TLC1542I,, TLC1542M,, TLC1542Q
TLC1542C, TLC1543C, TLC1543I, TLC1543Q
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SLAS052G – MARCH 1992 – REVISED JANUARY 2006
10-BIT ANALOG-TO-DIGITAL CONVERTERS
WITH SERIAL CONTROL AND 11 ANALOG INPUTS
•
•
•
•
•
•
•
•
•
10-Bit Resolution A/D Converter
11 Analog Input Channels
Three Built-In Self-Test Modes
Inherent Sample-and-Hold Function
Total Unadjusted Error: ±1LSB Max
On-Chip System Clock
End-of-Conversion (EOC) Output
Terminal Compatible With TLC542
CMOS Technology
DB, DW, J, OR N PACKAGE
(TOP VIEW)
A0
A1
A2
A3
A4
A5
A6
A7
A8
GND
DESCRIPTION
In addition to a high-speed A/D converter and
versatile control capability, these devices have an
on-chip 14-channel multiplexer that can select any
one of 11 analog inputs or any one of three internal
self-test voltages. The sample-and-hold function is
automatic. At the end of A/D conversion, the
end-of-conversion (EOC) output goes high to
indicate that conversion is complete. The converter
incorporated in the devices features differential
high-impedance reference inputs that facilitate
ratiometric conversion, scaling, and isolation of
analog circuitry from logic and supply noise. A
switched-capacitor
design
allows
low-error
conversion over the full operating free-air
temperature range.
20
2
3
19
18
4
5
17
16
6
7
15
14
8
9
13
12
10
11
VCC
EOC
I/O CLOCK
ADDRESS
DATA OUT
CS
REF +
REF −
A10
A9
FK OR FN PACKAGE
(TOP VIEW)
A2
A1
A0
VCC
EOC
The TLC1542C, TLC1542I, TLC1542M, TLC1542Q,
TLC1543C, TLC1543I, and TLC1543Q are CMOS
10-bit switched-capacitor successive-approximation
analog-to-digital converters. These devices have
three inputs and a 3-state output [chip select (CS),
input-output clock (I/O CLOCK), address input
(ADDRESS), and data output (DATA OUT)] that
provide a direct 4-wire interface to the serial port of a
host processor. These devices allow high-speed data
transfers from the host.
1
A3
A4
A5
A6
A7
4
3 2 1 20 19
18
5
6
17
16
7
15
14
9 10 11 12 13
8
I/O CLOCK
ADDRESS
DATA OUT
CS
REF +
A8
GND
A9
A10
REF −
FEATURES
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 1992–2006, Texas Instruments Incorporated
TLC1542I,, TLC1542M,, TLC1542Q
TLC1542C, TLC1543C, TLC1543I, TLC1543Q
www.ti.com
SLAS052G – MARCH 1992 – REVISED JANUARY 2006
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
AVAILABLE OPTIONS
PACKAGE
SMALL
OUTLINE
(DB)
TA
0°C to 70°C
SMALL OUTLINE
(DW)
CHIP CARRIER
(FN)
PLASTIC DIP
(N)
TLC1542CDW
TLC1542CFN
TLC1542CN
TLC1543CDW
TLC1543CFN
TLC1543CN
TLC1542IDW
TLC1542IFN
TLC1542IN
TLC1543IDB
TLC1543IDW
TLC1543IFN
TLC1543IN
TLC1543QDB
TLC1543QDW
TLC1543CDB
-40°C to 85°C
CHIP CARRIER
(FK)
CERAMIC DIP
(J)
TLC1542MFK
TLC1542MJ
TLC1542QFN
-40°C to 125°C
TLC1543QFN
-55°C to 125°C
FUNCTIONAL BLOCK DIAGRAM
REF+
14
REF −
13
1
A0
2
A1
Sample and
Hold
3
4
A2
A3
5
6
7
A4
A5
A6
8
9
11
A7
A8
A9
10
14-Channel
Analog
Multiplexer
4
12
A10
10-Bit
Analog-to-Digital
Converter
(switched capacitors)
Output
Data
Register
Input Address
Register
10
10-to-1 Data
Selector and
Driver
16 DATA
OUT
4
3
System Clock,
Control Logic,
and I/O
Counters
Self-Test
Reference
ADDRESS
I/O CLOCK
19
EOC
17
18
15
CS
TYPICAL EQUIVALENT INPUTS
INPUT CIRCUIT IMPEDANCE DURING SAMPLING MODE
1 kΩ TYP
A0 −A10
Ci = 60 pF TYP
(equivalent input
capacitance)
2
INPUT CIRCUIT IMPEDANCE DURING HOLD MODE
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A0 −A10
5 MΩ TYP
TLC1542I,, TLC1542M,, TLC1542Q
TLC1542C, TLC1543C, TLC1543I, TLC1543Q
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SLAS052G – MARCH 1992 – REVISED JANUARY 2006
TERMINAL FUNCTIONS
TERMINAL
I/O
DESCRIPTION
17
I
Serial address input. A 4-bit serial address selects the desired analog input or test voltage that is to be
converted next. The address data is presented with the MSB first and shifts in on the first four rising
edges of I/O CLOCK. After the four address bits have been read into the address register, this input is
ignored for the remainder of the current conversion period.
1-9, 11, 12
I
Analog signal inputs. The 11 analog inputs are applied to these terminals and are internally
multiplexed. The driving source impedance should be less than or equal to 1 kΩ.
CS
15
I
Chip select. A high-to-low transition on this input resets the internal counters and controls and enables
DATA OUT, ADDRESS, and I/O CLOCK within a maximum of a setup time plus two falling edges of
the internal system clock. A low-to-high transition disables ADDRESS and I/O CLOCK within a setup
time plus two falling edges of the internal system clock.
DATA OUT
16
O
The 3-state serial output for the A/D conversion result. This output is in the high-impedance state
when CS is high and active when CS is low. With a valid chip select, DATA OUT is removed from the
high-impedance state and is driven to the logic level corresponding to the MSB value of the previous
conversion result. The next falling edge of I/O CLOCK drives this output to the logic level
corresponding to the next most significant bit, and the remaining bits shift out in order with the LSB
appearing on the ninth falling edge of I/O CLOCK. On the tenth falling edge of I/O CLOCK, DATA
OUT is driven to a low logic level so that serial interface data transfers of more than ten clocks
produce zeroes as the unused LSBs.
EOC
19
O
End of conversion. This output goes from a high to a low logic level on the trailing edge of the tenth
I/O CLOCK and remains low until the conversion is complete and data are ready for transfer.
GND
10
I
The ground return terminal for the internal circuitry. Unless otherwise noted, all voltage measurements
are with respect to this terminal.
I/O CLOCK
18
I
Input/output clock. This terminal receives the serial I/O CLOCK input and performs the following four
functions: 1) It clocks the four input address bits into the address register on the first four rising edges
of the I/O CLOCK with the multiplex address available after the fourth rising edge. 2) On the fourth
falling edge of I/O CLOCK, the analog input voltage on the selected multiplex input begins charging
the capacitor array and continues to do so until the tenth falling edge of I/O CLOCK. 3) It shifts the
nine remaining bits of the previous conversion data out on DATA OUT. 4) It transfers control of the
conversion to the internal state controller on the falling edge of the tenth clock.
REF+
14
I
The upper reference voltage value (nominally VCC) is applied to this terminal. The maximum input
voltage range is determined by the difference between the voltage applied to this terminal and the
voltage applied to the REF- terminal.
REF-
13
I
The lower reference voltage value (nominally ground) is applied to this terminal.
VCC
20
I
Positive supply voltage
NAME
ADDRESS
A0-A10
NO.
DETAILED DESCRIPTION
With chip select (CS) inactive (high), the ADDRESS and I/O CLOCK inputs are initially disabled and DATA OUT
is in the high-impedance state. When the serial interface takes CS active (low), the conversion sequence begins
with the enabling of I/O CLOCK and ADDRESS and the removal of DATA OUT from the high-impedance state.
The serial interface then provides the 4-bit channel address to ADDRESS and the I/O CLOCK sequence to I/O
CLOCK. During this transfer, the serial interface also receives the previous conversion result from DATA OUT.
I/O CLOCK receives an input sequence that is between 10 and 16 clocks long from the host serial interface. The
first four I/O clocks load the address register with the 4-bit address on ADDRESS, selecting the desired analog
channel, and the next six clocks providing the control timing for sampling the analog input.
There are six basic serial-interface timing modes that can be used with the device. These modes are determined
by the speed of I/O CLOCK and the operation of CS as shown in Table 1. These modes are (1) a fast mode with
a 10-clock transfer and CS inactive (high) between conversion cycles, (2) a fast mode with a 10-clock transfer
and CS active (low) continuously, (3) a fast mode with an 11- to 16-clock transfer and CS inactive (high)
between conversion cycles, (4) a fast mode with a 16-clock transfer and CS active (low) continuously, (5) a slow
mode with an 11- to 16-clock transfer and CS inactive (high) between conversion cycles, and (6) a slow mode
with a 16-clock transfer and CS active (low) continuously.
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The MSB of the previous conversion appears at DATA OUT on the falling edge of CS in mode 1, mode 3, and
mode 5, on the rising edge of EOC in mode 2 and mode 4, and following the sixteenth clock falling edge in
mode 6. The remaining nine bits are shifted out on the next nine falling edges of I/O CLOCK. Ten bits of data
are transmitted to the host-serial interface through DATA OUT. The number of serial clock pulses used also
depends on the mode of operation, but a minimum of ten clock pulses is required for conversion to begin. On
the tenth clock falling edge, the EOC output goes low and returns to the high logic level when conversion is
complete and the result can be read by the host. Also, on the tenth clock falling edge, the internal logic takes
DATA OUT low to ensure that the remaining bit values are zero when the I/O CLOCK transfer is more than ten
clocks long.
Table 1 lists the operational modes with respect to the state of CS, the number of I/O serial transfer clocks that
can be used, and the timing edge on which the MSB of the previous conversion appears at the output.
Table 1. MODE OPERATION
MODES
Fast Modes
Slow Modes
(1)
(2)
(3)
CS
NO. OF 1/O CLOCK
MSB AT DATA OUT (1)
TIMING
DIAGRAM
Mode 1
High between conversion cycles
10
CS falling edge
Figure 9
Mode 2
Low continuously
10
EOC rising edge
Figure 10
Mode 3
High between conversion cycles
11 TO 16 (2)
CS falling edge
Figure 11
Mode 4
Low continuously
16 (2)
EOC rising edge
Figure 12
CS falling edge
Figure 13
16th clock falling edge
Figure 14
Mode 5
High between conversion cycles
Mode 6
Low continuously
11 to
16 (3)
16 (3)
These edges also initiate serial-interface communication.
No more than 16 clocks should be used.
No more than 16 clocks should be used.
FAST MODES
The device is in a fast mode when the serial I/O CLOCK data transfer is completed before the conversion is
completed. With a 10-clock serial transfer, the device can only run in a fast mode since a conversion does not
begin until the falling edge of the tenth I/O CLOCK.
MODE 1: FAST MODE, CS INACTIVE (HIGH) BETWEEN CONVERSION CYCLES, 10-CLOCK TRANSFER
In this mode, CS is inactive (high) between serial I/O CLOCK transfers and each transfer is ten clocks long. The
falling edge of CS begins the sequence by removing DATA OUT from the high-impedance state. The rising edge
of CS ends the sequence by returning DATA OUT to the high-impedance state within the specified delay time.
Also, the rising edge of CS disables the I/O CLOCK and ADDRESS terminals within a setup time plus two falling
edges of the internal system clock.
MODE 2: FAST MODE, CS ACTIVE (LOW) CONTINUOUSLY, 10-CLOCK TRANSFER
In this mode, CS is active (low) between serial I/O CLOCK transfers and each transfer is ten clocks long. After
the initial conversion cycle, CS is held active (low) for subsequent conversions; the rising edge of EOC then
begins each sequence by removing DATA OUT from the low logic level, allowing the MSB of the previous
conversion to appear immediately on this output.
MODE 3: FAST MODE, CS INACTIVE (HIGH) BETWEEN CONVERSION CYCLES, 11- to 16-CLOCK
TRANSFER
In this mode, CS is inactive (high) between serial I/O CLOCK transfers, and each transfer can be 11 to 16 clocks
long. The falling edge of CS begins the sequence by removing DATA OUT from the high-impedance state. The
rising edge of CS ends the sequence by returning DATA OUT to the high-impedance state within the specified
delay time. Also, the rising edge of CS disables the I/O CLOCK and ADDRESS terminals within a setup time
plus two falling edges of the internal system clock.
4
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SLAS052G – MARCH 1992 – REVISED JANUARY 2006
MODE 4: FAST MODE, CS ACTIVE (LOW) CONTINUOUSLY, 16-CLOCK TRANSFER
In this mode, CS is active (low) between serial I/O CLOCK transfers and each transfer must be exactly 16 clocks
long. After the initial conversion cycle, CS is held active (low) for subsequent conversions; the rising edge of
EOC then begins each sequence by removing DATA OUT from the low logic level, allowing the MSB of the
previous conversion to appear immediately on this output.
SLOW MODES
In a slow mode, the conversion is completed before the serial I/O CLOCK data transfer is completed. A slow
mode requires a minimum 11-clock transfer into I/O CLOCK, and the rising edge of the eleventh clock must
occur before the conversion period is complete; otherwise, the device loses synchronization with the host-serial
interface and CS has to be toggled to initialize the system. The eleventh rising edge of the I/O CLOCK must
occur within 9.5 µs after the tenth I/O clock falling edge.
MODE 5: SLOW MODE, CS INACTIVE (HIGH) BETWEEN CONVERSION CYCLES, 11- to 16-CLOCK
TRANSFER
In this mode, CS is inactive (high) between serial I/O CLOCK transfers and each transfer can be 11 to 16 clocks
long. The falling edge of CS begins the sequence by removing DATA OUT from the high-impedance state. The
rising edge of CS ends the sequence by returning DATA OUT to the high-impedance state within the specified
delay time. Also, the rising edge of CS disables the I/O CLOCK and ADDRESS terminals within a setup time
plus two falling edges of the internal system clock.
MODE 6: SLOW MODE, CS ACTIVE (LOW) CONTINUOUSLY, 16-CLOCK TRANSFER
In this mode, CS is active (low) between serial I/O CLOCK transfers and each transfer must be exactly 16 clocks
long. After the initial conversion cycle, CS is held active (low) for subsequent conversions. The falling edge of
the sixteenth I/O CLOCK then begins each sequence by removing DATA OUT from the low state, allowing the
MSB of the previous conversion to appear immediately at DATA OUT. The device is then ready for the next
16-clock transfer initiated by the serial interface.
ADDRESS BITS
The 4-bit analog channel-select address for the next conversion cycle is presented to the ADDRESS terminal
(MSB first) and is clocked into the address register on the first four leading edges of I/O CLOCK. This address
selects one of 14 inputs (11 analog inputs or three internal test inputs).
ANALOG INPUTS AND TEST MODES
The 11 analog inputs and the three internal test inputs are selected by the 14-channel multiplexer according to
the input address as shown in Tables 2 and 3. The input multiplexer is a break-before-make type to reduce
input-to-input noise injection resulting from channel switching.
Sampling of the analog input starts on the falling edge of the fourth I/O CLOCK, and sampling continues for six
I/O CLOCK periods. The sample is held on the falling edge of the tenth I/O CLOCK. The three test inputs are
applied to the multiplexer, sampled, and converted in the same manner as the external analog inputs.
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SLAS052G – MARCH 1992 – REVISED JANUARY 2006
Table 2. ANALOG-CHANNEL-SELECT ADDRESS
ANALOG INPUT SELECTED
VALUE SHIFTED INTO ADDRESS
INPUT
BINARY
HEX
A0
0000
0
A1
0001
1
A2
0010
2
A3
0011
3
A4
0100
4
A5
0101
5
A6
0110
6
A7
0111
7
A8
1000
8
A9
1001
9
A10
1010
A
Table 3. TEST-MODE-SELECT ADDRESS
INTERNAL SELF-TEST
VOLTAGE SELECTED (1)
OUTPUT RESULT (HEX) (2)
BINARY
HEX
1011
B
Vref-
1100
C
000
Vref+
1101
D
3FF
Vref+ − Vref−
2
(1)
(2)
VALUE SHIFTED INTO
ADDRESS INPUT
200
Vref+ is the voltage applied to the REF+ input, and Vref- is the voltage applied to the REF- input.
The output results shown are the ideal values and vary with the reference stability and with internal
offsets.
CONVERTER AND ANALOG INPUT
The CMOS threshold detector in the successive-approximation conversion system determines each bit by
examining the charge on a series of binary-weighted capacitors (see Figure 1). In the first phase of the
conversion process, the analog input is sampled by closing the SC switch and all ST switches simultaneously.
This action charges all the capacitors to the input voltage.
In the next phase of the conversion process, all ST and SC switches are opened and the threshold detector
begins identifying bits by identifying the charge (voltage) on each capacitor relative to the reference (REF-)
voltage. In the switching sequence, ten capacitors are examined separately until all ten bits are identified and
then the charge-convert sequence is repeated. In the first step of the conversion phase, the threshold detector
looks at the first capacitor (weight = 512). Node 512 of this capacitor is switched to the REF+ voltage, and the
equivalent nodes of all the other capacitors on the ladder are switched to REF-. If the voltage at the summing
node is greater than the trip point of the threshold detector (approximately one-half VCC), a 0 bit is placed in the
output register and the 512-weight capacitor is switched to REF-. If the voltage at the summing node is less than
the trip point of the threshold detector, a 1 bit is placed in the register and the 512-weight capacitor remains
connected to REF+ through the remainder of the successive-approximation process. The process is repeated for
the 256-weight capacitor, the 128-weight capacitor, and so forth down the line until all bits are counted.
With each step of the successive-approximation process, the initial charge is redistributed among the capacitors.
The conversion process relies on charge redistribution to count and weigh the bits from MSB to LSB.
6
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SC
Threshold
Detector
512
Node 512
REF −
256
128
REF+
REF+
REF −
ST
16
REF+
REF −
ST
8
REF+
REF −
ST
4
REF −
ST
REF+
REF −
ST
2
1
REF+
REF+
REF −
ST
REF −
ST
To Output
Latches
1
REF −
ST
ST
VI
Figure 1. Simplified Model of the Successive-Approximation System
CHIP-SELECT OPERATION
The trailing edge of CS starts all modes of operation, and CS can abort a conversion sequence in any mode. A
high-to-low transition on CS within the specified time during an ongoing cycle aborts the cycle, and the device
returns to the initial state (the contents of the output data register remain at the previous conversion result).
Exercise care to prevent CS from being taken low close to completion of conversion because the output data
can be corrupted.
REFERENCE VOLTAGE INPUTS
There are two reference inputs used with the device: REF+ and REF-. These voltage values establish the upper
and lower limits of the analog input to produce a full-scale and zero reading respectively. The values of REF+,
REF-, and the analog input should not exceed the positive supply or be lower than GND consistent with the
specified absolute maximum ratings. The digital output is at full scale when the input signal is equal to or higher
than REF+ and at zero when the input signal is equal to or lower than REF-.
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SLAS052G – MARCH 1992 – REVISED JANUARY 2006
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted) (1)
UNIT
VCC, see
(2)
Supply voltage range
-0.5 V to 6.5 V
VI
Input voltage range
-0.3 V to VCC + 0.3 V
VO
Output voltage range
-0.3 V to VCC + 0.3 V
Vref+
Positive reference voltage
VCC + 0.1 V
Vref-
Negative reference voltage
-0.1 V
±20 mA
Peak input current (any input)
±30 mA
Peak total input current (all inputs)
TLC1542C, TLC1543C
TA
Operating free-air temperature range
Tstg
Storage temperature range,
0°C to 70°C
TLC1542I, TLC1543I
-40°C to 85°C
TLC1542Q, TLC1543Q
-40°C to 125°C
TLC1542M
-55°C to 125°C
-65°C to 150°C
Lead temperature 1,6 mm (1/16 inch) from the case for 10 seconds
(1)
(2)
260°C
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltage values are with respect to digital ground with REF- and GND wired together (unless otherwise noted).
RECOMMENDED OPERATING CONDITIONS
MIN
VCC
Supply voltage
Vref+, see (1)
Positive reference voltage
Vref-, see
(1)
4.5
(1)
2.5
(1)
0
VIH
High-level control input voltage
VCC = 4.5 V to 5.5 V
VIL
Low-level control input voltage
VCC = 4.5 V to 5.5 V
tsu(A), see Figure 4
Setup time, address bits at data input before I/O
CLOCK↑
th(A), see Figure 4
th(CS), see Figure 5
tsu(CS), see
Figure 5
(2)
and
5.5
VCC
UNIT
V
V
V
VCC+0.
2
V
VCC
V
2
V
0.8
V
100
ns
Hold time, address bits after I/O CLOCK↑
0
ns
Hold time, CS low after last I/O CLOCK↓
0
ns
1.425
µs
Setup time, CS low before clocking in first
address bit
Clock frequency at I/O CLOCK, see
(3)
0
2.1
MHz
twH(I/O)
Pulse duration, I/O CLOCK high,
190
ns
twL(I/O)
Pulse duration, I/O CLOCK low,
190
ns
tt(I/O), see
Figure 6
tt(CS)
(1)
(2)
(3)
(4)
8
5
0
Differential reference voltage
Analog input voltage ,see
MAX
VCC
Negative reference voltage
Vref+-Vref-, see
NOM
(4)
and
Transition time, I/O CLOCK,
Transition time, ADDRESS and CS,
1
µs
10
µs
Analog input voltages greater than that applied to REF+ convert as all ones (1111111111), while input voltages less than that applied to
REF- convert as all zeros (0000000000). The device is functional with reference voltages down to 1 V (Vref+ - Vref-); however, the
electrical specifications are no longer applicable.
To minimize errors caused by noise at CS, the internal circuitry waits for a setup time plus two falling edges of the internal system clock
after CS↓ before responding to control input signals. Therefore, no attempt should be made to clock in an address until the minimum CS
setup time has elapsed.
For 11- to 16-bit transfers, after the tenth I/O CLOCK falling edge (≤ 2 V) at least 1 I/O CLOCK rising edge (≥ 2 V) must occur within 9.5
µs.
This is the time required for the clock input signal to fall from VIHmin to VILmax or to rise from VILmax to VIHmin. In the vicinity of normal
room temperature, the devices function with input clock transition time as slow as 1 µs for remote data-acquisition applications where
the sensor and the A/D converter are placed several feet away from the controlling microprocessor.
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RECOMMENDED OPERATING CONDITIONS (continued)
MIN
TLC1542C, TLC1543C
TA
Operating free-air temperature,
NOM
MAX
0
UNIT
70
TLC1542I, TLC1543I
-40
85
TLC1542Q, TLC1543Q
-40
125
TLC1542M
-55
125
°C
ELECTRICAL CHARACTERISTICS
over recommended operating free-air temperature range, VCC = Vref+ = 4.5 V to 5.5 V, I/O CLOCK frequency = 2.1 MHz
(unless otherwise noted)
PARAMETER
MIN TYP (1)
TEST CONDITIONS
MAX
VCC = 4.5 V,
IOH = -1.6 mA
VCC = 4.5 V to 5.5 V,
IOH = -20 µA
VCC = 4.5 V,
IOL = 1.6 mA
0.4
VCC = 4.5 V to 5.5 V,
IOL = 20 µA
0.1
Off-state
(high-impedance-state)
output current
VO = VCC,
CS at VCC
10
VO = 0,
CS at VCC
-10
IIH
High-level input current
VI = VCC
0.005
2.5
IIL
Low-level input current
VI = 0
0.005
-2.5
µA
ICC
Operating supply current
CS at 0 V
0.8
2.5
mA
Selected channel leakage
current TLC1542/TLC1543
C, I, or Q
Selected channel at VCC,
Unselected channel at 0 V
1
Selected channel at 0 V,
Unselected channel at VCC
-1
Selected channel at VCC,
TA= 25°C
Unselected channel at 0 V,
1
Selected channel at 0 V,
TA = 25°C
Unselected channel at VCC,
-1
Selected channel at VCC,
Unselected channel at 0 V
2.5
Selected channel at 0 V,
Unselected channel at VCC
-2.5
Vref+ = VCC,
Vref- = GND
VOH
High-level output voltage
VOL
Low-level output voltage
IOZ
Selected channel leakage
current TLC1542M
Maximum static analog
reference current into REF+
Ci
(1)
Input
capacitance
2.4
UNIT
V
VCC-0.1
10
Analog
inputs
7
Control
inputs
5
V
µA
µA
µA
µA
µA
pF
All typical values are at VCC = 5 V, TA = 25°C.
OPERATING CHARACTERISTICS
over recommended operating free-air temperature range, VCC = Vref+ = 4.5 V to 5.5 V, I/O CLOCK frequency = 2.1 MHz
(unless otherwise noted)
TEST
CONDITIONS
EL
(1)
(2)
Linearity error, see
(2))
MIN
TYP
(1)
MAX
UNIT
TLC1542C, I, or Q
±0.5
LSB
TLC1543C, I, or Q
±1
LSB
TLC1542M
±1
LSB
All typical values are at TA = 25°C.
Linearity error is the maximum deviation from the best straight line through the A/D transfer characteristics.
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SLAS052G – MARCH 1992 – REVISED JANUARY 2006
OPERATING CHARACTERISTICS (continued)
over recommended operating free-air temperature range, VCC = Vref+ = 4.5 V to 5.5 V, I/O CLOCK frequency = 2.1 MHz
(unless otherwise noted)
TEST
CONDITIONS
EZS
Zero-scale error, see
EFS
Full-scale error, see
(3)
Total unadjusted error, see
(5)
TYP
(1)
MAX
UNIT
See
(4)
±1
LSB
TLC1543C, I, or Q
See
(4)
±1
LSB
TLC1542M
See
(4)
±1
LSB
TLC1542C, I, or Q
See
(4)
±1
LSB
TLC1543C, I, or Q
See
(4)
±1
LSB
TLC1542M
See
(4)
±1
LSB
TLC1542C, I, or Q
±1
LSB
TLC1543C, I, or Q
±1
LSB
TLC1542M
±1
LSB
21
µs
TLC1542C, I, or Q
(3)
MIN
ADDRESS = 1011
Self-test output code, see Table 3 and
(6)
512
ADDRESS = 1100
0
ADDRESS = 1101
1023
tconv
Conversion time
See timing
diagrams
tc
Total cycle time (access, sample, and conversion)
See timing
diagrams and
(7)
tacq
Channel acquisition time (sample)
See timing
diagrams and
(7)
tv
Valid time, DATA OUT remains valid after I/O CLOCK↓
See Figure 6
td(I/O-DATA)
Delay time, I/O CLOCK↓ to DATA OUT valid
See Figure 6
td(I/O-EOC)
Delay time, tenth I/O CLOCK↓ to EOC↓
See Figure 7
td(EOC-DATA)
Delay time, EOC↑ to DATA OUT (MSB)
See Figure 8
100
ns
tPZH, tPZL
Enable time, CS↓ to DATA OUT (MSB driven)
See Figure 3
1.3
µs
tPHZ, tPLZ
Disable time, CS↑ to DATA OUT (high impedance)
See Figure 3
150
ns
tr(EOC)
Rise time, EOC
See Figure 8
300
ns
tf(EOC)
Fall time, EOC
See Figure 7
300
ns
tr(DATA)
Rise time, data bus
See Figure 6
300
ns
tf(DATA)
Fall time, data bus
See Figure 6
300
ns
td(I/O-CS)
Delay time, tenth I/O CLOCK↓ to CS↓ to abort
conversion (see Note (8))
9
µs
(3)
(4)
(5)
(6)
(7)
(8)
10
21
+10 I/O
CLOCK
periods
6
10
µs
I/O CLOCK
periods
ns
70
240
ns
240
ns
Zero-scale error is the difference between 0000000000 and the converted output for zero input voltage; full-scale error is the difference
between 1111111111 and the converted output for full-scale input voltage.
Analog input voltages greater than that applied to REF+ convert as all ones (1111111111), while input voltages less than that applied to
REF- convert as all zeros (0000000000). The device is functional with reference voltages down to 1 V (Vref+-Vref-); however, the
electrical specifications are no longer applicable.
Total unadjusted error comprises linearity, zero-scale, and full-scale errors.
Both the input address and the output codes are expressed in positive logic.
I/O CLOCK period = 1/(I/O CLOCK frequency) (see Figure 6)
Any transitions of CS are recognized as valid only if the level is maintained for a setup time plus two falling edges of the internal clock
(1.425 µs) after the transition.
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SLAS052G – MARCH 1992 – REVISED JANUARY 2006
PARAMETER MEASUREMENT INFORMATION
VCC
Test Point
VCC
Test Point
RL = 2.18 kΩ
RL = 2.18 kΩ
DATA OUT
EOC
12 kΩ
CL = 50 pF
12 kΩ
CL = 100 pF
Figure 2. Load Circuits
2V
CS
0.8 V
tPZH, tPZL
DATA
OUT
tPHZ, tPLZ
2.4 V
90%
0.4 V
10%
Figure 3. DATA OUT Enable and Disable Voltage Waveforms
Address
Valid
2V
0.8 V
ADDRESS
th(A)
tsu(A)
I/O CLOCK
0.8 V
Figure 4. ADDRESS Setup and Hold Time Voltage Waveforms
2V
CS
0.8 V
tsu(CS)
th(CS)
I/O CLOCK
0.8 V
First
Clock
Last
Clock
0.8 V
Figure 5. I/O CLOCK Setup and Hold Time Voltage Waveforms
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SLAS052G – MARCH 1992 – REVISED JANUARY 2006
PARAMETER MEASUREMENT INFORMATION (continued)
tt(I/O)
tt(I/O)
I/O CLOCK
2V
2V
0.8 V
0.8 V
0.8 V
I/O CLOCK Period
td(I/O-DATA)
tv
DATA OUT
2.4 V
2.4 V
0.4 V
0.4 V
tr(DATA), tf(DATA)
Figure 6. I/O CLOCK and DATA OUT Voltage Waveforms
I/O CLOCK
10th
Clock
0.8 V
td(I/O-EOC)
2.4 V
0.4 V
EOC
tf(EOC)
Figure 7. I/O CLOCK and EOC Voltage Waveforms
tr(EOC)
2.4 V
EOC
0.4 V
td(EOC-DATA)
DATA OUT
2.4 V
0.4 V
Valid MSB
Figure 8. EOC and DATA OUT Voltage Waveforms
12
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SLAS052G – MARCH 1992 – REVISED JANUARY 2006
PARAMETER MEASUREMENT INFORMATION (continued)
TIMING DIAGRAMS
CS
(see Note A)
I/O
CLOCK
1
2
3
4
5
6
Access Cycle B
A9
A8
A7
A6
B3
MSB
9
A5
B2
B1
10
1
Hi-Z State
A4
A3
A2
A1
Previous Conversion Data
MSB
ADDRESS
8
Sample Cycle B
ÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎÎ
ÎÎÎÎÎÎÎÎÎÎÎ
DATA
OUT
7
ÎÎÎÎÎÎ
ÎÎÎÎÎÎ
ÎÎÎÎÎÎ
ÎÎÎÎÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎ
A0
LSB
B0
LSB
B9
C3
EOC
Shift in New Multiplexer Address;
Simultaneously Shift Out Previous
Conversion Value
A/D Conversion
Interval
Initialize
A.
Initialize
To minimize errors caused by noise at CS, the internal circuitry waits for a setup time plus two falling edges of the
internal system clock after CS↓ before responding to control input signals. Therefore, no attempt should be made to
clock in an address until the minimum CS setup time has elapsed.
Figure 9. Timing for 10-Clock Transfer Using CS
Must be High on Power Up
CS
(see Note A)
I/O
CLOCK
1
2
3
4
5
6
Access Cycle B
A9
A8
A7
8
A6
A5
A4
A3
A2
Previous Conversion Data
MSB
9
10
A1
A0
LSB
ADDRESS
B3
MSB
B2
B1
1
Sample Cycle B
ÎÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎÎÎÎÎÎÎÎÎÎ
DATA
OUT
7
B0
LSB
Low Level
ÎÎÎ
ÎÎ
ÎÎÎ
ÎÎ
ÎÎÎ
ÎÎ
ÎÎÎÎÎ
B9
C3
EOC
Shift in New Multiplexer Address;
Simultaneously Shift Out Previous
Conversion Value
Initialize
A.
A/D Conversion
Interval
Initialize
To minimize errors caused by noise at CS, the internal circuitry waits for a setup time plus two falling edges of the
internal system clock after CS↓ before responding to control input signals. Therefore, no attempt should be made to
clock in an address until the minimum CS setup time has elapsed.
Figure 10. Timing for 10-Clock Transfer Not Using CS
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SLAS052G – MARCH 1992 – REVISED JANUARY 2006
ÏÏÏ
ÏÏÏ
ÏÏÏ
ÎÎÎ
ÏÏÏ
ÎÎÎ
ÎÎÎ
ÎÎÎ
ÎÎÎ
ÎÎÎ
ÎÎÎÎÎÎ
ÎÎ
ÎÎÎ
ÎÎ
ÎÎÎ
ÎÎ
ÎÎÎÎÎ
PARAMETER MEASUREMENT INFORMATION (continued)
See Note B
CS
(see Note A)
I/O
CLOCK
1
2
3
4
5
6
Access Cycle B
DATA
OUT
A8
A7
B3
MSB
A6
A5
A4
A3
A2
Previous Conversion Data
MSB
ADDRESS
8
B2
B1
9
11
10
Sample Cycle B
ÎÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎÎ
ÎÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎÎ
ÎÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎÎ
ÎÎÎÎÎÎÎÎÎ
ÎÎÎ
A9
7
A1
A0
Low
Level
LSB
B0
LSB
16
1
Hi-Z
B9
C3
EOC
Shift in New Multiplexer Address;
Simultaneously Shift Out Previous
Conversion Value
Initialize
A/D Conversion
Interval
To minimize errors caused by noise at CS, the internal circuitry waits for a setup time plus two falling edges of the
internal system clock after CS↓ before responding to control input signals. Therefore, no attempt should be made to
clock in an address until the minimum CS setup time has elapsed.
B.
A low-to-high transition of CS disables ADDRESS and the I/O CLOCK within a maximum of a setup time plus two
falling edges of the internal system clock.
Figure 11. Timing for 11- to 16-Clock Transfer Using
CS (Serial Transfer Interval Shorter Than Conversion)
14
Initialize
A.
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SLAS052G – MARCH 1992 – REVISED JANUARY 2006
PARAMETER MEASUREMENT INFORMATION (continued)
Must Be High on Power Up
CS
(see Note A)
I/O
CLOCK
1
2
3
4
5
6
Access Cycle B
DATA
OUT
A8
A7
B3
MSB
9
B2
B1
10
14
15
A6
A5
A4
A3
A2
1
16
See Note B
A1
Previous Conversion Data
MSB
ADDRESS
8
Sample Cycle B
ÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎÎ
ÎÎ
ÎÎÎÎ
ÎÎÎÎ
ÎÎÎÎ
ÎÎÎÎÎ
ÎÎÎ
A9
7
Low Level
A0
LSB
B0
LSB
ÎÎÎ
ÎÎ
ÎÎÎ
ÎÎ
ÎÎÎ
ÎÎÎÎÎ
ÎÎ
B9
C3
EOC
Shift in New Multiplexer Address;
Simultaneously Shift Out Previous
Conversion Value
A/D Conversion
Interval
Initialize
Initialize
A.
To minimize errors caused by noise at CS, the internal circuitry waits for a setup time plus two falling edges of the
internal system clock after CS↓ before responding to control input signals. Therefore, no attempt should be made to
clock in an address until the minimum CS setup time has elapsed.
B.
The first I/O CLOCK must occur after the rising edge of EOC.
Figure 12. Timing for 16-Clock Transfer Not Using
CS (Serial Transfer Interval Shorter Than Conversion)
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SLAS052G – MARCH 1992 – REVISED JANUARY 2006
ÏÏÏ
ÏÏÏ
ÏÏÏ
ÎÎ
ÏÏÏ
ÎÎ
ÎÎ
ÎÎ
ÎÎÎ
ÎÎÎ
ÎÎÎÎÎÎ
Î
ÎÎÎ
Î
ÎÎÎ
Î
ÏÏÏ
ÎÎÎ
Î
ÏÏÏ
ÏÏÏ
ÏÏÏ
PARAMETER MEASUREMENT INFORMATION (continued)
CS
(see Note A)
I/O
CLOCK
1
2
3
4
5
6
Access Cycle B
A9
A8
A7
8
A6
A5
A4
A3
A2
Previous Conversion Data
MSB
ADDRESS
B3
MSB
B2
B1
9
10
B0
LSB
EOC
Shift in New Multiplexer Address;
Simultaneously Shift Out Previous
Conversion Value
Initialize
11
A1
A0
LSB
Low
Level
Hi-Z State
B9
C3
A/D Conversion
Interval
Initialize
A.
To minimize errors caused by noise at CS, the internal circuitry waits for a setup time plus two falling edges of the
internal system clock after CS↓ before responding to control input signals. Therefore, no attempt should be made to
clock in an address until the minimum CS setup time has elapsed.
B.
The 11th rising edge of the I/O CLOCK sequence must occur before the conversion is complete to prevent losing
serial interface synchronization.
Figure 13. Timing for 11- to 16-Clock Transfer Using
CS (Serial Transfer Interval Longer Than Conversion)
16
1
16
See Note B
Sample Cycle B
ÎÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎÎÎÎÎÎÎÎÎÎ
DATA
OUT
7
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SLAS052G – MARCH 1992 – REVISED JANUARY 2006
PARAMETER MEASUREMENT INFORMATION (continued)
Must be High on Power Up
CS
(see Note A)
I/O
CLOCK
1
2
3
4
5
6
Access Cycle B
A9
A8
A7
8
9
A6
A5
A4
A3
A2
14
15
See Note B
A1
Previous Conversion Data
MSB
10
Sample Cycle B
ÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎ
ÎÎÎ
ÎÎ
ÎÎÎÎ
ÎÎÎÎ
ÎÎÎÎ
ÎÎÎÎÎ
ÎÎÎ
DATA
OUT
7
A0
Low Level
LSB
ADDRESS
B3
MSB
B2
B1
B0
LSB
1
16
See Note C
ÎÎÎ
ÎÎ
ÎÎÎ
ÎÎ
ÎÎÎ
ÎÎÎÎÎ
ÎÎ
B9
C3
EOC
Shift in New Multiplexer Address;
Simultaneously Shift Out Previous
Conversion Value
Initialize
A/D Conversion
Interval
A.
A. To minimize errors caused by noise at CS, the internal circuitry waits for a setup time plus two falling edges of the
internal system clock after CS↓ before responding to control input signals. Therefore, no attempt should be made to
clock in an address until the minimum CS setup time has elapsed.
B.
The 11th rising edge of the I/O CLOCK sequence must occur before the conversion is complete to prevent losing
serial interface synchronization.
C.
C. The I/O CLOCK sequence is exactly 16 clock pulses long.
Figure 14. Timing for 16-Clock Transfer Not Using
CS (Serial Transfer Interval Longer Than Conversion)
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SLAS052G – MARCH 1992 – REVISED JANUARY 2006
APPLICATION INFORMATION
1023
1111111111
See Notes A and B
1111111110
1022
1111111101
1021
VFT = VFS − 1/2 LSB
513
1000000001
512
1000000000
VZT =VZS + 1/2 LSB
511
0111111111
VZS
0000000001
1
0000000000
0
0.0096
0.0048
2.4528
2.4576
2.4624
4.9056
4.9080
2
0.0024
0000000010
4.9104
0
4.9152
VI − Analog Input Voltage − V
A.
This curve is based on the assumption that Vref+ and Vref- have been adjusted so that the voltage at the transition
from digital 0 to 1 (VZT) is 0.0024 V and the transition to full scale (VFT) is 4.908 V. 1 LSB = 4.8 mV.
B.
The full-scale value (VFS) is the step whose nominal midstep value has the highest absolute value. The zero-scale
value (VZS) is the step whose nominal midstep value equals zero.
Figure 15. Ideal Conversion Characteristics
TLC1542/43
1
2
3
4
5
Analog
Inputs
6
7
8
9
11
12
15
A0
CS
A1
I/O CLOCK
ADDRESS
A2
18
17
Processor
A3
A4
DATA OUT
A5
EOC
16
19
A6
A7
14
A8
REF+
A9
REF−
13
5-V DC Regulator
A10
GND
10
To Source
Ground
Figure 16. Serial Interface
18
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Control
Circuit
Step
Digital Output Code
VFS
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SLAS052G – MARCH 1992 – REVISED JANUARY 2006
APPLICATION INFORMATION (continued)
SIMPLIFIED ANALOG INPUT ANALYSIS
Using the equivalent circuit in Figure 17Figure 17, the time required to charge the analog input capacitance from
0 to VS within 1/2 LSB can be derived as follows:
The capacitance charging voltage is given by
−t c /RtCi
VC = VS 1−e
(
)
where
Rt = Rs + ri
(1)
The final voltage to 1/2 LSB is given by
VC (1/2 LSB) = VS − (VS /2048)
(2)
Equating equation 1 to equation 2 and solving for time tc gives
−t c /RtCi
VS −(VS/2048) = VS 1−e
(
)
and
tc (1/2 LSB) = Rt × Ci × ln(2048)
(3)
Therefore, with the values given the time for the analog input signal to settle is
tc (1/2 LSB) = (Rs + 1 kΩ) × 60 pF × ln(2048)
(4)
This time must be less than the converter sample time shown in the timing diagrams.
Driving Source†
TLC1542/3
Rs
VI
ri
VS
VC
1 kΩ MAX
Ci
50 pF MAX
VI = Input Voltage at A0 −A10
VS = External Driving Source Voltage
Rs = Source Resistance
ri = Input Resistance
Ci = Equivalent Input Capacitance
†
Driving source requirements:
• Noise and distortion for the source must be equivalent to the
resolution of the converter.
• Rs must be real at the input frequency.
Figure 17. Equivalent Input Circuit Including the Driving Source
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PACKAGE OPTION ADDENDUM
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PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
Samples
(4/5)
(6)
TLC1542CDW
ACTIVE
SOIC
DW
20
25
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
TLC1542C
Samples
TLC1542CDWR
ACTIVE
SOIC
DW
20
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
TLC1542C
Samples
TLC1542CFN
ACTIVE
PLCC
FN
20
46
RoHS & Green
SN
Level-1-260C-UNLIM
TLC1542C
Samples
TLC1542CN
ACTIVE
PDIP
N
20
20
RoHS &
Non-Green
NIPDAU
N / A for Pkg Type
TLC1542CN
Samples
TLC1542IDW
ACTIVE
SOIC
DW
20
25
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
TLC1542I
Samples
TLC1542IDWR
ACTIVE
SOIC
DW
20
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
TLC1542I
Samples
TLC1542IN
ACTIVE
PDIP
N
20
20
RoHS &
Non-Green
NIPDAU
N / A for Pkg Type
TLC1542IN
Samples
TLC1543CDB
ACTIVE
SSOP
DB
20
70
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
P1543
Samples
TLC1543CDBR
ACTIVE
SSOP
DB
20
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
P1543
Samples
TLC1543CDBRG4
ACTIVE
SSOP
DB
20
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
P1543
Samples
TLC1543CDW
ACTIVE
SOIC
DW
20
25
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
TLC1543C
Samples
TLC1543CDWG4
ACTIVE
SOIC
DW
20
25
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
TLC1543C
Samples
TLC1543CDWR
ACTIVE
SOIC
DW
20
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
TLC1543C
Samples
TLC1543CDWRG4
ACTIVE
SOIC
DW
20
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
TLC1543C
Samples
TLC1543CFN
ACTIVE
PLCC
FN
20
46
RoHS & Green
SN
Level-1-260C-UNLIM
TLC1543C
Samples
TLC1543CFNR
ACTIVE
PLCC
FN
20
1000
RoHS & Green
SN
Level-1-260C-UNLIM
TLC1543C
Samples
TLC1543CN
ACTIVE
PDIP
N
20
20
RoHS &
Non-Green
NIPDAU
N / A for Pkg Type
TLC1543CN
Samples
TLC1543IDB
ACTIVE
SSOP
DB
20
70
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
Y1543
Samples
TLC1543IDBR
ACTIVE
SSOP
DB
20
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
Y1543
Samples
Addendum-Page 1
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PACKAGE OPTION ADDENDUM
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Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
Samples
(4/5)
(6)
TLC1543IDBRG4
ACTIVE
SSOP
DB
20
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
Y1543
Samples
TLC1543IDW
ACTIVE
SOIC
DW
20
25
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
TLC1543I
Samples
TLC1543IDWR
ACTIVE
SOIC
DW
20
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
TLC1543I
Samples
TLC1543IFN
ACTIVE
PLCC
FN
20
46
RoHS & Green
SN
Level-1-260C-UNLIM
TLC1543I
Samples
TLC1543IN
ACTIVE
PDIP
N
20
20
RoHS &
Non-Green
NIPDAU
N / A for Pkg Type
TLC1543IN
Samples
TLC1543INE4
ACTIVE
PDIP
N
20
20
RoHS &
Non-Green
NIPDAU
N / A for Pkg Type
TLC1543IN
Samples
TLC1543QDB
ACTIVE
SSOP
DB
20
70
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
1543Q
Samples
TLC1543QDBG4
ACTIVE
SSOP
DB
20
70
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
1543Q
Samples
TLC1543QDBR
ACTIVE
SSOP
DB
20
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
1543Q
Samples
TLC1543QDW
ACTIVE
SOIC
DW
20
25
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
TLC1543Q
Samples
TLC1543QDWG4
ACTIVE
SOIC
DW
20
25
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
TLC1543Q
Samples
TLC1543QDWR
ACTIVE
SOIC
DW
20
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
TLC1543Q
Samples
TLC1543QDWRG4
ACTIVE
SOIC
DW
20
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
TLC1543Q
Samples
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
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