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ZHCS437B – APRIL 2012 – REVISED JULY 2013
TMS570LS31x5/21x5 16 和 32 位精简指令集计算机 (RISC) 闪存微控
制器
查询样片: TMS570LS2125, TMS570LS2135, TMS570LS3135
1 TMS570LS31x5/21x5 16 和 32 位精简指令集计算机 (RISC) 闪存微控制器
1.1
特性
12
• 针对安全关键应用的高性能汽车级微控制器
– 运行在锁步中的双中央处理单元 (CPU)
– 闪存和 RAM 接口上的 ECC
– 内置 CPU 和片上 RAM 自检
– 带有错误引脚的错误信令模块
– 电压和时钟监视
• ARM® Cortex™ – R4F 32 位 RISC CPU
– 带有 8 级管线的高效 1.66DMIPS/MHz
– 支持单精度和双精度的浮点运算单元 (FPU)
– 12 区域内存保护单元
– 带有第三方支持的开放式架构
• 运行条件
– 高达180MHz 系统时钟
– 内核电源电压 (VCC):
:标称值 1.2V
– I/O 电源电压 (VCCOI):
:标称值 3.3V
– ADC 电源电压 (VCCAD): 3.0 至 5.25V
• 集成内存
– 高达 3MB 具有 ECC 的程序闪存
– 高达 256KB 具有 ECC 的 RAM
– 针对仿真 EEPROM 的具有 ECC 的 64KB 闪存
• 16 位外部存储器接口
• 通用平台架构
– 系列间一致的存储器映射
– 实时中断 (RTI) 操作系统 (OS) 定时器
– 96 通道矢量中断模块 (VIM)
– 2 通道循环冗余校验器 (CRC)
• 直接内存访问 (DMA) 控制器
– 16 通道和 32 控制数据包
– 针对控制数据包 RAM 的奇偶校验保护
– 由专用MPU 保护的 DMA 访问
• 带有内置跳周检测器的调频锁相环 (FMPLL)
• 独立的非调制 PLL
• IEEE 1149.1 JTAG,
,边界扫描和 ARM
CoreSight™ 组件
• JTAG 安全模块
• 跟踪和校准功能
– 嵌入式跟踪宏单元 (ETM-R4)
– 数据修改模块 (DMM)
– RAM 跟踪端口 (RTP)
– 参数覆盖模块 (POM)
• 多通信接口
– 带有 2 个通道的 FlexRay 控制器
• 带有奇偶检验保护的 8KB 消息 RAM
• 专用传输单元 (FTU)
– 3 个 CAN 控制器 (DCAN)
• 64 个邮箱,每个邮箱均具有奇偶校验保护
• 与 CAN 协议 2.0B 版兼容
– 本地互连网络 (LIN) 接口控制器
• 与 LIN 协议版本 2.1 兼容
• 可被配置为第二个 SCI
– 标准串行通信接口 (SCI)
– 内部集成电路 (I2C)
– 3 个多通道经缓冲串行外设接口 (MibSPI)
• 128 个字,每个字具有奇偶校验保护
– 2 个标准串行外设接口 (SPI)
• 2 个高端定时器模块 (N2HET)
– N2HET1:
:32 个 可编程通道
– N2HET2:
:18 个可编程通道
– 160 个字指令 RAM,
,每个都带有奇偶校验保护
– 每个 N2HET 包括硬件角发生器
– 针对每个 N2HET (HTU) 的具有 MPU 的专用传
输单元
• 2 个 10 或 12 位多通道经缓冲 ADC 模块
– ADC1:
:24 个通道
– ADC2:
:与 ADC1 共用的 16 个通道
– 64 个结果缓冲器,每个缓冲器具有奇偶校验保护
• 16 个能够生成中断的通用输入/输
输出引脚 (GPIO)
• 封装
– 144 引脚四方扁平封装 (PGE)[绿
绿色环保]
– 337 球状引脚栅格阵列封装 (ZWT) [绿
绿色环保]
1
2
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date. Products conform to
specifications per the terms of the Texas Instruments standard warranty. Production
processing does not necessarily include testing of all parameters.
版权 © 2012–2013, Texas Instruments Incorporated
English Data Sheet: SPNS164
TMS570LS2125
TMS570LS2135
TMS570LS3135
ZHCS437B – APRIL 2012 – REVISED JULY 2013
1.2
•
•
•
•
•
•
•
•
2
www.ti.com.cn
应用范围
刹车系统(防抱死制动系统和电子稳定性控制)
电动助力转向
混合动力汽车 (HEV) 和电动汽车 (EV) 反向器系统
电池管理系统
主动驾驶员辅助系统
航天和航空电子设备
轨道交通
越野车
TMS570LS31x5/21x5 16 和 32 位精简指令集计算机 (RISC) 闪存微控制器
版权 © 2012–2013, Texas Instruments Incorporated
TMS570LS2125
TMS570LS2135
TMS570LS3135
www.ti.com.cn
1.3
ZHCS437B – APRIL 2012 – REVISED JULY 2013
说明
TMS570LS31x5/21x5 器件是一款用于安全系统的高性能 汽车级 系列微控制器。 此安全架构包括:
• 以锁步模式运行的双核 CPU
• CPU 和存储器内置自检 (BIST) 逻辑
• 闪存和数据 SRAM 上的 ECC
• 外设存储器的奇偶校验
• 外设 I/O 上的回路功能
TMS570LS31x5/21x5 器件集成了 ARM Cortex-R4F 浮点 CPU,此 CPU 可提供一个高效的 1.66
DMIPS/MHz,并且 具有能够以高达 180 MHz 运行的配置,从而提供高达 298 DMIPS。 此器件支持字不变
大端序 [BE32] 格式。
TMS570LS31x5/21x5 器件具有 最高到 3MB 的集成闪存以及 最高达 256KB 的数据 RAM,这些闪存和
RAM 支持单位错误校正和双位错误检测。 这个器件上的闪存存储器是一个由 64 位宽数据总线接口实现的
非易失性、电可擦除并且可编程的存储器。 为了实现所有读取、编程和擦除操作,此闪存运行在一个 3.3V
电源输入上(与 I/O 电源一样的电平)。 当处于管线模式中时,闪存可在高达 180MHz 的系统时钟频率下
运行。 在字节、半字、字和双字模式中,SRAM 支持单循环读取和写入访问。
TMS570LS31x5/21x5 器件特有针对基于实时控制应用的外设,其中包括 2 个下一代高端定时器 (N2HET)
时序协处理器和 2 个支持多达 24 个输入的 12 位模数转换器 (ADC) 。
N2HET1 是一款高级智能定时器,此定时器能够为实时应用提供精密的计时功能。 该定时器为软件控制
型,采用一个精简指令集,并具有一个专用的定时器微级机和一个连接的 I/O 端口。 N2HET 可被用于脉宽
调制输出,捕捉或比较输入,GPIO。 N2HET 特别适合于要求多个传感器信息并且用复杂和准确时间脉冲来
驱动致动器的应用。 一个高端定时器传输单元 (HTU) 能够执行 DMA 类型处理来与主存储器之间传输
N2HET 数据。 一个内存保护单元 (MPU) 被内置于 HTU 内。
此器件具有 2 个 12 位分辨率 MibADC,每个 MibADC 具有 24 个通道和受 64 字奇偶校验保护的缓冲器
RAM。 MibADC 通道可被独立转换或者可针对顺序转换序列由软件成组。 16 个通道可在两个 MibADC 间
共用。 有三个独立的组。 当被触发或者针对连续转换模式进行配置后,每个序列可被转换一次。
此器件有多个通信接口:3 个 MibSPI,2 个 SPI,1 个 LIN,1 个SCI,3 个 DACN,1 个 I2C,和 1 个
FlexRay 控制器。 SPI 为相似移位寄存器类型器件之间串行高速通信的提供了一个便捷方法。 LIN 支持本地
互联标准 2.0 并可被用作一个使用标准不归零码 (NRZ) 格式的全双工模式 UART。
DCAN 支持 CAN 2.0(A 和 B)协议标准并使用一个串行、多主控通信协议,此协议用高达 1Mbps 的稳健
耐用通信速率有效支持分布式实时控制。 DCAN 非常适合于工作于嘈杂和恶劣环境中的系统(例如,汽车
网络互连和工业领域),此类系统需要可靠的串行通信或多路复用布线。
FlexRay 控制器使用一个双通道串行、固定时基多主机通信协议,在此协议下,每通道的通信速率为
10Mbps。 一个 FlexRay 传输单元 (FTU) 可实现 FlexRay 数据与 CPU 主存储器之间的传输。 传输受到一
个专用且内置的 MPU 的保护。
I2C 模块是一个多主控通信模块,此模块通过 I2C 串行总线在微控制器和一个 I2C 兼容器件之间提供一个接
口。 此 I2C 支持 100Kbps 和 400Kbps 的速度。
此调频锁相环 (FMPLL) 时钟模块被用来将外部频率基准与一个内部使用的更高频率相乘。 这个器件上有两
个 FMPLL 模块。 当被启用时,这些模块提供 7 个可能的时钟源中的两个到全局时钟模块 (GCM)。 此
GCM 管理可用时钟源与器件时钟域间的映射。
此器件还有一个外部时钟前置分频器 (ECP) 模块,当被启用时,此模块在 ECLK 引脚/焊球上输出一个连续
外部时钟。 ECLK 频率是一个外设接口时钟 (VCLK) 频率的用户可编程比例。 这个可被外部监视的低频输出
作为此器件运行频率的指示器。
直接内存访问 (DMA) 控制器有 16 个通道,32 个控制数据包和针对其内存的奇偶校验保护。 在 DMA 中内
置了一个 MPU 来将 DMA 限制在存储器的指定区域,并且保护存储器系统的剩余部分不受 DMA 故障的影
响。
错误信令模块 (ESM) 监控所有器件错误并在检测到一个故障时确定是生成一个中断还是触发一个外部
ERROR 引脚。 可从外部监视此 ERROR 引脚,将其作为一个微控制器内故障条件的指示器。
版权 © 2012–2013, Texas Instruments Incorporated
TMS570LS31x5/21x5 16 和 32 位精简指令集计算机 (RISC) 闪存微控制器
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外部存储器接口 (EMIF) 提供芯片外扩展功能,此功能可实现与同步 DRAM (SDRAM) 器件、异步存储器、
外设或现场可编程门阵列 (FPGA) 器件的对接。
执行几个接口来提高应用代码的调试能力。 除了内置的 ARM Cortex-R4F CoreSight 调试特性,一个外部跟
踪宏单元 (ETM) 提供程序执行的指令和数据跟踪。 为了实现仪器测量的目的,执行了一个 RAM 跟踪端口
模块 (RTP) 来支持由 CPU 或者任何其它主控所访问的 RAM 和外设的高速跟踪。 一个数据修改模块
(DMM) 提供向器件内存写入外部数据的功能。 RTP 和 DMM 对于应用代码的程序执行时间没有影响或者只
有很小的影响。 一个参数覆盖模块 (POM) 可将闪存访问重新路由至内部存储器或 EMIF。 这个重新路由可
对照生产代码对参数和表格进行动态校准,而无需重建代码以明确访问 RAM 或停止处理器来重新编辑数据
闪存。
借助集成的安全特性和通信与控制外设的广泛选择,TMS570LS31x5/21x5 器件是针对具有安全关键要求的
高性能实时控制应用的理想解决方案。
4
TMS570LS31x5/21x5 16 和 32 位精简指令集计算机 (RISC) 闪存微控制器
版权 © 2012–2013, Texas Instruments Incorporated
TMS570LS2125
TMS570LS2135
TMS570LS3135
www.ti.com.cn
64K
64K
64K
TRACECTL
ETMDATA[31:0]
TRACECLKIN
TRACECLK
DMMSYNC
DMMDATA[15:0]
Color Legend for Power Domains
Core/RAM
always on
POM
HTU1
DMM
RAM
Core
#1
ETM-R4
RTP
DMA
Dual Cortex-R4F
CPUs in Lockstep
DMMCLK
DMMnENA
256K
RAM
with
ECC
RTPSYNC
RTPDATA[15:0]
64K
3M
Flash
with
ECC
RTPnENA
功能方框图
RTPCLK
1.4
ZHCS437B – APRIL 2012 – REVISED JULY 2013
#2
#3
#1
#2
#4
#3
#5
FTU
HTU2
Switched Central Resource Switched Central Resource
Main Cross Bar: Arbitration and Prioritization Control
64 KB Flash
for EEPROM
Emulation
with ECC
CRC
Peripheral Central Resource Bridge
Switched Central Resource
SYS
nPORRST
nRST
ECLK
ESM
nERROR
IOMM
PMM
DCAN1
DCAN2
VIM
EMIF_nWAIT
EMIF_CLK
EMIF_CKE
EMIF_nCS[4:2]
EMIF_nCS[0]
EMIF_ADDR[21:0]
EMIF_BA[1:0]
EMIF_DATA[15:0]
EMIF_nDQM[1:0]
EMIF_nOE
EMIF_nWE
EMIF_nRAS
EMIF_nCAS
EMIF_nRW
DCAN3
RTI
MibSPI1
MIBSPI1_nCS[5:0]
MIBSPI1_nENA
EMIF
DCC1
SPI2
DCC2
MibSPI3
SPI4
MibADC1
MibADC2
N2HET1
N2HET2
GIO
FlexRay
I2C
I2C_SCL
I2C_SDA
FRAY_RX2
FRAY_TX2
FRAY_TXEN2
FRAY_RX1
FRAY_TX1
FRAY_TXEN1
GIOB[7:0]
GIOA[7:0]
N2HET2_PIN_nDIS
N2HET2[18,16]
N2HET2[15:0]
N2HET1[31:0]
N2HET1_PIN_nDIS
ADREFLO
AD2EVT
VCCAD
VSSAD
ADREFHI
AD2IN[15:0]
ADREFLO
AD1EVT
AD1IN[7:0]
AD1IN[23:8]
MibSPI5
VCCAD
VSSAD
ADREFHI
CAN1_RX
CAN1_TX
CAN2_RX
CAN2_TX
CAN3_RX
CAN3_TX
MIBSPI1_CLK
MIBSPI1_SIMO[1:0]
MIBSPI1_SOMI[1:0]
SPI2_CLK
SPI2_SIMO
SPI2_SOMI
SPI2_nCS[1:0]
SPI2_nENA
MIBSPI3_CLK
MIBSPI3_SIMO
MIBSPI3_SOMI
MIBSPI3_nCS[5:0]
MIBSPI3_nENA
SPI4_CLK
SPI4_SIMO
SPI4_SOMI
SPI4_nCS0
SPI4_nENA
MIBSPI5_CLK
MIBSPI5_SIMO[3:0]
MIBSPI5_SOMI[3:0]
MIBSPI5_nCS[3:0]
MIBSPI5_nENA
LIN
LIN_RX
LIN_TX
SCI
SCI_RX
SCI_TX
图 1-1. 功能方框图
版权 © 2012–2013, Texas Instruments Incorporated
TMS570LS31x5/21x5 16 和 32 位精简指令集计算机 (RISC) 闪存微控制器
5
TMS570LS2125
TMS570LS2135
TMS570LS3135
ZHCS437B – APRIL 2012 – REVISED JULY 2013
1
www.ti.com.cn
TMS570LS31x5/21x5 16 和 32 位精简指令集计算机
(RISC) 闪存微控制器 ..................................... 1
.................................................. 1
............................................. 2
1.3
说明 .................................................. 3
1.4
功能方框图 ........................................... 5
修订历史记录 ................................................... 7
2 Device Package and Terminal Functions .......... 8
2.1
PGE QFP Package Pinout (144-Pin) ................ 8
2.2
ZWT BGA Package Ball-Map (337 Ball Grid Array) . 9
2.3
Terminal Functions ................................. 10
3 Device Operating Conditions ....................... 39
Device Memory Map ................................ 67
特性
4.10
Flash Memory
1.2
应用范围
4.11
Tightly-Coupled RAM Interface Module
3.1
Absolute Maximum Ratings Over Operating FreeAir Temperature Range, ............................ 39
3.2
3.3
Device Recommended Operating Conditions ...... 39
Switching Characteristics over Recommended
Operating Conditions for Clock Domains .......... 40
3.4
3.5
Wait States Required ............................... 40
Power Consumption Over Recommended
Operating Conditions ............................... 41
Input/Output Electrical Characteristics Over
Recommended Operating Conditions .............. 42
3.7
......................
Input Timings .......................................
Output Timings .....................................
Low-EMI Output Buffers ............................
Output Buffer Drive Strengths
3.8
3.9
3.10
6
Glitch Filters
4.9
1.1
3.6
4
........................................
4.8
4.12
4.13
4.14
4.15
4.16
4.17
4.18
4.19
4.20
4.21
5
.............................................................
4.1
Device Power Domains ............................
4.2
Voltage Monitor Characteristics ....................
4.3
Power Sequencing and Power On Reset ..........
4.4
Warm Reset (nRST) ................................
4.5
ARM© Cortex-R4F™ CPU Information .............
4.6
Clocks ..............................................
4.7
Clock Monitoring ....................................
内容
Peripheral Legend
5.2
Multi-Buffered 12bit Analog-to-Digital Converter
5.5
42
5.6
43
5.7
44
5.8
46
5.9
5.10
48
6
49
50
52
53
56
64
7
................................
..
General-Purpose Input/Output ....................
Enhanced High-End Timer (N2HET) ..............
FlexRay Interface .................................
Controller Area Network (DCAN) ..................
Local Interconnect Network Interface (LIN) .......
Serial Communication Interface (SCI) ............
Inter-Integrated Circuit (I2C) ......................
5.1
5.4
48
...................................... 74
............ 77
Parity Protection for peripheral RAMs .............. 77
On-Chip SRAM Initialization and Testing ........... 79
External Memory Interface (EMIF) ................. 81
Vectored Interrupt Manager ........................ 89
DMA Controller ..................................... 92
Real Time Interrupt Module ........................ 94
Error Signaling Module ............................. 96
Reset / Abort / Error Sources ..................... 100
Digital Windowed Watchdog ...................... 102
Debug Subsystem ................................. 103
Peripheral Information and Electrical
Specifications ......................................... 114
5.3
System Information and Electrical Specifications
66
114
114
125
126
131
133
134
135
136
Multi-Buffered / Standard Serial Peripheral Interface
.....................................................
.............
6.1
Device Nomenclature .............................
6.2
Device Identification ...............................
6.3
Module Certifications ..............................
Mechanical Data ......................................
7.1
Thermal Data ......................................
7.2
Packaging Information ............................
Device and Documentation Support
139
151
151
152
155
162
162
162
版权 © 2012–2013, Texas Instruments Incorporated
TMS570LS2125
TMS570LS2135
TMS570LS3135
www.ti.com.cn
ZHCS437B – APRIL 2012 – REVISED JULY 2013
Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
这个数据手册修订历史记录强调了对器件专用数据手册的A修订版本的修改,这些修改使其成为一份 B 修订
版本。
文档修订历史记录
部分
更改内容
Section 3.2
已更改最大 3.3V 电源电压转换率
Section 3.6
已恢复 FRAYRX1,FRAYRX2 滞后
从
至
105V/s
1V/µs
0mv
100mv
Copyright © 2012–2013, Texas Instruments Incorporated
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内容
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ZHCS437B – APRIL 2012 – REVISED JULY 2013
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2 Device Package and Terminal Functions
PGE QFP Package Pinout (144-Pin)
108
107
106
105
104
103
102
101
100
99
98
97
96
95
94
93
92
91
90
89
88
87
86
85
84
83
82
81
80
79
78
77
76
75
74
73
TMS
N2HET1[28]
N2HET1[08]
MIBSPI1NCS[0]
VCCIO
VSS
VSS
VCC
MIBSPI5CLK
MIBSPI5SIMO[0]
MIBSPI5SOMI[0]
MIBSPI5NENA
MIBSPI1NENA
MIBSPI1CLK
MIBSPI1SOMI
MIBSPI1SIMO
N2HET1[26]
N2HET1[24]
CAN1RX
CAN1TX
VSS
VCC
AD1EVT
AD1IN[15] / AD2IN[15]
AD1IN[23] / AD2IN[07]
AD1IN[08] / AD2IN[08]
AD1IN[14] / AD2IN[14]
AD1IN[22] / AD2IN[06]
AD1IN[06]
AD1IN[13] / AD2IN[13]
AD1IN[05]
AD1IN[12] / AD2IN[12]
AD1IN[04]
AD1IN[11] / AD2IN[11]
AD1IN[03]
AD1IN[02]
2.1
109
110
111
112
113
114
115
116
117
118
119
120
121
122
123
124
125
126
127
128
129
130
131
132
133
134
135
136
137
138
139
140
141
142
143
144
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
50
49
48
47
46
45
44
43
42
41
40
39
38
37
AD1IN[10] / AD2IN[10]
AD1IN[01]
AD1IN[09] / AD2IN[09]
VCCAD
VSSAD
ADREFLO
ADREFHI
AD1IN[21] / AD2IN[05]
AD1IN[20] / AD2IN[04]
AD1IN[19] / AD2IN[03]
AD1IN[18] / AD2IN[02]
AD1IN[07]
AD1IN[0]
AD1IN[17] / AD2IN[01]
AD1IN[16] / AD2IN[0]
VCC
VSS
MIBSPI3NCS[0]
MIBSPI3NENA
MIBSPI3CLK
MIBSPI3SIMO
MIBSPI3SOMI
VSS
VCC
VCC
VSS
nPORRST
VCC
VSS
VSS
VCCIO
N2HET1[15]
MIBSPI1NCS[2]
N2HET1[13]
N2HET1[06]
MIBSPI3NCS[1]
FRAYTX2
FRAYRX2
MIBSPI3NCS[3]
MIBSPI3NCS[2]
FRAYTXEN2
N2HET1[11]
FLTP1
FLTP2
GIOA[2]
VCCIO
VSS
CAN3RX
CAN3TX
GIOA[5]
N2HET1[22]
GIOA[6]
VCC
OSCIN
Kelvin_GND
OSCOUT
VSS
GIOA[7]
N2HET1[01]
N2HET1[03]
N2HET1[0]
VCCIO
VSS
VSS
VCC
N2HET1[02]
N2HET1[05]
MIBSPI5NCS[0]
N2HET1[07]
TEST
N2HET1[09]
N2HET1[4]
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
nTRST
TDI
TDO
TCK
RTCK
VCC
VSS
nRST
nERROR
N2HET1[10]
ECLK
VCCIO
VSS
VSS
VCC
N2HET1[12]
N2HET1[14]
FRAYRX1
N2HET1[30]
CAN2TX
CAN2RX
MIBSPI1NCS[1]
LINRX
LINTX
FRAYTX1
VCCP
VSS
VCCIO
VCC
VSS
N2HET1[16]
N2HET1[18]
N2HET1[20]
FRAYTXEN1
VCC
VSS
Figure 2-1. PGE QFP Package Pinout (144-Pin)
Note: Pins can have multiplexed functions. Only the default function is depicted in above diagram.
8
Device Package and Terminal Functions
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2.2
ZHCS437B – APRIL 2012 – REVISED JULY 2013
ZWT BGA Package Ball-Map (337 Ball Grid Array)
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
AD1IN[15] AD1IN[22]
/
/
AD1EVT
AD2IN[15] AD2IN[06]
19
VSS
VSS
TMS
N2HET1
[10]
MIBSPI5
NCS[0]
MIBSPI1
SIMO
MIBSPI1
NENA
MIBSPI5
CLK
MIBSPI5
SIMO[0]
N2HET1
[28]
DMM_
DATA[0]
CAN3RX
18
VSS
TCK
TDO
nTRST
N2HET1
[08]
MIBSPI1
CLK
MIBSPI1
SOMI
MIBSPI5
NENA
MIBSPI5
SOMI[0]
N2HET1
[0]
DMM_
DATA[1]
CAN3TX
NC
17
TDI
RST
EMIF_
ADDR[21]
EMIF_
nWE
MIBSPI5
SOMI[1]
DMM_
CLK
MIBSPI5
SIMO[3]
MIBSPI5
SIMO[2]
N2HET1
[31]
EMIF_
nCS[3]
EMIF_
nCS[2]
EMIF_
nCS[4]
EMIF_
nCS[0]
NC
16
RTCK
FRAY
TXEN1
EMIF_
ADDR[20]
EMIF_
BA[1]
MIBSPI5
SIMO[1]
DMM_
NENA
MIBSPI5
SOMI[3]
MIBSPI5
SOMI[2]
DMM_
SYNC
NC
NC
NC
NC
NC
15
FRAY
RX1
FRAY
TX1
ETM
DATA[16] /
EMIF_
DATA[0]
ETM
DATA[17] /
EMIF_
DATA[1]
ETM
DATA[18] /
EMIF_
DATA[2]
ETM
DATA[19] /
EMIF_
DATA[3]
NC
NC
14
N2HET1
[26]
nERROR
EMIF_
EMIF_
ETM
ADDR[17] ADDR[16] DATA[07]
VCCIO
VCC
VCCIO
VCCIO
VCCIO
VCCIO
NC
13
N2HET1
[17]
N2HET1
[19]
EMIF_
ADDR[15]
NC
ETM
DATA[12] /
EMIF_BA[0]
VCCIO
VCCIO
12
ECLK
N2HET1
[04]
EMIF_
ADDR[14]
NC
ETM
DATA[13] /
EMIF_nOE
VCCIO
VSS
VSS
VCC
VSS
VSS
11
N2HET1
[14]
N2HET1
[30]
EMIF_
ADDR[13]
NC
ETM
DATA[14] /
EMIF_
nDQM[1]
VCCIO
VSS
VSS
VSS
VSS
10 CAN1TX
CAN1RX
EMIF_
ADDR[12]
NC
ETM
DATA[15] /
EMIF_
nDQM[0]
VCC
VCC
VSS
VSS
EMIF_
EMIF_
ETM
ETM
ETM
ETM
ETM
ADDR[19] ADDR[18] DATA[06] DATA[05] DATA[04] DATA[03] DATA[02]
VCCIO
VCCIO
VCC
T
U
V
W
AD1IN
[06]
AD1IN[11]
/
AD2IN[11]
VSSAD
VSSAD
19
AD1IN
[04]
AD1IN
[02]
VSSAD
18
AD1IN[10]
/
AD2IN[10]
AD1IN
[01]
AD1IN[08] AD1IN[14] AD1IN[13]
/
/
/
AD2IN[08] AD2IN[14] AD2IN[13]
AD1IN
[05]
AD1IN
[03]
AD1IN[09]
/
17
AD2IN[09]
AD1IN[23] AD1IN[12] AD1IN[19]
/
/
/
ADREFLO
AD2IN[07] AD2IN[12] AD2IN[03]
VSSAD
16
AD1IN[21] AD1IN[20]
/
/
ADREFHI
AD2IN[05] AD2IN[04]
VCCAD
15
NC
AD1IN[18]
/
AD2IN[02]
AD1IN
[0]
14
ETM
DATA[01]
NC
AD1IN[17] AD1IN[16]
/
/
AD2IN[01] AD2IN[0]
NC
13
VCCIO
ETM
DATA[0]
MIBSPI5
NCS[3]
NC
NC
NC
12
VSS
VCCPLL
ETME
TRACE
CTL
NC
NC
NC
NC
11
VSS
VCC
VCC
ETM
TRACE
CLKOUT
NC
NC
MIBSPI3
NCS[0]
GIOB[3]
10
AD1IN
[07]
9
N2HET1
[27]
FRAY
TXEN2
EMIF_
ADDR[11]
NC
ETM
DATA[08] /
EMIF_
ADDR[5]
VCC
VSS
VSS
VSS
VSS
VSS
VCCIO
ETM
TRACE
CLKIN
NC
NC
MIBSPI3
CLK
MIBSPI3
9
NENA
8
FRAY
RX2
FRAY
TX2
EMIF_
ADDR[10]
NC
ETM
DATA[09] /
EMIF_
ADDR[4]
VCCP
VSS
VSS
VCC
VSS
VSS
VCCIO
ETM
DATA[31] /
EMIF_
DATA[15]
NC
NC
MIBSPI3
SOMI
MIBSPI3
8
SIMO
7
LINRX
LINTX
EMIF_
ADDR[9]
NC
ETM
DATA[10] /
EMIF_
ADDR[3]
VCCIO
VCCIO
ETM
DATA[30] /
EMIF_
DATA[14]
NC
NC
N2HET1
[09]
nPORRST 7
6
GIOA[4]
MIBSPI5
NCS[1]
EMIF_
ADDR[8]
NC
ETM
DATA[11] /
EMIF_
ADDR[2]
VCCIO
VCCIO
VCCIO
VCCIO
VCC
VCC
VCCIO
VCCIO
VCCIO
ETM
DATA[29] /
EMIF_
DATA[13]
NC
NC
N2HET1
[05]
MIBSPI5
6
NCS[2]
5
GIOA[0]
GIOA[5]
EMIF_
ADDR[7]
EMIF_
ADDR[1]
ETM
DATA[20] /
EMIF_
DATA[4]
ETM
DATA[21] /
EMIF_
DATA[5]
ETM
DATA[22] /
EMIF_
DATA[6]
FLTP2
FLTP1
ETM
DATA[23] /
EMIF_
DATA[7]
ETM
DATA[24] /
EMIF_
DATA[8]
ETM
DATA[25] /
EMIF_
DATA[9]
ETM
DATA[26] /
EMIF_
DATA[10]
ETM
DATA[27] /
EMIF_
DATA[11]
ETM
DATA[28] /
EMIF_
DATA[12]
NC
NC
MIBSPI3
NCS[1]
N2HET1
[02]
5
4
N2HET1
[16]
N2HET1
[12]
EMIF_
ADDR[6]
EMIF_
ADDR[0]
NC
NC
NC
N2HET1
[21]
N2HET1
[23]
NC
NC
NC
NC
NC
EMIF_
nCAS
NC
NC
NC
NC
4
3
N2HET1
[29]
N2HET1
[22]
MIBSPI3
NCS[3]
SPI2
NENA
N2HET1
[11]
MIBSPI1
NCS[1]
MIBSPI1
NCS[2]
GIOA[6]
MIBSPI1
NCS[3]
EMIF_
CLK
EMIF_
CKE
N2HET1
[25]
SPI2
NCS[0]
EMIF_
nWAIT
EMIF_
nRAS
NC
NC
NC
N2HET1
[06]
3
2
VSS
MIBSPI3
NCS[2]
GIOA[1]
SPI2
SOMI
SPI2 CLK
GIOB[2]
GIOB[5]
CAN2TX
GIOB[6]
GIOB[1]
KELVIN_
GND
GIOB[0]
N2HET1
[13]
N2HET1
[20]
MIBSPI1
NCS[0]
NC
TEST
N2HET1
[01]
VSS
2
1
VSS
VSS
GIOA[2]
SPI2
SIMO
GIOA[3]
GIOB[7]
GIOB[4]
CAN2RX
N2HET1
[18]
OSCIN
OSCOUT
GIOA[7]
N2HET1
[15]
N2HET1
[24]
NC
N2HET1
[07]
N2HET1
[03]
VSS
VSS
1
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
T
U
V
W
Figure 2-2. ZWT Package Pinout. Top View
Note: Balls can have multiplexed functions. Only the default function is depicted in above diagram, except
for the EMIF signals that are multiplexed with ETM signals.
Device Package and Terminal Functions
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ZHCS437B – APRIL 2012 – REVISED JULY 2013
2.3
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Terminal Functions
Section 2.3.1 and Section 2.3.2 identify the external signal names, the associated pin/ball numbers along
with the mechanical package designator, the pin/ball type (Input, Output, IO, Power or Ground), whether
the pin/ball has any internal pullup/pulldown, whether the pin/ball can be configured as a GPIO, and a
functional pin/ball description. The first signal name listed is the primary function for that terminal. The
signal name in Bold is the function being described. Refer to the TMS570LS31X/21X Technical Reference
Manual (SPNU499) for information on how to select between different multiplexed functions.
NOTE
All I/O signals except nRST are configured as inputs while nPORRST is low and immediately
after nPORRST goes High.
All output-only signals are configured as inputs while nPORRST is low, and are configured
as outputs immediately after nPORRST goes High.
While nPORRST is low, the input buffers are disabled, and the output buffers are tri-stated.
In the Terminal Functions table below, the "Default Pull State" is the state of the pullup or
pulldown while nPORRST is low and immediately after nPORRST goes High. The default
pull direction may change when software configures the pin for an alternate function. The
"Pull Type" is the type of pull asserted when the signal name in bold is enabled for the given
terminal.
2.3.1
PGE Package
2.3.1.1
Multi-Buffered Analog-to-Digital Converters (MibADC)
Table 2-1. PGE Multi-Buffered Analog-to-Digital Converters (MibADC1, MibADC2)
Terminal
Signal Name
144
PGE
Signal
Type
Default
Pull State
Pull Type
Input
-
None
Description
ADREFHI (1)
66
ADREFLO (1)
67
Input
ADC low reference supply
VCCAD (1)
69
Power
Operating supply for ADC
(1)
VSSAD
ADC high reference
supply
68
Ground
AD1EVT
86
I/O
Pull Down
Programmable,
20uA
ADC1 event trigger input,
or GPIO
MIBSPI3NCS[0]/AD2EVT/GIOB[2]/N2HET2PIN_nDIS
55
I/O
Pull Up
Programmable,
20uA
ADC2 event trigger input,
or GPIO
AD1IN[0]
60
Input
-
None
AD1IN[1]
71
AD1IN[2]
73
AD1IN[3]
74
AD1IN[4]
76
AD1IN[5]
78
AD1IN[6]
80
AD1IN[7]
61
(1)
10
ADC1 analog input
The ADREFHI, ADREFLO, VCCAD and VSSAD connections are common for both ADC cores.
Device Package and Terminal Functions
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ZHCS437B – APRIL 2012 – REVISED JULY 2013
Table 2-1. PGE Multi-Buffered Analog-to-Digital Converters (MibADC1, MibADC2) (continued)
Terminal
Signal Name
144
PGE
AD1IN[8] / AD2IN[8]
83
AD1IN[9] / AD2IN[9]
70
AD1IN[10] / AD2IN[10]
72
AD1IN[11] / AD2IN[11]
75
AD1IN[12] / AD2IN[12]
77
AD1IN[13] / AD2IN[13]
79
AD1IN[14] / AD2IN[14]
82
AD1IN[15] / AD2IN[15]
85
AD1IN[16] / AD2IN[0]
58
AD1IN[17] / AD2IN[1]
59
AD1IN[18] / AD2IN[2]
62
AD1IN[19] / AD2IN[3]
63
AD1IN[20] / AD2IN[4]
64
AD1IN[21] / AD2IN[5]
65
AD1IN[22] / AD2IN[6]
81
AD1IN[23] / AD2IN[7]
84
Signal
Type
Default
Pull State
Pull Type
Input
-
None
Description
ADC1/ADC2 shared
analog inputs
Device Package and Terminal Functions
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ZHCS437B – APRIL 2012 – REVISED JULY 2013
2.3.1.2
www.ti.com.cn
Enhanced High-End Timer Modules (N2HET)
Table 2-2. PGE Enhanced High-End Timer Modules (N2HET)
Terminal
Signal Name
144
PGE
N2HET1[0]/SPI4CLK
25
N2HET1[1]/SPI4NENA/N2HET2[8]
23
N2HET1[2]/SPI4SIMO[0]
30
N2HET1[3]/SPI4NCS[0]/N2HET2[10]
24
N2HET1[4]
36
N2HET1[5]/SPI4SOMI[0]/N2HET2[12]
31
N2HET1[6]/SCIRX
38
N2HET1[7]/N2HET2[14]
33
N2HET1[8]/MIBSPI1SIMO[1]
106
N2HET1[9]/N2HET2[16]
35
N2HET1[10]
118
N2HET1[11]/MIBSPI3NCS[4]/N2HET2[18]
N2HET1[12]
Signal
Type
Default Pull
State
Pull Type
I/O
Pull Down
Programmable,
20uA
N2HET1
time
input
capture
or
output
compare, or GIO.
Each terminal has a
suppression filter that
ignores input pulses
smaller
than
a
programmable duration.
6
124
N2HET1[13]/SCITX
39
N2HET1[14]
125
N2HET1[15]/MIBSPI1NCS[4]
41
N2HET1[16]
139
MIBSPI1NCS[1]/N2HET1[17]
130
I/O
Pull Up
Programmable,
20uA
N2HET1[18]
140
I/O
Pull Down
Programmable,
20uA
MIBSPI1NCS[2]/N2HET1[19]
40
I/O
Pull Up
Programmable,
20uA
N2HET1[20]
141
I/O
Pull Down
Programmable,
20uA
N2HET1[22]
15
I/O
Pull Down
Programmable,
20uA
MIBSPI1NENA/N2HET1[23]
96
I/O
Pull Up
Programmable,
20uA
N2HET1[24]/MIBSPI1NCS[5]
91
I/O
Pull Down
Programmable,
20uA
MIBSPI3NCS[1]/N2HET1[25]/MDCLK
37
I/O
Pull Up
Programmable,
20uA
N2HET1[26]
92
I/O
Pull Down
Programmable,
20uA
MIBSPI3NCS[2]/I2C_SDA/N2HET1[27]
4
I/O
Pull Up
Programmable,
20uA
107
I/O
Pull Down
Programmable,
20uA
3
I/O
Pull Up
Programmable,
20uA
N2HET1[30]
127
I/O
Pull Down
Programmable,
20uA
MIBSPI3NENA/MIBSPI3NCS[5]/N2HET1[31]
54
I/O
Pull Up
Programmable,
20uA
GIOA[5]/EXTCLKIN/N2HET1_PIN_nDIS
14
I/O
Pull Down
Programmable,
20uA
N2HET1[28]
MIBSPI3NCS[3]/I2C_SCL/N2HET1[29]
12
Description
Device Package and Terminal Functions
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ZHCS437B – APRIL 2012 – REVISED JULY 2013
Table 2-2. PGE Enhanced High-End Timer Modules (N2HET) (continued)
Terminal
Signal Name
144
PGE
GIOA[2]/N2HET2[0]
9
GIOA[6]/N2HET2[4]
16
GIOA[7]/N2HET2[6]
22
N2HET1[1]/SPI4NENA/N2HET2[8]
23
N2HET1[3]/SPI4NCS[0]/N2HET2[10]
24
N2HET1[5]/SPI4SOMI[0]/N2HET2[12]
31
N2HET1[7]/N2HET2[14]
33
N2HET1[9]/N2HET2[16]
35
N2HET1[11]/MIBSPI3NCS[4]/N2HET2[18]
6
MIBSPI3NCS[0]/AD2EVT/GIOB[2]/N2HET2_PIN_nDIS
55
2.3.1.3
Signal
Type
Default Pull
State
Pull Type
I/O
Pull Down
Programmable,
20uA
Description
N2HET2
time
input
capture
or
output
compare, or GPIO
Each terminal has a
suppression filter that
ignores input pulses
smaller
than
a
programmable duration.
I/O
Pull Up
Programmable,
20uA
General-Purpose Input / Output (GPIO)
Table 2-3. PGE General-Purpose Input / Output (GPIO)
Terminal
Signal Name
144
PGE
GIOA[2]/N2HET2[0]
9
GIOA[5]/EXTCLKIN/N2HET1_PIN_nDIS
14
GIOA[6]/N2HET2[4]
16
GIOA[7]/N2HET2[6]
22
MIBSPI3NCS[0]/AD2EVT/GIOB[2]/N2HET2_PIN_nDIS
55
2.3.1.4
Signal
Type
Default
Pull State
Pull Type
Description
I/O
Pull Down
Programmable,
20uA
General-purpose I/O.
All GPIO terminals are
capable of generating
interrupts to the CPU on
rising / falling / both
edges.
I/O
Pull Up
Programmable,
20uA
MibSPI3 chip select, or
GPIO
FlexRay Interface Controller (FlexRay)
Table 2-4. FlexRay Interface Controller (FlexRay)
Terminal
Signal Name
144
PGE
Signal
Type
Default
Pull State
Pull Type
Description
FRAYRX1
126
Input
Pull Up
Fixed, 100uA
FlexRay data receive
(channel 1)
FRAYTX1
133
Output
-
None
FlexRay data transmit
(channel 1)
FRAYTXEN1
142
Output
FRAYRX2
2
Input
Pull Up
Fixed, 100uA
FlexRay data receive
(channel 2)
FRAYTX2
1
Output
-
None
FlexRay data transmit
(channel 2)
FRAYTXEN2
5
Output
FlexRay transmit enable
(channel 1)
FlexRay transmit enable
(channel 2)
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2.3.1.5
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Controller Area Network Controllers (DCAN)
Table 2-5. PGE Controller Area Network Controllers (DCAN)
Terminal
Signal Name
144
PGE
Signal
Type
Default
Pull State
Pull Type
I/O
Pull Up
Programmable,
20uA
Description
CAN1RX
90
CAN1TX
89
CAN2RX
129
CAN2 receive, or GPIO
CAN2TX
128
CAN2 transmit, or GPIO
CAN3RX
12
CAN3 receive, or GPIO
CAN3TX
13
CAN3 transmit, or GPIO
2.3.1.6
CAN1 receive, or GPIO
CAN1 transmit, or GPIO
Local Interconnect Network Interface Module (LIN)
Table 2-6. PGE Local Interconnect Network Interface Module (LIN)
Terminal
Signal Name
144
PGE
LINRX
131
LINTX
132
2.3.1.7
Signal
Type
Default
Pull State
Pull Type
I/O
Pull Up
Programmable,
20uA
Description
LIN receive, or GPIO
LIN transmit, or GPIO
Standard Serial Communication Interface (SCI)
Table 2-7. PGE Standard Serial Communication Interface (SCI)
Terminal
Signal Name
144
PGE
N2HET1[6]/SCIRX
38
N2HET1[13]/SCITX
39
2.3.1.8
Signal
Type
Default
Pull State
Pull Type
I/O
Pull Down
Programmable,
20uA
Description
SCI receive, or GPIO
SCI transmit, or GPIO
Inter-Integrated Circuit Interface Module (I2C)
Table 2-8. PGE Inter-Integrated Circuit Interface Module (I2C)
Terminal
Signal Name
144
PGE
MIBSPI3NCS[2]/I2C_SDA/N2HET1[27]
4
MIBSPI3NCS[3]/I2C_SCL/N2HET1[29]
3
14
Device Package and Terminal Functions
Signal
Type
Default
Pull State
Pull Type
I/O
Pull Up
Programmable,
20uA
Description
I2C serial data, or GPIO
I2C serial clock, or GPIO
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2.3.1.9
ZHCS437B – APRIL 2012 – REVISED JULY 2013
Standard Serial Peripheral Interface (SPI)
Table 2-9. PGE Standard Serial Peripheral Interface (SPI)
Terminal
Signal Name
144
PGE
Signal
Type
Default
Pull State
Pull Type
I/O
Pull Down
Programmable,
20uA
Description
N2HET1[0]/SPI4CLK
25
N2HET1[3]/SPI4NCS[0]/N2HET2[10]
24
SPI4 clock, or GPIO
N2HET1[1]/SPI4NENA/N2HET2[8]
23
SPI4 enable, or GPIO
N2HET1[2]/SPI4SIMO[0]
30
SPI4 slave-input masteroutput, or GPIO
N2HET1[5]/SPI4SOMI[0]/N2HET2[12]
31
SPI4 slave-output masterinput, or GPIO
SPI4 chip select, or GPIO
2.3.1.10 Multi-Buffered Serial Peripheral Interface Modules (MibSPI)
Table 2-10. PGE Multi-Buffered Serial Peripheral Interface Modules (MibSPI)
Terminal
Signal Name
144
PGE
Signal
Type
Default
Pull State
Pull Type
Description
I/O
Pull Up
Programmable,
20uA
MibSPI1 clock, or GPIO
Pull Down
Programmable,
20uA
MibSPI1 chip select, or
GPIO
Pull Up
Programmable,
20uA
MibSPI1 enable, or GPIO
MIBSPI1CLK
95
MIBSPI1NCS[0]/MIBSPI1SOMI[1]
105
MIBSPI1NCS[1]/N2HET1[17]/
130
MIBSPI1NCS[2]/N2HET1[19]/
40
N2HET1[15]/MIBSPI1NCS[4]
41
N2HET1[24]/MIBSPI1NCS[5]
91
MIBSPI1NENA/N2HET1[23]
96
MIBSPI1SIMO[0]
93
N2HET1[8]/MIBSPI1SIMO[1]
106
Pull Down
Programmable,
20uA
MibSPI1 slave-in masterout, or GPIO
MIBSPI1SOMI[0]
94
Pull Up
MIBSPI1NCS[0]/MIBSPI1SOMI[1]
105
Programmable,
20uA
MibSPI1 slave-out masterin, or GPIO
MIBSPI3CLK
53
Pull Up
55
Programmable,
20uA
MibSPI3 clock, or GPIO
MIBSPI3NCS[0]/AD2EVT/GIOB[2]/N2HET2_PIN_nDIS
MIBSPI3NCS[1]/N2HET1[25]/MDCLK
37
MIBSPI3NCS[2]/I2C_SDA/N2HET1[27]
4
MIBSPI3NCS[3]/I2C_SCL/N2HET1[29]
3
N2HET1[11]/MIBSPI3NCS[4]/N2HET2[18]
6
Pull Down
Programmable,
20uA
MibSPI3 chip select, or
GPIO
MIBSPI3NENA /MIBSPI3NCS[5]/N2HET1[31]
54
Pull Up
Programmable,
20uA
MibSPI3 chip select, or
GPIO
MIBSPI3NENA/MIBSPI3NCS[5]/N2HET1[31]
54
MibSPI3 enable, or GPIO
MIBSPI3SIMO[0]
52
MibSPI3 slave-in masterout, or GPIO
MIBSPI3SOMI[0]
51
MibSPI3 slave-out masterin, or GPIO
I/O
MibSPI1 chip select, or
GPIO
MibSPI1 slave-in masterout, or GPIO
MibSPI3 chip select, or
GPIO
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Table 2-10. PGE Multi-Buffered Serial Peripheral Interface Modules (MibSPI) (continued)
Terminal
Signal Name
144
PGE
Signal
Type
Default
Pull State
Pull Type
I/O
Pull Up
Programmable,
20uA
Description
MIBSPI5CLK
100
MIBSPI5NCS[0]
32
MibSPI5 clock, or GPIO
MIBSPI5NENA
97
MibSPI5 enable, or GPIO
MIBSPI5SIMO[0]
99
MibSPI5 slave-in masterout, or GPIO
MIBSPI5SOMI[0]
98
MibSPI5 slave-out masterin, or GPIO
MibSPI5 chip select, or
GPIO
2.3.1.11 System Module Interface
Table 2-11. PGE System Module Interface
Terminal
Signal Name
144
PGE
Signal
Type
Default
Pull State
Pull Type
Description
nPORRST
46
Input
Pull Down
100uA
Power-on reset, cold reset
External power supply
monitor circuitry must
drive nPORRST low when
any of the supplies to the
microcontroller fall out of
the specified range. This
terminal has a glitch filter.
See Section 4.8.
nRST
116
I/O
Pull Up
100uA
System reset, warm reset,
bidirectional.
The internal circuitry
indicates any reset
condition by driving nRST
low.
The external circuitry can
assert a system reset by
driving nRST low. To
ensure that an external
reset is not arbitrarily
generated, TI
recommends that an
external pull-up resistor is
connected to this terminal.
This terminal has a glitch
filter. See Section 4.8.
nERROR
117
I/O
Pull Down
20uA
ESM Error Signal
Indicates error of high
severity. See
Section 4.18.
16
Device Package and Terminal Functions
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ZHCS437B – APRIL 2012 – REVISED JULY 2013
2.3.1.12 Clock Inputs and Outputs
Table 2-12. PGE Clock Inputs and Outputs
Terminal
Signal Name
144
PGE
Signal
Type
Default
Pull State
Pull Type
Input
-
-
OSCIN
18
KELVIN_GND
19
Input
OSCOUT
20
Output
ECLK
119
I/O
Pull Down
Programmable,
20uA
GIOA[5]/EXTCLKIN/N2HET1_PIN_nDIS
14
Input
Pull Down
20uA
Description
From external
crystal/resonator, or
external clock input
Kelvin ground for oscillator
To external
crystal/resonator
External prescaled clock
output, or GIO.
External clock input #1
2.3.1.13 Test and Debug Modules Interface
Table 2-13. PGE Test and Debug Modules Interface
Terminal
Signal Name
144
PGE
Signal
Type
Default
Pull State
Pull Type
I/O
Pull Down
Fixed, 100uA
TEST
34
nTRST
109
Input
RTCK
113
Output
-
None
TCK
112
Input
Pull Down
Fixed, 100uA
TDI
110
I/O
Pull Up
TDO
111
I/O
Pull Down
TMS
108
I/O
Pull Up
Description
Test enable
JTAG test hardware reset
JTAG return test clock
JTAG test clock
JTAG test data in
JTAG test data out
JTAG test select
2.3.1.14 Flash Supply and Test Pads
Table 2-14. PGE Flash Supply and Test Pads
Terminal
Signal Name
144
PGE
VCCP
134
FLTP1
7
FLTP2
8
Signal
Type
Default
Pull State
Pull Type
Description
3.3V
Power
-
None
Flash pump supply
-
None
Flash test pads. These
terminals are reserved for
TI use only. For proper
operation these terminals
must connect only to a
test pad or not be
connected at all [no
connect (NC)].
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2.3.1.15 Supply for Core Logic: 1.2V nominal
Table 2-15. PGE Supply for Core Logic: 1.2V nominal
Terminal
Signal Name
144
PGE
VCC
17
VCC
29
VCC
45
VCC
48
VCC
49
VCC
57
VCC
87
VCC
101
VCC
114
VCC
123
VCC
137
VCC
143
Signal
Type
Default
Pull State
Pull Type
1.2V
Power
-
None
Description
Core supply
2.3.1.16 Supply for I/O Cells: 3.3V nominal
Table 2-16. PGE Supply for I/O Cells: 3.3V nominal
Terminal
Signal Name
144
PGE
VCCIO
10
VCCIO
26
VCCIO
42
VCCIO
104
VCCIO
120
VCCIO
136
18
Device Package and Terminal Functions
Signal
Type
Default
Pull State
Pull Type
3.3V
Power
-
None
Description
Operating supply for I/Os
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ZHCS437B – APRIL 2012 – REVISED JULY 2013
2.3.1.17 Ground Reference for All Supplies Except VCCAD
Table 2-17. PGE Ground Reference for All Supplies Except VCCAD
Terminal
Signal Name
144
PGE
VSS
11
VSS
21
VSS
27
VSS
28
VSS
43
VSS
44
VSS
47
VSS
50
VSS
56
VSS
88
VSS
102
VSS
103
VSS
115
VSS
121
VSS
122
VSS
135
VSS
138
VSS
144
Signal
Type
Default
Pull State
Pull Type
Ground
-
None
Description
Ground reference
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2.3.2
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ZWT Package
2.3.2.1
Multi-Buffered Analog-to-Digital Converters (MibADC)
Table 2-18. ZWT Multi-Buffered Analog-to-Digital Converters (MibADC1, MibADC2)
Terminal
Signal Name
ADREFHI (1)
337
ZWT
V15
Signal
Type
Default
Pull State
Pull Type
Input
-
None
Description
ADC high reference
supply
ADREFLO (1)
V16
Input
ADC low reference supply
VCCAD (1)
W15
Power
Operating supply for ADC
V19
Ground
-
None
VSSAD
ADC supply power
W16
W18
W19
AD1EVT
N19
I/O
Pull Down
Programmable,
20uA
ADC1 event trigger input,
or GPIO
MIBSPI3NCS[0]/AD2EVT/GIOB[2]/N2HET2_PIN_nDIS
V10
I/O
Pull Up
Programmable,
20uA
ADC2 event trigger input,
or GPIO
AD1IN[0]
W14
Input
-
None
ADC1 analog input
AD1IN[1]
V17
AD1IN[2]
V18
Input
-
None
ADC1/ADC2 shared
analog inputs
AD1IN[3]
T17
AD1IN[4]
U18
AD1IN[5]
R17
AD1IN[6]
T19
AD1IN[7]
V14
AD1IN[8] / AD2IN[8]
P18
AD1IN[9] / AD2IN[9]
W17
AD1IN[10] / AD2IN[10]
U17
AD1IN[11] / AD2IN[11]
U19
AD1IN[12] / AD2IN[12]
T16
AD1IN[13] / AD2IN[13]
T18
AD1IN[14] / AD2IN[14]
R18
AD1IN[15] / AD2IN[15]
P19
AD1IN[16] / AD2IN[0]
V13
AD1IN[17] / AD2IN[1]
U13
AD1IN[18] / AD2IN[2]
U14
AD1IN[19] / AD2IN[3]
U16
AD1IN[20] / AD2IN[4]
U15
AD1IN[21] / AD2IN[5]
T15
AD1IN[22] / AD2IN[6]
R19
AD1IN[23] / AD2IN[7]
R16
(1)
20
The ADREFHI, ADREFLO, VCCAD and VSSAD connections are common for both ADC cores.
Device Package and Terminal Functions
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2.3.2.2
ZHCS437B – APRIL 2012 – REVISED JULY 2013
Enhanced High-End Timer Modules (N2HET)
Table 2-19. ZWT Enhanced High-End Timer Modules (N2HET)
Terminal
Signal Name
337
ZWT
N2HET1[0]/SPI4CLK
K18
N2HET1[1]/SPI4NENA/N2HET2[8]
V2
N2HET1[2]/SPI4SIMO[0]
W5
N2HET1[3]/SPI4NCS[0]/N2HET2[10]
U1
N2HET1[4]
B12
N2HET1[5]/SPI4SOMI[0]/N2HET2[12]
V6
N2HET1[6]/SCIRX
W3
N2HET1[7]/N2HET2[14]
T1
N2HET1[8]/MIBSPI1SIMO[1]
E18
N2HET1[9]/N2HET2[16]
Signal
Type
Default
Pull State
Pull Type
I/O
Pull Down
Programmable,
20uA
Description
N2HET1
time
capture
or
compare, or GIO.
input
output
Each terminal has a
suppression filter that
ignores
input
pulses
smaller
than
a
programmable duration.
V7
N2HET1[10]
D19
N2HET1[11]/MIBSPI3NCS[4]/N2HET2[18]
E3
N2HET1[12]
B4
N2HET1[13]/SCITX
N2
N2HET1[14]
A11
N2HET1[15]/MIBSPI1NCS[4]
N1
N2HET1[16]
A4
N2HET1[17]
A13
N2HET1[18]
J1
N2HET1[19]
B13
N2HET1[20]
P2
N2HET1[21]
H4
N2HET1[22]
B3
N2HET1[23]
J4
N2HET1[24]/MIBSPI1NCS[5]
P1
N2HET1[25]
M3
N2HET1[26]/
A14
N2HET1[27]
A9
N2HET1[28]/
K19
N2HET1[29]
A3
N2HET1[30]
B11
N2HET1[31]
J17
GIOA[5]/EXTCLKIN/N2HET1_PIN_nDIS
B5
I/O
Pull Down
Programmable,
20uA
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Table 2-19. ZWT Enhanced High-End Timer Modules (N2HET) (continued)
Terminal
Signal Name
337
ZWT
GIOA[2]/N2HET2[0]
C1
EMIF_ADDR[0]/N2HET2[1]
D4
GIOA[3]/N2HET2[2]
E1
EMIF_ADDR[1]/N2HET2[3]
D5
GIOA[6]/N2HET2[4]
H3
EMIF_BA[1]/N2HET2[5]
D16
GIOA[7]/N2HET2[6]
M1
EMIF_nCS[0]/RTP_DATA[15]/N2HET2[7]
N17
N2HET1[1]/SPI4NENA/N2HET2[8]
V2
EMIF_nCS[3]/RTP_DATA[14]/N2HET2[9]
K17
N2HET1[3]/SPI4NCS[0]/N2HET2[10]
U1
EMIF_ADDR[6]/RTP_DATA[13]/N2HET2[11]
C4
N2HET1[5]/SPI4SOMI[0]/N2HET2[12]
V6
EMIF_ADDR[7]/RTP_DATA[12]/N2HET2[13]
C5
N2HET1[7]/N2HET2[14]
T1
EMIF_ADDR[8]/RTP_DATA[11]/N2HET2[15]
C6
N2HET1[9]/N2HET2[16]
V7
N2HET1[11]/MIBSPI3NCS[4]/N2HET2[18]
E3
MIBSPI3NCS[0]/AD2EVT/GIOB[2]/N2HET2_PIN_nDIS
V10
22
Device Package and Terminal Functions
Signal
Type
Default
Pull State
Pull Type
I/O
Pull Down
Programmable,
20uA
Description
N2HET2
time
capture
or
compare, or GIO.
input
output
Each terminal has a
suppression filter that
ignores
input
pulses
smaller
than
a
programmable duration.
I/O
Pull Up
Programmable,
20uA
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2.3.2.3
ZHCS437B – APRIL 2012 – REVISED JULY 2013
General-Purpose Input / Output (GPIO)
Table 2-20. ZWT General-Purpose Input / Output (GPIO)
Terminal
Signal Name
337
ZWT
GIOA[0]
A5
GIOA[1]
C2
GIOA[2]/N2HET2[0]
C1
GIOA[3]/N2HET2[2]
E1
GIOA[4]
A6
GIOA[5]/EXTCLKIN/N2HET1_PIN_nDIS
B5
GIOA[6]/N2HET2[4]
H3
GIOA[7]/N2HET2[6]
M1
GIOB[0]
M2
GIOB[1]
K2
GIOB[2]
F2
GIOB[3]
W10
GIOB[4]
G1
GIOB[5]
G2
GIOB[6]
J2
GIOB[7]
F1
MIBSPI3NCS[0]/AD2EVT/GIOB[2]/N2HET2_PIN_nDIS
V10
2.3.2.4
Signal
Type
Default
Pull State
Pull Type
Description
I/O
Pull Down
Programmable,
20uA
General-purpose I/O.
All GPIO terminals are
capable of generating
interrupts to the CPU on
rising / falling / both
edges.
Pull Up
Fixed 20uA pull
down
GIOB[2] is input only on
this terminal. When
GIOB[2] function is
selected, the pull is a fixed
pull down
FlexRay Interface Controller (FlexRay)
Table 2-21. FlexRay Interface Controller (FlexRay)
Terminal
Signal Name
337
ZWT
Signal
Type
Default
Pull State
Pull Type
Description
FRAYRX1
A15
Input
Pull Up
Fixed, 100uA
FlexRay data receive
(channel 1)
FRAYTX1
B15
Output
None
-
FlexRay data transmit
(channel 1)
FRAYTXEN1
B16
Output
FRAYRX2
A8
Input
Pull Up
Fixed, 100uA
FlexRay data receive
(channel 2)
FRAYTX2
B8
Output
None
-
FlexRay data transmit
(channel 2)
FRAYTXEN2
B9
Output
FlexRay transmit enable
(channel 1)
FlexRay transmit enable
(channel 2)
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2.3.2.5
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Controller Area Network Controllers (DCAN)
Table 2-22. ZWT Controller Area Network Controllers (DCAN)
Terminal
Signal Name
337
ZWT
Signal
Type
Default
Pull State
Pull Type
I/O
Pull Up
Programmable,
20uA
Description
CAN1RX
B10
CAN1TX
A10
CAN2RX
H1
CAN2 receive, or GPIO
CAN2TX
H2
CAN2 transmit, or GPIO
CAN3RX
M19
CAN3 receive, or GPIO
CAN3TX
M18
CAN3 transmit, or GPIO
2.3.2.6
CAN1 receive, or GPIO
CAN1 transmit, or GPIO
Local Interconnect Network Interface Module (LIN)
Table 2-23. ZWT Local Interconnect Network Interface Module (LIN)
Terminal
Signal Name
337
ZWT
LINRX
A7
LINTX
B7
2.3.2.7
Signal
Type
Default
Pull State
Pull Type
I/O
Pull Up
Programmable,
20uA
Description
LIN receive, or GPIO
LIN transmit, or GPIO
Standard Serial Communication Interface (SCI)
Table 2-24. ZWT Standard Serial Communication Interface (SCI)
Terminal
Signal Name
337
ZWT
N2HET1[6]/SCIRX
W3
N2HET1[13]/SCITX
N2
24
Device Package and Terminal Functions
Signal
Type
Default
Pull State
Pull Type
I/O
Pull Down
Programmable,
20uA
Description
SCI receive, or GPIO
SCI transmit, or GPIO
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2.3.2.8
ZHCS437B – APRIL 2012 – REVISED JULY 2013
Inter-Integrated Circuit Interface Module (I2C)
Table 2-25. ZWT Inter-Integrated Circuit Interface Module (I2C)
Terminal
Signal Name
337
ZWT
MIBSPI3NCS[2]/I2C_SDA/N2HET1[27]
B2
MIBSPI3NCS[3]/I2C_SCL/N2HET1[29]
C3
2.3.2.9
Signal
Type
Default
Pull State
Pull Type
I/O
Pull Up
Programmable,
20uA
Description
I2C serial data, or GPIO
I2C serial clock, or GPIO
Standard Serial Peripheral Interface (SPI)
Table 2-26. ZWT Standard Serial Peripheral Interface (SPI)
Terminal
Signal Name
337
ZWT
Signal
Type
Default
Pull State
Pull Type
I/O
Pull Up
Programmable,
20uA
Description
SPI2CLK
E2
SPI2NCS[0]
N3
SPI2NENA/SPI2NCS[1]
D3
SPI2 chip select, or GPIO
SPI2NENA/SPI2NCS[1]
D3
SPI2 enable, or GPIO
SPI2SIMO[0]
D1
SPI2 slave-input masteroutput, or GPIO
SPI2SOMI[0]
D2
SPI2 slave-output masterinput, or GPIO
N2HET1[0]/SPI4CLK
K18
N2HET1[3]/SPI4NCS[0]/N2HET2[10]
U1
N2HET1[1]/SPI4NENA/N2HET2[8]
V2
SPI4 enable, or GPIO
N2HET1[2]/SPI4SIMO[0]
W5
SPI4 slave-input masteroutput, or GPIO
N2HET1[5]/SPI4SOMI[0]/N2HET2[12]
V6
SPI4 slave-output masterinput, or GPIO
I/O
Pull Down
Programmable,
20uA
SPI2 clock, or GPIO
SPI2 chip select, or GPIO
SPI4 clock, or GPIO
SPI4 chip select, or GPIO
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2.3.2.10 Multi-Buffered Serial Peripheral Interface Modules (MibSPI)
Table 2-27. ZWT Multi-Buffered Serial Peripheral Interface Modules (MibSPI)
Terminal
Signal Name
337
ZWT
MIBSPI1CLK
F18
MIBSPI1NCS[0]/MIBSPI1SOMI[1]
R2
MIBSPI1NCS[1]/N2HET1[17]
F3
MIBSPI1NCS[2]/N2HET1[19]
G3
MIBSPI1NCS[3]/N2HET1[21]
J3
N2HET1[15]/MIBSPI1NCS[4]
N1
Signal
Type
Default
Pull State
Pull Type
Description
I/O
Pull Up
Programmable,
20uA
MibSPI1 clock, or GPIO
Pull Down
Programmable,
20uA
MibSPI1 chip select, or
GPIO
Pull Up
Programmable,
20uA
MibSPI1 enable, or GPIO
MibSPI1 chip select, or
GPIO
N2HET1[24]/MIBSPI1NCS[5]
P1
MIBSPI1NENA/N2HET1[23]
G19
MIBSPI1SIMO[0]
F19
N2HET1[8]/MIBSPI1SIMO[1]
E18
Pull Down
Programmable,
20uA
MibSPI1 slave-in masterout, or GPIO
MIBSPI1SOMI[0]
G18
Pull Up
Programmable,
20uA
MibSPI1 slave-out masterin, or GPIO
Pull Up
Programmable,
20uA
MibSPI3 clock, or GPIO
MIBSPI1NCS[0]/MIBSPI1SOMI[1]
R2
MIBSPI3CLK
V9
MIBSPI3NCS[0]/AD2EVT/GIOB[2]/N2HET2_PIN_nDIS
V10
MIBSPI3NCS[1]/N2HET1[25]/MDCLK
V5
I/O
MibSPI1 slave-in masterout, or GPIO
MibSPI3 chip select, or
GPIO
MIBSPI3NCS[2]/I2C_SDA/N2HET1[27]
B2
MIBSPI3NCS[3]/I2C_SCL/N2HET1[29]
C3
N2HET1[11]/MIBSPI3NCS[4]/N2HET2[18]
E3
Pull Down
Programmable,
20uA
MibSPI3 chip select, or
GPIO
MIBSPI3NENA/MIBSPI3NCS[5]/N2HET1[31]
W9
Pull Up
Programmable,
20uA
MibSPI3 chip select, or
GPIO
MIBSPI3NENA/MIBSPI3NCS[5]/N2HET1[31]
W9
MibSPI3 enable, or GPIO
MIBSPI3SIMO[0]
W8
MibSPI3 slave-in masterout, or GPIO
MIBSPI3SOMI[0]
V8
MibSPI3 slave-out masterin, or GPIO
MIBSPI5CLK/DMM_DATA[4]
H19
MIBSPI5NCS[0]/DMM_DATA[5]
E19
MIBSPI5NCS[1]/DMM_DATA[6]
B6
MIBSPI5NCS[2]/DMM_DATA[2]
W6
I/O
Pull Up
Programmable,
20uA
MibSPI5 clock, or GPIO
MibSPI5 chip select, or
GPIO
MIBSPI5NCS[3]/DMM_DATA[3]
T12
MIBSPI5NENA/DMM_DATA[7]/
H18
MibSPI5 enable, or GPIO
MIBSPI5SIMO[0]/DMM_DATA[8]
J19
MIBSPI5SIMO[1]/DMM_DATA[9]
E16
MibSPI5 slave-in masterout, or GPIO
MIBSPI5SIMO[2]/DMM_DATA[10]
H17
MIBSPI5SIMO[3]/DMM_DATA[11]
G17
MIBSPI5SOMI[0]/DMM_DATA[12]
J18
MIBSPI5SOMI[1]/DMM_DATA[13]
E17
MIBSPI5SOMI[2]/DMM_DATA[14]
H16
MIBSPI5SOMI[3]/DMM_DATA[15]
G16
26
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2.3.2.11 External Memory Interface (EMIF)
Table 2-28. External Memory Interface (EMIF)
Terminal
Signal Name
337
ZWT
Signal
Type
Default
Pull State
Pull Type
Description
Pull Down
Programmable,
20uA
EMIF Clock Enablen
Pull Up
Programmable,
20uA
EMIF Read-Not-Write
Pull Down
Programmable,
20uA
EMIF Output Enable
EMIF_CKE
L3
Output
EMIF_CLK
K3
I/O
EMIF_nWE/EMIF_RNW
D17
Output
ETMDATA[13]/EMIF_nOE
E12
EMIF_nWAIT
P3
I/O
Pull Up
Fixed, 20uA
EMIF Extended Wait
Signal
EMIF_nWE/EMIF_RNW
D17
Output
Pull Up
R4
Output
Programmable,
20uA
EMIF Write Enable.
EMIF_nCAS
EMIF_nRAS
R3
Output
EMIF_nCS[0]/RTP_DATA[15]/N2HET2[7]
N17
Output
Pull Down
Programmable,
20uA
EMIF chip select, SDRAM
EMIF_nCS[2]
L17
Output
Pull Up
Programmable,
20uA
EMIF_nCS[3]/RTP_DATA[14]/N2HET2[9]
K17
Output
Pull Down
Programmable,
20uA
EMIF chip selects,
asynchronous
This applies to chip
selects 2, 3 and 4
EMIF_nCS[4]/RTP_DATA[7]
M17
Output
Pull Up
Programmable,
20uA
EMIF clock. This is an
output signal in functional
mode. It is gated off by
default, so that the signal
is tri-stated. PINMUX29[8]
must be cleared to enable
this output.
EMIF column address
strobe
EMIF row address strobe
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Table 2-28. External Memory Interface (EMIF) (continued)
Terminal
Signal Name
337
ZWT
Signal
Type
Default
Pull State
Pull Type
Description
Pull Down
Programmable,
20uA
EMIF Data Mask or Write
Strobe.
Data mask for SDRAM
devices, write strobe for
connected asynchronous
devices.
ETMDATA[15]/EMIF_nDQM[0]
E10
Output
ETMDATA[14]/EMIF_nDQM[1]
E11
Output
ETMDATA[12]/EMIF_BA[0]
E13
Output
EMIF bank address or
address line
EMIF_BA[1]/N2HET2[5]
D16
Output
EMIF bank address or
address line
EMIF_ADDR[0]/N2HET2[1]
D4
Output
EMIF address
EMIF_ADDR[1]/N2HET2[3]
D5
Output
ETMDATA[11]/EMIF_ADDR[2]
E6
Output
ETMDATA[10]/EMIF_ADDR[3]
E7
Output
ETMDATA[9]/EMIF_ADDR[4
E8
Output
ETMDATA[8]/EMIF_ADDR[5]
E9
Output
EMIF_ADDR[6]/RTP_DATA[13]
C4
Output
EMIF_ADDR[7]/RTP_DATA[12]
C5
Output
EMIF_ADDR[8]/RTP_DATA[11]
C6
Output
EMIF_ADDR[9]/RTP_DATA[10]
C7
Output
EMIF_ADDR[10]/RTP_DATA[9]
C8
Output
EMIF_ADDR[11]/RTP_DATA[8]
C9
Output
EMIF_ADDR[12]/RTP_DATA[6]
C10
Output
EMIF_ADDR[13]/RTP_DATA[5]
C11
Output
EMIF_ADDR[14]/RTP_DATA[4]
C12
Output
EMIF_ADDR[15]/RTP_DATA[3]
C13
Output
EMIF_ADDR[16]/RTP_DATA[2]
D14
Output
EMIF_ADDR[17]/RTP_DATA[1]
C14
Output
EMIF_ADDR[18]/RTP_DATA[0]
D15
Output
EMIF_ADDR[19]/RTP_nENA
C15
Output
EMIF_ADDR[20]/RTP_nSYNC
C16
Output
EMIF_ADDR[21]/RTP_CLK
C17
Output
ETMDATA[16]/EMIF_DATA[0]
K15
I/O
ETMDATA[17]/EMIF_DATA[1]
L15
I/O
ETMDATA[18]/EMIF_DATA[2]
M15
I/O
ETMDATA[19]/EMIF_DATA[3]
N15
I/O
ETMDATA[20]/EMIF_DATA[4]
E5
I/O
ETMDATA[21]/EMIF_DATA[5]
F5
I/O
ETMDATA[22]/EMIF_DATA[6]
G5
I/O
ETMDATA[23]/EMIF_DATA[7]
K5
I/O
ETMDATA[24]/EMIF_DATA[8]
L5
I/O
ETMDATA[25]/EMIF_DATA[9]
M5
I/O
ETMDATA[26]/EMIF_DATA[10]
N5
I/O
ETMDATA[27]/EMIF_DATA[11]
P5
I/O
ETMDATA[28]/EMIF_DATA[12]
R5
I/O
ETMDATA[29]/EMIF_DATA[13]
R6
I/O
ETMDATA[30]/EMIF_DATA[14]
R7
I/O
ETMDATA[31]/EMIF_DATA[15]
R8
I/O
28
Device Package and Terminal Functions
Pull Down
-
Pull Down
Fixed, 20uA
EMIF Data
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2.3.2.12 Embedded Trace Macrocell for Cortex-R4F CPU (ETM-R4F)
Table 2-29. Embedded Trace Macrocell for Cortex-R4F CPU (ETM-R4F)
Terminal
Signal Name
337
ZWT
Signal
Type
Default
Pull State
Pull Type
ETMTRACECLKIN/EXTCLKIN2
R9
Input
Pull Down
ETMTRACECLKOUT
R10
Output
Pull Down
-
ETM Trace Clock Output
ETMTRACECTL
R11
Output
Pull Down
-
ETM trace control
ETMDATA[0]
R12
ETMDATA[1]
R13
ETMDATA[2]
J15
ETMDATA[3]
H15
ETMDATA[4]
G15
ETMDATA[5]
F15
ETMDATA[6]
E15
ETMDATA[7]
E14
ETMDATA[8]/EMIF_ADDR[5]
E9
ETMDATA[9]/EMIF_ADDR[4]
E8
ETMDATA[10]/EMIF_ADDR[3]
E7
ETMDATA[11]/EMIF_ADDR[2]
E6
ETMDATA[12]/EMIF_BA[0]
E13
ETMDATA[13]/EMIF_nOE
E12
ETMDATA[14]/EMIF_nDQM[1]
E11
ETMDATA[15]/EMIF_nDQM[0]
E10
ETMDATA[16]/EMIF_DATA[0]
K15
ETMDATA[17]/EMIF_DATA[1]
L15
ETMDATA[18]/EMIF_DATA[2]
M15
ETMDATA[19]/EMIF_DATA[3]
N15
ETMDATA[20]/EMIF_DATA[4]
E5
ETMDATA[21]/EMIF_DATA[5]
F5
ETMDATA[22]/EMIF_DATA[6]
G5
ETMDATA[23]/EMIF_DATA[7]
K5
ETMDATA[24]/EMIF_DATA[8]
L5
ETMDATA[25]/EMIF_DATA[9]
M5
ETMDATA[26]/EMIF_DATA[10]
N5
ETMDATA[27]/EMIF_DATA[11]
P5
ETMDATA[28]/EMIF_DATA[12]
R5
ETMDATA[29]/EMIF_DATA[13]
R6
ETMDATA[30]/EMIF_DATA[14]
R7
ETMDATA[31]/EMIF_DATA[15]
R8
Fixed, 20uA
Description
ETM Trace Clock Input
ETM data
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2.3.2.13 RAM Trace Port (RTP)
Table 2-30. RAM Trace Port (RTP)
Terminal
Signal Name
337
ZWT
Signal
Type
Default
Pull State
Pull Type
Pull Down
Programmable,
20uA
Description
EMIF_ADDR[21]/RTP_CLK
C17
I/O
EMIF_ADDR[19]/RTP_nENA
C15
I/O
RTP packet handshake,
or GPIO
EMIF_ADDR[20]/RTP_nSYNC
C16
I/O
RTP synchronization, or
GPIO
EMIF_ADDR[18]/RTP_DATA[0]
D15
I/O
RTP packet data, or GPIO
EMIF_ADDR[17]/RTP_DATA[1]
C14
EMIF_ADDR[16]/RTP_DATA[2]
D14
EMIF_ADDR[15]/RTP_DATA[3]
C13
EMIF_ADDR[14]/RTP_DATA[4]
C12
EMIF_ADDR[13]/RTP_DATA[5]
C11
EMIF_ADDR[12]/RTP_DATA[6]
C10
EMIF_nCS[4]/RTP_DATA[7]
M17
Pull Up
Programmable,
20uA
EMIF_ADDR[11]/RTP_DATA[8]
C9
Pull Down
EMIF_ADDR[10]/RTP_DATA[9]
C8
Programmable,
20uA
EMIF_ADDR[9]/RTP_DATA[10]
C7
EMIF_ADDR[8]/RTP_DATA[11]
C6
EMIF_ADDR[7]/RTP_DATA[12]
C5
EMIF_ADDR[6]/RTP_DATA[13]
C4
EMIF_nCS[0]/RTP_DATA[15]/N2HET2[7]
N17
EMIF_nCS[3]/RTP_DATA[14]/N2HET2[9]
K17
30
Device Package and Terminal Functions
RTP packet clock, or
GPIO
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2.3.2.14 Data Modification Module (DMM)
Table 2-31. Data Modification Module (DMM)
Terminal
Signal Name
337
ZWT
Signal
Type
Default
Pull State
Pull Type
I/O
Pull Up
Programmable,
20uA
Description
DMM_CLK
F17
DMM_nENA
F16
DMM_SYNC
J16
DMM synchronization, or
GPIO
DMM_DATA[0]
L19
DMM data, or GPIO
DMM_DATA[1]
L18
MIBSPI5NCS[2]/DMM_DATA[2]
W6
MIBSPI5NCS[3]/DMM_DATA[3]
T12
MIBSPI5CLK/DMM_DATA[4]
H19
MIBSPI5NCS[0]/DMM_DATA[5]
E19
MIBSPI5NCS[1]/DMM_DATA[6]
B6
MIBSPI5NENA/DMM_DATA[7]
H18
MIBSPI5SIMO[0]/DMM_DATA[8]
J19
MIBSPI5SIMO[1]/DMM_DATA[9]
E16
MIBSPI5SIMO[2]/DMM_DATA[10]
H17
MIBSPI5SIMO[3]/DMM_DATA[11]
G17
MIBSPI5SOMI[0]/DMM_DATA[12]
J18
MIBSPI5SOMI[1]/DMM_DATA[13]
E17
MIBSPI5SOMI[2]/DMM_DATA[14]
H16
MIBSPI5SOMI[3]/DMM_DATA[15]
G16
DMM clock, or GPIO
DMM handshake, or GPIO
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2.3.2.15 System Module Interface
Table 2-32. ZWT System Module Interface
Terminal
Signal Name
337
ZWT
Signal
Type
Default
Pull State
Pull Type
Description
nPORRST
W7
Input
Pull Down
100uA
Power-on reset, cold reset
External power supply
monitor circuitry must
drive nPORRST low when
any of the supplies to the
microcontroller fall out of
the specified range. This
terminal has a glitch filter.
See Section 4.8.
nRST
B17
I/O
Pull Up
100uA
System reset, warm reset,
bidirectional.
The internal circuitry
indicates any reset
condition by driving nRST
low.
The external circuitry can
assert a system reset by
driving nRST low. To
ensure that an external
reset is not arbitrarily
generated, TI
recommends that an
external pull-up resistor is
connected to this terminal.
This terminal has a glitch
filter. See Section 4.8.
nERROR
B14
I/O
Pull Down
20uA
ESM Error Signal
Indicates error of high
severity. See
Section 4.18.
2.3.2.16 Clock Inputs and Outputs
Table 2-33. ZWT Clock Inputs and Outputs
Terminal
Signal Name
337
ZWT
Signal
Type
Default
Pull State
Pull Type
-
-
OSCIN
K1
Input
KELVIN_GND
L2
Input
OSCOUT
L1
Output
A12
I/O
Pull Down
Programmable,
20uA
GIOA[5]/EXTCLKIN/N2HET1_PIN_nDIS
B5
Input
Pull Down
20uA
ETMTRACECLKIN/EXTCLKIN2
R9
Input
VCCPLL
P11
1.2V
Power
ECLK
32
Device Package and Terminal Functions
Description
From external
crystal/resonator, or
external clock input
Kelvin ground for oscillator
To external
crystal/resonator
External prescaled clock
output, or GIO.
External clock input #1
External clock input #2
-
Dedicated core supply for
PLL's
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2.3.2.17 Test and Debug Modules Interface
Table 2-34. ZWT Test and Debug Modules Interface
Terminal
Signal Name
337
ZWT
Signal
Type
Default
Pull State
Pull Type
Pull Down
Fixed, 100uA
TEST
U2
I/O
nTRST
D18
Input
RTCK
A16
Output
-
None
TCK
B18
Input
Pull Down
Fixed, 100uA
TDI
A17
I/O
Pull Up
TDO
C18
I/O
Pull Down
TMS
C19
I/O
Pull Up
Description
Test enable
JTAG test hardware reset
JTAG return test clock
JTAG test clock
JTAG test data in
JTAG test data out
JTAG test select
2.3.2.18 Flash Supply and Test Pads
Table 2-35. ZWT Flash Supply and Test Pads
Terminal
Signal Name
337
ZWT
VCCP
F8
FLTP1
J5
FLTP2
H5
Signal
Type
Default
Pull State
Pull Type
3.3V
Power
-
None
Description
Flash pump supply
Flash test pads. These
terminals are reserved for
TI use only. For proper
operation these terminals
must connect only to a
test pad or not be
connected at all [no
connect (NC)].
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2.3.2.19 No Connects
Table 2-36. No Connects
Terminal
Signal Name
337
ZWT
Signal
Type
Default
Pull State
Pull Type
Description
No Connects. These balls
are not connected to any
internal logic and can be
connected to the PCB
ground without affecting
the functionality of the
device. Any other ball
marked as "NC" may be
internally connected to
some functionality. It is
recommended for such
balls to be left
unconnected.
NC
A8
-
-
-
NC
D6
-
-
-
NC
D7
-
-
-
NC
D8
-
-
-
NC
D9
-
-
-
NC
D10
-
-
-
NC
D11
-
-
-
NC
D12
-
-
-
NC
D13
-
-
-
NC
E4
-
-
-
NC
F4
-
-
-
NC
G4
-
-
-
NC
K4
-
-
-
NC
K16
-
-
-
NC
L4
-
-
-
NC
L16
-
-
-
NC
M4
-
-
-
NC
M16
-
-
-
NC
N4
-
-
-
NC
N16
-
-
-
NC
N18
-
-
-
NC
P4
-
-
-
NC
P15
-
-
-
NC
P16
-
-
-
NC
P17
-
-
-
NC
R1
-
-
-
NC
R14
-
-
-
NC
R15
-
-
-
NC
T2
-
-
-
NC
T3
-
-
-
NC
T4
-
-
-
NC
T5
-
-
-
NC
T6
-
-
-
NC
T7
-
-
-
NC
T8
-
-
-
NC
T9
-
-
-
NC
T10
-
-
-
NC
T11
-
-
-
NC
T13
-
-
-
NC
T14
-
-
-
NC
U3
-
-
-
NC
U4
-
-
-
NC
U6
-
-
-
No Connects. These balls
are not connected to any
internal logic and can be
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Table 2-36. No Connects (continued)
Terminal
Signal Name
Signal
Type
-
Default
Pull State
-
Pull Type
NC
337
U7
ZWT
U8
-
-
-
NC
U9
-
-
-
NC
U10
-
-
-
NC
U11
-
-
-
NC
U12
-
-
-
NC
V3
-
-
-
NC
V4
-
-
-
NC
V11
-
-
-
NC
V12
-
-
-
NC
W4
-
-
-
NC
W11
-
-
-
NC
W12
-
-
-
NC
W13
-
-
-
NC
Description
connected to the PCB
ground without affecting
the functionality of the
device. Any other ball
marked as "NC" may be
internally connected to
some functionality. It is
recommended for such
balls to be left
unconnected.
2.3.2.20 Supply for Core Logic: 1.2V nominal
Table 2-37. ZWT Supply for Core Logic: 1.2V nominal
Terminal
Signal Name
337
ZWT
VCC
F9
VCC
F10
VCC
H10
VCC
J14
VCC
K6
VCC
K8
VCC
K12
VCC
K14
VCC
L6
VCC
M10
VCC
P10
36
Device Package and Terminal Functions
Signal
Type
Default
Pull State
Pull Type
1.2V
Power
-
None
Description
Core supply
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2.3.2.21 Supply for I/O Cells: 3.3V nominal
Table 2-38. ZWT Supply for I/O Cells: 3.3V nominal
Terminal
Signal Name
337
ZWT
VCCIO
F6
VCCIO
F7
VCCIO
F11
VCCIO
F12
VCCIO
F13
VCCIO
F14
VCCIO
G6
VCCIO
G14
VCCIO
H6
VCCIO
H14
VCCIO
J6
VCCIO
L14
VCCIO
M6
VCCIO
M14
VCCIO
N6
VCCIO
N14
VCCIO
P6
VCCIO
P7
VCCIO
P8
VCCIO
P9
VCCIO
P12
VCCIO
P13
VCCIO
P14
Signal
Type
Default
Pull State
Pull Type
3.3V
Power
-
None
Description
Operating supply for I/Os
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2.3.2.22 Ground Reference for All Supplies Except VCCAD
Table 2-39. ZWT Ground Reference for All Supplies Except VCCAD
Terminal
Signal Name
337
ZWT
VSS
A1
VSS
A2
VSS
A18
VSS
A19
VSS
B1
VSS
B19
VSS
H8
VSS
H9
VSS
H11
VSS
H12
VSS
J8
VSS
J9
VSS
J10
VSS
J11
VSS
J12
VSS
K9
VSS
K10
VSS
K11
VSS
L8
VSS
L9
VSS
L10
VSS
L11
VSS
L12
VSS
M8
VSS
M9
VSS
M11
VSS
M12
VSS
V1
VSS
W1
VSS
W2
38
Device Package and Terminal Functions
Signal
Type
Default
Pull State
Pull Type
Ground
-
None
Description
Ground reference
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3 Device Operating Conditions
3.1
Absolute Maximum Ratings Over Operating Free-Air Temperature Range,
(1)
VCC (2)
Supply voltage range:
VCCIO, VCCP
Input voltage range:
Input clamp current:
-0.3 V to 1.43 V
(2)
-0.3 V to 4.6 V
VCCAD
-0.3 V to 5.5 V
All input pins
-0.3 V to 4.6 V
ADC input pins
-0.3 V to 5.5 V
IIK (VI < 0 or VI > VCCIO)
All pins, except AD1IN[23:0] and AD2IN[15:0]
±20 mA
IIK (VI < 0 or VI > VCCAD)
AD1IN[23:0] and AD2IN[15:0]
±10 mA
Total
±40 mA
Operating free-air temperature range, TA:
-40°C to 125°C
Operating junction temperature range, TJ:
-40°C to 150°C
Storage temperature range, Tstg
-65°C to 150°C
(1)
(2)
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating
conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
maximum-rated conditions for extended periods may affect device reliability. All voltage values are with respect to their associated
grounds.
Device Recommended Operating Conditions (1)
3.2
MIN
NOM
MAX
UNIT
VCC
Digital logic supply voltage (Core)
1.14
1.2
1.32
V
VCCPLL
PLL Supply Voltage
1.14
1.2
1.32
V
VCCIO
Digital logic supply voltage (I/O)
3
3.3
3.6
V
VCCAD
MibADC supply voltage
3
3.3/5.0
5.25
V
VCCP
Flash pump supply voltage
3
3.3
3.6
V
VSS
Digital logic supply ground
VSSAD
MibADC supply ground
VADREFHI
0
V
-0.1
0.1
V
A-to-D high-voltage reference source
VSSAD
VCCAD
V
VADREFLO
A-to-D low-voltage reference source
VSSAD
VCCAD
V
VSLEW
Maximum positive slew rate for VCCIO, VCCAD and VCCP supplies
TA
Operating free-air temperature
-40
125
°C
TJ
Operating junction temperature (2)
-40
150
°C
(1)
(2)
1
V/µs
All voltages are with respect to VSS, except VCCAD, which is with respect to VSSAD
Reliability data is based upon a temperature profile that is equivalent to 100,000 power-on hours at 105°C junction temperature.
Device Operating Conditions
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Switching Characteristics over Recommended Operating Conditions for Clock Domains
Table 3-1. Clock Domain Timing Specifications
Parameter
fHCLK
Description
Conditions
HCLK - System clock frequency
PGE
ZWT
Min
Max
Unit
Pipeline mode
enabled
160
MHz
Pipeline mode
disabled
50
MHz
Pipeline mode
enabled
180
MHz
Pipeline mode
disabled
50
MHz
fGCLK
GCLK - CPU clock frequency
fHCLK
MHz
fVCLK
VCLK - Primary peripheral clock
frequency
100
MHz
fVCLK2
VCLK2 - Secondary peripheral clock
frequency
100
MHz
fVCLK3
VCLK3 - Secondary peripheral clock
frequency
100
MHz
fVCLKA1
VCLKA1 - Primary asynchronous
peripheral clock frequency
100
MHz
fVCLKA2
VCLKA2 - Secondary asynchronous
peripheral clock frequency
100
MHz
fVCLKA4
VCLKA4 - Secondary asynchronous
peripheral clock frequency
50
MHz
fRTICLK
RTICLK - clock frequency
fVCLK
MHz
3.4
Wait States Required
RAM
0
Address Waitstates
fHCLK(max)
0MHz
Data Waitstates
0
fHCLK(max)
0MHz
Flash
Address Waitstates
1
0
150MHz
0MHz
Data Waitstates
0
0MHz
1
50MHz
3
2
100MHz
fHCLK(max)
150MHz
fHCLK(max)
Figure 3-1. Wait States Scheme
As shown in the figure above, the TCM RAM can support program and data fetches at full CPU speed without
any address or data wait states required.
The TCM flash can support zero address and data wait states up to a CPU speed of 50MHz in non-pipelined
mode. The flash supports a maximum CPU clock speed of 160MHz in pipelined mode for the PGE Package and
180MHz for the ZWT package, with one address wait state and three data wait states.
The flash wrapper defaults to non-pipelined mode with zero address wait state and one random-read data wait
state.
40
Device Operating Conditions
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3.5
ZHCS437B – APRIL 2012 – REVISED JULY 2013
Power Consumption Over Recommended Operating Conditions
PARAMETER
TEST CONDITIONS
TYP
MAX
UNIT
220 (1)
440 (2)
mA
LBIST clock rate =
90MHz
(ZWT
Package only)
700 (3) (4)
mA
PBIST ROM clock
frequency = 90MHz
700 (3) (4)
mA
420 (2)
mA
fHCLK = 180MHz
(ZWT Package only)
VCC Digital supply current (operating mode)
VCC Digital supply current (LBIST mode)
ICC, ICCPLL
VCC Digital supply current (PBIST mode)
fVCLK
=
90MHz,
Flash in pipelined
mode, VCCmax
MIN
(ZWT Package only)
fHCLK = 160MHz
ICCIO
ICCAD
IADREFHI
ICCP
(1)
(2)
(3)
(4)
200 (1)
VCC Digital supply current (operating mode)
fVCLK
=
80MHz,
Flash in pipelined
mode, VCCmax
VCC Digital supply current (LBIST mode)
LBIST clock rate =
80MHz
665 (3) (4)
mA
VCC Digital supply current (PBIST mode)
PBIST ROM clock
frequency = 80MHz
665 (3) (4)
mA
VCCIO supply current (operating mode).
No DC load, VCCmax
10
mA
Single ADC
operational,
VCCADmax
15
Both ADCs
operational,
VCCADmax
30
Single ADC
operational,
ADREFHImax
3
Both ADCs
operational,
ADREFHImax
6
Read from 1 bank
and program or
erase another bank,
VCCPmax
60
VCCAD supply current (operating mode)
ADREFHI supply current (operating mode)
VCCP pump supply current
mA
mA
mA
The typical value is the average current for the nominal process corner and junction temperature of 25C.
The maximum ICC, value can be derated
• linearly with voltage
• by 1ma/MHz for lower operating frequency when fHCLK= 2 * fVCLK
• for lower junction temperature by the equation below where TJK is the junction temperature in Kelvin and the result is in milliamperes.
235 - 0.15 e0.0174 TJK
The maximum ICC, value can be derated
• linearly with voltage
• by 1.7ma/MHz for lower operating frequency when fHCLK= 2 * fVCLK
• for lower junction temperature by the equation below where TJK is the junction temperature in Kelvin and the result is in milliamperes.
235 - 0.15 e0.0174 TJK
LBIST and PBIST currents are for a short duration, typically less than 10ms. They are usually ignored for thermal calculations for the
device and the voltage regulator
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Input/Output Electrical Characteristics Over Recommended Operating Conditions (1)
PARAMETER
Vhys
VIL
TEST CONDITIONS
MIN
All inputs except
FRAYRX1, FRAYRX2
Input hysteresis
Low-level input voltage
FRAYRX1, FRAYRX2
100
All inputs (2) (except
FRAYRX1,
FRAYRX2)
-0.3
2
VOH
IIC
II
High-level output voltage
Input clamp current (I/O pins)
Input current (I/O pins)
V
VCCIO + 0.3
0.6 VCCIO
IOL = IOLmax
Low-level output voltage
mV
0.8
V
FRAYRX1, FRAYRX2
VOL
UNIT
mV
0.4 VCCIO
All inputs (2) (except
FRAYRX1,
FRAYRX2)
High-level input voltage
MAX
V
FRAYRX1, FRAYRX2
VIH
TYP
180
V
0.2 VCCIO
IOL = 50 µA, standard
output mode
0.2
IOL = 50 µA, low-EMI
output mode (see
Section 3.10)
0.2 VCCIO
V
IOH = IOHmax
0.8 VCCIO
IOH = 50 µA, standard
output mode
VCCIO -0.3
IOH = 50 µA, low-EMI
output mode (see
Section 3.10)
0.8 VCCIO
VI < VSSIO - 0.3 or VI
> VCCIO + 0.3
-3.5
3.5
5
40
195
V
IIH Pulldown 20µA
VI = VCCIO
IIH Pulldown 100µA
VI = VCCIO
40
IIL Pullup 20µA
VI = VSS
-40
-5
IIL Pullup 100µA
VI = VSS
-195
-40
All other pins
No pullup or pulldown
-1
1
mA
µA
CI
Input capacitance
2
pF
CO
Output capacitance
3
pF
(1)
(2)
3.7
Source currents (out of the device) are negative while sink currents (into the device) are positive.
This does not apply to the nPORRST pin.
Output Buffer Drive Strengths
Table 3-2. Output Buffer Drive Strengths
Low-level Output Current,
IOL for VI=VOLmax
or
High-level Output Current,
IOH for VI=VOHmin
Signals
FRAYTX2, FRAYTX1, FRAYTXEN1, FRAYTXEN2,
MIBSPI5CLK, MIBSPI5SOMI[0], MIBSPI5SOMI[1], MIBSPI5SOMI[2], MIBSPI5SOMI[3],
MIBSPI5SIMO[0], MIBSPI5SIMO[1], MIBSPI5SIMO[2], MIBSPI5SIMO[3],
8mA
TMS, TDI, TDO, RTCK,
SPI4CLK, SPI4SIMO, SPI4SOMI, nERROR,
N2HET2[1], N2HET2[3],
All EMIF Outputs and I/Os, All ETM Outputs
42
Device Operating Conditions
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Table 3-2. Output Buffer Drive Strengths (continued)
Low-level Output Current,
IOL for VI=VOLmax
or
High-level Output Current,
IOH for VI=VOHmin
Signals
MIBSPI3SOMI, MIBSPI3SIMO, MIBSPI3CLK, MIBSPI1SIMO, MIBSPI1SOMI, MIBSPI1CLK,
4mA
nRST
AD1EVT,
CAN1RX, CAN1TX, CAN2RX, CAN2TX, CAN3RX, CAN3TX,
DMM_CLK, DMM_DATA[0], DMM_DATA[1], DMM_nENA, DMM_SYNC,
GIOA[0-7], GIOB[0-7],
LINRX, LINTX,
2mA zero-dominant
MIBSPI1NCS[0], MIBSPI1NCS[1-3], MIBSPI1NENA, MIBSPI3NCS[0-3], MIBSPI3NENA,
MIBSPI5NCS[0-3], MIBSPI5NENA,
N2HET1[0-31], N2HET2[0], N2HET2[2], N2HET2[4], N2HET2[5], N2HET2[6], N2HET2[7],
N2HET2[8], N2HET2[9], N2HET2[10], N2HET2[11], N2HET2[12], N2HET2[13], N2HET2[14],
N2HET2[15], N2HET2[16], N2HET2[18],
SPI2NCS[0], SPI2NENA, SPI4NCS[0], SPI4NENA
ECLK,
selectable 8mA / 2mA
SPI2CLK, SPI2SIMO, SPI2SOMI
The default output buffer drive strength is 8mA for these signals.
Table 3-3. Selectable 8mA/2mA Control
(1)
3.8
Signal
Control Bit
Address
8mA
2mA
ECLK
SYSPC10[0]
0xFFFF FF78
0
1
SPI2CLK
SPI2PC9[9] (1)
0xFFF7 F668
0
1
SPI2SIMO
SPI2PC9[10]
(1)
0xFFF7 F668
0
1
SPI2SOMI
SPI2PC9[11] (1)
0xFFF7 F668
0
1
Do not do byte or half-word writes to SPI2PC9[31.16] as it may inadvertently change the drive strength of the SPI2 pins
Input Timings
t pw
Input
V IH
VCCIO
VIH
VIL
V IL
0
Figure 3-2. TTL-Level Inputs
Table 3-4. Timing Requirements for Inputs (1)
Parameter
tpw
(1)
(2)
Input minimum pulse width
MIN
tc(VCLK) + 10 (2)
MAX
Unit
ns
tc(VCLK) = peripheral VBUS clock cycle time = 1 / f(VCLK)
The timing shown above is only valid for pin used in GPIO mode.
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Output Timings
Table 3-5. Switching Characteristics for Output Timings versus Load Capacitance (CL)
Parameter
Rise time, tr
8mA low EMI pins
(see Table 3-2)
Fall time, tf
Rise time, tr
4mA low EMI pins
(see Table 3-2)
Fall time, tf
Rise time, tr
2mA-z low EMI pins
(see Table 3-2)
Fall time, tf
Rise time, tr
Selectable 8mA / 2mA-z
pins
(see Table 3-2)
8mA mode
Fall time, tf
Rise time, tr
2mA-z mode
Fall time, tf
44
Device Operating Conditions
MIN
MAX
Unit
CL = 15 pF
2.5
ns
CL = 50 pF
4
CL = 100 pF
7.2
CL = 150 pF
12.5
CL = 15 pF
2.5
CL = 50 pF
4
CL = 100 pF
7.2
CL = 150 pF
12.5
CL = 15 pF
5.6
CL = 50 pF
10.4
CL = 100 pF
16.8
CL = 150 pF
23.2
CL = 15 pF
5.6
CL= 50 pF
10.4
CL = 100 pF
16.8
CL = 150 pF
23.2
CL = 15 pF
8
CL = 50 pF
15
CL = 100 pF
23
CL = 150 pF
33
CL = 15 pF
8
CL = 50 pF
15
CL = 100 pF
23
CL = 150 pF
33
CL = 15 pF
2.5
CL = 50 pF
4
CL = 100 pF
7.2
CL = 150 pF
12.5
CL = 15 pF
2.5
CL = 50 pF
4
CL = 100 pF
7.2
CL = 150 pF
12.5
CL = 15 pF
8
CL = 50 pF
15
CL = 100 pF
23
CL = 150 pF
33
CL = 15 pF
8
CL = 50 pF
15
CL = 100 pF
23
CL = 150 pF
33
ns
ns
ns
ns
ns
ns
ns
ns
ns
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tr
tf
V OH
Output
VOL
VCCIO
VOH
VOL
0
Figure 3-3. CMOS-Level Outputs
Table 3-6. Timing Requirements for Outputs (1)
Parameter
td(parallel_out)
(1)
Delay between low to high, or high to low transition of general-purpose output signals
that can be configured by an application in parallel, e.g. all signals in a GIOA port, or
all N2HET1 signals, etc.
MIN
MAX
UNIT
5
ns
This specification does not account for any output buffer drive strength differences or any external capacitive loading differences. Check
Table 3-2 for output buffer drive strength information on each signal.
Device Operating Conditions
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3.10 Low-EMI Output Buffers
The low-EMI output buffer has been designed explicitly to address the issue of decoupling sources of
emissions from the pins which they drive. This is accomplished by adaptively controlling the impedance of
the output buffer, and is particularly effective with capacitive loads.
This is not the default mode of operation of the low-EMI output buffers and must be enabled by setting the
system module GPCR1 register for the desired module or signal, as shown in Table 3-7. The adaptive
impedance control circuit monitors the DC bias point of the output signal. The buffer internally generates
two reference levels, VREFLOW and VREFHIGH, which are set to approximately 10% and 90% of
VCCIO, respectively.
Once the output buffer has driven the output to a low level, if the output voltage is below VREFLOW, then
the output buffer’s impedance will increase to hi-Z. A high degree of decoupling between the internal
ground bus and the output pin will occur with capacitive loads, or any load in which no current is flowing,
e.g. the buffer is driving low on a resistive path to ground. Current loads on the buffer which attempt to pull
the output voltage above VREFLOW will be opposed by the buffer’s output impedance so as to maintain
the output voltage at or below VREFLOW.
Conversely, once the output buffer has driven the output to a high level, if the output voltage is above
VREFHIGH then the output buffer’s impedance will again increase to hi-Z. A high degree of decoupling
between internal power bus ad output pin will occur with capacitive loads or any loads in which no current
is flowing, e.g. buffer is driving high on a resistive path to VCCIO. Current loads on the buffer which
attempt to pull the output voltage below VREFHIGH will be opposed by the buffer’s output impedance so
as to maintain the output voltage at or above VREFHIGH.
The bandwidth of the control circuitry is relatively low, so that the output buffer in adaptive impedance
control mode cannot respond to high-frequency noise coupling into the buffer’s power buses. In this
manner, internal bus noise approaching 20% peak-to-peak of VCCIO can be rejected.
Unlike standard output buffers which clamp to the rails, an output buffer in impedance control mode will
allow a positive current load to pull the output voltage up to VCCIO + 0.6V without opposition. Also, a
negative current load will pull the output voltage down to VSSIO – 0.6V without opposition. This is not an
issue since the actual clamp current capability is always greater than the IOH / IOL specifications.
The low-EMI output buffers are automatically configured to be in the standard buffer mode when the
device enters a low-power mode.
Table 3-7. Low-EMI Output Buffer Hookup
Module or Signal Name
Control Register to Enable Low-EMI Mode
Module: MibSPI1
GPREG1.0
Module: SPI2
GPREG1.1
Module: MibSPI3
GPREG1.2
Reserved
GPREG1.3
Module: MibSPI5
GPREG1.4
Module: FlexRay
GPREG1.5
Module: EMIF
GPREG1.6
Module: ETM
GPREG1.7
Signal: TMS
GPREG1.8
Signal: TDI
GPREG1.9
Signal: TDO
GPREG1.10
Signal: RTCK
GPREG1.11
Signal: TEST
GPREG1.12
Signal: nERROR
GPREG1.13
Reserved
GPREG1.14
Module: RTP
GPREG1.15
46
Device Operating Conditions
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Device Operating Conditions
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4 System Information and Electrical Specifications
4.1
Device Power Domains
The device core logic is split up into multiple power domains in order to optimize the power for a given
application use case. There are 8 core power domains in total: PD1, PD2, PD3, PD4, PD5, RAM_PD1,
RAM_PD2 and RAM_PD3.
The actual contents of these power domains are indicated in 节 1.4.
PD1 is an "always-ON" power domain, which cannot be turned off. Each of the other core power domains
can be turned ON/OFF one time during device initialization as per the application requirement. Refer to
the Power Management Module (PMM) chapter of TMS570LS31X/21X Technical Reference Manual
(SPNU499) for more details.
NOTE
The clocks to a module must be turned off before powering down the core domain that
contains the module.
NOTE
The logic in the modules that are powered down lose power completely. Any access to
modules that are powered down results in an abort being generated. When power is
restored, the modules power-up to their default states (after normal power-up). No register or
memory contents are preserved in the core domains that are turned off.
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4.2
ZHCS437B – APRIL 2012 – REVISED JULY 2013
Voltage Monitor Characteristics
A voltage monitor is implemented on this device. The purpose of this voltage monitor is to eliminate the
requirement for a specific sequence when powering up the core and I/O voltage supplies.
4.2.1
Important Considerations
•
•
4.2.2
The voltage monitor does not eliminate the need of a voltage supervisor circuit to guarantee that the
device is held in reset when the voltage supplies are out of range.
The voltage monitor only monitors the core supply (VCC) and the I/O supply (VCCIO). The other
supplies are not monitored by the VMON. For example, if the VCCAD or VCCP are supplied from a
source different from that for VCCIO, then there is no internal voltage monitor for the VCCAD and
VCCP supplies.
Voltage Monitor Operation
The voltage monitor generates the Power Good MCU signal (PGMCU) as well as the I/Os Power Good IO
signal (PGIO) on the device. During power-up or power-down, the PGMCU and PGIO are driven low when
the core or I/O supplies are lower than the specified minimum monitoring thresholds. The PGIO and
PGMCU being low isolates the core logic as well as the I/O controls during the power-up or power-down
of the supplies. This allows the core and I/O supplies to be powered up or down in any order.
When the voltage monitor detects a low voltage on the I/O supply, it will assert a power-on reset. When
the voltage monitor detects an out-of-range voltage on the core supply, it asynchronously makes all output
pins high impedance, and asserts a power-on reset. The voltage monitor is disabled when the device
enters a low power mode.
The VMON also incorporates a glitch filter for the nPORRST input. Refer to Section 4.3.3.1 for the timing
information on this glitch filter.
Table 4-1. Voltage Monitoring Specifications
PARAMETER
VMON
4.2.3
Voltage monitoring
thresholds
MIN
TYP
MAX
UNIT
VCC low - VCC level below this
threshold is detected as too low.
0.75
0.9
1.13
V
VCC high - VCC level above this
threshold is detected as too high.
1.40
1.7
2.1
VCCIO low - VCCIO level below this
threshold is detected as too low.
1.85
2.4
2.9
Supply Filtering
The VMON has the capability to filter glitches on the VCC and VCCIO supplies.
The following table shows the characteristics of the supply filtering. Glitches in the supply larger than the
maximum specification cannot be filtered.
Table 4-2. VMON Supply Glitch Filtering Capability
Parameter
MIN
MAX
Width of glitch on VCC that can be filtered
250ns
1us
Width of glitch on VCCIO that can be filtered
250ns
1us
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Power Sequencing and Power On Reset
Power-Up Sequence
There is no timing dependency between the ramp of the VCCIO and the VCC supply voltage. The powerup sequence starts with the I/O voltage rising above the minimum I/O supply threshold, (see Table 4-4 for
more details), core voltage rising above the minimum core supply threshold and the release of power-on
reset. The high frequency oscillator will start up first and its amplitude will grow to an acceptable level. The
oscillator start up time is dependent on the type of oscillator and is provided by the oscillator vendor. The
different supplies to the device can be powered up in any order.
The device goes through the following sequential phases during power up.
Table 4-3. Power-Up Phases
Oscillator start-up and validity check
1032 oscillator cycles
eFuse autoload
1180 oscillator cycles
Flash pump power-up
688 oscillator cycles
Flash bank power-up
617 oscillator cycles
Total
3517 oscillator cycles
The CPU reset is released at the end of the above sequence and fetches the first instruction from address
0x00000000.
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4.3.2
ZHCS437B – APRIL 2012 – REVISED JULY 2013
Power-Down Sequence
The different supplies to the device can be powered down in any order.
4.3.3
Power-On Reset: nPORRST
This is the power-on reset. This reset must be asserted by an external circuitry whenever the I/O or core
supplies are outside the specified recommended range. This signal has a glitch filter on it. It also has an
internal pulldown.
4.3.3.1
nPORRST Electrical and Timing Requirements
Table 4-4. Electrical Requirements for nPORRST
NO Parameter
MIN
MAX
Unit
0.5
V
VCCPORL
VCC low supply level when nPORRST must be active during powerup
VCCPORH
VCC high supply level when nPORRST must remain active during
power-up and become active during power down
VCCIOPORL
VCCIO / VCCP low supply level when nPORRST must be active during
power-up
VCCIOPORH
VCCIO / VCCP high supply level when nPORRST must remain active
during power-up and become active during power down
VIL(PORRST)
Low-level input voltage of nPORRST VCCIO > 2.5V
0.2 * VCCIO
V
Low-level input voltage of nPORRST VCCIO < 2.5V
0.5
V
1.14
V
1.1
V
3.0
V
3
tsu(PORRST)
Setup time, nPORRST active before VCCIO and VCCP > VCCIOPORL
during power-up
0
ms
6
th(PORRST)
Hold time, nPORRST active after VCC > VCCPORH
1
ms
7
tsu(PORRST)
Setup time, nPORRST active before VCC < VCCPORH during power
down
2
µs
8
th(PORRST)
Hold time, nPORRST active after VCCIO and VCCP > VCCIOPORH
1
ms
9
th(PORRST)
Hold time, nPORRST active after VCC < VCCPORL
0
ms
tf(nPORRST)
500
Filter time nPORRST pin;
2000
ns
pulses less than MIN will be filtered out, pulses greater than MAX
will generate a reset.
3.3 V
1.2 V
VCCIOPORH
VCCPORH
6
VCCIOPORL
VCC (1.2 V)
VCCIO / VCCP(3.3 V)
nPORRST
VCCIOPORH
VCCIO / VCCP
8
VCCPORH
VCC
7
6
7
VCCPORL
VCCPORL
3
VIL(PORRST)
VCCIOPORL
9
VIL
VIL
VIL
VIL(PORRST)
NOTE: There is no timing dependency between the ramp of the VCCIO and the VCC supply voltage; this is just an exemplary drawing.
Figure 4-1. nPORRST Timing Diagram
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Warm Reset (nRST)
This is a bidirectional reset signal. The internal circuitry drives the signal low on detecting any device reset
condition. An external circuit can assert a device reset by forcing the signal low. On this terminal, the
output buffer is implemented as an open drain (drives low only). To ensure an external reset is not
arbitrarily generated, TI recommends that an external pullup resistor is connected to this terminal.
This terminal has a glitch filter. It also has an internal pullup
4.4.1
Causes of Warm Reset
Table 4-5. Causes of Warm Reset
DEVICE EVENT
SYSTEM STATUS FLAG
Power-Up Reset
Exception Status Register, bit 15
Oscillator fail
Global Status Register, bit 0
PLL slip
Global Status Register, bits 8 and 9
Watchdog exception / Debugger reset
Exception Status Register, bit 13
CPU Reset (driven by the CPU STC)
Exception Status Register, bit 5
Software Reset
Exception Status Register, bit 4
External Reset
Exception Status Register, bit 3
4.4.2
nRST Timing Requirements
Table 4-6. nRST Timing Requirements
PARAMETER
tv(RST)
Valid time, nRST active after
nPORRST inactive
Valid time, nRST active (all other
System reset conditions)
tf(nRST)
Filter time nRST pin;
MIN
MAX
2276tc(OSC) (1)
UNIT
ns
32tc(VCLK)
475
2000
ns
pulses less than MIN will be
filtered out, pulses greater than
MAX will generate a reset
(1)
52
Assumes the oscillator has started up and stabilized before nPORRST is released .
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4.5
4.5.1
ZHCS437B – APRIL 2012 – REVISED JULY 2013
ARM© Cortex-R4F™ CPU Information
Summary of ARM Cortex-R4F™ CPU Features
The features of the ARM Cortex-R4F™ CPU include:
• An integer unit with integral EmbeddedICE-RT logic.
• High-speed Advanced Microprocessor Bus Architecture (AMBA) Advanced eXtensible Interfaces (AXI)
for Level two (L2) master and slave interfaces.
• Floating Point Coprocessor
• Dynamic branch prediction with a global history buffer, and a 4-entry return stack
• Low interrupt latency.
• Non-maskable interrupt.
• A Harvard Level one (L1) memory system with:
– Tightly-Coupled Memory (TCM) interfaces with support for error correction or parity checking
memories
– ARMv7-R architecture Memory Protection Unit (MPU) with 12 regions
• Dual core logic for fault detection in safety-critical applications.
• An L2 memory interface:
– Single 64-bit master AXI interface
– 64-bit slave AXI interface to TCM RAM blocks
• A debug interface to a CoreSight Debug Access Port (DAP).
• A trace interface to a CoreSight ETM-R4.
• A Performance Monitoring Unit (PMU).
• A Vectored Interrupt Controller (VIC) port.
For more information on the ARM Cortex-R4F™ CPU please see www.arm.com.
4.5.2
ARM Cortex-R4F™ CPU Features Enabled by Software
The following CPU features are disabled on reset and must be enabled by the application if required.
• ECC On Tightly-Coupled Memory (TCM) Accesses
• Harware Vectored Interrupt (VIC) Port
• Floating Point Coprocessor
• Memory Protection Unit (MPU)
4.5.3
Dual Core Implementation
The device has two Cortex-R4F cores, where the output signals of both CPUs are compared in the CCMR4 unit. To avoid common mode impacts the signals of the CPUs to be compared are delayed by 2 clock
cycles as shown in Figure 4-3.
The CPUs have a diverse CPU placement given by following requirements:
• different orientation; e.g. CPU1 = "north" orientation, CPU2 = "flip west" orientation
• dedicated guard ring for each CPU
F
Flip West
F
North
Figure 4-2. Dual - CPU Orientation
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Duplicate clock tree after GCLK
The CPU clock domain is split into two clock trees, one for each CPU, with the clock of the 2nd CPU
running at the same frequency and in phase to the clock of CPU1. See Figure 4-3.
4.5.5
ARM Cortex-R4F™ CPU Compare Module (CCM-R4) for Safety
This device has two ARM Cortex-R4F™ CPU cores, where the output signals of both CPUs are compared
in the CCM-R4 unit. To avoid common mode impacts the signals of the CPUs to be compared are delayed
in a different way as shown in the figure below.
Output + Control
CCM-R4
2 cycle delay
CCM-R4
compare
CPU1CLK
CPU 1
compare
error
CPU 2
2 cycle delay
CPU2CLK
Input + Control
Figure 4-3. Dual Core Implementation
To avoid an erroneous CCM-R4 compare error, the application software must initialize the registers of
both CPUs before the registers are used, including function calls where the register values are pushed
onto the stack.
4.5.6
CPU Self-Test
The CPU STC (Self-Test Controller) is used to test the two Cortex-R4F CPU Cores using the
Deterministic Logic BIST Controller as the test engine.
The main features of the self-test controller are:
• Ability to divide the complete test run into independent test intervals
• Capable of running the complete test as well as running few intervals at a time
• Ability to continue from the last executed interval (test set) as well as ability to restart from the
beginning (First test set)
• Complete isolation of the self-tested CPU core from rest of the system during the self-test run
• Ability to capture the Failure interval number
• Timeout counter for the CPU self-test run as a fail-safe feature
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4.5.6.1
1.
2.
3.
4.
5.
6.
7.
ZHCS437B – APRIL 2012 – REVISED JULY 2013
Application Sequence for CPU Self-Test
Configure clock domain frequencies.
Select number of test intervals to be run.
Configure the timeout period for the self-test run.
Enable self-test.
Wait for CPU reset.
In the reset handler, read CPU self-test status to identify any failures.
Retrieve CPU state if required.
For more information see the device specific technical reference manual.
4.5.6.2
CPU Self-Test Clock Configuration
The maximum clock rate for the self-test is 90MHz. The STCCLK is divided down from the CPU clock.
This divider is configured by the STCCLKDIV register at address 0xFFFFE108.
For more information see the device specific technical reference manual.
4.5.6.3
CPU Self-Test Coverage
Table 4-7 shows CPU test coverage achieved for each self-test interval. It also lists the cumulative test
cycles. The test time can be calculated by multiplying the number of test cycles with the STC clock period.
Table 4-7. CPU Self-Test Coverage
INTERVALS
TEST COVERAGE, %
TEST CYCLES
0
0
0
1
62.13
1365
2
70.09
2730
3
74.49
4095
4
77.28
5460
5
79.28
6825
6
80.90
8190
7
82.02
9555
8
83.10
10920
9
84.08
12285
10
84.87
13650
11
85.59
15015
12
86.11
16380
13
86.67
17745
14
87.16
19110
15
87.61
20475
16
87.98
21840
17
88.38
23205
18
88.69
24570
19
88.98
25935
20
89.28
27300
21
89.50
28665
22
89.76
30030
23
90.01
31395
24
90.21
32760
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Clocks
4.6.1
Clock Sources
The table below lists the available clock sources on the device. Each of the clock sources can be enabled
or disabled using the CSDISx registers in the system module. The clock source number in the table
corresponds to the control bit in the CSDISx register for that clock source.
The table also shows the default state of each clock source.
Table 4-8. Available Clock Sources
Clock
Source #
Name
0
OSCIN
Main Oscillator
Enabled
1
PLL1
Output From PLL1
Disabled
Description
Default State
2
Reserved
Reserved
Disabled
3
EXTCLKIN1
External Clock Input #1
Disabled
4
CLK80K
Low Frequency Output of Internal Reference Oscillator
Enabled
CLK10M
High Frequency Output of Internal Reference
Oscillator
Enabled
5
6
PLL2
Output From PLL2
Disabled
7
EXTCLKIN2
External Clock Input #2
Disabled
4.6.1.1
Main Oscillator
The oscillator is enabled by connecting the appropriate fundamental resonator/crystal and load capacitors
across the external OSCIN and OSCOUT pins as shown in Figure 4-4. The oscillator is a single stage
inverter held in bias by an integrated bias resistor. This resistor is disabled during leakage test
measurement and low power modes.
TI strongly encourages each customer to submit samples of the device to the resonator/crystal
vendors for validation. The vendors are equipped to determine what load capacitors will best tune
their resonator/crystal to the microcontroller device for optimum start-up and operation over
temperature/voltage extremes.
An external oscillator source can be used by connecting a 3.3V clock signal to the OSCIN pin and leaving
the OSCOUT pin unconnected (open) as shown in the figure below.
OSCIN
(see Note B)
Kelvin_GND
C1
OSCOUT
OSCIN
OSCOUT
C2
(see Note A)
External
Clock Signal
(toggling 0-3.3V)
Crystal
(a)
(b)
Note A: The values of C1 and C2 should be provided by the resonator/crystal vendor.
Note B: Kelvin_GND should not be connected to any other GND.
Figure 4-4. Recommended Crystal/Clock Connection
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4.6.1.1.1 Timing Requirements for Main Oscillator
Table 4-9. Timing Requirements for Main Oscillator
MIN
MAX
Unit
tc(OSC)
Cycle time, OSCIN (when using a sine-wave input)
Parameter
50
200
ns
tc(OSC_SQR)
Cycle time, OSCIN, (when input to the OSCIN is a square
wave )
50
200
ns
tw(OSCIL)
Pulse duration, OSCIN low (when input to the OSCIN is a
square wave)
6
ns
tw(OSCIH)
Pulse duration, OSCIN high (when input to the OSCIN is a
square wave)
6
ns
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Low Power Oscillator
The Low Power Oscillator (LPO) is comprised of two oscillators — HF LPO and LF LPO, in a single
macro.
4.6.1.2.1 Features
The main features of the LPO are:
• Supplies a clock at extremely low power for power-saving modes. This is connected as clock source #
4 of the Global Clock Module.
• Supplies a high-frequency clock for non-timing-critical systems. This is connected as clock source # 5
of the Global Clock Module.
• Provides a comparison clock for the crystal oscillator failure detection circuit.
BIAS_EN
CLK80K
LFEN
LF_TRIM
Low
Power
Oscillator
HFEN
CLK10M
HF_TRIM
CLK10M_VALID
nPORRST
Figure 4-5. LPO Block Diagram
Figure 4-5 shows a block diagram of the internal reference oscillator. This is a low power oscillator (LPO)
and provides two clock sources: one nominally 80KHz and one nominally 10MHz.
4.6.1.2.2 LPO Electrical and Timing Specifications
Table 4-10. LPO Specifications
Parameter
Clock Detection
LPO - HF oscillator
(fHFLPO)
MIN
Typical
MAX
Unit
oscillator fail frequency - lower threshold, using
untrimmed LPO output
1.375
2.4
4.875
MHz
oscillator fail frequency - higher threshold, using
untrimmed LPO output
22
38.4
78
MHz
untrimmed frequency
5.5
9
19.5
MHz
8
9.6
11
MHz
10
µs
trimmed frequency
startup time from STANDBY (LPO BIAS_EN High for
at least 900µs)
cold startup time
LPO - LF oscillator
58
900
µs
180
kHz
startup time from STANDBY (LPO BIAS_EN High for
at least 900µs)
100
µs
cold startup time
2000
µs
untrimmed frequency
36
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4.6.1.3
ZHCS437B – APRIL 2012 – REVISED JULY 2013
Phase Locked Loop (PLL) Clock Modules
The PLL is used to multiply the input frequency to some higher frequency.
The main features of the PLL are:
• Frequency modulation can be optionally superimposed on the synthesized frequency of PLL1. The
frequency modulation capability of PLL2 is permanently disabled.
• Configurable frequency multipliers and dividers.
• Built-in PLL Slip monitoring circuit.
• Option to reset the device on a PLL slip detection.
4.6.1.3.1 Block Diagram
The Figure 4-6 shows a high-level block diagram of the two PLL macros on this microcontroller. PLLCTL1
and PLLCTL2 are used to configure the multiplier and dividers for the PLL1. PLLCTL3 is used to configure
the multiplier and dividers for PLL2.
OSCIN
/NR
INTCLK
VCOCLK
PLL
/1 to /64
/OD
post_ODCLK
/1 to /8
/R
PLLCLK
/1 to /32
fPLLCLK = (fOSCIN / NR) * NF / (OD * R)
/NF
/1 to /256
OSCIN
/NR2
VCOCLK2
INTCLK2
/1 to /64
PLL#2
/NF2
/OD2
post_ODCLK2
/1 to /8
/R2
PLL2CLK
/1 to /32
f PLL2CLK = (fOSCIN / NR2) * NF2 / (OD2 * R2)
/1 to /256
Figure 4-6. ZWT PLLx Block Diagram
4.6.1.3.2 PLL Timing Specifications
Table 4-11. PLL Timing Specifications
PARAMETER
fINTCLK
fpost_ODCLK
PLL1 Reference Clock frequency
VCOCLK – PLL1 Output Divider (OD) input
clock frequency
fINTCLK2
PLL2 Reference Clock frequency
fVCOCLK2
MAX
1
20
Post-ODCLK – PLL1 Post-divider input
clock frequency
fVCOCLK
fpost_ODCLK2
MIN
400
150
550
1
20
Post-ODCLK – PLL2 Post-divider input
clock frequency
VCOCLK – PLL2 Output Divider (OD) input
clock frequency
400
150
550
UNIT
MHz
MHz
MHz
MHz
MHz
MHz
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External Clock Inputs
The device supports up to two external clock inputs. This clock input must be a square wave input. The
electrical and timing requirements for these clock inputs are specified below. The external clock sources
are not checked for validity. They are assumed valid when enabled.
Table 4-12. External Clock Timing and Electrical Specifications
Parameter
Description
Min
Max
Unit
80
MHz
fEXTCLKx
External clock input frequency
tw(EXTCLKIN)H
EXTCLK high-pulse duration
6
ns
tw(EXTCLKIN)L
EXTCLK low-pulse duration
6
ns
viL(EXTCLKIN)
Low-level input voltage
-0.3
0.8
V
viH(EXTCLKIN)
High-level input voltage
2
VCCIO + 0.3
V
4.6.2
Clock Domains
4.6.2.1
Clock Domain Descriptions
The table below lists the device clock domains and their default clock sources. The table also shows the
system module control register that is used to select an available clock source for each clock domain.
Table 4-13. Clock Domain Descriptions
Clock Domain Name
Default Clock
Source
Clock Source
Selection Register
HCLK
OSCIN
GHVSRC
•
•
Is disabled via the CDDISx registers bit 1
Used for all system modules including DMA, ESM
GCLK
OSCIN
GHVSRC
•
•
•
•
Always the same frequency as HCLK
In phase with HCLK
Is disabled separately from HCLK via the CDDISx registers bit 0
Can be divided by 1up to 8 when running CPU self-test (LBIST)
using the CLKDIV field of the STCCLKDIV register at address
0xFFFFE108
GCLK2
OSCIN
GHVSRC
•
•
•
•
Always the same frequency as GCLK
2 cycles delayed from GCLK
Is disabled along with GCLK
Gets divided by the same divider setting as that for GCLK when
running CPU self-test (LBIST)
VCLK
OSCIN
GHVSRC
•
•
•
Divided down from HCLK
Can be HCLK/1, HCLK/2, ... or HCLK/16
Is disabled separately from HCLK via the CDDISx registers bit 2
VCLK2
OSCIN
GHVSRC
•
•
•
•
Divided down from HCLK
Can be HCLK/1, HCLK/2, ... or HCLK/16
Frequency must be an integer multiple of VCLK frequency
Is disabled separately from HCLK via the CDDISx registers bit 3
VCLK3
OSCIN
GHVSRC
•
•
•
Divided down from HCLK
Can be HCLK/1, HCLK/2, ... or HCLK/16
Is disabled separately from HCLK via the CDDISx registers bit 8
VCLKA1
VCLK
VCLKASRC
•
•
Defaults to VCLK as the source
Is disabled via the CDDISx registers bit 4
VCLKA2
VCLK
VCLKASRC
•
•
Defaults to VCLK as the source
Is disabled via the CDDISx registers bit 5
60
Description
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ZHCS437B – APRIL 2012 – REVISED JULY 2013
Table 4-13. Clock Domain Descriptions (continued)
Clock Domain Name
Default Clock
Source
Clock Source
Selection Register
Description
VCLKA3_S
VCLK
VCLKACON
•
•
•
Defaults to VCLK as the source
Frequency can be as fast as HCLK frequency.
Is disabled via the CDDISx registers bit 10
VCLKA3_DIVR
VCLK
VCLKACON1
•
Divided down from the VCLKA3_S using the VCLKA3R field of
the VCLKACON1 register at address 0xFFFFE140
Frequency can be VCLKA3_S/1, VCLKA3_S/2, ..., or
VCLKA3_S/8
Default frequency is VCLKA3_S/2
Is disabled separately via the VCLKACON1 register
VCLKA3_DIV_CDDIS bit only if the VCLKA3_S clock is not
disabled
•
•
•
VCLKA4
VCLK
VCLKACON1
•
•
Defaults to VCLK as the source
Is disabled via the CDDISx registers bit 11
RTICLK
VCLK
RCLKSRC
•
•
Defaults to VCLK as the source
If a clock source other than VCLK is selected for RTICLK, then
the RTICLK frequency must be less than or equal to VCLK/3
– Application can ensure this by programming the RTI1DIV
field of the RCLKSRC register, if necessary
Is disabled via the CDDISx registers bit 6
•
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4.6.2.2
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Mapping of Clock Domains to Device Modules
Each clock domain has a dedicated functionality as shown in the figures below.
GCM
0
OSCIN
FMzPLL
X1..256
/1..64
Low Power
Oscillator
GCLK, GCLK2 (to CPU)
(SSPLL)
/1..32
/1..8
1
*
80kHz
4
10MHz
5
/1..16
HCLK (to SYSTEM)
VCLK _peri (VCLK to peripherals on PCR1)
VCLK_sys (VCLK to system modules)
/1..16
VCLK2 (to N2HETx and HTUx)
/1..16
VCLK3 (to EMIF)
PLL # 2 (SSPLL)
/1..64
X1..256
* the frequency at this node must not
exceed the maximum HCLK specifiation.
/1..8
/1..32
6
*
3
EXTCLKIN 1
7
EXTCLKIN2
VCLK3
0
1
3
4
5
6
7
EMIF
0
1
3
4
5
6
7
VCLK
VCLKA1 (to DCANx)
0
1
3
4
5
6
7
VCLK
VCLKA2 (to FlexRay)
/1, 2, 4, or 8
RTICLK (to RTI, DWWD)
VCLK
VCLKA1
VCLK
VCLK2
VCLKA2
/1,2,..1024
/1,2,..4
GTUC1,2
Prop_seg
Phase_seg2
Phase_seg1
FlexRay
Baud
Rate
FlexRay
CAN Baud Rate
DCANx
VCLK2
VCLKA2
/1,2,..256
/2,3..224
/1,2..32
/1,2..65536
HRP
/1..64
/1,2..256
N2HETx
TU
FlexRay
TU
SPI
Baud Rate
SPIx,MibSPIx
LIN / SCI
Baud Rate
ADCLK
ECLK
I2C baud
rate
LIN, SCI
MibADCx
External Clock
I2C
EXTCLKIN1
PLL#2 output
Start of cycle
Macro Tick
NTU[3]
NTU[2]
NTU[1]
RTI
LRP
/20 ..2 5
Loop
High
Resolution Clock
N2HETx
NTU[0]
Figure 4-7. Device Clock Domains
62
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4.6.3
ZHCS437B – APRIL 2012 – REVISED JULY 2013
Clock Test Mode
The TMS570 platform architecture defines a special mode that allows various clock signals to be brought
out on to the ECLK pin and N2HET1[12] device outputs. This mode is called the Clock Test mode. It is
very useful for debugging purposes and can be configured via the CLKTEST register in the system
module.
Table 4-14. Clock Test Mode Options
SEL_ECP_PIN
=
CLKTEST[3-0]
SIGNAL ON ECLK
SEL_GIO_PIN
=
CLKTEST[11-8]
SIGNAL ON N2HET1[12]
0000
Oscillator
0000
Oscillator Valid Status
0001
Main PLL free-running clock output
0001
Main PLL Valid status
0010
Reserved
0010
Reserved
0011
EXTCLKIN1
0011
Reserved
0100
CLK80K
0100
Reserved
0101
CLK10M
0101
CLK10M Valid status
0110
Secondary PLL free-running clock output
0110
Secondary PLL Valid Status
0111
EXTCLKIN2
0111
Reserved
1000
GCLK
1000
CLK80K
1001
RTI Base
1001
Reserved
1010
Reserved
1010
Reserved
1011
VCLKA1
1011
Reserved
1100
VCLKA2
1100
Reserved
1101
Reserved
1101
Reserved
1110
VCLKA4
1110
Reserved
1111
Reserved
1111
Reserved
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4.7
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Clock Monitoring
The LPO Clock Detect (LPOCLKDET) module consists of a clock monitor (CLKDET) and an internal low
power oscillator (LPO).
The LPO provides two different clock sources – a low frequency (LFLPO) and a high frequency (HFLPO).
The CLKDET is a supervisor circuit for an externally supplied clock signal (OSCIN). In case the OSCIN
frequency falls out of a frequency window, the CLKDET flags this condition in the global status register
(GLBSTAT bit 0: OSC FAIL) and switches all clock domains sourced by OSCIN to the HFLPO clock (limp
mode clock).
The valid OSCIN frequency range is defined as: fHFLPO / 4 < fOSCIN < fHFLPO * 4.
4.7.1
Clock Monitor Timings
For more information on LPO and Clock detection, refer to Table 4-10.
guaranteed fail
lower
threshold
1.375
upper
guaranteed fail
threshold
guaranteed pass
4.875
22
78
f[MHz]
Figure 4-8. LPO and Clock Detection, Untrimmed HFLPO
4.7.2
External Clock (ECLK) Output Functionality
The ECLK pin can be configured to output a pre-scaled clock signal indicative of an internal device clock.
This output can be externally monitored as a safety diagnostic.
4.7.3
Dual Clock Comparators
The Dual Clock Comparator (DCC) module determines the accuracy of selectable clock sources by
counting the pulses of two independent clock sources (counter 0 and counter 1). If one clock is out of
spec, an error signal is generated. For example, the DCC1 can be configured to use CLK10M as the
reference clock (for counter 0) and VCLK as the "clock under test" (for counter 1). This configuration
allows the DCC1 to monitor the PLL output clock when VCLK is using the PLL output as its source.
An additional use of this module is to measure the frequency of a selectable clock source, using the input
clock as a reference, by counting the pulses of two independent clock sources. Counter 0 generates a
fixed-width counting window after a preprogrammed number of pulses. Counter 1 generates a fixed-width
pulse (1 cycle) after a pre-programmed number of pulses. This pulse sets as an error signal if counter 1
does not reach 0 within the counting window generated by counter 0.
4.7.3.1
•
•
•
•
64
Features
Takes two different clock sources as input to two independent counter blocks.
One of the clock sources is the known-good, or reference clock; the second clock source is the "clock
under test."
Each counter block is programmable with initial, or seed values.
The counter blocks start counting down from their seed values at the same time; a mismatch from the
expected frequency for the clock under test generates an error signal which is used to interrupt the
CPU.
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4.7.3.2
ZHCS437B – APRIL 2012 – REVISED JULY 2013
Mapping of DCC Clock Source Inputs
Table 4-15. DCC1 Counter 0 Clock Sources
CLOCK SOURCE [3:0]
CLOCK NAME
others
oscillator (OSCIN)
0x5
high frequency LPO
0xA
test clock (TCK)
Table 4-16. DCC1 Counter 1 Clock Sources
KEY [3:0]
CLOCK SOURCE [3:0]
others
-
N2HET1[31]
0x0
Main PLL free-running clock output
0x1
PLL #2 free-running clock output
0xA
CLOCK NAME
0x2
low frequency LPO
0x3
high frequency LPO
0x4
flash HD pump oscillator
0x5
EXTCLKIN1
0x6
EXTCLKIN2
0x7
ring oscillator
0x8 - 0xF
VCLK
Table 4-17. DCC2 Counter 0 Clock Sources
CLOCK SOURCE [3:0]
CLOCK NAME
others
oscillator (OSCIN)
0xA
test clock (TCK)
Table 4-18. DCC2 Counter 1 Clock Sources
KEY [3:0]
CLOCK SOURCE [3:0]
CLOCK NAME
others
-
N2HET2[0]
0xA
00x0 - 0x7
Reserved
0x8 - 0xF
VCLK
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Glitch Filters
A glitch filter is present on the following signals.
Table 4-19. Glitch Filter Timing Specifications
Pin
nPORRST
Parameter
tf(nPORRST)
Filter time nPORRST pin;
MIN
MAX
Unit
500
2000
ns
475
2000
ns
500
2000
ns
pulses less than MIN will be filtered out, pulses greater than
MAX will generate a reset (1)
nRST
tf(nRST)
Filter time nRST pin;
pulses less than MIN will be filtered out, pulses greater than
MAX will generate a reset
TEST
tf(TEST)
Filter time TEST pin;
pulses less than MIN will be filtered out, pulses greater than
MAX will pass through
(1)
66
The glitch filter design on the nPORRST signal is designed such that no size pulse will reset any part of the microcontroller (flash pump,
I/O pins, etc.) without also generating a valid reset signal to the CPU.
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4.9
4.9.1
ZHCS437B – APRIL 2012 – REVISED JULY 2013
Device Memory Map
Memory Map Diagram
The figure below shows the device memory map.
0xFFFFFFFF
SYSTEM Modules
0xFFF80000
Peripherals - Frame 1
0xFF000000
0xFE000000
CRC
RESERVED
0xFCFFFFFF
0xFC000000
Peripherals - Frame 2
RESERVED
0xF07FFFFF
Flash Module Bus2 Interface
(Flash ECC, OTP and EEPROM accesses)
0xF0000000
RESERVED
0x87FFFFFF
0x80000000
0x6FFFFFFF
0x60000000
EMIF (128MB)
SDRAM
RESERVED
CS0
reserved
0x6C000000
CS4
0x68000000
CS3
0x64000000
CS2
EMIF (16MB * 3)
Async RAM
RESERVED
0x202FFFFF
0x20000000
Flash (3MB) (Mirrored Image)
RESERVED
0x0843FFFF
0x08400000
RAM - ECC
RESERVED
0x0803FFFF
0x08000000
0x002FFFFF
0x00000000
RAM (256KB)
RESERVED
Flash (3MB)
Figure 4-9. Memory Map
The Flash memory is mirrored to support ECC logic testing. The base address of the mirrored Flash
image is 0x2000 0000.
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Memory Map Table
Table 4-20. Device Memory Map
FRAME ADDRESS RANGE
MODULE NAME
FRAME CHIP
SELECT
TCM Flash
CS0
0x0000_0000
0x00FF_FFFF
16MB
3MB
TCM RAM + RAM
ECC
CSRAM0
0x0800_0000
0x0BFF_FFFF
64MB
256KB
Mirrored Flash
Flash mirror
frame
0x2000_0000
0x20FF_FFFF
16MB
3MB
START
END
FRAME ACTUA
SIZE
L SIZE
RESPONSE FOR ACCESS TO
UNIMPLEMENTED LOCATIONS IN
FRAME
Memories tightly coupled to the ARM Cortex-R4F CPU
Abort
External Memory Accesses
EMIF Chip Select
2 (asynchronous)
EMIF select 2
0x6000_0000
0x63FF_FFFF
64MB
16MB
EMIF Chip Select
3 (asynchronous)
EMIF select 3
0x6400_0000
0x67FF_FFFF
64MB
16MB
EMIF Chip Select
4 (asynchronous)
EMIF select 4
0x6800_0000
0x6BFF_FFFF
64MB
16MB
EMIF Chip Select
0 (synchronous)
EMIF select 0
0x8000_0000
0x87FF_FFFF
128MB
128MB
Access to "Reserved" space will
generate Abort
Flash Module Bus2 Interface
Customer OTP,
TCM Flash Bank
0
0xF000_0000
0xF000_1FFF
8KB
4KB
Customer OTP,
TCM Flash Bank
1
0xF000_2000
0xF000_3FFF
8KB
4KB
Customer OTP,
EEPROM Bank 7
0xF000_E000
0xF000_FFFF
8KB
4KB
Customer
OTP–ECC, TCM
Flash Bank 0
0xF004_0000
0xF004_03FF
1KB
512B
Customer
OTP–ECC, TCM
Flash Bank 1
0xF004_0400
0xF004_07FF
1KB
512B
Customer
OTP–ECC,
EEPROM Bank 7
0xF004_1C00
0xF004_1FFF
1KB
1KB
TI OTP, TCM
Flash Bank 0
0xF008_0000
0xF008_1FFF
8KB
4KB
TI OTP, TCM
Flash Bank 1
0xF008_2000
0xF008_3FFF
8KB
4KB
TI OTP, EEPROM
Bank 7
0xF008_E000
0xF008_FFFF
8KB
4KB
TI OTP–ECC,
TCM Flash Bank
0
0xF00C_0000
0xF00C_03FF
1KB
512B
TI OTP–ECC,
TCM Flash Bank
1
0xF00C_0400
0xF00C_07FF
1KB
512B
TI OTP–ECC,
EEPROM Bank 7
0xF00C_1C00
0xF00C_1FFF
1KB
1KB
EEPROM
Bank–ECC
0xF010_0000
0xF013_FFFF
256KB
8KB
EEPROM Bank
0xF020_0000
0xF03F_FFFF
2MB
64KB
Flash Data Space
ECC
0xF040_0000
0xF04F_FFFF
1MB
384KB
Abort
EMIF slave interfaces
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ZHCS437B – APRIL 2012 – REVISED JULY 2013
Table 4-20. Device Memory Map (continued)
MODULE NAME
FRAME CHIP
SELECT
EMIF Registers
FRAME ADDRESS RANGE
START
END
0xFCFF_E800
0xFCFF_E8FF
FRAME ACTUA
SIZE
L SIZE
256B
256B
RESPONSE FOR ACCESS TO
UNIMPLEMENTED LOCATIONS IN
FRAME
Abort
Cyclic Redundancy Checker (CRC) Module Registers
CRC
CRC frame
0xFE00_0000
0xFEFF_FFFF
16MB
512B
Accesses above 0x200 generate abort.
Peripheral Memories
MIBSPI5 RAM
PCS[5]
0xFF0A_0000
0xFF0B_FFFF
128KB
2KB
Abort for accesses above 2KB
MIBSPI3 RAM
PCS[6]
0xFF0C_0000
0xFF0D_FFFF
128KB
2KB
Abort for accesses above 2KB
MIBSPI1 RAM
PCS[7]
0xFF0E_0000
0xFF0F_FFFF
128KB
2KB
Abort for accesses above 2KB
DCAN3 RAM
PCS[13]
0xFF1A_0000
0xFF1B_FFFF
128KB
2KB
Wrap around for accesses to
unimplemented address offsets lower
than 0x7FF. Abort generated for
accesses beyond offset 0x800.
DCAN2 RAM
PCS[14]
0xFF1C_0000
0xFF1D_FFFF
128KB
2KB
Wrap around for accesses to
unimplemented address offsets lower
than 0x7FF. Abort generated for
accesses beyond offset 0x800.
2KB
Wrap around for accesses to
unimplemented address offsets lower
than 0x7FF. Abort generated for
accesses beyond offset 0x800.
8KB
Wrap around for accesses to
unimplemented address offsets lower
than 0x1FFF. Abort generated for
accesses beyond 0x1FFF.
8KB
Wrap around for accesses to
unimplemented address offsets lower
than 0x1FFF. Abort generated for
accesses beyond 0x1FFF.
16KB
Wrap around for accesses to
unimplemented address offsets lower
than 0x3FFF. Abort generated for
accesses beyond 0x3FFF.
DCAN1 RAM
MIBADC2 RAM
MIBADC1 RAM
N2HET2 RAM
PCS[15]
PCS[29]
PCS[31]
PCS[34]
0xFF1E_0000
0xFF3A_0000
0xFF3E_0000
0xFF44_0000
0xFF1F_FFFF
0xFF3B_FFFF
0xFF3F_FFFF
0xFF45_FFFF
128KB
128KB
128KB
128KB
N2HET1 RAM
PCS[35]
0xFF46_0000
0xFF47_FFFF
128KB
16KB
Wrap around for accesses to
unimplemented address offsets lower
than 0x3FFF. Abort generated for
accesses beyond 0x3FFF.
HTU2 RAM
PCS[38]
0xFF4C_0000
0xFF4D_FFFF
128KB
1KB
Abort
HTU1 RAM
PCS[39]
0xFF4E_0000
0xFF4F_FFFF
128KB
1KB
Abort
FTU RAM
PCS[40]
0xFF50_0000
0xFF51_FFFF
128KB
1KB
Abort
Debug Components
CoreSight Debug
ROM
CSCS0
0xFFA0_0000
0xFFA0_0FFF
4KB
4KB
Reads: 0, writes: no effect
Cortex-R4F
Debug
CSCS1
0xFFA0_1000
0xFFA0_1FFF
4KB
4KB
Reads: 0, writes: no effect
ETM-R4
CSCS2
0xFFA0_2000
0xFFA0_2FFF
4KB
4KB
Reads: 0, writes: no effect
CoreSight TPIU
CSCS3
0xFFA0_3000
0xFFA0_3FFF
4KB
4KB
Reads: 0, writes: no effect
POM
CSCS4
0xFFA0_4000
0xFFA0_4FFF
4KB
4KB
Abort
FTU
PS[23]
0xFFF7_A000
0xFFF7_A1FF
512B
512B
Reads: 0, writes: no effect
HTU1
PS[22]
0xFFF7_A400
0xFFF7_A4FF
256B
256B
Reads: 0, writes: no effect
Peripheral Control Registers
HTU2
PS[22]
0xFFF7_A500
0xFFF7_A5FF
256B
256B
Reads: 0, writes: no effect
N2HET1
PS[17]
0xFFF7_B800
0xFFF7_B8FF
256B
256B
Reads: 0, writes: no effect
N2HET2
PS[17]
0xFFF7_B900
0xFFF7_B9FF
256B
256B
Reads: 0, writes: no effect
GPIO
PS[16]
0xFFF7_BC00
0xFFF7_BCFF
256B
256B
Reads: 0, writes: no effect
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Table 4-20. Device Memory Map (continued)
MODULE NAME
FRAME CHIP
SELECT
MIBADC1
MIBADC2
FRAME ADDRESS RANGE
FRAME ACTUA
SIZE
L SIZE
RESPONSE FOR ACCESS TO
UNIMPLEMENTED LOCATIONS IN
FRAME
START
END
PS[15]
0xFFF7_C000
0xFFF7_C1FF
512B
512B
Reads: 0, writes: no effect
PS[15]
0xFFF7_C200
0xFFF7_C3FF
512B
512B
Reads: 0, writes: no effect
FlexRay
PS[12]+PS[13]
0xFFF7_C800
0xFFF7_CFFF
2KB
2KB
Reads: 0, writes: no effect
I2C
PS[10]
0xFFF7_D400
0xFFF7_D4FF
256B
256B
Reads: 0, writes: no effect
DCAN1
PS[8]
0xFFF7_DC00
0xFFF7_DDFF
512B
512B
Reads: 0, writes: no effect
DCAN2
PS[8]
0xFFF7_DE00
0xFFF7_DFFF
512B
512B
Reads: 0, writes: no effect
DCAN3
PS[7]
0xFFF7_E000
0xFFF7_E1FF
512B
512B
Reads: 0, writes: no effect
LIN
PS[6]
0xFFF7_E400
0xFFF7_E4FF
256B
256B
Reads: 0, writes: no effect
SCI
PS[6]
0xFFF7_E500
0xFFF7_E5FF
256B
256B
Reads: 0, writes: no effect
MibSPI1
PS[2]
0xFFF7_F400
0xFFF7_F5FF
512B
512B
Reads: 0, writes: no effect
SPI2
PS[2]
0xFFF7_F600
0xFFF7_F7FF
512B
512B
Reads: 0, writes: no effect
MibSPI3
PS[1]
0xFFF7_F800
0xFFF7_F9FF
512B
512B
Reads: 0, writes: no effect
SPI4
PS[1]
0xFFF7_FA00
0xFFF7_FBFF
512B
512B
Reads: 0, writes: no effect
MibSPI5
PS[0]
0xFFF7_FC00
0xFFF7_FDFF
512B
512B
Reads: 0, writes: no effect
System Modules Control Registers and Memories
DMA RAM
PPCS0
0xFFF8_0000
0xFFF8_0FFF
4KB
4KB
Abort
VIM RAM
PPCS2
0xFFF8_2000
0xFFF8_2FFF
4KB
1KB
Wrap around for accesses to
unimplemented address offsets
between 1kB and 4kB.
RTP RAM
PPCS3
0xFFF8_3000
0xFFF8_3FFF
4KB
4KB
Abort
Flash Module
PPCS7
0xFFF8_7000
0xFFF8_7FFF
4KB
4KB
Abort
eFuse Controller
PPCS12
0xFFF8_C000
0xFFF8_CFFF
4KB
4KB
Abort
Power
Management
Module (PMM)
PPSE0
0xFFFF_0000
0xFFFF_01FF
512B
512B
Abort
Test Controller
(FMTM)
PPSE1
0xFFFF_0400
0xFFFF_07FF
1KB
1KB
Reads: 0, writes: no effect
PCR registers
PPS0
0xFFFF_E000
0xFFFF_E0FF
256B
256B
Reads: 0, writes: no effect
System Module Frame 2 (see
device TRM)
PPS0
0xFFFF_E100
0xFFFF_E1FF
256B
256B
Reads: 0, writes: no effect
PBIST
PPS1
0xFFFF_E400
0xFFFF_E5FF
512B
512B
Reads: 0, writes: no effect
STC
PPS1
0xFFFF_E600
0xFFFF_E6FF
256B
256B
Generates address error interrupt, if
enabled
IOMM
Multiplexing
Control Module
PPS2
0xFFFF_EA00
0xFFFF_EBFF
512B
512B
Reads: 0, writes: no effect
DCC1
PPS3
0xFFFF_EC00
0xFFFF_ECFF
256B
256B
Reads: 0, writes: no effect
DMA
PPS4
0xFFFF_F000
0xFFFF_F3FF
1KB
1KB
Reads: 0, writes: no effect
DCC2
PPS5
0xFFFF_F400
0xFFFF_F4FF
256B
256B
Reads: 0, writes: no effect
ESM
PPS5
0xFFFF_F500
0xFFFF_F5FF
256B
256B
Reads: 0, writes: no effect
CCMR4
PPS5
0xFFFF_F600
0xFFFF_F6FF
256B
256B
Reads: 0, writes: no effect
DMM
PPS5
0xFFFF_F700
0xFFFF_F7FF
256B
256B
Reads: 0, writes: no effect
RAM ECC even
PPS6
0xFFFF_F800
0xFFFF_F8FF
256B
256B
Reads: 0, writes: no effect
RAM ECC odd
PPS6
0xFFFF_F900
0xFFFF_F9FF
256B
256B
Reads: 0, writes: no effect
RTP
PPS6
0xFFFF_FA00
0xFFFF_FAFF
256B
256B
Reads: 0, writes: no effect
RTI + DWWD
PPS7
0xFFFF_FC00
0xFFFF_FCFF
256B
256B
Reads: 0, writes: no effect
VIM Parity
PPS7
0xFFFF_FD00
0xFFFF_FDFF
256B
256B
Reads: 0, writes: no effect
VIM
PPS7
0xFFFF_FE00
0xFFFF_FEFF
256B
256B
Reads: 0, writes: no effect
70
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Table 4-20. Device Memory Map (continued)
MODULE NAME
FRAME CHIP
SELECT
System Module Frame 1 (see
device TRM)
PPS7
FRAME ADDRESS RANGE
START
END
0xFFFF_FF00
0xFFFF_FFFF
FRAME ACTUA
SIZE
L SIZE
256B
256B
RESPONSE FOR ACCESS TO
UNIMPLEMENTED LOCATIONS IN
FRAME
Reads: 0, writes: no effect
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4.9.3
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Master/Slave Access Privileges
The table below lists the access permissions for each bus master on the device. A bus master is a module
that can initiate a read or a write transaction on the device.
Each slave module on the main interconnect is listed in the table. A "Yes" indicates that the module listed
in the "MASTERS" column can access that slave module.
Table 4-21. Master / Slave Access Matrix
MASTERS
ACCESS MODE
SLAVES ON MAIN SCR
Flash Module
Bus2 Interface:
OTP, ECC,
EEPROM Bank
Non-CPU
Accesses to
Program Flash
and CPU Data
RAM
CRC
EMIF Slave
Interfaces
Peripheral
Control
Registers, All
Peripheral
Memories, And
All System
Module Control
Registers And
Memories
CPU READ
User/Privilege
Yes
Yes
Yes
Yes
Yes
CPU WRITE
User/Privilege
No
Yes
Yes
Yes
Yes
DMA
User
Yes
Yes
Yes
Yes
Yes
POM
User
Yes
Yes
Yes
Yes
Yes
DMM
User
Yes
Yes
Yes
Yes
Yes
DAP
Privilege
Yes
Yes
Yes
Yes
Yes
HTU1
Privilege
No
Yes
Yes
Yes
Yes
HTU2
Privilege
No
Yes
Yes
Yes
Yes
FTU
User
No
Yes
Yes
Yes
Yes
4.9.3.1
Special Notes on Accesses to Certain Slaves
Write accesses to the Power Domain Management Module (PMM) control registers are limited to the CPU
(master id = 1). The other masters can only read from these registers.
A debugger can also write to the PMM registers. The master-id check is disabled in debug mode.
The device contains dedicated logic to generate a bus error response on any access to a module that is in
a power domain that has been turned OFF.
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4.9.4
ZHCS437B – APRIL 2012 – REVISED JULY 2013
POM Overlay Considerations
•
•
•
•
The POM overlay can map onto up to 8MB of the internal or external memory space. The starting
address and the size of the memory overlay are configurable via the POM module control registers.
Care must be taken to ensure that the overlay is mapped on to available memory.
ECC must be disabled by software via CP15 in case POM overlay is enabled; otherwise ECC errors
will be generated.
POM overlay must not be enabled when the flash and internal RAM memories are swapped via the
MEM SWAP field of the Bus Matrix Module Control Register 1 (BMMCR1).
When POM is used to overlay the flash onto internal or external RAM, there is a bus contention
possibility when another master accesses the TCM flash. This results in a system hang.
– The POM module implements a timeout feature to detect this exact scenario. The timeout needs to
be enabled whenever POM overlay is enabled.
– The timeout can be enabled by writing 1010 to the Enable TimeOut (ETO) field of the POM Global
Control register (POMGLBCTRL, address = 0xFFA04000).
– In case a read request by the POM cannot be completed within 32 HCLK cycles, the timeout (TO)
flag is set in the POM Flag register (POMFLG, address = 0xFFA0400C). Also, an abort is
generated to the CPU. This can be a prefetch abort for an instruction fetch or a data abort for a
data fetch.
– The prefetch- and data-abort handlers must be modified to check if the TO flag in the POM module
is set. If so, then the application can assume that the timeout is caused by a bus contention
between the POM transaction and another master accessing the same memory region. The abort
handlers need to clear the TO flag, so that any further aborts are not misinterpreted as having been
caused due to a timeout from the POM.
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4.10 Flash Memory
4.10.1 Flash Memory Configuration
Flash Bank: A separate block of logic consisting of 1 to 16 sectors. Each flash bank normally has a
customer-OTP and a TI-OTP area. These flash sectors share input/output buffers, data paths, sense
amplifiers, and control logic.
Flash Sector: A contiguous region of flash memory which must be erased simultaneously due to physical
construction constraints.
Flash Pump: A charge pump which generates all the voltages required for reading, programming, or
erasing the flash banks.
Flash Module: Interface circuitry required between the host CPU and the flash banks and pump module.
Table 4-22. Flash Memory Banks and Sectors
Memory Arrays (or Banks)
(1)
BANK0 (1.5MBytes)
BANK1 (1.5MBytes)
BANK7 (64kBytes) for EEPROM emulation
(1)
(2)
(3)
74
(2) (3)
Sector
No.
Segment
Low Address
High Address
0
32K Bytes
0x0000_0000
0x0000_7FFF
1
32K Bytes
0x0000_8000
0x0000_FFFF
2
32K Bytes
0x0001_0000
0x0001_7FFF
3
32K Bytes
0x0001_8000
0x0001_FFFF
4
128K Bytes
0x0002_0000
0x0003_FFFF
5
128K Bytes
0x0004_0000
0x0005_FFFF
6
128K Bytes
0x0006_0000
0x0007_FFFF
7
128K Bytes
0x0008_0000
0x0009_FFFF
8
128K Bytes
0x000A_0000
0x000B_FFFF
9
128K Bytes
0x000C_0000
0x000D_FFFF
10
128K Bytes
0x000E_0000
0x000F_FFFF
11
128K Bytes
0x0010_0000
0x0011_FFFF
12
128K Bytes
0x0012_0000
0x0013_FFFF
13
128K Bytes
0x0014_0000
0x0015_FFFF
14
128K Bytes
0x0016_0000
0x0017_FFFF
0
128K Bytes
0x0018_0000
0x0019_FFFF
1
128K Bytes
0x001A_0000
0x001B_FFFF
2
128K Bytes
0x001C_0000
0x001D_FFFF
3
128K Bytes
0x001E_0000
0x001F_FFFF
4
128K Bytes
0x0020_0000
0x0021_FFFF
5
128K Bytes
0x0022_0000
0x0023_FFFF
6
128K Bytes
0x0024_0000
0x0025_FFFF
7
128K Bytes
0x0026_0000
0x0027_FFFF
8
128K Bytes
0x0028_0000
0x0029_FFFF
9
128K Bytes
0x002A_0000
0x002B_FFFF
10
128K Bytes
0x002C_0000
0x002D_FFFF
11
128K Bytes
0x002E_0000
0x002F_FFFF
0
16K Bytes
0xF020_0000
0xF020_3FFF
1
16K Bytes
0xF020_4000
0xF020_7FFF
2
16K Bytes
0xF020_8000
0xF020_BFFF
3
16K Bytes
0xF020_C000
0xF020_FFFF
The Flash banks are 144-bit wide bank with ECC support.
The flash bank7 can be programmed while executing code from flash bank0 or bank1.
Code execution is not allowed from flash bank7.
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4.10.2 Main Features of Flash Module
•
•
•
•
•
•
Support for multiple flash banks for program and/or data storage
Simultaneous read access on a bank while performing program or erase operation on any other bank
Integrated state machines to automate flash erase and program operations
Software interface for flash program and erase operations
Pipelined mode operation to improve instruction access interface bandwidth
Support for Single Error Correction Double Error Detection (SECDED) block inside Cortex-R4F CPU
– Error address is captured for host system debugging
Support for a rich set of diagnostic features
•
4.10.3 ECC Protection for Flash Accesses
All accesses to the program flash memory are protected by Single Error Correction Double Error Detection
(SECDED) logic embedded inside the CPU. The flash module provides 8 bits of ECC code for 64 bits of
instructions or data fetched from the flash memory. The CPU calculates the expected ECC code based on
the 64 bits received and compares it with the ECC code returned by the flash module. A signle-bit error is
corrected and flagged by the CPU, while a multi-bit error is only flagged. The CPU signals an ECC error
via its Event bus. This signaling mechanism is not enabled by default and must be enabled by setting the
"X" bit of the Performance Monitor Control Register, c9.
MRC
ORR
MCR
MRC
p15,#0,r1,c9,c12,#0
r1, r1, #0x00000010
p15,#0,r1,c9,c12,#0
p15,#0,r1,c9,c12,#0
;Enabling Event monitor states
;Set 4th bit (‘X’) of PMNC register
The application must also explicitly enable the CPU's ECC checking for accesses on the CPU's ATCM
and BTCM interfaces. These are connected to the program flash and data RAM respectively. ECC
checking for these interfaces can be done by setting the B1TCMPCEN, B0TCMPCEN and ATCMPCEN
bits of the System Control coprocessor's Auxiliary Control Register, c1.
MRC p15, #0, r1, c1, c0, #1
ORR r1, r1, #0x0e000000
DMB
MCR p15, #0, r1, c1, c0, #1
;Enable ECC checking for ATCM and BTCMs
4.10.4 Flash Access Speeds
For information on flash memory access speeds and the relevant wait states required, refer to Section 3.4.
4.10.5 Flash Program and Erase Timings for Program Flash
Table 4-23. Timing Specifications for Program Flash
Parameter
tprog (144bit)
tprog (Total)
MIN
Wide Word (144bit) programming time
3MByte programming time
(1)
Sector/Bank erase time (2)
-40°C to 125°C
0°C to 60°C, for first
25 cycles
twec
(1)
(2)
MAX
Unit
40
300
µs
-40°C to 125°C
0°C to 60°C, for first
25 cycles
terase
NOM
Write/erase cycles with 15 year Data Retention -40°C to 125°C
requirement
32
s
8
16
s
0.03
4
s
16
100
ms
1000
cycles
This programming time includes overhead of state machine, but does not include data transfer time. The programming time assumes
programming 144 bits at a time at the maximum specified operating frequency.
During bank erase, the selected sectors are erased simultaneously. The time to erase the bank is specified as equal to the time to erase
a sector.
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4.10.6 Flash Program and Erase Timings for Data Flash
Table 4-24. Timing Specifications for Data Flash
Parameter
tprog (144bit)
Wide Word (144bit) programming time
tprog (Total)
64KByte programming time (1)
terase
twec
(1)
(2)
76
Sector/Bank erase time (2)
MIN
NOM
MAX
40
300
µs
660
ms
330
ms
-40°C to 125°C
Unit
0°C to 60°C, for first
25 cycles
165
-40°C to 125°C
0.2
8
s
0°C to 60°C, for first
25 cycles
14
100
ms
100000
cycles
Write/erase cycles with 15 year Data Retention -40°C to 125°C
requirement
This programming time includes overhead of state machine, but does not include data transfer time. The programming time assumes
programming 144 bits at a time at the maximum specified operating frequency.
During bank erase, the selected sectors are erased simultaneously. The time to erase the bank is specified as equal to the time to erase
a sector.
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4.11 Tightly-Coupled RAM Interface Module
Figure 4-10 illustrates the connection of the Tightly Coupled RAM (TCRAM) to the Cortex-R4F™ CPU.
VBUSP I/F
PMT I/F
Upper 32 bits data &
4 ECC bits
Cortex R4F™
B0
TCM
EVEN Address
TCM BUS
TCRAM
Interface 1
64 Bit data bus
Lower 32 bits data &
4 ECC bits
A
TCM
B1
TCM
Upper 32 bits data &
4 ECC bits
ODD Address
TCM BUS
64 Bit data bus
TCRAM
Interface 2
Lower 32 bits data &
4 ECC bits
VBUSP I/F
36 Bit
Bit
3636
Bit
wide
wide
wideRAM
RAM
RAM
36 Bit
Bit
3636
Bit
wide
wide
wide
RAM
RAM
RAM
36 Bit
Bit
wide
3636
Bit
wide
wideRAM
RAM
RAM
36 Bit
Bit
3636
Bit
wide
wide
wideRAM
RAM
RAM
PMT I/F
Figure 4-10. TCRAM Block Diagram
4.11.1 Features
The features of the Tightly Coupled RAM (TCRAM) Module are:
• Acts as slave to the Cortex-R4F CPU's BTCM interface
• Supports CPU's internal ECC scheme by providing 64-bit data and 8-bit ECC code
• Monitors CPU Event Bus and generates single or multi-bit error interrupts
• Stores addresses for single and multi-bit errors
• Supports RAM trace module
• Provides CPU address bus integrity checking by supporting parity checking on the address bus
• Performs redundant address decoding for the RAM bank chip select and ECC select generation logic
• Provides enhanced safety for the RAM addressing by implementing two 36-bit wide byte-interleaved
RAM banks and generating independent RAM access control signals to the two banks
• Supports auto-initialization of the RAM banks along with the ECC bits
• No support for bit-wise RAM accesses
4.11.2 TCRAMW ECC Support
The TCRAMW passes on the ECC code for each data read by the Cortex-R4F CPU from the RAM. It also
stores the CPU's ECC port contents in the ECC RAM when the CPU does a write to the RAM. The
TCRAMW monitors the CPU's event bus and provides registers for indicating single/multi-bit errors and
also for identifying the address that caused the single or multi-bit error. The event signaling and the ECC
checking for the RAM accesses must be enabled inside the CPU.
For more information see the device specific technical reference manual.
4.12
Parity Protection for peripheral RAMs
Most peripheral RAMs are protected by odd/even parity checking. During a read access the parity is
calculated based on the data read from the peripheral RAM and compared with the good parity value
stored in the parity RAM for that peripheral. If any word fails the parity check, the module generates a
parity error signal that is mapped to the Error Signaling Module. The module also captures the peripheral
RAM address that caused the parity error.
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The parity protection for peripheral RAMs is not enabled by default and must be enabled by the
application. Each individual peripheral contains control registers to enable the parity protection for
accesses to its RAM.
NOTE
The CPU read access gets the actual data from the peripheral. The application can choose
to generate an interrupt whenever a peripheral RAM parity error is detected.
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4.13 On-Chip SRAM Initialization and Testing
4.13.1 On-Chip SRAM Self-Test Using PBIST
4.13.1.1 Features
•
•
•
Extensive instruction set to support various memory test algorithms
ROM-based algorithms allow application to run TI production-level memory tests
Independent testing of all on-chip SRAM
4.13.1.2 PBIST RAM Groups
Table 4-25. PBIST RAM Grouping
Test Pattern (Algorithm)
Memory
RAM Group
Test Clock
MEM Type
triple read
slow read
triple read
fast read
March 13N (1)
two port
(cycles)
March 13N (1)
single port
(cycles)
ALGO MASK
0x1
ALGO MASK
0x2
ALGO MASK
0x4
ALGO MASK
0x8
PBIST_ROM
1
ROM CLK
ROM
24578
8194
STC_ROM
2
ROM CLK
ROM
19586
6530
DCAN1
3
VCLK
Dual Port
25200
DCAN2
4
VCLK
Dual Port
25200
DCAN3
5
VCLK
Dual Port
25200
ESRAM1
6
HCLK
Single Port
MIBSPI1
7
VCLK
Dual Port
33440
MIBSPI3
8
VCLK
Dual Port
33440
MIBSPI5
9
VCLK
Dual Port
33440
VIM
10
VCLK
Dual Port
12560
MIBADC1
11
VCLK
Dual Port
4200
DMA
12
HCLK
Dual Port
18960
N2HET1
13
VCLK
Dual Port
31680
HTU1
14
VCLK
Dual Port
6480
RTP
15
HCLK
Dual Port
37800
16
VCLK
Dual Port
75400
FLEXRAY
(1)
17
266280
Single Port
133160
MIBADC2
18
VCLK
Dual Port
4200
N2HET2
19
VCLK
Dual Port
31680
HTU2
20
VCLK
Dual Port
6480
ESRAM5
21
HCLK
Single Port
266280
ESRAM6
22
HCLK
Single Port
266280
ESRAM8
28
HCLK
Single Port
266280
There are several memory testing algorithms stored in the PBIST ROM. However, TI recommends the March13N algorithm for
application testing.
The PBIST ROM clock frequency is limited to 90MHz, if 90MHz < HCLK NMI => nERROR
2.6
B0 TCM (even) address bus parity error
User/Privilege
ESM => NMI => nERROR
2.10
B1 TCM (odd) ECC single error (correctable)
User/Privilege
ESM
1.28
B1 TCM (odd) ECC double error (non-correctable)
User/Privilege
Abort (CPU), ESM =>
nERROR
3.5
B1 TCM (odd) uncorrectable error (i.e. redundant address
decode)
User/Privilege
ESM => NMI => nERROR
2.8
B1 TCM (odd) address bus parity error
User/Privilege
ESM => NMI => nERROR
2.12
Illegal instruction
MPU access violation
SRAM
B0 TCM (even) ECC single error (correctable)
FLASH
FMC correctable error - Bus1 and Bus2 interfaces (does not
include accesses to EEPROM bank)
User/Privilege
ESM
1.6
FMC uncorrectable error - Bus1 accesses
(does not include address parity error)
User/Privilege
Abort (CPU), ESM =>
nERROR
3.7
FMC uncorrectable error - Bus2 accesses
(does not include address parity error and EEPROM bank
accesses)
User/Privilege
ESM => nERROR
3.7
FMC uncorrectable error - address parity error on Bus1
accesses
User/Privilege
ESM => NMI => nERROR
2.4
FMC correctable error - Accesses to EEPROM bank
User/Privilege
ESM
1.35
User/Privilege
ESM
1.36
FMC uncorrectable error - Accesses to EEPROM bank
DMA TRANSACTIONS
External imprecise error on read (Illegal transaction with ok
response)
User/Privilege
ESM
1.5
External imprecise error on write (Illegal transaction with ok
response)
User/Privilege
ESM
1.13
Memory access permission violation
User/Privilege
ESM
1.2
User/Privilege
ESM
1.3
Memory parity error
DMM TRANSACTIONS
External imprecise error on read (Illegal transaction with ok
response)
User/Privilege
ESM
1.5
External imprecise error on write (Illegal transaction with ok
response)
User/Privilege
ESM
1.13
HTU1
NCNB (Strongly Ordered) transaction with slave error response
User/Privilege
Interrupt => VIM
n/a
External imprecise error (Illegal transaction with ok response)
User/Privilege
Interrupt => VIM
n/a
Memory access permission violation
User/Privilege
ESM
1.9
(1)
100
The Undefined Instruction TRAP is NOT detectable outside the CPU. The trap is taken only if the instruction reaches the execute stage
of the CPU.
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Table 4-36. Reset/Abort/Error Sources (continued)
ERROR SOURCE
Memory parity error
SYSTEM MODE
ERROR RESPONSE
ESM HOOKUP
group.channel
User/Privilege
ESM
1.8
HTU2
NCNB (Strongly Ordered) transaction with slave error response
User/Privilege
Interrupt => VIM
n/a
External imprecise error (Illegal transaction with ok response)
User/Privilege
Interrupt => VIM
n/a
Memory access permission violation
User/Privilege
ESM
1.9
Memory parity error
User/Privilege
ESM
1.8
ESM
1.7
ESM
1.7
ESM
1.12
n/a
N2HET1
Memory parity error
User/Privilege
N2HET2
Memory parity error
User/Privilege
FLEXRAY
Memory parity error
User/Privilege
FTU
NCNB (Strongly Ordered) transaction with slave error response
User/Privilege
Interrupt => VIM
External imprecise error (Illegal transaction with ok response)
User/Privilege
Interrupt => VIM
n/a
Memory access permission violation
User/Privilege
ESM
1.16
User/Privilege
ESM
1.14
Memory parity error
MIBSPI
MibSPI1 memory parity error
User/Privilege
ESM
1.17
MibSPI3 memory parity error
User/Privilege
ESM
1.18
User/Privilege
ESM
1.24
User/Privilege
ESM
1.19
User/Privilege
ESM
1.1
MibSPI5 memory parity error
MIBADC
MibADC1 Memory parity error
MibADC2 Memory parity error
DCAN
DCAN1 memory parity error
User/Privilege
ESM
1.21
DCAN2 memory parity error
User/Privilege
ESM
1.23
DCAN3 memory parity error
User/Privilege
ESM
1.22
User/Privilege
ESM
1.10
User/Privilege
ESM
1.42
ESM
1.11
PLL
PLL slip error
PLL #2 slip error
CLOCK MONITOR
Clock monitor interrupt
User/Privilege
DCC
DCC1 error
User/Privilege
ESM
1.30
DCC2 error
User/Privilege
ESM
1.62
CCM-R4
Self test failure
User/Privilege
ESM
1.31
Compare failure
User/Privilege
ESM => NMI => nERROR
2.2
ESM
1.15
Reset
n/a
ESM
1.27
ESM
1.37
VIM
Memory parity error
User/Privilege
VOLTAGE MONITOR
VMON out of voltage range
n/a
CPU SELFTEST (LBIST)
CPU Selftest (LBIST) error
User/Privilege
PIN MULTIPLEXING CONTROL
Mux configuration error
User/Privilege
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Table 4-36. Reset/Abort/Error Sources (continued)
ERROR SOURCE
SYSTEM MODE
ERROR RESPONSE
ESM HOOKUP
group.channel
POWER DOMAIN CONTROL
PSCON compare error
User/Privilege
ESM
1.38
PSCON self-test error
User/Privilege
ESM
1.39
eFuse Controller
eFuse Controller Autoload error
User/Privilege
ESM => nERROR
3.1
eFuse Controller - Any bit set in the error status register
User/Privilege
ESM
1.40
User/Privilege
ESM
1.41
ESM => NMI => nERROR
2.24
eFuse Controller self-test error
WINDOWED WATCHDOG
WWD Non-Maskable Interrupt exception
n/a
ERRORS REFLECTED IN THE SYSESR REGISTER
Power-Up Reset
n/a
Reset
n/a
Oscillator fail / PLL slip (2)
n/a
Reset
n/a
Watchdog exception
n/a
Reset
n/a
CPU Reset (driven by the CPU STC)
n/a
Reset
n/a
Software Reset
n/a
Reset
n/a
External Reset
n/a
Reset
n/a
(2)
Oscillator fail/PLL slip can be configured in the system register (SYS.PLLCTL1) to generate a reset.
4.20 Digital Windowed Watchdog
This device includes a digital windowed watchdog (DWWD) module that protects against runaway code
execution.
The DWWD module allows the application to configure the time window within which the DWWD module
expects the application to service the watchdog. A watchdog violation occurs if the application services the
watchdog outside of this window, or fails to service the watchdog at all. The application can choose to
generate a system reset or a non-maskable interrupt to the CPU in case of a watchdog violation.
The watchdog is disabled by default and must be enabled by the application. Once enabled, the watchdog
can only be disabled upon a system reset.
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4.21 Debug Subsystem
4.21.1 Block Diagram
The device contains an ICEPICK module to allow JTAG access to the scan chains.
Boundary Scan I/F
TRST
TMS
TCK
RTCK
TDI
TDO
Boundary Scan
BSR/BSDL
Debug
ROM1
Debug APB
Secondary Tap 0
DAP
APB Mux
AHB-AP
POM
ICEPICK_C
to SCR1 via A2A
APB slave
Cortex
R4F
from
PCR1/Bridge
ETM
TPIU
RTP
TAP 0
Secondary Tap 1
DMM
TAP 1
Secondary Tap 2
AJSM
Figure 4-19. Debug Subsystem Block Diagram
NOTE
The ETM, RTP and DMM exist in silcon, but are not supported in the PGE package.
4.21.2 Debug Components Memory Map
Table 4-37. Debug Components Memory Map
MODULE NAME
FRAME CHIP
SELECT
CoreSight Debug
ROM
FRAME ADDRESS RANGE
FRAME ACTUA
SIZE
L SIZE
RESPNSE FOR ACCESS TO
UNIMPLEMENTED LOCATIONS IN
FRAME
START
END
CSCS0
0xFFA0_0000
0xFFA0_0FFF
4KB
4KB
Reads: 0, writes: no effect
Cortex-R4F
Debug
CSCS1
0xFFA0_1000
0xFFA0_1FFF
4KB
4KB
Reads: 0, writes: no effect
ETM-R4
CSCS2
0xFFA0_2000
0xFFA0_2FFF
4KB
4KB
Reads: 0, writes: no effect
CoreSight TPIU
CSCS3
0xFFA0_3000
0xFFA0_3FFF
4KB
4KB
Reads: 0, writes: no effect
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4.21.3 JTAG Identification Code
The JTAG ID code for this device is the same as the device ICEPick Identification Code.
Table 4-38. JTAG ID Code
Silicon Revision
ID
Rev A
0x0B8A002F
Rev B
0x2B8A002F
Rev C
0x3B8A002F
4.21.4 Debug ROM
The Debug ROM stores the location of the components on the Debug APB bus:
Table 4-39. Debug ROM table
104
ADDRESS
DESCRIPTION
VALUE
0x000
pointer to Cortex-R4F
0x0000 1003
0x001
ETM-R4
0x0000 2003
0x002
TPIU
0x0000 3003
0x003
POM
0x0000 4003
0x004
end of table
0x0000 0000
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4.21.5 JTAG Scan Interface Timings
Table 4-40. JTAG Scan Interface Timing (1)
No.
Parameter
fTCK
fRTCK
(1)
1
td(TCK -RTCK)
2
tsu(TDI/TMS - RTCKr)
3
th(RTCKr -TDI/TMS)
4
th(RTCKr -TDO)
5
td(TCKf -TDO)
Min
TCK frequency (at HCLKmax)
RTCK frequency (at TCKmax and HCLKmax)
MAX
Unit
12
MHz
10
Delay time, TCK to RTCK
MHz
24
ns
Setup time, TDI, TMS before RTCK rise (RTCKr)
26
ns
Hold time, TDI, TMS after RTCKr
0
ns
Hold time, TDO after RTCKf
0
Delay time, TDO valid after RTCK fall (RTCKf)
ns
12
ns
Timings for TDO are specified for a maximum of 50pF load on TDO
TCK
RTCK
1
1
TMS
TDI
2
3
TDO
4
5
Figure 4-20. JTAG Timing
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4.21.6 Advanced JTAG Security Module
This device includes an Advanced JTAG Security Module (AJSM). which provides maximum security to
the device’s memory content by allowing users to secure the device after programming.
Flash Module Output
OTP Contents
(example)
H
L
H
...
...
L
Unlock By Scan
Register
Internal Tie-Offs
(example only)
L
L
H
H
L
H
H
L
H
H
L
L
UNLOCK
128-bit comparator
Internal Tie-Offs
(example only)
H
L
L
H
H
L
L
H
Figure 4-21. AJSM Unlock
The device is unsecure by default by virtue of a 128-bit visible unlock code programmed in the OTP
address 0xF0000000.The OTP contents are XOR-ed with the "Unlock By Scan" register contents. The
outputs of these XOR gates are again combined with a set of secret internal tie-offs. The output of this
combinational logic is compared against a secret hard-wired 128-bit value. A match results in the
UNLOCK signal being asserted, so that the device is now unsecure.
A user can secure the device by changing at least one bit in the visible unlock code from 1 to 0. Changing
a 0 to 1 is not possible since the visible unlock code is stored in the One Time Programmable (OTP) flash
region. Also, changing all the 128 bits to zeros is not a valid condition and will permanently secure the
device.
Once secured, a user can unsecure the device by scanning an appropriate value into the "Unlock By
Scan" register of the AJSM module. The value to be scanned is such that the XOR of the OTP contents
and the Unlock-By-Scan register contents results in the original visible unlock code.
The Unlock-By-Scan register is reset only upon asserting power-on reset (nPORRST).
A secure device only permits JTAG accesses to the AJSM scan chain via the Secondary Tap # 2 of the
ICEPick module. All other secondary taps, test taps and the boundary scan interface are not accessible in
this state.
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4.21.7 Embedded Trace Macrocell (ETM-R4)
The device contains a ETM-R4 module with a 32-bit internal data port. The ETM-R4 module is connected
to a TPIU with a 32-bit data bus; the TPIU provides a 35-bit (32-bit data, 3-bit control) external interface
for trace. The ETM-R4 is CoreSight compliant and follows the ETM v3 specification; for more details see
ARM CoreSight ETM-R4 TRM specification.
4.21.7.1 ETM TRACECLKIN Selection
The ETM clock source can be selected as either VCLK or the external ETMTRACECLKIN pin. The
selection is done by the EXTCTRLOUT[1:0] control bits of the TPIU; the default is '00'. The address of this
register is TPIU base address + 0x404.
Before you begin accessing TPIU registers, TPIU should be unlocked via coresight key and 1 or 2 should
be written to this register.
Table 4-41. TPIU / TRACECLKIN Selection
EXTCTRLOUT[1:0]
TPIU/TRACECLKIN
00
tied-zero
01
VCLK
10
ETMTRACECLKIN
11
tied-zero
4.21.7.2 Timing Specifications
tl(ETM)
th(ETM)
tr(ETM)
tf(ETM)
tcyc(ETM)
Figure 4-22. ETMTRACECLKOUT Timing
Table 4-42. ETMTRACECLK Timing
Parameter
MIN
MAX
Description
tcyc(ETM)
t(HCLK) * 4
Clock period
tl(ETM)
20ns
Low pulse width
th(ETM)
20ns
High pulse width
tr(ETM)
3ns
Clock and data rise time
tf(ETM)
3ns
Clock and data fall time
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Figure 4-23. ETMDATA Timing
Table 4-43. ETMDATA Timing
Parameter
MIN
MAX
Description
td(ETMTRACECLKH-ETMDATAV)
1.5ns
7ns
Delay time from ETM trace clock high to
ETM data valid
td(ETMTRACECLKl-ETMDATAV)
1.5ns
7ns
Delay time from ETM trace clock low to ETM
data valid
NOTE
The ETMTRACECLK and ETMDATA timing is based on a 15pF load and for ambient
temperature lower than 85°C.
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4.21.8 RAM Trace Port (RTP)
The RTP provides the ability to datalog the RAM contents of the TMS570 devices or accesses to
peripherals without program intrusion. It can trace all data write or read accesses to internal RAM. In
addition, it provides the capability to directly transfer data to a FIFO to support a CPU-controlled
transmission of the data. The trace data is transmitted over a dedicated external interface.
4.21.8.1 Features
The RTP offers the following features:
• Two modes of operation - Trace Mode and Direct Data Mode
– Trace Mode
• Non-intrusive data trace on write or read operation
• Visibility of RAM content at any time on external capture hardware
• Trace of peripheral accesses
• 2 configurable trace regions for each RAM module to limit amount of data to be traced
• FIFO to store data and address of data of multiple read/write operations
• Trace of CPU and/or DMA accesses with indication of the master in the transmitted data packet
– Direct Data Mode
• Directly write data with the CPU or trace read operations to a FIFO, without transmitting header
and address information
• Dedicated synchronous interface to transmit data to external devices
• Free-running clock generation or clock stop mode between transmissions
• Up to 100 Mbit per sec/pin transfer rate for transmitting data
• Pins not used in functional mode can be used as GIOs
4.21.8.2 Timing Specifications
tl(RTP)
tr
th(RTP)
tf
tcyc(RTP)
Figure 4-24. RTPCLK Timing
Table 4-44. RTPCLK Timing
Parameter
tcyc(RTP)
MIN
Description
11ns (90MHz)
Clock period, prescaled from HCLK; must not be faster
than HCLK / 2
th(RTP)
((tcyc(RTP))/2) - ((tr+tf)/2)
High pulse width
tl(RTP)
((tcyc(RTP))/2) - ((tr+tf)/2)
Low pulse width
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Figure 4-25. RTPDATA Timing
Table 4-45. RTPDATA Timing
Parameter
MIN
MAX
Description
td(RTPCLKH-RTPSYNCV)
-5ns
4ns
SYNC delay time
td(RTPCLKH-RTPDATAV)
-5ns
4ns
Data delay time
tena(RTP)
tdis(RTP)
1
2
3
4
d1
d2
d3
5
6
7
8
9
10
11
12
13
14
15
16
HCLK
HCLK
RTPCLK
RTPCLK
RTPnENA
RTPENA
RTPSYNC
RTPSYNC
RTPDATA
RTPDATA
d4
d5
d6
d7
d8
Divide by 1
Figure 4-26. RTPnENA timing
Table 4-46. RTPnENA timing
Parameter
MIN
tdis(RTP)
3tc(HCLK) +
tr(RTPSYNC) +
12ns
tena(RTP)
4tc(HCLK) +
tr(RTPSYNC)
110
MAX
Description
time RTPnENA must go high before what would be the next RTPSYNC,
to guarantee delaying the next packet
5tc(HCLK) +
tr(RTPSYNC) +
12ns
time after RTPnENA goes low before a packet that has been halted,
resumes
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4.21.9 Data Modification Module (DMM)
The Data Modification Module (DMM) provides the capability to modify data in the entire 4 GB address
space of the TMS570 devices from an external peripheral, with minimal interruption of the application.
4.21.9.1 Features
The DMM module has the following features:
• Acts as a bus master, thus enabling direct writes to the 4GB address space without CPU intervention
• Writes to memory locations specified in the received packet (leverages packets defined by trace mode
of the RAM trace port (RTP) module
• Writes received data to consecutive addresses, which are specified by the DMM module (leverages
packets defined by direct data mode of RTP module)
• Configurable port width (1, 2, 4, 8, 16 pins)
• Up to 100 Mbit/s pin data rate
• Unused pins configurable as GPIO pins
4.21.9.2 Timing Specifications
tl(DMM)
tr
th(DMM)
tf
tcyc(DMM)
Figure 4-27. DMMCLK Timing
Table 4-47. DMMCLK Timing
Parameter
MIN
tcyc(DMM)
Description
tc(HCLK) * 2
Clock period
th(DMM)
((tcyc(DMM))/2) - ((tr+tf)/2)
High pulse width
tl(DMM)
((tcyc(DMM))/2) - ((tr+tf)/2)
Low pulse width
tssu(DMM)
tsh(DMM)
DMMSYNC
DMMCLK
DMMDATA
tdsu(DMM)
tdh(DMM)
Figure 4-28. DMMDATA Timing
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Table 4-48. DMMDATA Timing
Parameter
MIN
Description
tssu(DMM)
2ns
SYNC active to clk falling edge setup time
tsh(DMM)
3ns
clk falling edge to SYNC deactive hold time
tdsu(DMM)
2ns
DATA to clk falling edge setup time
tdh(DMM)
3ns
clk falling edge to DATA hold time
HCLK
DMMCLK
DMMSYNC
DMMDATA
D00
D01
D10
D11
D20
D21
D30
D31
D40
D41
D50
DMMnENA
Figure 4-29. DMMnENA Timing
Figure 4-29 shows a case with 1 DMM packet per 2 DMMCLK cycles (Mode = Direct Data Mode, data
width = 8, portwidth = 4) where none of the packets received by the DMM are sent out, leading to filling up
of the internal buffers. The DMMnENA signal is shown asserted, after the first two packets have been
received and synchronised to the HCLK domain. Here, the DMM has the capacity to accept packets D4x,
D5x, D6x, D7x. Packet D8 would result in an overflow. Once DMMnENA is asserted, the DMM expects to
stop receiving packets after 4 HCLK cycles; once DMMnENA is de-asserted, the DMM can handle
packets immediately (after 0 HCLK cycles).
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4.21.10 Boundary Scan Chain
The device supports IEEE1149.1-compliant boundary scan for testing pin-to-pin compatibility. The
boundary scan chain is connected to the Boundary Scan Interface of the ICEPICK module.
Device Pins (conceptual)
RTCK
TDI
TDO
IC E P ICK
TRST
TMS
TCK
Boundary Scan Interface
Boundary
Scan
TDI
TDO
BSDL
Figure 4-30. Boundary Scan Implementation (Conceptual Diagram)
Data is serially shifted into all boundary-scan buffers via TDI, and out via TDO.
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5 Peripheral Information and Electrical Specifications
5.1
Peripheral Legend
Table 5-1. Peripheral Legend
5.2
Abbreviation
Full Name
MibADC
Analog To Digital Converter
CCM-R4F
CPU Compare Module - CortexR4F
CRC
Cyclic Redundancy Check
DCAN
Controller Area Network
DCC
Dual Clock Comparator
DMA
Direct Memory Access
DMM
Data Modification Module
EMIF
External Memory Interface
ESM
Error Signaling Module
ETM-R4F
Embedded Trace Macrocell - CortexR4F
FTU
FlexRay Transfer Unit
GPIO
General-Purpose Input/Output
HTU
High End Timer Transfer Unit
I2C
Inter-Integrated Circuit
LIN
Local Interconnect Network
MIBSPI
Multibuffer Serial Peripheral Interface
N2HET
Platform High-End Timer
POM
Parameter Overlay Module
RTI
Real-Time Interrupt Module
RTP
RAM Trace Port
SCI
Serial Communications Interface
SPI
Serial Peripheral Interface
VIM
Vectored Interrupt Manager
Multi-Buffered 12bit Analog-to-Digital Converter
The multibuffered A-to-D converter (MibADC) has a separate power bus for its analog circuitry that
enhances the A-to-D performance by preventing digital switching noise on the logic circuitry which could
be present on VSS and VCC from coupling into the A-to-D analog stage. All A-to-D specifications are given
with respect to ADREFLO unless otherwise noted.
Table 5-2. MibADC Overview
5.2.1
Value
Resolution
12 bits
Monotonic
Assured
Output conversion code
00h to FFFh [00 for VAI ≤ ADREFLO; FFF for VAI ≥ ADREFHI]
Features
•
•
•
•
•
•
114
Description
10-/12-bit resolution
ADREFHI and ADREFLO pins (high and low reference voltages)
Total Sample/Hold/Convert time: 600ns Typical Minimum at 30MHz ADCLK
One memory region per conversion group is available (event, group 1, group 2)
Allocation of channels to conversion groups is completely programmable
Memory regions are serviced either by interrupt or by DMA
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•
•
•
•
•
•
•
•
5.2.2
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Programmable interrupt threshold counter is available for each group
Programmable magnitude threshold interrupt for each group for any one channel
Option to read either 8-bit, 10-bit or 12-bit values from memory regions
Single or continuous conversion modes
Embedded self-test
Embedded calibration logic
Enhanced power-down mode
– Optional feature to automatically power down ADC core when no conversion is in progress
External event pin (ADEVT) programmable as general-purpose I/O
Event Trigger Options
The ADC module supports 3 conversion groups: Event Group, Group1 and Group2. Each of these 3
groups can be configured to be hardware event-triggered. In that case, the application can select from
among 8 event sources to be the trigger for a group's conversions.
5.2.2.1
Default MIBADC1 Event Trigger Hookup
Table 5-3. MIBADC1 Event Trigger Hookup
Event #
Source Select Bits For G1, G2 Or Event
(G1SRC[2:0], G2SRC[2:0] or EVSRC[2:0])
Trigger
1
000
ADEVT
2
001
N2HET1[8]
3
010
N2HET1[10]
4
011
RTI compare 0 interrupt
5
100
N2HET1[12]
6
101
N2HET1[14]
7
110
GIOB[0]
8
111
GIOB[1]
NOTE
For ADEVT, N2HET1 and GIOB trigger sources, the connection to the MibADC1 module
trigger input is made from the output side of the input buffer. This way, a trigger condition
can be generated either by configuring the function as output onto the pad (via the mux
control), or by driving the function from an external trigger source as input. If the mux control
module is used to select different functionality instead of the ADEVT, N2HET1[x] or GIOB[x]
signals, then care must be taken to disable these signals from triggering conversions; there
is no multiplexing on the input connections.
NOTE
For the RTI compare 0 interrupt source, the connection is made directly from the output of
the RTI module. That is, the interrupt condition can be used as a trigger source even if the
actual interrupt is not signaled to the CPU.
5.2.2.2
Alternate MIBADC1 Event Trigger Hookup
Table 5-4. Alternate MIBADC1 Event Trigger Hookup
Event #
Source Select Bits for G1, G2 or Event
(G1SRC[2:0], G2SRC[2:0] or EVSRC[2:0])
Trigger
1
000
ADEVT
2
001
N2HET2[5]
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Table 5-4. Alternate MIBADC1 Event Trigger Hookup (continued)
Event #
Source Select Bits for G1, G2 or Event
(G1SRC[2:0], G2SRC[2:0] or EVSRC[2:0])
Trigger
3
010
N2HET1[27]
4
011
RTI compare 0 interrupt
5
100
N2HET1[17]
6
101
N2HET1[19]
7
110
N2HET1[11]
8
111
N2HET2[13]
The selection between the default MIBADC1 event trigger hook-up versus the alternate event trigger hookup is done by multiplexing control module register 30 bits 0 and 1.
If 30[0] = 1, then the default MibADC1 event trigger hook-up is used.
If 30[0] = 0 and 30[1] = 1, then the alternate MibADC1 event trigger hook-up is used.
NOTE
For ADEVT trigger source, the connection to the MibADC1 module trigger input is made from
the output side of the input buffer. This way, a trigger condition can be generated either by
configuring ADEVT as an output function on to the pad (via the mux control), or by driving
the ADEVT signal from an external trigger source as input. If the mux control module is used
to select different functionality instead of the ADEVT signal, then care must be taken to
disable ADEVT from triggering conversions; there is no multiplexing on the input connection.
NOTE
For N2HETx trigger sources, the connection to the MibADC1 module trigger input is made
from the input side of the output buffer (at the N2HETx module boundary). This way, a
trigger condition can be generated even if the N2HETx signal is not selected to be output on
the pad.
NOTE
For the RTI compare 0 interrupt source, the connection is made directly from the output of
the RTI module. That is, the interrupt condition can be used as a trigger source even if the
actual interrupt is not signaled to the CPU.
5.2.2.3
Default MIBADC2 Event Trigger Hookup
Table 5-5. MIBADC2 Event Trigger Hookup
116
Event #
Source Select Bits for G1, G2 or Event
(G1SRC[2:0], G2SRC[2:0] or EVSRC[2:0])
Trigger
1
000
AD2EVT
2
001
N2HET1[8]
3
010
N2HET1[10]
4
011
RTI compare 0
5
100
N2HET1[12]
6
101
N2HET1[14]
7
110
GIOB[0]
8
111
GIOB[1]
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NOTE
For AD2EVT, N2HET1 and GIOB trigger sources, the connection to the MibADC2 module
trigger input is made from the output side of the input buffer. This way, a trigger condition
can be generated either by configuring the function as output onto the pad (via the mux
control), or by driving the function from an external trigger source as input. If the mux control
module is used to select different functionality instead of the AD2EVT, N2HET1[x] or GIOB[x]
signals, then care must be taken to disable these signals from triggering conversions; there
is no multiplexing on the input connections.
NOTE
For the RTI compare 0 interrupt source, the connection is made directly from the output of
the RTI module. That is, the interrupt condition can be used as a trigger source even if the
actual interrupt is not signaled to the CPU.
5.2.2.4
Alternate MIBADC2 Event Trigger Hookup
Table 5-6. Alternate MIBADC2 Event Trigger Hookup
Event #
Source Select Bits for G1, G2 or Event
(G1SRC[2:0], G2SRC[2:0] or EVSRC[2:0])
Trigger
1
000
AD2EVT
2
001
N2HET2[5]
3
010
N2HET1[27]
4
011
RTI compare 0
5
100
N2HET1[17]
6
101
N2HET1[19]
7
110
N2HET1[11]
8
111
N2HET2[13]
The selection between the default MIBADC2 event trigger hook-up versus the alternate event trigger hookup is done by multiplexing control module register 30 bits 0 and 1.
If 30[0] = 1, then the default MibADC2 event trigger hook-up is used.
If 30[0] = 0 and 30[1] = 1, then the alternate MibADC2 event trigger hook-up is used.
NOTE
For AD2EVT trigger source, the connection to the MibADC2 module trigger input is made
from the output side of the input buffer. This way, a trigger condition can be generated either
by configuring AD2EVT as an output function on to the pad (via the mux control), or by
driving the AD2EVT signal from an external trigger source as input. If the mux control module
is used to select different functionality instead of the AD2EVT signal, then care must be
taken to disable AD2EVT from triggering conversions; there is no multiplexing on the input
connections.
NOTE
For N2HETx trigger sources, the connection to the MibADC2 module trigger input is made
from the input side of the output buffer (at the N2HETx module boundary). This way, a
trigger condition can be generated even if the N2HETx signal is not selected to be output on
the pad.
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NOTE
For the RTI compare 0 interrupt source, the connection is made directly from the output of
the RTI module. That is, the interrupt condition can be used as a trigger source even if the
actual interrupt is not signaled to the CPU.
118
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5.2.3
ZHCS437B – APRIL 2012 – REVISED JULY 2013
ADC Electrical and Timing Specifications
Table 5-7. MibADC Recommended Operating Conditions
Parameter
MIN
MAX
Unit
ADREFHI
A-to-D high-voltage reference source
ADREFLO
VCCAD
V
ADREFLO
A-to-D low-voltage reference source
VSSAD
ADREFHI
V
VAI
Analog input voltage
ADREFLO
ADREFHI
V
IAIC
Analog input clamp current
(VAI < VSSAD – 0.3 or VAI > VCCAD + 0.3)
-2
2
mA
Table 5-8. MibADC Electrical Characteristics Over Full Ranges of Recommended Operating Conditions
Parameter
MAX
Unit
Rmux
Analog input mux onresistance
See Figure 5-1
250
Ω
Rsamp
ADC sample switch onresistance
See Figure 5-1
250
Ω
Cmux
Input mux capacitance
See Figure 5-1
16
pF
Csamp
ADC sample capacitance
See Figure 5-1
13
pF
IAIL
Analog off-state input
leakage current
VCCAD = 3.6V
maximum
IAIL
Description/Conditions
Analog off-state input
leakage current
IAOSB1 (1)
IAOSB2 (1)
IAOSB1 (1)
IAOSB2 (1)
ADC1 Analog on-state input
bias current
ADC2 Analog on-state input
bias current
ADC1 Analog on-state input
bias current
VCCAD = 5.5V
maximum
VCCAD = 3.6V
maximum
VCCAD = 3.6V
maximum
VCCAD = 5.5V
maximum
MIN
Nom
VSSAD ≤ VIN < VSSAD + 100mV
-300
200
nA
VSSAD + 100mV ≤ VIN ≤ VCCAD - 200mV
-200
200
nA
VCCAD - 200mV < VIN ≤ VCCAD
-200
500
nA
VSSAD ≤ VIN < VSSAD + 300mV
-1000
250
nA
VSSAD + 300mV ≤ VIN ≤ VCCAD - 300mV
-250
250
nA
VCCAD - 300mV < VIN ≤ VCCAD
-250
1000
nA
VSSAD ≤ VIN < VSSAD + 100mV
-8
2
µA
VSSAD + 100mV < VIN < VCCAD - 200mV
-4
2
µA
VCCAD - 200mV < VIN < VCCAD
-4
12
µA
VSSAD ≤ VIN < VSSAD + 100mV
-7
2
µA
VSSAD + 100mV ≤ VIN ≤ VCCAD - 200mV
-4
2
µA
VCCAD - 200mV < VIN ≤ VCCAD
-4
10
µA
VSSAD ≤ VIN < VSSAD + 300mV
-10
3
µA
VSSAD + 300mV ≤ VIN ≤ VCCAD - 300mV
-5
3
µA
VCCAD - 300mV < VIN ≤ VCCAD
-5
14
µA
VSSAD ≤ VIN < VSSAD + 300mV
-8
3
µA
VSSAD + 300mV ≤ VIN ≤ VCCAD - 300mV
-5
3
µA
VCCAD - 300mV < VIN ≤ VCCAD
-5
ADC2 Analog on-state input
bias current
VCCAD = 5.5V
maximum
12
µA
IADREFHI
ADREFHI input current
ADREFHI = VCCAD, ADREFLO = VSSAD
3
mA
ICCAD
Static supply current
Normal operating mode
15
mA
ADC core in power down mode
5
µA
(1)
If a shared channel is being converted by both ADC converters at the same time, the on-state leakage is equal to IAOSL1 + IAOSL2
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Rext
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Pin
VS1
Smux
Rmux
Smux
Rmux
IAOSB
Cext
On-State
Bias Current
Rext
Pin
VS2
IAIL
Cext
IAIL
IAIL
Off-State
Leakages
Rext
Pin
Smux
Rmux
Ssamp
Rsamp
VS24
IAIL
Csamp
Cmux
Cext
IAIL
IAIL
Figure 5-1. MibADC Input Equivalent Circuit
Table 5-9. MibADC Timing Specifications
Parameter
tc(ADCLK) (1)
td(SH)
(2)
MIN
Cycle time, MibADC clock
Delay time, sample and hold
time
NOM
MAX
Unit
0.033
µs
0.2
µs
1
µs
td(PU-ADV)
Delay time from ADC power on
until first input can be sampled
td(c)
Delay time, conversion time
0.4
µs
td(SHC) (3)
Delay time, total sample/hold
and conversion time
0.6
µs
td(c)
Delay time, conversion time
0.33
µs
td(SHC) (3)
Delay time, total sample/hold
and conversion time
0.53
µs
12-bit mode
10-bit mode
(1)
(2)
(3)
120
The MibADC clock is the ADCLK, generated by dividing down the VCLK by a prescale factor defined by the ADCLOCKCR register bits
4:0.
The sample and hold time for the ADC conversions is defined by the ADCLK frequency and the ADSAMP register for each
conversion group. The sample time needs to be determined by accounting for the external impedance connected to the input channel as
well as the ADC’s internal impedance.
This is the minimum sample/hold and conversion time that can be achieved. These parameters are dependent on many factors, e.g the
prescale settings.
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Table 5-10. MibADC Operating Characteristics Over Full Ranges of Recommended Operating Conditions
Parameter
Description/Conditions
CR
Conversion range over ADREFHI - ADREFLO
which specified
accuracy is
maintained
ZSET
Zero Scale Offset
FSET
EDNL
EINL
Differential
nonlinearity error
Integral nonlinearity
error
ETOT
(1)
(2)
Full Scale Offset
Total unadjusted error
MIN
3
Nom
MAX
Unit
5.5
V
Difference between the first ideal transition
(from code 000h to 001h) and the actual
transition
10-bit
mode
1
LSB (1)
12-bit
mode
2
LSB (2)
Difference between the range of the
measured code transitions (from first to last)
and the range of the ideal code transitions
10-bit
mode
2
LSB
12-bit
mode
3
LSB
Difference between the actual step width and
the ideal value. (See Figure 76)
10-bit
mode
± 1.5
LSB
12-bit
mode
±2
LSB
Maximum deviation from the best straight line 10-bit
through the MibADC. MibADC transfer
mode
characteristics, excluding the quantization
12-bit
error.
mode
±2
LSB
±2
LSB
Maximum value of the difference between an
analog value and the ideal midstep value.
10-bit
mode
±2
LSB
12-bit
mode
±4
LSB
1 LSB = (ADREFHI – ADREFLO)/ 210 for 10-bit mode
1 LSB = (ADREFHI – ADREFLO)/ 212 for 12-bit mode
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Performance (Accuracy) Specifications
5.2.4.1
MibADC Nonlinearity Errors
The differential nonlinearity error shown in Figure Figure 5-2 (sometimes referred to as differential
linearity) is the difference between an actual step width and the ideal value of 1 LSB.
0 ... 110
Digital Output Code
0 ... 101
0 ... 100
0 ... 011
Differential Linearity
Error (–½ LSB)
1 LSB
0 ... 010
Differential Linearity
Error (–½ LSB)
0 ... 001
1 LSB
0 ... 000
0
1
3
4
2
Analog Input Value (LSB)
5
12
NOTE A: 1 LSB = (ADREFHI – ADREFLO)/2
Figure 5-2. Differential Nonlinearity (DNL) Error
122
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The integral nonlinearity error shown in Figure Figure 5-3 (sometimes referred to as linearity error) is the
deviation of the values on the actual transfer function from a straight line.
0 ... 111
0 ... 110
Ideal
Transition
Digital Output Code
0 ... 101
Actual
Transition
0 ... 100
At Transition
011/100
(–½ LSB)
0 ... 011
0 ... 010
End-Point Lin. Error
0 ... 001
At Transition
001/010 (–1/4 LSB)
0 ... 000
0
1
2
3
4
5
6
7
Analog Input Value (LSB)
12
NOTE A: 1 LSB = (ADREFHI – ADREFLO)/2
Figure 5-3. Integral Nonlinearity (INL) Error
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MibADC Total Error
The absolute accuracy or total error of an MibADC as shown in Figure Figure 5-4 is the maximum value of
the difference between an analog value and the ideal midstep value.
0 ... 111
0 ... 110
Digital Output Code
0 ... 101
0 ... 100
Total Error
At Step 0 ... 101
(–1 1/4 LSB)
0 ... 011
0 ... 010
Total Error
At Step
0 ... 001 (1/2 LSB)
0 ... 001
0 ... 000
0
1
2
3
4
5
6
7
Analog Input Value (LSB)
12
NOTE A: 1 LSB = (ADREFHI – ADREFLO)/2
Figure 5-4. Absolute Accuracy (Total) Error
124
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5.3
ZHCS437B – APRIL 2012 – REVISED JULY 2013
General-Purpose Input/Output
The GPIO module on this device supports two ports, GIOA and GIOB. The I/O pins are bidirectional and
bit-programmable. Both GIOA and GIOB support external interrupt capability.
5.3.1
Features
The GPIO module has the following features:
• Each IO pin can be configured as:
– Input
– Output
– Open Drain
• The interrupts have the following characteristics:
– Programmable interrupt detection either on both edges or on a single edge (set in GIOINTDET)
– Programmable edge-detection polarity, either rising or falling edge (set in GIOPOL register)
– Individual interrupt flags (set in GIOFLG register)
– Individual interrupt enables, set and cleared through GIOENASET and GIOENACLR registers
respectively
– Programmable interrupt priority, set through GIOLVLSET and GIOLVLCLR registers
• Internal pullup/pulldown allows unused I/O pins to be left unconnected
For information on input and output timings see Section 3.8 and Section 3.9
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Enhanced High-End Timer (N2HET)
The N2HET is an advanced intelligent timer that provides sophisticated timing functions for real-time
applications. The timer is software-controlled, using a reduced instruction set, with a specialized timer
micromachine and an attached I/O port. The N2HET can be used for pulse width modulated outputs,
capture or compare inputs, or general-purpose I/O.. It is especially well suited for applications requiring
multiple sensor information and drive actuators with complex and accurate time pulses.
5.4.1
Features
The N2HET module has the following features:
• Programmable timer for input and output timing functions
• Reduced instruction set (30 instructions) for dedicated time and angle functions
• 160 words of instruction RAM protected by parity
• User defined number of 25-bit virtual counters for timer, event counters and angle counters
• 7-bit hardware counters for some pins allow up to 32-bit resolution in conjunction with the 25-bit virtual
counters
• Up to 32 pins usable for input signal measurements or output signal generation
• Programmable suppression filter for each input pin with adjustable limiting frequency
• Low CPU overhead and interrupt load
• Efficient data transfer to or from the CPU memory with dedicated High-End-Timer Transfer Unit (HTU)
or DMA
• Diagnostic capabilities with different loopback mechanisms and pin status readback functionality
5.4.2
N2HET RAM Organization
The timer RAM uses 4 RAM banks, where each bank has two port access capability. This means that one
RAM address may be written while another address is read. The RAM words are 96-bits wide, which are
split into three 32-bit fields (program, control, and data).
5.4.3
Input Timing Specifications
The N2HET instructions PCNT and WCAP impose some timing constraints on the input signals.
1
N2HETx
3
4
2
Figure 5-5. N2HET Input Capture Timings
126
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Table 5-11. Input Timing Requirements for the N2HET Input Capture Functionality
MIN (1)
PARAMETER
(2)
MAX (1)
25
(2)
UNIT
1
Input signal period, PCNT or WCAP for rising edge
to rising edge
2 (hr) (lr) tc(VCLK2) + 2
2
(hr) (lr) tc(VCLK2) - 2
ns
2
Input signal period, PCNT or WCAP for falling edge
to falling edge
2 (hr) (lr) tc(VCLK2) + 2
225 (hr) (lr) tc(VCLK2) - 2
ns
3
Input signal high phase, PCNT or WCAP for rising
edge to falling edge
(hr) (lr) tc(VCLK2) + 2
225 (hr) (lr) tc(VCLK2) - 2
ns
4
Input signal low phase, PCNT or WCAP for falling
edge to rising edge
(hr) (lr) tc(VCLK2) + 2
225 (hr) (lr) tc(VCLK2) - 2
ns
(1)
(2)
hr = High-resolution prescaler, configured using the HRPFC field of the Prescale Factor Register (HETPFR).
lr = Loop-resolution prescaler, configured using the LFPRC field of the Prescale Factor Register (HETPFR)
Both N2HET1 and N2HET2 have channels that are enhanced to be able to capture inputs with smaller
pulse widths than that specified in Table 5-11. See Table 5-13 for a list of which pins support small pulse
capture.
The input capture capability for these channels is specified in the following table.
Table 5-12. Input Timing Requirements for N2HET Channels with Enhanced Pulse Capture
PARAMETER
MIN
MAX
UNIT
1
Input signal period, PCNT or WCAP for rising edge
to rising edge
(hr) (lr) tc(VCLK2) + 2
225 (hr) (lr) tc(VCLK2) - 2
ns
2
Input signal period, PCNT or WCAP for falling edge
to falling edge
(hr) (lr) tc(VCLK2) + 2
225 (hr) (lr) tc(VCLK2) - 2
ns
3
Input signal high phase, PCNT or WCAP for rising
edge to falling edge
2 (hr) tc(VCLK2) + 2
225 (hr) (lr) tc(VCLK2) - 2
ns
4
Input signal low phase, PCNT or WCAP for falling
edge to rising edge
2 (hr) tc(VCLK2) + 2
225 (hr) (lr) tc(VCLK2) - 2
ns
Table 5-13. Input Capture Pin Capability
Channel
Supports 32-bit Capture
Enhanced Pulse Capture
N2HET1[00]
Yes
No
N2HET1[01]
Yes
No
N2HET1[02]
Yes
No
N2HET1[03]
Yes
No
N2HET1[04]
Yes
No
N2HET1[05]
Yes
No
N2HET1[06]
Yes
No
N2HET1[07]
Yes
No
N2HET1[08]
Yes
No
N2HET1[09]
Yes
No
N2HET1[10]
Yes
No
N2HET1[11]
Yes
No
N2HET1[12]
Yes
No
N2HET1[13]
Yes
No
N2HET1[14]
Yes
No
N2HET1[15]
Yes
Yes
N2HET1[16]
Yes
No
N2HET1[17]
Yes
No
N2HET1[18]
Yes
No
N2HET1[19]
Yes
No
N2HET1[20]
Yes
Yes
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Table 5-13. Input Capture Pin Capability (continued)
5.4.4
Channel
Supports 32-bit Capture
Enhanced Pulse Capture
N2HET1[21]
Yes
No
N2HET1[22]
Yes
No
N2HET1[23]
Yes
No
N2HET1[24]
Yes
No
N2HET1[25]
Yes
No
N2HET1[26]
Yes
No
N2HET1[27]
Yes
No
N2HET1[28]
Yes
No
N2HET1[29]
Yes
No
N2HET1[30]
Yes
No
N2HET1[31]
Yes
Yes
N2HET2[00]
Yes
No
N2HET2[01]
No
No
N2HET2[02]
No
No
N2HET2[03]
No
No
N2HET2[04]
Yes
No
N2HET2[05]
No
No
N2HET2[06]
Yes
No
N2HET2[07]
No
No
N2HET2[08]
No
No
N2HET2[09]
No
No
N2HET2[10]
No
No
N2HET2[11]
No
No
N2HET2[12]
Yes
Yes
N2HET2[13]
No
No
N2HET2[14]
Yes
Yes
N2HET2[15]
No
No
N2HET2[16]
Yes
Yes
N2HET2[18]
No
No
N2HET1-N2HET2 Interconnections
In some applications the N2HET resolutions must be synchronized. Some other applications require a
single time base to be used for all PWM outputs and input timing captures.
The N2HET provides such a synchronization mechanism. The Clk_master/slave (HETGCR.16) configures
the N2HET in master or slave mode (default is slave mode). A N2HET in master mode provides a signal
to synchronize the prescalers of the slave N2HET. The slave N2HET synchronizes its loop resolution to
the loop resolution signal sent by the master. The slave does not require this signal after it receives the
first synchronization signal. However, anytime the slave receives the re-synchronization signal from the
master, the slave must synchronize itself again..
N2HET1
EXT_LOOP_SYNC
NHET_LOOP_SYNC
N2HET2
NHET_LOOP_SYNC
EXT_LOOP_SYNC
Figure 5-6. N2HET1 – N2HET2 Synchronization Hookup
128
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5.4.5
ZHCS437B – APRIL 2012 – REVISED JULY 2013
N2HET Checking
5.4.5.1
Internal Monitoring
To assure correctness of the high-end timer operation and output signals, the two N2HET modules can be
used to monitor each other’s signals as shown in Figure 5-7. The direction of the monitoring is controlled
by the I/O multiplexing control module.
IOMM mux control signal x
N2HET1[1,3,5,7,9,11]
N2HET1[1,3,5,7,9,11] / N2HET2[8,10,12,14,16,18]
N2HET1
N2HET2[8,10,12,14,16,18]
N2HET2
Figure 5-7. N2HET Monitoring
5.4.5.2
Output Monitoring using Dual Clock Comparator (DCC)
N2HET1[31] is connected as a clock source for counter 1 in DCC1. This allows the application to measure
the frequency of the pulse-width modulated (PWM) signal on N2HET1[31].
Similarly, N2HET2[0] is connected as a clock source for counter 1 in DCC2. This allows the application to
measure the frequency of the pulse-width modulated (PWM) signal on N2HET2[0].
Both N2HET1[31] and N2HET2[0] can be configured to be internal-only channels. That is, the connection
to the DCC module is made directly from the output of the N2HETx module (from the input of the output
buffer).
For more information on DCC see Section 4.7.3.
5.4.6
Disabling N2HET Outputs
Some applications require the N2HET outputs to be disabled under some fault condition. The N2HET
module provides this capability via the "Pin Disable" input signal. This signal, when driven low, causes the
N2HET outputs identified by a programmable register (HETPINDIS) to be tri-stated. Please refer to the
device specific technical reference manual for more details on the "N2HET Pin Disable" feature.
GIOA[5] is connected to the "Pin Disable" input for N2HET1, and GIOB[2] is connected to the "Pin
Disable" input for N2HET2.
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High-End Timer Transfer Unit (HTU)
A High End Timer Transfer Unit (HTU) can perform DMA type transactions to transfer N2HET data to or
from main memory. A Memory Protection Unit (MPU) is built into the HTU.
5.4.7.1
•
•
•
•
•
•
•
•
•
5.4.7.2
Features
CPU and DMA independent
Master Port to access system memory
8 control packets supporting dual buffer configuration
Control packet information is stored in RAM protected by parity
Event synchronization (HET transfer requests)
Supports 32 or 64 bit transactions
Addressing modes for HET address (8 byte or 16 byte) and system memory address (fixed, 32 bit or
64bit)
One shot, circular and auto switch buffer transfer modes
Request lost detection
Trigger Connections
Table 5-14. HTU1 Request Line Connection
Modules
Request Source
HTU1 Request
N2HET1
HTUREQ[0]
HTU1 DCP[0]
N2HET1
HTUREQ[1]
HTU1 DCP[1]
N2HET1
HTUREQ[2]
HTU1 DCP[2]
N2HET1
HTUREQ[3]
HTU1 DCP[3]
N2HET1
HTUREQ[4]
HTU1 DCP[4]
N2HET1
HTUREQ[5]
HTU1 DCP[5]
N2HET1
HTUREQ[6]
HTU1 DCP[6]
N2HET1
HTUREQ[7]
HTU1 DCP[7]
Table 5-15. HTU2 Request Line Connection
130
Modules
Request Source
HTU2 Request
N2HET2
HTUREQ[0]
HTU2 DCP[0]
N2HET2
HTUREQ[1]
HTU2 DCP[1]
N2HET2
HTUREQ[2]
HTU2 DCP[2]
N2HET2
HTUREQ[3]
HTU2 DCP[3]
N2HET2
HTUREQ[4]
HTU2 DCP[4]
N2HET2
HTUREQ[5]
HTU2 DCP[5]
N2HET2
HTUREQ[6]
HTU2 DCP[6]
N2HET2
HTUREQ[7]
HTU2 DCP[7]
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5.5
ZHCS437B – APRIL 2012 – REVISED JULY 2013
FlexRay Interface
The FlexRay module performs communication according to the FlexRay protocol specification v2.1. The
sample clock bitrate can be programmed to values up to 10 MBit per second. Additional bus driver (BD)
hardware is required for connection to the physical layer.
For communication on a FlexRay network, individual message buffers with up to 254 data bytes are
configurable. The message storage consists of a single-ported message RAM that holds up to 128
message buffers. All functions concerning the handling of messages are implemented in the message
handler. Those functions are the acceptance filtering, the transfer of messages between the two FlexRay
Channel Protocol Controllers and the message RAM, maintaining the transmission schedule as well as
providing message status information.
The register set of the FlexRay module can be accessed directly by the CPU via the VBUS interface.
These registers are used to control, configure and monitor the FlexRay channel protocol controllers,
message handler, global time unit, system universal control, frame/symbol processing, network
management, interrupt control, and to access the message RAM via the input / output buffer.
5.5.1
Features
The FlexRay module has the following features:
• Conformance with FlexRay protocol specification v2.1
• Data rates of up to 10 Mbit/s on each channel
• Up to 128 message buffers
• 8 Kbyte of message RAM for storage of e.g. 128 message buffers with max. 48 byte data section or up
to 30 message buffers with 254 byte data section
• Configuration of message buffers with different payload lengths
• One configurable receive FIFO
• Each message buffer can be configured as receive buffer, as transmit buffer or as part of the receive
FIFO
• CPU access to message buffers via input and output buffer
• FlexRay Transfer Unit (FTU) for automatic data transfer between data memory and message buffers
without CPU interaction
• Filtering for slot counter, cycle counter, and channel ID
• Maskable module interrupts
• Supports Network Management
5.5.2
Electrical and Timing Specifications
Table 5-16. Timing Requirements for FlexRay Inputs
Parameter
tpw
(1)
MIN
Input minimum pulse width to meet the FlexRay sampling
requirement
tc(AVCLK2) + 2.5 (1)
MAX
UNIT
ns
tRxAsymDelay parameter
t pw
Input
0.6*V CCIO
0.6*V CCIO
0.4*V CCIO
VCCIO
0.4*VCCIO
0
Figure 5-8. FlexRay Inputs
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Table 5-17. FlexRay Jitter Timing
MIN
MAX
Unit
tTx1bit
Clock jitter and signal symmetry
Parameter
98
102
ns
tTx10bit
FlexRay BSS (byte start sequence) to BSS
999
1001
ns
tTx10bitAvg
Average over 10000 samples
999.5
1000.5
ns
tRxAsymDelay
Delay difference between rise and fall from Rx pin to sample
point in FlexRay core
–
2.5
ns
tjit(SCLK)
Jitter for the 80MHz Sample Clock generated by the PLL
–
0.5
ns
5.5.3
FlexRay Transfer Unit
The FlexRay Transfer Unit is able to transfer data between the input buffer (IBF) and output buffer (OBF)
of the communication controller and the system memory without CPU interaction.
Because the FlexRay module is accessed through the FTU, the FTU must be powered up by the setting
bit 23 in the Peripheral Power Down Registers of the System Module before accessing any FlexRay
module register.
For more information on the FTU see the TMS570LS31X/TMS570LS21X Technical Reference Manual
(SPNU499).
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5.6
ZHCS437B – APRIL 2012 – REVISED JULY 2013
Controller Area Network (DCAN)
The DCAN supports the CAN 2.0B protocol standard and uses a serial, multimaster communication
protocol that efficiently supports distributed real-time control with robust communication rates of up to 1
megabit per second (Mbps). The DCAN is ideal for applications operating in noisy and harsh
environments (e.g., automotive and industrial fields) that require reliable serial communication or
multiplexed wiring.
5.6.1
Features
Features of the DCAN module include:
• Supports CAN protocol version 2.0 part A, B
• Bit rates up to 1 MBit/s
• The CAN kernel can be clocked by the oscillator for baud-rate generation.
• 64 mailboxes on each DCAN
• Individual identifier mask for each message object
• Programmable FIFO mode for message objects
• Programmable loop-back modes for self-test operation
• Automatic bus on after Bus-Off state by a programmable 32-bit timer
• Message RAM protected by parity
• Direct access to Message RAM during test mode
• CAN Rx / Tx pins configurable as general purpose IO pins
• Message RAM Auto Initialization
• DMA support
For more information on the DCAN see the TMS570LS31X/21X Technical Reference Manual (SPNU499).
5.6.2
Electrical and Timing Specifications
Table 5-18. Dynamic Characteristics for the DCANx TX and RX pins
MAX
Unit
td(CANnTX)
Delay time, transmit shift register to CANnTX pin (1)
Parameter
15
ns
td(CANnRX)
Delay time, CANnRX pin to receive shift register
5
ns
(1)
MIN
These values do not include rise/fall times of the output buffer.
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Local Interconnect Network Interface (LIN)
The SCI/LIN module can be programmed to work either as an SCI or as a LIN. The core of the module is
an SCI. The SCI’s hardware features are augmented to achieve LIN compatibility.
The SCI module is a universal asynchronous receiver-transmitter that implements the standard nonreturn
to zero format. The SCI can be used to communicate, for example, through an RS-232 port or over a Kline.
The LIN standard is based on the SCI (UART) serial data link format. The communication concept is
single-master/multiple-slave with a message identification for multi-cast transmission between any network
nodes.
5.7.1
LIN Features
The following are features of the LIN module:
• Compatible to LIN 1.3, 2.0 and 2.1 protocols
• Multi-buffered receive and transmit units DMA capability for minimal CPU intervention
• Identification masks for message filtering
• Automatic Master Header Generation
– Programmable Synch Break Field
– Synch Field
– Identifier Field
• Slave Automatic Synchronization
– Synch break detection
– Optional baudrate update
– Synchronization Validation
• 231 programmable transmission rates with 7 fractional bits
• Error detection
• 2 Interrupt lines with priority encoding
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5.8
ZHCS437B – APRIL 2012 – REVISED JULY 2013
Serial Communication Interface (SCI)
5.8.1
Features
•
•
•
•
•
•
•
•
•
•
•
Standard universal asynchronous receiver-transmitter (UART) communication
Supports full- or half-duplex operation
Standard nonreturn to zero (NRZ) format
Double-buffered receive and transmit functions
Configurable frame format of 3 to 13 bits per character based on the following:
– Data word length programmable from one to eight bits
– Additional address bit in address-bit mode
– Parity programmable for zero or one parity bit, odd or even parity
– Stop programmable for one or two stop bits
Asynchronous or isosynchronous communication modes
Two multiprocessor communication formats allow communication between more than two devices.
Sleep mode is available to free CPU resources during multiprocessor communication.
The 24-bit programmable baud rate supports 224 different baud rates provide high accuracy baud rate
selection.
Four error flags and Five status flags provide detailed information regarding SCI events.
Capability to use DMA for transmit and receive data.
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Inter-Integrated Circuit (I2C)
The inter-integrated circuit (I2C) module is a multi-master communication module providing an interface
between the TMS570 microcontroller and devices compliant with Philips Semiconductor I2C-bus
specification version 2.1 and connected by an I2C-bus. This module will support any slave or master I2C
compatible device.
5.9.1
Features
The I2C has the following features:
• Compliance to the Philips I2C bus specification, v2.1 (The I2C Specification, Philips document number
9398 393 40011)
– Bit/Byte format transfer
– 7-bit and 10-bit device addressing modes
– General call
– START byte
– Multi-master transmitter/ slave receiver mode
– Multi-master receiver/ slave transmitter mode
– Combined master transmit/receive and receive/transmit mode
– Transfer rates of 10 kbps up to 400 kbps (Phillips fast-mode rate)
• Free data format
• Two DMA events (transmit and receive)
• DMA event enable/disable capability
• Seven interrupts that can be used by the CPU
• Module enable/disable capability
• The SDA and SCL are optionally configurable as general purpose I/O
• Slew rate control of the outputs
• Open drain control of the outputs
• Programmable pullup/pulldown capability on the inputs
• Supports Ignore NACK mode
NOTE
This I2C module does not support:
• High-speed (HS) mode
• C-bus compatibility mode
• The combined format in 10-bit address mode (the I2C sends the slave address second
byte every time it sends the slave address first byte)
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5.9.2
ZHCS437B – APRIL 2012 – REVISED JULY 2013
I2C I/O Timing Specifications
Table 5-19. I2C Signals (SDA and SCL) Switching Characteristics (1)
Parameter
Standard Mode
Fast Mode
Unit
MIN
MAX
MIN
MAX
75.2
149
75.2
149
ns
0
100
0
400
kHz
tc(I2CCLK)
Cycle time, Internal Module clock for I2C,
prescaled from VCLK
f(SCL)
SCL Clock frequency
tc(SCL)
Cycle time, SCL
10
2.5
µs
tsu(SCLH-SDAL)
Setup time, SCL high before SDA low (for a
repeated START condition)
4.7
0.6
µs
th(SCLL-SDAL)
Hold time, SCL low after SDA low (for a repeated
START condition)
4
0.6
µs
tw(SCLL)
Pulse duration, SCL low
4.7
1.3
µs
tw(SCLH)
Pulse duration, SCL high
4
0.6
µs
tsu(SDA-SCLH)
Setup time, SDA valid before SCL high
th(SDA-SCLL)
Hold time, SDA valid after SCL low (for I2C bus
devices)
tw(SDAH)
Pulse duration, SDA high between STOP and
START conditions
4.7
1.3
µs
tsu(SCLH-SDAH)
Setup time, SCL high before SDA high (for STOP
condition)
4.0
0.6
µs
tw(SP)
Pulse duration, spike (must be suppressed)
Cb (3)
Capacitive load for each bus line
(1)
(2)
(3)
250
100
3.45 (2)
0
ns
0
0.9
0
400
µs
50
ns
400
pF
The I2C pins SDA and SCL do not feature fail-safe I/O buffers. These pins could potentially draw current when the device is powered
down.
The maximum th(SDA-SCLL) for I2C bus devices has only to be met if the device does not stretch the low period (tw(SCLL)) of the SCL
signal.
Cb = The total capacitance of one bus line in pF.
SDA
tw(SDAH)
tsu(SDA-SCLH)
tw(SCLL)
tw(SP)
tsu(SCLH-SDAH)
tw(SCLH)
tr(SCL)
SCL
tc(SCL)
tf(SCL)
th(SCLL-SDAL)
th(SDA-SCLL)
tsu(SCLH-SDAL)
th(SCLL-SDAL)
Stop
Start
Repeated Start
Stop
Figure 5-9. I2C Timings
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NOTE
•
•
•
•
138
A device must internally provide a hold time of at least 300 ns for the SDA signal
(referred to the VIHmin of the SCL signal) to bridge the undefined region of the falling
edge of SCL.
The maximum th(SDA-SCLL) has only to be met if the device does not stretch the LOW
period (tw(SCLL)) of the SCL signal.
A Fast-mode I2C-bus device can be used in a Standard-mode I2C-bus system, but the
requirement tsu(SDA-SCLH) ≥ 250 ns must then be met. This will automatically be the case if
the device does not stretch the LOW period of the SCL signal. If such a device does
stretch the LOW period of the SCL signal, it must output the next data bit to the SDA line
tr max + tsu(SDA-SCLH).
Cb = total capacitance of one bus line in pF. If mixed with fast-mode devices, faster falltimes are allowed.
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5.10 Multi-Buffered / Standard Serial Peripheral Interface
The MibSPI is a high-speed synchronous serial input/output port that allows a serial bit stream of
programmed length (2 to 16 bits) to be shifted in and out of the device at a programmed bit-transfer rate.
Typical applications for the SPI include interfacing to external peripherals, such as I/Os, memories, display
drivers, and analog-to-digital converters.
5.10.1 Features
Both Standard and MibSPI modules have the following features:
• 16-bit shift register
• Receive buffer register
• 5-bit baud clock generator
• SPICLK can be internally-generated (master mode) or received from an external clock source (slave
mode)
• Each word transferred can have a unique format
• SPI I/Os not used in the communication can be used as digital input/output signals
Table 5-20. MibSPI/SPI Configurations
MibSPIx/SPIx
I/Os
MibSPI1
MIBSPI1SIMO[1:0], MIBSPI1SOMI[1:0], MIBSPI1CLK, MIBSPI1nCS[5:0], MIBSPI1nENA
MibSPI3
MIBSPI3SIMO, MIBSPI3SOMI, MIBSPI3CLK, MIBSPI3nCS[5:0], MIBSPI3nENA
MibSPI5
MIBSPI5SIMO[3:0], MIBSPI5SOMI[3:0], MIBSPI5CLK, MIBSPI5nCS[3:0], MIBSPI5nENA
SPI2
SPI2SIMO, SPI2SOMI, SPI2CLK, SPI2nCS[1:0], SPI2nENA
SPI4
SPI4SIMO, SPI4SOMI, SPI4CLK, SPI4nCS[0], SPI4nENA
5.10.2 MibSPI Transmit and Receive RAM Organization
The Multibuffer RAM is comprised of 128 buffers. Each entry in the Multibuffer RAM consists of 4 parts: a
16-bit transmit field, a 16-bit receive field, a 16-bit control field and a 16-bit status field. The Multibuffer
RAM can be partitioned into multiple transfer group with variable number of buffers each.
5.10.3 MibSPI Transmit Trigger Events
Each of the transfer groups can be configured individually. For each of the transfer groups a trigger event
and a trigger source can be chosen. A trigger event can be for example a rising edge or a permanent low
level at a selectable trigger source. For example, up to 15 trigger sources are available which can be
utilized by each transfer group. These trigger options are listed in Table 5-21 for MIBSPI1,
Section 5.10.3.2 for MIBSPI3 and Section 5.10.3.3 for MibSPI5.
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5.10.3.1 MIBSPI1 Event Trigger Hookup
Table 5-21. MIBSPI1 Event Trigger Hookup
Event #
TGxCTRL TRIGSRC[3:0]
Trigger
Disabled
0000
No trigger source
EVENT0
0001
GIOA[0]
EVENT1
0010
GIOA[1]
EVENT2
0011
GIOA[2]
EVENT3
0100
GIOA[3]
EVENT4
0101
GIOA[4]
EVENT5
0110
GIOA[5]
EVENT6
0111
GIOA[6]
EVENT7
1000
GIOA[7]
EVENT8
1001
N2HET1[8]
EVENT9
1010
N2HET1[10]
EVENT10
1011
N2HET1[12]
EVENT11
1100
N2HET1[14]
EVENT12
1101
N2HET1[16]
EVENT13
1110
N2HET1[18]
EVENT14
1111
Internal Tick counter
NOTE
For N2HET1 trigger sources, the connection to the MibSPI1 module trigger input is made
from the input side of the output buffer (at the N2HET1 module boundary). This way, a
trigger condition can be generated even if the N2HET1 signal is not selected to be output on
the pad.
NOTE
For GIOx trigger sources, the connection to the MibSPI1 module trigger input is made from
the output side of the input buffer. This way, a trigger condition can be generated either by
selecting the GIOx pin as an output pin plus selecting the pin to be a GIOx pin, or by driving
the GIOx pin from an external trigger source. If the mux control module is used to select
different functionality instead of the GIOx signal, then care must be taken to disable GIOx
from triggering MibSPI1 transfers; there is no multiplexing on the input connections.
5.10.3.2 MIBSPI3 Event Trigger Hookup
Table 5-22. MIBSPI3 Event Trigger Hookup
140
Event #
TGxCTRL TRIGSRC[3:0]
Trigger
Disabled
0000
No trigger source
EVENT0
0001
GIOA[0]
EVENT1
0010
GIOA[1]
EVENT2
0011
GIOA[2]
EVENT3
0100
GIOA[3]
EVENT4
0101
GIOA[4]
EVENT5
0110
GIOA[5]
EVENT6
0111
GIOA[6]
EVENT7
1000
GIOA[7]
EVENT8
1001
HET[8]
EVENT9
1010
N2HET1[10]
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Table 5-22. MIBSPI3 Event Trigger Hookup (continued)
Event #
TGxCTRL TRIGSRC[3:0]
Trigger
EVENT10
1011
N2HET1[12]
EVENT11
1100
N2HET1[14]
EVENT12
1101
N2HET1[16]
EVENT13
1110
N2HET1[18]
EVENT14
1111
Internal Tick counter
NOTE
For N2HET1 trigger sources, the connection to the MibSPI3 module trigger input is made
from the input side of the output buffer (at the N2HET1 module boundary). This way, a
trigger condition can be generated even if the N2HET1 signal is not selected to be output on
the pad.
NOTE
For GIOx trigger sources, the connection to the MibSPI3 module trigger input is made from
the output side of the input buffer. This way, a trigger condition can be generated either by
selecting the GIOx pin as an output pin plus selecting the pin to be a GIOx pin, or by driving
the GIOx pin from an external trigger source. If the mux control module is used to select
different functionality instead of the GIOx signal, then care must be taken to disable GIOx
from triggering MibSPI3 transfers; there is no multiplexing on the input connections.
5.10.3.3 MIBSPI5 Event Trigger Hookup
Table 5-23. MIBSPI5 Event Trigger Hookup
Event #
TGxCTRL TRIGSRC[3:0]
Trigger
Disabled
0000
No trigger source
EVENT0
0001
GIOA[0]
EVENT1
0010
GIOA[1]
EVENT2
0011
GIOA[2]
EVENT3
0100
GIOA[3]
EVENT4
0101
GIOA[4]
EVENT5
0110
GIOA[5]
EVENT6
0111
GIOA[6]
EVENT7
1000
GIOA[7]
EVENT8
1001
N2HET1[8]
EVENT9
1010
N2HET1[10]
EVENT10
1011
N2HET1[12]
EVENT11
1100
N2HET1[14]
EVENT12
1101
N2HET1[16]
EVENT13
1110
N2HET1[18]
EVENT14
1111
Internal Tick counter
NOTE
For N2HET1 trigger sources, the connection to the MibSPI5 module trigger input is made
from the input side of the output buffer (at the N2HET1 module boundary). This way, a
trigger condition can be generated even if the N2HET1 signal is not selected to be output on
the pad.
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NOTE
For GIOx trigger sources, the connection to the MibSPI5 module trigger input is made from
the output side of the input buffer. This way, a trigger condition can be generated either by
selecting the GIOx pin as an output pin + selecting the pin to be a GIOx pin, or by driving the
GIOx pin from an external trigger source. If the mux control module is used to select different
functionality instead of the GIOx signal, then care must be taken to disable GIOx from
triggering MibSPI5 transfers; there is no multiplexing on the input connections.
142
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5.10.4 MibSPI/SPI Master Mode I/O Timing Specifications
Table 5-24. SPI Master Mode External Timing Parameters (CLOCK PHASE = 0, SPICLK = output, SPISIMO
= output, and SPISOMI = input) (1) (2) (3)
NO.
1
2 (5)
3 (5)
4 (5)
5 (5)
6 (5)
7 (5)
8 (6)
9 (6)
(1)
(2)
(3)
(4)
(5)
(6)
Parameter
MIN
MAX
Unit
40
256tc(VCLK)
ns
Pulse duration, SPICLK high (clock
polarity = 0)
0.5tc(SPC)M – tr(SPC)M – 3
0.5tc(SPC)M + 3
ns
tw(SPCL)M
Pulse duration, SPICLK low (clock
polarity = 1)
0.5tc(SPC)M – tf(SPC)M – 3
0.5tc(SPC)M + 3
tw(SPCL)M
Pulse duration, SPICLK low (clock
polarity = 0)
0.5tc(SPC)M – tf(SPC)M – 3
0.5tc(SPC)M + 3
tw(SPCH)M
Pulse duration, SPICLK high (clock
polarity = 1)
0.5tc(SPC)M – tr(SPC)M – 3
0.5tc(SPC)M + 3
td(SPCH-SIMO)M
Delay time, SPISIMO valid before
SPICLK low (clock polarity = 0)
0.5tc(SPC)M – 6
td(SPCL-SIMO)M
Delay time, SPISIMO valid before
SPICLK high (clock polarity = 1)
0.5tc(SPC)M – 6
tv(SPCL-SIMO)M
Valid time, SPISIMO data valid after
SPICLK low (clock polarity = 0)
0.5tc(SPC)M – tf(SPC) – 4
tv(SPCH-SIMO)M
Valid time, SPISIMO data valid after
SPICLK high (clock polarity = 1)
0.5tc(SPC)M – tr(SPC) – 4
tsu(SOMI-SPCL)M
Setup time, SPISOMI before SPICLK
low (clock polarity = 0)
tf(SPC) + 2.2
tsu(SOMI-SPCH)M Setup time, SPISOMI before SPICLK
high (clock polarity = 1)
tr(SPC) + 2.2
tc(SPC)M
Cycle time, SPICLK (4)
tw(SPCH)M
ns
ns
ns
ns
th(SPCL-SOMI)M
Hold time, SPISOMI data valid after
SPICLK low (clock polarity = 0)
10
th(SPCH-SOMI)M
Hold time, SPISOMI data valid after
SPICLK high (clock polarity = 1)
10
tC2TDELAY
Setup time CS active
until SPICLK high
(clock polarity = 0)
CSHOLD = 0
C2TDELAY*tc(VCLK) + 2*tc(VCLK)
- tf(SPICS) + tr(SPC) – 7
(C2TDELAY+2) * tc(VCLK) tf(SPICS) + tr(SPC) + 5.5
CSHOLD = 1
C2TDELAY*tc(VCLK) + 3*tc(VCLK)
- tf(SPICS) + tr(SPC) – 7
(C2TDELAY+3) * tc(VCLK) tf(SPICS) + tr(SPC) + 5.5
Setup time CS active
until SPICLK low
(clock polarity = 1)
CSHOLD = 0
C2TDELAY*tc(VCLK) + 2*tc(VCLK)
- tf(SPICS) + tf(SPC) – 7
(C2TDELAY+2) * tc(VCLK) tf(SPICS) + tf(SPC) + 5.5
CSHOLD = 1
C2TDELAY*tc(VCLK) + 3*tc(VCLK)
- tf(SPICS) + tf(SPC) – 7
(C2TDELAY+3) * tc(VCLK) tf(SPICS) + tf(SPC) + 5.5
Hold time SPICLK low until CS inactive
(clock polarity = 0)
0.5*tc(SPC)M +
T2CDELAY*tc(VCLK) + tc(VCLK) tf(SPC) + tr(SPICS) - 7
0.5*tc(SPC)M +
T2CDELAY*tc(VCLK) + tc(VCLK) tf(SPC) + tr(SPICS) + 11
ns
Hold time SPICLK high until CS
inactive (clock polarity = 1)
0.5*tc(SPC)M +
T2CDELAY*tc(VCLK) + tc(VCLK) tr(SPC) + tr(SPICS) - 7
0.5*tc(SPC)M +
T2CDELAY*tc(VCLK) + tc(VCLK) tr(SPC) + tr(SPICS) + 11
ns
(C2TDELAY+1) * tc(VCLK) tf(SPICS) – 29
(C2TDELAY+1)*tc(VCLK)
ns
(C2TDELAY+2)*tc(VCLK)
ns
tT2CDELAY
10
tSPIENA
SPIENAn Sample point
11
tSPIENAW
SPIENAn Sample point from write to
buffer
ns
ns
ns
The MASTER bit (SPIGCR1.0) is set and the CLOCK PHASE bit (SPIFMTx.16) is cleared.
tc(VCLK) = interface clock cycle time = 1 / f(VCLK)
For rise and fall timings, see Table 3-5.
When the SPI is in Master mode, the following must be true:
For PS values from 1 to 255: tc(SPC)M ≥ (PS +1)tc(VCLK) ≥ 40ns, where PS is the prescale value set in the SPIFMTx.[15:8] register bits.
For PS values of 0: tc(SPC)M = 2tc(VCLK) ≥ 40ns.
The external load on the SPICLK pin must be less than 60pF.
The active edge of the SPICLK signal referenced is controlled by the CLOCK POLARITY bit (SPIFMTx.17).
C2TDELAY and T2CDELAY is programmed in the SPIDELAY register
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1
SPICLK
(clock polarity = 0)
2
3
SPICLK
(clock polarity = 1)
4
SPISIMO
5
Master Out Data Is Valid
6
7
Master In Data
Must Be Valid
SPISOMI
Figure 5-10. SPI Master Mode External Timing (CLOCK PHASE = 0)
Write to buffer
SPICLK
(clock polarity=0)
SPICLK
(clock polarity=1)
SPISIMO
Master Out Data Is Valid
8
9
SPICSn
10
11
SPIENAn
Figure 5-11. SPI Master Mode Chip Select Timing (CLOCK PHASE = 0)
144
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Table 5-25. SPI Master Mode External Timing Parameters (CLOCK PHASE = 1, SPICLK = output, SPISIMO
= output, and SPISOMI = input) (1) (2) (3)
NO.
Parameter
MIN
MAX
Unit
40
256tc(VCLK)
ns
Pulse duration, SPICLK high (clock
polarity = 0)
0.5tc(SPC)M – tr(SPC)M – 3
0.5tc(SPC)M + 3
ns
tw(SPCL)M
Pulse duration, SPICLK low (clock
polarity = 1)
0.5tc(SPC)M – tf(SPC)M – 3
0.5tc(SPC)M + 3
tw(SPCL)M
Pulse duration, SPICLK low (clock
polarity = 0)
0.5tc(SPC)M – tf(SPC)M – 3
0.5tc(SPC)M + 3
tw(SPCH)M
Pulse duration, SPICLK high (clock
polarity = 1)
0.5tc(SPC)M – tr(SPC)M – 3
0.5tc(SPC)M + 3
tv(SIMO-SPCH)M
Valid time, SPICLK high after
SPISIMO data valid (clock polarity =
0)
0.5tc(SPC)M – 6
tv(SIMO-SPCL)M
Valid time, SPICLK low after
SPISIMO data valid (clock polarity =
1)
0.5tc(SPC)M – 6
tv(SPCH-SIMO)M
Valid time, SPISIMO data valid after
SPICLK high (clock polarity = 0)
0.5tc(SPC)M – tr(SPC) – 4
tv(SPCL-SIMO)M
Valid time, SPISIMO data valid after
SPICLK low (clock polarity = 1)
0.5tc(SPC)M – tf(SPC) – 4
tsu(SOMI-SPCH)M
Setup time, SPISOMI before
SPICLK high (clock polarity = 0)
tr(SPC) + 2.2
tsu(SOMI-SPCL)M
Setup time, SPISOMI before
SPICLK low (clock polarity = 1)
tf(SPC) + 2.2
tv(SPCH-SOMI)M
Valid time, SPISOMI data valid after
SPICLK high (clock polarity = 0)
10
tv(SPCL-SOMI)M
Valid time, SPISOMI data valid after
SPICLK low (clock polarity = 1)
10
tC2TDELAY
Setup time CS
CSHOLD = 0
active until SPICLK
high (clock polarity =
0)
CSHOLD = 1
0.5*tc(SPC)M +
(C2TDELAY+2) * tc(VCLK) tf(SPICS) + tr(SPC) – 7
0.5*tc(SPC)M +
(C2TDELAY+2) * tc(VCLK) tf(SPICS) + tr(SPC) + 5.5
0.5*tc(SPC)M +
(C2TDELAY+3) * tc(VCLK) tf(SPICS) + tr(SPC) – 7
0.5*tc(SPC)M +
(C2TDELAY+3) * tc(VCLK) tf(SPICS) + tr(SPC) + 5.5
Setup time CS
active until SPICLK
low (clock polarity =
1)
CSHOLD = 0
0.5*tc(SPC)M +
(C2TDELAY+2) * tc(VCLK) tf(SPICS) + tf(SPC) – 7
0.5*tc(SPC)M +
(C2TDELAY+2) * tc(VCLK) tf(SPICS) + tf(SPC) + 5.5
CSHOLD = 1
0.5*tc(SPC)M +
(C2TDELAY+3) * tc(VCLK) tf(SPICS) + tf(SPC) – 7
0.5*tc(SPC)M +
(C2TDELAY+3) * tc(VCLK) tf(SPICS) + tf(SPC) + 5.5
Hold time SPICLK low until CS
inactive (clock polarity = 0)
T2CDELAY*tc(VCLK) +
tc(VCLK) - tf(SPC) + tr(SPICS) 7
T2CDELAY*tc(VCLK) +
tc(VCLK) - tf(SPC) + tr(SPICS) +
11
ns
Hold time SPICLK high until CS
inactive (clock polarity = 1)
T2CDELAY*tc(VCLK) +
tc(VCLK) - tr(SPC) + tr(SPICS) 7
T2CDELAY*tc(VCLK) +
tc(VCLK) - tr(SPC) + tr(SPICS) +
11
ns
(C2TDELAY+1)* tc(VCLK) tf(SPICS) – 29
(C2TDELAY+1)*tc(VCLK)
ns
(C2TDELAY+2)*tc(VCLK)
ns
1
tc(SPC)M
Cycle time, SPICLK
(5)
tw(SPCH)M
2
3 (5)
4 (5)
5 (5)
6 (5)
7 (5)
8 (6)
9 (6)
tT2CDELAY
(4)
10
tSPIENA
SPIENAn Sample Point
11
tSPIENAW
SPIENAn Sample point from write to
buffer
(1)
(2)
(3)
(4)
(5)
(6)
ns
ns
ns
ns
ns
ns
ns
The MASTER bit (SPIGCR1.0) is set and the CLOCK PHASE bit (SPIFMTx.16) is set.
tc(VCLK) = interface clock cycle time = 1 / f(VCLK)
For rise and fall timings, see the Table 3-5.
When the SPI is in Master mode, the following must be true:
For PS values from 1 to 255: tc(SPC)M ≥ (PS +1)tc(VCLK) ≥ 40ns, where PS is the prescale value set in the SPIFMTx.[15:8] register bits.
For PS values of 0: tc(SPC)M = 2tc(VCLK) ≥ 40ns.
The external load on the SPICLK pin must be less than 60pF.
The active edge of the SPICLK signal referenced is controlled by the CLOCK POLARITY bit (SPIFMTx.17).
C2TDELAY and T2CDELAY is programmed in the SPIDELAY register
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1
SPICLK
(clock polarity = 0)
2
3
SPICLK
(clock polarity = 1)
5
4
Master Out Data Is Valid
SPISIMO
6
Data Valid
7
Master In Data
Must Be Valid
SPISOMI
Figure 5-12. SPI Master Mode External Timing (CLOCK PHASE = 1)
Write to buffer
SPICLK
(clock polarity=0)
SPICLK
(clock polarity=1)
SPISIMO
Master Out Data Is Valid
8
9
SPICSn
10
11
SPIENAn
Figure 5-13. SPI Master Mode Chip Select Timing (CLOCK PHASE = 1)
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5.10.5 SPI Slave Mode I/O Timings
Table 5-26. SPI Slave Mode External Timing Parameters (CLOCK PHASE = 0, SPICLK = input, SPISIMO =
input, and SPISOMI = output) (1) (2) (3) (4)
NO.
1
2 (6)
3 (6)
4 (6)
5 (6)
6 (6)
7 (6)
8
9
(1)
(2)
(3)
(4)
(5)
(6)
Parameter
MIN
MAX
Unit
tc(SPC)S
Cycle time, SPICLK (5)
40
ns
tw(SPCH)S
Pulse duration, SPICLK high (clock polarity = 0)
14
ns
tw(SPCL)S
Pulse duration, SPICLK low (clock polarity = 1)
14
tw(SPCL)S
Pulse duration, SPICLK low (clock polarity = 0)
14
tw(SPCH)S
Pulse duration, SPICLK high (clock polarity = 1)
14
td(SPCH-SOMI)S
Delay time, SPISOMI valid after SPICLK high (clock
polarity = 0)
trf(SOMI) + 20
td(SPCL-SOMI)S
Delay time, SPISOMI valid after SPICLK low (clock polarity
= 1)
trf(SOMI) + 20
th(SPCH-SOMI)S
Hold time, SPISOMI data valid after SPICLK high (clock
polarity =0)
2
th(SPCL-SOMI)S
Hold time, SPISOMI data valid after SPICLK low (clock
polarity =1)
2
tsu(SIMO-SPCL)S
Setup time, SPISIMO before SPICLK low (clock polarity =
0)
4
tsu(SIMO-SPCH)S
Setup time, SPISIMO before SPICLK high (clock polarity =
1)
4
th(SPCL-SIMO)S
Hold time, SPISIMO data valid after SPICLK low (clock
polarity = 0)
2
th(SPCH-SIMO)S
Hold time, SPISIMO data valid after S PICLK high (clock
polarity = 1)
2
td(SPCL-SENAH)S
Delay time, SPIENAn high after last SPICLK low (clock
polarity = 0)
1.5tc(VCLK)
2.5tc(VCLK)+tr(ENAn)+
22
td(SPCH-SENAH)S
Delay time, SPIENAn high after last SPICLK high (clock
polarity = 1)
1.5tc(VCLK)
2.5tc(VCLK)+ tr(ENAn) +
22
td(SCSL-SENAL)S
Delay time, SPIENAn low after SPICSn low (if new data
has been written to the SPI buffer)
tf(ENAn)
tc(VCLK)+tf(ENAn)+27
ns
ns
ns
ns
ns
ns
ns
The MASTER bit (SPIGCR1.0) is cleared and the CLOCK PHASE bit (SPIFMTx.16) is cleared.
If the SPI is in slave mode, the following must be true: tc(SPC)S ≥ (PS + 1) tc(VCLK), where PS = prescale value set in SPIFMTx.[15:8].
For rise and fall timings, see Table 3-5.
tc(VCLK) = interface clock cycle time = 1 /f(VCLK)
When the SPI is in Slave mode, the following must be true:
For PS values from 1 to 255: tc(SPC)S ≥ (PS +1)tc(VCLK) ≥ 40ns, where PS is the prescale value set in the SPIFMTx.[15:8] register bits.
For PS values of 0: tc(SPC)S = 2tc(VCLK) ≥ 40ns.
The active edge of the SPICLK signal referenced is controlled by the CLOCK POLARITY bit (SPIFMTx.17).
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1
SPICLK
(clock polarity = 0)
2
3
SPICLK
(clock polarity = 1)
5
4
SPISOMI Data Is Valid
SPISOMI
6
7
SPISIMO Data
Must Be Valid
SPISIMO
Figure 5-14. SPI Slave Mode External Timing (CLOCK PHASE = 0)
SPICLK
(clock polarity=0)
SPICLK
(clock polarity=1)
8
SPIENAn
9
SPICSn
Figure 5-15. SPI Slave Mode Enable Timing (CLOCK PHASE = 0)
148
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Table 5-27. SPI Slave Mode External Timing Parameters (CLOCK PHASE = 1, SPICLK = input, SPISIMO =
input, and SPISOMI = output) (1) (2) (3) (4)
NO.
MAX
Unit
Cycle time, SPICLK (5)
40
ns
(6)
tw(SPCH)S
Pulse duration, SPICLK high (clock polarity = 0)
14
ns
tw(SPCL)S
Pulse duration, SPICLK low (clock polarity = 1)
14
tw(SPCL)S
Pulse duration, SPICLK low (clock polarity = 0)
14
tw(SPCH)S
Pulse duration, SPICLK high (clock polarity = 1)
14
td(SOMI-SPCL)S
Dealy time, SPISOMI data valid after SPICLK low
(clock polarity = 0)
trf(SOMI) + 20
td(SOMI-SPCH)S
Delay time, SPISOMI data valid after SPICLK high
(clock polarity = 1)
trf(SOMI) + 20
th(SPCL-SOMI)S
Hold time, SPISOMI data valid after SPICLK high
(clock polarity =0)
2
th(SPCH-SOMI)S
Hold time, SPISOMI data valid after SPICLK low (clock
polarity =1)
2
tsu(SIMO-SPCH)S
Setup time, SPISIMO before SPICLK high (clock
polarity = 0)
4
tsu(SIMO-SPCL)S
Setup time, SPISIMO before SPICLK low (clock polarity
= 1)
4
tv(SPCH-SIMO)S
High time, SPISIMO data valid after SPICLK high
(clock polarity = 0)
2
tv(SPCL-SIMO)S
High time, SPISIMO data valid after SPICLK low (clock
polarity = 1)
2
3 (6)
4 (6)
5 (6)
6 (6)
7 (6)
8
(6)
MIN
tc(SPC)S
2
(1)
(2)
(3)
(4)
(5)
Parameter
1
ns
ns
ns
ns
ns
td(SPCH-SENAH)S Delay time, SPIENAn high after last SPICLK high
(clock polarity = 0)
1.5tc(VCLK)
2.5tc(VCLK)+tr(ENAn) + 22
ns
td(SPCL-SENAH)S
Delay time, SPIENAn high after last SPICLK low (clock
polarity = 1)
1.5tc(VCLK)
2.5tc(VCLK)+tr(ENAn) + 22
9
td(SCSL-SENAL)S
Delay time, SPIENAn low after SPICSn low (if new data
has been written to the SPI buffer)
tf(ENAn)
tc(VCLK)+tf(ENAn)+ 27
ns
10
td(SCSL-SOMI)S
Delay time, SOMI valid after SPICSn low (if new data
has been written to the SPI buffer)
tc(VCLK)
2tc(VCLK)+trf(SOMI)+ 28
ns
The MASTER bit (SPIGCR1.0) is cleared and the CLOCK PHASE bit (SPIFMTx.16) is set.
If the SPI is in slave mode, the following must be true: tc(SPC)S ≤ (PS + 1) tc(VCLK), where PS = prescale value set in SPIFMTx.[15:8].
For rise and fall timings, see Table 3-5.
tc(VCLK) = interface clock cycle time = 1 /f(VCLK)
When the SPI is in Slave mode, the following must be true:
For PS values from 1 to 255: tc(SPC)S ≥ (PS +1)tc(VCLK) ≥ 40ns, where PS is the prescale value set in the SPIFMTx.[15:8] register bits.
For PS values of 0: tc(SPC)S = 2tc(VCLK) ≥ 40ns.
The active edge of the SPICLK signal referenced is controlled by the CLOCK POLARITY bit (SPIFMTx.17).
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1
SPICLK
(clock polarity = 0)
2
3
SPICLK
(clock polarity = 1)
5
4
SPISOMI
SPISOMI Data Is Valid
6
7
SPISIMO Data
Must Be Valid
SPISIMO
Figure 5-16. SPI Slave Mode External Timing (CLOCK PHASE = 1)
SPICLK
(clock polarity=0)
SPICLK
(clock polarity=1)
8
SPIENAn
9
SPICSn
10
SPISOMI
Slave Out Data Is Valid
Figure 5-17. SPI Slave Mode Enable Timing (CLOCK PHASE = 1)
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ZHCS437B – APRIL 2012 – REVISED JULY 2013
6 Device and Documentation Support
6.1
Device Nomenclature
To designate the stages in the product development cycle, TI assigns prefixes to the part numbers of all
devices. Each commercial family member has one of three prefixes: TMX, TMP, or TMS (for example,
TMS570LS3137). These prefixes represent evolutionary stages of product development from engineering
prototypes (TMX) through fully qualified production devices/tools (TMS).
Device development evolutionary flow:
TMX
Experimental device that is not necessarily representative of the final device's electrical
specifications.
TMP
Final silicon die that conforms to the device's electrical specifications but has not completed
quality and reliability verification.
TMS
Fully-qualified production device.
TMX and TMP devices are shipped against the following disclaimer:
"Developmental product is intended for internal evaluation purposes."
TMS devices have been characterized fully, and the quality and reliability of the device have been
demonstrated fully. TI's standard warranty applies.
Predictions show that prototype devices (TMX or TMP) have a greater failure rate than the standard
production devices. Texas Instruments recommends that these devices not be used in any production
system because their expected end-use failure rate still is undefined. Only qualified production devices are
to be used.
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6.2
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Device Identification
The figure below illustrates the numbering and symbol nomenclature for the TMS570LS31x5/21x5 .
Full Part #
TMS
570
Orderable Part #
TMS
570
LS
31
3
5
C
ZWT
Q
Q1
R
31
3
5
C ZWT
Q
Q1
R
Prefix: TM
TMS = Fully Qualified
TMP = Prototype
TMX = Samples
Core Technology:
570 = Cortex R4F
Architecture:
LS = Dual CPUs in Lockstep
(not included in orderable part #)
Flash Memory Size:
31 = 3MB
21 = 2MB
RAM Memory Size:
3 = 256kB
2 = 192kB
Peripheral Set:
5 = FlexRay, no Ethernet
Die Revision:
Blank = Initial Die
A = 1st Die Revision
B = 2nd Die Revision
C = 3rd Die Revision
Package Type:
ZWT = 337 BGA Package
PGE = 144 Pin Package
Temperature Range:
Q = -40...+125oC
Quality Designator:
Q1 = Automotive
Shipping Options:
R = Tape and Reel
Figure 6-1. TMS570LS31x5/21x5 Device Numbering Conventions
6.2.1
Orderable Part Numbers
Table 6-1. Orderable Part Numbers
Orderable Part #
Part #
Package
Flash
RAM
EMAC
FlexRay
TMS5702125CPGEQQ1
TMS570LS2125
144 QFP
2MB
192kB
-
2ch
TMS5702125CZWTQQ1
TMS570LS2125
337 BGA
2MB
192kB
-
2ch
TMS5702135CPGEQQ1
TMS570LS2135
144 QFP
2MB
256kB
-
2ch
TMS5702135CZWTQQ1
TMS570LS2135
337 BGA
2MB
256kB
-
2ch
TMS5703135CPGEQQ1
TMS570LS3135
144 QFP
3MB
256kB
-
2ch
TMS5703135CZWTQQ1
TMS570LS3135
337 BGA
3MB
256kB
-
2ch
152
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6.2.2
ZHCS437B – APRIL 2012 – REVISED JULY 2013
Device Identification Code Register
The device identification code register identifies several aspects of the device including the silicon version.
The details of the device identification code register are shown in Table 6-2. The device identification code
register value for this device is:
• Rev A = 0x802AAD05
• Rev B = 0x802AAD15
• Rev C = 0x802AAD1D
Figure 6-2. Device ID Bit Allocation Register
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
16
CP-15
UNIQUE ID
TECH
R-1
R-00000000010101
R-0
15
12
11
2
1
0
TECH
14
13
I/O
VOLT
AGE
PERIPH
PARITY
FLASH ECC
10
9
RAM
ECC
8
7
6
VERSION
5
4
3
1
0
1
R-101
R-0
R-1
R-10
R-1
R-00000
R-1
R-0
R-1
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 6-2. Device ID Bit Allocation Register Field Descriptions
Bit
Field
31
CP15
Value
Indicates the presence of coprocessor 15
1
30-17
Description
UNIQUE ID
10101
CP15 present
Silicon version (revision) bits.
This bitfield holds a unique number for a dedicated device configuration (die).
16-13
TECH
Process technology on which the device is manufactured.
0101
12
I/O VOLTAGE
11
PERIPHERAL
PARITY
I/O voltage of the device.
0
I/O are 3.3v
Peripheral Parity
1
10-9
F021
FLASH ECC
Parity on peripheral memories
Flash ECC
10
Program memory with ECC
8
RAM ECC
Indicates if RAM memory ECC is present.
7-3
REVISION
Revision of the Device.
2-0
101
The platform family ID is always 0b101
1
6.2.3
ECC implemented
Die Identification Registers
The four die ID registers at addresses 0xFFFFE1F0, 0xFFFFE1F4, 0xFFFFE1F8 and FFFFE1FC form a
128-bit dieid with the information as shown inTable 6-3.
Table 6-3. Die-ID Registers
Item
# of Bits
Bit Location
X Coord. on Wafer
12
0xFFFFE1F0[11:0]
Y Coord. on Wafer
12
0xFFFFE1F0[23:12]
Wafer #
8
0xFFFFE1F0[31:24]
Lot #
24
0xFFFFE1F4[23:0]
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Table 6-3. Die-ID Registers (continued)
154
Item
# of Bits
Bit Location
Reserved
72
0xFFFFE1F4[31:24], 0xFFFFE1F8[31:0],
0xFFFFE1FC[31:0]
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6.3
ZHCS437B – APRIL 2012 – REVISED JULY 2013
Module Certifications
The following communications modules have received certification of adherence to a standard.
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6.3.1
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FlexRay™ Certifications
Figure 6-3. Flexray Certification for ZWT Package
156
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ZHCS437B – APRIL 2012 – REVISED JULY 2013
Figure 6-4. Flexray Certification for PGE Package
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6.3.2
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DCAN Certification
Figure 6-5. DCAN Certification
158
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6.3.3
6.3.3.1
ZHCS437B – APRIL 2012 – REVISED JULY 2013
LIN Certification
LIN Master Mode
Figure 6-6. LIN Certification - Master Mode
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6.3.3.2
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LIN Slave Mode - Fixed Baud Rate
Figure 6-7. LIN Certification - Slave Mode - Fixed Baud Rate
160
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6.3.3.3
ZHCS437B – APRIL 2012 – REVISED JULY 2013
LIN Slave Mode - Adaptive Baud Rate
Figure 6-8. LIN Certification - Slave Mode - Adaptive Baud Rate
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7 Mechanical Data
7.1
Thermal Data
Table 7-1 shows the thermal resistance characteristics for the QFP - PGE mechanical package.
Table 7-2 shows the thermal resistance characteristics for the BGA - ZWT mechanical package.
Table 7-1. Thermal Resistance Characteristics
(PGE Package)
PARAMETER
°C / W
RΘJA
39
RΘJB
26.3
RΘJC
6.7
Table 7-2. Thermal Resistance Characteristics
(ZWT Package)
7.2
PARAMETER
°C / W
RΘJA
18.8
RΘJB
14.1
RΘJC
7.1
Packaging Information
The following packaging information reflects the most current released data available for the designated
device(s). This data is subject to change without notice and without revision of this document.
162
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PACKAGE OPTION ADDENDUM
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8-Jul-2021
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
(3)
Device Marking
(4/5)
(6)
TMS5702125DPGEQQ1
ACTIVE
LQFP
PGE
144
60
RoHS & Green
NIPDAU
Level-3-260C-168 HR
-40 to 125
TMS570LS
2125DPGEQQ1
TMS5702135DPGEQQ1
ACTIVE
LQFP
PGE
144
60
RoHS & Green
NIPDAU
Level-3-260C-168 HR
-40 to 125
TMS570LS
2135DPGEQQ1
TMS5703135DPGEQQ1
ACTIVE
LQFP
PGE
144
60
RoHS & Green
NIPDAU
Level-3-260C-168 HR
-40 to 125
TMS570LS
3135DPGEQQ1
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of