0
登录后你可以
  • 下载海量资料
  • 学习在线课程
  • 观看技术视频
  • 写文章/发帖/加入社区
创作中心
发布
  • 发文章

  • 发资料

  • 发帖

  • 提问

  • 发视频

创作活动
SN65HVD267D

SN65HVD267D

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    SOIC8_150MIL

  • 描述:

    IC TRANSCEIVER HALF 1/1 8SOIC

  • 数据手册
  • 价格&库存
SN65HVD267D 数据手册
Product Folder Sample & Buy Support & Community Tools & Software Technical Documents SN65HVD265, SN65HVD266, SN65HVD267 SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015 SN65HVD26x Turbo CAN Transceivers for CAN FD (Flexible Data Rate) and Redundancy 1 Features 3 Description • • This CAN transceiver meets the ISO1189-2 High Speed CAN (Controller Area Network) physical layer standard. It is designed for data rates in excess of 2 Mpbs (megabits per second) for CAN FD (CAN with flexible data rate), greater than 1 Mbps for CAN in short networks, and enhanced timing margin and higher data rates in long and highly-loaded networks. The device provides many protection features to enhance device and CAN-network robustness. The SN65HVD267 adds additional features, allowing easy design of redundant and multi-topology networks with fault indication for higher levels of safety in the CAN system. 1 • • • • Meets the Requirements of ISO11898-2 Turbo CAN: – Specified for 2-Mbps CAN FD (CAN with Flexible Data Rate) – Short and Symmetrical Propagation Delay Times and Fast Loop Times for Enhanced Timing Margin – Higher Data Rates in CAN Networks I/O Voltage Range Supports 3.3-V and 5-V MCUs Ideal Passive Behavior When Unpowered – Bus and Logic Terminals are High Impedance (no load) – Power-Up/Down With Glitch Free Operation On Bus Protection Features – HBM ESD Protection Exceeds ±12 kV – Bus Fault Protection –27 V to 40 V – Undervoltage Protection on Supply Terminals – Driver Dominant Time Out (TXD DTO) – SN65HVD267: Receiver Dominant Time Out (RXD DTO) – SN65HVD267: FAULT Output Terminal – Thermal Shutdown Protection Characterized for –40°C to 125°C Operation Device Information PART NUMBER PACKAGE SN65HVD26xD (1) BODY SIZE SOIC (8) 4.90 mm × 3.91 mm (1) For all available packages, see the orderable addendum at the end of the data sheet. Functional Block Diagram NC / VRXD / FAULT (See Note A) 5 VCC TXD S 1 VCC 3 FAULT LOGIC MUX (See Note A) VCC OVER TEMPERATURE DOMINANT TIME OUT 8 7 CANH 6 CANL MODE SELECT 2 Applications • • • • • • 2-Mbps Operation in CAN with Flexible Data Rate Networks 1-Mbps Operation in Highly Loaded CAN Networks Down to 10-kbps Networks Using TXD DTO Industrial Automation, Control, Sensors and Drive Systems Building, Security and Climate Control Automation Telecom Base Station Status and Control SN65HVD267: Functional Safety With Redundant and Multi-topology CAN networks CAN Bus Standards Such as CANopen, DeviceNet, NMEA2000, ARNIC825, ISO11783, CANaerospace UNDER VOLTAGE VCC or VRXD (See Note B) RXD 4 LOGIC OUTPUT DOMINANT TIME OUT (See Note C) BIAS UNIT • 2 GND Terminal 5 function is device dependent; NC on SN65HVD265, VRXD for RXD output level-shifting device on SN65HVD266, and FAULT Output on SN65HVD267 RXD logic output is driven to 5V VCC on 5V-only supply devices (SN65HVD265, SN65HVD267) and driven to VRXD on output level-shifting device (SN65HVD266). RXD (Receiver) Dominant State Time Out is a device dependent option available only on SN65HVD267. 1 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA. SN65HVD265, SN65HVD266, SN65HVD267 SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015 www.ti.com Table of Contents 1 2 3 4 5 6 7 8 9 Features .................................................................. Applications ........................................................... Description ............................................................. Revision History..................................................... Device Comparison Table..................................... Pin Configurations and Functions ....................... Specifications......................................................... 1 1 1 2 3 3 4 7.1 7.2 7.3 7.4 7.5 7.6 7.7 7.8 7.9 4 4 4 4 5 5 5 8 9 Absolute Maximum Ratings ...................................... ESD Ratings: AEC .................................................... ESD Ratings: IEC ..................................................... Transient Protection .................................................. Recommended Operating Conditions....................... Thermal Information .................................................. Electrical Characteristics........................................... Switching Characteristics .......................................... Typical Characteristics .............................................. Parameter Measurement Information .................. 9 Detailed Description ............................................ 13 9.1 9.2 9.3 9.4 Overview ................................................................. Functional Block Diagram ....................................... Feature Description................................................. Device Functional Modes........................................ 13 13 13 17 10 Application and Implementation........................ 20 10.1 Application Information.......................................... 20 10.2 Typical Application ................................................ 20 11 Power Supply Recommendations ..................... 24 12 Layout................................................................... 24 12.1 Layout Guidelines ................................................. 24 12.2 Layout Example .................................................... 25 13 Device and Documentation Support ................. 26 13.1 13.2 13.3 13.4 13.5 Related Links ........................................................ Community Resources.......................................... Trademarks ........................................................... Electrostatic Discharge Caution ............................ Glossary ................................................................ 26 26 26 26 26 14 Mechanical, Packaging, and Orderable Information ........................................................... 26 4 Revision History NOTE: Page numbers for previous revisions may differ from page numbers in the current version. Changes from Original (September 2013) to Revision A Page • Added Pin Configuration and Functions section, ESD Ratings table, Switching Characteristics table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section ..................................................................................................................... 1 • Changed Typical Redundant Physical Layer Topology Using the SN65HVD267, Figure 19 .............................................. 23 2 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: SN65HVD265 SN65HVD266 SN65HVD267 SN65HVD265, SN65HVD266, SN65HVD267 www.ti.com SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015 5 Device Comparison Table PART NUMBER I/O SUPPLY for RXD TXD DTO RXD DTO FAULT Output SN65HVD265 No Yes No No '251 and '1050 functional upgrade with Turbo CAN fast loop times and TXD DTO protection allowing data rates down to 10kbps SN65HVD266 Yes Yes No No '251 and '1050 functional upgrade with Turbo CAN fast loop times and TXD DTO protection allowing data rates down to 10kbps. RXD output level shifting via RXD supply input. SN65HVD267 No Yes Yes Yes '251 and '1050 functional upgrade with Turbo CAN fast loop times, TXD and RXD DTO protection allowing data rates down to 10kbps and fault output terminal COMMENT 6 Pin Configurations and Functions D Package 8-Pin SOIC Top View SN65HVD265 SN65HVD266 SN65HVD267 TXD 1 8 S TXD 1 8 S TXD 1 8 S GND 2 7 CANH GND 2 7 CANH GND 2 7 CANH VCC 3 6 CANL VCC 3 6 CANL VCC 3 6 CANL RXD 4 5 NC RXD 4 5 VRXD RXD 4 5 FAULT 5V Supply and Fault Output 5V Supply with RXD Level-Shifting 5V Supply Pin Functions PIN NO. NAME TYPE 1 TXD I 2 GND GND 3 VCC Supply 4 RXD O NC NC VRXD Supply 5 DESCRIPTION CAN transmit data input (LOW for dominant and HIGH for recessive bus states) Ground connection Transceiver 5V supply voltage CAN receive data output (LOW for dominant and HIGH for recessive bus states) SN65HVD265: No Connect SN65HVD266: RXD output supply voltage FAULT O SN65HVD267: open drain FAULT output terminal 6 CANL I/O Low level CAN bus line 7 CANH I/O High level CAN bus line 8 S I Mode select: S (silent mode) select terminal (active high) Copyright © 2013–2015, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVD265 SN65HVD266 SN65HVD267 3 SN65HVD265, SN65HVD266, SN65HVD267 SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015 www.ti.com 7 Specifications 7.1 Absolute Maximum Ratings Over operating free-air temperature range (unless otherwise noted). (1) (2) VCC Supply voltage VRXD RXD Output supply voltage VBUS CAN Bus I/O voltage (CANH, CANL) V(Logic_Input) Logic input terminal voltage (TXD, S) V(Logic_Output) Logic output terminal voltage (RXD) MIN MAX UNIT –0.3 6 V –0.3 6 and VRXD ≤ VCC + 0.3 V –27 40 V –0.3 6 V SN65HVD265, SN65HVD267 –0.3 6 V SN65HVD266 –0.3 6 and VI ≤ VRXD + 0.3 V 12 mA 20 mA SN65HVD266 IO(RXD) RXD (Receiver) output current IO(FAULT) FAULT output current TJ Operating virtual junction temperature (see Thermal Information) –40 150 °C TA Ambient temperature (see Thermal Information) –40 125 °C (1) (2) SN65HVD267 Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. All voltage values, except differential I/O bus voltages, are with respect to ground terminal. 7.2 ESD Ratings: AEC VALUE V(ESD) (1) (2) (3) Electrostatic discharge Human body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1) All pins ±2500 CAN bus pins (CANH, CANL) (2) ±12000 Charged-device model (CDM), per JEDEC specification JESD22-C101 (3) ±750 Machine Model ±250 UNIT V JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. Test method based upon JEDEC Standard 22 Test Method A114, CAN bus stressed with respect to GND. JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 7.3 ESD Ratings: IEC V(ESD) (1) Electrostatic discharge IEC 61400-4-2 according to GIFT-ICT CAN EMC test spec (1) VALUE UNIT ±8000 V IEC 61400-4-2 is a system level ESD test. Results given here are specific to the GIFT-ICT CAN EMC Test specification conditions. Different system level configurations may lead to different results. 7.4 Transient Protection ISO7637 Transients according to GIFT - ICT CAN EMC test spec (1) (1) 4 CAN bus pins (CANH, CANL) VALUE UNIT Pulse 1 –100 V Pulse 2 +75 V Pulse 3a –150 V Pulse 3b +100 V ISO7637 is a system level transient test. Results given here are specific to the GIFT-ICT CAN EMC Test specification conditions. Different system level configurations may lead to different results. Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: SN65HVD265 SN65HVD266 SN65HVD267 SN65HVD265, SN65HVD266, SN65HVD267 www.ti.com SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015 7.5 Recommended Operating Conditions MIN MAX VCC Supply voltage 4.5 5.5 UNIT V VRXD RXD supply (SN65HVD266 only) 2.8 5.5 V VI or VIC CAN bus terminal voltage (separately or common mode) –2 7 V VID CAN bus differential voltage -6 6 V VIH Logic HIGH level input (TXD, S) 2 5.5 V VIL Logic LOW level input (TXD, S) 0 0.8 V IOH(DRVR) CAN BUS Driver High level output current IOL(DRVR) CAN BUS Driver Low level output current IOH(RXD) RXD terminal HIGH level output current IOL(RXD) RXD terminal LOW level output current IO(FAULT) FAULT terminal LOW level output current TA Operational free-air temperature (see Thermal Information) –70 mA 70 mA –2 mA 2 mA 2 mA 125 °C SN65HVD267 –40 7.6 Thermal Information SN65HVD265, SN65HVD266, SN65HVD267 THERMAL METRIC (1) UNIT D (SOIC) 8 PINS RθJA Junction-to-air thermal resistance, High-K thermal resistance 107.5 °C/W RθJC(top) Junction-to-board thermal resistance 48.9 °C/W RθJB Junction-to-case (top) thermal resistance 56.7 °C/W ψJT Junction-to-top characterization parameter 12.1 °C/W ψJB Junction-to-board characterization parameter 48.2 °C/W (1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report, SPRA953. 7.7 Electrical Characteristics Over recommended operating conditions (unless otherwise noted): TA = –40°C to 125°C, SN65HVD266 device VRXD = VCC. PARAMETER TEST CONDITIONS MIN TYP (1) MAX UNIT SUPPLY CHARACTERISTICS ICC 5-V Supply current Normal Mode (Driving Dominant) See Figure 4, TXD = 0 V, RL = 50 Ω, CL = open, RCM = open, S = 0V 60 85 Normal Mode (Driving Dominant – bus fault) See Figure 4, TXD = 0 V, S = 0V, CANH = -12V, RL = open, CL = open, RCM = open 130 180 Normal Mode (Driving Dominant) See Figure 4, TXD = 0 V, RL = open (no load), CL = open, RCM = open, S = 0V 10 20 Normal Mode (Recessive) See Figure 4, TXD = VCC, RL = 50 Ω, CL = open, RCM = open, S = 0V 10 20 Silent Mode See Figure 4, TXD = VCC, RL = 50 Ω,CL = open, RCM = open, S = VCC 2.5 5 I(RXD) RXD Supply current All modes (SN65HVD266 only) UVVCC Undervoltage detection on VCC for protected mode RXD Floating, TXD = 0V 3.5 VHYS(UVVCC) Hysteresis voltage on UVVCC (1) mA 500 µA 4.45 V 200 mV All typical values are at 25°C and supply voltages of VCC = 5 V and V(RXD) = 5 V, RL = 60 Ω. Copyright © 2013–2015, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVD265 SN65HVD266 SN65HVD267 5 SN65HVD265, SN65HVD266, SN65HVD267 SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015 www.ti.com Electrical Characteristics (continued) Over recommended operating conditions (unless otherwise noted): TA = –40°C to 125°C, SN65HVD266 device VRXD = VCC. PARAMETER TEST CONDITIONS MIN TYP (1) MAX UNIT 2.75 V SUPPLY CHARACTERISTICS (CONTINUED) UV(RXD) Undervoltage detection on VRXD for protected mode (SN65HVD266 only) VHYS(UVRXD) Hysteresis voltage on UVRXD (SN65HVD266 only) 1.3 80 mV S TERMINAL (MODE SELECT INPUT) VIH HIGH-level input voltage 2 VIL LOW-level input voltage IIH HIGH-level input leakage current S = VCC = 5.5 V IIL Low-level input leakage current S = 0 V, VCC = 5.5 V Ilkg(OFF) Unpowered leakage current S = 5.5 V, VCC = 0 V, V(RXD) = 0 V V 7 0.8 V 100 µA –1 0 1 µA 7 35 100 µA TXD TERMINAL (CAN TRANSMIT DATA INPUT) VIH HIGH level input voltage VIL LOW level input voltage 2 V IIH HIGH level input leakage current TXD = VCC = 5.5 V –2.5 IIL Low level input leakage current TXD = 0 V, VCC = 5.5 V –100 Ilkg(OFF) Unpowered leakage current TXD = 5.5 V, VCC = 0 V, V(RXD) = 0 V –1 0 CI Input Capacitance 0.8 V 0 1 µA -25 –7 µA 1 µA 3.5 pF RXD TERMINAL (CAN RECEIVE DATA OUTPUT) VOH HIGH level output voltage See Figure 5, IO = –2 mA. For devices with V(RXD) supply VOH = 0.8 × V(RXD) VOL LOW level output voltage See Figure 5, IO = 2 mA Ilkg(OFF) Unpowered leakage current RXD = 5.5 V, VCC = 0 V, V(RXD) = 0 V 0.8×VCC –1 V 0 0.4 V 1 µA DRIVER ELECTRICAL CHARACTERISTICS CANH VO(D) Bus output voltage (dominant VO(R) Bus output voltage (recessive) VOD(D) CANL Differential output voltage (dominant) See Figure 14 and Figure 4, TXD = 0 V, S = 0 V, RL = 60 Ω, CL = open, RCM = open See Figure 14 and Figure 4, TXD = VCC, V(RXD) = VCC, S = VCC or 0 V (2), RL = open (no load), RCM = open VSYM (2) 6 Differential output voltage (recessive) Output symmetry (dominant or recessive) (VCC – VO(CANH) – VO(CANL)) 4.5 0.5 2.25 2 0.5×VCC 3 See Figure 14 and Figure 4, TXD = 0 V, S = 0 V, 45 Ω ≤ RL ≤ 65 Ω, CL = open, RCM = 330 Ω, –2 V ≤ VCM ≤ 7 V, 4.75 V≤ VCC ≤ 5.25 V 1.5 See Figure 14 and Figure 4, TXD = 0 V, S = 0 V, 45 Ω ≤ RL ≤ 65 Ω, CL = open, RCM = 330 Ω, –2 V ≤ VCM ≤ 7 V, 4.5V ≤ VCC ≤ 5.5 V 1.25 3.2 –0.12 0.012 See Figure 14 and Figure 4, TXD = VCC, S = 0 V, RL = 60 Ω, CL = open, RCM = open VOD(R) 2.75 V V 3 V V See Figure 14 and Figure 4, TXD = VCC, S = 0 V, RL = open (no load), CL = open, RCM = open, –40°C ≤ TA ≤ 85°C –0.100 0.050 See Figure 14 and Figure 4, S at 0 V, RL = 60 Ω, CL = open, RCM = open –0.4 0.4 V For the bus output voltage (recessive) will be the same if the device is in normal mode with S terminal LOW or if the device is in silent mode with the S terminal is HIGH. Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: SN65HVD265 SN65HVD266 SN65HVD267 SN65HVD265, SN65HVD266, SN65HVD267 www.ti.com SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015 Electrical Characteristics (continued) Over recommended operating conditions (unless otherwise noted): TA = –40°C to 125°C, SN65HVD266 device VRXD = VCC. PARAMETER TEST CONDITIONS MIN TYP (1) MAX UNIT DRIVER ELECTRICAL CHARACTERISTICS (CONTINUED) IOS(SS_DOM) IOS(SS_REC) Short circuit steady-state output current, Dominant Short circuit steady-state output current, Recessive See Figure 14 and Figure 10, VCANH = 0 V, CANL = open, TXD = 0 V –160 mA See Figure 14 and Figure 10, VCANL = 32 V, CANH = open, TXD = 0 V 160 See Figure 14 and Figure 10, –20 V ≤ VBUS ≤ 32 V, Where VBUS = CANH = CANL, TXD = VCC, Normal and Silent Modes –8 8 mA 900 mV RECEIVER ELECTRICAL CHARACTERISTICS VIT+ Positive-going input threshold voltage, normal mode See Figure 5, Table 6 and Table 1 VIT– Negative-going input threshold voltage, normal mode VHYS Hysteresis voltage (VIT+ - VIT–) Ilkg(IOFF) Power-off (unpowered) bus input leakage current CANH = CANL = 5 V, VCC = 0 V, V(RXD) =0V CI Input capacitance to ground (CANH or CANL) TXD = VCC, V(RXD) = VCC, VI = 0.4 sin (4E6 π t) + 2.5 V 25 pF CID Differential input capacitance TXD = VCC, V(RXD) = VCC, VI = 0.4 sin (4E6 π t) 10 pF RID Differential input resistance RIN Input resistance (CANH or CANL) RIN(M) Input resistance matching: [1 – RIN(CANH) / RIN(CANL)] × 100% 500 mV 125 mV 5.5 TXD = VCC = V(RXD) = 5 V, S = 0 V V(CANH) = V(CANL), –40°C ≤ TA ≤ 85°C µA 30 80 kΩ 15 40 kΩ –3% 3% FAULT terminal (Fault Output), SN65HVD267 only ICH Output current high level FAULT = VCC, See Figure 3 ICL Output current low level FAULT = 0.4 V, See Figure 3 –10 5 10 12 µA mA POWER DISSIPATION VCC = 5 V, VRXD = 5 V, TJ = 27°C, RL = 60 Ω, S at 0 V, Input to TXD at 250 kHz, 25% duty cycle square wave, CL_RXD = 15 pF. Typical CAN operating conditions at 500kbps with 25% transmission (dominant) rate. PD Average power dissipation 115 mW VCC = 5.5 V, VRXD = 5.5 V, TJ = 150°C, RL = 50 Ω, S at 0 V, Input to TXD at 500 kHz, 50% duty cycle square wave, CL_RXD = 15 pF. Typical high load CAN operating conditions at 1mbps with 50% transmission (dominant) rate and loaded network. 268 THERMAL SHUTDOWN Thermal shutdown temperature Thermal shutdown hysteresis Copyright © 2013–2015, Texas Instruments Incorporated 170 °C 5 °C Submit Documentation Feedback Product Folder Links: SN65HVD265 SN65HVD266 SN65HVD267 7 SN65HVD265, SN65HVD266, SN65HVD267 SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015 www.ti.com 7.8 Switching Characteristics Over operating free-air temperature range (unless otherwise noted). PARAMETER TEST CONDITIONS MIN TYP (1) MAX UNIT DEVICE SWITCHING CHARACTERISTICS Total loop delay, driver input (TXD) to tPROP(LOOP1) receiver output (RXD), recessive to dominant Total loop delay, driver input (TXD) to tPROP(LOOP2) receiver output (RXD), dominant to recessive 150 See Figure 7, S = 0 V, RL = 60 Ω, CL = 100 pF, CL(RXD) = 15 pF 150 tREC(2Mbps) Loop Delay Symmetry for 2Mbps CAN with Flexible Data Rate. (2) See Figure 8 , S = 0 V, RL = 60Ω, CL = 100pF, CL(RXD) = 15pF, tBIT = 500ns IMODE Mode change time, from Normal to Silent or from Silent to Normal See Figure 6 400 ns 550 20 µS DRIVER SWITCHING CHARACTERISTICS tpHR Propagation delay time, HIGH TXD to Driver Recessive tpLD Propagation delay time, LOW TXD to Driver Dominant tsk(p) Pulse skew (|tpHR - tpLD|) tR Differential output signal rise time 10 30 tF Differential output signal fall time 17 30 tR(10k) Differential output signal rise time, RL = 10 kΩ tF(10k) Differential output signal fall time, RL = 10 kΩ tTXD_DTO Dominant timeout (3) See Figure 4, S = 0 V, RL = 60 Ω, CL = 100 pF, RCM = open 50 70 40 70 ns 10 35 See Figure 4, S = 0 V, RL = 10 kΩ, CL = 10 pF, RCM = open See Figure 9, RL = 60 Ω, CL = open ns 100 1175 3700 µs 70 90 ns 70 90 ns RECEIVER SWITCHING CHARACTERISTICS tpRH Propagation delay time, recessive input to high output tpDL Propagation delay time, dominant input to low output tR Output signal rise time 4 20 ns tF Output signal fall time 4 20 ns t(RXD_DTO) Receiver dominant time out (SN65HVD267 only) See Figure 2, CL(RXD) = 15 pF 4200 µs (4) (1) (2) (3) (4) 8 See Figure 5, CL(RXD) = 15 pF 1380 All typical values are at 25°C and supply voltages of VCC = 5 V and V(RXD) = 5 V, RL = 60 Ω. Loop delay symmetry for CAN with flexible data rate or "improved CAN" for data rates in excess of 1Mbps. Specified in accordance with working draft 2Mbps specification from physical layer task force within CAN in Automation. The TXD dominant timeout (t(TXD_DTO)) disables the driver of the transceiver once the TXD has been dominant longer than t(TXD_DTO), which releases the bus lines to recessive, preventing a local failure from locking the bus dominant. The driver may only transmit dominant again after TXD has been returned HIGH (recessive). While this protects the bus from local faults, locking the bus dominant, it limits the minimum data rate possible. The CAN protocol allows a maximum of eleven successive dominant bits (on TXD) for the worst case, where five successive dominant bits are followed immediately by an error frame. This, along with the t(TXD_DTO) minimum, limits the minimum bit rate. The minimum bit rate may be calculated by: Minimum Bit Rate = 11 / t(TXD_DTO) = 11 bits / 1175 µs = 9.4 kbps. The RXD timeout (t(RXD_DTO)) disables the driver of the transceiver once the RXD has been dominant longer than t(RXD_DTO), which releases the bus lines to recessive, preventing a local failure from locking the bus dominant. The driver may only transmit dominant again after RXD has been returned HIGH (recessive). While this protects the bus from local faults, locking the bus dominant, it limits the minimum data rate possible. The CAN protocol allows a maximum of eleven successive dominant bits (on RXD) for the worst case, where five successive dominant bits are followed immediately by an error frame. This, along with the t(RXD_DTO) minimum, limits the minimum bit rate. The minimum bit rate may be calculated by: Minimum Bit Rate = 11 / t(RXD_DTO) = 11 bits / 1380 µs = 8 kbps. Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: SN65HVD265 SN65HVD266 SN65HVD267 SN65HVD265, SN65HVD266, SN65HVD267 www.ti.com SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015 7.9 Typical Characteristics 140 120 Time (ns) 100 80 60 40 20 0 40 45 50 55 60 65 RL - Bus Load (:) 70 C024 Figure 1. Typical Loop Delay With Respect To Bus Load 8 Parameter Measurement Information VID(D) CANH VID RXD 0.9V 0.5V 0V VID CANL CL_RXD VO VOH RXD 50% 0V t RXD_DTO Figure 2. RXD Dominant Timeout Test Circuit and Measurement Figure 3. FAULT Test and Measurement Copyright © 2013–2015, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVD265 SN65HVD266 SN65HVD267 9 SN65HVD265, SN65HVD266, SN65HVD267 SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015 www.ti.com Parameter Measurement Information (continued) RCM CANH VCC 50% TXD TXD RL CL VOD 50% 0V VCM VO(CANH) tpHR tpLD CANL 90% RCM VO(CANL) 0.9 V VOD 0.5 V 10% tR tF Figure 4. Driver Test Circuit and Measurement CANH 1 .5 V RXD 0 .9 V IO V ID 0 .5 V 0V VID CL_RXD CANL t pDL t pRH VO V OH 90 % V O(RXD) 50 % 10 % V OL tF tR Figure 5. Receiver Test Circuit and Measurement CANH 0V VCC TXD RL CL S 50% CANL VI S 0V tMODE RXD VO VOH CL_RXD RXD 50% VOL Figure 6. tMODE Test Circuit and Measurement 10 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: SN65HVD265 SN65HVD266 SN65HVD267 SN65HVD265, SN65HVD266, SN65HVD267 www.ti.com SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015 Parameter Measurement Information (continued) Table 1. Receiver Differential Input Voltage Threshold Test INPUT OUTPUT VCANH VCANL |VID| -1.1V -2.0 V 900 mV L RXD 7.0 V 6.1 V 900 mV L -1.5 V -2.0 V 500 mV H 7.0 V 6.5 V 500 mV H Open Open X H VOL VOH CANH VCC TXD RL VI CL 50% TXD CANL S 0V 0V tPROP(LOOP1) RXD VO tPROP(LOOP2) VOH CL_RXD 50% RXD VOL Figure 7. TPROP(LOOP) Test Circuit and Measurement CANH VI TXD VI CL RL 70% tLOOP TXD 0V S 30% 30% CANL 0V 5 x tBIT tBIT RXD VO VOH CL_RXD 70% RXD 30% tREC VOL Note: tLOOP is equivalent to tPROP(LOOP) from CAN timing. Figure 8. Loop Delay Symmetry Test Circuit and Measurement Copyright © 2013–2015, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVD265 SN65HVD266 SN65HVD267 11 SN65HVD265, SN65HVD266, SN65HVD267 SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015 www.ti.com CANH TXD VIH TXD RL CL 0V VOD VOD(D) CANL 0.9 V VOD 0.5 V 0V tTXD_DTO Figure 9. TXD Dominant Timeout Test Circuit and Measurement CANH IOS 200 ms TXD IOS CANL VBUS VBUS VBUS 0V or 0V VBUS VBUS Figure 10. Driver Short Circuit Current Test and Measurement 12 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: SN65HVD265 SN65HVD266 SN65HVD267 SN65HVD265, SN65HVD266, SN65HVD267 www.ti.com SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015 9 Detailed Description 9.1 Overview This CAN transceiver meets the ISO1189-2 High Speed CAN (Controller Area Network) physical layer standard. It is designed for data rates in excess of 2 Mpbs (megabits per second) for CAN FD (CAN with flexible data rate), greater than 1 Mbps for CAN in short networks, and enhanced timing margin and higher data rates in long and highly-loaded networks. The device provides many protection features to enhance device and CAN-network robustness. The SN65HVD267 adds additional features, allowing easy design of redundant and multi-topology networks with fault indication for higher levels of safety in the CAN system. 9.2 Functional Block Diagram NC / VRXD / FAULT (See Note A) 5 3 FAULT LOGIC MUX (See Note A) VCC TXD S 1 VCC VCC OVER TEMPERATURE DOMINANT TIME OUT 8 7 CANH 6 CANL MODE SELECT UNDER VOLTAGE RXD 4 LOGIC OUTPUT DOMINANT TIME OUT (See Note C) BIAS UNIT VCC or VRXD (See Note B) 2 GND 9.3 Feature Description 9.3.1 TXD Dominant Timeout (DTO) During normal mode (the only mode where the CAN driver is active), the TXD DTO circuit prevents the transceiver from blocking network communication in the event of a hardware or software failure where TXD is held dominant longer than the timeout period tTXD_DTO. The DTO circuit timer starts on a falling edge on TXD. The DTO circuit disables the CAN bus driver if no rising edge is seen before the timeout period expires. This frees the bus for communication between other nodes on the network. The CAN driver is re-activated when a recessive signal is seen on TXD terminal, thus clearing the TXD DTO condition. The receiver and RXD terminal still reflect the CAN bus, and the bus terminals are biased to recessive level during a TXD dominant timeout. NOTE The minimum dominant TXD time allowed by the TXD DTO circuit limits the minimum possible transmitted data rate of the device. The CAN protocol allows a maximum of eleven successive dominant bits (on TXD) for the worst case, where five successive dominant bits are followed immediately by an error frame. This, along with the tTXD_DTO minimum, limits the minimum data rate. Calculate the minimum transmitted data rate by: Minimum Data Rate = 11 / tTXD_DTO. Copyright © 2013–2015, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVD265 SN65HVD266 SN65HVD267 13 SN65HVD265, SN65HVD266, SN65HVD267 SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015 www.ti.com Feature Description (continued) 9.3.1.1 RXD Dominant Timeout (SN65HVD267) The SN65HVD267 device has a RXD dominant timeout (RXD DTO) circuit that prevents a bus stuck dominant fault from permanently driving the RXD output dominant (low) when the bus is held dominant longer than the timeout period tRXD_DTO. The RXD DTO timer starts on a falling edge on RXD (bus going dominant). If no rising edge (bus returning recessive) is seen before the timeout constant of the circuit expires (tRXD_DTO), the RXD terminal returns high (recessive). The RXD output is re-activated to mirror the bus receiver output when a recessive signal is seen on the bus, clearing the RXD dominant timeout. The CAN bus terminals are biased to the recessive level during a RXD DTO. NOTE APPLICATION NOTE: The minimum dominant RXD time allowed by the RXD DTO limits the minimum possible received data rate of the device. The CAN protocol allows a maximum of eleven successive dominant bits for the worst case transmission, where five successive dominant bits are followed immediately by an error frame. This, along with the tRXD_DTO minimum, limits the minimum data rate. The minimum received data rate may be calculated by: Minimum Data Rate = 11 / tRXD_DTO. 9.3.1.2 Thermal Shutdown If the junction temperature of the device exceeds the thermal shut down threshold the device turns off the CAN driver circuits thus blocking the TXD to bus transmission path. The shutdown condition is cleared when the junction temperature drops below the thermal shutdown temperature of the device. NOTE During thermal shutdown the CAN bus drivers turn off; thus no transmission is possible from TXD to the bus. The CAN bus terminals are biased to recessive level during a thermal shutdown, and the receiver to RXD path remains operational. 9.3.1.3 Undervoltage Lockout The supply terminals have undervoltage detection that places the device in protected mode. This protects the bus during an undervoltage event on either the VCC or VRXD supply terminals. Table 2. Undervoltage Lockout 5-V Only Devices (SN65HVD265 and SN65HVD267) VCC DEVICE STATE BUS OUTPUT RXD GOOD Normal Per Device State and TXD Mirrors Bus BAD Protected High Impedance High Impedance (3-state) Table 3. Undervoltage Lockout 5-V and VRXD Device (SN65HVD266) VCC VRXD DEVICE STATE BUS OUTPUT GOOD BAD RXD GOOD Normal Per Device State and TXD Mirrors Bus GOOD Protected High Impedance High (Recessive) GOOD BAD Protected Recessive High Impedance (3-state) BAD BAD Protected High Impedance High Impedance (3-state) NOTE After an undervoltage condition is cleared and the supplies have returned to valid levels, the device typically resumes normal operation in 300 µs. 14 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: SN65HVD265 SN65HVD266 SN65HVD267 SN65HVD265, SN65HVD266, SN65HVD267 www.ti.com SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015 9.3.1.4 Fault Terminal (SN65HVD267) If one or more of the faults (TXD-Dominant Timeout, RXD dominant Timeout, Thermal Shutdown or Undervoltage Lockout) occurs, the FAULT terminal (open-drain) turns off, resulting in a high level when externally pulled up to VCC or IO supply. ! Figure 11. FAULT Terminal Function Diagram and Application TXD fault stuck dominant, example PCB failure or bad software TXD (driver) tTXD_DTO Fault is repaired & transmission capability restored Driver disabled freeing bus for other nodes %XV ZRXOG EH ³VWXFN GRPLQDQW´ EORFNLQJ FRPPXQLFDWLRQ IRU WKH whole network but TXD DTO prevents this and frees the bus for communication after the time tTXD_DTO. Normal CAN communication CAN Bus Signal tTXD_DTO Communication from other bus node(s) Communication from repaired node FAULT is signaled to link layer / protocol. Fault indication is removed. FAULT (HVD257) RXD (receiver) Communication from local node Communication from other bus node(s) Communication from repaired local node Figure 12. Example Timing Diagram for TXD DTO and FAULT Terminal Copyright © 2013–2015, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVD265 SN65HVD266 SN65HVD267 15 SN65HVD265, SN65HVD266, SN65HVD267 SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015 CAN BUS Normal CAN communication www.ti.com Bus Fault stuck dominant , example CANH short to supply =5V and CAN L short to GND . Fault is repaired and normal communication returns SN65HVD257 CAN PHY With RXD DTO AND FAULT CAN PHY SN65HVD255 SN65HVD256 CAN Bus Signal RXD (receiver) RXD will also be “stuck dominant” blocking alternative communication paths RXD (reciever) t RXD_DTO RXD output is returned recessive (high) and FAULT is signaled to μP and link layer / protocol. RXD mirrors bus FAULT cleared signal is given FAULT Figure 13. Example Timing Diagram for Devices With and Without RXD DTO and FAULT Terminal 9.3.1.5 Unpowered Device The device is designed to be an 'ideal passive' or 'no load' to the CAN bus if it is unpowered. The bus terminals (CANH, CANL) have extremely low leakage currents when the device is unpowered so they will not load down the bus. This is critical if some nodes of the network will be unpowered while the rest of the of network remains in operation. The logic terminals also have extremely low leakage currents when the device is unpowered to avoid loading down other circuits that may remain powered. 9.3.1.6 Floating Terminals The device has internal pull ups and pull downs on critical terminals to place the device into known states if the terminals float. The TXD terminal is pulled up to VCC to force a recessive input level if the terminal floats. The S terminal is pulled down to GND to force the device into normal mode if the terminal floats. 9.3.1.7 CAN Bus Short Circuit Current Limiting The device has several protection features that limit the short circuit current when a CAN bus line is shorted. These include driver current limiting (dominant and recessive). The device has TXD dominant state time out to prevent permanent higher short circuit current of the dominant state during a system fault. During CAN communication the bus switches between dominant and recessive states with the data and control fields bits, thus the short circuit current may be viewed either as the instantaneous current during each bus state, or as a DC average current. For system current (power supply) and power considerations in the termination resistors and common-mode choke ratings, use the average short circuit current. Determine the ratio of dominant and recessive bits by the data in the CAN frame plus the following factors of the protocol and PHY that force either recessive or dominant at certain times: • Control fields with set bits • Bit stuffing • Interframe space • TXD dominant time out (fault case limiting) These ensure a minimum recessive amount of time on the bus even if the data field contains a high percentage of dominant bits. 16 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: SN65HVD265 SN65HVD266 SN65HVD267 SN65HVD265, SN65HVD266, SN65HVD267 www.ti.com SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015 NOTE The short circuit current of the bus depends on the ratio of recessive to dominant bits and their respective short circuit currents. The average short circuit current may be calculated with the following formula: IOS(AVG) = %Transmit × [(%REC_Bits × IOS(SS)_REC) + (%DOM_Bits × IOS(SS)_DOM)] + [%Receive × IOS(SS)_REC] (1) Where: • IOS(AVG) is the average short circuit current • %Transmit is the percentage the node is transmitting CAN messages • %Receive is the percentage the node is receiving CAN messages • %REC_Bits is the percentage of recessive bits in the transmitted CAN messages • %DOM_Bits is the percentage of dominant bits in the transmitted CAN messages • IOS(SS)_REC is the recessive steady state short circuit current • IOS(SS)_DOM is the dominant steady state short circuit current NOTE Consider the short circuit current and possible fault cases of the network when sizing the power ratings of the termination resistance and other network components. 9.4 Device Functional Modes The device has two main operating modes: normal mode and silent mode. Operating mode selection is made via the S input terminal. Table 4. Operating Modes (1) S Terminal MODE DRIVER RECEIVER RXD Terminal LOW Normal Mode Enabled (ON) Enabled (ON) Mirrors Bus State (1) HIGH Silent Mode Disabled (OFF) Enabled (ON) Mirrors Bus State Mirrors bus state: low if CAN bus is dominant, high if CAN bus is recessive. 9.4.1 Can Bus States The CAN bus has two states during powered operation of the device; dominant and recessive. A dominant bus state is when the bus is driven differentially, corresponding to a logic low on the TXD and RXD terminal. A recessive bus state is when the bus is biased to VCC / 2 via the high-resistance internal input resistors RIN of the receiver, corresponding to a logic high on the TXD and RXD terminals. See Figure 14 and Figure 15. Typical Bus Voltage (V) Normal & Silent Mode 4 CANH 3 Vdiff(D) 2 Vdiff(R) CANL 1 Recessive Logic H Dominant Logic L Recessive Logic H Time, t Figure 14. Bus States (Physical Bit Representation) Copyright © 2013–2015, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVD265 SN65HVD266 SN65HVD267 17 SN65HVD265, SN65HVD266, SN65HVD267 SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015 www.ti.com CANH RXD VCC/2 CANL Figure 15. Bias Unit (Recessive Common Mode Bias) and Receiver 9.4.2 Normal Mode Select the normal mode of device operation by setting S low. The CAN driver and receiver are fully operational and CAN communication is bi-directional. The driver is translating a digital input on TXD to a differential output on CANH and CANL. The receiver is translating the differential signal from CANH and CANL to a digital output on RXD. 9.4.3 Silent Mode Activate silent mode (receive only) by setting S high. The CAN driver is turned off while the receiver remains active and RXD outputs the received bus state. NOTE Silent mode may be used to implement babbling idiot protection, to ensure that the driver does not disrupt the network during a local fault. Silent mode may also be used in redundant systems to select or de-select the redundant transceiver (driver) when needed. 9.4.4 Driver and Receiver Function Tables Table 5. Driver Function Table DEVICE All Devices INPUTS S (1) (2) (3) OUTPUTS CANH (1) CANL (1) DRIVEN BUS STATE L H L Dominant H or Open Z Z Recessive X Z Z Recessive TXD (1) L or Open H (1) (2) (3) H = high level, L = low level, X= irrelevant, Z = common mode (recessive) bias to VCC / 2. See Figure 14 and Figure 15 for bus state and common mode bias information. Devices have an internal pull down to GND on S terminal. If S terminal is open the terminal will be pulled low and the device will be in normal mode. Devices have an internal pull up to VCC on TXD terminal. If the TXD terminal is open the terminal will be pulled high and the transmitter will remain in recessive (non-driven) state. Table 6. Receiver Function Table DEVICE MODE Normal or Silent (1) (2) 18 CAN DIFFERENTIAL INPUTS VID = VCANH – VCANL BUS STATE RXD TERMINAL (1) VID ≥ 0.9 V Dominant L (2) 0.5 V < VID < 0.9 V ? ? VID ≤ 0.5 V Recessive H Open (VID ≈ 0 V) Open H H = high level, L = low level, ? = indeterminate. RXD output remains dominant (low) as long as the bus is dominant. On SN65HVD267 device with RXD dominant timeout, once the bus has been dominant longer than the dominant timeout, tRXD_DTO, the RXD terminal will return recessive (high). See RXD Dominant Timeout (SN65HVD267) for a description of behavior during receiving a bus stuck dominant condition. Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: SN65HVD265 SN65HVD266 SN65HVD267 SN65HVD265, SN65HVD266, SN65HVD267 www.ti.com SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015 9.4.5 Digital Inputs and Outputs 9.4.5.1 5-V VCC Only Devices (SN65HVD265 and SN65HVD267) The 5-V VCC device is supplied by a single 5-V rail. The digital inputs are 5 V and 3.3 V compatible. This device has a 5-V (VCC) level RXD output. TXD is internally pulled up to VCC and S is internally pulled down to GND. NOTE TXD is internally pulled up to VCC and the S terminal is internally pulled down to GND. However, the internal bias may only put the device into a known state if the terminals float. The internal bias may be inadequate for system-level biasing. TXD pullup strength and CAN bit timing require special consideration when the SN65HVD26x devices are used with an open-drain TXD output on the CAN controller. An adequate external pullup resistor must be used to ensure that the CAN controller output of the μP maintains adequate bit timing input to the SN65HVD26x. 9.4.5.2 5-V VCC with VRXD RXD Output Supply Devices (SN65HVD266) This device is a 5-V VCC CAN transceiver with a separate supply for the RXD output, VRXD. The digital inputs are 5 V and 3.3 V compatible. These devices have a VRXD-level RXD output. TXD remains weakly pulled up to VCC. NOTE On device versions with a VRXD supply that shifts the RXD output level, the input terminals of the device remain the same. TXD remains weakly pulled up to VCC internally. Thus, a small IIH current flows if the TXD input is used below VCC levels. 9.4.5.3 5-V VCC with FAULT Open-Drain Output Device (SN65HVD267) This device has a FAULT output terminal (open-drain). FAULT must be pulled up to VCC or I/O supply level via an external resistor. NOTE Because the FAULT output terminal is open-drain, it actively pulls down when there is no fault, and becomes high-impedance when a fault condition is detected. An external pullup resistor to the VCC or I/O supply of the system must be used to pull the terminal high to indicate a fault to the host microprocessor. The open-drain architecture makes the fault terminal compatible with 3.3 V and 5 V I/O-level systems. The pullup current, selected by the pullup resistance value, should be as low as possible while achieving the desired voltage level output in the system with margin against noise. Copyright © 2013–2015, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVD265 SN65HVD266 SN65HVD267 19 SN65HVD265, SN65HVD266, SN65HVD267 SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015 www.ti.com 10 Application and Implementation NOTE Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes. Customers should validate and test their design implementation to confirm system functionality. 10.1 Application Information These CAN transceivers are typically used in applications with a host microprocessor or FPGA that includes the link layer portion of the CAN protocol. Below are typical application configurations for both 5 V and 3.3 V microprocessor applications. The bus termination is shown for illustrative purposes. 10.2 Typical Application VIN VIN VOUT 5-V Voltage Regulator VCC VCC (e.g. TPSxxxx) 3 Port x S 7 CANH 8 SN65HVD265 5-V MCU CAN Transceiver RXD TXD RXD TXD 4 1 5 6 2 NC CANL GND Optional: Terminating Node Typical CAN Transceiver Application Using 5V IO Connections Optional: Filtering, Transient and ESD VIN VIN VOUT 5-V Voltage Regulator VCC VCC (e.g. TPSxxxx) 3 Port x S CANH 8 SN65HVD266 3-V MCU VIN 7 CAN Transceiver VOUT RXD 3-V Voltage Regulator TXD RXD TXD 4 1 5 VRXD (e.g. TPSxxxx) 6 2 GND CANL Optional: Terminating Node Optional: Filtering, Transient and ESD Typical CAN Transceiver Application Using 3.3V IO Connections Figure 16. Typical 5-V Application 20 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: SN65HVD265 SN65HVD266 SN65HVD267 SN65HVD265, SN65HVD266, SN65HVD267 www.ti.com SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015 Typical Application (continued) 10.2.1 Design Requirements 10.2.1.1 Bus Loading, Length and Number of Nodes The ISO11898 Standard specifies a maximum bus length of 40m and maximum stub length of 0.3m. However, with careful design, users can have longer cables, longer stub lengths, and many more nodes to a bus. A large number of nodes requires a transceiver with high input impedance such as the SN65HVD26x family. Many CAN organizations and standards have scaled the use of CAN for applications outside the original ISO11898. They have made system level trade offs for data rate, cable length, and parasitic loading of the bus. Examples of some of these specifications are ARINC825, CANopen, DeviceNet and NMEA2000. A CAN network design is a series of tradeoffs, but these devices operate over wide common-mode range. In ISO11898-2 the driver differential output is specified with a 60Ω load (the two 120Ω termination resistors in parallel) and the differential output must be greater than 1.5V. The SN65HVD26x family is specified to meet the 1.5V requirement with a 45Ω load incorporating the worst case including parallel transceivers. The differential input resistance of the SN65HVD26x is a minimum of 30KΩ. If 167 SN65HVD26x family transceivers are in parallel on a bus, this is equivalent to a 180Ω differential load worst case. That transceiver load of 180Ω in parallel with the 60Ω gives a total 45Ω. Therefore, the SN65HVD26x family theoretically supports over 167 transceivers on a single bus segment with margin to the 1.2V minimum differential input at each node. However for CAN network design margin must be given for signal loss across the system and cabling, parasitic loadings, network imbalances, ground offsets and signal integrity thus a practical maximum number of nodes is typically much lower. Bus length may also be extended beyond the original ISO11898 standard of 40m by careful system design and datarate tradeoffs. For example CANopen network design guidelines allow the network to be up to 1km with changes in the termination resistance, cabling, less than 64 nodes and significantly lowered data rate. This flexibility in CAN network design is one of the key strengths of the various extensions and additional standards that have been built on the original ISO11898 CAN standard. In using this flexibility comes the responsibility of good network design and balancing these tradeoffs. 10.2.2 Detailed Design Procedures 10.2.2.1 CAN Termination The ISO11898 standard specifies the interconnect to be a twisted pair cable (shielded or unshielded) with 120 Ω characteristic impedance (ZO). Resistors equal to the characteristic impedance of the line should be used to terminate both ends of the cable to prevent signal reflections. Unterminated drop lines (stubs) connecting nodes to the bus should be kept as short as possible to minimize signal reflections. The termination may be on the cable or in a node, but if nodes may be removed from the bus the termination must be carefully placed so that it is not removed from the bus. Node 1 Node 2 Node 3 MCU or DSP MCU or DSP MCU or DSP CAN Controller CAN Controller CAN Controller CAN Transceiver CAN Transceiver CAN Transceiver Node n (with termination) MCU or DSP CAN Controller CAN Transceiver RTERM RTERM Figure 17. Typical CAN Bus Copyright © 2013–2015, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVD265 SN65HVD266 SN65HVD267 21 SN65HVD265, SN65HVD266, SN65HVD267 SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015 www.ti.com Typical Application (continued) Termination may be a single 120 Ω resistor at the end of the bus, either on the cable or in a terminating node. If filtering and stabilization of the common mode voltage of the bus is desired, then split termination may be used. (See Figure 18). Split termination improves the electromagnetic emissions behavior of the network by eliminating fluctuations in the bus common-mode voltages at the start and end of message transmissions. Standard Termination CANH Split Termination CANH RTERM/2 CAN CAN Transceiver RTERM Transceiver CSPLIT RTERM/2 CANL CANL Figure 18. CAN Bus Termination Concepts 10.2.2.2 Functional Safety Using the SN65HVD267 in a Redundant Physical Layer CAN Network Topology CAN is a standard linear bus topology using 120 Ω twisted pair cabling. The SN65HVD267 CAN device includes several features to use the CAN physical layer in nonstandard topologies with only one CAN link layer controller (μP) interface. This allows much greater flexibility in the physical topology of the bus while reducing the digital controller and software costs. The combination of RXD DTO and the FAULT output allows great flexibility, control and monitoring of these applications. A simple example of this flexibility is to use two SN65HVD267 devices in parallel with an AND gate to achieve redundancy (parallel) of the physical layer (cabling and PHYs) in a CAN network. For the CAN bit-wise arbitration to work, the RXD outputs of the transceivers must connect via AND gate logic so that a dominant bit (low) from any of the branches is received by the link layer logic (μP), and appears to the link layer and above as a single physical network. The RXD DTO feature prevents a bus stuck dominant fault in a single branch from taking down the entire network by forcing the RXD terminal for the transceivers on the branch with the fault back to the recessive after the tRXD_DTO time. The remaining branch of the network continues to function. The FAULT terminal of the transceivers on the branch with the fault indicates this via the FAULT output to their host processors, which diagnose the failure condition. Adding a logic XOR with a filter adds automatic detection for a fault where one of the 2 networks goes open (recessive) in addition to the faults detected by the SN65HVD267. The S terminal (silent mode terminal) may be used to put a branch in silent mode to check each branch for other faults. Thus it is possible to implement a robust and redundant CAN network topology in a simple and low cost manner. These concepts can be expanded into more complicated and flexible CAN network topologies to solve various system level challenges with a networked infrastructure. 22 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: SN65HVD265 SN65HVD266 SN65HVD267 SN65HVD265, SN65HVD266, SN65HVD267 www.ti.com SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015 Typical Application (continued) P SN65HVD267 2Z ~ ~ ~~ SN65HVD267 1Z RXD1 RXD2 SN65HVD267 2n RXD TXD S2 FLT2 FLT3 S1 RXD1 RXD2 SN65HVD267 1n FLT1 RXD TXD S2 RXD1 RXD2 SN65HVD267 2n FLT2 FLT3 S1 FLT1 RXD TXD S2 FLT2 FLT3 SN65HVD267 1n SN65HVD267 2A Bus 2 S1 RXD1 RXD2 Bus 1 FLT1 RXD TXD S2 FLT2 FLT3 S1 FLT1 SN65HVD267 1A P P P A. CAN nodes with termination are PHY 1A, PHY 2A, PHY 1Z and PHY 2Z. B. RXD DTO prevents a single branch-stuck-dominant condition from blocking the redundant branch via the AND logic on RXD. The transceivers signal a received bus stuck dominant fault via the FAULT terminal. The system detects which branch is stuck dominant, and issues a system warning. Other network faults on a single branch that appear as recessive (not blocking the redundant network) may be detected through a logic XOR with a filter and diagnostic routines, and using the Silent Mode of the PHYs to use only one branch at a time for transmission during diagnostic mode. This combination allows robust fault detection and recovery within single branches so that they may be repaired and again provide redundancy of the physical layer. Figure 19. Typical Redundant Physical Layer Topology Using the SN65HVD267 10.2.3 Application Curve Figure 20. Typical CAN Transceiver Operation Using 3.3V IO Connections Copyright © 2013–2015, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVD265 SN65HVD266 SN65HVD267 23 SN65HVD265, SN65HVD266, SN65HVD267 SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015 www.ti.com 11 Power Supply Recommendations These devices are designed to operate from main VCC input voltage supply range between 4.5 V and 5.5 V. Some devices have an output level shifting supply input, VRXD, designed for a range between 2.8 V and 5.5 V. Both supply inputs must be well regulated. A bulk capacitance, typically 4.7 μF, should be placed near the CAN transceiver's main VCC supply terminal in addition to bypass capacitors. A bulk capacitance, typically 1 μF, should be placed near the CAN transceiver's VRXD supply terminal in addition to bypass capacitors. 12 Layout 12.1 Layout Guidelines For the PCB design to be successful, start with design of the protection and filtering circuitry. Because ESD and EFT transients have a wide frequency bandwidth from approximately 3 MHz to 3 GHz, high frequency layout techniques must be applied during PCB design. On chip IEC ESD protection is good for laboratory and portable equipment but is usually not sufficient for EFT and surge transients occurring in industrial environments. Therefore, robust and reliable bus node design requires the use of external transient protection devices at the bus connectors. Placement at the connector also prevents these noisy events from propagating further into the PCB and system. • Place the protection and filtering circuitry as close to the bus connector, J1, to prevent transients, ESD and noise from penetrating onto the board. In this layout example for protection a Transient Voltage Suppression (TVS) device, D1, has been used. The production solution can be either bi-directional TVS diode or varistor with ratings matching the application requirements. This example also shows optional bus filter capacitors C8 and C9. • Design the bus protection components in the direction of the signal path. Do not force the transient current to divert from the signal path to reach the protection device. • Use supply (VCC) and ground planes to provide low inductance. Note: high frequency current follows the path of least inductance and not the path of least impedance. • Use at least two vias for supply (VCC) and ground connections of bypass capacitors and protection devices to minimize trace and via inductance. • Bypass and bulk capacitors should be placed as close as possible to the supply terminals of transceiver, examples C2, C3 (VCC) and for the dual supply devices additionally C5 and C6 (VRXD). • Bus termination: this layout example shows split termination. This is where the termination is split into two resistors, R7 and R8, with the center or split tap of the termination connected to ground via capacitor C7. Split termination provides common mode filtering for the bus. When bus termination is placed on the board instead of directly on the bus, additional care must be taken to ensure the terminating node is not removed from the bus thus also removing the termination. See the application section for information on power ratings needed for the termination resistor(s). • To limit current of digital lines serial resistors may be used. Examples are R2, R3, R4 and R5. • To filter noise on the digital IO lines a capacitor may be used close to the input side of the IO as shown by C1 and C4. • Terminal 5: This example is showing a flexible layout covering all three of the devices in this CAN transceiver family on terminal 5. SN65HVD265: this terminal is a no connect so external connections are un-important and the components R4, R5, C5 and C6 do not matter. SN65HVD266: this terminal is the RXD output supply terminal, VRXD. The bypass and bulk capacitor pads of C5 and C6 should be populated and R5 and R6 are not used. SN65HVD267: this terminal is the FAULT output (open drain). The pull resistor R6 is needed. R5 is shown if current limiting is desired to the host processor. If noise filtering is desired C5 should be used. • 1k to 10kΩ pull-up or down resistors should be used where required to limit noise during transient events. • Terminal 1: R1 is shown optionally for the TXD input of the device. If an option drain host processor is used this is mandatory to ensure the bit timing into the device is met. • Terminal 8: is shown assuming the mode terminal, S, will be used. If the device will only be used in normal mode R3 is not needed and the pads of C4 could be used for the pull down resistor to GND. 24 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: SN65HVD265 SN65HVD266 SN65HVD267 SN65HVD265, SN65HVD266, SN65HVD267 www.ti.com SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015 12.2 Layout Example VCC or VRXD C8 R7 GND C6 C5 R3 C9 R8 J1 C7 GND D1 C3 C2 U1 U1 VCC RXD GND C1 R2 TXD C4 R1 R4 S GND VRXD GND R5 R6 FAULT VCC or VRXD Figure 21. Layout Example Copyright © 2013–2015, Texas Instruments Incorporated Submit Documentation Feedback Product Folder Links: SN65HVD265 SN65HVD266 SN65HVD267 25 SN65HVD265, SN65HVD266, SN65HVD267 SLLSEI3A – SEPTEMBER 2013 – REVISED NOVEMBER 2015 www.ti.com 13 Device and Documentation Support 13.1 Related Links The table below lists quick access links. Categories include technical documents, support and community resources, tools and software, and quick access to sample or buy. Table 7. Related Links PARTS PRODUCT FOLDER SAMPLE & BUY TECHNICAL DOCUMENTS TOOLS & SOFTWARE SUPPORT & COMMUNITY SN65HVD265 Click here Click here Click here Click here Click here SN65HVD266 Click here Click here Click here Click here Click here SN65HVD267 Click here Click here Click here Click here Click here 13.2 Community Resources The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers. Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support. 13.3 Trademarks E2E is a trademark of Texas Instruments. All other trademarks are the property of their respective owners. 13.4 Electrostatic Discharge Caution These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. 13.5 Glossary SLYZ022 — TI Glossary. This glossary lists and explains terms, acronyms, and definitions. 14 Mechanical, Packaging, and Orderable Information The following pages include mechanical packaging and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation. 26 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated Product Folder Links: SN65HVD265 SN65HVD266 SN65HVD267 PACKAGE OPTION ADDENDUM www.ti.com 10-Dec-2020 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan (2) Lead finish/ Ball material MSL Peak Temp Op Temp (°C) Device Marking (3) (4/5) (6) SN65HVD265D ACTIVE SOIC D 8 75 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 125 HVD265 SN65HVD265DR ACTIVE SOIC D 8 2500 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 125 HVD265 SN65HVD266D ACTIVE SOIC D 8 75 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 125 HVD266 SN65HVD266DR ACTIVE SOIC D 8 2500 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 125 HVD266 SN65HVD267D ACTIVE SOIC D 8 75 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 125 HVD267 SN65HVD267DR ACTIVE SOIC D 8 2500 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 125 HVD267 (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
SN65HVD267D 价格&库存

很抱歉,暂时无法提供与“SN65HVD267D”相匹配的价格&库存,您可以联系我们找货

免费人工找货