TMUX4051, TMUX4052, TMUX4053
SCDS445B – MAY 2022 – REVISED MARCH 2023
TMUX405x 24-V, 8:1, 1-Channel, 4:1, 2-Channel and 2:1, 3-Channel
Multiplexers with 1.8-V Logic
1 Features
3 Description
•
•
•
•
•
•
•
•
•
•
The TMUX405x devices are general purpose
complementary metal-oxide semiconductor (CMOS)
multiplexers (MUX). The TMUX4051 is an 8:1, 1channel multiplexer, the TMUX4052 is a 4:1, 2channel multiplexer, and the TMUX4053 is 2:1, 3
channel switch. The devices work with a single supply
(5 V to 24 V), dual supplies (up to ±12 V), or
asymmetric supplies (such as VDD = 12 V, VSS =
–5 V). The wide supply voltage range allows the
TMUX405x devices to be used in a broad array of
applications from battery testers to appliances.
Single supply range: 5 V to 24 V
Dual supply range: up to ±12 V
Low capacitance: 3 pF
–55°C to +125°C operating temperature
Bidirectional signal path
Rail-to-rail operation
1.8 V logic compatible
Break-before-make switching
ESD protection HBM: 2000 V
TMUX405x – pin compatible with:
– Industry standard 4051, 4052, and 4053 muxes
The TMUX405x devices support bidirectional analog
signals on the source (Sx) and drain (Dx) pins ranging
from VSS to VDD. All logic inputs have 1.8 V logic
compatible thresholds, which is compatible for both
TTL and CMOS logic when operating with a valid
supply voltage.
2 Applications
•
•
•
•
•
•
•
•
Analog multiplexing and demultiplexing
Factory automation and control
Appliances
Battery test equipment
Power delivery
Medical
Building automation
Grid infrastructure
Package Information(1)(2)
PART NUMBER
TMUX4051
TMUX4052
TMUX4053
(1)
(2)
TMUX4051
S0A
S1A
S2A
S3A
D
1-OF-8
DECODER
A1
A0
5.00 mm × 4.40 mm
DYY (SOT-23-THIN, 16)
4.20 mm × 2.00 mm
BQB (WQFN, 16)
3.50 mm × 2.50 mm
For all available packages, see the package option
addendum at the end of the data sheet.
See the Device Comparison Table
DB
1-OF-4
DECODER
EN
TMUX4053
DA
S0B
S1B
S2B
S3B
A1
A0
BODY SIZE (NOM)
PW (TSSOP, 16)
TMUX4052
S0
S1
S2
S3
S4
S5
S6
S7
A2
PACKAGE
S1A
S1B
D1
S2A
S2B
D2
S3A
S3B
D3
LOGIC CONTROL
EN
SEL1 SEL2 SEL3 EN
TMUX4051, TMUX4052, and TMUX4053 Block Diagram
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
TMUX4051, TMUX4052, TMUX4053
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SCDS445B – MAY 2022 – REVISED MARCH 2023
Table of Contents
1 Features............................................................................1
2 Applications..................................................................... 1
3 Description.......................................................................1
4 Revision History.............................................................. 2
5 Device Comparison Table...............................................3
6 Pin Configuration and Functions...................................4
7 Specifications.................................................................. 7
7.1 Absolute Maximum Ratings........................................ 7
7.2 ESD Ratings............................................................... 7
7.3 Thermal Information: TMUX405x................................8
7.4 Recommended Operating Conditions.........................8
7.5 Electrical Characteristics.............................................9
7.6 AC Performance Characteristics...............................11
7.7 Timing Characteristics...............................................12
7.8 Typical Characteristics.............................................. 14
8 Parameter Measurement Information.......................... 16
8.1 On-Resistance.......................................................... 16
8.2 Off-Leakage Current................................................. 16
8.3 On-Leakage Current................................................. 17
8.4 Transition Time......................................................... 17
8.5 Break-Before-Make...................................................18
8.6 tON(EN) and tOFF(EN) .................................................. 18
8.7 Propagation Delay.................................................... 19
8.8 Charge Injection........................................................19
8.9 Off Isolation...............................................................20
8.10 Crosstalk................................................................. 20
8.11 Bandwidth............................................................... 21
9 Detailed Description......................................................22
9.1 Overview................................................................... 22
9.2 Functional Block Diagram......................................... 22
9.3 Feature Description...................................................22
10 Application and Implementation................................ 24
10.1 Application Information........................................... 24
10.2 Typical Application.................................................. 24
10.3 Design Requirements............................................. 25
10.4 Detailed Design Procedure..................................... 25
10.5 Application Curves.................................................. 25
10.6 Power Supply Recommendations...........................25
10.7 Layout..................................................................... 26
11 Device and Documentation Support..........................27
11.1 Documentation Support.......................................... 27
11.2 Receiving Notification of Documentation Updates.. 27
11.3 Support Resources................................................. 27
11.4 Trademarks............................................................. 27
11.5 Electrostatic Discharge Caution.............................. 27
11.6 Glossary.................................................................. 27
12 Mechanical, Packaging, and Orderable
Information.................................................................... 27
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision A (September 2022) to Revision B (March 2023)
Page
• Changed the status DYY and BQB packages from: preview to: active ............................................................. 1
Changes from Revision * (May 2022) to Revision A (September 2022)
Page
• Changed the status from: Advanced Information to: Production Data ...............................................................1
2
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SCDS445B – MAY 2022 – REVISED MARCH 2023
5 Device Comparison Table
PRODUCT
DESCRIPTION
TMUX4051
8:1, 1-channel multiplexer
TMUX4052
4:1, 2-channel multiplexer
TMUX4053
2:1, 3-channel switch
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SCDS445B – MAY 2022 – REVISED MARCH 2023
6 Pin Configuration and Functions
S4
1
16
VDD
S6
2
15
S2
D
3
14
S1
S4
1
16
VDD
S6
2
15
S2
D
3
14
S1
4
13
S0
5
12
S3
6
11
A0
S7
4
13
S0
S7
S5
5
12
S3
S5
6
11
A0
VSS
7
10
A1
VSS
7
10
A1
GND
8
9
A2
GND
8
9
A2
Not to scale
Figure 6-2. TMUX4051 DYY Package, 16-Pin
SOT-23-THIN (Top View)
Not to scale
S4
VDD
1
16
Figure 6-1. TMUX4051 PW Package, 16-Pin TSSOP
(Top View)
S6
2
15
S2
D
3
14
S1
S7
4
13
S0
S5
5
12
S3
6
11
A0
7
10
A1
Thermal
A2
GND
8
VSS
9
Pad
Not to scale
Figure 6-3. TMUX4051 BQB Package, 16-Pin WQFN (Top View)
Table 6-1. Pin Functions TMUX4051
PIN
NAME
NO.
TYPE(1)
S4
1
I/O
Source pin 4. Signal path can be an input or output.
S6
2
I/O
Source pin 6. Signal path can be an input or output.
D
3
I/O
Drain pin (common). Signal path can be an input or output.
S7
4
I/O
Source pin 7. Signal path can be an input or output.
S5
5
I/O
Source pin 5. Signal path can be an input or output.
EN
6
I
Active low logic enable. When this pin is high, all switches are turned off. Table 9-1 lists how the A[2:0]
address inputs determine which switch is turned on when this pin is low.
VSS
7
P
Negative power supply. This pin is the most negative power-supply potential. For reliable operation,
connect a decoupling capacitor ranging from 0.1 µF to 10 µF between VSS and GND.
GND
8
P
Ground (0 V) reference
A2
9
I
Address line 2. Table 9-1 provides information about how A2 controls the switch configuration.
A1
10
I
Address line 1. Table 9-1 provides information about how A1 controls the switch configuration.
A0
11
I
Address line 0. Table 9-1 provides information about how A0 controls the switch configuration.
S3
12
I/O
Source pin 3. Signal path can be an input or output.
S0
13
I/O
Source pin 0. Signal path can be an input or output.
S1
14
I/O
Source pin 1. Signal path can be an input or output.
S2
15
I/O
Source pin 2. Signal path can be an input or output.
VDD
16
P
Positive power supply. This pin is the most positive power-supply potential. For reliable operation,
connect a decoupling capacitor ranging from 0.1 µF to 10 µF between VDD and GND.
—
The thermal pad is not connected internally. It is recommended that the pad be left floating or tied to
GND.
Thermal pad
(1)
(2)
4
DESCRIPTION(2)
I = input, O = output, I/O = input and output, P = power.
For what to do with unused pins, refer to Section 9.3.4.
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SCDS445B – MAY 2022 – REVISED MARCH 2023
S0B
1
16
VDD
S2B
2
15
S2A
DB
3
14
S1A
S0B
1
16
VDD
S2B
2
15
S2A
DB
3
14
S1A
4
13
DA
5
12
S0A
6
11
S3A
7
10
A0
8
9
A1
S3B
4
13
DA
S3B
S1B
5
12
S0A
S1B
6
11
S3A
VSS
7
10
A0
VSS
GND
8
9
A1
GND
Not to scale
Figure 6-5. TMUX4052 DYY Package, 16-Pin
SOT-23-THIN (Top View)
Not to scale
S0B
VDD
1
16
Figure 6-4. TMUX4052 PW Package, 16-Pin TSSOP
(Top View)
S2B
2
15
S2A
DB
3
14
S1A
S3B
4
13
DA
S1B
5
12
S0A
6
11
S3A
7
10
A0
Thermal
A1
GND
8
VSS
9
Pad
Not to scale
Figure 6-6. TMUX4052 BQB Package, 16-Pin WQFN (Top View)
Table 6-2. Pin Functions TMUX4052
PIN
NAME
NO.
TYPE(1)
DESCRIPTION(2)
S0B
1
I/O
Source pin 0 of mux B. Can be an input or output.
S2B
2
I/O
Source pin 2 of mux B. Can be an input or output.
DB
3
I/O
Drain pin (common) of mux B. Can be an input or output.
S3B
4
I/O
Source pin 3 of mux B. Can be an input or output.
S1B
5
I/O
Source pin 1 of mux B. Can be an input or output.
EN
6
I
Active low logic enable. When this pin is high, all switches are turned off. When this pin is low, the
A[1:0] address inputs determine which switch is turned on.
VSS
7
P
Negative power supply. This pin is the most negative power-supply potential. For reliable operation,
connect a decoupling capacitor ranging from 0.1 µF to 10 µF between VSS and GND.
GND
8
P
Ground (0 V) reference
A1
9
I
Address line 1. Table 9-2 provides information about how A1 controls the switch configuration.
A0
10
I
Address line 0. Table 9-2 provides information about how A0 controls the switch configuration.
S3A
11
I/O
Source pin 3 of mux A. Can be an input or output.
S0A
12
I/O
Source pin 0 of mux A. Can be an input or output.
DA
13
I/O
Drain pin (common) of mux A. Can be an input or output.
S1A
14
I/O
Source pin 1 of mux A. Can be an input or output.
S2A
15
I/O
Source pin 2 of mux A. Can be an input or output.
VDD
16
P
Positive power supply. This pin is the most positive power-supply potential. For reliable operation,
connect a decoupling capacitor ranging from 0.1 µF to 10 µF between VDD and GND.
—
The thermal pad is not connected internally. It is recommended that the pad be left floating or tied to
GND.
Thermal pad
(1)
(2)
I = input, O = output, I/O = input and output, P = power.
For what to do with unused pins, refer to Section 9.3.4 .
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S2B
1
16
VDD
S2A
2
15
D2
S3B
3
14
D1
S2B
1
16
VDD
S2A
2
15
D2
S3B
3
14
D1
4
13
S1B
5
12
S1A
6
11
SEL1
7
10
SEL2
8
9
SEL3
D3
4
13
S1B
D3
S3A
5
12
S1A
S3A
6
11
SEL1
VSS
7
10
SEL2
VSS
GND
8
9
SEL3
GND
Not to scale
Figure 6-8. TMUX4053 DYY Package, 16-Pin
SOT-23-THIN (Top View)
Not to scale
S2B
VDD
1
16
Figure 6-7. TMUX4053 PW Package, 16-Pin TSSOP
(Top View)
S2A
2
15
D2
S3B
3
14
D1
D3
4
13
S1B
S3A
5
12
S1A
6
11
SEL1
7
10
SEL2
Thermal
SEL3
GND
8
VSS
9
Pad
Not to scale
Figure 6-9. TMUX4053 BQB Package, 16-Pin WQFN (Top View)
Table 6-3. Pin Functions TMUX4053
PIN
NAME
NO.
TYPE(1)
S2B
1
I/O
Source pin B of switch 2. Can be an input or output.
S2A
2
I/O
Source pin A of switch 2. Can be an input or output.
S3B
3
I/O
Source pin B of switch 3. Can be an input or output.
D3
4
I/O
Drain pin (common) of switch 3. Can be an input or output.
S3A
5
I/O
Source pin A of switch 3. Can be an input or output.
EN
6
I
Active low logic enable. When this pin is high, all switches are turned off. When this pin is low, the
SEL[x] logic control inputs determine which switch is turned on.
VSS
7
P
Negative power supply. This pin is the most negative power-supply potential. For reliable operation,
connect a decoupling capacitor ranging from 0.1 µF to 10 µF between VSS and GND.
GND
8
P
Ground (0 V) reference
SEL3
9
I
Logic control select pin 3. Table 9-3 provides controls switch 3 configuration.
SEL2
10
I
Logic control select pin 2. Table 9-3 provides controls switch 2 configuration.
SEL1
11
I
Logic control select pin 1. Table 9-3 provides controls switch 1 configuration.
S1A
12
I/O
Source pin A of switch 1. Can be an input or output.
S1B
13
I/O
Source pin B of switch 1. Can be an input or output.
D1
14
I/O
Drain pin (common) of switch 1. Can be an input or output.
D2
15
I/O
Drain pin (common) of switch 2. Can be an input or output.
VDD
16
P
Positive power supply. This pin is the most positive power-supply potential. For reliable operation,
connect a decoupling capacitor ranging from 0.1 µF to 10 µF between VDD and GND.
—
The thermal pad is not connected internally. It is recommended that the pad be left floating or tied to
GND.
Thermal pad
(1)
(2)
6
DESCRIPTION(2)
I = input, O = output, I/O = input and output, P = power.
For what to do with unused pins, refer to Section 9.3.4.
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SCDS445B – MAY 2022 – REVISED MARCH 2023
7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1) (3)
MIN
MAX
VDD – VSS
UNIT
28
V
Supply voltage
–0.5
28
V
–28
0.5
V
VSEL or VEN
Logic control input pin voltage (EN, Ax, SELx)
–0.5
28
V
ISEL or IEN
Logic control input pin current (EN, Ax, SELx)
mA
VS or VD
Source or drain voltage (Sx, D)
VDD
VSS
Diode clamp
IS or ID (CONT)
Source or drain continuous current (Sx, D)
TJ
Junction temperature
Tstg
Storage temperature
(2)
(3)
28
VDD+0.5
–30
30
mA
–10
10
mA
150
°C
150
°C
current(2)
IIK
(1)
–0.5
VSS–0.5
–65
V
Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute maximum ratings do not imply
functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions.
If briefly operating outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not
sustain damage, but it may not be fully functional. Operating the device in this manner may affect device reliability, functionality,
performance, and shorten the device lifetime.
Pins are diode-clamped to the power-supply rails. Over voltage signals must be voltage and current limited to maximum ratings.
To avoid drawing excess current from VDD, or into VSS, the voltage drop across the bidirectional switch path (ΔVswitch) must not exceed
1.2 V (600 mV for high temperature).
7.2 ESD Ratings
VALUE
V(ESD)
(1)
(2)
Electrostatic discharge
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001,
all pins(1)
±2000
Charged device model (CDM), per ANSI/ESDA/JEDEC
JS-002, all pins(2)
±500
UNIT
V
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
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7.3 Thermal Information: TMUX405x
TMUX4051 / TMUX4052 / TMUX4053
THERMAL
METRIC(1)
PW (TSSOP)
DYY (SOT)
BQB (WQFN)
16 PINS
16 PINS
16 PINS
UNIT
RθJA
Junction-to-ambient thermal resistance
116.5
138.9
70.5
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
47.2
70.3
67.8
°C/W
RθJB
Junction-to-board thermal resistance
63.0
69.1
40.2
°C/W
ΨJT
Junction-to-top characterization parameter
6.4
5.1
3.9
°C/W
ΨJB
Junction-to-board characterization parameter
62.1
69.0
40.2
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
N/A
N/A
18.7
°C/W
(1)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
7.4 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN
VDD – VSS (1) Power supply voltage differential
MAX
UNIT
24
V
VDD
Positive power supply voltage
5
24
V
VSS
Negative power supply voltage
–15
0
V
VS or VD
Signal path input/output voltage (source or drain pin) (Sx, D)
VSS
VDD
V
VAx or VEN
Address or enable pin voltage
0
VDD
V
IS or ID (CONT) Source or drain continuous current (Sx, D)
–10
10
mA
TA
–55
125
°C
(1)
8
NOM
5
Ambient temperature
VDD and VSS can be any value as long as 5 V ≤ (VDD – VSS) ≤ 24 V, and the minimum VDD and VSS are met.
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SCDS445B – MAY 2022 – REVISED MARCH 2023
7.5 Electrical Characteristics
Over operating free-air temperature range,
Typical at TA = 25℃ (unless otherwise noted)
PARAMETER
TEST CONDITIONS
VDD
VSS
TA
MIN
TYP
MAX
UNIT
POWER SUPPLY
–55°C
Address inputs = 0 V, 5 V, or VDD
EN = 0 V
Address inputs = 0 V, 5 V, or VDD
EN = 0 V
Supply current
IDD
Address inputs = 0 V, 5 V, or VDD
EN = 0 V
Address inputs = 0 V, 5 V, or VDD
EN = 0 V
Address inputs = 0 V, 5 V, or VDD
EN = 0 V
Address inputs = 0 V, 5 V, or VDD
EN = 0 V
5V
10 V
24 V
5V
12 V
5V
0V
0V
0V
–5 V
–12 V
–5 V
Negative supply
current
ISS
Address inputs = 0 V, 5 V, or VDD
EN = 0 V
12 V
–12 V
25°C
60
17
85°C
80
125°C
80
–55°C
60
25°C
18
EN = 5 V or VDD
All
60
85°C
80
125°C
80
–55°C
60
25°C
21
60
85°C
80
125°C
80
–55°C
60
25°C
18
80
125°C
80
–55°C
60
25°C
20
60
85°C
80
125°C
80
–55°C
20
25°C
6
20
85°C
25
125°C
25
–55°C
22
25°C
7
85°C
25°C
–55°C to 125°C
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µA
60
85°C
µA
22
26
125°C
IDD disable
60
26
8
20
µA
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SCDS445B – MAY 2022 – REVISED MARCH 2023
7.5 Electrical Characteristics (continued)
Over operating free-air temperature range,
Typical at TA = 25℃ (unless otherwise noted)
PARAMETER
TEST CONDITIONS
VDD
VSS
TA
MIN
TYP
MAX
75
1050
UNIT
ANALOG SWITCH
–55°C
VS = VSS to VDD
ID = –1 mA
5V
VS = VSS to VDD
ID = –1 mA
10 V
RON
VS = VSS to VDD
Source to Drain ONID = –1 mA
Resistance
24 V
VS = VSS to VDD
ID = –1 mA
5V
VS = VSS to VDD
ID = –1 mA
12 V
ΔRON
VS = VSS to VDD
ID = –1 mA
RON FLAT
VS = VSS to VDD
ID = –1 mA
All
Switch State is off
VS = VSS / VDD
VD = VDD / VSS
24 V
IS(OFF)
ID(OFF)
0V
0V
0V
–5 V
–12 V
All
800
25°C
85°C
1200
125°C
1300
–55°C
310
25°C
60
520
125°C
550
–55°C
200
25°C
60
300
125°C
300
–55°C
310
25°C
60
520
125°C
550
–55°C
200
25°C
60
300
125°C
300
2
25°C
60
24 V
0V
Ω
–55°C to 85°C
150
–55°C to 125°C
150
±0.3
–55°C to 85°C
Ω
±100
±800
nA
±1000
25°C
ION
240
85°C
25°C
Ω
400
85°C
–55°C to 125°C
Switch State is on
VS = VD = VSS or VDD
240
85°C
25°C
0V
400
85°C
±0.3
±100
–55°C to 85°C
±800
–55°C to 125°C
±1000
nA
LOGIC INPUTS (ADDRESS / ENABLE pins)
VIH
Input High Voltage
All
–55°C to 125°C
1.35
VIL
Input Low Voltage
All
–55°C to 125°C
0
IIH
IIL
Logic Input Current
25°C
VLOGIC = 0 V, 5 V, or VDD
CIN
10
All
All
–55°C to 125°C
25°C
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VDD
V
0.8
V
±0.6
–1
1
2
µA
pF
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7.6 AC Performance Characteristics
Typical at TA = 25℃ (unless otherwise noted)
PARAMETER
TEST CONDITIONS
CONDITION
TA = –55℃ to 125℃
VDD
VSS
GPN
MIN
TYP
MAX
UNIT
CAPACITANCE
CS(OFF)
CD(OFF)
CS(ON)
CD(ON)
VS = (VDD + VSS) / 2 V
f = 1 MHz
VS = (VDD + VSS) / 2 V
f = 1 MHz
VS = (VDD + VSS) / 2 V
f = 1 MHz
5V
–5 V
24 V
0V
5V
–5 V
24 V
0V
5V
–5 V
24 V
0V
5V
–5 V
24 V
0V
5V
–5 V
24 V
0V
5V
–5 V
24 V
0V
5V
–5 V
24 V
0V
+5 V
–5 V
24 V
0V
+5 V
–5 V
24 V
0V
+5 V
–5 V
24 V
0V
+5 V
–5 V
All
TMUX4051
TMUX4052
TMUX4053
TMUX4051
TMUX4052
TMUX4053
3
3
pF
11
9
6
5
pF
4
3
13
11
8
7
pF
10
5
DYNAMIC CHARACTERISTICS
VBIAS = (VDD + VSS) / 2 (1)
Bandwidth (BW)
V = 200 mVpp
(Sine Wave Input) S
RL = 50 Ω, CL = 5 pF
VBIAS = (VDD + VSS) / 2
Off Isolation
VS = 200 mVpp
Channel OFF
RL = 50 Ω, CL = 5 pF
(Sine Wave Input)
f = 1 MHz
(1)
VBIAS = (VDD + VSS) / 2 (1)
Crosstalk
VS = 200 mVpp
(Sine Wave Input) RL = 50 Ω, CL = 5 pF
f = 1 MHz
Charge Injection
(1)
VS = (VDD + VSS) / 2
RS = 0 Ω, CL = 100 pF
24 V
0V
+5 V
–5 V
24 V
0V
+5 V
–5 V
24 V
0V
TMUX4051
TMUX4052
TMUX4053
280
430
600
700
MHz
750
850
–95
All
–95
dB
–90
All
TMUX4051
–90
6
2
dB
pC
Peak-to-Peak voltage symmetrical about (VDD + VSS) / 2.
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7.7 Timing Characteristics
Over operating free-air temperature range,
Typical at TA = 25℃ (unless otherwise noted)
TEST CONDITIONS
PARAMETER
Prop
Delay
tON (EN)
tOFF
12
VS = VSS to
VDD
Address-to-Signal OUT tr , tf = 20 ns,
Transition time between CL = 50 pF,
inputs
RL = 10 kΩ
tTRAN
(EN)
Signal Input
to
Signal Output
CONDITION
Enable-to-Signal OUT
Channel turning ON
Enable-to-Signal OUT
Channel turning OFF
tr , tf = 20 ns,
CL = 50 pF,
RL = 10 kΩ
tr , tf = 20 ns,
CL = 50 pF,
RL = 10 kΩ
VDD
VSS
TA
MIN
TYP
MAX
5V
0V
25°C
4
20
10 V
0V
25°C
4
20
24 V
0V
25°C
3
20
5V
–5 V
25°C
4
20
12 V
–12 V
25°C
3
20
5V
0V
25°C
105
10 V
0V
24 V
0V
5V
–5 V
12 V
–12 V
5V
0V
10 V
0V
24 V
0V
5V
–5 V
12 V
–12 V
5V
0V
10 V
0V
24 V
0V
5V
–5 V
12 V
–12 V
–55°C to +125°C
25°C
100
190
110
–55°C to +125°C
25°C
230
190
100
–55°C to +125°C
25°C
190
100
–55°C to +125°C
25°C
190
95
–55°C to +125°C
25°C
190
110
–55°C to +125°C
25°C
230
190
100
–55°C to +125°C
25°C
190
90
–55°C to +125°C
25°C
140
90
–55°C to +125°C
25°C
140
85
–55°C to +125°C
25°C
140
–55°C to +125°C
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ns
100
–55°C to +125°C
25°C
ns
100
–55°C to +125°C
25°C
ns
100
–55°C to +125°C
25°C
ns
190
–55°C to +125°C
25°C
UNIT
160
90
140
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7.7 Timing Characteristics (continued)
Over operating free-air temperature range,
Typical at TA = 25℃ (unless otherwise noted)
PARAMETER
tBBM
TEST CONDITIONS
CONDITION
CL = 15 pF,
RL = 10 kΩ
VDD
VSS
5V
0V
10 V
0V
5V
–5 V
12 V
–12 V
24 V
0V
TA
MIN
25°C
–55°C to +125°C
45
1
45
1
25°C
–55°C to +125°C
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ns
55
1
25°C
–55°C to +125°C
UNIT
60
25°C
–55°C to +125°C
MAX
1
25°C
–55°C to +125°C
TYP
75
1
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7.8 Typical Characteristics
at TA = 25°C, VDD = 5 V (unless otherwise noted)
240
TA = 125C
TA = 85C
220
TA = 25C
TA = −55C
On Resistance ()
200
180
160
140
120
100
80
60
40
0
0.5
1
1.5
2
2.5
3
3.5
4
VS or VD - Source or Drain Voltage (V)
VDD = 5 V, VSS = -5 V
Figure 7-2. On-Resistance vs Temperature
230
27
TA = 125C
TA = 85C
210
TA = 25C
TA = −55C
25
Supply Current (A)
On Resistance ()
VDD
VDD
VDD
VDD
26
190
170
150
130
110
90
24
=
=
=
=
24V
10V
15V
5V
23
22
21
20
19
18
70
17
50
16
15
30
0
2
4
6
8 10 12 14 16 18 20
VS or VD - Source or Drain Voltage (V)
22
0
24
2.5
5
7.5
250
Input 90% to Output 90%
Input 80% to Output 80%
Input 50% to Output 50%
200
Settling Time (ns)
175
150
125
100
75
50
25
0
-25
-50
0
0.2
0.4
0.6
0.8
1
1.2
tr, tf - Signal Rise, Fall Time (s)
VDD = 5 V, Vsignal = 5 V
RL = 200 kΩ, CL = 15 pF
Figure 7-5. System Settling Time
20
22.5
25
Figure 7-4. Supply Current vs Logic Voltage
Figure 7-3. On-Resistance vs Temperature
225
10 12.5 15 17.5
Logic Voltage (V)
.
VDD = 24 V
Settling Time (ns)
5
VDD = 5 V
Figure 7-1. On-Resistance vs Temperature
14
4.5
1.4
650
600
550
500
450
400
350
300
250
200
150
100
50
0
Input 90% to Output 90%
Input 80% to Output 80%
Input 50% to Output 50%
0
0.2
0.4
0.6
0.8
1
1.2
tr, tf - Signal Rise, Fall Time (s)
1.4
VDD = 5 V, Vsignal = 5 V
RL = 10 kΩ, CL = 15 pF
Figure 7-6. System Settling Time
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7.8 Typical Characteristics (continued)
at TA = 25°C, VDD = 5 V (unless otherwise noted)
0
0
TMUX4051
TMUX4052
TMUX4053
-10
-2
-20
-30
-40
-50
Gain (dB)
Gain (dB)
-4
-6
-8
-60
-70
-80
-10
-90
-100
TMUX4053
TMUX4052
TMUX4051
-12
-14
100k
1M
-110
10M
Frequency (Hz)
100M
1G
-120
100k
1M
10M
Frequency (Hz)
100M
1G
VDD = 12 V, VSS = -12 V
VDD = 12 V, VSS = -12 V
Figure 7-8. Off-Isolation vs Frequency
Figure 7-7. On Response vs Frequency
0
-10
-20
TMUX4051
TMUX4052
TMUX4053
-30
Gain (dB)
-40
-50
-60
-70
-80
-90
-100
-110
-120
100k
1M
10M
Frequency (Hz)
100M
1G
VDD = 12 V, VSS = -12 V
Figure 7-9. Xtalk vs Frequency
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8 Parameter Measurement Information
8.1 On-Resistance
The on-resistance of a device is the ohmic resistance between the source (Sx) and drain (D) pins of the
device. The on-resistance varies with input voltage and supply voltage. The symbol RON is used to denote
on-resistance. The measurement setup used to measure RON is shown in the following figure. Figure 8-1 shows
how the RON is computed with RON = V / ISD, and the voltage (V) and current (ISD) are measured using this
setup.
V
ISD
Sx
D
VS
Figure 8-1. On-Resistance Measurement Setup
8.2 Off-Leakage Current
There are two types of leakage currents associated with a switch during the off state:
1. Source off-leakage current.
2. Drain off-leakage current.
Source leakage current is defined as the leakage current flowing into or out of the source pin when the switch is
off. This current is denoted by the symbol IS(OFF).
Drain leakage current is defined as the leakage current flowing into or out of the drain pin when the switch is off.
This current is denoted by the symbol ID(OFF).
Figure 8-2 shows the setup used to measure both off-leakage currents.
Is (OFF)
VDD
VDD
VDD
VDD
S0
S0
A
ID (OFF)
D
D
VS
S6
A
S6
S7
S7
VS
VD
VD
GND
GND
Figure 8-2. Off-Leakage Measurement Setup
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8.3 On-Leakage Current
Source on-leakage current is defined as the leakage current flowing into or out of the source pin when the switch
is on. This current is denoted by the symbol IS(ON).
Drain on-leakage current is defined as the leakage current flowing into or out of the drain pin when the switch is
on. This current is denoted by the symbol ID(ON).
Either the source pin or drain pin is left floating during the measurement. Figure 8-3 shows the circuit used for
measuring the on-leakage current, denoted by IS(ON) or ID(ON).
VDD
VDD
VDD
S0
N.C.
VDD
IS (ON)
S0
A
ID (ON)
S1
S1
D
D
A
N.C.
S7
S7
Vs
VS
VS
VD
GND
GND
Figure 8-3. On-Leakage Measurement Setup
8.4 Transition Time
Transition time is defined as the time taken by the output of the device to rise or fall 10% after the address signal
has risen or fallen past the 50% threshold. Figure 8-4 shows the setup used to measure transition time, denoted
by the symbol tTRANSITION.
VSS
VDD
VSS
0.1 µF
0.1 µF
5V
VADDRESS
VDD
tr < 20 ns
50%
50%
tf < 20 ns
VS
S1
0V
D
tTRANSITION
tTRANSITION
Output
S2
S8
90%
RL
CL
Output
10%
0V
A0
A1
VADDRESS
A2
GND
Figure 8-4. Transition-Time Measurement Setup
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8.5 Break-Before-Make
Break-before-make delay is a safety feature that prevents two inputs from connecting when the device is
switching. The output first breaks from the on-state switch before making the connection with the next on-state
switch. The time delay between the break and the make is known as break-before-make delay. Figure 8-5 shows
the setup used to measure break-before-make delay, denoted by the symbol tOPEN(BBM).
VDD
0.1…F
VDD
Input Select
(VSEL)
tr < 5ns
S0
VDD
tf < 5ns
D
OUTPUT
S1-S6
0V
RL
CL
S7
90%
Output
tBBM_1
tBBM_2
A0
0V
A1
tBBM = min ( tBBM_1, tBBM_2)
EN
VSEL
A2
GND
Figure 8-5. Break-Before-Make Delay Measurement Setup
8.6 tON(EN) and tOFF(EN)
Turn-on time is defined as the time taken by the output of the device to rise to 10% after the enable has risen
past the 50% threshold. The 10% measurement is utilized to provide the timing of the device, system level timing
can then account for the time constant added from the load resistance and load capacitance. Figure 8-6 shows
the setup used to measure transition time, denoted by the symbol tON(EN).
Turn-off time is defined as the time taken by the output of the device to fall to 90% after the enable has fallen
past the 50% threshold. The 90% measurement is utilized to provide the timing of the device, system level timing
can then account for the time constant added from the load resistance and load capacitance. Figure 8-6 shows
the setup used to measure transition time, denoted by the symbol tOFF(EN).
VDD
0.1F
VSS
0.1 F
Logic
High
VEN
tf = 20ns
50%
50%
tr = 20ns
VS
S0
D
0V
OUTPUT
S1
RL
CL
S7
tON (EN)
tOFF (EN)
90%
A0
EN
OUTPUT
A1
VEN
A2
10%
GND
0V
Figure 8-6. Turn-On and Turn-Off Time Measurement Setup
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8.7 Propagation Delay
Propagation delay is defined as the time taken by the output of the device to rise or fall 50% after the input signal
has risen or fallen past the 50% threshold. Figure 8-7 shows the setup used to measure propagation delay,
denoted by the symbol tPD.
VDD
0.1 µF
0.1 µF
VDD
Input
(VS)
VSS
50%
VDD
50%
50
VS
VSS
tPD 1
VSS
S1
D
tPD 2
RL
S8
Output
50%
Output
S2
CL
50%
GND
0V
tProp Delay = max ( tPD 1, tPD 2)
Figure 8-7. Propagation Delay Measurement Setup
8.8 Charge Injection
Any mismatch in capacitance between the NMOS and PMOS transistors results in a charge injected into the
drain or source during the falling or rising edge of the gate signal. The amount of charge injected into the source
or drain of the device is known as charge injection, and is denoted by the symbol QC. Figure 8-8 shows the
setup used to measure charge injection from source (Sx) to drain (D).
VDD
0.1 F
VDD
VDD
VS
S0
VEN
S5
OUTPUT
D
0V
S6
CL
S7
Output
VOUT
VOUT
VS
QC = CL ×
VOUT
EN
A0
A1
VEN
A2
GND
Figure 8-8. Charge-Injection Measurement Setup
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8.9 Off Isolation
Off isolation is defined as the ratio of the signal at the drain pin (D) of the device when a signal is applied to the
source pin (Sx) of an off-channel. Figure 8-9 shows the setup used to measure, and the equation to compute off
isolation.
0.1 µF
NETWORK
VDD
ANALYZER
VS
50
S
VSIG
D
VOUT
RL
50
SX
GND
RL
50
Figure 8-9. Off Isolation Measurement Setup
Off Isolation = 20 × Log
8.10 Crosstalk
VOUT
VS
(1)
Crosstalk is defined as the ratio of the signal at the drain pin (D) of a different channel, when a signal is applied
at the source pin (Sx) of an on-channel. Figure 8-10 shows the setup used to measure, and the equation used to
compute crosstalk.
0.1 µF
NETWORK
VDD
ANALYZER
S1
VOUT
RL
D
50
VS
RL
S2
50
50
VSIG
SX
RL
50
GND
Figure 8-10. Channel-to-Channel Crosstalk Measurement Setup
Cℎannel − to − Cℎannel Crosstalk = 20 × Log
20
VOUT
VS
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8.11 Bandwidth
Bandwidth is defined as the range of frequencies that are attenuated by less than 3 dB when the input is applied
to the source pin (Sx) of an on-channel, and the output is measured at the drain pin (D) of the device. Figure
8-11 shows the setup used to measure bandwidth.
0.1 µF
NETWORK
VDD
VS
ANALYZER
50
S
VSIG
D
VOUT
RL
SX
50
GND
RL
50
Figure 8-11. Bandwidth Measurement Setup
V
(3)
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1
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9 Detailed Description
9.1 Overview
The TMUX4051 is an 8:1, single-ended (1-channel) mux, the TMUX4052 is a 4:1, differential (2-channel)
multiplexer, and the TMUX4053 is 2:1, 3 channel switch. Each channel is turned on or turned off based on the
state of the address lines and enable pin.
9.2 Functional Block Diagram
TMUX4051
TMUX4052
S0A
S1A
S2A
S3A
S0
S1
S2
S3
S4
S5
S6
S7
D
1-OF-8
DECODER
A2
A1
A0
DA
S0B
S1B
S2B
S3B
DB
1-OF-4
DECODER
EN
TMUX4053
A1
A0
S1A
S1B
D1
S2A
S2B
D2
S3A
S3B
D3
LOGIC CONTROL
EN
SEL1 SEL2 SEL3 EN
9.3 Feature Description
9.3.1 Bidirectional Operation
The TMUX4051, TMUX4052, and TMUX4053 devices conduct equally well from source (Sx) to drain (Dx) or
from drain (Dx) to source (Sx). Each signal path has very similar characteristics in both directions so they can be
used as both multiplexers and demultiplexer to support analog signals.
9.3.2 Rail-to-Rail Operation
The valid signal path input and output voltage for the TMUX4051, TMUX4052, and TMUX4053 ranges from VSS
to VDD.
9.3.3 1.8 V Logic Compatible Inputs
The TMUX4051, TMUX4052, and TMUX4053 support 1.8-V logic compatible control for all logic control inputs.
1.8-V logic level inputs allows the multiplexers to interface with processors that have lower logic I/O rails
and eliminates the need for an external voltage translator, which saves both space and BOM cost. For more
information on 1.8-V logic implementation, refer to Simplifying Design with 1.8 V logic Muxes and Switches.
9.3.4 Device Functional Modes
When the EN pin of the TMUX405x devices is pulled low, one of the switches is closed based on the state of the
address or select pins. When the EN pin is pulled high, all the switches are in an open state regardless of the
state of the address or select pins.
Unused logic control pins must be tied to GND or VDD to be certain that the device does not consume additional
current as highlighted in Implications of Slow or Floating CMOS Inputs. Unused signal path inputs (Sx and Dx)
should be connected to GND.
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9.3.5 Truth Tables
Table 9-1, Table 9-2, and Table 9-3 provides the truth tables for the TMUX4051 respectively.
Table 9-1. TMUX4051 Truth Table
EN
A2
A1
A0
Selected Signal Path Connected To Drain (D) Pin
0
0
0
0
S0
0
0
0
1
S1
0
0
1
0
S2
0
0
1
1
S3
0
1
0
0
S4
0
1
0
1
S5
0
1
1
0
S6
0
1
1
1
S7
1
X(1)
X(1)
X(1)
All inputs are unselected (HI-Z)
(1)
X denotes do not care.
Table 9-2. TMUX4052 Truth Table
EN
A1
A0
Selected Signal Path Connected To Drain (DA and DB) Pins
0
0
0
S0A to DA
S0B to DB
0
0
1
S1A to DA
S1B to DB
0
1
0
S2A to DA
S2B to DB
0
1
1
S3A to DA
S3B to DB
1
X(1)
X(1)
All inputs are unselected (HI-Z)
(1)
X denotes do not care.
Table 9-3. TMUX4053 Truth Table
(1)
EN
SEL1
SEL2
SEL3
0
0
X
X
S1A to D1
0
1
X
X
S1B to D1
0
X
0
X
S2A to D2
0
X
1
X
S2B to D2
0
X
X
0
S3A to D3
0
X
X
1
S3B to D3
1
X(1)
X(1)
X(1)
Selected Signal Path Connected To Drain Pins
All inputs are unselected (HI-Z)
X denotes do not care.
The Enable pin, EN, of the TMUX405x devices have a weak internal pull-up resistor to put the devices into a
disabled state upon power up. The SELx / Address pins (Ax) have weak internal pull-down resistors to put the
switch into a defined logic state.
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10 Application and Implementation
Note
Information in the following applications sections is not part of the TI component specification, and
TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining
suitability of components for their purposes. Customers should validate and test their design
implementation to confirm system functionality.
10.1 Application Information
The TMUX405x devices offer good system performance across a wide operating supply (5 V to 24 V). These
devices include 1.8 V logic compatible control input pins that enable operation in systems with 1.8 V I/O rails.
These features make the TMUX405x a family of general purpose multiplexers and switches that can reduce
system complexity, board size, and overall system cost.
10.2 Typical Application
One useful application to take advantage of the TMUX405x features is multiplexing various signals into an ADC
that is integrated into an MCU. Utilizing an integrated ADC in an MCU allows a system to minimize cost with a
potential tradeoff of system performance when compared to an external ADC. The multiplexer allows for multiple
inputs or sensors to be monitored with a single ADC pin of the device, which is critical in systems with limited
I/O. The TMUX4052 is suitable for a similar design example using differential signals, or as two 4:1 multiplexers.
VDD VSS
VDD
VI/O
LDO #1
MCU
S1
LDO #2
S2
LDO #3
RAM
FLASH
S3
S4
LM20
Analog Temp.
Sensor
LM20
Analog Temp.
Sensor
LM20
Analog Temp.
Sensor
D
S5
Integrated
12-bit ADC
S6
S7
Port I/O
S8
TIMERS
A2
A0 A1
GND
EN
1.8 V Logic
I/O
System Inputs
and Sensors
Figure 10-1. Multiplexing Signals to an Integrated ADC with TMUX4051
24
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10.3 Design Requirements
Table 10-1 lists the parameters that must be used for this design example.
Table 10-1. Design Parameters
PARAMETERS
VALUES
Supply (VDD)
12 V
I/O signal range
0 V to VDD (rail-to-rail)
Control logic thresholds
1.8 V compatible
10.4 Detailed Design Procedure
The TMUX4051, TMUX4052, and TMUX4053 can operate without any external components except for the
supply decoupling capacitors. The MCU can control the enable and address pins through GPIOs to toggle
between various inputs of the multiplexer. The enable pin should be connected to ground if the functionality is
not required in the system. All inputs being muxed to the ADC of the MCU must fall within the Recommended
Operating Conditions, including signal range and continuous current. For this design with a supply of 12 V, the
signal range can be 0 V to 12 V.
10.5 Application Curves
0
-2
Gain (dB)
-4
-6
-8
-10
-12
TMUX4053
TMUX4052
TMUX4051
-14
100k
1M
10M
Frequency (Hz)
100M
1G
TA = 25°C
Figure 10-2. Bandwidth
10.6 Power Supply Recommendations
The TMUX4051, TMUX4052, and TMUX4053 devices operate across a wide supply range of 5 V to 24 V.
Power-supply bypassing improves noise margin and prevents switching noise propagation from the supply
pins to other components. Good power-supply decoupling is important to achieve optimum performance. For
improved supply noise immunity, use a supply decoupling capacitor ranging from 0.1 μF to 10 μF from
VDD to ground and VSS to ground. Place the bypass capacitors as close to the power supply pins of the
device as possible using low-impedance connections. TI recommends using multi-layer ceramic chip capacitors
(MLCCs) that offer low equivalent series resistance (ESR) and inductance (ESL) characteristics for power-supply
decoupling purposes. For very sensitive systems or systems in harsh noise environments, avoiding the use of
vias for connecting the capacitors to the device pins may offer superior noise immunity. The use of multiple vias
in parallel lowers the overall inductance and is beneficial for connections to ground planes.
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10.7 Layout
10.7.1 Layout Guidelines
Route high-speed signals using minimal vias and corners, which reduces signal reflections and impedance
changes. When a via must be used, increase the clearance size around it to minimize its capacitance.
Each via introduces discontinuities in the signal’s transmission line and increases the chance of picking up
interference from the other layers of the board. Be careful when designing test points, through-hole pins are not
recommended at high frequencies.
Figure 10-3 shows an example of a PCB layout with the TMUX4051, TMUX4052, and TMUX4053. Some key
considerations are as follows:
•
•
•
•
Decouple the VDD and VSS pins with a 0.1-µF capacitor, placed as close to the pin as possible. Make sure
that the capacitor voltage rating is sufficient.
Keep the input lines as short as possible.
Use a solid ground plane to help reduce electromagnetic interference (EMI) noise pickup.
Do not run sensitive analog traces in parallel with digital traces. Avoid crossing digital and analog traces if
possible, and only make perpendicular crossings when necessary.
10.7.2 Layout Example
Via to GND plane
Wide (low inductance)
trace for power
Wide (low inductance)
trace for power
C
C
VDD
S0B
VDD
S2B
VDD
S6
S2
S2B
S2A
S2A
D2
D
S1
DB
S1A
S3B
D1
S7
S0
S3B
DA
D3
S1B
S5
S3
S1B
S0A
S3A
S1A
EN
A0
EN
S3A
EN
SEL1
TMUX4051
VSS
A1
GND
A2
To VSS
TMUX4052
VSS
A0
GND
A1
To VSS
C
S4
C
To VSS
C
C
Wide (low inductance)
trace for power
TMUX4053
VSS
SEL2
GND
SEL3
Figure 10-3. TMUX4051, TMUX4052, and TMUX4053 Layout Example
26
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11 Device and Documentation Support
11.1 Documentation Support
11.1.1 Related Documentation
For releated documentation, see the following:
•
•
•
Texas Instruments, Simplifying Design with 1.8 V logic Muxes and Switches application brief
Texas Instruments, QFN/SON PCB Attachment application report
Texas Instruments, Quad Flatpack No-Lead Logic Packages application report
11.2 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on
Subscribe to updates to register and receive a weekly digest of any product information that has changed. For
change details, review the revision history included in any revised document.
11.3 Support Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
11.4 Trademarks
TI E2E™ is a trademark of Texas Instruments.
All trademarks are the property of their respective owners.
11.5 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
11.6 Glossary
TI Glossary
This glossary lists and explains terms, acronyms, and definitions.
12 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
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PACKAGE OPTION ADDENDUM
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11-Nov-2023
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
Samples
(4/5)
(6)
TMUX4051BQBR
ACTIVE
WQFN
BQB
16
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
T4051
Samples
TMUX4051DYYR
ACTIVE
SOT-23-THIN
DYY
16
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
T4051
Samples
TMUX4051PWR
ACTIVE
TSSOP
PW
16
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
T4051
Samples
TMUX4052BQBR
ACTIVE
WQFN
BQB
16
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
T4052
Samples
TMUX4052DYYR
ACTIVE
SOT-23-THIN
DYY
16
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
T4052
Samples
TMUX4052PWR
ACTIVE
TSSOP
PW
16
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
T4052
Samples
TMUX4053BQBR
ACTIVE
WQFN
BQB
16
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
T4053
Samples
TMUX4053DYYR
ACTIVE
SOT-23-THIN
DYY
16
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
T4053
Samples
TMUX4053PWR
ACTIVE
TSSOP
PW
16
2000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-55 to 125
T4053
Samples
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of