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DLPC150
DLPS048C – MARCH 2015 – REVISED JUNE 2019
DLPC150 DLP® Digital Controller for Advanced Light Control
1 Features
3 Description
•
The DLPC150 controller provides a convenient,
reliable, and multi-functional interface between user
electronics and the visible DLP2010 or the nearinfrared (NIR) DLP2010NIR digital micromirror device
(DMD) to steer light and create patterns with highspeed, precision, and efficiency. The DLPC150
controller enables high-speed pattern rates, along
with LED control and data formatting for multiple input
formats. The DLPC150 controller also provides input
and output trigger signals for synchronizing displayed
patterns with a camera, sensor, or other peripherals.
The DLPC150 controller is part of the 0.2 WVGA
chipset that includes the DLP2010 or DLP2010NIR
DMD and DLPA2000 or DLPA2005 power
management integrated chip (PMIC). The DLPC150
controller enables integration of the DLP® 0.2 WVGA
visible or NIR chipset into small form-factor, lowpower, and low-cost applications for programmable
spectrum and wavelength control, such as 3D
scanning or metrology systems, spectrometers,
interactive displays, chemical analyzers, medical
instruments, skin analysis, material identification, and
chemical sensing.
1
•
•
•
•
•
•
•
•
Display controller required for reliable operation of
the DLP2010 and DLP2010NIR DMDs
High-speed pattern sequence mode
– 1-Bit binary pattern rates to 2880 Hz
– 1-to-1 input mapping to micromirrors
Easy synchronization with cameras and sensors
– One input trigger
– Two output triggers
I2C configuration interface
Input pixel interface support:
– 24-bit parallel RGB888 interface protocol
– 16-bit parallel RGB565 interface protocol
– Pixel clock up to 75 MHz
Integrated micromirror drivers
Integrated clock generation
Auto DMD parking at power down
201-pin, 13mm × 13 mm, 0.8-mm pitch, VFBGA
package
Device Information(1)
2 Applications
•
•
•
•
•
•
•
•
•
Spectrometers (chemical analysis)
– Portable process analyzers
– Portable equipment
Compressive sensing (single pixel NIR cameras)
3D biometrics
Machine vision
Infrared scene projection
Microscopes
Laser marking
Optical choppers
Optical networking
PART NUMBER
DLPC150
PACKAGE
VFBGA (201)
BODY SIZE (NOM)
13.00 × 13.00 mm2
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
DLP 0.2-Inch WVGA Chipset
DLPC150
Display Controller
532-MHz
SubLVDS
DDR
Interface
D_P(0)
D_N(0)
DLP2010 DMD
or
DLP2010NIR DMD
VOFFSET
D_P(1)
D_N(1)
VBIAS
D_P(2)
D_N(2)
VRESET
DLPA2000
or
DLPA2005
(PMIC and LED
Driver)
D_P(3)
D_N(3)
VDDI
DCLK_P
DCLK_N
VDD
120-MHz
SDR
Interface
LS_WDATA
LS_CLK
LS_RDATA
VSS
DMD_DEN_ARSTZ
System Signal Routing Omitted For Clarity
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
DLPC150
DLPS048C – MARCH 2015 – REVISED JUNE 2019
www.ti.com
Table of Contents
1
1
1
2
3
8.2 Functional Block Diagram ....................................... 27
8.3 Feature Description................................................. 27
8.4 Device Functional Modes........................................ 33
1
2
3
4
5
Features ..................................................................
Applications ...........................................................
Description .............................................................
Revision History.....................................................
Pin Configuration and Functions .........................
5.1 DLPC150 Mechanical Data..................................... 11
9.1 Application Information............................................ 34
9.2 Typical Application ................................................. 35
6
Specifications....................................................... 13
10 Power Supply Recommendations ..................... 37
6.1
6.2
6.3
6.4
6.5
Absolute Maximum Ratings .................................... 13
ESD Ratings............................................................ 13
Recommended Operating Conditions..................... 14
Thermal Information ................................................ 14
Electrical Characteristics Over Recommended
Operating Conditions ............................................... 15
6.6 Electrical Characteristics......................................... 16
6.7 High-Speed Sub-LVDS Electrical Characteristics... 18
6.8 Low-Speed SDR Electrical Characteristics............. 19
6.9 System Oscillators Timing Requirements ............... 20
6.10 Power-Up and Reset Timing Requirements ......... 20
6.11 Parallel Interface Frame Timing Requirements .... 21
6.12 Parallel Interface General Timing Requirements .. 23
6.13 Flash Interface Timing Requirements ................... 24
7
Parameter Measurement Information ................ 25
7.1 Host_irq Usage Model ............................................ 25
7.2 Input Source............................................................ 26
8
9
Application and Implementation ........................ 34
10.1
10.2
10.3
10.4
10.5
System Power-Up and Power-Down Sequence ... 37
DLPC150 Power-Up Initialization Sequence ........ 39
DMD Fast Park Control (PARKZ) ......................... 40
Hot Plug Usage ..................................................... 40
Maximum Signal Transition Time.......................... 40
11 Layout................................................................... 41
11.1 Layout Guidelines ................................................. 41
11.2 Layout Example .................................................... 46
11.3 Thermal Considerations ........................................ 46
12 Device and Documentation Support ................. 47
12.1
12.2
12.3
12.4
12.5
12.6
Device Support......................................................
Related Links ........................................................
Community Resources..........................................
Trademarks ...........................................................
Electrostatic Discharge Caution ............................
Glossary ................................................................
47
48
48
48
48
48
Detailed Description ............................................ 27
13 Mechanical, Packaging, and Orderable
Information ........................................................... 48
8.1 Overview ................................................................. 27
13.1 Package Option Addendum .................................. 49
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision B (March 2018) to Revision C
Page
•
Changed normal park time from 500 µs to 20 ms ................................................................................................................. 3
•
Deleted mention of bit weight for parallel data input ............................................................................................................. 4
Changes from Revision A (March 2015) to Revision B
Page
•
Changed maximum binary pattern rate to 2880 Hz in Table 4 ............................................................................................ 27
•
Updated Device Markings drawing. ..................................................................................................................................... 47
•
Added Community Resources section ................................................................................................................................ 48
•
Added MSL Peak Temp and Op Temp to Packaging Option Addendum ........................................................................... 49
Changes from Original (March 2015) to Revision A
Page
•
Consolidated the Pin Functions table .................................................................................................................................... 3
•
Moved Storage temperature to Absolute Maximum Ratings ............................................................................................... 13
•
Changed Handling Ratings to ESD Ratings ........................................................................................................................ 13
2
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DLPS048C – MARCH 2015 – REVISED JUNE 2019
5 Pin Configuration and Functions
ZEZ Package
201-Pin VFBGA
Bottom View
Pin Functions
PIN
NAME
NO.
I/O (1)
DESCRIPTION
CONTROL AND INITIALIZATION
RESETZ
PARKZ
(1)
C11
C13
I6
DLPC150 power-on reset (active low input) (hysteresis buffer). Self-configuration starts when a lowto-high transition is detected on RESETZ. All DLPC150 controller power and clocks must be stable
before this reset is de-asserted. Connect to the reset output pin (RESETZ) of the DLPA2000 or
DLPA2005 PMIC. Note that the following signals will be tri-stated while RESETZ is asserted:
SPI0_CLK, SPI0_DOUT, SPI0_CSZ0, SPI0_CSZ1, PMIC_SPI_CLK, PMIC_SPI_CSZ,
PMIC_SPI_DIN, PMIC_SPI_DOUT, TRIG_OUT_1, TRIG_OUT_2, and GPIO[19:05]
External pullups or downs (as appropriate) should be added to all tri-stated output signals listed
(including bidirectional signals to be configured as outputs) to avoid floating DLPC150 controller
outputs during reset if connected to devices on the PCB that can malfunction. For SPI, at a
minimum, any chip selects connected to the devices should have a pullup.
Unused bidirectional signals can be functionally configured as outputs to avoid floating DLPC150
controller inputs after RESETZ is set high.
The following signals are forced to a logic low state while RESETZ is asserted and corresponding
I/O power is applied:
LED_SEL_0, LED_SEL_1 and DMD_DEN_ARSTZ
No signals will be in their active state while RESETZ is asserted.
Note that no I2C activity is permitted for a minimum of 500 ms after RESETZ (and PARKZ) are set
high.
I6
DMD fast PARK control (active low Input) (hysteresis buffer). PARKZ must be set high to enable
normal operation. PARKZ should be set high prior to releasing RESETZ (that is, prior to the low-tohigh transition on the RESETZ input). PARKZ should be set low for a minimum of 40 µs before any
power is removed from the DLPC150 such that the fast DMD PARK operation can be completed.
Note for PARKZ, fast PARK control should only be used when loss of power is eminent and beyond
the control of the host processor (for example, when the external power source has been
disconnected or the battery has dropped below a minimum level). The longest lifetime of the DMD
may not be achieved with the fast PARK operation. The longest lifetime is achieved with a normal
PARK operation. Because of this, PARKZ is typically used in conjunction with a normal PARK
request control input through PROJ_ON. The difference being that when the host sets PROJ_ON
low, which connects to both DLPC150 and the DLPA200x PMIC chip, the DLPC150 takes much
longer than 40 µs to park the mirrors. The DLPA200x holds on all power supplies, and keep
RESETZ high, until the longer mirror parking has completed. This longer mirror parking time, of up
to 20 ms, ensures the longest DMD lifetime and reliability.
The DLPA2000 or DLPA2005 monitors power to the DLPC150 and detects an eminent power loss
condition and drives the PARKZ signal accordingly. Connect to the interrupt output pin of the
DLPA2000 or DLPA2005 PMIC.
Refer to Table 1.
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Pin Functions (continued)
PIN
NAME
PROJ_ON
HOST_IRQ (2)
IIC0_SCL
IIC0_SDA
NO.
G14
N8
N10
N9
I/O (1)
DESCRIPTION
B1
Normal mirror parking request (active low): To be driven by the PROJ_ON output of the host. A
logic low on this signal will cause the DLPC150 to PARK the DMD, but it will not power down the
DMD (the DLPA2000 or DLPA2005 controls the power down). The minimum high time is 200 ms.
The minimum low time is also 200 ms.
O9
Host interrupt (output)
This signal has two primary uses. The first use is to indicate when DLPC150 auto-initialization is in
progress and most importantly when it completes. The second is to indicate when service is
requested (that is an interrupt request).
The DLPC150 tri-states this output during reset and requires an external pullup to drive this signal
to its inactive state.
B7
I2C slave (port 0) SCL A bidirectional, open-drain signal with input hysteresis that requires an
external pullup. The slave I2C I/Os are 3.6-V tolerant (high-volt-input tolerant) and are powered by
VCC_INTF (which can be 1.8, 2.5, or 3.3 V). External I2C pullups must be connected to an equal or
higher supply voltage, up to a maximum of 3.6 V (a lower pullup supply voltage would not likely
satisfy the VIH specification of the slave I2C input buffers).
B7
I2C slave (port 0) SDA. A bidirectional, open-drain signal with input hysteresis that requires an
external pullup. The slave I2C I/Os are 3.6-V tolerant (high-volt-input tolerant) and are powered by
VCC_INTF (which can be 1.8, 2.5, or 3.3 V). External I2C pullups must be connected to an equal or
higher supply voltage, up to a maximum of 3.6 V (a lower pullup supply voltage would not likely
satisfy the VIH specification of the slave I2C input buffers).
PARALLEL PORT INPUT DATA AND CONTROL
PCLK
P3
I11
Pixel clock (3)
PDM_CVS_TE
N4
B5
Parallel data mask (4)
VSYNC_WE
P1
I11
Vsync (5)
HSYNC_CS
N5
I11
Hsync (5)
DATAEN_CMD
P2
I11
Data valid active high framing signal. (5) DLPC150 also offers a manual data framing mode through
a software command. Refer to the DLPC150 Programmer's Guide for more information on the
manual data framing command.
(TYPICAL RGB 888)
PDATA_0
PDATA_1
PDATA_2
PDATA_3
PDATA_4
PDATA_5
PDATA_6
PDATA_7
K2
K1
L2
L1
M2
M1
N2
N1
PDATA_8
PDATA_9
PDATA_10
PDATA_11
PDATA_12
PDATA_13
PDATA_14
PDATA_15
R1
R2
R3
P4
R4
P5
R5
P6
I11
Blue
Blue
Blue
Blue
Blue
Blue
Blue
Blue
(TYPICAL RGB 888)
(2)
(3)
(4)
(5)
4
I11
Green
Green
Green
Green
Green
Green
Green
Green
For more information about usage, see Host_irq Usage Model.
Pixel clock capture edge is software programmable.
The parallel data mask signal input is optional for parallel interface operations. If unused, inputs should be grounded or pulled down to
ground through an external resistor (8 kΩ or less).
VSYNC, HSYNC, and DATAEN polarity is software programmable.
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Pin Functions (continued)
PIN
NAME
NO.
I/O (1)
DESCRIPTION
(TYPICAL RGB 888)
PDATA_16
PDATA_17
PDATA_18
PDATA_19
PDATA_20
PDATA_21
PDATA_22
PDATA_23
R6
P7
R7
P8
R8
P9
R9
P10
I11
Red
Red
Red
Red
Red
Red
Red
Red
DMD RESET AND BIAS CONTROL
DMD_DEN_ARSTZ
B1
O2
DMD driver enable (active high)/ DMD reset (active low). Assuming the corresponding I/O power is
supplied, this signal will be driven low after the DMD is parked and before power is removed from
the DMD. If the 1.8-V power to the DLPC150 is independent of the 1.8-V power to the DMD, then
TI recommends a weak, external pulldown resistor to hold the signal low in the event DLPC150
power is inactive while DMD power is applied.
DMD_LS_CLK
A1
O3
DMD, low speed interface clock
DMD_LS_WDATA
A2
O3
DMD, low speed serial write data
DMD_LS_RDATA
B2
I6
DMD, low speed serial read data
DMD SUB-LVDS INTERFACE
DMD_HS_CLK_P
DMD_HS_CLK_N
A7
B7
O4
DMD high speed interface
DMD_HS_WDATA
_H_P
DMD_HS_WDATA
_H_N
DMD_HS_WDATA
_G_P
DMD_HS_WDATA
_G_N
DMD_HS_WDATA
_F_P
DMD_HS_WDATA
_F_N
DMD_HS_WDATA
_E_P
DMD_HS_WDATA
_E_N
DMD_HS_WDATA
_D_P
DMD_HS_WDATA
_D_N
DMD_HS_WDATA
_C_P
DMD_HS_WDATA
_C_N
DMD_HS_WDATA
_B_P
DMD_HS_WDATA
_B_N
DMD_HS_WDATA
_A_P
DMD_HS_WDATA
_A_N
A3
B3
A4
B4
A5
B5
A6
B6
A8
B8
A9
B9
A10
B10
A11
B11
O4
DMD high speed interface lanes, write data bits: (The true numbering and application of the
DMD_HS_DATA pins are software configuration dependent)
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Pin Functions (continued)
PIN
NAME
NO.
I/O (1)
DESCRIPTION
SERIAL FLASH MEMORY INTERFACE
SPI0_CLK
A13
O13
Synchronous serial port 0, clock output. Connect to clock input pin of the serial Flash memory
device.
SPI0_CSZ0
A14
O13
Synchronous serial port 0, chip select 0 output. Active low output. Connect to chip select pin of the
serial Flash memory device.
TI recommends an external pullup resistor to avoid floating inputs to the external SPI device during
DLPC150 controller reset assertion.
SPI0_CSZ1
C12
O13
Synchronous serial port 0, chip select 1 output. Active low output. Connect to chip select pin of a
second serial Flash memory device.
TI recommends an external pullup resistor to avoid floating inputs to the external SPI device during
DLPC150 controller reset assertion.
SPI0_DIN
B12
I12
Synchronous serial port 0, receive data input. Connect to the data output of the serial Flash
memory device.
SPI0_DOUT
B13
O13
Synchronous serial port 0, transmit data output. Connect to the data input of the serial Flash
memory device.
DLPA2000 OR DLPA2005 PMIC INTERFACE
PMIC_SPI_CLK
C15
B1
Synchronous PMIC serial port, clock output. Connect to the clock input (SPI_CLK) of the
DLPA2000 or DLPA2005 PMIC.
PMIC_SPI_CSZ
D15
B1
Synchronous PMIC serial port, chip select output. Active low output. Connect to the chip select
input (SPI_CSZ) of the DLPA2000 or DLPA2005 PMIC.
TI recommends an external pullup resistor to avoid floating inputs to the external SPI device during
DLPC150 controller reset assertion.
PMIC_SPI_DIN
C14
B1
Synchronous PMIC serial port, receive data input. Connect to the data output (SPI_DOUT) of the
DLPA2000 or DLPA2005 PMIC.
PMIC_SPI_DOUT
D14
B1
Synchronous PMIC serial port, receive data output. Connect to the data input (SPI_DIN) of the
DLPA2000 or DLPA2005 PMIC.
PMIC_CMP_IN
A12
I6
Successive approximation ADC comparator input. Assumes a successive approximation ADC is
implemented with a WPC light sensor and/or a thermistor feeding one input of an external
comparator and the other side of the comparator is driven from the DLPC150 controller’s
CMP_PWM pin. Connect to the analog comparator output (CMP_OUT) of the DLPA2000 or
DLPA2005 PMIC. If this function is not used, pulled-down to ground.
PMIC_CMP_PWM
A15
O1
Successive approximation comparator pulse-duration modulation output. Supplies a PWM signal to
drive the successive approximation ADC comparator used in WPC light-to-voltage sensor
applications. Connect to the reference voltage input for analog comparator (PWM_IN) of the
DLPA2000 or DLPA2005. If this function is not used, leave this pin unconnected.
PMIC_LED_SEL_0
B15
O1
LED enable select. Controlled by programmable DMD sequence
Enabled LED Timing
DLPA2000 or DLPA2005 application
00 = None
01 = Red
10 = Green
11 = Blue
LED_SEL(1:0)
B14
O1
These signals will be driven low when RESETZ is asserted and the corresponding I/O power is
supplied. They will continue to be driven low throughout the auto-initialization process. A weak,
external pulldown resistor is still recommended to ensure that the LEDs are disabled when I/O
power is not applied.
N6
I11
Input Trigger mode 1. Active high input signal that display the next pattern in the pattern sequence.
Pull-down this signal with an external resistor.
TRIG_OUT_1
L14
B1
Output Trigger mode 1. Active high output signal during pattern exposure
TRIG_OUT_2
E14
B1
Output Trigger mode 2. Active high output signal that indicates the first pattern in a sequence.
PMIC_LED_SEL_1
TRIGGER CONTROL
TRIG_IN_1
6
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Pin Functions (continued)
PIN
NAME
NO.
I/O (1)
DESCRIPTION
GPIO PERIPHERAL INTERFACE
GPIO_19
M15
B1
General purpose I/O 19 (hysteresis buffer). Options:
1. Optional GPIO. Should be configured as a logic zero GPIO output and left unconnected if not
used (otherwise it will require an external pullup or pulldown to avoid a floating GPIO input).
2. KEYPAD_4 (input): keypad applications
GPIO_18
M14
B1
General purpose I/O 18 (hysteresis buffer). Options:
1. Optional GPIO. Should be configured as a logic zero GPIO output and left unconnected if not
used (otherwise it will require an external pullup or pulldown to avoid a floating GPIO input).
2. KEYPAD_3 (input): keypad applications
GPIO_17
L15
B1
General purpose I/O 17 (hysteresis buffer). Options:
1. Optional GPIO. Configured as a logic zero GPIO output and left unconnected if not used.
GPIO_15
K15
B1
General purpose I/O 15 (hysteresis buffer). Options:
1. Optional GPIO. Should be configured as a logic zero GPIO output and left unconnected if not
used (otherwise it will require an external pullup or pulldown to avoid a floating GPIO input).
2.
GPIO_14
K14
KEYPAD_0 (input): keypad applications
B1
General purpose I/O 14 (hysteresis buffer). Option:
1. Optional GPIO. Should be configured as a logic zero GPIO output and left unconnected if not
used (otherwise it will require an external pullup or pulldown to avoid a floating GPIO input).
GPIO_13
J15
B1
General purpose I/O 13 (hysteresis buffer). Options:
1. CAL_PWR (output): Intended to feed the calibration control of the successive approximation
ADC light sensor.
2. Optional GPIO. Should be configured as a logic zero GPIO output and left unconnected if not
used (otherwise it will require an external pullup or pulldown to avoid a floating GPIO input).
GPIO_12
J14
B1
General purpose I/O 12 (hysteresis buffer). Option:
1. Optional GPIO. Should be configured as a logic zero GPIO output and left unconnected if not
used (otherwise it will require an external pullup or pulldown to avoid a floating GPIO input).
B1
General purpose I/O 11 (hysteresis buffer). Options:
1. (Output): thermistor power enable.
2. Optional GPIO. Should be configured as a logic zero GPIO output and left unconnected if not
used (otherwise it will require an external pullup or pulldown to avoid a floating GPIO input).
B1
General Purpose I/O 10 (hysteresis buffer). Options:
1. RC_CHARGE (output): Intended to feed the RC charge circuit of the successive approximation
ADC used to control the light sensor comparator.
2. Optional GPIO. Should be configured as a logic zero GPIO output and left unconnected if not
used (otherwise it will require an external pullup or pulldown to avoid a floating GPIO input).
B1
General purpose I/O 09 (hysteresis buffer). Options:
1. LS_PWR (active high output): Intended to feed the power control signal of the successive
approximation ADC light sensor.
2. Optional GPIO. Should be configured as a logic zero GPIO output and left unconnected if not
used (otherwise it will require an external pullup or pulldown to avoid a floating GPIO input).
B1
General purpose I/O 07 (hysteresis buffer). Options:
1. (All) LED_ENABLE (active high input). This signal can be used as an optional shutdown
interlock for the LED driver. Specifically, when so configured, setting LED_ENABLE = 0
(disabled), will cause LDEDRV_ON to be forced to 0 and LED_SEL(2:0) to be forced to b000.
Otherwise when LED_ENABLE = 1 (enabled), the DLPC150 controller is free to control the
LED SEL signals as it desires. There is however a 100-ms delay after LED_ENABLE
transitions from low-to-high before the interlock is released.
2. (Output): LABB output sample and hold sensor control signal.
3. (All) GPIO (bidirectional): Optional GPIO. Should be configured as a logic zero GPIO output
and left unconnected if not used (otherwise it will require an external pullup or pulldown to
avoid a floating GPIO input).
B1
General purpose I/O 06 (hysteresis buffer). Option:
1. Optional GPIO. Should be configured as a logic zero GPIO output and left unconnected if not
used. An external pulldown resistor is required to deactivate this signal during reset and autoinitialization processes.
GPIO_11
GPIO_10
GPIO_09
GPIO_07
GPIO_06
H15
H14
G15
F15
F14
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Pin Functions (continued)
PIN
NAME
GPIO_05
NO.
E15
I/O (1)
DESCRIPTION
B1
General purpose I/O 05 (hysteresis buffer). Option:
1. Optional GPIO. Should be configured as a logic zero GPIO output and left unconnected if not
used (otherwise it will require an external pullup or pulldown to avoid a floating GPIO input).
CLOCK AND PLL SUPPORT
PLL_REFCLK_I
H1
I11
Reference clock crystal input. If an external oscillator is used in place of a crystal, then this pin
serves as the oscillator input.
PLL_REFCLK_O
J1
O5
Reference clock crystal return. If an external oscillator is used in place of a crystal, then leave this
pin unconnected with no capacitive load.
BOARD LEVEL TEST AND DEBUG
HWTEST_EN
C10
I6
Reserved Manufacturing test enable pin. For proper device operation, connect this signal directly to
ground.
Reserved
P12
I6
Reserved pin. For proper device operation, leave this pin unconnected.
Reserved
P13
I6
Reserved pin. For proper device operation, leave this pin unconnected.
Reserved
N13 (6)
O1
Reserved pin. For proper device operation, leave this pin unconnected.
Reserved
N12 (6)
O1
Reserved pin. For proper device operation, leave this pin unconnected.
Reserved
R10
B8
Reserved pin. For proper device operation, pull high to Vcc18 with external pullup resistor.
Reserved
R11
B8
Reserved pin. For proper device operation, pull high to Vcc18 with external pullup resistor.
Reserved
M13
I6
Reserved pin. For proper device operation, leave this pin unconnected.
Reserved
N11
I6
Reserved pin. For proper device operation, leave this pin unconnected.
Reserved
P11
I6
Reserved pin.
For proper device operation, this pin must be tied to ground, through an external 8-kΩ, or less,
resistor. Failure to tie this pin low will cause startup and initialization problems.
Reserved
E1
Reserved pin. For proper device operation, leave this pin unconnected.
Reserved
E2
Reserved pin. For proper device operation, leave this pin unconnected.
Reserved
F1
Reserved pin. For proper device operation, leave this pin unconnected.
Reserved
F2
Reserved pin. For proper device operation, leave this pin unconnected.
Reserved
F3
Reserved pin. For proper device operation, leave this pin unconnected.
Reserved
G1
Reserved pin. For proper device operation, leave this pin unconnected.
Reserved
G2
Reserved pin. For proper device operation, leave this pin unconnected.
Reserved
D1
Reserved pin. For proper device operation, leave this pin unconnected.
Reserved
D2
Reserved pin. For proper device operation, leave this pin unconnected.
Reserved
C1
Reserved pin. For proper device operation, leave this pin unconnected.
Reserved
C2
Reserved pin. For proper device operation, leave this pin unconnected.
R12
B1
Reserved Test pin 0. For proper device operation, leave this pin unconnected (includes weak
internal pulldown).Tri-stated while RESETZ is asserted low. Sampled as an input test mode
selection control approximately 1.5 µs after de-assertion of RESETZ, and then driven as an output.
Note: An external pullup should not be applied to this pin to avoid putting the DLPC150 in a test
mode.
B1
Reserved Test pin 1. For proper device operation, leave this pin unconnected (includes weak
internal pulldown). Tri-stated while RESETZ is asserted low. Sampled as an input test mode
selection control approximately 1.5 µs after de-assertion of RESETZ and then driven as an output.
Note: An external pullup should not be applied to this pin to avoid putting the DLPC150 in a test
mode.
B1
Reserved Test pin 2. For proper device operation, leave this pin unconnected (includes weak
internal pulldown). Tri-stated while RESETZ is asserted low. Sampled as an input test mode
selection control approximately 1.5 µs after de-assertion of RESETZ and then driven as an output.
Note: An external pullup should not be applied to this pin to avoid putting the DLPC150 in a test
mode.
TSTPT_0
TSTPT_1
TSTPT_2
(6)
8
R13
R14
If operation does not call for an external pullup and there is no external logic that might overcome the weak internal pulldown resistor,
then this I/O can be left open or unconnected for normal operation. If operation does not call for an external pullup, but there is external
logic that might overcome the weak internal pulldown resistor, then an external pulldown resistor is recommended to ensure a logic low.
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Pin Functions (continued)
PIN
NAME
NO.
I/O (1)
DESCRIPTION
TSTPT_3
R15
B1
Reserved Test pin 3. For proper device operation, leave this pin unconnected (includes weak
internal pulldown).Tri-stated while RESETZ is asserted low. Sampled as an input test mode
selection control approximately 1.5 µs after de-assertion of RESETZ and then driven as an output.
TSTPT_4
P14
B1
Reserved Test pin 4. For proper device operation, leave this pin unconnected (includes weak
internal pulldown).Tri-stated while RESETZ is asserted low. Sampled as an input test mode
selection control approximately 1.5 µs after de-assertion of RESETZ and then driven as an output.
TSTPT_5
P15
B1
Reserved Test pin 5. For proper device operation, leave this pin unconnected (includes weak
internal pulldown). Tri-stated while RESETZ is asserted low. Sampled as an input test mode
selection control approximately 1.5 µs after de-assertion of RESETZ and then driven as an output.
TSTPT_6
N14
B1
Reserved Test pin 6. For proper device operation, leave this pin unconnected (includes weak
internal pulldown). Tri-stated while RESETZ is asserted low. Sampled as an input test mode
selection control approximately 1.5 µs after de-assertion of RESETZ and then driven as an output.
TSTPT_7
N15
B1
Reserved Test pin 7. For proper device operation, leave this pin unconnected (includes weak
internal pulldown). Tri-stated while RESETZ is asserted low. Sampled as an input test mode
selection control approximately 1.5 µs after de-assertion of RESETZ and then driven as an output.
POWER AND GROUND
VDD
VDDLP12
VSS
C5, D5,
D7,
D12,
J4, J12,
K3, L4,
L12,
M6, M9,
D9,
D13,
F13,
H13,
L13,
M10,
D3, E3
PWR
Core power 1.1 V (main 1.1 V)
C3
PWR
Core power 1.1 V
C4, D6,
D8,
D10,
E4,
E13,
F4, G4,
G12,
H4,
H12,
J3, J13,
K4,
K12,
L3, M4,
M5, M8,
M12,
G13,
C6, C8,
F6, F7,
F8, F9,
F10,
G6, G7,
G8, G9,
G10,
H6, H7,
H8, H9,
H10,
J6, J7,
J8, J9,
J10, K6,
K7, K8,
K9, K10
GND
Core ground (eDRAM, I/O ground, thermal ground)
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Pin Functions (continued)
PIN
NAME
NO.
I/O (1)
DESCRIPTION
VCC18
C7, C9,
D4,
E12,
F12,
K13,
M11
PWR
All 1.8-V I/O power:
(1.8-V power supply for all I/O other than the host or parallel interface and the SPI flash interface.
This includes RESETZ, PARKZ LED_SEL, CMP, GPIO, IIC1, TSTPT, and JTAG pins)
VCC_INTF
M3, M7,
N3, N7
PWR
Host or parallel interface I/O power: 1.8 to 3.3 V (Includes IIC0, PDATA, video syncs, and
HOST_IRQ pins)
VCC_FLSH
D11
PWR
Flash interface I/O power:1.8 to 3.3 V
(Dedicated SPI0 power pin)
VDD_PLLM
H2
PWR
MCG PLL 1.1-V power
VSS_PLLM
G3
RTN
MCG PLL return
VDD_PLLD
J2
PWR
DCG PLL 1.1-V power
VSS_PLLD
H3
RTN
DCG PLL return
10
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5.1 DLPC150 Mechanical Data
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
A
DMD_LS_CLK
DMD_LS_WDAT
A
DMD_HS_
WDATA_H_P
DMD_HS_
WDATA_G_P
DMD_HS_
WDATA_F_P
DMD_HS_
WDATA_E_P
DMD_HS_
CLK_P
DMD_HS_
WDATA_D_P
DMD_HS_
WDATA_C_P
DMD_HS_
WDATA_B_P
DMD_HS_
WDATA_A_P
PMIC_CMP_IN
SPI0_CLK
SPI0_CSZ0
PMIC_
CMP_PWM
B
DMD_DEN_ARS
TZ
DMD_LS_RDAT
A
DMD_HS_
WDATA_H_N
DMD_HS_
WDATA_G_N
DMD_HS_
WDATA_F_N
DMD_HS_
WDATA_E_N
DMD_HS_
CLK_N
DMD_HS_
WDATA_D_N
DMD_HS_
WDATA_C_N
DMD_HS_
WDATA_B_N
DMD_HS_
WDATA_A_N
SPI0_DIN
SPI0_DOUT
PMIC_LED_
SEL_1
PMIC_LED_
SEL_0
C
Reserved
Reserved
VDDLP12
VSS
VDD
VSS
VCC18
VSS
VCC18
HWTEST_EN
RESETZ
SPI0_CSZ1
PARKZ
PMIC_SPI_DIN
PMIC_SPI_CLK
D
Reserved
Reserved
VDD
VCC18
VDD
VSS
VDD
VSS
VDD
VSS
VCC_FLSH
VDD
VDD
PMIC_
SPI_DOUT
PMIC_SPI_CSZ
E
Reserved
Reserved
VDD
VSS
VCC18
VSS
TRIG_OUT_2
GPIO_05
F
Reserved
Reserved
Reserved
VSS
VSS
VSS
VSS
VSS
VSS
VCC18
VDD
GPIO_06
GPIO_07
G
Reserved
Reserved
VSS_PLLM
VSS
VSS
VSS
VSS
VSS
VSS
VSS
VSS
PROJ_ON
GPIO_09
H
PLL_REFCLK_I
VDD_PLLM
VSS_PLLD
VSS
VSS
VSS
VSS
VSS
VSS
VSS
VDD
GPIO_10
GPIO_11
J
PLL_REFCLK_O
VDD_PLLD
VSS
VDD
VSS
VSS
VSS
VSS
VSS
VDD
VSS
GPIO_12
GPIO_13
K
PDATA_1
PDATA_0
VDD
VSS
VSS
VSS
VSS
VSS
VSS
VSS
VCC18
GPIO_14
GPIO_15
L
PDATA_3
PDATA_2
VSS
VDD
VDD
VDD
GPIO_16
GPIO_17
M
PDATA_5
PDATA_4
VCC_INTF
VSS
VSS
VDD
VCC_INTF
VSS
VDD
VDD
VCC18
VSS
Reserved
TRIG_OUT_1
GPIO_19
N
PDATA_7
PDATA_6
VCC_INTF
PDM_CVS_TE
HSYNC_CS
TRIG_IN_1
VCC_INTF
HOST_IRQ
IIC0_SDA
IIC0_SCL
Reserved
Reserved
Reserved
TSTPT_6
TSTPT_7
P
VSYNC_WE
DATEN_CMD
PCLK
PDATA_11
PDATA_13
PDATA_15
PDATA_17
PDATA_19
PDATA_21
PDATA_23
Reserved
Reserved
Reserved
TSTPT_4
TSTPT_5
R
PDATA_8
PDATA_9
PDATA_10
PDATA_12
PDATA_14
PDATA_16
PDATA_18
PDATA_20
PDATA_22
Reserved
Reserved
TSTPT_0
TSTPT_1
TSTPT_2
TSTPT_3
Figure 1. 13- × 13-mm Package – VF Ball Grid Array
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DLPC150 Mechanical Data (continued)
Table 1. I/O Type Subscript Definition
I/O TYPE
SUBSCRIPT
12
DESCRIPTION
SUPPLY REFERENCE
ESD STRUCTURE
1
1.8 LVCMOS I/O buffer with 8-mA drive
Vcc18
ESD diode to GND and supply rail
2
1.8 LVCMOS I/O buffer with 4-mA drive
Vcc18
ESD diode to GND and supply rail
3
1.8 LVCMOS I/O buffer with 24-mA drive
Vcc18
ESD diode to GND and supply rail
4
1.8 sub-LVDS output with 4-mA drive
Vcc18
ESD diode to GND and supply rail
5
1.8, 2.5, 3.3 LVCMOS with 4-mA drive
Vcc_INTF
ESD diode to GND and supply rail
6
1.8 LVCMOS input
Vcc18
ESD diode to GND and supply rail
7
1.8-, 2.5-, 3.3-V I2C with 3-mA drive
Vcc_INTF
ESD diode to GND and supply rail
2
8
1.8-V I C with 3-mA drive
Vcc18
ESD diode to GND and supply rail
9
1.8-, 2.5-, 3.3-V LVCMOS with 8-mA drive
Vcc_INTF
ESD diode to GND and supply rail
11
1.8, 2.5, 3.3 LVCMOS input
Vcc_INTF
ESD diode to GND and supply rail
12
1.8-, 2.5-, 3.3-V LVCMOS input
Vcc_FLSH
ESD diode to GND and supply rail
13
1.8-, 2.5-, 3.3-V LVCMOS with 8-mA drive
Vcc_FLSH
ESD diode to GND and supply rail
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Table 2. Internal Pullup and Pulldown Characteristics (1) (2)
INTERNAL PULLUP AND PULLDOWN
RESISTOR CHARACTERISTICS
Weak pullup resistance
Weak pulldown resistance
(1)
(2)
VCCIO
MIN
MAX
UNIT
3.3 V
29
63
kΩ
2.5 V
38
90
kΩ
1.8 V
56
148
kΩ
3.3 V
30
72
kΩ
2.5 V
36
101
kΩ
1.8 V
52
167
kΩ
The resistance is dependent on the supply voltage level applied to the I/O.
An external 8-kΩ pullup or pulldown (if needed) would work for any voltage condition to correctly pull enough to override any associated
internal pullups or pulldowns.
6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature (unless otherwise noted) (see
(1)
)
MIN
MAX
UNIT
V(VDD) (core)
–0.3
1.21
V
V(VDDLP12) (core)
–0.3
1.32
V
Power + sub-LVDS
–0.3
1.96
V
Host I/O power
–0.3
3.60
If 1.8-V power used
–0.3
1.99
If 2.5-V power used
–0.3
2.75
If 3.3-V power used
–0.3
3.60
Flash I/O power
–0.3
3.60
If 1.8-V power used
–0.3
1.96
If 2.5-V power used
–0.3
2.72
If 3.3-V power used
SUPPLY VOLTAGE
V(VCC_INTF)
V(VCC_FLSH)
(2) (3)
V
V
–0.3
3.58
V(VDD_PLLM) (MCG PLL)
–0.3
1.21
V
V(VDD_PLLD) (DCG PLL)
–0.3
1.21
V
GENERAL
TJ
Operating junction temperature
–30
125
°C
Tstg
Storage temperature
–40
125
°C
(1)
(2)
(3)
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltage values are with respect to GND.
Overlap currents, if allowed to continue flowing unchecked, not only increase total power dissipation in a circuit, but degrade the circuit
reliability, thus shortening its usual operating life.
6.2 ESD Ratings
VALUE
V(ESD)
(1)
Electrostatic
discharge
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins
±2000
Charged device model (CDM), per JEDEC specification JESD22-C101, all pins (1)
±500
UNIT
V
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
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6.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
V(VDD)
MIN
NOM
MAX
UNIT
V
Core power 1.1 V (main 1.1 V)
±5% tolerance
1.045
1.1
1.155
V(VDDLP12)
Core power 1.1 V
±5% tolerance
See (1)
1.02
1.1
1.18
1.12
1.2
1.28
V(VCC18)
All 1.8-V I/O power:
(1.8-V power supply for all I/O other than the
host or parallel interface and the SPI flash
interface. This includes RESETZ, PARKZ,
LED_SEL, CMP, GPIO, TSTPT, and Reserved
pins.)
±8.5% tolerance
1.64
1.8
1.96
Host or parallel interface I/O power: 1.8 to 3.3 V
(includes IIC0, PDATA, video syncs, and
HOST_IRQ pins)
1.64
1.8
1.96
V(VCC_INTF)
±8.5% tolerance
See (1)
2.28
2.5
2.72
3.02
3.3
3.58
1.64
1.8
1.96
2.28
2.5
2.72
3.02
3.3
3.58
V(VCC_FLSH)
±8.5% tolerance
See (1)
Flash interface I/O power:1.8 to 3.3 V
V
V
V
V
V(VDD_PLLM)
MCG PLL 1.1-V power
±9.1% tolerance
See (2)
1.025
1.1
1.155
V
V(VDD_PLLD)
DCG PLL 1.1-V power
±9.1% tolerance
See (2)
1.025
1.1
1.155
V
TA
Operating ambient temperature range (3)
85
°C
(1)
(2)
(3)
–30
These supplies have multiple valid ranges.
These I/O supply ranges are wider to facilitate additional filtering.
The operating ambient temperature range assumes 0 forced air flow, a JEDEC JESD51 junction-to-ambient thermal resistance value at
0 forced air flow (RθJA at 0 m/s), a JEDEC JESD51 standard test card and environment, along with min and max estimated power
dissipation across process, voltage, and temperature. Thermal conditions vary by application, which will impact RθJA. Thus, maximum
operating ambient temperature varies by application.
(a) Ta_min = Tj_min – (Pd_min × RθJA) = –30°C – (0.0W × 30.3°C/W) = –30°C
(b) Ta_max = Tj_max – (Pd_max × RθJA) = +105°C – (0.348W × 30.3°C/W) = +94.4°C
6.4 Thermal Information
DLPC150
THERMAL METRIC (1)
RθJC
RθJA
Junction-to-case thermal resistance
Junction-to-air thermal resistance
ψJT
(1)
(2)
(3)
14
176 PINS
201 PINS
11.2
10.1
at 0 m/s of forced airflow (2)
30.3
28.8
at 1 m/s of forced airflow (2)
27.4
25.3
(2)
26.6
24.4
.27
.23
at 2 m/s of forced airflow
(3)
ZEZ (VFBGA)
Temperature variance from junction to package top center temperature, per unit power
dissipation
UNIT
°C/W
°C/W
°C/W
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report (SPRA953).
Thermal coefficients abide by JEDEC Standard 51. RθJA is the thermal resistance of the package as measured using a JEDEC defined
standard test PCB. This JEDEC test PCB is not necessarily representative of the DLPC150 PCB and thus the reported thermal
resistance may not be accurate in the actual product application. Although the actual thermal resistance may be different , it is the best
information available during the design phase to estimate thermal performance.
Example: (0.5 W) × (0.2 C/W) ≈ 1.00°C temperature rise.
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6.5 Electrical Characteristics Over Recommended Operating Conditions
(1) (2) (3) (4) (5) (6)
(see
)
TEST CONDITIONS (7)
PARAMETER
TYP (8)
MAX (9)
IDLE disabled, WVGA, 60 Hz
112
232.2
IDLE enabled, WVGA, 60 Hz
85
IDLE disabled, WVGA, 60 Hz
112
IDLE enabled, WVGA, 60 Hz
85
IDLE disabled, WVGA, 60 Hz
112
MIN
UNIT
ICC11
Supply voltage, 1.1-V Main core power
ICC_PLLM
Supply voltage, 1.1-V MCG PLL power
ICC_PLLD
Supply voltage, 1.1-V DCG PLL power
IDLE enabled, WVGA, 60 Hz
85
13
ICC18
Supply voltage, 1.8-V I/O power:
IDLE disabled, WVGA, 60 Hz
(1.8-V power supply for all I/O other than the
host or parallel interface and the SPI flash
interface. This includes sub-LVDS DMD I/O, IDLE enabled, WVGA, 60 Hz
RESETZ, PARKZ LED_SEL, CMP, GPIO,
IIC1, TSTPT, and JTAG pins)
ICC_INTF
Supply voltage, 1.8-V Host or parallel
interface I/O power: (includes IIC0, PDATA,
video syncs, and HOST_IRQ pins)
IDLE disabled, WVGA, 60 Hz,
VVCC_INTF = 1.8V
1.5
mA
ICC_FLSH
Supply voltage, 1.8-V Flash interface I/O
power
IDLE disabled, WVGA, 60 Hz,
VVCC_FLSH = 1.8V
1.01
mA
(1)
(2)
(3)
(4)
(5)
(6)
(7)
(8)
(9)
mA
mA
mA
mA
13
Assumes 12.5% activity factor, 30% clock gating on appropriate domains, and mixed SVT or HVT cells.
Programmable host and flash I/O are at minimum voltage (that is 1.8 V) for this typical scenario.
Max currents column use typical motion video as the input. The typical currents column uses SMPTE color bars as the input.
Some applications (that is, high-resolution 3D) may be forced to use 1-oz copper to manage DLPC150 controller package heat.
For the typical cases, all pins using 1.8 V are tied together as are 1.1-V pins, and the current specified is for the collective 1.8-V and 1.1V current.
Input image is 854 × 480 (WVGA) 24-bits on the parallel interface at the frame rate shown with DLP2010 or DLP2010NIR.
In normal mode.
Assumes typical case power PVT condition = nominal process, typical voltage, typical temperature (55°C junction). WVGA resolution.
Assumes worse case power PVT condition = corner process, high voltage, high temperature (105°C junction), WVGA resolution .
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6.6 Electrical Characteristics
over operating free-air temperature range (unless otherwise noted) (see
PARAMETER
(3)
(1) (2)
)
TEST CONDITIONS
2
MIN
0.7 × VCC_INTF
1.17
3.6
1.8-V LVTTL (I/O type 1, 6)
identified below: (2)
CMP_OUT; PARKZ; RESETZ;
GPIO[19:05]; TRIG_OUT_1;
TRIG_OUT_2
1.3
3.6
2.5-V LVTTL (I/O type 5, 9, 11,
12, 13)
1.7
3.6
3.3-V LVTTL (I/O type 5, 9, 11,
12, 13)
2
3.6
I2C buffer (I/O type 7)
–0.5
0.3 × VCC_INTF
1.8-V LVTTL (I/O type 1, 2, 3, 5,
6, 8, 9, 11, 12, 13)
–0.3
0.63
1.8-V LVTTL (I/O type 1, 6)
identified below: (2)
CMP_OUT; PARKZ; RESETZ;
GPIO[19:05]; TRIG_OUT_1;
TRIG_OUT_2
–0.3
0.5
2.5-V LVTTL (I/O type 5, 9, 11,
12, 13)
–0.3
0.7
3.3-V LVTTL (I/O type 5, 9, 11,
12, 13)
–0.3
0.8
1.8-V LVTTL (I/O type 1, 2, 3, 5,
6, 8, 9, 11, 12, 13)
VIH
Low-level
input
threshold
voltage
VIL
VCM
Steady-state
1.8 sub-LVDS (DMD high speed)
common
(I/O type 4)
mode voltage
ǀVODǀ
Differential
output
magnitude
VOH
High-level
output
voltage
800
1.8 sub-LVDS (DMD high speed)
(I/O type 4)
VOL
1.8-V LVTTL (I/O type 1, 2, 3, 5,
6, 8, 9, 11, 12, 13)
1.35
2.5-V LVTTL (I/O type 5, 9, 11,
12, 13)
1.7
3.3-V LVTTL (I/O type 5, 9, 11,
12, 13)
2.4
(3)
16
1000
UNIT
V
V
mV
mV
V
1
I2C buffer (I/O type 7)
VCC_INTF > 2 V
0.4
I2C buffer (I/O type 7)
VCC_INTF < 2 V
0.2 × VCC_INTF
1.8-V LVTTL (I/O type 1, 2, 3, 5,
6, 8, 9, 11, 12, 13)
0.45
2.5 V LVTTL (I/O type 5, 9, 11,
12, 13)
0.7
3.3 V LVTTL (I/O type 5, 9, 11,
12, 13)
0.4
1.8 sub-LVDS – DMD high
speed (I/O type 4)
(1)
(2)
900
200
1.8 sub-LVDS – DMD high
speed (I/O type 4)
Low-level
output
voltage
MAX
(1)
I C buffer (I/O type 7)
High-level
input
threshold
voltage
TYP
V
0.8
I/O is high voltage tolerant; that is, if VCC = 1.8 V, the input is 3.3-V tolerant, and if VCC = 3.3 V, the input is 5-V tolerant.
DLPC150 controller pins: CMP_OUT; PARKZ; RESETZ; GPIO[19:05]; TRIG_OUT_1; TRIG_OUT_2 have slightly varied VIH and VIL
range from other 1.8-V I/O.
The number inside each parenthesis for the I/O refers to the type defined in Table 1.
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Electrical Characteristics (continued)
over operating free-air temperature range (unless otherwise noted) (see (1)(2))
PARAMETER (3)
IOH
High-level
output
current
TEST CONDITIONS
1.8-V LVTTL (I/O type 1, 2, 3, 5,
6, 8, 9, 11, 12, 13)
4 mA
2
1.8-V LVTTL (I/O type 1, 2, 3, 5,
6, 8, 9, 11, 12, 13)
8 mA
3.5
1.8-V LVTTL (I/O type 1, 2, 3, 5,
6, 8, 9, 11, 12, 13)
24 mA
10.6
2.5-V LVTTL (I/O type 5)
4 mA
5.4
2.5-V LVTTL (I/O type 9, 13)
8 mA
10.8
2.5-V LVTTL (I/O type 5, 9, 11,
12, 13)
24 mA
28.7
3.3-V LVTTL (I/O type 5 )
4 mA
7.8
3.3-V LVTTL (I/O type 9, 13)
8 mA
15
I2C buffer (I/O type 7)
IOL
IOZ
Low-level
output
current
Highimpedance
leakage
current
MIN
Input
capacitance
(including
package)
MAX
UNIT
mA
3
1.8-V LVTTL (I/O type 1, 2, 3, 5,
6, 8, 9, 11, 12, 13)
4 mA
2.3
1.8-V LVTTL (I/O type 1, 2, 3, 5,
6, 8, 9, 11, 12, 13)
8 mA
4.6
1.8-V LVTTL (I/O type 1, 2, 3, 5,
6, 8, 9, 11, 12, 13)
24 mA
13.9
2.5-V LVTTL (I/O type 5)
4 mA
5.2
2.5-V LVTTL (I/O type 9, 13)
8 mA
10.4
2.5-V LVTTL (I/O type 5, 9, 11,
12, 13)
24 mA
31.1
3.3-V LVTTL (I/O type 5 )
4 mA
4.4
3.3-V LVTTL (I/O type 9, 13)
8 mA
8.9
I2C buffer (I/O type 7)
0.1 × VCC_INTF < VI
< 0.9 × VCC_INTF
–10
10
1.8-V LVTTL (I/O type 1, 2, 3, 5,
6, 8, 9, 11, 12, 13)
–10
10
2.5-V LVTTL (I/O type 5, 9, 11,
12, 13)
–10
10
3.3-V LVTTL (I/O type 5, 9, 11,
12, 13)
–10
10
mA
µA
I2C buffer (I/O type 7)
CI
TYP
5
1.8-V LVTTL (I/O type 1, 2, 3, 5,
6, 8, 9, 11, 12, 13)
2.6
3.5
2.5-V LVTTL (I/O type 5, 9, 11,
12, 13)
2.6
3.5
3.3-V LVTTL (I/O type 5, 9, 11,
12, 13)
2.6
3.5
1.8 sub-LVDS – DMD high
speed (I/O type 4)
pF
3
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6.7 High-Speed Sub-LVDS Electrical Characteristics
over operating free-air temperature range (unless otherwise noted)
PARAMETER
VCM
Steady-state common mode voltage
VCM (Δpp) (1)
VCM change peak-to-peak (during switching)
VCM (Δss) (1)
VCM change steady state
|VOD| (2)
Differential output voltage magnitude
VOD (Δ)
VOD change (between logic states)
VOH
Single-ended output voltage high
VOL
Single-ended output voltage low
tR
(2)
MIN
TYP
0.8
0.9
–10
MAX
1
V
75
mV
10
mV
200
–10
UNIT
mV
10
mV
1
V
0.8
V
Differential output rise time
250
tF (2)
Differential output fall time
250
ps
tMAX
Max switching rate
1064
Mbps
DCout
Output duty cycle
45%
50%
55%
Txterm (1)
Internal differential termination
80
100
120
Txload
100-Ω differential PCB trace
(50-Ω transmission lines)
0.5
(1)
6
ps
Ω
inches
Definition of VCM changes:
Vcm
Vcm(ûss)
Vcm(ûpp)
(2)
Note that VOD is the differential voltage swing measured across a 100-Ω termination resistance connected directly between the
transmitter differential pins. |VOD| is the magnitude of this voltage swing relative to 0. Rise and fall times are defined for the differential
VOD signal as follows:
80%
tF
tR
+ Vod
|Vod|
Vod
0V
|Vod|
20%
- Vod
Differential Output Signal
(Note Vcm is removed when the signals are viewed differentially)
18
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6.8 Low-Speed SDR Electrical Characteristics
over operating free-air temperature range (unless otherwise noted)
PARAMETER
ID
TEST CONDITIONS
MIN
MAX
UNIT
1.64
1.96
V
Operating voltage
VCC18 (all signal groups)
DC input high voltage
VIHD(DC)
Signal group 1
All
0.7 × VCC18
VCC18 + 0.5
V
DC input low voltage (1)
VILD(DC)
Signal group 1
All
–0.5
0.3 × VCC18
V
AC input high voltage (2)
VIHD(AC)
Signal group 1
All
0.8 × VCC18
VCC18 + 0.5
V
AC input low voltage
VILD(AC)
Signal group 1
All
–0.5
0.2 × VCC18
V
Signal group 1
1
3
Signal group 2
0.25
Signal group 3
0.5
Slew rate
(1)
(2)
(3)
(4)
(5)
(6)
(3) (4) (5) (6)
V/ns
VILD(AC) min applies to undershoot.
VIHD(AC) max applies to overshoot.
Signal group 1 output slew rate for rising edge is measured between VILD(DC) to VIHD(AC).
Signal group 1 output slew rate for falling edge is measured between VIHD(DC) to VILD(AC).
Signal group 1: See Figure 2.
Signal groups 2 and 3 output slew rate for rising edge is measured between VILD(AC) to VIHD(AC).
Figure 2. Low Speed (Ls) I/O Input Thresholds
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6.9 System Oscillators Timing Requirements (1)
NUMBER
MIN
MAX
UNIT
Option 1: 24-MHz oscillator
23.998
24.002
MHz
Option 1: 24-MHz oscillator
41.67
41.663
ns
Option 2: 16-MHz oscillator
15.998
16.002
MHz
Cycle time, MOSC (2)
Option 2: 16-MHz oscillator
62.508
62.492
ns
tw(H)
Pulse duration (3), MOSC, high
50% to 50% reference points (signal)
40 tc%
tw(L)
Pulse duration (3), MOSC, low
50% to 50% reference points (signal)
40 tc%
1a
ƒclock Clock frequency, MOSC (2)
1a
tc
1b
ƒclock Clock frequency, MOSC (2)
1b
tc
2
3
Cycle time, MOSC (2)
(3)
4
tt
Transition time
5
tjp
Long-term, peak-to-peak, period jitter (3),
MOSC
(that is the deviation in period from ideal
period due solely to high frequency jitter)
(1)
(2)
(3)
, MOSC, tt = tf / tr
20% to 80% reference points (signal)
10
ns
2%
The I/O pin TSTPT_6 enables the DLPC150 controller to use two different oscillator frequencies through a pullup control at initial
DLPC150 controller power-up. If a pullup is applied to this pin then a 16.0-MHz oscillator option must be used instead of the 24-MHz
option shown.
The frequency accuracy for MOSC is ±200 PPM. (This includes impact to accuracy due to aging, temperature, and trim sensitivity.) The
MOSC input cannot support spread spectrum clock spreading.
Applies only when driven through an external digital oscillator.
tw(H)
MOSC
tt
tt
tc
tw(L)
50%
50%
80%
80%
20%
20%
50%
Figure 3. System Oscillators
6.10 Power-Up and Reset Timing Requirements
NUMBER
(1)
MIN
1
tw(L)
Pulse duration, inactive low, RESETZ 50% to 50% reference points
(signal)
2
tt
Transition time, RESETZ (1), tt = tf / tr
MAX
1.25
UNIT
µs
20% to 80% reference points
(signal)
0.5
µs
For more information on RESETZ, see Pin Configuration and Functions.
DC Power
Supplies
tt
80%
50%
20%
RESETZ
tw(L)
tt
80%
50%
20%
80%
50%
20%
80%
50%
20%
tw(L)
tw(L)
Figure 4. Power-Up and Power-Down RESETZ Timing
20
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6.11 Parallel Interface Frame Timing Requirements
MIN
MAX
UNIT
tp_vsw
Pulse duration – VSYNC_WE high
50% reference
points
1
lines
tp_vbp
Vertical back porch (VBP) – time from the leading
edge of VSYNC_WE to the leading edge
HSYNC_CS for the first active line (see (1))
50% reference
points
2
lines
tp_vfp
Vertical front porch (VFP) – time from the leading
edge of the HSYNC_CS following the last active line
in a frame to the leading edge of VSYNC_WE (see
(1)
)
50% reference
points
1
lines
tp_tvb
Total vertical blanking – time from the leading edge
of HSYNC_CS following the last active line of one
frame to the leading edge of HSYNC_CS for the first
active line in the next frame. (This is equal to the
sum of VBP (tp_vbp) + VFP (tp_vfp).)
50% reference
points
(1)
lines
tp_hsw
Pulse duration – HSYNC_CS high
50% reference
points
4
tp_hbp
Horizontal back porch – time from rising edge of
HSYNC_CS to rising edge of DATAEN_CMD
50% reference
points
4
PCLKs
tp_hfp
Horizontal front porch – time from falling edge of
DATAEN_CMD to rising edge of HSYNC_CS
50% reference
points
8
PCLKs
tp_thb
Total horizontal blanking – sum of horizontal front
and back porches
50% reference
points
(2)
PCLKs
(1)
(2)
See
See
128
PCLKs
The minimum total vertical blanking is defined by the following equation: tp_tvb(min) = 6 + [6 × Max(1, Source_ALPF/ DMD_ALPF)] lines
where:
(a) SOURCE_ALPF = Input source active lines per frame
(b) DMD_ALPF = Actual DMD used lines per frame supported
Total horizontal blanking is driven by the max line rate for a given source which will be a function of resolution and orientation. The
following equation can be applied for this: tp_thb = Roundup[(1000 × ƒclock)/ LR] – APPL
where:
(a) ƒclock = Pixel clock rate in MHz
(b) LR = Line rate in kHz
(c) APPL is the number of active pixels per (horizontal) line.
(d) If tp_thb is calculated to be less than tp_hbp + tp_hfp then the pixel clock rate is too low or the line rate is too high, and one or both
must be adjusted.
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1 Frame
tp_vsw
VSYNC_WE
(This diagram assumes the VSYNC
active edge is the rising edge)
tp_vbp
tp_vfp
HSYNC_CS
DATAEN_CMD
1 Line
tp_hsw
HSYNC_CS
tp_hbp
(This diagram assumes the HSYNC
active edge is the rising edge)
tp_hfp
DATAEN_CMD
PDATA(23/15:0)
P0
P1
P2
P3
P
n-2
P
n-1
Pn
PCLK
Figure 5. Parallel Interface Frame Timing
22
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6.12 Parallel Interface General Timing Requirements (1)
MIN
MAX
UNIT
1
75
MHz
6.66
1000
ƒclock
Clock frequency, PCLK
tp_clkper
Clock period, PCLK
50% reference points
tp_clkjit
Clock jitter, PCLK
Max ƒclock
tp_wh
Pulse duration low, PCLK
50% reference points
2.43
ns
tp_wl
Pulse duration high, PCLK
50% reference points
2.43
ns
tp_su
Setup time – HSYNC_CS, DATEN_CMD,
PDATA(23:0) valid before the active edge of PCLK
50% reference points
0.9
ns
tp_h
Hold time – HSYNC_CS, DATEN_CMD,
PDATA(23:0) valid after the active edge of PCLK
50% reference points
0.9
ns
tt
Transition time – all signals
20% to 80% reference
points
0.2
(1)
(2)
see
(2)
see
ns
(2)
2
ns
The active (capture) edge of PCLK for HSYNC_CS, DATEN_CMD and PDATA(23:0) is software programmable, but defaults to the
rising edge.
Clock jitter (in ns) should be calculated using this formula: Jitter = [1 / ƒclock – 5.76 ns]. Setup and hold times must be met during clock
jitter.
tp_clkper
tp_wh
tp_wl
PCLK
tp_su
tp_h
Figure 6. Parallel Interface General Timing
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6.13 Flash Interface Timing Requirements
The DLPC150 controller flash memory interface consists of a SPI flash serial interface with a programmable clock rate. The
DLPC150 controller can support 1- to 16-Mb flash memories. (see (1) (2))
MIN
MAX
UNIT
1.42
36
MHz
50% reference points
704
27.7
50% reference points
352
Pulse duration high, SPI_CLK
50% reference points
352
tt
Transition time – all signals
20% to 80% reference
points
0.2
tp_su
Setup time – SPI_DIN valid before SPI_CLK falling
edge
50% reference points
10
tp_h
Hold time – SPI_DIN valid after SPI_CLK falling edge
50% reference points
0
tp_clqv
SPI_CLK clock falling edge to output valid time –
SPI_DOUT and SPI_CSZ
50% reference points
tp_clqx
SPI_CLK clock falling edge output hold time –
SPI_DOUT and SPI_CSZ
50% reference points
ƒclock
Clock frequency, SPI_CLK
See
tp_clkper
Clock period, SPI_CLK
tp_wh
Pulse duration low, SPI_CLK
tp_wl
(1)
(2)
(3)
(3)
–3
ns
ns
ns
3
ns
ns
ns
1
ns
3
ns
Standard SPI protocol is to transmit data on the falling edge of SPI_CLK and capture data on the rising edge. The DLPC150 controller
does transmit data on the falling edge, but it also captures data on the falling edge rather than the rising edge. This provides support for
SPI devices with long clock-to-Q timing. DLPC150 controller hold capture timing has been set to facilitate reliable operation with
standard external SPI protocol devices.
With the above output timing, the DLPC150 controller provides the external SPI device 8.2-ns input set-up and 8.2-ns input hold, relative
to the rising edge of SPI_CLK.
This range include the 200 ppm of the external oscillator (but no jitter).
tclkper
SPI_CLK
(ASIC Output)
twh
twl
tp_su
tp_h
SPI_DIN
(ASIC Inputs)
tp_clqv
SPI_DOUT, SPI_CS(1:0)
(ASIC Outputs)
tp_clqx
Figure 7. Flash Interface Timing
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7 Parameter Measurement Information
7.1 Host_irq Usage Model
•
•
•
•
•
While reset is applied, HOST_IRQ will reset to tri-state (an external pullup pulls the line high).
HOST_IRQ will remain tri-state (pulled high externally) until the microprocessor boot completes. While the
signal is pulled high, this indicates that the DLPC150 controller is performing boot-up and auto-initialization.
As soon as possible after boot-up, the microprocessor will drive HOST_IRQ to a logic high state to indicate
that the DLPC150 controller is continuing to perform auto-initialization (no real state change occurs on the
external signal).
Upon completion of auto-initialization, software will set HOST_IRQ to a logic low state to indicate the
completion of auto-initialization. At the falling edge, the system is said to enter the INIT_DONE state.
After auto-initialization completes, HOST_IRQ is used to generate a logic high interrupt pulse to the host
through software control. This interrupt indicates that the DLPC150 controller has detected an error condition
or otherwise requires service.
RESETZ
500 ms max
The first falling edge of HOST_IRQ
indicates auto-initialization done.
(ERR IRQ)
HOST_IRQ
(with External
Pullup)
(INIT_BUSY)
3 µs min
0 ms min
I2C access to DLPC150 should not start until HOST_IRQ
goes low (this should occur within 500 ms from the
release of RESETZ.
An active high pulse on HOST_IRQ following the
initialization period indicates an error condition
was detected. The source of the error is reported
in the system status.
Figure 8. Host Irq Timing
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7.2 Input Source
Table 3. Supported Input Source Ranges (1) (2) (3) (4)
INTERFACE
(1)
(2)
(3)
(4)
(5)
BITS / PIXEL
(5)
SOURCE RESOLUTION RANGE
HORIZONTAL
VERTICAL
FRAME RATE RANGE
Parallel
16 or 24-bit
320 to 1280
200 to 800
47 to 63 Hz
SPI Flash
16-bit
320 to 1280
200 to 800
60 Hz
The user must stay within specifications for all source interface parameters such as max clock rate and max line rate.
The max DMD size for all rows in the table is 854 × 480.
To achieve the ranges stated, the composer-created firmware used must be defined to support the source parameters used.
These interfaces are supported with the DMD sequencer sync mode command (3Bh) set to auto.
Bits / Pixel does not necessarily equal the number of data pins used on the DLPC150 controller. Fewer pins are used if multiple clocks
are used per pixel transfer.
7.2.1 Parallel Interface Supports Two Data Transfer Formats
• 24-bit RGB888 on a 24 data wire interface
• 16-bit RGB565 on a 16 data wire interface
Pdata Bus – Parallel Interface Bit Mapping Modes shows the required PDATA(23:0) bus mapping for these two
data transfer formats.
7.2.1.1 Pdata Bus – Parallel Interface Bit Mapping Modes
23
Red / Cr
ASIC Input
Mapping
Green / Y
Blue / Cb
0
7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0
ASIC Internal Re7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0
Mapping
Red / Cr
Green / Y
Blue / Cb
Figure 9. 24-Bit Rgb-888 I/O Mapping
23
Input
ASIC Input
Mapping
Input
7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0
0
Input
7 6 5 4 3 2 1 0
ASIC Internal Re7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0
Mapping
Red / Cr
Green / Y
Blue / Cb
Figure 10. 16-Bit Rgb-565 I/O Mapping
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8 Detailed Description
8.1 Overview
In DLP-based solutions, image data is 100% digital from the DLPC150 controller input port to the image on the
DMD. The image stays in digital form and is not converted into an analog signal. The DLPC150 controller
processes the digital input image and converts the data into a format needed by the DMD. The DMD steers light
by using binary pulse-duration modulation (PWM) for each micromirror. For further details, refer to DMD data
sheet (DLPS046 for the DLP2010 and DLPS059 for the DLP2010NIR).
As shown in Functional Block Diagram, the DLPC150 controller takes input data from the Parallel or SPI
interface, optionally performs image processing, and formats the data for the DMD. The DLPC150 controller
offers a Pattern Generation Mode of operation. In Pattern Generation Mode, the DLPC150 bypasses the video
processing functions for accurate pattern display with one-to-one association with the corresponding micromirror
on the DMD. The pattern generation mode supports inputs and speeds shown in Table 4. This high speed
pattern display is well-suited for wavelength selection and control techniques used in spectroscopy, compressive
sensing, machine vision, or laser marking.
Table 4. Pattern Generation Mode Supported Inputs And Speeds
INPUT
FORMAT
MAXIMUM PATTERN RATE
SPI Flash memory
Binary pattern sequence encoded as a
16-bit RGB565 image
960 Hz
24-bit parallel input
Binary pattern sequence encoded as a
16-bit RGB565 image
1008 Hz
Binary pattern sequence encoded as a
24-bit RGB888 image
2880 Hz
8.2 Functional Block Diagram
PDATA[23:0]
PCLK
HSYNC
VSYNC
DATAEN
Parallel
Interface
DMD
Formatter
Image Processing
Sub-LVDS DATA
LPSDR CTRL
GPIO
Clocks
PLL_REFCLK
PMIC
Interface
GPIO
TRIG_IN
Trigger
Control
PMIC_LED
Control
IIC0
PMIC_SPI
HOST_IRQ
DMD
Interface
embedded
DRAM
PMIC_CMP
RESETZ
PARKZ
PROJ_ON
SPI
Interface
TRIG_OUT
SPI0_CLK
SPI0_CSZ
SPI0_DIN
SPIO_DOUT
- Image Resizing
- Degamma
- Color Coordinate Adjustment
8.3 Feature Description
8.3.1 Interface Timing Requirements
This section defines the timing requirements for the external interfaces for the DLPC150 controller.
8.3.1.1 Parallel Interface
The parallel interface complies with standard graphics interface protocol, which includes a vertical sync signal
(VSYNC_WE), horizontal sync signal (HSYNC_CS), optional data valid signal (DATAEN_CMD), a 24-bit data
bus (PDATA), and a pixel clock (PCLK). The polarity of both syncs and the active edge of the clock are
programmable. Figure 5 shows the relationship of these signals. The data valid signal (DATAEN_CMD) is
optional in that the DLPC150 provides auto-framing parameters that can be programmed to define the data valid
window based on pixel and line counting relative to the horizontal and vertical syncs.
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Feature Description (continued)
In addition to these standard signals, an optional side-band signal (PDM_CVS_TE) is available, which allows
periodic frame updates to be stopped without losing the displayed image. When PDM_CVS_TE is active, it acts
as a data mask and does not allow the source image to be propagated to the display. A programmable PDM
polarity parameter determines if it is active high or active low. This parameter defaults to make PDM_CVS_TE
active high; if this function is not desired, then it should be tied to a logic low on the PCB. PDM_CVS_TE is
restricted to change only during vertical blanking.
NOTE
VSYNC_WE must remain active at all times (in lock-to-VSYNC mode) or the display
sequencer will stop and cause the LEDs to be turned off.
8.3.2 Serial Flash Interface
DLPC150 uses an external SPI serial flash memory device for configuration support. The minimum required size
is dependent on the desired minimum number of sequences, CMT tables, and splash options while the maximum
supported is 16 Mb.
For access to flash, the DLPC150 uses a single SPI interface operating at a programmable frequency complying
to industry standard SPI flash protocol. The programmable SPI frequency is defined to be equal to 180 MHz/N,
where N is a programmable value between 5 to 127 providing a range from 36.0 to 1.41732 MHz. Note that this
results in a relatively large frequency step size in the upper range (for example, 36 MHz, 30 MHz, 25.7 MHz,
22.5 MHz, and so forth) and thus this must be taken into account when choosing a flash device.
The DLPC150 supports two independent SPI chip selects; however, the flash must be connected to SPI chip
select zero (SPI0_CSZ0) because the boot routine is only executed from the device connected to chip select
zero (SPI0_CSZ0). The boot routine uploads program code from flash to program memory, then transfers control
to an auto-initialization routine within program memory. The DLPC150 asserts the HOST_IRQ output signal high
while auto-initialization is in progress, then drives it low to signal its completion to the host processor. Only after
auto-initialization is complete will the DLPC150 be ready to receive commands through I2C.
The DLPC150 should support any flash device that is compatible with the modes of operation, features, and
performance as defined in Table 5 and Table 6.
Table 5. SPI Flash Required Features or Modes of Operation
FEATURE
DLPC150 REQUIREMENT
SPI interface width
Single
SPI protocol
SPI mode 0
Fast READ addressing
Auto-incrementing
Programming mode
Page mode
Page size
256 B
Sector size
4 KB sector
Block size
any
Block protection bits
0 = Disabled
Status register bit(0)
Write in progress (WIP) {also called flash busy}
Status register bit(1)
Write enable latch (WEN)
Status register bits(6:2)
A value of 0 disables programming protection
Status register bit(7)
Status register write protect (SRWP)
Status register bits(15:8)
(that is expansion status byte)
The DLPC150 only supports single-byte status register R/W command execution, and thus may not be
compatible with flash devices that contain an expansion status byte. However, as long as expansion status
byte is considered optional in the byte 3 position and any write protection control in this expansion status
byte defaults to unprotected, then the device should be compatible with DLPC150.
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To support flash devices with program protection defaults of either enabled or disabled, the DLPC150 always
assumes the device default is enabled and goes through the process of disabling protection as part of the bootup process. This process consists of:
• A write enable (WREN) instruction executed to request write enable, followed by
• A read status register (RDSR) instruction is then executed (repeatedly as needed) to poll the write enable
latch (WEL) bit
• After the write enable latch (WEL) bit is set, a write status register (WRSR) instruction is executed that writes
0 to all 8-bits (this disables all programming protection)
Prior to each program or erase instruction, the DLPC150 issues:
• A write enable (WREN) instruction to request write enable, followed by
• A read status register (RDSR) instruction (repeated as needed) to poll the write enable latch (WEL) bit
• After the write enable latch (WEL) bit is set, the program or erase instruction is executed
• Note the flash automatically clears the write enable status after each program and erase instruction
The specific instruction OpCode and timing compatibility requirements are listed in Table 8 and Table 7. Note
however that DLPC150 does not read the flash’s electronic signature ID and thus cannot automatically adapt
protocol and clock rate based on the ID.
Table 6. SPI Flash Instruction Opcode and Access Profile Compatibility Requirements
(1)
(2)
SPI FLASH COMMAND
FIRST BYTE
(OPCODE)
SECOND
BYTE
THIRD BYTE
FOURTH BYTE
FIFTH BYTE
SIXTH BYTE
Fast READ (1 Output)
0x0B
ADDRS(0)
ADDRS(1)
ADDRS(2)
dummy
DATA(0) (1)
Read status
0x05
n/a
n/a
STATUS(0)
Write status
0x01
STATUS(0)
Write enable
0x06
Page program
0x02
ADDRS(0)
ADDRS(1)
ADDRS(2)
Sector erase (4KB)
0x20
ADDRS(0)
ADDRS(1)
ADDRS(2)
Chip erase
0xC7
(2)
DATA(0) (1)
Only the first data byte is show, data continues for the duration of the read.
DLPC150 does not support access to a second/ expansion Write Status byte.
The specific and timing compatibility requirements for a DLPC150 compatible flash are listed in Table 7 and
Table 8.
Table 7. SPI Flash Key Timing Parameter Compatibility Requirements (1) (2)
SPI FLASH TIMING PARAMETER
SYMBOL
ALTERNATE
SYMBOL
FR
fC
≤1.42
MHz
Chip select high time (also called chip select deselect
time)
tSHSL
tCSH
≤200
ns
Output hold time
tCLQX
tHO
≥0
ns
Access frequency
(all commands)
MIN
MAX
≤ 11
UNIT
Clock low to output valid time
tCLQV
tV
Data in set-up time
tDVCH
tDSU
≤5
ns
Data in hold time
tCHDX
tDH
≤5
ns
(1)
(2)
ns
The timing values are related to the specification of the flash device itself, not the DLPC150.
The DLPC150 does not drive the HOLD or WP (active low write protect) pins on the flash device, and thus these pins should be tied to a
logic high on the PCB through an external pullup.
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The DLPC150 supports 1.8-, 2.5-, or 3.3-V serial flash devices. To do so, VCC_FLSH must be supplied with the
corresponding voltage. Table 8 contains a list of 1.8-, 2.5-, and 3.3-V compatible SPI serial flash devices
supported by DLPC150.
Table 8. DLPC150 Verified Compatible SPI Flash Device Options (1)
DENSITY (M-BITS)
VENDOR
PART NUMBER
(2)
PACKAGE SIZE
1.8-V Compatible Devices
4 Mb
Winbond
W25Q40BWUXIG
2 × 3 mm USON
4 Mb
Macronix
MX25U4033EBAI-12G
1.43 × 1.94 mm WLCSP
4 Mb
Macronix
MX25U4033EBAI-12G
1.68 × 1.99 mm WLCSP
16 Mb
Winbond
W25Q16CLZPIG
5 × 6 mm WSON
64 Mb
Winbond
W25Q64FVZPIG
5 × 6 mm WSON
2.5- or 3.3-V Compatible Devices
8.3.3 Serial Flash Programming
Note that the flash can be programmed through the DLPC150 over I2C or by driving the SPI pins of the flash
directly while the DLPC150 I/O are tri-stated. SPI0_CLK, SPI0_DOUT, and SPI0_CSZ0 I/O can be tri-stated by
holding RESETZ in a logic low state while power is applied to the DLPC150. Note that SPI0_CSZ1 is not tristated by this same action.
8.3.4
I2C Control Interface
DLPC150 supports I2C commands through the control interface. The control interface allows another master
processor to send commands to the DLPC150 chipset to query system status or perform realtime operations.
The DLPC150 I2C interface ports support 100-kHz baud rate at the 7-bit address 0x1B. By definition, I2C
transactions operate at the speed of the slowest device on the bus, thus there is no requirement to match the
speed grade of all devices in the system.
8.3.5 DMD (Sub-LVDS) Interface
The DLPC150 controller DMD interface consists of a high speed 1.8-V sub-LVDS output only interface with a
maximum clock speed of 532-MHz DDR and a low speed SDR (1.8-V LVCMOS) interface with a fixed clock
speed of 120 MHz. The DLPC150 sub-LVDS interface supports a number of DMD display sizes, and as a
function of resolution, not all output data lanes are needed as DMD display resolutions decrease in size. With
internal software selection, the DLPC150 also supports a limited number of DMD interface swap configurations
that can help board layout by remapping specific combinations of DMD interface lines to other DMD interface
lines as needed. Table 9 shows the four options available for the DLP2010 or DLP2010NIR (0.2-inch WVGA)
DMD. Any unused DMD signal pairs should be left unconnected on the final board design.
Table 9. DLP2010 or DLP2010NIR (0.2-Inch WVGA) DMD – Controller to 4-Lane DMD Pin Mapping
Options
DLPC150 CONTROLLER 4 LANE DMD ROUTING OPTIONS
OPTION 1
SWAP CONTROL = x0
OPTION 2
SWAP CONTROl = x2
OPTION 3
SWAP CONTROL = x1
OPTION 4
SWAP CONTROL = x3
DMD PINS
HS_WDATA_D_P
HS_WDATA_D_N
HS_WDATA_E_P
HS_WDATA_E_N
HS_WDATA_H_P
HS_WDATA_H_N
HS_WDATA_A_P
HS_WDATA_A_N
Input DATA_p_0
Input DATA_n_0
HS_WDATA_C_P
HS_WDATA_C_N
HS_WDATA_F_P
HS_WDATA_F_N
HS_WDATA_G_P
HS_WDATA_G_N
HS_WDATA_B_P
HS_WDATA_B_N
Input DATA_p_1
Input DATA_n_1
HS_WDATA_F_P
HS_WDATA_F_N
HS_WDATA_C_P
HS_WDATA_C_N
HS_WDATA_B_P
HS_WDATA_B_N
HS_WDATA_G_P
HS_WDATA_G_N
Input DATA_p_2
Input DATA_n_2
HS_WDATA_E_P
HS_WDATA_E_N
HS_WDATA_D_P
HS_WDATA_D_N
HS_WDATA_A_P
HS_WDATA_A_N
HS_WDATA_H_P
HS_WDATA_H_N
Input DATA_p_3
Input DATA_n_3
(1)
(2)
30
The flash supply voltage must match VCC_FLSH on the DLPC150. Special attention needs to be paid when ordering devices to be sure
the desired supply voltage is attained as multiple voltage options are often available under the same base part number.
Beware when considering Numonyx (Micron) serial flash devices as they typically do not have the 4KB sector size needed to be
DLPC150 compatible.
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532-MHz sub-LVDS DDR (High Speed)
DMD_HS_WDATA_A_N
DMD_HS_WDATA_A_P
DMD_HS_WDATA_B_N
DMD_HS_WDATA_B_P
Leave Open for .2
WVGA DMD
Leave Open for .2
WVGA DMD
Sub-LVDS-DMD
DMD_HS_WDATA_C_N
DMD_HS_WDATA_C_P
DLP2010NIR
or
DLP2010
0.2 WVGA
854 x 480 display
DMD_HS_WDATA_D_N
DMD_HS_WDATA_D_P
DLPC150
Controller
DMD_HS_CLK_N
DMD_HS_CLK_P
DMD_HS_WDATA_E_N
DMD_HS_WDATA_E_P
DMD_HS_WDATA_F_N
DMD_HS_WDATA_F_P
DMD_HS_WDATA_G_N
DMD_HS_WDATA_G_P
DMD_HS_WDATA_H_N
DMD_HS_WDATA_H_P
Leave Open for .2
WVGA DMD
Leave Open for .2
WVGA DMD
DMD_LS_CLK
DMD_LS_WDATA
DMD_DEN_ARSTZ
DMD_LS_RDATA
120-MHz SDR (Low Speed)
Figure 11. DLP2010 Or DLP2010NIR (0.2-Inch WVGA) DMD Interface Example (Mapping Option 1 Shown)
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8.3.6 Calibration And Debug Support
The DLPC150 contains a test point output port, TSTPT_(7:0), which provides selected system calibration support
as well as controller debug support. These test points are inputs while reset is applied and switch to outputs
when reset is released. The state of these signals is sampled upon the release of system reset and the captured
value configures the test mode until the next time reset is applied. Each test point includes an internal pulldown
resistor, thus external pullups must be used to modify the default test configuration. The default configuration
(x000) corresponds to the TSTPT_(7:0) outputs remaining tri-stated to reduce switching activity during normal
operation. For maximum flexibility, an option to jumper to an external pullup is recommended for TSTPT_(2:0).
Pullups on TSTPT_(6:3) are used to configure the controller for a specific mode or option. TI does not
recommend adding pullups to TSTPT_(7:3) because this has adverse affects for normal operation. This external
pullup is only sampled upon a 0-to-1 transition on the RESETZ input, thus changing their configuration after reset
is released will not have any effect until the next time reset is asserted and released. Table 10 defines the test
mode selection for one programmable scenario defined by TSTPT(2:0).
Table 10. Test Mode Selection Scenario Defined By Tstpt(2:0) (1)
TSTPT(2:0) CAPTURE VALUE
(1)
NO SWITCHING ACTIVITY
CLOCK DEBUG OUTPUT
x000
x010
TSTPT(0)
HI-Z
60 MHz
TSTPT(1)
HI-Z
30 MHz
TSTPT(2)
HI-Z
0.7 to 22.5MHz
TSTPT(3)
HI-Z
HIGH
TSTPT(4)
HI-Z
LOW
TSTPT(5)
HI-Z
HIGH
TSTPT(6)
HI-Z
HIGH
TSTPT(7)
HI-Z
7.5 MHz
These are only the default output selections. Software can reprogram the selection at any time.
8.3.7 DMD Interface Considerations
The sub-LVDS HS interface waveform quality and timing on the DLPC150 controller is dependent on the total
length of the interconnect system, the spacing between traces, the characteristic impedance, etch losses, and
how well matched the lengths are across the interface. Thus, ensuring positive timing margin requires attention
to many factors.
As an example, DMD interface system timing margin can be calculated as follows:
Setup Margin = (DLPC150 output setup) – (DMD input setup) – (PCB routing mismatch) – (PCB SI degradation)
Hold-time Margin = (DLPC150 output hold) – (DMD input hold) – (PCB routing mismatch) – (PCB SI degradation)
(1)
where PCB SI degradation is signal integrity degradation due to PCB affects which includes such things as
Simultaneously Switching Output (SSO) noise, cross-talk and Inter-symbol Interference (ISI) noise.
(2)
DLPC150 I/O timing parameters as well as DMD I/O timing parameters can be found in their corresponding data
sheets. Similarly, PCB routing mismatch can be budgeted and met through controlled PCB routing. However,
PCB SI degradation is a more complicated adjustment.
In an attempt to minimize the signal integrity analysis that would otherwise be required, the following PCB design
guidelines are provided as a reference of an interconnect system that will satisfy both waveform quality and
timing requirements (accounting for both PCB routing mismatch and PCB SI degradation). Variation from these
recommendations may also work, but should be confirmed with PCB signal integrity analysis or lab
measurements.
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DMD_HS Differential Signals
DMD_LS Signals
Figure 12. DMD Interface Board Stack-Up Details
8.4 Device Functional Modes
DLPC150 has two functional modes (ON/OFF) controlled by a single pin PROJ_ON:
• When pin PROJ_ON is set high, the DLPA2000 or DLPA2005 applies power to the DMD and the DLPC150.
• When pin PROJ_ON is set low, the DLPA2000 or DLPA2005 powers down and only microwatts of power are
consumed.
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9 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information
The DLPC150 controller couples with DLP2010 or DLP2010NIR DMD to provide a reliable solution for many data
and video display applications. The DMDs are spatial light modulators which reflect incoming light from an
illumination source to one of two positions, with the primary position being into a projection or collection optic.
Each specific application typically requires a system-level optical architecture that integrates the DMD, as well
as, a particular data format to the DLPC150. For example, in a spectroscopy application, the DLP2010NIR DMD
is often combined with a single element detector to replace expensive InGaAs array-based detector designs. In
this application, the DMD acts as a wavelength selector diverting specific wavelengths of light through the
collection optics into the single point detector by setting specific columns of pixel in the "on" position. All other
DMD columns that are "off" divert the unselected wavelengths away from the detector's optical path so as to not
interfere with the selected wavelength measurement. The DLPC150 controls the set of patterns that sequentially
turns columns of pixels "on" or "off" to scan the desired wavelenght spectrum.
Other applications of interest include machine vision systems, spectrometers, skin analysis, medical systems,
material identification, chemical sensing, infrared projection, and compressive sensing.
9.1.1 DLPC150 System Design Consideration – Application Notes
System power regulation: It is acceptable for VDD_PLLD and VDD_PLLM to be derived from the same regulator
as the core VDD, but to minimize the AC noise component they should be filtered as recommended in the PCB
Layout Guidelines For Internal Controller PLL Power.
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9.2 Typical Application
Power
Management
On/Off
BAT
–
Charger
DC_IN
+
A typical embedded system application using the DLPC150 controller and the DLPC2010NIR is shown in
Figure 13. In this configuration, the DLPC150 controller supports a 24-bit parallel RGB input, typical of LCD
interfaces, from an external source or processor. The DLPC150 controller processes the digital input image and
converts the data into the format needed by the DLP2010NIR. The DLP2010NIR steers light by setting specific
micromirrors to the "on" position, directing light to the detector, while unwanted micromirrors are set to "off"
position, directing light away from the detector. The microprocessor sends binary images to the DLP2010NIR to
steer specific wavelengths of light into the detector. The microprocessor uses an analog-to-digital converter to
sample the signal received by the detector into a digital value. By sequentially selecting different wavelengths of
light and capturing the values at the detector, the microprocessor can then plot a spectral response to the light.
2.3 to 5.5 V
1.8 V
Other
Supplies
VIN
SYSPWR
VDD
1.1 V
1.1-V
Reg
1.8 V
1.8S V
LS_IN
PROJ_ON
PROJ_ON
USB
DLPA2000
or
DLPA2005
PROJ_ON
Detector
ADC
FLASH
FLASH,
SDRAM
4
SPI_0
SPI_1
4
PARKZ
RESETZ
INTZ
Microprocessor
HOST_IRQ
Thermistor
I2C
1.8S V
Bluetooth
Illumination
Optics
CMP_OUT
Parallel RGB I/F (28)
SD
Card
Current
Sense
CMP_PWM
DLPC150
TRIG_OUT (2)
RED
BIAS, RST, OFS
3
LED_SEL(2)
TRIG_IN
Keypad
VLED
Sub-LVDS DATA
LPSDR CTRL
VIO
DLP2010NIR
WVGA
(WVGA
DDR
DMD
DMD)
VCC_INTF
VCC_FLSH
1.1 V
Projection
Optics
VCORE
ADC + Amplifier
NIR
Detector
DLP® Chip Set
Figure 13. Typical Application Diagram
9.2.1 Design Requirements
All applications using the DLP 0.2-inch WVGA chipset require the:
• DLPC150 controller, and
• DLPA2000 or DLPA2005 PMIC, and
• DLP2010 or DLP2010NIR DMD
components for operation. The system also requires an external parallel flash memory device loaded with the
DLPC150 configuration and support firmware. DLPC150 does the digital image processing and formats the data
for the DMD. DLPA2000 or DLPA2005 PMIC provides the needed analog functions for the DLPC150 and
DLP2010 or DLP2010NIR. The chipset has several system interfaces and requires some support circuitry. The
following interfaces and support circuitry are required:
•
DLPC150 system interfaces:
– Control interface
– Trigger interface
– Input data interface
– Illumination interface
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Typical Application (continued)
•
•
DLPC150 support circuitry and interfaces:
– Reference clock
– PLL
– Program memory flash interface
DMD interfaces:
– DLPC150 to DMD digital data
– DLPC150 to DMD control interface
– DLPC150 to DMD micromirror reset control interface
9.2.2 Detailed Design Procedure
9.2.2.1 DLPC150 System Interfaces
The 0.2-inch WVGA chipset supports a16-bit or 24-bit parallel RGB interface for image data transfers from
another device. There are two primary output interfaces: illumination driver control interface and sync outputs.
9.2.2.1.1 Control Interface
The 0.2-inch WVGA chipset supports I2C commands through the control interface. The control interface allows
another master processor to send commands to the DLPC150 controller to query system status or perform
realtime operations such as LED driver current settings.
9.2.3 Application Curve
In a reflective spectroscopy application, a broadband light source illuminates a sample and the reflected light
spectrum is dispersed onto the DLP2010NIR. A microprocessor in conjunction with the DLPC150 controls
individual DLP2010NIR micromirrors to reflect specific wavelengths of light to a single point detector. The
microprocessor uses an analog-to-digital converter to sample the signal received by the detector into a digital
value. By sequentially selecting different wavelengths of light and capturing the values at the detector, the
microprocessor can then plot a spectral response to the light. This systems allows the measurement of the
collected light and derive the wavelengths absorbed by the sample. This process leads to the absorption
spectrum shown in Figure 14.
Figure 14. Sample DLPC150-Based Spectrometer Output
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10 Power Supply Recommendations
10.1 System Power-Up and Power-Down Sequence
Although the DLPC150 requires an array of power supply voltages, (for example, VDD, VDDLP12,
VDD_PLLM/D, VCC18, VCC_FLSH, VCC_INTF), if VDDLP12 is tied to the 1.1-V VDD supply (which is assumed
to be the typical configuration), then there are no restrictions regarding the relative order of power supply
sequencing to avoid damaging the DLPC150. This is true for both power-up and power-down scenarios.
Similarly, there is no minimum time between powering-up or powering-down the different supplies if VDDLP12 is
tied to the 1.1-V VDD supply.
If however VDDLP12 is not tied to the VDD supply, then VDDLP12 must be powered-on after the VDD supply is
powered-on, and powered-off before the VDD supply is powered-off. In addition, if VDDLP12 is not tied to VDD,
then VDDLP12 and VDD supplies must be powered on or powered off within 100 ms of each other.
Although there is no risk of damaging the DLPC150 if the above power sequencing rules are followed, the
following additional power sequencing recommendations must be considered to ensure proper system operation.
• To ensure that DLPC150 output signal states behave as expected, all DLPC150 I/O supplies must remain
applied while VDD core power is applied. If VDD core power is removed while the I/O supply (VCC_INTF) is
applied, then the output signal state associated with the inactive I/O supply will go to a high impedance state.
• Additional power sequencing rules may exist for devices that share the supplies with the DLPC150, and thus
these devices may force additional system power sequencing requirements.
Note that when VDD core power is applied, but I/O power is not applied, additional leakage current may be
drawn. This added leakage does not affect normal DLPC150 operation or reliability.
Figure 15 and Figure 16 show the DLPC150 power-up and power-down sequence for both the normal PARK and
fast PARK operations of the DLPC150 controller.
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System Power-Up and Power-Down Sequence (continued)
Figure 15. DLPC150 Power-Up / Proj_on = 0 Initiated Normal Park and Power-Down
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System Power-Up and Power-Down Sequence (continued)
Normal
Operation
Power-up
Power-down
PROJ_ON
VCC_INTF (1.8 to 3.3 V)
VCC_FLSH (1.8 to 3.3 V)
VDD (1.1 V)
VDD_PLLM/D (1.1 V)
Point at which all supplies reach 95% of
their specified nominal values.
VDDLP12 (if not tied to VDD)
0 µs
Min
PARKZ must be set high a minimum
VCC18 (1.8 V)
of 0 µs before RESETZ is released to
support auto-initialization.
VCC18 must remain ON long
enough to satisfy DMD power
sequencing requirements defined
in the DLPA200x specification.
0 µs
Max
PARKZ
32 µs Min
PLL_REFCLK
power is removed (except
before power is applied.
VDDLP12), before PLL_REFCLK
is stopped and before RESETZ is
0 µs Min
RESETZ
PARKZ must be set low a
minimum of 32 µs before any
PLL_REFCLK may be active
asserted low to allow time for the
DMD mirrors to be parked.
500 ms Min
5 ms Min
I2C activity should cease
immediately upon active low
assertion of PARKZ.
I2C (activity)
0 µs Min
0 µs
Min
HOST_IRQ
HOST_IRQ is driven high when
PLL_REFCLK must become stable within
power and RESETZ are applied to
5 ms of all power being applied (for
I2C access can start immediately
indicate the DLPC150 is not ready for
external oscillator application this is
after HOST_IRQ goes low (this
operation, and then is driven low after
oscillator dependent and for crystal
should occur within 500 ms from the
initialization is complete.
applications this is crystal and DLPC150
release of RESETZ)
HOST_IRQ is pulled high
immediately after RESETZ is
asserted low.
oscillator cell dependent).
Figure 16. DLPC150 Power-Up / PARKZ = 0 Initiated Fast Park and Power-Down
10.2 DLPC150 Power-Up Initialization Sequence
It is assumed that an external power monitor will hold the DLPC150 in system reset during power-up. It must do
this by driving RESETZ to a logic low state. It should continue to assert system reset until all controller voltages
have reached minimum specified voltage levels, PARKZ is asserted high, and input clocks are stable. During this
time, most controller outputs will be driven to an inactive state and all bidirectional signals will be configured as
inputs to avoid contention. controller outputs that are not driven to an inactive state are tri-stated. These include
LED_SEL_0, LED_SEL_1, SPICLK, SPIDOUT, and SPICSZ0 (see RESETZ pin description for full signal
descriptions in Pin Configuration and Functions). After power is stable and the PLL_REFCLK_I clock input to the
DLPC150 is stable, then RESETZ should be deactivated (set to a logic high). The DLPC150 then performs a
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DLPC150 Power-Up Initialization Sequence (continued)
power-up initialization routine that first locks its PLL followed by loading self configuration data from the external
flash. Upon release of RESETZ all DLPC150 I/Os will become active. Immediately following the release of
RESETZ, the HOST_IRQ signal will be driven high to indicate that the auto initialization routine is in progress.
However, since a pullup resistor is connected to signal HOST_IRQ, this signal will have already gone high before
the DLPC150 actively drives it high. Upon completion of the auto-initialization routine, the DLPC150 will drive
HOST_IRQ low to indicate the initialization done state of the DLPC150 has been reached.
Note that the host processor can start sending I2C commands after HOST_IRQ goes low.
10.3 DMD Fast Park Control (PARKZ)
The PARKZ signal is defined to be an early warning signal that should alert the controller 40 µs before DC
supply voltages have dropped below specifications in fast PARK operation. This allows the controller time to park
the DMD, ensuring the integrity of future operation. Note that the reference clock should continue to run and
RESETZ should remain deactivated for at least 40 µs after PARKZ has been deactivated (set to a logic low) to
allow the park operation to complete.
10.4 Hot Plug Usage
The DLPC150 provides fail-safe I/O on all host interface signals (signals powered by VCC_INTF). This allows
these inputs to be driven high even when no I/O power is applied. Under this condition, the DLPC150 will not
load the input signal nor draw excessive current that could degrade controller reliability. For example, the I2C bus
from the host to other components would not be affected by powering off VCC_INTF to the DLPC150. TI
recommends weak pullups or pulldowns on signals feeding back to the host to avoid floating inputs.
If the I/O supply (VCC_INTF) is powered off, but the core supply (VDD) is powered on, then the corresponding
input buffer may experience added leakage current, but this does not damage the DLPC150.
10.5 Maximum Signal Transition Time
Unless otherwise noted, 10 ns is the maximum recommended 20 to 80% rise or fall time to avoid input buffer
oscillation. This applies to all DLPC150 input signals. However, the PARKZ input signal includes an additional
small digital filter that ignores any input buffer transitions caused by a slower rise or fall time for up to 150 ns.
40
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11 Layout
11.1 Layout Guidelines
11.1.1 PCB Layout Guidelines For Internal Controller PLL Power
The following guidelines are recommended to achieve desired controller performance relative to the internal PLL.
The DLPC150 contains 2 internal PLLs which have dedicated analog supplies (VDD_PLLM , VSS_PLLM,
VDD_PLLD, VSS_PLLD). As a minimum, VDD_PLLx power and VSS_PLLx ground pins should be isolated using
a simple passive filter consisting of two series Ferrites and two shunt capacitors (to widen the spectrum of noise
absorption). It’s recommended that one capacitor be a 0.1µF capacitor and the other be a 0.01µF capacitor. All
four components should be placed as close to the controller as possible but it’s especially important to keep the
leads of the high frequency capacitors as short as possible. Note that both capacitors should be connected
across VDD_PLLM and VSS_PLLM / VDD_PLLD and VSS_PLLD respectfully on the controller side of the
Ferrites.
For the ferrite beads used, their respective characteristics should be as follows:
• DC resistance less than 0.40 Ω
• Impedance at 10 MHz equal to or greater than 180 Ω
• Impedance at 100 MHz equal to or greater than 600 Ω
The PCB layout is critical to PLL performance. It is vital that the quiet ground and power are treated like analog
signals. Therefore, VDD_PLLM and VDD_PLLD must be a single trace from the DLPC150 to both capacitors and
then through the series ferrites to the power source. The power and ground traces should be as short as
possible, parallel to each other, and as close as possible to each other.
Signal VIA
PCB Pad
VIA to Common Analog
Digital Board Power Plane
ASIC Pad
1
VIA to Common Analog
Digital Board Ground Plane
2
3
4
5
A
Local
Decoupling
for the PLL
Digital Supply
F
Signal
Signal
Signal
VSS
G
Signal
Signal
VSS_
PLLM
VSS
GND
FB
VDD_
PLLM
J
PLL_
REF
CLK_O
VDD_
PLLD
VSS_
PLLD
VSS
0.01uF
PLL_
REF
CLK_I
0.1uF
H
1.1 V
PWR
FB
Crystal Circuit
VSS
VDD
VDD
Figure 17. PLL Filter Layout
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Layout Guidelines (continued)
11.1.2 DLPC150 Reference Clock
The DLPC150 requires an external reference clock to feed its internal PLL. A crystal or oscillator can supply this
reference. For flexibility, the DLPC150 accepts either of two reference clock frequencies (see Table 12), but both
must have a maximum frequency variation of ±200 ppm (including aging, temperature, and trim component
variation). When a crystal is used, several discrete components are also required as shown in Figure 18.
PLL_REFCLK_I
PLL_REFCLK_O
RFB
RS
Crystal
C
L1
C
L2
A.
CL = Crystal load capacitance (farads)
B.
CL1 = 2 × (CL – Cstray_pll_refclk_i)
C.
CL2 = 2 × (CL – Cstray_pll_refclk_o)
D.
Where: Cstray_pll_refclk_i = Sum of package and PCB stray capacitance at the crystal pin associated with the
controller pin pll_refclk_i. Cstray_pll_refclk_o = Sum of package and PCB stray capacitance at the crystal pin
associated with the controller pin pll_refclk_o.
Figure 18. Recommended Crystal Oscillator Configuration
11.1.2.1 Recommended Crystal Oscillator Configuration
Table 11. Crystal Port Characteristics
PARAMETER
NOMINAL
UNIT
PLL_REFCLK_I TO GND capacitance
1.5
pF
PLL_REFCLK_O TO GND capacitance
1.5
pF
Table 12. Recommended Crystal Configuration (1) (2)
PARAMETER
RECOMMENDED
Crystal circuit configuration
Parallel resonant
Crystal type
Fundamental (first harmonic)
Crystal nominal frequency
24 or 16
Crystal frequency tolerance (including accuracy, temperature, aging and trim sensitivity) ±200
UNIT
MHz
PPM
Maximum startup time
1.0
ms
Crystal equivalent series resistance (ESR)
120 max
Ω
Crystal load
6
pF
RS drive resistor (nominal)
100
Ω
RFB feedback resistor (nominal)
1Meg
Ω
CL1 external crystal load capacitor
See equation in Figure 18 notes
pF
CL2 external crystal load capacitor
See equation in Figure 18 notes
pF
PCB layout
A ground isolation ring around the
crystal is recommended
(1)
(2)
42
Temperature range of –30°C to +85°C.
The crystal bias is determined by the controller's VCC_INTF voltage rail, which is variable (not the VCC18 rail).
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If an external oscillator is used, then the oscillator output must drive the PLL_REFCLK_I pin on the DLPC150
DLPC150 controller and the PLL_REFCLK_O pins should be left unconnected.
Table 13. DLPC150 Recommended Crystal Parts (1) (2)
MANUFACTURE
R
PART NUMBER
SPEED
TEMPERATURE
AND AGING
ESR
LOAD CAPACITANCE
KDS
DSX211G-24.000M-8pF-50-50
24 MHz
±50 ppm
120-Ω max
8 pF
(1)
(2)
Crystal package sizes: 2.0 × 1.6 mm for both crystals.
Operating temperature range: –30°C to +85°C for all crystals.
11.1.3 General PCB Recommendations
TI recommends 1-oz. copper planes in the PCB design to achieve needed thermal connectivity.
11.1.4 General Handling Guidelines for Unused CMOS-Type Pins
To avoid potentially damaging current caused by floating CMOS input-only pins, TI recommends that unused
DLPC150 controller input pins be tied through a pullup resistor to its associated power supply or a pulldown to
ground. For DLPC150 controller inputs with an internal pullup or pulldown resistors, it is unnecessary to add an
external pullup or pulldown unless specifically recommended. Note that internal pullup and pulldown resistors are
weak and should not be expected to drive the external line. The DLPC150 implements very few internal resistors
and these are noted in the pin list. When external pullup or pulldown resistors are needed for pins that have builtin weak pullups or pulldowns, use the value 8 kΩ (max).
Unused output-only pins should never be tied directly to power or ground, but can be left open.
When possible, TI recommends that unused bidirectional I/O pins be configured to their output state such that
the pin can be left open. If this control is not available and the pins may become an input, then they should be
pulled-up (or pulled-down) using an appropriate, dedicated resistor.
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11.1.5 Maximum Pin-to-Pin, PCB Interconnects Etch Lengths
Table 14. Max Pin-to-Pin PCB Interconnect Recommendations (1) (2)
SIGNAL INTERCONNECT TOPOLOGY
DMD BUS SIGNAL
SINGLE BOARD SIGNAL ROUTING
LENGTH
DMD_HS_CLK_P
DMD_HS_CLK_N
MULTI-BOARD SIGNAL ROUTING
LENGTH
UNIT
6.0
152.4
See
(3)
inch
(mm)
6.0
152.4
See
(3)
inch
(mm)
DMD_LS_CLK
6.5
165.1
See
(3)
inch
(mm)
DMD_LS_WDATA
6.5
165.1
See
(3)
inch
(mm)
DMD_LS_RDATA
6.5
165.1
See
(3)
inch
(mm)
DMD_DEN_ARSTZ
7.0
177.8
See
(3)
inch
(mm)
DMD_HS_WDATA_A_P
DMD_HS_WDATA_A_N
DMD_HS_WDATA_B_P
DMD_HS_WDATA_B_N
DMD_HS_WDATA_C_P
DMD_HS_WDATA_C_N
DMD_HS_WDATA_D_P
DMD_HS_WDATA_D_N
DMD_HS_WDATA_E_P
DMD_HS_WDATA_E_N
DMD_HS_WDATA_F_P
DMD_HS_WDATA_F_N
DMD_HS_WDATA_G_P
DMD_HS_WDATA_G_N
DMD_HS_WDATA_H_P
DMD_HS_WDATA_H_N
(1)
(2)
(3)
44
Max signal routing length includes escape routing.
Multi-board DMD routing length is more restricted due to the impact of the connector.
Due to board variations, these are impossible to define. Any board designs should SPICE simulate with the DLPC150 controller IBIS
models to ensure single routing lengths do not exceed requirements.
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Table 15. High Speed PCB Signal Routing Matching Requirements (1) (2) (3) (4)
SIGNAL GROUP LENGTH MATCHING
INTERFACE
SIGNAL GROUP
REFERENCE SIGNAL
MAX MISMATCH (5)
UNIT
DMD_HS_CLK_P
DMD_HS_CLK_N
±0.1
(±25.4)
inch
(mm)
DMD_HS_WDATA_A_P
DMD_HS_WDATA_A_N
DMD_HS_WDATA_B_P
DMD_HS_WDATA_B_N
DMD_HS_WDATA_C_P
DMD_HS_WDATA_C_N
DMD
DMD_HS_WDATA_D_P
DMD_HS_WDATA_D_N
DMD_HS_WDATA_E_P
DMD_HS_WDATA_E_N
DMD_HS_WDATA_F_P
DMD_HS_WDATA_F_N
DMD_HS_WDATA_G_P
DMD_HS_WDATA_G_N
DMD_HS_WDATA_H_P
DMD_HS_WDATA_H_N
(1)
(2)
(3)
(4)
(5)
DMD
DMD_LS_WDATA
DMD_LS_RDATA
DMD_LS_CLK
±0.2
(±5.08)
inch
(mm)
DMD
DMD_DEN_ARSTZ
N/A
N/A
inch
(mm)
These values apply to PCB routing only. They do not include any internal package routing mismatch associated with the DLPC150, the
DMD.
DMD HS data lines are differential, thus these specifications are pair-to-pair.
Training is applied to DMD HS data lines, so defined matching requirements are slightly relaxed.
DMD LS signals are single ended.
Mismatch variance applies to high-speed data pairs. For all high-speed data pairs, the maximum mismatch between pairs should be 1
mm or less.
11.1.6 Number of Layer Changes
• Single-ended signals: Minimize the number of layer changes.
• Differential signals: Individual differential pairs can be routed on different layers, but the signals of a given pair
should not change layers.
11.1.7 Stubs
• Stubs should be avoided.
11.1.8 Terminations
• No external termination resistors are required on DMD_HS differential signals.
• The DMD_LS_CLK and DMD_LS_WDATA signal paths should include a 43-Ω series termination resistor
located as close as possible to the corresponding DLPC150 controller pins.
• The DMD_LS_RDATA signal path should include a 43-Ω series termination resistor located as close as
possible to the corresponding DMD pin.
• DMD_DEN_ARSTZ does not require a series resistor.
11.1.9 Routing Vias
• The number of vias on DMD_HS signals should be minimized and should not exceed two.
• Any and all vias on DMD_HS signals should be located as close to the DLPC150 controller as possible.
• The number of vias on the DMD_LS_CLK and DMD_LS_WDATA signals should be minimized and not
exceed two.
• Any and all vias on the DMD_LS_CLK and DMD_LS_WDATA signals should be located as close to the
DLPC150 controller as possible.
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11.2 Layout Example
Figure 19. Board Layout Example
11.3 Thermal Considerations
The underlying thermal limitation for the DLPC150 is that the maximum operating junction temperature (TJ) not
be exceeded (this is defined in the Recommended Operating Conditions). This temperature is dependent on
operating ambient temperature, airflow, PCB design (including the component layout density and the amount of
copper used), power dissipation of the DLPC150, and power dissipation of surrounding components. The
DLPC150’s package is designed primarily to extract heat through the power and ground planes of the PCB.
Thus, copper content and airflow over the PCB are important factors.
The recommended maximum operating ambient temperature (TA) is provided primarily as a design target and is
based on maximum DLPC150 power dissipation and RθJA at 0 m/s of forced airflow, where RθJA is the thermal
resistance of the package as measured using a glater test PCB with two, 1-oz power planes. This JEDEC test
PCB is not necessarily representative of the DLPC150 PCB; the reported thermal resistance may not be
accurate in the actual product application. Although the actual thermal resistance may be different, it is the best
information available during the design phase to estimate thermal performance. However, after the PCB is
designed and the product is built, TI highly recommends that thermal performance be measured and validated.
To do this, measure the top center case temperature under the worse case product scenario (max power
dissipation, max voltage, max ambient temperature) and validated not to exceed the maximum recommended
case temperature (TC). This specification is based on the measured φJT for the DLPC150 package and provides
a relatively accurate correlation to junction temperature. Take care when measuring this case temperature to
prevent accidental cooling of the package surface. TI recommends a small (approximately 40 gauge)
thermocouple. The bead and thermocouple wire should contact the top of the package and be covered with a
minimal amount of thermally conductive epoxy. The wires should be routed closely along the package and the
board surface to avoid cooling the bead through the wires.
46
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12 Device and Documentation Support
12.1 Device Support
12.1.1 Device Nomenclature
12.1.1.1 Device Markings
DLPC150
DLPC150ZEZ
Marking Definitions:
Line 1:
DLP Device Name: DLPC150
SC: Solder ball composition
e1: Indicates lead-free solder balls consisting of SnAgCu
G8: Indicates lead-free solder balls consisting of tin-silver-copper (SnAgCu) with silver content
less than or equal to 1.5% and that the mold compound meets TI's definition of green.
Line 2:
TI Part Number
Line 3:
XXXXXXXX-TT manufacturer part number
Line 4:
LLLLLLLL.ZZ Foundry lot code for semiconductor wafers and lead-free solder ball marking
Line 5:
PH YYWW: Package assembly information
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12.2 Related Links
The following table lists quick access links. Categories include technical documents, support and community
resources, tools and software, and quick access to sample or buy.
Table 16. Related Links
PARTS
PRODUCT FOLDER
SAMPLE and BUY
TECHNICAL
DOCUMENTS
TOOLS and
SOFTWARE
SUPPORT and
COMMUNITY
DLP2010NIR
Click here
Click here
Click here
Click here
Click here
DLP2010
Click here
Click here
Click here
Click here
Click here
DLPA2000
Click here
Click here
Click here
Click here
Click here
DLPA2005
Click here
Click here
Click here
Click here
Click here
12.3 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
12.4 Trademarks
E2E is a trademark of Texas Instruments.
DLP is a registered trademark of Texas Instruments.
All other trademarks are the property of their respective owners.
12.5 Electrostatic Discharge Caution
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
12.6 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
13 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
48
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13.1 Package Option Addendum
13.1.1 Packaging Information
Orderable Device
DLPC150ZEZ
(1)
(2)
(3)
(4)
(5)
Status
(1)
DLPC150ZEZ
Package
Type
Package
Drawing
Pins
Package
Qty
NFBGA
ZEZ
201
1
Eco Plan
TBD
(2)
Lead/Ball Finish
Call TI
MSL Peak Temp
(3)
Level-3-260C-168 HRS
Op Temp (°C)
Device Marking (4) (5)
–30 to 85
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PRE_PROD Unannounced device, not in production, not available for mass market, nor on the web, samples not available.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
space
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest
availability information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the
requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified
lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used
between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by
weight in homogeneous material)
space
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
space
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device
space
Multiple Device markings will be inside parentheses. Only on Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a
continuation of the previous line and the two combined represent the entire Device Marking for that device.
Important Information and Disclaimer: The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief
on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third
parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on
incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for
release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
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49
PACKAGE OUTLINE
ZEZ0201A
NFBGA - 1 mm max height
SCALE 1.000
PLASTIC BALL GRID ARRAY
13.1
12.9
A
B
BALL A1 CORNER
13.1
12.9
1 MAX
C
SEATING PLANE
0.31
TYP
0.21
BALL TYP
0.1 C
11.2 TYP
SYMM
(0.9) TYP
R
11.2
TYP
P
N
M
L
K
J
H
G
F
E
D
C
(0.9) TYP
SYMM
201X
B
0.4
0.3
0.15
0.08
C A
C
B
A
0.8 TYP
BALL A1 CORNER
1
2
3 4 5 6 7 8 9 10 11 12 13 14 15
0.8 TYP
4221521/A 03/2015
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
www.ti.com
EXAMPLE BOARD LAYOUT
ZEZ0201A
NFBGA - 1 mm max height
PLASTIC BALL GRID ARRAY
(0.8) TYP
201X ( 0.4)
1
2
3
4
5
6
7
8
10
9
12
11
13
14
15
A
(0.8) TYP
B
C
D
E
F
G
SYMM
H
J
K
L
M
N
P
R
SYMM
LAND PATTERN EXAMPLE
SCALE:8X
( 0.4)
METAL
0.05 MAX
METAL UNDER
SOLDER MASK
0.05 MIN
SOLDER MASK
OPENING
SOLDER MASK
DEFINED
NON-SOLDER MASK
DEFINED
(PREFERRED)
( 0.4)
SOLDER MASK
OPENING
SOLDER MASK DETAILS
NOT TO SCALE
4221521/A 03/2015
NOTES: (continued)
3. Final dimensions may vary due to manufacturing tolerance considerations and also routing constraints.
For information, see Texas Instruments literature number SPRAA99 (www.ti.com/lit/spraa99).
www.ti.com
EXAMPLE STENCIL DESIGN
ZEZ0201A
NFBGA - 1 mm max height
PLASTIC BALL GRID ARRAY
( 0.4) TYP
(0.8) TYP
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
A
B
(0.8) TYP
C
D
E
F
G
SYMM
H
J
K
L
M
N
P
R
SYMM
SOLDER PASTE EXAMPLE
BASED ON 0.15 mm THICK STENCIL
SCALE:8X
4221521/A 03/2015
NOTES: (continued)
4. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release.
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