TLK2711HFG/EM

TLK2711HFG/EM

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    CFP68

  • 描述:

    IC TXRX 1.6-2.5GBPS 68CFP

  • 数据手册
  • 价格&库存
TLK2711HFG/EM 数据手册
Product Folder Order Now Support & Community Tools & Software Technical Documents TLK2711-SP SGLS307P – JULY 2006 – REVISED FEBRUARY 2018 TLK2711-SP 1.6-Gbps to 2.5-Gbps Class V Transceiver 1 Features 3 Description • The TLK2711-SP is a member of the WizardLink transceiver family of multigigabit transceivers, intended for use in ultra-high-speed bidirectional point-to-point data transmission systems. The TLK2711-SP supports an effective serial interface speed of 1.6 Gbps to 2.5 Gbps, providing up to 2 Gbps of data bandwidth. External Component Interconnection 1 nF−10 nF† 1 nF−10 nF† Recommended use of 0.01-µF capacitor per VDD terminal 0.01 µF 5 Ω at 100 MHz RXD0 RXD3 TXD5 4 48 RXD4 GND 5 47 RXD5 TXD6 6 46 RXD6 TXD7 7 45 GND GTX_CLK 8 44 RXD7 VDD 9 43 RX_CLK TXD8 10 42 RXD8 TXD9 11 41 RXD9 TXD10 12 40 VDD GND 13 39 RXD10 TXD11 14 38 RXD11 TXD12 15 37 RXD12 TXD13 16 36 RXD13 GND 49 DINRXN VDD 3 PRE 50 TXD4 GND DINRXP 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 2 VDDA 1 GND VDD TXD3 GND GND GND RXD14 RXD15 GND RKLSB 17 35 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 RKMSB GND † RXD1 RXD2 0.01 µF 0.01 µF 0.01 µF 0.01 µF TESTEN VDD Point-to-Point High-Speed I/O Data Acquisition Data Processing These units are intended for engineering evaluation only. They are processed to a non-compliant flow (for example, no burn-in, and so forth) and are tested to temperature rating of 25°C only. These units are not suitable for qualification, production, radiation testing, or flight use. Parts are not warranted for performance on full MIL specified temperature range of –55°C to 125°C or operating life. 1 nF−10 nF† 1 nF−10 nF† PRBSEN (1) (1) For all available packages, see the orderable addendum at the end of the data sheet. VDDA • • • BODY SIZE (NOM) 13.97 mm × 13.97 mm LCKREFN 2 Applications PACKAGE CFP (68) DOUTTXN • • • PART NUMBER TLK2711-SP TKLSB VDD ENABLE • Device Information(1) TXD0 • • • • GND • DOUTTXP • TXD2 TXD1 • The primary application of the TLK2711-SP is to provide high-speed I/O data channels for point-topoint baseband data transmission over controlled impedance media of approximately 50 Ω. The transmission media can be printed circuit board, copper cables, or fiber-optic cable. The maximum rate and distance of data transfer is dependent upon the attenuation characteristics of the media and the noise coupling to the environment. GND • • TXD14 • • 1.6 to 2.5-Gbps (Gigabits Per Second) Serializer/Deserializer Hot-Plug Protection High-Performance 68-Pin Ceramic Quad Flat Pack Package (HFG) Low-Power Operation Programmable Preemphasis Levels on Serial Output Interfaces to Backplane, Copper Cables, or Optical Converters On-Chip 8-Bit/10-Bit Encoding/Decoding, Comma Detect On-Chip PLL Provides Clock Synthesis From Low-Speed Reference Low Power: < 500 mW 3-V Tolerance on Parallel Data Input Signals 16-Bit Parallel TTL-Compatible Data Interface Ideal for High-Speed Backplane Interconnect and Point-to-Point Data Link Military Temperature Range (–55°C to 125°C Tcase) Loss of Signal (LOS) Detection Integrated 50-Ω Termination Resistors on RX Engineering Evaluation (/EM) Samples are Available (1) TXD15 TKMSB LOOPEN 1 For ac coupling Copyright © 2018, Texas Instruments Incorporated 1 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA. TLK2711-SP SGLS307P – JULY 2006 – REVISED FEBRUARY 2018 www.ti.com Table of Contents 1 2 3 4 5 6 7 Features .................................................................. Applications ........................................................... Description ............................................................. Revision History..................................................... Description (continued)......................................... Pin Configuration and Functions ......................... Specifications......................................................... 7.1 7.2 7.3 7.4 7.5 7.6 7.7 7.8 7.9 8 1 1 1 2 4 5 7 Absolute Maximum Ratings ...................................... 7 ESD Ratings.............................................................. 7 Recommended Operating Conditions....................... 8 Thermal Information .................................................. 8 TTL Input Electrical Characteristics .......................... 8 Transmitter/Receiver Electrical Characteristics ........ 9 Reference Clock (TXCLK) Timing Requirements ... 10 TTL Output Switching Characteristics..................... 10 Typical Characteristics ............................................ 12 Detailed Description ............................................ 13 8.1 Overview ................................................................. 13 8.2 Functional Block Diagram ....................................... 13 8.3 Feature Description................................................. 14 8.4 Device Functional Modes........................................ 20 9 Application and Implementation ........................ 21 9.1 Application Information............................................ 21 9.2 Typical Application .................................................. 22 10 Power Supply Recommendations ..................... 24 11 Layout................................................................... 24 11.1 Layout Guidelines ................................................. 24 11.2 Layout Example .................................................... 24 12 Device and Documentation Support ................. 25 12.1 12.2 12.3 12.4 12.5 Receiving Notification of Documentation Updates Community Resources.......................................... Trademarks ........................................................... Electrostatic Discharge Caution ............................ Glossary ................................................................ 25 25 25 25 25 13 Mechanical, Packaging, and Orderable Information ........................................................... 25 4 Revision History NOTE: Page numbers for previous revisions may differ from page numbers in the current version. Changes from Revision O (March 2016) to Revision P Page • Changed column header of Table 4 indicating correct order of receive data bus bits......................................................... 17 • Added Receiving Notification of Documentation Updates section ....................................................................................... 25 Changes from Revision N (December 2015) to Revision O • Page Changed reference to table note (2) Internal 10-kΩ pulldown for TKLSB and TKMSB ......................................................... 6 Changes from Revision M (October 2014) to Revision N Page • Updated the frequency range of TXCLK ............................................................................................................................... 6 • Updated Handling Ratings table to an ESD Ratings table and moved Tstg to the Absolute Maximum Ratings table............ 7 • Added Community Resources ............................................................................................................................................. 25 Changes from Revision L (August 2014) to Revision M Page • Updated Power-On Reset description .................................................................................................................................. 18 • Removed option 2 from Power-On Reset ........................................................................................................................... 19 Changes from Revision K (July 2014) to Revision L • 2 Page Updated Power-On/Reset Timing Diagram options ............................................................................................................. 19 Submit Documentation Feedback Copyright © 2006–2018, Texas Instruments Incorporated TLK2711-SP www.ti.com SGLS307P – JULY 2006 – REVISED FEBRUARY 2018 Changes from Revision J (May 2014) to Revision K Page • Updated pin description for ENABLE ..................................................................................................................................... 5 • Updated pin voltages in Absolute Maximum Ratings ............................................................................................................. 7 • Added more information to Power-On Reset detailing two power-on/reset timing options ................................................. 18 Changes from Revision I (January 2014) to Revision J Page • Changed format to meet latest data sheet standards; added new sections and moved existing sections ........................... 1 • Changed Description .............................................................................................................................................................. 4 • Changed paragraph for LCKREFN in Description (continued)............................................................................................... 4 • Changed Description of LCKREFN in ................................................................................................................................... 5 • Changed Power-On Reset section ...................................................................................................................................... 18 Changes from Revision H (December 2013) to Revision I Page • Added /EM bullet to Features ................................................................................................................................................ 1 • Deleted Ordering Information table ...................................................................................................................................... 13 Copyright © 2006–2018, Texas Instruments Incorporated Submit Documentation Feedback 3 TLK2711-SP SGLS307P – JULY 2006 – REVISED FEBRUARY 2018 www.ti.com 5 Description (continued) This device can also be used to replace parallel data transmission architectures by providing a reduction in the number of traces, connector pins, and transmit/receive pins. Parallel data loaded into the transmitter is delivered to the receiver over a serial channel, which can be a coaxial copper cable, a controlled impedance backplane, or an optical link. It is then reconstructed into its original parallel format. It offers significant power and cost savings over parallel solutions, as well as scalability for higher data rates in the future. The TLK2711-SP performs parallel-to-serial and serial-to-parallel data conversion. The clock extraction functions as a physical layer (PHY) interface device. The serial transceiver interface operates at a maximum speed of 2.5 Gbps. The transmitter latches 16-bit parallel data at a rate based on the supplied reference clock (TXCLK). The 16-bit parallel data is internally encoded into 20 bits using an 8-bit/10-bit (8b/10b) encoding format. The resulting 20-bit word is then transmitted differentially at 20× the reference clock (TXCLK) rate. The receiver section performs the serial-to-parallel conversion on the input data, synchronizing the resulting 20-bit wide parallel data to the recovered clock (RXCLK). It then decodes the 20-bit wide data using the 8-bit/10-bit decoding format resulting in 16 bits of parallel data at the receive data pins (RXD0–RXD15). The outcome is an effective data payload of 1.28 to 2 Gbps (16 bits data × the frequency). The TLK2711-SP is available in a 68-pin ceramic nonconductive tie-bar package (HFG). NOTE The errata noted in the commercial TLK2711 device titled Errata to the TLK2711, 1.6-to2.7 GBPS Transceiver Data Sheet– PLL False Lock Problem does not apply to the TLK2711-SP device. The TLK2711-SP is functionally equivalent to the TLK2711A commercial device. The TLK2711-SP provides an internal loopback capability for self-test purposes. Serial data from the serializer is passed directly to the deserializer, providing the protocol device with a functional self-check of the physical interface. The TLK2711-SP has a LOS detection circuit for conditions where the incoming signal no longer has a sufficient voltage amplitude to keep the clock recovery circuit in lock. The TLK2711-SP allows users to implement redundant ports by connecting receive data bus pins from two TLK2711-SP devices together. Asserting the LCKREFN to a low state causes the receive data bus pins (RXD0 RXD15, RXCLK, RKLSB, and RKMSB) to go to a high-impedance state if device is enabled (ENABLE = H). This places the device in a transmit-only mode, because the receiver is not tracking the data. LCKREFN must be deasserted to a high state during power-on reset (see Power-On Reset section). If the device is disabled (ENABLE = L), then RKMSB will output the status of the LOS detector (active low = LOS ). All other receive outputs will remain high-impedance. The TLK2711-SP I/Os are 3-V compatible. The TLK2711-SP is characterized for operation from –55°C to 125°C Tcase. The TLK2711-SP is designed to be hot-plug capable. An on-chip power-on reset circuit holds the RXCLK low, and goes to high impedance on the parallel-side output signal pins, as well as TXP and TXN during power up. 4 Submit Documentation Feedback Copyright © 2006–2018, Texas Instruments Incorporated TLK2711-SP www.ti.com SGLS307P – JULY 2006 – REVISED FEBRUARY 2018 6 Pin Configuration and Functions RXD1 RXD2 RXD0 DINRXN GND GND DINRXP VDDA VDDA PRE GND DOUTTXP DOUTTXN TXD0 GND TXD2 TXD1 HFG Package 68-Pin CFP Top View VDD 1 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 TXD3 2 50 VDD TXD4 3 49 RXD3 TXD5 4 48 RXD4 GND 5 47 RXD5 TXD6 6 46 RXD6 TXD7 7 45 GND GTX_CLK 8 44 RXD7 VDD 9 43 RX_CLK TXD8 10 42 RXD8 TXD9 11 41 RXD9 TXD10 12 40 VDD GND 13 39 RXD10 TXD11 14 38 RXD11 TXD12 15 37 RXD12 TXD13 16 36 RXD13 GND GND RXD15 RXD14 RKLSB RKMSB GND TESTEN PRBSEN LCKREFN TKLSB VDD ENABLE TXD15 TKMSB LOOPEN GND 17 35 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 TXD14 GND GND Pin Functions PIN NAME DOUTTXN DOUTTXP ENABLE GND LCKREFN NO. I/O DESCRIPTION 63 64 O Serial transmit outputs. TXP and TXN are differential serial outputs that interface to copper or an optical I/F module. These pins transmit NRZ data at a rate of 20× the TXCLK value. TXP and TXN are put in a high-impedance state when LOOPEN is high and are active when LOOPEN is low. During power-on reset, these pins are high impedance. 25 (1) Device enable. When this pin is held low, the device is placed in power-down mode. Only the signal detect circuit on the serial receive pair is active. When in power-down mode, RKMSB will output the status of signal detect circuit (LOS). When asserted high while the device is in power-down mode, the transceiver is reset before beginning normal operation. — Analog and digital logic ground. Provides a ground for the logic circuits, digital I/O buffers, and the high-speed analog circuits. 5, 13, 17, 19, 29, 34, 35, 45, 51, 55, 58, 62, 65 26 I I (1) Lock to reference. When LCKREFN is low, the receiver clock is frequency locked to TXCLK. This places the device in a transmit-only mode since the receiver is not tracking the data. When LCKREFN is asserted low, the receive data bus pins (RXD0 through RXD15, RXCLK, RKLSB, and RKMSB) are in a high-impedance state if device is enabled (ENABLE = H). If device is disabled (ENABLE = L), then RKMSB will output the status of the LOS detector (active low = LOS). All other receive outputs will remain high-impedance. When LCKREFN is deasserted high, the receiver is locked to the received data stream. LCKREFN must be deasserted to a high state during power-on reset. See Power-On Reset. (1) Internal 10-kΩ pullup. Copyright © 2006–2018, Texas Instruments Incorporated Submit Documentation Feedback 5 TLK2711-SP SGLS307P – JULY 2006 – REVISED FEBRUARY 2018 www.ti.com Pin Functions (continued) PIN NAME NO. I/O DESCRIPTION (2) Loop enable. When LOOPEN is active high, the internal loopback path is activated. The transmitted serial data is directly routed internally to the inputs of the receiver. This provides a self-test capability in conjunction with the protocol device. The TXP and TXN outputs are held in a highimpedance state during the loopback test. LOOPEN is held low during standard operational state, with external serial outputs and inputs active. LOOPEN 22 I PRE 60 I (2) Preemphasis control. Selects the amount of preemphasis to be added to the high-speed serial output drivers. Left low or unconnected, 5% preemphasis is added. Pulled high, 20% preemphasis is added. PRBSEN 27 I (2) PRBS test enable. When asserted high, results of pseudo-random bit stream (PRBS) tests can be monitored on the RKLSB pin. A high on RKLSB indicates that valid PRBS is being received. O K-code indicator/PRBS test results. When RKLSB is asserted high, an 8-bit/10-bit K code was received and is indicated by data bits RXD0 through RXD7. When RKLSB is asserted low, an 8bit/10-bit D code is received and is presented on data bits RXD0 through RXD7. When PRBSEN is asserted high, this pin is used to indicate status of the PRBS test results (high = pass). RKLSB 30 RKMSB 31 O K-code indicator. When RKMSB is asserted high an 8-bit/10-bit K code was received and is indicated by data bits RXD8 through RXD15. When RKMSB is asserted low an 8-bit/10-bit D code was received and is presented on data bits RXD8 through RXD15. If the differential signal on RXN and RXP drops below 200 mV, RXD0–RXD15, RKLSB, and RKMSB are all asserted high. When device is disabled (ENABLE = L), RKMSB will output the status of LOS. Active low = LOS detected. RXCLK RX_CLK 43 O Recovered clock. Output clock that is synchronized to RXD0 through RXD9, RKLSB, and RKMSB. RXCLK is the recovered serial data rate clock divided by 20. RXCLK is held low during power-on reset. RXD0 RXD1 RXD2 RXD3 RXD4 RXD5 RXD6 RXD7 RXD8 RXD9 RXD10 RXD11 RXD12 RXD13 RXD14 RXD15 54 53 52 49 48 47 46 44 42 41 39 38 37 36 33 32 O Receive data bus. These outputs carry 16-bit parallel data output from the transceiver to the protocol device, synchronized to RXCLK. The data is valid on the rising edge of RXCLK as shown in Figure 10. These pins are in high-impedance state during power-on reset. DINRXN DINRXP 56 57 I Serial receive inputs. RXP and RXN together are the differential serial input interface from a copper or an optical I/F module. TESTEN 28 I (2) Test mode enable. This pin should be left unconnected or tied low. TKLSB 23 I (2) K-code generator (LSB). When TKLSB is high, an 8-bit/10-bit K code is transmitted as controlled by data bits TXD0 through TXD7. When TKLSB is low, an 8-bit/10-bit D code is transmitted as controlled by data bits TXD0 through TXD7. TKMSB 21 I (2) K-code generator (MSB). When TKMSB is high, an 8-bit/10-bit K code is transmitted as controlled by data bits TXD8 through TXD15. When TKMSB is low, an 8-bit/10-bit D code is transmitted as controlled by data bits TXD8 through TXD15. TXCLK GTX_CLK 8 I Reference clock. TXCLK is a continuous external input clock that synchronizes the transmitter interface signals TKMSB, TKLSB, and TXD0–TXD15. The frequency range of TXCLK is 80 to 125 MHz. The transmitter uses the rising edge of this clock to register the 16-bit input data TXD0 through TXD15 for serialization. (2) 6 Internal 10-kΩ pulldown. Submit Documentation Feedback Copyright © 2006–2018, Texas Instruments Incorporated TLK2711-SP www.ti.com SGLS307P – JULY 2006 – REVISED FEBRUARY 2018 Pin Functions (continued) PIN NAME NO. TXD0 TXD1 TXD2 TXD3 TXD4 TXD5 TXD6 TXD7 TXD8 TXD9 TXD10 TXD11 TXD12 TXD13 TXD14 TXD15 66 67 68 2 3 4 6 7 10 11 12 14 15 16 18 20 1, 9, 24, 40, 50 VDD VDDA I/O DESCRIPTION I Transmit data bus. These inputs carry the 16-bit parallel data output from a protocol device to the transceiver for encoding, serialization, and transmission. This 16-bit parallel data is clocked into the transceiver on the rising edge of TXCLK as shown in Figure 7. Digital logic power. Provides power for all digital circuitry and digital I/O buffers. Analog power. VDDA provides a supply reference for the high-speed analog circuits, receiver, and transmitter. 59, 61 7 Specifications 7.1 Absolute Maximum Ratings over operating temperature (unless otherwise noted) (1) MIN MAX UNIT –0.3 3 V TXD0 to TXD15, ENABLE, TXCLK, TKMSB, TKLSB, LOOPEN, PRBSEN, LCKREFN, PRE, TESTEN –0.3 4 RXD0 to RXD15, RKMSB, RKLSB, RXCLK –0.3 VDD + 0.35 DINRXP, DINRXN, DOUTTXP, DOUTTXN –0.35 VDDA + 0.35 Supply voltage (2) VDD Voltage Maximum cumulative exposure of unpowered receiver to external inputs (3) V 10 hours TC Characterized case operating temperature –55 125 °C Tstg Storage temperature –65 150 °C (1) (2) (3) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. All voltage values, except differential I/O bus voltages, are stated with respect to network ground. The TLK2711-SP shows no performance degradation when an external powered transmitter sends a signal to an unpowered receiver for short periods of time (up to 10 hours of lifetime of the device). Characterization was performed using maximum VOD, minimum frequency and typical VCM from recommended operating conditions for the specified period of time. 7.2 ESD Ratings V(ESD) (1) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins (1) VALUE UNIT ±2000 V JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. Copyright © 2006–2018, Texas Instruments Incorporated Submit Documentation Feedback 7 TLK2711-SP SGLS307P – JULY 2006 – REVISED FEBRUARY 2018 www.ti.com 7.3 Recommended Operating Conditions over operating free-air temperature range (unless otherwise noted) VDD Supply voltage ICC Supply current PD Power dissipation Frequency range 1.6 Gbps to 2 Gbps Frequency range 1.6 Gbps to 2.5 Gbps MIN NOM MAX 2.375 2.5 2.625 2.5 2.6 2.7 Frequency = 1.6 Gbps, PRBS pattern 110 Frequency = 2.5 Gbps, PRBS pattern 160 Frequency = 1.6 Gbps, PRBS pattern 275 Frequency = 2.5 Gbps, PRBS pattern 400 V mA mW Frequency = 2.5 Gbps, PRBS pattern 550 Shutdown current Enable = 0, VDDA, VDD pins, VDD = MAX PLL startup lock time VDD, VDDC = 2.375 V 3 mA 0.1 Data acquisition time Tc UNIT 0.4 1024 Operating case temperature ms bits –55 125 °C 7.4 Thermal Information see (1) TLK2711-SP THERMAL METRIC (2) HFG (CFP) UNIT 68 PINS RθJA Junction-to-ambient thermal resistance 31.5 °C/W RθJC Junction-to-case thermal resistance 2.96 °C/W (1) (2) This CFP package has built-in vias that electrically and thermally connect the bottom of the die to a pad on the bottom of the package. To efficiently remove heat and provide a low-impedance ground path, a thermal land is required on the surface of the PCB directly underneath the body of the package. During normal surface mount flow solder operations, the heat pad on the underside of the package is soldered to this thermal land creating an efficient thermal path. Normally, the PCB thermal land has a number of thermal vias within it that provide a thermal path to internal copper areas (or to the opposite side of the PCB) that provide for more efficient heat removal. TI typically recommends an 11.9-mm × 11.9-mm board-mount thermal pad with a 4.2-mm × 4.2-mm solder mask defined pad attach opening. This allows maximum area for thermal dissipation, while allowing leads pad to solder pad clearance. A sufficient quantity of thermal or electrical vias must be included to keep the device within Recommended Operating Conditions. This pad must be electrically ground potential. For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report, SPRA953. 7.5 TTL Input Electrical Characteristics over recommended operating conditions (unless otherwise noted), TTL signals: TXD0–TXD15, TXCLK, LOOPEN, LCKREFN, ENABLE, PRBS_EN, TKLSB, TKMSB, PRE PARAMETER TEST CONDITIONS MIN TYP MAX 1.7 UNIT VIH High-level input voltage See Figure 1 VIL Low-level input voltage See Figure 1 0.8 V IIH Input high current VDD = MAX, VIN = 2 V 40 µA IIL Input low current VDD = MAX, VIN = 0.4 V CI Receiver input capacitance tr Rise time, TXCLK, TKMSB, TKLSB, TXD0 to TXD15 0.7 to 1.9 V, C = 5 pF, See Figure 1 tf Fall time, TXCLK, TKMSB, TKLSB, TXD0 to TXD15 1.9 to 0.7 V, C = 5 pF, See Figure 1 tsu th (1) 8 TXD0 to TXD15, TKMSB, TKLSB setup to ↑ TXCLK TXD, TKMSB, TKLSB hold to ↑ TXCLKS V –40 µA 6 pF 1 ns 1 ns See Figure 1 (1) 1.5 ns See Figure 1 (1) 0.4 ns Nonproduction tested parameters. Submit Documentation Feedback Copyright © 2006–2018, Texas Instruments Incorporated TLK2711-SP www.ti.com SGLS307P – JULY 2006 – REVISED FEBRUARY 2018 7.6 Transmitter/Receiver Electrical Characteristics PARAMETER VOD(p) VOD(pp_p) Preemphasis VOD, direct, VOD(p) = |VTXP – VTXN| Differential, peak-to-peak output voltage with preemphasis MIN TYP MAX Rt = 50 Ω, PREM = high, DC coupled, see Figure 3 TEST CONDITIONS 655 800 1100 Rt = 50 Ω, PREM = low, DC coupled, see Figure 3 590 740 1050 Rt = 50 Ω, PREM = high, DC coupled, see Figure 3 1310 1600 2200 Rt = 50 Ω, PREM = low, DC coupled, see Figure 3 1180 1480 2100 UNIT mV mVp-p VOD(d) Deemphais output voltage, |VTXP – VTXN| Rt = 50 Ω, DC coupled, see Figure 3 540 650 950 mV VOD(pp_d) Differential, peak-to-peak output voltage with deemphasis Rt = 50 Ω, DC coupled, see Figure 3 1080 1300 1900 mVp-p V(cmt) Transmit common mode voltage range, (VTXP + VTXN) / 2 Rt = 50 Ω, see Figure 3 1000 1250 1450 mV VID Receiver input voltage differential, |VRXP – VRXN| See 1600 mV V(cmr) Receiver common mode voltage range, (VRXP See + VRXN) / 2 2250 mV Ilkg Receiver input leakage current 10 µA CI Receiver input capacitance (1) 220 (1) 1000 1250 –10 4 pF Differential output jitter at 2.5 Gbps, Random + deterministic, PRBS pattern 0.28 Differential output jitter at 1.6 Gbps, Random + deterministic, PRBS pattern 0.32 Differential output signal rise, fall time (20% to 80%) RL = 50 Ω, CL = 5 pF, see Figure 3 150 Jitter tolerance eye closure Differential input jitter, random + deterministic, PRBS pattern at zero crossing (1) 0.4 latency) Tx latency See Figure 8 34 38 bits td(Rx latency) Rx latency See Figure 11 76 107 bits Serial data total jitter (peak to peak) tt, tf td(Tx (1) (2) UI (2) ps UI Nonproduction tested parameters. UI is the time interval of one serialized bit. Copyright © 2006–2018, Texas Instruments Incorporated Submit Documentation Feedback 9 TLK2711-SP SGLS307P – JULY 2006 – REVISED FEBRUARY 2018 www.ti.com 7.7 Reference Clock (TXCLK) Timing Requirements over recommended operating conditions (unless otherwise noted) PARAMETER TEST CONDITIONS Frequency MIN Receiver data rate / 20 NOM MAX UNIT –100 100 ppm Frequency tolerance –100 100 ppm Duty cycle 40% Jitter 50% 60% Peak to peak 40 ps MAX UNIT 7.8 TTL Output Switching Characteristics over recommended operating conditions (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP 2.1 2.3 VOH High-level output voltage IOH = –2 mA, VDD = MIN VOL Low-level output voltage IOL = 2 mA, VDD = MIN tr(slew) Slew rate (rising), magnitude of RXCLK, RKLSB, RKMSB, RXD0 to RXD15 0.8 V to 2 V, C = 5 pF, see Figure 2 0.5 V/ns tf(slew) Slew rate (falling), magnitude of RXCLK, RKLSB, RKMSB, RXD0 to RXD15 0.8 V to 2 V, C = 5 pF, see Figure 2 0.5 V/ns tsu RXD0 to RXD15, RKMSB, RKLSB setup to ↑ RXCLK th (1) RXD0 to RXD15, RKMSB, RKLSB hold to ↑ RXCLK V 0.25 50% voltage swing, TXCLK = 80 MHz, see Figure 2 (1) 50% voltage swing, TXCLK = 125 MHz, see Figure 2 (1) 0.5 V 3 ns 2.5 50% voltage swing, TXCLK = 80 MHz, see Figure 2 (1) 3 50% voltage swing, TXCLK = 125 MHz, see Figure 2 (1) 2 ns Nonproduction tested parameters. 3.6 V 2V TXCLK 0.8 V 0V tr tf 3.6 V 2V TKLSB, TKMSB, TXD0−TXD15 0.8 V 0V tr tsu tf th Figure 1. TTL Data Input Valid Levels for AC Measurements 10 Submit Documentation Feedback Copyright © 2006–2018, Texas Instruments Incorporated TLK2711-SP www.ti.com SGLS307P – JULY 2006 – REVISED FEBRUARY 2018 2.7 V 2V RXCLK 0.8 V 0V tr(slew) tf(slew) 2.7 V 2V RKLSB, RKMSB, RXD0−RXD15 0.8 V 0V tr(slew) tsu tf(slew) th Figure 2. TTL Data Output Valid Levels for AC Measurements VOD(p) VOD(d) VOD(pp_d) 0V VOD(pp_p) tf VOD(d) tr Bit Time Bit Time VOD(p) Figure 3. Differential and Common-Mode Output Voltage VOD(p) VOD(d) VTXN V(cmt) VTXP Bit Time Bit Time Figure 4. Common-Mode Output Voltage Definitions Copyright © 2006–2018, Texas Instruments Incorporated Submit Documentation Feedback 11 TLK2711-SP SGLS307P – JULY 2006 – REVISED FEBRUARY 2018 www.ti.com 7.9 Typical Characteristics 12 10 Tlife - Years 8 6 4 2 0 100 105 110 115 120 125 130 135 140 145 150 155 Junction Te m pe rature - °C 2.5 GBPS, PRBS = 27 – 1 Figure 5. tlife vs Junction Temperature 12 Submit Documentation Feedback Figure 6. Typical Eye Diagram Copyright © 2006–2018, Texas Instruments Incorporated TLK2711-SP www.ti.com SGLS307P – JULY 2006 – REVISED FEBRUARY 2018 8 Detailed Description 8.1 Overview The TLK2711-SP is a member of the WizardLink transceiver family of multigigabit transceivers, intended for use in ultra-high-speed bidirectional point-to-point data transmission systems. The TLK2711-SP supports an effective serial interface speed of 1.6 Gbps to 2.5 Gbps, providing up to 2 Gbps of data bandwidth. The following sections describe block-by-block features and operation of the TLK2711-SP transceiver. 8.2 Functional Block Diagram LOOPEN PRBSEN PRBSEN PRBS Generator TXP 10 TXN 10 Parallel to Serial BIAS 10 PRE MUX TKLSB 9 TKMSB 8b/10b Encoder TXD0−TXD15 18 Bit Register 9 8b/10b Encoder 2:1 10 MUX 10 Clock Synthesizer TXCLK TESTEN Controls: PLL, Bias, RX, TX ENABLE PRBSEN 2:1 MUX RKLSB 18 Bit Register 9 RKMSB PRBS Verification PRBSEN RXCLK RXD0−RXD15 Interpolator and Clock Recovery 9 Comma Detect and 8b/10b Decoding Comma Detect and 8b/10b Decoding Clock 2:1 MUX Recovered Clock 10 1:2 MUX 10 Serial to Parallel 2:1 MUX Data RXP RXN 10 Signal Detect (LOS) Copyright © 2018, Texas Instruments Incorporated Copyright © 2006–2018, Texas Instruments Incorporated Submit Documentation Feedback 13 TLK2711-SP SGLS307P – JULY 2006 – REVISED FEBRUARY 2018 www.ti.com 8.3 Feature Description 8.3.1 Transmit Interface The transmitter interface registers valid incoming 16-bit-wide data (TXD0 to TXD15) on the rising edge of the TXCLK. The data is then 8-bit/10-bit encoded, serialized, and transmitted sequentially over the differential highspeed I/O channel. The clock multiplier multiplies the reference clock (TXCLK) by a factor of 10×, creating a bit clock. This internal bit clock is fed to the parallel-to-serial shift register, which transmits data on both the rising and falling edges of the bit clock, providing a serial data rate that is 20× the reference clock. Data is transmitted least significant bit (LSB) (TXD0) first. 8.3.2 Transmit Data Bus The transmit data bus interface accepts 16-bit single-ended TTL parallel data at the TXD0–TXD15 pins. Data and K-code control is valid on the rising edge of the TXCLK. The TXCLK is used as the word clock. The data, Kcode, and clock signals must be properly aligned as shown in Figure 7. Detailed timing information can be found in the Transmitter/Receiver Electrical Characteristics. TXCLK TXD0−TXD15 tsu th TKLSB, TKMSB Figure 7. Transmit Timing Waveform 8.3.3 Data Transmission Latency The data transmission latency of the TLK2711-SP is defined as the delay from the initial 16-bit word load to the serial transmission of bit 0. The transmit latency is fixed after the link is established. However, due to silicon process variations and implementation variables such as supply voltage and temperature, the exact delay varies slightly. The minimum transmit latency td(Tx latency) is 34 bit times; the maximum is 38 bit times. Figure 8 shows the timing relationship between the transmit data bus, TXCLK, and serial transmit pins. Transmitted 20-Bit Word TXP, TXN td(Tx latency) TXD0−TXD15 16-Bit Word to Transmit TXCLK Figure 8. Transmitter Latency 14 Submit Documentation Feedback Copyright © 2006–2018, Texas Instruments Incorporated TLK2711-SP www.ti.com SGLS307P – JULY 2006 – REVISED FEBRUARY 2018 Feature Description (continued) 8.3.4 8-Bit/10-Bit Encoder All true serial interfaces require a method of encoding to ensure minimum transition density, so that the receiving phase-locked loop (PLL) has a minimal number of transitions to stay locked on. The encoding scheme maintains the signal DC balance by keeping the number of 1s and 0s the same. This provides good transition density for clock recovery and improves error checking. The TLK2711-SP uses the 8-bit/10-bit encoding algorithm that is used by fibre channel and gigabit ethernet. This is transparent to the user, as the TLK2711-SP internally encodes and decodes the data such that the user reads and writes actual 16-bit data. The 8-bit/10-bit encoder converts 8-bit-wide data to a 10-bit-wide encoded data character to improve its transmission characteristics. Because the TLK2711-SP is a 16-bit-wide interface, the data is split into two 8-bitwide bytes for encoding. Each byte is fed into a separate encoder. The encoding is dependent upon two additional input signals, TKMSB and TKLSB. Table 1. Transmit Data Controls TKLSB TKMSB 0 0 Valid data on TXD0 to TXD7 16-BIT PARALLEL INPUT Valid data TXD8 to TXD15 0 1 Valid data on TXD0 to TXD7 K code on TXD8 to TXD15 1 0 K code on TXD0 to TXD7 Valid data on TXD8 to TXD15 1 1 K code on TXD0 to TXD7 K code on TXD8 to TXD15 8.3.5 Pseudo-Random Bit Stream (PRBS) Generator The TLK2711-SP has a built-in 27 – 1 PRBS function. When the PRBSEN pin is forced high, the PRBS test is enabled. A PRBS is generated and fed into the 10-bit parallel-to-serial converter input register. Data from the normal input source is ignored during the PRBS mode. The PRBS pattern is then fed through the transmit circuitry as if it were normal data and sent out to the transmitter. The output can be sent to a bit error rate tester (BERT), the receiver of another TLK2711-SP, or looped back to the receive input. Because the PRBS is not really random, but a predetermined sequence of 1s and 0s, the data can be captured and checked for errors by a BERT. 8.3.6 Parallel to Serial The parallel-to-serial shift register takes in the 20-bit-wide data word multiplexed from the two parallel 8-bit/10-bit encoders and converts it to a serial stream. The shift register is clocked on both the rising and falling edge of the internally generated bit clock, which is 10× the TXCLK input frequency. The LSB (TXD0) is transmitted first. 8.3.7 High-Speed Data Output The high-speed data output driver consists of a voltage mode logic (VML) differential pair optimized for a 50-Ω impedance environment. The magnitude of the differential-pair signal swing is compatible with pseudo emitter coupled logic (PECL) levels when AC coupled. The line can be directly coupled or AC coupled. See Figure 13 and Figure 14 for termination details. The outputs also provide preemphasis to compensate for AC loss when driving a cable or PCB backplane trace over a long distance (see Figure 9). The level of preemphasis is controlled by PRE (see Table 2). VOD(p) Table 2. Programmable Preemphasis VOD(d) 0V PRE PREEMPHASIS LEVEL (%) VOD(P), VOD(D) (1) 0 5% 1 20% VOD(d) Bit Time Bit Time VOD(p) Figure 9. Output Voltage Under Preemphasis (VTXP to VTXN) Copyright © 2006–2018, Texas Instruments Incorporated (1) VOD(p): Voltage swing when there is a transition in the data stream. VOD(d): Voltage swing when there is no transition in the data stream. Submit Documentation Feedback 15 TLK2711-SP SGLS307P – JULY 2006 – REVISED FEBRUARY 2018 www.ti.com 8.3.8 Receive Interface The receiver interface of the TLK2711-SP accepts 8-bit/10-bit encoded differential serial data. The interpolator and clock recovery circuit locks to the data stream and extracts the bit-rate clock. This recovered clock is used to retime the input data stream. The serial data is then aligned to two separate 10-bit word boundaries, 8-bit/10-bit decoded, and output on a 16-bit-wide parallel bus synchronized to the extracted receive clock. The data is received LSB (RXD0) first. 8.3.9 Receive Data Bus The receive bus interface drives 16-bit-wide single-ended TTL parallel data at the RXD0 to RXD15 pins. Data is valid on the rising edge of the RXCLK. The RXCLK is used as the recovered word clock. The data, RKLSB, RKMSB, and clock signals are aligned as shown in Figure 10. Detailed timing information can be found in the TTL Output Switching Characteristics. RXCLK RXD0−RXD15 tsu th RKLSB, RKMSB Figure 10. Receive Timing Waveform 8.3.10 Data Reception Latency The serial-to-parallel data receive latency is the time from when the first bit arrives at the receiver until it is output in the aligned parallel word. The receive latency is fixed after the link is established. However, due to silicon process variations and implementation variables such as supply voltage and temperature, the exact delay varies slightly. The minimum receive latency td(Rx latency) is 76-bit times; the maximum is 107-bit times. Figure 11 shows the timing relationship between the serial receive pins, the recovered word clock (RXCLK), and the receive data bus. 20-Bit Encoded Word RXN, RXP td(Rx latency) RXD0−RXD15 16-Bit Decoded Word RXCLK Figure 11. Receiver Latency 8.3.11 Serial to Parallel Serial data is received on the RXP and RXN pins. The interpolator and clock recovery circuit locks to the data stream if the clock to be recovered is within 200 PPM of the internally generated bit rate clock. The recovered clock is used to retime the input data stream. The serial data is then clocked into the serial-to-parallel shift registers. The 10-bit-wide parallel data is then multiplexed and fed into two separate 8-bit/10-bit decoders, where the data is then synchronized to the incoming data stream word boundary by detection of the comma 8-bit/10-bit synchronization pattern. 16 Submit Documentation Feedback Copyright © 2006–2018, Texas Instruments Incorporated TLK2711-SP www.ti.com SGLS307P – JULY 2006 – REVISED FEBRUARY 2018 8.3.12 Comma Detect and 8-Bit/10-Bit Decoding The TLK2711-SP has two parallel 8-bit/10-bit decode circuits. Each 8-bit/10-bit decoder converts 10-bit encoded data (half of the 20-bit received word) back into 8 bits. The comma-detect circuit is designed to provide for byte synchronization to an 8-bit/10-bit transmission code. When parallel data is clocked into a parallel-to-serial converter, the byte boundary that was associated with the parallel data is now lost in the serialization of the data. When the serial data is received and converted to parallel format again, a method is needed to recognize the byte boundary. Typically, this is accomplished through the use of a synchronization pattern. This is typically a unique pattern of 1s and 0s that either cannot occur as part of valid data or is a pattern that repeats at defined intervals. The 8-bit/10-bit encoding contains a character called the comma (b0011111 or b1100000), which is used by the comma-detect circuit on the TLK2711-SP to align the received serial data back to its original byte boundary. The decoder detects the comma, generating a synchronization signal aligning the data to their 10-bit boundaries for decoding; the comma is mapped into the LSB. The decoder then converts the data back into 8-bit data. The output from the two decoders is latched into the 16-bit register synchronized to the recovered parallel data clock (RXCLK) and output valid on the rising edge of the RXCLK. NOTE The TLK2711-SP only achieves byte alignment on the 0011111 comma. Decoding provides two additional status signals, RKLSB and RKMSB. When RKLSB is asserted, an 8-bit/10-bit K code is received and the specific K code is presented on the data bits RXD0 to RXD7; otherwise, an 8-bit/10bit D code is received. When RKMSB is asserted, an 8-bit/10-bit K code is received and the specific K-code is presented on data bits RXD8 to RXD15; otherwise, an 8-bit/10-bit D code is received (see Table 3). The valid K codes the TLK2711-SP; decodes are provided in Table 4. An error detected on either byte, including K codes not in Table 4, causes that byte only to indicate a K0.0 code on the RKxSB and associated data pins, where K0.0 is known to be an invalid 8-bit/10-bit code. A loss of input signal causes a K31.7 code to be presented on both bytes, where K31.7 is also known to be an invalid 8-bit/10-bit code. Table 3. Receive Status Signals RKLSB RKMSB 0 0 Valid data on RXD0 to RXD7 DECODED 20-BIT OUTPUT Valid data RXD8 to RXD15 0 1 Valid data on RXD0 to RXD7 K code on RXD8 to RXD15 1 0 K code on RXD0 to RXD7 Valid data on RXD8 to RXD15 1 1 K code on RXD0 to RXD7 K code on RXD8 to RXD15 Table 4. Valid K Characters K CHARACTER RECEIVE DATA BUS RXD7:RXD0 OR RXD15:RXD8 K28.0 000 11100 K28.1 (1) 001 11100 K28.2 010 11100 K28.3 011 11100 K28.4 100 11100 K28.5 (1) 101 11100 K28.6 110 11100 K28.7 (1) (1) 111 11100 K23.7 111 10111 K27.7 111 11011 K29.7 111 11101 K30.7 111 11110 Should only be present on RXD0 to RXD7 when in running disparity < 0. Copyright © 2006–2018, Texas Instruments Incorporated Submit Documentation Feedback 17 TLK2711-SP SGLS307P – JULY 2006 – REVISED FEBRUARY 2018 www.ti.com 8.3.13 LOS Detection The TLK2711-SP has a LOS detection circuit for conditions where the incoming signal no longer has a sufficient voltage level to keep the clock recovery circuit in lock. The signal detection circuit is intended to be an indication of gross signal error conditions, such as a detached cable or no signal being transmitted, and not an indication of signal coding health. The TLK2711-SP reports this condition by asserting RKLSB, RKMSB, and RXD0 to RXD15 pins to a high state. As long as the differential signal is above 200 mV in differential magnitude, the LOS circuit does not signal an error condition. When the device is disabled (ENABLE = L), RKMSB will output the status of LOS. Active low = LOS detected. 8.3.14 PRBS Verification The TLK2711-SP also has a built-in BERT function in the receiver side that is enabled by the PRBSEN. It can check for errors and report the errors by forcing the RKLSB pin low. 8.3.15 Reference Clock Input The reference clock (TXCLK) is an external input clock that synchronizes the transmitter interface. The reference clock is then multiplied in frequency 10× to produce the internal serialization bit clock. The internal serialization bit clock is frequency locked to the reference clock and used to clock out the serial transmit data on both its rising and falling edges, providing a serial data rate that is 20× the reference clock. 8.3.16 Operating Frequency Range The TLK2711-SP operates at a serial data rate from 1.6 to 2.5 Gbps. To achieve these serial rates, TXCLK must be within 80 to 125 MHz. The TXCLK must be within ±100 PPM of the desired parallel data rate clock. 8.3.17 Testability The TLK2711-SP has a comprehensive suite of built-in self-tests. The loopback function provides for at-speed testing of the transmit/receive portions of the circuitry. The enable pin allows for all circuitry to be disabled so that a quiescent current test can be performed. The PRBS function allows for built-in self-test (BIST). 8.3.18 Loopback Testing The transceiver can provide a self-test function by enabling (LOOPEN) the internal loopback path. Enabling this pin causes serial-transmitted data to be routed internally to the receiver. The parallel data output can be compared to the parallel input data for functional verification. The external differential output is held in a highimpedance state during the loopback testing. 8.3.19 BIST The TLK2711-SP has a BIST function. By combining PRBS with loopback, an effective self-test of all the circuitry running at full speed can be realized. The successful completion of the BIST is reported on the RKLSB pin. 8.3.20 Power-On Reset Upon application of minimum valid power and valid GTX_CLK with device enabled (ENABLE = HIGH), the TLK2711-SP generates a power-on reset. During the power-on reset the RXD0 to RXD15, RKLSB, and RKMSB signal pins go to a high-impedance state. The RXCLK is held low. LCKREFN must be deasserted (logic high state) with active transitions on the receiver during the power-on reset period. Active transitions on receiver can be accomplished with transitions on RXP/N or by assertion of LOOPEN. For TX-only applications, LOOPEN and LCKREFN can be driven logic high together. The receiver circuit requires this to properly reset. After power-up reset period, LCKREFN can be asserted for transmit only applications. The length of the power-on reset cycle depends on the TXCLK frequency, but is less than 1 ms. See Figure 12 . TI recommends that the receiver be reset immediately after power up. In some conditions, it is possible for the receiver circuit to power up in state with internal contention. If LCKREFN cannot be deasserted high during or for the complete power-on reset period, it can be deasserted high at the end of or after the power-on reset period for minimum of 1 µs with active transitions on receiver to properly complete reset of receiver. 18 Submit Documentation Feedback Copyright © 2006–2018, Texas Instruments Incorporated TLK2711-SP www.ti.com SGLS307P – JULY 2006 – REVISED FEBRUARY 2018 Min VCC/VCCA 2.375 V VCC/VDDA GTX_CLK ENABLE Internal Power-On Reset Complete LCKREFN RXP/N data or LOOPEN Min 1 ms Min 1 ms Min 1 ms Min 1 ms Min 1 ms Figure 12. Power-On/Reset Timing Diagram Copyright © 2006–2018, Texas Instruments Incorporated Submit Documentation Feedback 19 TLK2711-SP SGLS307P – JULY 2006 – REVISED FEBRUARY 2018 www.ti.com 8.4 Device Functional Modes 8.4.1 Power-Down Mode The TLK2711-SP goes into power-down mode when the ENABLE pin is pulled low. In the power-down mode, the serial transmit pins (TXN), the receive data bus pins (RXD0 to RXD15), and RKLSB goes into a high-impedance state. In the power-down condition, the signal detection circuit draws less than 15 mW. When the TLK2711-SP is in the power-down mode, the clock signal on the TXCLK pin must be provided if LOS functionality is needed. 8.4.2 High-Speed I/O Directly-Coupled Mode TXP 50 Ω RXP VDDA Transmission Line 50 Ω 4 kΩ 50 Ω 6 kΩ 50 Ω TXN Transmitter Transmission Line Media + _ GND RXN Receiver Figure 13. High-Speed I/O Directly-Coupled Mode Schematic 8.4.3 High-Speed I/O AC-Coupled Mode TXP 50 Ω RXP VDDA Transmission Line 50 Ω 4 kΩ 50 Ω 6 kΩ 50 Ω TXN Transmitter Transmission Line Media + _ GND RXN Receiver Figure 14. High-Speed I/O AC-Coupled Mode Schematic 20 Submit Documentation Feedback Copyright © 2006–2018, Texas Instruments Incorporated TLK2711-SP www.ti.com SGLS307P – JULY 2006 – REVISED FEBRUARY 2018 9 Application and Implementation NOTE Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes. Customers should validate and test their design implementation to confirm system functionality. 9.1 Application Information The TLK2711-SP may be operated as full link with send/receive functions or each end of link may be transmit only or receive only. The transmitter is always operational in either case as GTX_CLK is required to source the PLL. In transmit only cases, LCKREFN can be pulled low to disable the RX interface. See Power-On Reset for requirements. Copyright © 2006–2018, Texas Instruments Incorporated Submit Documentation Feedback 21 TLK2711-SP SGLS307P – JULY 2006 – REVISED FEBRUARY 2018 www.ti.com 9.2 Typical Application 1 nF−10 nF† 1 nF−10 nF† 1 nF−10 nF† 1 nF−10 nF† Recommended use of 0.01-µF capacitor per VDD terminal 0.01 µF 5 Ω at 100 MHz RXD1 RXD2 RXD0 RXD3 TXD5 4 48 RXD4 GND 5 47 RXD5 TXD6 6 46 RXD6 TXD7 7 45 GND GTX_CLK 8 44 RXD7 VDD 9 43 RX_CLK TXD8 10 42 RXD8 TXD9 11 41 RXD9 TXD10 12 40 VDD GND 13 39 RXD10 TXD11 14 38 RXD11 TXD12 15 37 RXD12 TXD13 16 36 RXD13 GND 49 DINRXN 3 GND DINRXP VDD TXD4 PRE 50 VDDA 2 GND TXD3 DOUTTXP 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 DOUTTXN 1 GND VDD GND GND GND RXD14 RXD15 RKLSB RKMSB GND TESTEN PRBSEN LCKREFN TKLSB VDD ENABLE TXD15 TKMSB LOOPEN GND 17 35 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 TXD14 GND † TXD0 TXD2 TXD1 0.01 µF 0.01 µF 0.01 µF 0.01 µF VDDA VDD For ac coupling Copyright © 2018, Texas Instruments Incorporated Figure 15. External Component Interconnection 22 Submit Documentation Feedback Copyright © 2006–2018, Texas Instruments Incorporated TLK2711-SP www.ti.com SGLS307P – JULY 2006 – REVISED FEBRUARY 2018 Typical Application (continued) 9.2.1 Design Requirements Input conditions in the data sheet were created and validated to achieve a bit error rate (BER) of 1 error in 1E12 bits or better. Other aspects that affect BER are power supply noise, quality (loss), and matching of 50-Ω controlled impedance for transmit and receive differential pins. 9.2.2 Detailed Design Procedure Detailed design procedures involve careful examination of system properties, design, and error rate goals. Understanding these properties allows for creation of jitter budget to ensure design BER goals are achieved. Application note SLLA071 is based on the TLK2500. The TLK2500 shares the same architecture and similar jitter properties. 9.2.3 Application Curves 2.5 850 2.0 800 VOUT_Differential (mV) VOUT (V) Figure 16 shows typical TTL output voltage characteristics at maximum 2-mA load at minimum VCC = 2.375 V. Figure 17 shows typical differential output voltage VOD(p) across temperature for each preemphasis condition at minimum VCC = 2.375 V. 1.5 VOH VOL 1.0 0.5 750 700 650 VOD(1) VOD(0) 0.0 600 ±75 ±50 ±25 0 25 50 75 100 Temperature (ƒC) VCC = 2.375 V 125 150 ±75 IOH/IOL = ±2 mA VOD VOD Figure 16. VOH/VOL vs Temperature Copyright © 2006–2018, Texas Instruments Incorporated ±50 ±25 0 25 50 75 100 125 Temperature (ƒC) C001 150 C002 VCC = 2.375 V (0) represents 5% emphasis enabled. (1) represents 20% emphasis enabled. Figure 17. VOD (0), VOD (1) vs Temperature Submit Documentation Feedback 23 TLK2711-SP SGLS307P – JULY 2006 – REVISED FEBRUARY 2018 www.ti.com 10 Power Supply Recommendations Power supplies must be within recommended operating range and should have less than 100 mV of ripple. Exceeding 100-mV ripple can impact transmitted jitter and receiver jitter tolerance. VDDA should be filtered from VDD. Filter values should be set to minimize any frequency components from power supply and/or digital logic that may exist in the system in the range of the PLL jitter transfer characteristics. The PLL is sensitive to noise in the range of 300 kHz to 3 MHz. 11 Layout 11.1 Layout Guidelines Standard high-speed differential routing best practices must be employed. Routing should be 50-Ω matched impedance and length for differential transmit and receive. Minimize layer transitions and stubs to reduce any impedance mismatches. Connecting the thermal pad to board ground improves device performance by supplying lower impedance path to ground minimizing ground bounce and improves thermal dissipation. 11.2 Layout Example Figure 18. Layout Recommendation 24 Submit Documentation Feedback Copyright © 2006–2018, Texas Instruments Incorporated TLK2711-SP www.ti.com SGLS307P – JULY 2006 – REVISED FEBRUARY 2018 12 Device and Documentation Support 12.1 Receiving Notification of Documentation Updates To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper right corner, click on Alert me to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document. 12.2 Community Resources The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers. Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support. 12.3 Trademarks E2E is a trademark of Texas Instruments. All other trademarks are the property of their respective owners. 12.4 Electrostatic Discharge Caution These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. 12.5 Glossary SLYZ022 — TI Glossary. This glossary lists and explains terms, acronyms, and definitions. 13 Mechanical, Packaging, and Orderable Information The following pages include mechanical, packaging, and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation. Copyright © 2006–2018, Texas Instruments Incorporated Submit Documentation Feedback 25 PACKAGE OPTION ADDENDUM www.ti.com 10-Jun-2022 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan (2) Lead finish/ Ball material MSL Peak Temp Op Temp (°C) (3) Device Marking Samples (4/5) (6) 5962-0522101VXC ACTIVE CFP HFG 68 1 RoHS-Exempt & Green Call TI N / A for Pkg Type -55 to 125 TLK2711HFG/EM ACTIVE CFP HFG 68 1 RoHS-Exempt & Green Call TI N / A for Pkg Type 25 to 25 59620522101VXC TLK2711HFGQMLV TLK2711HFG/EM EVAL ONLY (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
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