SCLS584A − MAY 2004 − REVISED APRIL 2008
D
D
D
D
D
D
D
D
Qualified for Automotive Applications
Wide Operating Voltage Range of 2 V to 6 V
Outputs Can Drive Up To 10 LSTTL Loads
Low Power Consumption, 80-µA Max ICC
Typical tpd = 14 ns
±4-mA Output Drive at 5 V
Low Input Current of 1 µA Max
Internal Look-Ahead for Fast Counting
D Carry Output for n-Bit Cascading
D Synchronous Counting
D Synchronously Programmable
PW PACKAGE
(TOP VIEW)
CLR
CLK
A
B
C
D
ENP
GND
description/ordering information
1
16
2
15
3
14
4
13
5
12
VCC
RCO
QA
QB
QC
QD
ENT
LOAD
11
6
This synchronous, presettable counter features an
10
7
internal carry look-ahead for application in
high-speed counting designs. The SN74HC163 is a
9
8
4-bit binary counter. Synchronous operation is
provided by having all flip-flops clocked
simultaneously so that the outputs change coincident with each other when instructed by the count-enable
(ENP, ENT) inputs and internal gating. This mode of operation eliminates the output counting spikes normally
associated with synchronous (ripple-clock) counters. A buffered clock (CLK) input triggers the four flip-flops on
the rising (positive-going) edge of the clock waveform.
This counter is fully programmable; that is, it can be preset to any number between 0 and 9 or 15. As presetting
is synchronous, setting up a low level at the load input disables the counter and causes the outputs to agree
with the setup data after the next clock pulse, regardless of the levels of the enable inputs.
The clear function for the SN74HC163 is synchronous. A low level at the clear (CLR) input sets all four of the
flip-flop outputs low after the next low-to-high transition of CLK, regardless of the levels of the enable inputs.
This synchronous clear allows the count length to be modified easily by decoding the Q outputs for the maximum
count desired. The active-low output of the gate used for decoding is connected to CLR to synchronously clear
the counter to 0000 (LLLL).
The carry look-ahead circuitry provides for cascading counters for n-bit synchronous applications without
additional gating. ENP, ENT, and a ripple-carry output (RCO) are instrumental in accomplishing this function.
Both ENP and ENT must be high to count, and ENT is fed forward to enable RCO. Enabling RCO produces a
high-level pulse while the count is maximum (9 or 15 with QA high). This high-level overflow ripple-carry pulse
can be used to enable successive cascaded stages. Transitions at ENP or ENT are allowed, regardless of the
level of CLK.
ORDERING INFORMATION{
TA
PACKAGE‡
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
−40°C to 85°C
TSSOP − PW
Tape and reel
SN74HC163IPWRQ1
HC163I
† For the most current package and ordering information, see the Package Option Addendum at the end of this
document, or see the TI web site at http://www.ti.com.
‡ Package drawings, thermal data, and symbolization are available at http://www.ti.com/packaging.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright 2008 Texas Instruments Incorporated
!"# $"%&! '#(
'"! ! $#!! $# )# # #*
"#
'' +,( '"! $!#- '# #!#&, !&"'#
#- && $##(
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1
SCLS584A − MAY 2004 − REVISED APRIL 2008
description/ordering information (continued)
This counter features a fully independent clock circuit. Changes at control inputs (ENP, ENT, or LOAD) that
modify the operating mode have no effect on the contents of the counter until clocking occurs. The function of
the counter (whether enabled, disabled, loading, or counting) is dictated solely by the conditions meeting the
stable setup and hold times.
logic diagram (positive logic)
LOAD
ENT
ENP
9
10
15
LD†
7
RCO
CK†
CLK
CLR
2
1
CK
LD
R
A
B
C
D
M1
G2
1, 2T/1C3
G4
3D
4R
3
M1
G2
1, 2T/1C3
G4
3D
4R
4
M1
G2
1, 2T/1C3
G4
3D
4R
5
M1
G2
1, 2T/1C3
G4
3D
4R
6
14
13
12
11
QA
QB
QC
QD
† For simplicity, routing of complementary signals LD and CK is not shown on this overall logic diagram. The uses of these signals are shown
on the logic diagram of the D/T flip-flops.
2
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SCLS584A − MAY 2004 − REVISED APRIL 2008
logic symbol, each D/T flip-flop
LD (Load)
M1
TE (Toggle Enable)
G2
CK (Clock)
1, 2T/1C3
G4
D (Inverted Data)
3D
R (Inverted Reset)
4R
Q (Output)
logic diagram, each D/T flip-flop (positive logic)
CK
LD
TE
LD†
TG
TG
LD†
Q
TG
TG
CK†
D
TG
CK†
CK†
TG
CK†
R
† The origins of LD and CK are shown in the logic diagram of the overall device.
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3
SCLS584A − MAY 2004 − REVISED APRIL 2008
typical clear, preset, count, and inhibit sequence
The following sequence is illustrated below:
1. Clear outputs to zero (synchronous)
2. Preset to binary 12
3. Count to 13, 14, 15, 0, 1, and 2
4. Inhibit
CLR
LOAD
A
Data
Inputs
B
C
D
CLK
ENP
ENT
QA
Data
Outputs
QB
QC
QD
RCO
12
13
14
15
0
1
2
Count
Sync Preset
Clear
Async
Clear
4
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Inhibit
SCLS584A − MAY 2004 − REVISED APRIL 2008
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)†
Supply voltage range, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −0.5 V to 7 V
Input clamp current, IIK (VI < 0 or VI > VCC) (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±20 mA
Output clamp current, IOK (VO < 0 or VO > VCC) (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±20 mA
Continuous output current, IO (VO = 0 to VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±25 mA
Continuous current through VCC or GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±50 mA
Package thermal impedance, θJA (see Note 2): PW package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 108°C/W
Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −65°C to 150°C
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51-7.
recommended operating conditions (see Note 3)
VCC
VIH
Supply voltage
VCC = 2 V
VCC = 4.5 V
High-level input voltage
VCC = 6 V
VCC = 2 V
VIL
VI
VO
∆t/∆v‡
MIN
NOM
MAX
2
5
6
Input voltage
3.15
0.5
1.35
Input transition rise/fall time
VCC = 6 V
V
1.8
0
VCC = 2 V
VCC = 4.5 V
V
4.2
0
Output voltage
V
1.5
VCC = 4.5 V
VCC = 6 V
Low-level input voltage
UNIT
VCC
VCC
V
V
1000
500
ns
400
TA
Operating free-air temperature
−40
85
°C
NOTE 3: All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.
‡ If this device is used in the threshold region (from VILmax = 0.5 V to VIHmin = 1.5 V), there is a potential to go into the wrong state from induced
grounding, causing double clocking. Operating with the inputs at tt = 1000 ns and VCC = 2 V does not damage the device; however, functionally,
the CLK inputs are not ensured while in the shift, count, or toggle operating modes.
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5
SCLS584A − MAY 2004 − REVISED APRIL 2008
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
IOH = −20 µA
VOH
VI = VIH or VIL
IOH = −4 mA
IOH = −5.2 mA
IOL = 20 µA
VOL
VI = VIH or VIL
IOL = 4 mA
IOL = 5.2 mA
II
ICC
VI = VCC or 0
VI = VCC or 0,
IO = 0
VCC
MIN
TA = 25°C
TYP
MAX
2V
1.9
1.998
1.9
4.5 V
4.4
4.499
4.4
6V
5.9
5.999
5.9
4.5 V
3.98
4.3
3.84
6V
5.48
5.8
MAX
UNIT
V
5.34
2V
0.002
0.1
0.1
4.5 V
0.001
0.1
0.1
6V
0.001
0.1
0.1
4.5 V
0.17
0.26
0.33
6V
0.15
0.26
0.33
6V
±0.1
±100
±1000
nA
8
80
µA
3
10
10
pF
6V
Ci
MIN
2 V to 6 V
V
timing requirements over recommended operating free-air temperature range (unless otherwise
noted)
VCC
fclock
tw
Clock frequency
Pulse duration
CLK high or low
A, B, C, or D
LOAD low
tsu
Setup time before CLK↑
ENP, ENT
CLR low
CLR inactive
th
6
Hold time, all synchronous inputs after CLK
CLK↑
POST OFFICE BOX 655303
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TA = 25°C
MIN
MAX
MIN
MAX
2V
6
5
4.5 V
31
25
6V
36
29
2V
80
100
4.5 V
16
20
6V
14
17
2V
150
190
4.5 V
30
38
6V
26
32
2V
135
170
4.5 V
27
34
6V
23
29
2V
170
215
4.5 V
34
43
6V
29
37
2V
160
200
4.5 V
32
40
6V
27
34
2V
160
200
4.5 V
32
40
6V
27
34
2V
0
0
4.5 V
0
0
6V
0
0
UNIT
MHz
ns
ns
ns
SCLS584A − MAY 2004 − REVISED APRIL 2008
switching characteristics over recommended operating free-air temperature range, CL = 50 pF
(unless otherwise noted) (see Figure 1)
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
fmax
RCO
CLK
tpd
Any Q
ENT
RCO
tt
Any
VCC
MIN
TA = 25°C
TYP
MAX
MIN
2V
6
14
5
4.5 V
31
40
25
6V
36
44
29
MAX
UNIT
MHz
2V
83
215
270
4.5 V
24
43
54
6V
20
37
46
2V
80
205
255
4.5 V
25
41
51
6V
21
35
43
2V
62
195
245
4.5 V
17
39
49
6V
14
33
42
2V
38
75
95
4.5 V
8
15
19
6V
6
13
16
ns
ns
operating characteristics, TA = 25°C
PARAMETER
Cpd
TEST CONDITIONS
Power dissipation capacitance
No load
POST OFFICE BOX 655303
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TYP
60
UNIT
pF
7
SCLS584A − MAY 2004 − REVISED APRIL 2008
PARAMETER MEASUREMENT INFORMATION
From Output
Under Test
VCC
High-Level
Pulse
Test
Point
50%
50%
0V
tw
CL = 50 pF
(see Note A)
VCC
Low-Level
Pulse
50%
50%
0V
LOAD CIRCUIT
VOLTAGE WAVEFORMS
PULSE DURATIONS
Input
VCC
50%
50%
0V
tPLH
Reference
Input
VCC
50%
In-Phase
Output
0V
tsu
Data
Input 50%
10%
90%
tr
tPHL
VCC
50%
10% 0 V
90%
90%
tr
th
90%
50%
10%
tPHL
Out-of-Phase
Output
90%
VOLTAGE WAVEFORMS
SETUP AND HOLD AND INPUT RISE AND FALL TIMES
tPLH
50%
10%
tf
tf
VOH
50%
10%
VOL
tf
50%
10%
90%
VOH
VOL
tr
VOLTAGE WAVEFORMS
PROPAGATION DELAY AND OUTPUT TRANSITION TIMES
NOTES: A. CL includes probe and test-fixture capacitance.
B. Phase relationships between waveforms were chosen arbitrarily. All input pulses are supplied by generators having the following
characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tr = 6 ns, tf = 6 ns.
C. For clock inputs, fmax is measured when the input duty cycle is 50%.
D. The outputs are measured one at a time, with one input transition per measurement.
E. tPLH and tPHL are the same as tpd.
Figure 1. Load Circuit and Voltage Waveforms
8
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SCLS584A − MAY 2004 − REVISED APRIL 2008
APPLICATION INFORMATION
n-bit synchronous counters
This application demonstrates how the look-ahead carry circuit can be used to implement a high-speed n-bit
counter. The SN74HC163 counts in binary. Virtually any count mode (modulo-N, N1-to-N2, N1-to-maximum) can
be used with this fast look-ahead circuit.
The application circuit shown in Figure 2 is not valid for clock frequencies above 18 MHz (at 25°C and
4.5-V VCC). The reason for this is that there is a glitch that is produced on the second stage’s RCO and every
succeeding stage’s RCO. This glitch is common to all HC vendors that Texas Instruments has evaluated, in
addition to the bipolar equivalents (LS, ALS, AS).
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9
SCLS584A − MAY 2004 − REVISED APRIL 2008
APPLICATION INFORMATION
LSB
CTR
CT=0
M1
3CT=MAX
G3
CLR
Clear (L)
LOAD
ENT
Count (H)/
Disable (L)
ENP
CLK
G4
C5/2,3,4+
Load (L)
A
1,5D [1]
QA
Count (H)/
Disable (L)
B
[2]
QB
C
[3]
QC
Clock
D
[4]
QD
CTR
CT=0
M1
3CT=MAX
G3
CLR
LOAD
ENT
ENP
CLK
RCO
G4
C5/2,3,4+
A
1,5D [1]
QA
B
[2]
QB
C
[3]
QC
D
[4]
QD
CTR
CT=0
M1
3CT=MAX
G3
CLR
LOAD
ENT
ENP
CLK
RCO
G4
C5/2,3,4+
A
1,5D [1]
QA
B
[2]
QB
C
[3]
QC
D
[4]
QD
CTR
CT=0
M1
3CT=MAX
G3
CLR
LOAD
ENT
ENP
CLK
RCO
G4
C5/2,3,4+
A
1,5D [1]
QA
B
[2]
QB
C
[3]
QC
D
[4]
QD
To More-Significant Stages
Figure 2
10
RCO
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SCLS584A − MAY 2004 − REVISED APRIL 2008
APPLICATION INFORMATION
n-bit synchronous counters (continued)
The glitch on RCO is caused because the propagation delay of the rising edge of QA of the second stage is
shorter than the propagation delay of the falling edge of ENT. RCO is the product of ENT, QA, QB, QC, and QD
(ENT × QA × QB × QC × QD). The resulting glitch is about 7 ns to 12 ns in duration. Figure 3 shows the condition
in which the glitch occurs. For simplicity, only two stages are being considered, but the results can be applied
to other stages. QB, QC, and QD of the first and second stage are at logic one, and QA of both stages are at logic
zero (1110 1110) after the first clock pulse. On the rising edge of the second clock pulse, QA and RCO of the
first stage go high. On the rising edge of the third clock pulse, QA and RCO of the first stage return to a low level,
and QA of the second stage goes to a high level. At this time, the glitch on RCO of the second stage appears
because of the race condition inside the chip.
1
2
3
4
5
CLK
ENT1
QB1, QC1, QD1
QA1
RCO1, ENT2
QB2, QC2, QD2
QA2
RCO2
Glitch (7−12 ns)
Figure 3
The glitch causes a problem in the next stage (stage three) if the glitch is still present when the next rising clock
edge appears (clock pulse 4). To ensure that this does not happen, the clock frequency must be less than the
inverse of the sum of the clock-to-RCO propagation delay and the glitch duration (tg). In other words,
fmax = 1/(tpd CLK-to-RCO + tg). For example, at 25°C at 4.5-V VCC, the clock-to-RCO propagation delay is
43 ns and the maximum duration of the glitch is 12 ns. Therefore, the maximum clock frequency that the
cascaded counters can use is 18 MHz. The following tables contain the fclock, tw, and fmax specifications for
applications that use more than two ’HC163 devices cascaded together.
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11
SCLS584A − MAY 2004 − REVISED APRIL 2008
APPLICATION INFORMATION
n-bit synchronous counters (continued)
timing requirements over recommended operating free-air temperature range (unless otherwise
noted)
VCC
fclock
tw
Clock frequency
Pulse duration, CLK high or low
TA = 25°C
MIN
MAX
MIN
MAX
2V
3.6
2.9
4.5 V
18
14
6V
21
17
2V
140
170
4.5 V
28
36
6V
24
30
UNIT
MHz
ns
switching characteristics over recommended operating free-air temperature range, CL = 50 pF
(unless otherwise noted) (see Note 4)
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
fmax
VCC
TA = 25°C
MIN
MAX
MIN
2V
3.6
2.9
4.5 V
18
14
6V
21
17
MAX
UNIT
MHz
NOTE 4: These limits apply only to applications that use more than two ’HC163 devices cascaded together.
If the SN74HC163 device is used as a single unit, or only two are cascaded together, then the maximum clock
frequency that the device can use is not limited because of the glitch. In these situations, the device can be
operated at the maximum specifications.
A glitch can appear on the RCO of a single SN74HC163 device, depending on the relationship of ENT to CLK.
Any application that uses RCO to drive any input, except an ENT of another cascaded SN74HC163 device, must
take this into consideration.
12
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PACKAGE OPTION ADDENDUM
www.ti.com
10-Dec-2020
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
(4/5)
(6)
SN74HC163IPWRG4Q1
ACTIVE
TSSOP
PW
16
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
HC163I
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of