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TPL5010-Q1
SNAS679 – SEPTEMBER 2016
TPL5010-Q1 AEC-Q100 Nano-Power System Timer with Watchdog Function
1 Features
2 Applications
•
•
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1
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Qualified for Automotive Applications
AEC-Q100 Qualified with the Following Results:
– Device Temperature Grade 1: –40°C to 125°C
Ambient Operating Temperature Range
– Device HBM ESD Classification Level 2
– Device CDM ESD Classification Level C5
Current Consumption of 35 nA (typ) at 2.5 V
Supply Voltage from 1.8 V to 5.5 V
Selectable Time Intervals 100 ms to 7200 s
Timer Accuracy 1% (Typical)
Resistor Selectable Time Interval
Watchdog Functionality
Manual Reset
TPL5x10Q Family of AEC-Q100 Nano-Power
System Timers
TPL5010-Q1 - Supply Current 35 nA
– Low Power Timer
– Watchdog Function
– Programmable Delay Range
– Manual Reset
TPL5110-Q1 - Supply Current 35 nA
– Low Power Timer
– MOS-Driver
– Programmable Delay Range
– Manual Reset
– One-Shot Feature
Electric Vehicles
Always On Systems
Battery powered systems
Clutch Actuator circuit
Car Door Handle circuit
Smart Key
Remote current sensor
Intruder Detection
3 Description
The TPL5010-Q1 Nano Timer is a low power, AECQ100 qualified timer with a watchdog feature ideal for
system wake up in duty cycled or battery powered
applications. In such systems the microcontroller
timer can be used for system wake-up, but if the
timer sleep current is high, up to 60-80% of the total
system current can be consumed by the
microcontroller timer in this sleep mode. Consuming
only 35 nA, the TPL5010-Q1 can replace the
functionality of the integrated microcontroller timer
and allow the microcontroller to be placed in a much
lower power mode. Such power savings extend the
operating life of batteries and enable the use of
significantly smaller batteries making the TPL5010Q1 ideal for power sensitive applications.. The
TPL5010-Q1 provides selectable timing intervals from
100 ms to 7200 s and is designed for interrupt-driven
applications. Some standards (such as EN50271)
require implementation of a watchdog for safety and
the TPL5010-Q1 realizes this watchdog function at
almost no additional power consumption. The
TPL5010-Q1 is available in a 6-pin SOT23 package.
Device Information(1)
PART NUMBER
TPL5010-Q1
PACKAGE
BODY SIZE (NOM)
SOT23 (6)
3.00 mm x 3.00 mm
(1) For all available packages, see the orderable addendum at
the end of the datasheet.
Simplified Application
µC
VOUT
TPL5010-Q1
VIN
VDD
VDD
RSTn
RSTn
GND
WAKE
GPIO
DELAY/
M_RST
DONE
GPIO
+
Battery
Rp
POWER MANAGEMENT
-
GND
REXT
GND
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
TPL5010-Q1
SNAS679 – SEPTEMBER 2016
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Table of Contents
1
2
3
4
5
6
7
8
Features ..................................................................
Applications ...........................................................
Description .............................................................
Revision History.....................................................
Device Comparison Table.....................................
Pin Configuration and Functions .........................
Specifications.........................................................
1
1
1
2
2
3
4
7.1
7.2
7.3
7.4
7.5
7.6
7.7
4
4
4
4
5
6
7
Absolute Maximum Ratings ......................................
ESD Ratings..............................................................
Recommended Operating Conditions ......................
Thermal Information .................................................
Electrical Characteristics...........................................
Timing Requirements ...............................................
Typical Characteristics ..............................................
8.3 Feature Description................................................... 8
8.4 Device Functional Modes.......................................... 9
8.5 Programming ............................................................ 9
9
Application and Implementation ........................ 15
9.1 Application Information............................................ 15
9.2 Typical Application ................................................. 15
10 Power Supply Recommendations ..................... 17
11 Layout................................................................... 17
11.1 Layout Guidelines ................................................. 17
11.2 Layout Example .................................................... 17
12 Device and Documentation Support ................. 18
12.1
12.2
12.3
12.4
12.5
Detailed Description .............................................. 8
8.1 Overview ................................................................... 8
8.2 Functional Block Diagram ......................................... 8
Receiving Notification of Documentation Updates
Community Resources..........................................
Trademarks ...........................................................
Electrostatic Discharge Caution ............................
Glossary ................................................................
18
18
18
18
18
13 Mechanical, Packaging, and Orderable
Information ........................................................... 18
4 Revision History
DATE
REVISION
NOTES
September 2016
*
Initial release.
5 Device Comparison Table
TPL5x10Q Family of AEC-Q100 Nano- Power System Timers
PART NUMBER
SUPPLY CURRENT (Typ)
SPECIAL FEATURES
Low Power Timer
TPL5010-Q1
35 nA
Watchdog Function
Programmable Delay Range
Manual Reset
Low Power Timer
MOS-Driver
TPL5110-Q1
35 nA
Programmable Delay Range
Manual Reset
One-Shot Feature
2
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6 Pin Configuration and Functions
SOT23
6-Pin DDC
Top View
TPL5010-Q1
1
VDD
RSTn
6
2
GND
WAKE
5
3
DELAY/
M_RST
DONE
4
Table 1. Pin Functions
PIN
NO.
NAME
TYPE (1)
DESCRIPTION
APPLICATION INFORMATION
1
VDD
P
Supply voltage
2
GND
G
Ground
3
DELAY/
M_RST
I
Time Interval set and Manual Reset
Resistance between this pin and GND is used to
select the time interval. The reset switch is also
connected to this pin.
4
DONE
I
Logic Input for watchdog functionality
Digital signal driven by the µC to indicate successful
processing of the WAKE signal.
5
WAKE
O
Timer output signal generated every tIP
period.
Digital pulsed signal to wake up the µC at the end of
the programmed time interval.
6
RSTn
O
Reset Output (open drain output)
Digital signal to RESET the µC, pull-up resistance is
required
(1)
G= Ground, P= Power, O= Output, I= Input.
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7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted) (1)
Supply voltage (VDD-GND)
Input voltage at any pin
Tstg
TJ
(1)
(2)
(3)
(2)
MIN
MAX
UNIT
–0.3
6.0
V
–0.3
VDD + 0.3
V
Input current on any pin
–5
5
mA
Storage temperature
–65
150
°C
150
°C
Junction temperature
(3)
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions . Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
The voltage between any two pins should not exceed 6V.
The maximum power dissipation is a function of TJ(MAX), θJA, and the ambient temperature, TA. The maximum allowable power
dissipation at any ambient temperature is PDMAX = (TJ(MAX) - TA)/ θJA. All numbers apply for packages soldered directly onto a PC
board.
7.2 ESD Ratings
VALUE
V(ESD)
(1)
Electrostatic discharge
Human-body model, per AEC Q100-002
(1)
±2000
Charged-device model (CDM), per AEC Q10-011
±750
UNIT
V
AEC Q100-002 indicates that HBM stressing shall be in accordance with ANSI/ESDA/JEDEC JS-001 specification.
7.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN
NOM
MAX
UNIT
Supply voltage (VDD-GND)
1.8
5.5
V
Temperature
–40
125
°C
7.4 Thermal Information
TPL5010-Q1
THERMAL METRIC
(1)
SOT23
UNIT
6 PINS
RθJA
Junction-to-ambient thermal resistance
163
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
26
°C/W
RθJB
Junction-to-board thermal resistance
57
°C/W
ψJT
Junction-to-top characterization parameter
7.5
°C/W
ψJB
Junction-to-board characterization parameter
57
°C/W
(1)
4
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
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7.5 Electrical Characteristics
TA= 25°C, VDD-GND=2.5 V (unless otherwise stated) (1)
PARAMETER
TEST CONDITIONS
MIN (2)
TYP (3)
MAX (2)
UNIT
POWER SUPPLY
IDD
Supply current (4)
Operation mode
35
50
nA
Digital conversion of external
resistance (Rext)
200
400
µA
TIMER
tIP
tOSC
Time interval period (5)
1650 selectable time Min time interval
Intervals
Max time
interval
7200
Time interval setting accuracy (6)
Excluding the precision of Rext
±0.6%
Timer interval setting accuracy over
supply voltage
1.8 V ≤ VDD ≤ 5.5 V
Oscillator accuracy
100
ms
s
±25
–0.5%
ppm/V
0.5%
Oscillator accuracy over
temperature (5)
-40°C ≤ TA ≤ 125°C
150
ppm/°C
Oscillator accuracy over supply
voltage (5)
1.8 V ≤ VDD ≤ 5.5 V
±0.4
%/V
Oscillator accuracy over life time (7)
tDONE
Minimum DONE pulse width
0.24%
(5)
100
ns
tRSTn
RSTn pulse width
320
ms
tWAKE
WAKE pulse width
20
ms
t_Rext
Time to convert Rext (5)
100
ms
DIGITAL LOGIC LEVELS
(1)
(2)
(3)
(4)
(5)
(6)
(7)
VIH
Minimum logic high threshold DONE
pin
0.7 ×
VDD
V
VIL
Maximum logic low threshold DONE
pin
0.3 ×
VDD
V
VOH
Logic output high-level WAKE pin
VOL
Logic output low-level WAKE pin
Iout = 100 µA
VDD – 0.3
V
Iout = 1 mA
VDD – 0.7
V
Iout = –100 µA
0.3
V
Iout = –1 mA
0.7
V
0.3
VOLRSTn
RSTn logic output low-level
IOL= –1 mA
IOHRSTn
RSTn high-level output current
VOHRSTn = VDD
VIHM_RST
Minimum logic high threshold
DELAY/M_RST pin (5)
V
1
nA
1.5
V
Values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating
of the device such that TJ = TA. No specification of parametric performance is indicated in the electrical tables under conditions of
internal self-heating where TJ > TA. Absolute Maximum Ratings indicate junction temperature limits beyond which the device may be
permanently degraded, either mechanically or electrically.
Limits are specified by testing, design, or statistical analysis at 25°C. Limits over the operating temperature range are specified through
correlations using statistical quality control (SQC) method.
Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped
production material.
The supply current excludes load and pull-up resistor current. Input pins are at GND or VDD.
This parameter is specified by design and/or characterization and is not tested in production.
The accuracy for time interval settings below 1 second is ±100 ms.
Operational life time test procedure equivalent to 10 years.
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7.6 Timing Requirements
MIN (1)
(3)
trRSTn
Rise Time RSTn
tfRSTn
Fall time RSTn
trWAKE
Rise time WAKE
tfWAKE
(3)
Fall time WAKE
(3)
(3)
tDDONE
DONE to RSTn or WAKE to
DONE delay
tM_RST
Minimum valid manual reset
tDB
De-bounce manual reset
(1)
(2)
(3)
(4)
MAX (1)
UNIT
Capacitive load 50 pF, Rpull-up 100 kΩ
11
µs
Capacitive load 50 pF, Rpull-up 100 kΩ
50
ns
Capacitive load 50 pF
50
ns
Capacitive load 50 pF
50
ns
Min delay (4)
100
ns
(4)
tIP–20
ms
Observation time 30 ms
20
ms
20
ms
Max delay
(3)
NOM (2)
Limits are specified by testing, design, or statistical analysis at 25°C. Limits over the operating temperature range are specified through
correlations using statistical quality control (SQC) method.
Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped
production material.
This parameter is specified by design and/or characterization and is not tested in production.
In case of RSTn from its falling edge, in case of WAKE, from its rising edge.
VDD
ttWAKEt
trWAKE
WAKE
ttIPt
tDONE
tfWAKE
ttDDONEt
DONE
ttRSTn+ tIPt
trRSTn
ttRSTn+tDBt
ttRSTnt
RSTn
ttR_EXT + tRSTnt
tfRSTn
DELAY/
M_RST
ttM_RST
Figure 1. TPL5010-Q1 Timing
6
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7.7 Typical Characteristics
100
100
TA= -40°C
TA= 25°C
TA= 70°C
TA= 105°C
TA = 125°C
90
80
80
Supply current (nA)
Supply current (nA)
VDD= 1.8V
VDD= 2.5V
VDD= 3.3V
VDD= 5.5V
90
70
60
50
70
60
50
40
40
30
30
20
1.5
1.9
2.3
2.7
3.1
3.5
3.9
4.3
4.7
5.1
Supply Voltage (V)
20
-40
5.5
-25
-10
20
35
50
65
80
95
110
125
110
125
Temperature (°C)
Figure 2. IDD vs VDD
Figure 3. IDD vs Temperature
2
2
TA= -40°C
TA= 25°C
TA= 70°C
TA= 105°C
TA= 125°C
VDD= 1.8V
VDD= 2.5V
VDD= 3.3V
VDD= 5.5V
1.5
Oscillator accuracy (%)
1.5
Oscillator accuracy (%)
5
D00
1
0.5
0
-0.5
1
0.5
0
-0.5
-1
1.5
1.9
2.3
2.7
3.1
3.5
3.9
4.3
4.7
5.1
-1
-40
5.5
-25
-10
5
20
Supply Voltage (V)
35
50
65
80
95
Temperature (°C)
Figure 4. Oscillator Accuracy vs VDD
Figure 5. Oscillator Accuracy vs Temperature
1000
40%
POR
REXT READING
35%
30%
10
Frequency
Supply current (PA)
100
1
TIMER MODE
0.1
25%
20%
15%
10%
5%
0.01
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
Time (s)
0.8
0.9
1
0
-1
-0.8
-0.4
-0.2
0
0.2
0.4
0.6
0.8
Accuracy (%)
number of
observations >
20000
Figure 6. IDD vs Time
-0.6
1 s < tIP ≤ 7200 s
Figure 7. Time Interval Setting Accuracy
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8 Detailed Description
8.1 Overview
The TPL5010-Q1 is a system wakeup timer with a watchdog feature, ideal for low power applications. TPL5010Q1 is ideal for use in interrupt-driven applications and provides selectable timing from 100 ms to 7200 s.
8.2 Functional Block Diagram
VDD
RSTn
LOW FREQUENCY
OSCILLATOR
FREQUENCY
DIVIDER
LOGIC
CONTROL
WAKE
DONE
DELAY/
M_RST
DECODER
&
MANUAL RESET
DETECTOR
GND
8.3 Feature Description
The DONE, WAKE and RSTn signals are used to implement the watchdog function. The TPL5010-Q1 is
programmed to issue a periodic WAKE pulse to a µC which is in sleep or standby mode. After receiving the
WAKE pulse, the µC must issue a DONE signal to the TPL5010-Q1 at least 20 ms before the rising edge of the
next WAKE pulse. If the DONE signal is not asserted, the TPL5010-Q1 asserts the RSTn signal to reset the µC.
A manual reset function is realized by momentarily pulling the DELAY/M_RST pin to VDD.
ttIPt
ttIPt
WAKE
DONE
MISSED
DONE
ttRSTn+ tIPt
RSTn
DELAY/
M_RST
Figure 8. Watchdog
8.3.1 WAKE
The WAKE pulse is sent out from the TPL5010-Q1 when the programmed time interval starts (except at the
beginning of the first cycle or if in the previous interval the DONE has not been received).
This signal is normally low.
8.3.2 DONE
The DONE pin is driven by a µC to signal successful processing of the WAKE signal. The TPL5010-Q1
recognizes a valid DONE signal as a low to high transition; if two or more DONE signals are received within the
time interval, only the first DONE signal is processed.
The DONE signal resets the counter of the watchdog only. If the DONE signal is received when the WAKE is still
high, the WAKE will go low as soon as the DONE is recognized.
8
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Feature Description (continued)
8.3.3 RSTn
To implement the reset interface between the TPL5010-Q1 and the µC a pull-up resistance is required. 100 kΩ is
recommended, to minimize current.
During the POR and the reading of the REXT the RSTn signal is LOW.
RSTn is asserted (LOW) for either one of the following conditions:
• 1. If the DELAY/M_RST pin is high for at least two consecutive cycles of the internal oscillator (approximately
20 ms).
• 2. At the beginning of a new time interval if DONE is not received at least 20 ms before the next WAKE rising
edge (see Figure 8).
8.4 Device Functional Modes
8.4.1 Startup
During startup, after POR, the TPL5010-Q1 executes a one-time measurement of the resistance attached to the
DELAY/M_RST pin in order to determine the desired time interval for WAKE. This measurement interval is
tR_EXT. During this measurement a constant current is temporarily flowing into REXT.
ttR_EXT + tRSTn + tIPt
ttIPt
WAKE
DONE
RSTn
DELAY/
M_RST
POR
RESISTANCE
READING
Figure 9. Startup
8.4.2 Normal Operating Mode
During normal operating mode, the TPL5010-Q1 asserts periodic WAKE pulses in response to valid DONE
pulses from the µC. If either a manual reset is applied (logic HIGH on DELAY/M_RST pin) or the µC does not
issue a DONE pulse within the required time, the TPL5010-Q1 asserts the RSTn signal to the µC and restarts its
internal counters. See Figure 8 and Figure 10 .
8.5 Programming
8.5.1 Configuring the WAKE Interval with the DELAY/M_RST Pin
The time interval between 2 adjacent WAKE pulses (rising edges) is selectable through an external resistance
(REXT) between the DELAY/M_RST pin and ground. The value of the resistance REXT is converted one time after
POR. The allowable range of REXT is 500 Ω to 170 kΩ. At least a 1% precision resistance is recommended. See
Timer Interval Selection Using External Resistance for how to set the WAKE pulse interval using REXT.
The time between 2 adjacent RESET signals (falling edges) or between a RESET (falling edge) and a WAKE
(rising edge) is given by the sum of the programmed time interval and the tRSTn (reset pulse width).
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Programming (continued)
8.5.2 Manual Reset
If VDD is connected to the DELAY/M_RST pin, the TPL5010-Q1 recognizes this as a manual reset condition. In
this case the time interval is not set. If the manual reset is asserted during the POR or during the reading
procedure, the reading procedure is aborted and is re-started as soon as the manual reset switch is released. A
pulse on the DELAY/M_RST pin is recognized as a valid manual reset only if it lasts at least 20 ms (observation
time is 30 ms).
A valid manual reset resets all the counters inside the TPL5010-Q1. The counters restart only when the high
digital voltage at DELAY/M_RST is removed and the next tRSTn is elapsed.
ttIPt
WAKE
DONE
ttRSTn+ tIPt
RSTn
ANY RESET
ttM_RSTt
ttDBt
ttM_RSTt
DELAY/
M_RST
VALID M_RST
NOT VALID M_RST
Figure 10. Manual Reset
8.5.2.1 DELAY/M_RST
A resistance in the range between 500 Ω and 170 kΩ needs to be connected in order to select a valid time
interval. At the POR and during the reading of the resistance the DELAY/M_RST is connected to an analog
signal chain though a mux. After the reading of the resistance the analog circuit is switched off and the
DELAY/RST is connected to a digital circuit.
The manual reset detection is supported with a de-bounce feature which makes the TPL5010-Q1 insensitive to
the glitches on the DELAY/M_RST pin. When a valid manual reset signal is asserted on the DELAY/M_RST pin,
the RSTn signal is asserted LOW after a delay of tM_RST. It remains LOW after a valid manual reset is asserted +
tDB + tRSTn. Due to the asynchronous nature of the manual reset signal and its arbitrary duration, the LOW status
of the RSTn signal maybe affected by an uncertainty of about ±5 ms.
A valid manual reset puts all the digital output signals at their default values:
• WAKE = LOW
• RSTn = asserted LOW
8.5.2.2 Circuitry
The manual reset may be implemented using a switch (momentary mechanical action). The TPL5010-Q1 offers 2
possible approaches according to the power consumption constraints of the application.
10
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Programming (continued)
µC
VOUT
TPL5010-Q1
VIN
VDD
VDD
RSTn
RSTn
GND
WAKE
GPIO
DELAY/
M_RST
DONE
GPIO
+
Battery
Rp
POWER MANAGEMENT
-
REXT
GND
GND
Figure 11. Manual Reset with SPST Switch
For use cases that do not require the lowest power consumption, using a single pole single throw switch may
offer a lower cost solution. The DELAY/M_RST pin may be directly connected to VDD with REXT in the circuit.
The current drawn from the supply voltage during the reset is given by VDD/REXT.
µC
VOUT
TPL5010-Q1
VIN
VDD
VDD
RSTn
RSTn
GND
WAKE
GPIO
DELAY/
M_RST
DONE
GPIO
+
Battery
Rp
POWER MANAGEMENT
-
REXT
GND
GND
Figure 12. Manual Reset with SPDT Switch
The reset function may also be asserted by switching DELAY/M_RST from REXT to VDD using a single pole
double throw switch, which will provide a lower power solution for the manual reset, because no current flows.
8.5.3 Timer Interval Selection Using External Resistance
In order to set the time interval, the external resistance REXT is selected according the following formula:
§
100 ¨
¨
©
R EXT
b
b 2 4 a c 100 T
2a
·
¸
¸
¹
where
•
•
•
T is the desired time interval in seconds
REXT is the resistance value to use in Ω
a, b, c are coefficients depending on the range of the time interval
(1)
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Programming (continued)
Table 2. Coefficients for Equation 1
SET
TIME
INTERVAL
RANGE (s)
a
b
c
1
1 1000
0.3177
–136.2571
34522.4680
EXAMPLE
Required time interval: 8 s
The coefficient set to be selected is the number 2. The formula becomes:
§ 46.9861
100¨
¨
©
REXT
46.98612 4*0.1284 2561.8889 100*8 ·¸
¸
2*0.1284
¹
(2)
The resistance value is 10.18 kΩ.
Table 3 and Table 4 contain example values of tIP and their corresponding value of REXT.
Table 3. First 9 Time Intervals
tIP (ms)
RESISTANCE (Ω)
CLOSEST REAL VALUE (Ω)
PARALLEL OF TWO 1% TOLERANCE
RESISTORS (kΩ)
100
500
500
1.0 // 1.0
200
1000
1000
-
300
1500
1500
2.43 // 3.92
400
2000
2000
-
500
2500
2500
4.42 // 5.76
600
3000
3000
5.36 // 6.81
700
3500
3500
4.75 // 13.5
800
4000
4000
6.19 // 11.3
900
4500
4501
6.19 // 16.5
Table 4. Most Common Time Intervals Between 1 s to 2 h
12
tIP
CALCULATED RESISTANCE (kΩ)
CLOSEST REAL
VALUE (kΩ)
PARALLEL OF TWO 1% TOLERANCE
RESISTORS (kΩ)
1s
5.20
5.202
7.15 // 19.1
2s
6.79
6.788
12.4 // 15.0
3s
7.64
7.628
12.7// 19.1
4s
8.30
8.306
14.7 // 19.1
5s
8.85
8.852
16.5 // 19.1
6s
9.27
9.223
18.2 // 18.7
7s
9.71
9.673
19.1 // 19.6
8s
10.18
10.180
11.5 // 8.87
9s
10.68
10.68
17.8 // 26.7
10 s
11.20
11.199
15.0 // 44.2
20 s
14.41
14.405
16.9 // 97.6
30 s
16.78
16.778
32.4 // 34.8
40 s
18.75
18.748
22.6 // 110.0
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Table 4. Most Common Time Intervals Between 1 s to 2 h (continued)
tIP
CALCULATED RESISTANCE (kΩ)
CLOSEST REAL
VALUE (kΩ)
PARALLEL OF TWO 1% TOLERANCE
RESISTORS (kΩ)
28.7 // 66.5
50 s
20.047
20.047
1 min
22.02
22.021
40.2 // 48.7
2 min
29.35
29.349
35.7 // 165.0
3 min
34.73
34.729
63.4 // 76.8
4 min
39.11
39.097
63.4 // 102.0
5 min
42.90
42.887
54.9 // 196.0
6 min
46.29
46.301
75.0 // 121.0
7 min
49.38
49.392
97.6 // 100.0
8 min
52.24
52.224
88.7 // 127.0
9 min
54.92
54.902
86.6 // 150.0
10 min
57.44
57.437
107.0 // 124.0
20 min
77.57
77.579
140.0 // 174.0
30 min
92.43
92.233
182.0 // 187.0
40 min
104.67
104.625
130.0 // 536.00
50 min
115.33
115.331
150.0 // 499.00
1h
124.91
124.856
221.0 // 287.00
1 h 30 min
149.39
149.398
165.0 // 1580.0
2h
170.00
170.00
340.0 // 340.0
8.5.4 Quantization Error
The TPL5010-Q1 can generate 1650 discrete timer intervals in the range of 100 ms to 7200 s. The first 9
intervals are multiples of 100 ms. The remaining 1641 intervals cover the range between 1 s to 7200 s. Because
they are discrete intervals, there is a quantization error associated with each value.
The quantization error can be evaluated according to the following formula:
Err 100
TDESIRED TADC
TDESIRED
(3)
Where:
ª 1
INT «
¬ 100
T ADC
§
R D2
¨¨ a
2
© 100
b
RD
100
·º
c ¸¸ »
¹¼
(4)
º
ªR
INT « EXT »
¬ 100 ¼
RD
where
•
•
REXT is the resistance calculated with Equation 1
a, b, c are the coefficients of the equation listed in Table 2
(5)
8.5.5 Error Due to Real External Resistance
REXT is a theoretical value and may not be available in standard commercial resistor values. It is possible to
closely approach the theoretical REXT using two or more standard values in parallel. However, standard values
are characterized by a certain tolerance. This tolerance will affect the accuracy of the time interval.
The accuracy can be evaluated using the following procedure:
1. Evaluate the min and max values of REXT (REXT_MIN, REXT_MAX with Equation 1 using the selected commercial
resistance values and their tolerances.
2. Evaluate the time intervals (TADC_MIN[REXT_MIN], TADC_MAX[REXT_MAX]) with Equation 4.
3. Find the errors using Equation 3 with TADC_MIN, TADC_MAX.
The results of the formula indicate the accuracy of the time interval.
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The example below illustrates the procedure.
• Desired time interval , T_desired = 600 s
• Required REXT, from Equation 1, REXT= 57.44 kΩ
From Table 4, REXT can be built with a parallel combination of two commercial values with 1% tolerance: R1=107
kΩ, R2=124 kΩ. The uncertainty of the equivalent parallel resistance can be found using Equation 6.
§u ·
uR// R// ¨ R1 ¸
© R1 ¹
2
§ uR 2 ·
¨
¸
© R2 ¹
2
(6)
Where uRn (n=1,2) represent the uncertainty of a resistance,
u R n Rn
Tolerance
3
(7)
The uncertainty of the parallel resistance is 0.82%, meaning the value of REXT may range between REXT_MIN =
56.96 kΩ and REXT_MAX = 57.90 kΩ.
Using these value of REXT, the digitized timer intervals calculated with Equation 4 are respectively TADC_MIN =
586.85 s and TADC_MAX = 611.3 s, giving an error range of –1.88% / +2.19%. The asymmetry of the error range is
due to the quadratic transfer function of the resistance digitizer.
14
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9 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information
In battery-powered applications, one design constraint is the need for low current consumption. The TPL5010-Q1
is ideal for applications where there is a need to monitor environmental conditions at a fixed time interval. Often
in these applications, a watchdog or other internal timer in a µC is used to implement a wakeup function. Using
the TPL5010-Q1 to implement the watchdog function will consume only tens of nA, significantly improving the
power consumption of the system.
9.2 Typical Application
The TPL5010-Q1 can be used in conjunction with environment sensors to build a low-power environment datalogger, such as an air quality data-logger. In this application, due to the monitored phenomena, the µC and the
front end of the sensor spend most of the time in the idle state, waiting for the next logging interval, usually a few
hundred of milliseconds. Figure 13 illustrates a data logging application based on a µC, and a front end for a gas
sensor based on the LMP91000.
VOLTAGE
REFERENCE
VIN
VOUT
GND
µC
VOUT
TPL5010-Q1
VIN
+
Lithium
ion battery
LMP91000
Rp
100k
Rp
100k
VDD
Rp
100k
VDD
VREF
VDD
RSTn
RST
SDA
SCL
CE
GND
WAKE
GPIO
SCL
SDA
RE
DELAY/
M_RST
DONE
GPIO
ADC
VOUT
WE
GND
GND
CE
POWER MANAGEMENT
GND
RE
WE
MENB
REXT
Button
Button
GPIO
GPIO
GPIO
GPIO
GAS
SENSOR
Temp 29°C
CO 0PPM
TIME xx:xx
Date xx/xx/xxxx
Button
DISPLAY
KEYBOARD
Figure 13. Data-Logger
9.2.1 Design Requirements
The design is driven by the low current consumption constraint. The data are usually acquired on a rate that
ranges between 1 s and 10 s. The highest necessity is the maximization of the battery life. The TPL5010-Q1
helps achieve that goal because it allows putting the µC in its lowest power mode. The TPL5010-Q1 will take
care of the watchdog and the timing.
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Typical Application (continued)
9.2.2 Detailed Design Procedure
When the main constraint is the battery life, the selection of a low-power voltage reference, µC, and display is
mandatory. The first step in the design is the calculation of the power consumption of the devices in their
different mode of operations. For instance, the LMP91000 burns most of the power when in gas measurement
mode, then according to the connected gas sensor it has 2 idle states: stand-by and deep sleep. The same is
true for the µC, such as one of the MSP430 family, which can be placed in one of its lower power modes, such
as LMP3.5 or LMP4.5. In this case, the TPL5010-Q1 can be used to implement the watchdog and wakeup timing
functions.
After the power budget calculation it is possible to select the appropriate time interval which satisfies the
application constraints and maximize the life of the battery.
9.2.3 Application Curves
Current consumption
Without TPL5010-Q1
With TPL5010-Q1
Time
Figure 14. Effect of TPL5010-Q1 on Current Consumption
16
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10 Power Supply Recommendations
The TPL5010-Q1 requires a voltage supply within 1.8 V and 5.5 V. A multilayer ceramic bypass X7R capacitor of
0.1 μF between VDD and GND pin is recommended.
11 Layout
11.1 Layout Guidelines
The DELAY/M_RST pin is sensitive to parasitic capacitance. It is suggested that the traces connecting the
resistance on this pin to GROUND be kept as short as possible to minimize parasitic capacitance. This
capacitance can affect the initial set up of the time interval. Signal integrity on the WAKE and RSTn pins is also
improved by keeping the trace length between the TPL5010-Q1 and the µC short to reduce the parasitic
capacitance.
11.2 Layout Example
Figure 15. Layout
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12 Device and Documentation Support
12.1 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper
right corner, click on Alert me to register and receive a weekly digest of any product information that has
changed. For change details, review the revision history included in any revised document.
12.2 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
12.3 Trademarks
E2E is a trademark of Texas Instruments.
All other trademarks are the property of their respective owners.
12.4 Electrostatic Discharge Caution
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
12.5 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
13 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
18
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PACKAGE OPTION ADDENDUM
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18-May-2022
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
Samples
(4/5)
(6)
TPL5010QDDCRQ1
ACTIVE
SOT-23-THIN
DDC
6
3000
RoHS & Green
NIPDAU | SN
Level-1-260C-UNLIM
-40 to 125
13VX
Samples
TPL5010QDDCTQ1
ACTIVE
SOT-23-THIN
DDC
6
250
RoHS & Green
NIPDAU | SN
Level-1-260C-UNLIM
-40 to 125
13VX
Samples
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
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