SN65C3232, SN75C3232
SLLS540C – JULY 2002 – REVISED JUNE 2021
3-V to 5.5-V Multichannel RS-232 Compatible Line Driver and Receiver
1 Features
3 Description
•
•
•
•
•
•
The SN65C3232 and SN75C3232 consist of two
line drivers, two line receivers, and a dual chargepump circuit with ±15-kV ESD protection pin-to-pin
(serial-port connection pins, including GND). These
devices provide the electrical interface between
an asynchronous communication controller and the
serial-port connector. The charge pump and four small
external capacitors allow operation from a single 3-V
to 5.5-V supply. The devices operate at typical data
signaling rates up to 1 Mbit/s and a driver output slew
rate of 24 V/μs to 150 V/μs.
Operate with 3-V to 5.5-V VCC supply
Operate up to 1 Mbit/s
Low supply current: 300 μA typical
External capacitors: 4 × 0.1 μF
Accept 5-V logic input with 3.3-V supply
RS-232 bus-pin ESD protection exceeds
±15 kV using human-body model (HBM)
2 Applications
•
•
•
•
•
•
•
•
Industrial PCs
Wired networking
Data center and enterprise computing
Battery-powered systems
Notebooks
Laptops
Palmtop PCs
Hand-held equipment
Device Information
PART NUMBER
SN65C3232
SN75C3232
(1)
PACKAGE(1)
BODY SIZE (NOM)
D (SOIC) (16)
9.90 mm x 3.91 mm
DB (SSOP) (16)
6.20 mm x 5.30 mm
DW (SOIC) (16)
10.3 mm x 7.50 mm
PW (TSSOP) (16)
5.00 mm v 4.40 mm
For all available packages, see the orderable addendum at
the end of the data sheet.
spacer
spacer
3.3 V, 5 V
POWER
2
DIN
2
TX
RS232
2
ROUT
DOUT
RX
2
RIN
RS232
Simplified Diagram
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
SN65C3232, SN75C3232
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SLLS540C – JULY 2002 – REVISED JUNE 2021
Table of Contents
1 Features............................................................................1
2 Applications..................................................................... 1
3 Description.......................................................................1
4 Revision History.............................................................. 2
5 Pin Configuration and Functions...................................3
6 Specifications.................................................................. 4
6.1 Absolute Maximum Ratings........................................ 4
6.2 ESD Ratings............................................................... 4
6.3 Recommended Operating Conditions.........................4
6.4 Thermal Information....................................................5
6.5 Electrical Characteristics.............................................5
6.6 Driver Section - Electrical Characteristics...................6
6.7 Switching Characteristics............................................6
6.8 Receiver Section - Electrical Characteristics.............. 7
6.9 Switching Characteristics............................................7
6.10 Typical Characteristics.............................................. 8
7 Parameter Measurement Information............................ 9
8 Detailed Description......................................................10
8.1 Overview................................................................... 10
8.2 Functional Block Diagram......................................... 10
8.3 Feature Description...................................................10
8.4 Device Functional Modes..........................................11
9 Application and Implementation.................................. 12
9.1 Application Information............................................. 12
10 Layout...........................................................................14
10.1 Layout Guidelines................................................... 14
10.2 Layout Example...................................................... 14
11 Device and Documentation Support..........................15
11.1 Documentation Support.......................................... 15
11.2 Receiving Notification of Documentation Updates.. 15
11.3 Support Resources................................................. 15
11.4 Trademarks............................................................. 15
11.5 Electrostatic Discharge Caution.............................. 15
11.6 Glossary.................................................................. 15
12 Mechanical, Packaging, and Orderable
Information.................................................................... 15
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision B (November 2004) to Revision C (June 2021)
Page
• Added Device Information table, Pin Configuration and Functions section, ESD Ratings table, Feature
Description section, Device Functional Modes, Application and Implementation section, Power Supply
Recommendations section, Layout section, Device and Documentation Support section, and Mechanical,
Packaging, and Orderable Information section ..................................................................................................1
• Added Applications: Industrial PCs, Wired networking, and Data center and enterprise computing..................1
• Added thermal parameter values for all packages and changed the thermal parameters for D package in the
Thermal Information table...................................................................................................................................5
2
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SLLS540C – JULY 2002 – REVISED JUNE 2021
5 Pin Configuration and Functions
C1+
V+
C1−
C2+
C2−
V−
DOUT2
RIN2
1
16
2
15
3
14
4
13
5
12
6
11
7
10
8
9
VCC
GND
DOUT1
RIN1
ROUT1
DIN1
DIN2
ROUT2
Figure 5-1. D, DW, DB and PW Package, 16-Pin SOIC, SSOP and TSSOP, Top View
PIN
NAME
NO.
I/O
DESCRIPTION
C1+
1
—
Positive lead of C1 capacitor
V+
2
O
Positive charge pump output for storage capacitor only
C1–
3
—
Negative lead of C1 capacitor
C2+
4
—
Positive lead of C2 capacitor
C2–
5
—
Negative lead of C2 capacitor
V–
6
O
Negative charge pump output for storage capacitor only
DOUT2
7
O
RS232 line data output (to remote RS232 system)
RIN2
8
I
RS232 line data input (from remote RS232 system)
ROUT2
9
O
Logic data output (to UART)
DIN2
10
I
Logic data input (from UART)
DIN1
11
I
Logic data input (from UART)
ROUT1
12
O
Logic data output (to UART)
RIN1
13
I
RS232 line data input (from remote RS232 system)
DOUT1
14
O
RS232 line data output (to remote RS232 system)
GND
15
—
Ground
VCC
16
—
Supply Voltage, Connect to external 3-V to 5.5-V power supply
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6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted) (1)
Supply voltage range(2)
VCC
range(2)
V+
Positive-output supply voltage
V–
Negative-output supply voltage range(2)
V+ – V–
Supply voltage
Input voltage range
VO
Output voltage range
TJ
Operating virtual junction temperature
Tstg
Storage temperature range
(2)
MAX
6
V
–0.3
7
V
0.3
–7
V
13
V
difference(2)
VI
(1)
MIN
–0.3
Drivers
–0.3
6
Receivers
–25
25
–13.2
13.2
–0.3
VCC + 0.3
Drivers
Receivers
–65
UNIT
V
V
150
°C
150
°C
Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute MaximumRatings do not imply
functional operation of the device at these or any other conditions beyond those listed underRecommended Operating Conditions.
If used outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not be fully
functional, and this may affect device reliability,functionality, performance, and shorten the device lifetime.
All voltages are with respect to network GND.
6.2 ESD Ratings
VALUE
V(ESD)
(1)
(2)
Electrostatic discharge
All pins except RIN and DOUT
Human body model (HBM), per ANSI/
ESDA/JEDEC JS-001(1)
RIN and DOUT Pins
Charged-device model (CDM), per JEDEC
specification JESD22-C101(2)
UNIT
±3000
±15,000
All pins
V
±1500
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.3 Recommended Operating Conditions
See Typical Operating Circuit and Capacitor Values, See (1)
VCC = 3.3 V
Supply voltage
VIH
Driver high-level input voltage
DIN
VIL
Driver low-level input voltage
DIN
Driver input voltage
DIN
VI
TA
(1)
4
VCC = 5 V
VCC = 3.3 V
VCC = 5 V
NOM
MAX
3
3.3
3.6
4.5
5
5.5
2
UNIT
V
V
2.4
0.8
0
5.5
–25
25
SN75C3232
0
70
SN65C3232
–40
85
Receiver input voltage
Operating free-air temperature
MIN
V
V
°C
Test conditions are C1–C4 = 0.1 μF at VCC = 3.3 V ± 0.3 V; C1 = 0.047 μF, C2–C4 = 0.33 μF at VCC = 5 V ± 0.5 V.
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6.4 Thermal Information
SN65C3232, SN75C3232
THERMAL
METRIC(1)
PW (TSSOP)
D (SOIC)
DW (SOIC)
DB (SSOP)
16 PINS
16 PINS
16 PINS
16 PINS
UNIT
RθJA
Junction-to-ambient thermal resistance
108.0
85.9
57.0
46.0
°C/W
RθJCtop
Junction-to-case (top) thermal resistance
20.8
43.1
33.5
36.2
°C/W
RθJB
Junction-to-board thermal resistance
45.1
44.5
37.1
43.8
°C/W
ψJT
Junction-to-top characterization parameter
0.6
10.1
7.5
4.2
°C/W
ψJB
Junction-to-board characterization parameter
45.1
44.1
37.1
42.9
°C/W
RθJCbot
Junction-to-case (bottom) thermal resistance
–
–
–
–
°C/W
(1)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
6.5 Electrical Characteristics
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Typical
Operating Circuit and Capacitor Values)
PARAMETER(2)
ICC
(1)
(2)
Supply current
TEST CONDITIONS
No load, VCC = 3.3 V or 5 V
MIN
TYP(1)
MAX
0.3
1
UNIT
mA
All typical values are at VCC = 3.3 V or VCC = 5 V, and TA = 25°C.
Test conditions are C1–C4 = 0.1 μF at VCC = 3.3 V ± 0.3 V; C1 = 0.047 μF, C2–C4 = 0.33 μF at VCC = 5 V ± 0.5 V.
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6.6 Driver Section - Electrical Characteristics
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Typical
Operating Circuit and Capacitor Values)
TEST CONDITIONS(3)
PARAMETER
MIN
TYP(1)
5.4
VOH
High-level output voltage
DOUT at RL = 3 kΩ to GND,
DIN = GND
5
VOL
Low-level output voltage
DOUT at RL = 3 kΩ to GND,
DIN = VCC
–5
IIH
High-level input current
VI = VCC
IIL
Low-level input current
VI at GND
Short-circuit output current(2)
VO = 0 V
ro
Output resistance
VCC, V+, and V– = 0 V,
(1)
(2)
(3)
V
±1
μA
μA
±0.01
±1
VCC = 3.6 V
±35
±60
VCC = 5.5 V
±35
±90
VO = ±2 V
300
UNIT
V
–5.4
±0.01
IOS
MAX
10M
mA
Ω
All typical values are at VCC = 3.3 V or VCC = 5 V, and TA = 25°C.
Short-circuit durations should be controlled to prevent exceeding the device absolute power dissipation ratings, and not more than one
output should be shorted at a time.
Test conditions are C1–C4 = 0.1 μF at VCC = 3.3 V ± 0.3 V; C1 = 0.047 μF, C2–C4 = 0.33 μF at VCC = 5 V ± 0.5 V.
6.7 Switching Characteristics
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Typical
Operating Circuit and Capacitor Values )
TEST CONDITIONS(3)
PARAMETER
Maximum data rate RL = 3 kΩ,
(see Figure 7-1)
One DOUT switching
CL = 1000 pF
MAX
UNIT
250
CL = 250 pF,
VCC = 3 V to 4.5 V
1000
1000
CL = 1000 pF,
VCC = 4.5 V to 5.5 V
tsk(p)
Pulse skew(2)
CL = 150 pF to 2500 pF,
RL = 3 kΩ to 7 kΩ,
See Figure 7-2
SR(tr)
Slew rate,
transition region
(see Figure 7-1 )
RL = 3 kΩ to 7 kΩ,
CL = 150 pF to 1000 pF,
VCC = 3.3 V
(1)
(2)
(3)
6
MIN TYP(1)
kbit/s
300
18
ns
150
V/μs
All typical values are at VCC = 3.3 V or VCC = 5 V, and TA = 25°C.
Pulse skew is defined as |tPLH – tPHL| of each channel of the same device.
Test conditions are C1–C4 = 0.1 μF at VCC = 3.3 V ± 0.3 V; C1 = 0.047 μF, C2–C4 = 0.33 μF at VCC = 5 V ± 0.5 V.
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6.8 Receiver Section - Electrical Characteristics
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Typical
Operating Circuit and Capacitor Values)
TEST CONDITIONS(2)
PARAMETER
VOH
High-level output voltage
IOH = –1 mA
VOL
Low-level output voltage
IOL = 1.6 mA
VIT+
Positive-going input threshold voltage
VIT–
Negative-going input threshold voltage
Vhys
Input hysteresis (VIT+ – VIT–)
ri
Input resistance
(1)
(2)
MIN
TYP(1)
VCC – 0.6
VCC – 0.1
MAX
V
0.4
VCC = 3.3 V
1.5
2.4
VCC = 5 V
1.8
2.4
VCC = 3.3 V
0.6
1.2
VCC = 5 V
0.8
1.5
3
5
V
V
V
0.3
VI = ±3 V to ±25 V
UNIT
V
7
kΩ
All typical values are at VCC = 3.3 V or VCC = 5 V, and TA = 25°C.
Test conditions are C1–C4 = 0.1 μF at VCC = 3.3 V ± 0.3 V; C1 = 0.047 μF, C2–C4 = 0.33 μF at VCC = 5 V ± 0.5 V.
6.9 Switching Characteristics
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Typical
Operating Circuit and Capacitor Values)
TEST CONDITIONS(3)
PARAMETER
TYP(1)
UNIT
tPLH
Propagation delay time, low- to high-level output
CL = 150 pF
300
ns
tPHL
Propagation delay time, high- to low-level output
CL = 150 pF
300
ns
tsk(p)
Pulse skew(2)
300
ns
(1)
(2)
(3)
All typical values are at VCC = 3.3 V or VCC = 5 V, and TA = 25°C.
Pulse skew is defined as |tPLH – tPHL| of each channel of the same device.
Test conditions are C1–C4 = 0.1 μF at VCC = 3.3 V ± 0.3 V; C1 = 0.047 μF, C2–C4 = 0.33 μF at VCC = 5 V ± 0.5 V.
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6
0
5
±1
DOUT Voltage (V)
DOUT Voltage (V)
6.10 Typical Characteristics
4
3
2
1
±2
±3
±4
±5
VOH
VOL
0
±6
0
5
10
15
20
DOUT Current (mA)
25
VCC = 3.3 V
5
10
15
DOUT Current (mA)
20
25
C001
VCC = 3.3 V
Figure 6-1. DOUT VOH vs Load Current, Both
Drivers Loaded
8
0
C001
Figure 6-2. DOUT VOL vs Load Current, Both
Drivers Loaded
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7 Parameter Measurement Information
3V
Input
Generator
(see Note B)
1.5 V
RS-232
Output
50 Ω
RL
1.5 V
0V
CL
(see Note A)
tTHL
tTLH
3V
3V
Output
-3 V
-3 V
VOH
VOL
TEST CIRCUIT
VOLTAGE WAVEFORMS
SR(tr) =
A.
B.
t
THL
6V
or t
TLH
CL includes probe and jig capacitance.
The pulse generator has the following characteristics: PRR = 250 kbit/s, ZO = 50 Ω, 50% duty cycle, tr ≤ 10 ns, tf ≤ 10 ns.
Figure 7-1. Driver Slew Rate
3V
Input
Generator
(see Note B)
1.5 V
RS-232
Output
50 Ω
RL
1.5 V
0V
CL
(see Note A)
tPHL
tPLH
VOH
50%
Output
50%
VOL
TEST CIRCUIT
VOLTAGE WAVEFORMS
A.
B.
CL includes probe and jig capacitance.
The pulse generator has the following characteristics: PRR = 250 kbit/s, ZO = 50 Ω, 50% duty cycle, tr ≤ 10 ns, tf ≤ 10 ns.
Figure 7-2. Driver Pulse Skew
3V
Input
1.5 V
1.5 V
−3 V
Output
Generator
(see Note B)
50 Ω
tPHL
CL
(see Note A)
tPLH
VOH
50%
Output
50%
VOL
TEST CIRCUIT
A.
B.
VOLTAGE WAVEFORMS
CL includes probe and jig capacitance.
The pulse generator has the following characteristics: ZO = 50 Ω, 50% duty cycle, tr ≤ 10 ns, tf ≤ 10 ns.
Figure 7-3. Receiver Propagation Delay Times
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8 Detailed Description
8.1 Overview
The devices consists of two line drivers, two-line receivers, and a dual charge-pump circuit with IEC61000-4-2
ESD protection terminal to terminal (serial-port connection terminals, including GND). The device meets the
requirements of TIA/EIA-232-F and provides the electrical interface between an asynchronous communication
controller and the serial-port connector. The charge pump and four small external capacitors allow operation
from a single 3-V to 5.5-V supply. The device operates at data signaling rates up to 250 kbit/s and a maximum of
30-V/μs driver output slew rate. Outputs are protected against shorts to ground.
8.2 Functional Block Diagram
3.3 V, 5 V
POWER
2
DIN
2
TX
RS232
2
ROUT
DOUT
RX
2
RIN
RS232
8.3 Feature Description
8.3.1 Power
The power block increases, inverts, and regulates voltage at V+ and V– pins using a charge pump that requires
four external capacitors.
8.3.2 RS232 Driver
Two drivers interface standard logic level to RS232 levels. Both DIN inputs must be valid high or low.
8.3.3 RS232 Receiver
Two receivers interface RS232 levels to standard logic levels. An open input will result in a high output on ROUT.
Each RIN input includes an internal standard RS232 load.
10
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8.4 Device Functional Modes
Table 8-1 and Table 8-2 list the functional modes of the drivers and receivers of MAX3232E.
Table 8-1. Each Driver(1)
INPUT
DIN
(1)
OUTPUT
DOUT
L
H
H
L
H = high level, L = low level
Table 8-2. Each Receiver(1)
INPUT
RIN
(1)
OUTPUT
ROUT
L
H
H
L
Open
H
H = high level, L = low level,
Open = input disconnected or connected driver off
11
14
DIN1
DOUT1
10
7
DIN2
DOUT2
12
13
ROUT1
RIN1
9
8
ROUT2
RIN2
Figure 8-1. Logic Diagram
8.4.1 VCC Powered by 3 V to 5.5 V
The device is in normal operation.
8.4.2 VCC Unpowered, VCC = 0 V
When the device is unpowered, it can be safely connected to an active remote RS232 device.
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9 Application and Implementation
Note
Information in the following applications sections is not part of the TI component specification,
and TI does not warrant its accuracy or completeness. TI’s customers are responsible for
determining suitability of components for their purposes, as well as validating and testing their design
implementation to confirm system functionality.
9.1 Application Information
For proper operation, add capacitors as shown in Table 9-1.
9.1.1 Typical Application
ROUT and DIN connect to UART or general-purpose logic lines. RIN and DOUT lines connect to a RS232
connector or cable.
1
16
+ CBYPASS
− = 0.1µF
+
C1
VCC
C1+
2
(1) +
−
C3
V+
GND
15
−
3
4
14
DOUT1
C1−
13
+
C2
RIN1
C2+
5 kΩ
−
5 C2−
12
6
C4
−
V−
ROUT1
11
DIN1
+
DOUT2
RIN2
7
10
8
9
DIN2
ROUT2
5 kΩ
A.
C3 can be connected to VCC or GND
A. Resistor values shown are nominal.
B. Nonpolorized ceramic capacitors are acceptable. If polarized tantalum or electrolytic capacitors are used, they should be connected
as shown.
Figure 9-1. Typical Operating Circuit and Capacitor Values
Table 9-1. VCC vs Capacitor Values
VCC
12
C1
C2, C3, C4
3.3 V ± 0.3 V
0.1 µF
0.1 µF
5 V ± 0.5 V
0.047 µF
0.33 µF
3 V to 5.5 V
0.1 µF
0.47 µF
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9.1.1.1 Design Requirements
The recommended VCC is 3.3 V or 5 V. 3 V to 5.5 V is also possible
The maximum recommended bit rate is 250 kbit/s.
9.1.1.2 Detailed Design Procedure
All DIN inputs must be connected to valid low or high logic levels.
Select capacitor values based on VCC level for best performance.
9.1.1.3 Application Performance Plots
Voltage (V)
Figure 9-2 curves are for 3.3-V VCC and 250-kbit/s alternative bit data stream.
6
5
4
3
2
1
0
±1
±2
±3
±4
±5
±6
±7
±8
±9
DIN
DOUT to RIN
ROUT
0
1
2
3
4
5
6
7
8
Time ( s)
9
10
C001
Figure 9-2. 250 kbit/s Driver to Receiver Loopback Timing Waveform, VCC = 3.3 V
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10 Layout
10.1 Layout Guidelines
Keep the external capacitor traces short, specifically on the C1 and C2 nodes that have the fastest rise and fall
times.
10.2 Layout Example
Ground
C3
C1
1 C1+
VCC 16
2 V+
GND 15
3 C1–
DOUT1 14
4 C2+
RIN1 13
5 C2–
ROUT1 12
VCC
0.1µF
Ground
C2
Ground
6 V–
DIN1 11
7 DOUT2
DIN2 10
C4
8 RIN2
ROUT2 9
Figure 10-1. Layout Diagram
14
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11 Device and Documentation Support
TI offers an extensive line of development tools. Tools and software to evaluate the performance of the device,
generate code, and develop solutions are listed below.
11.1 Documentation Support
11.1.1 Related Documentation
11.1.1.1 Related Links
The table below lists quick access links. Categories include technical documents, support and community
resources, tools and software, and quick access to order now.
11.2 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on
Subscribe to updates to register and receive a weekly digest of any product information that has changed. For
change details, review the revision history included in any revised document.
11.3 Support Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
11.4 Trademarks
TI E2E™ is a trademark of Texas Instruments.
All trademarks are the property of their respective owners.
11.5 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
11.6 Glossary
TI Glossary
This glossary lists and explains terms, acronyms, and definitions.
12 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
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Copyright © 2021 Texas Instruments Incorporated
Product Folder Links: SN65C3232 SN75C3232
15
PACKAGE OPTION ADDENDUM
www.ti.com
14-Oct-2022
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
Samples
(4/5)
(6)
SN65C3232DBR
ACTIVE
SSOP
DB
16
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
65C3232
Samples
SN65C3232DR
ACTIVE
SOIC
D
16
2500
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
65C3232
Samples
SN65C3232DW
ACTIVE
SOIC
DW
16
40
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
65C3232
Samples
SN65C3232DWR
ACTIVE
SOIC
DW
16
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
65C3232
Samples
SN65C3232PWR
ACTIVE
TSSOP
PW
16
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
CB3232
Samples
SN75C3232DBR
ACTIVE
SSOP
DB
16
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
0 to 70
CA3232
Samples
SN75C3232DR
ACTIVE
SOIC
D
16
2500
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
0 to 70
75C3232
Samples
SN75C3232DW
ACTIVE
SOIC
DW
16
40
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
0 to 70
75C3232
Samples
SN75C3232DWR
ACTIVE
SOIC
DW
16
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
0 to 70
75C3232
Samples
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of