TAS5630BPHD

TAS5630BPHD

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    HTQFP64

  • 描述:

    TAS5630B 300W 立体声、400W 单声道、25V 至 52.5V 电源电压、模拟输入 D 级音频放大器

  • 数据手册
  • 价格&库存
TAS5630BPHD 数据手册
Product Folder Sample & Buy Support & Community Tools & Software Technical Documents TAS5630B SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 TAS5630B 300-W Stereo and 400-W Mono PurePath™ HD Analog-Input Power Stage 1 Features 3 Description • The TAS5630B device is a high-performance analoginput class-D amplifier with integrated closed-loop feedback technology (known as PurePath HD technology) with the ability to drive up to 300 W (1) stereo into 4-Ω to 8-Ω speakers from a single 50-V supply. 1 • • • • • • PurePath™ HD Enabled Integrated Feedback Provides: – Signal Bandwidth up to 80 kHz for HighFrequency Content From HD Sources – Ultralow 0.03% THD at 1 W into 4 Ω – Flat THD at All Frequencies for Natural Sound – 80-dB PSRR (BTL, No Input Signal) – > 100-dB (A-weighted) SNR – Click- and Pop-Free Start-up Multiple Configurations Possible on the Same PCB With Stuffing Options: – Mono Parallel Bridge-Tied Load (PBTL) – Stereo Bridge-Tied Load (BTL) – 2.1 Single-Ended Stereo Pair and BTL Subwoofer – Quad Single-Ended Outputs Total Output Power at 10% THD+N – 400 W in Mono PBTL Configuration – 300 W per Channel in Stereo BTL Configuration – 145 W per Channel in Quad Single-Ended Configuration High-Efficiency Power Stage (> 88%) With 60-mΩ Output MOSFETs Two Thermally Enhanced Package Options: – PHD (64-Pin QFP) – DKD (44-Pin PSOP3) Self-Protection Design (Including Undervoltage, Overtemperature, Clipping, and Short-Circuit Protection) With Error Reporting EMI Compliant When Used With Recommended System Design PurePath HD technology enables traditional ABamplifier performance (< 0.03% THD) levels while providing the power efficiency of traditional class-D amplifiers. Unlike traditional class-D amplifiers, the distortion curve does not increase until the output levels move into clipping. PurePath HD technology enables lower idle losses, making the device even more efficient. When coupled with TI’s class-G power-supply reference design for TAS563x, industry-leading levels of efficiency can be achieved. Device Information(1) PART NUMBER TAS5630B Mini Combo System AV Receivers DVD Receivers Active Speakers BODY SIZE (NOM) HSSOP (44) 15.90 mm × 11.00 mm HTQFP (64) 14.00 mm × 14.00 mm (1) For all available packages, see the orderable addendum at the end of the data sheet. Typical TAS5630B Application Block Diagram 3 ´ OPA1632 ♫♪ TM ANALOG AUDIO INPUT PurePath HD TAS5630B (2.1 Configuration) ♫♪ ♫♪ ±15 V 12 V 25 V–50 V TM PurePath HD Class-G Power Supply Ref. Design 2 Applications • • • • PACKAGE 110 VAC ® 240 VAC (1) Achievable output power levels are dependent on the thermal configuration of the target application. A high-performance thermal interface material between the exposed package heat slug and the heat sink should be used to achieve high output power levels. 1 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA. TAS5630B SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 www.ti.com Table of Contents 1 2 3 4 5 6 Features .................................................................. Applications ........................................................... Description ............................................................. Revision History..................................................... Pin Configuration and Functions ......................... Specifications......................................................... 6.1 6.2 6.3 6.4 6.5 6.6 6.7 6.8 6.9 7 1 1 1 2 4 7 Absolute Maximum Ratings ...................................... 7 ESD Ratings.............................................................. 7 Recommended Operating Conditions....................... 7 Thermal Information .................................................. 8 Electrical Characteristics........................................... 8 Audio Characteristics (BTL) .................................... 10 Audio Specification (Single-Ended Output) ............ 10 Audio Specification (PBTL) .................................... 11 Typical Characteristics ............................................ 11 Detailed Description ............................................ 14 7.1 7.2 7.3 7.4 8 Overview ................................................................. Functional Block Diagram ....................................... Feature Description................................................. Device Functional Modes........................................ 14 14 15 18 Application and Implementation ........................ 19 8.1 Application Information............................................ 19 8.2 Typical Application .................................................. 20 9 Power Supply Recommendations...................... 27 10 Layout................................................................... 27 10.1 Layout Guidelines ................................................. 27 10.2 Layout Example .................................................... 28 11 Device and Documentation Support ................. 30 11.1 Trademarks ........................................................... 30 11.2 Electrostatic Discharge Caution ............................ 30 11.3 Glossary ................................................................ 30 12 Mechanical, Packaging, and Orderable Information ........................................................... 30 4 Revision History Changes from Revision C (September 2012) to Revision D Page • Added Pin Configuration and Functions section, ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section .............................. 1 • Changed Thermal Information table data. .............................................................................................................................. 8 Changes from Revision B (November 2011) to Revision C Page • Changed Analog comparator reference node, VI_CM Vlaues From: MIN = 1.5 TYP = 1.75 MAX = 1.9 To: MIN = 1.75 TYP = 2 MAX = 2.15 ...................................................................................................................................................... 8 • Changed ANALOG INPUTS - VIN TYP value From 3.5 to 5 VPP............................................................................................ 8 • Changed the VIH and VIL Test Conditions From: INPUT_X, M1, M2, M3, RESET To: M1, M2, M3, RESET ........................ 9 • Deleted - RL = 2 Ω, 1% THD+N, unclipped output signal From PO in the Audio Specification (PBTL) table....................... 11 Changes from Revision A (November 2011) to Revision B Page • Changed the RINT_PU parameters from /OTW1 to VREG, /OTW2 to VREG, /SD to VREG to /OTW, /OTW1, /OTW2, /CLIP, READY, /SD to VRE.................................................................................................................................................... 9 • Added text to the PHD Package section. ............................................................................................................................. 17 • Added text to the DKD Package section .............................................................................................................................. 17 Changes from Original (November 2010) to Revision A Page • Changed Title From: 600-W MONO To: 400-W MONO......................................................................................................... 1 • Changed Feature From: 600 W per Channel in Mono PBTL Configuration To: 400 W per Channel in Mono PBTL Configuration .......................................................................................................................................................................... 1 • Changed the Pin One Location Package image .................................................................................................................... 5 • Changed RL(PBTL) Load Impedance Min value From: 1.6 Ω To: 2.4 Ω, and Typ value From 2 To: 3 Ω ............................. 7 • Added footnotes to the ROC table ......................................................................................................................................... 7 • Added ROCP information to the ROC Table ............................................................................................................................ 8 2 Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B TAS5630B www.ti.com SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 • Changed the IOC Typical Value From: 19 A To: 15 A............................................................................................................. 9 • Deleted - RL = 2 Ω, 10%, THD+N, clipped input signal From PO in the Audio Specification (PBTL) table.......................... 11 • Replaced the TYPICAL CHARACTERISTICS, PBTL CONFIGURATION graphs ............................................................... 12 • Added section - Click and Pop in SE-Mode ......................................................................................................................... 18 • Added section - PBTL Overload and Short Circuit ............................................................................................................... 18 • Replaced the PACKAGE HEAT DISSIPATION RATINGS table with the THERMAL INFORMATION table....................... 18 Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B 3 TAS5630B SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 www.ti.com 5 Pin Configuration and Functions DKD Package 44 Pins HSSOP Top View AGND VREG INPUT_C INPUT_D FREQ_ADJ OSC_IO+ OSC_IOSD OTW READY M1 M2 M3 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 44 pins PACKAGE (TOP VIEW) PSU_REF VDD OC_ADJ RESET C_STARTUP INPUT_A INPUT_B VI_CM GND GVDD_AB BST_A PVDD_A PVDD_A OUT_A OUT_A GND_A GND_B OUT_B PVDD_B BST_B BST_C PVDD_C OUT_C GND_C GND_D OUT_D OUT_D PVDD_D PVDD_D BST_D GVDD_CD 64-pins QFP package 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 GND_A GND_B GND_B OUT_B OUT_B PVDD_B PVDD_B BST_B BST_C PVDD_C PVDD_C OUT_C OUT_C GND_C GND_C GND_D OTW2 CLIP READY M1 M2 M3 GND GND GVDD_C GVDD_D BST_D OUT_D OUT_D PVDD_D PVDD_D GND_D OC_ADJ RESET C_STARTUP INPUT_A INPUT_B VI_CM GND AGND VREG INPUT_C INPUT_D FREQ_ADJ OSC_IO+ OSC_IOSD OTW1 64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49 VDD PSU_REF NC NC NC NC GND GND GVDD_B GVDD_A BST_A OUT_A OUT_A PVDD_A PVDD_A GND_A PHD Package 64 Pins HTQFP Top View 4 Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B TAS5630B www.ti.com SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 Electrical Pin 1 Pin 1 Marker White Dot Figure 1. Pin One Location PHD Package Pin Functions PIN NAME FUNCTION (1) DESCRIPTION HTQFP HSSOP AGND 8 10 P Analog ground BST_A 54 43 P HS bootstrap supply (BST), external 0.033-μF capacitor to OUT_A required. BST_B 41 34 P HS bootstrap supply (BST), external 0.033-μF capacitor to OUT_B required. BST_C 40 33 P HS bootstrap supply (BST), external 0.033-μF capacitor to OUT_C required. BST_D 27 24 P HS bootstrap supply (BST), external 0.033-μF capacitor to OUT_D required. CLIP 18 — O Clipping warning; open drain; active-low C_STARTUP 3 5 O Start-up ramp requires a charging capacitor of 4.7 nF to AGND in BTL mode FREQ_ADJ 12 14 I PWM frame-rate-programming pin requires resistor to AGND 7, 23, 24, 57, 58 9 P Ground GND_A 48, 49 38 P Power ground for half-bridge A GND_B 46, 47 37 P Power ground for half-bridge B GND_C 34, 35 30 P Power ground for half-bridge C GND_D 32, 33 29 P Power ground for half-bridge D GVDD_A 55 — P Gate-drive voltage supply requires 0.1-μF capacitor to GND_A GVDD_B 56 — P Gate drive voltage supply requires 0.1-μF capacitor to GND_B GVDD_C 25 — P Gate drive voltage supply requires 0.1-μF capacitor to GND_C GVDD_D 26 — P Gate drive voltage supply requires 0.1-μF capacitor to GND_D GVDD_AB — 44 P Gate drive voltage supply requires 0.22-μF capacitor to GND_A/GND_B GVDD_CD — 23 P Gate drive voltage supply requires 0.22-μF capacitor to GND_C/GND_D INPUT_A 4 6 I Input signal for half-bridge A INPUT_B 5 7 I Input signal for half-bridge B INPUT_C 10 12 I Input signal for half-bridge C INPUT_D 11 13 I Input signal for half-bridge D M1 20 20 I Mode selection M2 21 21 I Mode selection M3 22 22 I Mode selection NC 59–62 – — GND (1) No connect; pins may be grounded. I = Input, O = Output, P = Power Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B 5 TAS5630B SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 www.ti.com Pin Functions (continued) PIN NAME FUNCTION (1) DESCRIPTION HTQFP HSSOP OC_ADJ 1 3 O Analog overcurrent-programming pin requires resistor to AGND. 64-pin package (PHD) = 22 kΩ. 44-pin PSOP3 (DKD) = 24 kΩ OSC_IO+ 13 15 I/O Oscillator master/slave output/input OSC_IO– 14 16 I/O Oscillator master/slave output/input OTW — 18 O Overtemperature warning signal, open-drain, active-low OTW1 16 — O Overtemperature warning signal, open-drain, active-low OTW2 17 — O Overtemperature warning signal, open-drain, active-low OUT_A 52, 53 39, 40 O Output, half-bridge A OUT_B 44, 45 36 O Output, half-bridge B OUT_C 36, 37 31 O Output, half-bridge C OUT_D 28, 29 27, 28 O Output, half-bridge D 63 1 P PSU reference requires close decoupling of 330 pF to AGND. PVDD_A 50, 51 41, 42 P Power-supply input for half-bridge A requires close decoupling of 0.01-μF capacitor in parallel with 2.2-μF capacitor to GND_A. PVDD_B 42, 43 35 P Power-supply input for half-bridge B requires close decoupling of 0.01-μF capacitor in parallel with 2.2-μF capacitor to GND_B. PVDD_C 38, 39 32 P Power-supply input for half-bridge C requires close decoupling of 0.0- μF capacitor in parallel with 2.2-μF capacitor to GND_C. PVDD_D 30, 31 25, 26 P Power-supply input for half-bridge D requires close decoupling of 0.01-μF capacitor in parallel with 2.2-μF capacitor to GND_D. READY 19 19 O Normal operation; open-drain; active-high RESET 2 4 I Device reset input; active-low SD 15 17 O Shutdown signal, open-drain, active-low VDD 64 2 P Power supply for digital voltage regulator requires a 10-μF capacitor in parallel with a 0.1-μF capacitor to GND for decoupling. VI_CM 6 8 O Analog comparator reference node requires close decoupling of 1 nF to AGND. VREG 9 11 P Regulator supply filter pin requires 0.1-μF capacitor to AGND. PSU_REF 6 Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B TAS5630B www.ti.com SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 6 Specifications 6.1 Absolute Maximum Ratings over operating free-air temperature range unless otherwise noted (1) MIN MAX UNIT VDD to AGND –0.3 13.2 V GVDD to AGND –0.3 13.2 V PVDD_X to GND_X (2) –0.3 69 V OUT_X to GND_X (2) –0.3 69 V BST_X to GND_X (2) –0.3 82.2 V BST_X to GVDD_X (2) –0.3 69 V VREG to AGND –0.3 4.2 V GND_X to GND –0.3 0.3 V GND_X to AGND –0.3 0.3 V OC_ADJ, M1, M2, M3, OSC_IO+, OSC_IO–, FREQ_ADJ, VI_CM, C_STARTUP, PSU_REF to AGND –0.3 4.2 V INPUT_X –0.3 7 V RESET, SD, OTW1, OTW2, CLIP, READY to AGND –0.3 7 V 9 mA 0 150 °C –40 150 °C Continuous sink current (SD, OTW1, OTW2, CLIP, READY) Operating junction temperature, TJ Storage temperature, Tstg (1) (2) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. These voltages represents the dc voltage + peak ac waveform measured at the terminal of the device in all conditions. 6.2 ESD Ratings VALUE V(ESD) (1) (2) Electrostatic discharge Human body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1) ±2000 Charged-device model (CDM), per JEDEC specification JESD22C101 (2) ±500 UNIT V JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 6.3 Recommended Operating Conditions over operating free-air temperature range (unless otherwise noted) MIN NOM MAX UNIT PVDD_x Half-bridge supply DC supply voltage 25 50 52.5 V GVDD_x Supply for logic regulators and gate-drive circuitry DC supply voltage 10.8 12 13.2 V VDD Digital regulator supply voltage DC supply voltage 10.8 12 13.2 V 3.5 4 1.8 2 2.4 3 7 10 7 15 7 10 Nominal 385 400 415 AM1 315 333 350 AM2 260 300 335 RL(BTL) RL(SE) (2) RL(PBTL) Load impedance Output filter according to schematics in the application information section (1) (2) LOUTPUT(BTL) LOUTPUT(SE) (2) LOUTPUT(PBTL) Output filter inductance (1) Minimum output inductance at IOC (2) PWM frame rate selectable for AM interference avoidance; 1% resistor tolerance. fPWM Nominal; master mode RFREQ_ADJ (1) (2) PWM frame-rate-programming resistor Ω μH 9.9 10 10.1 AM1; master mode 19.8 20 20.2 AM2; master mode 29.7 30 30.3 kHz kΩ Values are for actual measured impedance over all combinations of tolerance, current and temperature and not simply the component rating. See additional details for SE and PBTL in System Design Considerations. Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B 7 TAS5630B SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 www.ti.com Recommended Operating Conditions (continued) over operating free-air temperature range (unless otherwise noted) MIN Voltage on FREQ_ADJ pin for slave mode operation VFREQ_ADJ Overcurrent-protection-programming resistor, cycle-by-cycle mode ROCP Overcurrent-protection-programming resistor, latching mode TJ NOM Slave mode MAX UNIT 3.3 V 64-pin QFP package (PHD) 22 33 44-Pin PSOP3 package (DKD) 24 33 PHD or DKD 47 68 0 125 Junction temperature kΩ °C 6.4 Thermal Information TAS5630B THERMAL METRIC (1) PHD (HTQFP) DKD (HSSOP) 64 PINS 44 PINS RθJA Junction-to-ambient thermal resistance 8.6 8.8 RθJC(top) Junction-to-case (top) thermal resistance 0.3 0.4 RθJB Junction-to-board thermal resistance 2.1 3.0 ψJT Junction-to-top characterization parameter 0.4 0.4 ψJB Junction-to-board characterization parameter 2.1 3.0 (1) UNIT °C/W For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report (SPRA953). 6.5 Electrical Characteristics PVDD_X = 50 V, GVDD_X = 12 V, VDD = 12 V, TC (Case temperature) = 75°C, fS = 400 kHz, unless otherwise specified. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT INTERNAL VOLTAGE REGULATOR AND CURRENT CONSUMPTION VREG Voltage regulator, only used as reference node, VREG VI_CM Analog comparator reference node, VI_CM IVDD VDD supply current IGVDD_X GVDD_x gate-supply current per half-bridge IPVDD_X Half-bridge supply current VDD = 12 V 3 3.3 3.6 V 1.75 2 2.15 V Operating, 50% duty cycle 22.5 Idle, reset mode 22.5 50% duty cycle 12.5 Reset mode mA mA 1.5 50% duty cycle with recommended output filter 13.3 mA Reset mode, No switching 870 μA 33 kΩ 5 VPP ANALOG INPUTS RIN Input resistance VIN Maximum input voltage with symmetrical output swing READY = HIGH IIN Maximum input current 342 μA G Voltage gain (VOUT/VIN) 23 dB OSCILLATOR Nominal, master mode fOSC_IO+ AM1, master mode FPWM × 10 AM2, master mode VIH High level input voltage VIL Low level input voltage 8 3.85 4 3.15 3.33 4.15 3.5 2.6 3 3.35 1.86 V 1.45 Submit Documentation Feedback MHz V Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B TAS5630B www.ti.com SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 Electrical Characteristics (continued) PVDD_X = 50 V, GVDD_X = 12 V, VDD = 12 V, TC (Case temperature) = 75°C, fS = 400 kHz, unless otherwise specified. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT OUTPUT-STAGE MOSFETs RDS(on) Drain-to-source resistance, low side (LS) Drain-to-source resistance, high side (HS) TJ = 25°C, excludes metallization resistance, GVDD = 12 V 60 100 60 100 mΩ I/O PROTECTION Undervoltage protection limit, GVDD_x and VDD Vuvp,G Vuvp,hyst (1) 9.5 V 0.6 V (1) Overtemperature warning 1 95 100 105 °C OTW2 (1) Overtemperature warning 2 115 125 135 °C OTWhyst (1) Temperature drop needed below OTW temperature for OTW to be inactive after OTW event OTW1 OTE (1) 25 Overtemperature error 145 155 OTE-OTW differential 30 OTEhyst (1) A reset must occur for SD to be released following an OTE event. 25 OLPC Overload protection counter °C 165 °C °C fPWM = 400 kHz 2.6 Resistor – programmable, nominal peak current in 1-Ω load, 64-pin QFP package (PHD) ROCP = 22 kΩ 15 Resistor – programmable, nominal peak current in 1-Ω load, 44-pin PSOP3 package (DKD), ROCP = 24 kΩ 15 Overcurrent limit protection, latched Resistor – programmable, nominal peak current in 1-Ω load, ROCP = 47 kΩ 15 IOCT Overcurrent response time Time from switching transition to flip-state induced by overcurrent 150 ns IPD Internal pulldown resistor at output of each half-bridge Connected when RESET is active to provide bootstrap charge. Not used in SE mode 3 mA Overcurrent limit protection IOC ms A STATIC DIGITAL SPECIFICATIONS VIH High-level input voltage VIL Low-level input voltage Ilkg Input leakage current M1, M2, M3, RESET 2 V 0.8 V 100 μA kΩ OTW/SHUTDOWN (SD) RINT_PU Internal pullup resistance, OTW, OTW1, OTW2, CLIP, READY, SD to VREG VOH High-level output voltage VOL Low-level output voltage IO = 4 mA FANOUT Device fanout OTW, OTW1, OTW2, SD, CLIP, READY No external pullup (1) Internal pullup resistor External pullup of 4.7 kΩ to 5 V 20 26 32 3 3.3 3.6 4.5 V 5 200 30 500 mV devices Specified by design. Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B 9 TAS5630B SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 www.ti.com 6.6 Audio Characteristics (BTL) PCB and system configuration are in accordance with recommended guidelines. Audio frequency = 1 kHz, PVDD_X = 50 V, GVDD_X = 12 V, RL = 4 Ω, fS = 400 kHz, ROC = 22 kΩ, TC = 75°C; output filter: LDEM = 7 μH, CDEM = 680 nF, MODE = 010, unless otherwise noted. PARAMETER PO TEST CONDITIONS Power output per channel MIN TYP MAX RL = 4 Ω, 10% THD+N, clipped output signal 300 RL = 6 Ω, 10% THD+N, clipped output signal 210 RL = 8 Ω, 10% THD+N, clipped output signal 160 RL = 4 Ω, 1% THD+N, unclipped output signal 240 RL = 6 Ω, 1% THD+N, unclipped output signal 160 RL = 8 Ω, 1% THD+N, unclipped output signal UNIT W 125 THD+N Total harmonic distortion + noise 1W Vn Output integrated noise A-weighted, AES17 filter, input capacitor grounded |VOS| Output offset voltage Inputs ac-coupled to AGND SNR Signal-to-noise ratio (1) A-weighted, AES17 filter 100 dB DNR Dynamic range A-weighted, AES17 filter 100 dB 2.7 W Pidle (1) (2) Power dissipation due to idle losses (IPVDD_X) 0.03% 20 PO = 0, four channels switching μV 270 (2) 50 mV SNR is calculated relative to 1% THD+N output level. Actual system idle losses also are affected by core losses of output inductors. 6.7 Audio Specification (Single-Ended Output) PCB and system configuration are in accordance with recommended guidelines. Audio frequency = 1kHz, PVDD_X = 50 V, GVDD_X = 12 V, RL = 4 Ω, fS = 400 kHz, ROC = 22 kΩ, TC = 75°C; output filter: LDEM = 15 μH, CDEM = 470 μF, MODE = 100, unless otherwise noted. PARAMETER PO Power output per channel TEST CONDITIONS MIN TYP MAX RL = 2 Ω, 10% THD+N, clipped output signal 145 RL = 3 Ω, 10% THD+N, clipped output signal 100 RL = 4 Ω, 10% THD+N, clipped output signal 75 RL = 2 Ω, 1% THD+N, unclipped output signal 110 RL = 3 Ω, 1% THD+N, unclipped output signal 75 RL = 4 Ω, 1% THD+N, unclipped output signal UNIT W 55 THD+N Total harmonic distortion + noise 1W Vn Output integrated noise A-weighted, AES17 filter, input capacitor grounded 340 μV SNR Signal-to-noise ratio (1) A-weighted, AES17 filter 93 dB DNR Dynamic range A-weighted, AES17 filter 93 dB Pidle Power dissipation due to idle losses (IPVDD_X) PO = 0, four channels switching (2) 2 W (1) (2) 10 0.07% SNR is calculated relative to 1% THD+N output level. Actual system idle losses are affected by core losses of output inductors. Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B TAS5630B www.ti.com SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 6.8 Audio Specification (PBTL) PCB and system configuration are in accordance with recommended guidelines. Audio frequency = 1 kHz, PVDD_X = 50 V, GVDD_X = 12 V, RL = 3 Ω, fS = 400 kHz, ROC = 22 kΩ, TC = 75°C; output filter: LDEM = 7 μH, CDEM = 1.5 μF, MODE = 101-10, unless otherwise noted. PARAMETER TEST CONDITIONS MIN TYP MAX RL = 3 Ω, 10% THD+N, clipped output signal 400 RL = 4 Ω, 10% THD+N, clipped output signal 300 RL = 3 Ω, 1% THD+N, unclipped output signal 310 UNIT PO Power output per channel THD+N Total harmonic distortion + noise 1W Vn Output integrated noise A-weighted 260 μV SNR Signal to noise ratio (1) A-weighted 100 dB DNR Dynamic range A-weighted 100 dB Pidle Power dissipation due to idle losses (IPVDD_X) PO = 0, four channels switching (2) 2.7 W RL = 4 Ω, 1% THD+N, unclipped output signal (1) (2) W 230 0.05% SNR is calculated relative to 1% THD-N output level. Actual system idle losses are affected by core losses of output inductors. 6.9 Typical Characteristics 6.9.1 BTL Configuration 340 10 THD+N − Total Harmonic Distortion + Noise − % 4Ω 6Ω 8Ω 4Ω 6Ω 8Ω 320 300 280 260 PO − Output Power − W 1 0.1 240 220 200 180 160 140 120 100 80 60 40 0.01 0.005 20m 100m 1 10 100 0 400 PO − Output Power − W 4Ω 6Ω 8Ω 200 Efficiency − % PO − Output Power − W 220 180 160 140 120 100 80 60 40 20 TC = 75°C 25 30 35 40 PVDD − Supply Voltage − V 35 40 PVDD − Supply Voltage − V 45 50 G001 240 0 30 Figure 3. Output Power vs Supply Voltage 300 260 25 G001 Figure 2. Total Harmonic + Noise vs Output Power 280 TC = 75°C THD+N at 10% 20 TC = 75°C 45 50 G001 Figure 4. Unclipped Output Power vs Supply Voltage 100 95 90 85 80 75 70 65 60 55 50 45 40 35 30 25 20 15 10 5 0 4Ω 6Ω 8Ω 0 100 TC = 25°C THD+N at 10% 200 300 400 500 2 Channel Output Power − W 600 700 G001 Figure 5. System Efficiency vs Output Power Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B 11 TAS5630B SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 www.ti.com 100 95 90 85 80 75 70 65 60 55 50 45 40 35 30 25 20 15 10 5 0 340 4Ω 6Ω 8Ω 320 300 280 260 PO − Output Power − W Power Loss − W BTL Configuration (continued) 240 220 200 180 160 140 120 100 80 60 0 100 200 300 400 500 2 Channel Output Power − W 600 4Ω 6Ω 8Ω 40 TC = 25°C THD+N at 10% 20 0 −10 700 0 10 THD+N at 10% 20 30 40 50 60 70 80 90 100 110 TC − Case Temperature − °C G001 Figure 6. System Power Loss vs Output Power G001 Figure 7. Output Power vs Case Temperature 0 TC = 75°C VREF = 35.36 V Sample Rate = 48kHz FFT Size = 16384 −10 −20 −30 4Ω Noise Amplitude − dB −40 −50 −60 −70 −80 −90 −100 −110 −120 −130 −140 −150 −160 0 2k 4k 6k 8k 10k 12k 14k 16k 18k 20k 22k f − Frequency − Hz G001 Figure 8. Noise Amplitude vs Frequency 6.9.2 SE Configuration 1 Channel Driven 170 2Ω 3Ω 4Ω 150 140 130 1 0.1 120 110 100 90 80 70 60 50 40 30 20 0.01 0.005 20m 100m 1 10 PO − Output Power − W TC = 75°C THD+N at 10% 10 TC = 75°C 0 100 200 G001 Figure 9. Total Harmonic Distortion + Noise vs Output Power 12 2Ω 3Ω 4Ω 160 PO − Output Power − W THD+N − Total Harmonic Distortion + Noise − % 10 25 30 35 40 PVDD − Supply Voltage − V 45 50 G001 Figure 10. Output Power vs Supply Voltage Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B TAS5630B www.ti.com SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 SE Configuration (continued) 180 170 160 150 140 PO − Output Power − W 130 120 110 100 90 80 70 60 50 40 30 2Ω 3Ω 4Ω 20 10 0 −10 0 10 THD+N at 10% 20 30 40 50 60 70 80 90 100 110 TC − Case Temperature − °C G001 Figure 11. Output Power vs Case Temperature 6.9.3 PBTL Configuration 500 3Ω 4Ω 6Ω 8Ω 3Ω 4Ω 6Ω 8Ω 450 400 1 PO − Output Power − W THD+N − Total Harmonic Distortion + Noise − % 10 0.1 350 300 250 200 150 100 50 0.01 TC = 75°C THD+N at 10% TC = 75°C 0.005 20m 100m 1 10 100 0 700 PO − Output Power − W 25 30 G001 35 40 PVDD − Supply Voltage − V 45 50 G001 Figure 12. Total Harmonic Distortion + Noise vs Output Power Figure 13. Output Power vs Supply Voltage 500 450 PO − Output Power − W 400 350 300 250 200 150 100 3Ω 4Ω 6Ω 8Ω 50 0 −10 0 10 THD+N at 10% 20 30 40 50 60 70 80 90 100 110 TC − Case Temperature − °C G001 Figure 14. Output Power vs Case Temperature Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B 13 TAS5630B SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 www.ti.com 7 Detailed Description 7.1 Overview TAS5630B is an analog input, audio PWM (class-D) amplifier. The output of the TAS5630B can be configured for single-ended, bridge-tied load (BTL) or parallel BTL (PBTL) output. It requires two rails for power supply, PVDD and 12 V (GVDD and VDD). The following functional block diagram shows interconnections of internal supplies, control logic, gate drives and power amplifiers. Detailed schematic can be viewed in TAS5630B EVM User's Guide (SLAU287). 7.2 Functional Block Diagram /CLIP READY /OTW1 /OTW2 /SD PROTECTION & I/O LOGIC M1 M2 M3 /RESET C_STARTUP VDD POWER-UP RESET UVP VREG VREG AGND TEMP SENSE STARTUP CONTROL GVDD_A GVDD _C GVDD_B OVER-LOAD PROTECTION GND GVDD_D CURRENT SENSE CB3C OC_ADJ OSC_SYNC_IO+ OSC_SYNC_IO- 4 OSCILLATOR PPSC FREQ_ADJ 4 4 PVDD_X OUT_X GND_X GVDD_A PWM ACTIVITY DETECTOR 4 PSU_REF BST_A PVDD_A PVDD_X PSU_FF VI_CM GND PWM RECEIVER CONTROL TIMING CONTROL GATE-DRIVE OUT_A GND_A GVDD_B INPUT_A ANALOG LOOP FILTER BST_B + PVDD_B + INPUT_D ANALOG LOOP FILTER - + ANALOG COMPARATOR MUX INPUT_C ANALOG LOOP FILTER ANALOG INPUT MUX INPUT_B PWM RECEIVER CONTROL TIMING CONTROL GATE-DRIVE GND_B GVDD_C BST_C PVDD_C PWM RECEIVER CONTROL TIMING CONTROL GATE-DRIVE + ANALOG LOOP FILTER OUT_B OUT_C GND_C - GVDD_D BST_D PVDD_D PWM RECEIVER CONTROL TIMING CONTROL GATE-DRIVE OUT_D GND_D 14 Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B TAS5630B www.ti.com SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 7.3 Feature Description 7.3.1 Power Supplies To facilitate system design, the TAS5630B needs only a 12-V supply in addition to the (typical) 50-V power-stage supply. An internal voltage regulator provides suitable voltage levels for the digital and low-voltage analog circuitry. Additionally, all circuitry requiring a floating voltage supply, for example, the high-side gate drive, is accommodated by built-in bootstrap circuitry requiring only an external capacitor for each half-bridge. To provide outstanding electrical and acoustical characteristics, the PWM signal path, including gate drive and output stage, is designed as identical, independent half-bridges. For this reason, each half-bridge has separate gate drive supply pins (GVDD_X), bootstrap pins (BST_X), and power-stage supply pins (PVDD_X). Furthermore, an additional pin (VDD) is provided as supply for all common circuits. Although supplied from the same 12-V source, it is highly recommended to separate GVDD_A, GVDD_B, GVDD_C, GVDD_D, and VDD on the printed-circuit board (PCB) by RC filters (see Typical Application for details). These RC filters provide the recommended high-frequency isolation. Special attention should be paid to placing all decoupling capacitors as close to their associated pins as possible. In general, inductance between the power supply pins and decoupling capacitors must be avoided. (See SLAU287 for additional information.) For a properly functioning bootstrap circuit, a small ceramic capacitor must be connected from each bootstrap pin (BST_X) to the power-stage output pin (OUT_X). When the power-stage output is low, the bootstrap capacitor is charged through an internal diode connected between the gate-drive power-supply pin (GVDD_X) and the bootstrap pin. When the power-stage output is high, the bootstrap capacitor potential is shifted above the output potential and thus provides a suitable voltage supply for the high-side gate driver. In an application with PWM switching frequencies in the range from 300 kHz to 400 kHz, it is recommended to use 33-nF ceramic capacitors, size 0603 or 0805, for the bootstrap supply. These 33-nF capacitors ensure sufficient energy storage, even during minimal PWM duty cycles, to keep the high-side power stage FET (LDMOS) fully turned on during the remaining part of the PWM cycle. Special attention should be paid to the power-stage power supply; this includes component selection, PCB placement, and routing. As indicated, each half-bridge has independent power-stage supply pins (PVDD_X). For optimal electrical performance, EMI compliance, and system reliability, it is important that each PVDD_X pin is decoupled with a 2.2-μF ceramic capacitor placed as close as possible to each supply pin. It is recommended to follow the PCB layout of the TAS5630B reference design. For additional information on recommended power supply and required components, see Typical Application. The 12-V supply should be from a low-noise, low-output-impedance voltage regulator. Likewise, the 50-V powerstage supply is assumed to have low output impedance and low noise. The power-supply sequence is not critical as facilitated by the internal power-on-reset circuit. Moreover, the TAS5630B is fully protected against erroneous power-stage turnon due to parasitic gate charging. Thus, voltage-supply ramp rates (dV/dt) are non-critical within the specified range (see Recommended Operating Conditions). 7.3.2 System Power-Up and Power-Down Sequence 7.3.2.1 Powering Up The TAS5630B does not require a power-up sequence. The outputs of the H-bridges remain in a highimpedance state until the gate-drive supply voltage (GVDD_X) and VDD voltage are above the undervoltage protection (UVP) voltage threshold (see Electrical Characteristics). Although not specifically required, it is recommended to hold RESET in a low state while powering up the device. This allows an internal circuit to charge the external bootstrap capacitors by enabling a weak pulldown of the half-bridge output. 7.3.2.2 Powering Down The TAS5630B does not require a power-down sequence. The device remains fully operational as long as the gate-drive supply (GVDD_X) voltage and VDD voltage are above the undervoltage protection (UVP) voltage threshold (see Electrical Characteristics). Although not specifically required, it is a good practice to hold RESET low during power down, thus preventing audible artifacts including pops or clicks. 7.3.3 Error Reporting The SD, OTW, OTW1, and OTW2 pins are active-low, open-drain outputs. Their function is for protection-mode signaling to a PWM controller or other system-control device. Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B 15 TAS5630B SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 www.ti.com Feature Description (continued) Any fault resulting in device shutdown is signaled by the SD pin going low. Likewise, OTW and OTW2 go low when the device junction temperature exceeds 125°C and OTW1 goes low when the junction temperature exceeds 100°C (see Table 1). Table 1. Error Reporting SD OTW1 OTW2, OTW 0 0 0 Overtemperature (OTE) or overload (OLP) or undervoltage (UVP) 0 0 1 Overload (OLP) or undervoltage (UVP). Junction temperature higher than 100°C (overtemperature warning) 0 1 1 Overload (OLP) or undervoltage (UVP) 1 0 0 Junction temperature higher than 125°C (overtemperature warning) 1 0 1 Junction temperature higher than 100°C (overtemperature warning) 1 1 1 Junction temperature lower than 100°C and no OLP or UVP faults (normal operation) DESCRIPTION Note that asserting either RESET low forces the SD signal high, independent of faults being present. TI recommends monitoring the OTW signal using the system microcontroller and responding to an overtemperature warning signal by, for example, turning down the volume to prevent further heating of the device resulting in device shutdown (OTE). To reduce external component count, an internal pullup resistor to 3.3 V is provided on both SD and OTW outputs. Level compliance for 5-V logic can be obtained by adding external pullup resistors to 5 V (see Electrical Characteristics for further specifications). 7.3.4 Device Protection System The TAS5630B contains advanced protection circuitry carefully designed to facilitate system integration and ease of use, as well as to safeguard the device from permanent failure due to a wide range of fault conditions such as short circuits, overload, overtemperature, and undervoltage. The TAS5630B responds to a fault by immediately setting the power stage in a high-impedance (Hi-Z) state and asserting the SD pin low. In situations other than overload and overtemperature error (OTE), the device automatically recovers when the fault condition has been removed, that is, the supply voltage has increased. The device functions on errors, as shown in the following table. Table 2. Device Protection System BTL Mode Local error in A B C D PBTL Mode Turns Off or in A+B C+D Local error in Turns Off or in A B C SE Mode Local error in Turns Off or in A A+B+C+D D B C D A+B C+D Bootstrap UVP does not shut down according to the table; it shuts down the respective half-bridge. 16 Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B TAS5630B www.ti.com SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 7.3.5 Pin-to-Pin Short-Circuit Protection (PPSC) The PPSC detection system protects the device from permanent damage if a power output pin (OUT_X) is shorted to GND_X or PVDD_X. For comparison, the OC protection system detects an overcurrent after the demodulation filter, whereas PPSC detects shorts directly at the pin before the filter. PPSC detection is performed at startup, that is, when VDD is supplied; consequently, a short to either GND_X or PVDD_X after system startup does not activate the PPSC detection system. When PPSC detection is activated by a short on the output, all half-bridges are kept in a Hi-Z state until the short is removed; the device then continues the startup sequence and starts switching. The detection is controlled globally by a two-step sequence. The first step ensures that there are no shorts from OUT_X to GND_X; the second step tests that there are no shorts from OUT_X to PVDD_X. The total duration of this process is roughly proportional to the capacitance of the output LC filter. The typical duration is
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