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ONET1101LRGET

ONET1101LRGET

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    VQFN-24_4X4MM-EP

  • 描述:

    Laser Driver IC 11.3Gbps 1 Channel 2.97 V ~ 3.63 V 24-VQFN (4x4)

  • 数据手册
  • 价格&库存
ONET1101LRGET 数据手册
ONET1101L www.ti.com SLLS883 – MARCH 2008 11.3 Gbps Laser Diode Driver FEATURES 1 • • • • • • • • • • Up to 11.3 Gbps Operation Two-Wire Digital Interface Digitally Selectable Modulation Current up to 80 mA Digitally Selectable Bias Current up to 100 mA Source or Sink Automatic Power Control (APC) Loop Supports Transceiver Management System (TMS) Programmable Input Equalizer Cross-point Control Includes Laser Safety Features Adjustable Coupling Ratio • • • Single +3.3 V Supply Case Temperature –25°C to 100°C Small Surface Mount Footprint 4mm × 4mm 24-Pin, RoHS-compliant QFN Package APPLICATIONS • • • • • 10 Gigabit Ethernet Optical Transmitters 8x and 10x Fibre Channel Optical Transmitters SONET OC-192/SDH STM-64 Optical Transmitters XFP and SFP+ Transceiver Modules XENPAK, XPAK, X2 and 300-pin MSA Transponder Modules DESCRIPTION The ONET1101L is a high-speed, 3.3 -V laser driver designed to directly modulate a laser at data rates from 2 Gbps to 11.3 Gbps. The device provides a two-wire serial interface that helps digital control of the modulation, plus bias currents and cross point, eliminating the need for external components. An optional input equalizer can be used for equalization of up to 300 mm (12”) of microstrip or stripline transmission line on FR4 printed circuit boards. The ONET1101L includes an integrated automatic power control (APC) loop, plus circuitry to support laser safety and transceiver management systems. The laser driver is characterized for operation from –25°C to 100°C case temperature and is available in a small footprint using a 4mm × 4mm, 24-pin RoHS-compliant QFN package. 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2008, Texas Instruments Incorporated ONET1101L www.ti.com SLLS883 – MARCH 2008 These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. BLOCK DIAGRAM Figure 1 shows a block diagram of the ONET1101L device. The laser driver consists of an equalizer, a limiter, an output driver, DC offset cancellation with cross point control, power-on reset circuitry, a 2-wire serial interface (including a control logic block and modulation current generator), a bias current generator and automatic power control loop, and an analog reference block. CP Adjust DC Offset Cancellation Equalizer Output Driver MOD+ + DIN+ 100 W MOD– + DIN– Boost Limiter Adjustable Boost SDA SDA SCK SCK DIS DIS 8 Bit Register Settings 4 Bit Register Settings 10 Bit Register IMOD 10 Bit Register IBIAS 8 Bit Register Equalizer 7 Bit + Sign CP Adjust 3 Bit + Sign Limiter Current 1 Bit CP Adjust HC Enable 2-Wire Interface and Control Logic BIAS Bias MONB Current MONP Generator FLT and PD APC COMP Power-On Reset Band-Gap and Analog References RZTC BIAS MONB MONP FLT PD COMP RZTC B0285-01 Figure 1. Block Diagram of the ONET1101L PACKAGE The ONET1101L is packaged in a small footprint 4mm × 4mm 24-pin, RoHS-compliant QFN package, with a lead pitch of 0.5 mm. The 24-pin QFN Package top view and pin description follow. 2 Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s) :ONET1101L ONET1101L www.ti.com SLLS883 – MARCH 2008 VCC MOD– MOD– MOD+ MOD+ VCC 24 23 22 21 20 19 RGE Package (Top View) PD 1 18 BIAS GND 2 17 GND VCC 3 16 VCC EP 12 MONB RZTC 13 11 6 GND SDA 10 MONP DIN– 14 9 5 DIN+ SCK 8 COMP GND 15 7 4 FLT DIS P0024-07 24-Pin QFN Package, 4mm × 4mm (Top View) PIN DESCRIPTION PIN 1 NAME TYPE PD Analog Photodiode input. Pin can source or sink current dependent on register setting. Supply Circuit ground. Exposed die pad (EP) must be grounded. 2, 8, 11, 17, EP GND DESCRIPTION 3, 16, 19, 24 VCC Supply 3.3 V ± 10% supply voltage 4 DIS Digital-in Disables the bias and modulation currents when set to high state. Toggle to reset a fault condition. 5 SCK Digital-in 2-wire interface serial clock. Connect a pull-up resistor (10 kΩ typical) to VCC. 6 SDA Digital-in 2-wire interface serial data input. Connect a pull-up resistor (10 kΩ typical) to VCC. 7 FLT Digital-out Fault detection flag. 9 DIN+ Analog-in Non-inverted data input. On-chip differentially 100 Ω terminated to DIN–. Must be AC coupled. 10 DIN– Analog-in Inverted data input. On-chip differentially 100 Ω terminated to DIN+. Must be AC coupled. 12 RZTC Analog Connect external zero TC 28.7 kΩ resistor to ground (GND). Used to generate a defined zero TC reference current for internal DACs. 13 MONB Analog-out Bias current monitor. Supplies a 1% replica of the bias current. Connect an external resistor to ground (GND). If the voltage at this pin exceeds 1.16 V, a fault is triggered. Choose a resistor that yields a MONB voltage of 0.8 V at the maximum desired bias current. 14 MONP Analog-out Photodiode current monitor. Supplies a 12.5% replica of the photodiode current when PDRNG = 1X, a 25% replica when PDRNG = 01 and a 50% replica when PDRNG = 00. Connect an external resistor (5 kΩ typical) to ground (GND). 15 COMP Analog Compensation pin used to control the bandwidth of the automatic power control (APC) loop. Connect a 0.01 µF capacitor to ground. 18 BIAS Analog Sinks or sources average bias current for laser in both APC and open loop modes. 20, 21 MOD+ CML-out Non-inverted modulation current output. IMOD flows into this pin when input data is high (current). 22, 23 MOD– CML-out Inverted modulation current output. IMOD flows into this pin when input data is low (current). Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s) :ONET1101L 3 ONET1101L www.ti.com SLLS883 – MARCH 2008 ABSOLUTE MAXIMUM RATINGS (1) over operating free-air temperature range (unless otherwise noted) VALUE UNIT VCC Supply voltage (2) –0.3 to 4.0 V VDIS, VRZTC, VSCK, VSDA, VFLT, VMONB, VMONP, VCOMP, VPD, VBIAS Voltage at DIS, RZTC, SCK, SDA, DIN+, DIN–, FLT, MONB, MONP, COMP, PD, BIAS, MOD+, MOD– (2) –0.3 to 4.0 V IDIN–, IDIN+ Maximum current at input pins 25 mA IMOD+, IMOD– Maximum current at output pins 120 mA ESD ESD rating at all pins TJ,max Maximum junction temperature TSTG TC (1) (2) 2 kV (HBM) 125 °C Storage temperature range –65 to 150 °C Case Temperature –40 to 110 °C Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Device exposure to conditions outside the Absolute Maximum Ratings ranges for an extended duration can affect device reliability. All voltage values are with respect to network ground terminal. RECOMMENDED OPERATING CONDITIONS over operating free-air temperature range (unless otherwise noted) VCC Supply voltage VIH Digital input high voltage DIS, SCK, SDA VIL Digital input low voltage DIS, SCK, SDA Photodiode current range MIN NOM MAX UNIT 2.97 3.3 3.63 V 2.0 0.8 Control bit PDRNG = 1X, step size = 3 µA 3080 Control bit PDRNG = 01, step size = 1.5 µA 1540 Control bit PDRNG = 00, step size = 0.75 µA 770 RRZTC Zero TC resistor value (1) 1.16 V bandgap bias across resistor, E96, 1% accuracy 28.4 VIN Differential input voltage swing EQENA = 0 100 tR-IN Input rise time 20% to 80% tF-IN Input fall time 20% to 80% TC Case Temperature (1) 4 V 28.7 30 –25 µA 29 1200 30 V 55 kΩ mVp-p ps 55 ps 100 °C Changing the value alters the DAC ranges. Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s) :ONET1101L ONET1101L www.ti.com SLLS883 – MARCH 2008 DC ELECTRICAL CHARACTERISTICS Over recommended operating conditions with a 25 Ω output load, open loop operation, IMOD = 40 mA, IBIAS = 40 mA, and RRZTC = 28.7 kΩ (unless otherwise noted) PARAMETER VCC TEST CONDITIONS MIN TYP MAX UNIT 2.97 3.3 3.63 V IMOD = 40 mA, IBIAS= 40 mA, excluding IMOD and IBIAS, EQENA = 0 66 85 IMOD = 80 mA, IBIAS = 80 mA, excluding IMOD and IBIAS, EQENA = 0 95 118 IMOD = 40 mA, IBIAS = 40 mA, excluding IMOD and IBIAS, EQENA = 1 73 95 Supply voltage IVCC Supply current Output off (DIS = HIGH), IMOD = 40 mA, IBIAS = 40 mA, EQENA = 0 RIN Data input resistance Digital input current 120 Ω SCK, SDA, pull up to VCC –10 10 µA DIS, pull down to GND –10 10 µA 2.4 Digital output high voltage FLT, pull-up to VCC, ISOURCE = 50 µA VOL Digital output low voltage FLT, pull-up to VCC, ISINK = 350 µA IBIAS-MIN Minimum bias current See table note IBIAS-DIS Maximum bias current 80 100 V 0.4 (1) 5 Sink, BIASPOL = 0 DAC set to maximum, open and closed loop 85 100 Source, BIASPOL = 1 DAC set to maximum, open and closed loop 80 100 BIASPOL = 0 0.8 Photodiode reverse bias voltage Photodiode fault current level Photodiode current monitor ratio 100 BIASPOL = 1 VCC–0.8 APC active, IPD = max 1.3 2.3 IMONP / IPD with control bit PDRNG = 1X 10% 12.5% 15% IMONP / IPD with control bit PDRNG = 01 20% 25% 30% Percent of target IPD (2) V 150% IMONP / IPD with control bit PDRNG = 00 40% 50% 60% IMONB / IBIAS (nominal 1/100 = 1%) 0.9% 1.0% 1.2% VCC-RST VCC reset threshold voltage VCC voltage level which triggers power-on reset 2.5 2.8 VCC-RSTHYS VCC reset threshold voltage Hysteresis VMONB-FLT Fault voltage at MONB Fault occurs if voltage at MONB exceeds value (2) µA V Bias current monitor ratio (1) V mA mA Bias current during disable Bias pin compliance voltage VPD 42 Differential between DIN+ / DIN– VOH IBIAS-MAX mA 100 1.1 1.16 V mV 1.22 V The bias current can be set below the specified minimum according to the corresponding register setting; however in closed loop operation settings below the specified value the bias current can trigger a fault. Assured by simulation over process, supply, and temperature variation. Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s) :ONET1101L 5 ONET1101L www.ti.com SLLS883 – MARCH 2008 AC ELECTRICAL CHARACTERISTICS Over recommended operating conditions with 25 Ω output load, open loop operation, IMOD = 40 mA, IBIAS = 40 mA, and RRZTC = 28.7 kΩ. Typical operating condition is at VCC = 3.3 V and TA = 25°C (unless otherwise noted) PARAMETER SDD11 Differential input return gain SCD11 TEST CONDITIONS MIN 0.01 GHz < f < 3.9 GHz TYP MAX –16 dB See note (1) 3.9 GHz < f < 12.1 GHz UNIT Differential to common mode conversion gain f < 8.25 GHz –45 8.25 GHz < f < 20 GHz –35 tR-OUT Output rise time 20% to 80%, tR-IN < 40 ps, 25 Ω load, single-ended 25 35 ps tF-OUT Output fall time 20% to 80%, tF-IN < 40 ps, 25 Ω load, single-ended 25 35 ps IMOD-MIN Minimum modulation current 10 mA IMOD-MAX Maximum modulation current AC Coupled Outputs IMOD-STEP Modulation current step size 10 Bit Register DJ Deterministic output jitter RJ 70 APC time constant µA EQENA = 1, K28.5 pattern at 11.3 Gbps, maximum equalization with 12” transmission line at the input, 400 mVpp at input to transmission line 7 10 psp-p 0.4 CAPC = 0.01 µF, IPD = 100 µA, PD coupling ratio, CR = 40 (2) 0.8 30% Rising edge of DIS to IBIAS ≤ 0.1 × IBIAS-NOMINAL (2) TON Disable negate time Falling edge of DIS to IBIAS ≥ 0.9 × IBIAS-NOMINAL TINIT1 Power-on to initialize Power-on to registers ready to be loaded TINIT2 Initialize to transmit Register load STOP command to part ready to transmit valid data (2) TRESET DIS pulse width Time DIS must be held high to reset part (2) TFAULT Fault assert time Time from fault condition to FLT high (2) psRMS µs 120 Transmitter disable time (1) (2) mA 83 5 Cross Point Control Range TOFF 85 EQENA = 0, K28.5 pattern at 11.3 Gbps, 100 mVpp, 600 mVpp, 1200 mVpp differential input voltage Random output jitter τAPC dB 70% 0.05 5 µs 1 ms 1 10 ms 2 ms 50 µs (2) 100 ns Differential Return Gain given by SDD11, SDD22 = –11.6 + 13.33× log10(f÷8.25), f expressed in GHz Assured by simulation over process, supply, and temperature variation. DETAILED DESCRIPTION EQUALIZER The data signal can be applied to an input equalizer by means of the input signal pins DIN+ / DIN–, which provide on-chip differential 100 Ω line-termination. The equalizer is enabled by setting EQENA = 1 (bit 1 of register 0). Equalization of up to 300 mm (12") of microstrip or stripline transmission line on FR4 printed circuit boards can be achieved. The amount of equalization is digitally controlled by the two-wire interface and control logic block, and is dependant on the register settings EQADJ[0...7] (register 6). The equalizer can also be turned off and bypassed by setting EQENA = 0. For details about the equalizer settings, see Table 12 - Register Functionality. LIMITER By limiting the output signal of the equalizer to a fixed value, the limiter removes any overshoot after the input equalization and provides the input signal for the output driver. HIGH-SPEED OUTPUT DRIVER The modulation current is sunk from the common emitter node of the limiting output driver differential pair by means of a modulation current generator, which is digitally controlled by the 2-wire serial interface. 6 Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s) :ONET1101L ONET1101L www.ti.com SLLS883 – MARCH 2008 The collector nodes of the output stages are connected to the output pins MOD+ and MOD–. The laser diode can be AC- or DC-coupled, depending on the required modulation current. To obtain the maximum modulation current of 80 mA, AC coupling is required. The modulation outputs are optimized for driving a 25 Ω load. MODULATION CURRENT GENERATOR The modulation current generator provides the current for the current modulator described above. The circuit is digitally controlled by the 2-wire interface block. A 10-bit control bus, MODC[0...9] (register 2 and register 3), is used to set the desired modulation current. The modulation current can be disabled by setting the DIS input pin high or setting ENA = 0 (bit 7 of register 0). The modulation current is also disabled in a fault condition if the internal fault detection enable register flag FLTEN is set (bit 3 of register 0). DC OFFSET CANCELLATION AND CROSS POINT CONTROL The ONET1101L has DC offset cancellation to compensate for internal offset voltages. The offset cancellation can be disabled by setting OCDIS = 1 (bit 3 of register 1). Disabling the offset cancellation permits the output crossing point to be adjusted from a minimum of 30% to 70% of the output eye diagram. The crossing point can be moved toward the one level be setting CPSGN = 1 (bit 7 of register 7) and it can be moved toward the zero level by setting CPSGN = 0. The shift percentage depends upon the register settings CPADJ[0...6] (register 7) and the cross point adjustment range bits CPRNG[0...1] (register 1). Setting CPRNG1 = 0 and CPRNG0 = 0 results in minimum adjustment (fine) capability and setting CPRNG1 = 1 and CPRNG0 = 1 results in maximum (coarse) adjustment capability. BIAS CURRENT GENERATION AND APC LOOP The bias current generation and APC loop are controlled by means of the 2-wire interface. In open loop operation, selected with OLENA = 1 (bit 4 of register 0), the bias current is set directly by the 10-bit control word BIASC[0...9] (register 4 and register 5). In automatic power control mode (select with OLENA = 0), the bias current depends on the register settings BIASC[0...9] and the coupling ratio (CR) between the laser bias current and the photodiode current. CR = IBIAS / IPD. If the photodiode anode is connected to the PD pin, set PDPOL = 1 (bit 0 of register 0) and if the photodiode cathode is connected to the PD pin, set PDPOL = 0. Three photodiode current ranges can be selected by means of the PDRNG[1...0] bits (register 0). The photodiode range should be chosen to keep the laser bias control DAC, BIASC[0...9], close to its range center. This keeps the laser bias current set point resolution high. For details regarding the bias current setting in openand closed-loop mode, see Table 12. The ONET1101L has the ability to source or sink the bias current. For the BIAS pin to act as a source set BIASPOL = 1 (bit 2 of register 1) and for the BIAS pin to act as a sink set BIASPOL = 0. The bias current is monitored using a current mirror with a gain value equal to 0.01 (1 %). By connecting a resistor between MONB and GND, the bias current can be monitored as a voltage across the resistor. A low temperature coefficient precision resistor should be used. ANALOG REFERENCE The ONET1101L laser driver is supplied by a single 3.3 V±10% supply voltage connected to the VCC pins. This voltage is referenced to ground (GND). On-chip bandgap voltage circuitry generates a reference voltage, independent of the supply voltage, from which all other internally required voltages and bias currents are derived. An external zero temperature coefficient resistor must be connected from the RZTC pin of the device to ground (GND). This resistor is used to generate a precise, zero TC current, which is required as a reference current for the on-chip DACs. Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s) :ONET1101L 7 ONET1101L www.ti.com SLLS883 – MARCH 2008 POWER-ON RESET The ONET1101L has power-on reset circuitry that ensures all registers are reset to zero during startup. After the power-on to initialize time (tINIT1), the internal registers are ready to load. The part is ready to transmit data after the initialize to transmit time (tINIT2), assuming that the chip enable bit ENA is set to 1 and the disable pin DIS is low. The ONET1101L can be disabled using the ENA control register bit or the disable pin DIS. In both cases the internal registers are not reset. After the disable pin DIS is set low or the enable bit ENA is set back to 1, the part returns to its prior output settings. 2-WIRE INTERFACE AND CONTROL LOGIC The ONET1101L uses a 2-wire serial interface for digital control. The two circuit inputs, SDA and SCK, are driven, respectively, by the serial data and serial clock from a microprocessor, for example. For driving these inputs, TI recommends an open drain output. The 2-wire interface provides write access to the internal memory map to modify control registers and read access to read out the control signals. The ONET1101L is a slave device only, which means that it cannot initiate a transmission itself; it always relies on the availability of the SCK signal for the duration of the transmission. The master device provides the clock signal plus the START and STOP commands. The protocol for a data transmission is: 1. START command 2. 7-bit slave address (0001000) followed by an eighth bit which is the data direction bit (R/W). A zero indicates a WRITE and a 1 indicates a READ. 3. 8-bit register address 4. 8-bit register data word 5. STOP command Regarding timing, the ONET1101L is I2C compatible. A typical timing diagram, shown in Figure 2 and Figure 3, describes a complete data transfer. Table 1 provides definitions of parameters for the Figure 2, I2C Timing Diagram. Bus Idle: Both SDA and SCK lines remain HIGH Start Data Transfer: A change in the state of the SDA line, from HIGH to LOW, while the SCK line is HIGH, defines a START condition (S). Each data transfer begins with a START condition. Stop Data Transfer: A change in the state of the SDA line from LOW to HIGH while the SCK line is HIGH defines a STOP condition (P). Each data transfer ends with a STOP condition; however, if the master still wishes to communicate on the bus, it can generate a repeated START condition and address another slave without first generating a STOP condition. Data Transfer: Only one data byte can be transferred between a START and a STOP condition. The receiver acknowledges the transfer of data. Acknowledge: Each receiving device, when addressed, is obliged to generate an acknowledgment bit. The transmitter releases the SDA line and a device that acknowledges, must pull down the SDA line during the acknowledge clock pulse simultaneously so the SDA line is stable LOW during the HIGH period of the acknowledge clock pulse. Set-up and hold times must be taken into account. When a slave-receiver fails to acknowledge the slave address, the data line must be left HIGH by the slave. The master can generate a STOP condition to prevent the transfer. If the slave-receiver does acknowledge the slave address but some time later in the transfer cannot receive any more data bytes, the master must cancel the transfer. This is indicated by the slave generating the not acknowledge on the first following byte. The slave leaves the data line HIGH and the master generates the STOP condition. 8 Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s) :ONET1101L ONET1101L www.ti.com SLLS883 – MARCH 2008 SDA tBUF tLOW tr tHIGH tf tHDSTA SCK tHDSTA tSUDAT tHDSTA P tSUSTO tSUSTA S S P T0295-01 2 Figure 2. I C Timing Diagram Table 1. Timing Diagram Definitions PARAMETER MIN MAX UNIT 400 kHz fSCK SCK clock frequency tBUF Bus free time between START and STOP conditions 1.3 µs tHDSTA Hold time after repeated START condition. After this period, the first clock pulse is generated 0.6 µs tLOW Low period of the SCK clock 1.3 µs tHIGH High period of the SCK clock 0.6 µs tSUSTA Setup time for a repeated START condition 0.6 µs tHDDAT Data HOLD time 0 µs tSUDAT Data setup time tR Rise time of both SDA and SCK signals 300 ns tF Fall time of both SDA and SCK signals 300 ns tSUSTO Setup time for STOP condition 100 ns µs 0.6 SDA SCK S 1–7 8 9 SLAVE ADDRESS R/W ACK 8 1–7 9 REGISTER ADDRESS 8 1–7 REGISTER FUNCTION ACK 9 P ACK T0296-01 2 Figure 3. I C Data Transfer REGISTER MAPPING The register mapping for register addresses 0 (0x00) through 9 (0x09) are shown in Table 2 through Table 11. Table 12 describes the circuit functionality based on the register settings. Table 2. Register 0 (0x00) Mapping – Control Settings register address 0 (0x00) bit 7 bit 6 bit 5 bit4 bit 3 bit 2 bit 1 bit 0 ENA PDRNG1 PDRNG0 OLENA FLTEN POL EQENA PDPOL Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s) :ONET1101L 9 ONET1101L www.ti.com SLLS883 – MARCH 2008 Table 3. Register 1 (0x01) Mapping – Control Settings register address 1 (0x01) bit 7 bit 6 bit 5 bit4 bit 3 bit 2 bit 1 bit 0 – – – – OCDIS BIASPOL CPRNG1 CPRNG0 Table 4. Register 2 (0x02) Mapping – Modulation Current register address 2 (0x02) bit 7 bit 6 bit 5 bit4 bit 3 bit 2 bit 1 bit 0 – – – – – – MODC1 MODC0 Table 5. Register 3 (0x03) Mapping – Modulation Current register address 3 (0x03) bit 7 bit 6 bit 5 bit4 bit 3 bit 2 bit 1 bit 0 MODC9 MODC8 MODC7 MODC6 MODC5 MODC4 MODC3 MODC2 Table 6. Register 4 (0x04) Mapping – Bias Current register address 4 (0x04) bit 7 bit 6 bit 5 bit4 bit 3 bit 2 bit 1 bit 0 – – – – – – BIASC1 BIASC0 Table 7. Register 5 (0x05) Mapping – Bias Current register address 5 (0x05) bit 7 bit 6 bit 5 bit4 bit 3 bit 2 bit 1 bit 0 BIASC9 BIASC8 BIASC7 BIASC6 BIASC5 BIASC4 BIASC3 BIASC2 Table 8. Register 6 (0x06) Mapping – Equalizer Adjust register address 6 (0x06) bit 7 bit 6 bit 5 bit4 bit 3 bit 2 bit 1 bit 0 EQADJ7 EQADJ6 EQADJ5 EQADJ4 EQADJ3 EQADJ2 EQADJ1 EQADJ0 Table 9. Register 7 (0x07) Mapping – Cross Point Adjust register address 7 (0x07) bit 7 bit 6 bit 5 bit4 bit 3 bit 2 bit 1 bit 0 CPSGN CPADJ6 CPADJ5 CPADJ4 CPADJ3 CPADJ2 CPADJ1 CPADJ0 Table 10. Register 8 (0x08) Mapping – Limiter Bias Current Adjust register address 8 (0x08) bit 7 bit 6 bit 5 bit4 bit 3 bit 2 bit 1 bit 0 – – – – LIMCSGN LIMC2 LIMC1 LIMC0 Table 11. Register 9 (0x09) Mapping – High Current Enable register address 9 (0x09) 10 bit 7 bit 6 bit 5 bit4 bit 3 bit 2 bit 1 bit 0 – – – – – – – HMCENA Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s) :ONET1101L ONET1101L www.ti.com SLLS883 – MARCH 2008 Table 12. Register Functionality SYMBOL REGISTER BIT FUNCTION ENA Enable bit 7 Enable chip bit 1 = chip enabled. Can be toggled low to reset a fault condition. 0 = chip disabled PDRNG1 PDRNG0 Photodiode current range bit 6 Photodiode current range bit 5 Photodiode current range bits 1X: up to 3080 µA / 3 µA resolution 01: up to 1540 µA / 1.5 µA resolution 00: up to 770 µA / 0.75 µA resolution OLENA Open loop enable bit 4 Open loop enable bit 1 = open loop bias current control 0 = closed loop bias current control FLTEN Fault detection enable bit 3 Fault detection enable bit 1 = fault detection on 0 = fault detection off POL Output polarity switch bit 2 Output polarity switch bit 1: pins 20 and 21 = MOD– and pins 22 and 23 = MOD+ 0: pins 20 and 21 = MOD+ and pins 22 and 23 = MOD– EQENA Equalizer enable bit 1 Equalizer enable bit 1 = equalizer enabled 0 = equalizer disabled PDPOL Photodiode polarity bit 0 Photodiode polarity bit 1 = photodiode cathode connected to VCC 0 = photodiode anode connected to GND OCDIS Offset cancellation disable bit 3 Offset cancellation disable bit 1 = DC offset cancellation is disabled and cross point adjust is enabled 0 = DC offset cancellation is enabled and cross point adjust is disabled BIASPOL Bias current polarity bit 2 Bias current polarity bit 1 = Bias pin sources current 0 = Bias pin sinks current CPRNG1 CPRNG0 Cross point range bit 1 Cross point range bit 0 Cross point adjustment range bits: Minimum adjustment range for 00 Maximum adjustment range for 11 MODC9 Modulation current bit 9 (MSB) Modulation current setting MODC8 Modulation current bit 8 MODC7 Modulation current bit 7 MODC6 Modulation current bit 6 MODC5 Modulation current bit 5 MODC4 Modulation current bit 4 MODC3 Modulation current bit 3 MODC2 Modulation current bit 2 MODC1 Modulation current bit 1 MODC0 Modulation current bit 0 (LSB) BIASC9 Bias current bit 9 (MSB) Closed loop (APC) BIASC8 Bias current bit 8 Coupling ratio CR = IBIAS / IPD, BIASC = 0...1023, IBIAS ≤ 100 mA BIASC7 Bias current bit 7 BIASC6 Bias current bit 6 PDRNG = 00 (see Photodiode current range bits); IBIAS = 0.75 µA × CR × BIASC BIASC5 Bias current bit 5 PDRNG = 01 (see Photodiode current range bits); IBIAS = 1.5 µA × CR × BIASC BIASC4 Bias current bit 4 PDRNG = 1X (see Photodiode current range bits); IBIAS = 3 µA × CR × BIASC BIASC3 Bias current bit 3 BIASC2 Bias current bit 2 Open loop BIASC1 Bias current bit 1 IBIAS = 98 µA × BIASC BIASC0 Bias current bit 0 (LSB) Modulation current: 85 mA / 83 µA steps Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s) :ONET1101L 11 ONET1101L www.ti.com SLLS883 – MARCH 2008 Table 12. Register Functionality (continued) SYMBOL REGISTER BIT FUNCTION EQADJ7 Equalizer adjustment bit 7 (MSB) Equalizer adjustment setting EQADJ6 Equalizer adjustment bit 6 EQADJ5 Equalizer adjustment bit 5 EQENA = 0 (see Equalizer Enable Bit) EQADJ4 Equalizer adjustment bit 4 Equalizer is turned off and bypassed EQADJ3 Equalizer adjustment bit 3 EQADJ2 Equalizer adjustment bit 2 EQENA = 1 (see Equalizer Enable Bit) EQADJ1 Equalizer adjustment bit 1 Maximum equalization for 00000000 EQADJ0 Equalizer adjustment bit 0 (LSB) Minimum equalization for 11111111 CPSGN Eye crossing sign bit 7 Eye cross-point adjustment setting CPADJ6 Eye crossing adjustment bit 6 (MSB) CPSGN = 1 (positive shift) CPADJ5 Eye crossing adjustment bit 5 CPADJ4 Eye crossing adjustment bit 4 CPADJ3 Eye crossing adjustment bit 3 CPADJ2 Eye crossing adjustment bit 2 Maximum shift for 1111111 CPADJ1 Eye crossing adjustment bit 1 Minimum shift for 0000000 CPADJ0 Eye crossing adjustment bit 0 (LSB) LIMCSGN Limiter current sign bit 3 Limiter bias current setting LIMC2 Limiter current bit 2 (MSB) LIMCSGN = 1: decrease current LIMC1 Limiter current bit 1 LIMCSGN = 0: increase current LIMC0 Limiter current bit 0 (LSB) No change for 000 and maximum change for 111 HMCENA High modulation current enable bit 0 High modulation current enable bit 1 = high modulation current capability up to 100 mA 0 = modulation current capability up to 80 mA Maximum shift for 1111111 Minimum shift for 0000000 CPSGN = 0 (negative shift) LASER SAFETY FEATURES AND FAULT RECOVERY PROCEDURE The ONET1101L provides built-in laser safety features and can detect these fault conditions: • Voltage at MONB exceeds the voltage at RZTC (1.16 V) • Photodiode current exceeds 150% of its set value • Bias control DAC drops in value by more than 50% in one step If • • • one or more fault conditions happen and the fault enable bit FLTEN is set to 1, the ONET1101L responds by: Setting the bias current to zero. Setting the modulation current to zero. Asserting and latching the FLT pin. ONET1101L Fault recovery happens using this procedure: 1. The disable pin DIS or the internal enable control bit ENA are toggled for at least the fault latch reset time. 2. The FLT pin de-asserts while the disable pin DIS is asserted or the enable bit ENA is de-asserted. 3. If the fault condition is no longer present, the part returns to normal operation with its prior output settings after the disable negate time. 4. If the fault condition is still present, FLT re-asserts once DIS is set to a low level and the part does not return to normal operation. 12 Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s) :ONET1101L ONET1101L www.ti.com SLLS883 – MARCH 2008 TYPICAL OPERATION CHARACTERISTICS Typical operating condition is at VCC = 3.3 V, TA = 25°C, IBIAS = 40 mA, IMOD = 40 mA, VIN = 600 mVpp (unless otherwise noted). DETERMINISTIC JITTER vs TEMPERATURE 8 8 7 7 6 6 Deterministic Jitter − psPP Deterministic Jitter − psPP DETERMINISTIC JITTER vs MODULATION CURRENT 5 4 3 2 5 4 3 2 1 1 0 −40 0 10 20 30 40 50 60 70 80 −20 0 20 40 60 80 TA − Free-Air Temperature − °C Modulation Current − mA G001 Figure 4. Figure 5. RANDOM JITTER vs MODULATION CURRENT RANDOM JITTER vs TEMPERATURE 100 G002 0.4 0.5 0.4 Random Jitter − psrms Random Jitter − psrms 0.3 0.3 0.2 0.2 0.1 0.1 0.0 10 20 30 40 50 60 70 80 0.0 −40 −20 Modulation Current − mA G003 Figure 6. 0 20 40 60 80 TA − Free-Air Temperature − °C 100 G004 Figure 7. Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s) :ONET1101L 13 ONET1101L www.ti.com SLLS883 – MARCH 2008 TYPICAL OPERATION CHARACTERISTICS (continued) Typical operating condition is at VCC = 3.3 V, TA = 25°C, IBIAS = 40 mA, IMOD = 40 mA, VIN = 600 mVpp (unless otherwise noted). RISE-TIME AND FALL-TIME vs MODULATION CURRENT RISE-TIME AND FALL-TIME vs TEMPERATURE 35 35 Rise Time 25 Fall Time tt − Transition Time − ps tt − Transition Time − ps 30 20 15 10 5 30 Rise Time 25 Fall Time 20 15 10 5 0 10 20 30 40 50 60 70 0 −40 80 −20 G005 20 40 80 Figure 9. BIAS CURRENT IN OPEN LOOP MODE vs BIASC REGISTER SETTING BIAS-MONITOR CURRENT IMONB vs BIAS CURRENT 120 1.2 100 1.0 80 60 40 20 100 G006 0.8 0.6 0.4 0.2 0.0 0 0 200 400 600 800 1000 1200 10 20 30 40 50 60 70 80 90 100 Bias Current − mA Bias Current Register Setting − Decimal G008 G007 Figure 10. 14 60 Figure 8. IMONB − Bias-Monitor Current − mA Open Loop Bias Current − mA 0 TA − Free-Air Temperature − °C Modulation Current − mA Figure 11. Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s) :ONET1101L ONET1101L www.ti.com SLLS883 – MARCH 2008 TYPICAL OPERATION CHARACTERISTICS (continued) Typical operating condition is at VCC = 3.3 V, TA = 25°C, IBIAS = 40 mA, IMOD = 40 mA, VIN = 600 mVpp (unless otherwise noted). PHOTODIODE-MONITOR CURRENT IMONP vs PD CURRENT MODULATION CURRENT vs MODC REGISTER SETTING 90 0.25 0.20 70 Modulation Current − mA Photodiode Monitor Current − mA 80 0.15 0.10 60 50 40 30 20 0.05 10 0.00 0.05 0.15 0.25 0 0.35 0.45 0.55 0.65 0.75 0.85 Photodiode Current − mA 0 200 400 600 800 1000 1200 Modulation Current Register Setting − Decimal G009 G010 Figure 12. Figure 13. SUPPLY CURRENT (includes IBIAS and IMOD) vs TEMPERATURE EYE-DIAGRAM AT 11.3 GBPS, PRBS-31 PATTERN IMOD = 20 mA, EQENA = 0 200 190 Supply Current − mA (Including IBIAS and IMOD) 180 170 160 150 140 130 120 110 100 −40 −20 0 20 40 60 80 TA − Free-Air Temperature − °C 14.8 ps / Div 100 G012 G011 Figure 14. Figure 15. Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s) :ONET1101L 15 ONET1101L www.ti.com SLLS883 – MARCH 2008 TYPICAL OPERATION CHARACTERISTICS (continued) Typical operating condition is at VCC = 3.3 V, TA = 25°C, IBIAS = 40 mA, IMOD = 40 mA, VIN = 600 mVpp (unless otherwise noted). EYE-DIAGRAM AT 11.3GBPS, PRBS-31 PATTERN IMOD = 40 mA, EQENA = 0 EYE-DIAGRAM AT 11.3GBPS, PRBS-31 PATTERN IMOD = 60 mA, EQENA = 0 14.5 ps / Div 14.6 ps / Div G013 G014 Figure 16. Figure 17. EYE-DIAGRAM AT 11.3GBPS, PRBS-31 PATTERN IMOD = 40 mA, EQENA = 1 12" OF FR4 AT INPUTS 14 ps / Div G015 Figure 18. 16 Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s) :ONET1101L ONET1101L www.ti.com SLLS883 – MARCH 2008 APPLICATION INFORMATION Figure 19 and Figure 20 show typical application circuits using the ONET1101L with a laser biased to VCC (BIAS pin sink) and driven differentially or single-ended. The laser driver is controlled using the 2-wire interface SDA/SCK by a microcontroller. In a typical application, the FLT, MONB, and MONP outputs are also connected to the microcontroller for transceiver management purposes. The component values in Figure 19 and Figure 20 are typical examples and may be varied according to the intended application. DIS VCC SDK 0.1 mF SDA C1 0.1 mF MOD– ONET1101L GND MOD+ BLM15HG601SN1 (See Note 1) (See Note 1) (See Note 1) (See Note 1) BIAS GND VCC VCC RZTC COMP MOD+ MONP C2 0.1 mF DIN– MONB DIN– 0.1 mF MOD– GND DIN+ DIN+ BLM15HG601SN1 ´ 2 VCC FLT FLT BLM15HD102SN1 PD GND VCC DIS SDA SCK BLM15HD102SN1 ´ 2 0.1 mF Laser Monitor Photodiode 0.1 mF BLM15HG601SN1 0.1 mF RZTC 28.7 kW BLM15HD102SN1 0.1 mF 1000 pF MONB RMONB 1.2 kW MONP RMONP 5 kW CCOMP 0.01 mF S0319-01 (1) Resistor values depend on the TOSA diode used. Figure 19. AC Coupled Differential Drive Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s) :ONET1101L 17 ONET1101L www.ti.com SLLS883 – MARCH 2008 DIS VCC SDK 0.1 mF SDA C1 0.1 mF MOD+ GND MOD+ Laser 50 W Diff TL 25 W TL 0.1 mF BIAS VCC GND VCC COMP RZTC MONP DIN– MONB C2 0.1 mF BLM15HG601SN1 0.1 mF MOD– ONET1101L DIN– 0.1 mF MOD– GND DIN+ DIN+ BLM15HD102SN1 ´ 2 VCC FLT FLT BLM15HD102SN1 PD GND VCC DIS SDA SCK 25 W Monitor Photodiode Optional BLM15HG601SN1 0.1 mF RZTC 28.7 kW BLM15HD102SN1 0.1 mF 1000 pF MONB RMONB 1.2 kW MONP CCOMP 0.01 mF RMONP 5 kW S0320-01 Figure 20. AC Coupled Single-Ended Drive CALCULATING POWER CONSUMPTION The power dissipation is different, depending if the BIAS pin is sourcing or sinking current. Lower power dissipation in the ONET1101L can be achieved if the BIAS pin sinks the bias current because the BIAS pin compliance voltage is typically less than 1 V. The power dissipation is calculated as: P = VCC × (IVCC + IMOD) + (VBIAS × IBIAS) Where: VCC is the power supply voltage IVCC is the supply current excluding modulation and bias current IMOD is the modulation current VBIAS is the voltage at the BIAS pin IBIAS is the bias current 18 Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s) :ONET1101L ONET1101L www.ti.com SLLS883 – MARCH 2008 LAYOUT GUIDELINES For optimum performance, use 50 Ω transmission lines (100 Ω differential) for connecting the signal source to the DIN+ and DIN– pins and 25 Ω transmission lines (50 Ω differential) for connecting the modulation current outputs, MOD+ and MOD–, to the laser. The length of the transmission lines should be kept as short as possible to reduce loss and pattern-dependent jitter. It is recommended to assemble the series matching resistor as close as possible to the TOSA diode, if required. Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s) :ONET1101L 19 PACKAGE OPTION ADDENDUM www.ti.com 14-Oct-2022 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan (2) Lead finish/ Ball material MSL Peak Temp Op Temp (°C) Device Marking (3) Samples (4/5) (6) ONET1101LRGER ACTIVE VQFN RGE 24 3000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -25 to 100 ONET 1101L Samples ONET1101LRGET ACTIVE VQFN RGE 24 250 RoHS & Green NIPDAU Level-2-260C-1 YEAR -25 to 100 ONET 1101L Samples (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
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