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LM5068EVAL

LM5068EVAL

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    -

  • 描述:

    EVALUATION BOARD FOR LM5068

  • 数据手册
  • 价格&库存
LM5068EVAL 数据手册
User's Guide SNVA089A – May 2004 – Revised May 2013 AN-1326 LM5068 Evaluation Board 1 Introduction The LM5068 evaluation board is designed to provide the design engineer with a fully functional hot-swap controller board to evaluate the performance of LM5068 hot-swap controller IC, in a typical environment. The evaluation board is designed using the LM5068-2 (active high Power Good and Fault auto retry version). This application report explains the apparatus needed and method of operation to the user of the evaluation board. The LM5068 Negative Voltage Hot Swap Controller (SNVS254) should be consulted in conjunction with this user's guide. The performance of the evaluation board is: • Input range: -10V to -90V • Transient voltage rating : -100V (absolute maximum) • Maximum continuous load current: 1.0A • Maximum short-circuit current : 2.4A • Board Size: 58.5 mm × 31.8mm 2 Theory of Operation The LM5068 features all of the functions needed to implement hot-swap capability and intelligent control of power supply connections during the insertion and removal of circuit cards powered by live system backplanes as shown in Figure 1. PLUG-IN BOARD + LIVE BACKPLANE LM5068 CL DC-DC CONVERTER VDD (GND) VEE (-48V) Figure 1. Live System Backplanes The LM5068 provides both inrush current control and minimizes power supply transients in the backplane caused by the insertion of additional circuit cards. Once the turn-on sequence is completed, the LM5068 monitors the load current and provides overload protection. The LM5068 controls the external N-Channel MOSFET to provide programmable load current limiting and circuit breaker functions using a single external current sense resistor. The LM5068 issues a power good (PWRGD) signal at the conclusion of a successful power-on sequence. Input over-voltage or under-voltage fault conditions will cancel the PWRGD indication. The LM5068-1 and -2 indicate power good as an open-drain active high PWRGD state. The LM5068-3 and -4 indicate power good as an open-drain active low PWRGD state. The LM5068 is available in MSOP-8 package. The evaluation board schematic is shown in Figure 2. All trademarks are the property of their respective owners. SNVA089A – May 2004 – Revised May 2013 Submit Documentation Feedback AN-1326 LM5068 Evaluation Board Copyright © 2004–2013, Texas Instruments Incorporated 1 Theory of Operation www.ti.com GND GND J1 J2 -48V TP8 UV/OV TP1 VDD R10 499: R1 0: R5 100k: + C5 100PF + -48V C6 0.1PF TP4 UV R2 100k: VEE U1 TP5 OV R3 4.02k: VDD 8 OV TIMER 7 UV GATE 6 SENSE 5 1 PWRGD 2 3 TP6 TIMER + R4 3.40k: 4 C2 NOT USED + VEE R9 0: + TP7 GATE LM5068 C1 NOT USED C4 0.33PF VEE + R6 0: C3 22nF Q1 SUB85N10-10 R7 50m: : F1 10A TP2 VEE R8 0: TP3 SENSE Figure 2. Evaluation Board Schematic The apparatus required to test the evaluation board is: • 100V/ 5A DC power supply • 2 or 4 channel analog or digital storage oscilloscope • Two RMS voltmeters (DVM) with floating inputs Care must be exercised while operating at high input voltages. 2 AN-1326 LM5068 Evaluation Board SNVA089A – May 2004 – Revised May 2013 Submit Documentation Feedback Copyright © 2004–2013, Texas Instruments Incorporated Operational Description of the Evaluation Board www.ti.com 3 Operational Description of the Evaluation Board The operation of LM5068 hot-swap controller embedded on a plug-in board can be categorized into three parts: • Start-up and inrush current limiting • Auto retry following the detection of a fault • Load disconnect and power limiting during fault 3.1 Start-up and Inrush Current Limit Whenever a circuit card with large electrolytic capacitors is inserted into a live backplane, large inrush currents will occur. These surge currents can cause the backplane voltage to drop, which can reset or otherwise interfere with adjacent boards. The current surges can also affect connector pins, burn out PCB traces and can interfere with data by generating EMI. The LM5068 actively limits inrush currents, which limits load voltage slew rate (ΔV/Δt). The LM5068 has active current limiting threshold of 100mV, and an RSENSE equal to 50mΩ, therefore the maximum current is limited to 2.0A (see Figure 3). 1 2 ms 2.00V 5.06V 1 2 2 ms 20.0V 50.6V 2 3 2 ms 0.50A 1.26A 3 4 2 ms 5.0V 12.6V 4 CH1: Timer Pin Voltage CH2: Voltage Across MOSFET Switch CH3: Load Current CH4: Gate Voltage Figure 3. Start-Up Characteristics 3.2 Auto Retry During Faults If the fault conditions persist long enough for TIMER pin to charge CT to 4V, the LM5068 latches off (LM5068-1, -3) or switches off and initiates the re-try timer (LM5068-2, -4). The LM5068-1 and LM5068-3 remains off until the controller is reset by either temporarily pulling the UV pin low, pulling the TIMER pin below 1 volt, or decreasing the input voltage below the internal VDD undervoltage lockout (UVLO) threshold. The LM5068-2 and LM5068-4 respond to a fault condition by pulling the GATE and TIMER pins low and then initiating a timer sequence for automatic re-try. The re-try timer sequence begins with CT capacitor being charged slowly to 4V with a 6µA current source and then discharged quickly to 1V with a 30mA discharge current. After eight charge/discharge cycles the GATE pin is released and charged with a 60µA current source. If the fault condition persists, the LM5068 will again turn off the MOSFET and another 8cycle fault timer sequence will begin. The Evaluation board is provided with a LM5068-2 , which features the auto retry following a fault detection (see Figure 4). SNVA089A – May 2004 – Revised May 2013 Submit Documentation Feedback AN-1326 LM5068 Evaluation Board Copyright © 2004–2013, Texas Instruments Incorporated 3 Operational Description of the Evaluation Board www.ti.com 1 0.2 s 2.00V 3.10V 1 2 0.2 s 2.00V 3.10V 2 3 0.2 s 0.50A 0.77A 3 4 0.2 s 50V 77V 4 CH1: Timer Pin Voltage CH2: Gate Pin Voltage CH3: Current Through MOSFET CH4: Voltage Across MOSFET Figure 4. Auto Retry Feature after Fault Detection 3.3 Load Disconnect and Power Limit During Catastrophic Faults During catastrophic faults like short-circuit on the output when the series MOSFET is fully enhanced, high inrush currents are still possible. To prevent these high surge currents, the LM5068 has a fast current limit threshold of 200mV. Fast Discharge Current (FDC) responds to fast rising over-loads such as short circuit faults. During a short circuit event the fast rising current may overshoot past the ACL (active current limit) threshold of 100mV due to the finite response time of the ACL loop. If the SENSE voltage reaches 200mV a fast discharge comparator quickly pulls GATE pin low. The rapid response of the FDC circuit assures a fast and safe transition to the ACL mode. The LM5068 circuit breaker action filters low duty cycle over-load conditions to avoid declaring a fault during short duration load transients. The timer charges capacitor CT with 240µA when the SENSE voltage is greater than 50mV. When the SENSE pin voltage falls below 50mV, a 6µA current discharges the TIMER capacitor. Repetitive over-current faults with duty cycle greater than 2.5% will eventually charge CT and trip the fault timer. This feature protects the pass MOSFET, which has a fast heating and slow cooling characteristic. 1 1 ms 2.00V 3.10V 1 2 1 ms 5.0V 7.7V 3 2 1 ms 2.00A 3.10A 3 4 1 ms 50V 77V 4 CH1: Timer Pin Voltage CH2: Gate Pin Voltage CH3: Current Through MOSFET CH4: Voltage Across MOSFET Figure 5. Fast Response Circuit Breaker during Output Short Circuit 4 AN-1326 LM5068 Evaluation Board SNVA089A – May 2004 – Revised May 2013 Submit Documentation Feedback Copyright © 2004–2013, Texas Instruments Incorporated Conclusion www.ti.com 4 Conclusion This user's guide explains the apparatus and method needed to operate the LM5068 evaluation board in a typical environment. Typical operating modes have been explained with reference to the evaluation board. 5 Component List Part Value C1 NOT USED Package Description Part Number C2 NOT USED C3 C4 0.022µF/ 50V C0805 CAPACITOR, CERAMIC,KEMET C0805C223K5RAC 0.33µF / 50V C0805 CAPACITOR,CERAMIC,KEMET C5 100µF / 100V C0805C334K5RAC CAPACITOR, ALUMINIUM ELECTROLYTIC, SURFACE MOUNT,PANASONIC EEV-FK2A101M C6 0.1µF / 100V C1206 CAPACITOR, CERAMIC, TDK C3216X7R2A104KT F1 10A FUSE SMD_FUSE COOPER BUSSMAN FAST ACTING FUSE TRON TR/SFT-10 ( Digikey # 283-2439-2-ND) J1 PCB terminal Blocks/ 10A MOUSER TERMINAL BLOCKS 651-1727010 J2 PCB terminal Blocks/ 10A MOUSER TERMINAL BLOCKS 651-1727010 Q1 100V / 60A N-Channel Power MOSFET,TO263 VISHAY SUB85N10-10 R1 0 R1206 SMD RESISTOR, 1% TOL CRCW12060000F R2 100k R1206 SMD RESISTOR, 1% TOL CRCW12061003F R3 4.02k R0805 SMD RESISTOR, 1% TOL CRCW08054020F R4 3.40k R0805 SMD RESISTOR, 1% TOL CRCW08053401F R5 100k R0805 SMD RESISTOR, 1% TOL CRCW08051003F R6 0 R0805 SMD RESISTOR, 1% TOL CRCW08050000F R7 50m R2512 SMD RESISTOR, 1% TOL WSL-2512 .050F R8 0 R1206 SMD RESISTOR, 1% TOL CRCW12060000F R9 0 R1206 SMD RESISTOR, 1% TOL CRCW12060000F R10 499 R1206 SMD RESISTOR, 1% TOL CRCW1206499RF U1 LM5068 VSSOP-8 Texas Instruments LM5068-2 SNVA089A – May 2004 – Revised May 2013 Submit Documentation Feedback AN-1326 LM5068 Evaluation Board Copyright © 2004–2013, Texas Instruments Incorporated 5 PCB Layouts 6 www.ti.com PCB Layouts Figure 6. Silkscreen Layer as viewed from Top Figure 7. Top Side Soldermask as viewed from Top Figure 8. Top (Component) Layer as viewed from Top Figure 9. Bottom Side Soldermask as viewed from Top Figure 10. Bottom (Solder) Layer as viewed from Top 6 AN-1326 LM5068 Evaluation Board SNVA089A – May 2004 – Revised May 2013 Submit Documentation Feedback Copyright © 2004–2013, Texas Instruments Incorporated IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest issue. Buyers should obtain the latest relevant information before placing orders and should verify that such information is current and complete. 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