TLV9351-Q1, TLV9352-Q1, TLV9354-Q1
SBOSA34D – JANUARY 2021 – REVISED JUNE 2023
TLV935x-Q1 3.5-MHz, 40-V, RRO, MUX-Friendly Automotive Operational Amplifier
for Cost-Sensitive Systems
1 Features
3 Description
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The TLV935x-Q1 family (TLV9351-Q1, TLV9352-Q1,
and TLV9354-Q1) is a family of 40-V cost-optimized
automotive operational amplifiers.
•
•
•
•
•
Low offset voltage: ±350 µV
Low offset voltage drift: ±1.5 µV/°C
Low noise: 15 nV/√Hz at 1 kHz
High common-mode rejection: 110 dB
Low bias current: ±10 pA
Rail-to-rail output
MUX-friendly/comparator inputs
– Amplifier operates with differential inputs up to
supply rail
– Amplifier can be used in open-loop or as
comparator
Wide bandwidth: 3.5-MHz GBW
High slew rate: 20 V/µs
Low quiescent current: 600 µA per amplifier
Wide supply: ±2.25 V to ±20 V, 4.5 V to 40 V
Robust EMIRR performance: EMI/RFI filters on
input pins
These devices offer strong DC and AC specifications,
including rail-to-rail output, low offset (±350 µV,
typ), low offset drift (±1.5 µV/°C, typ), and 3.5-MHz
bandwidth.
Unique features such as differential input-voltage
range to the supply rail, high output current (±60 mA),
and high slew rate (20 V/µs) make the TLV935x-Q1
a robust operational amplifier for high-voltage, costsensitive applications.
The TLV935x-Q1 family of op amps is available in
standard packages and is specified from –40°C to
125°C.
Device Information
2 Applications
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PART NUMBER
Optimized for AEC-Q100 grade 1 applications
Infotainment and cluster
Passive safety
Body electronics and lighting
HEV/EV inverter and motor control
On-board (OBC) and wireless changer
Powertrain current sensor
Advanced driver assistance systems (ADAS)
Single-supply, low-side current sensing
TLV9351-Q1
TLV9352-Q1
TLV9354-Q1
(1)
(2)
RG
CHANNEL COUNT
Single
Dual
Quad
PACKAGE(1)
PACKAGE SIZE(2)
DBV (SOT-23 , 5)
2.90 mm × 2.80 mm
D (SOIC, 8)
4.90 mm × 6.00 mm
PW (TSSOP, 8)
3.00 mm × 6.40 mm
DGK (VSSOP, 8)
3.00 mm × 4.90 mm
D (SOIC, 14)
8.65 mm × 6.00 mm
DYY (SOT-23, 14)
4.20 mm × 3.26 mm
PW (TSSOP, 14)
5.00 mm × 6.40 mm
For all available packages, see the orderable addendum at
the end of the data sheet.
The package size (length × width) is a nominal value and
includes pins, where applicable.
RF
R1
VOUT
VIN
C1
f-3 dB =
(
RF
VOUT
= 1+
RG
VIN
((
1
1 + sR1C1
1
2pR1C1
(
TLV935x-Q1 in a Single-Pole, Low-Pass Filter
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
TLV9351-Q1, TLV9352-Q1, TLV9354-Q1
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SBOSA34D – JANUARY 2021 – REVISED JUNE 2023
Table of Contents
1 Features............................................................................1
2 Applications..................................................................... 1
3 Description.......................................................................1
4 Revision History.............................................................. 2
5 Pin Configuration and Functions...................................3
6 Specifications.................................................................. 6
6.1 Absolute Maximum Ratings........................................ 6
6.2 ESD Ratings............................................................... 6
6.3 Recommended Operating Conditions.........................6
6.4 Thermal Information for Single Channel..................... 6
6.5 Thermal Information for Dual Channel........................7
6.6 Thermal Information for Quad Channel...................... 7
6.7 Electrical Characteristics.............................................8
6.8 Typical Characteristics.............................................. 10
7 Detailed Description......................................................17
7.1 Overview................................................................... 17
7.2 Functional Block Diagram......................................... 17
7.3 Feature Description...................................................18
7.4 Device Functional Modes..........................................25
8 Application and Implementation.................................. 26
8.1 Application Information............................................. 26
8.2 Typical Applications.................................................. 26
8.3 Power Supply Recommendations.............................27
8.4 Layout....................................................................... 27
9 Device and Documentation Support............................30
9.1 Device Support......................................................... 30
9.2 Documentation Support............................................ 30
9.3 Receiving Notification of Documentation Updates....30
9.4 Support Resources................................................... 30
9.5 Trademarks............................................................... 30
9.6 Electrostatic Discharge Caution................................31
9.7 Glossary....................................................................31
10 Mechanical, Packaging, and Orderable
Information.................................................................... 31
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision C (September 2021) to Revision D (June 2023)
Page
• Add the 8-pin TSSOP (PW) package throughout data sheet............................................................................. 1
Changes from Revision B (May 2021) to Revision C (September 2021)
Page
• Deleted preview note from SOIC (14) package throughout data sheet. ............................................................1
• Deleted preview note from SOT-23 (14) package throughout data sheet. ........................................................ 1
• Deleted preview note from SOIC (8) package throughout data sheet. ..............................................................1
• Deleted preview note from SOT-23 (5) package throughout data sheet. .......................................................... 1
Changes from Revision A (March 2021) to Revision B (May 2021)
Page
• Deleted preview note from TSSOP (14) package throughout data sheet. ........................................................ 1
• Deleted preview note from PW package in Thermal Information for Quad Channel table................................. 7
Changes from Revision * (January 2021) to Revision A (March 2021)
Page
• Changed device status from Advance Information to Production Data ............................................................. 1
2
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SBOSA34D – JANUARY 2021 – REVISED JUNE 2023
5 Pin Configuration and Functions
OUT
1
V±
2
IN+
3
5
V+
4
IN±
Not to scale
Figure 5-1. TLV9351-Q1 DBV Package,
5-Pin SOT-23
(Top View)
Table 5-1. Pin Functions: TLV9351-Q1
PIN
NAME
TYPE(1)
NO.
IN+
3
IN–
OUT
DESCRIPTION
I
Noninverting input
4
I
Inverting input
1
O
Output
V+
5
—
Positive (highest) power supply
V–
2
—
Negative (lowest) power supply
(1)
I = input, O = output
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OUT1
1
8
V+
IN1±
2
7
OUT2
IN1+
3
6
IN2±
V±
4
5
IN2+
Not to scale
Figure 5-2. TLV9352-Q1 D, PW and DGK Package,
8-Pin SOIC, TSSOP and VSSOP
(Top View)
Table 5-2. Pin Functions: TLV9352-Q1
PIN
NAME
TYPE(1)
DESCRIPTION
IN1+
3
I
Noninverting input, channel 1
IN2+
5
I
Noninverting input, channel 1
IN1–
2
I
Inverting input, channel 1
IN2–
6
I
Inverting input, channel 2
OUT1
1
O
Output, channel 1
OUT2
7
O
Output, channel 2
V+
8
—
Positive (highest) power supply
V–
4
—
Negative (lowest) power supply
(1)
4
NO.
I = input, O = output
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SBOSA34D – JANUARY 2021 – REVISED JUNE 2023
OUT1
1
14
OUT4
IN1±
2
13
IN4±
IN1+
3
12
IN4+
V+
4
11
V±
IN2+
5
10
IN3+
IN2±
6
9
IN3±
OUT2
7
8
OUT3
Not to scale
Figure 5-3. TLV9354-Q1 D, DYY, and PW Package,
14-Pin SOIC, SOT-23, and TSSOP
(Top View)
Table 5-3. Pin Functions: TLV9354-Q1
PIN
NAME
TYPE(1)
NO.
DESCRIPTION
IN1+
3
I
Noninverting input, channel 1
IN2+
5
I
Noninverting input, channel 2
IN3+
10
I
Noninverting input, channel 3
IN4+
12
I
Noninverting input, channel 4
IN1–
2
I
Inverting input, channel 1
IN2–
6
I
Inverting input, channel 2
IN3–
9
I
Inverting input, channel 3
IN4–
13
I
Inverting input, channel 4
OUT1
1
O
Output, channel 1
OUT2
7
O
Output, channel 2
OUT3
8
O
Output, channel 3
OUT4
14
O
Output, channel 4
V+
4
—
Positive (highest) power supply
V–
11
—
Negative (lowest) power supply
(1)
I = input, O = output
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6 Specifications
6.1 Absolute Maximum Ratings
over operating ambient temperature range (unless otherwise noted) (1)
MIN
MAX
0
42
V
(V–) – 0.5
(V+) + 0.5
V
Supply voltage, VS = (V+) – (V–)
Common-mode voltage
(3)
Differential voltage(3)
Signal input pins
VS + 0.2
Current (3)
–10
Output short-circuit (2)
–55
Junction temperature, TJ
Storage temperature, Tstg
(2)
(3)
V
10
mA
150
°C
150
°C
150
°C
Continuous
Operating ambient temperature, TA
(1)
UNIT
–65
Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute Maximum Ratings do not imply
functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions.
If used outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not be fully
functional, and this may affect device reliability, functionality, performance, and shorten the device lifetime.
Short-circuit to ground, one amplifier per package.
Input pins are diode-clamped to the power-supply rails. Input signals that may swing more than 0.5 V beyond the supply rails must be
current limited to 10 mA or less.
6.2 ESD Ratings
VALUE
V(ESD)
(1)
Electrostatic discharge
Human body model (HBM), per AEC
Q100-002(1)
UNIT
±2000
Charged device model (CDM), per AEC Q100-011
V
±1000
AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
6.3 Recommended Operating Conditions
over operating ambient temperature range (unless otherwise noted)
MIN
VS
Supply voltage, (V+) – (V–)
VI
Input voltage range
TA
Specified ambient temperature
MAX
UNIT
4.5
40
(V–) – 0.1
(V+) – 2
V
V
–40
125
°C
6.4 Thermal Information for Single Channel
TLV9351-Q1
DBV
(SOT-23)
THERMAL METRIC (1)
UNIT
5 PINS
RθJA
Junction-to-ambient thermal resistance
187.4
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
86.2
°C/W
RθJB
Junction-to-board thermal resistance
54.6
°C/W
ψJT
Junction-to-top characterization parameter
27.8
°C/W
ψJB
Junction-to-board characterization parameter
54.3
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
N/A
°C/W
(1)
6
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
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SBOSA34D – JANUARY 2021 – REVISED JUNE 2023
6.5 Thermal Information for Dual Channel
TLV9352-Q1
THERMAL METRIC (1)
D
(SOIC)
DGK
(VSSOP)
PW
(TSSOP)
8 PINS
8 PINS
8 PINS
UNIT
RθJA
Junction-to-ambient thermal resistance
132.6
176.5
185.1
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
73.4
68.1
74.0
°C/W
RθJB
Junction-to-board thermal resistance
76.1
98.2
115.7
°C/W
ψJT
Junction-to-top characterization parameter
24.0
12.0
12.3
°C/W
ψJB
Junction-to-board characterization parameter
75.4
96.7
114.0
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
N/A
N/A
N/A
°C/W
(1)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
6.6 Thermal Information for Quad Channel
TLV9354-Q1
THERMAL METRIC (1)
D
(SOIC)
DYY
(SOT-23)
PW
(TSSOP)
14 PINS
UNIT
14 PINS
14 PINS
RθJA
Junction-to-ambient thermal resistance
101.4
110.7
118
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
57.6
55.9
47.6
°C/W
RθJB
Junction-to-board thermal resistance
57.3
35.3
60.9
°C/W
ψJT
Junction-to-top characterization parameter
18.5
2.3
6
°C/W
ψJB
Junction-to-board characterization parameter
56.9
35.1
60.4
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
N/A
N/A
N/A
°C/W
(1)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
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Product Folder Links: TLV9351-Q1 TLV9352-Q1 TLV9354-Q1
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6.7 Electrical Characteristics
For VS = (V+) – (V–) = 4.5 V to 40 V (±2.25 V to ±20 V) at TA = 25°C, RL = 10 kΩ connected to VS / 2, VCM = VS / 2, and
VO UT = VS / 2, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
±0.35
±1.8
UNIT
OFFSET VOLTAGE
VOS
Input offset voltage
VCM = V–
dVOS/dT
Input offset voltage drift
PSRR
Input offset voltage
versus power supply
VCM = V–
Channel separation
f = 0 Hz
TA = –40°C to 125°C
±2
TA = –40°C to 125°C
±1.5
TA = –40°C to 125°C
±2
mV
µV/℃
±5
5
μV/V
µV/V
INPUT BIAS CURRENT
IB
Input bias current
±10
pA
IOS
Input offset current
±10
pA
NOISE
2
EN
Input voltage noise
f = 0.1 Hz to 10 Hz
eN
Input voltage noise
density
f = 1 kHz
15
f = 10 kHz
14
iN
Input current noise
f = 1 kHz
2
μVPP
0.33
µVRMS
nV/√Hz
fA/√Hz
INPUT VOLTAGE RANGE
VCM
Common-mode voltage
range
CMRR
VS = 40 V, (V–) – 0.1 V < VCM < (V+)
Common-mode rejection – 2 V (Main input pair)
TA = –40°C to 125°C
ratio
VS = 4.5 V, (V–) – 0.1 V < VCM < (V+)
– 2 V (Main input pair)
(V–) – 0.2
(V+) – 2
95
110
82
90
V
dB
INPUT CAPACITANCE
ZID
Differential
ZICM
Common-mode
100 || 3
MΩ || pF
6 || 1
TΩ || pF
OPEN-LOOP GAIN
AOL
8
Open-loop voltage gain
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VS = 40 V, VCM = V–
(V–) + 0.1 V < VO < (V+) – 0.1 V
120
TA = –40°C to 125°C
130
127
dB
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6.7 Electrical Characteristics (continued)
For VS = (V+) – (V–) = 4.5 V to 40 V (±2.25 V to ±20 V) at TA = 25°C, RL = 10 kΩ connected to VS / 2, VCM = VS / 2, and
VO UT = VS / 2, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
FREQUENCY RESPONSE
GBW
Gain-bandwidth product
SR
Slew rate
tS
Settling time
VS = 40 V, G = +1, CL = 20 pF
MHz
20
V/μs
To 0.01%, VS = 40 V, VSTEP = 10 V , G = +1, CL = 20 pF
5
To 0.01%, VS = 40 V, VSTEP = 2 V , G = +1, CL = 20 pF
4
To 0.1%, VS = 40 V, VSTEP = 10 V , G = +1, CL = 20 pF
4
To 0.1%, VS = 40 V, VSTEP = 2 V , G = +1, CL = 20 pF
THD+N
3.5
Phase margin
G = +1, RL = 10 kΩ
Overload recovery time
VIN × gain > VS
Total harmonic distortion
+ noise (1)
VS = 40 V, VO = 1 VRMS, G = 1, f = 1 kHz
μs
3
60
°
600
ns
0.001%
OUTPUT
VS = 40 V, RL = no load(2)
Voltage output swing
from rail
Positive and negative rail headroom
5
10
VS = 40 V, RL = 10 kΩ
50
55
VS = 40 V, RL = 2 kΩ
200
250
VS = 4.5 V, RL = no load(2)
VS = 4.5 V, RL = 10 kΩ
VS = 4.5 V, RL = 2 kΩ
1
20
30
40
75
mV
ISC
Short-circuit current
±60
mA
CLOAD
Capacitive load drive
300
pF
ZO
Open-loop output
impedance
600
Ω
f = 1 MHz, IO = 0 A
POWER SUPPLY
IQ
(1)
(2)
Quiescent current per
amplifier
VCM = V–, IO = 0 A
650
TA = –40°C to 125°C
800
850
µA
Third-order filter; bandwidth = 80 kHz at –3 dB.
Specified by characterization only.
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6.8 Typical Characteristics
at TA = 25°C, VS = ±20 V, VCM = VS / 2, RLOAD = 10 kΩ connected to VS / 2, and CL = 10 pF (unless otherwise noted)
50
33
30
27
40
Population (%)
Population (%)
24
21
18
15
12
30
20
9
10
6
D001
Offset Voltage (µV)
900
400
700
300
Offset Voltage (µV)
100
-100
-300
0.8
0.7
0.6
100
0
-100
-200
-300
-700
-20
0
20
40
60
80
Temperature (°C)
100
120
-400
-40
140
-20
0
D004
20
40
60
80
Temperature (°C)
800
600
600
400
400
Offset Voltage (µV)
800
200
0
-200
-200
-600
-600
0
VCM
5
10
15
20
-800
16
16.5
17
17.5
D005
TA = 25°C
Figure 6-5. Offset Voltage vs Common-Mode Voltage
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D003
0
-400
-5
140
200
-400
-10
120
Figure 6-4. Offset Voltage vs Temperature
Figure 6-3. Offset Voltage vs Temperature
-15
100
VCM = V–
VCM = V+
Offset Voltage (µV)
0.5
200
300
-500
10
0.4
Figure 6-2. Offset Voltage Drift Distribution
500
Offset Voltage (µV)
0.3
Distribution from 60 amplifiers
Distribution from 15462 amplifiers, TA = 25°C
-800
-20
D002
Offset Voltage Drift (µV/C)
Figure 6-1. Offset Voltage Production Distribution
-900
-40
0.2
600
480
360
240
120
0
-120
-240
-360
-480
-600
0.1
0
0
0
3
18
VCM
18.5
19
19.5
20
D005
TA = 25°C
Figure 6-6. Offset Voltage vs Common-Mode Voltage (Transition
Region)
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6.8 Typical Characteristics (continued)
800
800
600
600
400
400
Offset Voltage (µV)
200
0
-200
200
0
-200
-400
-400
-600
-600
-800
-20
-15
-10
-5
0
VCM
5
10
15
-800
-20
20
-15
-10
-5
D006
TA = 125°C
10
15
20
D007
Figure 6-8. Offset Voltage vs Common-Mode Voltage
600
100
500
90
400
80
200
Gain (dB) 175
Phase ( )
150
300
70
125
200
60
100
50
75
40
50
30
25
-200
20
0
-300
10
-25
-400
0
-50
-500
-10
-75
-600
-20
100
Gain (dB)
Offset Voltage (µV)
5
TA = –40°C
Figure 6-7. Offset Voltage vs Common-Mode Voltage
100
0
-100
0
5
10
15
20
25
30
Supply Voltage (V)
35
40
45
1k
D008
10k
100k
Frequency (Hz)
-100
10M
1M
C002
CL = 20 pF
.
Figure 6-10. Open-Loop Gain and Phase vs Frequency
Figure 6-9. Offset Voltage vs Power Supply
80
6
60
50
Input Bias and Offset Current (pA)
G= 1
G=1
G = 10
G = 100
G = 1000
70
Closed-Loop Gain (dB)
0
VCM
Phase ( )
Offset Voltage (µV)
at TA = 25°C, VS = ±20 V, VCM = VS / 2, RLOAD = 10 kΩ connected to VS / 2, and CL = 10 pF (unless otherwise noted)
40
30
20
10
0
-10
-20
100
1k
10k
100k
Frequency (Hz)
1M
3
1.5
0
-1.5
-3
-4.5
C001
IB
IB+
IOS
-6
-7.5
-20
10M
Figure 6-11. Closed-Loop Gain vs Frequency
4.5
-16
-12
-8
-4
0
4
8
Common Mode Voltage (V)
12
16
20
D010
Figure 6-12. Input Bias Current vs Common-Mode Voltage
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6.8 Typical Characteristics (continued)
at TA = 25°C, VS = ±20 V, VCM = VS / 2, RLOAD = 10 kΩ connected to VS / 2, and CL = 10 pF (unless otherwise noted)
V+
IB
IB+
IOS
125
100
75
Output Voltage (V)
Input Bias and Offset Current (pA)
150
50
25
0
-25
V+
1V
V+
2V
V+
3V
V+
4V
V+
5V
V+
6V
V+
7V
-50
V+
8V
-75
V+
9V
-100
-40
V+
-20
0
20
40
60
80
Temperature (°C)
100
120
10 V
140
0
10
20
D011
Figure 6-13. Input Bias Current vs Temperature
30
40
50
60
70
Output Current (mA)
100
D012
CMRR
PSRR+
PSRR
120
CMRR and PSRR (dB)
V +6V
V +5V
V +4V
V +3V
V +2V
V +1V
105
90
75
60
45
30
15
V
0
10
20
30
40
50
60
70
Output Current (mA)
80
90
0
100
100
1k
10k
100k
Frequency (Hz)
D012
.
C003
Figure 6-16. CMRR and PSRR vs Frequency
Power Supply Rejection Ratio (dB)
130
125
120
115
PMOS (VCM
NMOS (VCM
V+
V+
1.5 V)
1.5 V)
105
100
95
90
85
-40
10M
170
135
110
1M
.
Figure 6-15. Output Voltage Swing vs Output Current (Sinking)
Common-Mode Rejection Ratio (dB)
90
135
-40°C
25°C
125°C
V +7V
-20
0
20
40
60
80
Temperature (°C)
100
120
140
D015
165
160
155
150
145
140
-40
-20
0
20
40
60
80
Temperature (°C)
f = 0 Hz
Figure 6-17. CMRR vs Temperature (dB)
12
80
Figure 6-14. Output Voltage Swing vs Output Current (Sourcing)
V +8V
Output Voltage (V)
-40°C
25°C
125°C
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100
120
140
D016
f = 0 Hz
Figure 6-18. PSRR vs Temperature (dB)
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6.8 Typical Characteristics (continued)
Input Voltage Noise Spectral Density (nV/ Hz)
at TA = 25°C, VS = ±20 V, VCM = VS / 2, RLOAD = 10 kΩ connected to VS / 2, and CL = 10 pF (unless otherwise noted)
1
0.8
Amplitude (uV)
0.6
0.4
0.2
0
-0.2
-0.4
-0.6
-0.8
-1
200
100
10
1
1
Time (1s/div)
10
C019
-32
100k
C017
-32
RL = 10 k
RL = 2 k
RL = 604
RL = 128
-40
-48
RL = 128
RL = 604
RL = 2 k
RL = 10 k
-40
-48
-56
THD+N (dB)
-56
THD+N (dB)
10k
Figure 6-20. Input Voltage Noise Spectral Density vs Frequency
Figure 6-19. 0.1-Hz to 10-Hz Noise
-64
-72
-80
-88
-64
-72
-80
-88
-96
-96
-104
-104
-112
0.001
-112
100
1k
Frequency (Hz)
10k
0.01
C012
BW = 80 kHz, VOUT = 1 VRMS
675
560
650
Quiescent current (µA)
700
570
550
540
530
520
510
575
550
525
500
475
480
12
16
20
24
28
Supply Voltage (V)
C023
600
490
8
10 20
625
500
4
1
Figure 6-22. THD+N vs Output Amplitude
580
0
0.1
Amplitude (Vrms)
BW = 80 kHz, f = 1 kHz
Figure 6-21. THD+N Ratio vs Frequency
Quiescent current (µA)
100
1k
Frequency (Hz)
32
36
40
D021
450
-40
-20
0
20
40
60
80
Temperature (°C)
VCM = V–
Figure 6-23. Quiescent Current vs Supply Voltage
100
120
140
D022
.
Figure 6-24. Quiescent Current vs Temperature
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6.8 Typical Characteristics (continued)
at TA = 25°C, VS = ±20 V, VCM = VS / 2, RLOAD = 10 kΩ connected to VS / 2, and CL = 10 pF (unless otherwise noted)
140
700
135
130
125
120
115
-40
-20
0
20
40
60
80
Temperature (°C)
100
120
650
Open-loop output impedance (ohms)
Open Loop Voltage Gain (dB)
VS = 4 V
VS = 40 V
600
550
500
450
400
350
300
250
200
150
100
140
D023
Figure 6-25. Open-Loop Voltage Gain vs Temperature (dB)
1k
10k
100k
Frequency (Hz)
1M
10M
C013
Figure 6-26. Open-Loop Output Impedance vs Frequency
80
60
70
50
Overshoot (%)
Overshoot (%)
60
40
30
20
40
30
20
RISO = 0 , Positive Overshoot
RISO = 0 , Negative Overshoot
RISO = 50 , Positive Overshoot
RISO = 50 , Negative Overshoot
10
50
RISO = 0 , Positive Overshoot
RISO = 0 , Negative Overshoot
RISO = 50 , Positive Overshoot
RISO = 50 , Negative Overshoot
10
0
0
0
500 1000 1500 2000 2500 3000 3500 4000 4500 5000
Cap Load (pF)
C007
0
G = –1, 10-mV output step
Figure 6-27. Small-Signal Overshoot vs Capacitive Load
500 1000 1500 2000 2500 3000 3500 4000 4500 5000
Cap Load (pF)
C008
G = 1, 10-mV output step
Figure 6-28. Small-Signal Overshoot vs Capacitive Load
60
Input
Output
Amplitude (4V/div)
Phase Margin (Degree)
50
40
30
20
10
0
500 1000 1500 2000 2500 3000 3500 4000 4500 5000
Cap Load (pF)
C009
Figure 6-29. Phase Margin vs Capacitive Load
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C016
VIN = ±20 V; VS = VOUT = ±17 V
.
14
Time (20us/div)
Figure 6-30. No Phase Reversal
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6.8 Typical Characteristics (continued)
at TA = 25°C, VS = ±20 V, VCM = VS / 2, RLOAD = 10 kΩ connected to VS / 2, and CL = 10 pF (unless otherwise noted)
Voltage (5V/div)
Input
Output
Voltage (5V/div)
Input
Output
Time (100ns/div)
Time (100ns/div)
C018
C018
G = –10
G = –10
Figure 6-31. Positive Overload Recovery
Figure 6-32. Negative Overload Recovery
Amplitude (5mV/div)
Amplitude (5mV/div)
Input
Output
Input
Output
Time (1µs/div)
Time (300ns/div)
C011
C010
CL = 20 pF, G = –1, 20-mV step response
CL = 20 pF, G = 1, 20-mV step response
Figure 6-34. Small-Signal Step Response
Figure 6-33. Small-Signal Step Response, Rising
Amplitude (2V/div)
Amplitude (2V/div)
Input
Output
Input
Output
Time (300ns/div)
Time (300ns/div)
C005
CL = 20 pF, G = 1
Figure 6-35. Large-Signal Step Response (Rising)
C005
CL = 20 pF, G = 1
Figure 6-36. Large-Signal Step Response (Falling)
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6.8 Typical Characteristics (continued)
at TA = 25°C, VS = ±20 V, VCM = VS / 2, RLOAD = 10 kΩ connected to VS / 2, and CL = 10 pF (unless otherwise noted)
Large Signal Step Response (2V/div)
100
80
60
Output Current (mA)
Input
Output
40
20
Sourcing
Sinking
0
-20
-40
-60
-80
-100
-40
Time (2µs/div)
-20
0
C021
20
40
60
80
Temperature (°C)
140
D014
Figure 6-38. Short-Circuit Current vs Temperature
Figure 6-37. Large-Signal Step Response
45
-50
VS = 40 V
VS = 30 V
VS = 15 V
VS = 2.7 V
35
-60
Channel Seperation (dB)
40
Maximum Output Swing (V)
120
.
CL = 20 pF, G = –1
30
25
20
15
10
-70
-80
-90
-100
-110
-120
5
0
1k
100
10k
100k
Frequency (Hz)
1M
-130
100
10M
1k
C020
Figure 6-39. Maximum Output Voltage vs Frequency
10k
100k
Frequency (Hz)
1M
10M
C014
Figure 6-40. Channel Separation vs Frequency
110
100
Gain(dB)
90
80
70
60
50
40
1M
10M
100M
Frequency (Hz)
1G
C004
Figure 6-41. EMIRR (Electromagnetic Interference Rejection Ratio) at Inputs vs Frequency
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7 Detailed Description
7.1 Overview
The TLV935x-Q1 family (TLV9351-Q1, TLV9352-Q1, and TLV9354-Q1) is a family of 40-V, cost-optimized
automotive operational amplifiers. These devices offer strong general-purpose DC and AC specifications,
including rail-to-rail output, low offset (±350 µV, typ), low offset drift (±1.5 µV/°C, typ), and 3.5-MHz bandwidth.
Convenient features such as wide differential input-voltage range, high output current (±60 mA), and high slew
rate (20 V/μs) make the TLV935x-Q1 a robust operational amplifier for high-voltage, cost-sensitive applications.
The TLV935x-Q1 family of op amps is available in standard packages and is specified from –40°C to 125°C.
7.2 Functional Block Diagram
V+
Reference
Current
V
V
INÛ
IN+
V
BIAS1
Class AB
Control
Circuitry
V
O
V
BIAS2
VÛ
(Ground)
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7.3 Feature Description
7.3.1 Input Protection Circuitry
The TLV935x-Q1 uses a patented input architecture to eliminate the requirement for input protection diodes
but still provides robust input protection under transient conditions. Figure 7-1 shows conventional input diode
protection schemes that are activated by fast transient step responses and introduce signal distortion and
settling time delays because of alternate current paths, as shown in Figure 7-2. For low-gain circuits, these
fast-ramping input signals forward-bias back-to-back diodes, causing an increase in input current and resulting in
extended settling time.
V+
V+
VIN+
VIN+
VOUT
TLV935x-Q1
40 V
VOUT
~0.7 V
VIN
VIN
V
OPAx990 Provides Full 40-V
Differential Input Range
V
Conventional Input Protection
Limits Differential Input Range
Figure 7-1. TLV935x-Q1 Input Protection Does Not Limit Differential Input Capability
Vn = 10 V
RFILT
10 V
1
Ron_mux
Sn
1
D
10 V
CFILT
2
~±9.3 V
CS
CD
Vn+1 = ±10 V RFILT
±10 V
Ron_mux
Sn+1
VIN±
2
~0.7 V
CS
CFILT
VOUT
Idiode_transient
±10 V
Input Low-Pass Filter
VIN+
Buffer Amplifier
Simplified Mux Model
Figure 7-2. Back-to-Back Diodes Create Settling Issues
The TLV935x-Q1 family of operational amplifiers provides a true high-impedance differential input capability
for high-voltage applications. This patented input protection architecture does not introduce additional signal
distortion or delayed settling time, making the device an optimal op amp for multichannel, high-switched,
input applications. The TLV935x-Q1 tolerates a maximum differential swing (voltage between inverting and
noninverting pins of the op amp) of up to 40 V, making the device suitable for use as a comparator or in
applications with fast-ramping input signals.
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7.3.2 EMI Rejection
The TLV935x-Q1 uses integrated electromagnetic interference (EMI) filtering to reduce the effects of EMI from
sources such as wireless communications and densely-populated boards with a mix of analog signal chain and
digital components. EMI immunity can be improved with circuit design techniques; the TLV935x-Q1 benefits from
these design improvements. Texas Instruments has developed the ability to accurately measure and quantify
the immunity of an operational amplifier over a broad frequency spectrum extending from 10 MHz to 6 GHz.
Figure 7-3 shows the results of this testing on the TLV935x-Q1. Table 7-1 provides the EMIRR IN+ values
for the TLV935x-Q1 at particular frequencies commonly encountered in real-world applications. Table 7-1 lists
applications that may be centered on or operated near the particular frequency shown. The EMI Rejection Ratio
of Operational Amplifiers application report contains detailed information on the topic of EMIRR performance as
it relates to op amps and is available for download from www.ti.com.
110
100
Gain(dB)
90
80
70
60
50
40
1M
10M
100M
Frequency (Hz)
1G
C004
Figure 7-3. EMIRR Testing
Table 7-1. TLV935x-Q1 EMIRR IN+ for Frequencies of Interest
FREQUENCY
APPLICATION OR ALLOCATION
EMIRR IN+
400 MHz
Mobile radio, mobile satellite, space operation, weather, radar, ultra-high frequency (UHF)
applications
71 dB
900 MHz
Global system for mobile communications (GSM) applications, radio communication, navigation,
GPS (to 1.6 GHz), GSM, aeronautical mobile, UHF applications
80 dB
1.8 GHz
GSM applications, mobile personal communications, broadband, satellite, L-band (1 GHz to 2 GHz)
87 dB
2.4 GHz
802.11b, 802.11g, 802.11n, Bluetooth®, mobile personal communications, industrial, scientific and
medical (ISM) radio band, amateur radio and satellite, S-band (2 GHz to 4 GHz)
90 dB
3.6 GHz
Radiolocation, aero communication and navigation, satellite, mobile, S-band
92 dB
802.11a, 802.11n, aero communication and navigation, mobile communication, space and satellite
operation, C-band (4 GHz to 8 GHz)
94 dB
5 GHz
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7.3.3 Phase Reversal Protection
The TLV935x-Q1 family has internal phase-reversal protection. Many op amps exhibit a phase reversal when the
input is driven beyond its linear common-mode range. This condition is most often encountered in noninverting
circuits when the input is driven beyond the specified common-mode voltage range, causing the output to
reverse into the opposite rail. The TLV935x-Q1 is a rail-to-rail input op amp; therefore, the common-mode range
can extend up to the rails. Input signals beyond the rails do not cause phase reversal; instead, the output limits
into the appropriate rail.
7.3.4 Thermal Protection
VOUT
The internal power dissipation of any amplifier causes its internal (junction) temperature to rise. This
phenomenon is called self heating. The absolute maximum junction temperature of the TLV935x-Q1 is 150°C.
Exceeding this temperature causes damage to the device. The TLV935x-Q1 has a thermal protection feature
that prevents damage from self heating. The protection works by monitoring the temperature of the device and
turning off the op amp output drive for temperatures above 140°C. Figure 7-4 shows an application example for
the TLV9351-Q1 that has significant self heating (159°C) because of its power dissipation (0.81 W). Thermal
calculations indicate that for an ambient temperature of 65°C the device junction temperature will reach 187°C.
The actual device, however, turns off the output drive to maintain a safe junction temperature. Figure 7-4 shows
how the circuit behaves during thermal protection. During normal operation, the device acts as a buffer so the
output is 3 V. When self heating causes the device junction temperature to increase above 140°C, the thermal
protection forces the output to a high-impedance state and the output is pulled to ground through resistor RL.
3V
TA = 65°C
PD = 0.81W
JA = 138.7°C/W
0V
TJ = 138.7°C/W × 0.81W + 65°C
TJ = 177.3°C (expected)
30 V
150°C
TLV9351
+
–
VIN
3V
+
RL
3V
100 –
140ºC
Temperature
IOUT = 30 mA
Figure 7-4. Thermal Protection
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7.3.5 Capacitive Load and Stability
The TLV935x-Q1 features a resistive output stage capable of driving smaller capacitive loads, and by leveraging
an isolation resistor, the device can easily be configured to drive large capacitive loads. Increasing the gain
enhances the ability of the amplifier to drive greater capacitive loads; see Figure 7-5 and Figure 7-6. The
particular op amp circuit configuration, layout, gain, and output loading are some of the factors to consider when
establishing whether an amplifier is stable in operation.
80
60
70
50
Overshoot (%)
Overshoot (%)
60
50
40
30
20
RISO = 0 , Positive Overshoot
RISO = 0 , Negative Overshoot
RISO = 50 , Positive Overshoot
RISO = 50 , Negative Overshoot
10
40
30
20
RISO = 0 , Positive Overshoot
RISO = 0 , Negative Overshoot
RISO = 50 , Positive Overshoot
RISO = 50 , Negative Overshoot
10
0
0
0
500 1000 1500 2000 2500 3000 3500 4000 4500 5000
Cap Load (pF)
C008
0
Figure 7-5. Small-Signal Overshoot vs Capacitive
Load (100-mV Output Step, G = 1)
500 1000 1500 2000 2500 3000 3500 4000 4500 5000
Cap Load (pF)
C007
Figure 7-6. Small-Signal Overshoot vs Capacitive
Load (100-mV Output Step, G = –1)
For additional drive capability in unity-gain configurations, improve capacitive load drive by inserting a small (10
Ω to 20 Ω) resistor, RISO, in series with the output, as shown in Figure 7-7. This resistor significantly reduces
ringing and maintains DC performance for purely capacitive loads. However, if a resistive load is in parallel with
the capacitive load, then a voltage divider is created, thus introducing a gain error at the output and slightly
reducing the output swing. The error introduced is proportional to the ratio RISO / RL, and is generally negligible
at low output levels. A high capacitive load drive makes the TLV935x-Q1 well suited for applications such
as reference buffers, MOSFET gate drives, and cable-shield drives. The circuit shown in Figure 7-7 uses an
isolation resistor, RISO, to stabilize the output of an op amp. RISO modifies the open-loop gain of the system for
increased phase margin. For additional information on techniques to optimize and design using this circuit, TI
Precision Design TIDU032 details complete design goals, simulation, and test results.
+Vs
Vout
Riso
+
Vin
+
±
Cload
-Vs
Figure 7-7. Extending Capacitive Load Drive With the TLV9351-Q1
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7.3.6 Common-Mode Voltage Range
The TLV935x-Q1 is a 40-V, rail-to-rail output operational amplifier with an input common-mode range
that extends 100 mV beyond V– and within 2 V of V+ for normal operation. The device accomplishes
this performance through a complementary input stage, using a P-channel differential pair. Additionally, a
complementary N-channel differential pair has been included in parallel with the P-channel pair to eliminate
common undesirable op amp behaviors, such as phase reversal.
The TLV935x-Q1 can operate with common mode ranges beyond 100 mV of the top rail, but with reduced
performance above (V+) – 2 V. The N-channel pair is active for input voltages close to the positive rail, typically
(V+) – 1 V to 100 mV above the positive supply. The P-channel pair is active for inputs from 100 mV below the
negative supply to approximately (V+) – 2 V. There is a small transition region, typically (V+) –2 V to (V+) – 1
V in which both input pairs are on. This transition region can vary modestly with process variation, and within
the transition region and N-channel region, many specifications of the op amp, including PSRR, CMRR, offset
voltage, offset drift, noise and THD performance may be degraded compared to operation within the P-channel
region.
Table 7-2. Typical Performance for Common-Mode Voltages Within 2 V of the Positive Supply
PARAMETER
Input common-mode voltage
MIN
TYP
(V+) – 2
MAX
(V+) + 0.1
Offset voltage
1.5
Offset voltage drift
Common-mode rejection
UNIT
V
mV
2
µV/°C
75
dB
Open-loop gain
75
dB
Gain-bandwidth product
1.5
MHz
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7.3.7 Electrical Overstress
Designers often ask questions about the capability of an operational amplifier to withstand electrical overstress
(EOS). These questions tend to focus on the device inputs, but may involve the supply voltage pins or even
the output pin. Each of these different pin functions have electrical stress limits determined by the voltage
breakdown characteristics of the particular semiconductor fabrication process and specific circuits connected to
the pin. Additionally, internal electrostatic discharge (ESD) protection is built into these circuits to protect them
from accidental ESD events both before and during product assembly.
Having a good understanding of this basic ESD circuitry and its relevance to an electrical overstress event
is helpful. Figure 7-8 shows an illustration of the ESD circuits contained in the TLV935x-Q1 (indicated by the
dashed line area). The ESD protection circuitry involves several current-steering diodes connected from the
input and output pins and routed back to the internal power-supply lines, where the diodes meet at an absorption
device or the power-supply ESD cell, internal to the operational amplifier. This protection circuitry is intended to
remain inactive during normal circuit operation.
TVS
+
–
RF
+VS
VDD
R1
RS
IN–
100
IN+
100
TLV935x-Q1
–
+
Power Supply
ESD Cell
ID
VIN
RL
+
–
VSS
+
–
–VS
TVS
Figure 7-8. Equivalent Internal ESD Circuitry Relative to a Typical Circuit Application
An ESD event is very short in duration and very high voltage (for example, 1 kV, 100 ns), whereas an EOS event
is long duration and lower voltage (for example, 50 V, 100 ms). The ESD diodes are designed for out-of-circuit
ESD protection (that is, during assembly, test, and storage of the device before being soldered to the PCB).
During an ESD event, the ESD signal is passed through the ESD steering diodes to an absorption circuit
(labeled ESD power-supply circuit). The ESD absorption circuit clamps the supplies to a safe level.
Although this behavior is necessary for out-of-circuit protection, excessive current and damage is caused if
activated in-circuit. A transient voltage suppressors (TVS) can be used to prevent against damage caused by
turning on the ESD absorption circuit during an in-circuit ESD event. Using the appropriate current limiting
resistors and TVS diodes allows for the use of device ESD diodes to protect against EOS events.
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7.3.8 Overload Recovery
Overload recovery is defined as the time required for the op amp output to recover from a saturated state to
a linear state. The output devices of the op amp enter a saturation region when the output voltage exceeds
the rated operating voltage, either due to the high input voltage or the high gain. After the device enters the
saturation region, the charge carriers in the output devices require time to return back to the linear state. After
the charge carriers return back to the linear state, the device begins to slew at the specified slew rate. Thus, the
propagation delay in case of an overload condition is the sum of the overload recovery time and the slew time.
The overload recovery time for the TLV935x-Q1 is approximately 600 ns.
7.3.9 Typical Specifications and Distributions
Designers often have questions about a typical specification of an amplifier to design a more robust circuit. Due
to natural variation in process technology and manufacturing procedures, every specification of an amplifier will
exhibit some amount of deviation from the ideal value, like an amplifier's input offset voltage. These deviations
often follow Gaussian (bell curve), or normal distributions, and circuit designers can leverage this information to
guardband their system, even when there is not a minimum or maximum specification in Section 6.7.
0.00002% 0.00312% 0.13185%
1
-61
1
-51
1
-41
2.145% 13.59% 34.13% 34.13% 13.59% 2.145%
1
-31
1
-21
1
-1
1
1
+1
0.13185% 0.00312% 0.00002%
1
1
1
1
+21 +31 +41 +51 +61
Figure 7-9. Ideal Gaussian Distribution
Figure 7-9 shows an example distribution, where µ, or mu, is the mean of the distribution, and where σ,
or sigma, is the standard deviation of a system. For a specification that exhibits this kind of distribution,
approximately two-thirds (68.26%) of all units can be expected to have a value within one standard deviation, or
one sigma, of the mean (from µ – σ to µ + σ).
Depending on the specification, values listed in the typical column of Section 6.7 are represented in different
ways. As a general rule, if a specification naturally has a nonzero mean (for example, like gain bandwidth), then
the typical value is equal to the mean (µ). However, if a specification naturally has a mean near zero (like input
offset voltage), then the typical value is equal to the mean plus one standard deviation (µ + σ) to most accurately
represent the typical value.
24
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This chart can be used to calculate approximate probability of a specification in a unit; for example, for TLV935xQ1, the typical input voltage offset is 350 µV, so 68.2% of all TLV935x-Q1 devices are expected to have an offset
from –350 µV to 350 µV. At 4 σ (±1400 µV), 99.9937% of the distribution has an offset voltage less than ±1400
µV, which means 0.0063% of the population is outside of these limits, which corresponds to about 1 in 15,873
units.
Specifications with a value in the minimum or maximum column are assured by TI, and units outside these limits
will be removed from production material. For example, the TLV935x-Q1 family has a maximum offset voltage
of 1.8 mV at 125°C, and even though this corresponds to about 5 σ (≈1 in 1.7 million units), which is extremely
unlikely, TI assures that any unit with larger offset than 1.8 mV will be removed from production material.
For specifications with no value in the minimum or maximum column, consider selecting a sigma value of
sufficient guardband for the application, and design worst-case conditions using this value. For example, the 6-σ
value corresponds to about 1 in 500 million units, which is an extremely unlikely chance, and could be an option
as a wide guardband to design a system around. In this case, the TLV935x-Q1 family does not have a maximum
or minimum for offset voltage drift, but based on the typical value of 1.5 µV/°C in Section 6.7, it can be calculated
that the 6-σ value for offset voltage drift is about 9 µV/°C. When designing for worst-case system conditions, this
value can be used to estimate the worst possible offset across temperature without having an actual minimum or
maximum value.
However, process variation and adjustments over time can shift typical means and standard deviations, and
unless there is a value in the minimum or maximum specification column, TI cannot assure the performance of a
device. This information should be used only to estimate the performance of a device.
7.4 Device Functional Modes
The TLV935x-Q1 has a single functional mode and is operational when the power-supply voltage is greater than
4.5 V (±2.25 V). The maximum power supply voltage for the TLV935x-Q1 is 40 V (±20 V).
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8 Application and Implementation
Note
Information in the following applications sections is not part of the TI component specification,
and TI does not warrant its accuracy or completeness. TI’s customers are responsible for
determining suitability of components for their purposes, as well as validating and testing their design
implementation to confirm system functionality.
8.1 Application Information
The TLV935x-Q1 family offers excellent DC precision and DC performance. These devices operate up to 40-V
supply rails and offer true rail-to-rail output, low offset voltage and offset voltage drift, as well as 3.5-MHz
bandwidth and high output drive. These features make the TLV935x-Q1 a robust, high-performance operational
amplifier for high-voltage cost-sensitive applications.
8.2 Typical Applications
8.2.1 High Voltage Precision Comparator
Many different systems require controlled voltages across numerous system nodes for robust operation. A
comparator can be used to monitor and control voltages by comparing a reference threshold voltage with an
input voltage and providing an output when the input crosses this threshold.
The TLV935x-Q1 family of op amps make excellent high voltage comparators due to their MUX-friendly input
stage (for more information, see Section 7.3.1). Previous generation high-voltage op amps often use back-toback diodes across the inputs to prevent damage to the op amp which greatly limits these op amps to be used
as comparators, but the TLV935x-Q1's patented input stage allows the device to have a wide differential voltage
between the inputs.
V+
+
VIN
VOUT
VTH
V+
R1
R2
Figure 8-1. Typical Comparator Application
8.2.1.1 Design Requirements
The primary objective is to design a 40-V precision comparator.
•
•
•
•
•
•
26
System supply voltage (V+): 40 V
Resistor 1 value: 100 kΩ
Resistor 2 value: 100 kΩ
Reference threshold voltage (VTH): 20 V
Input voltage range (VIN): 0 V – 40 V
Output voltage range (VOUT): 0 V – 40 V
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8.2.1.2 Detailed Design Procedure
This noninverting comparator circuit applies the input voltage (VIN) to the noninverting terminal of the op amp.
Two resistors (R1 and R2) divide the supply voltage (V+) to create a mid-supply threshold voltage (VTH) as
calculated in Equation 1. The circuit is shown in Figure 8-1. When VIN is less then VTH, the output voltage
transitions to the negative supply and equals the low-level output voltage. When VIN is greater than VTH, the
output voltage transitions to the positive supply and equals the high-level output voltage.
In this example, resistor 1 and 2 have been selected to be 100 kΩ, which sets the reference threshold at 20 V.
However, resistor 1 and 2 can be adjusted to modify the threshold using Equation 1. Resistor 1 and 2's values
have also been selected to reduce power consumption, but these values can be further increased to reduce
power consumption, or reduced to improve noise performance.
R
VTH = R +2 R × V+
1
2
(1)
8.2.1.3 Application Curve
45
Input
Output
40
35
Voltage (V)
30
25
20
15
10
5
0
-5
0
0.2
0.4
0.6
0.8
1
1.2
Time (ms)
1.4
1.6
1.8
2
comp
Figure 8-2. Comparator Output Response to Input Voltage
8.3 Power Supply Recommendations
The TLV935x-Q1 is specified for operation from 4.5 V to 40 V (±2.25 V to ±20 V); many specifications apply from
–40°C to 125°C.
CAUTION
Supply voltages larger than 40 V can permanently damage the device; see Section 6.1.
Place 0.1-μF bypass capacitors close to the power-supply pins to reduce errors coupling in from noisy or
high-impedance power supplies. For more detailed information on bypass capacitor placement, refer to Section
8.4.
8.4 Layout
8.4.1 Layout Guidelines
For best operational performance of the device, use good PCB layout practices, including:
•
Noise can propagate into analog circuitry through the power pins of the circuit as a whole and op amp itself.
Bypass capacitors are used to reduce the coupled noise by providing low-impedance power sources local to
the analog circuitry.
– Connect low-ESR, 0.1-µF ceramic bypass capacitors between each supply pin and ground, placed as
close to the device as possible. A single bypass capacitor from V+ to ground is applicable for singlesupply applications.
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•
•
•
•
•
•
•
Separate grounding for analog and digital portions of circuitry is one of the simplest and most-effective
methods of noise suppression. One or more layers on multilayer PCBs are usually devoted to ground planes.
A ground plane helps distribute heat and reduces EMI noise pickup. Make sure to physically separate digital
and analog grounds paying attention to the flow of the ground current.
In order to reduce parasitic coupling, run the input traces as far away from the supply or output traces as
possible. If these traces cannot be kept separate, crossing the sensitive trace perpendicular is much better as
opposed to in parallel with the noisy trace.
Place the external components as close to the device as possible. As shown in Figure 8-4, keeping RF and
RG close to the inverting input minimizes parasitic capacitance.
Keep the length of input traces as short as possible. Always remember that the input traces are the most
sensitive part of the circuit.
Consider a driven, low-impedance guard ring around the critical traces. A guard ring can significantly reduce
leakage currents from nearby traces that are at different potentials.
Cleaning the PCB following board assembly is recommended for best performance.
Any precision integrated circuit may experience performance shifts due to moisture ingress into the plastic
package. Following any aqueous PCB cleaning process, baking the PCB assembly is recommended to
remove moisture introduced into the device packaging during the cleaning process. A low temperature, post
cleaning bake at 85°C for 30 minutes is sufficient for most circumstances.
8.4.2 Layout Example
+
VIN
VOUT
RG
RF
Figure 8-3. Schematic Representation
Run the input traces
as far away from
the supply lines
as possible
Place components close
to device and to each
other to reduce parasitic
errors
VS+
RF
NC
NC
GND
±IN
V+
VIN
+IN
OUTPUT
V±
NC
Use a low-ESR,
ceramic bypass
capacitor
RG
GND
VS±
GND
VOUT
Ground (GND) plane on another layer
Use low-ESR,
ceramic bypass
capacitor
Figure 8-4. Operational Amplifier Board Layout for Noninverting Configuration
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V+
INPUT
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GND
GND
OUT
V-
GND
OUTPUT A
Figure 8-5. Example Layout for SC70 (DCK) Package
GND
GND
GND
V+
INPUT A
VGND
GND
INPUT B
OUTPUT B
GND
Figure 8-6. Example Layout for VSSOP-8 (DGK) Package
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9 Device and Documentation Support
9.1 Device Support
9.1.1 Development Support
9.1.1.1 TINA-TI™ (Free Software Download)
TINA™ is a simple, powerful, and easy-to-use circuit simulation program based on a SPICE engine. TINA-TI is a
free, fully-functional version of the TINA software, preloaded with a library of macro models in addition to a range
of both passive and active models. TINA-TI provides all the conventional dc, transient, and frequency domain
analysis of SPICE, as well as additional design capabilities.
Available as a free download from the Analog eLab Design Center, TINA-TI offers extensive post-processing
capability that allows users to format results in a variety of ways. Virtual instruments offer the ability to select
input waveforms and probe circuit nodes, voltages, and waveforms, creating a dynamic quick-start tool.
Note
These files require that either the TINA software (from DesignSoft™) or TINA-TI software be installed.
Download the free TINA-TI software from the TINA-TI folder.
9.1.1.2 TI Precision Designs
The TLV935x-Q1 is featured in several TI Precision Designs, available online at http://www.ti.com/ww/en/analog/
precision-designs/. TI Precision Designs are analog solutions created by TI’s precision analog applications
experts and offer the theory of operation, component selection, simulation, complete PCB schematic and layout,
bill of materials, and measured performance of many useful circuits.
9.2 Documentation Support
9.2.1 Related Documentation
For related documentation, see the following:
•
•
•
•
Texas Instruments, EMI Rejection Ratio of Operational Amplifiers application note
Texas Instruments, Capacitive Load Drive Solution using an Isolation Resistor reference guide
Texas Instruments, Analog Engineer's Circuit Cookbook: Amplifiers e-book
Texas Instruments, AN31 amplifier circuit collection application note
9.3 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on
Subscribe to updates to register and receive a weekly digest of any product information that has changed. For
change details, review the revision history included in any revised document.
9.4 Support Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
9.5 Trademarks
TINA-TI™ is a trademark of Texas Instruments, Inc and DesignSoft, Inc.
TINA™ and DesignSoft™ are trademarks of DesignSoft, Inc.
TI E2E™ is a trademark of Texas Instruments.
Bluetooth® is a registered trademark of Bluetooth SIG, Inc.
All trademarks are the property of their respective owners.
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9.6 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
9.7 Glossary
TI Glossary
This glossary lists and explains terms, acronyms, and definitions.
10 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
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PACKAGE OPTION ADDENDUM
www.ti.com
12-Dec-2023
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
Samples
(4/5)
(6)
TLV9351QDBVRQ1
ACTIVE
SOT-23
DBV
5
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
2JMF
Samples
TLV9352QDGKRQ1
ACTIVE
VSSOP
DGK
8
2500
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
27ST
Samples
TLV9352QDRQ1
ACTIVE
SOIC
D
8
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
T9352Q
Samples
TLV9352QPWRQ1
ACTIVE
TSSOP
PW
8
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
TL9352
Samples
TLV9354QDRQ1
ACTIVE
SOIC
D
14
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
TL9354QD
Samples
TLV9354QDYYRQ1
ACTIVE
SOT-23-THIN
DYY
14
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
TLV9354Q
Samples
TLV9354QPWRQ1
ACTIVE
TSSOP
PW
14
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
T9354Q
Samples
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of