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TIBPAL16R6-10CFN

TIBPAL16R6-10CFN

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    LCC20

  • 描述:

    IC PLD 10NS 20PLCC

  • 数据手册
  • 价格&库存
TIBPAL16R6-10CFN 数据手册
TIBPAL16L8-10C, TIBPAL16R4-10C, TIBPAL16R6-10C, TIBPAL16R8-10C TIBPAL16L8-12M, TIBPAL16R4-12M, TIBPAL16R6-12M, TIBPAL16R8-12M HIGH-PERFORMANCE IMPACT-X™ PAL® CIRCUITS SRPS017A − D3023, MAY 1987 − REVISED DECEMBER 2010 TIBPAL16L8’ C SUFFIX . . . J OR N PACKAGE M SUFFIX . . . J PACKAGE (TOP VIEW) I I I I I I I I I GND Functionally Equivalent, but Faster than, Existing 20-Pin PLDs • Preload Capability on Output Registers Simplifies Testing • Power-Up Clear on Registered Devices (All Register Outputs are Set Low, but Voltage Levels at the Output Pins Go High) • Package Options Include Both Plastic and Ceramic Chip Carriers in Addition to Plastic and Ceramic DIPs • • Security Fuse Prevents Duplication DEVICE I INPUTS 3-STATE O OUTPUTS REGISTERED Q OUTPUTS PAL16L8 10 2 0 6 PAL16R4 8 0 4 (3-state buffers) 4 PAL16R6 8 0 6 (3-state buffers) 2 PAL16R8 8 0 8 (3-state buffers) 0 20 2 19 3 18 4 17 5 16 6 15 7 14 8 13 9 12 10 11 VCC O I/O I/O I/O I/O I/O I/O O I TIBPAL16L8’ C SUFFIX . . . FN PACKAGE M SUFFIX . . . FK PACKAGE (TOP VIEW) I I I I I Dependable Texas Instruments Quality and Reliability I/O PORT S 1 I I I VCC O • High-Performance Operation: fmax (w/o feedback) TIBPAL16R’-10C Series . . . 62.5 MHz Min TIBPAL16R’-12M Series . . . 56 MHz Min fmax (with feedback) TIBPAL16R’-10C Series . . . 55.5 MHz Min TIBPAL16R’-12M Series . . . 48 MHz Min Propagation Delay TIBPAL16L’-10C Series . . . 10 ns Max TIBPAL16L’-12M Series . . . 12 ns Max 4 3 2 1 20 19 18 5 17 6 16 7 15 8 14 9 10 11 12 13 I/O I/O I/O I/O I/O I GND I O I/O • Pin assignments in operating mode description These programmable array logic devices feature high speed and functional equivalency when compared with currently available devices. These IMPACT-X™ circuits combine the latest Advanced Low-Power Schottky technology with proven titanium-tungsten fuses to provide reliable, high-performance substitutes for conventional TTL logic. Their easy programmability allows for quick design of custom functions and typically results in a more compact circuit board. In addition, chip carriers are available for futher reduction in board space. All of the register outputs are set to a low level during power up. Extra circuitry has been provided to allow loading of each register asynchronously to either a high or low state. This feature simplifies testing because the registers can be set to an initial state prior to executing the test sequence. The TIBPAL16’ C series is characterized from 0°C to 75°C. The TIBPAL16’ M series is characterized for operation over the full military temperature range of −55°C to 125°C. IMPACT-X is a trademark of Texas Instruments Incorporated. PAL is a registered trademark of Advanced Micro Devices Inc. Copyright © 2010, Texas Instruments Incorporated PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 1 TIBPAL16R4-10C, TIBPAL16R6-10C, TIBPAL16R8-10C TIBPAL16R4-12M, TIBPAL16R6-12M, TIBPAL16R8-12M HIGH-PERFORMANCE IMPACT-X™ PAL® CIRCUITS SRPS017A − D3023, MAY 1987 − REVISED DECEMBER 2010 TIBPAL16R4’ C SUFFIX . . . FN PACKAGE M SUFFIX . . . FK PACKAGE TIBPAL16R4’ C SUFFIX . . . J OR N PACKAGE M SUFFIX . . . J PACKAGE (TOP VIEW) 3 18 4 17 5 16 6 15 7 14 8 13 9 12 10 11 VCC I/O I/O Q Q Q Q I/O I/O OE I I I I I 4 3 2 1 20 19 18 5 17 6 16 7 15 8 14 9 10 11 12 13 TIBPAL16R6’ C SUFFIX . . . FN PACKAGE M SUFFIX . . . FK PACKAGE TIBPAL16R6’ C SUFFIX . . . J OR N PACKAGE M SUFFIX . . . J PACKAGE (TOP VIEW) 20 2 19 3 18 4 17 5 16 6 15 7 14 8 13 9 12 10 11 VCC I/O Q Q Q Q Q Q I/O OE I I I I I 4 3 2 1 20 19 18 5 17 6 16 7 15 8 14 9 10 11 12 13 I GND 1 I I CLK VCC I/O (TOP VIEW) CLK I I I I I I I I GND TIBPAL16R8’ C SUFFIX . . . J OR N PACKAGE M SUFFIX . . . J PACKAGE (TOP VIEW) 19 3 18 4 17 5 16 6 15 7 14 8 13 9 12 10 11 I I CLK VCC Q 20 2 VCC Q Q Q Q Q Q Q Q OE I I I I I Pin assignments in operating mode 2 POST OFFICE BOX 655303 4 3 2 1 20 19 18 5 17 6 16 7 15 8 14 9 10 11 12 13 I GND 1 Q Q Q Q Q TIBPAL16R8’ C SUFFIX . . . FN PACKAGE M SUFFIX . . . FK PACKAGE (TOP VIEW) CLK I I I I I I I I GND I/O Q Q Q Q OE I/O I/O 19 OE I/O Q 20 2 • DALLAS, TEXAS 75265 OE Q Q 1 I GND CLK I I I I I I I I GND I I CLK VCC I/O (TOP VIEW) Q Q Q Q Q TIBPAL16L8-10C, TIBPAL16R4-10C TIBPAL16L8-12M, TIBPAL16R4-12M HIGH-PERFORMANCE IMPACT-X™ PAL® CIRCUITS SRPS017A − D3023, MAY 1987 − REVISED DECEMBER 2010 functional block diagrams (positive logic) TIBPAL16L8’ & 32 X 64 I 16 x 10 6 16 16 EN ≥ 1 7 O 7 O 7 I/O 7 I/O 7 I/O 7 I/O 7 I/O 7 I/O 6 TIBPAL16R4’ OE CLK EN 2 C1 & 32 X 64 I 16 x 8 I=0 2 ≥1 8 Q 1D 8 Q 8 Q 8 Q 16 4 4 16 EN ≥ 1 7 I/O 7 I/O 7 I/O 7 I/O 4 4 denotes fused inputs POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 3 TIBPAL16R6-10C, TIBPAL16R8-10C TIBPAL16R6-12M, TIBPAL16R8-12M HIGH-PERFORMANCE IMPACT-X™ PAL® CIRCUITS SRPS017A − D3023, MAY 1987 − REVISED DECEMBER 2010 functional block diagrams (positive logic) TIBPAL16R6’ OE CLK EN 2 C1 & 32 X 64 I 16 x 8 ≥1 8 I=0 2 Q 1D 8 Q 8 Q 8 Q 8 Q 8 Q 16 6 2 16 EN ≥ 1 7 I/O I/O 7 2 6 TIBPAL16R8’ OE CLK EN 2 C1 & 32 X 64 I 16 x 8 8 8 ≥1 I=0 2 8 Q 8 Q 8 Q 8 Q 8 Q 8 Q 8 Q 16 16 8 denotes fused inputs 4 Q 1D POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 TIBPAL16L8-10C TIBPAL16L8-12M HIGH-PERFORMANCE IMPACT-X™ PAL® CIRCUITS SRPS017A − D3023, MAY 1987 − REVISED DECEMBER 2010 logic diagram (positive logic) I 1 First Fuse Numbers I I I I I I I I 2 3 4 5 6 7 8 9 Increment 0 4 8 12 16 20 24 28 0 32 64 96 128 160 192 224 31 19 256 288 320 352 384 416 448 480 18 512 544 576 608 640 672 704 736 17 768 800 832 864 896 928 960 992 16 1024 1056 1088 1120 1152 1184 1216 1248 15 1280 1312 1344 1376 1408 1440 1472 1504 14 1536 1568 1600 1632 1664 1696 1728 1760 13 1792 1824 1856 1888 1920 1952 1984 2016 12 11 O I/O I/O I/O I/O I/O I/O O I Fuse number = First fuse number + Increment POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 5 TIBPAL16R4-10C TIBPAL16R4-12M HIGH-PERFORMANCE IMPACT-X™ PAL® CIRCUITS SRPS017A − D3023, MAY 1987 − REVISED DECEMBER 2010 logic diagram (positive logic) CLK 1 First Fuse Numbers I I I I I I I I 2 3 4 5 6 7 8 9 Increment 0 4 8 12 16 20 24 31 19 256 288 320 352 384 416 448 480 18 512 544 576 608 640 672 704 736 I=0 1D 768 800 832 864 896 928 960 992 I=0 1D 1024 1056 1088 1120 1152 1184 1216 1248 I=0 1D 1280 1312 1344 1376 1408 1440 1472 1504 I=0 1D 17 I/O I/O Q C1 16 Q C1 15 Q C1 14 Q C1 1536 1568 1600 1632 1664 1696 1728 1760 13 1792 1824 1856 1888 1920 1952 1984 2016 12 11 Fuse number = First fuse number + Increment 6 28 0 32 64 96 128 160 192 224 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 I/O I/O OE TIBPAL16R6-10C TIBPAL16R6-12M HIGH-PERFORMANCE IMPACT-X™ PAL® CIRCUITS SRPS017A − D3023, MAY 1987 − REVISED DECEMBER 2010 logic diagram (positive logic) CLK 1 First Fuse Numbers I I I I I I I I 2 3 4 5 6 7 8 9 Increment 0 4 8 12 16 20 24 28 31 0 32 64 96 128 160 192 224 19 256 288 320 352 384 416 448 480 I=0 1D 512 544 576 608 640 672 704 736 I=0 1D 768 800 832 864 896 928 960 992 I=0 1D 1024 1056 1088 1120 1152 1184 1216 1248 I=0 1D 1280 1312 1344 1376 1408 1440 1472 1504 I=0 1D 1536 1568 1600 1632 1664 1696 1728 1760 I=0 1D 18 I/O Q C1 17 Q C1 16 Q C1 15 Q C1 14 Q C1 13 Q C1 1792 1824 1856 1888 1920 1952 1984 2016 12 11 Fuse number = First fuse number + Increment POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 I/O OE 7 TIBPAL16R8-10C TIBPAL16R8-12M HIGH-PERFORMANCE IMPACT-X™ PAL® CIRCUITS SRPS017A − D3023, MAY 1987 − REVISED DECEMBER 2010 logic diagram (positive logic) CLK 1 First Fuse Numbers I I I I I I I I 2 3 4 5 6 7 8 9 Increment 0 4 8 12 16 20 24 31 I=0 1D 256 288 320 352 384 416 448 480 I=0 1D 512 544 576 608 640 672 704 736 I=0 1D 768 800 832 864 896 928 960 992 I=0 1D 1024 1056 1088 1120 1152 1184 1216 1248 I=0 1D 1280 1312 1344 1376 1408 1440 1472 1504 I=0 1D 1536 1568 1600 1632 1664 1696 1728 1760 I=0 1D 1792 1824 1856 1888 1920 1952 1984 2016 I=0 1D 19 Q C1 18 Q C1 17 Q C1 16 Q C1 15 Q C1 14 Q C1 13 Q C1 12 Q C1 11 Fuse number = First fuse number + Increment 8 28 0 32 64 96 128 160 192 224 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 OE TIBPAL16L8-10C, TIBPAL16R4-10C, TIBPAL16R6-10C, TIBPAL16R8-10C HIGH-PERFORMANCE IMPACT-X™ PAL® CIRCUITS SRPS017A − D3023, MAY 1987 − REVISED DECEMBER 2010 absolute maximum ratings over operating free-air temperature range (unless otherwise noted) Supply voltage, VCC (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V Input voltage (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5.5 V Voltage applied to disabled output (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5.5 V Operating free-air temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 75°C Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −65°C to 150°C NOTE 1: These ratings apply except for programming pins during a programming cycle. recommended operating conditions VCC Supply voltage VIH High-level input voltage (see Note 2) VIL Low-level input voltage (see Note 2) IOH MIN NOM MAX UNIT 4.75 5 5.25 V 5.5 V 2 0.8 V High-level output current −3.2 mA IOL Low-level output current 24 mA fclock Clock frequency 62.5 MHz 0 High 8 Low 8 tw Pulse duration, clock (see Note 2) tsu Setup time, input or feedback before clock↑ th Hold time, input or feedback after clock↑ 0 TA Operating free-air temperature 0 ns 10 ns ns 25 75 °C NOTE 2: These are absolute voltage levels with respect to the ground pin of the device and include all overshoots due to system and/or tester noise. Testing these parameters should not be attempted without suitable equipment. electrical characteristics over recommended operating free-air temperature range PARAMETER TEST CONDITIONS MIN TYP† MAX UNIT −0.8 −1.5 V VIK VCC = 4.75 V, II = − 18 mA VOH VCC = 4.75 V, IOH = − 3.2 mA VOL VCC = 4.75 V, IOL = 24 mA 0.5 V IOZH‡ VCC = 5.25 V, VO = 2.4 V 100 μA IOZL‡ VCC = 5.25 V, VO = 0.4 V −100 μA II VCC = 5.25 V, VI = 5.5 V 0.2 mA IIH‡ VCC = 5.25 V, VI = 2.4 V 25 μA ‡ VCC = 5.25 V, VI = 0.4 V −0.08 −0.25 mA IOS§ VCC = 5.25 V, VO = 0 −70 −130 mA ICC VCC = 5.25 V, VI = 0, 140 180 mA Ci f = 1 MHz, VI = 2 V 5 pF Co f = 1 MHz, VO = 2 V 6 pF Ci/o f = 1 MHz, VI/O = 2 V 7.5 pF Cclk f = 1 MHz, VCLK = 2 V 6 pF IIL 2.4 3.2 0.3 −30 Outputs open V † All typical values are at VCC = 5 V, TA = 25°C. I/O leakage is the worst case of IOZL and IIL or IOZH and IIH respectively. § Not more than one output should be shorted at a time, and the duration of the short circuit should not exceed one second. ‡ POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 9 TIBPAL16L8-10C, TIBPAL16R4-10C, TIBPAL16R6-10C, TIBPAL16R8-10C HIGH-PERFORMANCE IMPACT-X™ PAL® CIRCUITS SRPS017A − D3023, MAY 1987 − REVISED DECEMBER 2010 switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER FROM (INPUT) fmax TO (OUTPUT) MIN TYP† With feedback 55.5 80 Without feedback 62.5 85 TEST CONDITION tpd I, I/O O, I/O R1 = 200 Ω, 3 7 tpd CLK↑ Q R2 = 390 Ω, 2 ten OE↓ Q See Figure 3 1 tdis OE↑ Q ten I, I/O tdis I, I/O UNIT MHz 10 ns 5 8 ns 4 10 ns 1 4 10 ns O, I/O 3 8 10 ns O, I/O 3 8 10 ns † All typical values are at VCC = 5 V, TA = 25°C. ‡ 1 , f max(with feedback) + 1 t su ) t (CLK to Q) f max(without feedback) + t high ) t low pd w w 10 MAX POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 TIBPAL16L8-12M, TIBPAL16R4-12M, TIBPAL16R6-12M, TIBPAL16R8-12M HIGH-PERFORMANCE IMPACT-X™ PAL® CIRCUITS SRPS017D − D3023, MAY 1987 − REVISED DECEMBER 2010 absolute maximum ratings over operating free-air temperature range (unless otherwise noted) Supply voltage, VCC (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V Input voltage (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5.5 V Voltage applied to disabled output (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5.5 V Operating free-air temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −55°C to 125°C Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −65°C to 150°C NOTE 1: These ratings apply except for programming pins during a programming cycle. recommended operating conditions MIN NOM MAX 4.5 5 5.5 UNIT V 5.5 V VCC Supply voltage VIH High-level input voltage VIL Low-level input voltage 0.8 V IOH High-level output current −2 mA Low-level output current 12 mA 56 MHz IOL fclock † 2 Clock frequency 0 tw Pulse duration, clock (see Note 2) tsu† Setup time, input or feedback before clock↑ th † TA High 9 Low 9 ns 11 Hold time, input or feedback after clock↑ ns 0 Operating free-air temperature −55 ns 25 125 °C NOTE 2: These are absolute voltage levels with respect to the ground pin of the device and include all overshoots due to system and/or tester noise. Testing these parameters should not be attempted without suitable equipment. electrical characteristics over recommended operating free-air temperature range PARAMETER TEST CONDITIONS VIK VCC = 4.5 V, II = − 18 mA VOH VCC = 4.5 V, IOH = − 2 mA VOL VCC = 4.5 V, IOL = 12 mA IOZH‡ VCC = 5.5 V, IOZL‡ II MIN 2.4 TYP† MAX UNIT −0.8 −1.5 V 3.2 0.3 V 0.5 V VO = 2.4 V 100 μA VCC = 5.5 V, VO = 0.4 V −100 μA VCC = 5.5 V, VI = 5.5 V 0.2 mA IIH‡ VCC = 5.5 V, VI = 2.4 V IIL‡ VCC = 5.5 V, VI = 0.4 V IOS§ VCC = 5.5 V, VO = 0.5 V ICC VCC = 5.5 V, VI = GND, Ci f = 1 MHz, VI = 2 V 5 pF Co f = 1 MHz, VO = 2 V 6 pF Ci/o f = 1 MHz, VI/O = 2 V 7.5 pF Cclk f = 1 MHz, VCLK = 2 V 6 pF −30 Outputs open 25 μA −0.08 −0.25 mA −70 −250 mA 140 220 mA † All typical values are at VCC = 5 V, TA = 25°C. I/O leakage is the worst case of IOZL and IIL or IOZH and IIH respectively. § Not more than one output should be shorted at a time, and the duration of the short circuit should not exceed one second. V is set at 0.5 V to O avoid test problems caused by test equipment ground degradation. ‡ POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 11 TIBPAL16L8-12M, TIBPAL16R4-12M, TIBPAL16R6-12M, TIBPAL16R8-12M HIGH-PERFORMANCE IMPACT-X™ PAL® CIRCUITS SRPS017D − D3023, MAY 1987 − REVISED DECEMBER 2010 switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER FROM (INPUT) fmax TO (OUTPUT) MIN TYP† With feedback 48 80 Without feedback 56 85 TEST CONDITION UNIT MHz tpd I, I/O O, I/O R1 = 390 Ω, 3 7 12 ns tpd CLK↑ Q R2 = 750 Ω, 2 5 10 ns ten OE↓ Q See Figure 3 1 4 10 ns tdis OE↑ Q 1 4 10 ns ten I, I/O O, I/O 3 8 14 ns tdis I, I/O O, I/O 2 8 12 ns † All typical values are at VCC = 5 V, TA = 25°C. ‡ 1 , f max(with feedback) + 1 t su ) t (CLK to Q) f max(without feedback) + t high ) t low pd w w 12 MAX POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 TIBPAL16L8-10C, TIBPAL16R4-10C, TIBPAL16R6-10C, TIBPAL16R8-10C TIBPAL16L8-12M, TIBPAL16R4-12M, TIBPAL16R6-12M, TIBPAL16R8-12M HIGH-PERFORMANCE IMPACT-X™ PAL® CIRCUITS SRPS017A − D3023, MAY 1987 − REVISED DECEMBER 2010 programming information Texas Instruments programmable logic devices can be programmed using widely available software and inexpensive device programmers. Complete programming specifications, algorithms, and the latest information on hardware, software, and firmware are available upon request. Information on programmers capable of programming Texas Instruments programmable logic is also available, upon request, from the nearest TI field sales office, local authorized TI distributor, or by calling Texas Instruments at (214) 997-5666. preload procedure for registered outputs (see Figure 1 and Note 3) The output registers can be preloaded to any desired state during device testing. This permits any state to be tested without having to step through the entire state-machine sequence. Each register is preloaded individually by following the steps given below. Step 1. Step 2. Step 3. Step 4. With VCC at 5 volts and Pin 1 at VIL, raise Pin 11 to VIHH. Apply either VIL or VIH to the output corresponding to the register to be preloaded. Pulse Pin 1, clocking in preload data. Remove output voltage, then lower Pin 11 to VIL. Preload can be verified by observing the voltage level at the output pin. VIHH Pin 11 td tsu tw VIL td VIH Pin 1 VIL VIH Registered I/O Input VOH Output VIL VOL Figure 1. Preload Waveforms NOTE 3: td = tsu = th = 100 ns to 1000 ns VIHH = 10.25 V to 10.75 v POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 13 TIBPAL16L8-10C, TIBPAL16R4-10C, TIBPAL16R6-10C, TIBPAL16R8-10C TIBPAL16L8-12M, TIBPAL16R4-12M, TIBPAL16R6-12M, TIBPAL16R8-12M HIGH-PERFORMANCE IMPACT-X™ PAL® CIRCUITS SRPS017A − D3023, MAY 1987 − REVISED DECEMBER power-up reset (see Figure 2) Following power up, all registers are reset to zero. This feature provides extra flexibility to the system designer and is especially valuable in simplifying state-machine initialization. To ensure a valid power-up reset, it is important that the rise of VCC be monotonic. Following power-up reset, a low-to-high clock transition must not occur until all applicable input and feedback setup times are met. VCC 5V 4V tpd† (600 ns TYP, 1000 ns MAX) VOH Active Low Registered Output 1.5 V VOL tsu‡ CLK 1.5 V 1.5 V tw † ‡ This is the power-up reset time and applies to registered outputs only. The values shown are from characterization data. This is the setup time for input or feedback. Figure 2. Power-Up Reset Waveforms 14 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 VIH VIL TIBPAL16L8-10C, TIBPAL16R4-10C, TIBPAL16R6-10C, TIBPAL16R8-10C TIBPAL16L8-12M, TIBPAL16R4-12M, TIBPAL16R6-12M, TIBPAL16R8-12M HIGH-PERFORMANCE IMPACT-X™ PAL® CIRCUITS SRPS017A − D3023, MAY 1987 − REVISED DECEMBER 2010 PARAMETER MEASUREMENT INFORMATION 5V S1 R1 From Output Under Test Test Point CL (see Note A) R2 LOAD CIRCUIT FOR 3-STATE OUTPUTS 1.5 V 1.5 V (0.3 V) [0] Data Input (3.5 V) [3 V] 1.5 V 1.5 V (0.3 V) [0] (3.5 V) [3 V] VOH 1.5 V VOL tpd tpd 1.5 V VOH 1.5 V VOL (3.5 V) [3 V] 1.5 V Waveform 1 S1 Closed (see Note B) tdis 1.5 V tdis ten Waveform 2 S1 Open (see Note B) VOLTAGE WAVEFORMS PROPAGATION DELAY TIMES 1.5 V (0.3 V) [0] ten tpd 1.5 V 1.5 V (0.3 V) [0] Output Control (low-level enabling) (0.3 V) [0] In-Phase Output 1.5 V VOLTAGE WAVEFORMS PULSE DURATIONS 1.5 V tpd (0.3 V) [0] (3.5 V) [3 V] Low-Level Pulse 1.5 V VOLTAGE WAVEFORMS SETUP AND HOLD TIMES Input 1.5 V tw th tsu Out-of-Phase Output (see Note D) (3.5 V) [3 V] High-Level Pulse (3.5 V) [3 V] Timing Input ≈ 3.3 V VOL +0.5 V VOL VOH 1.5 V VOH −0.5 V ≈0V VOLTAGE WAVEFORMS ENABLE AND DISABLE TIMES, 3-STATE OUTPUTS NOTES: A. CL includes probe and jig capacitance and is 50 pF for tpd and ten, 5 pF for tdis. B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control. Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control. C. All input pulses have the following characteristics: For C suffix, use the voltage levels indicated in parentheses ( ), PRR ≤ 1 MHz, tr = tf = 2 ns, duty cycle = 50%; For M suffix, use the voltage levels indicated in brackets [ ], PRR ≤ 10 MHz, tr and tf ≤ 2 ns, duty cycle = 50% D. When measuring propagation delay times of 3-state outputs, switch S1 is closed. E. Equivalent loads may be used for testing. Figure 3. Load Circuit and Voltage Waveforms POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 15 TIBPAL16R4-10C, TIBPAL16R6-10C, TIBPAL16R8-10C HIGH-PERFORMANCE IMPACT-X™ PAL® CIRCUITS SRPS017 − D3023, MAY 1987 − REVISED DECEMBER 2010 metastable characteristics of TIBPAL16R4-10C, TIBPAL16R6-10C, and TIBPAL16R8-10C At some point a system designer is faced with the problem of synchronizing two digital signals operating at two different frequencies. This problem is typically overcome by synchronizing one of the signals to the local clock through use of a flip-flop. However, this solution presents an awkward dilemma since the setup and hold time specifications associated with the flip-flop are sure to be violated. The metastable characteristics of the flip-flop can influence overall system reliability. Whenever the setup and hold times of a flip-flop are violated, its output response becomes uncertain and is said to be in the metastable state if the output hangs up in the region between VIL and VIH. This metastable condition lasts until the flip-flop falls into one of its two stable states, which takes longer than the specified maximum propagation delay time (CLK to Q max). From a system engineering standpoint, a designer cannot use the specified data sheet maximum for propagation delay time when using the flip-flop as a data synchronizer − how long to wait after the specified data sheet maximum must be known before using the data in order to guarantee reliable system operation. The circuit shown in Figure 4 can be used to evaluate MTBF (Mean Time Between Failure) and Δt for a selected flip-flop. Whenever the Q output of the DUT is between 0.8 V and 2 V, the comparators are in opposite states. When the Q output of the DUT is higher than 2 V or lower than 0.8 V, the comparators are at the same logic level. The outputs of the two comparators are sampled a selected time (Δt) after SCLK. The exclusive OR gate detects the occurrence of a failure and increments the failure counter. Noise Generator DATA IN DUT VIH Comparator 1D MTBF Counter 1D 1D C1 + C1 VIL Comparator SCLK C1 1D C1 SCLK + Δ t Figure 4. Metastable Evaluation Test Circuit In order to maximize the possibility of forcing the DUT into a metastable state, the input data signal is applied so that it always violates the setup and hold time. This condition is illustrated in the timing diagram in Figure 5. Any other relationship of SCLK to data will provide less chance for the device to enter into the metastable state. Data SCLK SCLK + Δ t Time (sec) MTBF + # Failures Δt Δt trec = Δ t − CLK to Q (max) Figure 5. Timing Diagram 16 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 TIBPAL16R4-10C, TIBPAL16R6-10C, TIBPAL16R8-10C HIGH-PERFORMANCE IMPACT-X™ PAL® CIRCUITS SRPS017A − D3023, MAY 1987 − REVISED DECEMBER 2010 By using the described test circuit, MTBF can be determined for several different values of Δt (see Figure 4). Plotting this information on semilog scale demonstrates the metastable characteristics of the selected flip-flop. Figure 6 shows the results for the TIBPAL16’-10C operating at 1 MHz. 10 9 10 yr 10 8 1 yr MTBF (s) 10 7 10 6 1 mo 1 wk 10 5 1 day 10 4 1 hr 10 3 10 2 1 min 10 1 10 s 0 10 fclk = 1 MHz fdata = 500 kHz 20 30 40 Δ t (ns) 50 60 70 Figure 6. Metastable Characteristics From the data taken in the above experiment, an equation can be derived for the metastable characteristics at other clock frequencies. 1 The metastable equation: + f x f x C1 e (*C2 x Dt) data SCLK MTBF The constants C1 and C2 describe the metastable characteristics of the device. From the experimental data, these constants can be solved for: C1 = 9.15 X 10−7 and C2 = 0.959 Therefore 1 + f x f x 9.15 x 10 *7 e (*0.959 x Dt) data SCLK MTBF definition of variables DUT (Device Under Test): The DUT is a 10-ns registered PLD programmed with the equation Q : = D. MTBF (Mean Time Between Failures): The average time (s) between metastable occurrences that cause a violation of the device specifications. fSCLK (system clock frequency): Actual clock frequency for the DUT. fdata (data frequency): Actual data frequency for a specified input to the DUT. C1: Calculated constant that defines the magnitude of the curve. C2: Calculated constant that defines the slope of the curve. trec (metastability recovery time): Minimum time required to guarantee recovery from metastability, at a given MTBF failure rate. trec = Δt − tpd (CLK to Q, max) Δt: The time difference (ns) from when the synchronizing flip-flop is clocked to when its output is sampled. The test described above has shown the metastable characteristics of the TIBPAL16R4/R6/R8-10C series. For additional information on metastable characteristics of Texas Instruments logic circuits, please refer to TI Applications publication SDAA004, ”Metastable Characteristics, Design Considerations for ALS, AS, and LS Circuits.’’ POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 17 TIBPAL16L8-10C, TIBPAL16R4-10C, TIBPAL16R6-10C, TIBPAL16R8-10C TIBPAL16L8-12M, TIBPAL16R4-12M, TIBPAL16R6-12M, TIBPAL16R8-12M HIGH-PERFORMANCE IMPACT-X™ PAL® CIRCUITS SRPS017A − D3023, MAY 1987 − REVISED DECEMBER 2010 TYPICAL CHARACTERISTICS PROPAGATION DELAY TIME vs FREE - AIR TEMPERATURE 9 tPHL (I, I/O to O, I/O) 8 Propagation Delay Time − ns Propagation Delay Time − ns 8 VCC = 5 V CL = 50 pF R1 = 200 Ω R2 = 390 Ω 1 Output Switching PROPAGATION DELAY TIME vs SUPPLY VOLTAGE 7 tPLH (I, I/O to O, I/O) 6 tPHL (CLK to Q) 5 4 3 −75 tPHL (I, I/O to O, I/O) 7 tPLH (I, I/O to O, I/O) 6 tPHL (CLK to Q) 5 4 tPLH (CLK to Q) −50 TA = 25 °C CL = 50 pF R1 = 200 Ω R2 = 390 Ω 75 100 −25 0 25 50 TA − Free - Air Temperature − ° C tPLH (CLK to Q) 3 4.5 125 4.75 5 5.25 VCC − Supply Voltage − V Figure 7 Figure 8 PROPAGATION DELAY TIME vs NUMBER OF OUTPUTS SWITCHING Propagation Delay Time − ns 11 VCC = 5 V TA = 25 ° C 10 CL = 50 pF R1 = 200 Ω R2 = 390 Ω 9 tPHL (I, I/O to O, I/O) 8 7 tPLH (I, I/O to O, I/O) 6 5 tPHL (CLK to Q) 4 3 tPLH (CLK to Q) 0 1 6 2 3 4 5 Number of Outputs Switching 7 Figure 9 18 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 8 5.5 TIBPAL16L8-10C, TIBPAL16R4-10C, TIBPAL16R6-10C, TIBPAL16R8-10C TIBPAL16L8-12M, TIBPAL16R4-12M, TIBPAL16R6-12M, TIBPAL16R8-12M HIGH-PERFORMANCE IMPACT-X™ PAL® CIRCUITS SRPS017A − D3023, MAY 1987 − REVISED DECEMBER 2010 TYPICAL CHARACTERISTICS POWER DISSIPATION vs FREQUENCY 8 - BIT COUNTER MODE PROPAGATION DELAY TIME vs LOAD CAPACITANCE 18 14 VCC = 5 V P − Power Dissipation − mW D 16 12 10 8 tPLH (CLK to Q) tPHL (CLK to Q) 6 tPLH (I, I/O to O, I/O) tPHL (I, I/O to O, I/O) 4 2 800 TA = 0 ° C 700 100 200 300 400 500 CL − Load Capacitance − pF 600 TA = 25 ° C TA = 80 ° C 600 0 1 4 10 40 100 F − Frequency − MHz Figure 11 Figure 10 SUPPLY CURRENT vs FREE - AIR TEMPERATURE 180 Unprogrammed Device 170 I CC − Supply Current − mA Propagation Delay Time − ns 900 VCC = 5 V TA = 25 ° C R1 = 200 Ω R2 = 390 Ω 1 Output Switching VCC = 5.5 V 160 VCC = 5.25 V 150 140 130 120 VCC = 5 V VCC = 4.75 V 110 100 −75 VCC = 4.5 V −50 −25 0 25 50 75 100 TA − Free - Air Temperature − ° C 125 Figure 12 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 19 TI Authorized TI North American Sales North American Offices Distributors ALABAMA: Huntsville: (205) 837-7530 ARIZONA: Phoenix: (602) 995-1007 CALIFORNIA: Irvine: (714) 660-1200 San Diego: (619) 278-9600 Santa Clara: (408) 980-9000 Woodland Hills: (818) 704-8100 COLORADO: Aurora: (303) 368-8000 CONNECTICUT: Wallingford: (203) 269-0074 FLORIDA: Altamonte Springs: (407) 260-2116 Fort Lauderdale: (305) 973-8502 Tampa: (813) 885-7588 GEORGIA: Norcross: (404) 662-7967 ILLINOIS: Arlington Heights: (708) 640-3000 INDIANA: Carmel: (317) 573-6400 Fort Wayne: (219) 489-4697 KANSAS: Overland Park: (913) 451-4511 MARYLAND: Columbia: (410) 964-2003 MASSACHUSETTS: Waltham: (617) 895-9100 MICHIGAN: Farmington Hills: (313) 553-1581 MINNESOTA: Eden Prairie: (612) 828-9300 MISSOURI: St. Louis: (314) 821-8400 NEW JERSEY: Iselin: (908) 750-1050 NEW MEXICO: Albuquerque: (505) 345-2555 NEW YORK: East Syracuse: (315) 463-9291 Fishkill: (914) 897-2900 Melville: (516) 454-6600 Pittsford: (716) 385-6770 NORTH CAROLINA: Charlotte: (704) 527-0930 Raleigh: (919) 876-2725 OHIO: Beachwood: (216) 765-7258 Beavercreek: (513) 427-6200 OREGON: Beaverton: (503) 643-6758 PENNSYLVANIA: Blue Bell: (215) 825-9500 PUERTO RICO: Hato Rey: (809) 753-8700 TEXAS: Austin: (512) 250-6769 Dallas: (214) 917-1264 Houston: (713) 778-6592 Midland: (915) 561-7137 UTAH: Salt Lake CIty: (801) 466-8972 WISCONSIN: Waukesha: (414) 798-1001 CANADA: Nepean: (613) 726-1970 Richmond Hill: (416) 884-9181 St. Laurent: (514) 335-8392 TI Regional Technology Centers CALIFORNIA: Irvine: (714) 660-8140 Santa Clara: (408) 748-2222 GEORGIA: Norcross: (404) 662-7945 ILLINOIS: Arlington Heights: (708) 640-2909 INDIANA: Indianapolis: (317) 573-6400 MASSACHUSETTS: Waltham: (617) 895-9196 MEXICO: Mexico City: 491-70834 MINNESOTA: Minneapolis: (612) 828-9300 TEXAS: Dallas: (214) 917-3881 CANADA: Nepean: (613) 726-1970 Alliance Electronics, Inc. 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TI Die Processors Chip Supply Elmo Semiconductor Minco Technology Labs (407) 298-7100 (818) 768-7400 (512) 834-2022 Customer Response Center TOLL FREE: OUTSIDE USA: (800) 336-5236 (214) 995-6611 (8:00 a.m. − 5:00 p.m. CST) D0892 ©1992 Texas Instruments Incorporated SRPS017 PACKAGE OPTION ADDENDUM www.ti.com 21-Mar-2012 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Drawing Pins Package Qty Eco Plan (2) Lead/ Ball Finish MSL Peak Temp Samples (Requires Login) 5962-85155132A ACTIVE LCCC FK 20 1 TBD Call TI Call TI 5962-8515513RA ACTIVE CDIP J 20 1 TBD Call TI Call TI 1 5962-8515513SA ACTIVE CFP W 20 TBD Call TI Call TI 5962-85155142A OBSOLETE LCCC FK 20 TBD Call TI Call TI 5962-8515514RA OBSOLETE CDIP J 20 TBD Call TI Call TI 5962-8515514SA OBSOLETE CFP W 20 TBD Call TI Call TI 5962-85155152A ACTIVE LCCC FK 20 1 TBD Call TI Call TI 5962-8515515RA ACTIVE CDIP J 20 1 TBD Call TI Call TI 5962-8515515SA ACTIVE CFP W 20 1 TBD Call TI Call TI 5962-85155162A ACTIVE LCCC FK 20 1 TBD Call TI Call TI 5962-8515516RA ACTIVE CDIP J 20 1 TBD Call TI Call TI 5962-8515516SA ACTIVE CFP W 20 1 TBD Call TI Call TI TIBPAL16L8-10CFN ACTIVE PLCC FN 20 46 Green (RoHS & no Sb/Br) TIBPAL16L8-10CN ACTIVE PDIP N 20 20 Pb-Free (RoHS) CU NIPDAU N / A for Pkg Type TIBPAL16L8-12MFKB ACTIVE LCCC FK 20 1 TBD POST-PLATE N / A for Pkg Type TIBPAL16L8-12MJ ACTIVE CDIP J 20 1 TBD A42 N / A for Pkg Type TIBPAL16L8-12MJB ACTIVE CDIP J 20 1 TBD A42 N / A for Pkg Type TIBPAL16L8-12MWB ACTIVE CFP W 20 1 TBD Call TI N / A for Pkg Type TIBPAL16R4-10CFN NRND PLCC FN 20 46 Green (RoHS & no Sb/Br) CU NIPDAU Level-3-245C-168 HR CU NIPDAU Level-3-245C-168 HR TIBPAL16R4-10CN NRND PDIP N 20 20 Pb-Free (RoHS) CU NIPDAU N / A for Pkg Type TIBPAL16R4-12MFKB ACTIVE LCCC FK 20 1 TBD POST-PLATE N / A for Pkg Type TIBPAL16R4-12MJ ACTIVE CDIP J 20 1 TBD A42 N / A for Pkg Type TIBPAL16R4-12MJB ACTIVE CDIP J 20 1 TBD A42 N / A for Pkg Type TIBPAL16R4-12MWB ACTIVE CFP W 20 1 TBD Call TI N / A for Pkg Type TIBPAL16R6-10CFN NRND PLCC FN 20 46 Green (RoHS & no Sb/Br) CU NIPDAU Level-3-245C-168 HR TIBPAL16R6-10CN NRND PDIP N 20 20 Pb-Free (RoHS) CU NIPDAU N / A for Pkg Type TIBPAL16R6-12MFKB ACTIVE LCCC FK 20 1 TBD POST-PLATE N / A for Pkg Type Addendum-Page 1 (3) PACKAGE OPTION ADDENDUM www.ti.com Orderable Device TIBPAL16R6-12MJB 21-Mar-2012 Status (1) ACTIVE Package Type Package Drawing CDIP Pins Package Qty Eco Plan (2) Lead/ Ball Finish MSL Peak Temp (3) Samples (Requires Login) J 20 1 TBD A42 N / A for Pkg Type 1 TIBPAL16R6-12MWB ACTIVE CFP W 20 TBD Call TI N / A for Pkg Type TIBPAL16R8-10CFN OBSOLETE PLCC FN 20 TBD Call TI Call TI TIBPAL16R8-10CN OBSOLETE PDIP N 20 TBD Call TI Call TI TIBPAL16R8-12MFKB OBSOLETE LCCC FK 20 TBD Call TI Call TI TIBPAL16R8-12MJ OBSOLETE CDIP J 20 TBD Call TI Call TI TIBPAL16R8-12MJB OBSOLETE CDIP J 20 TBD Call TI Call TI TIBPAL16R8-12MWB OBSOLETE CFP W 20 TBD Call TI Call TI (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release. In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis. Addendum-Page 2 MECHANICAL DATA MPLC004A – OCTOBER 1994 FN (S-PQCC-J**) PLASTIC J-LEADED CHIP CARRIER 20 PIN SHOWN Seating Plane 0.004 (0,10) 0.180 (4,57) MAX 0.120 (3,05) 0.090 (2,29) D D1 0.020 (0,51) MIN 3 1 19 0.032 (0,81) 0.026 (0,66) 4 E 18 D2 / E2 E1 D2 / E2 8 14 0.021 (0,53) 0.013 (0,33) 0.007 (0,18) M 0.050 (1,27) 9 13 0.008 (0,20) NOM D/E D2 / E2 D1 / E1 NO. OF PINS ** MIN MAX MIN MAX MIN MAX 20 0.385 (9,78) 0.395 (10,03) 0.350 (8,89) 0.356 (9,04) 0.141 (3,58) 0.169 (4,29) 28 0.485 (12,32) 0.495 (12,57) 0.450 (11,43) 0.456 (11,58) 0.191 (4,85) 0.219 (5,56) 44 0.685 (17,40) 0.695 (17,65) 0.650 (16,51) 0.656 (16,66) 0.291 (7,39) 0.319 (8,10) 52 0.785 (19,94) 0.795 (20,19) 0.750 (19,05) 0.756 (19,20) 0.341 (8,66) 0.369 (9,37) 68 0.985 (25,02) 0.995 (25,27) 0.950 (24,13) 0.958 (24,33) 0.441 (11,20) 0.469 (11,91) 84 1.185 (30,10) 1.195 (30,35) 1.150 (29,21) 1.158 (29,41) 0.541 (13,74) 0.569 (14,45) 4040005 / B 03/95 NOTES: A. All linear dimensions are in inches (millimeters). B. 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