SCANSTA101
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SNLS057J – MAY 2002 – REVISED APRIL 2013
SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master
Check for Samples: SCANSTA101
FEATURES
DESCRIPTION
•
The SCANSTA101 is designed to function as a test
master for an IEEE 1149.1 boundary scan test
system. It is suitable for use in embedded IEEE
1149.1 applications and as a component in a standalone boundary scan tester.
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Compatible with IEEE Std. 1149.1 (JTAG) Test
Access Port and Boundary Scan Architecture
Supported by Texas Instruments' SCAN Ease
(SCAN Embedded Application Software
Enabler) Software Rev 2.0
Uses Generic, Asynchronous Processor
Interface; Compatible with a Wide Range of
Processors and Processor Clock (PCLK)
Frequencies
16-Bit Data Interface (IP Scalable to 32-bit)
2k x 32 Bit Dual-Port Memory
Load-on-the-Fly (LotF) and Preloaded Vector
Operating Modes Supported
On-Board Sequencer Allows Multi-Vector
Operations such as those Required to Load
Data Into an FPGA
On-Board Compares Support Test Data In
(TDI) Validation Against Preloaded Expected
Data
32-Bit Linear Feedback Shift Register (LFSR)
at the Test Data In (TDI) Port for Signature
Compression
State, Shift, and BIST Macros Allow
Predetermined Test Mode Select (TMS)
Sequences to be Utilized
Operates at 3.3 V Supply Voltages with 5 V
Tolerant I/O
Outputs Support Power-Down TRI-STATE
Mode.
The SCANSTA101 is an enhanced version of, and a
replacement
for,
the
SCANPSC100.
The
SCANSTA101 supports the IEEE 1149.1 Test Access
Port (TAP) standard and the IEEE 1532 standard for
in-system configuration of programmable devices.
The SCANSTA101 improves test vector throughput
and reduces software overhead in the system
processor. The SCANSTA101 presents a simple,
register-based interface to the system processor.
Texas Instruments provides C-language source code
which can be included in the embedded system
software. The combination of the SCANSTA101 and
its support software comprises a simple API for
boundary scan operations.
The interface from the SCANSTA101 to the system
processor is implemented by reading and writing
registers, some of which map to locations in the
SCANSTA101 memory. Hardware handshaking and
interrupt lines are provided as part of the processor
interface.
The SCANSTA101 is available as a stand-alone
device packaged in a 49-pin NFBGA package. It is
also available as an IP macro for synthesis in
programmable logic devices.
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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2002–2013, Texas Instruments Incorporated
SCANSTA101
SNLS057J – MAY 2002 – REVISED APRIL 2013
www.ti.com
SCANSTA101 ARCHITECTURE
Figure 1. SCANSTA101 STA Master and Interfaces
Figure 1 shows a high level view of the SCANSTA101 STA Master and its interfaces. Table 1 provides a brief
description of each of these interfaces. provides a brief description of the device pins and their functions. The
device is composed of three interfaces around a dual-port memory. These interfaces are the Parallel Processor
Interface (PPI), Serial Scan Interface (SSI), and Test and Debug Interface. The System Input block designates
inputs that have global use across the device.
The Test and Debug Interface supports BIST, boundary scan, and internal scan for the SCANSTA101.
Table 1. INTERFACE DESCRIPTIONS
Interface
Description
Parallel Processor Interface
Used for configuration, ScanMaster scan chain loads and reads, programmable device file loads
and reads, and status monitoring.
Serial Scan Interface
Performs parallel to serial conversion, sequences and formats the outgoing serial stream to
conform to 1149.1 protocol.
Test and Debug Interface
IEEE 1149.1 TAP
System Inputs
Interface inputs for system control, i.e. clock, reset and output tristate control.
2
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CONNECTION DIAGRAM
Figure 2. NFBGA Package Pinout
(Top View)
PIN DESCRIPTIONS
Pin
Name
No. Pins
I/O
VCC
4
N/A
Power
GND
4
N/A
Ground
D(15:0)
16
I/O
Bidirectional Data Bus. Signals are bonded out for the packaged
device.
16
I/O
Bidirectional Data Bus. These signals are not available in the packaged
device.
A(4:0)
5
I
Address Bus
SCK
1
I
The system clock that drives all internal timing. TCK_SM is a gated,
divided and buffered version of SCK.
INT
1
O
Interrupt Output
OE
1
I
Output enable that will TRI-STATE all 1149.1 "_SM" outputs when high.
DTACK
1
O
DTACK is used to synchronize asynchronous transfers between the
host and the SCANSTA101. When CE is high, DTACK is tristated.
When CE is low, DTACK is enabled. DTACK goes low when data has
been registered and then goes tri-state when the cycle has completed.
R/W
1
I
R/W defines a PPI cycle. Read when high, write when low.
STB
1
I
Strobe is used for timing all PPI transfers. D(15:0), or D(31:0) in 32-bit
mode (1), are at TRI-STATE when STB is high. Data valid setup is with
respect to the falling edge of STB and data valid hold is with respect to
rising edge of STB.
CE
1
I
Chip Enable, when low, enables the PPI for data transfers. CE can
remain low during back-to-back accesses. D(15:0), or D(31:0) in 32-bit
mode (1), and DTACK are tristated when CE is high.
RST
1
I
Asynchronous reset, when low, initializes the SCANSTA101.
TDO
1
O
Test Data Out is the serial scan output from the SCANSTA101. TDO is
enabled when OE is low.
D(31:16)
(1)
(1)
Description
D(31:16) in the Parallel Processor Interface and TRST1_SM in the Serial Scan Interface are not bonded out for the packaged device.
These are used in the 32-bit IP Macro Mode only.
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PIN DESCRIPTIONS (continued)
Pin
Name
No. Pins
I/O
TDI
1
I
Test Data In is the serial scan input to the SCANSTA101.
TMS
1
I
Test Mode Select. The Test Mode Select pin is a serial input used to
accept control logic to the test & debug interface.
TCK
1
I
Test Clock Input for 1149.1
TRST
1
I
Test Reset. This pin should be tied to ground by a 1K resistor to hold
the Test and Debug Interface in the Test-Logic-Reset state during
device power-up. This avoids invalid states when ramping supply
voltages.
TDI_SM
1
I
STA Master Test Data Input in the Serial Scan Interface
TDO_SM
1
O
STA Master Test Data Output in the Serial Scan Interface
TMS_SM
1
O
STA Master Test Mode Select in the Serial Scan Interface
TCK_SM
1
O
STA Master Test Clock in the Serial Scan Interface
TRST0_SM
1
O
STA Master Test Reset output in the Serial Scan Interface
1
O
Redundant ScanMaster TRST. This signal is not available for the
packaged device.
1
O
The TRI-STATE notification pin exerts a high signal when TDO_SM is
at TRI-STATE
TRST1_SM
(1)
TRIST_SM
Description
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
4
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ABSOLUTE MAXIMUM RATINGS
(1) (2)
−0.5V to +4.0V
Supply Voltage (VCC)
DC Input Diode Current (IIK)
VI = −0.5V
−20 mA
VO = −0.5V
−20 mA
DC Input Voltage (VI) −0.5V to +4.0V
DC Output Diode Current (IOK)
DC Output Voltage (VO) −0.5V to +4.0V
DC Output Source/Sink Current (IO)
±50 mA
DC VCC or Ground Current per Output Pin
±50 mA
DC Latchup Source or Sink Current
±300 mA
Junction Temperature
Plastic
+150°C
Storage Temperature −65°C to +150°C
Lead Temperature (Solder, 4sec)
49L NFBGA
220°C
Max Pkg Power Capacity @ 25°C
49L NFBGA
1.47W
Thermal Resistance (θJA)
49L NFBGA
85°C/W
Package Derating 11.8mW/°C above +25°C
ESD Last Passing Voltage (Min)
(1)
(2)
2000V
Absolute maximum ratings are those values beyond which damage to the device may occur. The datasheet specifications should be
met, without exception, to ensure that the system design is reliable over its power supply, temperature, and output/input loading
variables. Texas Instruments does not recommend operation of SCAN STA products outside of recommended operation conditions.
If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and
specifications.
RECOMMENDED OPERATING CONDITIONS
Supply Voltage (VCC)
3.0V to 3.6V
Input Voltage (VI)
0V to VCC
Output Voltage (VO)
0V to VCC
−40°C to +85°C
Operating Temperature (TA)
DC ELECTRICAL CHARACTERISTICS
Over recommended operating supply voltage and temperature ranges unless otherwise specified.
Symbol
Parameter
Conditions
Min
Max
Units
VIH
Minimum High Input Voltage
VOUT = 0.1V or VCC − 0.1V
VIL
Maximum Low Input Voltage
VOUT = 0.1V or VCC − 0.1V
VOH
Minimum High Output Voltage
IOUT = −100 μA, VIN = VIL or VIH
Minimum High Output Voltage,
TDO_SM, TMS_SM, TCK_SM, TRST0_SM
outputs only
IOH = −24 mA, VIN = VIL or VIH
Minimum High Output Voltage,
All other outputs including 1149.1
IOH = −12 mA, VIN = VIL or VIH
Maximum Low Output Voltage
IOUT = +100 μA, VIN = VIL or VIH
0.2
V
Maximum Low Output Voltage,
TDO_SM, TMS_SM, TCK_SM, TRST0_SM
outputs only
IOL = 24 mA, VIN = VIL or VIH
0.5
V
Maximum Low Output Voltage,
all other outputs including 1149.1
IOL = 12mA, VIN = VIL or VIH
0.4
V
IIN
Maximum Input Leakage Current, All pins
except TDI, TMS, TRST, TDI_SM
VIN = VCC for TDI, OE, VIN = VCC,
GND for All Others
±5.0
μA
IILR
Maximum Input Leakage Current, TDI, TMS,
TRST, TDI_SM
VIN = GND
-200
μA
IIH
Maximum Input Leakage Current, TDI, TMS,
TRST, TDI_SM
VIN = VCC
5.0
μA
IOZ
Maximum TRI-STATE Leakage Current
VIN = VCC, GND, VIN (OE, R/W, CE,
STB) = VIL, VIH
±5.0
μA
VOL
2.1
V
0.8
VCC-0.2V
V
V
V
2.2
2.4
-45
V
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DC ELECTRICAL CHARACTERISTICS (continued)
Over recommended operating supply voltage and temperature ranges unless otherwise specified.
Symbol
Parameter
Conditions
Min
VCC = 0.0V
Max
Units
5.0
μA
IOFF
Power Off Leakage Current
All pins except TDI, TMS, TRST, and TDI_SM
ICC
Maximum Quiescent Supply Current
250
μA
ICCmax
Maximum Supply Current
All inputs low
1.2
mA
ICCT
Maximum ICC/Input
VIN = VCC − 0.6V
250
μA
AC ELECTRICAL CHARACTERISTICS/OPERATING REQUIREMENTS
Over recommended operating supply voltage and temperature ranges unless otherwise specified. CL = 50 pF, RL = 500Ω
unless otherwise specified.
Symbol
Parameter
Conditions
# of SCK
(1) (2)
Min
Max
Units
PARALLEL PROCESSOR INTERFACE (PPI)
tS1
Set Up Time
CE, R/W, Addr, Data to STB
tH1
Hold Time
CE, R/W, Addr, Data to DTACK
See Figure 12 and Figure 13
tD1
Propagation Delay
STB low to DTACK low, Register Write
See Figure 12
2 or 3
11.5
ns
tD1
Propagation Delay
STB low to DTACK low, Register Read
See Figure 13
4 or 5
11.5
ns
tD1
Propagation Delay
STB low to DTACK low, Memory Write:
16-bit first access
See Figure 12
3 or 4
11.5
ns
Propagation Delay
STB low to DTACK low, Memory Write:
16-bit second access
See Figure 12
7 or 8
11.5
ns
Propagation Delay
STB low to DTACK low, Memory Read:
16-bit first access
See Figure 13
9 or 10
11.5
ns
Propagation Delay
STB low to DTACK low, Memory Read:
16-bit second access
See Figure 13
3 or 4
11.5
ns
Propagation Delay
STB high to DTACK TRISTATE, Register
Write
See Figure 12
1 or 2
10.0
ns
Propagation Delay
STB high to DTACK TRISTATE, Register
Read
See Figure 13
1 or 2
10.0
ns
Propagation Delay
STB high to DTACK TRISTATE, Memory
Write: 16-bit first access
See Figure 12
1 or 2
10.0
ns
Propagation Delay
STB high to DTACK TRISTATE, Memory
Write: 16-bit second access
See Figure 12
1 or 2
10.0
ns
Propagation Delay
STB high to DTACK TRISTATE, Memory
Read: 16-bit first access
See Figure 13
1 or 2
10.0
ns
Propagation Delay
STB high to DTACK TRISTATE, Memory
Read: 16-bit second access
See Figure 13
1 or 2
10.0
ns
tD1
tD1
tD1
tD2
tD2
tD2
tD2
tD2
tD2
(1)
(2)
6
See Figure 12 and Figure 13
0
ns
0
ns
Due to uncertainty in the relationship of the STB placement to the system clock, SCK, the STB may be detected during the current or
the next SCK cycle.
An absolute maximum delay can be calculated as: (Max # SCK) x (SCK Period) + tD.For example, for tD1 (STB low to DTACK low,
register write), the # SCK cycles is 2 or 3 and the delay, tD, is 11.5ns. For a SCK with a 100ns period, the absolute maximum delay is (3
x 100ns) + 11.5, or 311.5ns.
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AC ELECTRICAL CHARACTERISTICS/OPERATING REQUIREMENTS (continued)
Over recommended operating supply voltage and temperature ranges unless otherwise specified. CL = 50 pF, RL = 500Ω
unless otherwise specified.
Symbol
tD3
tpHL1
Parameter
Conditions
# of SCK
Propagation Delay
Output data valid to DTACK low, all read
cycles
See Figure 13
1
Propagation Delay
STB low to INT low, register write (clears
Interrupt)
See Figure 12
5 or 6
tW
Clock Pulse Width, SCK, H or L
fMAX
Clock Frequency, SCK
tRELEASE
Release Time, RST to STB
Symbol
Min
(1) (2)
Max
Units
ns
10.5
ns
3.0
ns
66
2
Parameter
Conditions
MHz
ns
Min
Max
Units
SERIAL SCAN INTERFACE (SSI)
tD5
Propagation Delay
SCK to TCK_SM
See Figure 14
11.5
ns
tD6
Propagation Delay
SCK to TDO_SM
See Figure 14
12.0
ns
tD7
Propagation Delay
SCK to TMS_SM
See Figure 14
12.5
ns
tD8
Propagation Delay - tpLH
SCK to TRIST_SM
See Figure 14
15.0
ns
tD9
Propagation Delay - tpHL
SCK to TRIST_SM
See Figure 14
12.5
ns
tD10
Propagation Delay
SCK to TDO_SM disable
See Figure 14
12.5
ns
tD11
Propagation Delay
SCK to TDO_SM enable
See Figure 14
14.0
ns
tEN1
Enable Delay
OE low to TCK_SM, TDO_SM, TMS_SM, or
TRST0_SM
See Figure 14
12.0
ns
tDIS1
Disable Delay
OE high to TCK_SM, TDO_SM, TMS_SM, or
TRST0_SM
See Figure 14
11.0
ns
tEN2
Enable Delay
OE low to TRIST_SM
10.0
ns
tDIS2
Disable Delay
OE high to TRIST_SM
11.5
ns
tDIS3
Disable Delay
RST low to TRST0_SM
12.5
ns
tS2
Setup Time
SCK to TDI_SM
See Figure 14
3.5
ns
tH2
Hold Time
SCK to TDI_SM
See Figure 14
2.0
ns
TEST & DEBUG INTERFACE TIMING REQUIREMENTS (SCAN)
tS
Setup Time
TMS to TCK
2.0
ns
tH
Hold Time
TMS to TCK
1.0
ns
tS
Setup Time
TDI to TCK
1.0
ns
tH
Hold Time
TDI to TCK
2.0
ns
tW
Pulse Width
TCK (H or L)
10.0
ns
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Symbol
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Parameter
Conditions
Min
Max
Units
tWL
Reset Pulse Width
TRST (L)
2.5
ns
tREC
Recovery Time
TCK from TRST
2.0
ns
fMAX
Maximum Clock Frequency, TCK
25
MHz
APPLICATIONS/PROGRAMMERS REFERENCE
Table 2. REGISTER SUMMARY
Address
Type
Mnemonic
Register
Active Register Bits
00h
RW
START
Start Register
5
0000h
Reset Value
01h
RW
STATUS
Status Register
10
0000h
02h
RW
INTCTRL
Interrupt Control Register
8
0000h
03h
RW
INTSTAT
Interrupt Status Register
8
0000h
04h
RW
SETUPR
Setup Register
8
0043h
05h
RW
CLKDIV
Clock Divider Register
6
0000h
07h
RW
EXPR
TDI_SM LFSR Exponent Register
3
0000h
08h
RW
LSSEDR
TDI_SM LSB Seed Register
16
0000h
09h
RW
MSSEDR
TDI_SM MSB Seed Register
16
0000h
0Ah
RW
LSRESR
TDI_SM LSB Result Register
16
0000h
0Bh
RW
MSRESR
TDI_SM MSB Result Register
16
0000h
0Ch
RW
INDEXR
Index Register
16
0000h
11h
RW
VINDEXR
Vector Index Register
16
0000h
13h
RW
HTINDEXR
Header/Trailer Index Register
16
0000h
15h
RW
MINDEXR
Macro Index Register
16
0000h
17h
RW
SINDEXR
Sequencer Index Register
16
0000h
19h
RW
BSINDEXR
Bridge Support Register
16
0000h
Table 3. MEMORY/REGISTER ADDRESS MAP
A4
A3
A2
A1
A0
Function
Base Address
Long Word
Index
Structure/Size
0
0
0
0
0
0
0
0
0
Start
N/A
N/A
16-bit Register
1
Status
N/A
N/A
0
0
0
16-bit Register
1
0
Interrupt Control
N/A
N/A
16-bit Register
0
0
0
0
0
1
1
Interrupt Status
N/A
N/A
16-bit Register
1
0
0
Setup
N/A
N/A
0
16-bit Register
0
1
0
1
Clock Divider
N/A
N/A
16-bit Register
0
0
1
1
1
TDI_SM LFSR Exponent
N/A
N/A
16-bit Register
0
1
0
0
0
TDI_SM LFSR LSB Seed
N/A
N/A
16-bit Register
(1)
0
1
0
0
1
TDI_SM LFSR MSB Seed
N/A
N/A
16-bit Register
(1)
0
1
0
1
0
TDI_SM LFSR LSB Result
N/A
N/A
16-bit Register
(1)
0
1
0
1
1
TDI_SM LFSR MSB Result
N/A
N/A
16-bit Register
(1)
0
1
1
0
0
Index Register
N/A
N/A
16-bit Register
(2)
0
1
1
0
1
TDO_SM
0
0 - 0x1BF
See
(3)
See
(3)
0
(1)
(2)
(3)
8
1
1
1
0
TDI_SM
0 x 1C0
0 - 0x1BF
The TDI_SM LFSR result and seed registers require two sequential reads/writes for each register pair.
The Index register is used to set the individual address pointers. Writing to the Index register will set each of the individual address
pointers (TDO_SM, TDI_SM, Expected, and Mask). The individual address pointers will automatically increment with each long word
read from TDI_SM or each long word written to the TDO_SM, Expected, or Mask memory spaces.
The actual address is calculated from the base address of the memory area plus the content of its address pointer.
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Table 3. MEMORY/REGISTER ADDRESS MAP (continued)
(4)
A4
A3
A2
A1
A0
Function
Base Address
Long Word
Index
Structure/Size
0
1
1
1
1
Expected
0 x 380
0 - 0x1BF
See
(3)
1
0
0
0
0
Mask
0 x 540
0 - 0x1BF
See
(3)
1
0
0
0
1
Vector Index
N/A
N/A
16-bit Register
1
0
0
1
0
Vector 1
0 x 700
0x0 - 0x1
See
Vector 2
0 x 700
0x2 - 0x3
Vector 3
0 x 700
0x4 - 0x5
(4)
, Table 4
Vector 4
0 x 700
0x6 - 0x7
1
0
0
1
1
Header/Trailer Index
N/A
N/A
16-bit Register
1
0
1
0
0
Data Header
0 x 708
0x0 - 0x1F
See Table 5
Data Trailer
0 x 728
0x20 - 0x3F
Instruction Header
0 x 748
0x40 - 0x5F
Instruction Trailer
0 x 768
0x60 - 0x7F
1
0
1
0
1
Macro Index
N/A
N/A
16-bit Register
1
0
1
1
0
Macro 1
0 x 788
0x0
Macro 2
0 x 789
0x1
See Table 6,
Table 7 and
Table 8
Macro 3 . . .
0 x 78A . . .
0x2 . . .
Macro 16
0 x 797
0xF
1
0
1
1
1
Sequencer Index
N/A
N/A
16-bit Register
1
1
0
0
0
Sequencer
0 x 798
0x0 - 0x1F
See Table 9
1
1
0
0
1
Scan Bridge Support Index
N/A
N/A
16-bit Register
1
1
0
1
0
Scan Bridge Support
0 x 7B8
0x0 - 0x3F
See Table 10
The upper two bytes of each vector are ignored. These have been inserted to make the space align on long word boundaries.
Table 4. VECTOR STRUCTURE
Bit(s)
Function
0x00 - 0x1F
Length (maximum of 4G)
0x20 - 0x27
Macro Number (1 of 256) Room for scaleability
0x28 - 0x2E
Reserved
0x2F
Preloaded data / Load-on-the-fly (LotF)
0x30 - 0x3F
Reserved
Table 5. HEADER/TRAILER STRUCTURE
Bit(s)
Function
0x00 - 0x1F
32-bit count
0x20 - 0x3FF
124 bytes (992 bits) header/trailer data
(1)
(1)
Count must be greater than zero if the Header/Trailer Usage bits are not equal to "000" or "111".
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Table 6. MACRO STRUCTURE
Bit(s)
Function
0x1F
Compare
0x1E
Use Mask / Compare full length of vector (not including header/trailer)
0x1D - 0x1B
Post-shift TCK_SM Count
0x1A - 0x18
Pre-shift TCK_SM Count
0x17
Sync Bit Support Enable
0x16
Macro Structure Bit 8 Enable (Ignored for the shift macros with or without capture)
0x15
Macro Structure bit 7 Enable (Ignored for the shift macros with or without capture)
0x14 - 0x12
Header/Trailer Usage
0x11
Macro Type bit 1
0x10
Macro Type bit 0
0xF - 0x9
Last 7 TMS_SM bits
0x8
Presented during the falling edge of TCK_SM at terminal count during a Shift macro. Use in the same
manner as other TMS bits for State and BIST Macros.
0x7
Loop Bit if Macro type is Shift (for 1149.1 it would be a 0) or BIST
0x6 - 0x0
First 7 TMS_SM Bits (LSB is first bit to be shifted out of TMS_SM)
Table 7. HEADER/TRAILER USAGE
Bit 2
Bit 1
Bit 0
0
0
0
Function
Ignore Headers and Trailers
0
0
1
Use Instruction Header
0
1
0
Use Instruction Trailer
0
1
1
Use both Instruction Header and Trailer
1
0
0
Use Data Header
1
0
1
Use Data Trailer
1
1
0
Use both Data Header and Trailer
1
1
1
Reserved
Table 8. Macro Type bits 10 and 11
Bit 1
Bit 0
Function
Function
0
0
BIST Macro
Loop on loop bit for Vector count. No Data
0
1
Shift Macro
Loop on loop bit for vector count. Read data from TDO_SM memory
1
0
Shift Macro with Capture
Loop on loop bit for vector count. Read data from TDO_SM memory
1
1
State Macro
Do not loop on loop bit of macro. No data to be shifted
Table 9. SEQUENCER STRUCTURE
Bit(s)
Sequence repeat count (up to 255)
0x20 - 0x2F
Vector repeat count
0x30 - 0x3F
Vector number
..x.. - ..x..
10
Function
0x00 - 0x1F
Repeat vector repeat count and vector number
0x3E0 - 0x3EF
Vector repeat count (up to 255)
0x3F0 - 0x3FF
Vector number (up to 63)
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Table 10. SCAN BRIDGE SUPPORT STRUCTURE
Bit(s)
Function
0x00 - 0x0F
Levels of Scan Bridge support to be inserted in the scan chain
0x10 - 0x17
Hierarchical Level 0 Scan Bridge Address
0x18 - 0x1F
Hierarchical Level 0 Scan Bridge LSP
0x20 - 0x27
Hierarchical Level 1 Scan Bridge Address
0x28 - 0x2F
Hierarchical Level 1 Scan Bridge LSP
..x.. - ..x..
Hierarchical Level Scan Bridge Address and LSP
0x7F0 - 0x7F7
Hierarchical Level 125 Scan Bridge Address
0x7F8 - 0x7FF
Hierarchical Level 125 Scan Bridge LSP
MODULE DESCRIPTIONS
Figure 1 shows a high level view of the SCANSTA101. The Parallel Processor Interface (PPI) and the Serial
Scan Interface (SSI) connect to each other through a dual-port memory. The PPI provides a parallel interface for
transferring data into and out of the dual-port memory, and for configuring, controlling and obtaining the status of
the device. The SSI, which resides on the other side of the dual-port memory, provides the parallel-to-serial and
serial-to-parallel conversion paths for providing test data and test control to support the STA Master and IEEE
1532 functions.
DUAL PORT MEMORY
The Dual Port Memory module is a 2048 x 32 bit dual-port memory which acts as the buffer between the PPI and
the SSI. There are seven regions of memory as viewed from the processor side. These regions, shown in
Table 3, are TDO_SM, TDI_SM, Expected, Mask, Vector, Header/Trailer, Macro. Sequencer, and ScanBridge
Support. Each has a pointer which resides in the PPI.
The memory is big endian oriented and is viewed as a single entity from the SSI side, and the SSI maintains a
pointer. The dual port memory module does not include any logic outside of its own macro function, so all the
timing and support logic is included in the PPI and SSI sections. There is no logic included in the SCANSTA101
design to utilize the "busy" indicators to keep the user from overwriting memory locations. The only area where
this could occur in memory would be the TDI_SM memory space since both the SSI and PPI can write to this
space, but the drivers should not allow PPI writes to this area during normal operations. The Texas Instruments
SCAN Ease software does not allow PPI writes to the TDI_SM memory.
PARALLEL PROCESSOR INTERFACE
The overall function of the PPI is to receive the parallel data from the processor; store the data in the appropriate
register or memory location; act on the data if the data are PPI control data; provide status data back to the
processor; and provide a read path for result data to the processor. The PPI consists of seven main blocks of
logic. These blocks are the Edge Detector (ED), Processor Interface Controller (PIC), the Memory/Register
Decoder (MRD), the Word/Long Word Converter (WLWC), the Control Generator (CG), the Status/Interrupt
Generator (SIG) and the Flag Generator (FG).
WORD/LONG WORD CONVERTER
The Word/Long Word Converter (WLWC) has four 16-bit capture registers: a least significant/most significant
(LS/MS) word read capture register pair; and a LS/MS word write capture register pair.
Each register within the write register pair has a separate enable to allow for the necessary control to accomplish
word to long word conversions when in the 16-bit mode. In 32-bit mode, these enables are driven
simultaneously. A mux is provided in front of the MS word write capture register to select between the 32-bit and
16-bit mode external bus.
Only one enable and a mux select is needed to control the read capture register pair to accomplish the long word
to word conversions when in the 16- bit mode. In the 32-bit mode, the mux selection doesn't change, so 32 bits
are always driven. A mux is on either side of the LS word read capture register. The mux at the register output
provides for selection between the 32-bit and 16-bit mode. The mux at the register input is for selection between
register space and memory space.
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All the control for this block is provided by the PIC and MRD with the 16/32-bit mode enable coming from the
Setup register.
EDGE DETECTOR
The PPI module can support either an asynchronous or synchronous processor interface. For an asynchronous
interface, the circuit initially synchronizes STB and CE to the system clock, SCK, by pipelining these two signals
through two flip-flop stages and then performing an edge detection on STB and CE. For a synchronous parallel
processor interface, this circuit just performs an edge detection. The outputs of this circuit, one clock wide pulses
indicating the detection of negative and positive edges, are used by the Processor Interface Controller (PIC)
state machine to start and to end a processor access.
PROCESSOR INTERFACE CONTROLLER
The Processor Interface Controller (PIC) monitors the incoming processor control signals and sets up the
appropriate internal control signals to move the data into memory or into an internal register on a write or to
move the data out of memory or out of an internal register on a read. The PIC edge detects the CE and the STB
to start the access. The PIC provides the control for the word to long word conversion in the WLWC by
controlling the three enables and the mux select (READ_MSW) to the capture registers. The PIC also controls
when the internal read/write enable is issued to the memory to complete the read/write operation. Timing for
register and memory read and write operations is described in Figure 12 and Figure 13.
MEMORY/REGISTER DECODER
The Memory/Register Decoder (MRD) contains all six index registers (Index, Vector Index, Header/Trailer Index,
Macro Index, Sequencer Index and ScanBridge Support Index) and four address registers (TDI_SM Address,
TDO_SM Address, Expected Address and Mask Address). On the PPI side, both index and address registers are
used to maintain pointers to their respective memory spaces. The Index register sets values in all four address
registers; i.e., writing to the Index register sets all of the address registers. The value written to each address
register is the sum of its base address and the value written to the Index register (the offset). All index and
address registers except the Index register auto-increment with each access to the corresponding memory
space.
The MRD provides the address decode to generate all the control and status register enables for the CG and the
SIG. The MRD also provides the mux selects for the register or memory selection for the read capture operation
in the WLWC.
CONTROL GENERATOR
The Control Generator includes the seven control registers: the Start, Interrupt Control, Setup, Clock Divider,
TDI_SM LFSR Exponent, TDI_SM LFSR LSB Seed, and TDI_SM LFSR MSB Seed registers are included in this
block. The CG issues a strobe to the SSI when a write has been issued to the Start or Setup registers so the SSI
can react to the new control data. The strobe is derived from edge detecting the enables to the Start or Setup
registers. The "new" data to the SSI are the Use Sequencer bit and three Use Vector bits from the Start register,
and the TDO Default Value, TRST, ScanBridge Support Initiate/Release, three-bit Sync Bit Length, and two Test
Loop-back bits from the Setup register.
STATUS/INTERRUPT GENERATOR
The Status/Interrupt Generator comprises the four status registers plus the logic to generate the interrupts and to
clear the interrupts on a read. The registers are the Status, Interrupt Status, TDI_SM LFSR LSB Result and
TDI_SM LFSR MSB Result registers. The SIG receives the LFSR result and strobe signal SSI_LFSR_EN from
the SSI and captures the data in the LSB and MSB registers. The SIG receives the compare result bit value from
the SSI along with the compare result bit clear and the compare result bit load.
The SIG receives the 4 memory space flags from the FG along with their associated load and clear signals so
these bits may be constantly updated. The half-full, half-empty, full and empty flags are generated and updated
regardless of the states of their respective interrupt enables. The SIG also receives the four interrupt enables for
the flags. The SIG also receives the sequencer active and the three vector active signals from the SSI. These
are also updated regardless of the enable state.
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If an interrupt enable is set then an interrupt will be generated. If an interrupt occurs at the same time as the
interrupt status is being read, then the interrupt will be set after the read is complete. All bits in the Interrupt
Status register are cleared when the register is read.
FLAG GENERATOR
The FG takes in the TDI_SM or TDO_SM pointer values from the PPI address pointers, compares them and
generates the appropriate flags. If a flag condition has occurred, it is passed, along with the corresponding load
enable, to the SIG to set the bit in the status register. If the flag condition changes, then the clear for the
corresponding bit is passed to the SIG to clear the flag. The TDO_SM empty and the TDI_SM full flags are
passed to the SSI also. A counter enable is passed from the SSI to indicate to the FG when the SSI's pointer
value has changed. If a decrement and an increment occur at the same time to either of the counters, the
counter value will not change.
PPI INTERFACE TIMING
The processor accesses to SCANSTA101 can be classified into six categories:
• register read
• register write
• 16-bit memory read
• 16-bit memory write
• 32-bit memory read
• 32-bit memory write
Register reads and register writes are performed the same whether the device is in 16-bit mode or 32-bit mode.
In 32-bit mode, only the LS word is used. The MS word is ignored. The timing for the 16-bit and 32-bit modes is
exactly the same.
The 16-bit mode memory write is accomplished by performing two consecutive register writes with the only
difference being that the actual write occurs on the second access. The 16-bit mode register read consists of two
accesses, with the first access performed similar to the 16-bit register read but requiring one more clock to
complete the memory access. Since all 32-bits of the memory data are captured on the first access, the second
memory read access is 2 clocks shorter than the first.
The processor initiates a write cycle by asserting CE followed by STB. A set time prior to asserting STB, the R/W
is driven low and the address and data buses are driven by valid address and data, respectively. After edge
detecting the STB and registering all the inputs, the address is decoded to determine which internal address
within the SCANSTA101 will be written by the processor. The DTACK will be asserted on the same rising edge
of SCK on which the negative edge of the STB signal is detected, indicating to the processor that it can deassert
the STB. When the SCANSTA101 detects the positive edge of the STB, it will deassert the DTACK indicating to
the processor that it can start a new cycle. The processor can start a new cycle by asserting the STB and by
driving the address and data buses with new address and data.
A read cycle is similar to the write cycle except that the DTACK will not be asserted until the selected address
location's contents are loaded. So, for a 16-bit register read it takes one more clock than it does for a write cycle.
Reads and writes to the SCANSTA101 memory require two consecutive accesses in the 16-bit external bus
mode. The memory writes are similar to register writes; the processor performs two consecutive 16-bit writes to
write to the selected memory location.
During a memory read, the DTACK line is not asserted until the contents of the memory is loaded into the
capture registers. For this reason the first read from the memory requires five clocks which includes the memory
access time, while the second read is done in three clock cycles.
SERIAL SCAN INTERFACE
The Serial Scan Interface consists of the following units:
• Clock Divider and TCK_SM Control
• TAP Tracker
• Pointer Generator
• Structure (Sequencer/Vector/Macro/ScanBridge) Decoder
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•
•
•
•
•
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Structure (Sequencer/Vector/Macro/ScanBridge) Control Registers
Count Generator
Shifter (TDO_SM/TDI_SM/TMS_SM)
Comparator
Expected and Mask Registers
Serial Scan Interface Controller (SSIC) and ScanBridge Controller
The clock divider unit divides the system clock SCK based on the programmable divisor set in the clock divider to
generate TCK_SM. The TCK_SM control unit gates TCK_SM if the TDO_SM buffer is empty.
The TAP Tracker unit tracks the target's TAP controller state. The TAP Tracker determines whether the target's
TAP controller is in SIR or SDR state, so that the necessary pad bits are inserted.
The shifter block contains two 32-bit shift registers for TDO_SM and TDI_SM respectively, and a 16-bit shift
register for TMS_SM.
The comparator unit compares the serial input on the TDI_SM pin with the expected data, bit by bit, if the
compare bit of the Macro Structure is set. If the compare/mask bit is set, then the comparator unit compares only
those bits that are unmasked.
Expected and Mask Registers contain the data fetched from the memory. This data is used by the comparator to
compare the TDI_SM input with the expected data.
The SSIC provides the timing and control signals to synchronize the operation of the various blocks in the SSI.
The ScanBridge Controller consists of the control logic to set up the ScanBridge hierarchy, if the ScanBridge
Support Initiate/Release bit is enabled, prior to scanning test vectors out of TDO_SM.
CLOCK DIVIDER AND TCK_SM CONTROL
The clock divider is a binary divider with only one bit of the clock divider register set to one at any given time.
The SCANSTA101 SSI ignores bits 0, and 8-15 of the clock divider register, so the supported divisors are 2, 4, 8,
16, 32, 64 and 128.
To generate a TCK_SM of frequency SCK/4, the clock divider register should be set to 4 (00000100). This will
enable the gate at the output of bit 2 of the counter to generate a clock of SCK divided by 4. If in LotF mode, the
TCK_SM enable from the SSIC will gate TCK_SM when the TDO_SM buffer is empty.
TAP TRACKER
The TAP Tracker consists of a 16-bit register to track the IEEE Standard 1149.1 TAP state machine. The register
is one-hot encoded (meaning that only one bit in the TAP tracker register, corresponding to the current TAP
state, is set at a time) and will continuously track the target's TAP Controller based on the TMS_SM sequence.
The TAP Tracker is used by the ScanBridge support controller to determine whether the target's TAP controller is
in SIR or SDR state so that it can insert an appropriate number of pre and post-shift pad bits.
The TAP Tracker will enter Test-Logic Reset state upon setting the TRST bit (bit 5) in the Setup register or by
issuing a sequence of five TMS_SM high bits.
SHIFTER
The Shifter block contains two 32-bit shift registers for TDO_SM and TDI_SM respectively, and one 16-bit shift
register for TMS_SM. The TMS_SM shifter block diagram is shown in Figure 3, the TDO_SM shifter block
diagram is shown in Figure 4, and the TDI_SM shifter block diagram is shown in Figure 5.
Before the start of a vector processing the TMS_SM shifter is loaded with the least significant 16 bits of the
macro structure. Based on the pre-shift TCK_SM count, the TMS_SM shifter will skip (7 - pre-shift count) least
significant bits. e.g., if the pre-shift count is 4, the least significant 3 bits of the TMS_SM shifter will not be used to
drive TMS_SM during pre-shift. Similarly, if the post-shift is less than 7 then, during post shift only the number of
bits equal to the post-shift count following the macro structure bit 8 will be used to drive TMS_SM.
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The SCANSTA101 memory is organized in big endian format. A memory write is accomplished by two
consecutive writes to the same location. When embedded software loads the TDO_SM memory, the least
significant 16 bits are written first and then the most significant 16 bits. Therefore, when the Sequencer or a
Vector is initialized the SSIC can directly fetch and load the long word to the TDO_SM shifter without any
modification.
Figure 3. TMS_SM Shifter
Figure 4. TDO_SM Shifter
Figure 5. TDI_SM Shifter
Reading from TDI_SM memory is accomplished by two consecutive reads. When reading from the TDI_SM
memory, the first read will contain the least significant 16 bits and the second read the most significant 16 bits.
The TDI_SM shifter unit consists of two 32-bit shift registers as shown in Figure 5. The shift register on top in the
figure is the LFSR register. Before using the TDI_SM LFSR register, the LFSR Exponent and LFSR Seed
registers must be written with valid data. The LFSR Exponent register must be written with a 3-bit binary
encoded value that selects one of the five available polynomials. The value written to the LFSR Seed registers is
used to initialize the TDI_SM LFSR register to a predetermined state. Once the test vector has completely
scanned in, the final contents of the LFSR register are transferred to the LFSR Result registers.
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The 32-bit shift register at the bottom is used to shift in TDI_SM directly in normal mode or to shift in TMS_SM or
TDO_SM in the loop-back mode. After each long word of 32 bits is shifted into this register, the contents of the
register are transferred to the corresponding TDI memory location before the next shift operation.
SHIFTER IMPLEMENTATION
Shift register implementation is illustrated in Figure 6. Shift out enable for the TMS_SM and TDO_SM shifters is
generated by comparing the clock pulse counter output to the clock divider - 1. Shift in enable for the TDI_SM
shifter is generated by comparing the clock pulse counter to the programmable divisor/2 - 1. These enables are
gated by the control signals from SSIC so that data are shifted out (TMS_SM/TDO_SM) or shifted in (TDI_SM)
only when necessary.
Figure 6. Shift Register Implementation and Timing
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COMPARATOR AND EXPECTED/MASK REGISTERS
The One-Bit Comparator, when enabled, compares the TDI_SM input with expected data. When the compare
feature is enabled (in preloaded vector mode only) the SSIC pre-fetches data into Expected and Mask registers
from the address locations for the current vector being processed. The comparator will compare each bit on the
TDI_SM input with the corresponding bit from the expected register. If the mask feature is enabled, then the
comparison is performed only on those bits that are not masked, i.e., on those bits for which the mask is set to
zero. Table 11 shows how the Compare and Use Mask/Compare bits in the Macro Structure are used.
Table 11. Compare and Use Mask/Compare Bit Descriptions
Compare
Use Mask/Compare
Description
0
0
Do Not Compare
0
1
Compare with Mask
1
0
Compare without Mask
1
1
Compare with Mask
The Results of Compare bit (bit 15 of Status register) stores the comparison results in the status register. This bit
defaults to fail (zero) and will be updated only after the current vector is processed. In the case of a single vector
the Results of Compare bit will be set to one (pass) only if all the bits in the scanned in vector match the
expected vector. However, in the case of the sequencer only the results of final vector comparison will be taken
into account.
Each vector within the sequencer is repeated until the vector repeat count is exhausted. The sequence is
repeated until the sequencer repeat count is exhausted.
Figure 7 illustrates the compare logic.
After reset and before every sequencer process, flip-flops 1 and 3 are initialized to zero while flip-flop 2 is set to
1. When the compare feature is enabled flip-flop 1 is continuously updated with the immediate comparison
results (1 for pass and 0 for fail). Flip-flop 2 is reset to zero when a mismatch occurs and remains in this state for
the remainder of the current vector processing. When the current vector is completely processed flip-flop 3
(Results of Compare register) will be updated with the current status.
Figure 7. Compare Logic
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SERIAL SCAN INTERFACE CONTROLLER AND SCANBRIDGE CONTROLLER
The Serial Scan Interface Controller (SSIC) remains in the Idle state until new data are written to the Start
register. When this event occurs the following operations are performed:
1. If the ScanBridge Support Initiate/Release bit was not set previously and is currently set in the Setup
register, the SSIC initializes the ScanBridge Controller (SBC) to perform the following steps to set up all
ScanBridges in the hierarchy.
(a) Determine the number of levels of ScanBridge support to be inserted (from the ScanBridge support
structure)
(b) Sequence TMS_SM so that all ScanBridges in the same level of hierarchy enter the SIR state, and then
shift in the address (from the ScanBridge structure) to select a ScanBridge in the current level of
hierarchy. The ScanBridge's TAP controller is then sequenced through the Update-IR state.
(c) Sequence TMS_SM so that the selected ScanBridge's TAP controller enters the SIR state, then scan in
the MODESEL instruction to put its mode register in the data path.
(d) Sequence the selected ScanBridge's TAP controller to enter the Shift-DR state and scan in the LSP
contents (from the ScanBridge structure) into its mode register. The ScanBridge's TAP controller is then
sequenced through the Update-DR state.
(e) Repeat Step 1C, but this time scan in the UNPARK instruction so that the LSP is inserted into the active
scan chain.
(f) Sequence the ScanBridge's TAP controller to enter the RTI state (the LSP will not be unparked until its
TAP controller enters RTI).
(g) Repeat Steps 1B through Step 1G to configure the ScanBridges in the remaining hierarchy levels. One
set of pre-shift pad and post-shift pad bits is added to the patterns for each hierarchy level between the
STA Master and the ScanBridge being configured. The pad bits are used to bypass the intermediate
levels of hierarchy.
(h) For the subsequent vectors, if the TAP Tracker enters the
(a) SDR state, the SCANSTA101 will add one pre-shift bit for the pad register and one post-shift bit for
the bypass register for each level of hierarchy.
(b) SIR state, the SCANSTA101 will add one pre-shift bit for the pad register and eight post-shift bits for
the ScanBridge instruction register for each level of hierarchy. The eight post-shift bits will be all
ones, forcing the ScanBridge into bypass mode.
(i) The pad bits need to be stripped when loading a vector into TDI_SM. This will be done by having a
status flag to indicate whether the vector that is being scanned out has ScanBridge support or not. If the
scanned-out vector has ScanBridge support, then the pad bits will be stripped when the TAP Tracker
enters the SDR or SIR states.
2. If the ScanBridge Support Initiate/Release bit was set previously and is currently reset in the Setup register,
the SSIC will toggle TCK_SM five times while TMS_SM is held high. This will return all selected ScanBridges
to the wait-for-address state and park the LSPs in the Test-Logic-Reset state. When the ScanBridge support
is released the user should make sure that the Use Vector and Use Sequencer bits in the Start register are
not set, so that the SSIC will not start processing a vector or the sequencer immediately after releasing the
ScanBridge support. Once the ScanBridge support is released the user may start processing a vector or the
sequencer by writing to the Start register.
3. If the sequencer is enabled (the Use Sequencer bit in the Start register is one),
(a) Clear the Results of Compare bit and set the Using Sequencer bit in the Status register.
(b) Fetch the sequence repeat count.
(c) If the sequence repeat count is zero, the sequence is complete so reset the Using Sequencer bit and
return to the Idle state, otherwise fetch the next vector number and its repeat count.
(d) If the vector number is zero, decrement the sequence repeat count and return to Step 3C. If the vector
number is illegal, i.e., other than 001, 010, 011, or 100, decrement the sequence repeat count and return
to Step 3C.
(e) If the vector repeat count is equal to zero, fetch the next vector number and its repeat count and go to
Step 3D. If the repeat count is non-zero fetch the vector structure.
(f) If the pre-load bit in the vector structure is not set, reset the Using Sequencer bit and return to the Idle
state.
4. If the sequencer is not enabled but a vector is enabled (the Use Vector bits in the Start register are nonzero), fetch the current vector structure and set the appropriate Using Vector bits in the Status register. If
neither the sequencer nor a vector is enabled, return to the Idle state.
5. Fetch the Macro Structure to be used, set the vector/macro control bits and store the TMS_SM bits in the
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Structure Control registers.
6. If the Pre-shift TCK_SM Count is not zero, then enable TCK_SM and drive TMS_SM using the first seven
bits of the macro until the Pre-shift TCK_SM Count is zero. During pre-shift, TDO_SM will be driven with its
previous value.
7. If the macro type is State then,
(a) If the Macro Structure Bit 7 is enabled, set TMS_SM to the bit 7 value of the macro structure and drive
TDO_SM with its previous value.
(b) If the Macro Structure Bit 8 is enabled, set TMS_SM to the bit 8 value of the macro structure and drive
TDO_SM with it's previous value and then go to Step 10.
(c) If the sequencer is being used, then decrement the vector repeat count and return to Step 3E. If a vector
is being used, return to the Idle state.
8. If the macro type is BIST then,
(a) If the Macro Structure Bit 7 is enabled, set the count length, set TMS_SM to the bit 7 value of the macro
structure and drive TDO_SM with the default value (Setup register bit 6) until the count length is zero.
(b) If the Macro Structure Bit 8 is enabled, set TMS_SM to the bit 8 value of the macro structure and drive
TDO_SM with the default value (Setup register bit 6) and then go to Step 10.
(c) If the sequencer is being used then, decrement the vector repeat count and return to Step 3E. If a vector
is being used, return to the Idle state.
9. If the macro type is Shift or Shift with Capture then,
(a) If the macro type is Shift with Capture, enable TDI capture.
(b) If the Sync Bit Support Enable bit is set, fetch sync bit count, set the count length, set TMS_SM to the
loop bit and drive the TDO_SM high until sync bit count is zero.
(c) If the ScanBridge Support Initiate/Release bit is set, drive the TDO_SM with pre- PAD bit (high) and
while TMS_SM remains set to the loop bit. Repeat for each level of hierarchy.
(d) If the Use Data/Instruction Header is enabled, fetch the header length and data, set the count length, and
drive the TDO_SM with header data until the header length is zero and while TMS_SM remains set to
the loop bit.
(e) If the Compare or Mask/Compare is set, enable the comparator.
(f) Set the vector count length, and drive the TDO_SM with vector data until the count length is one and
while TMS_SM remains set to the loop bit. In the LotF mode if the count length is not zero and the TDO
buffer is empty, then gate TCK_SM until more data are available in the TDO buffer. When TCK_SM is
disabled TMS_SM and TDO_SM will be driven with their previous values.
(g) If the Use Data/Instruction Trailer is enabled, fetch the trailer length and data, set the count length, and
drive TDO_SM with trailer data until the trailer length is one and while TMS_SM remains set to the loop
bit.
(h) If the ScanBridge Support Initiate/Release bit is set:
(a) If the TAP tracker is in the Shift-IR state and the number of levels of hierarchy is greater than one,
set the count length to eight, and drive TDO_SM with post-shift pad bits (all high) until the count
length is zero for each level of hierarchy and while TMS_SM remains set to the loop bit.
(b) If the TAP tracker is in the Shift-DR state and the number of levels of hierarchy is greater than one,
drive TDO_SM with a post-shift pad bit (high) for each level of hierarchy and while TMS_SM remains
set to the loop bit.
(c) For the final level of hierarchy or if there is only one level of hierarchy, and if the TAP tracker is in the
Shift-IR state, set the count length to eight, and drive TDO_SM with post-shift pad bits (all high) until
the count length is one and while TMS_SM remains set to the loop bit.
(i) If the Sync Bit Support Enable is set, fetch sync bit count, set the count length, and drive the TDO_SM
high until sync bit count is one and while TMS_SM remains set to the loop bit.
(j) Set TMS_SM to bit 8 of the TMS_SM Macro Structure sequence and drive TDO_SM with the final vector
bit or trailer bit or post-shift pad bit or sync bit. After shifting out the final vector bit, disable the
comparator and register the comparison results.
10. If the post-shift TCK_SM Count is not zero, then enable TCK_SM and drive TMS_SM using the last seven
bits of the macro until the post-shift TCK_SM Count is zero.
11. If the Sequencer is being used,
(a) Decrement the sequence repeat count and return to Step 3C if the Compare or Mask/Compare is
enabled and the results of compare is a fail.
(b) Decrement the vector repeat count and return to Step 3E if the if the Compare or Mask/Compare is
enabled and the results of compare is a pass.
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(c) Decrement the vector repeat count and return to Step 3E if the Compare or Mask/ Compare is not
enabled.
12. If the Vector is being used return to the Idle state.
MODE REGISTER WRITE TO VECTOR/SEQUENCER START
Figure 8 shows the timing from the processor write to the start of vector processing. Figure 9 shows the timing
from the processor write to the start of sequencer processing. A processor write to the Start registers is indicated
by a "new data" pulse. On the same SCK rising edge when the "new data" is detected to be high, the Start or
Setup register contents will be updated with new data. So, the decoding of the enables takes place during the
next clock cycle to determine whether to process the sequencer or a vector. Therefore, one clock after the "new
data" is detected, the SSIC starts loading the pointer register on consecutive cycles with the appropriate
addresses to fetch the Sequencer, Vector and Macro Structures. Once the headers are decoded and Structure
Control Registers are set up, the SSIC loads the pointer register so that data from the TDO_SM memory area is
fetched and loaded into the TDO_SM shifter before being shifted out. However if there are any sync bits and/or
header bits and/or ScanBridge support is enabled, then the sync bits and/or header bits and/or ScanBridge prePAD bits will be loaded into the TDO_SM shifter before processing the actual test vector. Once the actual test
vector is completely shifted out, again depending on the ScanBridge support and/or the use of trailers, post-PAD
bits and the trailer bits are loaded and shifted out through the TDO_SM shifter.
The count length will be decremented by one with each shift. After shifting out all the current shifter contents the
shifter will be loaded with new data before the falling edge of the next TCK_SM, if the count length is not
exhausted. In the case where data cannot be loaded from the memory before the next falling edge of TCK_SM,
the TCK_SM will be gated until the data is available.
Figure 8. Timing from Mode Register Write to Vector Start
Figure 9. Timing from Mode Register to Sequencer Start
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WRITING AND READING PARTIAL LONG WORDS
Care should be taken when writing a partial long word to TDO_SM memory or reading a partial long word from
TDI_SM memory. Since the TDO_SM shifter shifts out LSB first, the valid (meaningful) bits within a partial long
word (i.e., long word containing less than 32 valid bits to be shifted to the scan chain) must be stored and written
into the memory as the least significant bits. This will assure that the desired bits will be accurately loaded into
the TDO_SM shifter and shifted out to the boundary scan chain. For instance, to shift a 3-bit (110) sequence the
partial long word should be written to the TDO_SM memory as shown in Figure 10 (only the least significant 16
bits are shown). A subsequent enable and load of the vector structure with the correct length will initialize the
shift operation and only the bits that are significant will be shifted out to the scan chain.
Figure 10. Writing a Partial Long Word to the TDO_SM Memory
Data is shifted from the scan chain into the TDI_SM shifter from MSB to LSB. Consequently, the valid
(meaningful) bits in a partial long word shifted into the TDI_SM shifter will reside in the upper significant bit
locations. For example, if a scan operation involves shifting and evaluating 69 bits returning to TDI_SM, the
TDI_SM memory will be loaded with two long words (i.e., two full long words plus a partial long word containing 5
meaningful bits). If the last 5 bits shifted back to the TDI_SM shifter are 11010, then upon completion of the shift
operation, the TDI_SM shifter will contain the following partial long word as shown in Figure 11 (only the most
significant 16 bits are shown), which will subsequently be loaded into the TDI_SM memory.
Following a read of a partial long word, the embedded test software must adjust the position of the valid bits read
from the TDI_SM shifter/buffer or the position of the expected data to assure that an accurate comparison is
made (and the non-meaningful bits are masked).
Figure 11. Reading a Partial Long Word from the TDI_SM Memory
TDO_SM IMPLEMENTATION
The behavior of the TDO_SM output depends on the macro type that is being processed and the SETUP register
bits 11 and 10, as shown in Table 12, regardless of the TAP tracker state. For shift macros, the TDO_SM output
also depends on the current macro structure's TMS_SM bit number as explained below.
Table 12. TDO_SM Output Behavior
SETUP[11:10]
TDO_SM
00
Hold Previous value
01 or 10
Default TDO value (Bit 6 of the SETUP register)
11
High Impedance
(1)
(1)
Default TDO value (bit 6 of the SETUP register) may be set to a 0 when SETUP[11:10]=01 and to a 1 when SETUP[11:10]=10.
For BIST and STATE macros, the TDO_SM output behaves as shown in the above table.
For the shift macros, with or without capture, the TDO_SM output behaves as per the table only when the
corresponding TMS_SM output is not driven by the macro structure bit 7 or 8. On each falling edge of the
TCK_SM following the TCK_SM falling edge on which the TMS_SM changes state from bit 6 of the macro
structure to bit 7 of the macro structure, the serial test vector data fetched from the memory is presented on the
TDO_SM output. On the falling edge of the TCK_SM on which the final bit of the test vector is presented on the
TDO_SM output, the TMS_SM is presented with macro structure bit 8. On the subsequent TCK_SM falling
edges, and on the TCK_SM falling edges before the TMS_SM changes state from bit 6 to bit 7 of the macro
structure, the TDO_SM will behave as per the table above.
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HARDWARE INTERFACE DETAILS
Table 13. System Interface Signal Description
Signal Name
No. of
Bits
Pin Type
Driver Type
Freq. MHz Description
SCK
1
I
LVTTL
66
System Clock: This is the main clock signal to the SCANSTA101.
SCK is used to clock all internal circuitry
RST
1
I,H
LVTTL
N/A
Hardware Reset signal (with hysteresis (H)): This is the
SCANSTA101 asynchronous reset signal. This signal resets the
entire SCANSTA101 and sets all registers to their respective
default values.
OE
1
I
LVTTL
N/A
Output enable: will TRI-STATE all 1149.1 outputs when high.
Table 14. Parallel Processor Interface Signal Descriptions
Signal Name
No. of
Bits
Pin Type
Driver Type
Freq. MHz Description
DATA(31:16)
16
I/O
LVTTL (weakest
driver)
N/A
Bidirectional Data Bus. Not bonded out in packaged part. These
are only used in the 32-bit macro version.
DATA(15:0)
16
I/O
LVTTL
N/A
Bidirectional Data Bus.
ADDRESS(4:0)
5
I
LVTTL
N/A
Address Bus
CE
1
I
LVTTL
N/A
Chip Enable, when low, enables the PPI for transfers.
DATA(31:0) and DTACK are tristated when CE is high.
R/W
1
I
LVTTL
N/A
Read/Write defines a PPI cycle. Read when high, write when low.
STB
1
I
LVTTL
N/A
Strobe is used for timing all PPI transfers. DATA(31:0) are
tristated when STB is high. Data valid setup is with respect to the
falling edge of STB and data valid hold is with respect to rising
edge of STB.
DTACK
1
O
O/D
N/A
Data Acknowledge (open drain - sustained tristate). DTACK is
used to synchronize asynchronous transfers between the host
and the SCANSTA101. During write cycles, DTACK goes low
when data has been registered and then goes to high impedance
when the cycle has been completed. During read cycles DTACK
goes low when data bus is driven with the valid data and then
goes to high impedance when the cycle has been completed.
INT
1
O
LVTTL
N/A
Interrupt is used to trigger a host interrupt for any of the defined
interrupt events. Signal is active high.
Table 15. Serial Scan Interface Signal Descriptions
Signal Name
No.
Pin Type
Driver Type
Freq. MHz
TDI_SM
1
I
LVTTL
up to 25
ScanMaster Test Data Input (weak pullup)
TDO_SM
1
O
LVTTL
up to 25
ScanMaster Test Data Output
TMS_SM
1
O
LVTTL
up to 25
ScanMaster Test Mode Select
TCK_SM
1
O
LVTTL
up to 25
ScanMaster Test Clock
TRST0_SM
1
O
LVTTL
N/A
ScanMaster Test Reset
TRST1_SM
1
O
LVTTL
N/A
Redundant ScanMaster Test Reset (not bonded out)
TRIST_SM
1
O
LVTTL
N/A
The tristate notification pin exerts a high when TDO_SM is
tristated.
22
Description
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Figure 12. PPI Write Cycle Timing Diagram
Figure 13. PPI Read Cycle Timing Diagram
Figure 14. SSI Timing Diagram with Clock Divider set to 4
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Figure 15. SSI Timing Diagram with Clock Divider set to 8
Table 16. SCANSTA101 1149.1 Signal Descriptions
No. of
Bits
Pin Type
Driver Type
Freq. MHz
TDO
1
O
LVTTL
up to 25
SCANSTA101 Test Data Out
TDI
1
I,U
LVTTL
up to 25
SCANSTA101 Test Data In (pullup (U))
TMS
1
I,U
LVTTL
up to 25
SCANSTA101 Test Mode Select (pullup (U))
TCK
1
I
LVTTL
up to 25
SCANSTA101 Test Clock
TRST
1
I,U,H
LVTTL
N/A
Signal Name
Description
SCANSTA101 Test Reset (pullup (U) & hysteresis (H))
SAFE MODE
This device implements the following design rules to provide Single Event Upset/Single Event Error (SEU/SEE)
protection:
• Triple modular redundancy (TMR) for TRST0_SM and TRST1_SM outputs with the help of a TMR D flip-flop .
• After reset all scan interface outputs are driven to SEU tolerant safe values as shown below:
– TMS_SM = 1
– TCK_SM = 0
– TDO_SM = high-Z
– TRST0_SM = 0
– TRST1_SM = 0
• The EXTEST and the HIGHZ outputs from the JTAG TAP controller are gated with TRST to protect the
boundary scan cells from inadvertently entering the test mode.
CLOCK GENERATION AND DISTRIBUTION
Input Clock (SCK): Up to 66 MHz
Output Clock (TCK_SM): TCK_SM is a divided, registered version of SCK.
• Selectable: to 1/2, 1/4, 1/8, 1/16, 1/32, 1/64, and 1/128 of SCK.
• Frequency: up to 25 MHz
24
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RESET STRATEGY
The incoming external hardware reset (RST) will be synchronized to the incoming clock (SCK) and is combined
with the soft reset to generate a synchronized internal reset (SYS_RST_N). During operation, the chip can be
reset by writing a '1' to the Reset bit in the Setup register. All logic throughout the device will be initialized, all
control and status registers will be in a known default state, all PPI memory address pointers will default to their
respective base addresses, the SSI memory pointer will default to zero, the Tap Tracker will be reset to TLR, and
the clock division counter will be initialized to all zeroes after deassertion of the internal reset. The Reset bit in
the Setup register is self clearing. The TRST bit in the Setup register, when set, resets the SSI logic and drives
the TRST0_SM and TRST1_SM to zero.
SOFTWARE INTERFACE DETAILS
REGISTER DEFINITIONS
The following sections include descriptions of each addressable register in the ScanMaster memory space.
Following the title of the particular register, the mnemonic for the register is included in parentheses as well as
the physical address location in hexadecimal notation (value preceded by $). KEY- RO: Read Only; RW:
Read/Write.
Table 17. Start Register (START) ($00)
(1)
Bit(s)
Type
Address Offset
Reset Value
15:14
RO
Reserved
Field
0
00b
13
RW
Onboard Memory BIST
0
0b
12:9
RO
Reserved
0
0000b
8
RW
Use Sequencer
0
0b
7:3
RO
Reserved Use Vector x
0
0000h
2:0
RW
Use Vector x
0
000b
(1)
Reset Source
SYS_RST
SYS_RST
SYS_RST
Reserved Use Vector x for future growth for the number of vectors.
Onboard Memory BIST
ScanMaster memory BIST enable. This bit is self clearing when BIST result is written to the Memory
BIST Result bit in the Status register.
'1'
Initiate on chip memory BIST
'0'
On chip memory BIST complete
Use Sequencer
Sequencer enable/disable (For preloaded vectors only)
'1'
Enable sequencer
'0'
Disable sequencer
Use Vector
Use Vector x designates the vector "x" which is enabled, where "x" is the vector number, a binary
encoding of bits . Only vectors 1 through 4 are valid. Vectors 5 through 7 reserved for future
use.
'000'
No vector enabled
'001'
Vector 1 enabled
'010'
Vector 2 enabled
'011'
Vector 3 enabled
'100'
Vector 4 enabled
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Table 18. Status Register (STATUS) ($01)
(1)
(2)
(3)
(4)
Bit(s)
Type
15
RW
Results of Compare
14
RW
13
RW
12
RW
TDO Status Half-empty
11
RW
TDO Status Empty
10
RW
TDI Status Full
9
RW
TDI Status Half-full
8
RW
Using Sequencer
Address Offset
Reset Value
Reset Source
0
0b
SYS_RST
BIST Running
0
0b
SYS_RST
Memory BIST Result
0
0b
SYS_RST
0
0b
SYS_RST
0
0b
SYS_RST
0
0b
SYS_RST
0
0b
SYS_RST
0
0b
SYS_RST
0
00000b
0
000b
(2)
(3)
(3)
7:3
RO
Reserved Using Vector x
2:0
RW
Using Vector x
(4)
SYS_RST
Write capability to the register is only for test and debug purposes. Drivers should disable writes to the register during normal operation.
Results of Compare bit is toggled after a compare is complete and it is set to the mismatch state when sequencer is kicked off again.
Remains in last state until next compare completed or until set to the mismatch state.
Half full or half empty designates 56 long words.
Reserved Using Vector x for future growth for the number of vectors.
Results of Compare
Results of compare between TDI_SM and Expected memory space
'1'
Compare match
'0'
Compare mismatch
BIST Running
Indicates the BIST operation is still active
'1'
BIST operation active
'0'
BIST operation complete or BIST operation not running
Memory BIST Result
ScanMaster BIST result. BIST result will be held until overwritten by next BIST operation.
'1'
Passed memory BIST
'0'
Failed memory BIST
TDO Status Half
TDO_SM memory space status half empty
'1'
TDO_SM memory space half empty
'0'
TDO_SM memory space not half empty
TDO Status Empty
TDO_SM memory space status empty
'1'
TDO_SM memory space empty
'0'
TDO_SM memory space not empty
TDI Status Full
TDI_SM memory space status full
'1'
TDI_SM memory space full
'0'
TDI_SM memory space not full
TDI Status Half
TDI_SM memory space status half full
'1'
TDI_SM memory space half full
'0'
TDI_SM memory space not half full
Using Sequencer
Sequencer active and processing. Bit cleared when sequence complete.
'1'
Sequencer active
'0'
Sequencer inactive
Using Vector
26
Field
(1)
Using Vector x designates the vector "x" currently running, where "x" is the vector number, a binary encoding of
bits . Only vectors 1 through 4 are valid. Vectors 5 through 7 reserved for future use. Field cleared when
vectors complete.
'000'
No vector active.
'001'
Vector 1 active.
'010'
Vector 2 active.
'011'
Vector 3 active.
'100'
Vector 4 active.
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Table 19. Interrupt Control Register (INTCTRL) ($02)
(1)
(2)
(3)
Bit(s)
Type
15:13
RO
Reserved
Field
12
RW
TDO Half-empty Interrupt Enable
11
RW
TDO Empty Interrupt Enable
10
RW
TDI Full Interrupt Enable
9
RW
TDI Half-full Interrupt Enable
Address Offset
Reset Value
0
000b
0
0b
SYS_RST
0
0b
SYS_RST
0
0b
SYS_RST
0
0b
SYS_RST
0
0b
SYS_RST
0
00000b
0
000b
(1)
(1)
(2)
8
RW
Sequencer Interrupt Enable
7:3
RO
Reserved Vector x Interrupt Enable
2:0
RW
Vector x Interrupt Enable
(3)
(2)
Reset Source
SYS_RST
Half full or half empty designates 56 long words.
Drivers should not allow Sequencer Interrupt Enable and Vector x Interrupt Enable to be set at same time. Sequencer Interrupt Enable
has priority over the Vector x Interrupt Enable.
Reserved Vector x Interrupt Enable for future growth for the number of vectors.
TDO Half-empty Interrupt Enable
TDO_SM memory space half empty interrupt enable
'1'
Enable TDO_SM memory space half empty interrupt
'0'
Disable TDO_SM memory space half empty interrupt
TDO Empty Interrupt Enable
TDO_SM memory space empty interrupt enable
'1'
Enable TDO_SM memory space empty interrupt
'0'
Disable TDO_SM memory space empty interrupt
TDI Full Interrupt Enable
TDI_SM memory space full interrupt enable
'1'
Enable TDI_SM memory space full interrupt
'0'
Disable TDI_SM memory space full interrupt
TDI Half-full Interrupt Enable
TDI_SM memory space half full interrupt enable
'1'
Enable TDI_SM memory space half full interrupt
'0'
Disable TDI_SM memory space half full interrupt
Sequencer Interrupt Enable
Sequencer activity complete interrupt enable
'1'
Enable Sequencer activity complete interrupt
'0'
Disable Sequencer activity complete interrupt
Vector Interrupt Enable
Vector "x" complete interrupt enable, where "x" is the vector number, a binary encoding of bits
. Only vector interrupts 1 through 4 are valid. Vector interrupts 5 through 7 reserved for future
use.
'000'
No vector interrupt enabled
'001'
Vector 1 interrupt enabled
'010'
Vector 2 interrupt enabled
'011'
Vector 3 interrupt enabled
'100'
Vector 4 interrupt enabled
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Table 20. Interrupt Status Register (INTSTAT) ($03)
(1)
(2)
(3)
(4)
Bit(s)
Type
15:13
RO
Reserved
Field
12
RW
TDO Half-empty Interrupt
11
RW
TDO Empty Interrupt
10
RW
TDI Full Interrupt
9
RW
TDI Half-full Interrupt
Address Offset
Reset Value
0
00b
0
0b
SYS_RST
0
1b
SYS_RST
0
0b
SYS_RST
0
0b
SYS_RST
0
0b
SYS_RST
0
00000b
0
000b
(2)
(2)
8
RW
Sequencer Interrupt
7:3
RO
Reserved Vector x Interrupt
2:0
RW
Vector x Interrupt
(1)
(3) (4)
(4)
Reset Source
SYS_RST
This register is writable in debug mode only.
Half full or half empty designates 56 long words.
Reserved Vector x Interrupt for future growth for the number of vectors.
Drivers shouldn't allow Sequencer Interrupt and Vector x Interrupt to be set at same time. Sequencer Interrupt has priority over the
Vector x Interrupt.
TDO Half-empty Interrupt
TDO_SM memory space half empty status
'1'
TDO_SM memory space half empty
'0'
TDO_SM memory space not half empty
TDO Empty Interrupt
TDO_SM memory space empty status
'1'
TDO_SM memory space empty
'0'
TDO_SM memory space not empty
TDI Full Interrupt
TDI_SM memory space full status
'1'
TDI_SM memory space full
'0'
TDI_SM memory space not full
TDI Half-full Interrupt
TDI_SM memory space half full status
'1'
TDI_SM memory space half full
'0'
TDI_SM memory space not half full
Sequencer Interrupt
Sequencer completed status
'1'
Sequencer processing completed
'0'
Sequencer processing or not started
Vector Interrupt
Vector "x" completed status, where "x" is the vector number, a binary encoding of bits . Only
vectors 1 through 4 are valid. Vectors 5 through 7 reserved for future use.
'000'
No vector completed activity
'001'
Vector 1 completed
'010'
Vector 2 completed
'011'
Vector 3 completed
'100'
Vector 4 completed
Table 21. Setup Register (SETUPR) ($04)
28
Bit(s)
Type
Field
Address Offset
Reset Value
Reset Source
SYS_RST
15
RW
16/32 bit Mode
0
0b
14:10
RO
Reserved
0
00h
11:10
RW
TDO_SM Ctrl
0
00b
SYS_RST
9:7
RW
Sync Bit Length
0
000b
SYS_RST
6
RW
Default TDO Value
0
1b
SYS_RST
5
RW
Debug Mode
0
0b
SYS_RST
4
RW
ScanBridge Support Initiate/ Release
0
0b
SYS_RST
3
RW
TRST
0
0b
SYS_RST
2
RW
Reset
0
0b
SYS_RST
1:0
RW
Test Loop-Back
0
11b
SYS_RST
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16/32 bit Mode
Selects 16-bit or 32-bit external interface mode
'1'
32-bit external interface mode (used in macro form only)
'0'
16-bit external interface mode
TDO_SM Ctrl
TDO_SM Control bits
'00'
Hold previous value
'01'
Default TDO Value
'10'
Default TDO Value
'11'
High impedance
Sync Bit Length "x"
Sync Bit Length bits represents the number of sync bits to be used when the Sync Bit Support
Enable bit (17 in the Macro Structure) is set. The value "x" is the binary encoded numeric value.
Default TDO Value
The value in this register will be sent out on the TDO_SM pin when performing a BIST or a STATE
Macro.
'1'
Drive TDO_SM to one.
'0'
Drive TDO_SM to zero.
Debug Mode
Control bit to put SCANSTA101 in debug mode
'1'
Debug mode.
'0'
Normal mode.
ScanBridge Support Initiate/Release
ScanBridge support enable
'1'
Enable ScanBridge support
'0'
Disable ScanBridge support
TRST
Processor initiated ScanMaster test reset (on TRST0_SM and TRST1_SM_N). Bit is cleared by a
processor write.
'1'
Set TRST outputs low (active) and reset SSI logic.
'0'
Set TRST outputs high
Reset
Processor commanded synchronous reset to the serial scan logic for 2 clocks. This bit is self
clearing.
'1'
Reset the entire chip.
'0'
Release serial scan logic reset
Test Loop-Back
Test loop-back mode bits
'00'
Normal operation
'01'
Loop-back TDO_SM to TDI_SM
'10'
Loop-back TMS_SM to TDI_SM
'11'
All Dot1 (1149.1) pins placed in SEU tolerant safe mode with: TMS_SM = 1, TCK_SM = 0,
TDO_SM = Z, TRST0_SM = 0
Table 22. Clock Divider Register (CLKDIV) ($05)
Bit(s)
Type
15:8
RO
Reserved
7:1
RW
Divisor
0
(1)
RO
Field
Reserved (hard coded)
(1)
Address Offset
Reset Value
0
00h
0
00h
0
0b
Reset Source
SYS_RST
LSB of the Clock Divider register is hard coded to zero.
Divisor
Clock divisor for the division of the SCK clock to the serial scan clock.
'0000000'
No serial scan clock generated.
'0000001'
Divide SCK by 2
'0000010'
Divide SCK by 4
'0000100'
Divide SCK by 8
'0001000'
Divide SCK by 16
'0010000'
Divide SCK by 32
'0100000'
Divide SCK by 64
'1000000'
Divide SCK by 128
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Table 23. TDI_SM LFSR Exponent Register (EXPR) ($07)
Bit(s)
Type
Address Offset
Reset Value
15:3
RO
Reserved
Field
0
0000h
2:0
RW
LFSR
0
000b
LFSR Exponent
LFSR exponent. Binary encoding for the selection between three polynomials.
'000'
No polynomial selected
'001'
Polynomial 1: X32 + X7 + X5 + X3 + X2 + X + 1
'010'
Polynomial 2: X32 + X28 + X27 + X + 1
'011'
Polynomial 3: X32 + X7 + X6 + X2 + 1
Table 24. TDI_SM LFSR LSB Seed Register (LSSEDR) ($08)
(1)
(2)
Bit(s)
Type
15:0
RW
Field
LSW LFSR Seed
Address Offset
Reset Value
Reset Source
0
0000h
SYS_RST
LSW LFSR Seed is the LS word of the LFSR seed.
This register along with register MSSEDR form a register pair and should be read/written with two consecutive read/write accesses.
Bit(s)
Type
15:0
RW
Field
MSW LFSR Seed
(1) (2)
Address Offset
Reset Value
Reset Source
0
0000h
SYS_RST
MSW LFSR Seed is the MS word of the LFSR seed.
This register along with register LSSEDR form a register pair and should be read/ written with two consecutive read/write accesses.
Table 26. TDI_SM LFSR LSB Result Register (LSRESR) ($0A)
(1)
(2)
Bit(s)
Type
15:0
RW
Field
LSW LFSR Result
Reset Value
Reset Source
0
0000h
SYS_RST
LSW LFSR Result is the LS word of the LFSR result.
This register along with register MSRESR form a register pair and should be read/written with two consecutive read/write accesses.
Bit(s)
Type
15:0
RW
Field
MSW LFSR Result
Reset Value
Reset Source
0
0000h
SYS_RST
MSW LFSR Result is the MS word of the LFSR result.
This register along with register LSRESR form a register pair and should be read/ written with two consecutive read/write accesses.
Bit(s)
Type
15:0
RW
Field
Index
(1) (2) (3)
Address Offset
Reset Value
Reset Source
0
0000h
SYS_RST
Index sets the individual address memory pointer.
Address memory pointer must be on a long word boundary.
Writing to this register sets the TDO_SM, TDI_SM, Expected and Mask pointers. These pointers will automatically increment with each
long word read from the TDI_SM space and each long word write to the other TDO_SM, Expected and Mask spaces.
Table 29. Vector Index Register (VINDEXR) ($11)
(1)
(2)
30
(1) (2)
Address Offset
Table 28. Index Register (INDEXR) ($0C)
(1)
(2)
(3)
(1) (2)
Address Offset
Table 27. TDI_SM LFSR MSB Result Register (MSRESR) ($0B)
(1)
(2)
SYS_RST
(1) (2)
Table 25. TDI_SM LFSR MSB Seed Register (MSSEDR) ($09)
(1)
(2)
Reset Source
Bit(s)
Type
15:0
RW
Field
Vector Index
(1) (2)
Address Offset
Reset Value
Reset Source
0
0000h
SYS_RST
Vector Index sets the Vector address memory pointer.
Address memory pointer must be on a long word boundary.
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Table 30. Header/Trailer Index Register (HTINDEXR) ($13)
(1)
(2)
Bit(s)
Type
15:0
RW
Field
Address Offset
Reset Value
Reset Source
0
0000h
SYS_RST
Header/Trailer Index
Header/Trailer Index sets the Header/Trailer address memory pointer.
Address memory pointer must be on a long word boundary.
Table 31. Macro Index Register (MINDEXR) ($15)
(1)
(2)
Bit(s)
Type
15:0
RW
Field
(1) (2)
Address Offset
Reset Value
Reset Source
0
0000h
SYS_RST
Macro Index
Macro Index sets the Macro address memory pointer.
Address memory pointer must be on a long word boundary.
Table 32. Sequencer Index Register (SINDEXR) ($17)
(1)
(2)
(1) (2)
Bit(s)
Type
15:0
RW
Field
(1) (2)
Address Offset
Reset Value
Reset Source
0
0000h
SYS_RST
Sequencer Index
Sequencer Index sets the Sequencer address memory pointer.
Address memory pointer must be on a long word boundary.
Table 33. ScanBridge Support Index Register (BSINDEXR) ($19)
(1)
(2)
Bit(s)
Type
15:0
RW
Field
(1) (2)
Address Offset
Reset Value
Reset Source
0
0000h
SYS_RST
ScanBridge Index
ScanBridge Index sets the ScanBridge Support address memory pointer.
Address memory pointer must be on a long word boundary.
TESTABILITY DETAILS - IEEE 1149.1 SUPPORT
Table 34. Supported IEEE 1149.1 Instruction Set
Instruction Mnemonic
Binary Instruction Code
Description
EXTEST
000
Allows off-chip circuitry and interconnect to be tested.
SAMPLE/PRELOAD
001
Allows snapshot of normal operation. Also allows data to be loaded on
parallel output boundary scan registers.
BYPASS
111
Places device in bypass mode so that there is single shift register stage
between TDI and TDO.
IDCODE
010
Allows scanning of the device identification register.
HIGHZ
011
Will TRI-STATE all output drivers with the exception of TDO.
CLAMP
100
Allows the state of the signals driven from component pins to be
determined from the boundary-scan register while the BYPASS register
is selected as the serial path between TDI and TDO.
RUNBIST
110
Enables on chip BIST logic to perform memory BIST.
SCANTEST
101
Allows the assertion of internal test_mode signal to prevent the
asynchronous resets from inadvertently resetting the flip-flops during
internal scan. Used in factory test.
Table 35. IDCODE Register Description
Version
Part Number
Manufacturer Identity
Start Bit
"0000"
"1111 1100 0001 0111"
"000 0000 1111"
"1"
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Table 36. Boundary Scan Register Definition
BSR
Bit#
Signal Name
BSR
Bit#
Signal Name
BSR
Bit#
Signal Name
BSR
Bit#
Signal Name
0
SCK
10
DTACK
20
DATA[7]
30
TCK_SM
1
RST
11
INT
21
DATA[6]
31
TRST0_SM
2
R/W
12
DATA[15]
22
DATA[5]
32
TDI_SM
3
STB
13
DATA[14]
23
DATA[4]
33
OE
4
CE
14
DATA[13]
24
DATA[3]
34
TRIST
5
ADDRESS[4]
15
DATA[12]
25
DATA[2]
6
ADDRESS[3]
16
DATA[11]
26
DATA[1]
7
ADDRESS[2]
17
DATA[10]
27
DATA[0]
8
ADDRESS[1]
18
DATA[9]
28
TDO_SM
9
ADDRESS[0]
19
DATA[8]
29
TMS_SM
BIST SUPPORT
The memory BIST can be initiated through JTAG interface using the RUNBIST instruction or by setting the
Onboard Memory BIST bit in the Start register. When the memory BIST is initiated through the JTAG interface
the result of pass/fail will be set in the Memory BIST Result bit in the Status register and also in the BIST status
register that can be accessed through the JTAG interface. The BIST status register is a one bit register and is
connected in the serial path of TDO and TDI when the RUNBIST instruction is scanned into the instruction
register. Once the BIST is done, the contents of the BIST status register can be scanned out to determine
whether the memory BIST passed or failed. If the memory BIST is initiated through the Onboard Memory BIST
bit in the Start register the result of pass/fail will be set only in the BIST Result bit in the status register. The
memory BIST will initialize the memory to zero.
32
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SNLS057J – MAY 2002 – REVISED APRIL 2013
REVISION HISTORY
April, 2013 – Changed layout of National Data Sheet to TI format.
January, 2010 – Applications information updates and clarification. No specification changes.
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PACKAGE OPTION ADDENDUM
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10-Dec-2020
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
(3)
Device Marking
(4/5)
(6)
SCANSTA101SM/NOPB
ACTIVE
NFBGA
NZA
49
416
RoHS & Green
SNAGCU
Level-4-260C-72 HR
-40 to 85
SCANSTA101
SM
SCANSTA101SMX/NOPB
ACTIVE
NFBGA
NZA
49
2000
RoHS & Green
SNAGCU
Level-4-260C-72 HR
-40 to 85
SCANSTA101
SM
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of