TPD8S300RUKR

TPD8S300RUKR

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    WQFN20_3X3MM_EP

  • 描述:

    TPD8S300 USB Type-C™ 端口保护器:VBUS 短路过压和 8 通道 ESD 保护

  • 详情介绍
  • 数据手册
  • 价格&库存
TPD8S300RUKR 数据手册
Product Folder Order Now Tools & Software Technical Documents Support & Community TPD8S300 SLVSDD6B – SEPTEMBER 2016 – REVISED NOVEMBER 2016 TPD8S300 USB Type-C™ Port Protector: Short-to-VBUS Overvoltage and IEC ESD Protection • • • • 4-Channels of Short-to-VBUS Overvoltage Protection (CC1, CC2, SBU1, SBU2): 24-VDC Tolerant 8-Channels of IEC 61000-4-2 ESD Protection (CC1, CC2, SBU1, SBU2, DP_T, DM_T, DP_B, DM_B) CC1, CC2 Overvoltage Protection FETs 600 mA capable for passing VCONN power CC Dead Battery Resistors integrated for handling dead battery use case in mobile devices 3-mm × 3-mm WQFN Package 2 Applications • • • • • Laptop PC Tablets Smartphones Monitors and TVs Docking Stations Finally, most systems require IEC 61000-4-2 system level ESD protection for their external pins. The TPD8S300 integrates IEC 61000-4-2 ESD protection for the CC1, CC2, SBU1, SBU2, DP_T (Top side D+), DM_T (Top Side D–), DP_B (Bottom Side D+), DM_B (Bottom Side D–) pins, removing the need to place high voltage TVS diodes externally on the connector. Device Information(1) PART NUMBER TPD8S300 3 Description The TPD8S300 is a single chip USB Type-C port protection solution that provides 20-V Short-to-VBUS overvoltage and IEC ESD protection. Since the release of the USB Type-C connector, many products and accessories for USB Type-C have been released which do not meet the USB Type-C specification. One example of this is USB Type-C Power Delivery adaptors that only place 20 V on the VBUS line. Another concern for USB Type-C is that mechanical twisting and sliding of the connector could short pins due to the close proximity they have in this small connector. This can cause 20-V VBUS to be shorted to the CC and SBU pins. Also, due to the close proximity of the pins in the Type-C connector, there is a heightened concern that debris and moisture will cause the 20-V VBUS pin to be shorted to the CC and SBU pins. PACKAGE WQFN (20) BODY SIZE (NOM) 3.00 mm × 3.00 mm (1) For all available packages, see the orderable addendum at the end of the data sheet. Application Diagram Battery FET OVP FET OVP, OCP 5V DC/DC VBUS • 1 These non-ideal equipments and mechanical events make it necessary for the CC and SBU pins to be 20V tolerant, even though they only operate at 5 V or lower. The TPD8S300 enables the CC and SBU pins to be 20-V tolerant without interfering with normal operation by providing overvoltage protection on the CC and SBU pins. The device places high voltage FETs in series on the SBU and CC lines. When a voltage above the OVP threshold is detected on these lines, the high voltage switches are opened up, isolating the rest of the system from the high voltage condition present on the connector. TPD8S300 OVP & ESD AUX_P AUX_M DP DM CC Analog USB PD Phy & Controller Power Switch Control SBU Mux D+/D- Mux DM_B DP_B DM_T DP_T SBU2 SBU1 CC2 CC1 1 Features Copyright © 2016, Texas Instruments Incorporated 1 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA. TPD8S300 SLVSDD6B – SEPTEMBER 2016 – REVISED NOVEMBER 2016 www.ti.com Table of Contents 1 2 3 4 5 6 7 Features .................................................................. Applications ........................................................... Description ............................................................. Revision History..................................................... Device Comparison Table..................................... Pin Configuration and Functions ......................... Specifications......................................................... 7.1 7.2 7.3 7.4 7.5 7.6 7.7 7.8 8 1 1 1 2 3 3 5 Absolute Maximum Ratings ...................................... 5 ESD Ratings—JEDEC Specification......................... 5 ESD Ratings—IEC Specification .............................. 5 Recommended Operating Conditions....................... 5 Thermal Information .................................................. 6 Electrical Characteristics........................................... 6 Timing Requirements ................................................ 9 Typical Characteristics ............................................ 10 Detailed Description ............................................ 15 8.1 Overview ................................................................. 15 8.2 Functional Block Diagram ....................................... 16 8.3 Feature Description................................................. 16 8.4 Device Functional Modes........................................ 19 9 Application and Implementation ........................ 20 9.1 Application Information............................................ 20 9.2 Typical Application ................................................. 20 10 Power Supply Recommendations ..................... 25 11 Layout................................................................... 26 11.1 Layout Guidelines ................................................. 26 11.2 Layout Example .................................................... 26 12 Device and Documentation Support ................. 27 12.1 12.2 12.3 12.4 12.5 12.6 Documentation Support ........................................ Receiving Notification of Documentation Updates Community Resources.......................................... Trademarks ........................................................... Electrostatic Discharge Caution ............................ Glossary ................................................................ 27 27 27 27 27 27 13 Mechanical, Packaging, and Orderable Information ........................................................... 27 4 Revision History NOTE: Page numbers for previous revisions may differ from page numbers in the current version. Changes from Revision A (September 2016) to Revision B • 2 Page First public release of the data sheet ..................................................................................................................................... 1 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: TPD8S300 TPD8S300 www.ti.com SLVSDD6B – SEPTEMBER 2016 – REVISED NOVEMBER 2016 5 Device Comparison Table Part Number Over Voltage Protected Channels IEC 61000-4-2 ESD Protected Channels TPD6S300 4-Ch (CC1, CC2, SBU1, SBU2) 6-Ch (CC1, CC2, SBU1, SBU2, DP, DM) TPD8S300 4-Ch (CC1, CC2, SBU1, SBU2) 8-Ch (CC1, CC2, SBU1, SBU2, DP_T, DM_T, DP_B, DM_B) 6 Pin Configuration and Functions RUK Package 20 Pin WQFN Top View CC1 GND SBU2 SBU1 16 CC2 11 15 D4 VPWR 10 D3 FLT GND GND 1 C_CC2 RPD_G2 6 C_CC1 D1 VBIAS RPD_G1 C_SBU2 D2 C_SBU1 20 Thermal Pad 5 Pin Functions PIN NO. NAME TYPE DESCRIPTION 1 C_SBU1 I/O Connector side of the SBU1 OVP FET. Connect to either SBU pin of the USB Type-C connector 2 C_SBU2 I/O Connector side of the SBU2 OVP FET. Connect to either SBU pin of the USB Type-C connector 3 VBIAS Power 4 C_CC1 I/O Connector side of the CC1 OVP FET. Connect to either CC pin of the USB Type-C connector 5 C_CC2 I/O Connector side of the CC2 OVP FET. Connect to either CC pin of the USB Type-C connector 6 RPD_G2 I/O Short to C_CC2 if dead battery resistors are needed. If dead battery resistors are not needed, short pin to GND 7 RPD_G1 I/O Short to C_CC1 if dead battery resistors are needed. If dead battery resistors are not needed, short pin to GND 8 GND GND 9 FLT O 10 VPWR Power 11 CC2 I/O System side of the CC2 OVP FET. Connect to either CC pin of the CC/PD controller 12 CC1 I/O System side of the CC1 OVP FET. Connect to either CC pin of the CC/PD controller 13 GND GND Pin for ESD support capacitor. Place a 0.1-µF capacitor on this pin to ground Ground Open drain for fault reporting 2.7-V-3.6-V power supply Ground Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: TPD8S300 3 TPD8S300 SLVSDD6B – SEPTEMBER 2016 – REVISED NOVEMBER 2016 www.ti.com Pin Functions (continued) PIN NO. NAME TYPE DESCRIPTION 14 SBU2 I/O System side of the SBU2 OVP FET. Connect to either SBU pin of the SBU MUX 15 SBU1 I/O System side of the SBU1 OVP FET. Connect to either SBU pin of the SBU MUX 16 D4 I/O USB2.0 IEC ESD protection. Connect to any of the USB2.0 pins of the USB Type-C connector 17 D3 I/O USB2.0 IEC ESD protection. Connect to any of the USB2.0 pins of the USB Type-C connector 18 GND GND 19 D2 I/O USB2.0 IEC ESD protection. Connect to any of the USB2.0 pins of the USB Type-C connector 20 D1 I/O USB2.0 IEC ESD protection. Connect to any of the USB2.0 pins of the USB Type-C connector — Thermal Pad GND 4 Ground Internally connected to GND. Used as a heatsink. Connect to the PCB GND plane Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: TPD8S300 TPD8S300 www.ti.com SLVSDD6B – SEPTEMBER 2016 – REVISED NOVEMBER 2016 7 Specifications 7.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) VI Input voltage VO Output voltage VIO I/O voltage MIN MAX UNIT VPWR –0.3 4 V RPD_G1, RPD_G2 –0.3 24 V FLT –0.3 6 V VBIAS –0.3 24 V D1, D2, D3, D4 –0.3 6 V CC1, CC2, SBU1, SBU2 –0.3 6 V C_CC1, C_CC2, C_SBU1, C_SBU2 –0.3 24 V TA Operating free air temperature –40 85 °C Tstg Storage temperature –65 150 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 7.2 ESD Ratings—JEDEC Specification VALUE V(ESD) (1) (2) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1) ±2000 Charged-device model (CDM), per JEDEC specification JESD22C101 (2) ±500 UNIT V JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. Pins listed as ±2000 V may actually have higher performance. JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. Pins listed as ±500 V may actually have higher performance. 7.3 ESD Ratings—IEC Specification VALUE V(ESD) Electrostatic discharge (1) IEC 61000-4-2, C_CC1, C_CC2, D1, D2, D3, D4 IEC 61000-4-2, C_SBU1, C_SBU2 (1) Contact discharge ±8000 Air-gap discharge ±15000 Contact discharge ±6000 Air-gap discharge ±15000 UNIT V Tested on the TPD8S300 EVM connected to the TPS65982 EVM. 7.4 Recommended Operating Conditions over operating free-air temperature range (unless otherwise noted) VI Input voltage VO Output voltage VIO I/O voltage VPWR RPD_G1, RPD_G2 FLT pull-up resistor power rail D1, D2, D3, D4 MIN NOM MAX 2.7 3.3 UNIT 3.6 V 0 5.5 V 2.7 5.5 V –0.3 5.5 V CC1, CC2, C_CC1, C_CC2 0 5.5 V SBU1, SBU2, C_SBU1, C_SBU2 0 4.3 V 600 mA 1.25 A IVCONN VCONN current Current flowing into CC1/2 and flowing out of C_CC1/2, VCCx – VC_CCx ≤ 250 mV IVCONN VCONN current Current flowing into CC1/2 and flowing out of C_CC1/2, TJ ≤ 105°C Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: TPD8S300 5 TPD8S300 SLVSDD6B – SEPTEMBER 2016 – REVISED NOVEMBER 2016 www.ti.com Recommended Operating Conditions (continued) over operating free-air temperature range (unless otherwise noted) MIN FLT pull-up resistance External components (1) 1.7 VBIAS capacitance (2) VPWR capacitance (1) (2) NOM MAX UNIT 300 kΩ 0.1 µF 1 µF 0.3 For recommended values for capacitors and resistors, the typical values assume a component placed on the board near the pin. Minimum and maximum values listed are inclusive of manufacturing tolerances, voltage derating, board capacitance, and temperature variation. The effective value presented must be within the minimum and maximums listed in the table. The VBIAS pin requires a minimum 35-VDC rated capacitor. A 50-VDC rated capacitor is recommended to reduce capacitance derating. See the VBIAS Capacitor Selection section for more information on selecting the VBIAS capacitor. 7.5 Thermal Information TPD8S300 THERMAL METRIC (1) RUK (WQFN) UNIT 20 PINS RθJA Junction-to-ambient thermal resistance 45.2 °C/W RθJC(top) Junction-to-case (top) thermal resistance 48.8 °C/W RθJB Junction-to-board thermal resistance 17.1 °C/W ψJT Junction-to-top characterization parameter 0.6 °C/W ψJB Junction-to-board characterization parameter 17.1 °C/W RθJC(bot) Junction-to-case (bottom) thermal resistance 3.7 °C/W (1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report. 7.6 Electrical Characteristics over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT CC OVP Switches On resistance of CC OVP FETs, TJ ≤ 85°C CCx = 5.5 V 278 392 mΩ On resistance of CC OVP FETs, TJ ≤ 105°C CCx = 5.5 V 278 415 mΩ RONFLAT On resistance flatness Sweep CCx voltage between 0 V and 1.2 V 5 mΩ CON_CC Equivalent on capacitance Capacitance from C_CCx or CCx to GND when device is powered. VC_CCx/VCCx = 0 V to 1.2 V , f = 400 kHz 60 74 120 pF RD_DB Dead battery pull-down resistance (only present when device is unpowered). Effective resistance of RD and FET in series V_C_CCx = 2.6 V 4.1 5.1 6.1 kΩ VTH_DB Threshold voltage of the pulldown FET in series with RD during dead battery I_CC = 80 µA 0.5 0.9 1.2 V VOVPCC OVP threshold on CC pins Place 5.5 V on C_CCx. Step up C_CCx until the FLT pin is asserted 5.75 6 6.2 V Hysteresis on CC OVP Place 6.5 V on C_CCx. Step down the voltage on C_CCx until the FLT pin is deasserted. Measure difference between rising and falling OVP threshold for CC RON VOVPCC_HYS 6 Submit Documentation Feedback 50 mV Copyright © 2016, Texas Instruments Incorporated Product Folder Links: TPD8S300 TPD8S300 www.ti.com SLVSDD6B – SEPTEMBER 2016 – REVISED NOVEMBER 2016 Electrical Characteristics (continued) over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT BWON On bandwidth single ended (–3 dB) Measure the –3-dB bandwidth from C_CCx to CCx. Single ended measurement, 50-Ω system. Vcm = 0.1 V to 1.2 V VSTBUS_CC Short-to-VBUS tolerance on the CC pins Hot-Plug C_CCx with a 1 meter USB Type C Cable, place a 30-Ω load on CCx VSTBUS_CC_CLAMP Short-to-VBUS system-side clamping voltage on the CC pins (CCx) Hot-Plug C_CCx with a 1 meter USB Type C Cable. Hot-Plug voltage C_CCx = 24 V. VPWR = 3.3 V. Place a 30-Ω load on CCx 8 RON On resistance of SBU OVP FETs SBUx = 3.6 V. –40°C ≤ TJ ≤ +85°C 4 6.5 Ω RONFLAT On resistance flatness Sweep SBUx voltage between 0 V and 3.6 V. –40°C ≤ TJ ≤ +85°C 0.7 1.5 Ω CON_SBU Equivalent on capacitance Capacitance from SBUx or C_SBUx to GND when device is powered. Measure at VC_SBUx/VSBUx = 0.3 V to 3.6 V VOVPSBU OVP threshold on SBU pins Place 3.6 V on C_SBUx. Step up C_SBUx until the FLT pin is asserted VOVPSBU_HYS Hysteresis on SBU OVP Place 5 V on C_CCx. Step down the voltage on C_CCx until the FLT pin is deasserted. Measure difference between rising and falling OVP threshold for C_SBUx BWON On bandwidth single ended (–3 dB) Measure the –3-dB bandwidth from C_SBUx to SBUx. Single ended measurement, 50-Ω system. Vcm = 0.1 V to 3.6 V XTALK Crosstalk Measure crosstalk at f = 1 MHz from SBU1 to C_SBU2 or SBU2 to C_SBU1. Vcm1 = 3.6 V, Vcm2 = 0.3 V. Be sure to terminate open sides to 50 Ω VSTBUS_SBU Short-to-VBUS tolerance on the SBU pins Hot-Plug C_SBUx with a 1 meter USB Type C Cable. Put a 150-nF capacitor in series with a 40-Ω resistor to GND on SBUx VSTBUS_SBU_CLAMP Short-to-VBUS system-side clamping voltage on the SBU pins (SBUx) Hot-Plug C_SBUx with a 1 meter USB Type C Cable. Hot-Plug voltage C_SBUx = 24 V. VPWR = 3.3 V. Put a 100-nF capacitor in series with a 40-Ω resistor to GND on SBUx 100 MHz 24 V V SBU OVP Switches 6 4.35 4.5 pF 4.7 V 50 mV 1000 MHz –80 dB 24 8 V V Power Supply and Leakage Currents VPWR_UVLO VPWR_UVLO_HYS VPWR under voltage lockout Place 1 V on VPWR and raise voltage until SBU or CC FETs turnon 2.1 2.3 2.5 V VPWR UVLO hysteresis Place 3 V on VPWR and lower voltage until SBU or CC FETs turnoff; measure difference between rising and falling UVLO to calculate hysteresis 100 150 200 mV Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: TPD8S300 7 TPD8S300 SLVSDD6B – SEPTEMBER 2016 – REVISED NOVEMBER 2016 www.ti.com Electrical Characteristics (continued) over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT 90 120 µA VPWR supply current VPWR = 3.3 V (typical), VPWR = 3.6 V (maximum). –40°C ≤ TJ ≤ +85°C. Leakage current for CC pins when device is powered VPWR = 3.3 V, VC_CCx = 3.6 V, CCx pins are floating, measure leakage into C_CCx pins. Result must be same if CCx side is biased and C_CCx is left floating. 5 µA ISBU_LEAK Leakage current for SBU pins when device is powered VPWR = 3.3 V, VC_SBUx = 3.6 V, SBUx pins are floating, measure leakge into C_SBUx pins. Result must be same if SBUx side is biased and C_SBUx is left floating. –40°C ≤ TJ ≤ 85°C. 3 µA IC_CC_LEAK_OVP Leakage current for CC pins when device is in OVP VPWR = 0 V or 3.3 V, VC_CCx = 24 V, CCx pins are set to 0 V, measure leakage into C_CCx pins 1200 µA IC_SBU_LEAK_OVP Leakage current for SBU pins when device is in OVP VPWR = 0 V or 3.3 V, VC_SBUx = 24 V, SBUx pins are set to 0 V, measure leakage into C_SBUx pins 400 µA ICC_LEAK_OVP Leakage current for CC pins when device is in OVP VPWR = 0 V or 3.3 V, VC_CCx = 24 V, CCx pins are set to 0 V, measure leakage out of CCx pins 30 µA ISBU_LEAK_OVP Leakage current for SBU pins when device is in OVP VPWR = 0 V or 3.3 V, VC_SBUx = 24 V, SBUx pins are set to 0 V, measure leakage out of SBUx pins 1 µA IDx_LEAK Leakage current for Dx pins V_Dx = 3.6 V, measure leakage into Dx pins 1 µA Low-level output voltage IOL = 3 mA. Measure the voltage at the FLT pin 0.4 V IVPWR ICC_LEAK –1 FLT Pin VOL Over Temperature Protection TSD_RISING The rising over-temperature protection shutdown threshold 150 175 °C TSD_FALLING The falling over-temperature protection shutdown threshold 130 140 °C TSD_HYST The over-temperature protection shutdown threshold hysteresis 35 °C Dx ESD Protection VRWM_POS Reverse stand-off voltage from Dx to GND VRWM_NEG Reverse stand-off voltage from GND GND to Dx to Dx VBR_POS Break-down voltage from Dx to GND Dx to GND. IBR = 1 mA 7 V VBR_NEG Break-down voltage from GND to Dx GND to Dx. IBR = 8 mA 0.6 V CIO Dx to GND or GND to Dx f = 1 MHz, VIO = 2.5 V 1.7 pF ΔCIO Differential capacitance between two Dx pins f = 1 MHz, VIO = 2.5 V 0.02 pF RDYN Dynamic on-resistance Dx IEC clamps Dx to GND or GND to Dx 0.4 Ω 8 Dx to GND. IDX ≤ 1 µA Submit Documentation Feedback 5.5 V 0 V Copyright © 2016, Texas Instruments Incorporated Product Folder Links: TPD8S300 TPD8S300 www.ti.com SLVSDD6B – SEPTEMBER 2016 – REVISED NOVEMBER 2016 7.7 Timing Requirements MIN NOM MAX UNIT Power-On and Off Timings tON Time from crossing rising VPWR UVLO until CC and SBU OVP FETs are on dVPWR_OFF/dt Minimum slew rate allowed to guarantee CC and SBU FETs turnoff during a power off 3.5 –0.5 ms V/µs Over Voltage Protection tOVP_RESPONSE_CC OVP response time on the CC pins. Time from OVP asserted until OVP FETs turnoff 70 ns tOVP_RESPONSE_SBU OVP response time on the SBU pins. Time from OVP asserted until OVP FETs turnoff 80 ns tOVP_RECOVERY_CC_ OVP recovery time on the CC pins. Once an OVP has occurred, the minimum time duration until the CC FETs turn back on. OVP must be removed for CC FETs to turn back on 21 29 39 ms OVP recovery time on the SBU pins. Once an OVP has occurred, the minimum time duration until the SBU FETs turn back on. OVP must be removed for SBU FETs to turn back on 21 29 39 ms 1 tOVP_RECOVERY_SBU _1 tOVP_RECOVERY_CC_ OVP recovery time on the CC pins. Time from OVP removal until CC FET turns back on, if device has been in OVP > 40 ms 0.5 ms OVP recovery time on the SBU pins. Time from OVP removal until SBU FET turns back on, if device has been in OVP > 40 ms 0.5 ms _2 tOVP_FLT_ASSERTION Time from OVP asserted to FLT assertion 20 µs tOVP_FLT_DEASSERTI Time from CC FET turnon after an OVP to FLT deassertion 5 ms 2 tOVP_RECOVERY_SBU ON Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: TPD8S300 9 TPD8S300 SLVSDD6B – SEPTEMBER 2016 – REVISED NOVEMBER 2016 www.ti.com 7.8 Typical Characteristics 0 0 -10 -20 Crosstalk (dB) Insertion Loss (dB) -3 -6 -9 -30 -40 -50 -60 -70 SBUx to C_SBUx -12 1E+7 -80 1E+8 Frequency (Hz) 1E+9 3E+9 0 1E+9 2E+9 Frequency (Hz) D016 Figure 2. SBU Crosstalk VC_SBU1 IC_SBU1 VSBU1 V/FLT VC_SBU1 IC_SBU1 VSBU1 V/FLT 8.5 6.5 4.5 2.5 0.5 0.2 0.45 0.7 0.95 1.2 Time (Ps) 1.45 1.7 -1.5 -2.2 -0.2 1.95 1.8 3.8 D014 Figure 3. SBU Short-to-VBUS 20 V 5.8 7.8 9.8 Time (Ps) 11.8 13.8 15.8 17.8 D014 Figure 4. SBU Short-to-VBUS 5 V 140 7 -40qC 25qC 85qC 125qC 120 100 80 Voltage (V) 6 RON (:) D017 10.5 Voltage (V) or Current (A) Voltage (V) or Current (A) Figure 1. SBU S21 BW 30.5 28.5 26.5 24.5 22.5 20.5 18.5 16.5 14.5 12.5 10.5 8.5 6.5 4.5 2.5 0.5 -1.5 -0.05 3E+9 5 4 60 40 20 0 -20 3 -40 C_SBU SBU -60 2 0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 VSBU1 (V) Figure 5. SBU RON Flatness 10 3 3.3 3.6 -80 -10 0 D014 10 20 30 40 50 60 Time (ns) 70 80 90 100 110 D001 Figure 6. SBU IEC 61000-4-2 4-kV Response Waveform Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: TPD8S300 TPD8S300 www.ti.com SLVSDD6B – SEPTEMBER 2016 – REVISED NOVEMBER 2016 Typical Characteristics (continued) 80 2.5 C_SBU1 C_SBU2 60 2 Leakge Current (PA) 40 Voltage (V) 20 0 -20 -40 -60 1.5 1 0.5 C_SBU SBU -80 -100 -10 0 10 20 30 40 50 60 Time (ns) 70 80 0 -40 -30 -20 -10 90 100 110 Figure 7. SBU IEC 61000-4-2 –4-kV Response Waveform 10 20 30 40 Temperature (qC) 50 60 70 8085 D014 Figure 8. SBU Path Leakage Current vs Ambient Temperature at 3.6 V 500 0.000125 C_SBU1 at 24 V C_SBU2 at 24 V C_SBU1 at 5.5 V C_SBU2 at 5.5 V 400 SBU1: C_SBU1 at 24 V SBU2: C_SBU2 at 24 V SBU1: C_SBU1 at 5.5 V SBU2: C_SBU2 at 5.5 V 0.0001 Leakage Current (PA) 450 Leakage Current (PA) 0 D001 350 300 250 200 150 7.5E-5 5E-5 100 2.5E-5 50 0 -40 -30 -20 -10 0 10 20 30 40 Temperature (qC) 50 60 70 0 -40 -30 -20 -10 8085 0 D014 Figure 9. C_SBU OVP Leakage Current vs Ambient Temperature at 5.5 V and 24 V 10 20 30 40 Temperature (qC) 50 60 70 8085 D014 Figure 10. SBU OVP Leakage Current vs Ambient Temperature at 5.5 V and 24 V 30 3.6 C_SBU 3.3 25 3 2.7 20 Current (A) Voltage (V) 2.4 2.1 1.8 1.5 15 10 1.2 0.9 VPWR C_SBU1 SBU1 0.6 0.3 0 -3 5 0 -2 -1 0 1 2 3 Time (ms) 4 5 6 7 0 5 D014 Figure 11. SBU FET Turnon Timing 10 15 20 25 Voltage (V) 30 35 40 D005 Figure 12. C_SBU TLP Curve Unpowered Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: TPD8S300 11 TPD8S300 SLVSDD6B – SEPTEMBER 2016 – REVISED NOVEMBER 2016 www.ti.com Typical Characteristics (continued) 0 1 0.75 -3 Insertion Loss (dB) Current (mA) 0.5 0.25 0 -0.25 -6 -9 -0.5 -0.75 C_SBU -1 -5 0 5 10 15 20 Voltage (V) 25 30 -12 1E+7 35 1E+8 Frequency (Hz) D003 3E+9 D016 Figure 14. CC S21 BW 0.6 -40qC 25qC 85qC 125qC 0.5 0.4 RON (:) Voltage (V) or Current (A) Figure 13. SBU IV Curve 30.5 VC_CC1 28.5 IC_CC1 26.5 VCC1 24.5 V/FLT 22.5 20.5 18.5 16.5 14.5 12.5 10.5 8.5 6.5 4.5 2.5 0.5 -1.5 -0.3 -0.1 0.1 1E+9 0.3 0.2 0.1 0 0.3 0.5 0.7 0.9 Time (Ps) 1.1 1.3 1.5 1.71.8 0 0.2 0.4 D014 Figure 15. CC Short-to-VBUS 20 V 0.6 VCC1 (V) 0.8 1 1.2 D014 Figure 16. CC RON Flatness 140 80 120 60 100 40 20 60 Voltage (V) Voltage (V) 80 40 20 0 0 -20 -40 -20 -60 -40 C_CC CC -60 -80 -10 0 10 20 30 40 50 60 Time (ns) 70 80 90 100 110 -100 -10 0 D001 Figure 17. CC IEC 61000-4-2 8-kV Response Waveform 12 C_CC CC -80 10 20 30 40 50 60 Time (ns) 70 80 90 100 110 D001 Figure 18. CC IEC 61000-4-2 –8-kV Response Waveform Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: TPD8S300 TPD8S300 www.ti.com SLVSDD6B – SEPTEMBER 2016 – REVISED NOVEMBER 2016 Typical Characteristics (continued) 1030 20 C_CC1 C_CC2 19 1025 17 Leakge Current (PA) Leakge Current (PA) 18 C_CC1 C_CC2 16 15 14 13 12 11 1020 1015 1010 1005 10 9 8 -40 -30 -20 -10 0 10 20 30 40 Temperature (qC) 50 60 70 1000 -40 -30 -20 -10 8085 0 D014 Figure 19. C_CC Path Leakage Current vs Ambient Temperature at C_CC = 5.5 V 10 20 30 40 Temperature (qC) 50 60 70 8085 D014 Figure 20. C_CC OVP Leakage Current vs Ambient Temperature at C_CC = 24 V 4.3E-4 5.5 CC1: C_CC1 at 24 V CC2: C_CC2 at 24 V 3.8E-4 5 3.3E-4 4 2.8E-4 3.5 Voltage (V) Leakge Current (PA) 4.5 2.3E-4 1.8E-4 3 2.5 2 1.5 1.3E-4 1 8E-5 VPWR C_CC1 CC1 0.5 3E-5 -40 -30 -20 -10 0 10 20 30 40 Temperature (qC) 50 60 70 0 -3 8085 -2 -1 0 D014 Figure 21. CC OVP Leakage Current vs Ambient Temperature at C_CC = 24 V 1 2 3 Time (ms) 4 5 6 7 D014 Figure 22. CC FET Turnon Timing 1 30 C_CC 0.75 25 0.5 Current (mA) Current (A) 20 15 10 0.25 0 -0.25 -0.5 5 -0.75 C_CC 0 0 5 10 15 20 25 Voltage (V) 30 35 40 45 -1 -5 D005 D003 Figure 23. C_CC TLP Curve Unpowered 0 5 10 15 Voltage (V) 20 25 Product Folder Links: TPD8S300 D003 Figure 24. C_CC IV Curve Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated 30 13 TPD8S300 SLVSDD6B – SEPTEMBER 2016 – REVISED NOVEMBER 2016 www.ti.com Typical Characteristics (continued) 7 100 Dx at 3.6 V Dx at 0.4 V IVPWR 97.5 6 Leakage Current (nA) Current (PA) 95 92.5 90 87.5 85 5 4 3 2 1 82.5 80 -40 -30 -20 -10 0 10 20 30 40 Temperature (qC) 50 60 70 0 -40 -30 -20 -10 8085 0 10 20 30 40 Temperature (qC) D014 Figure 25. VPWR Supply Leakage vs Ambient Temperature at 3.6 V 50 60 70 8085 D014 Figure 26. Dx Leakage Current vs Ambient Temperature at 0.4 V and 3.6 V 1 30 Dx 0.75 25 20 0.25 Current (A) Current (mA) 0.5 0 -0.25 15 10 -0.5 5 -0.75 Dx -1 -2 0 0 2 4 Voltage (V) 6 8 10 0 2 D003 Figure 27. Dx IV Curve 14 4 6 8 10 Voltage (V) 12 14 16 18 D005 D003 Figure 28. Dx TLP Curve Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: TPD8S300 TPD8S300 www.ti.com SLVSDD6B – SEPTEMBER 2016 – REVISED NOVEMBER 2016 8 Detailed Description 8.1 Overview The TPD8S300 is a single chip USB Type-C port protection solution that provides 20-V Short-to-VBUS overvoltage and IEC ESD protection. Due to the small pin pitch of the USB Type-C connector and non-compliant USB Type-C cables and accessories, the VBUS pins can get shorted to the CC and SBU pins inside the USB Type-C connector. Because of this short-to-VBUS event, the CC and SBU pins need to be 20-V tolerant, to support protection on the full USB PD voltage range. Even if a device does not support 20-V operation on VBUS, non complaint adaptors can start out with 20-V VBUS condition, making it necessary for any USB Type-C device to support 20 V protection. The TPD8S300 integrates four channels of 20-V Short-to-VBUS overvoltage protection for the CC1, CC2, SBU1, and SBU2 pins of the USB Type-C connector. Additionally, IEC 61000-4-2 system level ESD protection is required in order to protect a USB Type-C port from ESD strikes generated by end product users. The TPD8S300 integrates eight channels of IEC61000-4-2 ESD protection for the CC1, CC2, SBU1, SBU2, DP_T (Top side D+), DM_T (Top Side D–), DP_B (Bottom Side D+), and DM_B (Bottom Side D–) pins of the USB Type-C connector. This means IEC ESD protection is provided for all of the low-speed pins on the USB Type-C connector in a single chip in the TPD8S300. Additionally, highvoltage IEC ESD protection that is 22-V DC tolerant is required for the CC and SBU lines in order to simultaneously support IEC ESD and Short-to-VBUS protection; there are not many discrete market solutions that can provide this kind of protection. This high-voltage IEC ESD diode is what the TPD8S300 integrates, specifically designed to guarantee it works in conjunction with the overvoltage protection FETs inside the device. This sort of solution is very hard to generate with discrete components. Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: TPD8S300 15 TPD8S300 SLVSDD6B – SEPTEMBER 2016 – REVISED NOVEMBER 2016 www.ti.com 8.2 Functional Block Diagram Over-voltage Protection Control Logic And Charge Pumps VPWR FLT C_SBU1 SBU1 ESD Clamps System Clamps C_SBU2 SBU2 VBIAS C_CC1 CC1 System Clamps ESD Clamps C_CC2 CC2 /VPWR RD RPD_G1 /VPWR RD RPD_G2 D1 D2 D3 D4 Copyright © 2016, Texas Instruments Incorporated 8.3 Feature Description 8.3.1 4-Channels of Short-to-VBUS Overvoltage Protection (CC1, CC2, SBU1, SBU2 Pins): 24-VDC Tolerant The TPD8S300 provides 4-channels of Short-to-VBUS Overvoltage Protection for the CC1, CC2, SBU1, and SBU2 pins of the USB Type-C connector. The TPD8S300 is able to handle 24-VDC on its C_CC1, C_CC2, C_SBU1, and C_SBU2 pins. This is necessary because according to the USB PD specification, with VBUS set for 20-V operation, the VBUS voltage is allowed to legally swing up to 21 V, and 21.5 V on voltage transitions from a different USB PD VBUS voltage. The TPD8S300 builds in tolerance up to 24-VBUS to provide margin above this 21.5 V specification to be able to support USB PD adaptors that may break the USB PD specification. When a short-to-VBUS event occurs, ringing happens due to the RLC elements in the hot-plug event. With very low resistance in this RLC circuit, ringing up to twice the settling voltage can appear on the connector. More than 2x ringing can be generated if any capacitor on the line derates in capacitance value during the short-to-VBUS event. This means that more than 44 V could be seen on a USB Type-C pin during a Short-to-VBUS event. The TPD8S300 has built in circuit protection to handle this ringing. The diode clamps used for IEC ESD protection also clamp the ringing voltage during the short-to-VBUS event to limit the peak ringing to around 30 V. Additionally, the overvoltage protection FETs integrated inside the TPD8S300 are 30-V tolerant, therefore being capable of supporting the high-voltage ringing waveform that is experienced during the short-to-VBUS event. The well designed combination of voltage clamps and 30-V tolerant OVP FETs insures the TPD8S300 can handle Short-to-VBUS hot-plug events with hot-plug voltages as high as 24-VDC. 16 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: TPD8S300 TPD8S300 www.ti.com SLVSDD6B – SEPTEMBER 2016 – REVISED NOVEMBER 2016 Feature Description (continued) The TPD8S300 has an extremely fast turnoff time of 70 ns typical. Furthermore, additional voltage clamps are placed after the OVP FET on the system side (CC1, CC2, SBU1, SBU2) pins of the TPD8S300, to further limit the voltage and current that is exposed to the USB Type-C CC/PD controller during the 70 ns interval while the OVP FET is turning off. The combination of connector side voltage clamps, OVP FETs with extremely fast turnoff time, and system side voltage clamps all work together to insure the level of stress seen on a CC1, CC2, SBU1, or SBU2 pin during a short-to-VBUS event is less than or equal to an HBM event. This is done by design, as any USB Type-C CC/PD controller will have built in HBM ESD protection. Figure 29 is an example of the TPD8S300 successfully protecting the TPS65982, the world's first fully integrated, full-featured USB Type-C and PD controller. Figure 29. TPD8S300 Protecting the TPS65982 During a Short-to-VBUS Event 8.3.2 8-Channels of IEC 61000-4-2 ESD Protection (CC1, CC2, SBU1, SBU2, DP_T, DM_T, DP_B, DM_B Pins) The TPD8S300 integrates 8-Channels of IEC 61000-4-2 system level ESD protection for the CC1, CC2, SBU1, SBU2, DP_T (Top side D+), DM_T (Top Side D–), DP_B (Bottom Side D+), and DM_B (Bottom Side D–) pins. USB Type-C ports on end-products need system level IEC ESD protection in order to provide adequate protection for the ESD events that the connector can be exposed to from end users. The TPD8S300 integrates IEC ESD protection for all of the low-speed pins on the USB Type-C connector in a single chip. Also note, that while the RPD_Gx pins are not individually rated for IEC ESD, when they are shorted to the C_CCx pins, the C_CCx pins provide protection for both the C_CCx pins and the RPD_Gx pins. Additionally, high-voltage IEC ESD protection that is 24-V DC tolerant is required for the CC and SBU lines in order to simultaneously support IEC ESD and Short-to-VBUS protection; there are not many discrete market solutions that can provide this kind of protection. The TPD8S300 integrates this type of high-voltage ESD protection so a system designer can meet both IEC ESD and Short-to-VBUS protection requirements in a single device. 8.3.3 CC1, CC2 Overvoltage Protection FETs 600 mA Capable for Passing VCONN Power The CC pins on the USB Type-C connector serve many functions; one of the functions is to be a provider of power to active cables. Active cables are required when desiring to pass greater than 3 A of current on the VBUS line or when the USB Type-C port uses the super-speed lines (TX1+, TX2–, RX1+, RX1–, TX2+, TX2–, RX2+, RX2–). When CC is configured to provide power, it is called VCONN. VCONN is a DC voltage source in the range of 3 V-5.5 V. If supporting VCONN, a VCONN provider must be able to provide 1 W of power to a cable; this translates into a current range of 200 mA to 333 mA (depending on your VCONN voltage level). Additionally, if operating in a USB PD alternate mode, greater power levels are allowed on the VCONN line. Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: TPD8S300 17 TPD8S300 SLVSDD6B – SEPTEMBER 2016 – REVISED NOVEMBER 2016 www.ti.com Feature Description (continued) When a USB Type-C port is configured for VCONN and using the TPD8S300, this VCONN current flows through the OVP FETs of the TPD8S300. Therefore, the TPD8S300 has been designed to handle these currents and have an RON low enough to provide a specification compliant VCONN voltage to the active cable. The TPD8S300 is designed to handle up to 600 mA of DC current to allow for alternate mode support in addition to the standard 1 W required by the USB Type-C specification. 8.3.4 CC Dead Battery Resistors Integrated for Handling the Dead Battery Use Case in Mobile Devices An important feature of USB Type-C and USB PD is the ability for this connector to serve as the sole power source to mobile devices. With support up to 100 W, the USB Type-C connector supporting USB PD can be used to power a whole new range of mobile devices not previously possible with legacy USB connectors. When the USB Type-C connector is the sole power supply for a battery powered device, the device must be able to charge from the USB Type-C connector even when its battery is dead. In order for a USB Type-C power adapter to supply power on VBUS, RD pull-down resistors must be exposed on the CC pins. These RD resistors are typically included inside a USB Type-C CC/PD controller. However, when the TPD8S300 is used to protect the USB Type-C port, the OVP FETs inside the device isolates these RD resistors in the CC/PD controller when the mobile device has no power. This is because when the TPD8S300 has no power, the OVP FETs are turned off to guarantee overvoltage protection in a dead battery condition. Therefore, the TPD8S300 integrates highvoltage, dead battery RD pull-down resistors to allow dead battery charging simultaneously with high-voltage OVP protection. If dead battery support is required, short the RPD_G1 pin to the C_CC1 pin, and short the RPD_G2 pin to the C_CC2 pin. This connects the dead battery resistors to the connector CC pins. When the TPD8S300 is unpowered, and the RP pull-up resistor is connected from a power adaptor, this RP pull-up resistor activates the RD resistor inside the TPD8S300. This enables VBUS to be applied from the power adaptor even in a dead battery condition. Once power is restored back to the system and back to the TPD8S300 on its VPWR pin, the TPD8S300 removes its RD pull-down resistor and turn on its OVP FETs within 3.5 ms to guarantee the RD pulldown resistor inside the CC/PD Controller is exposed within 10 ms. This is by design, because if the RD pulldown resistor is not exposed within 10 ms, the power adaptor can legally interpret this behavior as a port disconnect and remove VBUS. If desiring to power the CC/PD controller during dead battery mode and if the CC/PD Controller is configured as a DRP, it is critical that the TPD8S300 be powered before or at the same time that the CC/PD controller is powered. It is also critical that when unpowered, the CC/PD controller also expose its dead battery resistors. When the TPD8S300 gets powered, it exposes the CC pins of the CC/PD controller within 3.5 ms. Once the TPD8S300 turns on, the RD pull-down resistors of the CC/PD controller must be present immediately, in order to guarantee the power adaptor connected to power the dead battery device keeps its VBUS turned on. If the power adaptor sees any change to its CC voltage for more than 10 ms, it can disconnect VBUS. This removes power from the device with its battery still not sufficiently charged, which consequently removes power from the CC/PD controller and the TPD8S300. Then the RD resistors of the TPD8S300 are exposed again, connect the power adaptor's VBUS to start the cycle over. This creates an infinite loop, never or very slowly charging the mobile device. If the CC/PD Controller is configured for DRP and has started its DRP toggle before the TPD8S300 turns on, this DRP toggle is unable to guarantee that the power adaptor does not disconnect from the port. Therefore, it is recommended if the CC/PD controller is configured for DRP, that its dead battery resistors be exposed as well, and that they remain exposed until the TPD8S300 turns on. This is typically accomplished by powering the TPD8S300 at the same time as the CC/PD controller when powering the CC/PD controller in dead battery operation. If dead battery charging is not required in your application, connect the RPD_G1 and RPD_G2 pins to ground. 8.3.5 3-mm × 3-mm WQFN Package The TPD8S300 comes in a small, 3-mm × 3-mm WQFN package, greatly reducing the size of implementing a similar protection solution discretely. The WQFN package allows support for a wider range of PCB designs. Additionally, the pin-out of the TPD8S300 was designed to optimize routing with the TPS6598x family of USB Type-C/PD controllers. 18 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Product Folder Links: TPD8S300 TPD8S300 www.ti.com SLVSDD6B – SEPTEMBER 2016 – REVISED NOVEMBER 2016 8.4 Device Functional Modes Table 1 describes all of the functional modes for the TPD8S300. The "X" in the below table are "do not care" conditions, meaning any value can be present within the absolute maximum ratings of the datasheet and maintain that functional mode. Also note the D1, D2, D3, D4 pins are not listed, because these pins have IEC ESD protection diodes that are always present, regardless of whether the device is powered and regardless of the conditions on any of the other pins. Table 1. Device Mode Table Device Mode Table MODE Normal Operating Conditions Fault Conditions Inputs Outputs VPWR C_CCx C_SBUx RPD_Gx TJ FLT CC FETs SBU FETs Unpowered, no dead battery support OVP X X, forced OFF UVLO X >OVP X, forced OFF
TPD8S300RUKR
物料型号:TPD8S300 器件简介:TPD8S300是一款USB Type-C端口保护解决方案,提供20V短路至VBUS过电压保护和IEC ESD保护。

引脚分配:该器件采用3mm x 3mm WQFN封装,共有20个引脚,包括CC1、CC2、SBU1、SBU2等。

参数特性:提供4通道短路至VBUS过电压保护,8通道IEC 61000-4-2 ESD保护,支持高达600mA的VCONN电源传输。

功能详解:集成了过压保护FET,当检测到超过OVP阈值的电压时,FET会断开,隔离系统其余部分。

应用信息:适用于笔记本电脑、平板电脑、智能手机、显示器和电视等。

封装信息:3mm x 3mm WQFN封装。
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