THS4520
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SLOS503B – SEPTEMBER 2006 – REVISED JULY 2007
WIDEBAND, LOW NOISE, LOW DISTORTION FULLY DIFFERENTIAL AMPLIFIER
WITH RAIL-TO-RAIL OUTPUTS
FEATURES
•
•
•
•
•
•
•
•
•
•
•
•
DESCRIPTION
Fully Differential Architecture With Rail-to-Rail
Outputs
Centered Input Common-mode Range
Minimum Gain of 1 V/V (0 dB)
Bandwidth: 620 MHz
Slew Rate: 570 V/μs
0.1% Settling Time: 7 ns
HD2: –115 dBc at 100 kHz, VOD = 8 VPP
HD3: –123 dBc at 100 kHz, VOD = 8 VPP
Input Voltage Noise: 2 nV/√Hz (f >10 kHz)
Output Common-Mode Control
Power Supply:
– Voltage: 3.3 V (±1.65 V) to 5 V (±2.5 V)
– Current: 14.2 mA
Power-Down Capability: 15 μA
APPLICATIONS
•
•
•
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5-V and 3.3-V Data Acquisition Systems
High Linearity ADC Amplifier
Wireless Communication
Test and Measurement
Voice Processing Systems
The THS4520 is a wideband, fully differential
operational amplifier designed for 5-V data
acquisition systems. It has very low noise at
2 nV/√Hz, and low harmonic distortion of –115 dBc
HD2 and –123 dBc HD3 at 100 kHz with 8 VPP, and
1-kΩ load. The slew rate is 570 V/μs, and with a
settling time of 7 ns to 0.1% (2-V step), it is ideal for
data acquisition applications. It is designed for unity
gain stability.
To allow for dc coupling to ADCs, its unique output
common-mode control circuit maintains the output
common-mode voltage within 0.25 mV offset (typical)
from the set voltage. The common-mode set point
defaults to mid-supply by internal circuitry, which
may be over-driven from an external source.
The input and output are optimized for best
performance with their common-mode voltages set to
mid-supply. Along with high performance at low
power supply voltage, this makes for extremely high
performance single supply 5-V and 3.3-V data
acquisition systems.
The THS4520 is offered in a Quad 16-pin leadless
QFN package (RGT), and is characterized for
operation over the full industrial temperature range
from –40°C to 85°C.
THS4520
HARMONIC DISTORTION
vs
FREQUENCY
RELATED PRODUCTS
BW
(MHZ)
Slew Rate
(V/μsec)
THD
(dBc)
VN
(nV/Hz)
-60
THS4509
2000
6600
-102 at 10 MHz
1.9
-70
THS4500
370
2800
-82 at 8 MHz
7
THS4130
150
52
-97 at 250 kHz
1.3
499 W
2.5 V
499 W
+
Differential
Input - VID
Differential
1 kW Output - V
OD
-
Harmonic Distortion - dBc
Device
VOD = 8 VPP,
G = -1,
RL = 1 KW,
VS = ±2.5 V
-80
-90
-100
-110
HD3
-120
HD2
-130
+
499 W
-140
-2.5 V
VOCM = open
499 W
1
100
10
f - Frequency - kHz
1000
Measured HD2/HD3 for G = -1, VOD = 8
VPP, RL = 1 KΩ (circuit shown on the left)
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2006–2007, Texas Instruments Incorporated
THS4520
www.ti.com
SLOS503B – SEPTEMBER 2006 – REVISED JULY 2007
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted)
UNIT
VS– to VS+
Supply voltage
6V
VI
Input voltage
±VS
VID
Differential input voltage
IO
Output current
4V
(1)
200 mA
Continuous power dissipation
TJ
See Dissipation Rating Table
Maximum junction temperature
150°C
Maximum junction temperature, continuous operation, long term reliability
125°C
TA
Operating free-air temperature range
–40°C to 85°C
Tstg
Storage temperature range
–65°C to 150°C
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds
ESD ratings
(1)
300°C
HBM
2000
CDM
1500
MM
100
The THS4520 incorporates a (QFN) exposed thermal pad on the underside of the chip. See TI technical brief SLMA002 and SLMA004
for more information about utilizing the QFN thermally enhanced package.
DISSIPATION RATINGS TABLE PER PACKAGE
(1)
2
PACKAGE (1)
θJC
θJA
RGT (16)
2.4°C/W
39.5°C/W
POWER RATING
TA ≤ 25°C
TA = 85°C
2.3 W
225 mW
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
Web site at www.ti.com.
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THS4520
www.ti.com
SLOS503B – SEPTEMBER 2006 – REVISED JULY 2007
DEVICE INFORMATION
RGT Package
(TOP VIEW)
VS−
16
15
14
13
NC
1
12
PD
VIN−
2
11
VIN+
VOUT+
3
10
VOUT−
CM
4
9
5
7
6
CM
8
VS+
TERMINAL FUNCTIONS
TERMINAL
(RGT PACKAGE)
NO.
DESCRIPTION
NAME
1
NC
No internal connection
2
VIN–
Inverting amplifier input
3
VOUT+
Non-inverted amplifier output
4, 9
CM
Common-mode voltage input
5, 6, 7, 8
VS+
Positive amplifier power supply input
10
VOUT–
Inverted amplifier output
11
VIN+
Non-inverting amplifier input
12
PD
Powerdown, PD = logic low puts part into low power mode, PD = logic high or open for normal operation.
If the PD pin is open (unterminated) the device will default to the enabled state.
13, 14, 15, 16
VS–
Negative amplifier power supply input
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THS4520
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SLOS503B – SEPTEMBER 2006 – REVISED JULY 2007
SPECIFICATIONS; VS+ – VS– = 5 V:
Test conditions unless otherwise noted: VS+ = +2.5 V, VS– = –2.5 V, G = 0 dB, CM = open, VO = 2 VPP, RF = 499 Ω,
RL = 200 Ω Differential, TA = 25°C Single-Ended Input, Differential Output, Input and Output Referenced to mid-supply
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
TEST
LEVEL (1)
AC PERFORMANCE
Small-Signal Bandwidth
G = 0 dB, VO = 100 mVPP
620
MHz
G = 6 dB, VO = 100 mVPP
450
MHz
G = 10 dB, VO = 100 mVPP
330
MHz
G = 20 dB, VO = 100 mVPP
120
MHz
1200
MHz
Gain-Bandwidth Product
G = 20 dB
Bandwidth for 0.1 dB flatness
G = 6 dB, VO = 2 VPP
30
MHz
Large-Signal Bandwidth
G = 6 dB, VO = 2 VPP
132
MHz
570
V/μs
Slew Rate (Differential)
Rise Time
Fall Time
4
2-V Step
4
Settling Time to 1%
6.2
Settling Time to 0.1%
ns
C
7
f = 100 kHz (3)
f = 1 MHz (4)
RL = 1 kΩ
VOD = 8 VPP
–115
RL = 200
Ω
VOD = 2 VPP
–100
RL = 1 kΩ
2nd Order Harmonic Distortion (2)
RL = 200
Ω
f = 8 MHz
(3)
f = 100 kHz
–93
VOD = 2 VPP
–101
VOD = 4 VPP
–101
VOD = 2 VPP
–103
–97
VOD = 2 VPP
–100
VOD = 4 VPP
–95
RL = 1 kΩ
VOD = 8 VPP
–123
RL = 200
Ω
VOD = 2 VPP
–105
f = 1 MHz (4)
RL = 1 kΩ
3rd Order Harmonic Distortion (2)
VOD = 4 VPP
VOD = 4 VPP
(4)
RL = 1 kΩ
RL = 200
Ω
f = 8 MHz (4)
RL = 1 kΩ
VOD = 4 VPP
–93
VOD = 2 VPP
–101
VOD = 4 VPP
–96
VOD = 2 VPP
–92
VOD = 4 VPP
–88
VOD = 2 VPP
–102
VOD = 4 VPP
–91
fC = 100 kHz (3), 10-kHz Tone Spacing,
RL = 1k Ω, VOD = 8 VPP envelope, G = 0dB
3rd Order Intermodulation Distortion
C
fC = 1 MHz (4), 100-kHz Tone Spacing,
RL = 200 Ω, VOD = 4 VPP envelope, G = 10dB
dBc
C
dBc
C
dBc
C
–135
-82
(4)
fC = 10 MHz , 100-kHz Tone Spacing,
RL = 200 Ω, VOD = 4 VPP envelope, G = 10dB
Input Voltage Noise
f > 10 kHz
2
nV/√Hz
Input Current Noise
f > 10 kHz
2
pA/√Hz
(1)
(2)
(3)
(4)
4
-82
Test levels: (A) 100% tested at 25°C. Overtemperature limits by characterization and simulation. (B) Limits set by characterization and
simulation. (C) Typical value only for information.
For additional information, see the Typical Characteristics section and the Apllications section.
Data collected with applied differential input signal and measured differential output signal.
Data collected with applied single-ended input signal and measured differential output signal. See Figure 55 in the Applications/Test
Circuits section for additional information.
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THS4520
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SLOS503B – SEPTEMBER 2006 – REVISED JULY 2007
SPECIFICATIONS; VS+ – VS– = 5 V: (continued)
Test conditions unless otherwise noted: VS+ = +2.5 V, VS– = –2.5 V, G = 0 dB, CM = open, VO = 2 VPP, RF = 499 Ω,
RL = 200 Ω Differential, TA = 25°C Single-Ended Input, Differential Output, Input and Output Referenced to mid-supply
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
TEST
LEVEL (1)
dB
C
DC PERFORMANCE
Open-Loop Voltage Gain (AOL)
Input Offset Voltage
Average Offset Voltage Drift
Input Bias Current
Average Bias Current Drift
Input Offset Current
Average Offset Current Drift
112
TA = 25°C
±0.25
±2.5
mV
TA = –40°C to 85°C
±0.25
±3
mV
TA = –40°C to 85°C
1
TA = 25°C
6.5
10
TA = –40°C to 85°C
6.4
11
TA = –40°C to 85°C
1.9
TA = 25°C
±0.2
±2.5
TA = –40°C to 85°C
±0.2
±3
TA = –40°C to 85°C
1.6
A
μV/°C
B
μA
A
nA/°C
B
μA
A
nA/°C
B
INPUT
Common-Mode Input Range High
1.75
Common-Mode Input Range Low
–1.3
Common-Mode Rejection Ratio
V
84
B
dB
Differential Input Impedance
7.5||0.31
kΩ||pF
C
Common-Mode Input Impedance
2.67||0.7
7
MΩ||pF
C
OUTPUT
TA = 25°C
Maximum Output Voltage High
Each output with 100 Ω
to mid-supply
Minimum Output Voltage Low
TA = –40C to
85°C
1.95
2.16
1.9
2.16
TA = 25°C
–2.16
TA = –40C to
85°C
–2.16
7.8
V
–1.95
–1.9
A
V
Differential Output Voltage Swing
TA = –40C to 85°C
8.64
V
Differential Output Current Drive
RL = 10 Ω
105
mA
Output Balance Error
VO = 100 mV, f = 1 MHz
–80
dB
230
MHz
1
V/V
C
OUTPUT COMMON-MODE VOLTAGE CONTROL
Small-Signal Bandwidth
Gain
Output Common-Mode Offset from CM input
1.25 V < CM < 3.5 V
±0.25
mV
CM Input Bias Current
1.25 V < CM < 3.5 V
0.6
μA
CM Input Voltage
CM Default Voltage
–1.5
CM = 0.5 (VS+ + VS- )
1.5
0
C
V
V
POWER SUPPLY
Specified Operating Voltage
Maximum Quiescent Current
Minimum Quiescent Current
5
5.25
TA = 25°C
3
14.2
15.3
TA = –40C to 85°C
14.2
15.5
TA = 25°C
TA = –40C to 85°C
Power Supply Rejection (±PSRR)
POWERDOWN
Referenced to Vs–
Enable Voltage Threshold
For additional information, see the Application
Information section of this data sheet.
Disable Voltage Threshold
Powerdown Quiescent Current
13.1
14.2
12.75
14.2
94
dB
>1.5
V
10 kHz
2
nV/√Hz
Input Current Noise
f > 10 kHz
2
pA/√Hz
(2)
(3)
(4)
C
dBc
Input Voltage Noise
(1)
6
ns
7.1
f = 100 kHz (3)
rd
C
Test levels: (A) 100% tested at 25°C. Overtemperature limits by characterization and simulation. (B) Limits set by characterization and
simulation. (C) Typical value only for information.
For additional information, see the Typical Characteristics section and the Apllications section.
Data collected with applied differential input signal and measured differential output signal.
Data collected with applied single-ended input signal and measured differential output signal. See Figure 55 in the Applications/Test
Circuits section for additional information.
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THS4520
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SLOS503B – SEPTEMBER 2006 – REVISED JULY 2007
SPECIFICATIONS; VS+ – VS– = 3.3 V: (continued)
Test conditions unless otherwise noted: VS+ = +1.65 V, VS– = –1.65 V, G = 0 dB, CM = open, VO = 1 VPP, RF = 499 Ω,
RL = 200 Ω Differential, TA = 25°C Single-Ended Input, Differential Output, Input and Output Referenced to mid-supply
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
TEST
LEVEL (1)
DC PERFORMANCE
Open-Loop Voltage Gain (AOL)
Input Offset Voltage
Average Offset Voltage Drift
Input Bias Current
Average Bias Current Drift
Input Offset Current
Average Offset Current Drift
104
dB
TA = 25°C
±0.25
mV
TA = –40°C to 85°C
±0.25
mV
TA = –40°C to 85°C
1
TA = 25°C
6.5
TA = –40°C to 85°C
6.4
TA = –40°C to 85°C
1.9
TA = 25°C
±0.2
TA = –40°C to 85°C
±0.2
TA = –40°C to 85°C
1.6
C
μV/°C
μA
C
nA/°C
μA
C
nA/°C
INPUT
Common-Mode Input Range High
1.4
Common-Mode Input Range Low
–0.45
Common-Mode Rejection Ratio
84
V
C
dB
OUTPUT
Maximum Output Voltage High
Minimum Output Voltage Low
Each output with 100 Ω to mid-supply
TA = 25°C
1.4
TA = 25°C
–1.4
Differential Output Voltage Swing
Differential Output Current Drive
RL = 10 Ω
Output Balance Error
VO = 100 mV, f = 1 MHz
V
5.6
V
78
mA
–80
dB
224
MHz
1
V/V
C
C
OUTPUT COMMON-MODE VOLTAGE CONTROL
Small-Signal Bandwidth
Gain
Output Common-Mode Offset
from CM input
1.25 V < CM < 3.5 V
±0.25
mV
CM Input Bias Current
1.25 V < CM < 3.5 V
0.6
μA
CM Default Voltage
CM = 0.5 (VS+ + VS- )
0
V
C
POWER SUPPLY
Specified Operating Voltage
Quiescent Current
TA = 25°C
Power Supply Rejection (±PSRR)
POWERDOWN
Referenced to Vs–
Enable Voltage Threshold
For additional information, see the Application Information
section of this data sheet.
Disable Voltage Threshold
Powerdown Quiescent Current
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3.3
V
13
mA
94
dB
>1
V