OPA1655, OPA1656
SBOS901C – MARCH 2019 – REVISED SEPTEMBER 2022
OPA165x Ultra-Low-Noise, Low-Distortion, FET-Input,
Burr-Brown™ Audio Operational Amplifiers
1 Features
3 Description
•
The OPA1655 and OPA1656 (OPA165x) are BurrBrown™ op amps designed specifically for audio
and industrial applications, where maintaining signal
fidelity is crucial. The FET-input architecture achieves
a low 2.9‑nV/√Hz voltage noise density and 6‑fA/√Hz
current noise density, allowing for very-low noise
performance in a wide variety of circuits. The high
bandwidth and high open-loop-gain design of the
OPA165x delivers a low distortion of 0.000035%
(–129 dB) at 20 kHz, and improves audio signal
fidelity across the full audio bandwidth. These devices
also feature excellent output current drive capability,
offering rail-to-rail output swing to within 250 mV of
the power supplies with a 2‑kΩ load, and can deliver
100 mA of output current.
•
•
•
•
•
•
•
•
•
Ultra-low noise:
– Voltage noise: 2.9 nV/√Hz at 10 kHz
– Current noise: 6 fA/√Hz at 1 kHz
Low distortion:
– 0.000029% (–131 dB) at 1 kHz
– 0.000035% (–129 dB) at 20 kHz
High open-loop gain: 150 dB
High output current: 100 mA
Low input bias current: 10 pA
Slew rate: 24 V/μs
Gain bandwidth product: 53 MHz
Rail-to-rail output
Wide supply range:
±2.25 V to ±18 V or 4.5 V to 36 V
Quiescent current: 3.9 mA per channel
The OPA165x operate over a very wide supply range
of ±2.25 V to ±18 V or (4.5 V to 36 V) on 3.9 mA
of supply current to accommodate the power-supply
constraints of many types of audio products. The
temperature range is specified from –40°C to +125°C.
2 Applications
•
•
•
•
•
•
•
•
•
Professional microphones and wireless systems
Professional audio mixer/control surface
Guitar amplifier and other music instrument
amplifier
A/V receiver
Bookshelf stereo system
Professional audio amplifier
DJ equipment
Turntable
Special function module
Device Information
PART NUMBER
OPA1655
Single
OPA1656
Dual
(1)
PACKAGE(1)
D (SOIC, 8)
DBV (SOT-23, 5)
D (SOIC, (8)
For all available packages, see the package option
addendum at the end of the data sheet.
100
Bass
–
+
–
OPA165x
+
OPA165x
Output
Voltage Noise Density (nV/—Hz)
Pad
Input
CHANNEL
10
Treble
Active Baxandall Tone Control
1
10
100
1k
10k
100k
Frequency (Hz)
1M
10M
C020
Ultra-Low Input Voltage Noise
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
OPA1655, OPA1656
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SBOS901C – MARCH 2019 – REVISED SEPTEMBER 2022
Table of Contents
1 Features............................................................................1
2 Applications..................................................................... 1
3 Description.......................................................................1
4 Revision History.............................................................. 2
5 Pin Configuration and Functions...................................3
6 Specifications.................................................................. 4
6.1 Absolute Maximum Ratings........................................ 4
6.2 ESD Ratings............................................................... 4
6.3 Recommended Operating Conditions.........................4
6.4 Thermal Information: OPA1655.................................. 5
6.5 Thermal Information: OPA1656.................................. 5
6.6 Electrical Characteristics.............................................6
6.7 Typical Characteristics................................................ 8
7 Detailed Description......................................................15
7.1 Overview................................................................... 15
7.2 Functional Block Diagram......................................... 15
7.3 Feature Description...................................................15
7.4 Device Functional Modes..........................................18
8 Application and Implementation.................................. 19
8.1 Application Information............................................. 19
8.2 Typical Applications.................................................. 20
8.3 Power Supply Recommendations.............................27
8.4 Layout....................................................................... 27
9 Device and Documentation Support............................29
9.1 Device Support......................................................... 29
9.2 Documentation Support............................................ 30
9.3 Receiving Notification of Documentation Updates....30
9.4 Support Resources................................................... 30
9.5 Trademarks............................................................... 30
9.6 Electrostatic Discharge Caution................................30
9.7 Glossary....................................................................30
10 Mechanical, Packaging, and Orderable
Information.................................................................... 30
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision B (December 2021) to Revision C (September 2022)
Page
• Changed OPA1655 DBV (SOT-23, 5) package from preview to production data (active).................................. 1
Changes from Revision A (July 2019) to Revision B (December 2021)
Page
• Added OPA1655 production data (active) device and associated content......................................................... 1
Changes from Revision * (March 2019) to Revision A (July 2019)
Page
• Changed device status from advanced information (preview) to production data (active)................................. 1
2
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SBOS901C – MARCH 2019 – REVISED SEPTEMBER 2022
5 Pin Configuration and Functions
–IN
2
+IN
3
V–
4
8
NC
–
7
V+
+
6
OUT
5
NC
OUT
1
V±
2
+IN
3
5
V+
4
±IN
±
1
+
NC
Not to scale
Figure 5-2. OPA1655 DBV (5-Pin SOT-23) Package,
Top View
Not to scale
Figure 5-1. OPA1655 D (8-Pin SOIC) Package,
Top View
Pin Functions: OPA1655
PIN
NO.
NAME
TYPE
DESCRIPTION
D (SOIC)
DBV (SOT-23)
–IN
2
4
Input
Inverting input
+IN
3
3
Input
Noninverting input
OUT
6
1
Output
Output
V–
4
2
Power
Negative (lowest) power supply
V+
7
5
Power
Positive (highest) power supply
OUT A
1
8
V+
±IN A
2
7
OUT B
+IN A
3
6
±IN B
V±
4
5
+IN B
Not to scale
Figure 5-3. OPA1656 D (8-Pin SOIC) Package, Top View
Pin Functions: OPA1656
PIN
TYPE
DESCRIPTION
NAME
NO.
–IN A
2
Input
Inverting input, channel A
+IN A
3
Input
Noninverting input, channel A
–IN B
6
Input
Inverting input, channel B
+IN B
5
Input
Noninverting input, channel B
OUT A
1
Output
Output, channel A
OUT B
7
Output
Output, channel B
V–
4
Power
Negative (lowest) power supply
V+
8
Power
Positive (highest) power supply
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SBOS901C – MARCH 2019 – REVISED SEPTEMBER 2022
6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)
MIN
MAX
40
V
(V–) – 0.5
(V+) + 0.5
V
–10
10
mA
125
°C
150
°C
150
°C
Supply voltage, VS = (V+) – (V–)
Voltage
Input
Input (all pins except power-supply pins)
Current
Output short-circuit(2)
Continuous
Operating, TA
Temperature
–55
Junction, TJ
Storage, Tstg
(1)
(2)
UNIT
–65
Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute Maximum Ratings do not imply
functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions.
If used outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not be fully
functional, and this may affect device reliability, functionality, performance, and shorten the device lifetime.
Short-circuit to VS / 2 (groundinsymmetrical dual-supply setups), one amplifier per package.
6.2 ESD Ratings
VALUE
V(ESD)
(1)
(2)
Electrostatic discharge
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)
±2000
Charged-device model (CDM), per JEDEC specification JESD22-C101(2)
±1000
UNIT
V
JEDEC document JEP155 states that 500-V HBM allowssafemanufacturing with a standard ESD control process.
JEDEC document JEP157 states that 250-V CDM allowssafemanufacturing with a standard ESD control process.
6.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN
4
VS
Supply voltage
TA
Operating temperature
Single supply
Dual supply
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NOM
MAX
4.5
36
±2.25
±18
–40
125
UNIT
V
°C
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SBOS901C – MARCH 2019 – REVISED SEPTEMBER 2022
6.4 Thermal Information: OPA1655
OPA1655
THERMAL
METRIC(1)
D (SOIC)
DBV (SOT23)
8 PINS
5 PINS
UNIT
RθJA
Junction-to-ambient thermal resistance
120.9
143.4
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
58.9
68.4
°C/W
RθJB
Junction-to-board thermal resistance
65.1
39.2
°C/W
ψJT
Junction-to-top characterization parameter
13.5
20.4
°C/W
ψJB
Junction-to-board characterization parameter
64.2
39.0
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
N/A
N/A
°C/W
(1)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
6.5 Thermal Information: OPA1656
OPA1656
THERMAL METRIC(1)
D (SOIC)
UNIT
8 PINS
RθJA
Junction-to-ambient thermal resistance
119.9
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
51.8
°C/W
RθJB
Junction-to-board thermal resistance
65.4
°C/W
ψJT
Junction-to-top characterization parameter
10.0
°C/W
ψJB
Junction-to-board characterization parameter
64.2
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
N/A
°C/W
(1)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
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SBOS901C – MARCH 2019 – REVISED SEPTEMBER 2022
6.6 Electrical Characteristics
at TA = 25°C, VS = ±18 V, RL = 2 kΩ, and VCM = VOUT = VS/2 (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
AUDIO PERFORMANCE
0.000029%
G = 1, RL = 600 Ω, VO = 3.5 VRMS, f = 1 kHz,
80-kHz measurement bandwidth
–131
G = 1, RL = 600 Ω, VO = 3.5 VRMS, f = 20 kHz,
80-kHz measurement bandwidth
THD+N
IMD
–120
Total harmonic distortion + noise
Intermodulation distortion
G = 1, RL = 2 kΩ, VO = 3.5 VRMS, f = 1 kHz,
80-kHz measurement bandwidth
0.000029%
G = 1, RL = 2 kΩ, VO = 3.5 VRMS, f = 20 kHz,
80-kHz measurement bandwidth
0.000035%
SMPTE/DIN two-tone, 4:1
(60 Hz and 7 kHz)
0.000018%
CCIF twin-tone
(19 kHz and 20 kHz)
0.000020%
G=1
VO = 3.5 VRMS
dB
0.0001%
dB
–131
dB
–129
dB
–135
dB
–134
dB
FREQUENCY RESPONSE
GBW
SR
Gain-bandwidth product
G = 100
53
MHz
Unity gain bandwidth
G=1
20
MHz
Slew rate
G = –1, 10-V step
24
V/µs
Full-power bandwidth(1)
VO = 1 VP
3.8
MHz
Overload recovery time
G = –10
100
ns
Channel separation
f = 1 kHz
–135
dB
Settling time
0.01%, G = –1, 10-V step
800
ns
f = 20 Hz to 20 kHz
0.53
µVRMS
f = 0.1 Hz to 10 Hz
1.9
µVPP
11.8
nV/√Hz
NOISE
Input voltage noise
f = 100 Hz
en
Input voltage noise density
in
Input current noise density
f = 1 kHz
4.3
f = 10 kHz
2.9
f = 1 kHz
nV/√Hz
6
fA/√Hz
OFFSET VOLTAGE
VOS
Input offset voltage
VS = ±2.25 V to ±18 V
±0.5
±1
mV
dVOS/dT
Input offset voltage drift(2)
VS = ±2.25 V to ±18 V
TA = –40°C to +125°C
0.3
2
µV/°C
PSRR
Power-supply rejection ratio
VS = ±2.25 V to ±18 V
0.3
5
µV/V
INPUT BIAS CURRENT
IB
Input bias current(3)
VCM = 0 V
IOS
Input offset current
VCM = 0 V
OPA1655
±10
OPA1656
±10
OPA1655
±10
OPA1656
±10
±20
±20
pA
pA
INPUT VOLTAGE RANGE
VCM
Common-mode voltage range
CMRR
Common-mode rejection ratio
(V–)
(V–) ≤ VCM ≤ (V+) – 2.25
106
(V+) – 2.25
120
V
dB
INPUT IMPEDANCE
Differential
100 || 9.1
Common-mode
6 || 1.9
MΩ || pF
1012Ω || pF
OPEN-LOOP GAIN
AOL
6
Open-loop voltage gain
(V–) + 1.3 V ≤ VO ≤ (V+) – 1.3 V
RL = 600 Ω
134
150
(V–) + 0.5 V ≤ VO ≤ (V+) – 0.5 V
RL = 2 kΩ
134
154
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6.6 Electrical Characteristics (continued)
at TA = 25°C, VS = ±18 V, RL = 2 kΩ, and VCM = VOUT = VS/2 (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
OUTPUT
VO
Voltage output
ZO
Open-loop output impedance
(V–) + 0.25
ISC
Short-circuit current(4)
±100
mA
CL
Capacitive load drive
100
pF
f = 1 MHz
(V+) – 0.25
26
V
Ω
POWER SUPPLY
IQ
(1)
(2)
(3)
(4)
Quiescent current (per channel)
IO = 0 A, VS = ±2.25 V to ±18 V
IO = 0 A, TA = –40°C to +125°C(2)
3.9
4.6
5.0
mA
Full-power bandwidth = SR / (2π × VP), where SR = slew rate.
Specified by design and characterization.
Input bias current test conditions can vary from nominal ambient conditions as a result of junction temperature differences.
One channel at a time.
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6.7 Typical Characteristics
at TA = 25°C, VS = ±15 V, RL = 2 kΩ, and VCM = VS/2 (unless otherwise noted)
Input Referred Voltage Noise (500 nV/div)
Voltage Noise Density (nV/—Hz)
100
10
1
10
100
1k
10k
100k
Frequency (Hz)
1M
10M
Time (1 s/div)
C020
D029
Figure 6-1. Input Voltage Noise Density vs Frequency
1000
500
50
Voltage Noise Contribution
Resistor Noise Contribution
Current Noise Contribution
Total Noise Contribution
20
10
5
2
1
0.5
100
1k
10k
Source Resistance (:)
100k
20
0
100
1M
120
120
90
90
60
60
30
30
0
0
-30
100
1k
10k 100k
Frequency (Hz)
1M
10M
D113
10M
G= 1
G= 1
G= 10
G= +100
40
20
0
-20
100
1k
D104
CL = 10 pF
10k
100k
Frequency (Hz)
1M
10M
D106
CL = 10 pF
Figure 6-5. Open-Loop Gain and Phase vs Frequency
8
1M
60
Phase (q)
150
180
Gain
Phase 150
10
10k
100k
Frequency (Hz)
Figure 6-4. Maximum Output Voltage vs Frequency
Gain (dB)
180
1
1k
D120
Figure 6-3. Voltage Noise vs Source Resistance
Gain (dB)
30
10
0.2
0.1
10
-30
100m
Vs=r18 V
Vs=r15 V
Vs=r2.25 V
40
Output Voltage (VP)
200
100
50
Noise (nV/—Hz)
Figure 6-2. 0.1-Hz to 10-Hz Noise
Figure 6-6. Closed-Loop Gain vs Frequency
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6.7 Typical Characteristics (continued)
-120
20
100
1k
Frequency (Hz)
VOUT = 3 VRMS
10k
-140
20k
0.1
0.01
-100
0.0001
-120
1E-5
100m
f = 1 kHz
-120
-140
2E-6
1E-6
5E-7
-160
2E-7
1E-7
5E-8
-180
2E-8
1E-8
20
100
1k
Frequency (Hz)
VOUT = 3 VRMS
10k
-200
20k
G = 1, VIN = 1 VPP (0.354 VRMS)
G = 1, VIN = 5 VPP (1.768 VRMS)
G = +1, VIN = 1 VPP (0.354 VRMS)
G = +1, VIN = 5 VPP (1.768 VRMS)
0.003
0.002
0.001
0.0007
0.0005
0.0001
7E-5
5E-5
-120
3E-5
2E-5
r5
r10
Bandwidth = 80 kHz
f = 1 kHz
-20
-100
0.0001
-120
-40
Amplitude (dBc)
-80
0.001
D141
Bandwidth = 80 kHz
0
Intermodulation Distortion (dB)
0.01
RL = 2 kΩ
Figure 6-10. THD+N vs Supply Voltage
-60
CCIF
SMPTE
r18
VS (V)
D111
0.1
-100
0.0003
0.0002
Figure 6-9. Individual Harmonic Amplitude vs Frequency
Intermodulation Distortion (%)
D110
Bandwidth = 80 kHz
0.005
Noise (%)
1, HD2
1, HD3
1, HD4
1, HD5
1, HD2
1, HD3
1, HD4
1, HD5
Amplitude (dB)
2E-5
1E-5
5E-6
10
Figure 6-8. THD+N Ratio vs Output Amplitude
Total Harmonic Distortion
Amplitude ( )
0.0002
0.0001
5E-5
-140
1
Output Amplitude (VRMS)
D109
Bandwidth = 80 kHz
-100
G=
G=
G=
G=
G=
G=
G=
G=
-40
1, 600 : Load
1, 2k : Load
1, 10k : Load
-60
1, 600 : Load
1, 2k : Load
1, 10k : Load
-80
0.001
Figure 6-7. THD+N Ratio vs Frequency
0.001
0.0005
G=
G=
G=
G=
G=
G=
Total Harmonic Distortion + Noise (dB)
0.00001
Noise (dB)
0.0001
1
Noise (%)
0.001
-80
1, 600 : Load
1, 2k : Load
1, 10k : Load
1, 600 : Load
1, 2k : Load
1, 10k : Load -100
Total Harmonic Distortion
G=
G=
G=
G=
G=
G=
Total Harmonic Distortion
Total Harmonic Distortion
Noise (%)
0.01
Total Harmonic Distortion + Noise (dB)
at TA = 25°C, VS = ±15 V, RL = 2 kΩ, and VCM = VS/2 (unless otherwise noted)
-60
-80
-100
-120
-140
-160
-180
1E-5
10m
-140
100m
1
Output Amplitude (VRMS)
10
-200
20
100
D140
Bandwidth = 80 kHz
Figure 6-11. Intermodulation Distortion vs Amplitude
G = 1, VOUT = 3 VRMS
1k
Frequency (Hz)
RL = 2 kΩ
10k
50k
D142
Bandwidth = 80 kHz
Figure 6-12. FFT, 1-kHz Sine Wave
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6.7 Typical Characteristics (continued)
0
0
-20
-20
-40
-40
-60
-60
Amplitude (dBc)
Amplitude (dBc)
at TA = 25°C, VS = ±15 V, RL = 2 kΩ, and VCM = VS/2 (unless otherwise noted)
-80
-100
-120
-140
-80
-100
-120
-140
-160
-160
-180
-180
-200
1k
-200
10k
Frequency (Hz)
G = 1, VOUT = 3 VRMS
RL = 2 kΩ
0
80k
Bandwidth = 80 kHz
VOUT = 3 VRMS
Figure 6-13. FFT, 10-kHz Sine Wave
Rejection Ratio (dB)
Channel Seperation (dB)
80k
D143
Bandwidth = 80 kHz
PSRR
PSRR
CMRR
140
-100
-120
-140
-160
120
100
80
60
40
20
-180
1k
0
10k
100k
Frequency (Hz)
VOUT = 3 VRMS
1M
10M
1
10
100
D114
1k
10k
Frequency (Hz)
100k
1M
10M
D107
G=1
Figure 6-15. Channel Separation vs Frequency
Figure 6-16. CMRR and PSRR vs Frequency (Referred to Input)
147
126
Common-Mode Rejection Ratio (dB)
Power Supply Rejection Ratio (dB)
RL = 2 kΩ
60k
160
-80
146
145
144
-25
-10
5
20 35 50 65
Temperature (qC)
80
95
110 125
125
124
123
122
-40
-25
-10
D028
Figure 6-17. Power Supply Rejection Ratio vs Temperature
(Referred to Input)
10
40k
Frequency (Hz)
Figure 6-14. FFT, CCIF Input (19 kHz + 20 kHz)
-60
143
-40
20k
D143
5
20 35 50 65
Temperature (qC)
80
95
110 125
D027
Figure 6-18. Common Mode Rejection Ratio vs Temperature
(Referred to Input)
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6.7 Typical Characteristics (continued)
at TA = 25°C, VS = ±15 V, RL = 2 kΩ, and VCM = VS/2 (unless otherwise noted)
15
30
Total Amplifiers (%)
Total Amplifiers (%)
25
10
5
20
15
10
5
-1000
-750
-500
-250
0
250
500
Input Offset Voltage (PV)
750
-2
1000
-1.5
D001
-1
-0.5
0
0.5
1
Offset Voltage Drift (PV/qC)
1.5
2
D004
Count = 32
Count = 7955
Figure 6-20. Input Offset Voltage Drift Distribution
Figure 6-19. Input Offset Voltage Distribution
1
100
-40qC
50
0.5
Offset Voltage (PV)
Offset Voltage (mV)
75
0
25
0
-25
-50
-0.5
25qC
-75
-1
-40
-25
-10
5
20 35 50 65
Temperature (qC)
80
95
-100
-18 -15 -12
110 125
D017
85qC
125qC
-9 -6 -3
0
3
6
9
Input Common-Mode Voltage (V)
12
15
18
D019
5 typical units shown
Figure 6-22. Input Offset vs Common Mode Voltage
Figure 6-21. Input Offset vs Temperature
Voltage (5 mV/div)
VIN
VOUT
Voltage (5 mV/div)
VIN
VOUT
Time (1 Ps/div)
Time (1 Ps/div)
D137
G=1
CL = 20 pF
D135
G = –1
Figure 6-23. Small-Signal Step Response (100 mV)
CL = 100 pF
Figure 6-24. Small-Signal Step Response (100 mV)
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6.7 Typical Characteristics (continued)
at TA = 25°C, VS = ±15 V, RL = 2 kΩ, and VCM = VS/2 (unless otherwise noted)
Voltage (5 V/div)
VIN
VOUT
Voltage (5 V/div)
VIN
VOUT
Time (1 Ps/div)
Time (1 Ps/div)
D136
G=1
RL = 2 kΩ
D139
CL = 100 pF
G = –1
Figure 6-25. Large-Signal Step Response
Figure 6-26. Large-Signal Step Response
100
50
156
20
10
5
Input Bias Current (nA)
158
AOL (dB)
154
152
150
148
IB+
IBIOS
2
1
0.5
0.2
0.1
0.05
146
0.02
0.01
0.005
144
-40
0.002
0.001
-40
-25
-10
5
20 35 50 65
Temperature(qC)
80
95
110 125
-10
5
20 35 50 65
Temperature (qC)
80
95
110 125
D024
Figure 6-28. IB and IOS vs Temperature
4
30
IBIB+
IOS
VS = 4.5 V
VS = 36 V
Quiescent Current (mA)
Input Bias Current (pA)
-25
D033
Figure 6-27. Open-Loop Gain vs Temperature
20
CL = 100 pF
10
0
-10
3.9
3.8
3.7
-20
-30
-18 -15 -12
-9 -6 -3
0
3
6
9
Input Common-Mode Voltage (V)
12
15
Figure 6-29. IB and IOS vs Common-Mode Voltage
12
18
3.6
-40
-25
-10
D023
5
20 35 50 65
Temperature (qC)
80
95
110 125
D031
Figure 6-30. Supply Current vs Temperature
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6.7 Typical Characteristics (continued)
4.5
18
4
17
25qC
Output Voltage (V)
Quiescent Current (mA)
at TA = 25°C, VS = ±15 V, RL = 2 kΩ, and VCM = VS/2 (unless otherwise noted)
3.5
3
2.5
-40qC
16
15
125qC
14
2
13
1.5
12
85qC
0
4
8
12
16
20
24
Supply Voltage (V)
28
32
36
0
Figure 6-31. Supply Current vs Supply Voltage
20
30
40 50 60 70 80
Output Current (mA)
90 100 110 120
D025
Figure 6-32. Output Voltage vs Output Current (Sourcing)
-12
140
Sinking
Sourcing
132
85qC
Short Circuit Current (mA)
-13
Output Voltage (V)
10
D030
-14
125qC
-15
-16
25qC
-17
-40qC
124
116
108
100
92
84
76
68
60
-40
-18
0
10
20
30
40 50 60 70 80
Output Current (mA)
90 100 110 120
-10
5
20 35 50 65
Temperature (qC)
80
95
110 125
D041
Figure 6-34. Short-Circuit Current vs Temperature
Figure 6-33. Output Voltage vs Output Current (Sinking)
75
100
90
80
Overshoot ( )
50
Phase Margin (q)
-25
D026
25
0
RISO = 0 :
RISO = 25 :
RISO = 50 :
70
60
50
40
30
20
-25
10
100
Load Capacitance, CL (pF)
500
10
10
D105
100
Load Capacitance, C L (pF)
1000
D037
G=1
G=1
Figure 6-35. Phase Margin vs Capacitive Load
Figure 6-36. Percent Overshoot vs Capacitive Load
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6.7 Typical Characteristics (continued)
at TA = 25°C, VS = ±15 V, RL = 2 kΩ, and VCM = VS/2 (unless otherwise noted)
60
RISO = 0 :
RISO = 25 :
RISO = 50 :
Voltage (5 V/div)
50
Overshoot ( )
40
30
20
10
0
10
VIN
VOUT
100
Load Capacitance, CL (pF)
Time (400 ns/div)
1000
D134
D131
G = –10
G = –1
Figure 6-38. Negative Overload Recovery
Figure 6-37. Percent Overshoot vs Capacitive Load
1000
VIN
VOUT
ZO :
Voltage (5 V/div)
100
10
1
0.1
Time (400 ns/div)
1
10
100
1k
10k
Frequency (Hz)
D138
100k
1M
10M
D112
G = –10
Figure 6-39. Positive Overload Recovery
Figure 6-40. Open-Loop Output Impedance vs Frequency
Voltage (5 V/div)
VIN
VOUT
Time (400 ns/div)
D138
G=1
Figure 6-41. No Phase Reversal
14
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7 Detailed Description
7.1 Overview
The OPA1655 and OPA1656 (OPA165x) use a three-gain-stage architecture to achieve very low noise and
distortion. The Functional Block Diagram shows a simplified schematic of the OPA165x (one channel shown).
The devices consist of a low-noise input stage and feedforward pathway coupled to a high-current output stage.
This topology exhibits superior distortion performance under a wide range of loading conditions compared to
other operational amplifiers.
7.2 Functional Block Diagram
Feedforward
Path
CM1
CM2
+IN
Input
Stage
Gain
Stage
Output
Stage
OUT
-IN
7.3 Feature Description
7.3.1 Phase Reversal Protection
The OPA165x have internal phase-reversal protection. Many op amps exhibit phase reversal when the input is
driven beyond the linear common-mode range. This condition is most often encountered in noninverting circuits
when the input is driven beyond the specified common-mode voltage range, causing the output to reverse into
the opposite rail. The input of the OPA165x prevents phase reversal with excessive common-mode voltage.
Instead, the appropriate rail limits the output voltage. This performance is shown in Figure 7-1.
20
15
Voltage (V)
10
5
0
-5
-10
-15
-20
VIN
VOUT
Time (125 s/div)
C004
Figure 7-1. Output Waveform Devoid of Phase Reversal During an Input Overdrive Condition
7.3.2 Electrical Overstress
Designers often ask questions about the capability of an operational amplifier to withstand electrical overstress.
These questions tend to focus on the device inputs, but can involve the supply voltage pins or even the output
pin. Each of these different pin functions have electrical stress limits determined by the voltage breakdown
characteristics of the particular semiconductor fabrication process and specific circuits connected to the pin.
Additionally, internal electrostatic discharge (ESD) protection is built into these circuits to protect them from
accidental ESD events both before and during product assembly.
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A good understanding of this basic ESD circuitry and the relevance to an electrical overstress event is helpful.
Figure 7-2 illustrates the ESD circuits contained in the OPA165x (indicated by the dashed line area). The ESD
protection circuitry involves several current-steering diodes connected from the input and output pins and routed
back to the internal power-supply lines, where the diodes meet at an absorption device internal to the operational
amplifier. This protection circuitry is intended to remain inactive during normal circuit operation.
TVS
+
±
RF
+VS
R1
IN±
20 Ÿ
RS
IN+
20 Ÿ
+
Power-Supply
ESD Cell
VIN
RL
+
±
+
±
±VS
TVS
Figure 7-2. Equivalent Internal ESD Circuitry Relative to a Typical Circuit Application
An ESD event produces a short-duration, high-voltage pulse that is transformed into a short-duration, highcurrent pulse when discharging through a semiconductor device. The ESD protection circuits are designed to
provide a current path around the operational amplifier core to prevent damage. The energy absorbed by the
protection circuitry is then dissipated as heat.
When an ESD voltage develops across two or more amplifier device pins, current flows through one or
more steering diodes. Depending on the path that the current takes, the absorption device can activate. The
absorption device has a trigger, or threshold voltage, that is above the normal operating voltage of the OPA165x
but below the device breakdown voltage level. When this threshold is exceeded, the absorption device quickly
activates and clamps the voltage across the supply rails to a safe level.
When the operational amplifier connects into a circuit, as shown in Figure 7-2, the ESD protection components
are intended to remain inactive and do not become involved in the application circuit operation. However,
circumstances may arise where an applied voltage exceeds the operating voltage range of a given pin. If this
condition occurs, there is a risk that some internal ESD protection circuits can turn on and conduct current. Any
such current flow occurs through steering-diode paths and rarely involves the absorption device.
Figure 7-2 shows a specific example where the input voltage (VIN) exceeds the positive supply voltage (V+)
by 500 mV or more. Much of what happens in the circuit depends on the supply characteristics. If V+ can
sink the current, one of the upper input steering diodes conducts and directs current to V+. Excessively high
current levels can flow with increasingly higher VIN. As a result, the data sheet specifications recommend that
applications limit the input current to 10 mA.
16
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If the supply is not capable of sinking the current, VIN can begin sourcing current to the operational amplifier and
then take over as the source of positive supply voltage. The danger in this case is that the voltage can rise to
levels that exceed the operational amplifier absolute maximum ratings.
Another common question involves what happens to the amplifier if an input signal is applied to the input when
the power supplies (V+ or V–) are at 0 V. Again, this question depends on the supply characteristic when at
0 V, or at a level below the input signal amplitude. If the supplies appear as high impedance, then the input
source supplies the operational amplifier current through the current-steering diodes. This state is not a normal
bias condition; most likely, the amplifier does not operate normally. If the supplies are low impedance, then the
current through the steering diodes can become quite high. The current level depends on the ability of the input
source to deliver current, and any resistance in the input path.
If there is any uncertainty about the ability of the supply to absorb this current, add external Zener diodes to the
supply pins; see Figure 7-2. Select the Zener voltage so that the diode does not turn on during normal operation.
However, the Zener voltage must be low enough so that the Zener diode conducts if the supply pin begins to rise
above the safe-operating, supply-voltage level.
7.3.3 EMI Rejection Ratio (EMIRR)
The electromagnetic interference (EMI) rejection ratio, or EMIRR, describes the EMI immunity of operational
amplifiers. An adverse effect that is common to many operational amplifiers is a change in the offset voltage
as a result of RF signal rectification. An operational amplifier that is more efficient at rejecting this change in
offset as a result of EMI has a higher EMIRR and is quantified by a decibel value. Measuring EMIRR can be
performed in many ways, but this document provides the EMIRR IN+, which specifically describes the EMIRR
performance when the RF signal is applied to the noninverting input pin of the operational amplifier. In general,
only the noninverting input is tested for EMIRR for the following three reasons:
• Operational amplifier input pins are known to be the most sensitive to EMI, and typically rectify RF signals
better than the supply or output pins.
• The noninverting and inverting operational amplifier inputs have symmetrical physical layouts and exhibit
nearly matching EMIRR performance.
• EMIRR is easier to measure on noninverting pins than on other pins because the noninverting input pin can
be isolated on a printed-circuit-board (PCB). This isolation allows the RF signal to be applied directly to the
noninverting input pin with no complex interactions from other components or connecting PCB traces.
A more formal discussion of the EMIRR IN+ definition and test method is provided in the EMI Rejection Ratio of
Operational Amplifiers application report, available for download at www.ti.com.
The EMIRR IN+ of the OPA165x is plotted versus frequency in Figure 7-3. If available, any dual and quad
operational amplifier device versions have nearly identical EMIRR IN+ performance. The OPA165x unity-gain
bandwidth is 20 MHz. EMIRR performance below this frequency denotes interfering signals that fall within the
operational amplifier bandwidth.
140
EMIRR IN+ (dB)
120
100
80
60
40
20
10M
100M
1G
Frequency (Hz)
10G
D115
Figure 7-3. OPA165x EMIRR vs Frequency
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Table 7-1 lists the EMIRR IN+ values for the OPA165x at particular frequencies commonly encountered in realworld applications. Applications listed in Table 7-1 can be centered on or operated near the particular frequency
shown. This information can be of special interest to designers working with these types of applications, or
working in other fields likely to encounter RF interference from broad sources, such as the industrial, scientific,
and medical (ISM) radio band.
Table 7-1. OPA165x EMIRR IN+ for Frequencies of Interest
FREQUENCY
APPLICATION OR ALLOCATION
EMIRR IN+
400 MHz
Mobile radio, mobile satellite, space operation, weather, radar, UHF
36 dB
900 MHz
GSM, radio communication and navigation, GPS (to 1.6 GHz), ISM,
aeronautical mobile, UHF
42 dB
1.8 GHz
GSM, mobile personal comm. broadband, satellite, L-band
52 dB
Bluetooth®
2.4 GHz
802.11b/g/n,
3.6 GHz
Radiolocation, aero comm./nav., satellite, mobile, S-band
67 dB
802.11a/n, aero communication and navigation, mobile communication,
space and satellite operation, C-band
77 dB
5 GHz
mobile personal comm., ISM, amateur radio and satellite, S-band
64 dB
7.3.3.1 EMIRR IN+ Test Configuration
Figure 7-4 shows the circuit configuration for testing the EMIRR IN+. An RF source is connected to the
operational amplifier noninverting input pin using a transmission line. The operational amplifier is configured
in a unity-gain buffer topology with the output connected to a low-pass filter (LPF) and a digital multimeter
(DMM). A large impedance mismatch at the operational amplifier input causes a voltage reflection; however, this
effect is characterized and accounted for when determining the EMIRR IN+. The resulting dc offset voltage is
sampled and measured by the multimeter. The LPF isolates the multimeter from residual RF signals that can
interfere with multimeter accuracy. See the EMI Rejection Ratio of Operational Amplifiers application report for
more details.
Ambient temperature: 25Û&
+VS
±
50
Low-Pass Filter
+
RF source
DC Bias: 0 V
Modulation: None (CW)
Frequency Sweep: 201 pt. Log
-VS
Not shown: 0.1 µF and 10 µF
supply decoupling
Sample /
Averaging
Digital Multimeter
Figure 7-4. EMIRR IN+ Test Configuration Schematic
7.4 Device Functional Modes
The OPA165x have a single functional mode and are operational when the power-supply voltage is greater than
4.5 V. The maximum specified power-supply voltage for the OPA165x is 36 V.
In all cases, the common-mode voltage must be maintained within the specified range. In addition, key
parameters are specified over the temperature range of TA = –40°C to +125°C.
18
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8 Application and Implementation
Note
Information in the following applications sections is not part of the TI component specification,
and TI does not warrant its accuracy or completeness. TI’s customers are responsible for
determining suitability of components for their purposes, as well as validating and testing their design
implementation to confirm system functionality.
8.1 Application Information
8.1.1 Basic Noise Calculations
Low-noise circuit design requires careful analysis of all noise sources. External noise sources can dominate in
many cases; consider the effect of source resistance on overall op amp noise performance. Total noise of the
circuit is the root-sum-square combination of all noise components.
Figure 8-1 shows noninverting (A) and inverting (B) op amp circuit configurations with gain. In circuit
configurations with gain, the feedback network resistors contribute noise. In general, the current noise of the
op amp reacts with the feedback resistors to create additional noise components.
The selected feedback resistor values make these noise sources negligible. Low impedance feedback resistors
load the output of the amplifier. The equations for total noise are shown for both configurations.
(A) Noise in Noninverting Gain Configuration
R1
Noise at the output is given as EO, where
R2
GND
±
EO
+
RS
+
±
VS
Source
GND
'1 = l1 +
:2;
A5 = ¥4 „ G$ „ 6(-) „ 45
d
:3;
A41 æ42 = ¨4 „ G$ „ 6(-) „ d
8
41 „ 42
h d
h
41 + 42
¾*V
Thermal noise of R1 || R2
:4;
G$ = 1.38065 „ 10F23
Boltzmann Constant
:5;
,
h
-
6(-) = 237.15 + 6(°%)
(B) Noise in Inverting Gain Configuration
R1
RS
R2
h
>-?
Thermal noise of RS
Temperature in kelvins
:45 + 41 ; „ 42
42
2
p „ ¨:A0 ;2 + kA41 +45 æ42 o + FE0 „ H
IG
45 + 41
45 + 41 + 42
:6;
'1 = l1 +
+
:7;
:45 + 41 ; „ 42
8
I d
A41 +45 æ42 = ¨4 „ G$ „ 6(-) „ H
h
45 + 41 + 42
¾*V Thermal noise of (R1 + RS) || R2
GND
:8;
G$ = 1.38065 „ 10F23
:9;
6(-) = 237.15 + 6(°%)
±
+
±
d
8
¾*V
> 84/5 ?
Noise at the output is given as EO, where
EO
VS
42
41 „ 42 2
2
p „ ¨:A5 ;2 + :A0 ;2 + kA41 æ42 o + :E0 „ 45 ;2 + lE0 „ d
hp
41
41 + 42
:1;
Source
GND
d
,
h
-
>-?
2
> 84/5 ?
Boltzmann Constant
Temperature in kelvins
Copyright © 2017, Texas Instruments Incorporated
where
•
•
eN is the voltage noise of the amplifier. For the OPA165x, eN = 4.3 nV/√Hz at 1 kHz.
iN is the current noise of the amplifier. For the OPA165x, iN = 6 fA/√Hz at 1 kHz.
Note: For additional resources on noise calculations, see TI's Precision Labs Series.
Figure 8-1. Noise Calculation in Gain Configurations
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8.2 Typical Applications
8.2.1 Preamplifier Circuit for Vinyl Record Playback With Moving-Magnet Phono Cartridges
The noise and distortion performance of the OPA165x is exceptional in applications with high source
impedances, which makes these devices an excellent choice in preamplifier circuits for moving magnet phono
cartridges. The high source impedance of the cartridge, and high gain required by the RIAA playback curve at
low frequency, requires an amplifier with both low input current noise and low input voltage noise.
15 V
MM Phono Input
+IN
R1
47 k
C1
150 pF
IN
R2
118 k
R4
127
C2
27 nF
OPA165x
+
R5
100
VOUT
–
15 V
R3
10 k
C5
100 F
Output
R6
100 k
C3
7.5 nF
C4
100 F
Figure 8-2. Preamplifier Circuit for Vinyl Record Playback With Moving-Magnet Phono Cartridges
(Single Channel Shown)
8.2.1.1 Design Requirements
•
•
•
20
Gain: 40 dB (1 kHz)
RIAA accuracy: ±0.5 dB (100 Hz to 20 kHz)
Power supplies: ±15 V
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8.2.1.2 Detailed Design Procedure
Vinyl records are recorded using an equalization curve specified by the Recording Institute Association of
America (RIAA). The purpose of this equalization curve is to decrease the amount of space occupied by a
groove on the record and therefore maximize the amount of information able to be stored. Proper playback
of music stored on the record requires a preamplifier circuit that applies the inverse transfer function of the
recording equalization curve. The combination of the recording equalization and the playback equalization
results in a flat frequency response over the audio range, as Figure 8-3 shows.
20
15
Playback Curve
10
Gain (dB)
5
0
Combined Response
-5
-10
Recording Curve
-15
-20
10
100
1000
10000
Frequency (Hz)
C009
Figure 8-3. RIAA Recording and Playback Curves Normalized at 1 kHz
The basic RIAA playback curve implements three time constants: 75 μs, 380 μs, and 3180 μs. An IEC
amendment was later added to the playback curve and implements a pole in the curve at 20 Hz with the
intent of protecting loudspeakers from excessive low frequency content. Rather than strictly adhering to the
IEC amendment, this design moves this pole to a lower frequency to improve low frequency response and still
provide protection for loudspeakers.
Resistor R1 and capacitor C1 are selected to provide the proper input impedance for the moving magnet
cartridge. Cartridge loading is specified by the manufacturer in the cartridge datasheet and is absolutely crucial
for proper response at high frequency. 47 kΩ is a common value for the input resistor, and the capacitive
loading is usually specified from 200 pF to 300 pF per channel. This capacitive loading specification includes
the capacitance of the cable connecting the turntable to the preamplifier, as well as any additional parasitic
capacitances at the preamplifier input. Therefore, the value of C1 must be less than the loading specification to
account for these additional capacitances.
The output network consisting of R5, R6, and C5 serves to ac couple the preamplifier circuit to any subsequent
electronics in the signal path. 100-Ω resistor R5 limits in-rush current into coupling capacitor C5 and prevents
parasitic capacitance from cabling from causing instability. R6 prevents charge accumulation on C5. Capacitor
C5 is chosen to be the same value as C4; for simplicity however, the value of C5 must be large enough to avoid
attenuating low-frequency information.
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The feedback resistor elements must be selected to provide the correct response within the audio bandwidth. In
order to achieve the correct frequency response, the passive components in Figure 8-2 must satisfy Equation 1,
Equation 2, and Equation 3:
R2 × C2 = 3180 μs
(1)
R3 × C3 = 75 μs
R2
(2)
R3 × C2 + C3 = 318 μs
(3)
R2, R3, and R4 must also be selected to meet the design requirements for gain. The gain at 1 kHz is determined
by subtracting 20 dB from gain of the circuit at very low-frequency (near dc), as shown in Equation 4:
A1kHz = ALF − 20 dB
(4)
Therefore, the low frequency gain of the circuit must be 60 dB to meet the goal of 40 dB at 1 kHz and is
determined by resistors R2, R3, and R4 as shown in Equation 5:
R +R
ALF = 1 + 3R 2 = 1000 60 dB
4
(5)
Because there are multiple combinations of passive components that satisfy these equations, a spreadsheet or
other software calculation tool is the easiest method to examine resistor and capacitor combinations.
Capacitor C4 forces the gain of the circuit to unity at dc in order to limit the offset voltage at the output of the
preamplifier circuit. The high-pass corner frequency created by this capacitor is calculated by Equation 6:
FHP = 2πR1 C
4 4
(6)
The circuit described in Figure 8-2 is constructed with 1% tolerance resistors and 5% tolerance NP0, C0G
ceramic capacitors without any additional hand sorting. The large value of C4 typically requires an electrolytic
type to be used. However, electrolytic capacitors have the potential to introduce distortion into the signal path.
This circuit is constructed using a bipolar electrolytic capacitor specifically intended for audio applications.
22
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8.2.1.3 Application Curves
The deviation from the ideal RIAA transfer function curve is shown in Figure 8-4 and normalized to an ideal gain
of 40 dB at 1 kHz. The measured gain at 1 kHz is 0.05 dB less than the design goal, and the maximum deviation
from 100 Hz to 20 kHz is 0.18 dB. The deviation from the ideal curve can be improved by hand-sorting resistor
and capacitor values to their ideal values. The value of C4 can also be increased to reduce the deviation at low
frequency.
A spectrum of the preamplifier output signal is shown in Figure 8-5 for a 10 mVRMS, 1-kHz input signal (1-VRMS
output). All distortion harmonics are below the preamplifier noise floor.
1.5
Amplitude (dBV)
Magnitude (dB)
1
0.5
0
-0.5
10
100
1k
Frequency (Hz)
0
-10
-20
-30
-40
-50
-60
-70
-80
-90
-100
-110
-120
-130
-140
-150
-160
100
10k
D202
Figure 8-4. Measured Deviation
From Ideal RIAA Response
1k
Frequency (Hz)
10k
D201
Figure 8-5. Output Spectrum for a 10-mVRMS,
1‑kHz Input Signal
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8.2.2 Composite Headphone Amplifier
Figure 8-6 shows the BUF634A buffer inside the feedback loop of the OPA165x to increase the available
output current for low-impedance headphones. If the BUF634A is used in wide-bandwidth mode, no additional
components beyond the feedback resistors are required to maintain loop stability.
12 V
100 F
0.1 F
0.1 F
+
Input
R1
100 k
OPA165x
Output
BUF634A
0.1 F
–
0.1 F
RBW
100 F
12 V
R3
R2
500
500
Figure 8-6. Composite Headphone Amplifier (Single-Channel Shown)
8.2.2.1 Application Curves
-85
0
-30
Amplitude (dBc)
-90
THD + N (dB)
249 : RL
249 : RL
32 : RL
16 : RL
-95
-100
-105
-110
-90
-120
-150
20 Hz
100 Hz
1 kHz
20 kHz
Frequency (Hz)
-180
0
C051
Figure 8-7. THD+N vs Frequency for a
5‑VPP (1.77‑VRMS) Input Signal
24
-60
5000
10000
Frequency (Hz)
15000
20000
C052
Figure 8-8. FFT for a 5-VPP (1.77-VRMS),
1‑kHz Input Signal
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8.2.3 Baxandall Tone Control
Figure 8-9 gives an example of ultra-low noise and THD tone control. This circuit provides 20 dB of gain at the
first stage, followed by two separate tone controls for bass and treble. The passive circuit is designed to yield a
flat gain response with the potentiometers both set to 50%.
1.69 k
15.4 k
11 k
Bass
100 k
10 nF
10 µF
–
Input
11 k
10 nF
11 k
15 V
+
–
1/2
OPA1656
10 µF
+
4.7 nF
1.69 k
3.65 k
3.65 k
500 k
Treble
Output
1/2
OPA1656
15 V
Figure 8-9. Dual Potentiometer Baxandall Tone Control
8.2.3.1 Application Curves
40
10% Bass / 90% Treble
50% Bass / 50% Treble
90% Bass / 10% Treble
36
32
Amplitude (dB)
28
24
20
16
12
8
4
0
100
1k
Frequency (Hz)
10k
D203
Figure 8-10. Amplitude vs Frequency for Various Tone-Control Settings
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8.2.4 Guitar Input to XLR Output
The OPA165x are an excellent choice for guitar input circuits as a result of the high input impedance and
ultra-low noise performance. Figure 8-11 gives an example of a basic guitar input circuit to differential XLR
schematic. The logarithmic taper potentiometer shown in this circuit provides 6 dB of gain at 0%, and 40 dB of
gain at 100%. The rail-to-rail output swing of the OPA165x allows for a high amplitude swing at the outputs of
the differentially configured amplifiers, while maintaining very low distortion performance. A 10-µF dc blocking
capacitor is used in the feedback of the noninverting stage to remove any dc offset as a result of the amplifier
offset voltage. However, this dc blocking capacitor can be eliminated for applications that are not sensitive to low
dc offsets.
10 µF
100 k
1 k
1k
¼ Inch
Jack
10 pF
–
49
+
1/2
OPA1656
1 M
XLR
Output
1 k
1 k
10 pF
5V
49
–
1/2
OPA1656
+
5 V
Figure 8-11. Guitar Input to XLR Output Schematic
0.1
0.08
0.06
0.04
0.02
0
-0.02
-0.04
-0.06
-0.08
-0.1
-0.12
-0.14
-0.16
-0.18
-0.2
0
0.4
0.8
1.2
1.6
2
2.4
3.3
Input Voltage
3
Output Voltage 1 2.7
Output Voltage 2 2.4
2.1
1.8
1.5
1.2
0.9
0.6
0.3
0
-0.3
-0.6
-0.9
-1.2
2.8 3.2 3.6
4
Output Voltage (V)
Input Voltage (V)
8.2.4.1 Application Curves
D200
Figure 8-12. 1-kHz Input Signal Transient Simulation
26
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8.3 Power Supply Recommendations
The OPA165x are specified for operation from 4.5 V to 36 V (±2.25 V to ±18 V); many specifications apply from
–40°C to +125°C. Parameters that can exhibit significant variance with regard to operating voltage or
temperature are presented in the Typical Characteristics section.
The OPA165x operate with as little as 4.5 V between the supplies and with up to 36 V between the supplies.
However, some applications do not require equal positive and negative output voltage swing. With the OPA165x,
power-supply voltages are not required to be equal. For example, the positive supply can be set to 25 V with the
negative supply at –5 V.
8.4 Layout
8.4.1 Layout Guidelines
For best operational performance of the device, use good printed-circuit board (PCB) layout practices, including:
•
•
•
•
•
•
•
•
Noise can propagate into analog circuitry through the power pins of the circuit as a whole and of op amp
itself. Bypass capacitors are used to reduce the coupled noise by providing low-impedance power sources
local to the analog circuitry.
– Connect low-ESR, 0.1-µF ceramic bypass capacitors between each supply pin and ground, placed as
close to the device as possible. A single bypass capacitor from V+ to ground is applicable for singlesupply applications.
Separate grounding for analog and digital portions of circuitry is one of the simplest and most-effective
methods of noise suppression. One or more layers on multilayer PCBs are usually devoted to ground planes.
A ground plane helps distribute heat and reduces electromagnetic interference (EMI) noise pickup. Physically
separate digital and analog grounds, observing the flow of the ground current.
To reduce parasitic coupling, run the input traces as far away from the supply or output traces as possible. If
these traces cannot be kept separate, crossing the sensitive trace perpendicular is much better as opposed
to in parallel with the noisy trace.
Place the external components as close to the device as possible. As illustrated in Figure 8-13, keeping RF
and RG close to the inverting input minimizes parasitic capacitance.
Keep the length of input traces as short as possible. Always remember that the input traces are the most
sensitive part of the circuit.
Consider a driven, low-impedance guard ring around the critical traces. A guard ring can significantly reduce
leakage currents from nearby traces that are at different potentials.
Cleaning the PCB following board assembly is recommended for best performance.
Any precision integrated circuit can experience performance shifts resulting from moisture ingress into the
plastic package. Following any aqueous PCB cleaning process, baking the PCB assembly is recommended
to remove moisture introduced into the device packaging during the cleaning process. A low-temperature,
post-cleaning bake at 85°C for 30 minutes is sufficient for most circumstances.
8.4.1.1 Power Dissipation
The OPA165x op amps are capable of driving 600-Ω loads with a power-supply voltage up to ±18 V and
full operating temperature range. Internal power dissipation increases when operating at high supply voltages.
Copper leadframe construction used in the OPA165x improves heat dissipation compared to conventional
materials. Circuit board layout can also help minimize junction temperature rise. Wide copper traces help
dissipate the heat by acting as an additional heat sink. Temperature rise can be further minimized by soldering
the devices to the circuit board rather than using a socket.
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8.4.2 Layout Example
+
VIN A
+
VIN B
VOUT A
RG
VOUT B
RG
RF
RF
(Schematic Representation)
Place components
close to device and to
each other to reduce
parasitic errors.
Output A
VS+
OUTPUT A
Use low-ESR,
ceramic bypass
capacitor. Place as
close to the device
as possible.
GND
V+
RF
Output B
GND
-IN A
OUTPUT B
+IN A
-IN B
RF
RG
VIN A
GND
RG
V±
Use low-ESR,
ceramic bypass
capacitor. Place as
close to the device
as possible.
GND
VS±
+IN B
Ground (GND) plane on another layer
VIN B
Keep input traces short
and run the input traces
as far away from
the supply lines
as possible.
Figure 8-13. Operational Amplifier Board Layout for Noninverting Configuration
28
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9 Device and Documentation Support
9.1 Device Support
9.1.1 Development Support
9.1.1.1 PSpice® for TI
PSpice® for TI is a design and simulation environment that helps evaluate performance of analog circuits. Create
subsystem designs and prototype solutions before committing to layout and fabrication, reducing development
cost and time to market.
9.1.1.2 TINA-TI™ Simulation Software (Free Download)
TINA-TI™ simulation software is a simple, powerful, and easy-to-use circuit simulation program based on a
SPICE engine. TINA-TI simulation software is a free, fully-functional version of the TINA™ software, preloaded
with a library of macromodels, in addition to a range of both passive and active models. TINA-TI simulation
software provides all the conventional dc, transient, and frequency domain analysis of SPICE, as well as
additional design capabilities.
Available as a free download from the Design tools and simulation web page, TINA-TI simulation software offers
extensive post-processing capability that allows users to format results in a variety of ways. Virtual instruments
offer the ability to select input waveforms and probe circuit nodes, voltages, and waveforms, creating a dynamic
quick-start tool.
Note
These files require that either the TINA software or TINA-TI software be installed. Download the free
TINA-TI simulation software from the TINA-TI™ software folder.
9.1.1.3 DIP-Adapter-EVM
Speed up your op amp prototyping and testing with the DIP-Adapter-EVM, which provides a fast, easy and
inexpensive way to interface with small, surface-mount devices. Connect any supported op amp using the
included Samtec terminal strips or wire them directly to existing circuits. The DIP-Adapter-EVM kit supports
the following industry-standard packages: D or U (SOIC-8), PW (TSSOP-8), DGK (VSSOP-8), DBV (SOT-23-6,
SOT-23-5 and SOT-23-3), DCK (SC70-6 and SC70-5), and DRL (SOT563-6).
9.1.1.4 DIYAMP-EVM
The DIYAMP-EVM is a unique evaluation module (EVM) that provides real-world amplifier circuits, enabling the
user to quickly evaluate design concepts and verify simulations. This EVM is available in three industry-standard
packages (SC70, SOT23, and SOIC) and 12 popular amplifier configurations, including amplifiers, filters, stability
compensation, and comparator configurations for both single and dual supplies.
9.1.1.5 TI Reference Designs
TI reference designs are analog solutions created by TI’s precision analog applications experts. TI reference
designs offer the theory of operation, component selection, simulation, complete PCB schematic and layout, bill
of materials, and measured performance of many useful circuits. TI reference designs are available online at
https://www.ti.com/reference-designs.
9.1.1.6 Filter Design Tool
The filter design tool is a simple, powerful, and easy-to-use active filter design program. The filter design tool
allows the user to create optimized filter designs using a selection of TI operational amplifiers and passive
components from TI's vendor partners.
Available as a web-based tool from the Design tools and simulation web page, the filter design tool allows the
user to design, optimize, and simulate complete multistage active filter solutions within minutes.
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9.2 Documentation Support
9.2.1 Related Documentation
The following documents are recommended for reference when using the OPA165x, and are available for
download at www.ti.com.
•
•
•
•
•
•
•
Texas Instruments, Source Resistance and Noise Considerations in Amplifiers technical brief
Texas Instruments, Single-Supply Operation of Operational Amplifiers application bulletin
Texas Instruments, Op Amp Performance Analysis application bulletin
Texas Instruments, Compensate Transimpedance Amplifiers Intuitively application report
Texas Instruments, Tuning in Amplifiers application bulletin
Texas Instruments, Feedback Plots Define Op Amp AC Performance application bulletin
Texas Instruments, Active Volume Control for Professional Audio design guide
9.3 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on
Subscribe to updates to register and receive a weekly digest of any product information that has changed. For
change details, review the revision history included in any revised document.
9.4 Support Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
9.5 Trademarks
Burr-Brown™, TINA-TI™, and TI E2E™ are trademarks of Texas Instruments.
TINA™ is a trademark of DesignSoft, Inc.
Bluetooth® is a registered trademark of Bluetooth SIG, Inc.
PSpice® is a registered trademark of Cadence Design Systems, Inc.
All trademarks are the property of their respective owners.
9.6 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
9.7 Glossary
TI Glossary
This glossary lists and explains terms, acronyms, and definitions.
10 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
30
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PACKAGE OPTION ADDENDUM
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30-Sep-2022
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
Samples
(4/5)
(6)
OPA1655DBVR
ACTIVE
SOT-23
DBV
5
3000
RoHS & Green
SN
Level-2-260C-1 YEAR
-40 to 125
2R8Q
Samples
OPA1655DBVT
ACTIVE
SOT-23
DBV
5
250
RoHS & Green
SN
Level-2-260C-1 YEAR
-40 to 125
2R8Q
Samples
OPA1655DR
ACTIVE
SOIC
D
8
3000
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-40 to 125
OP1655
Samples
OPA1656ID
ACTIVE
SOIC
D
8
75
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-40 to 125
OP1656
Samples
OPA1656IDR
ACTIVE
SOIC
D
8
2500
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-40 to 125
OP1656
Samples
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of