TLV5628C, TLV5628I
OCTAL 8-BIT DIGITAL-TO-ANALOG CONVERTERS
SLAS108A – JANUARY 1995 – REVISED NOVEMBER 1995
D
D
D
D
D
D
D
D
D
DW OR N PACKAGE
(TOP VIEW)
Eight 8-Bit Voltage Output DACs
3-V Single Supply Operation
Serial Interface
High-Impedance Reference Inputs
Programmable for 1 or 2 Times Output
Range
Simultaneous Update Facility
Internal Power-On Reset
Low Power Consumption
Half-Buffered Output
DACB
DACA
GND
DATA
CLK
VDD
DACE
DACF
1
16
2
15
3
14
4
13
5
12
6
11
7
10
8
9
DACC
DACD
REF1
LDAC
LOAD
REF2
DACH
DACG
applications
D
D
D
D
D
D
Programmable Voltage Sources
Digitally Controlled Amplifiers/Attenuators
Mobile Communications
Automatic Test Equipment
Process Monitoring and Control
Signal Synthesis
description
The TLV5628C and TLV5628I are octal 8-bit voltage output digital-to-analog converters (DACs) with buffered
reference inputs (high impedance). The DACs produce an output voltage that varies between one or two times
the reference voltages and GND, and the DACs are monotonic. The device is simple to use, running from a
single supply of 3 to 3.6 V. A power-on reset function is incorporated to ensure repeatable start-up conditions.
Digital control of the TLV5628C and TLV5628I is over a simple 3-wire serial bus that is CMOS compatible and
easily interfaced to all popular microprocessor and microcontroller devices. The 12-bit command word
comprises 8 bits of data, 3 DAC select bits and a range bit, the latter allowing selection between the times 1
or times 2 output range. The DAC registers are double buffered, allowing a complete set of new values to be
written to the device, then all DAC outputs are updated simultaneously through control of the LDAC terminal.
The digital inputs feature Schmitt triggers for high noise immunity.
The 16-terminal small-outline D package allows digital control of analog functions in space-critical applications.
The TLV5628C is characterized for operation from 0°C to 70°C. The TLV5628I is characterized for operation
from – 40°C to 85°C. The TLV5628C and TLV5628I do not require external trimming.
AVAILABLE OPTIONS
PACKAGE
TA
SMALL OUTLINE
(DW)
PLASTIC DIP
(N)
0°C to 70°C
TLV5628CDW
TLV5628CN
– 40°C to 85°C
TLV5628IDW
TLV5628IN
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright 1995, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
1
TLV5628C, TLV5628I
OCTAL 8-BIT DIGITAL-TO-ANALOG CONVERTERS
SLAS108A – JANUARY 1995 – REVISED NOVEMBER 1995
functional block diagram
REF1
+
–
DAC
9
Latch
Latch
8
Latch
Latch
8
Latch
Latch
8
Latch
Latch
8
DAC
REF2
+
–
DAC
DAC
CLK
DATA
Serial
Interface
×2
+
–
DACA
×2
+
–
DACD
×2
+
–
DACE
×2
+
–
DACH
Power-On
Reset
LDAC
LOAD
Terminal Functions
TERMINAL
NAME
2
NO.
I/O
DESCRIPTION
CLK
5
I
Serial-interface clock, data enters on the negative edge
DACA
2
O
DACA analog output
DACB
1
O
DACB analog output
DACC
16
O
DACC analog output
DACD
15
O
DACD analog output
DACE
7
O
DACE analog output
DACF
8
O
DACF analog output
DACG
9
O
DACG analog output
DACH
10
O
DACH analog output
DATA
4
I
Serial-interface digital data input
GND
3
I
Ground return and reference terminal
LDAC
13
I
DAC-update latch control
LOAD
12
I
Serial-interface load control
REF1
14
I
Reference voltage input to DACA
REF2
11
I
Reference voltage input to DACB
VDD
6
I
Positive supply voltage
POST OFFICE BOX 655303
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TLV5628C, TLV5628I
OCTAL 8-BIT DIGITAL-TO-ANALOG CONVERTERS
SLAS108A – JANUARY 1995 – REVISED NOVEMBER 1995
detailed description
The TLV5628 is implemented using eight resistor-string DACs. The core of each DAC is a single resistor with
256 taps, corresponding to the 256 possible codes listed in Table 1. One end of each resistor string is connected
to the GND terminal and the other end is fed from the output of the reference input buffer. Monotonicity is
maintained by use of the resistor strings. Linearity depends upon the matching of the resistor elements and upon
the performance of the output buffer. Because the inputs are buffered, the DACs always present a
high-impedance load to the reference sources. There are two input reference terminals; REF1 is used for DACA
through DACD and REF2 is used by DACE through DACH.
Each DAC output is buffered by a configurable-gain output amplifier, which can be programmed to times 1 or
times 2 gain.
On power-up, the DACs are reset to CODE 0.
Each output voltage is given by:
V (DACA|B|C|D|E|F|G|H)
O
+ REF
CODE
256
(1
) RNG bit value)
where CODE is in the range of 0 to 255 and the range (RNG) bit is a 0 or 1 within the serial-control word.
data interface
With LOAD high, data is clocked into the DATA terminal on each falling edge of CLK. Once all data bits have
been clocked in, LOAD is pulsed low to transfer the data from the serial-input register to the selected DAC as
shown in Figure 1. When LDAC is low, the selected DAC output voltage is updated and LOAD goes low. When
LDAC is high during serial programming, the new value is stored within the device and can be transferred to
the DAC output at a later time by pulsing LDAC low as shown in Figure 2. Data is entered MSB first. Data
transfers using two 8 clock cycle periods are shown in Figures 3 and 4.
CLK
tsu(DATA-CLK)
tv(DATA-CLK)
DATA
A2
A1
A0
tsu(LOAD-CLK)
RNG
D7
D6
D5
D4
D2
D1
D0
tsu(CLK-LOAD)
tw(LOAD)
LOAD
DAC Update
Figure 1. LOAD-Controlled Update (LDAC = Low)
CLK
tsu(DATA-CLK)
tv(DATA-CLK)
DATA
A2
A1
A0
RNG
D7
D6
D5
D4
D2
D1
D0
tsu(LOAD – LDAC)
LOAD
tw(LDAC)
LDAC
DAC Update
Figure 2. LDAC-Controlled Update
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
3
LOAD
ÎÎÎÎÎÎÎÎÎÎÎ
ÎÎÎÎÎÎÎÎÎÎÎ
A1
A0
ÎÎÎÎ
ÎÎÎÎ
RNG
D7
D6
D5
D4
D3
ÎÎÎÎ
ÎÎÎÎ
D2
D1
D0
D2
D1
D0
LDAC
Figure 3. Load Controlled Update Using 8-Bit Serial Word (LDAC = Low)
CLK Low
CLK
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
DATA
ÎÎÎÎÎÎÎÎÎÎÎ
ÎÎÎÎÎÎÎÎÎÎÎ
A1
A0
ÎÎÎ
ÎÎÎ
RNG
D7
D6
D5
D4
LOAD
LDAC
Figure 4. LDAC Controlled Update Using 8-Bit Serial Word
D3
ÎÎÎÎÎ
ÎÎÎÎÎ
Template Release Date: 7–11–94
DATA
TLV5628C, TLV5628I
OCTAL 8-BIT DIGITAL-TO-ANALOG CONVERTERS
CLK
SLAS108A – JANUARY 1995 – REVISED NOVEMBER 1995
4
CLK Low
TLV5628C, TLV5628I
OCTAL 8-BIT DIGITAL-TO-ANALOG CONVERTERS
SLAS108A – JANUARY 1995 – REVISED NOVEMBER 1995
data interface (continued)
Table 2 lists the A2, A1, and A0 bits and the selection of the updated DACs. The RNG bit controls the DAC output
range. When RNG = low, the output range is between the applied reference voltage and GND, and when
RNG = high, the range is between twice the applied reference voltage and GND.
Table 1. Ideal Output Transfer
D7
D6
D5
D4
D3
D2
D1
D0
0
0
0
0
0
0
0
0
OUTPUT VOLTAGE
GND
0
0
0
0
0
0
0
1
(1/256) × REF (1+RNG)
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
0
1
1
1
1
1
1
1
(127/256) × REF (1+RNG)
1
0
0
0
0
0
0
0
(128/256) × REF (1+RNG)
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
1
1
1
1
1
1
1
1
(255/256) × REF (1+RNG)
Table 2. Serial Input Decode
A2
A1
A0
DAC UPDATED
0
0
0
DACA
0
0
1
DACB
0
1
0
DACC
0
1
1
DACD
1
0
0
DACE
1
0
1
DACF
1
1
0
DACG
1
1
1
DACH
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5
TLV5628C, TLV5628I
OCTAL 8-BIT DIGITAL-TO-ANALOG CONVERTERS
SLAS108A – JANUARY 1995 – REVISED NOVEMBER 1995
linearity, offset, and gain error
When an amplifier is operated from a single supply, the voltage offset can still be either positive or negative. With
a positive offset, the output voltage changes on the first code change. With a negative offset the output voltage
may not change with the first code depending on the magnitude of the offset voltage.
The output amplifier, with a negative voltage offset, attempts to drive the output to a negative voltage. However,
since the most negative supply rail is ground, the output cannot drive to a negative voltage.
So when the output offset voltage is negative, the output voltage remains at 0 volts until the input code value
produces a sufficient output voltage to overcome the inherent negative offset voltage resulting in the transfer
function shown in Figure 5.
Output
Voltage
0V
DAC Code
Negative
Offset
Figure 5. Effect of Negative Offset (Single Supply)
The negative offset error produces a breakpoint, not a linearity error. The transfer function would follow the
dotted line if the output buffer could drive to a negative voltage.
For a DAC, linearity is measured between zero input code (all inputs 0) and full scale code (all inputs 1) after
offset and full scale is adjusted out or accounted for in some way. However, single supply operation does not
allow for adjustment when the offset is negative due to the breakpoint in the transfer function. The linearity in
the unipolar mode is measured between full scale code and the lowest code which produces a positive output
voltage.
The code is calculated from the maximum specification for the negative offset.
equivalent inputs and outputs
INPUT CIRCUIT
OUTPUT CIRCUIT
VDD
VDD
_
Input from
Decoded DAC
Register String
Vref
Input
To DAC
Resistor
String
+
DAC
Voltage Output
×1
Output
Range × 2
Select
84 kΩ
84 kΩ
GND
6
ISINK
60 µA
Typical
GND
POST OFFICE BOX 655303
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TLV5628C, TLV5628I
OCTAL 8-BIT DIGITAL-TO-ANALOG CONVERTERS
SLAS108A – JANUARY 1995 – REVISED NOVEMBER 1995
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)†
Supply voltage (VDD – GND) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V
Digital input voltage range, VID . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . GND – 0.3 V to VDD + 0.3 V
Reference input voltage range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . GND – 0.3 V to VDD + 0.3 V
Operating free-air temperature range, TA: TLV5628C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C
TLV5628I . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 40°C to 85°C
Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 50°C to 150°C
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 230°C
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
recommended operating conditions
Supply voltage, VDD
High-level digital input voltage, VIH
MIN
NOM
MAX
UNIT
2.7
3.3
5.25
V
0.8 VDD
Low-level digital input voltage, VIL
V
0.8
Reference voltage, Vref [A|B|C|D|E|F|G|H], X1 gain
VDD– 1.5
V
V
Load resistance, RL
10
kΩ
Setup time, data input, tsu(DATA-CLK) (see Figures 1 and 2)
50
ns
Valid time, data input valid after CLK↓, tv(DATA-CLK) (see Figures 1 and 2)
50
ns
Setup time, CLK eleventh falling edge to LOAD, tsu(CLK-LOAD) (see Figure 1)
50
ns
Setup time, LOAD↑ to CLK↓, tsu(LOAD-CLK) (see Figure 1)
50
ns
Pulse duration, LOAD, tw(LOAD) (see Figure 1)
250
ns
Pulse duration, LDAC, tw(LDAC) (see Figure 2)
250
ns
Setup time, LOAD↑ to LDAC↓, tsu(LOAD-LDAC) (see Figure 2)
0
CLK frequency
Operating free-air
free air temperature,
temperature TA
TLV5628C
TLV5628I
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
ns
1
MHz
0
70
°C
– 40
85
°C
7
TLV5628C, TLV5628I
OCTAL 8-BIT DIGITAL-TO-ANALOG CONVERTERS
SLAS108A – JANUARY 1995 – REVISED NOVEMBER 1995
electrical characteristics over recommended operating free-air temperature range,
VDD = 3 V to 3.6 V, Vref = 2 V, × 1 gain output range (unless otherwise noted)
PARAMETER
IIH
IIL
High-level digital input current
IO(sink)
IO(source)
Output sink current
Ci
TEST CONDITIONS
Low-level digital input current
Each DAC output
Output source current
Linearity error (end point corrected)
EZS
Zero-scale error
Zero-scale error temperature coefficient
Full-scale error temperature coefficient
Vref = 1.25 V, × 2 gain (see Note 5)
Vref = 1.25 V, × 2 gain (see Note 6)
Power supply sensitivity
See Notes 7 and 8
Full-scale error
µA
pF
4
Vref = 1.5 V
Vref = 1.25 V, × 2 gain (see Note 1)
Vref = 1.25 V, × 2 gain (see Note 2)
Vref = 1.25 V, × 2 gain (see Note 3)
Vref = 1.25 V, × 2 gain (see Note 4)
± 10
µA
VDD = 3.3 V
VDD = 3.3 V,
Differential linearity error
µA
mA
15
Reference input current
UNIT
± 10
1
15
EL
ED
MAX
20
Reference input capacitance
Supply current
PSRR
TYP
Input capacitance
IDD
Iref
EFS
MIN
VI = VDD
VI = 0 V
0
mA
± 10
µA
±1
LSB
± 0.9
LSB
30
mV
µV/°C
10
± 60
mV
± 25
µV/°C
0.5
mV/V
NOTES: 1. Integral nonlinearity (INL) is the maximum deviation of the output from the line between zero-scale and full scale (excluding the
effects of zero code and full-scale errors).
2. Differential nonlinearity (DNL) is the difference between the measured and ideal 1 LSB amplitude change of any two adjacent codes.
Monotonic means the output voltage changes in the same direction (or remains constant) as a change in the digital input code.
3. Zero-scale error is the deviation from zero voltage output when the digital input code is zero.
4. Zero-scale error temperature coefficient is given by: ZSETC = [ZSE(Tmax) – ZSE(Tmin)]/Vref × 106/(Tmax – Tmin).
5. Full-scale error is the deviation from the ideal full-scale output (Vref – 1 LSB) with an output load of 10 kΩ .
6. Full-scale temperature coefficient is given by: FSETC = [FSE(Tmax) – FSE (Tmin)]/Vref × 106/(Tmax – Tmin).
7. Zero-scale error rejection ratio (ZSE-RR) is measured by varying the VDD voltage from 4.5 V to 5.5 V dc and measuring the effect
of this signal on the zero-code output voltage.
8. Full-scale error rejection ratio (FSE-RR) is measured by varing the VDD voltage from 3 V to 3.6 V dc and measuring the effect of
this signal on the full-scale output voltage.
operating characteristics over recommended operating free-air temperature range,
VDD = 3 V to 3.6 V, Vref = 2 V, × 1 gain output range (unless otherwise noted)
TEST CONDITIONS
Output slew rate
CL = 100 pF,
RL = 10 kΩ
Output settling time
To 0.5 LSB,
CL = 100 pF,
Large-signal bandwidth
MIN
TYP
1
MAX
UNIT
V/µs
10
µs
Measured at – 3 dB point
100
kHz
Digital crosstalk
CLK = 1-MHz square wave measured at DACA-DACH
– 50
dB
Reference feedthrough
See Note 10
– 60
dB
Channel-to-channel isolation
See Note 11
– 60
dB
Reference input bandwidth
See Note 12
100
kHz
RL = 10 kΩ, See Note 9
NOTES: 9. Settling time is the time for the output signal to remain within ± 0.5 LSB of the final measured value for a digital input code change
of 00 hex to FF hex or FF hex to 00 hex. For TLC5628C VDD = 5 V, Vref = 2 V and range = × 2. For TLC5628I VDD = 3 V,
Vref = 1.25 V and range × 2.
10. Reference feedthrough is measured at any DAC output with an input code = 00 hex with a Vref input = 1 V dc + 1 VPP at 10 kHz.
11. Channel-to-channel isolation is measured by setting the input code of one DAC to FF hex and the code of all other DACs to 00 hex
with Vref input = 1 V dc + 1 VPP at 10 kHz.
12. Reference bandwidth is a –3 dB bandwidth with an input at Vref = 1.25 V dc + 2 VPP and with a full-scale digital input code.
8
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TLV5628C, TLV5628I
OCTAL 8-BIT DIGITAL-TO-ANALOG CONVERTERS
SLAS108A – JANUARY 1995 – REVISED NOVEMBER 1995
PARAMETER MEASUREMENT INFORMATION
TLV5628
DACA
DACB
•
•
•
DACH
10 kΩ
CL = 100 pF
Figure 6. Slewing Settling Time and Linearity Measurements
TYPICAL CHARACTERISTICS
NEGATIVE FALL TIME AND SETTLING TIME
3
3
2.5
2.5
2
2
VO – Output Voltage – V
VO – Output Voltage – V
POSITIVE RISE TIME AND SETTLING TIME
1.5
1
VDD = 3 V
TA = 25°C
Code 00 to
FF Hex
Range = ×2
Vref = 1.25 V
(see Note A)
0.5
0
– 0.5
VDD = 3 V
TA = 25°C
Code FF to
00 Hex
Range = ×2
Vref = 1.25 V
(see Note B)
1.5
1
0.5
0
– 0.5
–1
–1
0
2
4
6
8
10 12
Time – µs
14
16
18
20
NOTE A: Rise time = 2.05 µs, positive slew rate = 0.96 V/µs,
settling time = 4.5 µs.
0
2
4
6
8
10
12
14
16
18
20
Time – µs
NOTE B: Fall time = 4.25 µs, negative slew rate = 0.46 V/µs,
settling time = 8.5 µs.
Figure 8
Figure 7
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• DALLAS, TEXAS 75265
9
TLV5628C, TLV5628I
OCTAL 8-BIT DIGITAL-TO-ANALOG CONVERTERS
SLAS108A – JANUARY 1995 – REVISED NOVEMBER 1995
TYPICAL CHARACTERISTICS
DAC OUTPUT VOLTAGE
vs
LOAD
DAC OUTPUT VOLTAGE
vs
LOAD
3
1.6
1.4
VO – DAC Output Voltage – V
VO – DAC Output Voltage – V
2.8
2.6
2.4
2.2
2
1.8
1.6
VDD = 3 V,
Vref = 1.5 V,
Range = 2x
1.4
1.2
1
0.8
0.6
0.4
VDD = 3 V,
Vref = 1.5 V,
Range = 1x
0.2
1.2
1
0
10
20
30
40 50 60
Load – kΩ
70
80
0
90 100
0
10
20
30
40
Figure 9
Figure 10
SUPPLY CURRENT
vs
TEMPERATURE
1.2
Range = × 2
Input Code = 255
VDD = 3 V
Vref 1.25 V
I DD – Supply Current – mA
1.15
1.1
1.05
1
0.95
0.9
0.85
0.8
– 50
0
50
t – Temperature – °C
Figure 11
10
50
60
Load – kΩ
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
100
70
80
90
100
TLV5628C, TLV5628I
OCTAL 8-BIT DIGITAL-TO-ANALOG CONVERTERS
SLAS108A – JANUARY 1995 – REVISED NOVEMBER 1995
APPLICATION INFORMATION
_
TLV5628
DACA
DACB
•
•
•
DACH
R
NOTE A: Resistor R
w 10 kΩ
+
VO
Figure 12. Output Buffering Scheme
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
11
TLV5628C, TLV5628I
OCTAL 8-BIT DIGITAL-TO-ANALOG CONVERTERS
SLAS108A – JANUARY 1995 – REVISED NOVEMBER 1995
MECHANICAL DATA
DW (R-PDSO-G**)
PLASTIC SMALL-OUTLINE PACKAGE
16 PIN SHOWN
PINS **
0.050 (1,27)
16
20
24
28
A MAX
0.410
(10,41)
0.510
(12,95)
0.610
(15,49)
0.710
(18,03)
A MIN
0.400
(10,16)
0.500
(12,70)
0.600
(15,24)
0.700
(17,78)
DIM
0.020 (0,51)
0.014 (0,35)
16
0.010 (0,25) M
9
0.419 (10,65)
0.400 (10,15)
0.299 (7,59)
0.293 (7,45)
0.010 (0,25) NOM
Gage Plane
0.010 (0,25)
1
8
0°– 8°
A
0.050 (1,27)
0.016 (0,40)
Seating Plane
0.104 (2,65) MAX
0.012 (0,30)
0.004 (0,10)
0.004 (0,10)
4040000 / B 10/94
NOTES: A.
B.
C.
D.
12
All linear dimensions are in inches (millimeters).
This drawing is subject to change without notice.
Body dimensions do not include mold flash or protrusion not to exceed 0.006 (0,15).
Falls within JEDEC MS-013
POST OFFICE BOX 655303
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TLV5628C, TLV5628I
OCTAL 8-BIT DIGITAL-TO-ANALOG CONVERTERS
SLAS108A – JANUARY 1995 – REVISED NOVEMBER 1995
MECHANICAL DATA
N (R-PDIP-T**)
PLASTIC DUAL-IN-LINE PACKAGE
16 PIN SHOWN
A
16
PINS **
9
14
16
18
20
A MAX
0.775
(19,69)
0.775
(19,69)
0.920
(23.37)
0.975
(24,77)
A MIN
0.745
(18,92)
0.745
(18,92)
0.850
(21.59)
0.940
(23,88)
DIM
0.260 (6,60)
0.240 (6,10)
1
8
0.070 (1,78) MAX
0.035 (0,89) MAX
0.310 (7,87)
0.290 (7,37)
0.020 (0,51) MIN
0.200 (5,08) MAX
Seating Plane
0.125 (3,18) MIN
0.100 (2,54)
0.021 (0,53)
0.015 (0,38)
0°– 15°
0.010 (0,25) M
0.010 (0,25) NOM
14 Pin Only
4040049 / C 7/95
NOTES: A. All linear dimensions are in inches (millimeters).
B. This drawing is subject to change without notice.
C. Falls within JEDEC MS-001 (20-pin package is shorter than MS-001)
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
13
PACKAGE OPTION ADDENDUM
www.ti.com
13-Aug-2021
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
(4/5)
(6)
TLV5628CDW
ACTIVE
SOIC
DW
16
40
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
0 to 70
TLV5628C
TLV5628CDWR
ACTIVE
SOIC
DW
16
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
TLV5628CN
ACTIVE
PDIP
N
16
25
RoHS & Green
NIPDAU
N / A for Pkg Type
TLV5628IDW
ACTIVE
SOIC
DW
16
40
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
TLV5628I
TLV5628IDWG4
ACTIVE
SOIC
DW
16
40
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
TLV5628I
TLV5628IDWR
ACTIVE
SOIC
DW
16
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
TLV5628I
TLV5628IDWRG4
ACTIVE
SOIC
DW
16
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
TLV5628I
TLV5628IN
ACTIVE
PDIP
N
16
25
RoHS & Green
NIPDAU
N / A for Pkg Type
TLV5628C
TLV5628CN
TLV5628IN
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
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