TLV9161-Q1, TLV9162-Q1, TLV9164-Q1
SBOSAD7 – APRIL 2023
TLV916x-Q1 Automotive 16-V, 11-MHz, Rail-to-Rail Input or Output,
Low Offset Voltage, Low Noise Automotive Op Amp
1 Features
3 Description
•
The TLV916x-Q1 family (TLV9161-Q1, TLV9162-Q1,
and TLV9164-Q1) is a family of 16-V, general-purpose
automotive operational amplifiers. These devices
offer exceptional DC precision and AC performance,
including rail-to-rail input or output, low offset (±210
µV, typical), low-offset drift (±0.25 µV/°C, typical), and
low noise (6.8 nV/√Hz at 1 kHz, 4.2 nV/√Hz at 10
kHz).
•
•
•
•
•
•
•
•
•
•
•
AEC-Q100 qualified for automotive applications
– Temperature grade 1: –40°C to +125°C, TA
– Device HBM ESD classification level 3A
(≥2500 V)
– Device CDM ESD classification level C3
(≥1500 V)
Low offset voltage: ±210 µV
Low offset voltage drift: ±0.25 µV/°C
Low noise: 6.8 nV/√Hz at 1 kHz, 4.2 nV/√Hz
broadband
High common-mode rejection: 110 dB
Low bias current: ±10 pA
Rail-to-rail input and output
Wide bandwidth: 11-MHz GBW, unity-gain stable
High slew rate: 33 V/µs
Low quiescent current: 2.4 mA per amplifier
Wide supply: ±1.35 V to ±8 V, 2.7 V to 16 V
Robust EMIRR performance
2 Applications
•
•
•
•
•
•
•
•
•
Features such as wide differential input voltage range,
high short-circuit current (±73 mA), and high slew
rate (33 V/µs) make the TLV916x-Q1 a flexible,
robust, and high-performance op amp for automotive
applications.
The TLV916x-Q1 family of op amps is available in
standard packages and is specified from –40°C to
125°C.
Package Information
PART
Optimized for AEC-Q100 grade 1 applications
Infotainment and cluster
Passive safety
Body electronics and lighting
HEV/EV inverter and motor control
On-board (OBC) and wireless charger
Powertrain current sensor
Advanced driver assistance systems (ADAS)
High-side and low-side current sensing
NUMBER(1)
TLV9161-Q1
TLV9162-Q1
TLV9164-Q1
(1)
PACKAGE
BODY SIZE (NOM)
DBV (SOT-23, 5)
2.90 mm × 1.60 mm
DCK (SC70, 5)
2.00 mm × 1.25 mm
D (SOIC, 8)
4.90 mm × 3.90 mm
DGK (VSSOP, 8)
3.00 mm × 3.00 mm
D (SOIC, 14)
8.65 mm × 3.90 mm
PW (TSSOP, 14)
5.00 mm × 4.40 mm
For all available packages, see the orderable addendum at
the end of the data sheet.
TLV916x
+
Vshunt
System
Load
Rshunt
MCU
-
+
-
+
Vo
-
Iload
Vbus
+
–
Vbus
Iload
Vshunt
-
Rshunt
+
–
GND
TLV916x
+
GND
+
-
System
Load
MCU
+
Vo
-
GND
GND
Low-Side Current Sense
GND
GND
High-Side Current Sense
TLV916x-Q1 in Current-Sensing Applications
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
TLV9161-Q1, TLV9162-Q1, TLV9164-Q1
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SBOSAD7 – APRIL 2023
Table of Contents
1 Features............................................................................1
2 Applications..................................................................... 1
3 Description.......................................................................1
4 Revision History.............................................................. 2
5 Pin Configuration and Functions...................................3
6 Specifications.................................................................. 6
6.1 Absolute Maximum Ratings........................................ 6
6.2 ESD Ratings............................................................... 6
6.3 Recommended Operating Conditions.........................6
6.4 Thermal Information for Single Channel..................... 7
6.5 Thermal Information for Dual Channel........................7
6.6 Thermal Information for Quad Channel...................... 7
6.7 Electrical Characteristics.............................................8
6.8 Typical Characteristics.............................................. 10
7 Detailed Description......................................................17
7.1 Overview................................................................... 17
7.2 Functional Block Diagram......................................... 17
7.3 Feature Description...................................................18
7.4 Device Functional Modes..........................................25
8 Application and Implementation.................................. 26
8.1 Application Information............................................. 26
8.2 Typical Applications.................................................. 26
8.3 Power Supply Recommendations.............................27
8.4 Layout....................................................................... 28
9 Device and Documentation Support............................31
9.1 Device Support......................................................... 31
9.2 Documentation Support............................................ 31
9.3 Receiving Notification of Documentation Updates....31
9.4 Support Resources................................................... 31
9.5 Trademarks............................................................... 32
9.6 Electrostatic Discharge Caution................................32
9.7 Glossary....................................................................32
10 Mechanical, Packaging, and Orderable
Information.................................................................... 32
4 Revision History
2
DATE
REVISION
NOTES
April 2023
*
Initial Release
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SBOSAD7 – APRIL 2023
5 Pin Configuration and Functions
OUT
1
V±
2
IN+
3
5
V+
4
IN±
IN+
1
V±
2
IN±
3
Not to scale
5
V+
4
OUT
Not to scale
Figure 5-1. TLV9161-Q1 DBV Package,
5-Pin SOT-23
(Top View)
Figure 5-2. TLV9161-Q1 DCK Package,
5-Pin SC70
(Top View)
Table 5-1. Pin Functions: TLV9161-Q1
PIN
NAME
SOT-23 (DBV)
SC70 (DCK)
IN+
3
1
IN–
4
OUT
1
V+
V–
(1)
TYPE(1)
DESCRIPTION
I
Noninverting input
3
I
Inverting input
4
O
Output
5
5
—
Positive (highest) power supply
2
2
—
Negative (lowest) power supply
I = input, O = output
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OUT1
1
8
V+
IN1±
2
7
OUT2
IN1+
3
6
IN2±
V±
4
5
IN2+
Not to scale
Figure 5-3. TLV9162-Q1 D and DGK Package,
8-Pin SOIC and VSSOP
(Top View)
Table 5-2. Pin Functions: TLV9162-Q1
PIN
NAME
TYPE(1)
DESCRIPTION
IN1+
3
I
Noninverting input, channel 1
IN1–
2
I
Inverting input, channel 1
IN2+
5
I
Noninverting input, channel 2
IN2–
6
I
Inverting input, channel 2
OUT1
1
O
Output, channel 1
OUT2
7
O
Output, channel 2
V+
8
—
Positive (highest) power supply
V–
4
—
Negative (lowest) power supply
(1)
4
NO.
I = input, O = output
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OUT1
1
14
OUT4
IN1±
2
13
IN4±
IN1+
3
12
IN4+
V+
4
11
V±
IN2+
5
10
IN3+
IN2±
6
9
IN3±
OUT2
7
8
OUT3
Not to scale
Figure 5-4. TLV9164-Q1 D and PW Package,
14-Pin SOIC and TSSOP
(Top View)
Table 5-3. Pin Functions: TLV9164-Q1
PIN
NAME
NO.
TYPE(1)
DESCRIPTION
IN1+
3
I
Noninverting input, channel 1
IN1–
2
I
Inverting input, channel 1
IN2+
5
I
Noninverting input, channel 2
IN2–
6
I
Inverting input, channel 2
IN3+
10
I
Noninverting input, channel 3
IN3–
9
I
Inverting input, channel 3
IN4+
12
I
Noninverting input, channel 4
IN4–
13
I
Inverting input, channel 4
OUT1
1
O
Output, channel 1
OUT2
7
O
Output, channel 2
OUT3
8
O
Output, channel 3
OUT4
14
O
Output, channel 4
V+
4
—
Positive (highest) power supply
V–
11
—
Negative (lowest) power supply
(1)
I = input, O = output
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6 Specifications
6.1 Absolute Maximum Ratings
over operating ambient temperature range (unless otherwise noted)(1)
MIN
MAX
0
20
V
(V–) – 0.5
(V+) + 0.5
V
Supply voltage, VS = (V+) – (V–)
Common-mode
voltage(3)
Differential voltage(3)
Signal input pins
VS + 0.2
Current(3)
–10
10
V–
V+
Shutdown pin voltage
Output short-circuit(2)
–55
Junction temperature, TJ
Storage temperature, Tstg
(2)
(3)
V
mA
Continuous
Operating ambient temperature, TA
(1)
UNIT
–65
150
°C
150
°C
150
°C
Operating the device beyond the ratings listed under Absolute Maximum Ratings will cause permanent damage to the device.
These are stress ratings only, based on process and design limitations, and this device has not been designed to function outside
the conditions indicated under Recommended Operating Conditions. Exposure to any condition outside Recommended Operating
Conditions for extended periods, including absolute-maximum-rated conditions, may affect device reliability and performance.
Short-circuit to ground, one amplifier per package. Extended short-circuit current, especially with higher supply voltage, can cause
excessive heating and eventual destruction.
Input pins are diode-clamped to the power-supply rails. Input signals that may swing more than 0.5 V beyond the supply rails must be
current limited to 10 mA or less.
6.2 ESD Ratings
VALUE
UNIT
TLV9161-Q1
V(ESD)
Electrostatic discharge
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)
±2000
Charged-device model (CDM), per ANSI/ESDA/JEDEC JS-002(2)
±1500
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)
±2500
V
TLV9162-Q1 and TLV9164-Q1
V(ESD)
(1)
(2)
Electrostatic discharge
Charged-device model (CDM), per ANSI/ESDA/JEDEC
JS-002(2)
V
±1500
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.3 Recommended Operating Conditions
over operating ambient temperature range (unless otherwise noted)
MIN
6
MAX
UNIT
VS
Supply voltage, (V+) – (V–)
2.7
16
VI
Common mode voltage range
V–
V+
V
TA
Specified temperature
–40
125
°C
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V
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6.4 Thermal Information for Single Channel
TLV9161-Q1
THERMAL METRIC(1)
DBV
(SOT-23)
DCK
(SC70)
5 PINS
5 PINS
UNIT
RθJA
Junction-to-ambient thermal resistance
189.3
202.4
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
86.8
111.6
°C/W
RθJB
Junction-to-board thermal resistance
55.9
51.6
°C/W
ψJT
Junction-to-top characterization parameter
23.6
25.8
°C/W
ψJB
Junction-to-board characterization parameter
55.5
51.4
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
N/A
N/A
°C/W
(1)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
6.5 Thermal Information for Dual Channel
TLV9162-Q1
THERMAL METRIC(1)
D
(SOIC)
DGK
(VSSOP)
Unit
8 PINS
8 PINS
RθJA
Junction-to-ambient thermal resistance
130.8
173.9
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
74.0
65.7
°C/W
RθJB
Junction-to-board thermal resistance
74.3
95.6
°C/W
ψJT
Junction-to-top characterization parameter
25.8
10.9
°C/W
ψJB
Junction-to-board characterization parameter
73.5
94.1
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
N/A
N/A
°C/W
(1)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
6.6 Thermal Information for Quad Channel
TLV9164-Q1
THERMAL METRIC(1)
D
(SOIC)
PW
(TSSOP)
UNIT
14 PINS
14 PINS
RθJA
Junction-to-ambient thermal resistance
94.9
120.0
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
51.1
50.4
°C/W
RθJB
Junction-to-board thermal resistance
51.4
63.1
°C/W
ψJT
Junction-to-top characterization parameter
15.3
8.1
°C/W
ψJB
Junction-to-board characterization parameter
51.0
62.5
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
N/A
N/A
°C/W
(1)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
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Product Folder Links: TLV9161-Q1 TLV9162-Q1 TLV9164-Q1
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6.7 Electrical Characteristics
For VS = (V+) – (V–) = 2.7 V to 16 V (±1.35 V to ±8 V) at TA = 25°C, RL = 10 kΩ connected to VS / 2, VCM = VS / 2, and
VOUT = VS / 2, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
±0.21
±1.03
UNIT
OFFSET VOLTAGE
VOS
Input offset voltage
VCM = V–
dVOS/dT
Input offset voltage drift
VCM = V–
±1.2
TA = –40°C to 125°C
±0.25
±2
TA = –40°C to 125°C
±0.45
±3
Input offset voltage versus TLV9164-Q1, VCM = V–, VS =
5 V to 16 V
power supply
TA = –40°C to 125°C
±0.45
±2.2
±0.45
±3.8
±2
±12
TLV9161-Q1, TLV9162-Q1,
TLV9164-Q1, VCM = V–, VS = TA = –40°C to 125°C
2.7 V to 16 V(1)
DC channel separation
mV
µV/℃
±0.45
TLV9161-Q1, TLV9162-Q1,
VCM = V–, VS = 5 V to 16 V
PSRR
TA = –40°C to 125°C
μV/V
0.4
µV/V
INPUT BIAS CURRENT
IB
Input bias current
±10
pA
IOS
Input offset current
±10
pA
2.7
μVPP
0.49
µVRMS
NOISE
EN
Input voltage noise
f = 0.1 Hz to 10 Hz
f = 1 kHz
6.8
f = 10 kHz
4.2
eN
Input voltage noise density
iN
Input current noise density f = 1 kHz
nV/√Hz
55
fA/√Hz
INPUT VOLTAGE RANGE
Common-mode voltage
range
VCM
CMRR
Common-mode rejection
ratio
(V–)
(V+)
VS = 16 V, V– < VCM < (V+) –
2 V (PMOS pair)
85
110
VS = 5 V, V– < VCM < (V+) – 2
V (PMOS pair)(1)
75
98
VS = 2.7 V, V– < VCM < (V+) – TA = –40°C to 125°C
2 V (PMOS pair)
90
VS = 2.7 – 16 V, (V+) – 1 V <
VCM < V+ (NMOS pair)
78
(V+) – 2 V < VCM < (V+) – 1 V
V
dB
See Figure 6-6
INPUT IMPEDANCE
ZID
Differential
ZICM
Common-mode
100 || 9
MΩ || pF
6 || 1
TΩ || pF
OPEN-LOOP GAIN
VS = 16 V, VCM = VS / 2,
(V–) + 0.1 V < VO < (V+) –
0.1 V
AOL
8
Open-loop voltage gain
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120
TA = –40°C to 125°C
VS = 5 V, VCM = VS / 2,
(V–) + 0.1 V < VO < (V+) –
0.1 V(1)
TA = –40°C to 125°C
VS = 2.7 V, VCM = VS / 2,
(V–) + 0.1 V < VO < (V+) –
0.1 V(1)
TA = –40°C to 125°C
136
136
104
125
125
90
dB
105
105
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6.7 Electrical Characteristics (continued)
For VS = (V+) – (V–) = 2.7 V to 16 V (±1.35 V to ±8 V) at TA = 25°C, RL = 10 kΩ connected to VS / 2, VCM = VS / 2, and
VOUT = VS / 2, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
FREQUENCY RESPONSE
GBW
Gain-bandwidth product
SR
Slew rate
tS
Settling time
VS = 16 V, G = +1, VSTEP = 10 V, CL = 20 pF(2)
MHz
V/μs
To 0.1%, VS = 16 V, VSTEP = 10 V, G = +1, CL = 20 pF
0.70
To 0.1%, VS = 16 V, VSTEP = 2 V, G = +1, CL = 20 pF
0.22
To 0.01%, VS = 16 V, VSTEP = 10 V, G = +1, CL = 20 pF
0.89
To 0.01%, VS = 16 V, VSTEP = 2 V, G = +1, CL = 20 pF
0.42
Phase margin
G = +1, RL = 10 kΩ, CL = 20 pF
Overload recovery time
VIN × gain > VS
VS = 16 V, VO = 3 VRMS, G = 1, f = 1 kHz
THD+N
11
33
Total harmonic distortion +
VS = 10 V, VO = 3 VRMS, G = 1, f = 1 kHz, RL = 128 Ω
noise
VS = 10 V, VO = 0.4 VRMS, G = 1, f = 1 kHz, RL = 32 Ω
μs
64
°
120
ns
0.00005%
126
dB
0.0032%
90
dB
0.00032%
110
dB
OUTPUT
VS = 16 V, RL = no load
Voltage output swing from
rail
ISC
Short-circuit current
CLOAD
Capacitive load drive
ZO
Open-loop output
impedance
Positive and negative
rail headroom
6
VS = 16 V, RL = 10 kΩ
25
60
VS = 16 V, RL = 2 kΩ
85
300
VS = 2.7 V, RL = no load
0.5
VS = 2.7 V, RL = 10 kΩ
5
20
VS = 2.7 V, RL = 2 kΩ
20
50
±73
IO = 0 A
mV
mA
See Figure 6-33
pF
See Figure 6-30
Ω
POWER SUPPLY
IQ
Quiescent current per
amplifier
TLV9162-Q1, TLV9164-Q1,
IO = 0 A
TLV9161-Q1, IO = 0 A
(1)
(2)
2.4
TA = –40°C to 125°C
2.48
TA = –40°C to 125°C
2.8
2.84
2.92
mA
2.98
Specified by characterization only.
See Slew Rate vs. Input Step Voltage for more information.
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6.8 Typical Characteristics
at TA = 25°C, VS = ±8 V, VCM = VS / 2, RLOAD = 10 kΩ (unless otherwise noted)
30
45
40
25
30
Population (%)
Population (%)
35
25
20
15
20
15
10
10
5
5
0
-675
0
-525
-375
-225 -75
75
225
Offset Voltage (µV)
375
525
0.1
675
0.2
D001
Distribution from 74 amplifiers, TA = 25°C
400
1600
300
1200
200
100
0
-100
-200
400
0
-400
-800
-300
-400
-1600
20
40
60
80
Temperature (°C)
100
120
-2000
-40
140
-20
0
20
2000
1600
1600
1200
1200
Offset Voltage (µV)
Offset Voltage (µV)
120
140
D014
Figure 6-4. Offset Voltage vs Temperature
2000
800
400
0
-400
-800
800
400
0
-400
-800
-1200
-1200
-1600
-1600
-2000
5
6
7
TA = 25°C
Data from 74 amplifiers
Figure 6-5. Offset Voltage vs Common-Mode Voltage
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100
VCM = V+
Data from 74 amplifiers
Figure 6-3. Offset Voltage vs Temperature
10
40
60
80
Temperature (°C)
D013
VCM = V–
Data from 74 amplifiers
-2000
-8 -7 -6 -5 -4 -3 -2 -1 0 1 2 3 4
Common-Mode Voltage (V)
D002
800
-1200
0
0.9
Figure 6-2. Offset Voltage Drift Distribution
2000
Offset Voltage (µV)
Offset Voltage (µV)
Figure 6-1. Offset Voltage Production Distribution
-20
0.8
Distribution from 74 amplifiers
500
-500
-40
0.3
0.4
0.5
0.6
0.7
Offset Voltage Drift (µV/°C)
8
D015
4
4.5
5
5.5
6
6.5
7
Common-Mode Voltage (V)
7.5
8
D060
TA = 25°C
Data from 74 amplifiers
Figure 6-6. Offset Voltage vs Common-Mode Voltage (Transition
Region)
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6.8 Typical Characteristics (continued)
2000
2000
1600
1600
1200
1200
800
800
Offset Voltage (µV)
Offset Voltage (µV)
at TA = 25°C, VS = ±8 V, VCM = VS / 2, RLOAD = 10 kΩ (unless otherwise noted)
400
0
-400
-800
400
0
-400
-800
-1200
-1200
-1600
-1600
-2000
-8 -7 -6 -5 -4 -3 -2 -1 0 1 2 3 4
Common-Mode Voltage (V)
-2000
5
6
7
8
4
4.5
TA = 125°C
Data from 74 amplifiers
2000
2000
1600
1600
1200
1200
800
800
400
0
-400
-800
8
400
0
-400
-800
-1200
-1200
-1600
-1600
-2000
5
6
7
8
4
4.5
TA = –40°C
Data from 74 amplifiers
5
5.5
6
6.5
7
Common-Mode Voltage (V)
7.5
8
TA = –40°C
Data from 74 amplifiers
Figure 6-9. Offset Voltage vs Common-Mode Voltage
Figure 6-10. Offset Voltage vs Common-Mode Voltage
(Transition Region)
75
500
400
G=-1
G=1
G=11
G=101
G=1001
60
Closed-Loop Gain (dB)
300
Offset Voltage (µV)
7.5
Figure 6-8. Offset Voltage vs Common-Mode Voltage (Transition
Region)
Offset Voltage (µV)
Offset Voltage (µV)
5.5
6
6.5
7
Common-Mode Voltage (V)
TA = 125°C
Data from 74 amplifiers
Figure 6-7. Offset Voltage vs Common-Mode Voltage
-2000
-8 -7 -6 -5 -4 -3 -2 -1 0 1 2 3 4
Common-Mode Voltage (V)
5
200
100
0
-100
-200
-300
-400
45
30
15
0
-15
-30
-500
0
1
2
3
4
5
6 7 8 9 10 11 12 13 14 15 16
Supply Voltage (V)
VCM = V–
Data from 74 amplifiers
Figure 6-11. Offset Voltage vs Power Supply
-45
100
1k
10k
100k
Frequency (Hz)
1M
10M
D005
Figure 6-12. Closed-Loop Gain vs Frequency
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6.8 Typical Characteristics (continued)
20
Input Bias Current and Offset Current (pA)
Input Bias Current and Offset Current (pA)
at TA = 25°C, VS = ±8 V, VCM = VS / 2, RLOAD = 10 kΩ (unless otherwise noted)
IBIB+
IOS
15
10
5
0
-5
-10
-15
-20
-8
-6
-4
-2
0
2
4
Common-Mode Voltage (V)
6
8
600
550
500
450
400
350
300
250
200
150
100
50
0
-50
-100
-40
IBIB+
IOS
-20
0
20
40
60
80
Temperature (°C)
50
D020
V+
SR+
SR-
45
V+ - 1V
40
V+ - 2V
35
V+ - 3V
Output Voltage (V)
Slew Rate (V/Ps)
140
Figure 6-14. Input Bias Current and Offset Current vs
Temperature
Figure 6-13. Input Bias Current and Offset Current vs CommonMode Voltage
30
25
20
15
V+ - 4V
V+ - 5V
V+ - 6V
V+ - 7V
V+ - 8V
10
-40°C
25°C
125°C
V+ - 9V
5
V+ - 10V
0
0
0
0.5
1
1.5
2
2.5
3
Input Step (V)
3.5
4
4.5
10
20
30
5
40
50
60
70
Output Current (mA)
80
90
100
D021
VS = 16 V
D035
Figure 6-15. Slew Rate vs Input Step Voltage
Figure 6-16. Output Voltage Swing vs Output Current (Sourcing)
V+
V- + 10V
-40°C
25°C
125°C
V- + 9V
V- + 8V
V+ - 1V
V- + 7V
Output Voltage (V)
Output Voltage (V)
120
No Load
No Load
V- + 6V
V- + 5V
V- + 4V
V- + 3V
V- + 2V
V+ - 2V
V+ - 3V
V+ - 4V
-40°C
25°C
125°C
V- + 1V
V-
V+ - 5V
0
10
20
30
40
50
60
70
Output Current (mA)
80
90
100
0
10
20
30
D022
VS = 16 V
Figure 6-17. Output Voltage Swing vs Output Current (Sinking)
12
100
D019
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40
50
60
70
Output Current (mA)
80
90
100
D049
VS = 5 V
Figure 6-18. Output Voltage Swing vs Output Current (Sourcing)
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6.8 Typical Characteristics (continued)
at TA = 25°C, VS = ±8 V, VCM = VS / 2, RLOAD = 10 kΩ (unless otherwise noted)
120
V- + 5V
-40°C
25°C
125°C
CMRR & PSRR (dB)
Output Voltage (V)
V- + 4V
CMRR
PSRR+
PSRR-
105
V- + 3V
V- + 2V
V- + 1V
90
75
60
45
30
15
V20
30
40
50
60
70
Output Current (mA)
80
90
0
1k
100
D050
VS = 5 V
120
1
140
0.1
-40
-20
0
20
40
60
80
Temperature (°C)
100
120
Common-Mode Rejection Ratio (PV/V)
100
10
Common-Mode Rejection Ratio (dB)
Common-Mode Rejection Ratio (PV/V)
1000
80
100k
1M
Frequency (Hz)
60
100
80
10
100
1
120
0.1
-40
140
-20
0
20
D023
80
10
100
1
120
40
60
80
Temperature (°C)
100
120
VS = 2.7 V, VCM = V–
140
140
D052
Power-Supply Rejection Ratio (µV/V)
100
20
100
120
140
140
D051
Figure 6-22. CMRR vs Temperature
60
Common-Mode Rejection Ratio (dB)
Common-Mode Rejection Ratio (PV/V)
Figure 6-21. CMRR vs Temperature
0
40
60
80
Temperature (°C)
VS = 5 V, VCM = V–
1000
-20
D006
1000
VS = 16 V, VCM = V–
0.1
-40
10M
Figure 6-20. CMRR and PSRR vs Frequency
Figure 6-19. Output Voltage Swing vs Output Current (Sinking)
100
10k
Common-Mode Rejection Ratio (dB)
10
100
80
10
100
1
120
0.1
140
0.01
-40
-20
0
20
40
60
80
Temperature (°C)
100
120
Power-Supply Rejection Ratio (dB)
0
160
140
Figure 6-24. PSRR vs Temperature
Figure 6-23. CMRR vs Temperature
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6.8 Typical Characteristics (continued)
Input Voltage Noise Spectral Density (nV/rtHz)
at TA = 25°C, VS = ±8 V, VCM = VS / 2, RLOAD = 10 kΩ (unless otherwise noted)
2
1.5
Amplitude (PV)
1
0.5
0
-0.5
-1
-1.5
-2
Time (1s/div)
100
10
1
10
100
1k
Frequency (Hz)
D025
Figure 6-25. 0.1-Hz to 10-Hz Noise
Quiescent Current (mA)
Quiescent Current (mA)
2.4
2
1.6
1.2
0.8
0.4
0
1
2
3
4
5
6 7 8 9 10 11 12 13 14 15 16
Supply Voltage (V)
2.6
2.55
2.5
2.45
2.4
2.35
2.3
2.25
2.2
2.15
2.1
2.05
2
1.95
1.9
1.85
1.8
-40
Vs=2.7V
Vs=5V
Vs=16V
-20
0
20
40
60
80
Temperature (°C)
140
D027
1000
145
135
Open-Loop Output Impedance (:)
VS = 2.7V
VS = 5V
VS = 16V
140
Open-Loop Gain (dB)
120
Figure 6-28. Quiescent Current vs Temperature
Figure 6-27. Quiescent Current vs Supply Voltage
130
125
120
115
110
105
-20
0
20
40
60
80
Temperature (°C)
100
120
140
D028
Figure 6-29. Open-Loop Voltage Gain vs Temperature (dB)
14
100
VCM = V–
VCM = V–
100
-40
D007
Figure 6-26. Input Voltage Noise Spectral Density vs Frequency
2.8
0
10k
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100
10
1
0.1
100
1k
10k
100k
Frequency (Hz)
1M
10M
D099
Figure 6-30. Open-Loop Output Impedance vs Frequency
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6.8 Typical Characteristics (continued)
70
70
60
60
50
50
Overshoot (%)
Overshoot (%)
at TA = 25°C, VS = ±8 V, VCM = VS / 2, RLOAD = 10 kΩ (unless otherwise noted)
40
30
20
40
30
20
RISO = 0:, Overshoot (+)
RISO = 0:, Overshoot (-)
RISO = 50:, Overshoot (+)
RISO = 50:, Overshoot (-)
10
RISO = 0:, Overshoot (+)
RISO = 0:, Overshoot (-)
RISO = 50:, Overshoot (+)
RISO = 50:, Overshoot (-)
10
0
0
0
80
160
240
320
400
Capacitive Load (pF)
480
560
0
D029
20-mVpp output step, G = –1
80
160
240
320
400
Capacitive Load (pF)
480
D030
20-mVpp output step, G = +1
Figure 6-31. Small-Signal Overshoot vs Capacitive Load
Figure 6-32. Small-Signal Overshoot vs Capacitive Load
20
70
Input
Output
65
60
10
55
Amplitude (mV)
Phase Margin (°)
560
50
45
40
35
0
-10
30
25
-20
20
0
20
40
60
Time (2 µs/div)
80 100 120 140 160 180 200 220
Capacitive Load (pF)
D004
D033
CL = 20 pF, G = 1, 20-mVpp step response
G = +1
Figure 6-34. Small-Signal Step Response
Figure 6-33. Phase Margin vs Capacitive Load
4
20
Input
Output
10
2
Amplitude (V)
Amplitude (mV)
Input
Output
3
0
-10
1
0
-1
-2
-3
-20
-4
Time (2 µs/div)
Time (2 µs/div)
D054
CL = 20 pF, G = –1, 20-mVpp step response
Figure 6-35. Small-Signal Step Response
D034
CL = 20 pF, G = 1, 5-Vpp step response
Figure 6-36. Large-Signal Step Response
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6.8 Typical Characteristics (continued)
at TA = 25°C, VS = ±8 V, VCM = VS / 2, RLOAD = 10 kΩ (unless otherwise noted)
4
20
Vs=16V
Vs=2.7V
Input
Output
3
16
1
Output (V)
Amplitude (V)
2
0
-1
12
8
-2
4
-3
-4
0
100
Time (2 µs/div)
D055
1k
10k
100k
1M
Frequency (Hz)
10M
100M
Figure 6-38. Maximum Output Voltage vs Frequency
CL = 20 pF, G = –1, 5-Vpp step response
120
-70
110
-80
100
-90
90
EMIRR (dB)
Crosstalk (dB)
Figure 6-37. Large-Signal Step Response
-60
-100
-110
-120
70
60
-130
50
-140
40
-150
30
-160
100
1k
10k
100k
Frequency (Hz)
1M
Submit Document Feedback
20
10M
10M
Figure 6-39. Channel Separation vs Frequency
16
80
D011
100M
Frequency (Hz)
1G
D012
Figure 6-40. EMIRR (Electromagnetic Interference Rejection
Ratio) vs Frequency
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7 Detailed Description
7.1 Overview
The TLV916x-Q1 family (TLV9161-Q1, TLV9162-Q1, and TLV9164-Q1) is a family of 16-V, general-purpose,
automotive operational amplifiers.
These devices offer excellent DC precision and AC performance, including rail-to-rail input or output, low offset
(±210 µV, typical), low offset drift (±0.25 µV/°C, typical), and 11-MHz bandwidth.
Features such as wide differential input range, high short-circuit current (±73 mA), and high slew rate (33
V/μs) make the TLV916x-Q1 a flexible, robust, and high-performance operational amplifier for 16-V automotive
applications.
7.2 Functional Block Diagram
+
NCH Input
Stage
–
IN+
+
16-V
Differential
MUX-Friendly
Front End
Slew
Boost
Gain
Stage
Shutdown
Circuitry
Output
Stage
OUT
–
IN-
+
PCH Input
Stage
–
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7.3 Feature Description
7.3.1 Input Protection Circuitry
The TLV916x-Q1 uses a special input architecture to eliminate the requirement for input protection diodes
but still provides robust input protection under transient conditions. Figure 7-1 shows conventional input diode
protection schemes that are activated by fast transient step responses and introduce signal distortion and
settling time delays because of alternate current paths, as shown in Figure 7-2. For low-gain circuits, these
fast-ramping input signals forward-bias back-to-back diodes, causing an increase in input current and resulting in
extended settling time.
V+
V+
VIN+
VIN+
VOUT
TLV916x
16 V
VOUT
~0.7 V
VIN
VIN
V
TLV916x Provides Full 16-V
Differential Input Range
V
Conventional Input Protection
Limits Differential Input Range
Figure 7-1. TLV916x-Q1 Input Protection Does Not Limit Differential Input Capability
Vn = 8 V
RFILT
8V
1
Ron_mux
Sn
1
D
8V
CFILT
2
~–7.3 V
CS
CD
Vn+1 = –8 V RFILT
–8 V
Ron_mux
Sn+1
VIN–
2
~0.7 V
CS
CFILT
VOUT
Idiode_transient
–8 V
Simplified Mux Model
Input Low-Pass Filter
VIN+
Buffer Amplifier
Figure 7-2. Back-to-Back Diodes Create Settling Issues
The TLV916x-Q1 family of operational amplifiers provides a true high-impedance differential input capability
using a patented input protection architecture that does not introduce additional signal distortion or delayed
settling time, making the device an optimal op amp for multichannel, high-switched, input applications. The
TLV916x-Q1 tolerates a maximum differential swing (voltage between inverting and non-inverting pins of the op
amp) of up to 16 V, making the device suitable for use as a comparator or in applications with fast-ramping input
signals such as data-acquisition systems; see the TI TechNote MUX-Friendly Precision Operational Amplifiers
for more information.
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7.3.2 EMI Rejection
The TLV916x-Q1 uses integrated electromagnetic interference (EMI) filtering to reduce the effects of EMI from
sources such as wireless communications and densely-populated boards with a mix of analog signal chain and
digital components. EMI immunity can be improved with circuit design techniques; the TLV916x-Q1 benefits
from these design improvements. Texas Instruments has developed the ability to accurately measure and
quantify the immunity of an operational amplifier over a broad frequency spectrum extending from 10 MHz to
6 GHz. Figure 7-3 shows the results of this testing on the TLV916x-Q1. Table 7-1 provides the EMIRR IN+
values for the TLV916x-Q1 at particular frequencies commonly encountered in real-world applications. The EMI
Rejection Ratio of Operational Amplifiers application report contains detailed information on the topic of EMIRR
performance as it relates to op amps and is available for download from www.ti.com.
120
110
100
EMIRR (dB)
90
80
70
60
50
40
30
20
10M
100M
Frequency (Hz)
1G
D012
Figure 7-3. EMIRR Testing
Table 7-1. TLV9161-Q1 EMIRR IN+ for Frequencies of Interest
FREQUENCY
APPLICATION OR ALLOCATION
EMIRR IN+
400 MHz
Mobile radio, mobile satellite, space operation, weather, radar, ultra-high frequency (UHF)
applications
50.0 dB
900 MHz
Global system for mobile communications (GSM) applications, radio communication, navigation,
GPS (to 1.6 GHz), GSM, aeronautical mobile, UHF applications
56.3 dB
1.8 GHz
GSM applications, mobile personal communications, broadband, satellite, L-band (1 GHz to 2 GHz)
65.6 dB
Bluetooth®,
2.4 GHz
802.11b, 802.11g, 802.11n,
mobile personal communications, industrial, scientific and
medical (ISM) radio band, amateur radio and satellite, S-band (2 GHz to 4 GHz)
70.0 dB
3.6 GHz
Radiolocation, aero communication and navigation, satellite, mobile, S-band
78.9 dB
802.11a, 802.11n, aero communication and navigation, mobile communication, space and satellite
operation, C-band (4 GHz to 8 GHz)
91.0 dB
5 GHz
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7.3.3 Thermal Protection
One channel has load
Consider IQ of two channels
TA = 60°C
PD = 0.627W
JA = 183.4°C/W
TJ = 183.4°C/W × 0.627W + 60°C
TJ = 175°C (expected)
16 V
VOUT
The internal power dissipation of any amplifier causes its internal (junction) temperature to rise. This
phenomenon is called self heating. The absolute maximum junction temperature of the TLV916x-Q1 is 150°C.
Exceeding this temperature causes damage to the device. The TLV916x-Q1 has a thermal protection feature
that reduces damage from self heating. The protection works by monitoring the temperature of the device and
turning off the op amp output drive for temperatures above 170°C. Figure 7-4 shows an application example for
the TLV9162-Q1 that has significant self heating because of its power dissipation (0.627 W). In this example,
both channels have a quiescent power dissipation while one of the channels has a significant load. Thermal
calculations indicate that for an ambient temperature of 60°C, the device junction temperature reaches 175°C.
The actual device, however, turns off the output drive to recover towards a safe junction temperature. Figure 7-4
shows how the circuit behaves during thermal protection. During normal operation, the device acts as a buffer so
the output is 5 V. When self heating causes the device junction temperature to increase above the internal limit,
the thermal protection forces the output to a high-impedance state and the output is pulled to ground through
resistor RL. If the condition that caused excessive power dissipation is not removed, the amplifier will oscillate
between a shutdown and enabled state until the output fault is corrected. Please note that thermal performance
can vary greatly depending on the package selected and the PCB layout design. This example uses the thermal
performance of the TSSOP (8) package.
5V
0V
TLV9162
IOUT = 50 mA
+
–
+
RL
5V
100 –
VIN
5V
170ºC
Temperature
Figure 7-4. Thermal Protection
7.3.4 Capacitive Load and Stability
The TLV916x-Q1 features an output stage capable of driving moderate capacitive loads, and by leveraging
an isolation resistor, the device can easily be configured to drive larger capacitive loads. Increasing the gain
enhances the ability of the amplifier to drive greater capacitive loads; see Figure 7-5 and Figure 7-6. The
particular op amp circuit configuration, layout, gain, and output loading are some of the factors to consider when
establishing whether an amplifier will be stable in operation.
70
70
RISO = 0:, Overshoot (+)
RISO = 0:, Overshoot (-)
RISO = 50:, Overshoot (+)
RISO = 50:, Overshoot (-)
60
50
Overshoot (%)
Overshoot (%)
50
60
40
30
30
20
20
10
10
0
RISO = 0:, Overshoot (+)
RISO = 0:, Overshoot (-)
RISO = 50:, Overshoot (+)
RISO = 50:, Overshoot (-)
0
0
80
160
240
320
400
Capacitive Load (pF)
480
560
D030
Figure 7-5. Small-Signal Overshoot vs Capacitive
Load (20-mVpp Output Step, G = +1)
20
40
Submit Document Feedback
0
80
160
240
320
400
Capacitive Load (pF)
480
560
D029
Figure 7-6. Small-Signal Overshoot vs Capacitive
Load (20-mVpp Output Step, G = -1)
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SBOSAD7 – APRIL 2023
For additional drive capability in unity-gain configurations, improve capacitive load drive by inserting a small
resistor, RISO, in series with the output, as shown in Figure 7-7. This resistor significantly reduces ringing
and maintains DC performance for purely capacitive loads. However, if a resistive load is in parallel with the
capacitive load, then a voltage divider is created, thus introducing a gain error at the output and slightly reducing
the output swing. The error introduced is proportional to the ratio RISO / RL, and is generally negligible at low
output levels. A high capacitive load drive makes the TLV916x-Q1 well suited for applications such as reference
buffers, MOSFET gate drives, and cable-shield drives. The circuit shown in Figure 7-7 uses an isolation resistor,
RISO, to stabilize the output of an op amp. RISO modifies the open-loop gain of the system for increased phase
margin.
+Vs
Vout
Riso
+
Vin
+
±
Cload
-Vs
Figure 7-7. Extending Capacitive Load Drive With the TLV9161-Q1
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7.3.5 Common-Mode Voltage Range
The TLV916x-Q1 is a 16-V, rail-to-rail input operational amplifier with an input common-mode range that extends
to both supply rails. This wide range is achieved with paralleled complementary N-channel and P-channel
differential input pairs, as shown in Figure 7-8. The N-channel pair is active for input voltages close to the
positive rail, typically from (V+) – 1 V to the positive supply. The P-channel pair is active for inputs from the
negative supply to approximately (V+) – 2 V. There is a small transition region, typically (V+) – 2 V to (V+) – 1
V in which both input pairs are on. This transition region can vary modestly with process variation. Within this
region PSRR, CMRR, offset voltage, offset drift, noise, and THD performance may be degraded compared to
operation outside this region.
Figure 6-5 shows this transition region for a typical device in terms of input voltage offset in more detail.
For more information on common-mode voltage range and PMOS/NMOS pair interaction, see Op Amps With
Complementary-Pair Input Stages application note.
V+
INPMOS
PMOS
NMOS
IN+
NMOS
V-
Figure 7-8. Rail-to-Rail Input Stage
7.3.6 Phase Reversal Protection
The TLV916x-Q1 family has internal phase-reversal protection. Many op amps exhibit a phase reversal when the
input is driven beyond its linear common-mode range. This condition is most often encountered in non-inverting
circuits when the input is driven beyond the specified common-mode voltage range, causing the output to
reverse into the opposite rail. The TLV916x-Q1 is a rail-to-rail input op amp; therefore, the common-mode range
can extend up to the rails. Input signals beyond the rails do not cause phase reversal; instead, the output limits
into the appropriate rail. For more information on phase reversal, see Op Amps With Complementary-Pair Input
Stages application note.
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7.3.7 Electrical Overstress
Designers often ask questions about the capability of an operational amplifier to withstand electrical overstress
(EOS). These questions tend to focus on the device inputs, but may involve the supply voltage pins or even
the output pin. Each of these different pin functions have electrical stress limits determined by the voltage
breakdown characteristics of the particular semiconductor fabrication process and specific circuits connected to
the pin. Additionally, internal electrostatic discharge (ESD) protection is built into these circuits to protect them
from accidental ESD events both before and during product assembly.
Having a good understanding of this basic ESD circuitry and its relevance to an electrical overstress event
is helpful. Figure 7-9 shows an illustration of the ESD circuits contained in the TLV916x-Q1 (indicated by the
dashed line area). The ESD protection circuitry involves several current-steering diodes connected from the
input and output pins and routed back to the internal power-supply lines, where the diodes meet at an absorption
device or the power-supply ESD cell, internal to the operational amplifier. This protection circuitry is intended to
remain inactive during normal circuit operation.
TVS
+
–
RF
+VS
VDD
R1
RS
IN–
50
IN+
50
–
+
Power-Supply
ESD Cell
ID
VIN
RL
+
–
VSS
+
–
–VS
TVS
Figure 7-9. Equivalent Internal ESD Circuitry Relative to a Typical Circuit Application
An ESD event is very short in duration and very high voltage (for example; 1 kV, 100 ns), whereas an EOS event
is long duration and lower voltage (for example; 50 V, 100 ms). The ESD diodes are designed for out-of-circuit
ESD protection (that is, during assembly, test, and storage of the device before being soldered to the PCB).
During an ESD event, the ESD signal is passed through the ESD steering diodes to an absorption circuit
(labeled ESD power-supply circuit). The ESD absorption circuit clamps the supplies to a safe level.
Although this behavior is necessary for out-of-circuit protection, excessive current and damage is caused if
activated in-circuit. A transient voltage suppressors (TVS) can be used to prevent against damage caused by
turning on the ESD absorption circuit during an in-circuit ESD event. Using the appropriate current limiting
resistors and TVS diodes allows for the use of device ESD diodes to protect against EOS events.
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7.3.8 Overload Recovery
Overload recovery is defined as the time required for the op amp output to recover from a saturated state to
a linear state. The output devices of the op amp enter a saturation region when the output voltage exceeds
the rated operating voltage, either due to the high input voltage or the high gain. After the device enters the
saturation region, the charge carriers in the output devices require time to return back to the linear state. After
the charge carriers return back to the linear state, the device begins to slew at the specified slew rate. Thus, the
propagation delay in case of an overload condition is the sum of the overload recovery time and the slew time.
The overload recovery time for the TLV916x-Q1 is approximately 120 ns.
7.3.9 Typical Specifications and Distributions
Designers often have questions about a typical specification of an amplifier in order to design a more robust
circuit. Due to natural variation in process technology and manufacturing procedures, every specification of an
amplifier will exhibit some amount of deviation from the ideal value, like an amplifier's input offset voltage. These
deviations often follow Gaussian (bell curve), or normal distributions, and circuit designers can leverage this
information to guardband their system, even when there is not a minimum or maximum specification in the
Electrical Characteristics table.
0.00002% 0.00312% 0.13185%
1
-61
1
-51
1
-41
2.145% 13.59% 34.13% 34.13% 13.59% 2.145%
1
-31
1
-21
1
-1
1
1
+1
0.13185% 0.00312% 0.00002%
1
1
1
1
+21 +31 +41 +51 +61
Figure 7-10. Ideal Gaussian Distribution
Figure 7-10 shows an example distribution, where µ, or mu, is the mean of the distribution, and where σ,
or sigma, is the standard deviation of a system. For a specification that exhibits this kind of distribution,
approximately two-thirds (68.26%) of all units can be expected to have a value within one standard deviation, or
one sigma, of the mean (from µ – σ to µ + σ).
Depending on the specification, values listed in the typical column of the Electrical Characteristics table are
represented in different ways. As a general rule of thumb, if a specification naturally has a nonzero mean
(for example, like gain bandwidth), then the typical value is equal to the mean (µ). However, if a specification
naturally has a mean near zero (like input offset voltage), then the typical value is equal to the mean plus one
standard deviation (µ + σ) in order to most accurately represent the typical value.
24
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This chart can be used to calculate approximate probability of a specification in a unit; for example, for TLV916xQ1, the typical input voltage offset is 210 µV, so 68.2% of all TLV916x-Q1 devices are expected to have an offset
from –210 µV to 210 µV. At 4 σ (±840 µV), 99.9937% of the distribution has an offset voltage less than ±840 µV,
which means 0.0063% of the population is outside of these limits, which corresponds to about 1 in 15,873 units.
Specifications with a value in the minimum or maximum column are assured by TI, and units outside these limits
will be removed from production material. For example, the TLV916x-Q1 family has a maximum offset voltage
of 1 mV at 25°C, and even though this corresponds to about 5-σ (≈1 in 1.7 million units), which is extremely
unlikely, TI assures that any unit with larger offset than 1 mV will be removed from production material.
For specifications with no value in the minimum or maximum column, consider selecting a sigma value of
sufficient guardband for the application, and design worst-case conditions using this value. For example, the 6-σ
value corresponds to about 1 in 500 million units, which is an extremely unlikely chance, and could be an option
as a wide guardband to design a system around. In this case, the TLV916x-Q1 family does not have a maximum
or minimum for offset voltage drift, but based on the typical value of 0.25 µV/°C in the Electrical Characteristics
table, it can be calculated that the 6-σ value for offset voltage drift is about 1.5 µV/°C. When designing for
worst-case system conditions, this value can be used to estimate the worst possible offset across temperature
without having an actual minimum or maximum value.
However, process variation and adjustments over time can shift typical means and standard deviations, and
unless there is a value in the minimum or maximum specification column, TI cannot assure the performance of a
device. This information should be used only to estimate the performance of a device.
7.4 Device Functional Modes
The TLV916x-Q1 has a single functional mode and is operational when the power-supply voltage is greater than
2.7 V (±1.35 V). The maximum power supply voltage for the TLV916x-Q1 is 16 V (±8 V).
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8 Application and Implementation
Note
Information in the following applications sections is not part of the TI component specification,
and TI does not warrant its accuracy or completeness. TI’s customers are responsible for
determining suitability of components for their purposes, as well as validating and testing their design
implementation to confirm system functionality.
8.1 Application Information
The TLV916x-Q1 family offers excellent DC precision and AC performance. These devices operate up to 16-V
supply rails and offer true rail-to-rail input/output, low offset voltage and offset voltage drift, as well as 11-MHz
bandwidth and high output drive. These features make the TLV916x-Q1 a robust, high-performance operational
amplifier for 16-V industrial applications.
8.2 Typical Applications
8.2.1 Low-Side Current Measurement
Figure 8-1 shows the TLV9161-Q1 configured in a low-side current sensing application. For a full analysis of
the circuit shown in Figure 8-1 including theory, calculations, simulations, and measured data, see TI Precision
Design TIPD129, 0-A to 1-A Single-Supply Low-Side Current-Sensing Solution.
VCC
5V
LOAD
+
TLV9161
VOUT
–
ILOAD
RSHUNT
100 m
LM7705
RF
5.76 k
RG
120
Figure 8-1. TLV9161-Q1 in a Low-Side, Current-Sensing Application
8.2.1.1 Design Requirements
The design requirements for this design are:
•
•
•
26
Load current: 0 A to 1 A
Output voltage: 4.9 V
Maximum shunt voltage: 100 mV
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8.2.1.2 Detailed Design Procedure
The transfer function of the circuit in Figure 8-1 is given in Equation 1:
VOUT = ILOAD × RSHUNT × Gain
(1)
The load current (ILOAD) produces a voltage drop across the shunt resistor (RSHUNT). The load current is set
from 0 A to 1 A. To keep the shunt voltage below 100 mV at maximum load current, the largest shunt resistor is
defined using Equation 2:
V
RSHUNT = ISHUNT_MAX = 100 mV
1 A = 100 mΩ
(2)
LOAD_MAX
Using Equation 2, RSHUNT is calculated to be 100 mΩ. The voltage drop produced by ILOAD and RSHUNT is
amplified by the TLV916x-Q1 to produce an output voltage of 0 V to 4.9 V. The gain needed by the TLV916x-Q1
to produce the necessary output voltage is calculated using Equation 3:
Gain =
VOUT_MAX − VOUT_MIN
VIN_MAX − VIN_MIN
(3)
Using Equation 3, the required gain is calculated to be 49 V/V, which is set with resistors RF and RG. Equation 4
is used to size the resistors, RF and RG, to set the gain of the TLV916x-Q1 to 49 V/V.
Gain = 1 +
RF
RG
(4)
Choosing RF as 5.76 kΩ, RG is calculated to be 120 Ω. RF and RG were chosen as 5.76 kΩ and 120 Ω because
the values are standard value resistors that create a 49:1 ratio. Other resistors that create a 49:1 ratio can also
be used. However, excessively large resistors generate thermal noise that exceeds the intrinsic noise of the op
amp. Figure 8-2 shows the measured transfer function of the circuit shown in Figure 8-1.
8.2.1.3 Application Curves
5
Output (V)
4
3
2
1
0
0
0.1
0.2
0.3
0.4
0.5 0.6
ILOAD (A)
0.7
0.8
0.9
1
Figure 8-2. Low-Side, Current-Sense, Transfer Function
8.3 Power Supply Recommendations
The TLV916x-Q1 is specified for operation from 2.7 V to 16 V (±1.35 V to ±8 V); many specifications apply from
–40°C to 125°C or with specific supply voltage and test conditions.
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CAUTION
Supply voltages larger than 20 V can permanently damage the device; see the Absolute Maximum
Ratings section.
Place 0.1-µF bypass capacitors close to the power-supply pins to reduce errors coupling in from noisy or
high-impedance power supplies. For more detailed information on bypass capacitor placement, refer to the
Layout section.
8.4 Layout
8.4.1 Layout Guidelines
For best operational performance of the device, use good PCB layout practices, including:
•
•
•
•
•
•
•
•
28
Noise can propagate into analog circuitry through the power pins of the circuit as a whole and op amp itself.
Bypass capacitors are used to reduce the coupled noise by providing low-impedance power sources local to
the analog circuitry.
– Connect low-ESR, 0.1-µF ceramic bypass capacitors between each supply pin and ground, placed as
close to the device as possible. A single bypass capacitor from V+ to ground is applicable for singlesupply applications.
Separate grounding for analog and digital portions of circuitry is one of the simplest and most-effective
methods of noise suppression. One or more layers on multilayer PCBs are usually devoted to ground planes.
A ground plane helps distribute heat and reduces EMI noise pickup. Make sure to physically separate digital
and analog grounds paying attention to the flow of the ground current.
To reduce parasitic coupling, run the input traces as far away from the supply or output traces as possible. If
these traces cannot be kept separate, crossing the sensitive trace perpendicular is much better as opposed
to in parallel with the noisy trace.
Place the external components as close to the device as possible. As shown in Figure 8-4, keeping RF and
RG close to the inverting input minimizes parasitic capacitance.
Keep the length of input traces as short as possible. Always remember that the input traces are the most
sensitive part of the circuit.
Consider a driven, low-impedance guard ring around the critical traces. A guard ring can significantly reduce
leakage currents from nearby traces that are at different potentials.
Cleaning the PCB following board assembly is recommended for best performance.
Any precision integrated circuit may experience performance shifts due to moisture ingress into the plastic
package. Following any aqueous PCB cleaning process, baking the PCB assembly is recommended to
remove moisture introduced into the device packaging during the cleaning process. A low temperature, post
cleaning bake at 85°C for 30 minutes is sufficient for most circumstances.
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8.4.2 Layout Example
VC3
INPUT
OUTPUT
1 +
3
2
–
R3
4
C4
C2
V+
R1
C1
R2
GND
V+
INPUT
Figure 8-3. Schematic for Non-inverting Configuration Layout Example
GND
OUTPUT
V-
GND
Figure 8-4. Operational Amplifier Board Layout for Non-inverting Configuration - SC70 (DCK) Package
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OUTPUT A
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GND
GND
V+
INPUT A
VGND
GND
INPUT B
OUTPUT B
GND
Figure 8-5. Example Layout for VSSOP-8 (DGK) Package
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9 Device and Documentation Support
9.1 Device Support
9.1.1 Development Support
9.1.1.1 TINA-TI™ (Free Software Download)
TINA™ is a simple, powerful, and easy-to-use circuit simulation program based on a SPICE engine. TINA-TI is a
free, fully-functional version of the TINA software, preloaded with a library of macro models in addition to a range
of both passive and active models. TINA-TI provides all the conventional dc, transient, and frequency domain
analysis of SPICE, as well as additional design capabilities.
Available as a free download from the Analog eLab Design Center, TINA-TI offers extensive post-processing
capability that allows users to format results in a variety of ways. Virtual instruments offer the ability to select
input waveforms and probe circuit nodes, voltages, and waveforms, creating a dynamic quick-start tool.
Note
These files require that either the TINA software (from DesignSoft™) or TINA-TI software be installed.
Download the free TINA-TI software from the TINA-TI folder.
9.2 Documentation Support
9.2.1 Related Documentation
For related documentation, see the following:
1.
2.
3.
4.
5.
Texas Instruments, Analog Engineer's Circuit Cookbook: Amplifiers
Texas Instruments, AN31 amplifier circuit collection application note
Texas Instruments, MUX-Friendly, Precision Operational Amplifiers application brief
Texas Instruments, EMI Rejection Ratio of Operational Amplifiers application note
Texas Instruments, Op Amps With Complementary-Pair Input Stages application note
9.3 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on
Subscribe to updates to register and receive a weekly digest of any product information that has changed. For
change details, review the revision history included in any revised document.
9.4 Support Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
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9.5 Trademarks
TINA-TI™ is a trademark of Texas Instruments, Inc and DesignSoft, Inc.
TINA™ and DesignSoft™ are trademarks of DesignSoft, Inc.
TI E2E™ is a trademark of Texas Instruments.
Bluetooth® is a registered trademark of Bluetooth SIG, Inc.
All trademarks are the property of their respective owners.
9.6 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
9.7 Glossary
TI Glossary
This glossary lists and explains terms, acronyms, and definitions.
10 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
32
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PACKAGE OPTION ADDENDUM
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23-Jul-2023
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
Samples
(4/5)
(6)
TLV9161QDBVRQ1
ACTIVE
SOT-23
DBV
5
3000
RoHS & Green
SN
Level-1-260C-UNLIM
-40 to 125
2W2H
Samples
TLV9161QDCKRQ1
ACTIVE
SC70
DCK
5
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
1NJ
Samples
TLV9162QDGKRQ1
ACTIVE
VSSOP
DGK
8
2500
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
2S5T
Samples
TLV9162QDRQ1
ACTIVE
SOIC
D
8
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
T9162Q
Samples
TLV9164QDRQ1
ACTIVE
SOIC
D
14
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
TLV9164QD
Samples
TLV9164QPWRQ1
ACTIVE
TSSOP
PW
14
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
T9164PW
Samples
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of