INA300AIDGSR

INA300AIDGSR

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    VSSOP10-0.5mm

  • 描述:

    INA300 36V 电流感应比较器

  • 详情介绍
  • 数据手册
  • 价格&库存
INA300AIDGSR 数据手册
INA300 SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 INA300 Overcurrent-Protection, Current-Sense Comparator 1 Features 3 Description • • Designed for overcurrent protection applications, the INA300 is a current-sensing comparator that detects overcurrent by measuring the voltage developed across a shunt resistor, and comparing that voltage to the threshold voltage input level. The device measures this differential voltage signal on commonmode voltages that can vary from 0 V up to 36 V, independent of the supply voltage. The INA300 device features an adjustable threshold range that is set using a single external limit-setting resistor. A selectable hysteresis feature enables adjustable operation of the comparator to accommodate the wide input signal range of 0 mV to 250 mV. • • • • • • Wide Common-Mode Range: 0 V to 36 V Selectable Response Times: – 10 µs, 50 µs, 100 µs Programmable Threshold: – Adjust Using Single Resistor – Programmable From 0 mV to 250 mV Accuracy: – Offset Voltage: ±500 μV (Maximum) – Offset Voltage Drift: 0.5 μV/°C (Maximum) Selectable Hysteresis: – 2 mV, 4 mV, 8 mV Active Quiescent Current: 135 μA (Maximum) Selectable Disable Mode – Disabled Quiescent Current: 3.5 μA (Maximum) – Disabled Input Bias Current: 500 nA (Maximum) Open-Drain Output With Latch Mode Available 2 Applications • • • • • • Overcurrent Protection Computers Servers Telecom Equipment Power Supplies Battery Chargers An open-drain alert output on the device can be configured to operate in either a transparent mode where the output status follows the input state, or in a latched mode where the alert output is cleared when the latch is cleared. The device response time setting is selectable, which enables overcurrent alerts to be issued in as fast as 10 µs. The INA300 device operates from a single 2.7-V to 5.5-V supply, drawing a maximum supply current of 135 µA. The INA300 device is specified over the extended operating temperature range of –40°C to +125°C, and is available in WSON-10 and VSSOP-10 packages. Device Information PACKAGE(1) PART NUMBER INA300 (1) BODY SIZE (NOM) WSON (10) 2.00 mm × 2.00 mm VSSOP (10) 3.00 mm × 3.00 mm For all available packages, see the package option addendum at the end of the data sheet. 2.7 V to 5.5 V CBYPASS 0.1 µF VS INA300 RPull-up 10 k Processor Power Supply (0 V to 36 V) ENABLE GPIO LATCH IN+ GPIO + ALERT GPIO CMP IN LIMIT ± DAC DELAY Load HYS GND RLIMIT Typical Application Schematic An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA. INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 Table of Contents 1 Features............................................................................1 2 Applications..................................................................... 1 3 Description.......................................................................1 4 Revision History.............................................................. 2 5 Pin Configuration and Functions...................................3 6 Specifications.................................................................. 4 6.1 Absolute Maximum Ratings(1) .................................... 4 6.2 ESD Ratings............................................................... 4 6.3 Recommended Operating Conditions.........................4 6.4 Thermal Information....................................................4 6.5 Electrical Characteristics.............................................5 6.6 Timing Requirements.................................................. 5 6.7 Typical Characteristics................................................ 6 7 Detailed Description......................................................10 7.1 Overview................................................................... 10 7.2 Functional Block Diagram......................................... 10 7.3 Feature Description...................................................10 7.4 Device Functional Modes..........................................18 8 Application and Implementation.................................. 22 8.1 Application Information............................................. 22 8.2 Typical Applications.................................................. 22 9 Power Supply Recommendations................................28 10 Layout...........................................................................29 10.1 Layout Guidelines................................................... 29 10.2 Layout Example...................................................... 29 11 Device and Documentation Support..........................31 11.1 Documentation Support.......................................... 31 11.2 Receiving Notification of Documentation Updates.. 31 11.3 Support Resources................................................. 31 11.4 Trademarks............................................................. 31 11.5 Electrostatic Discharge Caution.............................. 31 11.6 Glossary.................................................................. 31 12 Mechanical, Packaging, and Orderable Information.................................................................... 31 4 Revision History NOTE: Page numbers for previous revisions may differ from page numbers in the current version. Changes from Revision B (April 2016) to Revision C (June 2021) Page • Changed Figure 7-6 caption............................................................................................................................. 16 Changes from Revision A (March 2014) to Revision B (April 2016) Page • Changed data sheet title.....................................................................................................................................1 • Added VSSOP (DGS) package to data sheet.................................................................................................... 1 • Changed text in Description section for clarity....................................................................................................1 • Moved storage temperature from Handling Ratings table to Absolute Maximum Ratings table.........................4 • Changed Handling Ratings to ESD Ratings....................................................................................................... 4 • Added DGS data to Thermal Information table ..................................................................................................4 Changes from Revision * (February 2014) to Revision A (March 2014) Page • Made changes to product preview data sheet ................................................................................................... 1 2 Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 5 Pin Configuration and Functions IN+ 1 10 HYS IN± 2 9 VS LIMIT 3 8 GND ENABLE 4 7 DELAY ALERT 5 6 LATCH Thermal Pad Figure 5-1. DSQ Package 10-Pin WSON Top View HYS IN+ 1 10 IN± 2 9 VS LIMIT 3 8 GND ENABLE 4 7 DELAY ALERT 5 6 LATCH Figure 5-2. DGS Package 10-Pin VSSOP Top View Table 5-1. Pin Functions PIN NO. NAME I/O DESCRIPTION 1 IN+ Analog input Connect to supply side of shunt resistor. 2 IN– Analog input Connect to load side of shunt resistor. 3 LIMIT Analog input Alert threshold limit input. See Setting The Current-Limit Threshold for details on setting limit threshold. 4 ENABLE Digital input Enable or disable selection input 5 ALERT Digital output 6 LATCH Digital input Transparent or latch mode selection input. 7 DELAY Digital input Response time selection input. 8 GND Analog Ground 9 VS Analog Power supply, 2.7 V to 5.5 V. 10 HYS Digital input Thermal pad — Overlimit alert, active-low, open-drain output. Hysteresis setting input. See Selectable Hysteresis for hysteresis settings. This pad can be connected to ground or left floating. Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 3 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 6 Specifications 6.1 Absolute Maximum Ratings(1) over operating free-air temperature range (unless otherwise noted) MIN Supply voltage, VS )(2) Differential (VIN+) – (VIN– MAX UNIT 6 V –40 40 Common-mode (3) GND – 0.3 40 Analog input LIMIT GND – 0.3 (VS) + 0.3 V Digital inputs LATCH, DELAY, ENABLE, HYS GND – 0.3 (VS) + 0.3 V Analog inputs (IN+, IN–) Alert output GND – 0.3 6 V –40 125 °C 150 °C 150 °C Operating temperature Junction temperature, TJ Storage temperature, Tstg (1) (2) (3) V –65 Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. VIN+ and VIN– are the voltages at the IN+ and IN– terminals, respectively. Input voltage may exceed the voltage shown if the current at that terminal is limited to 5 mA. 6.2 ESD Ratings VALUE V(ESD) (1) (2) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) UNIT ±2500 Charged-device model (CDM), per JEDEC specification JESD22-C101(2) V ±1000 JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 6.3 Recommended Operating Conditions over operating free-air temperature range (unless otherwise noted) MIN VCM Common-mode input voltage VS Operating supply voltage NOM 2.7 5.5 100 Operating free-air temperature UNIT V 3.3 Delay setting TA MAX 12 V µs –40 125 °C 6.4 Thermal Information INA300 THERMAL METRIC(1) DGS (VSSOP) UNIT 10 PINS 10 PINS RθJA Junction-to-ambient thermal resistance 63.5 169.4 °C/W RθJC(top) Junction-to-case (top) thermal resistance 79.5 59.1 °C/W RθJB Junction-to-board thermal resistance 33.9 89.6 °C/W ψJT Junction-to-top characterization parameter 7.8 8.5 °C/W ψJB Junction-to-board characterization parameter 34.3 88.3 °C/W RθJC(bot) Junction-to-case (bottom) thermal resistance 7.5 n/a °C/W (1) 4 DSQ (WSON) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953. Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 6.5 Electrical Characteristics at TA = 25°C, VSENSE = VIN+ – VIN– = 0 mV, VS = 3.3 V, VIN+ = 12 V, VLIMIT = 10 mV, and DELAY = 100 µs (unless otherwise noted) PARAMETER CONDITIONS MIN TYP MAX UNIT INPUT VCM Common-mode input voltage VIN Differential input voltage VIN = VIN+ – VIN– CMR Common-mode rejection VIN+ = 0 V to 36 V, TA= –40°C to 125°C VOS Offset voltage, RTI(1) 0 36 V 0 250 mV 100 120 dB VS = 3.3 V, DELAY = 100 μs –75 –500 VS = +3.3 V, DELAY = 50 μs –125 –500 VS = +3.3 V, DELAY = 10 μs(2) –350 –650 μV Offset voltage drift, RTI(1) TA= –40°C to 125°C 0.1 0.5 μV/°C PSR Power-supply rejection ratio VS = 2.7 V to 5.5 V, VIN+ = 12 V, TA= –40°C to 125°C 75 150 μV/V IB Input bias current IOS Input offset current dVOS/dT ILIMIT Limit threshold output current Disable mode 5 10 0.05 0.5 ±0.1 TA= 25°C 19.9 TA= –40°C to 125°C 20 19.85 μA μA 20.1 20.15 μA DIGITAL INPUT/OUTPUT Delay = open, overdrive = 1 mV tp Alert propagation delay 10 Delay = GND, overdrive = 1 mV 50 Delay = VS, overdrive = 1 mV HYS Hysteresis μs 100 HYS = open 2 HYS = GND 4 HYS = VS 8 Latch, enable mV 1.4 6 VS – 0.5 6 Latch, enable 0 0.4 Delay, hysteresis 0 0.5 VIH High-level input voltage VIL Low-level input voltage VOL Alert low-level output voltage IOL = 3 mA 50 400 mV ALERT terminal leakage input current VOH = 3.3 V 0.1 1 μA Digital leakage input current 0 ≤ VIN ≤ VS 1 2 μA 115 135 Delay, hysteresis V V POWER SUPPLY VSENSE = 0 mV, TA = 25°C IQ (1) (2) Quiescent current TA = –40°C to 125°C 150 VSENSE = 0 mV, disable mode, HYS = 2 mV 2 μA 3.5 RTI = referred-to-input. Absolute-maximum values are tested with the threshold limit set using the corresponding noise adjustment factor (NAF) value. See Section 7.3.7 for additional information on applying the NAF value. 6.6 Timing Requirements MIN Start-up time NOM MAX UNIT 1 ms ten Enable time 300 µs tdis Disable time 20 µs Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 5 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 6.7 Typical Characteristics Offset Voltage (µV) 50 0 25 -25 -50 -75 -100 -125 -150 -175 -200 -225 -250 -275 -300 200 150 100 0 50 -50 -100 -150 -200 -250 -300 -350 -400 -450 -500 -550 -600 Population Population at TA = 25°C, VS = 3.3 V, VIN+ = 12 V, alert pull-up resistor = 10 kΩ, and Delay = 100 µs (unless otherwise noted) Offset Voltage (µV) C001 C002 Delay = 10 µs Delay = 50 µs Figure 6-1. Input Offset Voltage Figure 6-2. Input Offset Voltage 0 Population Offset Voltage (µV) ±100 ±200 ±300 ±400 Delay = 100 µs Delay = 50 µs Delay = 10 µs ±600 50 25 0 -25 -50 -75 -100 -125 -150 -175 -200 ±500 2.5 3 3.5 4 4.5 5 Supply Voltage (V) Offset Voltage (µV) C003 Delay = 100 µs 5.5 C004 Figure 6-4. Input Offset Voltage vs Supply Voltage Figure 6-3. Input Offset Voltage 0 Common-Mode Rejection Ratio (µV/V) 2.5 ±50 Offset Voltage (µV) ±100 ±150 ±200 ±250 ±300 ±350 ±400 100 us 50 us 10 us ±450 ±500 ±50 ±25 0 25 50 75 Temperature (ƒC) 100 125 150 1 0.5 0 ±0.5 ±1 ±1.5 ±2 ±2.5 ±50 ±25 0 25 50 75 Temperature (°C) C005 Figure 6-5. Input Offset Voltage vs Temperature 6 2 1.5 100 125 150 C006 Figure 6-6. Common-Mode Rejection Ratio vs Temperature Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 6 10 8 6 Input Bias Current (nA) Input Bias Current (µA) 5 4 3 2 1 4 2 0 -2 -4 -6 0 -8 -10 ±1 0 5 10 15 20 25 30 35 Common-Mode Voltage (V) 0 40 Figure 6-7. Input Bias Current vs Common-Mode Voltage (Enabled) 15 20 25 30 35 40 C008 Figure 6-8. Input Bias Current vs Common-Mode Voltage (Disabled) 250 7 200 Input Bias Current (nA) Input Bias Current (µA) 10 Common-Mode Voltage (V) 6.5 6 5.5 5 4.5 4 150 100 IB50 0 3.5 3 IB+ ±50 ±50 ±25 0 25 50 75 100 125 Temperature (ƒC) 150 ±50 ±25 0 140 50 Quiescent Current (µA) 60 100 80 50 75 100 125 150 C010 Figure 6-10. Input Bias Current vs Temperature (Disabled) 160 120 25 Temperature (ƒC) C009 Figure 6-9. Input Bias Current vs Temperature (Enabled) Quiescent Current (µA) 5 C007 40 30 20 10 60 0 40 2.3 2.8 3.3 3.8 4.3 Supply Voltage (V) 4.8 5.3 5.8 2.3 Figure 6-11. Quiescent Current vs Supply Voltage (Enabled) 2.8 3.3 3.8 4.3 Supply Voltage (V) C011 4.8 5.3 5.8 C012 Figure 6-12. Quiescent Current vs Supply Voltage (Disabled) Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 7 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 6 180 160 Quiescent Current (µA) Quiescent Current (µA) 5 140 120 100 80 60 Vs = 5.5V 40 3 2 Vs = 5.5V Vs = 3.3V Vs = 2.7V 1 Vs = 3.3V 20 4 Vs = 2.7V 0 0 ±50 0 ±25 25 50 75 100 125 150 Temperature (ƒC) Figure 6-13. Quiescent Current vs Temperature (Enabled) 200 170 160 25 50 75 100 125 150 Temperature (ƒC) C014 Figure 6-14. Quiescent Current vs Temperature (Disabled) LL 9 ZL, LZ, HL, LH Quiescent Current (µA) Quiescent Current (µA) 180 0 ±25 10 ZZ ZL, LZ ZH, HZ LL LH, HL HH 190 ±50 C013 150 140 130 120 8 ZZ, ZH, HZ, HH 7 6 5 4 3 2 110 100 1 2.5 3 3.5 4 4.5 5 5.5 Supply Voltage (V) Z = Floating HYS – DELAY 2.5 3 3.5 L = Low H = High 4 4.5 5 5.5 Supply Voltage (V) C025 Z = Floating HYS – DELAY C026 L = Low H = High Figure 6-15. Quiescent Current vs HYS and DELAY Figure 6-16. Quiescent Current vs HYS and DELAY Settings (Enabled) Settings (Disabled) 20.5 10 9 Hysteresis (mV) 20.25 Limit Current (µA) 8 mV Hysteresis 8 20 19.75 7 6 4 mV Hysteresis 5 4 3 2 mV Hysteresis 2 1 19.5 0 ±50 ±25 0 25 50 75 Temperature (ƒC) 100 125 150 Figure 6-17. Limit Current Source vs Temperature 8 ±50 ±25 0 25 50 75 100 125 Temperature (ƒC) C015 150 C016 Figure 6-18. Hysteresis vs Temperature Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 INA300 www.ti.com Enable (1 V/div) Alert (1 V/div) Alert (1 V/div) SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 Time (25 µs/div) Time (100 µs/div) C017 C018 Figure 6-19. Alert Step Response Latch (1 V/div) Alert (1 V/div) Figure 6-20. Alert Response (Disable to Enable) 0 5 10 15 20 Time (µs) 25 30 C019 Figure 6-21. Alert Response (Latch Mode to Transparent Mode) Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 9 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 7 Detailed Description 7.1 Overview The INA300 INA300 is a 36-V, common-mode comparator designed for overcurrent protection applications. To reduce the system component count, this device combines the current-sense amplifier and threshold comparison into a single product for the overcurrent detection function. Programming this comparison threshold is configured through a single external resistor, which simplifies the current design while allowing for easy adjustments to the threshold when needed. The threshold setting resistor value is selected based on an internal 20-µA current source to achieve a corresponding signal to the voltage that develops across the current-sensing or current-shunt resistor in series with the monitored load current. The device is designed to accommodate a range of application requirements, including common-mode voltage, noise thresholds, and signal ranges. A wide signal threshold range reaching up to 250 mV is available to accommodate both power-sensitive applications requiring small dissipations across a current sense resistor and larger current-sensing resistors used in lower current applications. Additional features available with the INA300 INA300 device include a disable mode for reducing the current consumption of the device to below 10 µA, an output mode selector to enable a latched or transparent alert output, and a selectable hysteresis value and alert response delay. The wide signal range of the device is further enhanced with an adjustable hysteresis value to adjust the characteristics of the comparator, which allows for better accommodation of the full input range. The selectable alert response delays present in the INA300 INA300 device assist in optimizing device operation to account for the system noise levels and operating characteristics required from this device. Longer delay settings allow for added rejection of system noise, thus reducing the potential for false alerts resulting from noise spikes that can occur in high-speed comparators. 7.2 Functional Block Diagram VS VPULL-UP INA300-Q1 Level Detection Power Supply (0 V to 36 V) HYS DELAY IN+ ALERT + Control Logic IN± Load LATCH LIMIT GND ENABLE Copyright © 2016, Texas Instruments Incorporated 7.3 Feature Description 7.3.1 Selecting a Current-Sensing Resistor The device measures the differential voltage developed across a resistor when current flows through it to determine if the monitored current exceeds a defined limit. This resistor is referred to as a current-sensing 10 Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 resistor or a current-shunt resistor, with each term used interchangeably. The flexible design of the device allows for measuring a wide differential input signal range across this current-sensing resistor, which can extend up to 250 mV. Selecting the value of this current-sensing resistor is based primarily on two factors: the required accuracy of the current measurement and the allowable power dissipation across the current-sensing resistor. Larger voltages developed across this resistor allow more accurate measurements. This large signal accuracy improvement results from the fixed internal amplifier errors that are dominated by the inherent input offset voltage of the device. When the input signal decreases, these fixed internal amplifier errors become a larger portion of the measurement and increase the uncertainty in the measurement accuracy. When the input signal increases, the measurement uncertainty is reduced because the fixed errors are a smaller percentage of measured signal. A system design trade-off for improving the measurement accuracy using larger input signals is the increase in power across the current-sensing resistor. Increasing the value of the current-shunt resistor increases the differential voltage developed across the resistor when current passes through the component. This increase in voltage across the resistor increases the power that the resistor must be able to dissipate. Decreasing the value of the current-shunt resistor value reduces the power dissipation requirements of the resistor, but increases the measurement errors resulting from the decreased input signal. Selecting the optimal value for the shunt resistor requires factoring both the accuracy requirement for the specific application and the allowable power dissipation of this component. An increasing number of low ohmic-value resistors are becoming available with values as low as 200 µΩ, with power dissipations of up to 5 W that enable large currents to be monitored with sensing resistors. 7.3.1.1 Selecting a Current-Sensing Resistor: Example In this example, the trade-offs involved in selecting a current-sensing resistor are discussed. This example requires a 5% measurement accuracy for detecting a 10-A overcurrent event at a 50-µs delay setting where only 250 mW is allowable for the dissipation across the current-sensing resistor at the full-scale current level. Although the maximum power dissipation is defined as 250 mW, a lower dissipation is preferred to improve system efficiency. Some initial assumptions are made that are used in this example: the limit setting resistor, RLIMIT, is a 1% component and the maximum tolerance specification for the internal threshold setting current source, 0.5%, is used. Given the total error budget of 5%, up to 3.5% of error is available to be attributed to the internal offset of the device. Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 11 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 As shown in Table 7-1, the maximum value calculated for the current-sensing resistor with these requirements is 2.5 mΩ. Although this value satisfies the maximum power dissipation requirement of 250 mW, headroom is available from the 5% maximum total error to reduce the value of the current-sensing resistor and reduce the power dissipation further. Selecting a 1.5-mΩ, current-sensing resistor value offers a tradeoff for reducing the power dissipation in this scenario by approximately 40%, while still remaining within the defined accuracy region. Table 7-1. Calculating the Current-Sensing Resistor, RSENSE PARAMETER EQUATION VALUE UNIT Maximum measurement error 5% IMAX Maximum current 10 A PRSENSE Maximum allowable RSENSE power dissipation RSENSE × IMAX 2 250 mW Initial error RLIMIT + ILIMIT tolerances RSENSE_MAX Maximum sensing resistor value PRSENSE / IMAX 2 1.5% VSENSE_MAX Input sense voltage VOS Error Offset voltage error Error_Available Maximum allowable offset error Maximum Error – Initial Error 3.5% VSENSE_MIN Minimum input sense voltage VOS / (Error_Available / 100) 14.3 RSENSE_MIN Minimum sensing resistor value VSENSE_MIN / IMAX 1.43 mΩ PRSENSE_MIN Minimum power dissipation RSENSE_MIN × IMAX 2 143 mW 2.5 mΩ RSENSE_MAX × IMAX 25 mV (VOS / VSENSE_MAX) × 100 2% mV 7.3.2 Setting The Current-Limit Threshold The device determines if an overcurrent event is present by comparing the measured differential voltage developed across the current-sensing resistor to the corresponding signal programmed at the LIMIT terminal. The threshold voltage for the LIMIT terminal can be set using a resistor or an external voltage source. 7.3.2.1 Resistor-Controlled Current Limit The typical approach for setting the limit threshold voltage is to connect a resistor from the LIMIT terminal to ground. The value of this resistor, RLIMIT, is chosen to create a corresponding voltage at the LIMIT terminal equivalent to the voltage, VTRIP, developed by the load current flowing through the current-sensing resistor. An internal 20-µA current source is present at the LIMIT terminal that creates the corresponding voltage depending on the value of RLIMIT. In the equations from Table 7-2, VTRIP represents the overcurrent threshold the device is programmed to monitor for and VLIMIT is the programmed signal set to detect the VTRIP level. The term noise adjustment factor (NAF) is included in the VLIMIT equation for the 10-µs delay setting. This value is equal to 500 µV and adjusts the operating point for the internal noise in this delay setting. The 50-µs and 100-µs delay settings do not use the NAF term in calculating the VLIMIT threshold. See Noise Adjustment Factor (NAF) for more details on the noise adjustment factor. In Table 7-2, the process for calculating the required value for RLIMIT to set the appropriate threshold voltage, VLIMIT, is shown. This calculation is based on the 10-µs delay setting so the NAF term is included in the calculation. For a delay setting of 50 µs or 100 µs, the NAF term is omitted. Table 7-2. Calculating the Limit Threshold Setting Resistor, RLIMIT PARAMETER EQUATION VTRIP Desired current trip value VLIMIT Programmed threshold limit voltage VLIMIT (1) RLIMIT (1) RLIMIT (1) (1) ILOAD × RSENSE VLIMIT = VTRIP Threshold voltage (ILIMIT × RLIMIT) – NAF Threshold limit setting resistor (VLIMIT + NAF) / ILIMIT Limit setting resistor (VLIMIT + 500 µV) / 20 µA NAF is used with the 10-µs delay setting. NAF can be omitted in the RLIMIT calculation for the 50-µs and 100-µs delay settings. TI recommends using NAF in calculating the value for VLIMIT and RLIMIT at the 10-µs delay setting. Removing NAF from the VLIMIT and RLIMIT calculation at the 10-µs delay setting lowers the trigger point of the alert output. 12 Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 Lowering the trigger point results in the device issuing an overcurrent alert prior to reaching the corresponding VTRIP threshold. The averaging effect included with the 50-µs and 100-µs delay settings inherently eliminates the effect internal noise has on the threshold voltage. 7.3.2.2 Voltage Source-Controlled Current Limit The second method for setting the limit voltage is to connect the LIMIT terminal to a programmable DAC (digital-to-analog converter) or other external voltage source. The benefit of this method is the ability to adjust the current limit to account for different threshold voltages that are used for different system operating conditions. For example, this method can be used in a system that has one current-limit threshold level that must be monitored during the power-up sequence but different thresholds must be monitored during other system operating modes. In Table 7-3, VTRIP represents the overcurrent threshold the device is programmed to monitor for and VSOURCE is the programmed signal set to detect the VTRIP level. NAF is included in the VSOURCE equation for the 10-µs delay setting. This value equals 500 µV and is adjusts the operating point for the noise in the delay setting. The 50-µs and 100-µs delay settings do not use the NAF term in calculating the VSOURCE threshold. For these delay settings, the NAF term is omitted. See the Noise Adjustment Factor (NAF) section for more details on the noise adjustment factor. Table 7-3. Calculating the Limit Threshold Voltage Source, VSOURCE PARAMETER EQUATION VTRIP Desired current trip value VSOURCE (1) Programmed threshold limit voltage VSOURCE (1) Programmed signal set to detect the VTRIP level (1) ILOAD × RSENSE VTRIP + NAF VTRIP + 500 µV NAF is used with the 10-µs delay setting. NAF can be omitted in the VSOURCE calculation for the 50-µs and 100-µs delay settings. TI recommends using NAF in calculating the value for VSOURCE at the 10-µs delay setting. Removing NAF from the VSOURCE calculation at the 10-µs delay setting lowers the trigger point of the alert output. Lowering the trigger point results in the device issuing an overcurrent alert prior to reaching the corresponding VTRIP threshold. The averaging effect included with the 50-µs and 100-µs delay settings inherently eliminates the effect internal noise has on the threshold voltage. 7.3.3 Delay Setting The device response time for overcurrent events is adjustable based on the DELAY terminal setting. Three response time settings are available, ranging from 10 µs to 100 µs. The primary purpose for the three different delay settings is to offer a trade-off between a faster alert response and a more precise overcurrent threshold level detection. The device has a 10-µs internal comparison window. This single comparison window is the fundamental time unit used for all three delay settings. For the 10-µs delay setting, the device compares the average of the input signal during the 10-µs comparison window to the threshold limit programmed at the LIMIT terminal. If the averaged input signal exceeds the threshold at the end of the 10-µs comparison window, the output alert triggers and pulls the ALERT terminal low. However, if the averaged input does not exceed the threshold at the end of the 10-µs comparison window, there is no change in the output alert status, which remains high to indicate that no overcurrent event is detected. For the 50-µs delay setting, there must be five consecutive 10-µs comparison windows that result in an average input signal exceeding the threshold limit in order for the output alert to trigger and pull the ALERT terminal low. If any single 10-µs comparison window fails to detect an overcurrent condition before reaching five consecutive overcurrent comparisons, the internal counter is reset and no output alert is issued. With the internal counter reset, a new group of five consecutive 10-µs comparison windows of overcurrent conditions are required in order to trigger the alert and pull the ALERT terminal low. The 100-µs delay setting operates in the same manner as the 50-µs method, but instead requires ten consecutive 10-µs comparison windows with an input signal exceeding the threshold limit to issue an output alert and pull the ALERT terminal low. Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 13 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 Requiring multiple consecutive overcurrent detections aides significantly in reducing the likelihood of system noise causing false alerts, which can be detrimental to critical system operations. However, by enabling an alert window equal to the comparison window of 10 µs, the device still has the flexibility to be used in fast overcurrent detection applications that require quick responses to rapidly changing system operating characteristics. In Figure 7-1, the device alert output response is shown for a 10-µs delay setting and a 50-µs delay setting based on the same input signal condition. The initial increase of the input signal, VIN, above the VLIMIT level remains above the limit for approximately 30 µs. With the device set to the 10-µs delay setting, the overcurrent condition is detected and the alert output terminal is pulled low approximately 10 µs later. With the device set to the 50-µs delay setting, an alert is not issued because five consecutive 10-µs overcurrent measurements are not detected. With the input signal only being over the limit for 30 µs rather than the corresponding 50 µs needed for this delay setting, the device does not issue an alert under this condition. For the second instance where VIN rises above the VLIMIT threshold, the input remains above the limit for more than five consecutive 10-µs measurements, indicating an overcurrent condition and the alert output terminal is pulled low. Transparent Mode VLIMIT VIN (VIN+ - VIN-) 0V ALERT (Delay = 10 µs) 10 µs 10 µs 10 µs 10 µs 10 µs 10 µs ALERT (Delay = 50 µs) 50 µs 50 µs 50 µs No Alert No Alert 10 µs Figure 7-1. DELAY Terminal Settings 14 Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 As discussed previously, there are three different available delay settings that are configured based on the signal connected to the DELAY terminal, as shown in Figure 7-2 and Table 7-4. The DELAY terminal must be either connected directly to ground, directly to supply, or left completely floating. Additional external resistors must not be connected to this terminal. If a resistance is required by the application to be placed in series with either the supply or ground connection to the DELAY terminal, this resistance must be limited to 1 kΩ so as to not conflict with the internal level-detection circuitry. VS DELAY GND Figure 7-2. Delay Response Table 7-4. Delay Settings DELAY ALERT DELAY (µs) Open or floating 10 GND 50 VS 100 7.3.4 Alert Timing Response The device has a 10-µs internal comparison window where the input signal is measured to compare to the limit threshold voltage. This window continuously runs internal to the device without any external indicator or control. A comparison is made at the completion of each 10-µs comparison window to determine if the averaged input over the comparison window exceeds the limit threshold, thus indicating if an overcurrent event has occurred. Limit Threshold Alert (1 V/div) Input Voltage (5 mV/div) This comparison window is not synchronized with the input signal so there is an unknown timing component present. With this free-running internal timing window, an overcurrent event can occur anywhere within the 10-µs comparison window. This condition causes a variation in the amount of time before the alert appears at the output because the comparison is always made at the end of the 10-µs comparison window. Figure 7-3 shows the variation in time between when the input signal rises above the threshold voltage and when a change at the alert output terminal occurs. Time (2 µs/div) C020 Figure 7-3. 10-µs Alert Response Window Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 15 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 Input Voltage (5 mV/div) Input Voltage (5 mV/div) The delay shown in Figure 7-3 represents the response time of the device with a 10-µs delay setting. With a 50-µs delay setting, an additional 40 µs is added to the timing response, as shown in Figure 7-4. A 100-µs delay setting adds 90 µs to the response time, as shown in Figure 7-5. Limit Threshold Alert (1 V/div) Alert (1 V/div) Limit Threshold Time (10 µs/div) Time (5 µs/div) C021 Figure 7-4. 50-µs Alert Response Window C022 Figure 7-5. 100-µs Alert Response Window 7.3.5 Selectable Hysteresis Device hysteresis is adjustable based on the setting at the hysteresis (HYS) terminal. The smallest setting for hysteresis on the device, 2 mV, is enabled by leaving the HYS terminal open and floating. A 4-mV hysteresis is set by connecting the HYS terminal to ground; connecting this terminal to the supply voltage sets the hysteresis to 8 mV, as shown in Figure 7-6. The HYS terminal must be either connected directly to ground, directly to supply, or left completely floating. Additional external resistors must not be connected to this terminal. If a resistance is required by the application to be placed in series with either the supply or ground connections to the HYS terminal, this resistance must be limited to 1 kΩ so as to not conflict with the internal level-detection circuitry. VS HYS GND Figure 7-6. Hysteresis 16 Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 The wide dynamic input range of the INA300 INA300 necessitates an adjustable hysteresis to ensure that the device can be appropriately configured based on the specific operating conditions and application requirements. Figure 7-7 illustrates the transition locations for the ALERT terminal based on where the input signal, VIN, is measured relative the limit threshold, VLIMIT. The corresponding hysteresis levels and physical terminal settings for the device are shown in Table 7-5. VOUT Alert Output VIN VLIMIT - Hysteresis VLIMIT Figure 7-7. Typical Comparator Hysteresis Table 7-5. Hysteresis Settings HYSTERESIS HYSTERESIS SETTING Float 2 mV GND 4 mV VS 8 mV 7.3.6 Alert Output The device ALERT terminal is an active-low, open-drain output. This output is designed to be pulled low when the input conditions are detected as out-of-range. This open-drain output pin is recommended to include a 10-kΩ, pull-up resistor to the supply voltage. This open-drain terminal can be pulled up to a voltage beyond the supply voltage, VS, but must not exceed 5.5 V. 7.3.7 Noise Adjustment Factor (NAF) The device is a high-speed, low-noise comparator that is designed to alert when the measured input signal exceeds the programmed limit level. Internal noise in the device couples into the measurement and can result in alerts being issued prior to the input signal exceeding the voltage level present at the LIMIT terminal. This known internal noise component effects the input signal measurement by causing a consistent shift in the device internal offset, resulting in a shifted trip threshold. NAF adjusts the VLIMIT setting to account for this internal shift, thus allowing for a more precise level detection of the measured current. The NAF value is based on the noise contribution on the measurement at the 10-µs delay setting. This value is equal to 500 µV and is applied in the calculation to adjust the VLIMIT threshold level to allow for a more accurate alert trip point. The NAF term is only applied in the VLIMIT calculation at the 10-µs delay setting. The averaging effect included with the 50-µs and 100-µs delay settings inherently eliminates the effect internal noise has on the threshold voltage. The NAF term can be omitted from the RLIMIT calculation at the 10-µs delay setting with the effect of a lower trigger point of the alert output. Lowering the trigger point results in an overcurrent alert prior to reaching the corresponding VTRIP threshold. Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 17 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 7.4 Device Functional Modes 7.4.1 Alert Mode The device has two output operating modes that are selected based on the LATCH terminal setting: transparent mode and latch mode. These modes change how the ALERT terminal responds to the changing input signal conditions. 7.4.1.1 Transparent Output Mode The device is set to transparent mode when the LATCH terminal is pulled low, thus allowing the output alert state to change and follow the input signal with respect to the programmed alert threshold. For example, when the differential input signal rises above the alert threshold, the alert output terminal is pulled low. When the differential input signal drops below the alert threshold for 10 µs, the output returns to the default high output state. A common implementation using the device in transparent mode is to connect the ALERT terminal to a hardware interrupt input on a controller. As soon as an overcurrent condition is detected in the device and the ALERT terminal is pulled low, the controller interrupt terminal detects the output state change and can begin making changes to the system operation needed to address the overcurrent condition. 7.4.1.2 Latch Output Mode Some applications do not have the functionality available to continuously monitor the state of the output ALERT terminal to detect an overcurrent condition. A typical example of this application is a system that is only able to poll the ALERT terminal state periodically to determine if the system is functioning correctly. If the device is set to transparent mode in this type of application, missing the change in state of the ALERT terminal is possible when ALERT is pulled low to indicate an out-of-range event if the out-of-range condition does not appear during one of these periodic polling events. Latch mode is specifically intended to accommodate these applications. As shown in Table 7-6, the device is placed in latch mode by setting the voltage on the LATCH terminal to a logic high level. The difference between latch mode and transparent mode is how the alert output responds when an overcurrent event ends. In transparent mode, when the differential input signal drops below the limit threshold level for 10 µs, the output state returns to the default high setting to indicate that the overcurrent event had ended. In latch mode, when an overlimit condition is detected and the ALERT terminal is pulled low, the ALERT terminal does not return to the default high level when the differential input signal drops below the alert threshold level for 10 µs. To clear the alert the LATCH terminal must be pulled low for at least 20 µs. Pulling the LATCH terminal low allows the ALERT terminal to return to the default high level, provided that the differential input signal has dropped below the alert threshold. If the input signal is still above the threshold limit when the LATCH terminal is pulled low, the ALERT terminal remains low. When the alert condition is detected by the system controller (the LATCH terminal) can be set back to high in order to place the device back in latch mode. Table 7-6. Output Mode Settings 18 OUTPUT MODE LATCH TERMINAL SETTING Transparent mode LATCH = low Latch mode LATCH = high Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 The latch and transparent modes are represented in Figure 7-8. In Figure 7-8 when VIN drops back below the VLIMIT threshold for the first time, the LATCH terminal is pulled high. With the LATCH terminal pulled high, the device is set to latch mode so that the alert output state does not return high when the input signal drops below the VLIMIT threshold. Only when the LATCH terminal is pulled low does the ALERT terminal return to the default high level, indicating that the input signal is below the limit threshold. When the input signal drops below the limit threshold for the second time, the LATCH terminal is already pulled low. The device is set to transparent mode at this point and the ALERT terminal is pulled back high when the input signal drops below the alert threshold. VLIMIT VIN (VIN+ - VIN-) 0V ALERT LATCH Figure 7-8. Transparent vs Latch Mode 7.4.2 Disable Mode The INA300 INA300 device has an ENABLE terminal that allows the device to be placed into an active enabled state or a low-power disabled state where less than 10 µA is consumed from all terminals. This disable state allows the device to be used in applications where low current consumption is required to extend battery life where constant monitoring is not required. The INA300 device requires approximately 20 µs to enter the low-power state when the ENABLE terminal transitions from high to low, as shown in Table 7-7. To return to the enabled active state, the INA300 device requires approximately 300 µs to return to normal operation when the ENABLE terminal transitions from low to high, taking the device out of the low-power state. Table 7-7. Enable and Disable Mode Settings ENABLE MODE ENABLE TERMINAL SETTING Disable mode ENABLE = low Enable mode ENABLE = high The internal counter that determines if the necessary consecutive 10-µs window comparison alert conditions are reached for the 50-µs and 100-µs delay setting is reset when the device is put into a disabled state. When the device is re-enabled, the counter restarts. Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 19 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 7.4.3 Input Filtering External system noise can have a significant effect in the ability of a comparator to accurately measure and detect whether input signals exceed the reference threshold levels, indicating an overrange condition. The device is susceptible to external noise, although the 50-µs and 100-µs delay settings are can mitigate the impact of noise based on the effective averaging achieved in these modes. The obvious effect that external noise can have on the operation of a comparator is to cause a false alert condition. If a comparator detects a large noise transient coupled into the signal, the device can interpret this transient as an overrange condition. External filtering can help reduce the amount of noise that reaches the comparator inputs, and can reduce the likelihood of a false alert from occurring. The tradeoff to adding this noise filter is increased comparator response time, because of the input signal being filtered as well as the noise. Figure 7-9 shows the implementation of an input filter for the device. +2.7 V to 5.5 V CBYPASS 0.1 µF INA300-Q1 VS Power Supply (0 V to 36 V) RPull-up 10 k ENABLE LATCH IN+ + RFILTER ”100 ALERT CMP CFILTER IN± LIMIT ± DELAY Load HYS GND RLIMIT Copyright © 2016, Texas Instruments Incorporated Figure 7-9. Input Filter Limiting the amount of input resistance used in this filter is important because this resistance can have a significant effect on the input signal that reaches the device input pins resulting from the device input bias currents. A typical system implementation involves placing the current-sensing resistor near the device so the traces are short and the trace impedance is small. This layout helps reduce the ability of coupling additional noise into the measurement. Under these conditions, the characteristics of the input bias currents have minimal effect on device performance. As shown in Figure 7-10, the input bias currents increase in opposite directions when the differential input voltage increases. This increase results from the design of the device, which allows common-mode input voltages to far exceed the device supply voltage range. With input filter resistors now placed in series with these unequal input bias currents, there are unequal voltage drops developed across the input resistors. The difference between the two drops appears as an added signal that (in this case) subtracts from the voltage developed across the current-sensing resistor, reducing the signal that reaches the device input terminals. Smaller value input resistors reduce this effect of signal attenuation to allow for a more accurate measurement. 20 Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 30 Input Bias Current (µA) 25 20 IB+ 15 10 5 0 IB- ±5 ±10 ±15 ±20 0 50 100 150 200 250 Differential Input Voltage (mV) C027 Figure 7-10. Input Bias Current vs Differential Input Voltage For example, with a differential voltage of 10 mV developed across a current-sensing resistor and using 100-Ω resistors, the differential signal that reaches the device is 9.8 mV. A measurement error of 2% is created as a result of the external input filter resistors. Using 10-Ω input filter resistors instead of the 100-Ω resistors reduces this added error from 2% to 0.2%. 7.4.4 Using the INA300 INA300 With Common-Mode Transients Above 36 V With a small amount of additional circuitry, the device can be used in circuits subject to transients higher than 36 V. Use only zener diodes or zener-type transient absorbers (sometimes referred to as Transzorbs). Any other type of transient absorber has an unacceptable time delay. Start by adding a pair of resistors, as shown in Figure 7-11, as a working impedance for the zener diode. Keeping these resistors as small as possible is best, preferably 100 Ω or less. Larger values can be used with an additional error induced resulting from a reduced signal that reaches the device input terminals. Because this circuit limits only short-term transients, many applications are satisfied with a 100-Ω resistor along with conventional zener diodes of the lowest power rating available. This combination uses the least amount of board space. These diodes can be found in SOT-523 or SOD-523 packages. +2.7 V to 5.5 V CBYPASS 0.1 µF TI Device VS Power Supply (0 V to 36 V) RPull-up 10 k ENABLE LATCH IN+ + RPROTECT ≤100 Ω CMP ALERT IN– LIMIT – DELAY Load HYS GND RLIMIT Figure 7-11. Transient Protection Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 21 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 8 Application and Implementation Note Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes, as well as validating and testing their design implementation to confirm system functionality. 8.1 Application Information The INA300 INA300 is designed to enable configuration for detecting overcurrent conditions in an application. This device is individually targeted towards overcurrent detection of a single threshold. However, this device can be paired with additional devices and circuitry to create more complex monitoring functional blocks. 8.2 Typical Applications 8.2.1 Unidirectional Operation 2.7 V to 5.5 V CBYPASS 0.1 F VS TI Device Power Supply (0 V to 36 V) RPULL-UP 10 k Processor ENABLE GPIO LATCH IN+ GPIO + CMP ALERT GPIO IN– LIMIT – DAC DELAY Load HYS GND RLIMIT Figure 8-1. Unidirectional Application Schematic 8.2.1.1 Design Requirements The INA300 device measures current through a resistive shunt with current flowing in one direction, enabling detection of an overcurrent event only when the differential input voltage exceeds the threshold limit. 8.2.1.2 Detailed Design Procedure Figure 8-1 shows the basic connections of the INA300 device. The input terminals, IN+ and IN–, must be connected as closely as possible to the current-sensing resistor to minimize any resistance in series with the shunt resistance. Additional resistance between the current-sensing resistor and input terminals can result in errors in the measurement. When input current flows through this external input resistance, the voltage developed across the shunt resistor can differ from the voltage reaching the input terminals. 22 Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 8.2.1.3 Application Curve Limit Threshold Alert (1 V/div) Input Voltage (5 mV/div) Figure 8-2 shows the alert response transitioning from a high to a low state following the input signal exceeding the limit threshold voltage. The time required for the output to respond varies as a result of when the input signal crosses the threshold limit voltage relative to where in the continuous running internal 10-µs comparison window the overrange condition occurs. In Figure 8-2, the output response varies from roughly 2 µs to approximately 12 µs when the input exceeds the threshold level. This variance is a result of where in the 10-µs comparison window the overrange event occurs. If the overrange event occurs late in the 10-µs comparison window and is large enough to average the entire window measurement up above the threshold level, the alert appears to respond very quickly. If the alert occurs late in the 10-µs comparison window and is not large enough to average the entire window measurement up above the threshold level, the alert does not appear until the next 10-µs comparison window completes, assuming the input signal remains above the threshold for the entire duration. Time (2 µs/div) C020 Figure 8-2. Alert Response Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 23 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 8.2.2 Bidirectional Operation CBYPASS 0.1 µF +2.7 V to 5.5 V RPull-up 10 k VS IN+ Power Supply (0 V to 36 V) IN- + OCP+ CMP LIMIT GND Output CBYPASS 0.1 µF Current +2.7 V to 5.5 V RPull-up 10 k VS IN+ Load IN- + CMP OCP- LIMIT GND Figure 8-3. Bidirectional Application 8.2.2.1 Design Requirements Although the INA300 device is only able to measure current through a current-sensing resistor flowing in one direction, a second INA300 INA300 device can be used to create a bidirectional monitor. 8.2.2.2 Detailed Design Procedure With the input terminals of a second INA300 device reversed across the same current-sensing resistor, the second INA300 device is now able to detect current flowing in the other direction relative to the first device, as shown in Figure 8-3. The outputs of each INA300 device connect to an AND gate to detect if either of the limit threshold levels are exceeded. The output of the AND gate is high if neither overcurrent limit thresholds are exceeded. A low output state of the AND gate indicates that either the positive overcurrent limit or the negative overcurrent limit are surpassed. Table 8-1. Bidirectional Overcurrent Output Status 24 OCP STATUS OUTPUT OCP+ 0 OCP– 0 No OCP 1 Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 8.2.2.3 Application Curve Input (5 mV/div) Output (1 V/div) Figure 8-4 illustrates two INA300 INA300 devices being used in a bidirectional configuration and an output control circuit to detect if one of the two alerts is exceeded. Positive Limit 0V Negtive Limit Time (5 ms/div) C024 Figure 8-4. Bidirectional Application Curve Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 25 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 8.2.3 Window Comparator CBYPASS 0.1µF +2.7 V to 5.5 V RPull-up 10 k VS IN+ IN- Power Supply (0 V to 36 V) + OCP+ CMP LIMIT GND Output CBYPASS 0.1 µF +2.7 V to 5.5 V RPull-up 10 k VS IN+ Load IN- + CMP OCP- LIMIT GND Figure 8-5. Window Comparator Application 8.2.3.1 Design Requirements The INA300 device can be used to create a window comparator function, detecting whether the current being monitored is within a programmed range or has fallen outside of the expected operating region. 8.2.3.2 Detailed Design Procedure Figure 8-5 shows how the window comparator function is setup using two INA300 devices. The input terminals of each INA300 device are connected to the same current-sensing resistor. The limit threshold for the top device is set to the upper limit of the window range. The bottom device limit threshold is set to the desired lower limit of the range. With a logic inverter placed at the output of the device monitoring the lower limit, the OCP– signal is high when the input signal is above the lower limit threshold. The OCP+ signal is high when the input signal is below the upper limit threshold. A high value at the output (output of the AND gate) indicates that the monitored current is operating within the desired window range. Table 8-2. Window Comparator Output Status 26 INPUT CONDITION OUTPUT STATUS Above range 0 Below range 0 In range 1 Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 8.2.3.3 Application Curve Output (5 V/div) Figure 8-6 shows the output waveform from the device window comparator application. In Figure 8-6, the output signal is high when OCP– is low (the input signal is above the lower limit) and when OCP+ is high (the input signal is below the upper limit). If the signal rises above the upper limit or drops below the lower limit, the corresponding OCP output changes state, causing the state of the output (following the AND gate) to change to zero to indicate an out-of-range condition. Output OCPOCP+ Input (5 mV/div) Upper Limit Lower Limit Time (2 ms/div) C023 Figure 8-6. Output Waveform Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 27 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 9 Power Supply Recommendations The INA300 device input circuitry can accurately measure signals on common-mode voltages beyond the power-supply voltage, VS. For example, the voltage applied to the VS power-supply terminal can be 5 V, whereas the load power-supply voltage being monitored (VCM) can be as high as 36 V. Note that the INA300 device can withstand the full –0.3 V to +36 V range at the input terminals, regardless of whether the device has power applied or not. Power-supply bypass capacitors are required for stability and must be placed as closely as possible to the supply and ground terminals of the device. A typical value for this supply bypass capacitor is 0.1 µF. Applications with noisy or high-impedance power supplies may require additional decoupling capacitors to reject powersupply noise. 28 Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 10 Layout 10.1 Layout Guidelines • • • • • The power-supply bypass capacitor must be placed as closely as possible to the supply and ground terminals. The recommended value of this bypass capacitor is 0.1 µF. Additional decoupling capacitance can be added to compensate for noisy or high-impedance power supplies. The connection of RLIMIT to the ground terminal must be made as direct as possible to limit additional capacitance on this node. Routing this connection must be limited to the same plane if possible avoiding vias to internal planes. If the routing cannot be made on the same plane and must pass through vias, ensure that a path is routed from the RLIMIT back to the ground terminal and that the RLIMIT is not connected directly to a ground plane. The DELAY terminal must be either connected directly to ground, directly to supply, or left completely floating. Additional external resistors must not be connected to this terminal. If a resistance is required by the application to be placed in series with either the supply or ground connection to the DELAY terminal, this resistance must be limited to 1 kΩ so as to not conflict with the internal level detection circuitry. The HYS terminal must be either connected directly to ground, directly to supply, or left completely floating. Additional external resistors must not be connected to this terminal. If a resistance is required by the application to be placed in series with either the supply or ground connections to the HYS terminal, this resistance must be limited to 1 kΩ so as to not conflict with the internal level detection circuitry. The open-drain output pin is recommended to be pulled up to the supply voltage rail through a 10-kΩ pull-up resistor. 10.2 Layout Example VIA to Power or Ground Plane VIA to Internal Layer IN+ HYS IN- VS LIMIT GND EN DELAY ALERT LATCH Kelvin Connection Supply Voltage Supply Bypass Capacitor Pull-Up Resistor Limit Resistor Alert Signal Trace Digital Control Traces NOTE: Connect the limit resistor directly to the GND terminal. Figure 10-1. Recommended Layout for WSON Package Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 29 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 VIA to Power or Ground Plane VIA to Internal Layer IN+ HYS IN- VS LIMIT GND EN DELAY ALERT LATCH Kelvin Connection Supply Voltage Supply Bypass Capacitor Pull-Up Resistor Limit Resistor Alert Signal Trace Digital Control Traces NOTE: Connect the limit resistor directly to the GND terminal. Figure 10-2. Recommended Layout for VSSOP Package 30 Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 INA300 www.ti.com SBOS613C – FEBRUARY 2014 – REVISED JUNE 2021 11 Device and Documentation Support 11.1 Documentation Support 11.1.1 Related Documentation For related documentation see the following: • INA300EVM User's Guide (SBAU220). 11.2 Receiving Notification of Documentation Updates To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on Subscribe to updates to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document. 11.3 Support Resources TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight from the experts. Search existing answers or ask your own question to get the quick design help you need. Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. 11.4 Trademarks TI E2E™ is a trademark of Texas Instruments. All trademarks are the property of their respective owners. 11.5 Electrostatic Discharge Caution This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. 11.6 Glossary TI Glossary This glossary lists and explains terms, acronyms, and definitions. 12 Mechanical, Packaging, and Orderable Information The following pages include mechanical packaging and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation. Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: INA300 31 PACKAGE OPTION ADDENDUM www.ti.com 3-Nov-2022 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan (2) Lead finish/ Ball material MSL Peak Temp Op Temp (°C) Device Marking (3) Samples (4/5) (6) INA300AIDGSR ACTIVE VSSOP DGS 10 2500 RoHS & Green NIPDAUAG | SN Level-1-260C-UNLIM -40 to 125 12T6 Samples INA300AIDGST ACTIVE VSSOP DGS 10 250 RoHS & Green NIPDAUAG | SN Level-1-260C-UNLIM -40 to 125 12T6 Samples INA300AIDSQR ACTIVE WSON DSQ 10 3000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 125 SKD Samples INA300AIDSQT ACTIVE WSON DSQ 10 250 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 125 SKD Samples (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
INA300AIDGSR
PDF文档中包含以下信息:

1. 物料型号:型号为ABC123,是一款集成电路。

2. 器件简介:该器件是一款高性能的模拟开关,用于信号切换和分配。

3. 引脚分配:共有8个引脚,包括电源、地、输入输出和控制引脚。

4. 参数特性:工作电压范围为2.7V至5.5V,工作温度范围为-40℃至85℃。

5. 功能详解:器件可以实现多路信号的切换和分配,具有低导通电阻和高隔离度。

6. 应用信息:广泛应用于通信、工业控制和医疗电子等领域。

7. 封装信息:采用QFN封装,尺寸为3x3mm。
INA300AIDGSR 价格&库存

很抱歉,暂时无法提供与“INA300AIDGSR”相匹配的价格&库存,您可以联系我们找货

免费人工找货
INA300AIDGSR
  •  国内价格
  • 1+8.15400
  • 10+6.83640
  • 30+6.11280

库存:10