SN65LVPE504
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SLLSE46 – SEPTEMBER 2010
Quad Channel (Half X4 Lane) PCIe Redriver/Equalizer
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FEATURES
1
•
•
•
•
•
•
•
•
•
DESCRIPTION
4 Identical Channel PCIe Equalizer/Redriver
Support for Both PCIe Gen I (2.5Gbps) and
Gen II (5.0 Gbps) Speed
Selectable Equalization, De-emphasis, and
Output Swing
Per Channel Receive Detect (Lane Detection)
Selectable Receiver Electrical Idle Threshold
Control
Low Operating Power Modes
– Supports Three Low-Power Modes to
Enable up to 80% Lower Operating Power
Excellent Jitter and Loss Compensation
Capability to 50" of 4-mil SL on FR4
Small Foot Print – 42 Pin 9 × 3.5 TQFN
Package
High Protection Against ESD Transient
– HBM: 6,000 V
– CDM: 1,000 V
– MM: 200 V
The SN65LVPE504 is a quad channel, half four lane
PCIe redriver and signal conditioner supporting data
rates of up to 5.0Gbps. The device complies with
PCIe spec revision 2.1, supporting electrical idle and
power management modes.
Programmable EQ, De-Emphasis and Amplitude
Swing
The SN65LVPE504 is designed to minimize the
signal degradation effects such as crosstalk and
inter-symbol interference (ISI) that limits interconnect
distance between two devices. The input stage of
each channel offers selectable equalization settings
that can be programmed to match loss in the
channel. The differential outputs provide selectable
de-emphasis to compensate for the anticipated
distortion PCIe signal will experience. Both
equalization and de-emphasis levels for all 4
channels are controlled by the setting of signal
control pins EQ, DE and OS.
See Table 1 for EQ, DE and OS setting details.
spacer
APPLICATIONS
•
PC MB, Docking Station, Server,
Communication Platform, Backplane and
Cabled Application
PS1 PS2 RST# EN_RXD
RX
1-4+
RX
1-4-
Dual Termination
Low Power
Controller
E
Q
U
Receiver/
A
Equalizer
RX
L
I
Z
E
R
Detect
TX
1-4+
CHANNEL
1-4
Receiver/
Equalizer
Driver
TX
TX
1-4-
OS
Loss of Signal
Detector
VBB_TX
EQ
DE
SQ_TH
OS
Figure 1. Data Flow Block Diagram
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2010, Texas Instruments Incorporated
SN65LVPE504
SLLSE46 – SEPTEMBER 2010
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DEVICE OPERATION
Device PowerOn
Device initiates internal power-on reset after Vcc has stabilized. External reset can also be applied at anytime by
toggling RST pin. External reset is recommended after every device power-up. After 50µs (MAX) from the
application of RST, device samples the state of EN_RXD, if it is set H device will enter Rx.Detect state where
each of the four channels will perform Rx.Detect function (as described in PCIe spec). If EN_RXD is set L,
automatic RX detect function is disabled and all channels are enabled with their termination set to ZRX_DC.
Receiver Detection
While EN_RXD pin is H and device is not in reset state (RST is H), LVPE504 performs RX.Detect on all its 4
channels indefinitely until remote termination is detected on at least one channel. When termination is detected
on ≥ 1 CH, RX.Detect cycle is limited to 5 more tries on the other channels. At the end of 5th try those channels
which failed to detect remote termination will be turned off to save power and their Rx termination is set to
ZRX-HIGH. In the event device detects only three channels, all four channels are enabled.
Automatic Rx detection feature on all four channels can be forced off by driving EN_RXD low. In this state all
four channels input termination are set to ZRX_DC.
Standby Mode
This is low power state triggered by RST = L. In standby mode receiver termination resistor for each of the four
channels is switched to ZRX-HIGH of >50 kΩ and transmitters are pulled to Hi-Z state. Device power is reduced to
250ms (TYP). In this mode anytime Vindiff_p-p falls below selected VEID_TH for a given channel and stays
below VEID_TH for >1µs, the associated CH enters auto low power (ALP) mode where power/CH is reduced
by >80% of normal operating power/CH. A CH will exit ALP mode whenever Vindiff_p-p exceeds max VEID_TH
for that channel. Exit latency from ALP state is 30ns max. To use this mode link latency will need to account
for the ALP exit time for N_FTS. ALP mode is handled by each channel independently based on its input
differential signal level, unless slave mode is activated (PS2=H) when CH1 controls SQ detect of other
channels based on its signal level.
3. Slave Power Mode
This mode is activated by driving PS2 high. Under normal operation squelch detection is handled by each
channel independently. In slave mode SQ detection for CH2, CH3 and CH4 are turned off and squelch
function is slaved to that of CH1. By turning off squelch detection circuitry for three of the four channels
device saves power. To use this feature user must ensure all channels operate simultaneously
2
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Squelch Control
Controls electrical idle detect threshold level. Three levels are supported as shown in Table 1.
Beacon Support
With its broadband design, the SN65LVPE504 supports low frequency Beacon signal (as defined by PCIe 2.1
spec) used to indicate wake-up event to the system by a downstream device when in L2 power state. All
requirements for a beacon signal as specified in PCI Express specification 2.1 must be met for device to pass
beacon signals.
PCIe
compliant
cable
Instrumentation Chassis/
I/O expansion box/
Docking Station
Server/PC/Notebook
Cabled
Midplane
Mainboard
Tx
Rx
I/O Module
R
R
x4
I/O Hub
I/O Module
Tx
Rx
R
R
x4
uP
I/O Module
Tx
Rx
R
R
R
x4
SN75LVPE504
Backplane
Figure 2. LVPE504 Typical Applications
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DEVICE INFORMATION
PS2
OS
EN_RXD
RST
42
41
40
39
RUA Package
(Top View)
1
38
VCC
NC
2
37
NC
RX1+
3
36
TX1+
RX1–
4
35
TX1–
GND
5
34
GND
RX2+
6
33
TX2+
RX2–
7
32
TX2–
GND
8
31
GND
VCC
9
30
VCC
29
GND
28
TX3+
RX3– 12
27
TX3–
GND 13
26
GND
RX4+ 14
25
TX4+
RX4– 15
24
TX4–
NC 16
23
NC
VCC 17
22
VCC
EQ 19
PS1 18
RX3+ 11
DE 21
GND 10
SQ_TH 20
SN65LVPE504
VCC
Figure 3. Flow-Through Pin-Out
PIN FUNCTIONS
PIN
NO.
NAME
I/O TYPE
DESCRIPTION
HIGH SPEED DIFFERENTIAL I/O PINS
3
4
RX1+
4
RX1–
6
RX2+
7
RX2–
11
RX3+
12
RX3–
14
RX4+
15
RX4–
36
TX1+
35
TX1–
33
TX2+
32
TX2–
I, CML
Non-inverting and inverting CML differential input for CH 1 and CH 4. These pins are tied to an internal voltage
bias by dual termination resistor circuit
O, CML
Non-inverting and inverting CML differential output for CH 1 and CH 4. These pins are internally tied to voltage
bias by termination resistors
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PIN FUNCTIONS (continued)
PIN
NO.
I/O TYPE
NAME
DESCRIPTION
HIGH SPEED DIFFERENTIAL I/O PINS (continued)
28
TX3+
27
TX3–
25
TX4+
24
TX4–
Non-inverting and inverting CML differential output for CH 1 and CH 4. These pins are internally tied to voltage
bias by termination resistors
O, CML
DEVICE CONTROL PIN
40
EN_RXD
I, LVCMOS
Sets device operation modes per Table 1. Internally pulled to VCC
42
PS2
I, LVCMOS
Tying pin to VCC slaves CH2-4 electrical idle and Rx.Detect function to CH1. Internally pulled to GND
18
PS1
I, LVCMOS
Select auto-low power save mode per Table 1. Internally pulled to GND
20
SQ_TH (1)
I, LVCMOS
Squelch threshold level select pin for electrical idle detect per Table 1 Internally pulled to VCC/2
39
RST
I, LVCMOS
Reset device, input active Low. Internally pulled to VCC
SIGNAL CONDITIONING PINS (1)
21
DE
I, LVCMOS
Selects de-emphasis settings for CH 1-CH 4 per Table 1. Internally pulled to Vcc/2
19
EQ
I, LVCMOS
Selects equalization settings for CH 1-CH 4 per Table 1. Internally pulled to Vcc/2
41
OS
I, LVCMOS
Selects output amplitude for CH 1-CH 4 per Table 1. Internally pulled to Vcc/2
1,9,17,22,30,38
VCC
Power
Positive supply should be 3.3V ± 10%
5,8,10,13,
26,29,31,34û
GND
Power
Supply ground
POWER PINS
(1)
Internally biased to Vcc/2 with >200kΩ pull-up/pull-down. When 3-state pins are left as NC, board leakage at the pin pad must be < 1 µA
otherwise drive to Vcc/2 to assert mid-level state.
Table 1. Control Pin Settings
OUTPUT SWING (CH1-CH4) at 5Gbps
SQUELCH THRESHOLD (CH1-CH4)
OS
TRANSITION BIT AMPLITUDE
(TYP mVpp)
SQ_TH
MIN DIFFERENTIAL INPUT
(CH1-CH4)
0
800
0
47 mVpp
NC (default)
929
NC (default)
61 mVpp
1
1047
1
83 mVpp
OUTPUT DE-EMPHASIS (CH1-CH4) at 5Gbps
INPUT EQUALIZATION (CH1-CH4)
DE
OS = NC
OS = 0
OS = 1
EQ
NC (default)
–3.4dB
–2.1dB
–4.6dB
0
0
0
–6.2dB
–4.9dB
–7.2dB
NC
7 (default)
1
–10.3dB
–9.2dB
–11dB
1
15
EN_RXD
DEVICE FUNCTION
0
Set input termination to Rx_DC
1
Perform Rx detect after power up
RST
DEVICE FUNCTION
0
Device in standby state, inputs set to Hi-Z
1
Device in active mode
PS1
DEVICE FUNCTION
0
Auto-low power mode disabled (default)
1
Auto-low power mode enabled
PS2
Equalization dB (at 5Gbps)
DEVICE FUNCTION
0
Electrical Idle and Rx Detect independent for CH1-CH4 (default)
1
CH2-CH4 Electrical Idle and Rx Detect slaved to CH1
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ORDERING INFORMATION (1)
(1)
PART NUMBER
PART MARKING
PACKAGE
SN65LVPE504RUAR
LVPE504
42-pin RUA Reel (large)
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted) (1)
Supply voltage range
(2)
Voltage range
VALUE
UNIT
VCC
–0.5 to 4
V
Differential I/O
–0.5 to 4
V
–0.5 to VCC + 0.5
V
Control I/O
Human body model
Electrostatic discharge
(3)
±6000
V
Charged-device model (4)
±1000
V
Machine model (5)
±200
V
Continuous power dissipation
(1)
(2)
(3)
(4)
(5)
See Thermal Table
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any conditions beyond those indicated under recommended operating conditions
is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltage values, except differential voltages, are with respect to network ground terminal.
Tested in accordance with JEDEC Standard 22, Test Method A114-B
Tested in accordance with JEDEC Standard 22, Test Method C101-A
Tested in accordance with JEDEC Standard 22, Test Method A115-A
THERMAL INFORMATION
THERMAL METRIC
SN65LVPE504
UNITS
TQFN (42 PINS)
qJA
Junction-to-ambient thermal resistance
30
qJCtop
Junction-to-case (top) thermal resistance
12
qJB
Junction-to-board thermal resistance
10
yJT
Junction-to-top characterization parameter
0.5
yJB
Junction-to-board characterization parameter
9
qJCbot
Junction-to-case (bottom) thermal resistance
4.7
°C/W
RECOMMENDED OPERATING CONDITIONS
VCC
Supply voltage
CCOUPLING
AC Coupling capacitor
Operating free-air temperature
6
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MIN
TYP
3
3.3
MAX
UNITS
3.6
V
75
200
nF
–40
85
°C
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ELECTRICAL CHARACTERISTICS
under recommended operating conditions
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
DEVICE PARAMETERS
ICC
RST, DEx, EQx, OS = NC, EN_RXD = NC, K28.5
pattern at 5 Gbps, VID = 1000mVp-p
174
190
ICCSlave
PS2 = Vcc; RST, DEx, EQx, OS = NC,
EN_RXD = NC, K28.5 pattern at 5 Gbps,
VID = 1000mVp-p
161
175
When auto-low power conditions are met,
PS1 = VCC
27
32
PS1, PS2 = VCC and link in EID state
14
18
ICCNO_CONNECT
EN_RXD = 1 No termination detected on any CH
2.5
ICCstdby
RST = GND
Supply current
ICCALP
ICCALP
_Slave
0.1
Maximum data rate
5
AutoLPENTRY
Auto low power entry time
Electrical idle at input, Refer to Figure 7
AutoLPEXIT
Auto low power exit time
After first signal activity, Refer to Figure 7
tENB
Device enable time
RST 0 → 1
tDIS
Device disable time
RST 1 → 0
Rx.Detect start event
EN_RXD = 1, Time to start Rx Detect after power
up
TRX.Detect
mA
Gbps
1
µs
30
ns
5
50
µs
0.1
2
µs
6
µs
CONTROL LOGIC
VIH
High level Input Voltage
1.4
Vcc
VIL
Low Level Input Voltage
–0.3
0.5
VHYS
Input Hysteresis
IIH
High Level Input Current
IIL
Low Level Input Current
V
V
150
OS, EQ, DE, SQ_TH, PS1, PS2 = VCC
mV
30
EN_RXD, RST = VCC
µA
1
PS1, PS2 = GND
–1
OS, EQ, DE, SQ_TH, EN_RXD, RST = GND
–30
100
µA
RECEIVER AC/DC
Vindiff_p-p
RX1-RX4 Input voltage swing
AC coupled differential signal (5Gbps)
TRX_TJ
Max Rx total timing error
At device pin (5Gbps)
0.4
UI
TRX_DJ
Max Rx deterministic timing
error
At device pin (5Gbps)
0.3
UI
VCM_RX
RX1-RX4 Common mode
voltage
3.6
V
VinCOM_P
RX1-RX4 AC peak common
mode voltage
150
mVP
ZRX_DC
DC single ended impedance
40
55
60
Ω
ZRX_Diff
DC Differential input
impedance
80
98
120
Ω
ZRX_High
DC Input high impedance
50
75
VEID_TH
Electrical idle detect threshold
0
Device in standby mode. Rx termination not
powered measured with respect to GND over 200
mV max
Measured at receiver pin: SQ_TH = NC
SQ_TH = 1
Differential return loss
RLRX-CM
Common mode return loss
mVp-p
kΩ
61
58
SQ_TH = 0
RLRX-DIFF
1200
83
107
mVpp
47
50 MHz – 1.25 GHz
10
15
1.25 GHz – 2.5 GHz
8
11
50 MHz – 2.5 GHz
9
14
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dB
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ELECTRICAL CHARACTERISTICS (continued)
under recommended operating conditions
PARAMETER
CONDITIONS
MIN
TYP
MAX
866
929
1031
UNITS
TRANSMITTER AC/DC
RL = 100Ω ±1%, OS = NC, transition Bit
VTXDIFF_P-P
Differential peak-to-peak
output voltage
De-emphasis level
RL = 100Ω ±1%, OS = GND transition Bit
800
RL = 100Ω ±1% OS = VCC transition Bit
1047
RL = 100Ω ±1%, DE=NC, OS = 0,1,NC
on-transition bit
620
RL = 100Ω ±1%, DE=OS = 0,1,NC on-transition bit
456
RL = 100Ω ±1%, DE=OS = 0,1,NC on-transition bit
288
OS = NC (Figure 9) for OS = 1 and NC see
Table 1)
–3.0
–3.4
–5.5
–6.2
–6.5
–9.0
–10.3
–10.6
TDE
De-emphasis width
At 5 Gbps
ZTX_diff
DC Differential impedance
Defined during signaling
80
100
f = 50 MHz – 1.25 GHz
10
20
f = 1.25 GHz – 2.5 GHz
8
13
6
12
RLdiff_TX
Differential return loss
RLCM_TX
Common mode return loss
f = 50 MHz – 2.5 GHz
ITX_SC
TX short circuit current
TX± shorted to GND
VTX_CM_DC
mV
–4.0
0.9
dB
UI
120
Ω
dB
dB
44
90
mA
Transmitter DC common-mode Allowed DC CM voltage at TX pins
voltage
1.8
2.2
V
VTX_CM_AC2
TX AC common mode voltage
at Gen II speed
Max(Vd+ + Vd–) /2 – Min(Vd+ + Vd–)/2
30
100
mVpp
VTX_CM_AC1
TX AC common mode voltage
at Gen I speed
RMS(Vd+ + Vd–)/2 – DCAVG(Vd+ + Vd–)/2
3
20
mV
VTX_CM_DeltaL0-
Absolute Delta DC CM voltage |VTX_CM_DC [L0] – VTX_CM_DC [L0s] |
during active and idle states
0
100
mV
Absolute delta of DC CM
voltage between D+ and D–
|VTX_CM_DC–D+ [L0] – VTX_CM_DC–D– [L0] |
0
25
mV
VTX_idle_diff-AC-p
Electrical idle differential peak
output voltage
|VTX-Idle-D+ – VTX-Idle-D–|, LP filtered to remove any
DC component
0
20
mVpp
VTX_idle_diff-DC
DC electrical idle differential
output voltage
|VTX_idle-D+ – VTX_idle-D–|, LP filtered to remove any
AC component
Vdetect
Voltage change to allow
receiver detect
Positive voltage to sense receiver
tR,tF
Output rise/fall time
De-Emphasis = 0 dB,
OS = NC (CH 0 and CH 1)
20%-80% of differential voltage at the output
tRF_MM
Output rise/fall time mismatch
De-Emphasis = 0dB,
OS = NC (CH 0 and CH 1)
20%-80% of differential voltage at the output
Tdiff_LH, Tdiff_HL
Differential propagation delay
De-Emphasis = 0dB (CH 0 and CH 1). Propagation
delay between 50% level at input and output
TINTRA_SKEW
Output skew (same lane)
5 Gbps
TINTER_SKEW
Lane to lane skew
5 Gbps
tidleEntry, tidleExit
Idle entry and exit times
See Figure 5
Ttx_EID_min
Minimum time in EID
L0s
VTX_CM-DC-LineDelta
1
1.9
30
55
280
–25
mV
600
mV
70
ps
20
ps
350
ps
15
ps
25
ps
8
ns
20
ns
Tx EQUALIZATION AT GEN II SPEED
TXDJ (1)
Residual deterministic jitter
TXRJ
(1)
8
Residual random jitter
At point A1 in Figure 8, EQ/DE=NC, OS=HIGH
25
60
At point A2 in Figure 8, EQ/DE=NC, OS=LOW
26
60
At point B in Figure 8, EQ/DE=NC, OS=HIGH
27
60
D24.3 pattern at point A1/A2/B in Figure 8
0.1
ps p-p
psrms
Refer to Figure 8 with ±K28.5 pattern, –3.5dB DE from source AWG
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IN
Tdiff_HL
Tdiff_LH
OUT
Figure 4. Propagation Delay
IN+
VEID_TH
Vcm
INtidleEntry
tidleExit
OUT+
Vcm
OUT-
Figure 5. Idle Mode Exit and Entry Delay
80 %
20 %
tr
tf
Figure 6. Output Rise and Fall Times
RX_1-4+
VCMRX
RX_1-4tidleEntry
AutoLPEXIT
TX_1-4+
VCMTX
TX_1-4AutoLP ENTRY
Power Saving
Mode
Figure 7. Auto Low Power Mode Timing (when enabled)
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A1
X = 40", 4mil SL on
FR4
2"
AWG*
CH
2"
Jitter Measurement
Y = 8", 5mil SL on
FR4
5 Gbps Signal Gen.
K28.5 pattern, 800mVpp
B
A2
X = 25", 4mil SL on
FR4
2"
AWG*
CH
2"
Jitter Measurement
Y = 23", 5mil SL on
FR4
5 Gbps Signal Gen.
K28.5 pattern, 800mVpp
Figure 8. Jitter Measurement Setup
1-bit
1 to N bits
tDE
1-bit
1 to N bits
DEx/OSx = NC
-3.4dB
-6.2dB
DEx = 0;
OSx = NC
-10.3dB
Vcm
DiffVppTX
DEx = 1;
OSx = NC
DiffVppTX_DE
tDE
Figure 9. Output De-Emphasis Levels
10
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TYPICAL CHARACTERISTICS
TYPICAL EYE DIAGRAM AND PERFORMANCE CURVES
•
•
•
•
Input Signal Characteristics – VID = 1000mVpp, DE = –3.5 dB, Pattern = K28.5
Device Operating Conditions: VCC = 3.3 V, Temp = 25°C
All trace are 4 mils
PCIe Gen I and Gen II compliance mask shown
AT GEN II SPEED
Input Trace = 4", Output Trace = 8"
EQ = 0 dB, OS = 833 mVpp, DE = - 1.9 dB
Input Trace = 4", Output Trace = 16"
EQ = 0 dB, OS = 1166 mVpp, DE = - 4.9 dB
Figure 10.
Figure 11.
Input Trace = 4", Output Trace = 28"
EQ = 0 dB, OS = 1166 mVpp, DE = - 7.4 dB
Input Trace = 16", Output Trace = 4"
EQ = 0 dB, OS = 833 mVpp, DE = - 1.9 dB
Figure 12.
Figure 13.
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TYPICAL CHARACTERISTICS (continued)
Input Trace = 28", Output Trace = 4"
EQ = 7 dB, OS = 833 mVpp, DE = - 1.9 dB
Input Trace = 36", Output Trace = 4"
EQ = 7 dB, OS = 833 mVpp, DE = - 1.9 dB
Figure 14.
Figure 15.
Input Trace = 48", Output Trace = 4"
EQ = 15 dB, OS = 833 mVpp, DE = - 1.9 dB
Figure 16.
AT GEN I SPEED
Input Trace = 4", Output Trace = 8"
EQ = 7 dB, OS = 833 mVpp, DE = - 1.9 dB
Input Trace = 4", Output Trace = 16"
EQ = 7 dB, OS = 1166 mVpp, DE = - 4.9 dB
Figure 17.
12
Figure 18.
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TYPICAL CHARACTERISTICS (continued)
Input Trace = 4", Output Trace = 28"
EQ = 7 dB, OS = 1166 mVpp, DE = - 7.4 dB
Input Trace = 16", Output Trace = 4"
EQ = 7 dB, OS = 833 mVpp, DE = - 1.9 dB
Figure 19.
Figure 20.
Input Trace = 28", Output Trace = 4"
EQ = 15 dB, OS = 833 mVpp, DE = - 1.9 dB
Input Trace = 36", Output Trace = 4"
EQ = 15 dB, OS = 833 mVpp, DE = - 1.9 dB
Figure 21.
Figure 22.
Input Trace = 48", Output Trace = 4"
EQ = 15 dB, OS = 833 mVpp, DE = - 1.9 dB
Figure 23.
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Product Folder Link(s): SN65LVPE504
13
PACKAGE OPTION ADDENDUM
www.ti.com
10-Dec-2020
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
(4/5)
(6)
SN65LVPE504RUAR
ACTIVE
WQFN
RUA
42
3000
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-40 to 85
LVPE504
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of