TAS5715
www.ti.com
SLOS645 – AUGUST 2010
25-W DIGITAL AUDIO POWER AMPLIFIER WITH EQ AND DRC
Check for Samples: TAS5715
FEATURES
1
•
•
•
Audio Input/Output
– 25-W Into an 8-Ω Load From an 18-V Supply
– 50-W Support in PBTL Mode With 4-Ω Load
– Wide PVDD Range, From 8 V to 26 V
– Efficient Class-D Operation Eliminates
Need for Heatsinks
– Requires Only 3.3 V and PVDD
– One Serial Audio Input (Two Audio
Channels)
– I2C Address Selection via PIN (Chip Select)
– Supports 8-kHz to 48-kHz Sample Rate
(LJ/RJ/I2S)
– Headphone PWM Outputs
– Dedicated Pin for External
Headphone-Amplifier Shutdown
– Single-Filter PBTL Support
Audio/PWM Processing
– Independent Channel Volume Controls With
24-dB to Mute
– Independent Headphone Volume
– Programmable Two-Band Dynamic Range
Control
– Up to Eight User-Programmable Biquads
per Channel
– Programmable Coefficients for DRC Filters
– DC Blocking Filters and PWM DC Detect
– CRC Checksum to Detect Biquad
Coefficient Corruption
General Features
– Serial Control Interface Operational Without
MCLK
– Factory-Trimmed Internal Oscillator for
Automatic Rate Detection
– Surface Mount, 48-Pin, 7-mm × 7-mm
HTQFP Package
– Thermal and Short-Circuit Protection
•
A
Benefits
– EQ: Speaker Equalization Improves Audio
Performance
– DRC: Automatic Gain Limiter. Can Be Used
As Power Limiter. Enables Speaker
Protection, Easy Listening
– Two-Band DRC: Set Two Different
Thresholds for Low- and High-Frequency
Content
– Autobank Switching: Preload Coefficients
for Different Sample Rates. No Need to
Write New Coefficients to the Part When
Sample Rate Changes
– Autodetect: Automatically Detects
Sample-Rate Changes. No Need for
External Microprocessor Intervention
– Single-Filter PBTL Support Reduces BOM
Cost
– Thgermal Dissipation, Improving System
Stability
DESCRIPTION
The TAS5715 is a 25-W, efficient, digital audio-power
amplifier for driving stereo bridge-tied speakers. One
serial data input allows processing of up to two
discrete audio channels and seamless integration to
most digital audio processors and MPEG decoders.
The device accepts a wide range of input data and
data rates. A fully programmable data path routes
these channels to the internal speaker drivers.
The TAS5715 is a slave-only device receiving all
clocks from external sources. The TAS5715 operates
with a PWM carrier between a 384-kHz switching rate
and a 352-KHz switching rate, depending on the input
sample rate. Oversampling combined with a
fourth-order noise shaper provides a flat noise floor
and excellent dynamic range from 20 Hz to 20 kHz.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2010, Texas Instruments Incorporated
TAS5715
SLOS645 – AUGUST 2010
www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
SIMPLIFIED APPLICATION DIAGRAM
3.3 V
8 V–26 V
AVDD/DVDD
AVCC/PVCC
OUT_A
LRCLK
Digital
Audio
Source
SCLK
BST_A
LCBTL
MCLK
SDIN
BST_B
OUT_B
2
I C
Control
SDA
OUT_C
SCL
BST_C
RESET
Control
Inputs
LCBTL
BST_D
PDN
OUT_D
PLL_FLTP
TPA6110A2
(HP Amplifier)
Loop
Filter
(1)
PLL_FLTM
HPR_PWM
HPL_PWM
RC
Filter
A_SEL/HP_SD
B0264-12
(1)
See the TAS5715 User's Guide for loop-filter values.
2
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
TAS5715
www.ti.com
SLOS645 – AUGUST 2010
FUNCTIONAL VIEW
OUT_A
th
SDIN
Serial
Audio
Port
Digital Audio Processor
(DAP)
S
R
C
4
Order
Noise
Shaper
and
PWM
2´ HB
FET Out
OUT_B
OUT_C
2´ HB
FET Out
OUT_D
Protection
Logic
MCLK
SCLK
LRCLK
SDA
SCL
Click and Pop
Control
Sample Rate
Autodetect
and PLL
Serial
Control
HPL
Headphone
Buffers
HPR
Microcontroller
Based
System
Control
Terminal Control
B0262-09
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
3
TAS5715
SLOS645 – AUGUST 2010
www.ti.com
FAULT
Undervoltage
Protection
FAULT
4
4
Power
On
Reset
Protection
and
I/O Logic
AGND
Temp.
Sense
GND
VALID
Overcurrent
Protection
Isense
BST_D
PVDD_D
PWM
Rcv
Ctrl
Timing
PWM Controller
PWM_D
Gate
Drive
OUT_D
Pulldown Resistor
PGND_CD
GVDD
Regulator
GVDD_OUT
BST_C
PVDD_C
PWM_C
PWM
Rcv
Ctrl
Timing
Gate
Drive
OUT_C
Pulldown Resistor
PGND_CD
BST_B
PVDD_B
PWM_B
PWM
Rcv
Ctrl
Timing
Gate
Drive
OUT_B
Pulldown Resistor
GVDD
Regulator
PGND_AB
BST_A
PVDD_A
PWM_A
PWM
Rcv
Ctrl
Timing
Gate
Drive
OUT_A
Pulldown Resistor
PGND_AB
B0034-06
Figure 1. Power Stage Functional Block Diagram
4
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
R
L
0x77
0x76
0x73
0x72
+
+
0x30–0x36
7BQ
0x29–0x2F
7BQ
+
Auto-lp
(0x46 Bit 5)
0
–1
+
2
1BQ
5D
1BQ
59
I C Subaddress in Red
0x74
0x70
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
+
+
+
+
Volc config reg 0x0E
Vol
DRC
Vol
Vol2
DRC
Vol1
0x52[0]
0x52[1]
0x51[0]
0x51[1]
+
+
2
I C:57
VDISTB
2
B0321-07
I C:56
VDISTA
TAS5715
www.ti.com
SLOS645 – AUGUST 2010
DAP Process Structure
Submit Documentation Feedback
5
TAS5715
SLOS645 – AUGUST 2010
www.ti.com
DEVICE INFORMATION
PIN ASSIGNMENT
PGND_CD
PGND_CD
PVDD_C
OUT_C
BST_C
PVDD_C
BST_B
PVDD_B
PVDD_B
PGND_AB
OUT_B
PGND_AB
PHP Package
(Top View)
48 47 46 45 44 43 42 41 40 39 38 37
OUT_A
1
36
OUT_D
PVDD_A
2
35
PVDD_D
PVDD_A
3
34
PVDD_D
BST_A
4
33
BST_D
HPR
5
32
GVDD_OUT
SSTIMER
6
31
VREG
30
AGND
TAS5715
HPL
7
PBTL
8
29
GND
AVSS
9
28
DVSS
PLL_FLTM
10
27
DVDD
PLL_FLTP
11
26
STEST
VR_ANA
12
25
RESET
SCL
SDA
SDIN
SCLK
LRCLK
PDN
VR_DIG
DVSSO
OSC_RES
MCLK
AVDD
A_SEL
13 14 15 16 17 18 19 20 21 22 23 24
P0075-10
PIN FUNCTIONS
PIN
NAME
NO.
TYPE (1)
5-V
TERMINATION (2)
TOLERANT
DESCRIPTION
AGND
30
P
A_SEL
14
DIO
AVDD
13
P
3.3-V analog power supply
AVSS
9
P
Analog 3.3-V supply ground
BST_A
4
P
High-side bootstrap supply for half-bridge A
BST_B
43
P
High-side bootstrap supply for half-bridge B
BST_C
42
P
High-side bootstrap supply for half-bridge C
BST_D
33
P
High-side bootstrap supply for half-bridge D
DVDD
27
P
3.3-V digital power supply
DVSSO
17
P
Oscillator ground
DVSS
28
P
Digital ground
(1)
(2)
6
Analog ground for power stage
This pin is monitored on the rising edge of RESET. A value of 0
makes the I2C dev address 0x54 and a value of 1 makes it 0x56.
This pin can be re-used after reset as external HP amplifer shutdown
signal.
TYPE: A = analog; D = 3.3-V digital; P = power/ground/decoupling; I = input; O = output
All pullups are weak pullups and all pulldowns are weak pulldowns. The pullups and pulldowns are included to assure proper input logic
levels if the pins are left unconnected (pullups → logic 1 input; pulldowns → logic 0 input).
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
TAS5715
www.ti.com
SLOS645 – AUGUST 2010
PIN FUNCTIONS (continued)
PIN
NAME
NO.
TYPE (1)
5-V
TERMINATION (2)
TOLERANT
DESCRIPTION
GND
29
P
Analog ground for power stage
GVDD_OUT
32
P
Gate drive internal regulator output
HPL
7
AO
HPR
5
AO
LRCLK
20
DI
5-V
Pulldown
Input serial audio data left/right clock (sample rate clock)
MCLK
15
DI
5-V
Pulldown
Master clock input
OSC_RES
16
AO
OUT_A
1
O
Output, half-bridge A
OUT_B
46
O
Output, half-bridge B
OUT_C
39
O
Output, half-bridge C
OUT_D
36
O
Output, half-bridge D
PBTL
8
DI
Low means BTL or SE mode; high means PBTL mode. Information
goes directly to power stage.
PDN
19
DI
PGND_AB
47, 48
P
Power ground for half-bridges A and B
PGND_CD
37, 38
P
Power ground for half-bridges C and D
PLL_FLTM
10
AO
PLL negative loop filter terminal
PLL_FLTP
11
AO
PLL positive loop filter terminal
PVDD_A
2, 3
P
Power supply input for half-bridge output A
PVDD_B
44, 45
P
Power supply input for half-bridge output B
PVDD_C
40, 41
P
Power supply input for half-bridge output C
PVDD_D
Headphone PWM out (HPL) (leave floating if unused)
Headphone PWM out (HPR) (leave floating if unused)
Oscillator trim resistor. Connect an 18-kΩ 1% resistor to DVSSO.
5-V
Pullup
Power down, active-low. PDN prepares the device for loss of power
supplies by shutting down the Noise Shaper and initiating PWM stop
sequence.
34, 35
P
RESET
25
DI
5-V
Power supply input for half-bridge output D
SCL
24
DI
5-V
SCLK
21
DI
5-V
SDA
23
DIO
5-V
SDIN
22
DI
5-V
SSTIMER
6
AI
Controls ramp time of OUT_x to minimize pop. Leave this pin
floating for BD mode. Requires capacitor of 2.2 nF to GND in AD
mode. The capacitor determines the ramp time.
STEST
26
DI
Factory test pin. Connect directly to DVSS.
VR_ANA
12
P
Internally regulated 1.8-V analog supply voltage. This pin must not
be used to power external devices.
VR_DIG
18
P
Internally regulated 1.8-V digital supply voltage. This pin must not be
used to power external devices.
VREG
31
P
Digital regulator output. Not to be used for powering external
circuitry.
Pullup
Reset, active-low. A system reset is generated by applying a logic
low to this pin. RESET is an asynchronous control signal that
restores the DAP to its default conditions, and places the PWM in
the hard mute state (tristated).
I2C serial control clock input
Pulldown
Serial audio data clock (shift clock). SCLK is the serial audio port
input data bit clock.
I2C serial control data interface input/output
Pulldown
Serial audio data input. SDIN supports three discrete (stereo) data
formats.
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
7
TAS5715
SLOS645 – AUGUST 2010
www.ti.com
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted)
Supply voltage
(1)
VALUE
UNIT
DVDD, AVDD
–0.3 to 3.6
V
PVDD_x
–0.3 to 30
V
–0.5 to DVDD + 0.5
V
–0.5 to DVDD + 2.5 (3)
V
(3)
V
3.3-V digital input
5-V tolerant (2) digital input (except MCLK)
Input voltage
5-V tolerant MCLK input
–0.5 to AVDD + 2.5
OUT_x to PGND_x
32 (4)
V
BST_x to PGND_x
43 (4)
V
Input clamp current, IIK
±20
mA
Output clamp current, IOK
±20
mA
0 to 85
°C
0 to 150
°C
–40 to 125
°C
Operating free-air temperature
Operating junction temperature range
Storage temperature range, Tstg
(1)
Stresses beyond those listed under absolute ratings may cause permanent damage to the device. These are stress ratings only and
functional operation of the device at these or any other conditions beyond those indicated under recommended operation conditions are
not implied. Exposure to absolute-maximum conditions for extended periods may affect device reliability.
5-V tolerant inputs are PDN, RESET, SCLK, LRCLK, MCLK, SDIN, SDA, and SCL.
Maximum pin voltage should not exceed 6.0V
DC voltage + peak ac waveform measured at the pin should be below the allowed limit for all conditions.
(2)
(3)
(4)
DISSIPATION RATINGS (1)
PACKAGE
DERATING FACTOR
ABOVE TA = 25°C
TA ≤ 25°C
POWER RATING
TA = 45°C
POWER RATING
TA = 70°C
POWER RATING
7-mm × 7-mm HTQFP
20 mW/°C
2W
1.6 W
1.1 W
(1)
This data was taken using 1 oz trace and copper pad that is soldered directly to a JEDEC standard high-k PCB. The thermal pad must
be soldered to a thermal land on the printed-circuit board. See TI Technical Briefs SLMA002 for more information about using the
HTQFP thermal pad
RECOMMENDED OPERATING CONDITIONS
MIN
NOM
MAX
Digital/analog supply voltage
DVDD, AVDD
3
3.3
3.6
V
Half-bridge supply voltage
PVDD_x
8
26
V
VIH
High-level input voltage
5-V tolerant
2
VIL
Low-level input voltage
5-V tolerant
0.8
V
TA
Operating ambient temperature range
0
85
°C
Operating junction temperature range
0
125
°C
TJ
(1)
RL (BTL)
LO (BTL)
(1)
Load impedance
Output filter: L = 15 mH, C = 680 nF.
Output-filter inductance
Minimum output inductance under
short-circuit condition
4
UNIT
V
Ω
8
10
mH
Continuous operation above the recommended junction temperature may result in reduced reliability and/or lifetime of the device.
PWM OPERATION AT RECOMMENDED OPERATING CONDITIONS
PARAMETER
Output sample rate
8
TEST CONDITIONS
VALUE
UNIT
11.025/22.05/44.1-kHz data rate ±1%
352.8
kHz
48/24/12/8/16/32-kHz data rate ±1%
384
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
TAS5715
www.ti.com
SLOS645 – AUGUST 2010
PLL INPUT PARAMETERS AND EXTERNAL FILTER COMPONENTS
PARAMETER
fMCLKI
tr /
tf(MCLK)
TEST CONDITIONS
MIN
MCLK Frequency
2.8224
MCLK duty cycle
40%
TYP
50%
Rise/fall time for MCLK
LRCLK allowable drift before LRCLK reset
External PLL filter capacitor C1
SMD 0603 Y5V
External PLL filter capacitor C2
External PLL filter resistor R
MAX
UNIT
12.288
MHz
60%
5
ns
4
MCLKs
47
nF
SMD 0603 Y5V
4.7
nF
SMD 0603, metal film
470
Ω
ELECTRICAL CHARACTERISTICS
DC Characteristics
TA = 25°, PVCC_x = 18 V, DVDD = AVDD = 3.3 V, RL= 8 Ω, BTL AD Mode, fS = 48 KHz (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VOH
High-level output voltage
A_SEL and SDA
IOH = –4 mA
DVDD = 3 V
VOL
Low-level output voltage
A_SEL and SDA
IOL = 4 mA
DVDD = 3 V
0.5
V
IIL
Low-level input current
VI < VIL ; DVDD = AVDD
= 3.6V
75
mA
IIH
High-level input current
VI > VIH ; DVDD =
AVDD = 3.6V
75 (1)
mA
IDD
3.3 V supply current
3.3 V supply voltage (DVDD,
AVDD)
IPVDD
Supply current
No load (PVDD_x)
rDS(on)
(2)
2.4
V
Normal mode
56
85
Reset (RESET = low,
PDN = high)
26
40
Normal mode
40
85
5
13
Reset (RESET = low,
PDN = high)
Drain-to-source resistance, LS TJ = 25°C, includes metallization resistance
110
Drain-to-source resistance,
HS
TJ = 25°C, includes metallization resistance
110
mA
mA
mΩ
I/O Protection
Vuvp
Undervoltage protection limit
PVDD falling
7.2
Vuvp,hyst
Undervoltage protection limit
PVDD rising
7.6
V
OTE (3)
Overtemperature error
150
°C
30
°C
0.63
ms
4.5
A
150
ns
3
kΩ
OTEHYST
(3)
Extra temperature drop
required to recover from error
OLPC
Overload protection counter
IOC
Overcurrent limit protection
IOCT
Overcurrent response time
RPD
Internal pulldown resistor at
the output of each half-bridge
(1)
(2)
(3)
fPWM = 384 kHz
Connected when drivers are tristated to provide bootstrap
capacitor charge.
V
IIH for the PBTL pin has a maximum limit of 200 µA due to an internal pulldown on the pin.
This does not include bond-wire or pin resistance.
Specified by design
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
9
TAS5715
SLOS645 – AUGUST 2010
www.ti.com
AC Characteristics (BTL, PBTL)
PVDD_x = 18 V, BTL AD mode, fS = 48 KHz, RL = 8 Ω, ROCP = 22 KΩ, CBST = 33 nF, audio frequency = 1 kHz, AES17 filter,
fPWM = 384 kHz, TA = 25°C (unless otherwise specified). All performance is in accordance with recommended operating
conditions (unless otherwise specified).
PARAMETER
TEST CONDITIONS
MIN
21.5
PVDD = 18 V, 7% THD, 1-kHz input signal
20.3
PVDD = 12 V, 10% THD, 1-kHz input signal
9.6
PVDD = 12 V, 7% THD, 1-kHz input signal
9.1
PVDD = 8 V, 10% THD, 1-kHz input signal
4.2
PVDD = 8 V, 7% THD, 1-kHz input signal
PO
Power output per channel
THD+N
Total harmonic distortion + noise
Vn
Output integrated noise (rms)
Crosstalk
SNR
(1)
10
Signal-to-noise ratio
(1)
TYP
PVDD = 18 V, 10% THD, 1-kHz input signal
UNIT
4
PBTL mode, PVDD = 12 V, RL = 4 Ω,
10% THD, 1-kHz input signal
18.7
PBTL mode, PVDD = 12 V, RL = 4 Ω,
7% THD, 1-kHz input signal
17.7
PBTL mode, PVDD = 18 V, RL = 4 Ω,
10% THD, 1-kHz input signal
41.5
PBTL mode, PVDD = 18 V, RL = 4 Ω,
7% THD, 1-kHz input signal
39
PVDD = 18 V, PO = 1 W
0.07%
PVDD = 12 V, PO = 1 W
0.03%
PVDD = 8 V, PO = 1 W
0.1%
A-weighted
MAX
W
56
mV
PO = 0.25 W, f = 1 kHz (BD Mode)
–82
dB
PO = 0.25 W, f = 1 kHz (AD Mode)
–69
dB
A-weighted, f = 1 kHz, maximum power at
THD < 1%
106
dB
SNR is calculated relative to 0-dBFS input level.
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
TAS5715
www.ti.com
SLOS645 – AUGUST 2010
SERIAL AUDIO PORTS SLAVE MODE
over recommended operating conditions (unless otherwise noted)
TEST
CONDITIONS
PARAMETER
MIN
CL = 30 pF
TYP
1.024
MAX
UNIT
3.072
MHz
fSCLKIN
Frequency, SCLK 32 × fS, 48 × fS, 64 × fS
tsu1
Setup time, LRCLK to SCLK rising edge
10
ns
th1
Hold time, LRCLK from SCLK rising edge
10
ns
tsu2
Setup time, SDIN to SCLK rising edge
10
ns
th2
Hold time, SDIN from SCLK rising edge
10
LRCLK frequency
ns
8
48
48
SCLK duty cycle
40%
50%
60%
LRCLK duty cycle
40%
50%
60%
SCLK rising edges between LRCLK rising edges
t(edge)
LRCLK clock edge with respect to the falling edge of SCLK
tr/tf
Rise/fall time for SCLK/LRCLK
kHz
32
64
SCLK
edges
–1/4
1/4
SCLK
period
8
tr
ns
tf
SCLK
(Input)
t(edge)
th1
tsu1
LRCLK
(Input)
th2
tsu2
SDIN
T0026-04
Figure 2. Slave Mode Serial Data Interface Timing
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
11
TAS5715
SLOS645 – AUGUST 2010
www.ti.com
I2C SERIAL CONTROL PORT OPERATION
Timing characteristics for I2C Interface signals over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
fSCL
Frequency, SCL
tw(H)
Pulse duration, SCL high
No wait states
0.6
tw(L)
Pulse duration, SCL low
1.3
tr
Rise time, SCL and SDA
tf
Fall time, SCL and SDA
tsu1
Setup time, SDA to SCL
th1
Hold time, SCL to SDA
t(buf)
tsu2
MAX
UNIT
400
kHz
ms
ms
300
ns
300
ns
100
ns
0
ns
Bus free time between stop and start condition
1.3
ms
Setup time, SCL to start condition
0.6
ms
th2
Hold time, start condition to SCL
0.6
ms
tsu3
Setup time, SCL to stop condition
0.6
CL
Load capacitance for each bus line
ms
400
tw(H)
tw(L)
pF
tf
tr
SCL
tsu1
th1
SDA
T0027-01
Figure 3. SCL and SDA Timing
SCL
t(buf)
th2
tsu2
tsu3
SDA
Start
Condition
Stop
Condition
T0028-01
Figure 4. Start and Stop Conditions Timing
12
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
TAS5715
www.ti.com
SLOS645 – AUGUST 2010
RESET TIMING (RESET)
Control signal parameters over recommended operating conditions (unless otherwise noted). Please refer to Recommended
Use Model section on usage of all terminals.
PARAMETER
tw(RESET)
MIN
Pulse duration, RESET active
TYP
2
td(I2C_ready)
MAX
UNIT
100
Time to enable I C
ms
12.0
ms
RESET
tw(RESET)
2
2
I C Active
I C Active
td(I2C_ready)
System Initialization.
2
Enable via I C.
T0421-01
NOTES: On power up, it is recommended that the TAS5715 RESET be held LOW for at least 100 ms after DVDD has
reached 3 V.
If RESET is asserted LOW while PDN is LOW, then the RESET must continue to be held LOW for at least 100 ms
after PDN is deasserted (HIGH).
Figure 5. Reset Timing
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
13
TAS5715
SLOS645 – AUGUST 2010
www.ti.com
TYPICAL CHARACTERISTICS, BTL CONFIGURATION, 8 Ω
TOTAL HARMONIC DISTORTION + NOISE
vs
FREQUENCY
TOTAL HARMONIC DISTORTION + NOISE
vs
FREQUENCY
10
10
PVDD = 8V
RL = 8Ω
T A = 25°C
PVDD = 12V
RL = 8Ω
T A = 25°C
1
PO = 5W
1
PO = 2.5W
THD+N (%)
THD+N (%)
PO = 2.5W
0.1
PO = 0.5W
0.1
PO = 1W
PO = 1W
0.01
0.001
20
0.01
100
1k
Frequency (Hz)
10k
0.001
20
20k
100
G001
TOTAL HARMONIC DISTORTION + NOISE
vs
FREQUENCY
TOTAL HARMONIC DISTORTION + NOISE
vs
FREQUENCY
10
PVDD = 24V
RL = 8Ω
T A = 25°C
1
1
PO = 5W
PO = 5W
THD+N (%)
THD+N (%)
20k
G002
Figure 7.
PVDD = 18V
RL = 8Ω
T A = 25°C
0.1
PO = 1W
PO = 1W
0.1
PO = 2.5W
PO = 2.5W
0.01
0.01
100
1k
Frequency (Hz)
10k
20k
0.001
20
G003
Figure 8.
14
10k
Figure 6.
10
0.001
20
1k
Frequency (Hz)
100
1k
Frequency (Hz)
10k
20k
G004
Figure 9.
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
TAS5715
www.ti.com
SLOS645 – AUGUST 2010
TYPICAL CHARACTERISTICS, BTL CONFIGURATION, 8 Ω (continued)
TOTAL HARMONIC DISTORTION + NOISE
vs
OUTPUT POWER
TOTAL HARMONIC DISTORTION + NOISE
vs
OUTPUT POWER
10
10
PVDD = 8V
RL = 8Ω
T A = 25°C
PVDD = 12V
RL = 8Ω
T A = 25°C
1
1
THD+N (%)
THD+N (%)
f = 20Hz
0.1
f = 1kHz
0.1
f = 1kHz
0.01
f = 20Hz
0.01
f = 10kHz
f = 10kHz
0.001
0.01
0.1
1
Output Power (W)
10
0.001
0.01
40
0.1
G005
1
Output Power (W)
40
G006
Figure 10.
Figure 11.
TOTAL HARMONIC DISTORTION + NOISE
vs
OUTPUT POWER
TOTAL HARMONIC DISTORTION + NOISE
vs
OUTPUT POWER
10
10
PVDD = 18V
RL = 8Ω
T A = 25°C
PVDD = 24V
RL = 8Ω
T A = 25°C
1
1
f = 20Hz
f = 1kHz
f = 1kHz
THD+N (%)
THD+N (%)
10
0.1
0.01
f = 20Hz
0.1
0.01
f = 10kHz
0.001
0.01
0.1
1
Output Power (W)
10
f = 10kHz
40
0.001
0.01
G007
Figure 12.
0.1
1
Output Power (W)
10
40
G008
Figure 13.
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
15
TAS5715
SLOS645 – AUGUST 2010
www.ti.com
TYPICAL CHARACTERISTICS, BTL CONFIGURATION, 8 Ω (continued)
OUTPUT POWER
vs
SUPPLY VOLTAGE
EFFICIENCY
vs
TOTAL OUTPUT POWER
40
100
RL = 8Ω
T A = 25°C
35
90
80
30
PVDD = 24V
PVDD = 18V
25
Efficiency (%)
Output Power (W)
70
THD+N = 10%
20
15
PVDD = 12V
50
PVDD = 8V
40
30
THD+N = 1%
10
60
20
5
RL = 8Ω
T A = 25°C
10
0
0
8
10
12
14
16
18
20
Supply Voltage (V)
22
24
26
0
5
10
G009
NOTE: Dashed lines represent thermally limited region.
Figure 14.
40
G010
0
PO = 1W
PVDD = 8V
RL = 8Ω
T A = 25°C
-10
-20
PO = 1W
PVDD = 12V
RL = 8Ω
T A = 25°C
-30
Crosstalk (dB)
-30
Crosstalk (dB)
35
CROSSTALK
vs
FREQUENCY
0
-20
30
NOTE: Dashed lines represent thermally limited region.
Figure 15.
CROSSTALK
vs
FREQUENCY
-10
15
20
25
Total Output Power (W)
-40
-50
-60
Right to Left
-70
-40
-50
-60
-70
Left to Right
-80
-80
Left to Right
-90
-90
-100
20
-100
20
Right to Left
100
1k
Frequency (Hz)
10k
20k
G011
Figure 16.
16
100
1k
Frequency (Hz)
10k
20k
G012
Figure 17.
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
TAS5715
www.ti.com
SLOS645 – AUGUST 2010
TYPICAL CHARACTERISTICS, BTL CONFIGURATION, 8 Ω (continued)
CROSSTALK
vs
FREQUENCY
CROSSTALK
vs
FREQUENCY
0
-10
-20
0
PO = 1W
PVDD = 18V
RL = 8Ω
T A = 25°C
-10
-20
-30
Crosstalk (dB)
Crosstalk (dB)
-30
PO = 1W
PVDD = 24V
RL = 8Ω
T A = 25°C
-40
-50
-60
-40
-50
-60
Right to Left
-70
-70
Right to Left
-80
-80
-90
-90
Left to Right
Left to Right
-100
20
100
1k
Frequency (Hz)
10k
20k
-100
20
G013
Figure 18.
100
1k
Frequency (Hz)
10k
20k
G014
Figure 19.
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
17
TAS5715
SLOS645 – AUGUST 2010
www.ti.com
TYPICAL CHARACTERISTICS, BTL CONFIGURATION, 4 Ω
TOTAL HARMONIC DISTORTION + NOISE
vs
FREQUENCY
TOTAL HARMONIC DISTORTION + NOISE
vs
FREQUENCY
10
10
PVDD = 12V
RL = 4Ω
T A = 25°C
PVDD = 18V
RL = 4Ω
T A = 25°C
PO = 5W
1
1
PO = 5W
THD+N (%)
THD+N (%)
PO = 2.5W
0.1
PO = 1W
PO = 1W
0.01
0.001
20
100
0.1
0.01
1k
Frequency (Hz)
10k
0.001
20
20k
100
1k
Frequency (Hz)
G021
10k
20k
G022
Figure 20.
Figure 21.
TOTAL HARMONIC DISTORTION + NOISE
vs
OUTPUT POWER
TOTAL HARMONIC DISTORTION + NOISE
vs
OUTPUT POWER
10
10
PVDD = 12V
RL = 4Ω
T A = 25°C
PVDD = 18V
RL = 4Ω
T A = 25°C
1
1
f = 1kHz
f = 1kHz
THD+N (%)
THD+N (%)
PO = 2.5W
0.1
0.1
f = 20Hz
0.01
0.01
f = 10kHz
f = 10kHz
f = 20Hz
0.001
0.01
0.1
1
Output Power (W)
10
40
0.001
0.01
G026
Figure 22.
18
0.1
1
Output Power (W)
10
50
G027
Figure 23.
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
TAS5715
www.ti.com
SLOS645 – AUGUST 2010
TYPICAL CHARACTERISTICS, BTL CONFIGURATION, 4 Ω (continued)
CROSSTALK
vs
FREQUENCY
CROSSTALK
vs
FREQUENCY
0
-10
-10
-20
-30
-30
-40
-40
Crosstalk (dB)
Crosstalk (dB)
-20
0
PO = 1W
PVDD = 12V
RL = 4Ω
T A = 25°C
-50
-60
Right to Left
-70
PO = 1W
PVDD = 18V
RL = 4Ω
T A = 25°C
-50
-60
Right to Left
-70
-80
-80
Left to Right
-90
-90
-100
-100
-110
20
100
1k
Frequency (Hz)
10k
20k
-110
20
G023
Figure 24.
Left to Right
100
1k
Frequency (Hz)
10k
20k
G024
Figure 25.
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
19
TAS5715
SLOS645 – AUGUST 2010
www.ti.com
TYPICAL CHARACTERISTICS, PBTL CONFIGURATION, 4 Ω
TOTAL HARMONIC DISTORTION + NOISE
vs
FREQUENCY
TOTAL HARMONIC DISTORTION + NOISE
vs
FREQUENCY
10
10
PVDD = 12V
RL = 4Ω
T A = 25°C
PVDD = 24V
RL = 4Ω
T A = 25°C
1
1
PO = 2.5W
PO = 5W
THD+N (%)
THD+N (%)
PO = 5W
0.1
PO = 1W
0.01
0.001
20
100
PO = 2.5W
0.1
0.01
1k
Frequency (Hz)
10k
PO = 1W
0.001
20
20k
100
1k
Frequency (Hz)
G015
20k
G016
Figure 26.
Figure 27.
TOTAL HARMONIC DISTORTION + NOISE
vs
OUTPUT POWER
TOTAL HARMONIC DISTORTION + NOISE
vs
OUTPUT POWER
10
10
PVDD = 12V
RL = 4Ω
T A = 25°C
PVDD = 24V
RL = 4Ω
T A = 25°C
1
1
f = 1kHz
f = 20Hz
THD+N (%)
THD+N (%)
10k
f = 20Hz
0.1
0.1
f = 1kHz
0.01
0.01
f = 10kHz
f = 10kHz
0.001
0.01
0.1
1
Output Power (W)
10
50
0.001
0.01
G017
Figure 28.
20
0.1
1
Output Power (W)
10
40
G018
Figure 29.
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
TAS5715
www.ti.com
SLOS645 – AUGUST 2010
TYPICAL CHARACTERISTICS, PBTL CONFIGURATION, 4 Ω (continued)
OUTPUT POWER
vs
SUPPLY VOLTAGE
EFFICIENCY
vs
TOTAL OUTPUT POWER
100
60
RL = 4Ω
T A = 25°C
90
50
80
PVDD = 24V
70
40
PVDD = 12V
Efficiency (%)
Output Power (W)
THD+N = 10%
30
THD+N = 1%
20
60
50
40
30
20
10
RL = 4Ω
T A = 25°C
10
0
0
8
10
12
14
16
18
20
Supply Voltage (V)
22
24
26
0
G019
NOTE: Dashed lines represent thermally limited region.
Figure 30.
10
20
30
40
Total Output Power (W)
50
60
G020
NOTE: Dashed line represents thermally limited region.
Figure 31.
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
21
TAS5715
SLOS645 – AUGUST 2010
www.ti.com
DETAILED DESCRIPTION
POWER SUPPLY
To facilitate system design, the TAS5715 needs only a 3.3-V supply in addition to the (typical) 18-V power-stage
supply. An internal voltage regulator provides suitable voltage levels for the gate drive circuitry. Additionally, all
circuitry requiring a floating voltage supply, e.g., the high-side gate drive, is accommodated by built-in bootstrap
circuitry requiring only a few external capacitors.
In order to provide good electrical and acoustical characteristics, the PWM signal path for the output stage is
designed as identical, independent half-bridges. For this reason, each half-bridge has separate bootstrap pins
(BST_x) and power-stage supply pins (PVDD_x). The gate drive voltages (GVDD_AB and GVDD_CD) are
derived from the PVDD voltage. Special attention should be paid to placing all decoupling capacitors as close to
their associated pins as possible. In general, inductance between the power-supply pins and decoupling
capacitors must be avoided.
For a properly functioning bootstrap circuit, a small ceramic capacitor must be connected from each bootstrap pin
(BST_x) to the power-stage output pin (OUT_x). When the power-stage output is low, the bootstrap capacitor is
charged through an internal diode connected between the gate-drive regulator output pin (GVDD_x) and the
bootstrap pin. When the power-stage output is high, the bootstrap capacitor potential is shifted above the output
potential and thus provides a suitable voltage supply for the high-side gate driver. In an application with PWM
switching frequencies in the range from 352 kHz to 384 kHz, it is recommended to use 33-nF ceramic capacitors,
size 0603 or 0805, for the bootstrap supply. These 33-nF capacitors ensure sufficient energy storage, even
during minimal PWM duty cycles, to keep the high-side power stage FET (LDMOS) fully turned on during the
remaining part of the PWM cycle.
Special attention should be paid to the power-stage power supply; this includes component selection, PCB
placement, and routing. As indicated, each half-bridge has independent power-stage supply pins (PVDD_x). For
optimal electrical performance, EMI compliance, and system reliability, it is important that each PVDD_x pin is
decoupled with a 100-nF ceramic capacitor placed as close as possible to each supply pin.
The TAS5715 is fully protected against erroneous power-stage turnon due to parasitic gate charging.
I2C CHIP SELECT/HP_SHUTDOWN
A_SEL/HP_SD is an input pin during power up. It can be pulled high or low. HIGH indicates an I2C subaddress
of 0x56, and LOW a subaddress of 0x54.
When used in headphone mode, this pin can be re-assigned as an output after reset during the initialization
sequence. Then this pin functions as headphone shutdown (active-high shutdown). A device with a headphone
should use an external pulldown, so the address is 0x54.
SINGLE-FILTER PBTL MODE
The TAS5715 supports parallel BTL (PBTL) mode with OUT_A/OUT_B (and OUT_C/OUT_D) connected before
the LC filter. In order to put the part in PBTL configuration, drive PBTL (pin 8) HIGH. This synchronizes the
turnoff of half-bridges A and B (and similarly C/D) if an overcurrent condition is detected in either half-bridge.
There is a pulldown resistor on the PBTL pin that configures the part in BTL mode if the pin is left floating.
PWM output multiplexers should be updated to set the device in PBTL mode. Output Mux Register (0x25) should
be written with a value of 0x01 10 32 45. Also, the PWM shutdown register (0x19) should be written with a value
of 0x3A.
DEVICE PROTECTION SYSTEM
Overcurrent (OC) Protection With Current Limiting
The device has independent, fast-reacting current detectors on all high-side and low-side power-stage FETs. The
detector outputs are closely monitored by two protection systems. The first protection system controls the power
stage in order to prevent the output current further increasing, i.e., it performs a cycle-by-cycle current-limiting
function, rather than prematurely shutting down during combinations of high-level music transients and extreme
speaker load impedance drops. If the high-current condition situation persists, i.e., the power stage is being
22
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
TAS5715
www.ti.com
SLOS645 – AUGUST 2010
overloaded, a second protection system triggers a latching shutdown, resulting in the power stage being set in
the high-impedance (Hi-Z) state. The device returns to normal operation once the fault condition (i.e., a short
circuit on the output) is removed. Current limiting and overcurrent protection are not independent for half-bridges.
That is, if the bridge-tied load between half-bridges A and B causes an overcurrent fault, half-bridges A, B, C,
and D are shut down.
Overtemperature Protection
The TAS5715 has an overtemperature-protection system. If the device junction temperature exceeds 150°C
(nominal), the device is put into thermal shutdown, resulting in all half-bridge outputs being set in the
high-impedance (Hi-Z) state and FAULT being asserted low. The TAS5715 recovers automatically once the
temperature drops approximately 30°.
Undervoltage Protection (UVP) and Power-On Reset (POR)
The UVP and POR circuits of the TAS5715 fully protect the device in any power-up/down and brownout situation.
While powering up, the POR circuit resets the overload circuit (OLP) and ensures that all circuits are fully
operational when the PVDD and AVDD supply voltages reach 7.6 V and 2.7 V, respectively. Although PVDD and
AVDD are independently monitored, a supply voltage drop below the UVP threshold on AVDD or on either PVDD
pin results in all half-bridge outputs immediately being set in the high-impedance (Hi-Z) state and FAULT being
asserted low.
SSTIMER FUNCTIONALITY
SSTIMER is used to reduced turnon pop. This is used only in AD mode. The SSTIMER pin uses a capacitor
connected between this pin and ground to control the output duty cycle when exiting all-channel shutdown. The
capacitor on the SSTIMER pin is slowly charged through an internal current source, and the charge time
determines the rate at which the output transitions from a near-zero duty cycle to the desired duty cycle. This
allows for a smooth transition that minimizes audible pops and clicks. When the part is shut down, the drivers are
high-impedance and transition slowly down through a 3-kΩ resistor, similarly minimizing pops and clicks. The
shutdown transition time is independent of the SSTIMER pin capacitance. Larger capacitors increase the start-up
time, whereas capacitors smaller than 2.2 nF decrease the start-up time. The SSTIMER pin should be left
floating for BD modulation.
CLOCK, AUTO DETECTION, AND PLL
The TAS5715 is a slave device. It accepts MCLK, SCLK, and LRCLK. The digital audio processor (DAP)
supports all the sample rates and MCLK rates that are defined in the clock control register .
The TAS5715 checks to verify that SCLK is a specific value of 32 fS, 48 fS, or 64 fS. The DAP only supports a 1 ×
fS LRCLK. The timing relationship of these clocks to SDIN is shown in subsequent sections. The clock section
uses MCLK or the internal oscillator clock (when MCLK is unstable, out of range, or absent) to produce the
internal clock (DCLK) running at 512 times the PWM switching frequency.
The DAP can autodetect and set the internal clock-control logic to the appropriate settings for all supported clock
rates as defined in the clock control register.
TAS5715 has robust clock error handling that uses the bulit-in trimmed oscillator clock to quickly detect
changes/errors. Once the system detects a clock change/error, it mutes the audio (through a single-step mute)
and then forces PLL to limp using the internal oscillator as a reference clock. Once the clocks are stable, the
system autodetects the new rate and reverts to normal operation. During this process, the default volume is
restored in a single step (also called hard unmute). The ramp process can be programmed to ramp back slowly
(also called soft unmute) as defined in volume register (0x0E).
SERIAL DATA INTERFACE
Serial data is input on SDIN. The PWM outputs are derived from SDIN. The TAS5715 DAP accepts serial data in
16-, 20-, or 24-bit left-justified, right-justified, or I2S serial data format.
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
23
TAS5715
SLOS645 – AUGUST 2010
www.ti.com
PWM Section
The TAS5715 DAP device uses noise-shaping and sophisticated nonlinear correction algorithms to achieve high
power efficiency and high-performance digital audio reproduction. The DAP uses a fourth-order noise shaper to
increase dynamic range and SNR in the audio band. The PWM section accepts 24-bit PCM data from the DAP
and outputs two BTL PWM audio output channels.
The PWM section has individual-channel dc-blocking filters that can be enabled and disabled. The filter cutoff
frequency is less than 1 Hz. Individual-channel de-emphasis filters for 44.1- and 48-kHz are included and can be
enabled and disabled.
Finally, the PWM section has an adjustable maximum modulation limit of 93.8% to 99.2%.
For detailed description of using audio processing features like DRC, EQ, 3D, and bass boost, see the User's
Guide and TAS570X GDE software development tool documentation. Also see the GDE software development
tool for the device data path.
I2C COMPATIBLE SERIAL CONTROL INTERFACE
The TAS5715 DAP has an I2C serial control slave interface to receive commands from a system controller. The
serial control interface supports both normal-speed (100-kHz) and high-speed (400-kHz) operations without wait
states. As an added feature, this interface operates even if MCLK is absent.
The serial control interface supports both single-byte and multiple-byte read and write operations for status
registers and the general control registers associated with the PWM.
SERIAL INTERFACE CONTROL AND TIMING
I2S Timing
I2S timing uses LRCLK to define when the data being transmitted is for the left channel and when it is for the
right channel. LRCLK is low for the left channel and high for the right channel. A bit clock running at 32, 48, or
64 × fS is used to clock in the data. There is a delay of one bit clock from the time the LRCLK signal changes
state to the first bit of data on the data lines. The data is written MSB-first and is valid on the rising edge of bit
clock. The DAP masks unused trailing data-bit positions.
24
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
TAS5715
www.ti.com
SLOS645 – AUGUST 2010
2
2-Channel I S (Philips Format) Stereo Input
32 Clks
LRCLK (Note Reversed Phase)
32 Clks
Right Channel
Left Channel
SCLK
SCLK
MSB
24-Bit Mode
23 22
MSB
LSB
9
8
5
4
5
4
1
0
1
0
1
0
LSB
23 22
9
8
5
4
19 18
5
4
1
0
15 14
1
0
1
0
20-Bit Mode
19 18
16-Bit Mode
15 14
T0034-01
NOTE: All data presented in 2s-complement form with MSB first.
Figure 32. I2S 64-fS Format
2
2-Channel I S (Philips Format) Stereo Input/Output (24-Bit Transfer Word Size)
LRCLK
24 Clks
24 Clks
Left Channel
Right Channel
SCLK
SCLK
MSB
24-Bit Mode
23 22
MSB
LSB
17 16
9
8
5
4
13 12
5
4
1
0
9
1
0
3
2
1
0
LSB
23 22
17 16
9
8
5
4
19 18
13 12
5
4
1
0
15 14
9
1
0
3
2
1
20-Bit Mode
19 18
16-Bit Mode
15 14
8
8
T0092-01
NOTE: All data presented in 2s-complement form with MSB first.
Figure 33. I2S 48-fS Format
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
25
TAS5715
SLOS645 – AUGUST 2010
www.ti.com
2
2-Channel I S (Philips Format) Stereo Input
LRCLK
16 Clks
16 Clks
Left Channel
Right Channel
SCLK
SCLK
MSB
16-Bit Mode
MSB
LSB
15 14 13 12
11 10
9
5
8
4
3
2
1
0
LSB
15 14 13 12
11 10
9
5
8
4
3
2
1
T0266-01
NOTE: All data presented in 2s-complement form with MSB first.
Figure 34. I2S 32-fS Format
Left-Justified
Left-justified (LJ) timing uses LRCLK to define when the data being transmitted is for the left channel and when it
is for the right channel. LRCLK is high for the left channel and low for the right channel. A bit clock running at 32,
48, or 64 × fS is used to clock in the data. The first bit of data appears on the data lines at the same time LRCLK
toggles. The data is written MSB-first and is valid on the rising edge of the bit clock. The DAP masks unused
trailing data-bit positions.
2-Channel Left-Justified Stereo Input
32 Clks
32 Clks
Left Channel
Right Channel
LRCLK
SCLK
SCLK
MSB
24-Bit Mode
23 22
LSB
9
8
5
4
5
4
1
0
1
0
1
0
MSB
LSB
23 22
9
8
5
4
19 18
5
4
1
0
15 14
1
0
1
0
20-Bit Mode
19 18
16-Bit Mode
15 14
T0034-02
NOTE: All data presented in 2s-complement form with MSB first.
Figure 35. Left-Justified 64-fS Format
26
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
TAS5715
www.ti.com
SLOS645 – AUGUST 2010
2-Channel Left-Justified Stereo Input (24-Bit Transfer Word Size)
24 Clks
24 Clks
Left Channel
Right Channel
LRCLK
SCLK
SCLK
MSB
24-Bit Mode
23 22
21
LSB
17 16
9
8
5
4
13 12
5
4
1
0
9
1
0
1
0
MSB
LSB
21
17 16
9
8
5
4
19 18 17
13 12
5
4
1
0
15 14 13
9
1
0
23 22
1
0
20-Bit Mode
19 18 17
16-Bit Mode
15 14 13
8
8
T0092-02
NOTE: All data presented in 2s-complement form with MSB first.
Figure 36. Left-Justified 48-fS Format
2-Channel Left-Justified Stereo Input
16 Clks
16 Clks
Left Channel
Right Channel
LRCLK
SCLK
SCLK
MSB
16-Bit Mode
15 14 13 12
LSB
11 10
9
8
5
4
3
2
1
0
MSB
15 14 13 12
LSB
11 10
9
8
5
4
3
2
1
0
T0266-02
NOTE: All data presented in 2s-complement form with MSB first.
Figure 37. Left-Justified 32-fS Format
Right-Justified
Right-justified (RJ) timing uses LRCLK to define when the data being transmitted is for the left channel and when
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
27
TAS5715
SLOS645 – AUGUST 2010
www.ti.com
it is for the right channel. LRCLK is high for the left channel and low for the right channel. A bit clock running at
32, 48, or 64 × fS is used to clock in the data. The first bit of data appears on the data 8 bit-clock periods (for
24-bit data) after LRCLK toggles. In RJ mode the LSB of data is always clocked by the last bit clock before
LRCLK transitions. The data is written MSB-first and is valid on the rising edge of bit clock. The DAP masks
unused leading data-bit positions.
2-Channel Right-Justified (Sony Format) Stereo Input
32 Clks
32 Clks
Left Channel
Right Channel
LRCLK
SCLK
SCLK
MSB
24-Bit Mode
LSB
23 22
19 18
15 14
1
0
19 18
15 14
1
0
15 14
1
0
MSB
LSB
23 22
19 18
15 14
1
0
19 18
15 14
1
0
15 14
1
0
20-Bit Mode
16-Bit Mode
T0034-03
Figure 38. Right-Justified 64-fS Format
28
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
TAS5715
www.ti.com
SLOS645 – AUGUST 2010
2-Channel Right-Justified Stereo Input (24-Bit Transfer Word Size)
24 Clks
24 Clks
Left Channel
Right Channel
LRCLK
SCLK
SCLK
MSB
24-Bit Mode
23 22
LSB
19 18
15 14
6
5
2
1
0
19 18
15 14
6
5
2
1
0
15 14
6
5
2
1
0
LSB
MSB
23 22
19 18
15 14
6
5
2
1
0
19 18
15 14
6
5
2
1
0
15 14
6
5
2
1
0
20-Bit Mode
16-Bit Mode
T0092-03
Figure 39. Right-Justified 48-fS Format
Figure 40. Right-Justified 32-fS Format
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
29
TAS5715
SLOS645 – AUGUST 2010
www.ti.com
I2C SERIAL CONTROL INTERFACE
The TAS5715 DAP has a bidirectional I2C interface that is compatible with the Inter IC (I2C) bus protocol and
supports both 100-kHz and 400-kHz data transfer rates for single- and multiple-yte write and read operations.
This is a slave-only device that does not support a multimaster bus environment or wait-state insertion. The
control interface is used to program the registers of the device and to read device status.
The DAP supports the standard-mode I2C bus operation (100 kHz maximum) and the fast I2C bus operation
(400 kHz maximum). The DAP performs all I2C operations without I2C wait cycles.
General I2C Operation
The I2C bus employs two signals; SDA (data) and SCL (clock), to communicate between integrated circuits in a
system. Data is transferred on the bus serially, one bit at a time. The address and data can be transferred in byte
(8-bit) format, with the most significant bit (MSB) transferred first. In addition, each byte transferred on the bus is
acknowledged by the receiving device with an acknowledge bit. Each transfer operation begins with the master
device driving a start condition on the bus and ends with the master device driving a stop condition on the bus.
The bus uses transitions on the data pin (SDA) while the clock is high to indicate start and stop conditions. A
high-to-low transition on SDA indicates a start and a low-to-high transition indicates a stop. Normal data-bit
transitions must occur within the low time of the clock period. These conditions are shown in Figure 41. The
master generates the 7-bit slave address and the read/write (R/W) bit to open communication with another
device and then waits for an acknowledge condition. The TAS5715 holds SDA low during the acknowledge clock
period to indicate an acknowledgment. When this occurs, the master transmits the next byte of the sequence.
Each device is addressed by a unique 7-bit slave address plus R/W bit (1 byte). All compatible devices share the
same signals via a bidirectional bus using a wired-AND connection. An external pullup resistor must be used for
the SDA and SCL signals to set the high level for the bus.
SDA
R/
A
W
7-Bit Slave Address
7
6
5
4
3
2
1
0
8-Bit Register Address (N)
7
6
5
4
3
2
1
0
8-Bit Register Data For
Address (N)
A
7
6
5
4
3
2
1
8-Bit Register Data For
Address (N)
A
0
7
6
5
4
3
2
1
A
0
SCL
Start
Stop
T0035-01
Figure 41. Typical I2C Sequence
There is no limit on the number of bytes that can be transmitted between start and stop conditions. When the last
word transfers, the master generates a stop condition to release the bus. A generic data transfer sequence is
shown in Figure 41.
The 7-bit address for TAS5715 is 0101 010 (0x54) or 0101 011 (0x56) defined by A_SEL (external pulldown for
0x54 and pullup for 0x56).Stero device with Headphone should use 0x54 as its device address.
Single- and Multiple-Byte Transfers
The serial control interface supports both single-byte and multiple-byte read/write operations for subaddresses
0x00 to 0x1F. However, for the subaddresses 0x20 to 0xFF, the serial control interface supports only
multiple-byte read/write operations (in multiples of 4 bytes).
During multiple-byte read operations, the DAP responds with data, a byte at a time, starting at the subaddress
assigned, as long as the master device continues to respond with acknowledges. If a particular subaddress does
not contain 32 bits, the unused bits are read as logic 0.
During multiple-byte write operations, the DAP compares the number of bytes transmitted to the number of bytes
that are required for each specific subaddress. For example, if a write command is received for a biquad
subaddress, the DAP expects to receive five 32-bit words. If fewer than five 32-bit data words have been
received when a stop command (or another start command) is received, the data received is discarded.
30
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
TAS5715
www.ti.com
SLOS645 – AUGUST 2010
Supplying a subaddress for each subaddress transaction is referred to as random I2C addressing. The TAS5715
also supports sequential I2C addressing. For write transactions, if a subaddress is issued followed by data for
that subaddress and the 15 subaddresses that follow, a sequential I2C write transaction has taken place, and the
data for all 16 subaddresses is successfully received by the TAS5715. For I2C sequential write transactions, the
subaddress then serves as the start address, and the amount of data subsequently transmitted, before a stop or
start is transmitted, determines how many subaddresses are written. As was true for random addressing,
sequential addressing requires that a complete set of data be transmitted. If only a partial set of data is written to
the last subaddress, the data for the last subaddress is discarded. However, all other data written is accepted;
only the incomplete data is discarded.
Single-Byte Write
As shown in Figure 42, a single-byte data-write transfer begins with the master device transmitting a start
condition followed by the I2C device address and the read/write bit. The read/write bit determines the direction of
the data transfer. For a data-write transfer, the read/write bit is 0. After receiving the correct I2C device address
and the read/write bit, the DAP responds with an acknowledge bit. Next, the master transmits the address byte or
bytes corresponding to the TAS5715 internal memory address being accessed. After receiving the address byte,
the TAS5715 again responds with an acknowledge bit. Next, the master device transmits the data byte to be
written to the memory address being accessed. After receiving the data byte, the TAS5715 again responds with
an acknowledge bit. Finally, the master device transmits a stop condition to complete the single-byte data-write
transfer.
Start
Condition
Acknowledge
A6
A5
A4
A3
A2
A1
A0
Acknowledge
R/W ACK A7
A6
A5
2
A4
A3
A2
A1
Acknowledge
A0 ACK D7
D6
Subaddress
I C Device Address and
Read/Write Bit
D5
D4
D3
D2
D1
D0 ACK
Stop
Condition
Data Byte
T0036-01
Figure 42. Single-Byte Write Transfer
Multiple-Byte Write
A multiple-byte data-write transfer is identical to a single-byte data write transfer except that multiple data bytes
are transmitted by the master device to the DAP as shown in Figure 43. After receiving each data byte, the
TAS5715 responds with an acknowledge bit.
Start
Condition
Acknowledge
A6
A5
A1
A0 R/W ACK A7
2
I C Device Address and
Read/Write Bit
A6
A5
A4
A3
Subaddress
A1
Acknowledge
Acknowledge
Acknowledge
Acknowledge
A0 ACK D7
D0 ACK D7
D0 ACK D7
D0 ACK
First Data Byte
Other Data Bytes
Last Data Byte
Stop
Condition
T0036-02
Figure 43. Multiple-Byte Write Transfer
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
31
TAS5715
SLOS645 – AUGUST 2010
www.ti.com
Single-Byte Read
As shown in Figure 44, a single-byte data-read transfer begins with the master device transmitting a start
condition followed by the I2C device address and the read/write bit. For the data-read transfer, both a write
followed by a read are actually done. Initially, a write is done to transfer the address byte or bytes of the internal
memory address to be read. As a result, the read/write bit becomes a 0. After receiving the TAS5715 address
and the read/write bit, TAS5715 responds with an acknowledge bit. In addition, after sending the internal memory
address byte or bytes, the master device transmits another start condition followed by the TAS5715 address and
the read/write bit again. This time the read/write bit becomes a 1, indicating a read transfer. After receiving the
address and the read/write bit, the TAS5715 again responds with an acknowledge bit. Next, the TAS5715
transmits the data byte from the memory address being read. After receiving the data byte, the master device
transmits a not-acknowledge followed by a stop condition to complete the single-byte data-read transfer.
Repeat Start
Condition
Start
Condition
Acknowledge
A6
A5
A1
A0 R/W ACK A7
Acknowledge
A6
2
A5
A4
A0 ACK
A6
A5
A1
A0 R/W ACK D7
D6
2
I C Device Address and
Read/Write Bit
Subaddress
I C Device Address and
Read/Write Bit
Not
Acknowledge
Acknowledge
D1
D0 ACK
Stop
Condition
Data Byte
T0036-03
Figure 44. Single-Byte Read Transfer
Multiple-Byte Read
A multiple-byte data-read transfer is identical to a single-byte data-read transfer except that multiple data bytes
are transmitted by the TAS5715 to the master device as shown in Figure 45. Except for the last data byte, the
master device responds with an acknowledge bit after receiving each data byte.
Repeat Start
Condition
Start
Condition
Acknowledge
A6
2
A0 R/W ACK A7
I C Device Address and
Read/Write Bit
Acknowledge
A6
A6
A0 ACK
A5
Subaddress
Acknowledge
Acknowledge
Acknowledge
Not
Acknowledge
A0 R/W ACK D7
D0 ACK D7
D0 ACK D7
D0 ACK
2
I C Device Address and
Read/Write Bit
First Data Byte
Other Data Bytes
Last Data Byte
Stop
Condition
T0036-04
Figure 45. Multiple-Byte Read Transfer
Headphone Support in the TAS5715
The TAS5715 provides headphone PWM out that can drive a headphone amplifier. This feature cannot be used
in lineout mode, because once the headphone is selected, the speaker is muted. See the headphone use model
diagrams on how to use the headphone feature and quite turn on and off.
The headphone volume register is 0x0C. Headphone control bits are in the system control2 register (0x05).
Register 0x05 bit 4: This is headphone/speaker mode-select bit.
Bit 3: This bit selects the headphone volume to be same as speaker channel volume or headphone volume
register (0x0C).
Bit 1: This bit is used to drive pin A_SEL_HP_SDZ as an output. This must be set to 1 if that pin is used. This
pin is a multi-function pin. On reset, it is an input used for I2C address select. After coming out of reset, this pin
can be programmed to be an output. It drives HP_SDZ when coming out of shutdown in headphone mode. The
internal control state machine takes care of the timing on PWM switching and HP_SDZ going low to high to avoid
start/stop clicks.
32
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
TAS5715
www.ti.com
SLOS645 – AUGUST 2010
Bit 0: This is bit should be 1 if the headphone function is used in the TAS5715. If the headphone is not used, this
bit can be cleared to 0. Then if bit 1 is also set to 1, the TAS5715 drives the FAULTZ signal out on the A_SEL
pin. FAULTZ is the internal power-stage fault signal asserted low during errors like overcurrent, overtemperature,
and UVP.
Figure 46 shows the connection of A_SEL_HP_SDZ pin to headphone shutdown.
2
I S Audio
Left
TAS5715
Right
(HP Amplifier)
HPL
HPR
Addr = 0x54
RC
Filter
A_sel_HP_SDZ
15 kΩ
B0424-01
Figure 46. Headphone Shutdown (HP_SD)
Digital THD Manager
The THD manager can be used to achieve digitally the {specified ?} THD levels without voltage clipping. This
allows the customer to achieve the same THD (for example, 10% THD) for different power levels (15 W/10 W/5
W) with same PVCC level.
The waveform of Figure 47 shows digital clipping using the THD manager.
Figure 47. Digital Clipping Using the THD Manager
Register 0x57 is used to achieve the clipping. Register 0x56 is used to scale the clipped waveform to get the
desired power out.
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
33
TAS5715
SLOS645 – AUGUST 2010
www.ti.com
PWM DC Detection
The TAS5715 supports a PWM dc-detect function. This is to detect dc present in the input source and generated
by another means in the blocks prior to PCM-to-PWM conversion.
If enabled (0x46, bit 10), the detection block checks for PWM duty cycle. If it is above the programmed threshold
(0x0F, bits 7–4]) for more than the programmed duration of time (0x0F, bits 3–0), the PWM dc error flag is set on
error register 0x02, bit 0.
This bit is set as long as the dc condition remains. Once the dc condition is gone, the bit is cleared automatically.
The bit is cleared if detection is disabled.
Biquad Corruption Control
The TAS5715 supports this function to prevent issues when a biquad value is corrupted due an error in the I2C
line while updating biquads. The system controller writes a checksum for the biquads into the checksum register.
Once the EQ CRC detect function is enabled (0x46, bit 25), the TAS5715 periodically calculates a checksum for
biquads in DAP memory and compare it with the expected checksum. If an error occurs, then the crc error flag is
set in register 0x02, bit 3.
34
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
TAS5715
www.ti.com
SLOS645 – AUGUST 2010
Automatic Gain Limit (DRC)
The DRC scheme has a single programmable threshold. There is one ganged DRC for the high-band left/right
channels and one DRC for the low-band left/right channels.
Output Level (dB)
The DRC input/output diagram is shown in Figure 48.
1:1 Transfer Function
Implemented Transfer Function
T
Input Level (dB)
M0176-01
Professional-quality dynamic range compression automatically adjusts volume to flatten volume level.
• Each DRC has adjustable threshold levels.
• Programmable attack, release, and softening-filter constants
• Transparent compression: compressors can attack fast enough to avoid apparent clipping before engaging,
and decay times can be set slow enough to avoid pumping.
Figure 48. Automatic Gain Limit
Attack/Release
Softening Filter
Threshold
DRC1
0x3C
0x3B
0x40
DRC2
0x3F
0x3E
0x43
Alpha Filter Structure
S
a
w
–1
Z
B0265-05
T = 9.23 format, all other DRC coefficients are 3.23 format
Figure 49. DRC Filter Structure
DRC acts more like a gain limiter (automatic gain limiter, AGL). The block works to reduce the peak of energy if it
goes beyond the programmable threshold level. DRC starts an attack event (reduces gain) if energy goes above
the threshold. Similarly, it starts a release event if the level goes below the threshold (increases gain back to the
original value).
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
35
TAS5715
SLOS645 – AUGUST 2010
www.ti.com
Attack and release events occur only when level remains above or below the threshold continuously during the
time-constant time. And the constant time is controlled by the attack/release rate. If the attack/release rate is
short, DRC operates frequently. Attack time defines how fast to cut the signal to bring it under the threshold.
Similarly, release time defines how fast to release the cut back to normal. Attack and release are shown in
Figure 50.
Threshold
INPUT
Threshold
OUTPUT
Attack Rate
Release Rate
W0003-01
Figure 50. Attack/Release
The device should be in all-channel shutdown when DRC parameters are changed. The TAS57X GDE (GUI)
takes care of this when changing DRC parameters.
TAS5715 supports two-band and one-band DRC. Two-band DRC helps to get the maximum sound levels out of
small, thin, low-cost speakers. It protects speakers from being overdriven/damaged and stops cabinet rattle
without sacrificing loudness.
In the two-band DRC mode, audio is split into to high-band and low-band. The bands have separate thresholds
and attack/decay filters.
Configuration is as shown in Figure 51. DRC1 (upper band) and DRC2 (lower band) can be programmed using
GDE. Default values for attack and decay filters cover most of the cases. Only thresholds require updating,
depending on the power levels for the upper and lower bands.
36
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
TAS5715
www.ti.com
SLOS645 – AUGUST 2010
HPF
L_IN
DRC-1
Speaker EQ
L_OUT
LPF
DRC-2
B0425-01
Figure 51. Two-Band DRC
A crossover biquad should be used only for two-band DRC. It should be all-pass for the one-band DRC mode.
Only DRC1 (upper band) is used in the one-band DRC mode.
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
37
TAS5715
SLOS645 – AUGUST 2010
www.ti.com
BANK SWITCHING
The TAS5715 uses an approach called bank switching together with automatic sample-rate detection. All
processing features that must be changed for different sample rates are stored internally in three banks. The
user can program which sample rates map to each bank. By default, bank 1 is used in 32-kHz mode, bank 2 is
used in 44.1/48-kHz mode, and bank 3 is used for all other rates. Combined with the clock-rate autodetection
feature, bank switching allows the TAS5715 to detect automatically a change in the input sample rate and switch
to the appropriate bank without any MCU intervention.
An external controller configures bankable locations (0x29–0x36, 0x3A–0x3F, and 0x59,0x5D) for all three banks
during the initialization sequence.
If automatic bank switching is enabled (register 0x50, bits 2:0) , then the TAS5715 automatically swaps the
coefficients for subsequent sample rate changes, avoiding the need for any external controller intervention for a
sample-rate change.
By default, bits 2:0 have the value 000; indicating that bank switching is disabled. In that state, updates to
bankable locations take immediate effect. A write to register 0x50 with bits 2:0 being 001, 010, or 011 brings the
system into the coefficient-bank-update state update bank1, update bank2, or update bank3, respectively. Any
subsequent write to bankable locations updates the coefficient banks stored outside the DAP. After updating all
the three banks, the system controller should issue a write to register 0x50 with bits 2:0 being 100; this changes
the system state to automatic bank-switching mode. In automatic bank-switching mode, the TAS5715
automatically swaps banks based on the sample rate.
Command sequences for updating DAP coefficients can be summarized as follows:
1. Bank switching disabled (default): DAP coefficient writes take immediate effect and are not
influenced by subsequent sample rate changes.
OR
Bank switching enabled:
(a) Update bank-1 mode: Write 001 to bits 2:0 of reg 0x50. Load the 32-kHz coefficients.
(b) Update bank-2 mode: Write 010 to bits 2:0 of reg 0x50. Load the 48-kHz coefficients.
(c) Update bank-3 mode: Write 011 to bits 2:0 of reg 0x50. Load the other coefficients.
(d) Enable automatic bank switching by writing 100 to bits 2:0 of reg 0x50.
26-Bit 3.23 Number Format
All mixer gain coefficients are 26-bit coefficients using a 3.23 number format. Numbers formatted as 3.23
numbers means that there are 3 bits to the left of the binary point and 23 bits to the right of the binary point. This
is shown in Figure 52 .
2
–23
2
2
–5
–1
Bit
Bit
Bit
0
2 Bit
1
2 Bit
Sign Bit
S_xx.xxxx_xxxx_xxxx_xxxx_xxxx_xxx
M0125-01
Figure 52. 3.23 Format
38
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
TAS5715
www.ti.com
SLOS645 – AUGUST 2010
The decimal value of a 3.23 format number can be found by following the weighting shown in Figure 52. If the
most significant bit is logic 0, the number is a positive number, and the weighting shown yields the correct
number. If the most significant bit is a logic 1, then the number is a negative number. In this case every bit must
be inverted, a 1 added to the result, and then the weighting shown in Figure 53 applied to obtain the magnitude
of the negative number.
1
0
2 Bit
2 Bit
1
2
–1
Bit
0
2
(1 or 0) ´ 2 + (1 or 0) ´ 2 + (1 or 0) ´ 2
–1
–4
Bit
2
+ ....... (1 or 0) ´ 2
–4
–23
Bit
+ ....... (1 or 0) ´ 2
–23
M0126-01
Figure 53. Conversion Weighting Factors—3.23 Format to Floating Point
Gain coefficients, entered via the I2C bus, must be entered as 32-bit binary numbers. The format of the 32-bit
number (4-byte or 8-digit hexadecimal number) is shown in Figure 54
Fraction
Digit 6
Sign
Bit
Fraction
Digit 1
Integer
Digit 1
Fraction
Digit 2
Fraction
Digit 3
Fraction
Digit 4
Fraction
Digit 5
u u u u
u u S x
x. x x x
x x x x
x x x x
x x x x
x x x x
x x x x 0
Coefficient
Digit 8
Coefficient
Digit 7
Coefficient
Digit 6
Coefficient
Digit 5
Coefficient
Digit 4
Coefficient
Digit 3
Coefficient
Digit 2
Coefficient
Digit 1
u = unused or don’t care bits
Digit = hexadecimal digit
M0127-01
2
Figure 54. Alignment of 3.23 Coefficient in 32-Bit I C Word
Table 1. Sample Calculation for 3.23 Format
db
Linear
Decimal
0
1
8,388,608
Hex (3.23 Format)
80 0000
5
1.77
14,917,288
00E3 9EA8
–5
0.56
4,717,260
0047 FACC
X
L = 10(X/20)
D = 8388608 × L
H = dec2hex (D, 8)
Table 2. Sample Calculation for 9.17 Format
db
Linear
Decimal
Hex (9.17 Format)
0
1
131,072
20 000
38 A3D
5
1.77
231,997
–5
0.56
73,400
11 EB8
X
L = 10(X/20)
D = 131,072 × L
H = dec2hex (D, 8)
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
39
40
2
Submit Documentation Feedback
Product Folder Link(s): TAS5715
PVDD
RESET
SCL
SDA
0 ns
0 ns
100 ms
100 μs
3V
10 ms
8V
6V
13.5 ms
Trim
50 ms
DAP
Config
Other
Config
tPLL
(1) tPLL has to be greater than 240 ms + 1.3 tstart.
This constraint only applies to the first trim command following AVDD/DVDD power-up.
It does not apply to trim commands following subsequent resets.
(2) tstart/tstop = PWM start/stop time as defined in register 0X1A
I C
PDN
AVDD/DVDD
Initialization
(1)
Exit
SD
(1)
tPLL
(2)
1 ms + 1.3 tstart
Volume and Mute Commands
Normal Operation
Enter
SD
50 ms
1 ms + 1.3 tstop
Shutdown
(2)
2 ms
2 ms
2 ms
8V
6V
0 ns
Powerdown
T0419-03
3V
TAS5715
SLOS645 – AUGUST 2010
www.ti.com
Recommended Use Model
Figure 55. Recommended Command Sequence
Copyright © 2010, Texas Instruments Incorporated
TAS5715
www.ti.com
SLOS645 – AUGUST 2010
3V
AVDD/DVDD
0 ns
2 ms
PDN
0 ns
2
I C
2 ms
RESET
2 ms
0 ns
8V
PVDD
6V
T0420-05
Figure 56. Power Loss Sequence
Initialization Sequence
Use the following sequence to power-up and initialize the device:
1.
Hold all digital inputs low and ramp up AVDD/DVDD to at least 3V.
2.
Initialize digital inputs and PVDD supply as follows:
•
Drive RESET = 0, PDN = 1, and other digital inputs to their desired state while ensuring that
all are never more than 2.5V above AVDD/DVDD. Wait at least 100µs, drive RESET = 1, and
wait at least another 13.5ms.
•
Ramp up PVDD to at least 8V while ensuring that it remains below 6V for at least 100µs after
AVDD/DVDD reaches 3V. Then wait at least another 10µs.
3.
Trim oscillator (write 0x00 to register 0x1B) and wait at least 50ms.
4.
Configure the DAP via I2C (see Users's Guide for typical values).
5.
Configure remaining registers.
6.
Exit shutdown (sequence defined below).
Normal Operation
The following are the only events supported during normal operation:
1.
Writes to master/channel volume registers.
2.
Writes to soft mute register.
3.
Enter and exit shutdown (sequence defined below).
4.
Clock errors and rate changes.
Note: Events 3 and 4 are not supported for 240ms+1.3*Tstart after trim following AVDD/DVDD powerup
ramp (where Tstart is specified by register 0x1A).
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
41
TAS5715
SLOS645 – AUGUST 2010
www.ti.com
Shutdown Sequence
Enter:
1.
Ensure I2S clocks have been stable and valid for at least 50ms.
2.
Write 0x40 to register 0x05.
3.
Wait at least 1ms+1.3*Tstop (where Tstop is specified by register 0x1A).
4.
Once in shutdown, stable clocks are not required while device remains idle.
5.
If desired, reconfigure by ensuring that clocks have been stable and valid for at least 50ms before
returning to step 4 of initialization sequence.
1.
Ensure I2S clocks have been stable and valid for at least 50ms.
2.
Write 0x00 to register 0x05 (exit shutdown command may not be serviced for as much as 240ms
after trim following AVDD/DVDD powerup ramp).
3.
Wait at least 1ms+1.3*Tstart (where Tstart is specified by register 0x1A).
4.
Proceed with normal operation.
Exit:
Powerdown Sequence
Use the following sequence to powerdown the device and its supplies:
1.
If time permits, enter shutdown (sequence defined above); else, in case of sudden power loss,
assert PDN = 0 and wait at least 2ms.
2.
Assert RESET = 0.
3.
Drive digital inputs low and ramp down PVDD supply as follows:
4.
42
•
Drive all digital inputs low after RESET has been low for at least 2µs.
•
Ramp down PVDD while ensuring that it remains above 8V until RESET has been low for at
least 2µs.
Ramp down AVDD/DVDD while ensuring that it remains above 3V until PVDD is below 6V and
that it is never more than 2.5V below the digital inputs.
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
TAS5715
www.ti.com
SLOS645 – AUGUST 2010
Headphone Usage
HP/SPKR
(SE/BTL)
VALID
PWM_A(L+)
PWM_C(R+)
SpkrL+/R+
50%
t(exitSDHP)
t(mute)
PWM_B(L–)
PWM_D(R–)
SpkrL+/R+
HPL/R
t(enterSDHPamp)
t(mute)
t(exitSDHPamp)
SpkrL–/R–
SpkrL–/R–
50%
t(enterSD)
t(exitSD)
FAULT = 1 Output
HPSD
(A0/FAULT)
Hi-Z (Ext. Pulldown)
I2C: SCL
SDA
Mute
Enter
ACSD
HP
Config
Exit
ACSD
Enable
FAULT
Unmute
Mute
Disable
FAULT
Enter
ACSD
Spkr
Config
Exit
ACSD
Unmute
(if not done in
Spkr Config)
PDN
T0452-01
Headphone/Speaker Configuration
PARAMETE
R
t(mute)
t(exitSD)
t(enterSD)
t(exitSDHP)
t(exitSDHPamp)
t(enterSDHPamp)
DESCRIPTION
Mute volume ramp wait time (t(volramp) given by register 0x0E )
Exit shutdown wait time before issuing further commands to device (t(start)
given by regioster 0x1A)
Enter shutdown wait time before issuing further commands to device (t(stop)
given by regioster 0x1A)
Exit shutdown wait time before enabling external headphone amp (t(HPchg)
given by register 0x1A)
Headphone amp exit shutdown wait time before unmuting (t(HPamp) given by
register 0x1C)
Headphone amp enter shutdown wait time before entering ACSD (t(HPamp)
given by register 0x1C)
MIN
TYP MAX
UNIT
5 + 1.3 × t(volramp)
ms
1 + 1.3 × t(start)
ms
1 + 1.3 × t(stop)
ms
1 + 1.3 × t(HPchg)
ms
1 + 1.3 × t(HPamp)
ms
1 + 1.3 × t(HPamp)
ms
Figure 57. Headphone Control Use Model
Speaker Configuration
• Registers 0x07–0x0B
Master/channel speaker volume
• Register 0x19
SDG = 0x30 or 0x00 (no channels in SDG)
• Registers 0x11–0x12
ICD1/2 = {0xB8, 0x60}
• Register 0x1A
Clear bit for speaker mode (HP/SPKR = 0)
• Register 0x1A
Set to 0 1000 for 16.5-ms start/stop period
• Register 0x20
Set bit for Ch1 BD mode
• Register 0x20
Set bit for Ch2 BD mode
• Register 0x46
Set both bits to enable DRC1 and DRC2
• Register 0x50
Clear bit to enable EQ
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
43
TAS5715
SLOS645 – AUGUST 2010
www.ti.com
Headphone Configuration
• Registers 0x07–0x0B
Master/channel headphone volume
• Register 0x19
SDG = 0x30 or 0x00 (PWM3/4 in SDG)
• Registers 0x11–0x12
ICD1/2 = {0xAC, 0x54}
• Register 0x1A
Clear bit for headphone mode (HP/SPKR = 0)
• Register 0x1A
Set to 0 0000 for 0-ms start/stop period
• Register 0x20
Clear bit for Ch1 AD mode
• Register 0x20
Clear bit for Ch2 AD mode
• Register 0x46
Clear both bits to disable DRC1 and DRC2
• Register 0x50
Set bit to disable EQ
Headphone Mode Power Down
HP/SPKR
(SE/BTL)
VALID
PWM_A(L+)
PWM_C(R+)
HPL/R
HPL/R
t(exitSDHP)
t(HPamp)
t(exitSDHPamp)
PWM_B(L–)
PWM_D(R–)
FAULT = 1 Output
HPSD
(A0/FAULT)
Hi-Z (Ext. Pulldown)
I2C: SCL
SDA
Enable
FAULT
t(PDN-HPSD)
PDN
T0453-01
PARAMETE
R
t(PDN-HPSD)
t(exitSDHP)
t(exitSDHPamp)
t(HPamp)
DESCRIPTION
Delay from power-down event to headphone amplifier shutdown assertion
Exit shutdown wait time before enabling external headphone amp (t(HPchg)
given by register 0x1A)
Headphone amp exit shutdown wait time before unmuting (t(HPamp) given by
register 0x1C)
Headphone amp enable/disable wait time (given by register 0x1C)
MIN
TYP MAX
2
UNIT
ms
1 + 1.3 × t(HPchg)
ms
1 + 1.3 ×
t(HPamp)
ms
t(HPamp)
ms
Figure 58. Headphone Control Power Down
44
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
TAS5715
www.ti.com
SLOS645 – AUGUST 2010
Headphone-Mode All-Channel Shutdown
HP/SPKR
(SE/BTL)
VALID
PWM_A(L+)
PWM_C(R+)
HPL/R
HPL/R
t(exitSDHP)
t(mute)
t(enterSDHPamp)
t(exitSDHPamp)
PWM_B(L–)
PWM_D(R–)
FAULT = 1 Output
HPSD
(A0/FAULT)
Hi-Z (Ext. Pulldown)
I2C: SCL
SDA
Mute
Disable
FAULT
Enter
ACSD
HP
Config
Exit
ACSD
Enable
FAULT
Unmute
PDN
T0454-01
PARAMETE
R
t(mute)
t(exitSDHP)
t(exitSDHPamp)
t(enterSDHPamp)
DESCRIPTION
MIN
MAX
UNIT
5 + 1.3 ×
t(volramp)
ms
1 + 1.3 × t(HPchg)
ms
Mute volume ramp wait time (t(volramp) given by register 0x0E )
Exit shutdown wait time before enabling external headphone amp (t(HPchg)
given by register 0x1A)
Headphone amp exit shutdown wait time before unmuting (t(HPamp) given by
register 0x1C)
Headphone amp enter shutdown wait time before entering ACSD (t(HPamp)
given by register 0x1C)
TYP
1 + 1.3 ×
t(HPamp)
1 + 1.3 ×
t(HPamp)
ms
ms
Figure 59. Headphone Control ACSD
Applying Soft Reset
To soft-reset the device, write 0x01 to register 0xC8. Once soft reset is applied, I2C commands should not be
sent for a duration of 2 × (1 ms + 1.3 × t(start/stop)) + 13.5 ms.
Restrictions in Using 432-kHz Output Switching
•
•
•
•
Only 48-kHz LRCLK is supported. The maximum allowed variance on LRCLK is 1%.
The maxmimum allowed MCLK frequency is 12.288 MHz + 1%.
Only 64-fS SCLK is supported.
PWM headphone output is not supported.
I2C Commands to enable 423-kHz Switching
All I2C write operations should be at 100 kHz when used in this higher switching mode.
No 400-kHz I2C is supported when used in this mode.
To switch into 432-kHz switching mode, send the following commands before sending the exit shutdown
command to register 0x05.
• Write to register 0xF8 with a value of 0xA5A5A5A5.
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
45
TAS5715
SLOS645 – AUGUST 2010
•
•
•
•
•
•
•
46
www.ti.com
Write to register 0xC9 with a value of 0x000600EA.
Write to register 0xCA with a value of 0x0000000000000098. Note that register 0xCA is a write-only register.
Reads from this register are prohibited.
Write to register 0x03 with a value of 0x88.
Write to register 0x00 with a value of 0x6D.
Write to register 0x00 with a value of 0x6C.
Write to register 0x03 with a value of 0x80.
Write to register 0x05 with a value of 0x00.
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
TAS5715
www.ti.com
SLOS645 – AUGUST 2010
Table 3. Serial Control Interface Register Summary
SUBADDRESS
REGISTER NAME
NO. OF
BYTES
INITIALIZATION
VALUE
CONTENTS
A u indicates unused bits.
0x00
Clock control register
1
Description shown in subsequent section
0x6C
0x01
Device ID register
1
Description shown in subsequent section
0x42
0x02
Error status register
1
Description shown in subsequent section
0x00
0x03
System control register 1
1
Description shown in subsequent section
0xA0
0x04
Serial data interface
register
1
Description shown in subsequent section
0x05
0x05
System control register 2
1
Description shown in subsequent section
0x40
0x06
Soft mute register
1
Description shown in subsequent section
0x00
0x07
Master volume
1
Description shown in subsequent section
0xFF (mute)
0x08
Channel 1 vol
1
Description shown in subsequent section
0x30 (0 dB)
0x09
Channel 2 vol
1
Description shown in subsequent section
0x30 (0 dB)
0x0A
Channel 3 vol
1
Description shown in subsequent section
0x30 (0 dB)
1
Reserved (1)
0x0B–0x0D
0x0E
Volume configuration
register
1
Description shown in subsequent section
0x90
0x0F
Max duty cycle register
1
Description shown in subsequent section
0x97
0x10
Modulation limit register
1
Description shown in subsequent section
0x01
0x11
IC delay channel 1
1
Description shown in subsequent section
0xAC
0x12
IC delay channel 2
1
Description shown in subsequent section
0x54
0x13
IC delay channel 3
1
Description shown in subsequent section
0xAC
0x14
IC delay channel 4
1
Description shown in subsequent section
0x54
1
Reserved (1)
0x15–0x19
0x1A
Start/stop period register
1
0x68
0x1B
Oscillator trim register
1
0x82
0x1C
BKND_ERR register
1
0x1D–0x1F
0x20
Input MUX register
Reserved (1)
4
Description shown in subsequent section
(1)
0x21
4
Reserved
0x22–0x24
4
Reserved (1)
4
Description shown in subsequent section
0x25
PWM MUX register
0x26–0x28
0x29
0x2A
(1)
0x57
1
ch1_bq[0]
ch1_bq[1]
0x0001 7772
0x0000 4303
0x0102 1345
(1)
4
Reserved
20
u[31:26], b0[25:0]
0x0080 0000
u[31:26], b1[25:0]
0x0000 0000
u[31:26], b2[25:0]
0x0000 0000
u[31:26], a1[25:0]
0x0000 0000
u[31:26], a2[25:0]
0x0000 0000
u[31:26], b0[25:0]
0x0080 0000
u[31:26], b1[25:0]
0x0000 0000
u[31:26], b2[25:0]
0x0000 0000
u[31:26], a1[25:0]
0x0000 0000
u[31:26], a2[25:0]
0x0000 0000
20
Reserved registers should not be accessed.
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
47
TAS5715
SLOS645 – AUGUST 2010
www.ti.com
Table 3. Serial Control Interface Register Summary (continued)
SUBADDRESS
0x2B
0x2C
0x2D
0x2E
0x2F
0x30
0x31
0x32
0x33
48
REGISTER NAME
ch1_bq[2]
ch1_bq[3]
ch1_bq[4]
ch1_bq[5]
ch1_bq[6]
ch2_bq[0]
ch2_bq[1]
ch2_bq[2]
ch2_bq[3]
NO. OF
BYTES
20
20
20
20
20
20
20
20
20
CONTENTS
INITIALIZATION
VALUE
u[31:26], b0[25:0]
0x0080 0000
u[31:26], b1[25:0]
0x0000 0000
u[31:26], b2[25:0]
0x0000 0000
u[31:26], a1[25:0]
0x0000 0000
u[31:26], a2[25:0]
0x0000 0000
u[31:26], b0[25:0]
0x0080 0000
u[31:26], b1[25:0]
0x0000 0000
u[31:26], b2[25:0]
0x0000 0000
u[31:26], a1[25:0]
0x0000 0000
u[31:26], a2[25:0]
0x0000 0000
u[31:26], b0[25:0]
0x0080 0000
u[31:26], b1[25:0]
0x0000 0000
u[31:26], b2[25:0]
0x0000 0000
u[31:26], a1[25:0]
0x0000 0000
u[31:26], a2[25:0]
0x0000 0000
u[31:26], b0[25:0]
0x0080 0000
u[31:26], b1[25:0]
0x0000 0000
u[31:26], b2[25:0]
0x0000 0000
u[31:26], a1[25:0]
0x0000 0000
u[31:26], a2[25:0]
0x0000 0000
u[31:26], b0[25:0]
0x0080 0000
u[31:26], b1[25:0]
0x0000 0000
u[31:26], b2[25:0]
0x0000 0000
u[31:26], a1[25:0]
0x0000 0000
u[31:26], a2[25:0]
0x0000 0000
u[31:26], b0[25:0]
0x0080 0000
u[31:26], b1[25:0]
0x0000 0000
u[31:26], b2[25:0]
0x0000 0000
u[31:26], a1[25:0]
0x0000 0000
u[31:26], a2[25:0]
0x0000 0000
u[31:26], b0[25:0]
0x0080 0000
u[31:26], b1[25:0]
0x0000 0000
u[31:26], b2[25:0]
0x0000 0000
u[31:26], a1[25:0]
0x0000 0000
u[31:26], a2[25:0]
0x0000 0000
u[31:26], b0[25:0]
0x0080 0000
u[31:26], b1[25:0]
0x0000 0000
u[31:26], b2[25:0]
0x0000 0000
u[31:26], a1[25:0]
0x0000 0000
u[31:26], a2[25:0]
0x0000 0000
u[31:26], b0[25:0]
0x0080 0000
u[31:26], b1[25:0]
0x0000 0000
u[31:26], b2[25:0]
0x0000 0000
u[31:26], a1[25:0]
0x0000 0000
u[31:26], a2[25:0]
0x0000 0000
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
TAS5715
www.ti.com
SLOS645 – AUGUST 2010
Table 3. Serial Control Interface Register Summary (continued)
SUBADDRESS
0x34
0x35
0x36
REGISTER NAME
ch2_bq[4]
ch2_bq[5]
ch2_bq[6]
NO. OF
BYTES
20
20
20
INITIALIZATION
VALUE
CONTENTS
u[31:26], b0[25:0]
0x0080 0000
u[31:26], b1[25:0]
0x0000 0000
u[31:26], b2[25:0]
0x0000 0000
u[31:26], a1[25:0]
0x0000 0000
u[31:26], a2[25:0]
0x0000 0000
u[31:26], b0[25:0]
0x0080 0000
u[31:26], b1[25:0]
0x0000 0000
u[31:26], b2[25:0]
0x0000 0000
u[31:26], a1[25:0]
0x0000 0000
u[31:26], a2[25:0]
0x0000 0000
u[31:26], b0[25:0]
0x0080 0000
u[31:26], b1[25:0]
0x0000 0000
u[31:26], b2[25:0]
0x0000 0000
u[31:26], a1[25:0]
0x0000 0000
u[31:26], a2[25:0]
0x0000 0000
0x37
EQ CRC
4
u[31:16], EQ CRC [15:0]
0x0000 A14C
0x38
DRC CRC
4
u[31:16], DRC CRC [15:0]
0x0000 5395
Reserved (2)
0x0000 0000
8
Reserved (2)
0x0080 0000
8
u[31:26], ae[25:0]
0x0008 0000
u[31:26], oe[25:0]
0x0078 0000
0x39
0x3A
0x3B
DRC1 softening filter alpha
DRC1 softening filter
omega
0x3C
DRC1 attack rate
8
0x0000 0100
DRC1 release rate
0x3D
0x3E
DRC2 softening filter alpha
0xFFFF FF00
8
Reserved (2)
8
u[31:26], ae[25:0]
0x0008 0000
u[31:26], oe[25:0]
0xFFF8 0000
DRC2 softening filter
omega
0x3F
DRC2 attack rate
8
DRC2 release rate
0x40
DRC1 attack threshold
8
0x43
DRC2 attack threshold
0x46
DRC and DC DETECT
control
0x47–0x4F
0x0008 0000
u[31:26], rt[25:0]
0xFFF8 0000
0x0800 0000
T1'[31:0]
0x07FF FFFF
4
Reserved (2)
0x0000 0000
8
T2[31:0] (9.23 format)
0x0074 0000
T2'[31:0]
0x0073 FFFF
4
Reserved (2)
0x0000 0000
4
Description shown in subsequent section
0x0002 0020
4
Reserved (2)
DRC2 release threshold
0x45
u[31:26], at[25:0]
T1[31:0] (9.23 format)
DRC1 release threshold
0x42
0x0080 0000
0x50
Bank switch control
4
Description shown in subsequent section
0x0F70 8000
0x51
Ch 1 output mixer
8
Ch 1 output mix1[1]
0x0080 0000
0x52
Ch 2 output mixer
8
Ch 1 output mix1[0]
0x0000 0000
Ch 2 output mix2[1]
0x0080 0000
Ch 2 output mix2[0]
0x53
(2)
Ch 1 input mixers
16
0x0000 0000
2
Channel-1 input mixers can be accessed using I C
subaddresses 0x70–0x73 using 4-byte access
Reserved registers should not be accessed.
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
49
TAS5715
SLOS645 – AUGUST 2010
www.ti.com
Table 3. Serial Control Interface Register Summary (continued)
SUBADDRESS
REGISTER NAME
NO. OF
BYTES
CONTENTS
0x54
Ch 2 input mixers
16
Channel-2 input mixers can be accessed using I2C
subaddresses 0x74–0x77 using 4-byte access
0x56
Output post-scale
4
u[31:26], post[25:0]
0x0080 0000
0x57
Output pre-scale
4
u[31:26], pre[25:0] (9.17 format)
0x0002 0000
0x59
ch1 BQ[7] (DRC1 BQ)
20
u[31:26], b0[25:0]
0x0080 0000
u[31:26], b1[25:0]
0x0000 0000
u[31:26], b2[25:0]
0x0000 0000
u[31:26], a1[25:0]
0x0000 0000
u[31:26], a2[25:0]
0x0000 0000
u[31:26], b0[25:0]
0x0080 0000
u[31:26], b1[25:0]
0x0000 0000
u[31:26], b2[25:0]
0x0000 0000
u[31:26], a1[25:0]
0x0000 0000
u[31:26], a2[25:0]
0x0000 0000
0x5D
0x62
ch2 BQ[8] (DRC2 BQ)
IDF post scale
20
4
0x0000 0080
Reserved (3)
0x0000 0000
4
Ch 1 Input mixer[3]
0x0080 0000
0x71
4
Reserved (3)
0x0000 0000
0x72
4
Ch 1 Input mixer[1]; THIS NODE is RESERVED as
ZERO
0x0000 0000
0x63–0x6F
0x70
ch1 DRC
cross-over_mixer_1
0x73
ch1 Input Sclaer
4
Ch 1 Input mixer[0]
0x0080 0000
0x74
ch2 DRC
cross-over_mixer_1
4
Ch 2 Input mixer[3]
0x0080 0000
0x75
4
Reserved (3)
0x0000 0000
0x76
4
Ch 2 Input mixer[1]; THIS NODE is RESERVED as
ZERO
0x0000 0000
4
Ch 2 Input mixer[0]
0x0080 0000
Reserved (3)
0x0000 0000
Soft Reset Reg (bit [0] = 1 assert soft reset to the
device)
0x0000 0000
Reserved (3)
0x0000 0000
4
Reserved (3)
0x0000 0000
0x0000 0036
0x77
ch2 Input Scaler
0x78–0xC7
0xC8
Soft Reset Register [bit 0]
4
0xC9–0xF7
0xF8
0xF9
Update Dev Address Reg
4
u[31:8],New Dev Id[7:0] (New Dev Id = 0x38 for
TAS5715)
0xFE
Repeat Sub Address
4
Append the write to previous write
4
Reserved (3)
0xFA–0xFF
(3)
INITIALIZATION
VALUE
0x0000 0000
Reserved registers should not be accessed.
All DAP coefficients are 3.23 format unless specified otherwise.
Registers 0x3B through 0x46 should be altered only during the initialization phase.
50
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
TAS5715
www.ti.com
SLOS645 – AUGUST 2010
CLOCK CONTROL REGISTER (0x00)
The clocks and data rates are automatically determined by the TAS5715. The clock control register contains the
auto-detected clock status. Bits D7–D5 reflect the sample rate. Bits D4–D2 reflect the MCLK frequency.
Table 4. Clock Control Register (0x00)
D7
D6
D5
D4
D3
D2
D1
D0
0
0
0
–
–
–
–
–
fS = 32-kHz sample rate
0
0
1
–
–
–
–
–
Reserved (1)
0
1
0
–
–
–
–
–
Reserved (1)
0
1
1
–
–
–
–
–
fS = 44.1/48-kHz sample rate
1
0
0
–
–
–
–
–
fS = 16-kHz sample rate
1
0
1
–
–
–
–
–
fS = 22.05/24 -kHz sample rate
1
1
0
–
–
–
–
–
fS = 8-kHz sample rate
1
1
1
–
–
–
–
–
fS = 11.025/12-kHz sample rate
–
–
–
0
0
0
–
–
MCLK frequency = 64 × fS
–
–
–
0
0
1
–
–
MCLK frequency = 128 × fS
(3)
–
–
–
0
1
0
–
–
MCLK frequency = 192 × fS
(4)
–
–
–
0
1
1
–
–
MCLK frequency = 256 × fS
–
–
–
1
0
0
–
–
MCLK frequency = 384 × fS
–
–
–
1
0
1
–
–
MCLK frequency = 512 × fS
–
–
–
1
1
0
–
–
Reserved (1)
–
–
–
1
1
1
–
–
Reserved (1)
–
–
–
–
–
–
0
–
Reserved (1)
–
–
–
–
–
–
–
0
Reserved
(1)
(2)
(3)
(4)
(5)
FUNCTION
(2)
(3)
(2) (5)
(1)
Reserved registers should not be accessed.
Default values are in bold.
Only available for 44.1-kHz and 48-kHz rates
Rate only available for 32/44.1/48-KHz sample rates
Not available at 8 kHz
DEVICE ID REGISTER (0x01)
The device ID register contains the ID code for the firmware revision.
Table 5. General Status Register (0x01)
D7
D6
D5
D4
D3
D2
D1
D0
0
1
0
0
0
0
1
0
FUNCTION
Identification code
Submit Documentation Feedback
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): TAS5715
51
TAS5715
SLOS645 – AUGUST 2010
www.ti.com
ERROR STATUS REGISTER (0x02)
The error bits are sticky and are not cleared by the hardware. This means that the software must clear the
register (write zeroes) and then read them to determine if they are persistent errors.
Error definitions:
• MCLK error : MCLK frequency is changing. The number of MCLKs per LRCLK is changing.
• SCLK error: The number of SCLKs per LRCLK is changing.
• LRCLK error: LRCLK frequency is changing.
• Frame slip: LRCLK phase is drifting with respect to internal frame sync.
• DC detect: This flag is set if PWM dc detect is enabled and dc is detected in the PWM block.
Table 6. Error Status Register (0x02)
D7
D6
D5
D4
D3
D2
D1
D0
1
–
–
–
–
–
–
–
MCLK error
–
1
–
–
–
–
–
–
PLL autolock error
–
–
1
–
–
–
–
–
SCLK error
–
–
–
1
–
–
–
–
LRCLK error
–
–
–
–
1
–
–
–
EQ flag
–
–
–
–
–
1
–
–
DRC flag
–
–
–
–
–
–
1
–
Overcurrent, overtemperature, overvoltage, or undervoltage errors
–
–
–
–
–
–
–
1
PWM DC-detect flag
0
0
0
0
0
0
0
0
No errors
(1)
FUNCTION
(1)
Default values are in bold.
SYSTEM CONTROL REGISTER 1 (0x03)
The system control register 1 has several functions:
Bit D7:
If 0, the dc-blocking filter for each channel is disabled.
If 1, the dc-blocking filter (–3 dB cutoff
工商网监
湘ICP备2023018690号
