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INA282, INA283, INA284, INA285, INA286
SBOS485C – NOVEMBER 2009 – REVISED MAY 2015
INA28x High-Accuracy, Wide Common-Mode Range, Bidirectional
Current Shunt Monitors, Zero-Drift Series
1 Features
3 Description
•
•
•
•
The INA28x family includes the INA282, INA283,
INA284, INA285, and INA286 devices. These devices
are voltage output current shunt monitors that can
sense drops across shunts at common-mode
voltages from –14 V to +80 V, independent of the
supply voltage. The low offset of the zero-drift
architecture enables current sensing with maximum
drops across the shunt as low as 10 mV full-scale.
1
•
•
Wide Common-Mode Range: –14 V to +80 V
Offset Voltage: ±20 μV
CMRR: 140 dB
Accuracy:
– ±1.4% Gain Error (Max)
– 0.3 μV/°C Offset Drift
– 0.005%/°C Gain Drift (Max)
Available Gains:
– 50 V/V: INA282
– 100 V/V: INA286
– 200 V/V: INA283
– 500 V/V: INA284
– 1000 V/V: INA285
Quiescent Current: 900 μA (Max)
These current sense amplifiers operate from a single
+2.7-V to +18-V supply, drawing a maximum of 900
μA of supply current. These devices are specified
over the extended operating temperature range of
–40°C to +125°C, and offered in SOIC-8 and
VSSOP-8 packages.
Device Information(1)
ORDER NUMBER
INA28x
2 Applications
•
•
•
•
PACKAGE
BODY SIZE (NOM)
SOIC (8)
4.90 mm x 3.91 mm
VSSOP (8)
3.00 mm x 3.00 mm
(1) For all available packages, see the package option addendum
at the end of the datasheet.
Telecom Equipment
Automotive
Power Management
Solar Inverters
Detailed Block Diagram
Bus Supply
±14 V to +80 V
Load
+IN
1
2.7 V to 18 V
V+
±IN
2
2
2
1
2
1
1
ZerDrift
GAIN
PRODUCT
50 V/V
100 V/V
INA282
INA286
200 V/V
INA283
500 V/V
1000 V/V
INA284
INA285
OUT
Output
33.3 k
REF2
33.3 k
REF1
GND
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
INA282, INA283, INA284, INA285, INA286
SBOS485C – NOVEMBER 2009 – REVISED MAY 2015
www.ti.com
Table of Contents
1
2
3
4
5
6
7
Features ..................................................................
Applications ...........................................................
Description .............................................................
Revision History.....................................................
Pin Configuration and Functions .........................
Specifications.........................................................
1
1
1
2
3
4
6.1
6.2
6.3
6.4
6.5
6.6
4
4
4
4
5
7
Absolute Maximum Ratings .....................................
ESD Ratings..............................................................
Recommended Operating Conditions.......................
Thermal Information ..................................................
Electrical Characteristics...........................................
Typical Characteristics ..............................................
Detailed Description ............................................ 13
7.1 Overview ................................................................. 13
7.2 Functional Block Diagram ....................................... 13
7.3 Feature Description................................................. 14
7.4 Device Functional Modes........................................ 15
8
Applications and Implementation ...................... 20
8.1 Application Information............................................ 20
8.2 Typical Applications ................................................ 21
9 Power Supply Recommendations...................... 25
10 Layout................................................................... 25
10.1 Layout Guidelines ................................................. 25
10.2 Layout Example .................................................... 25
11 Device and Documentation Support ................. 26
11.1
11.2
11.3
11.4
11.5
Related Links ........................................................
Community Resources..........................................
Trademarks ...........................................................
Electrostatic Discharge Caution ............................
Glossary ................................................................
26
26
26
26
26
12 Mechanical, Packaging, and Orderable
Information ........................................................... 26
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision B (September 2012) to Revision C
Page
•
Added DGK (VSSOP) package to data sheet ........................................................................................................................ 1
•
Changed front page diagram.................................................................................................................................................. 1
•
Added ESD Ratings and Recommended Operating Conditions tables, and Feature Description, Application and
Implementation, Power Supply Recommendations ,Layout , Device and Documentation Support , and Mechanical,
Packaging, and Orderable Information sections..................................................................................................................... 4
•
Deleted Machine Model ESD rating ....................................................................................................................................... 4
•
Changed HBM ESD rating from ±3000 V to ±2000 V ............................................................................................................ 4
•
Added RVRR as symbol for reference voltage rejection ratio ............................................................................................... 5
•
Changed order of figures in Typical Characteristics section .................................................................................................. 7
•
Changed Figure 16................................................................................................................................................................. 8
•
Changed VDRIVE condition in Figure 19 and Figure 20 ........................................................................................................... 9
•
Added functional block diagram ........................................................................................................................................... 13
•
Changed Figure 32 and Figure 33 ....................................................................................................................................... 15
•
Changed Figure 34 and Figure 35 ....................................................................................................................................... 16
•
Changed Figure 36 and Figure 37 ....................................................................................................................................... 17
•
Changed Figure 38............................................................................................................................................................... 18
•
Changed Reference Common-Mode Rejection to Reference Voltage Rejection Ratio ....................................................... 18
•
Changed RCMR to RVRR in Table 1 and Table 2 ................................................................................................................. 19
•
Changed Figure 39 .............................................................................................................................................................. 20
•
Changed Figure 40 .............................................................................................................................................................. 21
•
Changed Figure 42 .............................................................................................................................................................. 23
Changes from Revision A (July 2010) to Revision B
•
2
Page
Changed devices from product preview to production data. .................................................................................................. 1
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SBOS485C – NOVEMBER 2009 – REVISED MAY 2015
5 Pin Configuration and Functions
D and DGK Packages
8-Pin SOIC and 8-Pin VSSOP
Top View
-IN
1
8
+IN
GND
2
7
REF1
REF2
3
6
V+
(1)
4
5
OUT
NC
(1)
NC: This pin is not internally connected. Leave the NC pin floating or connect this pin to GND.
Pin Descriptions
PIN
NO.
NAME
I/O
1
–IN
Analog input
2
GND
Analog
3
REF2
Analog input
4
NC
—
5
OUT
DESCRIPTION
Connect this pin to load side of shunt resistor.
Ground
Reference voltage, 0 V to V+. See Reference Pin Connection Options section for connection options.
This pin is not internally connected. Either float or connect this pin to GND.
Analog output Output voltage
6
V+
Analog
7
REF1
Analog input
Power supply, 2.7 V to 18 V
Reference voltage, 0 V to V+. See Reference Pin Connection Options section for connection options.
8
+IN
Analog input
Connect this pin to supply side of shunt resistor.
Copyright © 2009–2015, Texas Instruments Incorporated
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SBOS485C – NOVEMBER 2009 – REVISED MAY 2015
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6 Specifications
6.1 Absolute Maximum Ratings
Over operating free-air temperature range (unless otherwise noted) (1)
MIN
Supply voltage, V+
Analog inputs, V+IN, V–IN
(2)
Differential (V+IN) – (V–IN)
(3)
+5
V
+80
V
GND – 0.3
(V+) + 0.3
V
Junction temperature
Storage temperature range, Tstg
(2)
(3)
V
–5
Input current into any pin
(1)
UNIT
18
–14
Common-mode
REF1, REF2, OUT
MAX
–65
5
mA
150
°C
+150
°C
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
V+IN and V–IN are the voltages at the +IN and –IN pins, respectively.
Input voltages must not exceed common-mode rating.
6.2 ESD Ratings
VALUE
V(ESD)
(1)
(2)
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001
Electrostatic discharge
(1)
±2000
Charged-device model (CDM), per JEDEC specification JESD22-C101 (2)
±1000
UNIT
V
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN
VCM
Common-mode input voltage
V+
Operating supply voltage
TA
Operating free-air temperature
NOM
MAX
12
UNIT
V
5
V
–40
+125
°C
6.4 Thermal Information
INA28x
THERMAL METRIC (1)
D (SOIC)
DGK (VSSOP)
UNIT
8 PINS
8 PINS
RθJA
Junction-to-ambient thermal resistance
134.9
164.1
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
72.9
56.4
°C/W
RθJB
Junction-to-board thermal resistance
61.3
85.0
°C/W
ψJT
Junction-to-top characterization parameter
18.9
6.5
°C/W
ψJB
Junction-to-board characterization parameter
54.3
83.3
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
n/a
n/a
°C/W
(1)
4
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
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SBOS485C – NOVEMBER 2009 – REVISED MAY 2015
6.5 Electrical Characteristics
At TA = 25°C, V+ = 5 V, V+IN = 12 V, VREF1 = VREF2 = 2.048 V referenced to GND, and VSENSE = V+IN – V–IN (unless otherwise
noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
INPUT
Offset voltage, RTI (1)
VSENSE = 0 mV
±20
±70
µV
dVOS/dT
vs temperature
VSENSE = 0 mV,
TA = –40°C to +125°C
±0.3
±1.5
µV/°C
PSRR
vs power supply
V+ = +2.7 V to +18 V,
VSENSE = 0 mV
3
VCM
Common-mode input range
TA = –40°C to +125°C
–14
CMRR
Common-mode rejection ratio
V+IN = –14 V to +80 V,
VSENSE = 0 mV,
TA = –40°C to +125°C
120
IB
Input bias current per pin (2)
IOS
Input offset current
VOS
μV/V
+80
V
140
dB
VSENSE = 0 mV
25
µA
VSENSE = 0 mV
1
µA
6
kΩ
1
V/V
Differential input impedance
REFERENCE INPUTS
Reference input gain
Reference input voltage range
(3)
0
VGND + 9
Divider accuracy (4)
INA282
INA283
RVRR
Reference voltage
rejection ratio
(VREF1 = VREF2 = 40 mV to 9 V,
V+ = 18 V)
INA284
INA285
INA286
±0.2%
±0.5%
±25
±75
TA = –40°C to +125°C
0.055
TA = –40°C to +125°C
0.040
±13
±6
TA = –40°C to +125°C
TA = –40°C to +125°C
0.010
TA = –40°C to +125°C
0.040
±17
µV/V
µV/V/°C
±30
µV/V
µV/V/°C
±25
0.015
±4
V
µV/V
µV/V/°C
±10
µV/V
µV/V/°C
±45
µV/V
µV/V/°C
GAIN (5) (GND + 0.5 V ≤ VOUT ≤ (V+) – 0.5 V; VREF1 = VREF2 = (V+) / 2 for all devices)
G
Gain
INA282, V+ = 5 V
50
V/V
INA283, V+ = 5 V
200
V/V
INA284, V+ = 12 V
500
V/V
INA285, V+ = 12 V
1000
V/V
INA286, V+ = 5 V
Gain error
(1)
(2)
(3)
(4)
(5)
100
V/V
INA282, INA283, INA286
±0.4%
±1.4%
INA284, INA285
±0.4%
±1.6%
TA = –40°C to +125°C
0.0008
0.005
%/°C
RTI = referred-to-input.
See typical characteristic graph Figure 7.
The average of the voltage on pins REF1 and REF2 must be between VGND and the lesser of (VGND + 9 V) and V+.
Reference divider accuracy specifies the match between the reference divider resistors using the configuration in Figure 36.
See typical characteristic graph Figure 12.
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Electrical Characteristics (continued)
At TA = 25°C, V+ = 5 V, V+IN = 12 V, VREF1 = VREF2 = 2.048 V referenced to GND, and VSENSE = V+IN – V–IN (unless otherwise
noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
OUTPUT
Nonlinearity error
±0.01%
Output impedance
Maximum capacitive load
No sustained oscillation
1.5
Ω
1
nF
VOLTAGE OUTPUT (6)
Swing to V+ power-supply rail
V+ = 5 V, RLOAD = 10 kΩ to GND,
TA = –40°C to +125°C
Swing to GND
RLOAD = 10 kΩ to GND,
TA = –40°C to +125°C
(V+) – 0.17
(V+) – 0.4
V
GND + 0.015
GND + 0.04
V
FREQUENCY RESPONSE
BW
Effective bandwidth (7)
NOISE, RTI
INA282
10
kHz
INA283
10
kHz
INA284
4
kHz
INA285
2
kHz
INA286
10
kHz
110
nV/√Hz
(1)
Voltage noise density
1 kHz
POWER SUPPLY
VS
Specified voltage range
IQ
Quiescent current
(6)
(7)
6
TA = –40°C to +125°C
2.7
600
18
V
900
µA
See typical characteristic graphs Figure 16 through Figure 18.
See typical characteristic graph Figure 1 and the Effective Bandwidth section.
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SBOS485C – NOVEMBER 2009 – REVISED MAY 2015
6.6 Typical Characteristics
At TA = 25°C, V+ = 5 V, V+IN = 12 V, VREF1 = VREF2 = 2.048 V referenced to GND, and VSENSE = V+IN – V–IN (unless otherwise
noted)
60
Power-Supply Rejection Ratio (dB)
120
50
Gain (dB)
40
30
20
10
INA282 (50V/V)
INA285 (1kV/V)
INA284 (500V/V)
INA283 (200V/V)
INA286 (100V/V)
0
-10
-20
110
100
90
80
70
60
50
40
30
20
10
100
1k
10k
100k
1M
100
1k
10k
Frequency (Hz)
Figure 1. Gain vs Frequency
1M
Figure 2. INA282 PSRR (RTI) vs Frequency
0.1
150
140
VOS, Referred-to-Input (V)
Common-Mode Rejectio Ratio (dB)
100k
Frequency (Hz)
130
120
110
100
90
0.01
0.001
0.0001
0.00001
80
0.000001
70
1
10
100
1k
10k
1k
100k
10k
100k
1M
VCM Slew Rate (V/sec)
Frequency (Hz)
Figure 4. INA282 Common-Mode Slew Rate Induced Offset
Figure 3. INA284 Common-Mode Rejection Ratio (RTI)
1k
0.06
VSENSE = -50mV to +50mV
0.04
Nonlinearity (%)
ROUT (W)
100
10
0.02
0
V+ = 18V
-0.02
1
V+ = 3.5V
-0.04
0.1
-0.06
10
100
1k
10k
100k
1M
0
3
6
Frequency (Hz)
Figure 5. INA286 Output Impedance vs Frequency
Copyright © 2009–2015, Texas Instruments Incorporated
9
12
15
18
VOUT (V)
Figure 6. INA282 Typical Nonlinearity vs Output Voltage
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Typical Characteristics (continued)
At TA = 25°C, V+ = 5 V, V+IN = 12 V, VREF1 = VREF2 = 2.048 V referenced to GND, and VSENSE = V+IN – V–IN (unless otherwise
noted)
900
30
850
V+ = 5V
V+ = 2.7V
Quiescent Current (mA)
+IN Bias Current (mA)
20
10
V+ = 18V
0
-10
-20
-30
800
750
V+ = 18V
700
650
600
V+ = 5V
550
500
V+ = 2.7V
450
400
-40
-20 -10
0
10
20
30
40
50
60
70
80
0
-20
20
Common-Mode Voltage (V)
Figure 7. INA283 +IN Bias Current vs Common-Mode
Voltage
Common-Mode Rejection Ratio (dB)
Quiescent Current (mA)
80
170
800
700
600
500
400
300
200
100
160
V+ = 12V
150
140
130
120
V+ = 5V
110
100
90
80
0
4
2
6
8
10
12
14
16
-75
18
-50
-25
0
25
50
75
100
125
150
Temperature (°C)
Supply Voltage (V)
Figure 10. Common-Mode Rejection Ratio vs Temperature
Figure 9. Quiescent Current vs Supply Voltage
980
1.0
0.8
880
V+ = 18V
780
V+ = 5V
0.6
Deviation in Gain (%)
Quiescent Current (mA)
60
Figure 8. INA283 Quiescent Current vs Common-Mode
Voltage
900
680
580
480
380
V+ = 2.7V
280
0.4
V+ = 5V
0.2
0
-0.2
V+ = 12V
-0.4
-0.6
180
-0.8
-1.0
80
-75
-50
-25
0
25
50
75
100
125
Temperature (°C)
Figure 11. Quiescent Current vs Temperature
8
40
Common-Mode Voltage (V)
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150
-75
-50
-25
0
25
50
75
100
125
150
Temperature (°C)
Figure 12. Deviation in Gain vs Temperature
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SBOS485C – NOVEMBER 2009 – REVISED MAY 2015
Typical Characteristics (continued)
At TA = 25°C, V+ = 5 V, V+IN = 12 V, VREF1 = VREF2 = 2.048 V referenced to GND, and VSENSE = V+IN – V–IN (unless otherwise
noted)
Voltage Noise, RTI (200nV/div)
0
+IN Bias Current (mA)
-5
-10
V+ = 2.7V
-15
-20
V+ = 5V
-25
V+ = 18V
-30
-35
VCM = 0V
-40
-75
-50
0
-25
25
75
50
100
125
Time (1s/div)
150
Temperature (°C)
Figure 14. INA282 0.1-Hz to 10-Hz Voltage Noise, RTI
0.12
5.5
0.11
5.0
0.10
4.5
0.09
4.0
0.08
3.5
0.07
3.0
0.06
100k
V+
18V
5V
2.7V
Output Voltage Swing (V)
(V+) – 2
Voltage Noise, RTI (mV/ÖHz)
Voltage Noise, RTO (mV/ÖHz)
Figure 13. +IN Bias Current vs Temperature
6.0
(V+) – 4
(V+) – 6
(V+) – 8
GND + 8
GND + 6
GND + 4
GND + 2
100
1k
10k
GND
0
1
2
4
3
Frequency (Hz)
Figure 15. INA282 Voltage Noise vs Frequency
6
7
8
9
10
Figure 16. INA284 Output Voltage Swing vs Output Current
800
400
700
+125°C
600
350
+25°C
+85°C
Swing to Ground (mV)
Swing to Rail (mV)
5
IOUT (mA)
500
400
-40°C
300
200
250
+125°C
200
150
100
50
+25°C
0
0
0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
2.0
IOUT, Sourcing (mA)
Figure 17. INA283 Swing to Rail vs Output Current
Copyright © 2009–2015, Texas Instruments Incorporated
2.7V Swing
5V Swing
18V Swing
+85°C
2.7V Swing
5V Swing
100
300
0
-40°C
0.5
1.0
1.5
2.0
2.5
IOUT, Sinking (mA)
Figure 18. INA283 Swing to Ground vs Output Current
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Typical Characteristics (continued)
At TA = 25°C, V+ = 5 V, V+IN = 12 V, VREF1 = VREF2 = 2.048 V referenced to GND, and VSENSE = V+IN – V–IN (unless otherwise
noted)
VREF = GND, VSENSE = 50mV, RLOAD = 10kW, CLOAD = 10pF
CLOAD = 10pF
VREF = GND
VSENSE = 50mV
RLOAD = 10kW
5V/div
5V/div
VOUT
500mV/div
500mV/div
VOUT
V+
V+
250ms/div
25ms/div
Figure 20. Start-Up Transient Response
500mV/div
500mV/div
Figure 19. Start-Up Transient Response
VOUT
VOUT
5V/div
5V/div
VCM
VCM
2.5ms/div
2.5ms/div
Figure 22. 12-V Common-Mode Step Response
500mV/div
500mV/div
Figure 21. 12-V Common-Mode Step Response
VOUT
VOUT
5V/div
5V/div
VCM
VCM
2.5ms/div
2.5ms/div
Figure 23. 12-V Common-Mode Step Response
10
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Figure 24. 12-V Common-Mode Step Response
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SBOS485C – NOVEMBER 2009 – REVISED MAY 2015
Typical Characteristics (continued)
VOUT
10V/div
VOUT
VCM
10V/div
500mV/div
500mV/div
At TA = 25°C, V+ = 5 V, V+IN = 12 V, VREF1 = VREF2 = 2.048 V referenced to GND, and VSENSE = V+IN – V–IN (unless otherwise
noted)
VCM
5ms/div
5ms/div
Figure 26. 50-V Common-Mode Step Response
20mV/div
100mV/div
Figure 25. 50-V Common-Mode Step Response
10ms/div
10ms/div
Figure 28. 500-mV Step Response
5V/div
1V/div
Figure 27. 100-mV Step Response
25ms/div
Figure 29. 4-V Step Response
Copyright © 2009–2015, Texas Instruments Incorporated
25ms/div
Figure 30. 17-V Step Response
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Typical Characteristics (continued)
At TA = 25°C, V+ = 5 V, V+IN = 12 V, VREF1 = VREF2 = 2.048 V referenced to GND, and VSENSE = V+IN – V–IN (unless otherwise
noted)
Input Drive (1V to 0V)
1V/div
VOUT (5V to midsupply)
25ms/div
Figure 31. Input Overload
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7 Detailed Description
7.1 Overview
The INA28x family of voltage output current-sensing amplifiers are specifically designed to accurately measure
voltages developed across current-sensing resistors on common-mode voltages that far exceed the supply
voltage powering the devices. This family features a common-mode range that extends 14 V below the negative
supply rail, as well as up to 80 V, allowing for either low-side or high-side current sensing while the device is
powered from supply voltages as low as 2.7 V.
The zero-drift topology enables high-precision measurements with maximum input offset voltages as low as 70
µV with a maximum temperature contribution of 1.5 µV/°C over the full temperature range of –40°C to +125°C.
7.2 Functional Block Diagram
V+
±IN
±
±
+
+
OUT
REF2
+IN
REF1
GND
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7.3 Feature Description
7.3.1 Selecting RS
The zero-drift offset performance of the INA28x family offers several benefits. Most often, the primary advantage
of the low offset characteristic enables lower full-scale drops across the shunt. For example, nonzero-drift,
current-shunt monitors typically require a full-scale range of 100 mV. The INA28x family gives equivalent
accuracy at a full-scale range on the order of 10 mV. This accuracy reduces shunt dissipation by an order of
magnitude, with many additional benefits. Alternatively, applications that must measure current over a wide
dynamic range can take advantage of the low offset on the low end of the measurement. Most often, these
applications can use the lower gains of the INA282, INA286, or INA283 to accommodate larger shunt drops on
the upper end of the scale. For instance, an INA282 operating on a 3.3-V supply can easily handle a full-scale
shunt drop of 55 mV, with only 70 μV of offset.
7.3.2 Effective Bandwidth
The extremely high dc CMRR of the INA28x family results from the switched-capacitor input structure. Because
of this architecture, the INA28x exhibits discrete time-system behaviors, as illustrated in the Gain vs Frequency
curve of Figure 1 and the Step Response curves of Figure 21 through Figure 28. The response to a step input
depends in part on the phase of the internal INA28x clock when the input step occurs. It is possible to overload
the input amplifier with a rapid change in input common-mode voltage (see Figure 4). Errors as a result of
common-mode voltage steps or overload situations typically disappear within 15 μs after the disturbance is
removed.
7.3.3 Transient Protection
The –14-V to +80-V common-mode range of the INA28x family is ideal for withstanding automotive fault
conditions that range from 12-V battery reversal up to 80-V transients; no additional protective components are
needed up to those levels. In the event that the INA28x family is exposed to transients on the inputs in excess of
its ratings, then external transient absorption with semiconductor transient absorbers (Zener diodes or transorbs)
are required. Use of metal-oxide varistors (MOVs) or voltage-dependent resistors (VDRs) is not recommended
except when they are used in addition to a semiconductor transient absorber. Select a transient absorber that
does not allow the INA28x family to be exposed to transients greater than 80 V (that is, allow for transient
absorber tolerance, as well as additional voltage as a result of transient absorber dynamic impedance). Despite
the use of internal zener-type electrostatic discharge (ESD) protection, the INA28x family does not lend itself to
using external resistors in series with the inputs without degrading gain accuracy.
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7.4 Device Functional Modes
7.4.1 Reference Pin Connection Options
Figure 32 illustrates a test circuit for reference-divider accuracy. The output of the INA28x family can be
connected for unidirectional or bidirectional operation. Do not connect the REF1 pin or the REF2 pin to any
voltage source lower than GND or higher than V+. The effective reference voltage (REF1 + REF2) / 2 must be 9
V or less. This parameter means that the V+ reference output connection shown in Figure 34 is not allowed for a
V+ value greater than 9 V. However, the split-supply reference connection shown in Figure 36 is allowed for all
values of V+ up to 18 V.
V+
+IN
V+
±IN
See Note (1)
±
Input Stage
OUT
+
REF2
REF1
GND
(1)
Reference divider accuracy is determined by measuring the output with the reference voltage applied to alternate
reference resistors, and calculating a result where the amplifier offset is cancelled in the final measurement.
Figure 32. Test Circuit For Reference Divider Accuracy
7.4.1.1 Unidirectional Operation
Unidirectional operation allows the INA28x family to measure currents through a resistive shunt in one direction.
In the case of unidirectional operation, set the output at the negative rail (near ground, and the most common
connection) or at the positive rail (near V+) when the differential input is 0 V. The output moves to the opposite
rail when a correct polarity differential input voltage is applied.
The required polarity of the differential input depends on the output voltage setting. If the output is set at the
positive rail, the input polarity must be negative to move the output down. If the output is set at ground, the
polarity is positive to move the output up.
The following sections describe how to configure the output for unidirectional operation.
7.4.1.1.1 Ground Referenced Output
When using the INA28x family in ground referenced output mode, both reference inputs are connected to
ground; this configuration takes the output to the negative rail when there is 0 V differential at the input (as
Figure 33 shows).
V+
+IN
V+
±IN
Input Stage
±
+
OUT
REF2
REF1
GND
Figure 33. Ground Referenced Output
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Device Functional Modes (continued)
7.4.1.1.2 V+ Referenced Output
V+ referenced output mode is set when both reference pins are connected to the positive supply. This mode is
typically used when a diagnostic scheme requires detection of the amplifier and the wiring before power is
applied to the load (as shown in Figure 34).
V+
+IN
V+
±IN
±
Input Stage
OUT
+
REF2
REF1
GND
Figure 34. V+ Referenced Output
7.4.1.2 Bidirectional Operation
Bidirectional operation allows the INA28x family to measure currents through a resistive shunt in two directions.
In this case, the output can be set anywhere within the limits of what the reference inputs allow (that is, between
0 V to 9 V, but never to exceed the supply voltage). Typically, the reference inputs are set at half-scale for equal
range in both directions. In some cases, however, the reference inputs are set at a voltage other than half-scale
when the bidirectional current is nonsymmetrical.
The quiescent output voltage is set by applying voltage or voltages to the reference inputs. REF1 and REF2 are
connected to internal resistors that connect to an internal offset node. There is no operational difference between
the pins.
7.4.1.2.1 External Reference Output
Connecting both pins together and to a reference produces an output at the reference voltage when there is no
differential input; this configuration is illustrated in Figure 35. The output moves down from the reference voltage
when the input is negative relative to the –IN pin and up when the input is positive relative to the –IN pin. Note
that this technique is the most accurate way to bias the output to a precise voltage.
V+
+IN
V+
±IN
Input Stage
±
+
OUT
REF2
REF1
REF3020
2.048-V
Reference
GND
Figure 35. External Reference Output
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Device Functional Modes (continued)
7.4.1.2.2 Splitting The Supply
By connecting one reference pin to V+ and the other to the ground pin, the output is set at half of the supply
when there is no differential input, as shown in Figure 36. This method creates a midscale offset that is
ratiometric to the supply voltage; thus, if the supply increases or decreases, the output remains at half the
supply.
V+
+IN
V+
±IN
±
Input Stage
OUT
+
Output
REF2
REF1
GND
Figure 36. Split-Supply Output
7.4.1.2.3 Splitting an External Reference
In this case, an external reference is divided by two with an accuracy of approximately 0.5% by connecting one
REF pin to ground and the other REF pin to the reference (as Figure 37 illustrates).
V+
+IN
V+
±IN
Input Stage
±
+
OUT
REF2
REF1
REF02
5-V
Reference
GND
Figure 37. Split Reference Output
7.4.2 Shutdown
While the INA28x family does not provide a shutdown pin, the quiescent current of 600 μA enables the device to
be powered from the output of a logic gate. Take the gate low to shut down the INA28x family devices.
7.4.3 Extended Negative Common-Mode Range
Using a negative power supply can extend the common-mode range 14 V more negative than the supply used.
For instance, a –10-V supply allows up to a –24-V negative common-mode. Remember to keep the total voltage
between the GND pin and V+ pin to less than 18 V. The positive common-mode decreases by the same amount.
The reference input simplifies this type of operation because the output quiescent bias point is always based on
the reference connections. Figure 38 shows a circuit configuration for common-mode ranges from –24 V to +70
V.
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Device Functional Modes (continued)
V+ = 5 V
Bus Supply
±24 V to +70 V
Load
+IN
V+
±IN
Input Stage
±
+
OUT
Output
REF2
REF1
See Note (1)
GND
Connect to ±10 V
(1)
Connect the REF pins as desired; however, they cannot exceed 9 V above the GND pin voltage.
Figure 38. Circuit Configuration for Common-Mode Ranges from –24 V to +70 V
7.4.4 Calculating Total Error
The electrical specifications for the INA28x family of devices include the typical individual errors terms such as
gain error, offset error, and nonlinearity error. Total error including all of these individual error components is not
specified in the Electrical Characteristics table. In order to accurately calculate the expected error of the device,
the operating conditions of the device must first be known. Some current shunt monitors specify a total error in
the product data sheet. However, this total error term is accurate under only one particular set of operating
conditions. Specifying the total error at this one point has little practical value because any deviation from these
specific operating conditions no longer yields the same total error value. This section discusses the individual
error sources, with information on how to apply them in order to calculate the total error value for the device
under any normal operating conditions.
The typical error sources that have the largest impact on the total error of the device are input offset voltage,
common-mode rejection ratio, gain error, and nonlinearity error. For the INA28x, an additional error source
referred to as reference voltage rejection ratio is also included in the total error value.
The nonlinearity error of the INA28x is relatively low compared to the gain error specification. This low error
results in a gain error that can be expected to be relatively constant throughout the linear input range of the
device. While the gain error remains constant across the linear input range of the device, the error associated
with the input offset voltage does not. As the differential input voltage developed across a shunt resistor at the
input of the INA28x decreases, the inherent input offset voltage of the device becomes a larger percentage of the
measured input signal resulting in an increase in error in the measurement. This varying error is present among
all current shunt monitors, given the input offset voltage ratio to the voltage being sensed by the device. The
relatively low input offset voltages present in the INA28x devices limit the amount of contribution the offset
voltage has on the total error term.
The term reference voltage rejection ratio refers to the amount of error induced by applying a reference voltage
to the INA28x device that deviates from the inherent bias voltage present at the output of the first stage of the
device. The output of the switched-capacitor network and first-stage amplifier has an inherent bias voltage of
approximately 2.048 V. Applying a reference voltage of 2.048 V to the INA28x reference pins results in no
additional error term contribution. Applying a voltage to the reference pins that differs from 2.048 V creates a
voltage potential in the internal difference amplifier, resulting in additional current flowing through the resistor
network. As a result of resistor tolerances, this additional current flow causes additional error at the output
because of resistor mismatches. Additionally, as a result of resistor tolerances, this additional current flow causes
additional error at the output based on the common-mode rejection ratio of the output stage amplifier. This error
term is referred back to the input of the device as additional input offset voltage. Increasing the difference
between the 2.048 V internal bias and the external reference voltage results in a higher input offset voltage. Also,
as the error at the output is referred back to the input, there is a larger impact on the input-referred offset, VOS,
for the lower-gain versions of the device.
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Device Functional Modes (continued)
Two examples are provided that detail how different operating conditions can affect the total error calculations.
Typical and maximum calculations are shown as well, to provide the user more information on how much error
variance is present from device to device.
7.4.4.1 Example 1
INA282; V+ = 5 V; VCM = 12 V; VREF1 = VREF2 = 2.048 V; VSENSE = 10 mV
Table 1. Example 1
TERM
SYMBOL
EQUATION
TYPICAL VALUE
MAXIMUM VALUE
Initial input offset
voltage
VOS
—
20 μV
70 μV
Added input offset
voltage because of
common-mode
voltage
VOS_CM
0 μV
0 μV
Added input offset
voltage because of
reference voltage
VOS_REF
RVRR u 2.048 V ± VREF
0 μV
0 μV
Total input offset
voltage
VOS_Total
(VOS)2 + (VOS_CM)2 + (VOS_REF)2
20 μV
70 μV
Error from input offset
voltage
Error_VOS
VOS_Total
VSENSE ´ 100
0.20%
0.70%
1
20
(
10
(
CMRR_dB
´ (VCM - 12V)
Gain error
Error_Gain
—
0.40%
1.40%
Nonlinearity error
Error_Lin
—
0.01%
0.01%
Total error
—
(Error_VOS)2 + (Error_Gain)2 + (Error_Lin)2
0.45%
1.56%
7.4.4.2 Example 2
INA286; V+ = 5 V; VCM = 24 V; VREF1 = VREF2 = 0 V; VSENSE = 10 mV
Table 2. Example 2
TERM
SYMBOL
EQUATION
TYPICAL VALUE
MAXIMUM VALUE
Initial input offset
voltage
VOS
—
20 μV
70 μV
Added input offset
voltage because of
common-mode
voltage
VOS_CM
1.2 μV
12 μV
Added input offset
voltage because of
reference voltage
VOS_REF
RVRR u 2.048 V ± VREF
34.8 μV
92.2 μV
Total input offset
voltage
VOS_Total
(VOS)2 + (VOS_CM)2 + (VOS_REF)2
40.2 μV
116.4 μV
Error from input offset
voltage
Error_VOS
VOS_Total
VSENSE ´ 100
0.40%
1.16%
Gain error
Error_Gain
—
0.40%
1.40%
Nonlinearity error
Error_Lin
—
0.01%
0.01%
0.57%
1.82%
10
(
20
2
(
Total error
1
CMRR_dB
´ (VCM - 12V)
2
(Error_VOS) + (Error_Gain) + (Error_Lin)
—
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8 Applications and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
8.1 Application Information
The INA28x family of devices measure the voltage developed across a current-sensing resistor when current
passes through it. The ability to drive the reference pins to adjust the functionality of the output signal is shown in
multiple configurations.
8.1.1 Basic Connections
Figure 39 shows the basic connection of an INA28x family device. Connect the input pins, +IN and –IN, as
closely as possible to the shunt resistor to minimize any resistance in series with the shunt resistance.
Device Supply
2.7 V to 18 V
CBYPASS
0.1 F
Bus Supply
±14 V to +80 V
Load
+IN
V+
±IN
Input Stage
±
+
OUT
Output
REF2
REF1
GND
Figure 39. Basic Connections
Power-supply bypass capacitors are required for stability. Applications with noisy or high-impedance power
supplies may require additional decoupling capacitors to reject power-supply noise. Connect bypass capacitors
close to the device pins.
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8.2 Typical Applications
8.2.1 Current Summing
The outputs of multiple INA28x family devices are easily summed by connecting the output of one INA28x family
device to the reference input of a second INA28x family device. The circuit configuration shown in Figure 40 is an
easy way to achieve current summing.
First Circuit
+IN
±IN
±IN
Input Stage
Input Stage
±
+
REF2
REF1
+
REF2
REF1
OUT
±
+IN
Second Circuit
OUT
Output
Output
VREF
GND
V+
GND
V+
Summed
Output
V+
V+
NOTE: The voltage applied to the reference inputs must not exceed 9 V.
Figure 40. Summing the Outputs of Multiple INA28x Family Devices
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Typical Applications (continued)
8.2.1.1 Design Requirements
In order to sum multiple load currents, multiple INA28x devices must be connected. Figure 40 shows summing
for two devices. Summing beyond two devices is possible by repeating this connection. The reference input of
the first INA28x family device sets the output quiescent level for all the devices in the string.
8.2.1.2 Detailed Design Procedure
Connect the output of one INA28x family device to the reference input of the next INA28x family device in the
chain. Use the reference input of the first circuit to set the reference of the final summed output. The currents
sensed at each circuit in the chain are summed at the output of the last device in the chain.
8.2.1.3 Application Curves
An example output response of a summing configuration is shown in Figure 41. The reference pins of the first
circuit are connected to ground, and sine waves at different frequencies are applied to the two circuits to produce
a summed output as shown. The sine wave voltage input for the first circuit is offset so that the whole wave is
above GND.
100 mV/div
5 V/div
Output
Inputs
Time (4 ms/div)
VREF = 0 V
Figure 41. Current Summing Application Output Response
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Typical Applications (continued)
8.2.2 Current Differencing
Occasionally, the need arises to confirm that the current into a load is identical to the current out of a load,
usually as part of diagnostic testing or fault detection. This situation requires precision current differencing, which
is the same as summing except that the two amplifiers have the inputs connected opposite of each other.
First Circuit
Bus Supply
Second Circuit
Load
+IN
±IN
±IN
Input Stage
Input Stage
±
+
REF2
REF1
+
REF2
REF1
OUT
±
+IN
OUT
Output
Output
VREF
GND
V+
GND
V+
Difference
Output
V+
V+
NOTE: The voltage applied to the reference inputs must not exceed 9 V.
Figure 42. Current Differencing Using an INA28x Family Device
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Typical Applications (continued)
8.2.2.1 Design Requirements
For current differencing, connect two INA28x devices, and have the inputs connected opposite to each other, as
shown in Figure 42. The reference input of the first INA28x family device sets the output quiescent level for all
the devices in the string.
8.2.2.2 Detailed Design Procedure
Connect the output of one INA28x family device to the reference input of the second INA28x family device. The
reference input of the first circuit sets the reference at the output. This circuit example is identical to the current
summing example, except that the two shunt inputs are reversed in polarity. Under normal operating conditions,
the final output is very close to the reference value and proportional to any current difference. This current
differencing circuit is useful in detecting when current in to and out of a load do not match.
8.2.2.3 Application Curves
100 mV/div
5 V/div
An example output response of a difference configuration is shown in Figure 43. The reference pins of the first
circuit are connected to a reference voltage of 2.048 V. The inputs to each circuit is a 100-Hz sine wave, 180°
out of phase with each other, resulting in a zero output as shown. The sine wave input to the first circuit is offset
so that the input wave is completely above GND.
Output
Inputs
Time (4 ms/div)
VREF = 2.048 V
Figure 43. Current Differencing Application Output Response
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9 Power Supply Recommendations
The INA28x family makes accurate measurements well outside of its own power-supply voltage (V+) because the
inputs (+IN and –IN) operate anywhere between –14 V and +80 V independent of V+. For example, the V+
power supply can be 5 V while the common-mode voltage being monitored by the shunt may be as high as 80 V.
Of course, the output voltage range of the INA28x family is constrained by the V+ supply voltage. Note that when
the power to the INA28x family is off (that is, no voltage is supplied to the V+ pin), the input pins (+IN and –IN)
are high impedance with respect to ground and typically leak less than ±1 μA over the full common-mode range
of –14 V to +80 V
10 Layout
10.1 Layout Guidelines
Connect the input pins to the sensing resistor using a Kelvin or 4-wire connection. This connection technique
makes sure that only the current-sensing resistor impedance is detected between the input pins. Poor routing of
the current-sensing resistor commonly results in additional resistance present between the input pins. Given the
very low ohmic value of the current resistor, any additional high-current carrying impedance causes significant
measurement errors.
Place the power-supply bypass capacitor as close as possible to the supply and ground pins. The recommended
value of this bypass capacitor is 0.1 μF. Add additional decoupling capacitance to compensate for noisy or highimpedance power supplies.
10.2 Layout Example
+IN
±IN
GND
REF2
NC
REF1
V+
Supply Voltage
OUT
Output Signal Trace
VIA to Power Plane
Supply Bypass
Capacitor
VIA to Ground Plane
Figure 44. Layout Example
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11 Device and Documentation Support
11.1 Related Links
Table 3 lists quick access links. Categories include technical documents, support and community resources,
tools and software, and quick access to sample or buy.
Table 3. Related Links
PARTS
PRODUCT FOLDER
SAMPLE & BUY
TECHNICAL
DOCUMENTS
TOOLS &
SOFTWARE
SUPPORT &
COMMUNITY
INA282
Click here
Click here
Click here
Click here
Click here
INA283
Click here
Click here
Click here
Click here
Click here
INA284
Click here
Click here
Click here
Click here
Click here
INA285
Click here
Click here
Click here
Click here
Click here
INA286
Click here
Click here
Click here
Click here
Click here
11.2 Community Resources
The following links connect to TI community resources. Linked contents are provided AS IS by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
11.3 Trademarks
E2E is a trademark of Texas Instruments.
All other trademarks are the property of their respective owners.
11.4 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
11.5 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
12 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
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PACKAGE OPTION ADDENDUM
www.ti.com
10-Dec-2020
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
(4/5)
(6)
INA282AID
ACTIVE
SOIC
D
8
75
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-40 to 125
I282A
INA282AIDGKR
ACTIVE
VSSOP
DGK
8
2500
RoHS & Green
NIPDAUAG
Level-2-260C-1 YEAR
-40 to 125
(CFI, CFIF)
INA282AIDGKT
ACTIVE
VSSOP
DGK
8
250
RoHS & Green
NIPDAUAG
Level-2-260C-1 YEAR
-40 to 125
(CFI, CFIF)
INA282AIDR
ACTIVE
SOIC
D
8
2500
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-40 to 125
I282A
INA283AID
ACTIVE
SOIC
D
8
75
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-40 to 125
I283A
INA283AIDGKR
ACTIVE
VSSOP
DGK
8
2500
RoHS & Green
NIPDAUAG
Level-2-260C-1 YEAR
-40 to 125
(CFJ, CFJF)
INA283AIDGKT
ACTIVE
VSSOP
DGK
8
250
RoHS & Green
NIPDAUAG
Level-2-260C-1 YEAR
-40 to 125
(CFJ, CFJF)
INA283AIDR
ACTIVE
SOIC
D
8
2500
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-40 to 125
I283A
INA284AID
ACTIVE
SOIC
D
8
75
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-40 to 125
I284A
INA284AIDGKR
ACTIVE
VSSOP
DGK
8
2500
RoHS & Green
NIPDAUAG
Level-2-260C-1 YEAR
-40 to 125
(CFK, CFKF)
INA284AIDGKT
ACTIVE
VSSOP
DGK
8
250
RoHS & Green
NIPDAUAG
Level-2-260C-1 YEAR
-40 to 125
(CFK, CFKF)
INA284AIDR
ACTIVE
SOIC
D
8
2500
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-40 to 125
I284A
INA285AID
ACTIVE
SOIC
D
8
75
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-40 to 125
I285A
INA285AIDGKR
ACTIVE
VSSOP
DGK
8
2500
RoHS & Green
NIPDAUAG
Level-2-260C-1 YEAR
-40 to 125
(CFL, CFLF)
INA285AIDGKT
ACTIVE
VSSOP
DGK
8
250
RoHS & Green
NIPDAUAG
Level-2-260C-1 YEAR
-40 to 125
(CFL, CFLF)
INA285AIDR
ACTIVE
SOIC
D
8
2500
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-40 to 125
I285A
INA286AID
ACTIVE
SOIC
D
8
75
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-40 to 125
I286A
INA286AIDGKR
ACTIVE
VSSOP
DGK
8
2500
RoHS & Green
NIPDAUAG
Level-2-260C-1 YEAR
-40 to 125
(ODY, ODYF)
INA286AIDGKT
ACTIVE
VSSOP
DGK
8
250
RoHS & Green
NIPDAUAG
Level-2-260C-1 YEAR
-40 to 125
(ODY, ODYF)
INA286AIDR
ACTIVE
SOIC
D
8
2500
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-40 to 125
I286A
Addendum-Page 1
Samples
PACKAGE OPTION ADDENDUM
www.ti.com
10-Dec-2020
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of