DS90CP22
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SNLS053E – MARCH 2000 – REVISED APRIL 2013
DS90CP22 800 Mbps 2x2 LVDS Crosspoint Switch
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FEATURES
DESCRIPTION
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DS90CP22 is a 2x2 crosspoint switch utilizing LVDS
(Low Voltage Differential Signaling) technology for
low power, high speed operation. Data paths are fully
differential from input to output for low noise
generation and low pulse width distortion. The nonblocking design allows connection of any input to any
output or outputs. LVDS I/O enable high speed data
transmission for point-to-point interconnects. This
device can be used as a high speed differential
crosspoint, 2:1 mux, 1:2 demux, repeater or 1:2
signal splitter. The mux and demux functions are
useful for switching between primary and backup
circuits in fault tolerant systems. The 1:2 signal
splitter and 2:1 mux functions are useful for
distribution of serial bus across several rack-mounted
backplanes.
1
2
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DC - 800 Mbps Low Jitter, Low Skew Operation
65 ps (typ) of Pk-Pk Jitter with PRBS = 223−1
Data Pattern at 800 Mbps
Single +3.3 V Supply
Less than 330 mW (typ) Total Power
Dissipation
Non-Blocking "'Switch Architecture"'
Balanced Output Impedance
Output Channel-to-Channel Skew is 35 ps (typ)
Configurable as 2:1 mux, 1:2 demux, Repeater
or 1:2 Signal Splitter
LVDS Receiver Inputs Accept LVPECL Signals
Fast Switch Time of 1.2ns (typ)
Fast Propagation Delay of 1.3ns (typ)
Receiver Input Threshold < ±100 mV
Available in 16 Lead TSSOP and SOIC
Packages
Conforms to ANSI/TIA/EIA-644-1995 LVDS
Standard
Operating Temperature: −40°C to +85°C
The DS90CP22 accepts LVDS signal levels, LVPECL
levels directly or PECL with attenuation networks.
The individual LVDS outputs can be put into TRISTATE by use of the enable pins.
For more details, please refer to the Application
Information section of this datasheet.
Connection Diagram
Figure 1. SOIC-16 Package
or
TSSOP-16 Package
1
2
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2000–2013, Texas Instruments Incorporated
DS90CP22
SNLS053E – MARCH 2000 – REVISED APRIL 2013
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Figure 2. Diff. Output Eye-Pattern in 1:2 split mode @ 800 Mbps
Conditions: 3.3 V, PRBS = 223−1 data pattern,
VID = 300mV, VCM = +1.2 V, 200 ps/div, 100 mV/div
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
Absolute Maximum Ratings (1) (2)
−0.3V to +4V
Supply Voltage (VCC)
−0.3V to (VCC + 0.3V)
CMOS/TTL Input Voltage (EN0, EN1, SEL0, SEL1)
LVDS Receiver Input Voltage (IN+, IN−)
−0.3V to +4V
LVDS Driver Output Voltage (OUT+, OUT−)
−0.3V to +4V
LVDS Output Short Circuit Current
Continuous
Junction Temperature
+150°C
−65°C to +150°C
Storage Temperature Range
Lead Temperature (Soldering, 4 sec.)
Maximum Package Power Dissipation at
25°C
+260°C
16L SOIC
1.435 W
16L SOIC Package Derating
11.48 mW/°C above +25°C
16L TSSOP
0.866 W
16L TSSOP Package Derating
ESD Rating
9.6 mW/°C above +25°C
(HBM, 1.5kΩ, 100pF)
> 5 kV
(EIAJ, 0Ω, 200pF)
(1)
(2)
> 250 V
If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/Distributors for availability and
specifications.
“Absolute Maximum Ratings” are these beyond which the safety of the device cannot be verified. They are not meant to imply that the
device should be operated at these limits. “Electrical Characteristics” provides conditions for actual device operation.
Recommended Operating Conditions
Supply Voltage (VCC)
Receiver Input Voltage
Typ
Max
Units
3.0
3.3
3.6
V
0
Operating Free Air Temperature
2
Min
-40
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+25
VCC
V
+85
°C
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Electrical Characteristics (1)
Over recommended operating supply and temperature ranges unless otherwise specified
Symbol
Parameter
Conditions
Min
Typ
Max
Units
V
CMOS/TTL DC SPECIFICATIONS (EN0,EN1,SEL0,SEL1)
VIH
High Level Input Voltage
2.0
VCC
VIL
Low Level Input Voltage
GND
0.8
V
IIH
High Level Input Current
VIN = 3.6V or 2.0V; VCC = 3.6V
+20
μA
IIL
Low Level Input Current
VIN = 0V or 0.8V; VCC = 3.6V
VCL
Input Clamp Voltage
ICL = −18 mA
+7
±1
±10
μA
−0.8
−1.5
V
LVDS OUTPUT DC SPECIFICATIONS (OUT0,OUT1)
VOD
Differential Output Voltage
ΔVOD
RL = 75Ω
270
365
475
mV
RL = 75Ω, VCC = 3.3V, TA = 25°C
285
365
440
mV
35
mV
Change in VOD between Complimentary Output States
(2)
VOS
Offset Voltage
ΔVOS
Change in VOS between Complimentary Output States
1.0
IOZ
Output TRI-STATE Current
TRI-STATE Output,
1.2
±1
1.45
V
35
mV
±10
μA
VOUT = VCC or GND
IOFF
Power-Off Leakage Current
VCC = 0V; VOUT = 3.6V or GND
±1
±10
μA
IOS
Output Short Circuit Current
VOUT+ OR VOUT− = 0V
−15
−25
mA
IOSB
Both Outputs Short Circuit Current
VOUT+ AND VOUT− = 0V
−30
−50
mA
0
+100
mV
LVDS RECEIVER DC SPECIFICATIONS (IN0,IN1)
VTH
Differential Input High Threshold
VCM = +0.05V or +1.2V or +3.25V,
VTL
Differential Input Low Threshold
Vcc = 3.3V
−100
VCMR
Common Mode Voltage Range
VID = 100mV, Vcc = 3.3V
0.05
IIN
Input Current
0
mV
3.25
V
VIN = +3.0V, VCC = 3.6V or 0V
±1
±10
μA
VIN = 0V, VCC = 3.6V or 0V
±1
±10
μA
SUPPLY CURRENT
ICCD
Total Supply Current
RL = 75Ω, CL = 5 pF, EN0 = EN1 = High
98
125
mA
ICCZ
TRI-STATE Supply Current
EN0 = EN1 = Low
43
55
mA
Max
Units
(1)
(2)
All typical are given for VCC = +3.3V and TA = +25°C, unless otherwise stated.
VOS is defined and measured on the ATE as (VOH + VOL) / 2.
AC Electrical Characteristics
Over recommended operating supply and temperature ranges unless otherwise specified (1)
Symbol
TSET
Min
Typ
Input to SEL Setup Time (2), (Figure 3 and Figure 4)
Parameter
Conditions
0.7
0.5
(2)
ns
THOLD
Input to SEL Setup Time , (Figure 3 and Figure 4)
1.0
0.5
TSWITCH
SEL to Switched Output, (Figure 3 and Figure 4)
0.9
1.2
1.7
ns
TPHZ
Disable Time (Active to TRI-STATE) High to Z, Figure 5
2.1
4.0
ns
TPLZ
Disable Time (Active to TRI-STATE) Low to Z, Figure 5
3.0
4.5
ns
TPZH
Enable Time (TRI-STATE to Active) Z to High, Figure 5
25.5
55.0
ns
TPZL
Enable Time (TRI-STATE to Active) Z to Low, Figure 5
25.5
55.0
ns
TLHT
Output Low-to-High Transition Time, 20% to 80%, Figure 7
290
400
580
ps
THLT
Output High-to-Low Transition Time, 80% to 20%, Figure 7
290
400
580
ps
(1)
(2)
ns
The parameters are specified by design. The limits are based on statistical analysis of the device performance over PVT (process,
voltage and temperature) range.
TSET and THOLD time specify that data must be in a stable state before and after the SEL transition.
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AC Electrical Characteristics (continued)
Over recommended operating supply and temperature ranges unless otherwise specified(1)
Symbol
Parameter
Conditions
TJIT
Max
Units
40
90
ps
65
120
ps
0.9
1.3
1.6
ns
1.0
1.3
1.5
ns
0.9
1.3
1.6
ns
1.0
23
VID = 300mV; PRBS=2 -1 data
pattern; VCM = 1.2V at 800Mbps
Propagation Low to High Delay, Figure 8
Propagation Low to High Delay, Figure 8
TPHLD
Typ
VID = 300mV; 50% Duty Cycle; VCM =
1.2V at 800Mbps
LVDS Data Path Peak to Peak Jitter (3)
TPLHD
Min
VCC = 3.3V, TA = 25°C
Propagation High to Low Delay, Figure 8
1.3
1.5
ns
TSKEW
Propagation High to Low Delay, Figure 8
Pulse Skew |TPLHD - TPHLD|
0
225
ps
TCCS
Output Channel-to-Channel Skew, Figure 9
35
80
ps
(3)
VCC = 3.3V, TA = 25°C
The parameters are specified by design. The limits are based on statistical analysis of the device performance over PVT range with the
following equipment test setup: HP70004A (display mainframe) with HP70841B (pattern generator), 5 feet of RG-142 cable with DUT
test board and HP83480A (digital scope mainframe) with HP83483A (20GHz scope module).
AC Timing Diagrams
Figure 3. Input-to-Select rising edge setup and hold times and mux switch time
Figure 4. Input-to-Select falling edge setup and hold times and mux switch time
4
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Figure 5. Output active to TRI-STATE and TRI-STATE to active output time
Figure 6. LVDS Output Load
Figure 7. LVDS Output Transition Time
Figure 8. Propagation Delay Low-to-High and High-to-Low
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Figure 9. Output Channel-to-Channel Skew in 1:2 splitter mode
PIN DESCRIPTIONS
6
Pin Name
# of Pin
Input/Output
IN+
2
I
Non-inverting LVDS input
Description
IN -
2
I
Inverting LVDS input
OUT+
2
O
Non-inverting LVDS Output
OUT -
2
O
Inverting LVDS Output
EN
2
I
A logic low on the Enable puts the LVDS output into TRI-STATE and
reduces the supply current
SEL
2
I
2:1 mux input select
GND
1
P
Ground
VCC
1
P
Power Supply
NC
2
No Connect
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APPLICATION INFORMATION
MODES OF OPERATION
The DS90CP22 provides three modes of operation. In the 1:2 splitter mode, the two outputs are copies of the
same single input. This is useful for distribution / fan-out applications. In the repeater mode, the device operates
as a 2 channel LVDS buffer. Repeating the signal restores the LVDS amplitude, allowing it to drive another
media segment. This allows for isolation of segments or long distance applications. The switch mode provides a
crosspoint function. This can be used in a system when primary and redundant paths are supported in fault
tolerant applications.
INPUT FAIL-SAFE
The receiver inputs of the DS90CP22 do not have internal fail-safe biasing. For point-to-point and multidrop
applications with a single source, fail-safe biasing may not be required. When the driver is off, the link is inactive. If fail-safe biasing is required, this can be accomplished with external high value resistors. The IN+ should
be pull to Vcc with 10kΩ and the IN− should be pull to Gnd with 10kΩ. This provides a slight positive differential
bias, and sets a known HIGH state on the link with a minimum amount of distortion.
UNUSED LVDS INPUTS
Unused LVDS Receiver inputs should be tied off to prevent the high-speed sensitive input stage from picking up
noise signals. The open input to IN+ should be pull to Vcc with 10kΩ and the open input to IN− should be pull to
Gnd with 10kΩ.
UNUSED CONTROL INPUTS
The SEL and EN control input pins have internal pull down devices. Unused pins may be tied off or left as noconnect (if a LOW state is desired).
EXPANDING THE NUMBER OF OUTPUT PORTS
To expand the number of output ports, more than one DS90CP22 can be used. Total propagation delay through
the devices should be considered to determine the maximum expansion. For example, if 2 X 4 is desired, than
three of the DS90CP22 are required. A minimum of two device propagation delays (2 x 1.3ns = 2.6ns (typ)) can
be achieved. For a 2 X 8, a total of 7 devices must be used with propagation delay of 3 x 1.3ns = 3.9ns (typ).
The power consumption will increase proportional to the number of devices used.
PCB LAYOUT AND POWER SYSTEM BYPASS
Circuit board layout and stack-up for the DS90CP22 should be designed to provide noise-free power to the
device. Good layout practice also will separate high frequency or high level inputs and outputs to minimize
unwanted stray noise pickup, feedback and interference. Power system performance may be greatly improved by
using thin dielectrics (4 to 10 mils) for power/ground sandwiches. This increases the intrinsic capacitance of the
PCB power system which improves power supply filtering, especially at high frequencies, and makes the value
and placement of external bypass capacitors less critical. External bypass capacitors should include both RF
ceramic and tantalum electrolytic types. RF capacitors may use values in the range 0.01 µF to 0.1 µF. It is
recommended practice to use two vias at each power pin of the DS90CP22 as well as all RF bypass capacitor
terminals. Dual vias reduce the interconnect inductance by up to half, thereby reducing interconnect inductance
and extending the effective frequency range of the bypass components.
The outer layers of the PCB may be flooded with additional ground plane. These planes will improve shielding
and isolation as well as increase the intrinsic capacitance of the power supply plane system. Naturally, to be
effective, these planes must be tied to the ground supply plane at frequent intervals with vias. Frequent via
placement also improves signal integrity on signal transmission lines by providing short paths for image currents
which reduces signal distortion.
There are more common practices which should be followed when designing PCBs for LVDS signaling.
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COMPATIBILITY WITH LVDS STANDARD
The DS90CP22 is compatible with LVDS and Bus LVDS Interface devices. It is enhanced over standard LVDS
drivers in that it is able to driver lower impedance loads with standard LVDS levels. Standard LVDS drivers
provide 330mV differential output with a 100Ω load. The DS90CP22 provides 365mV with a 75Ω load or 400mV
with 100Ω loads. This extra drive capability is useful in certain multidrop applications.
In backplane multidrop configurations, with closely spaced loads, the effective differential impedance of the line is
reduced. If the mainline has been designed for 100Ω differential impedance, the loading effects may reduce this
to the 70Ω range depending upon spacing and capacitance load. Terminating the line with a 75Ω load is a better
match than with 100Ω and reflections are reduced.
BLOCK DIAGRAM
Table 1. Function Table
8
SEL0
SEL1
OUT0
OUT1
Mode
0
0
IN0
IN0
1:2 splitter
0
1
IN0
IN1
repeater
1
0
IN1
IN0
switch
1
1
IN1
IN1
1:2 splitter
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Typical Performance Characteristics
Diff. Output Voltage (VOD) vs. Resistive Load (RT)
Peak-to-Peak Output Jitter at VCM = +0.4V vs. VID
Figure 10.
Figure 11.
Peak-to-Peak Output Jitter at VCM = +1.2V vs. VID
Peak-to-Peak Output Jitter at VCM = +1.6V vs. VID
Figure 12.
Figure 13.
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REVISION HISTORY
Changes from Revision D (April 2013) to Revision E
•
10
Page
Changed layout of National Data Sheet to TI format ............................................................................................................ 9
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PACKAGE OPTION ADDENDUM
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30-Sep-2021
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
(4/5)
(6)
DS90CP22M-8
NRND
SOIC
D
16
48
Non-RoHS
& Green
Call TI
Level-1-235C-UNLIM
-40 to 85
DS90CP22M
-8
DS90CP22M-8/NOPB
ACTIVE
SOIC
D
16
48
RoHS & Green
SN
Level-1-260C-UNLIM
-40 to 85
DS90CP22M
-8
DS90CP22MT
NRND
TSSOP
PW
16
92
Non-RoHS
& Green
Call TI
Level-1-260C-UNLIM
-40 to 85
DS90CP
22MT
DS90CP22MT/NOPB
ACTIVE
TSSOP
PW
16
92
RoHS & Green
SN
Level-1-260C-UNLIM
-40 to 85
DS90CP
22MT
DS90CP22MTX/NOPB
ACTIVE
TSSOP
PW
16
2500
RoHS & Green
SN
Level-1-260C-UNLIM
-40 to 85
DS90CP
22MT
DS90CP22MX-8/NOPB
ACTIVE
SOIC
D
16
2500
RoHS & Green
SN
Level-1-260C-UNLIM
-40 to 85
DS90CP22M
-8
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of