register address = E8h
Figure 7-35. GPIO-CONFIG Register
15
14
13
12
11
GF-EN
X
GPO-EN
GPO-CONFIG
10
9
8
GPI-CH-SEL
7
6
5
4
GPI-CONFIG
3
2
1
GPI-EN
0
R/W-0h
X-0h
R/W-0h
R/W-0h
R/W-0h
R/W-0h
R/W-0h
Table 7-38. GPIO-CONFIG Register Field Descriptions
Bit
Field
Type
Reset
Description
15
GF-EN
R/W
0
0: Glitch filter disabled for GP input. This setting provides faster
response.
1: Glitch filter enabled for GPI. This setting introduces additional
propagation delay but provides robustness.
14
X
X
0
Don't care.
13
GPO-EN
R/W
0
0: Disable output mode for GPIO pin.
1: Enable output mode for GPIO pin.
12-9
GPO-CONFIG
R/W
0000
STATUS function setting. The GPIO pin is mapped to the
following register bits as output:
0001: NVM-BUSY
0100: DAC-1-BUSY
0111: DAC-0-BUSY
1000: WIN-CMP-1
1011:WIN-CMP-0
Others: NA
8-5
GPI-CH-SEL
R/W
0000
Two bits correspond to two DAC channels. 0b is disabled and 1b
is enabled.
GPI-CH-SEL[0]: Channel 1
GPI-CH-SEL[3]: Channel 0
Example: when GPI-CH-SEL is 1001, both channel-0 and
channel-1 are enabled.
64
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Table 7-38. GPIO-CONFIG Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
4-1
GPI-CONFIG
R/W
0000
GPIO pin input configuration. Global settings act on the entire
device. Channel-specific settings are dependent on the channel
selection by the GPI-CH-SEL bits:
0010: FAULT-DUMP (global). GPIO falling edge triggers fault
dump, GPIO = 1 has no effect.
0011: IOUT power up-down (channel-specific). GPIO falling edge
triggers power down, GPIO rising edge triggers power up.
0100: VOUT power up-down (channel-specific). The output load
is as per the VOUT-PDN-X setting. GPIO falling edge triggers
power down, GPIO rising edge triggers power up.
0101: PROTECT input (global). GPIO falling edge asserts
PROTECT function, GPIO = 1 has no effect.
0111: CLR input (global). GPIO = 0 asserts CLR function, GPIO =
1 has no effect.
1000: LDAC input (channel-specific). GPIO falling edge asserts
LDAC function, GPIO = 1 has no effect. Both the SYNC-CONFIGX and the GPI-CH-SEL must be configured for every channel.
1001: Start and stop function generation (channel-specific). GPIO
falling edge stops function generation. GPIO rising edge starts
function generation.
1010: Trigger margin high-low (channel-specific). GPIO falling
edge triggers margin low. GPIO rising edge triggers margin high.
1011: RESET input (global). The falling edge of the GPIO pin
asserts the RESET function. The RESET input must be a pulse.
The GPIO rising edge brings the device out of reset. The RESET
configuration must be programmed into the NVM. Otherwise the
setting is cleared after the device reset.
1100: NVM write protection (global). GPIO falling edge allows
NVM programming. GPIO rising edge blocks NVM programming.
1101: Register-map lock (global). GPIO falling edge allows
update to the register map. GPIO rising edge blocks any register
map update except a write to the DEV-UNLOCK field through I2C
or SPI and to the RESET field through I2C.
Others: Invalid
0
GPI-EN
R/W
0
0: Disable input mode for GPIO pin.
1: Enable input mode for GPIO pin.
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7.6.15 DEVICE-MODE-CONFIG Register (address = 25h) [reset = 0000h]
PMBus page address = FFh, PMBus register address = E9h
Figure 7-36. DEVICE-MODE-CONFIG Register
15
14
13
12
11
10
9
8
7
6
5
4
3
2
RESERVED
DISMODE-IN
RESERVED
PROTECTCONFIG
RESERVED
X
R/W-0h
R/W-0h
R/W-0h
R/W-0h
R/W-0h
X-0h
1
0
Table 7-39. DEVICE-MODE-CONFIG Register Field Descriptions
Bit
Field
Type
Reset
Description
RESERVED
R/W
00
Always write 0b00
DIS-MODE-IN
R/W
0
Write 1 to this bit for low-power consumption.
RESERVED
R/W
0
Always write 0b000
9-8
PROTECT-CONFIG
R/W
00
00: Switch to Hi-Z power-down (no slew)
01: Switch to DAC code stored in NVM (no slew) and then switch
to Hi-Z power-down
10: Slew to margin-low code and then switch to Hi-Z power-down
11: Slew to margin-high code and then switch to Hi-Z power-down
7-5
RESERVED
R/W
0
Always write 0b000
4-0
X
R/W
00h
Don't care
15-14
13
12-10
7.6.16 INTERFACE-CONFIG Register (address = 26h) [reset = 0000h]
Figure 7-37. INTERFACE-CONFIG Register
15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
0
X
SDOEN
X
TIMEOUTEN
X
EN-PMBUS
X
FSDOEN
X-0h
R/W-0h
X-0h
R/W-0h
X-0h
R/W-0h
X-0h R/W-0h
Table 7-40. INTERFACE-CONFIG Register Field Descriptions
Bit
15-13
12
11-9
8
7-3
66
Field
Type
Reset
Description
X
X
0h
Don't care
TIMEOUT-EN
R/W
0
0: I2C timeout disabled
1: I2C timeout enabled
X
X
0h
Don't care
EN-PMBUS
R/W
0
0: PMBus disabled
1: Enable PMBus
X
X
00h
Don't care
2
FSDO-EN
R/W
0
0: Fast SDO disabled
1: Fast SDO enabled
1
X
X
0
Don't care
0
SDO-EN
R/W
0
0: SDO disabled
1: SDO enabled on GPIO pin
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7.6.17 SRAM-CONFIG Register (address = 2Bh) [reset = 0000h]
PMBus page address = FFh, PMBus register address = EFh
Figure 7-38. SRAM-CONFIG Register
15
14
13
12
11
10
9
8
7
6
5
4
3
X
SRAM-ADDR
X-0h
R/W-0h
2
1
0
Table 7-41. SRAM-CONFIG Register Field Descriptions
Bit
Field
Type
Reset
Description
15-8
X
X
0h
Don't care
7-0
SRAM-ADDR
R/W
0h
8-bit SRAM address. Writing to this register field configures the
SRAM address to be accessed next. This address automatically
increments after a write to the SRAM.
7.6.18 SRAM-DATA Register (address = 2Ch) [reset = 0000h]
PMBus page address = FFh, PMBus register address = F0h
Figure 7-39. SRAM-DATA Register
15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
0
SRAM-DATA
R/W-0h
Table 7-42. SRAM-DATA Register Field Descriptions
Bit
15-0
Field
Type
Reset
Description
SRAM-ADDR
R/W
0h
16-bit SRAM data. This data is written to or read from the address
configured in the SRAM-CONFIG register.
7.6.19 BRDCAST-DATA Register (address = 50h) [reset = 0000h]
PMBus page address = FFh, PMBus register address = F1h
Figure 7-40. BRDCAST-DATA Register
15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
DAC63202: BRDCAST-DATA[11:0]
DAC53202: BRDCAST-DATA[9:0]
X
R/W-0h
X-0h
0
Table 7-43. BRDCAST-DATA Register Field Descriptions
Bit
15-4
Field
Type
Reset
Description
DAC63202: BRDCAST-DATA[11:0]
DAC53202: BRDCAST-DATA[9:0]
R/W
000h
Broadcast code for all DAC channels
Data are in straight-binary format. MSB left-aligned. Use the
following bit-alignment:
DAC63202: {DAC-X-MARGIN-HIGH[11:0]}
DAC53202: {DAC-X-MARGIN-HIGH[9:0], X, X}
X = Don't care bits.
The BRD-CONFIG-X bit in the DAC-X-FUNC-CONFIG register
must be enabled for the respective channels.
3-0
X
X
0h
Don't care.
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7.6.20 PMBUS-PAGE Register [reset = 0300h]
PMBus page address = X, PMBus register address = 00h
Figure 7-41. PMBUS-PAGE Register
15
14
13
12
11
10
9
8
7
6
5
4
3
PMBUS-PAGE
X
R/W-03h
X-00h
2
1
0
Table 7-44. PMBUS_OPERATION Register Field Descriptions
Bit
Field
Type
Reset
Description
15-8
PMBUS-PAGE
R/W
03h
8-bit PMBus page address as specified in Table 7-21.
7-0
X
X
00h
Not applicable
7.6.21 PMBUS-OP-CMD-X Register [reset = 0000h]
PMBus page address = 00h, 01h, 02h, 03h, PMBus register address = 01h
Figure 7-42. PMBUS-OP-CMD-X Register (X = 0, 1, 2, 3)
15
14
13
12
11
10
9
8
7
6
5
4
3
PMBUS-OPERATION-CMD-X
X
R/W-00h
X-00h
2
1
0
Table 7-45. PMBUS-OP-CMD-X Register Field Descriptions
Field
Type
Reset
Description
15-8
Bit
PMBUS-OPERATION-CMD-X
R/W
00h
PMBus operation commands:
00h: Turn off
80h: Turn on
A4h: Margin high, DAC output margins high to DAC-X-MARGINHIGH code
94h: Margin low, DAC output margins low to DAC-X-MARGINLOW code
7-0
X
X
00h
Not applicable
7.6.22 PMBUS-CML Register [reset = 0000h]
PMBus page address = X, PMBus register address = 78h
Figure 7-43. PMBUS-CML Register
15
14
13
9
8
X
12
11
10
CML
X
7
6
5
4
N/A
3
X-00h
R/W-0h
X-0h
X-00h
2
1
0
Table 7-46. PMBUS-CML Register Field Descriptions
Bit
15-10
68
Field
Type
Reset
Description
X
X
00h
Don't care
9
CML
R/W
0h
0: No communication fault
1: PMBus communication fault for write with incorrect number of
clocks, read before write command, invalid command address,
and invalid or unsupported data value; reset this bit by writing 1.
8
X
X
0h
Don't care
7-0
X
X
00h
Not applicable
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7.6.23 PMBUS-VERSION Register [reset = 2200h]
PMBus page address = X, PMBus register address =98h
Figure 7-44. PMBUS-VERSION Register
15
14
13
12
11
10
9
8
7
6
5
4
3
PMBUS-VERSION
X
R-22h
X-00h
2
1
0
Table 7-47. PMBUS-VERSION Register Field Descriptions
Bit
Field
Type
Reset
Description
15-8
PMBUS-VERSION
R
22h
PMBus version
7-0
X
X
00h
Not applicable
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8 Application and Implementation
Note
Information in the following applications sections is not part of the TI component specification,
and TI does not warrant its accuracy or completeness. TI’s customers are responsible for
determining suitability of components for their purposes, as well as validating and testing their design
implementation to confirm system functionality.
8.1 Application Information
The DACx3202 are dual-channel buffered, force-sense output, voltage-output and current-output smart DACs
that include an NVM and internal reference, and available in a tiny 3-mm × 3-mm package.
•
•
•
•
•
•
•
In voltage-output mode, short the OUTx and FBx pins for each channel. In current-output mode, leave the
FBx pins unconnected. The FBx pins function as inputs in comparator mode.
The external reference must not exceed VDD, either during transient or steady-state conditions. For the best
Hi-Z output performance, use a pullup resistor on the VREF pin to VDD. In case the VDD remains floating
during the off condition, place a 100-kΩ resistor to AGND for proper detection of the VDD off condition.
All the digital outputs are open drain; use external pullup resistors on these pins.
The interface protocol is detected at power-on, and the device locks to the protocol as long as VDD is on.
When allocating nonoverlapping I2C addresses on a system I2C bus, consider the broadcast address as well.
I2C timeout can be enabled for robustness.
SPI mode is 3-wire by default. Configure the GPIO pin as SDO in the NVM for SPI readback capability. The
SPI clock speed in readback mode is slower than that in write mode.
Power-down mode sets the DAC outputs in Hi-Z by default. Change the configuration appropriately for
different power-down settings. The DAC channels can also power-up with a programmed DAC code in the
NVM.
8.2 Typical Application
A power-supply margining and scaling circuit is used to trim, scale, or test the output of a power converter.
This example circuit is used to test a system by margining the power supplies for adaptive voltage scaling or to
program a desired value at the output. Adjustable power supplies, such as low-dropout regulators (LDOs) and
DC/DC converters, provide a feedback or adjust the input that is used to set the desired output. A precision
voltage-output DAC is the best choice for controlling the power-supply output linearly. Figure 8-1 shows a control
circuit for a switch-mode power supply (SMPS) using the DACx3202. Typical applications of power-supply
margining are communications equipment, enterprise servers, test and measurement, and general-purpose
power-supply modules.
VDD
10 kΩ
0.1 μ
VREF
CAP
1.5 μF
LDO
L
PH
IN
SMPS / LDO
VOUT
BOOT
CB
SENSE
CL
Internal
Reference
R1
VFB
R3
R2
R3
GND
NVM
VOUT/
IOUT
DAC
REG
DAC
BUF
VOUT/
IOUT
DAC
REG
DAC
BUF
Output Configuration
Logic
Power-supply: 0
Power-supply: 1
SCL/SYNC
Digital Interface
VIN
SDA/SCLK
A0/SDI
PROTECT
DACx3202
AGND
Figure 8-1. Voltage Margining and Scaling
70
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8.2.1 Design Requirements
Table 8-1. Design Parameters
PARAMETER
VALUE
Power-supply nominal output
3.3 V
Reference voltage of the converter (VFB)
0.6 V
Margin
±10% (that is, 2.97 V to 3.63 V)
DAC output range
1.8 V
Nominal current through R1 and R2
100 µA
8.2.2 Detailed Design Procedure
The DACx3202 features a Hi-Z power-down mode that is set by default at power-up, unless the device is
programmed otherwise using the NVM. When the DAC output is at Hi-Z, the current through R3 is zero and the
SMPS is set at the nominal output voltage of 3.3 V. To have the same nominal condition when the DAC powers
up, bring up the device at the same output as VFB (that is 0.6 V). This configuration makes sure there is no
current through R3 even at power-up. Calculate R1 as (VOUT – VFB) / 100 µA = 27 kΩ.
To achieve ±10% margin-high and margin-low conditions, the DAC must sink or source additional current
through R1. Calculate the current from the DAC (IMARGIN) using Equation 9 as 12 µA.
where
•
•
•
•
•
•
IMARGIN =
VOUT × 1 + MARGIN − VFB
− INOMINAL
R1
(9)
IMARGIN is the margin current sourced or sinked from the DAC.
MARGIN is the percentage margin value divided by 100.
INOMINAL is the nominal current through R1 and R2.
VOUT is the output voltage of the respective DAC channel.
VFB is the reference voltage at the SENSE node of the power converter.
R1 is the resistance between the output and SENSE pin of the power converter.
To calculate the value of R3, first decide the DAC output range, and make sure to avoid the codes near
zero-scale and full-scale for safe operation in the linear region. A DAC output of 20 mV is a safe consideration as
the minimum output, and (1.8 V – 0.6 V – 20 mV = 1.18 V) as the maximum output. When the DAC output is at
20 mV, the power supply goes to margin high, and when the DAC output is at 1.18 V, the power supply goes to
margin low. Calculate the value of R3 using Equation 10 as 48.3 kΩ. Choose a standard resistor value and adjust
the DAC outputs. Choosing R3 = 47 kΩ makes the DAC margin high code as 1.164 V and the DAC margin low
code as 36 mV.
R3 =
VDAC − VFB
IMARGIN
(10)
When the DACx3202 are set to current-output mode, series resistor R3 is not required. Set the DAC output at
the current-output range of –25 µA to +25 µA, and set the DAC code accordingly to achieve a margin current of
±12 µA.
The DACx3202 have a slew-rate feature that is used to toggle between margin high, margin low, and nominal
outputs with a defined slew rate; see also Section 7.6.7.
Note
The DAC-X-MARGIN-HIGH register value in DACx3202 results in the margin-low value at the power
supply output. Similarly, the DAC-X-MARGIN-LOW register value in DACx3202 results in the marginhigh value at the power-supply output.
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The pseudocode for getting started with a power-supply control application is as follows:
//SYNTAX: WRITE , ,
//Write DAC code for nominal output (repeat for all DAC channels)
//For a 1.8-V output range, the 10-bit hex code for 0.6 V is 0x155. With 16-bit left alignment,
this becomes 0x5540
WRITE DAC_0_DATA(0x1C), 0x55, 0x40
//Power-up voltage output on both the channels, enables internal reference
WRITE COMMON-CONFIG(0x1F), 0x12, 0x01
//Set channel 0 gain setting to 1.5x internal reference (1.8 V)
WRITE DAC-0-VOUT-CMP-CONFIG(0x15), 0x08, 0x00
//Set channel 1 gain setting to 1.5x internal reference (1.8 V)
WRITE DAC-1-VOUT-CMP-CONFIG(0x3), 0x08, 0x00
//Configure GPI for Margin-High, Low trigger for all channels
WRITE GPIO-CONFIG(0x24), 0x01, 0x35
//Set slew rate and code step (repeat for all channels)
//CODE_STEP: 2 LSB, SLEW_RATE: 60.72 µs/step
WRITE DAC-0-FUNC-CONFIG(0x18), 0x00, 0x17
//Write DAC margin high code (repeat for all channels)
//For a 1.8-V output range, the 10-bit hex code for 1.164 V is 0x296. With 16-bit left alignment,
this becomes 0xA540
WRITE DAC-0-MARGIN-HIGH(0x13), 0xA5, 0x40
//Write DAC margin low code (repeat for all channels)
//For a 1.8-V output range, the 10-bit hex code for 36 mV is 0x14. With 16-bit left alignment, this
becomes 0x0500
WRITE DAC-0-MARGIN-LOW(0x14), 0x05, 0x00
//Save settings to NVM
WRITE COMMON-TRIGGER(0x20), 0x00, 0x02
8.2.3 Application Curves
Figure 8-2. Power-Supply Margin High
72
Figure 8-3. Power-Supply Margin Low
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9 Power Supply Recommendations
The DACx3202 family of devices does not require specific power-supply sequencing. These devices require a
single power supply, VDD. However, make sure the external voltage reference is applied after VDD. Use a 0.1-µF
decoupling capacitor for the VDD pin. Use a bypass capacitor with a value approximately 1.5 µF for the CAP pin.
10 Layout
10.1 Layout Guidelines
The DACx3202 pin configuration separates the analog, digital, and power pins for an optimized layout. For signal
integrity, separate the digital and analog traces, and place decoupling capacitors close to the device pins.
10.2 Layout Example
VREF Pullup
Resistor
VDD
VDD
Decoupling
Capacitor
GND
GND
13
3
10
4
9
FB1
OUT1
8
11
7
12
2
6
VIO
GND
1
5
FB0
14
16
DACx3202
15
GND
VREF Bypass
Capacitor
VIO
SDA/SCLK
SCL/SYNC
GPIO/SDO
VIO
A0/SDI
OUT0
LDO Bypass
Capacitor
VIO
Figure 10-1. Layout Example
Note: The ground and power planes have been omitted for clarity. Connect the thermal pad to ground.
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11 Device and Documentation Support
TI offers an extensive line of development tools. Tools and software to evaluate the performance of the device,
generate code, and develop solutions are listed below.
11.1 Documentation Support
11.1.1 Related Documentation
The following EVM user's guide is available: DACx3204 Evaluation Module user's guide
11.2 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on
Subscribe to updates to register and receive a weekly digest of any product information that has changed. For
change details, review the revision history included in any revised document.
11.3 Support Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
11.4 Trademarks
PMBus™ is a trademark of SMIF, Inc..
TI E2E™ is a trademark of Texas Instruments.
All trademarks are the property of their respective owners.
11.5 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
11.6 Glossary
TI Glossary
This glossary lists and explains terms, acronyms, and definitions.
12 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
74
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PACKAGE OPTION ADDENDUM
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PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
Samples
(4/5)
(6)
DAC53202RTER
ACTIVE
WQFN
RTE
16
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
D53202
Samples
DAC63202RTER
ACTIVE
WQFN
RTE
16
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
D63202
Samples
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of