SN65LV1023A-EP
SN65LV1224B-EP
www.ti.com
SGLS358 – SEPTEMBER 2006
10-MHz To 66-MHz, 10:1 LVDS SERIALIZER/DESERIALIZER
•
FEATURES
•
•
•
•
•
(1)
Controlled Baseline
– One Assembly/Test Site, One Fabrication
Site
Extended Temperature Performance of –55°C
to 125°C
Enhanced Diminishing Manufacturing
Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree (1)
Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
performance and environmental limits.
•
•
•
•
•
•
•
•
100-Mbps to 660-Mbps Serial LVDS Data
Payload Bandwidth at 10-MHz to 66-MHz
System Clock
Pin-Compatible Superset of
DS92LV1023/DS92LV1224
Chipset (Serializer/Deserializer) Power
Consumption 6
cycles, another 1026 SYNC pattern transmission initiates.
13
TCLK_R/F
14
TCLK
LVTTL-level reference clock input. The SN65LV1023A accepts a 10-MHz to
66-MHz clock. TCLK strobes parallel data into the input latch and provides a
reference frequency to the PLL.
1, 12, 13
AGND
Analog circuit ground (PLL and analog circuits)
4, 11
AVCC
Analog circuit power supply (PLL and analog circuits)
14, 20, 22
DGND
Digital circuit ground
21, 23
DVCC
Digital circuit power supply
10
LOCK
LVTTL level output. LOCK goes low when the deserializer PLL locks onto the
embedded clock edge.
Digital circuit ground
Parallel LVTTL data inputs
LVTTL logic input. Low selects a TCLK falling-edge data strobe; high selects a
TCLK rising-edge data strobe.
DESERIALIZER
LVTTL logic input. Asserting this pin low turns off the PLL and places outputs into a
high-impedance state, putting the device into a low-power mode. To initiate power
down, this pin is held low for a minimum of 16 ns. As long as PWRDN is held low,
the device is in the power down state.
7
PWRDN
2
RCLK_R/F
9
RCLK
3
REFCLK
LVTTL logic input. Use this pin to supply a REFCLK signal for the internal PLL
frequency.
8
REN
LVTTL logic input. Low places ROUT0–ROUT9 and RCLK in the high-impedance
state.
5
RI+
Serial data input. Noninverting LVDS differential input
6
RI–
Serial data input. Inverting LVDS differential input
28–24, 19–15
ROUT0–ROUT9
LVTTL logic input. Low selects an RCLK falling-edge data strobe; high selects an
RCLK rising-edge data strobe.
LVTTL level output recovered clock. Use RCLK to strobe ROUTx.
Parallel LVTTL data outputs
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SN65LV1224B-EP
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SGLS358 – SEPTEMBER 2006
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted) (1)
UNIT
VCC to GND
–0.3 V to 4 V
LVTTL input voltage
–0.3 V to (VCC + 0.3 V)
LVTTL output voltage
–0.3 V to (VCC + 0.3 V)
LVDS receiver input voltage
–0.3 V to 3.9 V
LVDS driver output voltage
–0.3 V to 3.9 V
LVDS output short circuit duration
Electrostatic discharge:
10 ms
HBM
up to 6 kV
MM
up to 200 V
Junction temperature
150°C
Storage temperature (2)
–65°C to 150°C
Lead temperature (soldering, 4 seconds)
260°C
DB package maximum package
power dissipation
1.27 W
TA = 25°C
DB package derating
(1)
(2)
10.8 mW/°C above 25°C
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
Long term high temperature storage and/or extended use at maximum operating conditions may result in a reduction of overall device
life. See http://www.ti.com/ep_quality for additional information on enhanced plastic packaging.
RECOMMENDED OPERATING CONDITIONS
over operating free-air temperature range (unless otherwise noted)
VCC (1)
MIN
NOM
MAX
3
3.3
3.6
V
0
2.4
V
ID
2
ǒ Ǔ
V
Supply voltage
Receiver input voltage range
VCM
Receiver input common mode range
V
V
2.4 *
Supply noise voltage
TA
(1)
8
Operating free-air temperature
–55
25
ID
2
UNIT
100
mVp-p
125
°C
By design, DVCC and AVCC are separated internally and does not matter what the difference is for |DVCC–AVCC|, as long as both are
within 3 V to 3.6 V.
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SN65LV1224B-EP
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SGLS358 – SEPTEMBER 2006
ELECTRICAL CHARACTERISTICS
over recommended operating supply and temperature ranges (unless otherwise specified)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VCC
V
0.8
V
SERIALIZER LVCMOS/LVTTL DC SPECIFICATIONS (1)
VIH
High-level input voltage
VIL
Low-level input voltage
VCL
Input clamp voltage
IIN
Input current,
(2)
2
GND
ICL = –18 mA
VIN = 0 V or 3.6 V
–200
-0.86
–1.5
V
±100
200
µA
DESERIALIZER LVCMOS/LVTTL DC SPECIFICATIONS (3)
VIH
High-level input voltage
2
VCC
V
VIL
Low-level input voltage
GND
0.8
V
VCL
Input clamp voltage
ICL = –18 mA
IIN
Input current (pull-up and
pull-down resistors on inputs)
VIN = 0 V or 3.6 V
VOH
High-level output voltage
IOH = –5 mA
VOL
Low-level output voltage
IOL = 5 mA
IOS
Output short-circuit current
VOUT = 0 V
IOZ
High-impedance output current
PWRDN or REN = 0.8 V, VOUT = 0 V or VCC
–0.62
–200
–1.5
V
200
µA
VCC
V
2.2
3
GND
0.25
0.5
V
–47
–85
mA
–10
±1
10
µA
350
450
SERIALIZER LVDS DC SPECIFICATIONS (Apply to Pins DO+ and DO–)
RL = 27 Ω, See Figure 20
VOD
Output differential voltage
(DO+)–(DO–)
∆VOD
Output differential voltage
unbalance
VOS
Offset voltage
∆VOS
Offset voltage unbalance
IOS
Output short circuit current
D0 = 0 V, DINx = high,
PWRDN and DEN = 2.4 V
IOZ
High-impedance output current
PWRDN or DEN = 0.8 V,
DO = 0 V or VCC
IOX
Power-off output current
VCC = 0 V, DO = 0 V or 3.6 V
CO
Output single-ended capacitance
mV
35
1.1
mV
1.2
1.3
V
4.8
35
mV
–10
–90
mA
–10
±1
10
µA
–20
±1
25
µA
1
pF
DESERIALIZER LVDS DC SPECIFICATIONS (Apply to Pins RI+ and RI–)
VTH
Differential threshold high voltage
VTL
Differential threshold low voltage
IIN
Input current
CI
Input single-ended capacitance
VCM = 1.1 V
50
–50
mV
mV
VIN = 2.4 V, VCC = 3.6 V or 0 V
–10
±1
15
VIN = 0 V, VCC = 3.6 V or 0 V
–10
±0.05
10
0.5
µA
pF
SERIALIZER SUPPLY CURRENT (Applies to Pins DVCC and AVCC)
ICCD
Serializer supply current worst
case
RL = 27 Ω, See Figure 5
ICCXD
Serializer supply current
PWRDN = 0.8 V
f = 10 MHz
20
25
f = 66 MHz
55
70
200
500
f = 10 MHz
15
35
f = 66 MHz
80
95
0.36
1
mA
µA
DESERIALIZER SUPPLY CURRENT (applies to pins DVCC and AVCC)
ICCR
Deserializer supply current, worst
case
ICCXR
Deserializer supply current, power
down
(1)
(2)
(3)
CL = 15 pF, See Figure 5
PWRDN = 0.8 V, REN = 0.8 V
mA
mA
Apply to DIN0–DIN9, TCLK, PWRDN, TCLK_R/F, SYNC1, SYNC2, and DEN
High IIN values are due to pullup and pulldown resistors on the inputs.
Apply to pins PWRDN, RCLK_R/F, REN, and REFCLK = inputs; apply to pins ROUTx, RCLK, and LOCK = outputs (see Deserializer truth
table)
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SN65LV1224B-EP
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SGLS358 – SEPTEMBER 2006
SERIALIZER TIMING REQUIREMENTS FOR TCLK
over recommended operating supply and temperature ranges (unless otherwise specified)
PARAMETER
MIN
TYP
MAX
UNIT
15.15
T
100
ns
Transmit clock high time
0.4T
0.5T
0.6T
ns
tTCIL
Transmit clock low time
0.4T
0.5T
0.6T
ns
tt(CLK)
TCLK input transition time
3
6
tJIT
TCLK input jitter
tTCP
Transmit clock period
tTCIH
TEST CONDITIONS
See Figure 19
Frequency tolerance
–100
ns
150
ps (RMS)
+100
ppm
MAX
UNIT
SERIALIZER SWITCHING CHARACTERISTICS
over recommended operating supply and temperature ranges (unless otherwise specified)
PARAMETER
TEST CONDITIONS
MIN
RL = 27 Ω, CL = 10 pF to GND, See
Figure 6
TYP
tTLH(L)
LVDS low-to-high transition time
tLTHL(L)
LVDS high-to-low transition time
tsu(DI)
DIN0–DIN9 setup to TCLK
tsu(DI)
DIN0–DIN9 hold from TCLK
td(HZ)
DO± high-to-high impedance state
delay
td(LZ)
DO± low-to-high impedance state
delay
td(ZH)
DO± high-to-high impedance
state-to-high delay
5
td(ZL)
DO± high-to-high impedance
state-to-low delay
6.5
tw(SPW)
SYNC pulse duration
t(PLD)
Serializer PLL lock time
td(S)
Serializer delay
RL = 27 Ω, See Figure 13
tDJIT
Deterministic jitter
RL = 27 Ω, CL = 10 pF to GND
RL = 27 Ω, CL = 10 pF to GND, See
Figure 9
0.2
ns
0.25
ns
0.5
ns
4
RL = 27 Ω, CL = 10 pF to GND, See
Figure 10
ns
2.5
2.5
RL = 27 Ω, See Figure 12
ns
6×tTCP
ns
1026×tTCP
tTCP
ns
tTCP+2
tTCP+3
230
ps
150
tRJIT
Random jitter
RL = 2.7 Ω, CL = 10 pF to GND
ns
10
ps (RMS)
DESERIALIZER TIMING REQUIREMENTS FOR REFCLK
over recommended operating supply and temperature ranges (unless otherwise specified)
PARAMETER
tRFCP
REFCLK period
tRFDC
REFCLK duty cycle
tt(RF)
REFCLK transition time
TEST CONDITIONS
TYP
MAX
UNIT
T
100
ns
30%
50%
70%
3
Frequency tolerance
10
MIN
15.15
–100
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+100
ns
ppm
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SN65LV1224B-EP
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SGLS358 – SEPTEMBER 2006
DESERIALIZER SWITCHING CHARACTERISTICS
over recommended operating supply and temperature ranges (unless otherwise specified)
PARAMETER
t(RCP)
Receiver out clock period
tTLH(C))
CMOS/TTL low-to-high
transition time
tTHL(C))
CMOS/TTL high-to-low
transition time
td(D) (1)
Deserializer delay, See
Figure 14
t(ROS)
TEST
CONDITIONS
t(RCP) = t(TCP), See
Figure 13
CL = 15 pF, CL =
15 pF, See
Figure 7
PIN/FREQ
RCLK
MIN
TYP
15.15
ROUT0–ROUT9
,
LOCK, RCLK
MAX
UNIT
100
ns
1.2
ns
1.1
Room temperature, 10 MHz
3.3 V
1.75×t(RCP)
+4.2
1.75×t(RCP)
+12.6
66 MHz
1.75×t(RCP)
+7.4
1.75×t(RCP)
+9.7
ROUTx data valid before RCLK
See Figure 15
RCLK 10 MHz
0.4×t(RCP)
0.5×t(RCP)
RCLK 66 MHz
0.4×t(RCP)
0.5×t(RCP)
10 MHz
–0.4×t(RCP)
–0.5×t(RCP)
66 MHz
–0.4×t(RCP)
–0.5×t(RCP)
40%
50%
ns
ns
ns
t(ROH)
ROUTx data valid after RCLK
t(RDC)
RCLK duty cycle
td(HZ)
High-to-high impedance state
delay
6.5
ns
td(LZ)
Low-to-high impedance state
delay
4.7
ns
td(HR)
High-impedance state to high
delay
5.3
ns
td(ZL)
High-impedance state to low
delay
4.7
ns
t(DSR1)
Deserializer PLL lock time from
PWRDN (with SYNCPAT)
t(DSR2)
Deserializer PLL lock time from
SYNCPAT
td(ZHLK)
High-impedance state to high
delay (power up)
tRNM
Deserializer noise margin
(1)
(2)
(3)
See Figure 16
See Figure 17,
Figure 18,
and (2)
ROUT0–ROUT9
10 MHz
850 × tRFCP
66 MHz
850 × tRFCP
10 MHz
2
66 MHz
0.303
LOCK
See Figure 19 and
(3)
60%
3
10 MHz
3680
66 MHz
540
ns
µs
ns
ps
The deserializer delay time for all frequencies does not exceed two serial bit times.
t(DSR1) represents the time required for the deserializer to register that a lock has occurred upon powerup or when leaving the
powerdown mode. t(DSR2) represents the time required to register that a lock has occurred for the powered up and enabled deserializer
when the input (RI±) conditions change from not receiving data to receiving synchronization patterns (SYNCPATs). In order to specify
deserializer PLL performance, tDSR1 and tDSR2 are specified with REFCLK active and stable and specific conditions of SYNCPATs.
tRNM represents the phase noise or jitter that the deserializer can withstand in the incoming data stream before bit errors occur.
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TIMING DIAGRAMS AND TEST CIRCUITS
TCLK
ODD DIN
EVEN DIN
Figure 3. Worst-Case Serializer ICC Test Pattern
SUPPLY CURRENT
vs
TCLK FREQUENCY
60
66 mA, 48.880 MHz
ICC − Supply Current − mA
50
40
ICC
30
20
10 mA, 14.732 MHz
10
0
0
20
40
TCLK Frequency − MHz
Figure 4.
12
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60
80
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TIMING DIAGRAMS AND TEST CIRCUITS (continued)
RCLK
ODD ROUT
EVEN ROUT
Figure 5. Worst-Case Deserializer ICC Test Pattern
10 pF
tTLH(L)
DO+
tTHL(L)
RL
80%
Vdiff
80%
20%
20%
DO−
10 pF
Vdiff = (DO+) − (DO−)
Figure 6. Serializer LVDS Output Load and Transition Times
CMOS/TTL Output
Deserializer
tTHL(C)
tTLH(C)
80%
15 pF
80%
20%
20%
Figure 7. Deserializer CMOS/TTL Output Load and Transition Times
tt(CLK)
TCLK
tt(CLK)
90%
10%
90%
10%
3V
0V
Figure 8. Serializer Input Clock Transition Time
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TIMING DIAGRAMS AND TEST CIRCUITS (continued)
tTCP
1.5 V
TCLK
1.5 V
For TCLK_R/F = Low
1.5 V
th(DI)
tsu(DI)
DIN [9:0]
1.5 V
Setup
Hold
1.5 V
Figure 9. Serializer Setup/Hold Times
Parasitic Package and
Trace Capacitance
3V
DEN
1.5 V
1.5 V
0V
td(ZH)
td(HZ)
VOH
13.5 Ω
DO+
50%
1.1 V
DO−
DO±
50%
1.1 V
td(ZL)
td(LZ)
13.5 Ω
DEN
1.1 V
50%
50%
VOL
Figure 10. Serializer High-Impedance State Test Circuit and Timing
PWRDN
2V
0.8 V
1026 Cycles
td(HZ) or td(LZ)
TCLK
td(ZH) or td(ZL)
tPLD
DO±
3-State
Output Active
Figure 11. Serializer PLL Lock Time and PWRDN High-Impedance State Delays
14
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TIMING DIAGRAMS AND TEST CIRCUITS (continued)
REN
PWRDN
TCLK
tw(SP)
SYNC1
or
SYNC2
DO±
DATA
SYNC Pattern
TCLK
SYNC1
or
SYNC2
tw(SP) Min. Timing Met
DO±
SYNC Pattern
DATA
Figure 12. SYNC Timing Delays
DIN
DIN0 − DIN9 SYMBOL N
DIN0 − DIN9 SYMBOL N+1
td(S)
TCLK
Timing for TCLK_R/F = High
Start
D00 − D09 SYMBOL N−1
Bit
Stop Start
Bit Bit
D00 − D09 SYMBOL N
Stop
Bit
DO
Figure 13. Serializer Delay
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TIMING DIAGRAMS AND TEST CIRCUITS (continued)
Start
Bit
D00 − D09 SYMBOL N
Stop Start
Bit Bit
D00 − D09 SYMBOL N+1
Stop Start
Bit Bit
D00 − D09 SYMBOL N+2
Stop
Bit
RI
1.2 V
1V
tDD
RCLK
Timing for TCLK_R/F = High
ROUT
ROUT0 − ROUT9 SYMBOL N−1
ROUT0 − ROUT9 SYMBOL N+1
ROUT0 − ROUT9 SYMBOL N
Figure 14. Deserializer Delay
tLow
tHigh
RCLK
RCLK_R/F = Low
tHigh
tLow
RCLK
RCLK_R/F = High
tROH
tROS
ROUT [9:0]
1.5 V
Data Valid
Before RCLK
Data Valid
After RCLK
1.5 V
Figure 15. Deserializer Data Valid Out Times
7 V x (LZ/ZL), Open (HZ/ZH)
VOH
REN
500 Ω
450 Ω
1.5 V
1.5 V
VOL
Scope
td(LZ)
VOL + 0.5 V
50 Ω
td(ZL)
VOL + 0.5 V
VOL
ROUT[9:0]
td(HZ)
td(ZH)
VOH
VOH − 0.5 V
Figure 16. Deserializer High-Impedance State Test Circuit and Timing
16
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VOH − 0.5 V
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SN65LV1224B-EP
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TIMING DIAGRAMS AND TEST CIRCUITS (continued)
PWRDN
2V
0.8 V
REFCLK
1.5 V
t(DSR1)
DATA
RI±
Not Important
td(ZHL)
LOCK
SYNC Patterns
3-State
3-State
td(HZ) or td(LZ)
td(ZH) or td(ZL)
ROUT[9:0]
3-State
3-State
SYNC Symbol or DIN[9:0]
RCLK
3-State
3-State
RCLK_R/F = Low
REN
Figure 17. Deserializer PLL Lock Times and PWRDN 3-State Delays
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TIMING DIAGRAMS AND TEST CIRCUITS (continued)
3.6 V
3V
VCC
0V
PWRDN
0.8 V
REFCLK
t(DSR2)
DATA
1.2 V
RI±
Not Important
1V
SYNC Patterns
LOCK
3-State
td(ZH) or td(ZL)
ROUT[9:0]
td(HZ) or td(LZ)
3-State
3-State
SYNC Symbol or DIN[9:0]
RCLK
3-State
3-State
REN
Figure 18. Deserializer PLL Lock Time From SyncPAT
1.2 V
VTH
RI±
VTL
1V
tDJIT
tDJIT
tRNM
tRNM
tSW
Ideal Sampling Position
tSW: Setup and Hold Time (Internal Data Sampling Window)
tDJIT: Serializer Output Bit Position Jitter That Results From Jitter on TCLK
tRNM: Receiver Noise Margin Time
Figure 19. Receiver LVDS Input Skew Margin
18
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TIMING DIAGRAMS AND TEST CIRCUITS (continued)
DO+
RL
10
DIN
Parallel-to-Serial
DO−
> TCLK
VOD = (DO+) − (DO−)
Differential Output Signal Is Shown as (DO+) − (DO−)
Figure 20. VOD Diagram
DEVICE STARTUP PROCEDURE
It is recommended that the PWRDNB pin on both the SN65LV1023A and the SN65LV1224B device be held to a
logic LOW level until after the power supplies have powered up to at least 3 V as shown in Figure 21.
3.0 V
VDD
PWRDNB
Figure 21. Device Startup
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APPLICATION INFORMATION
DIFFERENTIAL TRACES AND TERMINATION
The performance of the SN65LV1023A/SN65LV1224B is affected by the characteristics of the transmission
medium. Use controlled-impedance media and termination at the receiving end of the transmission line with the
media’s characteristics impedance.
Use balanced cables such as twisted pair or differential traces that are ran close together. A balanced cable
picks up noise together and appears to the receiver as common mode. Differential receivers reject
common-mode noise. Keep cables or traces matched in length to help reduce skew.
Running the differential traces close together helps cancel the external magnetic field, as well as maintain a
constant impedance. Avoiding sharp turns and reducing the number of vias also helps.
TOPOLOGIES
There are several topologies that the serializers can operate. Three common examples are shown below.
Figure 22 shows an example of a single-terminated point-to-point connection. Here a single termination resistor
is located at the deserializer end. The resistor value should match that of the characteristic impedance of the
cable or PC board traces. The total load seen by the serializer is 100 Ω. Double termination can be used and
typically reduces reflections compared with single termination. However, it also reduces the differential output
voltage swing.
AC-coupling is only recommended if the parallel TX data stream is encoded to achieve a dc-balanced data
stream. Otherwise the ac-capacitors can induce common mode voltage drift due to the dc-unbalanced data
stream.
Serialized Data
100 Ω
Parallel Data In
Parallel Data Out
Figure 22. Single-Terminated Point-to-Point Connection
Figure 23 shows an example of a multidrop configuration. Here there is one transmitter broadcasting data to
multiple receivers. A 50-kΩ resistor at the far end terminates the bus.
ASIC
ASIC
ASIC
ASIC
50 Ω
Figure 23. Multidrop Configuration
Figure 24 shows an example of multiple serializers and deserializers on the same differential bus, such as in a
backplane. This is a multipoint configuration. In this situation, the characteristic impedance of the bus can be
significantly less due to loading. Termination resistors that match the loaded characteristic impedance are
required at each end of the bus. The total load seen by the serializer in this example is 27 Ω.
20
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APPLICATION INFORMATION (continued)
ASIC
ASIC
ASIC
54 Ω
ASIC
54 Ω
Figure 24. Multiple Serializers and Deserializers on the Same Differential Bus
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PACKAGE MATERIALS INFORMATION
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TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
SN65LV1224BMDBREP
Package Package Pins
Type Drawing
SSOP
DB
28
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
2000
330.0
16.4
Pack Materials-Page 1
8.1
B0
(mm)
K0
(mm)
P1
(mm)
W
Pin1
(mm) Quadrant
10.4
2.5
12.0
16.0
Q1
PACKAGE MATERIALS INFORMATION
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14-Aug-2019
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
SN65LV1224BMDBREP
SSOP
DB
28
2000
350.0
350.0
43.0
Pack Materials-Page 2
PACKAGE OUTLINE
DB0028A
SSOP - 2 mm max height
SCALE 1.500
SMALL OUTLINE PACKAGE
C
8.2
TYP
7.4
A
0.1 C
PIN 1 INDEX AREA
SEATING
PLANE
26X 0.65
28
1
2X
10.5
9.9
NOTE 3
8.45
14
15
28X
B
5.6
5.0
NOTE 4
SEE DETAIL A
(0.15) TYP
0.38
0.22
0.15
C A B
2 MAX
0.25
GAGE PLANE
0 -8
0.95
0.55
0.05 MIN
DETAIL A
A 15
TYPICAL
4214853/B 03/2018
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed 0.15 mm per side.
4. This dimension does not include interlead flash. Interlead flash shall not exceed 0.25 mm per side.
5. Reference JEDEC registration MO-150.
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EXAMPLE BOARD LAYOUT
DB0028A
SSOP - 2 mm max height
SMALL OUTLINE PACKAGE
SYMM
28X (1.85)
(R0.05) TYP
1
28X (0.45)
28
26X (0.65)
SYMM
15
14
(7)
LAND PATTERN EXAMPLE
EXPOSED METAL SHOWN
SCALE: 10X
SOLDER MASK
OPENING
SOLDER MASK
OPENING
METAL UNDER
SOLDER MASK
METAL
EXPOSED METAL
EXPOSED METAL
0.07 MAX
ALL AROUND
NON-SOLDER MASK
DEFINED
(PREFERRED)
0.07 MIN
ALL AROUND
SOLDER MASK
DEFINED
SOLDER MASK DETAILS
15.000
4214853/B 03/2018
NOTES: (continued)
6. Publication IPC-7351 may have alternate designs.
7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.
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EXAMPLE STENCIL DESIGN
DB0028A
SSOP - 2 mm max height
SMALL OUTLINE PACKAGE
28X (1.85)
SYMM
(R0.05) TYP
1
28X (0.45)
28
26X (0.65)
SYMM
14
15
(7)
SOLDER PASTE EXAMPLE
BASED ON 0.125 mm THICK STENCIL
SCALE: 10X
4214853/B 03/2018
NOTES: (continued)
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
9. Board assembly site may have different recommendations for stencil design.
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