THVD1439, THVD1439V
THVD1449, THVD1449V
SLLSF79B – APRIL 2021 – REVISED SEPTEMBER 2021
THVD14x9x 3-V to 5.5-V RS-485 Transceivers With 4-kV Surge Protection and 1.8-V
VIO Capability
1 Features
2 Applications
•
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•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
Meets or exceeds the requirements of the TIA/
EIA-485A standard
3-V to 5.5-V Supply Voltage
VIO Support from 1.65-V to VCC supply level
(THVD1439V, THVD1449V)
Bus I/O protection
– ± 4-kV IEC 61000-4-5 1.2/50-μs surge
– ± 15-kV IEC 61000-4-2 Contact discharge
– ± 15-kV IEC 61000-4-2 Air-gap discharge
– ± 4-kV IEC 61000-4-4 Electrical fast transient
– ± 15-kV HBM ESD
– ± 15-V DC bus fault
Available in two speed grades
– THVD1439, THVD1439V: 250 kbps
– THVD1449, THVD1449V: 12 Mbps
Extended ambient
temperature range: -40°C to 125°C
Extended operational
common-mode range: ± 12 V
Large receiver hysteresis for noise rejection
Low Power Consumption
– Standby supply current: < 3 µA
– Current during operation: < 5 mA
Glitch-free power-up/down for hot plug-in capability
Open, short, and idle bus failsafe
1/8 Unit load (up to 256 bus nodes)
Industry standard 8-pin SOIC
for drop-in compatibility
Wireless infrastructure
Factory automation
Motor drives
Building automation
HVAC
Grid infrastructure
3 Description
THVD14x9(V) devices are half-duplex RS-485
transceivers with integrated surge protection. Surge
protection is achieved by integrating transient voltage
suppressor (TVS) diodes in the standard 8-pin SOIC
(D) package. This feature increases the reliability by
providing better immunity to noise transients coupled
to the data cable which eliminates the need for
external protection components.
THVD1439 and THVD1449 operate from a single
3.3-V or 5-V supply. The THVD1439V and
THVD1449V devices support an additional VIO supply
to operate the IOs from as low as 1.65 V supply level.
The devices in this family feature a wide commonmode voltage range making them suitable for multipoint applications over long cable runs.
Device Information
PACKAGE(1)
PART NUMBER
THVD1439
THVD1439V
THVD1449
THVD1449V
(1)
SOIC (8)
BODY SIZE (NOM)
4.90 mm × 3.91 mm
For all available devices, see the orderable addendum at the
end of the data sheet.
VIO
VCC
R
A
R
RE
B
DE / RE
VCC
A
B
DE
D
D
GND
THVD14x9 Block Diagram
GND
THVD14x9V Block Diagram
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
THVD1439, THVD1439V
THVD1449, THVD1449V
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SLLSF79B – APRIL 2021 – REVISED SEPTEMBER 2021
Table of Contents
1 Features............................................................................1
2 Applications..................................................................... 1
3 Description.......................................................................1
4 Revision History.............................................................. 2
5 Pin Configuration and Functions...................................4
6 Specifications.................................................................. 5
6.1 Absolute Maximum Ratings ....................................... 5
6.2 ESD Ratings .............................................................. 5
6.3 ESD Ratings, IEC ...................................................... 5
6.4 Recommended Operating Conditions ........................6
6.5 Thermal Information ...................................................6
6.6 Power Dissipation ...................................................... 6
6.7 Electrical Characteristics ............................................7
6.8 Switching Characteristics (THVD1439,
THVD1439V) ................................................................ 9
6.9 Switching Characteristics (THVD1449,
THVD1449V) ................................................................ 9
6.10 Typical Characteristics............................................ 10
7 Parameter Measurement Information.......................... 12
8 Detailed Description......................................................14
8.1 Overview................................................................... 14
8.2 Functional Block Diagrams....................................... 14
8.3 Feature Description...................................................14
8.4 Device Functional Modes..........................................18
9 Application and Implementation.................................. 19
9.1 Application Information .........................................19
9.2 Typical Application.................................................... 19
10 Power Supply Recommendations..............................22
11 Layout........................................................................... 23
11.1 Layout Guidelines................................................... 23
11.2 Layout Example...................................................... 23
12 Device and Documentation Support..........................25
12.1 Device Support....................................................... 25
12.2 Receiving Notification of Documentation Updates..25
12.3 Support Resources................................................. 25
12.4 Trademarks............................................................. 25
12.5 Electrostatic Discharge Caution..............................25
12.6 Glossary..................................................................25
4 Revision History
Changes from Revision A (June 2021) to Revision B (September 2021)
Page
• Changed document status from Advanced Information to Production data ...................................................... 1
2
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Device Comparison Table
PART NUMBER
ENABLES
VIO
THVD1439
Separate DE and RE
No
THVD1439V
Combined DE / RE
Yes
Separate DE and RE
No
Combined DE / RE
Yes
THVD1449
DUPLEX
Half
THVD1449V
SIGNALING RATE
NODES
up to 250 kbps
256
up to 12 Mbps
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5 Pin Configuration and Functions
R
1
8
VCC
VIO
1
8
VCC
RE
2
7
B
R
2
7
B
DE
3
6
A
DE/RE
3
6
A
D
4
5
GND
D
4
5
GND
Not to scale
Not to scale
Figure 5-1. THVD1439, THVD1449, 8-Pin (SOIC),
Top View
Figure 5-2. THVD1439V, THVD1449V, 8-Pin (SOIC),
Top View
PIN
NAME
4
THVD1439,
THVD1449
THVD1439
V,
THVD1449V
I/O
DESCRIPTION
VIO
-
1
P
1.8-V to 5-V supply for R, D, and RE/DE
R
1
2
O
Receiver data output
RE
2
-
I
Receiver enable, active low (2 MΩ internal pull-up)
DE
3
-
I
Driver enable, active high
DE/ RE
-
3
I
Driver enable (Active high), Receiver enable (Active Low). (2 MΩ
internal pull-down)
D
4
4
I
Driver data input
GND
5
5
-
Device ground
A
6
6
I/O
Bus I/O port, A (complementary to B)
B
7
7
I/O
Bus I/O port, B (complementary to A)
VCC
8
8
P
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3.3-V to 5-V supply
for the device
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6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)
MIN
MAX
Supply voltage
VCC
–0.5
7
V
Logic supply voltage
VIO
-0.5
VCC+0.2
V
Bus voltage
Range at any bus pin (A or B)
–15
15
V
Input voltage
Range at any logic pin (R, D, DE, or RE) THVD1439,
THVD1449
–0.3
5.7
V
Input voltage
Range at any logic pin (R, D, DE, or RE)
THVD1439V, THVD1449V
–0.3
VIO+0.2
V
Receiver output current
IO
–24
24
mA
Storage temperature
Tstg
–65
150
°C
(1)
UNIT
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress
ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under
Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device
reliability.
6.2 ESD Ratings
VALUE
V(ESD)
Electrostatic discharge
Human-body model (HBM), per ANSI/ESDA/
JEDEC JS-001(1)
Bus terminals and GND
±15,000
All pins except bus terminals
and GND
±4,000
Charged-device model (CDM), per JEDEC specification JESD22-C102(2)
(1)
(2)
UNIT
V
±1,500
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.3 ESD Ratings, IEC
VALUE
Contact Discharge, per IEC 61000-4-2
UNIT
V(ESD)
Electrostatic discharge
V(EFT)
Electrical fast transient
Per IEC 61000-4-4
Bus terminals
±4,000
V
V(surge)
Surge
Per IEC 61000-4-5, 1.2/50 μs
Bus terminals
±4,000
V
Air-Gap Discharge, per IEC 61000-4-2
Bus terminals
±15,000
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±15,000
V
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6.4 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN
VCC
Supply voltage
VIO
IO Supply Voltage (V Variant)
VI
Input voltage on logic pins (R, D,
DE, or RE)
VI
Input voltage at bus pins (A or B)
VIH
High-level input voltage (R, D, DE,
or RE)
VIL
Low-level input voltage (R, D, DE, or
RE)
VIH
High-level input voltage (R, D, DE,
or RE)
MAX
UNIT
5.5
V
1.65
VCC
V
THVD1439, THVD1449
0
5.5
V
THVD1439V, THVD1449V
0
VIO
V
-12
12
V
0.67 * VIO
VIO
V
0
0.33 * VIO
V
2
5.5
V
0
0.8
V
(1)
VI
NOM
3
THVD1439V, THVD1449V
THVD1439, THVD1449
VIL
Low-level input voltage (R, D, DE, or
RE)
VID
Differential input voltage
-12
12
V
IO
Output current, driver
-60
60
mA
IOR
Output current, receiver
-8
8
mA
RL
Differential load resistance
54
1/tUI
Signaling rate
TA
Operating ambient temperature
(1)
Ω
THVD1439, THVD1439V
250
kbps
THVD1449, THVD14149V
12
Mbps
125
°C
-40
The algebraic convention, in which the least positive (most negative) limit is designated as minimum is used in this data sheet.
6.5 Thermal Information
THVD1439 THVD1439V
THVD1449 THVD1449V
THERMAL METRIC(1)
UNIT
D (SOIC)
8 PINS
RθJA
Junction-to-ambient thermal resistance
120.7
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
50.3
°C/W
RθJB
Junction-to-board thermal resistance
62.8
°C/W
ψJT
Junction-to-top characterization parameter
7.5
°C/W
ψJB
Junction-to-board characterization parameter
62.2
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
N/A
°C/W
(1)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
6.6 Power Dissipation
over operating free-air temperature range (unless otherwise noted)
PARAMETER
PD
6
TEST CONDITIONS
Driver and receiver enabled,
VCC = 5.5 V, TA = 125 °C,
50% duty cycle square wave at signaling
rate
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VALUE
Unterminated
RL = 300 Ω, C L = 50 pF (driver)
THVD1439
250 kbps
160
THVD1449
12 Mbps
290
RS-422 load
RL = 100 Ω, CL = 50 pF (driver)
THVD1439
250 kbps
190
THVD1449
12 Mbps
290
RS-485 load
RL = 54 Ω, CL = 50 pF (driver)
THVD1439
250 kbps
250
THVD1449
12 Mbps
320
UNIT
mW
mW
mW
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6.7 Electrical Characteristics
over operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
RL = 60 Ω, -12 V ≤ Vtest ≤ 12 V (See Figure 7-1 )
1.5
2
RL = 60 Ω, -12 V ≤ Vtest ≤ 12 V, 4.5 V ≤ VCC ≤ 5.5 V (See Figure
7-1 )
2.1
MAX
UNIT
Driver
|VOD|
Driver differential output
voltage magnitude
RL = 100 Ω (See Figure 7-2 )
V
V
2
2.5
V
2
V
RL = 54 Ω (See Figure 7-2 )
1.5
Δ|VOD|
Change in differential output
voltage
RL = 54 Ω (See Figure 7-2 )
–50
VOC
Common-mode output voltage
RL = 54 Ω (See Figure 7-2 )
1
ΔVOC(SS)
Change in steady-state
common-mode output voltage
RL = 54 Ω (See Figure 7-2 )
IOS
Short-circuit output current
DE = VCC, -12 V ≤ VO ≤ 12 V
Bus input current
DE = 0 V, VCC
= 0 V or 5.5 V
50
mV
3
V
–50
50
mV
–250
250
mA
VCC / 2
Receiver
II
VTH+
Positive-going input threshold
voltage(1)
VTH-
Negative-going input threshold
voltage(1)
VHYS
Input hysteresis
VTH_FSH
Input fail-safe threshold
VOH
VOL
IOZ
VI = 12 V
75
135
VI = -7 V
–100
–40
VI = -12 V
–135
–75
40
125
200
mV
–200
–125
–40
mV
Over common-mode range of ±12 V
μA
250
–40
THVD1439V,
THVD1449V
Output high voltage
THVD1439,
THVD1449
THVD1439V,
THVD1449V
Output low voltage
THVD1439,
THVD1449
IOH = -4 mA; VIO= 1.65 V - 3 V
IOH = -8 mA; VIO= 3 V - 5.5 V
IOH = -8 mA
VIO – 0.4
mV
40
mV
VIO – 0.2
V
VCC – 0.4 VCC – 0.2
IOL = 8 mA; VIO = 3 V - 5.5 V
IOL = 4 mA; VIO = 1.65 V - 3 V
0.2
0.4
V
–1
1
µA
IOL = 8 mA
Output high-impedance current VO = 0 V or VCC, RE = VCC
Logic
IIN
Input current (D, DE, RE)
THVD1439V,
THVD1449V
3 V ≤ VCC ≤ 5.5 V, 1.65 ≤ VIO ≤ VCC V, 0 V ≤ VIN ≤
VIO
–5
5
µA
THVD1439,
THVD1449
3 V ≤ VCC ≤ 5.5 V, 0 V ≤ VIN ≤ VCC
–5
5
µA
Thermal Protection
TSHDN
Thermal shutdown threshold
THYS
Thermal shutdown hysteresis
Temperature rising
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150
170
℃
10
℃
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6.7 Electrical Characteristics (continued)
over operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
3
4
mA
2
3
mA
Driver disabled, receiver RE = 0 V, DE = 0 V, No
enabled
load
1.7
2.2
mA
Driver and receiver
disabled (THVD1439,
THVD1449)
RE = VCC, DE = 0 V, D
= open, No load
0.1
1.5
µA
Driver and receiver
enabled (THVD1439,
THVD1449)
RE = 0 V, DE = VCC, No
load
3.5
5
mA
Driver enabled, receiver RE = VCC, DE = VCC,
disabled
No load
2.5
3.8
mA
Driver disabled, receiver RE = 0 V, DE = 0 V, No
enabled
load
1.8
2.4
mA
Driver and receiver
disabled (THVD1439,
THVD1449)
RE = VCC, DE = 0 V, D
= open, No load
0.2
3
µA
Driver Enabled
DE/RE=VIO, D=open,
No load
5
µA
Receiver enabled
DE/RE= 0 V, D=open,
No load
5
µA
Supply
Driver and receiver
enabled (THVD1439,
THVD1449)
Supply current (quiescent)
VCC=3.6 V
ICC
Supply current (quiescent)
IIO
(1)
8
VIO supply current (quiescent)
VCC=5.5 V
THVD1439V,
THVD1449V
RE = 0 V, DE = VCC, No
load
Driver enabled, receiver RE = VCC, DE = VCC,
disabled
No load
Under any specific conditions, VTH+ is assured to be at least VHYS higher than VTH–.
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6.8 Switching Characteristics (THVD1439, THVD1439V)
250-kbps devices (THVD1439, 39V), over recommended operating conditions. All typical values are at 25 ℃.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
300
570
1200
ns
450
650
ns
50
ns
ns
Driver
tr, tf
Differential output rise/fall time
tPHL, tPLH
Propagation delay
tSK(P)
Pulse skew, |tPHL – tPLH|
tPHZ, tPLZ
Disable time
RL = 54 Ω, CL = 50 pF
25
125
240
600
ns
RE = VCC
2
4
µs
RE = VCC
300
See Figure
7-4 and Figure 7-5
RE = 0 V
tPZH, tPZL
Enable time
tSHDN
Pulse width (logic low) on DE pin
to initiate device shutdown
See Figure 7-3
ns
Receiver
tr, tf
Differential output rise/fall time
tPHL, tPLH
Propagation delay
tSK(P)
Pulse skew, |tPHL – tPLH|
tPHZ, tPLZ
Disable time
CL = 15 pF
tPZH(1),
tPZL(1),
tPZH(2),
tPZL(2)
Enable time
tD(OFS)
Delay to enter fail-safe operation
tD(FSO)
Delay to exit fail-safe operation
tSHDN
RE pulse width to initiate device
shutdown
See Figure 7-6
9
25
ns
70
110
ns
7
ns
22
60
ns
DE = VCC
See Figure 7-7
120
185
ns
DE = 0 V
See Figure 7-8
4
10
μs
CL = 15 pF
See Figure 7-9
14
20
36
μs
25
40
66
ns
DE = 0 V
300
ns
6.9 Switching Characteristics (THVD1449, THVD1449V)
12-Mbps devices (THVD1449, 49V), over recommended operating conditions. All typical values are at 25 ℃.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
2
12
25
ns
7
10
25
ns
3.5
ns
25
75
ns
18
65
ns
RE = VCC
2
4
μs
RE = VCC
300
Driver
tr, tf
Differential output rise/fall time
tPHL, tPLH
Propagation delay
tSK(P)
Pulse skew, |tPHL – tPLH|
tPHZ, tPLZ
Disable time
RL = 54 Ω, CL = 50 pF
RE = 0 V
tPZH, tPZL
Enable time
tSHDN
Pulse width (logic low) on DE pin
to initiate device shutdown
See Figure 7-3
See Figure 7-4 and
Figure 7-5
ns
Receiver
tr, tf
Differential output rise/fall time
tPHL, tPLH
Propagation delay
tSK(P)
Pulse skew, |tPHL – tPLH|
tPHZ, tPLZ
Disable time
CL = 15 pF
tPZH(1),
tPZL(1),
tPZH(2),
tPZL(2)
Enable time
tD(OFS)
Delay to enter fail-safe operation
tD(FSO)
Delay to exit fail-safe operation
tSHDN
Pulse width (logic high) on RE pin
DE = 0 V
to initiate device shutdown
See Figure 7-6
30
3
10
ns
60
110
ns
4
ns
10
30
ns
DE = VCC
See Figure 7-7
90
130
ns
DE = 0 V
See Figure 7-8
4
10
μs
CL = 15 pF
See Figure 7-9
14
20
36
μs
25
35
55
ns
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6.10 Typical Characteristics
VOH (VCC = 3.3 V)
VOL (VCC = 3.3 V)
VOH (VCC = 5 V)
VOL (VCC = 5 V)
Driver Differential Output Voltage (V)
Driver Output Voltage (V)
6.5
6
5.5
5
4.5
4
3.5
3
2.5
2
1.5
1
0.5
0
D=0V
3.6
3
2.4
1.8
1.2
0.6
0
5 10 15 20 25 30 35 40 45 50 55 60 65 70 75 80
Driver Output Current (mA)
DE = VCC
TA= 25 °C
Figure 6-1. Driver Output Voltage vs Driver Output
Current
D=0V
TA= 25 °C
Figure 6-2. Driver Differential Output voltage vs
Driver Output Current
650
65
Driver Output Rise/Fall Time (ns)
60
Driver Output Current (mA)
4.2
5 10 15 20 25 30 35 40 45 50 55 60 65 70 75 80
Driver Output Current (mA)
DE = VCC
55
50
45
40
35
30
3
3.5
4
4.5
5
5.5
VCC (V)
TA= 25 °C
RL = 54 Ω
600
575
550
525
500
475
450
425
-40
-20
0
20
40
60
80
Temperature ( C)
100
120
140
spacer
Figure 6-4. THVD1439, THVD1439V Driver Rise or
Fall Time vs Temperature
500
80
480
470
460
450
VCC = 3.3 V
VCC = 5 V
75
70
Supply Current (mA)
tPHL (VCC = 3.3 V)
tPLH (VCC = 3.3 V)
tPHL (VCC = 5 V)
tPLH (VCC = 5 V)
490
65
60
55
50
45
440
430
-40
Rise time (VCC = 3.3 V)
Fall time (VCC = 3.3 V)
Rise time (VCC = 5 V)
Fall time (VCC = 5 V)
625
DE = D = VCC
Figure 6-3. Driver Output Current vs Supply
Voltage
Driver Propagation Delay (ns)
VCC = 3.3 V
VCC = 5 V
0
0
40
35
-20
0
20
40
60
80
Temperature (C)
100
120
140
0
25
50
75
100 125 150 175
Signaling Rate (kbps)
TA= 25 °C
spacer
Figure 6-5. THVD1439, THVD1439V Driver
Propagation Delay vs Temperature
10
4.8
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200
225
250
RL = 54 Ω
Figure 6-6. THVD1439, THVD1439V Supply Current
vs Signal Rate
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22
Driver Propagation Delay (ns)
20
19
18
17
16
15
14
13
12
Driver Rise/Fall Times (ns)
18.5
tPHL (VCC = 3.3 V)
tPLH (VCC = 3.3 V)
tPHL (VCC = 5 V)
tPLH (VCC = 5 V)
21
Rise time (VCC = 3.3 V)
Fall time (VCC = 3.3 V)
Rise time (VCC = 5 V)
Fall time (VCC = 5 V)
17.5
16.5
15.5
14.5
13.5
11
10
-40
-20
0
20
40
60
80
Temperature (C)
100
120
140
Figure 6-7. THVD1449, THVD1449V Driver
Propagation Delay vs Temperature
12.5
-40
-20
0
20
40
60
80
Temperature ( C)
100
120
140
Figure 6-8. THVD1449, THVD1449V Driver Rise or
Fall Time vs Temperature
90
VCC = 3 V
VCC = 5 V
85
Supply Current (mA)
80
75
70
65
60
55
50
45
40
35
0
TA= 25 °C
2000
4000
6000
8000
Signaling Rate (kbps)
10000
12000
RL = 54 Ω
Figure 6-9. THVD1449, THVD1449V Supply Current vs Signal Rate
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7 Parameter Measurement Information
375 Ÿ
Vcc
DE
A
D
VOD
0V or Vcc
Vtest
RL
B
375 Ÿ
Figure 7-1. Measurement of Driver Differential Output Voltage With Common-Mode Load
A
0V or Vcc
A
D
RL/2
VA
B
VB
VOD
RL/2
B
CL
VOC(PP)
VOC
ûVOC(SS)
VOC
Figure 7-2. Measurement of Driver Differential and Common-Mode Output With RS-485 Load
Vcc
Vcc
DE
A
D
Input
Generator
VI
50%
VI
VOD
50 Ÿ
0V
tPHL
tPLH
RL=
54 Ÿ
CL= 50 pF
90%
50%
10%
B
VOD
tr
tf
~2 V
~ ±2V
Figure 7-3. Measurement of Driver Differential Output Rise and Fall Times and Propagation Delays
A
D
S1
Vcc
VO
50%
VI
B
DE
Input
Generator
VI
RL =
110 Ÿ
CL =
50 pF
50 Ÿ
0V
tPZH
90%
VO
VOH
50%
~
~ 0V
tPHZ
Figure 7-4. Measurement of Driver Enable and Disable Times With Active High Output and Pull-Down
Load
Vcc
Vcc
A
S1
B
D
DE
Input
Generator
RL= 110 Ÿ
CL=
50 pF
VI
VO
50%
VI
0V
tPZL
tPLZ
§ Vcc
VO
10%
50 %
VOL
50 Ÿ
Figure 7-5. Measurement of Driver Enable and Disable Times With Active Low Output and Pull-up Load
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3V
A
Input
Generator
R VO
VI
50 Ÿ
1.5V
B
0V
tPLH
tPHL
VOH
90%
CL=15 pF
50%
RE
0V
50 %
VI
VOD
10 %
tr
VOL
tf
Figure 7-6. Measurement of Receiver Output Rise and Fall Times and Propagation Delays
Vcc
Vcc
Vcc
VI
50 %
DE
0V or Vcc
0V
A
D
1 kŸ
VO
R
B
tPZH(1)
tPHZ
S1
VO
CL=15 pF
90 %
50 %
tPZL(1)
VI
D at Vcc
S1 to GND
§ 0V
RE
Input
Generator
VOH
50 Ÿ
tPLZ
VO
50 %
VCC D at 0V
S1 to Vcc
10 %
VOL
Figure 7-7. Measurement of Receiver Enable/Disable Times With Driver Enabled
Vcc
Vcc
VI
50%
0V
A
V or 1.5V
R
1.5 V or 0V
B
1 NŸ
VO
tPZH(2)
S1
VOH
RE
50%
VO
CL=15 pF
§ 0V
A at 1.5 V
B at 0 V
S1 to GND
tPZL(2)
Input
Generator
VI
VCC
50 Ÿ
VO
50%
VOL
A at 0V
B at 1.5V
S1 to VCC
Figure 7-8. Measurement of Receiver Enable Times With Driver Disabled
0V
VA - VB
A
VA = 0 V or -750 mV
VB = 0 V or +750 mV
R
B
RE
0V
-1.5 V
VO
tD(OFS)
CL= 15 pF
tD(FSO)
VCC
VO
VCC / 2
0V
Copyright © 2017, Texas Instruments Incorporated
Figure 7-9. Fail-Safe Delay Measurements
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8 Detailed Description
8.1 Overview
THVD14x9(V) devices are surge-protected, half duplex RS-485 transceivers available in two speed grades
suitable for data transmission up to 250 kbps and 12 Mbps respectively. Surge protection is achieved by
integrating transient voltage suppressor (TVS) diodes in the standard 8-pin SOIC (D) package.
THVD1439 and THVD1449 devices have active-high driver enables and active-low receiver enables. A standby
current of less than 1.5 µA (VCC = 3.6 V) can be achieved by disabling both driver and receiver. THVD1439V and
THVD1449V have a single enable/disable pin that either enables the driver or the receiver at a time.
8.2 Functional Block Diagrams
VCC
R
A
RE
B
DE
D
GND
Figure 8-1. THVD1439 and THVD1449 Block Diagram
VIO
VCC
A
R
B
DE / RE
D
GND
Figure 8-2. THVD1439V and THVD1449V Block Diagram
8.3 Feature Description
8.3.1 Electrostatic Discharge (ESD) Protection
The bus pins of the THVD14x9(V) transceiver family include on-chip ESD protection against ±15-kV HBM and
±15-kV IEC 61000-4-2 contact discharge. The International Electrotechnical Commission (IEC) ESD test is far
more severe than the HBM ESD test. The 50% higher charge capacitance, C(S), and 78% lower discharge
resistance, R(D), of the IEC model produce significantly higher discharge currents than the HBM model. As
stated in the IEC 61000-4-2 standard, contact discharge is the preferred transient protection test method.
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R(D)
50 M
(1 M)
High-Voltage
Pulse
Generator
330 Ω
(1.5 kΩ)
C(S)
Device
Under
Test
150 pF
(100 pF)
Current (A)
R(C)
40
35
30 10-kV IEC
25
20
15
10
5
0
0
50
100
10-kV HBM
150
200
250
300
Time (ns)
Figure 8-3. HBM and IEC ESD Models and Currents in Comparison (HBM Values in Parenthesis)
The on-chip implementation of IEC ESD protection significantly increases the robustness of equipment.
Common discharge events occur because of human contact with connectors and cables.
8.3.2 Electrical Fast Transient (EFT) Protection
Normalized Voltage
Inductive loads such as relays, switch contactors, or heavy-duty motors can create high-frequency bursts during
transition. The IEC 61000-4-4 test is intended to simulate the transients created by such switching of inductive
loads on AC power lines. Figure 8-4 shows the voltage waveforms in to 50-Ω termination as defined by the IEC
standard.
1
Time
Normalized Voltage
300 ms
15 ms at 5 kHz
0.75 ms at 100 kHz
1
Time
Normalized Voltage
200 µs at 5 kHz
10 µs at 100 kHz
1
0.5
Time
5 ns
50ns
Figure 8-4. EFT Voltage Waveforms
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Internal ESD protection circuits of the THVD14x9(V) protect the transceivers against ±4-kV EFT. With careful
system design, one could achieve EFT Criterion A (no data loss when transient noise is present).
8.3.3 Surge Protection
Surge transients often result from lightning strikes (direct strike or an indirect strike which induce voltages
and currents), or the switching of power systems, including load changes and short circuit switching. These
transients are often encountered in industrial environments, such as factory automation and power-grid systems.
Figure 8-5 compares the pulse-power of the EFT and surge transients with the power caused by an IEC ESD
transient. The diagram on the left shows the relative pulse-power for a 0.5-kV surge transient and 4-kV EFT
transient, both of which dwarf the 10-kV ESD transient visible in the lower-left corner. 500-V surge transients are
representative of events that may occur in factory environments in industrial and process automation.
22
20
18
16
14
12
10
8
6
4
2
0
Pulse Power (MW)
Pulse Power (kW)
The diagram on the right shows the pulse-power of a 6-kV surge transient, relative to the same 0.5-kV surge
transient. 6-kV surge transients are most likely to occur in power generation and power-grid systems.
0.5-kV Surge
4-kV EFT
10-kV ESD
0
5
10
15
20
25
30
35
3.0
2.8
2.6
2.4
2.2
2.0
1.8
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0
6-kV Surge
0.5-kV Surge
0
40
5
10
15
20
25
30
35
40
Time (µs)
Time (µs)
Figure 8-5. Power Comparison of ESD, EFT, and Surge Transients
Figure 8-6 shows the test setup used to validate THVD14x9 surge performance according to the IEC 61000-4-5
1.2/50-μs surge pulse.
80 O
A
Surge Generator
2 O Source Impedance
80 O
B
THVD14x9
Coupling Network
GND
Figure 8-6. THVD14x9(V) Surge Test Setup
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Total Surge Current (A), VCLAMP at Bus Pins (V)
THVD14x9(V) product family is robust to ±4-kV surge transients without the need for any external components.
The transient current and voltage waveforms resulting from a +4-kV surge test as described in Figure 8-6 are
shown in Figure 8-7. The bus pin voltage is clamped by the integrated surge protection diodes such that the
internal circuitry is not damaged during the surge event. The clamping voltage at the bus pins for versus the total
current from the surge generator is shown in Figure 8-8.
120
110
100
90
80
70
60
50
40
30
20
10
0
-10
-20
Voltage (V)
Current (A)
0
20
40
60
Time (ns)
80
100
120
Figure 8-7. Transient current and voltage waveforms from +4-kV Surge Test. The current waveform is
the total current output from the generator and the voltage waveform is the voltage at A or B pin of the
transceiver.
Total Peak Surge Current (A)
100
90
80
70
60
50
40
30
20
10
0
15
20
25 30 35 40 45 50 55 60 65
VCLAMP at Bus Pins at Peak Current (V)
70
75
Figure 8-8. Clamping voltage at bus pins vs total surge current from the surge generator
8.3.4 Enhanced Receiver Noise Immunity
The differential receivers of THVD14x9(V) family feature fully symmetric thresholds to maintain duty cycle of
the signal even with small input amplitudes. In addition, 250 mV (typical) hysteresis guarantees excellent noise
immunity.
8.3.5 Failsafe Receiver
The differential receivers of the THVD14x9(V) family are failsafe to invalid bus states caused by the following:
• Open bus conditions, such as a disconnected connector
• Shorted bus conditions, such as cable damage shorting the twisted-pair together
• Idle bus conditions that occur when no driver on the bus is actively driving
In any of these cases, the receiver will output a fail-safe logic high state if the input amplitude stays for longer
than tD(OFS) at less than |VTH_FSH|.
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8.4 Device Functional Modes
When the driver enable pin, DE, is logic high, the differential outputs A and B follow the logic states at data input
D. A logic high at D causes A to turn high and B to turn low. In this case the differential output voltage defined
as VOD = VA – VB is positive. When D is low, the output states reverse: B turns high, A becomes low, and VOD is
negative.
When DE is low, both outputs turn high-impedance. In this condition the logic state at D is irrelevant. The DE
pin has an internal pull-down resistor to ground, thus when left open the driver is disabled (high-impedance) by
default. The D pin has an internal pull-up resistor to VCC, thus, when left open while the driver is enabled, output
A turns high and B turns low.
Table 8-1. Driver Function Table
INPUT
ENABLE
OUTPUTS
D
DE
A
B
H
H
H
L
Actively drive bus high
FUNCTION
L
H
L
H
Actively drive bus low
X
L
Z
Z
Driver disabled
X
OPEN
Z
Z
Driver disabled by default
OPEN
H
H
L
Actively drive bus high by default
When the receiver enable pin, RE, is logic low, the receiver is enabled. When the differential input voltage
defined as VID = VA – VB is higher than the positive input threshold, VTH+, the receiver output, R, turns high.
When VID is lower than the negative input threshold, VTH-, the receiver output, R, turns low. If VID is between
VTH+ and VTH- the output is indeterminate.
When RE is logic high or left open, the receiver output is high-impedance and the magnitude and polarity of VID
are irrelevant. Internal biasing of the receiver inputs causes the output to go failsafe-high when the transceiver is
disconnected from the bus (open-circuit), the bus lines are shorted to one another (short-circuit), or the bus is not
actively driven (idle bus).
Table 8-2. Receiver Function Table
18
DIFFERENTIAL INPUT
ENABLE
OUTPUT
VID = VA – VB
RE
R
FUNCTION
VTH+ < VID
L
H
Receive valid bus high
VTH- < VID < VTH+
L
Indeterminate
Indeterminate bus state
VID < VTH-
L
L
Receive valid bus low
X
H
Z
Receiver disabled
X
OPEN
Z
Receiver disabled by default
Open-circuit bus
L
H
Fail-safe high output
Short-circuit bus
L
H
Fail-safe high output
Idle (terminated) bus
L
H
Fail-safe high output
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9 Application and Implementation
Note
Information in the following applications sections is not part of the TI component specification,
and TI does not warrant its accuracy or completeness. TI’s customers are responsible for
determining suitability of components for their purposes, as well as validating and testing their design
implementation to confirm system functionality.
9.1 Application Information
THVD14x9(V) are half-duplex RS-485 transceivers with integrated system-level surge protection. Standard
8-pin SOIC (D) package allows drop-in replacement into existing systems and eliminate system-level protection
components.
9.2 Typical Application
An RS-485 bus consists of multiple transceivers connecting in parallel to a bus cable. To eliminate line
reflections, each cable end is terminated with a termination resistor, RT, with a value that matches the
characteristic impedance, Z0, of the cable. This method, known as parallel termination, allows for higher data
rates over longer cable length.
R
R
RE
B
DE
D
R
A
R
A
RT
RT
D
A
R
B
A
D
R RE DE D
R
RE
B
DE
D
B
D
D
R RE DE D
Figure 9-1. Typical RS-485 Network With Half-Duplex Transceivers
9.2.1 Design Requirements
RS-485 is a robust electrical standard suitable for long-distance networking that may be used in a wide range of
applications with varying requirements, such as distance, data rate, and number of nodes.
9.2.1.1 Data Rate and Bus Length
There is an inverse relationship between data rate and cable length, which means the higher the data rate, the
short the cable length; and conversely, the lower the data rate, the longer the cable length. While most RS-485
systems use data rates between 10 kbps and 100 kbps, some applications require data rates up to 250 kbps at
distances of 4000 feet and longer. Longer distances are possible by allowing for small signal jitter of up to 5 or
10%.
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10000
Cable Length (ft)
5%, 10%, and 20% Jitter
1000
Conservative
Characteristics
100
10
100
1k
10 k
100 k
1M
10 M
100 M
Data Rate (bps)
Figure 9-2. Cable Length vs Data Rate Characteristic
Even higher data rates are achievable (that is, 12 Mbps for the THVD1449(V)) in cases where the interconnect is
short enough (or has suitably low attenuation at signal frequencies) to not degrade the data.
9.2.1.2 Stub Length
When connecting a node to the bus, the distance between the transceiver inputs and the cable trunk, known as
the stub, should be as short as possible. Stubs present a non-terminated piece of bus line which can introduce
reflections as the length of the stub increases. As a general guideline, the electrical length, or round-trip delay, of
a stub should be less than one-tenth of the rise time of the driver, thus giving a maximum physical stub length as
shown in Equation 1.
L(STUB) ≤ 0.1 × tr × v × c
(1)
where
•
•
•
tr is the 10/90 rise time of the driver
c is the speed of light (3 × 108 m/s)
v is the signal velocity of the cable or trace as a factor of c
9.2.1.3 Bus Loading
The RS-485 standard specifies that a compliant driver must be able to driver 32 unit loads (UL), where 1 unit
load represents a load impedance of approximately 12 kΩ. Because the THVD14x9(V) devices consist of 1/8 UL
transceivers, connecting up to 256 receivers to the bus is possible.
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9.2.2 Detailed Design Procedure
RS-485 transceivers operate in noisy industrial environments typically require surge protection at the bus
pins. Figure 9-3 compares 4-kV surge protection implementation with a regular RS-485 transceiver (such as
THVD14x0) against with the THVD14x9(V). The internal TVS protection of the THVD14x9(V) achieves ±4-kV
IEC 61000-4-5 surge protection without any additional external components, reducing system level bill of
materials.
System level surge protection implementation
using a typical RS-485 transceiver
3.3V ± 5 V
100nF
VCC
10k
10k
MOV
R
RxD
TBU
/RE
A
DE
B
DIR
MCU/
UART DIR
TVS
TBU
D
TxD
RS-485 transceiver
10k
MOV
GND
System level surge protection implementation
using THVD14x9 transceiver
3.3V ± 5 V
100nF
VCC
10k
10k
R
RxD
/RE
A
DE
B
DIR
MCU/
UART DIR
D
TxD
10k
THVD24x9
GND
Figure 9-3. Implementation of System-Level Surge Protection Using THVD14x9(V)
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9.2.3 Application Curves
Ch 2: D Input, Ch4: VOD VCC = 5 V
Ch1: R Output
Data rate: 12 Mbps
Figure 9-4. THVD1449 Waveforms with 54-Ω
Termination and VCC = 5 V
Ch 2: D Input, Ch4: VAB
Ch1: R Output
VCC = 3.3 V
Data rate: 12 Mbps
Figure 9-5. THVD1449 Waveforms with 54-Ω
Termination and VCC = 3.3 V
10 Power Supply Recommendations
To ensure reliable operation at all data rates and supply voltages, each supply should be decoupled with a 100
nF ceramic capacitor located as close to the supply pins as possible. This helps to reduce supply voltage ripple
present on the outputs of switched-mode power supplies and also helps to compensate for the resistance and
inductance of the PCB power planes.
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11 Layout
11.1 Layout Guidelines
Additional external protection components generally are not needed when using THVD14x9(V) transceivers.
1. Use VCC and ground planes to provide low-inductance. Note that high-frequency currents tend to follow the
path of least impedance and not the path of least resistance. Apply 100-nF to 220-nF decoupling capacitors
as close as possible to the VCC pins of transceiver, UART and/or controller ICs on the board.
2. Use at least two vias for VCC and ground connections of decoupling capacitors to minimize effective via
inductance.
3. Use 1-kΩ to 10-kΩ pull-up and pull-down resistors for enable lines to limit noise currents in these lines during
transient events.
11.2 Layout Example
2
C
R
R
VCC
R
RE
B
JMP
3
Via to GND
Via to VCC
1
R
MCU
DE
3
A
R
D
GND
2
Figure 11-1. THVD1439, THVD1449 Layout Example
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2
1
C
VIO
1
VCC
R
R
B
R
MCU
DE / RE
3
Via to GND
Via to VCC
Via to VIO
JMP
3
C
2
A
R
D
GND
2
Figure 11-2. THVD1439V THVD1449V Layout Example
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12 Device and Documentation Support
12.1 Device Support
12.2 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on
Subscribe to updates to register and receive a weekly digest of any product information that has changed. For
change details, review the revision history included in any revised document.
12.3 Support Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
12.4 Trademarks
TI E2E™ is a trademark of Texas Instruments.
All trademarks are the property of their respective owners.
12.5 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
12.6 Glossary
TI Glossary
This glossary lists and explains terms, acronyms, and definitions.
Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
Copyright © 2021 Texas Instruments Incorporated
Product Folder Links: THVD1439 THVD1439V THVD1449 THVD1449V
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25
PACKAGE OPTION ADDENDUM
www.ti.com
3-Apr-2022
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
(4/5)
(6)
THVD1439DR
ACTIVE
SOIC
D
8
2500
RoHS & Green
NIPDAUAG
Level-3-260C-168 HR
-40 to 125
T1439
THVD1439VDR
ACTIVE
SOIC
D
8
2500
RoHS & Green
NIPDAUAG
Level-3-260C-168 HR
-40 to 125
1439V
THVD1449DR
ACTIVE
SOIC
D
8
2500
RoHS & Green
NIPDAUAG
Level-3-260C-168 HR
-40 to 125
T1449
THVD1449VDR
ACTIVE
SOIC
D
8
2500
RoHS & Green
NIPDAUAG
Level-3-260C-168 HR
-40 to 125
T1449V
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of