TLC5615C, TLC5615I
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SLAS142E – OCTOBER 1996 – REVISED JUNE 2007
10-BIT DIGITAL-TO-ANALOG CONVERTERS
FEATURES
•
•
•
•
•
•
•
•
•
•
•
10-Bit CMOS Voltage Output DAC in an
8-Terminal Package
5V Single Supply Operation
3-Wire Serial Interface
High-Impedance Reference Inputs
Voltage Output Range: 2 Times the Reference
Input Voltage
Internal Power-On Reset
Low Power Consumption: 1.75mW Max
Update Rate of 1.21MHz
Settling Time to 0.5LSB: 12.5µs Typ
Monotonic Over Temperature
Pin-Compatible With the Maxim MAX515
APPLICATIONS
•
•
•
•
•
Battery-Powered Test Instruments
Digital Offset and Gain Adjustment
Battery Operated/Remote Industrial Controls
Machine and Motion Control Devices
Cellular Telephones
DESCRIPTION
The TLC5615 is a 10-bit voltage output
digital-to-analog converter (DAC) with a buffered
reference input (high impedance). The DAC has an
output voltage range that is two times the reference
voltage, and the DAC is monotonic. The device is
simple to use, running from a single supply of 5V. A
power-on-reset function is incorporated to ensure
repeatable start-up conditions.
Digital control of the TLC5615 is over a three-wire
serial bus that is CMOS compatible and easily
interfaced to industry standard microprocessor and
microcontroller devices. The device receives a 16-bit
data word to produce the analog output. The digital
inputs feature Schmitt triggers for high noise
immunity. Digital communication protocols include
the SPI™, QSPI™, and Microwire™ standards.
The 8-terminal small-outline D package allows digital
control of analog functions in space-critical
applications. The TLC5615C is characterized for
operation from 0°C to +70°C. The TLC5615I is
characterized for operation from –40°C to +85°C.
D, P, OR DGK PACKAGE
(TOP VIEW)
DIN
SCLK
CS
DOUT
1
8
2
7
3
6
4
5
VDD
OUT
REFIN
AGND
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SPI, QSPI are trademarks of Motorola, Inc.
Microwire is a trademark of National Semiconductor Corporation.
All other trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 1996–2007, Texas Instruments Incorporated
TLC5615C, TLC5615I
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SLAS142E – OCTOBER 1996 – REVISED JUNE 2007
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
FUNCTIONAL BLOCK DIAGRAM
_
+
_ 2
DAC
+
REFIN
OUT
(Voltage Output)
AGND
R
Power-ON
Reset
R
10-Bit DAC Register
Control
Logic
CS
2
0s
SCLK
(LSB)
(MSB)
10 Data Bits
DIN
4
Dummy
Bits
DOUT
16-Bit Shift Register
Terminal Functions
TERMINAL
NAME
NO.
I/O
DESCRIPTION
DIN
1
I
Serial data input
SCLK
2
I
Serial clock input
CS
3
I
Chip select, active low
DOUT
4
O
Serial data output for daisy chaining
AGND
5
REFIN
6
I
Reference input
OUT
7
O
DAC analog voltage output
VDD
8
Analog ground
Positive power supply
PACKAGE/ORDERING INFORMATION
For the most current package and ordering information, see the Package Option Addendum at the end of this
document, or see the TI website at www.ti.com.
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ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted) (1)
UNIT
Supply voltage (VDD to AGND)
7V
Digital input voltage range to AGND
–0.3V to VDD + 0.3V
Reference input voltage range to AGND
–0.3V to VDD + 0.3V
Output voltage at OUT from external source
VDD + 0.3V
±20mA
Continuous current at any terminal
Operating free-air temperature range, TA
TLC5615C
0°C to +70°C
TLC5615I
–40°C to +85°C
Storage temperature range, Tstg
–65°C to +150°C
Lead temperature 1,6mm (1/16 inch) from case for 10 seconds
(1)
+260°C
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
RECOMMENDED OPERATING CONDITIONS
MIN
NOM
MAX
Supply voltage, VDD
4.5
5
5.5
High-level digital input voltage, VIH
2.4
0.8
2
Load resistance, RL
2
Operating free-air temperature, TA
V
V
Low-level digital input voltage, VIL
Reference voltage, Vref to REFIN terminal
UNIT
2.048
VDD–2
V
V
kΩ
TLC5615C
0
70
°C
TLC5615I
40
85
°C
ELECTRICAL CHARACTERISTICS
over recommended operating free-air temperature range, VDD = 5V ± 5%, Vref = 2.048V (unless otherwise noted)
STATIC DAC SPECIFICATIONS
PARAMETER
TEST CONDITIONS
MIN
Resolution
EZS
EG
Integral nonlinearity, end point adjusted (INL)
Vref = 2.048V,
See
(1)
Differential nonlinearity (DNL)
Vref = 2.048V,
See
(2)
Zero-scale error (offset error at zero scale)
Vref = 2.048V,
See
(3)
Zero-scale-error temperature coefficient
Vref = 2.048V,
See
(4)
Gain error
Vref = 2.048V,
See
(5)
Gain-error temperature coefficient
Vref = 2.048V,
See
(6)
PSRR Power-supply rejection ratio
Analog full scale output
(1)
(2)
(3)
(4)
(5)
(6)
(7)
(8)
TYP
MAX
10
Zero scale
Gain
See
(7) (8)
RL = 100kΩ
UNIT
bits
±0.1
±1
LSB
±0.5
LSB
±3
LSB
3
ppm/°C
±3
1
80
LSB
ppm/°C
dB
80
2Vref(1023/1024)
V
The relative accuracy or integral nonlinearity (INL), sometimes referred to as linearity error, is the maximum deviation of the output from
the line between zero and full scale excluding the effects of zero code and full-scale errors (see text). Tested from code 3 to code 1024.
The differential nonlinearity (DNL), sometimes referred to as differential error, is the difference between the measured and ideal 1LSB
amplitude change of any two adjacent codes. Monotonic means the output voltage changes in the same direction (or remains constant)
as a change in the digital input code. Tested from code 3 to code 1024.
Zero-scale error is the deviation from zero-voltage output when the digital input code is zero (see text).
Zero-scale-error temperature coefficient is given by: EZS TC = [EZS (Tmax) – EZS (Tmin)]/Vref × 106/(Tmax– Tmin).
Gain error is the deviation from the ideal output (Vref – 1LSB) with an output load of 10kΩ excluding the effects of the zero-scale error.
Gain temperature coefficient is given by: EG TC = [EG(Tmax) – EG (Tmin)]/Vref × 106/(Tmax– Tmin).
Zero-scale-error rejection ratio (EZS-RR) is measured by varying the VDD from 4.5V to 5.5V dc and measuring the proportion of this
signal imposed on the zero-code output voltage.
Gain-error rejection ratio (EG-RR) is measured by varying the VDD from 4.5V to 5.5V dc and measuring the proportion of this signal
imposed on the full-scale output voltage after subtracting the zero-scale change.
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VOLTAGE OUTPUT (OUT)
PARAMETER
VO
TEST CONDITIONS
Voltage output range
RL= 10kΩ
Output load regulation accuracy
VO(OUT) = 2V,
IOSC
Output short circuit current
OUT to VDD or AGND
VOL(low)
Output voltage, low-level
IO(OUT)≤ 5mA
VOH(high)
Output voltage, high-level
IO(OUT)≤– 5mA
MIN
TYP
0
MAX
VDD–0.4
RL = 2kΩ
0.5
20
UNIT
V
LSB
mA
0.25
4.75
V
V
REFERENCE INPUT (REFIN)
VI
Input voltage
ri
Input resistance
Ci
Input capacitance
0
VDD–2
V
10
MΩ
5
pF
DIGITAL INPUTS (DIN, SCLK, CS)
VIH
High-level digital input voltage
VIL
Low-level digital input voltage
2.4
IIH
High-level digital input current
VI = VDD
IIL
Low-level digital input current
VI = 0
Ci
Input capacitance
V
0.8
V
±1
µA
±1
µA
8
pF
DIGITAL OUTPUT (DOUT)
VOH
Output voltage, high-level
IO = –2mA
VOL
Output voltage, low-level
IO = 2mA
VDD–1
V
0.4
V
5
5.5
V
POWER SUPPLY
VDD
Supply voltage
IDD
4.5
Power supply current
VDD = 5.5V, No load,
All inputs = 0V or VDD
Vref = 0
150
250
µA
VDD= 5.5V, No load,
All inputs = 0V or VDD
Vref = 2.048V
230
350
µA
ANALOG OUTPUT DYNAMIC PERFORMANCE
Vref = 1VPP at 1kHz + 2.048Vdc,
code = 11 1111 1111 (1)
Signal-to-noise + distortion, S/(N+D)
(1)
60
dB
The limiting frequency value at 1VPP is determined by the output-amplifier slew rate.
DIGITAL INPUT TIMING REQUIREMENTS (See Figure 1)
PARAMETER
MIN
NOM
MAX
UNIT
tsu(DS)
Setup time, DIN before SCLK high
45
ns
th(DH)
Hold time, DIN valid after SCLK high
0
ns
tsu(CSS)
Setup time, CS low to SCLK high
1
ns
tsu(CS1)
Setup time, CS high to SCLK high
50
ns
th(CSH0)
Hold time, SCLK low to CS low
1
ns
th(CSH1)
Hold time, SCLK low to CS high
0
ns
tw(CS)
Pulse duration, minimum chip select pulse width high
20
ns
tw(CL)
Pulse duration, SCLK low
25
ns
tw(CH)
Pulse duration, SCLK high
25
ns
OUTPUT SWITCHING CHARACTERISTICS
PARAMETER
tpd(DOUT)
4
Propagation delay time, DOUT
TEST CONDITIONS
CL = 50pF
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MIN NOM MAX
50
UNIT
ns
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SLAS142E – OCTOBER 1996 – REVISED JUNE 2007
OPERATING CHARACTERISTICS
over recommended operating free-air temperature range, VDD = 5V ±5%, Vref = 2.048V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
0.3
0.5
V/µs
12.5
µs
ANALOG OUTPUT DYNAMIC PERFORMANCE
SR
Output slew rate
CL = 100pF,
TA= +25°C
RL = 10kΩ,
ts
Output settling time
To 0.5LSB,
RL = 10kΩ,
CL = 100pF,
Glitch energy
DIN = All 0s to all 1s
(1)
5
nV-s
REFERENCE INPUT (REFIN)
(1)
(2)
Reference feedthrough
REFIN = 1VPP at 1kHz + 2.048Vdc
Reference input
bandwidth (f–3dB)
REFIN = 0.2VPP + 2.048Vdc
(2)
–80
dB
30
kHz
Settling time is the time for the output signal to remain within ±0.5LSB of the final measured value for a digital input code change of 000
hex to 3FF hex or 3FF hex to 000 hex.
Reference feedthrough is measured at the DAC output with an input code = 000 hex and a Vref input = 2.048Vdc + 1Vpp at 1kHz.
PARAMETER MEASUREMENT INFORMATION
CS
ÎÎÎ
ÎÎÎ
ÎÎÎ
ÎÎÎ
ÎÎÎÎÎ
ÎÎÎÎÎ
ÎÎÎÎÎ
ÎÎÎÎÎ
th(CSH0)
tsu(CSS)
tw(CS)
tw(CH)
tw(CL)
SCLK
See Note A
tsu(DS)
th(CSH1)
See Note C
th(DH)
DIN
tpd(DOUT)
DOUT
ÎÎÎÎ
ÎÎÎÎ
ÎÎÎÎ
ÎÎÎÎ
ÎÎÎÎÎÎÎÎ
ÎÎÎÎÎÎÎÎ
ÎÎÎÎÎÎÎÎ
ÎÎÎÎÎÎÎÎ
Previous LSB
MSB
tsu(CS1)
See Note A
LSB
See Note B
NOTES: A. The input clock, applied at the SCLK terminal, should be inhibited low when CS is high to minimize clock feedthrough.
B. Data input from preceeding conversion cycle.
C. Sixteenth SCLK falling edge
Figure 1. Timing Diagram
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TYPICAL CHARACTERISTICS
OUTPUT SINK CURRENT
vs
OUTPUT PULLDOWN VOLTAGE
OUTPUT SOURCE CURRENT
vs
OUTPUT PULLUP VOLTAGE
30
20
IO - Output Sink Current - mA
16
VDD = 5 V
VREFIN = 2.048 V
TA = 25°C
IO - Output Source Current - mA
18
14
12
10
8
6
4
VDD = 5 V
VREFIN = 2.048 V
TA = 25°C
25
20
15
10
5
2
0
0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9
0
1
4.8 4.6
5
1.1 1.2
4
3.8 3.6
3.4
Figure 2.
Figure 3.
SUPPLY CURRENT
vs
TEMPERATURE
VREFIN TO V(OUT) RELATIVE GAIN
vs
INPUT FREQUENCY
280
3.2
3
4
VDD = 5 V
VREFIN = 0.2 VPP + 2.048 V dc
TA = 25°C
2
240
0
200
G - Relative Gain - dB
I DD - Supply Current - µ A
4.4 4.2
VO - Output Pullup Voltage - V
VO - Output Pulldown Voltage - V
160
120
80
-2
-4
-6
-8
- 10
40
VDD = 5 V
VREFIN = 2.048 V
TA = 25°C
0
- 60 - 40 - 20
- 12
0
20 40 60 80
t - Temperature - °C
100 120 140
- 14
1
1k
10 k
fI - Input Frequency - Hz
Figure 4.
6
100
Figure 5.
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TYPICAL CHARACTERISTICS (continued)
SIGNAL-TO-NOISE + DISTORTION
vs
INPUT FREQUENCY AT REFIN
70
VDD = 5 V
TA = 25°C
VREFIN = 4 VPP
Signal-To-Noise + Distortion - dB
60
50
40
30
20
10
0
1k
10 k
100 k
300 k
Frequency - Hz
Figure 6.
Differential Nonlinearity – LSB
0.2
0.15
0.1
0.05
0
–0.05
–0.1
–0.15
–0.2
0
255
511
767
1023
Integral Nonlinearity – LSB
Input Code
Figure 7. Differential Nonlinearity With Input Code
1
0.8
0.6
0.4
0.2
0
–0.2
–0.4
–0.6
–0.8
–1
0
255
511
767
1023
Input Code
Figure 8. Integral Nonlinearity With Input Code
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APPLICATION INFORMATION
GENERAL FUNCTION
The TLC5615 uses a resistor string network buffered with an op amp in a fixed gain of 2 to convert 10-bit digital
data to analog voltage levels (see functional block diagram and Figure 9). The output of the TLC5615 is the
same polarity as the reference input (see Table 1).
An internal circuit resets the DAC register to all zeros on power up.
DIN
REFIN
+
_
SCLK
CS
Resistor
String
DAC
DOUT
+
_
OUT
R
R
AGND
VDD
5V
0.1 µF
Figure 9. TLC5615 Typical Operating Circuit
Table 1. Binary Code Table (0V to 2VREFINOutput), Gain = 2
INPUT (1)
1111
1111
OUTPUT
1023
2 VREFIN
1024
ǒ
11(00)
Ǔ
:
:
1000
0000
01(00)
513
2 VREFIN
1024
1000
0000
00(00)
512
2 VREFIN
+ V REFIN
1024
0111
1111
11(00)
ǒ
ǒ
Ǔ
8
Ǔ 511
ǒ
2 VREFIN
1024
:
(1)
Ǔ
:
0000
0000
01(00)
1
2 VREFIN
1024
0000
0000
00(00)
0V
ǒ
Ǔ
A 10-bit data word with two bits below the LSB bit (sub-LSB) with 0 values must be written since the DAC input latch is 12 bits wide.
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BUFFER AMPLIFIER
The output buffer has a rail-to-rail output with short circuit protection and can drive a 2kΩ load with a 100pF load
capacitance. Settling time is 12.5µs typical to within 0.5LSB of final value.
EXTERNAL REFERENCE
The reference voltage input is buffered, which makes the DAC input resistance not code dependent. Therefore,
the REFIN input resistance is 10MΩ and the REFIN input capacitance is typically 5pF independent of input
code. The reference voltage determines the DAC full-scale output.
LOGIC INTERFACE
The logic inputs function with either TTL or CMOS logic levels. However, using rail-to-rail CMOS logic achieves
the lowest power dissipation. The power requirement increases by approximately 2 times when using TTL logic
levels.
SERIAL CLOCK AND UPDATE RATE
Figure 1 shows the TLC5615 timing. The maximum serial clock rate is:
f(SCLK)max +
t
wǒCHǓ
1
)t
wǒCLǓ
or approximately 14MHz. The digital update rate is limited by the chip-select period, which is:
tp(CS) + 16
ǒ
t
wǒCHǓ
)t
Ǔ
wǒCLǓ
)t
wǒCSǓ
and is equal to 820ns which is a 1.21MHz update rate. However, the DAC settling time to 10 bits of 12.5µs limits
the update rate to 80kHz for full-scale input step transitions.
SERIAL INTERFACE
When chip select (CS) is low, the input data is read into a 16-bit shift register with the input data clocked in most
significant bit first. The rising edge of the SLCK input shifts the data into the input register.
The rising edge of CS then transfers the data to the DAC register. When CS is high, input data cannot be
clocked into the input register. All CS transitions should occur when the SCLK input is low.
If the daisy chain (cascading) function (see daisy-chaining devices section) is not used, a 12-bit input data
sequence with the MSB first can be used as shown in Figure 10:
12 Bits
10 Data Bits
x
MSB
LSB
x
2 Extra (Sub-LSB) Bits
x = don’t care
Figure 10. 12-Bit Input Data Sequence
or 16 bits of data can be transferred as shown in Figure 11 with the 4 upper dummy bits first.
16 Bits
4 Upper Dummy Bits
10 Data Bits
MSB
x
LSB
x
2 Extra (Sub-LSB) Bits
x = don’t care
Figure 11. 16-Bit Input Data Sequence
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The data from DOUT requires 16 falling edges of the input clock and, therefore, requires an extra clock width.
When daisy chaining multiple TLC5615 devices, the data requires 4 upper dummy bits because the data transfer
requires 16 input-clock cycles plus one additional input-clock falling edge to clock out the data at the DOUT
terminal (see Figure 1).
The two extra (sub-LSB) bits are always required to provide hardware and software compatibility with 12-bit data
converter transfers.
The TLC5615 three-wire interface is compatible with the SPI, QSPI, and Microwire serial standards. The
hardware connections are shown in Figure 12 and Figure 13.
The SPI and Microwire interfaces transfer data in 8-bit bytes; therefore, two write cycles are required to input
data to the DAC. The QSPI interface, which has a variable input data length from 8 to 16 bits, can load the DAC
input register in one write cycle.
SCLK
DIN
TLC5615
CS
DOUT
SK
SO Microwire
Port
I/O
SI
NOTE A: The DOUT-SI connection is not required for writing to
the TLC5615 but may be used for verifying data
transfer if desired.
Figure 12. Microwire Connection
SCLK
DIN
TLC5615
CS
DOUT
SCK
MOSI
I/O
SPI/QSPI
Port
MISO
CPOL = 0, CPHA = 0
NOTE A: The DOUT-MISO connection is not required for writing to the
TLC5615 but may be used for verifying data transfer.
Figure 13. SPI/QSPI Connection
DAISY-CHAINING DEVICES
DACs can be daisy-chained by connecting the DOUT terminal of one device to the DIN of the next device in the
chain, providing that the setup time, tsu(CSS) (CS low to SCLK high), is greater than the sum of the setup time,
tsu(DS), plus the propagation delay time, tpd(DOUT), for proper timing (see digital input timing requirements section).
The data at DIN appears at DOUT, delayed by 16 clock cycles plus one clock width. DOUT is a totem-poled
output for low power. DOUT changes on the SCLK falling edge when CS is low. When CS is high, DOUT
remains at the value of the last data bit and does not go into a high-impedance state.
LINEARITY, OFFSET, AND GAIN ERROR USING SINGLE-ENDED SUPPLIES
When an amplifier is operated from a single supply, the voltage offset can still be either positive or negative.
With a positive offset, the output voltage changes on the first code change. With a negative offset the output
voltage may not change with the first code depending on the magnitude of the offset voltage.
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The output amplifier attempts to drive the output to a negative voltage. However, because the most negative
supply rail is ground, the output cannot drive below ground and clamps the output at 0V.
The output voltage then remains at zero until the input code value produces a sufficient positive output voltage
to overcome the negative offset voltage, resulting in the transfer function shown in Figure 14.
Output
Voltage
0V
DAC Code
Negative
Offset
Figure 14. Effect of Negative Offset (Single Supply)
This offset error, not the linearity error, produces this breakpoint. The transfer function would have followed the
dotted line if the output buffer could drive below the ground rail.
For a DAC, linearity is measured between zero-input code (all inputs '0') and full-scale code (all inputs '1') after
offset and full scale are adjusted out or accounted for in some way. However, single supply operation does not
allow for adjustment when the offset is negative due to the breakpoint in the transfer function. So the linearity is
measured between full-scale code and the lowest code that produces a positive output voltage. For the
TLC5615, the zero-scale (offset) error is ±3LSB maximum. The code is calculated from the maximum
specification for the negative offset.
POWER-SUPPLY BYPASSING AND GROUND MANAGEMENT
Printed circuit boards that use separate analog and digital ground planes offer the best system performance.
Wire-wrap boards do not perform well and should not be used. The two ground planes should be connected
together at the low-impedance power-supply source. The best ground connection may be achieved by
connecting the DAC AGND terminal to the system analog ground plane making sure that analog ground currents
are well managed and there are negligible voltage drops across the ground plane.
A 0.1µF ceramic-capacitor bypass should be connected between VDD and AGND and mounted with short leads
as close as possible to the device. Use of ferrite beads may further isolate the system analog supply from the
digital power supply.
Figure 15 shows the ground plane layout and bypassing technique.
Analog Ground Plane
1
8
2
7
3
6
4
5
0.1 µF
Figure 15. Power-Supply Bypassing
SAVING POWER
Setting the DAC register to all 0s minimizes power consumption by the reference resistor array and the output
load when the system is not using the DAC.
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AC CONSIDERATIONS
Digital Feedthrough
Even with CS high, high-speed serial data at any of the digital input or output terminals may couple through the
DAC package internal stray capacitance and appear at the DAC analog output as digital feedthrough. Digital
feedthrough is tested by holding CS high and transmitting 0101010101 from DIN to DOUT.
Analog Feedthrough
Higher frequency analog input signals may couple to the output through internal stray capacitance. Analog
feedthrough is tested by holding CS high, setting the DAC code to all 0s, sweeping the frequency applied to
REFIN, and monitoring the DAC output.
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Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from D Revision (August 2003) to E Revision ............................................................................................... Page
•
•
Added ESD statement. ......................................................................................................................................................... 2
Changed —moved package option table from front page. ................................................................................................... 2
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PACKAGE OPTION ADDENDUM
www.ti.com
14-Oct-2022
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
Samples
(4/5)
(6)
TLC5615CD
ACTIVE
SOIC
D
8
75
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
0 to 70
5615C
Samples
TLC5615CDG4
ACTIVE
SOIC
D
8
75
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
0 to 70
5615C
Samples
TLC5615CDGK
ACTIVE
VSSOP
DGK
8
80
RoHS & Green
NIPDAUAG
Level-1-260C-UNLIM
0 to 70
AEM
Samples
TLC5615CDGKR
ACTIVE
VSSOP
DGK
8
2500
RoHS & Green
NIPDAUAG
Level-1-260C-UNLIM
0 to 70
AEM
Samples
TLC5615CDR
ACTIVE
SOIC
D
8
2500
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
0 to 70
5615C
Samples
TLC5615CP
ACTIVE
PDIP
P
8
50
RoHS & Green
NIPDAU
N / A for Pkg Type
0 to 70
TLC5615CP
Samples
TLC5615ID
ACTIVE
SOIC
D
8
75
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
5615I
Samples
TLC5615IDGK
ACTIVE
VSSOP
DGK
8
80
RoHS & Green
NIPDAUAG
Level-1-260C-UNLIM
-40 to 85
AEN
Samples
TLC5615IDR
ACTIVE
SOIC
D
8
2500
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
5615I
Samples
TLC5615IP
ACTIVE
PDIP
P
8
50
RoHS & Green
NIPDAU
N / A for Pkg Type
-40 to 85
TLC5615IP
Samples
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
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