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DAC8811
SLAS411D – NOVEMBER 2004 – REVISED FEBRUARY 2016
DAC8811 16-Bit, Serial Input Multiplying Digital-to-Analog Converter
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Features
3
±0.5 LSB DNL
16-Bit Monotonic
±1 LSB INL
Low Noise: 12 nV/√Hz
Low Power: IDD = 2 µA
2.7-V to 5.5-V Analog Power Supply
2-mA Full-Scale Current ±20%,
with VREF = 10 V
50-MHz Serial Interface
0.5-μs Settling Time
4-Quadrant Multiplying Reference
Reference Bandwidth: 10 MHz
±10-V Reference Input
Reference Dynamics: –105 THD
Tiny 8-Lead 3 × 3 mm VSON and 3 × 5 mm
VSSOP Packages
Industry-Standard Pin Configuration
Description
The DAC8811 multiplying digital-to-analog converter
(DAC) is designed to operate from a single 2.7-V to
5.5-V supply.
The applied external reference input voltage VREF
determines the full-scale output current. An internal
feedback resistor (RFB) provides temperature tracking
for the full-scale output when combined with an
external I-to-V precision amplifier.
A serial data interface offers high-speed, three-wire
microcontroller-compatible inputs using data-in (SDI),
clock (CLK), and chip-select (CS).
On power-up, the DAC register is filled with zeroes,
and the DAC output is at zero scale.
The DAC8811 is packaged in space-saving 8-lead
VSON and VSSOP packages.
Device Information(1)
PART NUMBER
DAC8811
Applications
PACKAGE
BODY SIZE (NOM)
VSSOP (8)
3.00 mm × 3.00 mm
VSON (8)
3.00 mm × 3.00 mm
(1) For all available packages, see the orderable addendum at
the end of the datasheet.
Automatic Test Equipment
Instrumentation
Digitally Controlled Calibration
Industrial Control PLCs
Simplified Schematic
DAC8811
RFB
VDD
D/A
Converter
VREF
Power-On
Reset
CS
IOUT
16
DAC
Register
16
CLK
SDI
Shift
Register
GND
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
DAC8811
SLAS411D – NOVEMBER 2004 – REVISED FEBRUARY 2016
www.ti.com
Table of Contents
1
2
3
4
5
6
7
Features ..................................................................
Applications ...........................................................
Description .............................................................
Revision History.....................................................
Device Comparison Table.....................................
Pin Configuration and Functions .........................
Specifications.........................................................
7.1
7.2
7.3
7.4
7.5
7.6
7.7
7.8
8
1
1
1
2
4
4
5
Absolute Maximum Ratings ..................................... 5
ESD Ratings ............................................................ 5
Recommended Operating Conditions....................... 5
Thermal Information .................................................. 5
Electrical Characteristics........................................... 6
Timing Requirements ................................................ 7
Typical Characteristics: VDD = 5 V........................... 8
Typical Characteristics: VDD = 2.7 V...................... 10
Detailed Description ............................................ 11
8.1 Overview ................................................................ 11
8.2 Functional Block Diagram ....................................... 11
8.3 Feature Description................................................. 11
8.4 Device Functional Mode ......................................... 14
8.5 Programming........................................................... 15
9
Application and Implementation ........................ 16
9.1 Application Information............................................ 16
9.2 Typical Application ................................................. 16
10 Power Supply Recommendations ..................... 17
11 Layout................................................................... 18
11.1 Layout Guidelines ................................................. 18
11.2 Layout Example .................................................... 18
12 Device and Documentation Support ................. 19
12.1
12.2
12.3
12.4
12.5
Documentation Support ........................................
Community Resources..........................................
Trademarks ...........................................................
Electrostatic Discharge Caution ............................
Glossary ................................................................
19
19
19
19
19
13 Mechanical, Packaging, and Orderable
Information ........................................................... 19
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision C (October 2015) to Revision D
Page
•
Changed the DAC8811 Timing Diagram image to show the setup and hold time with respect to rising edge .................... 7
•
Changed two instances of falling to rising in the DAC8811 Input Shift Register section ..................................................... 15
•
Changed the SYNC Interrupt Facility image ........................................................................................................................ 15
Changes from Revision B (February 2007) to Revision C
Page
•
Added ESD Ratings table, Recommended Operating Conditions table, Thermal Information table, Timing
Requirements table, Feature Description section, Device Functional Modes, Application and Implementation section,
Power Supply Recommendations section, Layout section, Device and Documentation Support section, and
Mechanical, Packaging, and Orderable Information sections. .............................................................................................. 1
•
Changed R3' From: 50 kΩ To: 50 Ω in Figure 23 ................................................................................................................ 14
Changes from Revision A (December 2004) to Revision B
Page
•
Added a new paragraph to the Description , "On power-up,..." ............................................................................................. 1
•
Changed the Simplified Schematic to include the Power-On Reset ...................................................................................... 1
•
Added VREF, RFB to GND to the Absolute Maximum Ratings ................................................................................................ 5
•
Changed the ESD rating of HBM From: 1500 To: 4000 in the Absolute Maximum Ratings ................................................ 5
•
Added table note: " All ac characteristic tests are performed.." to the Electrical Characteristics........................................... 6
•
Added test conditions to the Output voltage settling time of the AC characteristics section in the Timing
Requirements ........................................................................................................................................................................ 7
•
Added table note: " All ac characteristic tests are performed.." to the Electrical Characteristics........................................... 7
•
Changed Figure 9................................................................................................................................................................... 8
2
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SLAS411D – NOVEMBER 2004 – REVISED FEBRUARY 2016
Changes from Original (November 2004) to Revision A
Page
•
Removed the Product Preview label ...................................................................................................................................... 1
•
Added information to the Features ........................................................................................................................................ 1
•
Added Output leakage current Data = 0000h, TA = TMAX in the Electrical Characteristics .................................................... 6
•
Added Input high voltage for VDD = 2.7 V and 2.5 V in the Electrical Characteristics ........................................................... 6
•
Changed the values of the Power Requirements and the AC characteristics section in the Electrical Characteristics ....... 6
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DAC8811
SLAS411D – NOVEMBER 2004 – REVISED FEBRUARY 2016
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5 Device Comparison Table
6
PART NUMBER
INL (LSB)
DNL (LSB)
DAC8811ICDGK
±1
±1
DAC8811IBDGK
±2
±1
DAC8811ICDRB
±1
±1
DAC8811IBDRB
±2
±1
Pin Configuration and Functions
DRB Package
8-Pins VSON
Top View
DGK Package
8-Pins VSSOP
Top View
CLK
1
8
CS
CLK
1
8
CS
SDI
2
7
VDD
SDI
2
7
VDD
RFB
3
6
GND
RFB
3
6
GND
VREF
4
5
IOUT
VREF
4
5
IOUT
Pin Functions
PIN
NAME
NO.
TYPE
DESCRIPTION
CLK
1
I
Clock input; positive edge triggered clocks data into shift register
SDI
2
I
Serial register input; data loads directly into the shift register MSB first. Extra leading bits are
ignored.
RFB
3
O
Internal matching feedback resistor. Connect to external op amp output.
VREF
4
I
DAC reference input pin. Establishes DAC full-scale voltage. Constant input resistance versus
code.
IOUT
5
O
DAC current output. Connects to inverting terminal of external precision I/V op amp.
GND
6
G
Analog and digital ground.
VDD
7
I
Positive power supply input. Specified operating range of 2.7 V to 5.5 V.
CS
8
I
Chip-select; active low digital input. Transfers shift register data to DAC register on rising edge.
See Table 1 for operation.
4
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SLAS411D – NOVEMBER 2004 – REVISED FEBRUARY 2016
7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted) (1)
Input voltage
MIN
MAX
UNIT
VDD to GND
–0.3
7
V
V (IOUT) to GND
–0.3
VDD + 0.3
V
Digital input voltage
GND
–0.3
VDD + 0.3
V
Reference voltage, VREF
RFB to GND
–25
25
V
–40
105
°C
125
°C
Operating temperature
Junction temperature, TJ
Storage temperature, Tstg
(1)
–65
150
Stresses above those listed under absolute maximum ratings may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
7.2 ESD Ratings
MAX
V(ESD)
(1)
(2)
Electrostatic discharge
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1)
±4000
Charged device model (CDM), per JEDEC specification JESD22C101 (2)
±1000
UNIT
V
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
7.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN
NOM
MAX
UNIT
Supply voltage to GND
2.7
5.5
V
Operating ambient temperature, TA
–40
125
°C
7.4 Thermal Information
DAC8811
THERMAL METRIC (1)
DGK (VSSOP)
DRB (VSON)
UNIT
8 PINS
8 PINS
RθJA
Junction-to-ambient thermal resistance
169.6
46.7
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
64.2
61.3
°C/W
RθJB
Junction-to-board thermal resistance
90.3
22
°C/W
ψJT
Junction-to-top characterization parameter
7.7
1.1
°C/W
ψJB
Junction-to-board characterization parameter
88.8
22.1
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
N/A
3.8
°C/W
(1)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
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DAC8811
SLAS411D – NOVEMBER 2004 – REVISED FEBRUARY 2016
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7.5 Electrical Characteristics
VDD = 2.7 V to 5.5 V; IOUT = Virtual GND, GND = 0 V; VREF = 10 V; TA = full operating temperature. All specifications -40°C to
85°C, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
±1
LSB
±2
LSB
±1
LSB
nA
STATIC PERFORMANCE
Resolution
16
Relative accuracy
DAC8811C
Relative accuracy
DAC8811B
Differential nonlinearity
Bits
±0.5
Output leakage current
Data = 0000h, TA = 25°C
10
Output leakage current
Data = 0000h, TA = TMAX
10
nA
Full-scale gain error
All ones loaded to DAC register
±4
mV
±1
Full-scale tempco
±3
ppm/°C
2
mA
50
pF
OUTPUT CHARACTERISTICS (1)
Output current
Output capacitance
Code dependent
REFERENCE INPUT (1)
VREF Range
–15
15
V
Input resistance
5
kΩ
Input capacitance
5
pF
LOGIC INPUTS AND OUTPUT (1)
VIL
Input low voltage
VDD = 2.7V
VDD = 5V
0.6
V
0.8
V
VDD = 2.7V
2.1
V
VDD = 5V
2.4
V
VIH
Input high voltage
IIL
Input leakage current
10
µA
CIL
Input capacitance
10
pF
5.5
V
POWER REQUIREMENTS
VDD
2.7
IDD (normal operation)
Logic inputs = 0 V
5
µA
VDD = 4.5 V to 5.5 V
VIH = VDD and VIL = GND
3
5
µA
VDD = 2.7 V to 3.6 V
VIH = VDD and VIL = GND
1
2.5
µA
AC CHARACTERISTICS
BW –3 dB
(1)
(2)
6
(1) (2)
Reference mutiplying BW
VREF = 5 VPP, Data = FFFFh
DAC glitch impulse
VREF = 0 V to 10 V, Data = 7FFFh to 8000h to 7FFFh
Feed through error VOUT/VREF
Data = 0000h, VREF = 100 mVRMS, f = 100kHz
Digital feed through
CS = 1 and fCLK = 1 MHz
Total harmonic distortion
VREF = 5 VPP, Data = FFFFh, f = 1 kHz
Output spot noise voltage
f = 1 kHz, BW = 1 Hz
10
MHz
2
nV/s
–70
2
–105
12
dB
nV/s
dB
nV/√Hz
Specified by design and characterization; not production tested.
All ac characteristic tests are performed in a closed-loop system using the THS4011 I-to-V converter amplifier.
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7.6 Timing Requirements
MIN
NOM
MAX
UNIT
50
MHz
INTERFACE TIMING
fCLK
Clock input frequency
t(CH)
Clock pulse width high
10
ns
t(CL)
Clock pulse width low
10
ns
t(CSS)
CS to Clock setup time
0
ns
t(CSH)
Clock to CS hold time
10
ns
t(DS)
Data setup time
5
ns
t(DH)
Data hold time
10
ns
AC CHARACTERISTICS (1)
ts
(1)
(2)
(2)
Output voltage settling time
To ±0.1% of full-scale, Data = 0000h to
FFFFh to 0000h
0.3
µs
To ±0.0015% of full-scale, Data = 0000h
to FFFFh to 0000h
0.5
µs
Specified by design and characterization; not production tested.
All ac characteristic tests are performed in a closed-loop system using the THS4011 I-to-V converter amplifier.
SDI
DB15
DB14
DB13
DB1
DB0
tDS
tDH
CLK
1
16
tCL
tCH
tCSH
tCSS
CS
Figure 1. DAC8811 Timing Diagram
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DAC8811
SLAS411D – NOVEMBER 2004 – REVISED FEBRUARY 2016
7.7
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Typical Characteristics: VDD = 5 V
1.0
1.0
0.8
0.8
0.6
0.6
0.4
0.4
DNL (LSB)
INL (LSB)
At TA = 25°C, +VDD = 5 V, unless otherwise noted.
0.2
0
- 0.2
0.2
0
- 0.2
- 0.4
- 0.4
- 0.6
- 0.6
- 0.8
- 0.8
- 1.0
- 1.0
0
0
8192 16384 24576 32768 40960 49512 57344 65536
Digital Input Code
TA = 25°C
TA = 25°C
Figure 3. Differential Linearity Error vs Digital Input Code
1.0
1.0
0.8
0.8
0.6
0.6
0.4
0.4
DNL (LSB)
INL (LSB)
Figure 2. Linearity Error vs Digital Input Code
0.2
0
- 0.2
0.2
0
- 0.2
- 0.4
- 0.4
- 0.6
- 0.6
- 0.8
- 0.8
- 1.0
- 1.0
0
0
8192 16384 24576 32768 40960 49512 57344 65536
Digital Input Code
Figure 5. Differential Linearity Error vs Digital Input Code
Figure 4. Linearity Error vs Digital Input Code
1.0
1.0
0.8
0.8
0.6
0.6
0.4
0.4
DNL (LSB)
INL (LSB)
8192 16384 24576 32768 40960 49512 57344 65536
Digital Input Code
TA = –40°C
TA = –40°C
0.2
0
- 0.2
0.2
0
- 0.2
- 0.4
- 0.4
- 0.6
- 0.6
- 0.8
- 0.8
- 1.0
- 1.0
0
8192 16384 24576 32768 40960 49512 57344 65536
Digital Input Code
0
8192 16384 24576 32768 40960 49512 57344 65536
Digital Input Code
TA = 85°C
TA = 85°C
Figure 6. Linearity Error vs Digital Input Code
8
8192 16384 24576 32768 40960 49512 57344 65536
Digital Input Code
Figure 7. Differential Linearity Error vs Digital Input Code
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Typical Characteristics: VDD = 5 V (continued)
At TA = 25°C, +VDD = 5 V, unless otherwise noted.
A ttenuation (dB)
0xFFFF
0x8000
0x4000
0x2000
0x1000
0x0800
0x0400
0x0200
0x0100
0x0080
0x0040
0x0020
0x0010
0x0008
0x0004
0x0002
0x0001
Digital Code
6
0
−6
− 12
− 18
− 24
− 30
− 36
− 42
− 48
− 54
− 60
− 66
− 72
− 78
− 84
− 90
− 96
− 102
− 108
− 114
10
0x0000
1 00
1k
10k
10 0k
1M
10 M
100M
Bandwidth (H z )
Figure 9. Reference Multiplying Bandwidth
Code: 7FFFh to 8000h
Output Voltage (5 V/div)
Output Voltage (50 mV/div)
Figure 8. Supply Current vs Logic Input Voltage
Voltage Output Setting
Trigger Pulse
Trigger Pulse
Time (0.1 Ps/div)
Time (0.2 Ps/div)
Figure 10. DAC Glitch
Figure 11. DAC Settling Time
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7.8
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Typical Characteristics: VDD = 2.7 V
1.0
1.0
0.8
0.8
0.6
0.6
0.4
0.4
DNL (LSB)
INL (LSB)
At TA = 25°C, +VDD = 2.7 V, unless otherwise noted.
0.2
0
- 0.2
0.2
0
- 0.2
- 0.4
- 0.4
- 0.6
- 0.6
- 0.8
- 0.8
- 1.0
- 1.0
0
0
8192 16384 24576 32768 40960 49512 57344 65536
Digital Input Code
TA = 25°C
TA = 25°C
Figure 13. Differential Linearity Error vs Digital Input Code
1.0
1.0
0.8
0.8
0.6
0.6
0.4
0.4
DNL (LSB)
INL (LSB)
Figure 12. Linearity Error vs Digital Input Code
0.2
0
- 0.2
0.2
0
- 0.2
- 0.4
- 0.4
- 0.6
- 0.6
- 0.8
- 0.8
- 1.0
- 1.0
0
0
8192 16384 24576 32768 40960 49512 57344 65536
Digital Input Code
Figure 15. Differential Linearity Error vs Digital Input Code
Figure 14. Linearity Error vs Digital Input Code
1.0
1.0
0.8
0.8
0.6
0.6
0.4
0.4
DNL (LSB)
INL (LSB)
8192 16384 24576 32768 40960 49512 57344 65536
Digital Input Code
TA = –40°C
TA = –40°C
0.2
0
- 0.2
0.2
0
- 0.2
- 0.4
- 0.4
- 0.6
- 0.6
- 0.8
- 0.8
- 1.0
- 1.0
0
8192 16384 24576 32768 40960 49512 57344 65536
Digital Input Code
TA = 85°C
0
8192 16384 24576 32768 40960 49512 57344 65536
Digital Input Code
TA = 85°C
Figure 16. Linearity Error vs Digital Input Code
10
8192 16384 24576 32768 40960 49512 57344 65536
Digital Input Code
Figure 17. Differential Linearity Error vs Digital Input Code
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Detailed Description
8.1 Overview
The DAC8811 is a single channel current output, 16-bit digital-to-analog converter (DAC). The device includes a
3-wire serial interface to communicate with most DSPs.
8.2 Functional Block Diagram
DAC8811
RFB
VDD
D/A
Converter
VREF
Power-On
Reset
IOUT
16
DAC
Register
CS
16
Shift
Register
CLK
SDI
GND
8.3 Feature Description
The DAC8811 is a single channel current output, 16-bit digital-to-analog converter (DAC). The architecture,
illustrated in Figure 18, is an R-2R ladder configuration with the three MSBs segmented. Each 2R leg of the
ladder is either switched to GND or the IOUT terminal. The IOUT terminal of the DAC is held at a virtual GND
potential by the use of an external I/V converter op amp. The R-2R ladder is connected to an external reference
input VREF that determines the DAC full-scale current. The R-2R ladder presents a code independent load
impedance to the external reference of 5 kΩ ±25%. The external reference voltage can vary in a range of -15 V
to 15 V, thus providing bipolar IOUT current operation. By using an external I/V converter and the DAC8811 RFB
resistor, output voltage ranges of -VREF to VREF can be generated.
Figure 18. Equivalent R-2R DAC Circuit
When using an external I/V converter and the DAC8811 RFB resistor, the DAC output voltage is given by
Equation 1:
CODE
VOUT
VREF x
65536
(1)
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Feature Description (continued)
Each DAC code determines the 2R leg switch position to either GND or IOUT. Because the DAC output
impedance as seen looking into the IOUT terminal changes versus code, the external I/V converter noise gain will
also change. Because of this, the external I/V converter op amp must have a sufficiently low offset voltage such
that the amplifier offset is not modulated by the DAC IOUT terminal impedance change. External op amps with
large offset voltages can produce INL errors in the transfer function of the DAC8811 due to offset modulation
versus DAC code. For best linearity performance of the DAC8811, an operational amplifier (OPA277) is
recommended (Figure 19). This circuit allows VREF swinging from -10 V to +10 V.
Figure 19. Voltage Output Configuration
8.3.1 Stability Circuit
For a current-to-voltage design (see Figure 20), the DAC8811 current output (IOUT) and the connection with the
inverting node of the op amp should be as short as possible and according to correct PCB layout design. For
each code change, there is a step function. If the GBP of the op amp is limited and parasitic capacitance is
excessive at the inverting node then gain peaking is possible. Therefore, for circuit stability, a compensation
capacitor C1 (4 pF to 20 pF typ) can be added to the design, as shown in Figure 20.
Figure 20. Gain Peaking Prevention Circuit With Compensation Capacitor
8.3.2 Positive Voltage Output Circuit
As Figure 21 illustrates, in order to generate a positive voltage output, a negative reference is input to the
DAC8811. This design is suggested instead of using an inverting amp to invert the output due to tolerance errors
of the resistor. For a negative reference, VOUT and GND of the reference are level-shifted to a virtual ground and
a –2.5 V input to the DAC8811 with an op amp.
12
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Feature Description (continued)
0 ” VOUT ” +2.5V
Figure 21. Positive Voltage Output Circuit
8.3.3 Bipolar Output Circuit
The DAC8811, as a 2-quadrant multiplying DAC, can be used to generate a unipolar output. The polarity of the
full-scale output IOUT is the inverse of the input reference voltage at VREF.
Some applications require full 4-quadrant multiplying capabilities or bipolar output swing. As shown in Figure 22,
external op amp U4 is added as a summing amp and has a gain of 2X that widens the output span to 5 V. A 4quadrant multiplying circuit is implemented by using a 2.5-V offset of the reference voltage to bias U4. According
to the circuit transfer equation given in Equation 2, input data (D) from code 0 to full scale produces output
voltages of VOUT = -2.5 V to VOUT = +2.5 V.
VOUT
§ D
·
¨ 32,768 - 1 ¸ x VREF
©
¹
(2)
External resistance mismatching is the significant error in Figure 22.
10 k:
10 k:
5 k:
-2.5V ” VOUT ” +2.5V
(-10s G sOUT G +10V)
Figure 22. Bipolar Output Circuit
8.3.4 Programmable Current Source Circuit
A DAC8811 can be integrated into the circuit in Figure 23 to implement an improved Howland current pump for
precise voltage to current conversions. Bidirectional current flow and high voltage compliance are two features of
the circuit. With a matched resistor network, the load current of the circuit is shown by Equation 3:
R2 R3 / R1
IL
x VREF x D
R3
(3)
The value of R3 in the previous equation can be reduced to increase the output current drive of U3. U3 can drive
±20 mA in both directions with voltage compliance limited up to 15 V by the U3 voltage supply. Elimination of the
circuit compensation capacitor C1 in the circuit is not suggested as a result of the change in the output
impedance ZO, according to Equation 4:
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Feature Description (continued)
ZO
R1'R3 R1 R2
R1(R2' R3') R1'(R2
R3)
(4)
As shown in Equation 4, with matched resistors, ZO is infinite and the circuit is optimum for use as a current
source. However, if unmatched resistors are used, ZO is positive or negative with negative output impedance
being a potential cause of oscillation. Therefore, by incorporating C1 into the circuit, possible oscillation problems
are eliminated. The value of C1 can be determined for critical applications; for most applications, however, a
value of several pF is suggested.
R2’
15 kW
C1 10 pF
R1’
150 kW
VDD
VDD
VREF
VREF
U2
OPA277
R3’
50 W
−
RFB
U1
DAC8811
IOUT
+
R3
50 W
R2
15 kW
−
GND
VOUT
+
U2
OPA277
R1
150 kW
IL
LOAD
Figure 23. Programmable Bidirectional Current Source Circuit
8.4 Device Functional Mode
Table 1. Control Logic Truth Table (1)
CLK
CS
SERIAL SHIFT REGISTER
DAC REGISTER
X
H
No effect
Latched
↑+
L
Shift register data advanced one bit
Latched
X
H
No effect
Latched
X
↑+
Shift register data transferred to DAC register
New data loaded from serial register
(1)
↑+ Positive logic transition; X = Don't care
14
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8.5 Programming
8.5.1 DAC8811 Input Shift Register
The DAC8811 has a 3-wire serial interface (CS, SCLK, and DIN) compatible with SPI, QSPI, and Microwire
interface standards, as well as most DSPs. See Figure 1 for an example of a typical write sequence.
The input shift register is 16 bits wide, as shown in Figure 25. The write sequence begins by bringing the CS line
low. Data from the DIN line are clocked into the 16-bit shift register on each rising edge of CLK. The serial clock
frequency can be as high as 50 MHz, making the DAC8811 compatible with high-speed DSPs. On the 16th rising
edge of the serial clock, the last data bit is clocked in and the programmed function is executed.
At this point, the CS line may be kept low or brought high. In either case, it must be brought high for a minimum
of 20 ns before the next write sequence so that a falling edge of CS can initiate the next write sequence.
Figure 24. Data Input Register
DB15
D15
D15
D13
D12
D11
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
DB0
D0
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
CLK
CS
DIN
DB15
DB0
Invalid Write Sequence:
CS HIGH before 16th Rising Edge
DB15
DB0
Valid Write Sequence:
Output Updates on 16th Rising Edge
Figure 25. CS Interrupt Facility
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9 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information
This design features the DAC8811 followed by a four-quadrant circuit for multiplying DACs. The circuit conditions
the current output of an MDAC into a symmetrical bipolar voltage. The design uses an operational amplifier in a
transimpedance configuration to convert the MDAC current into a voltage followed by an additional amplifier in a
summing configuration to apply an offset voltage.
9.2 Typical Application
Trans-Impedance Stage
Gain and Offset Stage
RG2
VREF
REFIN RFB
IOUT
RG1
+
MDAC
RFB2
A1
VDAC
+
VOUT
A2
Figure 26. Typical Application
9.2.1 Design Requirements
Using a multiplying DAC requires a transimpedance stage with an amplifier with minimal input offset voltage. The
tolerance of the external resistors will vary depending on the goals of the application, but for optimal performance
with the DAC8811 the tolerance should be 0.1 % for all of the external resistors. The summing stage amplifier
also needs low input-offset voltage and enough slew rate for the output range desired.
9.2.2 Detailed Design Procedure
The first stage of the design converts the current output of the MDAC (IOUT) to a voltage (VOUT) using an amplifier
in a transimpedance configuration. A typical MDAC features an on-chip feedback resistor sized appropriately to
match the ratio of the resistor values used in the DAC R-2R ladder. This resistor is available using the input
shown in Figure 26 called RFB on the MDAC. The MDAC reference and the output of the transimpedance stage
are then connected to the inverting input of the amplifier in the summing stage to produce the output that is
defined by Equation 5.
VOUT Code
16
§ 2FB2
·
V
x Code · § RFB2
x REF bits
x VREF ¸
¨
¸ ¨
R
R
2
© G1
¹ © G2
¹
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Typical Application (continued)
9.2.3 Application Curves
Figure 27 shows the output voltage vs code of this design, while Figure 28 shows the output error vs code. Keep
in mind that the error gets worse as the output code increases because the contribution of the gain error
increases with code.
10
0.014
0.012
Output Error (%FSR)
Output Voltage (V)
5
0
-5
0.01
0.008
0.006
0.004
0.002
-10
0
0
8192 16384 24576 32768 40960 49152 57344 65536
Input Code (decimal)
D001
0
Figure 27. Output Voltage vs Input Code
8192 16384 24576 32768 40960 49152 57344 65536
Input Code (decimal)
D002
Figure 28. Output Current vs Input Code
10 Power Supply Recommendations
These devices can operate within the specified supply voltage range of 2.7 V to 5.5 V. The power applied to
AVDD should be well-regulated and low-noise. In order to further minimize noise from the power supplies, a
strong recommendation is to include a pair of 100 pF and 1 nF capacitors and a 0.1 μF to 1 μF bypass capacitor.
The current consumption of the AVDD pin, the short-circuit current limit, and the load current for these devices
are listed in the Electrical Characteristics table. Choose the power supplies for these devices to meet the
aforementioned current requirements.
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11 Layout
11.1 Layout Guidelines
A precision analog component requires careful layout, adequate bypassing, and clean, well-regulated power
supplies. The DAC8811devices offer single-supply operation, and are often used in close proximity with digital
logic, microcontrollers, microprocessors, and digital signal processors. The more digital logic present in the
design and the higher the switching speed, the more difficult it is to keep digital noise from appearing at the
output. As a result of the single ground pin of the DAC8811, all return currents (including digital and analog
return currents for the DAC) must flow through a single point. Ideally, GND would be connected directly to an
analog ground plane. This plane would be separate from the ground connection for the digital components until
they were connected at the power-entry point of the system. The power applied to AVDD should be wellregulated and low noise. Switching power supplies and dc-dc converters often have high-frequency glitches or
spikes riding on the output voltage. In addition, digital components can create similar high-frequency spikes as
their internal logic switches states. This noise can easily couple into the DAC output voltage through various
paths between the power connections and analog output. As with the GND connection, AVDD should be
connected to a power-supply plane or trace that is separate from the connection for digital logic until they are
connected at the power-entry point. In addition, a pair of 100-pF to 1-nF capacitors and a 0.1-μF to 1-μF bypass
capacitor are strongly recommended. In some situations, additional bypassing may be required, such as a 100
μF electrolytic capacitor or even a pi filter made up of inductors and capacitors – all designed essentially to
provide low-pass filtering for the supply and remove the high-frequency noise.
While all the other recommendations apply to most DACs, multiplying DACs also require that the transimpedance
amplifier be placed in close proximity in order to minimize non-linearity errors introduced by any resistance
between the IOUT pin and V- pin of the amplifier.
11.2 Layout Example
Figure 29. DAC8811 Layout Example
18
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12 Device and Documentation Support
12.1 Documentation Support
12.1.1 Related Documentation
For related documentation see the following:
• DAC8801/11EVM, SLAU151
• Interfacing the DAC8811 to the MSP430F449, SLAA238
• Topology and Noise Using Multiplying DAC, SBAA146
12.2 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
12.3 Trademarks
E2E is a trademark of Texas Instruments.
All other trademarks are the property of their respective owners.
12.4 Electrostatic Discharge Caution
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
12.5 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
13 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
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PACKAGE OPTION ADDENDUM
www.ti.com
6-Feb-2020
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
Lead/Ball Finish
MSL Peak Temp
(2)
(6)
(3)
Op Temp (°C)
Device Marking
(4/5)
DAC8811IBDGKR
ACTIVE
VSSOP
DGK
8
2500
Green (RoHS
& no Sb/Br)
NIPDAUAG
Level-2-260C-1 YEAR
-40 to 105
D11
DAC8811IBDGKT
ACTIVE
VSSOP
DGK
8
250
Green (RoHS
& no Sb/Br)
NIPDAUAG
Level-2-260C-1 YEAR
-40 to 105
D11
DAC8811IBDGKTG4
ACTIVE
VSSOP
DGK
8
250
Green (RoHS
& no Sb/Br)
NIPDAUAG
Level-2-260C-1 YEAR
-40 to 105
D11
DAC8811IBDRBT
ACTIVE
SON
DRB
8
250
Green (RoHS
& no Sb/Br)
NIPDAU
Level-2-260C-1 YEAR
-40 to 105
D11
DAC8811IBDRBTG4
ACTIVE
SON
DRB
8
250
Green (RoHS
& no Sb/Br)
NIPDAU
Level-2-260C-1 YEAR
-40 to 105
D11
DAC8811ICDGKR
ACTIVE
VSSOP
DGK
8
2500
Green (RoHS
& no Sb/Br)
NIPDAUAG
Level-2-260C-1 YEAR
-40 to 105
D11
DAC8811ICDGKRG4
ACTIVE
VSSOP
DGK
8
2500
Green (RoHS
& no Sb/Br)
NIPDAUAG
Level-2-260C-1 YEAR
-40 to 105
D11
DAC8811ICDGKT
ACTIVE
VSSOP
DGK
8
250
Green (RoHS
& no Sb/Br)
NIPDAUAG
Level-2-260C-1 YEAR
-40 to 105
D11
DAC8811ICDRBT
ACTIVE
SON
DRB
8
250
Green (RoHS
& no Sb/Br)
NIPDAU
Level-2-260C-1 YEAR
-40 to 105
D11
DAC8811ICDRBTG4
ACTIVE
SON
DRB
8
250
Green (RoHS
& no Sb/Br)
NIPDAU
Level-2-260C-1 YEAR
-40 to 105
D11
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
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