SN74AUC1G125
SCES382M – MARCH 2002 – REVISED AUGUST 2022
SN74AUC1G125 Single Bus Buffer Gate With 3-State Output
1 Features
3 Description
•
•
•
•
•
The SN74AUC1G125 device is a single line driver
with a 3-state output. The output is disabled when the
output-enable (OE) input is high.
•
•
•
•
Optimized for 1.8-V operation
±8-mA output drive at 1.8 V
Maximum tpd of 2.5 ns at 1.8 V, 30 pF load
Wide operating voltage range of 0.8 V to 2.7 V
Over-voltage tolerant I/Os support up to 3.6 V,
independent of VCC
Available in the Texas Instruments NanoFree™
package
Ioff feature supports partial power down mode and
back drive protection
Low power consumption, 10-µA maximum ICC
Latch-up performance exceeds 100 mA per JESD
78, Class II
2 Applications
•
•
•
Redrive digital signals
Enable or disable a digital signal
Drive transmission lines with logic
The AUC logic family is specifically designed for
speed and is optimized for operation between 1.65-V
and 1.95-V VCC. With an optimal supply and 15-pF
load the device can operate at over 250 MHz, or
500 Mbps. The unique output structure of the AUC
family provides great signal integrity without the need
for external termination when driving 50- to 65-Ω
transmission lines of moderate length (less than 15
cm). See Application of the Texas Instruments AUC
Sub-1-V Little Logic Devices for more details on this
technology.
This device is available in the popular SOT-23 and
SC70 packages, as well as the advanced NanoFree™
DSBGA package. NanoFree™ package technology is
a major breakthrough in IC packaging concepts, using
the die as the package.
Package Information(1)
PART NUMBER
SN74AUC1G125
(1)
OE
A
PACKAGE
BODY SIZE (NOM)
DBV (SOT-23, 5)
2.90 mm × 1.60 mm
DCK (SC70, 5)
2.00 mm × 1.25 mm
YZP (DSBGA, 5)
1.39 mm × 0.89 mm
For all available packages, see the orderable addendum at
the end of the data sheet.
1
4
2
Y
Logic Diagram (Positive Logic)
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
SN74AUC1G125
www.ti.com
SCES382M – MARCH 2002 – REVISED AUGUST 2022
Table of Contents
1 Features............................................................................1
2 Applications..................................................................... 1
3 Description.......................................................................1
4 Revision History.............................................................. 2
5 Pin Configuration and Functions...................................3
6 Specifications.................................................................. 4
6.1 Absolute Maximum Ratings........................................ 4
6.2 ESD Ratings............................................................... 4
6.3 Recommended Operating Conditions.........................4
6.4 Thermal Information....................................................5
6.5 Electrical Characteristics.............................................5
6.6 Switching Characteristics: CL = 15 pF........................ 6
6.7 Switching Characteristics: CL = 30 pF........................ 6
6.8 Operating Characteristics........................................... 6
6.9 Typical Characteristics................................................ 7
7 Parameter Measurement Information............................ 8
8 Detailed Description........................................................9
8.1 Overview..................................................................... 9
8.2 Functional Block Diagram........................................... 9
8.3 Feature Description.....................................................9
8.4 Device Functional Modes..........................................10
9 Application and Implementation.................................. 11
9.1 Application Information..............................................11
9.2 Typical Application.................................................... 11
10 Power Supply Recommendations..............................12
11 Layout........................................................................... 13
11.1 Layout Guidelines................................................... 13
11.2 Layout Example...................................................... 13
12 Device and Documentation Support..........................14
12.1 Documentation Support.......................................... 14
12.2 Receiving Notification of Documentation Updates..14
12.3 Support Resources................................................. 14
12.4 Trademarks............................................................. 14
12.5 Electrostatic Discharge Caution..............................14
12.6 Glossary..................................................................14
13 Mechanical, Packaging, and Orderable
Information.................................................................... 14
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision L (June 2017) to Revision M (August 2022)
Page
• Updated the numbering format for tables, figures, and cross-references throughout the document .................1
• Updated the Features section, Applications section, and Device Information table........................................... 1
• Changed the YZP (DSBGA, 5) body size from:1.75 mm × 1.25 mm to:1.39 mm × 0.89 mm ............................1
• Added the Application and Implementation, Application Information, Typical Application, Power Supply
Recommendations, Layout, Layout Guidelines, and Layout Examples sections............................................... 1
• Updated the Pin Configuration and Functions section........................................................................................3
• Updated the ESD Ratings section...................................................................................................................... 4
• Updated the Thermal Information section...........................................................................................................5
Changes from Revision K (April 2007) to Revision L (June 2017)
Page
• Deleted DRY package throughout data sheet.................................................................................................... 1
• Added Applications, Device Information table, ESD Ratings table, Thermal Information table, Feature
Description section, Device Functional Modes, Device and Documentation Support section, and Mechanical,
Packaging, and Orderable Information section...................................................................................................1
• Deleted Ordering Information table, see Mechanical, Packaging, and Orderable Information at the end of the
data sheet .......................................................................................................................................................... 1
2
Submit Document Feedback
Copyright © 2022 Texas Instruments Incorporated
Product Folder Links: SN74AUC1G125
SN74AUC1G125
www.ti.com
SCES382M – MARCH 2002 – REVISED AUGUST 2022
5 Pin Configuration and Functions
OE
1
A
2
GND
3
5
4
OE
1
A
2
GND
3
5
VCC
4
Y
VCC
Figure 5-2. DCK Package, 5-Pin SC70 (Top View)
Y
Figure 5-1. DBV Package, 5-Pin SOT-23 (Top View)
Table 5-1. Pin Functions
PIN
NAME
DBV, DCK
TYPE(1)
DESCRIPTION
A
2
I
Logic input
GND
3
G
Ground
OE
1
I
Active-low output enable
VCC
5
P
Positive supply
Y
4
O
Output
(1)
I = input, O = output, P = power, G = ground
1
2
C
GND
Y
B
A
A
OE
VCC
Not to scale
Figure 5-3. YZP Package, 5-Pin DSBGA (Bottom View)
Legend
Input
Power
Ground
Output
Table 5-2. Pin Functions
PIN
NO.
NAME
TYPE(1)
DESCRIPTION
A1
OE
I
Output enable, active low
A2
VCC
P
Positive supply
B1
A
I
Logic input
C1
GND
G
Ground
C2
Y
O
Output
(1)
I = input, O = output, P = power, G = ground
Submit Document Feedback
Copyright © 2022 Texas Instruments Incorporated
Product Folder Links: SN74AUC1G125
3
SN74AUC1G125
www.ti.com
SCES382M – MARCH 2002 – REVISED AUGUST 2022
6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)
VCC
MIN
MAX
UNIT
Supply voltage
–0.5
3.6
V
voltage(2)
–0.5
3.6
V
–0.5
3.6
V
–0.5
VI
Input
VO
Voltage range applied to any output in the high-impedance or power-off state(2)
range(2)
VO
Output voltage
VCC + 0.5
V
IIK
Input clamp current
VI < 0
–50
mA
IOK
Output clamp current
VO < 0
–50
mA
IO
Continuous output current
±20
mA
±100
mA
150
°C
Continuous current through VCC or GND
Tstg
(1)
(2)
Storage temperature
–65
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed.
6.2 ESD Ratings
VALUE
V(ESD)
(1)
(2)
Electrostatic discharge
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)
±2000
Charged-device model (CDM), per JEDEC specification JESD22-C101(2)
±1000
Machine Model (A115-A)
±200
UNIT
V
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.3 Recommended Operating Conditions
See (1)
VCC
Supply voltage
VIH
High-level input voltage
VCC = 0.8 V
MIN
MAX
UNIT
0.8
2.7
V
VCC
VCC = 1.1 V to 1.95 V
0.65 × VCC
VCC = 2.3 V to 2.7 V
1.7
VCC = 0.8 V
VIL
0
VCC = 1.1 V to 1.95 V
0.35 × VCC
VCC = 2.3 V to 2.7 V
0.7
V
VI
Input voltage
0
3.6
V
VO
Output voltage
0
VCC
V
IOH
4
Low-level input voltage
V
High-level output current
VCC = 0.8 V
–0.7
VCC = 1.1 V
–3
VCC = 1.4 V
–5
VCC = 1.65 V
–8
VCC = 2.3 V
–9
Submit Document Feedback
mA
Copyright © 2022 Texas Instruments Incorporated
Product Folder Links: SN74AUC1G125
SN74AUC1G125
www.ti.com
SCES382M – MARCH 2002 – REVISED AUGUST 2022
6.3 Recommended Operating Conditions (continued)
See (1)
MIN
IOL
Low-level output current
Δt/Δv
Input transition rise or fall rate
TA
Operating free-air temperature
MAX
VCC = 0.8 V
0.7
VCC = 1.1 V
3
VCC = 1.4 V
5
VCC = 1.65 V
8
VCC = 2.3 V
9
VCC = 0.8 V to 1.6 V
20
VCC = 1.65 V to 1.95 V
10
VCC = 2.3 V to 2.7 V
(1)
UNIT
mA
ns/V
3
–40
85
°C
All unused inputs of the device must be held at VCC or GND to ensure proper device operation. See Implications of Slow or Floating
CMOS Inputs
6.4 Thermal Information
THERMAL METRIC(1)
DBV (SOT-23)
DCK (SC70)
YZP (DSBGA)
5 PINS
5 PINS
5 PINS
220.7
262.5
144.5
°C/W
UNIT
RθJA
Junction-to-ambient thermal resistance
RθJC(top)
Junction-to-case (top) thermal resistance
123.9
181.4
1.4
°C/W
RθJB
Junction-to-board thermal resistance
123.20
153.4
47.6
°C/W
ΨJT
Junction-to-top characterization parameter
58.3
67.60
0.6
°C/W
ΨJB
Junction-to-board characterization parameter
122.5
152.80
47.5
°C/W
(1)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
6.5 Electrical Characteristics
over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER
VOH
VOL
II
A or OE input
TEST CONDITIONS
VCC
MIN TYP(1)
MAX
IOH = –100 µA
0.8 V to 2.7 V
IOH = –0.7 mA
0.8 V
IOH = –3 mA
1.1 V
0.8
IOH = –5 mA
1.4 V
1
IOH = –8 mA
1.65 V
1.2
IOH = –9 mA
2.3 V
1.8
IOL = 100 µA
0.8 V to 2.7 V
IOL = 0.7 mA
0.8 V
IOL = 3 mA
1.1 V
0.3
IOL = 5 mA
1.4 V
0.4
IOL = 8 mA
1.65 V
0.45
IOL = 9 mA
2.3 V
0.6
UNIT
VCC – 0.1
0.55
V
0.2
0.25
V
VI = VCC or GND
0 to 2.7 V
±5
µA
Ioff
VI or VO = 2.7 V
0
±10
µA
IOZ
VO = VCC or GND
2.7 V
±10
µA
ICC
VI = VCC or GND
0.8 V to 2.7 V
10
µA
CI
VI = VCC or GND
IO = 0
2.5 V
2.5
pF
Submit Document Feedback
Copyright © 2022 Texas Instruments Incorporated
Product Folder Links: SN74AUC1G125
5
SN74AUC1G125
www.ti.com
SCES382M – MARCH 2002 – REVISED AUGUST 2022
6.5 Electrical Characteristics (continued)
over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
Co
(1)
VO = VCC or GND
VCC
MIN TYP(1)
2.5 V
5.5
MAX
UNIT
pF
All typical values are at TA = 25°C.
6.6 Switching Characteristics: CL = 15 pF
over recommended operating free-air temperature range, CL = 15 pF (unless otherwise noted) (see Figure 7-1)
VCC = 1.2 V
± 0.1 V
VCC = 1.5 V
± 0.1 V
VCC = 1.8 V
± 0.15 V
FROM
(INPUT)
TO
(OUTPUT)
VCC = 0.8 V
TYP
MIN
MAX
MIN
MAX
MIN
tpd
A
Y
4.7
0.8
3.6
0.4
2.3
ten
OE
Y
5.4
0.7
4.1
0.5
2.6
tdis
OE
Y
4.8
1.4
4.3
1.4
4
PARAMETER
VCC = 2.5 V
± 0.2 V
UNIT
TYP
MAX
MIN
MAX
0.6
1
1.5
0.5
1.3
ns
0.6
1.1
1.8
0.5
1.4
ns
1.5
2.2
2.9
0.9
2.2
ns
6.7 Switching Characteristics: CL = 30 pF
over recommended operating free-air temperature range, CL = 30 pF (unless otherwise noted) (see Figure 7-1)
FROM
(INPUT)
TO
(OUTPUT)
tpd
A
Y
ten
OE
tdis
OE
PARAMETER
VCC = 1.8 V
± 0.15 V
VCC = 2.5 V
± 0.2 V
UNIT
MIN
TYP
MAX
MIN
MAX
0.7
1.5
2.5
0.9
1.7
ns
Y
1
1.6
2.6
1.1
1.9
ns
Y
1.8
2.2
3.1
0.8
1.7
ns
6.8 Operating Characteristics
TA = 25°C
PARAMETER
Cpd
6
Power
dissipation
capacitance
Outputs
enabled
Outputs
disabled
TEST
CONDITIONS
VCC = 0.8 V
VCC = 1.2 V
VCC = 1.5 V
VCC = 1.8 V
VCC = 2.5 V
TYP
TYP
TYP
TYP
TYP
14
14
14
15
16
1.5
1.5
1.5
2
2.5
f = 10 MHz
UNIT
pF
Submit Document Feedback
Copyright © 2022 Texas Instruments Incorporated
Product Folder Links: SN74AUC1G125
SN74AUC1G125
www.ti.com
SCES382M – MARCH 2002 – REVISED AUGUST 2022
6.9 Typical Characteristics
0.8
2.7
0.7
2.4
0.6
0.5
0.4
0.3
0.2
VCC = 0.8 V
VCC = 1.8 V
VCC = 2.7 V
0.1
0
0
2
4
6
8
10
12
14
16
Output Low-State Current (I OL, mA)
18
20
Output Hi-Z State Leakage Current (IOZ, nA)
Figure 6-1. Output Low-State Voltage Across Output Current,
0.8-, 1.8-, and 2.7-V Supply
Output High-State Voltage (VOH, V)
Output Low-State Voltage (VOL, V)
TA = 25°C
2.1
1.8
1.5
1.2
0.9
0.6
0.3
0
-20
VCC = 0.8 V
VCC = 1.8 V
VCC = 2.7 V
-18
-16 -14 -12 -10
-8
-6
-4
Output High-State Current (I OH, mA)
-2
0
Figure 6-2. Output High-State Voltage Across Output Current,
0.8-, 1.8-, and 2.7-V Supply
8
VCC = 0.8 V
VCC = 1.8 V
VCC = 2.7 V
7
6
5
4
3
2
1
0
-1
-2
-3
0
0.3
0.6
0.9
1.2
1.5
1.8
Output Voltage (V O, V)
2.1
2.4
2.7
Figure 6-3. Output High-Impedance State Leakage Current Across Output Voltage, 0.8-, 1.8-, and 2.7-V Supply
Submit Document Feedback
Copyright © 2022 Texas Instruments Incorporated
Product Folder Links: SN74AUC1G125
7
SN74AUC1G125
www.ti.com
SCES382M – MARCH 2002 – REVISED AUGUST 2022
7 Parameter Measurement Information
TEST
tPLH/tPHL
tPLZ/tPZL
tPHZ/tPZH
2 × VCC
S1
RL
From Output
Under Test
Open
S1
Open
2 × VCC
GND
GND
CL
(see Note A)
RL
LOAD CIRCUIT
VCC
CL
RL
VD
0.8 V
1.2 V ± 0.1 V
1.5 V ± 0.1 V
1.8 V ± 0.15 V
2.5 V ± 0.2 V
1.8 V ± 0.15 V
2.5 V ± 0.2 V
15 pF
15 pF
15 pF
15 pF
15 pF
30 pF
30 pF
2 kW
2 kW
2 kW
2 kW
2 kW
1 kW
500 W
0.1 V
0.1 V
0.1 V
0.15 V
0.15 V
0.15 V
0.15 V
VCC
Timing Input
VCC/2
0V
tW
tsu
VCC
Input
VCC/2
VCC/2
th
VCC
Data Input
VCC/2
VCC/2
0V
0V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VOLTAGE WAVEFORMS
PULSE DURATION
VCC
VCC/2
Input
VCC/2
0V
tPLH
VOH
Output
VCC/2
VOL
tPHL
VCC/2
0V
VCC
VCC/2
tPZH
VCC/2
VOL
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
INVERTING AND NONINVERTING OUTPUTS
Output
Waveform 2
S1 at GND
(see Note B)
VCC/2
tPLZ
Output
Waveform 1
S1 at 2 × VCC
(see Note B)
tPLH
VOH
Output
VCC/2
tPZL
tPHL
VCC/2
VCC
Output
Control
VOL + VD
VOL
tPHZ
VCC/2
VOH – VD
VOH
»0 V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low, except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high, except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR £ 10 MHz, ZO = 50 W,
slew rate ³ 1 V/ns.
D. The outputs are measured one at a time, with one transition per measurement.
E. tPLZ and tPHZ are the same as tdis.
F. tPZL and tPZH are the same as ten.
G. tPLH and tPHL are the same as tpd.
Figure 7-1. Load Circuit and Voltage Waveforms
8
Submit Document Feedback
Copyright © 2022 Texas Instruments Incorporated
Product Folder Links: SN74AUC1G125
SN74AUC1G125
www.ti.com
SCES382M – MARCH 2002 – REVISED AUGUST 2022
8 Detailed Description
8.1 Overview
The SN74AUC1G125 bus buffer gate is operational from 0.8-V to 2.7-V VCC, but is optimized for 1.65-V to
1.95-V VCC operation.
This device is a single line driver with a 3-state output. The output is disabled when the output-enable (OE) input
is high.
To ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup
resistor; the current-sinking capability of the driver determines the minimum value of the resistor.
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs,
preventing damaging current backflow through the device when it is powered down.
8.2 Functional Block Diagram
OE
A
1
4
2
Y
Figure 8-1. Logic Diagram (Positive Logic)
8.3 Feature Description
8.3.1 ULTTL CMOS Outputs
This device includes ultra-low-voltage transistor-transistor logic (ULTTL) output drivers. ULTTL outputs are
balanced, indicating that the device can sink and source similar currents. They are also specially designed
for applications requiring high-speed, low power consumption, and optimal signal integrity while minimizing
switching noise.
The ULTTL output driver changes impedance during transition to maximize transition rate while limiting ringing
and transmission line reflections. The output is optimized for operation with a direct connection to a 50- to 65-Ω
controlled impedance transmission line of up to 15 cm, although it can operate with acceptable signal integrity for
controlled impedances of between 30 and 70 Ω.
The outputs of this device are capable of driving larger currents than the device can sustain without being
damaged. It is important for the output power of the device to be limited to avoid damage due to overcurrent. The
electrical and thermal limits defined in the Absolute Maximum Ratings must be followed at all times.
Unused push-pull CMOS outputs should be left disconnected.
8.3.2 Standard CMOS Inputs
This device includes standard CMOS inputs. Standard CMOS inputs are high impedance and are typically
modeled as a resistor in parallel with the input capacitance given in the Electrical Characteristics. The worst
case resistance is calculated with the maximum input voltage, given in the Absolute Maximum Ratings, and the
maximum input leakage current, given in the Electrical Characteristics, using Ohm's law (R = V ÷ I).
Standard CMOS inputs require that input signals transition between valid logic states quickly, as defined
by the input transition time or rate in the Recommended Operating Conditions table. Failing to meet this
specification will result in excessive power consumption and could cause oscillations. More details can be found
in Implications of Slow or Floating CMOS Inputs.
Do not leave standard CMOS inputs floating at any time during operation. Unused inputs must be terminated at
VCC or GND. If a system will not be actively driving an input at all times, then a pull-up or pull-down resistor can
be added to provide a valid input voltage during these times. The resistor value will depend on multiple factors; a
10-kΩ resistor, however, is recommended and will typically meet all requirements.
Submit Document Feedback
Copyright © 2022 Texas Instruments Incorporated
Product Folder Links: SN74AUC1G125
9
SN74AUC1G125
www.ti.com
SCES382M – MARCH 2002 – REVISED AUGUST 2022
8.3.3 Partial Power Down (Ioff)
This device includes circuitry to disable all outputs when the supply pin is held at 0 V. When disabled, the
outputs will neither source nor sink current, regardless of the input voltages applied. The amount of leakage
current at each output is defined by the Ioff specification in the Electrical Characteristics table.
8.3.4 Clamp Diode Structure
Figure 8-2 shows the inputs and outputs to this device have negative clamping diodes only.
CAUTION
Voltages beyond the values specified in the Absolute Maximum Ratings table can cause damage
to the device. The input and output voltage ratings may be exceeded if the input and output clampcurrent ratings are observed.
Device
VCC
Logic
Input
-IIK
Output
-IOK
GND
Figure 8-2. Electrical Placement of Clamping Diodes for Each Input and Output
8.4 Device Functional Modes
Table 8-1 lists the functional modes of the SN74AUC1G125.
Table 8-1. Function Table
INPUTS(1)
(1)
(2)
10
OE
A
OUTPUT(2)
Y
L
H
H
L
L
L
H
X
Z
L = Low Voltage Level, H = High Voltage Level, X = Do Not Care
L = Driving Low, H = Driving High, Z = High Impedance
Submit Document Feedback
Copyright © 2022 Texas Instruments Incorporated
Product Folder Links: SN74AUC1G125
SN74AUC1G125
www.ti.com
SCES382M – MARCH 2002 – REVISED AUGUST 2022
9 Application and Implementation
Note
Information in the following applications sections is not part of the TI component specification,
and TI does not warrant its accuracy or completeness. TI’s customers are responsible for
determining suitability of components for their purposes, as well as validating and testing their design
implementation to confirm system functionality.
9.1 Application Information
In this application, the SN74AUC1G125 is used to control a high-speed digital signal. The output enable (OE)
input is connected to the system controller and allows the output to be disabled. Not shown is a 10-kΩ pull-down
resistor which will ensure that the output will return to the low state when placed in the high-impedance mode of
operation.
9.2 Typical Application
System
Controller
OE
Data
A
Y
Output
Figure 9-1. Application Block Diagram
9.2.1 Design Requirements
•
•
•
•
All signals in the system operate at 1.8 V ± 0.15 V
Input signals transition faster than 10 ns/V
Y output is enabled when OE is LOW
Output transmission line impedance should be between 50 and 65 Ω
9.2.2 Detailed Design Procedure
1. Add a decoupling capacitor from VCC to GND. The capacitor needs to be placed physically close to the
device and electrically close to both the VCC and GND pins. An example layout is shown in the Layout
section.
2. Ensure the output tranmission line is less than 15 cm in total length for optimal signal integrity results. For
the best signal integrity, avoid sharp turns, stubs, and branches.
3. Ensure the resistive load at the output is larger than (VCC / IO(max)) Ω. This will ensure that the maximum
output current from the Absolute Maximum Ratings is not violated. Most CMOS inputs have a resistive load
measured in MΩ; much larger than the minimum calculated previously.
4. Thermal issues are rarely a concern for logic gates; the power consumption and thermal increase, however,
can be calculated using the steps provided in the application report, CMOS Power Consumption and Cpd
Calculation.
Submit Document Feedback
Copyright © 2022 Texas Instruments Incorporated
Product Folder Links: SN74AUC1G125
11
SN74AUC1G125
www.ti.com
SCES382M – MARCH 2002 – REVISED AUGUST 2022
9.2.3 Application Curves
2.2
ZO = 70
2.0
1.8
1.6
ZO = 30
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0.0
-0.2
110
111
112
113
114
115
116
117
118
119
120
Figure 9-2. Simulated Output Voltage Waveforms for AUC Family Directly Driving Short (< 15 cm)
Transmission Lines With Characteristic Impedances from 30 to 70 Ω (Volts vs Nanoseconds)
10 Power Supply Recommendations
The power supply can be any voltage between the minimum and maximum supply voltage rating located in the
Recommended Operating Conditions. Each VCC terminal should have a good bypass capacitor to prevent power
disturbance. A 0.1-μF capacitor is recommended for this device. It is acceptable to parallel multiple bypass caps
to reject different frequencies of noise. The 0.1-μF and 1-μF capacitors are commonly used in parallel. The
bypass capacitor should be installed as close to the power terminal as possible for best results, as shown in the
following layout example.
12
Submit Document Feedback
Copyright © 2022 Texas Instruments Incorporated
Product Folder Links: SN74AUC1G125
SN74AUC1G125
www.ti.com
SCES382M – MARCH 2002 – REVISED AUGUST 2022
11 Layout
11.1 Layout Guidelines
When using multiple-input and multiple-channel logic devices inputs must not ever be left floating. In many
cases, functions or parts of functions of digital logic devices are unused; for example, when only two inputs of a
triple-input AND gate are used or only 3 of the 4 buffer gates are used. Such unused input pins must not be left
unconnected because the undefined voltages at the outside connections result in undefined operational states.
All unused inputs of digital logic devices must be connected to a logic high or logic low voltage, as defined by the
input voltage specifications, to prevent them from floating. The logic level that must be applied to any particular
unused input depends on the function of the device. Generally, the inputs are tied to GND or VCC, whichever
makes more sense for the logic function or is more convenient.
11.2 Layout Example
GND
VCC
Recommend GND flood fill for
improved signal isolation, noise
reduction, and thermal dissipation
VCC
Bypass capacitor
placed close to the
device
0.1 F
Unused input tied
directly to GND
Avoid 90°
corners for
signal lines
OE
1
A
2
GND
3
5
4
GND
0.1 F
Avoid 90°
corners for
signal lines
OE
A1
A
B1
A2
Bypass capacitor
placed close to the
device
VCC
VCC
50
controlled
impedance
Y
GND
Figure 11-1. Example Layout for DCK Package
C1
C2
Y
Figure 11-2. Example Layout for YZP Package
Submit Document Feedback
Copyright © 2022 Texas Instruments Incorporated
Product Folder Links: SN74AUC1G125
13
SN74AUC1G125
www.ti.com
SCES382M – MARCH 2002 – REVISED AUGUST 2022
12 Device and Documentation Support
12.1 Documentation Support
12.1.1 Related Documentation
For related documentation, see the following:
•
Texas Instruments, Implications of Slow or Floating CMOS Inputs application report
12.2 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on
Subscribe to updates to register and receive a weekly digest of any product information that has changed. For
change details, review the revision history included in any revised document.
12.3 Support Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
12.4 Trademarks
NanoFree™ is a trademark of Texas Instruments.
TI E2E™ is a trademark of Texas Instruments.
All trademarks are the property of their respective owners.
12.5 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
12.6 Glossary
TI Glossary
This glossary lists and explains terms, acronyms, and definitions.
13 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
14
Submit Document Feedback
Copyright © 2022 Texas Instruments Incorporated
Product Folder Links: SN74AUC1G125
PACKAGE OPTION ADDENDUM
www.ti.com
14-Oct-2022
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
Samples
(4/5)
(6)
74AUC1G125DBVRE4
ACTIVE
SOT-23
DBV
5
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
U25R
Samples
74AUC1G125DBVRG4
ACTIVE
SOT-23
DBV
5
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
U25R
Samples
SN74AUC1G125DBVR
ACTIVE
SOT-23
DBV
5
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
U25R
Samples
SN74AUC1G125DCKR
ACTIVE
SC70
DCK
5
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
(UM5, UMF, UMR)
Samples
SN74AUC1G125YZPR
ACTIVE
DSBGA
YZP
5
3000
RoHS & Green
SNAGCU
Level-1-260C-UNLIM
-40 to 85
UMN
Samples
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of