SLOS019E − SEPTEMBER 1988 − REVISED FEBRUARY 2005
D Extremely Low Offset Voltage . . . 1 µV Max
D Extremely Low Change on Offset Voltage
D008, JG, OR P PACKAGE
(TOP VIEW)
With Temperature . . . 0.003 µV/°C Typ
CXA
IN −
IN +
VDD −
D Low Input Offset Current
D
D
D
D
D
D
500 pA Max at TA = − 55°C to 125°C
AVD . . . 135 dB Min
CMRR . . . 120 dB Min
kSVR . . . 110 dB Min
Single-Supply Operation
Common-Mode Input Voltage Range
Includes the Negative Rail
No Noise Degradation With External
Capacitors Connected to VDD −
1
8
2
7
3
6
4
5
CXB
VDD +
OUT
CLAMP
D014, J, OR N PACKAGE
(TOP VIEW)
CXB
CXA
NC
IN −
IN +
NC
VDD −
description
1
14
2
13
3
12
4
11
5
10
6
9
INT/EXT
CLK IN
CLK OUT
VDD +
OUT
CLAMP
C RETURN
8
The TLC2652 and TLC2652A are high-precision
chopper-stabilized operational amplifiers using
FK PACKAGE
Texas Instruments Advanced LinCMOS pro(TOP VIEW)
cess. This process, in conjunction with unique
chopper-stabilization circuitry, produces operational amplifiers whose performance matches or
exceeds that of similar devices available today.
Chopper-stabilization techniques make possible
3 2 1 20 19
NC
18 CLK OUT
4
extremely high dc precision by continuously
NC
17 NC
5
nulling input offset voltage even during variations
IN − 6
16 VDD +
in temperature, time, common-mode voltage, and
15 NC
NC
7
power supply voltage. In addition, low-frequency
14 OUT
8
IN +
noise voltage is significantly reduced. This high
9 10 11 12 13
precision, coupled with the extremely high input
impedance of the CMOS input stage, makes the
TLC2652 and TLC2652A an ideal choice for
low-level signal processing applications such as
strain gauges, thermocouples, and other
transducer amplifiers. For applications that
NC − No internal connection
require extremely low noise and higher usable
bandwidth, use the TLC2654 or TLC2654A
device, which has a chopping frequency of
10 kHz.
The TLC2652 and TLC2652A input common-mode range includes the negative rail, thereby providing superior
performance in either single-supply or split-supply applications, even at power supply voltage levels as low as
± 1.9 V.
Two external capacitors are required for operation of the device; however, the on-chip chopper-control circuitry
is transparent to the user. On devices in the 14-pin and 20-pin packages, the control circuitry is made accessible
to allow the user the option of controlling the clock frequency with an external frequency source. In addition, the
clock threshold level of the TLC2652 and TLC2652A requires no level shifting when used in the single-supply
configuration with a normal CMOS or TTL clock input.
NC
VDD−
NC
C RETURN
CLAMP
V XA
V XB
NC
INT/EXT
CLK IN
7
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Advanced LinCMOS is a trademark of Texas Instruments.
Copyright 1988−2005, Texas Instruments Incorporated
!"#$ %"
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POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
1
SLOS019E − SEPTEMBER 1988 − REVISED FEBRUARY 2005
description (continued)
Innovative circuit techniques are used on the TLC2652 and TLC2652A to allow exceptionally fast overload
recovery time. If desired, an output clamp pin is available to reduce the recovery time even further.
The device inputs and output are designed to withstand ± 100-mA surge currents without sustaining latch-up.
Additionally the TLC2652 and TLC2652A incorporate internal ESD-protection circuits that prevent functional
failures at voltages up to 2000 V as tested under MIL-STD-883C, Method 3015.2; however, care should be
exercised in handling these devices, as exposure to ESD may result in degradation of the device parametric
performance.
The C-suffix devices are characterized for operation from 0°C to 70°C. The I-suffix devices are characterized
for operation from − 40°C to 85°C. The Q-suffix devices are characterized for operation from − 40°C to125°C.
The M-suffix devices are characterized for operation over the full military temperature range of −55°C to125°C.
AVAILABLE OPTIONS(1)
PACKAGED DEVICES
TA
VIOmax
AT 25°C
0°C
0
C
to
70 C
70°C
8 PIN
14 PIN
20 PIN
CHIP
FORM
(Y)
SMALL
OUTLINE
(D008)
CERAMIC
DIP
(JG)
PLASTIC
DIP
(P)
SMALL
OUTLINE
(D014)
CERAMIC
DIP
(J)
PLASTIC
DIP
(N)
CHIP
CARRIER
(FK)
1 µV
3 µV
TLC2652AC-8D
TLC2652C-8D
—
—
TLC2652ACP
TLC2652CP
TLC2652AC-14D
TLC2652C - 14D
—
—
TLC2652ACN
TLC2652CN
—
—
TLC2652Y
40°C
− 40
C
to
85 C
85°C
1 µV
3 µV
TLC2652AI-8D
TLC2652A-8D
—
—
TLC2652AIP
TLC2652IP
TLC2652AI-14D
TLC2652I-14D
—
—
TLC2652AIN
TLC2652IN
—
—
—
40°C
− 40
C
to
125 C
125°C
3.5 µV
TLC2652Q-8D
—
—
—
—
—
—
—
− 55°C
to
125°C
3 µV
3.5 µV
TLC2652AM-8D
TLC2652M-8D
TLC2652AMJG
TLC2652MJG
TLC2652AMP
TLC2652MP
TLC2652AM-14D
TLC2652M-14D
TLC2652AMJ
TLC2652MJ
TLC2652AMN
TLC2652MN
TLC2652AMFK
TLC2652MFK
—
The D008 and D014 packages are available taped and reeled. Add R suffix to the device type (e.g., TLC2652AC-8DR). Chips are tested at 25°C.
NOTE (1): For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
functional block diagram
DISTRIBUTION OF TLC2652
INPUT OFFSET VOLTAGE
VDD +
7
36
IN +
IN −
3
6
+
−
2
B
B
Main
CIC A
B
CompensationBiasing
Circuit
OUT
A
+
−
A
Null
CXA
CXB
150 Units Tested From 1 Wafer Lot
32 VDD ± = ± 5 V
TA = 25°C
28 N Package
CLAMP
External Components
Percentage of Units − %
5
Clamp
Circuit
24
20
16
12
8
4
4
VDD −
8
0
C RETURN
−3
Pin numbers shown are for the D (14 pin), JG, and N packages.
2
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
−2
−1
0
1
2
VIO − Input Offset Voltage − µV
3
SLOS019E − SEPTEMBER 1988 − REVISED FEBRUARY 2005
TLC2652Y chip information
This chip, when properly assembled, displays characteristics similar to the TLC2652C. Thermal compression
or ultrasonic bonding may be used on the doped-aluminum bonding pads. Chips may be mounted with
conductive epoxy or a gold-silicon preform.
BONDING PAD ASSIGNMENTS
(13)
(12)
(11)
(10)
(9)
(14)
(8)
CHIP THICKNESS: 15 TYPICAL
BONDING PADS: 4 × 4 MINIMUM
TJmax = 150°C
TOLERANCES ARE ± 10%.
80
ALL DIMENSIONS ARE IN MILS.
(1)
PIN (7) IS INTERNALLY CONNECTED
TO BACK SIDE OF CHIP.
FOR THE PINOUT, SEE THE FUNCTIONAL
BLOCK DIAGRAM.
(2)
(4)
(5)
(7)
90
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
3
SLOS019E − SEPTEMBER 1988 − REVISED FEBRUARY 2005
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)‡
Supply voltage VDD + (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 V
Supply voltage VDD − (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −8 V
Differential input voltage, VID (see Note 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 16 V
Input voltage, VI (any input, see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 8 V
Voltage range on CLK IN and INT/EXT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VDD − to VDD − + 5.2 V
Input current, II (each input) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 5 mA
Output current, IO . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 50 mA
Duration of short-circuit current at (or below) 25°C (see Note 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . unlimited
Current into CLK IN and INT/EXT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 5 mA
Continuous total dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . See Dissipation Rating Table
Operating free-air temperature range, TA: C suffix . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C
I suffix . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −40°C to 85°C
Q suffix . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −40°C to 125°C
M suffix . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −55°C to 125°C
Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −65 °C to 150 °C
Case temperature for 60 seconds: FK package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260°C
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds: D, N, or P package . . . . . . . . . . . . . 260 °C
Lead temperature 1,6 mm (1/16 inch) from case for 60 seconds: J or JG package . . . . . . . . . . . . . . . . 300°C
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. All voltage values, except differential voltages, are with respect to the midpoint between VDD + and VDD − .
2. Differential voltages are at IN+ with respect to IN −.
3. The output may be shorted to either supply. Temperature and/or supply voltages must be limited to ensure that the maximum
dissipation rating is not exceeded.
DISSIPATION RATING TABLE
PACKAGE
TA ≤ 25°C
25 C
POWER RATING
DERATING FACTOR
ABOVE TA = 25°C
TA = 70
70°C
C
POWER RATING
TA = 85
85°C
C
POWER RATING
TA = 125
125°C
C
POWER RATING
D008
725 mV
5.8 mW/°C
464 mW
377 mW
145 mW
D014
950 mV
7.6 mW/°C
608 mW
494 mW
190 mW
FK
1375 mV
11.0 mW/°C
880 mW
715 mW
275 mW
J
1375 mV
11.0 mW/°C
880 mW
715 mW
275 mW
JG
1050 mV
8.4 mW/°C
672 mW
546 mW
210 mW
N
1575 mV
12.6 mW/°C
1008 mW
819 mW
315 mW
P
1000 mV
8.0 mW/°C
640 mW
520 mW
200 mW
recommended operating conditions
C SUFFIX
Supply voltage, VDD ±
Common-mode input voltage, VIC
Clock input voltage
Operating free-air temperature, TA
4
I SUFFIX
Q SUFFIX
M SUFFIX
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
± 1.9
±8
± 1.9
±8
± 1.9
±8
± 1.9
±8
VDD −
VDD −
0
VDD + − 1.9
VDD − + 5
70
VDD −
VDD −
−40
POST OFFICE BOX 655303
VDD + − 1.9 VDD −
VDD − + 5 VDD −
85
−40
• DALLAS, TEXAS 75265
VDD + − 1.9 VDD −
VDD − + 5 VDD −
125
−55
UNIT
V
VDD + − 1.9
VDD − + 5
V
125
°C
V
SLOS019E − SEPTEMBER 1988 − REVISED FEBRUARY 2005
electrical characteristics at specified free-air temperature, VDD ± = ±5 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
TA†
TLC2652C
MIN
25°C
VIO
Input offset voltage
αVIO
Temperature coefficient of
input offset voltage
Input offset voltage long-term
drift (see Note 4)
TYP
0.6
Full range
VIC = 0,
RS = 50 Ω
IIO
Input offset current
IIB
Input bias current
VICR
Common-mode input voltage
range
RS = 50 Ω
VOM +
Maximum positive peak
output voltage swing
RL = 10 kΩ
kΩ,
See Note 5
VOM −
Maximum negative peak
output voltage swing
RL = 10 kΩ
kΩ,
See Note 5
AVD
Large-signal differential
voltage amplification
VO = ± 4 V,
RL = 10 kΩ
fch
Internal chopping frequency
TLC2652AC
MAX
MIN
3
TYP
0.5
4.35
MAX
1
2.35
UNIT
µV
V
Full range
0.003
0.03
0.003
0.03
µV/°C
V/°C
25°C
0.003
0.06
0.003
0.02
µV/mo
25°C
2
60
2
Full range
100
25°C
4
Full range
60
4
100
Full range
−5
to
3.1
25°C
4.7
Full range
4.7
25°C
−4.7
Full range
−4.7
25°C
120
Full range
120
25°C
60
100
60
100
−5
to
3.1
4.8
4.7
−4.7
4.8
V
−4.9
V
−4.7
150
135
150
dB
130
450
450
25°C
25
25
25
25
Hz
A
µA
Clamp on-state current
RL = 100 kΩ
Full range
25°C
100
100
Clamp off-state current
VO = − 4 V to 4 V
Full range
100
100
Common-mode rejection
ratio
VO = 0, VIC = VICRmin,
RS = 50 Ω
25°C
120
CMRR
Full range
120
Supply-voltage rejection ratio
(∆VDD ± /∆VIO)
VDD ± = ± 1.9 V to ± 8 V,
VO = 0,
RS = 50 Ω
25°C
110
kSVR
Full range
110
IDD
Supply current
25°C
Full range
140
120
110
dB
135
dB
110
1.5
2.4
2.5
pA
140
120
135
pA
V
4.7
−4.9
pA
1.5
2.4
2.5
mA
† Full range is 0° to 70°C.
NOTES: 4. Typical values are based on the input offset voltage shift observed through 168 hours of operating life test at TA = 150°C extrapolated
at TA = 25° using the Arrhenius equation and assuming an activation energy of 0.96 eV.
5. Output clamp is not connected.
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
5
SLOS019E − SEPTEMBER 1988 − REVISED FEBRUARY 2005
operating characteristics specified free-air temperature, VDD± = ±5 V
PARAMETER
TEST
CONDITIONS
TA†
25°C
TLC2652C
MIN
TYP
2
2.8
TLC2652AC
MAX
MIN
TYP
2
2.8
MAX
SR +
Positive slew rate at unity gain
SR −
Negative slew rate at unity gain
VO = ± 2.3 V,
RL = 10 kΩ,
CL = 100 pF
Equivalent input noise voltage
(see Note 6)
f = 10 Hz
25°C
94
94
140
Vn
f = 1 kHz
25°C
23
23
35
Peak-to-peak equivalent input
noise voltage
f = 0 to 1 Hz
25°C
0.8
0.8
VN(PP)
f = 0 to 10 Hz
25°C
2.8
2.8
In
Equivalent input noise current
f = 10 kHz
25°C
0.004
0.004
25°C
25
C
1.9
1.9
25°C
48°
48°
Gain-bandwidth product
φm
Phase margin at unity gain
Full range
1.5
25°C
2.3
Full range
1.8
f = 10 kHz,
RL = 10 kΩ,
CL = 100 pF
RL = 10 kΩ,
CL = 100 pF
V/ s
V/µs
1.5
3.1
2.3
UNIT
3.1
V/ s
V/µs
1.8
nV/√Hz
µV
V
fA/√Hz
MHz
† Full range is 0° to 70°C.
NOTE 6: This parameter is tested on a sample basis for the TLC2652A. For other test requirements, please contact the factory. This statement
has no bearing on testing or nontesting of other parameters.
6
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
SLOS019E − SEPTEMBER 1988 − REVISED FEBRUARY 2005
electrical characteristics at specified free-air temperature, VDD ± = ±5 V (unless otherwise noted)
PARAMETER
TA†
TEST CONDITIONS
TLC2652I
MIN
TYP
25°C
VIO
Input offset voltage
αVIO
Temperature coefficient of
input offset voltage
Input offset voltage
long-term drift (see Note 4)
0.6
Full range
IIO
Input offset current
IIB
Input bias current
VICR
Common-mode input
voltage range
RS = 50 Ω
VOM +
Maximum positive peak
output voltage swing
kΩ
RL = 10 kΩ,
See Note 5
VOM −
Maximum negative peak
output voltage swing
kΩ
RL = 10 kΩ,
See Note 5
AVD
Large-signal differential
voltage amplification
VO = ± 4 V,
RL = 10 kΩ
MIN
3
TYP
0.5
4.95
MAX
1
2.95
µV
V
0.003
0.03
0.003
0.03
µV/°C
V/°C
25°C
0.003
0.06
0.003
0.02
µV/mo
25°C
2
60
2
Full range
150
25°C
4
Full range
−5
to
3.1
25°C
4.7
Full range
4.7
25°C
−4.7
Full range
−4.7
25°C
120
Full range
120
25°C
60
150
60
4
150
Full range
Internal chopping frequency
150
−5
to
3.1
4.8
4.7
−4.7
4.8
V
−4.9
V
−4.7
150
135
150
dB
125
450
450
25°C
25
25
25
25
Hz
A
µA
RL = 100 kΩ
Full range
25°C
100
100
Clamp off-state current
VO = − 4 V to 4 V
Full range
100
100
Common-mode rejection
ratio
VO = 0, VIC = VICRmin,
RS = 50 Ω
25°C
120
CMRR
Full range
120
Supply-voltage rejection
ratio (∆VDD ± /∆VIO)
VDD ± = ± 1.9 V to ± 8 V,
VO = 0,
RS = 50 Ω
25°C
110
kSVR
Full range
110
IDD
Supply current
VO = 0,
25°C
Full range
140
120
110
dB
135
dB
110
1.5
2.4
2.5
pA
140
120
135
pA
V
4.7
−4.9
pA
60
Clamp on-state current
No load
UNIT
Full range
RS = 50 Ω
VIC = 0,
TLC2652AI
MAX
1.5
2.4
2.5
mA
† Full range is − 40° to 85°C.
NOTES: 4. Typical values are based on the input offset voltage shift observed through 168 hours of operating life test at TA = 150°C extrapolated
at TA = 25° using the Arrhenius equation and assuming an activation energy of 0.96 eV.
5. Output clamp is not connected.
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
7
SLOS019E − SEPTEMBER 1988 − REVISED FEBRUARY 2005
operating characteristics at specified free-air temperature, VDD ± = ±5 V
PARAMETER
TEST
CONDITIONS
TA†
25°C
TLC2652I
MIN
TYP
2
2.8
TLC2652AI
MAX
MIN
TYP
2
2.8
MAX
SR +
Positive slew rate at unity gain
SR −
Negative slew rate at unity gain
VO = ± 2.3 V,
RL = 10 kΩ,
CL = 100 pF
Equivalent input noise voltage
(see Note 6)
f = 10 Hz
25°C
94
94
140
Vn
f = 1 kHz
25°C
23
23
35
Peak-to-peak equivalent input
noise voltage
f = 0 to 1 Hz
25°C
0.8
0.8
VN(PP)
f = 0 to 10 Hz
25°C
2.8
2.8
In
Equivalent input noise current
f = 1 kHz
25°C
0.004
0.004
25°C
25
C
1.9
1.9
25°C
48°
48°
Gain-bandwidth product
φm
Phase margin at unity gain
Full range
1.4
25°C
2.3
Full range
1.7
f = 10 kHz,
RL = 10 kΩ,
CL = 100 pF
RL = 10 kΩ,
CL = 100 pF
V/ s
V/µs
1.4
3.1
2.3
UNIT
3.1
V/ s
V/µs
1.7
nV/√Hz
µV
V
pA/√Hz
MHz
† Full range is − 40° to 85°C.
NOTE 6: This parameter is tested on a sample basis for the TLC2652A. For other test requirements, please contact the factory. This statement
has no bearing on testing or nontesting of other parameters.
8
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
SLOS019E − SEPTEMBER 1988 − REVISED FEBRUARY 2005
electrical characteristics at specified free-air temperature, VDD ± = ±5 V (unless otherwise noted)
PARAMETER
TA†
TEST CONDITIONS
TLC2652Q
TLC2652M
MIN
VIO
Input offset voltage
(see Note 7)
αVIO
Temperature coefficient of
input offset voltage
Input offset voltage
long-term drift (see Note 4)
25°C
TYP
MAX
0.6
3.5
Full range
IIO
Input offset current
IIB
Input bias current
VICR
Common-mode input
voltage range
RS = 50 Ω
VOM +
Maximum positive peak
output voltage swing
kΩ
RL = 10 kΩ,
See Note 5
VOM −
Maximum negative peak
output voltage swing
kΩ
RL = 10 kΩ,
See Note 5
AVD
Large-signal differential
voltage amplification
VO = ± 4 V,
RL = 10 kΩ
fch
Internal chopping frequency
MIN
UNIT
TYP
MAX
0.5
3
10
8
0.003
0.03∗
0.003
0.03∗
V/°C
µV/°C
25°C
0.003
0.06∗
0.003
0.02∗
µV/mo
25°C
2
60
2
60
Full range
500
25°C
4
Full range
500
60
4
500
Full range
−5
to
3.1
25°C
4.7
Full range
4.7
25°C
−4.7
Full range
−4.7
25°C
120
Full range
120
25°C
−5
to
3.1
4.8
4.7
−4.7
4.8
V
−4.9
V
−4.7
150
135
150
dB
120
450
450
25°C
25
25
25
25
Hz
µA
A
VO = − 5 V to 5 V
Full range
25°C
100
100
Clamp off-state current
RL = 100 kΩ
Full range
500
500
Common-mode rejection
ratio
VO = 0, VIC = VICRmin,
RS = 50 Ω
25°C
120
CMRR
Full range
120
Supply-voltage rejection
ratio (∆VDD ± /∆VIO)
VDD ± = ± 1.9 V to ± 8 V,
VO = 0,
RS = 50 Ω
25°C
110
kSVR
Full range
110
IDD
Supply current
VO = 0,
25°C
Full range
140
120
110
dB
135
dB
110
1.5
2.4
2.5
pA
140
120
135
pA
V
4.7
−4.9
pA
60
500
Clamp on-state current
No load
µV
V
Full range
RS = 50 Ω
VIC = 0,
TLC2652AM
1.5
2.4
2.5
mA
∗ On products compliant to MIL-PRF-38535, this parameter is not production tested.
† Full range is − 40° to 125°C for Q suffix, − 55° to 125°C for M suffix.
NOTES: 4. Typical values are based on the input offset voltage shift observed through 168 hours of operating life test at TA = 150°C extrapolated
at TA = 25° using the Arrhenius equation and assuming an activation energy of 0.96 eV.
5. Output clamp is not connected.
7. This parameter is not production tested. Thermocouple effects preclude measurement of the actual VIO of these devices in high
speed automated testing. VIO is measured to a limit determined by the test equipment capability at the temperature extremes. The
test ensures that the stabilization circuitry is performing properly.
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
9
SLOS019E − SEPTEMBER 1988 − REVISED FEBRUARY 2005
operating characteristics at specified free-air temperature, VDD ± = ±5 V
PARAMETER
TEST CONDITIONS
TA†
25°C
SR +
Positive slew rate at unity gain
SR −
Negative slew rate at unity gain
Vn
Equivalent input noise voltage
VN(PP)
Peak-to-peak equivalent input noise voltage
In
φm
VO = ± 2.3 V,
RL = 10 kΩ,
CL = 100 pF
MIN
TYP
2
2.8
Full range
1.3
25°C
2.3
Full range
1.6
V/ s
V/µs
25°C
94
25°C
23
f = 0 to 1 Hz
25°C
0.8
f = 0 to 10 Hz
25°C
2.8
Equivalent input noise current
f = 1 kHz
25°C
0.004
Gain-bandwidth product
f = 10 kHz,
RL = 10 kΩ,
CL = 100 pF
25°C
1.9
Phase margin at unity gain
RL = 10 kΩ,
CL = 100 pF
25°C
48°
• DALLAS, TEXAS 75265
MAX
3.1
f = 1 kHz
POST OFFICE BOX 655303
UNIT
V/ s
V/µs
f = 10 Hz
† Full range is − 40° to 125°C for the Q suffix, − 55° to 125°C for the M suffix.
10
TLC2652Q
TLC2652M
TLC2652AM
nV/√Hz
µV
V
pA/√Hz
MHz
SLOS019E − SEPTEMBER 1988 − REVISED FEBRUARY 2005
electrical characteristics at VDD± = ±5 V, TA = 25°C (unless otherwise noted)
PARAMETER
VIO
TEST CONDITIONS
TLC2652Y
MIN
Input offset voltage
Input offset voltage long-term drift (see Note 4)
VIC = 0,
RS = 50 Ω
UNIT
TYP
MAX
0.6
3
0.003
0.006
2
60
pA
4
60
pA
µV
µV/mo
IIO
IIB
Input offset current
VICR
Common-mode input voltage range
RS = 50 Ω
VOM +
VOM −
Maximum positive peak output voltage swing
RL = 10 kΩ,
See Note 5
4.7
4.8
Maximum negative peak output voltage swing
RL = 10 kΩ,
See Note 5
−4.7
−4.9
V
AVD
fch
Large-signal differential voltage amplification
VO = ± 4 V,
RL = 10 kΩ
120
150
dB
Input bias current
−5
to
3.1
Internal chopping frequency
V
V
450
Clamp on-state current
RL = 100 kΩ
Clamp off-state current
VO = − 4 V to 4 V
VO = 0,
VIC = VICRmin,
RS = 50 Ω
CMRR
Common-mode rejection ratio
kSVR
Supply-voltage rejection ratio (∆VDD ± /∆VIO)
Hz
µA
25
VDD ± = ± 1.9 V to ± 8 V,
RS = 50 Ω
VO = 0,
VO = 0,
No load
100
pA
120
140
dB
110
135
dB
IDD
Supply current
1.5
2.4
mA
NOTES: 4. Typical values are based on the input offset voltage shift observed through 168 hours of operating life test at TA = 150°C extrapolated
at TA = 25° using the Arrhenius equation and assuming an activation energy of 0.96 eV.
5. Output clamp is not connected.
operating characteristics at VDD± = ±5 V, TA = 25°C
PARAMETER
SR +
Positive slew rate at unity gain
SR −
Negative slew rate at unity gain
TEST CONDITIONS
VO = ± 2.3 V,
CL = 100 pF
RL = 10 kΩ,
TLC2652Y
TYP
2
2.8
V/µs
2.3
3.1
V/µs
f = 10 Hz
94
f = 1 kHz
23
f = 0 to 1 Hz
0.8
f = 0 to 10 Hz
2.8
Vn
Equivalent input noise voltage
VN(PP)
Peak-to-peak equivalent input noise voltage
In
Equivalent input noise current
f = 1 kHz
Gain-bandwidth product
f = 10 kHz,
CL = 100 pF
RL = 10 kΩ,
1.9
Phase margin at unity gain
RL = 10 kΩ,
CL = 100 pF
48°
φm
POST OFFICE BOX 655303
MAX
UNIT
MIN
nV/√Hz
µV
V
pA/√Hz
• DALLAS, TEXAS 75265
MHz
11
SLOS019E − SEPTEMBER 1988 − REVISED FEBRUARY 2005
TYPICAL CHARACTERISTICS
Table of Graphs
FIGURE
VIO
Normalized input offset voltage
vs Chopping frequency
1
IIB
Input bias current
vs Common-mode input voltage
vs Chopping frequency
vs Free-air temperature
2
3
4
IIO
Input offset current
vs Chopping frequency
vs Free-air temperature
5
6
Clamp current
vs Output voltage
7
Maximum peak-to-peak output voltage
vs Frequency
VOM
Maximum peak output voltage
vs Output current
vs Free-air temperature
9, 10
11, 12
AVD
Large-signal differential voltage amplification
vs Frequency
vs Free-air temperature
13
14
Chopping frequency
vs Supply voltage
vs Free-air temperature
15
16
IDD
Supply current
vs Supply voltage
vs Free-air temperature
17
18
IOS
Short-circuit output current
vs Supply voltage
vs Free-air temperature
19
20
SR
Slew rate
vs Supply voltage
vs Free-air temperature
21
22
Voltage-follower pulse response
Small-signal
Large-signal
23
24
Peak-to-peak equivalent input noise voltage
vs Chopping frequency
Equivalent input noise voltage
vs Frequency
27
Gain-bandwidth product
vs Supply voltage
vs Free-air temperature
28
29
Phase margin
vs Supply voltage
vs Free-air temperature
vs Load capacitance
30
31
32
Phase shift
vs Frequency
13
V(OPP)
VN(PP)
Vn
φm
12
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
8
25, 26
SLOS019E − SEPTEMBER 1988 − REVISED FEBRUARY 2005
TYPICAL CHARACTERISTICS†
NORMALIZED INPUT OFFSET VOLTAGE
vs
CHOPPING FREQUENCY
INPUT BIAS CURRENT
vs
COMMON-MODE INPUT VOLTAGE
70
IIB
I IB − Input Bias Current − pA
60
VIO
uV
VIO − Normalized Input Offset − µ
V
25
VDD ± = ± 5 V
VIC = 0
TA = 25°C
50
40
30
20
10
VDD ± = ± 5 V
TA = 25°C
20
15
10
5
0
−10
100
1k
10 k
Chopping Frequency − Hz
0
−5
100 k
−4
−3
−2
1
2
3
4
5
Figure 2
INPUT BIAS CURRENT
vs
FREE-AIR TEMPERATURE
INPUT BIAS CURRENT
vs
CHOPPING FREQUENCY
100
70
VDD ± = ± 5 V
VIC = 0
TA = 25°C
IIB
I IB − Input Bias Current − pA
IIB
I IB − Input Bias Current − pA
0
VIC − Common-Mode Input Voltage − V
Figure 1
60
−1
50
40
30
20
VDD ± = ± 5 V
VO = 0
VIC = 0
10
10
0
100
1k
10 k
100 k
1
25
45
65
85
105
125
TA − Free-Air Temperature − °C
Chopping Frequency − Hz
Figure 4
Figure 3
† Data at high and low temperatures are applicable only within the rated operating free-air temperature ranges of the various devices.
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
13
SLOS019E − SEPTEMBER 1988 − REVISED FEBRUARY 2005
TYPICAL CHARACTERISTICS†
INPUT OFFSET CURRENT
vs
CHOPPING FREQUENCY
INPUT OFFSET CURRENT
vs
FREE-AIR TEMPERATURE
10
VDD ± = ± 5 V
VIC = 0
VDD ± = ± 5 V
VIC = 0
TA = 25°C
20
IIIO
IO − Input Offset Current − pA
IIIO
IO − Input Offset Current − pA
25
15
10
5
8
6
4
2
0
0
100
1k
10 k
105
45
65
85
TA − Free-Air Temperature − °C
25
100 k
Chopping Frequency − Hz
Figure 5
Figure 6
MAXIMUM PEAK-TO-PEAK OUTPUT
VOLTAGE
vs
FREQUENCY
VO(PP)
V O(PP)− Maximum Peak-to-Peak Output Voltage − V
CLAMP CURRENT
vs
OUTPUT VOLTAGE
100 µA
VDD ± = ± 5 V
TA = 25°C
10 µA
|Clamp Current|
1 µA
Positive Clamp Current
100 nA
10 nA
1 nA
100 pA
Negative Clamp Current
10 pA
1 pA
4
4.2
4.4
4.6
4.8
5
10
8
TA = − 55°C
6
TA = 125°C
4
2
VDD ± = ± 5 V
RL = 10 kΩ
0
100
1k
10 k
f − Frequency − Hz
|VO| − Output Voltage − V
Figure 7
Figure 8
† Data at high and low temperatures are applicable only within the rated operating free-air temperature ranges of the various devices.
14
125
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
1M
SLOS019E − SEPTEMBER 1988 − REVISED FEBRUARY 2005
TYPICAL CHARACTERISTICS†
MAXIMUM PEAK OUTPUT VOLTAGE
vs
OUTPUT CURRENT
MAXIMUM PEAK OUTPUT VOLTAGE
vs
OUTPUT CURRENT
7.5
VDD ± = ± 5 V
TA = 25°C
4.8
VOM +
VDD ± = ± 7.5 V
TA = 25°C
|VOM|
|VOM − Maximum Peak Output Voltage − V
|VOM|
|VOM − Maximum Peak Output Voltage − V
5
VOM −
4.6
4.4
4.2
7.3
7.1
6.9
4
6.7
0
0.4
0.8
1.2
1.6
2
0
0.4
|IO| − Output Current − mA
0.8
1.2
1.6
2
|IO| − Output Current − mA
Figure 9
Figure 10
MAXIMUM PEAK OUTPUT VOLTAGE
vs
FREE-AIR TEMPERATURE
MAXIMUM PEAK OUTPUT VOLTAGE
vs
FREE-AIR TEMPERATURE
5
8
VOM
VOM − Maximum Peak Output Voltage − V
VOM
VOM − Maximum Peak Output Voltage − V
VOM −
VOM +
2.5
VDD ± = ± 5 V
RL = 10 kΩ
0
−2.5
−5
4
VDD ± = ± 7.5 V
RL = 10 kΩ
0
−4
−8
−75 −50 −25
0
25
50
75
100
125
TA − Free-Air Temperature − °C
−75 −50 −25
0
25
50
75 100
TA − Free-Air Temperature − °C
125
Figure 12
Figure 11
† Data at high and low temperatures are applicable only within the rated operating free-air temperature ranges of the various devices.
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
15
SLOS019E − SEPTEMBER 1988 − REVISED FEBRUARY 2005
TYPICAL CHARACTERISTICS†
LARGE-SIGNAL DIFFERENTIAL VOLTAGE
AMPLIFICATION AND PHASE SHIFT
vs
FREQUENCY
120
60°
ÁÁ
ÁÁ
ÁÁ
Phase Shift
80°
80
100°
AVD
60
120°
40
140°
20
160°
0
−20
−40
10
180°
VDD ± = ± 5 V
RL = 10 kΩ
CL = 100 pF
TA = 25°C
100
Phase Shift
AVD
AVD− Large-Signal Differential
Voltage Amplification − dB
100
200°
1k
10 k
100 k
1M
220°
10 M
f − Frequency − Hz
Figure 13
LARGE-SIGNAL DIFFERENTIAL VOLTAGE
AMPLIFICATION
vs
FREE-AIR TEMPERATURE
AVD
AVD− Large-Signal Differential
Voltage Amplification − dB
155
ÁÁ
ÁÁ
ÁÁ
VDD ± = ± 7.5 V
RL = 10 kΩ
VO = ± 4 V
150
145
140
135
−75
−50 −25
0
25
50
75
100
125
TA − Free-Air Temperature − °C
Figure 14
† Data at high and low temperatures are applicable only within the rated operating free-air temperature ranges of the various devices.
16
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
SLOS019E − SEPTEMBER 1988 − REVISED FEBRUARY 2005
TYPICAL CHARACTERISTICS†
CHOPPING FREQUENCY
vs
FREE-AIR TEMPERATURE
CHOPPING FREQUENCY
vs
SUPPLY VOLTAGE
460
540
VDD ± = ± 5 V
TA = 25°C
450
Chopping Frequency − kHz
Chopping Frequency − kHz
520
500
480
460
440
430
420
410
440
400
−75
420
0
1
6
2
3
4
5
|VDD ±| − Supply Voltage − V
7
8
75
100
0
25
50
−50 −25
TA − Free-Air Temperature − °C
Figure 15
Figure 16
SUPPLY CURRENT
vs
SUPPLY VOLTAGE
SUPPLY CURRENT
vs
FREE-AIR TEMPERATURE
2
2
VO = 0
No Load
VDD ± = ± 7.5 V
IIDD
DD − Supply Current − mA
1.6
IIDD
DD − Supply Current − mA
125
TA = 25°C
1.2
TA = − 55°C
0.8
TA = 125°C
1.6
VDD ± = ± 5 V
1.2
VDD ± = ± 2.5 V
0.8
0.4
0.4
VO = 0
No Load
0
0
1
2
3
4
5
6
7
8
0
−75 −50 −25
0
25
50
75
100
125
TA − Free-Air Temperature − °C
|VDD ±| − Supply Voltage − V
Figure 18
Figure 17
† Data at high and low temperatures are applicable only within the rated operating free-air temperature ranges of the various devices.
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
17
SLOS019E − SEPTEMBER 1988 − REVISED FEBRUARY 2005
TYPICAL CHARACTERISTICS†
SHORT-CIRCUIT OUTPUT CURRENT
vs
SUPPLY VOLTAGE
SHORT-CIRCUIT OUTPUT CURRENT
vs
FREE-AIR TEMPERATURE
15
VO = 0
TA = 25°C
IOS
I OS − Short-Circuit Output Current − mA
IOS
I OS − Short-Circuit Output Current − mA
12
8
4
VID = − 100 mV
0
−4
−8
VID = 100 mV
−12
0
1
6
2
3
4
5
|VDD ±| − Supply Voltage − V
7
10
5
VID = − 100 mV
0
−5
VID = 100 mV
−10
−15
−75
8
VDD ± = ± 5 V
VO = 0
75
100
0
25
50
−50 −25
TA − Free-Air Temperature − °C
Figure 19
Figure 20
SLEW RATE
vs
FREE-AIR TEMPERATURE
SLEW RATE
vs
SUPPLY VOLTAGE
4
4
SR −
SR −
VDD ± = ± 5 V
RL = 10 kΩ
CL = 100 pF
3
SR − Slew Rate − V?us
V/ µ s
3
SR − Slew Rate − V?us
V/ µ s
125
SR +
2
1
SR +
2
1
RL = 10 kΩ
CL = 100 pF
TA = 25°C
0
0
1
6
2
3
4
5
|VDD ±| − Supply Voltage − V
7
8
0
75 100
−75 −50 −25
0
25
50
TA − Free-Air Temperature − °C
Figure 21
Figure 22
† Data at high and low temperatures are applicable only within the rated operating free-air temperature ranges of the various devices.
18
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
125
SLOS019E − SEPTEMBER 1988 − REVISED FEBRUARY 2005
TYPICAL CHARACTERISTICS
VOLTAGE-FOLLOWER
LARGE-SIGNAL
PULSE RESPONSE
100
4
75
3
50
2
VO
VO − Output Voltage − V
VO
VO − Output Voltage − mV
VOLTAGE-FOLLOWER
SMALL-SIGNAL
PULSE RESPONSE
VDD ± = ± 5 V
RL = 10 kΩ
CL = 100 pF
TA = 25°C
25
0
−25
−50
VDD ± = ± 5 V
RL = 10 kΩ
CL = 100 pF
TA = 25°C
1
0
−1
−2
−3
−75
−100
0
1
2
3
4
5
6
−4
7
0
Figure 23
VN(PP) − Peak-to-Peak Input Noise Voltage − µV
VN(PP)
uV
VN(PP)
VN(PP) − Peak-to-Peak Input Noise Voltage −uV
µV
VDD ± = ± 5 V
RS = 20 Ω
f = 0 to 1 Hz
TA = 25°C
1.6
1.4
1.2
1
0.8
0.6
0.4
0.2
0
4
15
20
25
30
35
40
PEAK-TO-PEAK INPUT NOISE VOLTAGE
vs
CHOPPING FREQUENCY
1.8
2
10
Figure 24
PEAK-TO-PEAK INPUT NOISE VOLTAGE
vs
CHOPPING FREQUENCY
0
5
t − Time − µs
t − Time − µs
6
8
10
fch − Chopping Frequency − kHz
5
VDD ± = ± 5 V
RS = 20 Ω
f = 0 to 10 Hz
TA = 25°C
4
3
2
1
0
0
8
2
4
6
fch − Chopping Frequency − kHz
10
Figure 26
Figure 25
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
19
SLOS019E − SEPTEMBER 1988 − REVISED FEBRUARY 2005
TYPICAL CHARACTERISTICS†
GAIN-BANDWIDTH PRODUCT
vs
SUPPLY VOLTAGE
100
2.1
80
Gain-Bandwidth Product − MHz
V
Vn
nV/HzHz
n − Equivalent Input Noise Voltage − nV/
EQUIVALENT INPUT NOISE VOLTAGE
vs
FREQUENCY
60
40
20
VDD ± = ± 5 V
RS = 20 Ω
TA = 25°C
0
1
10
100
RL = 10 kΩ
CL = 100 pF
TA = 25°C
2
1.9
1.8
1k
0
1
f − Frequency − Hz
2
3
Figure 27
6
7
8
7
8
PHASE MARGIN
vs
SUPPLY VOLTAGE
50°
2.6
VDD ± = ± 5 V
RL = 10 kΩ
CL = 100 pF
2.4
RL = 10 kΩ
CL = 100 pF
TA = 25°C
48°
om
φ m − Phase Margin
Gain-Bandwidth Product − MHz
5
Figure 28
GAIN-BANDWIDTH PRODUCT
vs
FREE-AIR TEMPERATURE
2.2
2
1.8
46°
44°
42°
1.4
1.2
−75
4
|VCC ±| − Supply Voltage − V
40°
−50 −25
0
25
50
75
100
125
0
1
TA − Free-Air Temperature − °C
2
3
4
5
6
|VCC ±| − Supply Voltage − V
Figure 29
Figure 30
† Data at high and low temperatures are applicable only within the rated operating free-air temperature ranges of the various devices.
20
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
SLOS019E − SEPTEMBER 1988 − REVISED FEBRUARY 2005
TYPICAL CHARACTERISTICS†
PHASE MARGIN
vs
LOAD CAPACITANCE
PHASE MARGIN
vs
FREE-AIR TEMPERATURE
50°
60°
50°
om
φ m − Phase Margin
om
φ m − Phase Margin
48°
46°
44°
42°
VDD ± = ± 5 V
RL = 10 kΩ
TA = 25°C
30°
20°
10°
VDD ± = ± 5 V
RL = 10 kΩ
CL = 100 pF
40°
−75 −50 −25
40°
0°
0
25
50
75
100
125
0
200
TA − Free-Air Temperature − °C
400
600
800
1000
CL − Load Capacitance − pF
Figure 31
Figure 32
† Data at high and low temperatures are applicable only within the rated operating free-air temperature ranges of the various devices.
APPLICATION INFORMATION
capacitor selection and placement
The two important factors to consider when selecting external capacitors CXA and CXB are leakage and
dielectric absorption. Both factors can cause system degradation, negating the performance advantages
realized by using the TLC2652.
Degradation from capacitor leakage becomes more apparent with the increasing temperatures. Low-leakage
capacitors and standoffs are recommended for operation at TA = 125°C. In addition, guard bands are
recommended around the capacitor connections on both sides of the printed circuit board to alleviate problems
caused by surface leakage on circuit boards.
Capacitors with high dielectric absorption tend to take several seconds to settle upon application of power, which
directly affects input offset voltage. In applications where fast settling of input offset voltage is needed, it is
recommended that high-quality film capacitors, such as mylar, polystyrene, or polypropylene, be used. In other
applications, however, a ceramic or other low-grade capacitor can suffice.
Unlike many choppers available today, the TLC2652 is designed to function with values of CXA and CXB in the
range of 0.1 µF to 1 µF without degradation to input offset voltage or input noise voltage. These capacitors
should be located as close as possible to the CXA and CXB pins and returned to either VDD − or C RETURN. On
many choppers, connecting these capacitors to VDD − causes degradation in noise performance. This problem
is eliminated on the TLC2652.
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
21
SLOS019E − SEPTEMBER 1988 − REVISED FEBRUARY 2005
APPLICATION INFORMATION
internal/external clock
When large differential input voltage conditions
are applied to the TLC2652, the nulling loop
attempts to prevent the output from saturating by
driving CXA and CXB to internally-clamped voltage
levels. Once the overdrive condition is removed,
a period of time is required to allow the built-up
charge to dissipate. This time period is defined as
overload recovery time (see Figure 33). Typical
overload recovery time for the TLC2652 is
significantly faster than competitive products;
however, if required, this time can be reduced
further by use of internal clamp circuitry
accessible through CLAMP if required.
VII − Input Voltage − mV
V
overload recovery/output clamp
VO
V O − Output Voltage − V
The TLC2652 has an internal clock that sets the chopping frequency to a nominal value of 450 Hz. On 8-pin
packages, the chopping frequency can only be controlled by the internal clock; however, on all 14-pin packages
and the 20-pin FK package, the device chopping frequency can be set by the internal clock or controlled
externally by use of the INT/EXT and CLK IN pins. To use the internal 450-Hz clock, no connection is necessary.
If external clocking is desired, connect INT/EXT to VDD − and the external clock to CLK IN. The external clock
trip point is 2.5 V above the negative rail; however, CLK IN can be driven from the negative rail to 5 V above
the negative rail. If this level is exceeded, damage could occur to the device unless the current into CLK IN is
limited to ± 5 mA. When operating in the single-supply configuration, this feature allows the TLC2652 to be driven
directly by 5-V TTL and CMOS logic. A divide-by0
two frequency divider interfaces with CLK IN and
VDD ± = ± 5 V
sets the clock chopping frequency. The duty cycle
TA = 25° C
of the external clock is not critical but should be
kept between 30% and 60%.
−5
0
−50
0
10
20
30
40
50
60
70
80
t − Time − ms
Figure 33. Overload Recovery
The clamp is a switch that is automatically activated when the output is approximately 1 V from either supply
rail. When connected to the inverting input (in parallel with the closed-loop feedback resistor), the closed-loop
gain is reduced, and the TLC2652 output is prevented from going into saturation. Since the output must source
or sink current through the switch (see Figure 7), the maximum output voltage swing is slightly reduced.
thermoelectric effects
To take advantage of the extremely low offset voltage drift of the TLC2652, care must be taken to compensate
for the thermoelectric effects present when two dissimilar metals are brought into contact with each other (such
as device leads being soldered to a printed circuit board). Dissimilar metal junctions can produce thermoelectric
voltages in the range of several microvolts per degree Celsius (orders of magnitude greater than the 0.01-µV/°C
typical of the TLC2652).
To help minimize thermoelectric effects, careful attention should be paid to component selection and
circuit-board layout. Avoid the use of nonsoldered connections (such as sockets, relays, switches, etc.) in the
input signal path. Cancel thermoelectric effects by duplicating the number of components and junctions in each
device input. The use of low-thermoelectric-coefficient components, such as wire-wound resistors, is also
beneficial.
22
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
SLOS019E − SEPTEMBER 1988 − REVISED FEBRUARY 2005
APPLICATION INFORMATION
latch-up avoidance
Because CMOS devices are susceptible to latch-up due to their inherent parasitic thyristors, the TLC2652 inputs
and output are designed to withstand −100-mA surge currents without sustaining latch-up; however, techniques
to reduce the chance of latch-up should be used whenever possible. Internal protection diodes should not, by
design, be forward biased. Applied input and output voltages should not exceed the supply voltage by more than
300 mV. Care should be exercised when using capacitive coupling on pulse generators. Supply transients
should be shunted by the use of decoupling capacitors (0.1 µF typical) located across the supply rails as close
to the device as possible.
The current path established if latch-up occurs is usually between the supply rails and is limited only by the
impedance of the power supply and the forward resistance of the parasitic thyristor. The chance of latch-up
occurring increases with increasing temperature and supply voltage.
electrostatic discharge protection
The TLC2652 incorporates internal ESD-protection circuits that prevent functional failures at voltages at or
below 2000 V. Care should be exercised in handling these devices, as exposure to ESD may result in
degradation of the device parametric performance.
theory of operation
Chopper-stabilized operational amplifiers offer the best dc performance of any monolithic operational amplifier.
This superior performance is the result of using two operational amplifiers, a main amplifier and a nulling
amplifier, plus oscillator-controlled logic and two external capacitors to create a system that behaves as a single
amplifier. With this approach, the TLC2652 achieves submicrovolt input offset voltage, submicrovolt noise
voltage, and offset voltage variations with temperature in the nV/°C range.
The TLC2652 on-chip control logic produces two dominant clock phases: a nulling phase and an amplifying
phase. The term chopper-stabilized derives from the process of switching between these two clock phases.
Figure 34 shows a simplified block diagram of the TLC2652. Switches A and B are make-before-break types.
During the nulling phase, switch A is closed shorting the nulling amplifier inputs together and allowing the nulling
amplifier to reduce its own input offset voltage by feeding its output signal back to an inverting input node.
Simultaneously, external capacitor CXA stores the nulling potential to allow the offset voltage of the amplifier to
remain nulled during the amplifying phase.
Main Amplifier
IN +
+
IN −
−
VO
B
B
A
CXB
+
VDD −
−
Null
Amplifier
A
CXA
Figure 34. TLC2652 Simplified Block Diagram
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
23
SLOS019E − SEPTEMBER 1988 − REVISED FEBRUARY 2005
APPLICATION INFORMATION
theory of operation (continued)
During the amplifying phase, switch B is closed connecting the output of the nulling amplifier to a noninverting
input of the main amplifier. In this configuration, the input offset voltage of the main amplifier is nulled. Also,
external capacitor CXB stores the nulling potential to allow the offset voltage of the main amplifier to remain
nulled during the next nulling phase.
This continuous chopping process allows offset voltage nulling during variations in time and temperature over
the common-mode input voltage range and power supply range. In addition, because the low-frequency signal
path is through both the null and main amplifiers, extremely high gain is achieved.
The low-frequency noise of a chopper amplifier depends on the magnitude of the component noise prior to
chopping and the capability of the circuit to reduce this noise while chopping. The use of the Advanced LinCMOS
process, with its low-noise analog MOS transistors and patent-pending input stage design, significantly reduces
the input noise voltage.
The primary source of nonideal operation in chopper-stabilized amplifiers is error charge from the switches. As
charge imbalance accumulates on critical nodes, input offset voltage can increase, especially with increasing
chopping frequency. This problem has been significantly reduced in the TLC2652 by use of a patent-pending
compensation circuit and the Advanced LinCMOS process.
The TLC2652 incorporates a feed-forward design that ensures continuous frequency response. Essentially, the
gain magnitude of the nulling amplifier and compensation network crosses unity at the break frequency of the
main amplifier. As a result, the high-frequency response of the system is the same as the frequency response
of the main amplifier. This approach also ensures that the slewing characteristics remain the same during both
the nulling and amplifying phases.
24
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
PACKAGE OPTION ADDENDUM
www.ti.com
14-Oct-2022
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
Samples
(4/5)
(6)
5962-9089501MPA
ACTIVE
CDIP
JG
8
1
Non-RoHS
& Green
SNPB
N / A for Pkg Type
-55 to 125
9089501MPA
TLC2652M
5962-9089503MCA
ACTIVE
CDIP
J
14
1
Non-RoHS
& Green
SNPB
N / A for Pkg Type
-55 to 125
5962-9089503MC
A
TLC2652AMJB
5962-9089503MPA
ACTIVE
CDIP
JG
8
1
Non-RoHS
& Green
SNPB
N / A for Pkg Type
-55 to 125
9089503MPA
TLC2652AM
Samples
TLC2652AC-14D
ACTIVE
SOIC
D
14
50
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
0 to 70
2652AC
Samples
TLC2652AC-8D
ACTIVE
SOIC
D
8
75
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
0 to 70
2652AC
Samples
TLC2652ACN
ACTIVE
PDIP
N
14
25
RoHS & Green
NIPDAU
N / A for Pkg Type
0 to 70
TLC2652ACN
Samples
TLC2652ACP
ACTIVE
PDIP
P
8
50
RoHS & Green
NIPDAU
N / A for Pkg Type
0 to 70
TLC2652AC
Samples
TLC2652AI-14D
ACTIVE
SOIC
D
14
50
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
2652AI
Samples
TLC2652AI-8D
ACTIVE
SOIC
D
8
75
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
2652AI
Samples
TLC2652AI-8DR
ACTIVE
SOIC
D
8
2500
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
2652AI
Samples
TLC2652AIN
ACTIVE
PDIP
N
14
25
RoHS & Green
NIPDAU
N / A for Pkg Type
-40 to 85
TLC2652AIN
Samples
TLC2652AIP
ACTIVE
PDIP
P
8
50
RoHS & Green
NIPDAU
N / A for Pkg Type
-40 to 85
TLC2652AI
Samples
TLC2652AMJB
ACTIVE
CDIP
J
14
1
Non-RoHS
& Green
SNPB
N / A for Pkg Type
-55 to 125
5962-9089503MC
A
TLC2652AMJB
TLC2652AMJGB
ACTIVE
CDIP
JG
8
1
Non-RoHS
& Green
SNPB
N / A for Pkg Type
-55 to 125
9089503MPA
TLC2652AM
Samples
TLC2652C-8D
ACTIVE
SOIC
D
8
75
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
2652C
Samples
TLC2652C-8DR
ACTIVE
SOIC
D
8
2500
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
2652C
Samples
TLC2652CN
ACTIVE
PDIP
N
14
25
RoHS & Green
NIPDAU
N / A for Pkg Type
TLC2652CN
Samples
TLC2652CP
ACTIVE
PDIP
P
8
50
RoHS & Green
NIPDAU
N / A for Pkg Type
TLC2652CP
Samples
Addendum-Page 1
Samples
Samples
Samples
PACKAGE OPTION ADDENDUM
www.ti.com
14-Oct-2022
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
Samples
(4/5)
(6)
TLC2652I-8D
ACTIVE
SOIC
D
8
75
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
2652I
Samples
TLC2652I-8DR
ACTIVE
SOIC
D
8
2500
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
2652I
Samples
TLC2652MJG
ACTIVE
CDIP
JG
8
1
Non-RoHS
& Green
SNPB
N / A for Pkg Type
-55 to 125
TLC2652MJG
Samples
TLC2652MJGB
ACTIVE
CDIP
JG
8
1
Non-RoHS
& Green
SNPB
N / A for Pkg Type
-55 to 125
9089501MPA
TLC2652M
Samples
TLC2652Q-8D
ACTIVE
SOIC
D
8
75
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
T2652Q
Samples
TLC2652Q-8DG4
ACTIVE
SOIC
D
8
75
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
T2652Q
Samples
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
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