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DAC8554IPWR

DAC8554IPWR

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    TSSOP16_5X4.4MM

  • 描述:

    16位,四通道,超低故障,电压输出数模转换器

  • 数据手册
  • 价格&库存
DAC8554IPWR 数据手册
          DA C8 554 DAC8554 SLAS431B – JUNE 2005 – REVISED OCTOBER 2006 16-BIT, QUAD-CHANNEL, ULTRA-LOW GLITCH, VOLTAGE OUTPUT DIGITAL-TO-ANALOG CONVERTER FEATURES • • • • • • • • • • • • • • • Relative Accuracy: 4LSB Glitch Energy: 0.15nV-s MicroPower Operation: 150µA per channel at 2.7V Power-On Reset to Zero-Scale Power Supply: +2.7V to +5.5V 16-Bit Monotonic Over Temperature Settling Time: 10µs to ±0.003% FSR Ultra-Low AC Crosstalk: –100dB Typ Low Power SPI™ Compatible Serial Interface with Schmitt-Triggered Inputs: Up to 50MHz On-Chip Output Buffer Amplifier with Rail-to-Rail Operation Double Buffered Input Architecture Simultaneous or Sequential Output Update and Power-Down 16-Channel Broadcast Capability 1.8V to 5.5V Logic Compatibility Available in a TSSOP-16 Package APPLICATIONS • • • • • • Portable Instrumentation Closed-Loop Servo-Control Process Control Data Acquisition Systems Programmable Attenuation PC Peripherals DESCRIPTION The DAC8554 is a 16-bit, quad-channel, voltage output, digital-to-analog converter (DAC), offering low-power operation and a flexible serial host interface. It offers monotonicity, good linearity, and exceptionally low glitch. Each on-chip precision output amplifier allows rail-to-rail output swing to be achieved over the supply range of 2.7V to 5.5V. The device supports a standard 3-wire serial interface capable of operating with input data clock frequencies up to 50MHz for IOVDD = 5V. The DAC8554 requires an external reference voltage to set the output range of each DAC channel. Also incorporated into the device is a power-on reset circuit which ensures that the DAC outputs power up at zero-scale and remain there until a valid write takes place. The DAC8554 provides a per channel power-down feature, accessed over the serial interface, that reduces the current consumption to 175nA per channel at 5V. The low-power consumption of this device in normal operation makes it ideally suited to portable battery-operated equipment and other low-power applications. The power consumption is 4.25mW at 5V, reducing to 4µW in power-down mode. The DAC8554 is available in a TSSOP-16 package with a specified operating temperature range of –40°C to +105°C. FUNCTIONAL BLOCK DIAGRAM AVDD IOVDD VREFH Data Buffer A DAC Register A VOUTA DAC A VOUTB VOUTC Data Buffer D 18 SYNC SCLK 24-Bit Serial-to-Parallel Shift Register 8 Buffer Control DAC Register D Register Control Power-Down Control Logic Resistor Network DIN A0 A1 LDAC ENABLE VOUTD DAC D VREFL Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SPI, QSPI are trademarks of Motorola, Inc. Microwire is a trademark of National Semiconductor. All other trademarks are the property of their respective owners. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2005–2006, Texas Instruments Incorporated DAC8554 www.ti.com SLAS431B – JUNE 2005 – REVISED OCTOBER 2006 This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. PACKAGING/ORDERING INFORMATION (1) PRODUCT MAXIMUM RELATIVE ACCURACY (LSB) MAXIMUM DIFFERENTIAL NONLINEARITY (LSB) PACKAGELEAD PACKAGE DESIGNATOR SPECIFIED TEMPERATURE RANGE PACKAGE MARKING DAC8554 ±12 ±1 TSSOP-16 PW –40°C to +105°C D8554 (1) ORDERING NUMBER TRANSPORT MEDIA, QUANTITY DAC8554IPW Tube, 90 DAC8554IPWR Tape and Reel, 2000 For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI web site at www.ti.com. ABSOLUTE MAXIMUM RATINGS (1) UNIT AVDD to GND –0.3V to 6V Digital input voltage to GND –0.3 V to AVDD + 0.3V VO(A) to VO(D) to GND –0.3V to AVDD + 0.3V Operating temperature range –40°C to +105°C Storage temperature range –65°C to +150°C Junction temperature range (TJ max) 150°C Power dissipation θJA Thermal impedance 118°C/W θJC Thermal impedance 29°C/W ESD rating (1) (TJmax – TA)/θJA Human body model (HBM) 1500V Charged device model (CDM) 1000V Stresses above those listed under absolute maximum ratings may cause permanent damage to the device. Exposure to absolute maximum conditions for extended periods may affect device reliability. ELECTRICAL CHARACTERISTICS VDD = 2.7V to 5.5V,– 40°C to +105°C range (unless otherwise noted). PARAMETER TEST CONDITIONS MIN TYP MAX UNIT ±4 ±12 LSB ±0.25 ±1 LSB ±2 ±12 STATIC PERFORMANCE (1) Resolution 16 Relative accuracy Measured by line passing through codes 485 and 64741 Differential nonlinearity 16-bit monotonic Zero-scale error Measured by line passing through codes 485 and 64741 ±5 Zero-scale error drift Full-scale error Gain error Measured by line passing through codes 485 and 64741, (AVDD = 5V, VREF = 4.99V) and (AVDD = 2.7V, VREF = 2.69V) Power-Supply Rejection Ratio RL = 2kΩ, CL = 200pF mV µV/°C ±0.3 ±0.5 % of FSR ±0.05 ±0.15 % of FSR ppm of FSR/°C ±1 Gain temperature coefficient PSRR Bits 0.75 mV/V OUTPUT CHARACTERISTICS (2) Output voltage range Output voltage settling time 0 To ±0.003% FSR, 0200h to FD00h, RL = 2kΩ, 0pF < CL < 200pF RL = 2kΩ, CL = 500pF (1) (2) 2 Linearity calculated using a reduced code range of 485 to 64741; output unloaded. Ensured by design and characterization; not production tested. Submit Documentation Feedback 8 12 VREFH V 10 µs µs DAC8554 www.ti.com SLAS431B – JUNE 2005 – REVISED OCTOBER 2006 ELECTRICAL CHARACTERISTICS (continued) VDD = 2.7V to 5.5V,– 40°C to +105°C range (unless otherwise noted). PARAMETER TEST CONDITIONS MIN Slew rate Capacitive load stability Code change glitch impulse TYP MAX UNIT 1.8 V/µs 470 pF RL = 2kΩ 1000 pF 1LSB change around major carry 0.15 RL = ∞ Digital feedthrough nV-s 0.15 DC crosstalk Full-scale swing on adjacent channel. AVDD = 5V, VREF = 4.096V 0.25 LSB AC crosstalk 1kHz sine wave –100 dB DC output impedance At mid-point input 1 Ω Short-circuit current Power-up time AVDD = 5V 50 AVDD = 3V 20 Coming out of power-down mode, AVDD = 5V 2.5 Coming out of power-down mode, AVDD = 3V 5 mA µs AC PERFORMANCE SNR 95 THD –85 BW = 20kHz, AVDD = 5V, FOUT = 1kHz, 1st 19 harmonics removed for SNR calculation SFDR dB 87 SINAD 84 REFERENCE INPUT VREFH Voltage VREFL < VREFH, AVDD – (VREFH + VREFL)/2 > 1.2V 0 AVDD VREFL Voltage VREFL < VREFH , AVDD – (VREFH + VREFL)/2 > 1.2V 0 AVDD/2 V Reference input current Reference input impedance V VREFL = GND, VREFH = AVDD = 5V 180 250 µA VREFL = GND, VREFH = AVDD = 3V 120 200 µA VREFL < VREFH 31 kΩ LOGIC INPUTS (3) VIL Logic input LOW voltage VIH Logic input HIGH voltage 2.7V ≤ IOVDD ≤ 5.5V 0.3 × IOVDD 1.8V ≤ IOVDD ≤ 2.7V 0.1 × IOVDD 2.7 ≤ IOVDD ≤ 5.5V 0.7 × IOVDD 1.8 ≤ IOVDD < 2.7V 0.95 × IOVDD V V Pin capacitance 3 pF POWER REQUIREMENTS AVDD 2.7 5.5 IOVDD 1.8 5.5 IDD (normal mode) Input code = 32768, no load, reference current not included IOIDD AVDD = 3.6V to 5.5V V VIH = IOVDD and VIL = GND AVDD = 2.7V to 3.6V 10 20 0.65 0.95 0.6 0.9 0.7 2 0.4 2 µA mA IDD (all power-down modes) AVDD = 3.6V to 5.5V VIH = IOVDD and VIL = GND AVDD = 2.7V to 3.6V µA POWER EFFICIENCY IOUT/IDD IL = 2mA, AVDD = 5V 89 % TEMPERATURE RANGE Specified performance (3) –40 +105 °C Ensured by design and characterization; not production tested. Submit Documentation Feedback 3 DAC8554 www.ti.com SLAS431B – JUNE 2005 – REVISED OCTOBER 2006 PIN CONFIGURATION VOUTA 1 16 LDAC VOUTB 2 15 ENABLE VREFH 3 14 A1 AVDD 4 13 A0 DAC8554 VREFL 5 12 IOVDD GND 6 11 DIN VOUTC 7 10 SCLK VOUTD 8 9 SYNC PIN DESCRIPTIONS 4 PIN NAME DESCRIPTION 1 VOUTA Analog output voltage from DAC A. 2 VOUTB Analog output voltage from DAC B. 3 VrefH Positive reference voltage input. 4 AVDD Power supply input, 2.7V to 5.5V. 5 VrefL Negative reference voltage input. 6 GND Ground reference point for all circuitry on the part. 7 VOUTC Analog output voltage DAC C. 8 VOUTD Analog output voltage DAC D. 9 SYNC Level-triggered control input (active LOW). This is the frame synchronization signal for the input data. When SYNC goes LOW, it enables the input shift register and data is transferred in on the falling edges of the following clocks. The DAC is updated following the 24th clock (unless SYNC is taken HIGH before this edge, in which case the rising edge of SYNC acts as an interrupt and the write sequence is ignored by the DAC8554). Schmitt-Trigger-Logic input. 10 SCLK Serial clock input. Data can be transferred at rates up to 50MHz. Schmitt-Trigger-Logic input. 11 DIN 12 IOVDD 13 A0 Address 0 — sets device address; see Table 2 14 A1 Address 1 — sets device address; see Table 2 15 ENABLE 16 LDAC Serial data input. Data is clocked into the 24-bit input shift register on each falling edge of the serial clock input. Schmitt-Trigger-Logic input. Digital input-output power supply Active LOW, ENABLE LOW connects the SPI interface to the serial port. Load DACs, rising edge triggered, loads all DAC registers. Submit Documentation Feedback DAC8554 www.ti.com SLAS431B – JUNE 2005 – REVISED OCTOBER 2006 SERIAL WRITE OPERATION t9 t1 SCLK 1 24 t8 t2 t3 t4 t7 SYNC t6 t5 DIN DB23 DB0 DB23 TIMING REQUIREMENTS (1) (2) AVDD = 2.7V to 5.5V, all specifications –40°C to +105°C (unless otherwise noted) PARAMETER TEST CONDITIONS t1 (3) SCLK cycle time t2 SCLK HIGH time t3 SCLK LOW time t4 SYNC falling edge to SCLK rising edge setup time t5 Data setup time t6 Data hold time t7 24th SCLK falling edge to SYNC rising edge t8 Minimum SYNC HIGH time t9 24th SCLK falling edge to SYNC falling edge (1) (2) (3) MIN IOVDD = AVDD = 2.7V to 3.6V 40 IOVDD = AVDD = 3.6V to 5.5V 20 IOVDD = AVDD = 2.7V to 3.6V 20 IOVDD = AVDD = 3.6V to 5.5V 10 IOVDD = AVDD = 2.7V to 3.6V 20 IOVDD = AVDD = 3.6V to 5.5V 10 IOVDD = AVDD = 2.7V to 3.6V 0 IOVDD = AVDD = 3.6V to 5.5V 0 IOVDD = AVDD = 2.7V to 3.6V 5 IOVDD = AVDD = 3.6V to 5.5V 5 IOVDD = AVDD = 2.7V to 3.6V 4.5 IOVDD = AVDD = 3.6V to 5.5V 4.5 IOVDD = AVDD = 2.7V to 3.6V 0 IOVDD = AVDD = 3.6V to 5.5V 0 IOVDD = AVDD = 2.7V to 3.6V 40 IOVDD = AVDD = 3.6V to 5.5V 20 IOVDD = AVDD = 2.7V to 5.5V 130 TYP MAX UNIT ns ns ns ns ns ns ns ns ns All input signals are specified with tR = tF = 3ns (10% to 90% of AVDD) and timed from a voltage level of (VIL + VIH)/2. See Serial Write Operation timing diagram. Maximum SCLK frequency is 50MHz at IOVDD = AVDD = 3.6V to 5.5V and 25MHz at IOVDD = AVDD = 2.7V to 3.6V. Submit Documentation Feedback 5 DAC8554 www.ti.com SLAS431B – JUNE 2005 – REVISED OCTOBER 2006 TYPICAL CHARACTERISTICS: VDD = 5V At TA = +25°C, unless otherwise noted. LINEARITY ERROR AND DIFFERENTIAL LINEARITY ERROR vs DIGITAL INPUT CODE LE (LSB) 1.0 1.0 0.5 0.5 0 -0.5 -1.0 8 6 4 2 0 -2 -4 -6 -8 0 -0.5 8192 16384 24576 32768 40960 49152 Digital Input Code 57344 65536 0 16384 24576 32768 40960 49152 Digital Input Code LINEARITY ERROR AND DIFFERENTIAL LINEARITY ERROR vs DIGITAL INPUT CODE LINEARITY ERROR AND DIFFERENTIAL LINEARITY ERROR vs DIGITAL INPUT CODE 8 6 4 2 0 -2 -4 -6 -8 VDD = 5V, VREF = 4.99V LE (LSB) Channel C VDD = 5V, VREF = 4.99V Channel D 1.0 0.5 0 -0.5 -1.0 0.5 0 -0.5 -1.0 0 8192 16384 24576 32768 40960 49152 Digital Input Code 57344 65536 0 8192 16384 24576 32768 40960 49152 Digital Input Code Figure 3. Figure 4. ZERO-SCALE ERROR vs TEMPERATURE FULL-SCALE ERROR vs TEMPERATURE 57344 65536 0 5.0 VDD = 5V VREF = 4.99V AVDD = 5V, VREF = 4.99V CH C -5 Error (mV) 2.5 CH A 0 CH D -10 CH C -15 CH A CH B -2.5 CH D -20 CH B -25 -5.0 -40 6 57344 65536 Figure 2. DLE (LSB) DLE (LSB) 8192 Figure 1. 1.0 Error (mV) VDD = 5V, VREF = 4.99V Channel B -1.0 0 LE (LSB) 8 6 4 2 0 -2 -4 -6 -8 VDD = 5V, VREF = 4.99V Channel A DLE (LSB) DLE (LSB) LE (LSB) 8 6 4 2 0 -2 -4 -6 -8 LINEARITY ERROR AND DIFFERENTIAL LINEARITY ERROR vs DIGITAL INPUT CODE 0 40 80 120 -40 0 40 Temperature (°C) Temperature (°C) Figure 5. Figure 6. Submit Documentation Feedback 80 120 DAC8554 www.ti.com SLAS431B – JUNE 2005 – REVISED OCTOBER 2006 TYPICAL CHARACTERISTICS: VDD = 5V (continued) At TA = +25°C, unless otherwise noted. SUPPLY CURRENT vs LOGIC INPUT VOLTAGE SOURCE CURRENT CAPABILITY (ALL CHANNELS) 6.0 2000 5.6 1600 TA = +25°C, SYNC Input (All other inputs = GND) CH A Powered Up (All other channels in powerdown) Reference Current Included 5.2 IDD (mA) VOUT (V) IOVDD = AVDD = VREF = 5V 4.8 4.4 AVDD = 5.5V VREF = AVDD - 10mV DAC Loaded with FFFFh 1200 800 400 4.0 0 0 2 4 6 8 10 0 1 2 ISOURCE (mA) Figure 8. POWER SPECTRAL DENSITY TOTAL HARMONIC DISTORTION vs OUTPUT FREQUENCY -50 -70 -40 -60 -70 THD -90 -80 -110 -90 -130 -100 2nd Harmonic 5k 10k 5 AVDD = VREF = 5V -1dB FSR Digital Input fS = 1MSPS Measurement Bandwidth = 20kHz -50 THD (dB) AVDD = 5V VREF = 4.096V fCLK = 1MSPS fOUT = 1kHz THD = 79dB SNR = 96dB -30 Gain (dB) 4 Figure 7. -10 0 3 VLOGIC (V) 15k 20k 0 1 3rd Harmonic 2 3 4 5 Frequency (Hz) fOUT (kHz) Figure 9. Figure 10. FULL-SCALE SETTLING TIME: 5V RISING EDGE FULL-SCALE SETTLING TIME: 5V FALLING EDGE Trigger Pulse: 5V/div Trigger Pulse: 5V/div AVDD = 5V, VREF = 4.096V, From Code: FFFF To Code: 0000 AVDD = 5V, VREF = 4.096V, From Code: 0000 To Code: FFFF Rising Edge 1V/div Zoomed Rising Edge 1mV/div Falling Edge 1V/div Time (2ms/div) Zoomed Falling Edge 1mV/div Time (2ms/div) Figure 11. Figure 12. Submit Documentation Feedback 7 DAC8554 www.ti.com SLAS431B – JUNE 2005 – REVISED OCTOBER 2006 TYPICAL CHARACTERISTICS: VDD = 5V (continued) At TA = +25°C, unless otherwise noted. HALF-SCALE SETTLING TIME: 5V RISING EDGE HALF-SCALE SETTLING TIME: 5V FALLING EDGE Trigger Pulse: 5V/div Rising Edge 1V/div Trigger Pulse: 5V/div AVDD = 5V, VREF = 4.096V, From Code: CFFF To Code: 4000 AVDD = 5V, VREF = 4.096V, From Code: 4000 To Code: CFFF Falling Edge 1V/div Zoomed Rising Edge 1mV/div 8 Time (2ms/div) Figure 14. GLITCH ENERGY: 5V, 1LSB STEP, RISING EDGE GLITCH ENERGY: 5V, 1LSB STEP, FALLING EDGE VOUT (500mV/div) Figure 13. AVDD = 5V, VREF = 4.096V, From Code: 7FFF To Code: 8000 Glitch: 0.08nV-s AVDD = 5V, VREF = 4.096V, From Code: 8000 To Code: 7FFF Glitch: 0.16nV-s Measured Worst Case Time (400ns/div) Time (400ns/div) Figure 15. Figure 16. GLITCH ENERGY: 5V, 16LSB STEP, RISING EDGE GLITCH ENERGY: 5V, 16LSB STEP, FALLING EDGE AVDD = 5V, VREF = 4.096V, From Code: 8000 To Code: 8010 Glitch: 0.04nV-s VOUT (500mV/div) VOUT (500mV/div) VOUT (500mV/div) Time (2ms/div) Zoomed Falling Edge 1mV/div AVDD = 5V, VREF = 4.096V, From Code: 8010 To Code: 8000 Glitch: 0.08nV-s Time (400ns/div) Time (400ns/div) Figure 17. Figure 18. Submit Documentation Feedback DAC8554 www.ti.com SLAS431B – JUNE 2005 – REVISED OCTOBER 2006 TYPICAL CHARACTERISTICS: VDD = 5V (continued) At TA = +25°C, unless otherwise noted. GLITCH ENERGY: 5V, 256LSB STEP, FALLING EDGE AVDD = 5V, VREF = 4.096V, From Code: 8000 To Code: 80FF Glitch: Not Detected Theoretical Worst Case Time (400ns/div) Time (400ns/div) Figure 19. Figure 20. OUTPUT NOISE DENSITY SIGNAL-TO-NOISE RATIO vs OUTPUT FREQUENCY 350 98 AVDD = 5V VREF = 4.096V Code = 7FFF No Load 300 AVDD = VREF = 5V -1dB FSR Digital Inputs fS = 1MSPS Measurement Bandwidth = 20kHz 96 94 250 SNR (dB) Noise (nV/ÖHz) AVDD = 5V, VREF = 4.096V, From Code: 80FF To Code: 8000 Glitch: Not Detected Theoretical Worst Case VOUT (5mV/div) VOUT (5mV/div) GLITCH ENERGY: 5V, 256LSB STEP, RISING EDGE 200 92 90 88 150 86 100 100 84 1k 10k 100k 0 Frequency (Hz) 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5 fOUT (kHz) Figure 21. Figure 22. Submit Documentation Feedback 9 DAC8554 www.ti.com SLAS431B – JUNE 2005 – REVISED OCTOBER 2006 TYPICAL CHARACTERISTICS: VDD = 2.7V At TA = +25°C, unless otherwise noted. LINEARITY ERROR AND DIFFERENTIAL LINEARITY ERROR vs DIGITAL INPUT CODE 8 6 4 2 0 -2 -4 -6 -8 VDD = 2.7V, VREF = 2.69V Channel A LE (LSB) LE (LSB) 8 6 4 2 0 -2 -4 -6 -8 LINEARITY ERROR AND DIFFERENTIAL LINEARITY ERROR vs DIGITAL INPUT CODE 1.0 DLE (LSB) DLE (LSB) 1.0 0.5 0 -0.5 -1.0 8 6 4 2 0 -2 -4 -6 -8 8192 16384 24576 32768 40960 49152 Digital Input Code 0 -0.5 57344 65536 0 16384 24576 32768 40960 49152 Digital Input Code 57344 65536 Figure 24. LINEARITY ERROR AND DIFFERENTIAL LINEARITY ERROR vs DIGITAL INPUT CODE LINEARITY ERROR AND DIFFERENTIAL LINEARITY ERROR vs DIGITAL INPUT CODE 8 6 4 2 0 -2 -4 -6 -8 VDD = 2.7V, VREF = 2.69V LE (LSB) Channel C 1.0 1.0 0.5 0.5 0 -0.5 -1.0 VDD = 2.7V, VREF = 2.69V Channel D 0 -0.5 -1.0 0 8192 16384 24576 32768 40960 49152 Digital Input Code 57344 65536 0 8192 16384 24576 32768 40960 49152 Digital Input Code Figure 25. Figure 26. ZERO-SCALE ERROR vs TEMPERATURE FULL-SCALE ERROR vs TEMPERATURE 57344 65536 0 5.0 VDD = 2.7V VREF = 2.69V AVDD = 2.7V, VREF = 2.69V -5 Error (mV) CH C 2.5 Error (mV) 8192 Figure 23. DLE (LSB) LE (LSB) DLE (LSB) 0.5 -1.0 0 CH A 0 CH D CH B -2.5 CH C CH A -10 CH D CH B -15 -20 -25 -5.0 -40 10 VDD = 2.7V, VREF = 2.69V Channel B 0 40 80 120 -40 0 40 Temperature (°C) Temperature (°C) Figure 27. Figure 28. Submit Documentation Feedback 80 120 DAC8554 www.ti.com SLAS431B – JUNE 2005 – REVISED OCTOBER 2006 TYPICAL CHARACTERISTICS: VDD = 2.7V (continued) At TA = +25°C, unless otherwise noted. SUPPLY CURRENT vs LOGIC INPUT VOLTAGE SOURCE CURRENT CAPABILITY (ALL CHANNELS) 3.0 800 TA = +25°C, SYNC Input (All other inputs = GND) CH A Powered Up (All other channels in powerdown) Reference Current Included 2.7 600 IDD (mA) VOUT (V) IOVDD = AVDD = VREF = 2.7V 2.4 2.1 1.8 400 200 AVDD = 2.7V VREF = AVDD - 10mV DAC Loaded with FFFFh 1.5 0 0 2 4 6 8 10 0 0.5 1.0 1.5 2.0 2.5 2.7 ISOURCE (mA) VLOGIC (V) Figure 29. Figure 30. FULL-SCALE SETTLING TIME: 2.7V RISING EDGE FULL-SCALE SETTLING TIME: 2.7V FALLING EDGE Trigger Pulse: 2.7V/div Rising Edge 0.5V/div Trigger Pulse: 2.7V/div AVDD = 2.7V, VREF = 2.5V, From Code: 0000 To Code: FFFF Zoomed Rising Edge 1mV/div AVDD = 2.7V, VREF = 2.5V, From Code: FFFF To Code: 0000 Falling Edge 0.5V/div Time (2ms/div) Zoomed Falling Edge 1mV/div Time (2ms/div) Figure 31. Figure 32. HALF-SCALE SETTLING TIME: 2.7V RISING EDGE HALF-SCALE SETTLING TIME: 2.7V FALLING EDGE Trigger Pulse: 2.7V/div Trigger Pulse: 2.7V/div AVDD = 2.7V, VREF = 2.5V, From Code: CFFF To Code: 4000 AVDD = 2.7V, VREF = 2.5V, From Code: 4000 To Code: CFFF Rising Edge 0.5V/div Zoomed Rising Edge 1mV/div Falling Edge 0.5V/div Time (2ms/div) Zoomed Falling Edge 1mV/div Time (2ms/div) Figure 33. Figure 34. Submit Documentation Feedback 11 DAC8554 www.ti.com SLAS431B – JUNE 2005 – REVISED OCTOBER 2006 TYPICAL CHARACTERISTICS: VDD = 2.7V (continued) At TA = +25°C, unless otherwise noted. VOUT (200mV/div) AVDD = 2.7V, VREF = 2.5V, From Code: 7FFF To Code: 8000 Glitch: 0.08nV-s AVDD = 2.7V, VREF = 2.5V, From Code: 8000 To Code: 7FFF Glitch: 0.16nV-s Measured Worst Case Time (400ns/div) Time (400ns/div) Figure 35. Figure 36. GLITCH ENERGY: 2.7V, 16LSB STEP, RISING EDGE GLITCH ENERGY: 2.7V, 16LSB STEP, FALLING EDGE AVDD = 2.7V, VREF = 2.5V, From Code: 8000 To Code: 8010 Glitch: 0.04nV-s AVDD = 2.7V, VREF = 2.5V, From Code: 8010 To Code: 8000 Glitch: 0.12nV-s Time (400ns/div) Figure 37. Figure 38. GLITCH ENERGY: 2.7V, 256LSB STEP, RISING EDGE GLITCH ENERGY: 2.7V, 256LSB STEP, FALLING EDGE AVDD = 2.7V, VREF = 2.5V, From Code: 8000 To Code: 80FF Glitch: Not Detected Theoretical Worst Case VOUT (5mV/div) Time (400ns/div) VOUT (5mV/div) 12 GLITCH ENERGY: 2.7V, 1LSB STEP, FALLING EDGE VOUT (200mV/div) VOUT (200mV/div) VOUT (200mV/div) GLITCH ENERGY: 2.7V, 1LSB STEP, RISING EDGE AVDD = 2.7V, VREF = 2.5V, From Code: 80FF To Code: 8000 Glitch: Not Detected Theoretical Worst Case Time (400ns/div) Time (400ns/div) Figure 39. Figure 40. Submit Documentation Feedback DAC8554 www.ti.com SLAS431B – JUNE 2005 – REVISED OCTOBER 2006 TYPICAL CHARACTERISTICS: VDD = 5V and 2.7V At TA = +25°C, unless otherwise noted. SUPPLY CURRENT vs DIGITAL INPUT CODE SINK CURRENT CAPABILITY (ALL CHANNELS) 0.150 1200 VREF = AVDD - 10mV DAC Loaded with 0000h Reference Current Included 1000 0.125 800 IDD (mA) VOUT (V) AVDD = VREF = 5V VDD = 2.7V 0.100 VDD = 5.5V 0.075 600 AVDD = VREF = 2.7V 0.050 400 0.025 200 0 0 0 2 4 6 8 0 10 8192 16384 24576 32768 40960 49152 57344 65535 Digital Input Code ISINK (mA) Figure 41. Figure 42. SUPPLY CURRENT vs FREE-AIR TEMPERATURE SUPPLY CURRENT vs SUPPLY VOLTAGE 1200 900 VREF = AVDD, All DACs Powered, Reference Current Included, No Load Reference Current Included 1000 850 AVDD = VREF = 5V 800 IDD (mA) IDD (mA) 800 AVDD = VREF = 2.7V 600 750 400 700 200 650 0 -40 600 0 40 80 120 2.7 3.05 3.4 3.75 4.1 4.45 Temperature (°C) AVDD (V) Figure 43. Figure 44. Submit Documentation Feedback 4.8 5.15 5.5 13 DAC8554 www.ti.com SLAS431B – JUNE 2005 – REVISED OCTOBER 2006 THEORY OF OPERATION DAC SECTION VREFH The architecture of each channel of the DAC8554 consists of a resistor-string DAC followed by an output buffer amplifier. Figure 45 shows a simplified block diagram of the DAC architecture. VREFH 50kW RDIVIDER VREF 2 50kW R 62kW VOUT REF(+) Resistor String REF(-) DAC Register R To Output Amplifier (2x Gain) VREFL Figure 45. DAC8554 Architecture The input coding for each device is unipolar straight binary, so the ideal output voltage is given by: V OUTX + 2 V REFL ) (V REFH * V REFL) DIN 65536 R where DIN = decimal equivalent of the binary code that is loaded to the DAC register; it can range from 0 to 65535. R RESISTOR STRING The resistor string section is shown in Figure 46. It is simply a divide-by-2 resistor followed by a string of resistors. The code loaded into the DAC register determines at which node on the string the voltage is tapped off. This voltage is then applied to the output amplifier by closing one of the switches connecting the string to the amplifier. OUTPUT AMPLIFIER Each output buffer amplifier is capable of generating rail-to-rail voltages on its output that approaches an output range of 0V to AVDD (gain and offset errors must be taken into account). Each buffer is capable of driving a load of 2kΩ in parallel with 1000pF to GND. The source and sink capabilities of the output amplifier can be seen in the Typical Characteristics. SERIAL INTERFACE The DAC8554 uses a 3-wire serial interface (SYNC, SCLK, and DIN), which is compatible with SPI, QSPI™, and Microwire™ interface standards, as well as most DSPs. See the Serial Write Operation timing diagram for an example of a typical write sequence. 14 VREFL Figure 46. Resistor String The write sequence begins by bringing the SYNC line LOW. Data from the DIN line are clocked into the 24-bit shift register on each falling edge of SCLK. The serial clock frequency can be as high as 50MHz, making the DAC8554 compatible with high-speed DSPs. On the 24th falling edge of the serial clock, the last data bit is clocked into the shift register and the shift register gets locked. Further clocking does not change the shift register data. Once 24 bits are locked into the shift register, the eight MSBs are used as control bits and the 16 LSBs are used as data. After receiving the 24th falling clock edge, The DAC8554 decodes the eight control bits and 16 data bits to perform the required function, without waiting for a SYNC rising edge. A new SPI sequence starts at the next falling edge of SYNC. A rising edge of SYNC before the 24-bit sequence is complete resets the SPI interface; no data transfer occurs. Submit Documentation Feedback DAC8554 www.ti.com SLAS431B – JUNE 2005 – REVISED OCTOBER 2006 After the 24th falling edge of SCLK is received, the SYNC line may be kept LOW or brought HIGH. In either case, the minimum delay time from the 24th falling SCLK edge to the next falling SYNC edge must be met in order to properly begin the next cycle. To assure the lowest power consumption of the device, care should be taken that the levels are as close to each rail as possible. [Refer to the Typical Characteristics section for the Supply Current vs Logic Input Voltage (5V and 2.7V) transfer characteristic curves.] IOVDD AND VOLTAGE TRANSLATORS The IOVDD pin powers the digital input structures of the DAC8554. For single-supply operation, it can be tied to AVDD. For dual-supply operation, the IOVDD pin provides interface flexibility with various CMOS logic families and should be connected to the logic supply of the system. Analog circuits and internal logic of the DAC8554 use AVDD as the supply voltage. The external logic high inputs get translated to AVDD by level shifters. These level shifters use the IOVDD voltage as a reference to shift the incoming logic HIGH levels to AVDD. IOVDD is ensured to operate from 2.7V to 5.5V regardless of the AVDD voltage, which ensures compatibility with various logic families. Although specified down to 2.7V, IOVDD will operate at as low as 1.8V with degraded timing and temperature performance. For lowest power consumption, logic VIH levels should be as close as possible to IOVDD, and logic VIL levels should be as close as possible to GND voltages INPUT SHIFT REGISTER The input shift register (SR) of the DAC8554 is 24 bits wide, as shown in Figure 47, and is made up of eight control bits (DB23–DB16) and 16 data bits (DB15–DB0). The first two control bits (DB23 and DB22) are the address match bits. The DAC8554 offers additional hardware-enabled addressing capability, allowing a single host to talk to up to four DAC8554s through a single SPI bus without any glue logic, enabling up to 16-channel operation. The state of DB23 should match the state of pin A1; similarly, the state of DB22 should match the state of pin A0. If there is no match, the control command and the data (DB21...DB0) are ignored by the DAC8554. That is, if there is no match, the DAC8554 is not addressed. Address matching can be overridden by the broadcast update. LD1 (DB21) and LD0 (DB20) control the updating of each analog output with the specified 16-bit data value or power-down command. Bit DB19 is a don't care bit that does not affect the operation of the DAC8554, and can be '1' or '0'. The DAC channel select bits (DB18, DB17) control the destination of the data (or power-down command) from DAC A through DAC D. The final control bit, PD0 (DB16), selects the power-down mode of the DAC8554 channels. DB23 A1 DB12 A0 LD1 LD0 X DAC Select 1 DAC Select 0 PD0 D15 D14 D13 DB11 D11 D12 DB0 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 Figure 47. DAC8554 Data Input Register Format Submit Documentation Feedback 15 DAC8554 www.ti.com SLAS431B – JUNE 2005 – REVISED OCTOBER 2006 The DAC8554 also supports a number of different load commands. The load commands include broadcast commands to address all the DAC8554s on an SPI bus. The load commands can be summarized as follows: Power-down/data selection is as follows: DB16 is a power-down flag. If this flag is set, then DB15 and DB14 select one of the four power-down modes of the device as described in Table 1. If DB16 = 1, DB15 and DB14 no longer represent the two MSBs of data, but represent a power-down condition described in Table 1. Similar to data, power-down conditions can be stored at the temporary registers of each DAC. It is possible to update DACs simultaneously either with data, power-down, or a combination of both. DB21 = 0 and DB20 = 0: Single-channel store. The temporary register (data buffer) corresponding to a DAC selected by DB18 and DB17 is updated with the contents of SR data (or power-down). DB21 = 0 and DB20 = 1: Single-channel update. The temporary register and DAC register corresponding to a DAC selected by DB18 and DB17 are updated with the contents of SR data (or power-down). Refer to Table 2 for more information. Table 1. DAC8554 Power-Down Modes DB21 = 1 and DB20 = 0: Simultaneous update. A channel selected by DB18 and DB17 gets updated with the SR data, and simultaneously, all the other channels get updated with previous stored data (or power-down) from temporary registers. PD0 PD1 PD2 (DB16) (DB15) (DB14) DB21 = 1 and DB20 = 1: Broadcast update. All the DAC8554s on the SPI bus respond, regardless of address matching. If DB18 = 0, then SR data gets ignored, all channels from all DAC8554s get updated with previously stored data (or power-down). If DB18 = 1, then SR data (or power-down) updates all channels of all DAC8554s in the system. This broadcast update feature allows the simultaneous update of up to 16 channels. OPERATING MODE 1 0 0 Output high impedance 1 0 1 Output typically 1kΩ to GND 1 1 0 Output typically 100kΩ to GND 1 1 1 Output high impedance Table 2. Control Matrix DB23 A1 DB22 A0 DB21 LD 1 DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13-DB0 LD 0 Don't Care DAC Sel 1 DAC Sel 0 PD0 MSB MSB-1 MSB-2...LSB (Address Select) 0/1 DESCRIPTION 0/1 This address selects 1 of 4 possible devices on a single SPI data bus based on each device's address pin(s) state. See Below A0 and A1 should correspond to the package address set via pins 13 and 14. 0 0 X 0 0 0 Data Write to buffer A with data 0 0 X 0 1 0 Data Write to buffer B with data 0 0 X 1 0 0 Data Write to buffer C with data 0 0 X 1 1 0 Data 0 0 X (00, 01, 10, or 11) 1 0 1 X (00, 01, 10, or 11) 0 0 1 X (00, 01, 10, or 11) 1 1 0 X (00, 01, 10, or 11) 0 1 0 X (00, 01, 10, or 11) 1 See Table 1 Write to buffer D with data 0 Write to buffer with data and load DAC (selected by DB17 and DB18) Data See Table 1 0 Write to buffer with power-down command and load DAC (selected by DB17 and DB18) Write to buffer with data (selected by DB17 and DB18) and then load all DACs simultaneously from their corresponding buffers. Data See Table 1 Write to buffer (selected by DB17 and DB18) with power-down command 0 Write to buffer with power-down command (selected by DB17 and DB18) and then load all DACs simultaneously from their corresponding buffers. Broadcast Modes 16 X X 1 1 X 0 X X X X 1 1 X 1 X 0 X X 1 1 X 1 X 1 Simultaneously update all channels of all DAC8554 devices in the system with data stored in each channels temporary register. X Data See Table 1 Submit Documentation Feedback Write to all devices and load all DACs with SR data 0 Write to all devices and load all DACs with power-down command in SR. DAC8554 www.ti.com SLAS431B – JUNE 2005 – REVISED OCTOBER 2006 SYNC INTERRUPT POWER-ON RESET In a normal write sequence, the SYNC line is kept LOW for at least 24 falling edges of SCLK and the addressed DAC register is updated on the 24th falling edge. However, if SYNC is brought HIGH before the 24th falling edge, it acts as an interrupt to the write sequence; the shift register is reset and the write sequence is discarded. Neither an update of the data buffer contents, DAC register contents, nor a change in the operating mode occurs (see Figure 48). The DAC8554 contains a power-on reset circuit that controls the output voltage during power-up. On power-up, the DAC registers are filled with zeros and the output voltages are set to zero-scale; they remain that way until a valid write sequence and load command are made to the respective DAC channel. The power-on reset is useful in applications where it is important to know the state of the output of each DAC while the device is in the process of powering up. No device pin should be brought high before power is applied to the device. 24th Falling Edge SCLK 1 2 1 24th Falling Edge 2 SYNC Invalid Write-Sync Interrupt: SYNC HIGH Before 24th Falling Edge DIN DB23 DB22 DB0 Valid Write-Buffer/DAC Update: SYNC HIGH After 24th Falling Edge DB23 DB22 DB1 DB0 Figure 48. Interrupt and Valid SYNC Timing Submit Documentation Feedback 17 DAC8554 www.ti.com SLAS431B – JUNE 2005 – REVISED OCTOBER 2006 POWER-DOWN MODES The DAC8554 utilizes four modes of operation. These modes are accessed by setting three bits (PD2, PD1, and PD0) in the shift register and performing a Load action to the DACs. The DAC8554 offers a very flexible power-down interface based on channel register operation. A channel consists of a single 16-bit DAC with power-down circuitry, a temporary storage register (TR), and a DAC register (DR). TR and DR are both 18 bits wide. Two MSBs represent a power-down condition and 16 LSBs represent data for TR and DR. By adding bits 17 and 18 to TR and DR, a power-down condition can be temporarily stored and used as data. Internal circuits ensure that DB15 and DB14 get transferred to TR17 and TR16 (DR17 and DR16), when DB16 = 1. The DAC8554 treats the power-down condition as data; all the operational modes are still valid for power-down. It is possible to broadcast a power-down condition to all the DAC8554s in a system, or it is possible to simultaneously power-down a channel while updating data on other channels. Individual channels can be separately powered down, reducing the total power consumption. When all channels are powered down, the DAC8554 power consumption drops below 2µA. There is no power-up command. When a channel is updated with data, it automatically exits power-down. All channels exit power-down simultaneously after a broadcast data update. The time to exit power-down is approximately 5µs. See Table 1 and Table 2 for power-down operation details. Resistor String DAC Power-Down Circuitry VOUTX Resistor Network Figure 49. Output Stage During Power-Down (High-Impedance) DB16, DB15, and DB14 = '100' (or '111') represent a power-down condition with Hi-Z output impedance for a selected channel. '101' represents a power-down condition with 1kΩ output impedance, and '110' represents a power-down condition with 100kΩ output impedance. 18 Amplifier Submit Documentation Feedback DAC8554 www.ti.com SLAS431B – JUNE 2005 – REVISED OCTOBER 2006 OPERATION EXAMPLES Example 1: Write to Data Buffer A Through Buffer D; Load DAC A Through DAC D Simultaneously • 1st — Write to data buffer A: • • • A1 A0 LD1 LD0 DC DAC Sel 1 DAC Sel 0 PD0 DB15 — DB1 DB0 0 0 0 0 X 0 0 0 D15 — D1 D0 2nd — Write to data buffer B: A1 A0 LD1 LD0 DC DAC Sel 1 DAC Sel 0 PD0 DB15 — DB1 DB0 0 0 0 0 X 0 1 0 D15 — D1 D0 3rd — Write to data buffer C: A1 A0 LD1 LD0 DC DAC Sel 1 DAC Sel 0 PD0 DB15 — DB1 DB0 0 0 0 0 X 1 0 0 D15 — D1 D0 4th — Write to data buffer D and simultaneously update all DACs: A1 A0 LD1 LD0 DC DAC Sel 1 DAC Sel 0 PD0 DB15 — DB1 DB0 0 0 1 0 X 1 1 0 D15 — D1 D0 The DAC A, DAC B, DAC C, and DAC D analog outputs simultaneously settle to the specified values upon completion of the 4th write sequence. (The DAC voltages update simultaneously after the 24th SCLK falling edge of the 4th write cycle). Example 2: Load New Data to DAC A Through DAC D Sequentially • 1st — Write to data buffer A and load DAC A: DAC A output settles to specified value upon completion: • • • A1 A0 LD1 LD0 DC DAC Sel 1 DAC Sel 0 PD0 DB15 — DB1 DB0 0 0 0 1 X 0 0 0 D15 — D1 D0 2nd — Write to data buffer B and load DAC B: DAC B output settles to specified value upon completion: A1 A0 LD1 LD0 DC DAC Sel 1 DAC Sel 0 PD0 DB15 — DB1 DB0 0 0 0 1 X 0 1 0 D15 — D1 D0 3rd — Write to data buffer C and load DAC C: DAC C output settles to specified value upon completion: A1 A0 LD1 LD0 DC DAC Sel 1 DAC Sel 0 PD0 DB15 — DB1 DB0 0 0 0 1 X 1 0 0 D15 — D1 D0 4th — Write to data buffer D and load DAC D: DAC D output settles to specified value upon completion: A1 A0 LD1 LD0 DC DAC Sel 1 DAC Sel 0 PD0 DB15 — DB1 DB0 0 0 0 1 X 1 1 0 D15 — D1 D0 After completion of each write cycle, DAC analog output settles to the voltage specified. Submit Documentation Feedback 19 DAC8554 www.ti.com SLAS431B – JUNE 2005 – REVISED OCTOBER 2006 Example 3: Power-Down DAC A and DAC B to 1kΩ and Power-Down DAC C and DAC D to 100kΩ Simultaneously • Write power-down command to data buffer A: DAC A to 1kΩ. • • • A1 A0 LD1 LD0 DC DAC Sel 1 DAC Sel 0 PD0 DB15 DB14 DB13 — 0 0 0 0 X 0 0 1 0 1 X — Write power-down command to data buffer B: DAC B to 1kΩ. A1 A0 LD1 LD0 DC DAC Sel 1 DAC Sel 0 PD0 DB15 DB14 DB13 — 0 0 0 0 X 0 1 1 0 1 X — Write power-down command to data buffer C: DAC C to 1kΩ. A1 A0 LD1 LD0 DC DAC Sel 1 DAC Sel 0 PD0 DB15 DB14 DB13 — 0 0 0 0 X 1 0 1 1 0 X — Write power-down command to data buffer D: DAC D to 100kΩ and simultaneously update all DACs. A1 A0 LD1 LD0 DC DAC Sel 1 DAC Sel 0 PD0 DB15 DB14 DB13 — 0 0 1 0 X 1 1 1 1 0 X — The DAC A, DAC B, DAC C, and DAC D analog outputs simultaneously power-down to each respective specified mode upon completion of the 4th write sequence. Example 4: Power-Down DAC A Through DAC D to High-Impedance Sequentially: • Write power-down command to data buffer A and load DAC A: DAC A output = Hi-Z: • • • A1 A0 LD1 LD0 DC DAC Sel 1 DAC Sel 0 PD0 DB15 DB14 DB13 — 0 0 0 1 X 0 0 1 1 1 X — Write power-down command to data buffer B and load DAC B: DAC B output = Hi-Z: A1 A0 LD1 LD0 DC DAC Sel 1 DAC Sel 0 PD0 DB15 DB14 DB13 — 0 0 0 1 X 0 1 1 1 1 x — Write power-down command to data buffer C and load DAC C: DAC C output = Hi-Z: A1 A0 LD1 LD0 DC DAC Sel 1 DAC Sel 0 PD0 DB15 DB14 DB13 — 0 0 0 1 X 1 0 1 1 1 X — Write power-down command to data buffer D and load DAC D: DAC D output = Hi-Z: A1 A0 LD1 LD0 DC DAC Sel 1 DAC Sel 0 PD0 DB15 DB14 DB13 — 0 0 0 1 X 1 1 1 1 1 X — The DAC A, DAC B, DAC C, and DAC D analog outputs sequentially power-down to high-impedance upon completion of the 1st, 2nd, 3rd, and 4th write sequences, respectively. 20 Submit Documentation Feedback DAC8554 www.ti.com SLAS431B – JUNE 2005 – REVISED OCTOBER 2006 LDAC FUNCTIONALITY The DAC8554 offers both a software and hardware simultaneous update function. The DAC8554 double-buffered architecture has been designed so that new data can be entered for each DAC without disturbing the analog outputs. The software simultaneous update capability is controlled by the load 1 (LD1) and load 0 (LD0) control bits. By setting load 1 = 1, all of the DAC registers will be updated on the falling edge of the 24th clock signal. When the new data has been entered into the device, all of the DAC outputs can be updated simultaneously and synchronously with the clock. DAC8554 data updates are synchronized with the falling edge of the 24th SCLK cycle, which follows a falling edge of SYNC. For such synchronous updates, the LDAC pin is not required and it must be connected to GND permanently. The LDAC pin is used as a positive edge triggered timing signal for asynchronous DAC updates. Data buffers of all channels must be loaded with desired data before LDAC is triggered. After a low-to-high LDAC transition, all DACs are simultaneously updated with the contents of the corresponding data buffers. If the contents of a data buffer are not changed by the serial interface, the corresponding DAC output will remain unchanged after the LDAC trigger. ENABLE PIN For normal operation, the enable pin must be tied to a logic low. If the enable pin is tied high, the DAC8554 stops listening to the serial port. This feature can be useful for applications that share the same serial port. Submit Documentation Feedback 21 DAC8554 www.ti.com SLAS431B – JUNE 2005 – REVISED OCTOBER 2006 DAC8554 to 68HC11 Interface MICROPROCESSOR INTERFACING DAC8554 to 8051 Interface See Figure 50 for a serial interface between the DAC8554 and a typical 8051-type microcontroller. The setup for the interface is as follows: TXD of the 8051 drives SCLK of the DAC8554, while RXD drives the serial data line of the device. The SYNC signal is derived from a bit-programmable pin on the port of the 8051. In this case, port line P3.3 is used. When data are to be transmitted to the DAC8554, P3.3 is taken LOW. The 8051 transmits data in 8-bit bytes; thus, only eight falling clock edges occur in the transmit cycle. To load data to the DAC, P3.3 is left LOW after the first eight bits are transmitted, then a second and third write cycle are initiated to transmit the remaining data. P3.3 is taken HIGH following the completion of the third write cycle. The 8051 outputs the serial data in a format that presents the LSB first, while the DAC8554 requires its data with the MSB as the first bit received. The 8051 transmit routine must therefore take this into account, and mirror the data as needed. 80C51/80L51(1) DAC8554 P3.3 SYNC TXD SCLK RXD DIN (1) Additional pins omitted for clarity. Figure 50. DAC8554 to 80C51/80L51 Interface DAC8554 to Microwire Interface Figure 51 shows an interface between the DAC8554 and any Microwire-compatible device. Serial data are shifted out on the falling edge of the serial clock and clocked into the DAC8554 on the rising edge of the SK signal. Figure 52 shows a serial interface between the DAC8554 and the 68HC11 microcontroller. SCK of the 68HC11 drives the SCLK of the DAC8554, while the MOSI output drives the serial data line of the DAC. The SYNC signal is derived from a port line (PC7), similar to the 8051 diagram. 68HC11(1) DAC8554 PC7 SYNC SCK SCLK MOSI DIN (1) Additional pins omitted for clarity. Figure 52. DAC8554 to 68HC11 Interface The 68HC11 should be configured so that its CPOL bit is '0' and its CPHA bit is '1'. This configuration causes data appearing on the MOSI output to be valid on the falling edge of SCLK. When data are being transmitted to the DAC, the SYNC line is held LOW (PC7). Serial data from the 68HC11 are transmitted in 8-bit bytes with only eight falling clock edges occurring in the transmit cycle. (Data are transmitted MSB first.) In order to load data to the DAC8554, PC7 is left LOW after the first eight bits are transferred, then a second and third serial write operation are performed to the DAC. PC7 is taken HIGH at the end of this procedure. DAC8554 to TMS320 DSP Interface Figure 53 shows the connections between the DAC8554 and a TMS320 digital signal processor (DSP). A single DSP can control up to four DAC8554s without any interface logic. DAC8554 Positive Supply AVDD 0.1mF MicrowireTM DAC8554 10mF TMS320 DSP CS SYNC FSX SK SCLK DX SO DIN CLKX (1) Additional pins omitted for clarity. SYNC DIN SCLK VOUTA Output A VOUTD Output D VREFL Microwire is a registered trademark of National Semiconductor. Reference Input VREFH 0.1mF 1mF to 10mF GND Figure 51. DAC8554 to Microwire Interface Figure 53. DAC8554 to TMS320 DSP 22 Submit Documentation Feedback DAC8554 www.ti.com SLAS431B – JUNE 2005 – REVISED OCTOBER 2006 APPLICATION INFORMATION CURRENT CONSUMPTION The DAC8554 typically consumes a maximum of 208µA at AVDD = 5V and 180µA at AVDD = 3V for each active channel, including reference current consumption. Additional current consumption can occur at the digital inputs if VIH
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