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TAS5751MDCAR

TAS5751MDCAR

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    HTSSOP48_12.5X6.1MM_EP

  • 描述:

    带 EQ 和 AGL 功能的 25W 立体声、40W 单声道、8V 至 26.4V、数字输入、开环 D 类音频放大器

  • 数据手册
  • 价格&库存
TAS5751MDCAR 数据手册
Order Now Product Folder Support & Community Tools & Software Technical Documents TAS5751M SLASEC1B – MARCH 2016 – REVISED MAY 2018 TAS5751M - Digital Input Audio Power Amplifier with EQ and 3-Band AGL 1 Features 2 Applications • • • 1 • • Audio Input/Output – One-Stereo Serial Audio Input – Supports 44.1-kHz and 48-kHz Sample Rates (LJ/RJ/I²S) – Supports 3-Wire I²S Mode (no MCLK required) – Automatic Audio Port Rate Detection – Supports BTL and PBTL Configuration – POUT = 25 W at 10% THD+N – PVDD = 20 V, 8 Ω, 1 kHz Audio/PWM Processing – Independent Channel Volume Controls With Gain of 24 dB to Mute in 0.125-dB Steps – Programmable Three-Band Automatic Gain Limiting (AGL) – 20 Programmable Biquads for Speaker EQ and Other Audio-Processing Features General Features – 106-dB SNR, A-Weighted, Referenced to Full Scale (0 dB) – I²C Serial Control Interface w/ two Addresses – Thermal, Short-Circuit, and Undervoltage Protection – Up to 90% Efficient – AD, BD, and Ternary Modulation – PWM Level Meter Power vs PVDD LCD TV, LED TV Low-Cost Audio Equipment 3 Description The TAS5751M device is an efficient, digital-input audio amplifier for driving stereo speakers configured as a bridge tied load (BTL). In parallel bridge tied load (PBTL) in can produce higher power by driving the parallel outputs into a single lower impedance load. One serial data input allows processing of up to two discrete audio channels and seamless integration to most digital audio processors and MPEG decoders. The device accepts a wide range of input data and data rates. A fully programmable data path routes these channels to the internal speaker drivers. The TAS5751M device is a slave-only device receiving all clocks from external sources. The TAS5751M device operates with a PWM carrier between a 384-kHz switching rate and a 288-kHz switching rate, depending on the input sample rate. Oversampling combined with a fourth-order noise shaper provides a flat noise floor and excellent dynamic range from 20 Hz to 20 kHz. Device Information(1) PART NUMBER TAS5751M BODY SIZE (NOM) HTSSOP (48) 12.50 mm × 6.10 mm (1) For all available packages, see the orderable addendum at the end of the data sheet. Simplified Block Diagram 45 RL = 4 Ω 40 PACKAGE DVDD AVDD Power-On Reset (POR) 35 Internal Regulation and Power Distribution MCLK Monitoring and Watchdog Output Power (W) PVDD RL = 8 Ω 30 MCLK 25 LRCK 20 Sensing & Protection Serial Audio Port (SAP) SCLK Sample Rate Auto-Detect SDIN PLL Digital Audio Processor (DAP) Sample Rate Converter (SRC) Internal Voltage Supplies Open Loop Stereo Stereo PWM Amplifier Digital to PWM Converter (DPC) 2 Ch. PWM Modulator Noise Shaping Temperature Short Circuits PVDD Voltage Output Current Click & Pop Suppression Fault Notification AMP_OUT_A AMP_OUT_B AMP_OUT_C AMP_OUT_D 15 10 Internal Register/State Machine Interface 5 Current Sourcing Limit EVM Thermal Limit I²C Control Port 0 8 12 16 PVDD (V) 20 24 SCL SDA DR_SD PDN RST 1 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA. TAS5751M SLASEC1B – MARCH 2016 – REVISED MAY 2018 www.ti.com Table of Contents 1 2 3 4 5 6 Features .................................................................. Applications ........................................................... Description ............................................................. Revision History..................................................... Pin Configuration and Functions ......................... Specifications......................................................... 6.1 6.2 6.3 6.4 6.5 6.6 6.7 6.8 6.9 6.10 6.11 7 1 1 1 2 3 5 Absolute Maximum Ratings ...................................... 5 ESD Ratings ............................................................ 5 Recommended Operating Conditions....................... 5 Thermal Characteristics ............................................ 6 Electrical Characteristics........................................... 6 Speaker Amplifier Characteristics............................ 7 Protection Characteristics ......................................... 7 Master Clock Characteristics .................................... 7 I²C Interface Timing Requirements ........................... 8 Serial Audio Port Timing Requirements.................. 8 Typical Characteristics .......................................... 10 Detailed Description ............................................ 17 7.1 Overview ................................................................. 17 7.2 7.3 7.4 7.5 7.6 7.7 8 Functional Block Diagram ....................................... Audio Signal Processing Overview ......................... Feature Description................................................. Device Functional Modes........................................ Programming........................................................... Register Maps ......................................................... 17 18 19 22 23 34 Application and Implementation ........................ 52 8.1 Application Information............................................ 52 8.2 Typical Applications ............................................... 53 9 Power Supply Recommendations...................... 58 10 Layout................................................................... 59 10.1 Layout Guidelines ................................................. 59 10.2 Layout Example .................................................... 60 11 Device and Documentation Support ................. 62 11.1 Trademarks ........................................................... 62 11.2 Electrostatic Discharge Caution ............................ 62 11.3 Glossary ................................................................ 62 12 Mechanical, Packaging, and Orderable Information ........................................................... 62 4 Revision History NOTE: Page numbers for previous revisions may differ from page numbers in the current version. Changes from Revision A (March 2016) to Revision B Page • Added PVDD to the Absolute Maximum Ratings table .......................................................................................................... 5 • Moved the units values From the MAX value column to the UNITS column in the I²C Interface Timing Requirements table ........................................................................................................................................................................................ 8 • Changed text "Multiplex channel 2 to AMP_OUT_D" To: Multiplex channel 2 to AMP_OUT_D" in the Functions column of Table 21 .............................................................................................................................................................. 49 Changes from Original (March 2016) to Revision A • 2 Page Moved from Product Preview to Production Data release. ................................................................................................... 1 Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M TAS5751M www.ti.com SLASEC1B – MARCH 2016 – REVISED MAY 2018 5 Pin Configuration and Functions DCA Package 48-Pin HTSSOP With PowerPAD™ Top View BSTRP_B 1 48 BSTRP_C AMP_OUT_B 2 47 AMP_OUT_C AMP_OUT_B 3 46 AMP_OUT_C PGND 4 45 PGND PGND 5 44 PGND AMP_OUT_A 6 43 AMP_OUT_D PVDD 7 42 PVDD PVDD 8 41 PVDD BSTRP_A 9 40 BSTRP_D SSTIMER 10 39 GVDD_REG PBTL 11 38 AVDD_REG NC 12 37 NC PowerPAD NC 13 36 NC PLL_GND 14 35 AGND PLL_FLTM 15 34 DGND PLL_FLTP 16 33 DVDD AVDD_REF 17 32 TEST AVDD 18 31 RST ADR/FAULT 19 30 NC MCLK 20 29 SCL OSC_RES 21 28 SDA OSC_GND 22 27 SDIN DVDD_REG 23 26 SCLK PDN 24 25 LRCLK Not to scale Pin Functions PIN NAME NO. TYPE (1) DESCRIPTION ADR/FAULT 19 DI/DO Dual function terminal which sets the LSB of the I²C Address to 0 if pulled to GND, 1 if pulled to AVDD. Also, if configured to be a fault output by the methods described in the Fault Indication section, this terminal will be pulled low when an internal fault occurs. AGND 35 P Ground reference for analog circuitry (NOTE: This terminal should be connected to the system ground) AMP_OUT_A 6 AMP_OUT_B AMP_OUT_C 2 3 46 AO Speaker amplifier outputs 47 AMP_OUT_D 43 AVDD 18 P Power supply for internal analog circuitry AVDD_REF 17 P Internal power supply (NOTE: This terminal is provided as a connection point for filtering capacitors for this supply and must not be used to power any external circuitry) AVDD_REG 38 P Voltage regulator derived from AVDD supply (NOTE: This terminal is provided as a connection point for filtering capacitors for this supply and must not be used to power any external circuitry) BSTRP_A 9 BSTRP_B 1 BSTRP_C 48 P Connection points to for the bootstrap capacitors, which are used to create a power supply for the gate drive for the high-side device BSTRP_D 40 DGND 34 P Ground reference for digital circuitry (NOTE: This terminal should be connected to the system ground) DVDD 33 P Power supply for the internal digital circuitry (1) TYPE: A = analog; D = 3.3-V digital; P = power/ground/decoupling; I = input; O = output Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M 3 TAS5751M SLASEC1B – MARCH 2016 – REVISED MAY 2018 www.ti.com Pin Functions (continued) PIN NAME NO. TYPE (1) DESCRIPTION DVDD_REG 23 P Voltage regulator derived from DVDD supply (NOTE: This terminal is provided as a connection point for filtering capacitors for this supply and must not be used to power any external circuitry) GVDD_REG 39 P Voltage regulator derived from PVDD supply (NOTE: This terminal is provided as a connection point for filtering capacitors for this supply and must not be used to power any external circuitry) LRCLK 25 DI Word select clock for the digital signal that is active on the input data line of the serial port MCLK 20 DI Master clock used for internal clock tree and sub-circuit/state machine clocking P Not connected inside the device (all "no connect" terminals should be connected to system ground) Ground reference for oscillator circuitry (NOTE: These terminals should be connected to the system ground) 12 13 NC (2) 30 36 37 OSC_GND 22 P OSC_RES 21 AO Connection point for precision resistor used by internal oscillator circuit. Details for this resistor are shown in the Typical Applications section PBTL 11 DI Places the power stage in BTL mode when pulled low, or in PBTL mode when pulled high PDN 24 DI Places the device in power down when pulled low — Ground reference for power device circuitry (NOTE: This terminal should be connected to the system ground) 4 5 PGND 44 45 PLL_FLTM 15 AO Negative connection point for the PLL loop filter components PLL_FLTP 16 AO Positive connection point for the PLL loop filter components PLL_GND 14 P Ground reference for PLL circuitry (NOTE: This terminal should be connected to the system ground) P Power supply for internal power circuitry 7 8 PVDD 41 42 RST 31 DI Places the devices in reset when pulled low SCL 29 DI I²C serial control port clock SCLK 26 DI Bit clock for the digital signal that is active on the input data line of the serial data port SDA 28 DI/DO SDIN 27 DI Data line to the serial data port SSTIMER 10 AO Connection point for the capacitor that is used by the ramp timing circuit, as described in the SSTIMER Pin Functionality section TEST 32 — Used by TI for testing during device production (NOTE: This terminal should be connected to system ground) PowerPAD — P Exposed metal pad on the underside of the device, which serves as an electrical connection point for ground as well as a heat conduction path from the device into the board (NOTE: This terminal should be connected to ground through a land pattern defined in the Mechanical Data section) (2) 4 I²C serial control port data Although these pins are not connected internally, optimum thermal performance is realized when these pins are connected to the ground plane. Doing so allows copper on the PCB to fill up to and including these pins, providing a path for heat to conduct away from the device and into the surrounding PCB area. Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M TAS5751M www.ti.com SLASEC1B – MARCH 2016 – REVISED MAY 2018 6 Specifications 6.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) Supply voltage Input voltage MIN MAX UNIT DVDD, AVDD, DR_VDD –0.3 3.6 V PVDD –0.3 30 3.3-V digital input –0.5 DVDD +. 0.5 5-V tolerant (2) digital input (except MCLK) –0.5 DVDD + 2.5 (3) –0.5 (3) 5-V tolerant MCLK input AVDD + 2.5 V AMP_OUT_x to GND 32 (4) V BSTRP_x to GND 39 (4) V PVDD V 0 85 °C –40 125 °C Supply voltage for power stage 28 Operating free-air temperature Storage temperature range, Tstg (1) (5) (6) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum conditions for extended periods may affect device reliability. 5-V tolerant inputs are PDN, RST, SCLK, LRCK, MCLK, SDIN, SDA, and SCL. Maximum pin voltage should not exceed 6 V. DC voltage + peak ac waveform measured at the pin should be below the allowed limit for all conditions. For operation at PVDD levels greater than 18 V, the modulation limit must be set to 96.1 % or lower via the control port register 0x10. 26.4 V is the maximum recommended operating voltage for continuous operation of the TAS5751M device. Testing and characterization of the device is performed up to and including 28 V to ensure “in system” design margin. Continuous operation at these levels is not recommended. Operation above the maximum recommended voltage may result in reduced performance, errant operation, and reduction in device reliability. (2) (3) (4) (5) (6) 6.2 ESD Ratings VALUE V(ESD) (1) (2) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1) ±4000 Charged-device model (CDM), per JEDEC specification JESD22C101 (2) ±1500 UNIT V JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 6.3 Recommended Operating Conditions DVDD, AVDD Digital, analog supply voltage PVDD Output power devices supply voltage VIH High-level input voltage 5-V tolerant VIL Low-level input voltage 5-V tolerant TA MIN NOM MAX 3 3.3 3.6 V (1) (2) V 8 26.4 UNIT 2 V 0.8 V Operating ambient temperature range 0 85 °C Operating junction temperature range 0 125 °C RL Load impedance 4 RL Load impedance in PBTL TJ LO (1) (2) (2) Output-filter inductance Minimum output inductance under short-circuit condition Ω 8 2 Ω 10 μH For operation at PVDD levels greater than 18 V, the modulation limit must be set to 96.1 % or lower via the control port register 0x10. 26.4 V is the maximum recommended operating voltage for continuous operation of the TAS5751M device. Testing and characterization of the device is performed up to and including 28 V to ensure “in system” design margin. Continuous operation at these levels is not recommended. Operation above the maximum recommended voltage may result in reduced performance, errant operation, and reduction in device reliability. Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M 5 TAS5751M SLASEC1B – MARCH 2016 – REVISED MAY 2018 www.ti.com 6.4 Thermal Characteristics DCA (48 PINS) THERMAL METRIC (1) Special Test Case JEDEC Standard 2Layer PCB JEDEC Standard 4Layer PCB TAS5751MEVM UNITS 49.9 26.2 24.0 °C/W θJA Junction-to-ambient thermal resistance (2) θJCtop Junction-to-case (top) thermal resistance (3) 14.9 °C/W θJB Junction-to-board thermal resistance (4) 6.9 °C/W (5) ψJT Junction-to-top characterization parameter ψJB Junction-to-board characterization parameter (6) θJCbot Junction-to-case (bottom) thermal resistance (7) (1) (2) (3) (4) (5) (6) (7) 1.1 0.8 0.7 °C/W 10.8 6.8 1.7 °C/W 1.7 °C/W For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report (SPRA953). The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-K board, as specified in JESD51-7, in an environment described in JESD51-2a. The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDECstandard test exists, but a close description can be found in the ANSI SEMI standard G30-88. The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB temperature, as described in JESD51-8. The junction-to-top characterization parameter, ψJT, estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining RθJA, using a procedure described in JESD51-2a (sections 6 and 7). The junction-to-board characterization parameter, ψJB, estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining RθJA, using a procedure described in JESD51-2a (sections 6 and 7). The junction-to-case (bottom) thermal resistance is obtained by simulating a cold plate test on the exposed (power) pad. No specific JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88. Spacer 6.5 Electrical Characteristics TA = 25°, PVDD_x = 24 V, DVDD = AVDD = 3.3 V, RL= 8 Ω, BTL BD mode, fS = 48 kHz (unless otherwise noted) PARAMETER VOH High-level output voltage VOL Low-level output voltage IIL Low-level input current ADR/SPK_FAULT and SDA Digital Inputs IIH High-level input current IDD 3.3-V supply current 6 3.3-V supply voltage (DVDD, AVDD) TEST CONDITIONS MIN IOH = –4 mA DVDD = AVDD = 3 V 2.4 TYP MAX UNIT V IOL = 4 mA DVDD = AVDD = 3 V 0.5 V VI < VIL DVDD = AVDD = 3.6 V 75 μA VI > VIH DVDD = AVDD = 3.6 V 75 μA Normal mode 49 68 Reset (RST = low, PDN = high) 23 38 Submit Documentation Feedback mA Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M TAS5751M www.ti.com 6.6 SLASEC1B – MARCH 2016 – REVISED MAY 2018 Speaker Amplifier Characteristics PVDD = 18 V, BTL AD mode, AVDD = DVDD = 3.3 V, fS = 48 KHz, RL = 8 Ω, audio frequency = 1 kHz, AES17 filter, fPWM = 384 kHz, TA = 25°C (unless otherwise specified). All performance is in accordance with recommended operating conditions. PARAMETER TEST CONDITIONS MIN TYP PVDD = 18 V,10% THD, 1-kHz input signal PO Power output per channel PVDD = 18 V, 7% THD, 1-kHz input signal 20 PVDD = 12 V, 10% THD, 1-kHz input signal 9.5 PVDD = 12 V, 7% THD, 1-kHz input signal 9 PVDD = 8 V, 10% THD, 1-kHz input signal 4.2 PVDD = 8 V, 7% THD, 1-kHz input signal THD+N Total harmonic distortion + noise Vn Output integrated noise (rms) Crosstalk SNR Signal-to-noise ratio Output switching frequency 0.07% PVDD = 12 V, PO = 1 W 0.03% PVDD = 8 V, PO = 1 W 0.1% A-weighted 44 μV –82 dB PO =1 W, f = 1 kHz (AD Mode), PVDD = 24 V –62 dB A-weighted, f = 1 kHz, maximum power at THD < 1% 106 dB 11.025/22.05/44.1-kHz data rate ±2% 288 48/24/12/8/16/32-kHz data rate ±2% 384 Normal mode 32 Reset (RST = low, PDN = high) 3 kHz 50 8 No load (PVDD) rDS(on) Drain-to-source resistance, LS TJ = 25°C, includes metallization resistance 80 Drain-to-source resistance, HS TJ = 25°C, includes metallization resistance 80 Internal pulldown resistor at the output of each half-bridge Connected when drivers are in the high-impedance state to provide bootstrap capacitor charge. (1) W PO = 1 W, f = 1 kHz (BD Mode), PVDD = 24 V Supply current RPD UNIT 4 PVDD = 18 V, PO = 1 W IPVDD (1) MAX 21.5 mA mΩ 3 kΩ This does not include bond-wire or pin resistance. 6.7 Protection Characteristics TA = 25°, PVDD_x = V, DVDD = AVDD = 3.3 V, RL= 8 Ω, BTL BD mode, fS = 48 kHz (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Vuvp(fall) Undervoltage protection limit PVDD falling 5.4 V Vuvp(rise) Undervoltage protection limit PVDD rising 5.8 V OTE Overtemperature error 150 °C IOC Overcurrent limit protection 4 A IOCT Overcurrent response time 150 ns 6.8 Master Clock Characteristics (1) PVDD = 24 V, BTL BD mode, AVDD = DVDD = 3.3 V, fS = 48 kHz, RL = 8 Ω, audio frequency = 1 kHz, AES17 filter, fPWM = 384 kHz, TA = 25°C (unless otherwise specified). All performance is in accordance with recommended operating conditions (unless otherwise specified). PARAMETER TEST CONDITIONS MIN TYP MAX UNIT 24.576 MHz PLL INPUT PARAMETERS fMCLKI tr / tf(MCLK) (1) MCLK frequency 2.8224 MCLK duty cycle 40% Rise/fall time for MCLK 50% 60% 5 ns For clocks related to the serial audio port, please see Serial Audio Port Timing Requirements. Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M 7 TAS5751M SLASEC1B – MARCH 2016 – REVISED MAY 2018 www.ti.com 6.9 I²C Interface Timing Requirements MIN NOM MAX UNIT tw(RST) Pulse duration, RST active 100 td(I²C_ready) Time to enable I²C after RST goes high 13.5 ms fSCL Frequency, SCL 400 kHz tw(H) Pulse duration, SCL high 0.6 tw(L) Pulse duration, SCL low 1.3 tr Rise time, SCL and SDA tf Fall time, SCL and SDA tsu1 Setup time, SDA to SCL th1 Hold time, SCL to SDA t(buf) tsu2 μs μs μs 300 ns 300 ns 100 ns 0 ns Bus free time between stop and start conditions 1.3 μs Setup time, SCL to start condition 0.6 μs th2 Hold time, start condition to SCL 0.6 μs tsu3 Setup time, SCL to stop condition 0.6 μs CL Load capacitance for each bus line 400 pF 6.10 Serial Audio Port Timing Requirements over recommended operating conditions (unless otherwise noted) PARAMETER TEST CONDITIONS CL ≤ 30 pF MIN TYP 1.024 MAX UNIT 12.288 MHz fSCLKIN Frequency, SCLK 32 × fS, 48 × fS, 64 × fS tsu1 Setup time, LRCK to SCLK rising edge 10 ns th1 Hold time, LRCK from SCLK rising edge 10 ns tsu2 Setup time, SDIN to SCLK rising edge 10 ns th2 Hold time, SDIN from SCLK rising edge 10 ns LRCK frequency 8 48 48 SCLK duty cycle 40% 50% 60% LRCK duty cycle 40% 50% 60% SCLK rising edges between LRCK rising edges kHz 32 64 SCLK edges –1/4 1/4 SCLK period t(edge) LRCK clock edge with respect to the falling edge of SCLK tr/tf Rise/fall time for SCLK/LRCK 8 ns LRCK allowable drift before LRCK reset 4 MCLKs RST tw(RST) 2 2 I C Active I C Active td(I2C_ready) System Initialization. 2 Enable via I C. T0421-01 NOTE: On power up, hold the TAS5751M RST LOW for at least 100 μs after DVDD has reached 3 V. NOTE: If RST is asserted LOW while PDN is LOW, then RST must continue to be held LOW for at least 100 μs after PDN is deasserted (HIGH). Figure 1. Reset Timing 8 Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M TAS5751M www.ti.com SLASEC1B – MARCH 2016 – REVISED MAY 2018 tw(H) tw(L) tf tr SCL tsu1 th1 SDA T0027-01 Figure 2. SCL and SDA Timing SCL t(buf) th2 tsu3 tsu2 SDA Start Condition Stop Condition T0028-01 Figure 3. Start and Stop Conditions Timing tr tf SCLK (Input) t(edge) th1 tsu1 LRCLK (Input) th2 tsu2 SDIN T0026-04 Figure 4. Serial Audio Port Timing Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M 9 TAS5751M SLASEC1B – MARCH 2016 – REVISED MAY 2018 www.ti.com 6.11 Typical Characteristics 6.11.1 Typical Characteristics - Stereo BTL Mode 45 RL = 4 Ω 2.0 BTL Mode RL = 8Ω TA = 25°C 55 40 RL = 8 Ω 50 Idle Channel Noise (uV) Output Power (W) 35 30 25 20 15 45 40 35 30 10 25 5 Current Sourcing Limit EVM Thermal Limit 8 0 8 12 16 20 10 12 24 14 16 18 Supply Voltage (V) 20 22 24 G012 PVDD (V) Figure 5. Output Power vs Supply Voltage Figure 6. Idle Channel Noise vs Supply Voltage 10 10 2.0 BTL Mode PVDD = 12V RL = 8Ω TA = 25°C 2.0 BTL Mode PVDD = 12V RL = 6Ω TA = 25°C 1 THD+N (%) THD+N (%) 1 0.1 0.01 0.1 0.01 PO = 1W PO = 2.5W PO = 5W 0.001 20 100 PO = 1W PO = 2.5W PO = 5W 1k Frequency (Hz) 10k 0.001 20k 20 100 1k Frequency (Hz) 10k G005 G003 Figure 7. THD+N vs Frequency Figure 8. THD+N vs Frequency 10 10 2.0 BTL Mode PVDD = 12V RL = 4Ω TA = 25°C 2.0 BTL Mode PVDD = 18V RL = 8Ω TA = 25°C 1 THD+N (%) THD+N (%) 1 0.1 0.01 0.1 0.01 PO = 1W PO = 2.5W PO = 5W 0.001 20 100 PO = 1W PO = 5W PO = 10W 1k Frequency (Hz) 10k 20k 0.001 20 100 1k Frequency (Hz) 10k G004 Figure 9. THD+N vs Frequency 10 20k Submit Documentation Feedback 20k G008 Figure 10. THD+N vs Frequency Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M TAS5751M www.ti.com SLASEC1B – MARCH 2016 – REVISED MAY 2018 Typical Characteristics - Stereo BTL Mode (continued) 10 10 2.0 BTL Mode PVDD = 18V RL = 6Ω TA = 25°C 2.0 BTL Mode PVDD = 18V RL = 4Ω TA = 25°C 1 THD+N (%) THD+N (%) 1 0.1 0.01 0.1 0.01 PO = 1W PO = 5W PO = 10W 0.001 20 100 PO = 1W PO = 5W PO = 10W 1k Frequency (Hz) 10k 0.001 20k 20 100 1k Frequency (Hz) 10k 20k G007 G006 Figure 11. THD+N vs Frequency Figure 12. THD+N vs Frequency 10 10 2.0 BTL Mode PVDD = 24V RL = 8Ω TA = 25°C 2.0 BTL Mode PVDD = 24V RL = 6Ω TA = 25°C 1 THD+N (%) THD+N (%) 1 0.1 0.01 0.1 0.01 PO = 1W PO = 5W PO = 10W 0.001 20 100 PO = 1W PO = 5W PO = 10W 1k Frequency (Hz) 10k 0.001 20k 20 100 1k Frequency (Hz) 10k 20k G011 G010 Figure 13. THD+N vs Frequency Figure 14. THD+N vs Frequency 10 10 2.0 BTL Mode PVDD = 24V RL = 4Ω TA = 25°C 2.0 BTL Mode PVDD = 12V RL = 8Ω TA = 25°C 1 THD+N (%) THD+N (%) 1 0.1 0.01 0.1 0.01 PO = 1W PO = 5W PO = 10W 0.001 20 100 f = 20Hz f = 1kHz f = 6kHz 1k Frequency (Hz) 10k 20k 0.001 0.01 G009 Figure 15. THD+N vs Frequency 0.1 1 Output Power (W) 10 20 G015 Figure 16. THD+N vs Output Power Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M 11 TAS5751M SLASEC1B – MARCH 2016 – REVISED MAY 2018 www.ti.com Typical Characteristics - Stereo BTL Mode (continued) 10 10 2.0 BTL Mode PVDD = 12V RL = 6Ω TA = 25°C 2.0 BTL Mode PVDD = 12V RL = 4Ω TA = 25°C 1 THD+N (%) THD+N (%) 1 0.1 0.01 0.1 0.01 f = 20Hz f = 1kHz f = 6kHz 0.001 0.01 0.1 1 Output Power (W) 10 f = 20Hz f = 1kHz f = 6kHz 0.001 0.01 20 0.1 1 Output Power (W) 10 20 G014 G013 Figure 17. THD+N vs Output Power Figure 18. THD+N vs Output Power 10 10 2.0 BTL Mode PVDD = 18V RL = 8Ω TA = 25°C 2.0 BTL Mode PVDD = 18V RL = 6Ω TA = 25°C 1 THD+N (%) THD+N (%) 1 0.1 0.01 0.1 0.01 f = 20Hz f = 1kHz f = 6kHz 0.001 0.01 0.1 1 Output Power (W) 10 f = 20Hz f = 1kHz f = 6kHz 0.001 0.01 20 0.1 1 Output Power (W) 10 20 G018 G017 Figure 19. THD+N vs Output Power Figure 20. THD+N vs Output Power 10 10 2.0 BTL Mode PVDD = 18V RL = 4Ω TA = 25°C 2.0 BTL Mode PVDD = 24V RL = 8Ω TA = 25°C 1 THD+N (%) THD+N (%) 1 0.1 0.01 0.1 0.01 f = 20Hz f = 1kHz f = 6kHz 0.001 0.01 0.1 1 Output Power (W) 10 f = 20Hz f = 1kHz f = 6kHz 20 0.001 0.01 G016 Figure 21. THD+N vs Output Power 12 Submit Documentation Feedback 0.1 1 Output Power (W) 10 20 G021 Figure 22. THD+N vs Output Power Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M TAS5751M www.ti.com SLASEC1B – MARCH 2016 – REVISED MAY 2018 Typical Characteristics - Stereo BTL Mode (continued) 10 10 2.0 BTL Mode PVDD = 24V RL = 6Ω TA = 25°C 2.0 BTL Mode PVDD = 24V RL = 4Ω TA = 25°C 1 THD+N (%) THD+N (%) 1 0.1 0.1 0.01 0.01 f = 20Hz f = 1kHz f = 6kHz 0.001 0.01 0.1 1 Output Power (W) 10 f = 20Hz f = 1kHz f = 6kHz 20 0.001 0.01 0.1 1 Output Power (W) 10 20 G020 G019 Figure 24. THD+N vs Output Power 100 100 90 90 80 80 70 70 60 60 Efficiency (%) Efficiency (%) Figure 23. THD+N vs Output Power 50 40 50 40 30 30 PVDD = 12V PVDD = 18V PVDD = 24V 20 10 0 0 5 10 PVDD = 12V PVDD = 18V PVDD = 24V 20 2.0 BTL Mode RL = 8Ω TA = 25°C 15 20 25 30 Total Output Power (W) 35 10 0 40 0 5 10 2.0 BTL Mode RL = 4Ω TA = 25°C 15 20 25 30 Total Output Power (W) 35 40 G023 Total Output Power includes power delivered from both amplifier outputs. For instance, 40 W of total output power means 2 × 20 W, with 20 W delivered by one channel and 20 W delivered by the other channel. Figure 25. Efficiency vs Total Output Power G022 Total Output Power includes power delivered from both amplifier outputs. For instance, 40 W of total output power means 2 × 20 W, with 20 W delivered by one channel and 20 W delivered by the other channel. Figure 26. Efficiency vs Total Output Power 0 0 2.0 BTL Mode PO = 1W PVDD = 12V RL = 8Ω TA = 25°C −10 −20 Right to Left Left to Right −20 Right to Left Left to Right −30 Crosstalk (dB) −30 Crosstalk (dB) 2.0 BTL Mode PO = 1W PVDD = 12V RL = 4Ω TA = 25°C −10 −40 −50 −60 −40 −50 −60 −70 −70 −80 −80 −90 −90 −100 −100 20 100 1k Frequency (Hz) 10k 20k 20 100 1k Frequency (Hz) 10k 20k G025 Figure 27. Crosstalk vs Frequency G024 Figure 28. Crosstalk vs Frequency Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M 13 TAS5751M SLASEC1B – MARCH 2016 – REVISED MAY 2018 www.ti.com Typical Characteristics - Stereo BTL Mode (continued) 0 0 2.0 BTL Mode PO = 1W PVDD = 18V RL = 8Ω TA = 25°C −10 −20 Right to Left Left to Right −20 Right to Left Left to Right −30 Crosstalk (dB) −30 Crosstalk (dB) 2.0 BTL Mode PO = 1W PVDD = 18V RL = 4Ω TA = 25°C −10 −40 −50 −60 −40 −50 −60 −70 −70 −80 −80 −90 −90 −100 −100 20 100 1k Frequency (Hz) 10k 20k 20 100 1k Frequency (Hz) 10k 20k G027 G026 Figure 29. Crosstalk vs Frequency Figure 30. Crosstalk vs Frequency 0 0 2.0 BTL Mode PO = 1W PVDD = 24V RL = 8Ω TA = 25°C −10 −20 Right to Left Left to Right −20 Right to Left Left to Right −30 Crosstalk (dB) −30 Crosstalk (dB) 2.0 BTL Mode PO = 1W PVDD = 24V RL = 4Ω TA = 25°C −10 −40 −50 −60 −40 −50 −60 −70 −70 −80 −80 −90 −90 −100 −100 20 100 1k Frequency (Hz) 10k 20k 20 100 1k Frequency (Hz) 10k 20k G029 G028 Figure 31. Crosstalk vs Frequency Figure 32. Crosstalk vs Frequency 6.11.2 Typical Characteristics - Mono PBTL Mode 80 10 PBTL Mode PBTL Mode PVDD = 12V f = 1kHz TA = 25°C RL = 4Ÿ 70 TA = 25ƒC 60 1 THD+N (%) Power (W) 50 40 0.1 30 20 0.01 2 Layer Continuous Power 10 RL = 4Ÿ 4 Layer Continuous Power RL = 2Ÿ Instantaneous Power 0 8 10 12 14 16 18 20 22 24 0.001 0.01 Supply Voltage (V) 1 10 100 Output Power (W) C039 Figure 33. Output Power vs Supply Voltage (PBTL Mode) 14 0.1 C032 Figure 34. Total Harmonic Distortion + Noise vs Output Power (PBTL Mode) Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M TAS5751M www.ti.com SLASEC1B – MARCH 2016 – REVISED MAY 2018 Typical Characteristics - Mono PBTL Mode (continued) 10 10 PBTL Mode PVDD = 24V f = 1kHz TA = 25°C PBTL Mode PVDD = 18V f = 1kHz TA = 25°C 1 THD+N (%) THD+N (%) 1 0.1 0.1 0.01 0.01 RL = 4Ÿ RL = 4Ÿ RL = 2Ÿ 0.001 0.01 0.1 1 10 0.001 0.01 100 RL = 2Ÿ 0.1 1 10 100 Output Power (W) Output Power (W) C029 C033 Figure 35. Total Harmonic Distortion + Noise vs Output Power (PBTL Mode) 10 Figure 36. Total Harmonic Distortion + Noise vs Output Power (PBTL Mode) 10 RL = 2Ÿ PBTL Mode PO = 1W PVDD = 12V TA = 25ƒC RL = 6Ÿ RL = 4Ÿ RL = 6Ÿ 1 THD+N (%) 1 THD+N (%) RL = 2Ÿ PBTL Mode PO = 1W PVDD = 18V TA = 25ƒC RL = 4Ÿ 0.1 0.1 0.01 0.01 0.001 0.001 20 200 2k 20k 20 200 Frequency (Hz) 2k 20k Frequency (Hz) C037 Figure 37. Total Harmonic Distortion + Noise vs Frequency (PBTL Mode) 10 C038 Figure 38. Total Harmonic Distortion + Noise vs Frequency (PBTL Mode) 100 RL = 2Ÿ PBTL Mode PO = 1W PVDD = 24V TA = 25ƒC RL = 4Ÿ 90 RL = 6Ÿ 80 1 PBTL Mode RL = 4Ÿ TA = 25ƒC Efficiency (%) THD+N (%) 70 0.1 60 50 40 30 0.01 20 PVDD = 12V PVDD = 18V 10 PVDD = 24V 0.001 0 20 200 2k 20k 0 Frequency (Hz) 20 40 60 80 Total Output Power (W) C041 Figure 39. Total Harmonic Distortion + Noise vs Frequency (PBTL Mode) C035 Total Output Power includes power delivered from both amplifier outputs. For instance, 40 W of total output power means 2 × 20 W, with 20 W delivered by one channel and 20 W delivered by the other channel. Figure 40. Efficiency vs Output Power (PBTL Mode) Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M 15 TAS5751M SLASEC1B – MARCH 2016 – REVISED MAY 2018 www.ti.com Typical Characteristics - Mono PBTL Mode (continued) 100 80 PBTL Mode 90 RL = 4Ÿ 70 TA = 25ƒC 80 50 60 Power (W) Efficiency (%) 60 PBTL Mode RL = 6Ÿ TA = 25ƒC 70 50 40 40 30 30 20 20 PVDD = 12V 2 Layer Continuous Power 10 PVDD = 18V 10 4 Layer Continuous Power PVDD = 24V 0 Instantaneous Power 0 0 10 20 30 40 8 50 10 12 14 16 18 20 22 24 Supply Voltage (V) Total Output Power (W) C039 C034 Total Output Power includes power delivered from both amplifier outputs. For instance, 40 W of total output power means 2 × 20 W, with 20 W delivered by one channel and 20 W delivered by the other channel. Figure 42. Power vs Supply Voltage (PBTL Mode) Figure 41. Efficiency vs Output Power (PBTL Mode) 80 PBTL Mode TA = 25ƒC Idle Channel Noise ( V) 60 40 20 RL = 4Ÿ RL = 6Ÿ RL = 8Ÿ 0 8 10 12 14 16 18 20 22 24 Supply Voltage (V) C036 Figure 43. Idle Channel Noise vs Supply Voltage (PBTL Mode) 16 Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M TAS5751M www.ti.com SLASEC1B – MARCH 2016 – REVISED MAY 2018 7 Detailed Description 7.1 Overview The TAS5751M device is an efficient, digital-input audio amplifier for driving stereo speakers configured as a bridge tied load (BTL). In parallel bridge tied load (PBTL) in can produce higher power by driving the parallel outputs into a single lower impedance load. One serial data input allows processing of up to two discrete audio channels and seamless integration to most digital audio processors and MPEG decoders. The device accepts a wide range of input data and data rates. A fully programmable data path routes these channels to the internal speaker drivers. The TAS5751M device is a slave-only device receiving all clocks from external sources. The TAS5751M device operates with a PWM carrier between a 384-kHz switching rate and a 288-kHz switching rate, depending on the input sample rate. Oversampling combined with a fourth-order noise shaper provides a flat noise floor and excellent dynamic range from 20 Hz to 20 kHz. 7.2 Functional Block Diagram DVDD Power-On Reset (POR) AVDD Internal Regulation and Power Distribution MCLK Monitoring and Watchdog MCLK LRCK PVDD Open Loop Stereo Stereo PWM Amplifier Digital to PWM Converter (DPC) Sensing & Protection Serial Audio Port (SAP) SCLK Sample Rate Auto-Detect SDIN PLL Digital Audio Processor (DAP) Sample Rate Converter (SRC) Internal Voltage Supplies 2 Ch. PWM Modulator Noise Shaping Temperature Short Circuits PVDD Voltage Output Current Click & Pop Suppression Fault Notification AMP_OUT_A AMP_OUT_B AMP_OUT_C AMP_OUT_D Internal Register/State Machine Interface I²C Control Port SCL SDA DR_SD PDN RST Figure 44. TAS5751M Functional Block Diagram Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M 17 TAS5751M SLASEC1B – MARCH 2016 – REVISED MAY 2018 www.ti.com 7.3 Audio Signal Processing Overview DC Block and LR Mixer Equalizer Multi Band AGL 0x59 Full Band AGL Master Volume 0x3B - 0x3C, 0x40 Biquad 0x5E 0x72, 0x73 0x26 L Biquad 0x27 - 0x2F, 0x58 Input Mixer L AGL 1 Low Band 0x51 0x8 Biquad 0x44 - 0x45, 0x48 10 Biquads 0x5A 0x3E - 0x3F, 0x43 0x07 - 0x57, 0x56 Mixer L L Vol 1 Biquad 0x5F 0x76, 0x77 AGL 2 High Band 0x9 0x42 - 0x41, 0x47 Vol 2 0x52 Biquad 0x31 - 0x39, 0x5D 0x30 R Biquad Input Mixer R 10 Biquads AGL 4 Full Band Master Volume, Pre Scale, Post Scale R 0x5B, 0x5C Mixer R 2 Biquads 0x60, 0x61 AGL 3 Mid Band 2 Biquads Figure 45. TAS5751M Audio Process Flow 18 Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M TAS5751M www.ti.com SLASEC1B – MARCH 2016 – REVISED MAY 2018 7.4 Feature Description 7.4.1 Clock, Autodetection, and PLL The TAS5751M device is an I²S slave device. The TAS5751M device accepts MCLK, SCLK, and LRCK. The digital audio processor (DAP) supports all the sample rates and MCLK rates that are defined in the Clock Control Register. The TAS5751M device checks to verify that SCLK is a specific value of 32 fS, 48 fS, or 64 fS. The DAP only supports a 1 × fS LRCK. The timing relationship of these clocks to SDIN is shown in subsequent sections. The clock section uses MCLK or the internal oscillator clock (when MCLK is unstable, out of range, or absent) to produce the internal clock (DCLK) running at 512 times the PWM switching frequency. The DAP can autodetect and set the internal clock control logic to the appropriate settings for all supported clock rates as defined in the Clock Control Register. The TAS5751M device has robust clock error handling that uses the built-in trimmed oscillator clock to quickly detect changes/errors. Once the system detects a clock change/error, the system mutes the audio (through a single-step mute) and then forces PLL to limp using the internal oscillator as a reference clock. Once the clocks are stable, the system autodetects the new rate and reverts to normal operation. During this process, the default volume is restored in a single step (also called hard unmute). The ramp process can be programmed to ramp back slowly (also called soft unmute) as defined in the Volume Configuration Register. 7.4.2 PWM Section The TAS5751M DAP device uses noise-shaping and customized nonlinear correction algorithms to achieve high power efficiency and high-performance digital audio reproduction. The DAP uses a fourth-order noise shaper to increase dynamic range and SNR in the audio band. The PWM section accepts 24-bit PCM data from the DAP and outputs two BTL PWM audio output channels. The PWM section has individual-channel dc-blocking filters that can be enabled and disabled. The filter cutoff frequency is less than 1 Hz. The PWM section has an adjustable maximum modulation limit of 93.8% to 99.2%. For PVDD > 18 V the modulation index must be limited to 96.1% for safe and reliable operation. 7.4.3 PWM Level Meter The structure in Figure 46 shows the PWM level meter that can be used to study the power profile. Post-DAP Processing 1–a –1 Z Ch1 ABS a rms 32-Bit Level ADDR = 0x6B 2 I C Registers (PWM Level Meter) 1–a –1 Z Ch2 ABS a rms 32-Bit Level ADDR = 0x6C B0396-01 Figure 46. PWM Level Meter Structure 7.4.4 Automatic Gain Limiter (AGL) The AGL scheme has three AGL blocks. One ganged AGL exists for the high-band left/right channels, the midband left/right channels, and the low-band left/right channels. The AGL input/output diagram is shown in Figure 47. Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M 19 TAS5751M SLASEC1B – MARCH 2016 – REVISED MAY 2018 www.ti.com Output Level (dB) Feature Description (continued) 1:1 Transfer Function Implemented Transfer Function T Input Level (dB) M0091-04 Professional-quality dynamic range compression automatically adjusts volume to flatten volume level. • Each AGL has adjustable threshold levels. • Programmable attack and decay time constants • Transparent compression: compressors can attack fast enough to avoid apparent clipping before engaging, and decay times can be set slow enough to avoid pumping. Figure 47. Automatic Gain Limiter Alpha Filter Structure S a –1 w Z T = 9.23 format, all other AGL coefficients are 3.23 format Figure 48. AGL Structure Table 1. AGL Structure α, ω T αa, ωa / αd, ωd AGL 1 0x3B 0x40 0x3C AGL 2 0x3E 0x43 0x3F AGL 3 0x47 0x41 0x42 AGL 4 0x48 0x44 0x45 7.4.5 Headphone/Line Amplifier An integrated ground centered DirectPath combination headphone amplifier and line driver is integrated in the TAS5729MD. This headphone/line amplifier can be used independently from the device speaker amplifier modes, with analog single-ended inputs DR_INA and DR_INB, linked to the respective analog outputs DR_OUTA, and DR_OUTB. A basic diagram of the headphone/line amplifier is shown in Figure 49. 20 Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M TAS5751M www.ti.com SLASEC1B – MARCH 2016 – REVISED MAY 2018 Figure 49. Headphone/Line Amplifier The DR_SDI pin can be used to turn on or off the headphone amplifier and line driver. The DirectPath amplifier makes use of the provided positive and negative supply rails generated by the IC. The output voltages are centered at zero volts with the capability to swing to the positive rail or negative rail; combining this capability with the built-in click and pop reduction circuit, the DirectPath amplifier requires no output dc blocking capacitors. 7.4.6 Fault Indication ADR/FAULT is an input pin during power up. This pin can be programmed after RST to be an output by writing 1 to bit 0 of I²C register 0x05. In that mode, the ADR/FAULT pin has the definition shown in Table 2. Any fault resulting in device shutdown is signaled by the ADR/FAULT pin going low (see Table 2). A latched version of this pin is available on D1 of register 0x02. This bit can be reset only by an I²C write. Table 2. ADR/FAULT Output States ADR/FAULT DESCRIPTION 0 Overcurrent (OC) or undervoltage (UVP) error or overtemperature error (OTE) or overvoltage error 1 No faults (normal operation) 7.4.7 SSTIMER Pin Functionality The SSTIMER pin uses a capacitor connected between this pin and ground to control the output duty cycle when exiting all-channel shutdown. The capacitor on the SSTIMER pin is slowly charged through an internal current source, and the charge time determines the rate at which the output transitions from a near-zero duty cycle to the desired duty cycle. This allows for a smooth transition that minimizes audible pops and clicks. When the part is shut down, the drivers are placed in the high-impedance state and transition slowly down through an internal 3kΩ resistor, similarly minimizing pops and clicks. The shutdown transition time is independent of the SSTIMER pin capacitance. Larger capacitors increase the start-up time, while smaller capacitors decrease the start-up time. The SSTIMER pin can be left floating for BD modulation. 7.4.8 Device Protection System 7.4.8.1 Overcurrent (OC) Protection With Current Limiting The TAS5751M device has independent, fast-reacting current detectors on all high-side and low-side powerstage FETs. The detector outputs are closely monitored to prevent the output current from increasing beyond the overcurrent threshold defined in the Protection Characteristics table. If the output current increases beyond the overcurrent threshold, the device shuts down and the outputs transition to the off or high impedance (Hi-Z) state. The device returns to normal operation once the fault condition (i.e., a short circuit on the output) is removed. Current-limiting and overcurrent protection are not independent for half-bridges. That is, if the bridge-tied load between half-bridges A and B causes an overcurrent fault, half-bridges A, B, C, and D shut down. 7.4.8.2 Overtemperature Protection The TAS5751M device has an overtemperature-protection system. If the device junction temperature exceeds 150°C (nominal), the device enters thermal shutdown, where all half-bridge outputs enter the high-impedance (Hi-Z) state, and ADR/FAULT asserts low if the device is configured to function as a fault output. The TAS5751M device recovers automatically once the junction temperature of the device drops approximately 30°C. Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M 21 TAS5751M SLASEC1B – MARCH 2016 – REVISED MAY 2018 www.ti.com 7.4.8.3 Undervoltage Protection (UVP) and Power-On Reset (POR) The UVP and POR circuits of the TAS5751M device fully protect the device in any power-up/down and brownout situation. While powering up, the POR circuit resets the overload circuit (OLP) and ensures that all circuits are fully operational when the PVDD and AVDD supply voltages reach 7.6 V and 2.7 V, respectively. Although PVDD and AVDD are independently monitored. For PVDD, if the supply voltage drops below the UVP threshold, the protection feature immediately sets all half-bridge outputs to the high-impedance (Hi-Z) state and asserts ADR/FAULT low. 7.5 Device Functional Modes The TAS5751M device is a digital input class-d amplifier with audio processing capabilities. The TAS5751M device has numerous modes to configure and control the device. 7.5.1 Serial Audio Port Operating Modes The serial audio port in the TAS5751M device supports industry-standard audio data formats, including I²S, Leftjustified(LJ) and Right-justified(RJ) formats. To select the data format that will be used with the device can controlled by using the serial data interface registers 0x04. The default is 24bit, I²S mode. The timing diagrams for the various serial audio port are shown in the Serial Interface Control and Timing section 7.5.2 Communication Port Operating Modes The TAS5751M device is configured via an I²C communication port. The I²C communication protocol is detailed in the 7.7 I²C Serial Control Port Requirements and Specifications section. 22 Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M TAS5751M www.ti.com SLASEC1B – MARCH 2016 – REVISED MAY 2018 Device Functional Modes (continued) 7.5.3 Speaker Amplifier Modes The TAS5751M device can be configured as: • Stereo Mode • Mono Mode 7.5.3.1 Stereo Mode Stereo mode is the most common option for the TAS5751M. TAS5751M can be connected in 2.0 mode to drive stereo channels. Detailed application section regarding the stereo mode is discussed in the Stereo Bridge Tied Load Application section. 7.5.3.2 Mono Mode Mono mode is described as the operation where the two BTL outputs of amplifier are placed in parallel with one another to provide increase in the output power capability. This mode is typically used to drive subwoofers, which require more power to drive larger loudspeakers with high-amplitude, low-frequency energy. Detailed application section regarding the mono mode is discussed in the Mono Parallel Bridge Tied Load Application section. 7.6 Programming 7.6.1 I²C Serial Control Interface The TAS5751M device has a bidirectional I²C interface that is compatible with the Inter IC (I²C) bus protocol and supports both 100-kHz and 400-kHz data transfer rates for single- and multiple-byte write and read operations. This is a slave-only device that does not support a multimaster bus environment or wait-state insertion. The control interface is used to program the registers of the device and to read device status. The DAP supports the standard-mode I²C bus operation (100 kHz maximum) and the fast I²C bus operation (400 kHz maximum). The DAP performs all I²C operations without I²C wait cycles. 7.6.1.1 General I²C Operation The I²C bus employs two signals, SDA (data) and SCL (clock), to communicate between integrated circuits in a system. Data is transferred on the bus serially, one bit at a time. The address and data can be transferred in byte (8-bit) format, with the most-significant bit (MSB) transferred first. In addition, each byte transferred on the bus is acknowledged by the receiving device with an acknowledge bit. Each transfer operation begins with the master device driving a start condition on the bus and ends with the master device driving a stop condition on the bus. The bus uses transitions on the data pin (SDA) while the clock is high to indicate start and stop conditions. A high-to-low transition on SDA indicates a start and a low-to-high transition indicates a stop. Normal data-bit transitions must occur within the low time of the clock period. These conditions are shown in Figure 50. The master generates the 7-bit slave address and the read/write (R/W) bit to open communication with another device and then waits for an acknowledge condition. The TAS5751M device holds SDA low during the acknowledge clock period to indicate an acknowledgment. When this occurs, the master transmits the next byte of the sequence. Each device is addressed by a unique 7-bit slave address plus R/W bit (1 byte). All compatible devices share the same signals via a bidirectional bus using a wired-AND connection. An external pullup resistor must be used for the SDA and SCL signals to set the high level for the bus. SDA R/ A W 7-Bit Slave Address 7 6 5 4 3 2 1 0 8-Bit Register Address (N) 7 6 5 4 3 2 1 0 8-Bit Register Data For Address (N) A 7 6 5 4 3 2 1 8-Bit Register Data For Address (N) A 0 7 6 5 4 3 2 1 A 0 SCL Start Stop T0035-01 Figure 50. Typical I²C Sequence Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M 23 TAS5751M SLASEC1B – MARCH 2016 – REVISED MAY 2018 www.ti.com Programming (continued) No limit exists for the number of bytes that can be transmitted between start and stop conditions. When the last word transfers, the master generates a stop condition to release the bus. A generic data transfer sequence is shown in Figure 50. The 7-bit address for the TAS5751M device is 0101 010 (0x54) or 0101 011 (0x56) as defined by ADR/FAULT (external pulldown for 0x54 and pullup for 0x56). 7.6.1.2 I²C Slave Address The ADR/FAULT is an input pin during power-up and after each toggle of RST, which is used to set the I²C subaddress of the device. The ADR/FAULT can also operate as a fault output after power-up is complete and the address has been latched in. At power-up, and after each toggle of RST, the pin is read to determine its voltage level. If the pin is left floating, an internal pull-up will set the I²C sub-address to 0x56. This will also be the case if an external resistor is used to pull the pin up to AVDD. To set the sub-address to 0x54, an external resistor (specified in Typical Applications ) must be connected to the system ground. As mentioned, the pin can also be reconfigured as an output driver via I²C for fault monitoring. Use System Control Register 2 (0x05) to set ADR/FAULT pin to be used as a fault output during fault conditions. 7.6.1.2.1 I²C Device Address Change Procedure 1. Write to device address change enable register, 0xF8 with a value of 0xF9A5 A5A5. 2. Write to device register 0xF9 with a value of 0x0000 00XX, where XX is the new address. 3. Any writes after that should use the new device address XX. 7.6.1.3 Single- and Multiple-Byte Transfers The serial control interface supports both single-byte and multiple-byte read/write operations for subaddresses 0x00 to 0x1F. However, for the subaddresses 0x20 to 0xFF, the serial control interface supports only multiplebyte read/write operations (in multiples of 4 bytes). During multiple-byte read operations, the DAP responds with data, a byte at a time, starting at the subaddress assigned, as long as the master device continues to respond with acknowledges. If a particular subaddress does not contain 32 bits, the unused bits are read as logic 0. During multiple-byte write operations, the DAP compares the number of bytes transmitted to the number of bytes that are required for each specific subaddress. For example, if a write command is received for a biquad subaddress, the DAP must receive five 32-bit words. If fewer than five 32-bit data words have been received when a stop command (or another start command) is received, the received data is discarded. Supplying a subaddress for each subaddress transaction is referred to as random I²C addressing. The TAS5751M device also supports sequential I²C addressing. For write transactions, if a subaddress is issued followed by data for that subaddress and the 15 subaddresses that follow, a sequential I²C write transaction has taken place, and the data for all 16 subaddresses is successfully received by the TAS5751M device. For I²C sequential-write transactions, the subaddress then serves as the start address, and the amount of data subsequently transmitted before a stop or start is transmitted determines how many subaddresses are written. As was true for random addressing, sequential addressing requires that a complete set of data be transmitted. If only a partial set of data is written to the last subaddress, the data for the last subaddress is discarded. However, all other data written is accepted; only the incomplete data is discarded. 24 Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M TAS5751M www.ti.com SLASEC1B – MARCH 2016 – REVISED MAY 2018 Programming (continued) 7.6.1.4 Single-Byte Write As shown in Figure 51, a single-byte data-write transfer begins with the master device transmitting a start condition followed by the I²C device address and the read/write bit. The read/write bit determines the direction of the data transfer. For a data-write transfer, the read/write bit is a 0. After receiving the correct I²C device address and the read/write bit, the DAP responds with an acknowledge bit. Next, the master transmits the address byte or bytes corresponding to the internal memory address being accessed. After receiving the address byte, the TAS5751M device again responds with an acknowledge bit. Next, the master device transmits the data byte to be written to the memory address being accessed. After receiving the data byte, the TAS5751M device again responds with an acknowledge bit. Finally, the master device transmits a stop condition to complete the singlebyte data-write transfer. Start Condition Acknowledge A6 A5 A4 A3 A2 A1 A0 Acknowledge R/W ACK A7 A6 A5 2 A4 A3 A2 A1 Acknowledge A0 ACK D7 D6 Subaddress I C Device Address and Read/Write Bit D5 D4 D3 D2 D1 D0 ACK Stop Condition Data Byte T0036-01 Figure 51. Single-Byte Write Transfer 7.6.1.5 Multiple-Byte Write A multiple-byte data-write transfer is identical to a single-byte data-write transfer except that multiple data bytes are transmitted by the master device to the DAP as shown in Figure 52. After receiving each data byte, the TAS5751M device responds with an acknowledge bit. Start Condition Acknowledge A6 A5 A1 A0 R/W ACK A7 A6 A5 2 A4 A3 Subaddress I C Device Address and Read/Write Bit A1 Acknowledge Acknowledge Acknowledge Acknowledge A0 ACK D7 D0 ACK D7 D0 ACK D7 D0 ACK First Data Byte Other Data Bytes Last Data Byte Stop Condition T0036-02 Figure 52. Multiple-Byte Write Transfer 7.6.1.6 Single-Byte Read As shown in Figure 53, a single-byte data-read transfer begins with the master device transmitting a start condition, followed by the I²C device address and the read/write bit. For the data read transfer, both a write followed by a read are actually done. Initially, a write is done to transfer the address byte or bytes of the internal memory address to be read. As a result, the read/write bit becomes a 0. After receiving the TAS5751M address and the read/write bit, TAS5751M device responds with an acknowledge bit. In addition, after sending the internal memory address byte or bytes, the master device transmits another start condition followed by the TAS5751M address and the read/write bit again. This time, the read/write bit becomes a 1, indicating a read transfer. After receiving the address and the read/write bit, the TAS5751M device again responds with an acknowledge bit. Next, the TAS5751M device transmits the data byte from the memory address being read. After receiving the data byte, the master device transmits a not-acknowledge followed by a stop condition to complete the single-byte data-read transfer. Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M 25 TAS5751M SLASEC1B – MARCH 2016 – REVISED MAY 2018 www.ti.com Programming (continued) Repeat Start Condition Start Condition Acknowledge A6 A5 A1 A0 R/W ACK A7 Acknowledge A6 2 A5 A4 A0 ACK A6 A5 A1 A0 R/W ACK D7 D6 2 I C Device Address and Read/Write Bit Subaddress I C Device Address and Read/Write Bit Not Acknowledge Acknowledge D1 D0 ACK Stop Condition Data Byte T0036-03 Figure 53. Single-Byte Read Transfer 7.6.1.7 Multiple-Byte Read A multiple-byte data-read transfer is identical to a single-byte data-read transfer except that multiple data bytes are transmitted by the TAS5751M device to the master device as shown in Figure 54. Except for the last data byte, the master device responds with an acknowledge bit after receiving each data byte. Repeat Start Condition Start Condition Acknowledge A6 A0 R/W ACK A7 2 I C Device Address and Read/Write Bit Acknowledge A6 A6 A0 ACK A5 2 Acknowledge Acknowledge Acknowledge Not Acknowledge A0 R/W ACK D7 D0 ACK D7 D0 ACK D7 D0 ACK I C Device Address and Read/Write Bit Subaddress First Data Byte Other Data Bytes Last Data Byte Stop Condition T0036-04 Figure 54. Multiple-Byte Read Transfer 7.6.2 Serial Interface Control and Timing 7.6.2.1 Serial Data Interface Serial data is input on SDIN. The PWM outputs are derived from SDIN. The TAS5751M DAP accepts serial data in 16-bit, 20-bit, or 24-bit left-justified, right-justified, and I²S serial data formats. 7.6.2.2 I²S Timing I²S timing uses LRCK to define when the data being transmitted is for the left channel and when the data is for the right channel. LRCK is low for the left channel and high for the right channel. A bit clock running at 32 × fS, 48 × fS, or 64 × fS is used to clock in the data. A delay of one bit clock exists from the time the LRCK signal changes state to the first bit of data on the data lines. The data is written MSB-first and is valid on the rising edge of bit clock. The DAP masks unused trailing data bit positions. 26 Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M TAS5751M www.ti.com SLASEC1B – MARCH 2016 – REVISED MAY 2018 Programming (continued) 2 2-Channel I S (Philips Format) Stereo Input 32 Clks LRCLK (Note Reversed Phase) 32 Clks Right Channel Left Channel SCLK SCLK MSB 24-Bit Mode 23 22 LSB 9 8 5 4 5 4 1 0 1 0 1 0 MSB LSB 23 22 9 8 5 4 19 18 5 4 1 0 15 14 1 0 1 0 20-Bit Mode 19 18 16-Bit Mode 15 14 T0034-01 NOTE: All data presented in two's-complement form with MSB first. Figure 55. I²S 64-fS Format Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M 27 TAS5751M SLASEC1B – MARCH 2016 – REVISED MAY 2018 www.ti.com Programming (continued) 2 2-Channel I S (Philips Format) Stereo Input/Output (24-Bit Transfer Word Size) LRCLK 24 Clks 24 Clks Left Channel Right Channel SCLK SCLK MSB 24-Bit Mode 23 22 MSB LSB 17 16 9 8 5 4 13 12 5 4 1 0 9 1 0 3 2 1 0 LSB 23 22 17 16 9 8 5 4 19 18 13 12 5 4 1 0 15 14 9 1 0 3 2 1 20-Bit Mode 19 18 16-Bit Mode 15 14 8 8 T0092-01 NOTE: All data presented in two's-complement form with MSB first. Figure 56. I²S 48-fS Format 2 2-Channel I S (Philips Format) Stereo Input LRCLK 16 Clks 16 Clks Left Channel Right Channel SCLK SCLK MSB 16-Bit Mode 15 14 13 12 MSB LSB 11 10 9 8 5 4 3 2 1 0 LSB 15 14 13 12 11 10 9 8 5 4 3 2 1 T0266-01 NOTE: All data presented in two's-complement form with MSB first. Figure 57. I²S 32-fS Format 28 Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M TAS5751M www.ti.com SLASEC1B – MARCH 2016 – REVISED MAY 2018 Programming (continued) 7.6.2.3 Left-Justified Left-justified (LJ) timing uses LRCK to define when the data being transmitted is for the left channel and when the data is for the right channel. LRCK is high for the left channel and low for the right channel. A bit clock running at 32 × fS, 48 × fS, or 64 × fS is used to clock in the data. The first bit of data appears on the data lines at the same time LRCK toggles. The data is written MSB-first and is valid on the rising edge of the bit clock. The DAP masks unused trailing data bit positions. 2-Channel Left-Justified Stereo Input 32 Clks 32 Clks Left Channel Right Channel LRCLK SCLK SCLK MSB 24-Bit Mode 23 22 LSB 9 8 5 4 5 4 1 0 1 0 1 0 MSB LSB 23 22 9 8 5 4 19 18 5 4 1 0 15 14 1 0 1 0 20-Bit Mode 19 18 16-Bit Mode 15 14 T0034-02 NOTE: All data presented in two's-complement form with MSB first. Figure 58. Left-Justified 64-fS Format Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M 29 TAS5751M SLASEC1B – MARCH 2016 – REVISED MAY 2018 www.ti.com Programming (continued) 2-Channel Left-Justified Stereo Input (24-Bit Transfer Word Size) 24 Clks 24 Clks Left Channel Right Channel LRCLK SCLK SCLK MSB 24-Bit Mode 23 22 21 LSB 17 16 9 8 5 4 13 12 5 4 1 0 9 1 0 1 0 MSB LSB 21 17 16 9 8 5 4 19 18 17 13 12 5 4 1 0 15 14 13 9 1 0 23 22 1 0 20-Bit Mode 19 18 17 16-Bit Mode 15 14 13 8 8 T0092-02 NOTE: All data presented in two's-complement form with MSB first. Figure 59. Left-Justified 48-fS Format 2-Channel Left-Justified Stereo Input 16 Clks 16 Clks Left Channel Right Channel LRCLK SCLK SCLK MSB 16-Bit Mode 15 14 13 12 LSB 11 10 9 8 5 4 3 2 1 0 MSB 15 14 13 12 LSB 11 10 9 8 5 4 3 2 1 0 T0266-02 NOTE: All data presented in two's-complement form with MSB first. Figure 60. Left-Justified 32-fS Format 30 Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M TAS5751M www.ti.com SLASEC1B – MARCH 2016 – REVISED MAY 2018 Programming (continued) 7.6.2.4 Right-Justified Right-justified (RJ) timing uses LRCK to define when the data being transmitted is for the left channel and when the data is for the right channel. LRCK is high for the left channel and low for the right channel. A bit clock running at 32 × fS, 48 × fS, or 64 × fS is used to clock in the data. The first bit of data appears on the data 8 bitclock periods (for 24-bit data) after LRCK toggles. In RJ mode, the LSB of data is always clocked by the last bit clock before LRCK transitions. The data is written MSB-first and is valid on the rising edge of bit clock. The DAP masks unused leading data bit positions. 2-Channel Right-Justified (Sony Format) Stereo Input 32 Clks 32 Clks Left Channel Right Channel LRCLK SCLK SCLK MSB 24-Bit Mode LSB 23 22 19 18 15 14 1 0 19 18 15 14 1 0 15 14 1 0 MSB LSB 23 22 19 18 15 14 1 0 19 18 15 14 1 0 15 14 1 0 20-Bit Mode 16-Bit Mode T0034-03 All data presented in two's-complement form with MSB first. Figure 61. Right-Justified 64-fS Format Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M 31 TAS5751M SLASEC1B – MARCH 2016 – REVISED MAY 2018 www.ti.com Programming (continued) 2-Channel Right-Justified Stereo Input (24-Bit Transfer Word Size) 24 Clks 24 Clks Left Channel Right Channel LRCLK SCLK SCLK MSB 24-Bit Mode 23 22 LSB 19 18 15 14 6 5 2 1 0 19 18 15 14 6 5 2 1 0 15 14 6 5 2 1 0 LSB MSB 23 22 19 18 15 14 6 5 2 1 0 19 18 15 14 6 5 2 1 0 15 14 6 5 2 1 0 20-Bit Mode 16-Bit Mode T0092-03 All data presented in two's-complement form with MSB first. Figure 62. Right-Justified 48-fS Format All data presented in two's-complement form with MSB first. Figure 63. Right-Justified 32-fS Format 7.6.3 26-Bit 3.23 Number Format All mixer gain coefficients are 26-bit coefficients using a 3.23 number format. Numbers formatted as 3.23 numbers mean that the binary point has 3 bits to the left and 23 bits to the right. This is shown in Figure 64. 32 Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M TAS5751M www.ti.com SLASEC1B – MARCH 2016 – REVISED MAY 2018 Programming (continued) 2 –23 2 2 Bit –5 Bit –1 Bit 0 2 Bit 1 2 Bit Sign Bit S_xx.xxxx_xxxx_xxxx_xxxx_xxxx_xxx M0125-01 Figure 64. 3.23 Format The decimal value of a 3.23 format number can be found by following the weighting shown in Figure 64. If the most significant bit is logic 0, the number is a positive number, and the weighting shown yields the correct number. If the most significant bit is a logic 1, then the number is a negative number. In the case every bit must be inverted, a 1 added to the result, and then the weighting shown in Figure 65 applies to obtain the magnitude of the negative number. 1 0 2 Bit 2 Bit 1 2 –1 Bit 0 (1 or 0) ´ 2 + (1 or 0) ´ 2 + (1 or 0) ´ 2 2 –1 –4 Bit + ....... (1 or 0) ´ 2 2 –4 –23 Bit + ....... (1 or 0) ´ 2 –23 M0126-01 Figure 65. Conversion Weighting Factors—3.23 Format to Floating Point Gain coefficients, entered via the I²C bus, must be entered as 32-bit binary numbers. The format of the 32-bit number (4-byte or 8-digit hexadecimal number) is shown in Figure 66. Fraction Digit 6 Sign Bit Integer Digit 1 Fraction Digit 1 Fraction Digit 2 Fraction Digit 3 Fraction Digit 4 Fraction Digit 5 u u u u u u S x x. x x x x x x x x x x x x x x x x x x x x x x x 0 Coefficient Digit 8 Coefficient Digit 7 Coefficient Digit 6 Coefficient Digit 5 Coefficient Digit 4 Coefficient Digit 3 Coefficient Digit 2 Coefficient Digit 1 u = unused or don’t care bits Digit = hexadecimal digit M0127-01 Figure 66. Alignment of 3.23 Coefficient in 32-Bit I²C Word Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M 33 TAS5751M SLASEC1B – MARCH 2016 – REVISED MAY 2018 www.ti.com Table 3. Sample Calculation for 3.23 Format db Linear Decimal Hex (3.23 Format) 0 1 8,388,608 80 0000 5 1.77 14,917,288 00E3 9EA8 –5 0.56 4,717,260 0047 FACC X L = 10(X / 20) D = 8,388,608 × L H = dec2hex (D, 8) Table 4. Sample Calculation for 9.17 Format db Linear Decimal 0 1 131,072 2 0000 5 1.77 231,997 3 8A3D –5 0.56 73,400 1 1EB8 D = 131,072 × L H = dec2hex (D, 8) X (X / 20) L = 10 Hex (9.17 Format) 7.7 Register Maps 7.7.1 Register Summary SUBADDRESS REGISTER NAME NO. OF BYTES CONTENTS DEFAULT VALUE A u indicates unused bits. 0x00 Clock control register 1 Description shown in subsequent section 0x6C 0x01 Device ID register 1 Description shown in subsequent section 0x40 0x02 Error status register 1 Description shown in subsequent section 0x00 0x03 System control register 1 1 Description shown in subsequent section 0xA0 0x04 Serial data interface register 1 Description shown in subsequent section 0x05 0x05 System control register 2 1 Description shown in subsequent section 0x40 0x06 Soft mute register 1 Description shown in subsequent section 0x00 0x07 Master volume 2 Description shown in subsequent section 0x03FF (mute) 0x08 Channel 1 vol 2 Description shown in subsequent section 0x00C0 (0 dB) 0x09 Channel 2 vol 2 Description shown in subsequent section 0x00C0 (0 dB) 0x0A Channel 3 vol 2 Description shown in subsequent section 0x00C0 (0 dB) 0x0B Reserved 2 Reserved (1) 0x03FF 0x0C 2 Reserved (1) 0x00C0 0x0D 1 Reserved (1) 0xC0 0x0E Volume configuration register 1 Description shown in subsequent section 0xF0 0x0F Reserved 1 Reserved (1) 0x97 0x10 Modulation limit register 1 Description shown in subsequent section 0x01 0x11 IC delay channel 1 1 Description shown in subsequent section 0xAC 0x12 IC delay channel 2 1 Description shown in subsequent section 0x54 0x13 IC delay channel 3 1 Description shown in subsequent section 0xAC 0x14 IC delay channel 4 1 Description shown in subsequent section 0x54 0x15 Reserved 1 Reserved (1) 0xAC 0x16 0x54 0x17 (1) 34 0x00 0x18 PWM Start 0x0F 0x19 PWM Shutdown Group Register 1 Description shown in subsequent section 0x30 0x1A Start/stop period register 1 Description shown in subsequent section 0x68 0x1B Oscillator trim register 1 Description shown in subsequent section 0x82 Do not access reserved registers. Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M TAS5751M www.ti.com SLASEC1B – MARCH 2016 – REVISED MAY 2018 Register Maps (continued) SUBADDRESS 0x1C REGISTER NAME BKND_ERR register 0x1D–0x1F NO. OF BYTES 1 DEFAULT VALUE CONTENTS Description shown in subsequent section (1) 0x57 1 Reserved 0x20 Input MUX register 4 Description shown in subsequent section 0x0001 7772 0x00 0x21 Reserved 4 Reserved (1) 0x0000 4303 0x22 4 0x0000 0000 0x23 4 0x0000 0000 0x24 4 0x0000 0000 0x25 PWM MUX register 4 Description shown in subsequent section 0x0102 1345 0x26 ch1_bq[0] 20 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 0x27 0x28 0x29 0x2A 0x2B 0x2C ch1_bq[1] ch1_bq[2] ch1_bq[3] ch1_bq[4] ch1_bq[5] ch1_bq[6] 20 20 20 20 20 20 Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M 35 TAS5751M SLASEC1B – MARCH 2016 – REVISED MAY 2018 www.ti.com Register Maps (continued) SUBADDRESS 0x2D 0x2E 0x2F 0x30 0x31 0x32 0x33 0x34 0x35 36 REGISTER NAME ch1_bq[7] ch1_bq[8] ch1_bq[9] ch2_bq[0] ch2_bq[1] ch2_bq[2] ch2_bq[3] ch2_bq[4] ch2_bq[5] NO. OF BYTES 20 20 20 20 20 20 20 20 20 CONTENTS DEFAULT VALUE u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M TAS5751M www.ti.com SLASEC1B – MARCH 2016 – REVISED MAY 2018 Register Maps (continued) SUBADDRESS 0x36 0x37 0x38 0x39 REGISTER NAME ch2_bq[6] ch2_bq[7] ch2_bq[8] ch2_bq[9] NO. OF BYTES 20 20 20 20 DEFAULT VALUE CONTENTS u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 0x3A Reserved 4 Reserved (1) 0x3B AGL1 softening filter alpha 8 u[31:26], ae[25:0] 0x0008 0000 u[31:26], oe[25:0] 0x0078 0000 Description shown in subsequent section 0x0000 0100 Description shown in subsequent section 0xFFFF FF00 AGL1 softening filter omega 0x3C AGL1 attack rate AGL1 release rate 8 0x0080 0000 0000 0000 Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M 37 TAS5751M SLASEC1B – MARCH 2016 – REVISED MAY 2018 www.ti.com Register Maps (continued) SUBADDRESS REGISTER NAME 0x3D 0x3E AGL2 softening filter alpha NO. OF BYTES AGL2 attack rate Reserved (1) 8 u[31:26], ae[25:0] 0x0008 0000 u[31:26], oe[25:0] 0x0078 0000 8 AGL2 release rate u[31:26], at[25:0] 0x0008 0000 u[31:26], rt[25:0] 0xFFF8 0000 0x40 AGL1 attack threshold 4 T1[31:0] (9.23 format) 0x0800 0000 0x41 AGL3 attack threshold 4 T1[31:0] (9.23 format) 0x0074 0000 0x42 AGL3 attack rate 8 Description shown in subsequent section 0x0008 0000 AGL3 release rate Description shown in subsequent section 0xFFF8 0000 0x43 AGL2 attack threshold 4 T2[31:0] (9.23 format) 0x0074 0000 0x44 AGL4 attack threshold 4 T1[31:0] (9.23 format) 0x0074 0000 0x45 AGL4 attack rate 8 0x0008 0000 AGL4 release rate 0xFFF8 0000 0x46 AGL control 4 Description shown in subsequent section 0x0002 0000 0x47 AGL3 softening filter alpha 8 u[31:26], ae[25:0] 0x0008 0000 u[31:26], oe[25:0] 0x0078 0000 u[31:26], ae[25:0] 0x0008 0000 u[31:26], oe[25:0] 0x0078 0000 AGL3 softening filter omega 0x48 AGL4 softening filter alpha 8 AGL4 softening filter omega 0x49 Reserved 4 Reserved (1) 0x4A 4 0x1212 1010 E1FF FFFF F95E 1212 0x4B 4 0x0000 296E 0x4C 4 0x0000 5395 0x4D 4 0x0000 0000 0x4E 4 0x0000 0000 0x4F PWM switching rate control 4 u[31:4], src[3:0] 0x0000 0008 0x50 Bank switch control 4 Description shown in subsequent section 0x0F70 8000 0x51 Ch 1 output mixer 12 Ch 1 output mix1[2] 0x0080 0000 Ch 1 output mix1[1] 0x0000 0000 Ch 1 output mix1[0] 0x0000 0000 0x52 Ch 2 output mixer 12 Ch 2 output mix2[2] 0x0080 0000 Ch 2 output mix2[1] 0x0000 0000 Ch 2 output mix2[0] 38 DEFAULT VALUE 8 AGL2 softening filter omega 0x3F CONTENTS 0x0000 0000 0x53 16 Reserved (1) 0x0080 0000 0000 0000 0000 0000 0x54 16 Reserved (1) 0x0080 0000 0000 0000 0000 0000 0x56 Output post-scale 4 u[31:26], post[25:0] 0x0080 0000 0x57 Output pre-scale 4 u[31:26], pre[25:0] (9.17 format) 0x0002 0000 0x58 ch1_bq[10] 20 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M TAS5751M www.ti.com SLASEC1B – MARCH 2016 – REVISED MAY 2018 Register Maps (continued) SUBADDRESS 0x59 0x5A 0x5B 0x5C 0x5D 0x5E 0x5F 0x60 0x61 0x62 REGISTER NAME ch1_cross_bq[0] ch1_cross_bq[1] ch1_cross_bq[2] ch1_cross_bq[3] ch2_bq[10] ch2_cross_bq[0] ch2_cross_bq[1] ch2_cross_bq[2] ch2_cross_bq[3] IDF post scale NO. OF BYTES 20 20 20 20 20 20 20 20 20 4 DEFAULT VALUE CONTENTS u[31:26], b0[25:0] 0x0080 0000 ch1_cross_bq[1] 0x0000 0000 ch1_cross_bq[2] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 Description shown in subsequent section 0x0000 0080 Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M 39 TAS5751M SLASEC1B – MARCH 2016 – REVISED MAY 2018 www.ti.com Register Maps (continued) SUBADDRESS NO. OF BYTES REGISTER NAME 0x63–0x69 Reserved 4 0x6A CONTENTS Reserved (1) 0x0000 0000 0x007F 7CED 4 0x0000 8312 0x6B Left channel PWM level meter 4 Data[31:0] 0x6C Right channel PWM level meter 4 Data[31:0] 0x6D Reserved 8 Reserved (1) 0x6E–0x6F DEFAULT VALUE 0x0000 0000 0x0000 0000 0000 0000 4 0x0000 0000 0x70 ch1 inline mixer 4 u[31:26], in_mix1[25:0] 0x0080 0000 0x71 inline_AGL_en_mixer_ch1 4 u[31:26], in_mixagl_1[25:0] 0x0000 0000 0x72 ch1 right_channel mixer 4 u[31:26], right_mix1[25:0] 0x0000 0000 0x73 ch1 left_channel_mixer 4 u[31:26], left_mix_1[25:0] 0x0080 0000 0x74 ch2 inline mixer 4 u[31:26], in_mix2[25:0] 0x0080 0000 0x75 inline_AGL_en_mixer_ch2 4 u[31:26], in_mixagl_2[25:0] 0x0000 0000 0x76 ch2 left_chanel mixer 4 u[31:26], left_mix1[25:0] 0x0000 0000 0x77 ch2 right_channel_mixer 4 u[31:26], right_mix_1[25:0] 0x0080 0000 0x78–0xF7 Reserved (1) 0x0000 0000 0xF8 Update device address key 4 Dev Id Update Key[31:0] (Key = 0xF9A5A5A5) 0x0000 0054 0xF9 Update device address 4 u[31:8],New Dev Id[7:0] (New Dev Id = 0x54 for TAS5751M) 0x0000 0054 4 Reserved (1) 0x0000 0000 0xFA–0xFF All DAP coefficients are 3.23 format unless specified otherwise. Registers 0x3B through 0x46 should be altered only during the initialization phase. 7.7.2 Detailed Register Descriptions 7.7.2.1 Clock Control Register (0x00) The clocks and data rates are automatically determined by the TAS5751M. The clock control register contains the autodetected clock status. Bits D7–D5 reflect the sample rate. Bits D4–D2 reflect the MCLK frequency. Table 5. Clock Control Register (0x00) D7 D6 D5 D4 D3 D2 D1 D0 0 0 0 – – – – – fS = 32-kHz sample rate 0 0 1 – – – – – Reserved 0 1 0 – – – – – Reserved 0 1 1 – – – – – fS = 44.1/48-kHz sample rate (1) 1 0 0 – – – – – fS = 16-kHz sample rate 1 0 1 – – – – – fS = 22.05/24-kHz sample rate 1 1 0 – – – – – fS = 8-kHz sample rate 1 1 1 – – – – – fS = 11.025/12-kHz sample rate – – – 0 0 0 – – MCLK frequency = 64 × fS (2) – – – 0 0 1 1 – MCLK frequency = 128 × fS (2) 0 0 0 0 1 0 0 0 MCLK frequency = 192 × fS (3) – – – 0 1 1 – – MCLK frequency = 256 × fS (1) (4) (1) (2) (3) (4) 40 FUNCTION Default values are in bold. Only available for 44.1-kHz and 48-kHz rates Rate only available for 32/44.1/48-KHz sample rates Not available at 8 kHz Submit Documentation Feedback Copyright © 2016–2018, Texas Instruments Incorporated Product Folder Links: TAS5751M TAS5751M www.ti.com SLASEC1B – MARCH 2016 – REVISED MAY 2018 Table 5. Clock Control Register (0x00) (continued) D7 D6 D5 D4 D3 D2 D1 D0 – – – 1 0 0 – – MCLK frequency = 384 × fS FUNCTION – – – 1 0 1 – – MCLK frequency = 512 × fS – – – 1 1 0 – – Reserved – – – 1 1 1 – – Reserved – – – – – – 0 – Reserved – – – – – – – 0 Reserved 7.7.2.2 Device ID Register (0x01) The device ID register contains the ID code for the firmware revision. Table 6. General Status Register (0x01) D7 D6 D5 D4 D3 D2 D1 D0 0 0 0 0 0 0 0 0 (1) FUNCTION Identification code (1) Default values are in bold. 7.7.2.3 Error Status Register (0x02) The error bits are sticky and are not cleared by the hardware. This means that the software must clear the register (write zeroes) and then read them to determine if they are persistent errors. Error definitions: • MCLK error: MCLK frequency is changing. The number of MCLKs per LRCLK is changing. • SCLK error: The number of SCLKs per LRCLK is changing. • LRCLK error: LRCLK frequency is changing. • Frame slip: LRCLK phase is drifting with respect to internal frame sync. Table 7. Error Status Register (0x02) D7 D6 D5 D4 D3 D2 D1 D0 1 - – – – – – – MCLK error – 1 – – – – – – PLL autolock error – – 1 – – – – – SCLK error – – – 1 – – – – LRCLK error – – – – 1 – – – Frame slip – – – – – 1 – – Clip indicator – – – – – – 1 – Overcurrent, overtemperature, overvoltage, or undervoltage error 0 0 0 0 0 0 0 0 Reserved 0 0 0 0 0 0 0 0 No errors (1) FUNCTION (1) Default values are in bold. 7.7.2.4 System Control Register 1 (0x03) System control register 1 has several functions: Bit D7: If 0, the dc-blocking filter for each channel is disabled. If 1, the dc-blocking filter (–3 dB cutoff
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TAS5751MDCAR
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    TAS5751MDCAR
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    • 1+42.238301+5.23970
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