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TPS1HA08EQPWPRQ1

TPS1HA08EQPWPRQ1

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    TSSOP16

  • 描述:

    POWER MANAGEMENT

  • 数据手册
  • 价格&库存
TPS1HA08EQPWPRQ1 数据手册
Product Folder Order Now Technical Documents Support & Community Tools & Software TPS1HA08-Q1 SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 TPS1HA08-Q1, 40-V, 8-mΩ Single-Channel Smart High-Side Switch 1 Features 3 Description • The device is a single-channel smart high-side switch intended for use with 12-V automotive systems. The device integrates robust protection and diagnostic features to ensure output port protection even during harmful events like short circuits. The device protects against faults through a reliable current limit, which, depending on device variant, is available at both 80 A and 20 A and can be configured to react to an overcurrent event by either instantly turning the switch off or by regulating the output current at the set point. The high current limit option allows for usage in loads that require large transient currents, while the low current limit option provides improved protection for loads that do not require high peak current. 1 • • • • • • Single-channel smart high-side switch with 8-mΩ RON (TJ = 25°C) Qualified for automotive applications: – AEC Q-100 Qualified – Device temperature grade 1: –40°C to +125°C ambient operating temperature range – Withstands 40-V load dump Functional safety capable – Documentation available to aid functional safety system design Improve reliability through selectable current limiting – Current limit set-point at 20 A or 80 A – Overcurrent response of current clamping or instant shutdown Robust integrated output protection: – Integrated thermal protection – Protection against short to ground and battery – Automatic switch-on during reverse battery – Automatic shut off if loss of battery and ground occurs – Integrated output clamp to demagnetize inductive loads – Configurable fault handling Analog sense output can be configured to accurately measure: – Load current – Supply voltage – Device temperature Provides FLT indication back to MCU – Detection of open load and short-to-battery The also provides a high accuracy analog current sense that allows for improved diagnostics when driving varied load profiles. By reporting load current, device temperature, and supply voltage to a system MCU, the device enables predictive maintenance and load diagnostics that lengthen the system lifetime. The is available in a small 16-pin HTSSOP package which allows for reduced PCB footprint. Device Information(1) PART NUMBER TPS1HA08-Q1 PACKAGE HTSSOP (16) BODY SIZE (NOM) 5.00 mm × 4.40 mm (1) For all available packages, see the orderable addendum at the end of the data sheet. Simplified Schematic DIA_EN SEL1 SEL2 µC SNS ST 2 Applications • • • • • • • Body control modules Incandescent and LED lighting Heating elements: – Seat heaters – Glow plug – Tank heaters Transmission control unit Climate control Infotainment display ADAS modules LATCH TPS1HA08-Q1 EN 12-V Battery VBB VOUT GND Load 1 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA. TPS1HA08-Q1 SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 www.ti.com Table of Contents 1 2 3 4 5 6 Features .................................................................. Applications ........................................................... Description ............................................................. Revision History..................................................... Device Comparison Table..................................... Pin Configuration and Functions ......................... 1 1 1 2 3 4 7 Specifications......................................................... 6 6.1 Recommended Connections for Unused Pins .......... 5 7.1 7.2 7.3 7.4 7.5 7.6 7.7 7.8 8 9 Absolute Maximum Ratings ...................................... 6 ESD Ratings.............................................................. 6 Recommended Operating Conditions....................... 6 Thermal Information .................................................. 7 Electrical Characteristics........................................... 7 Switching Characteristics .......................................... 9 SNS Timing Characteristics .................................... 10 Typical Characteristics ............................................ 12 Parameter Measurement Information ................ 18 Detailed Description ............................................ 19 9.1 9.2 9.3 9.4 Overview ................................................................. Functional Block Diagram ....................................... Feature Description................................................. Device Functional Modes........................................ 19 20 21 36 10 Application and Implementation........................ 38 10.1 Application Information.......................................... 38 10.2 Typical Application ............................................... 41 11 Power Supply Recommendations ..................... 45 12 Layout................................................................... 46 12.1 Layout Guidelines ................................................. 46 12.2 Layout Example .................................................... 46 13 Device and Documentation Support ................. 47 13.1 13.2 13.3 13.4 Device Support...................................................... Trademarks ........................................................... Electrostatic Discharge Caution ............................ Glossary ................................................................ 47 47 47 47 14 Mechanical, Packaging, and Orderable Information ........................................................... 47 4 Revision History Changes from Revision C (May 2019) to Revision D • Page Added functional safety capable link to the Features section ................................................................................................ 1 Changes from Revision B (January 2019) to Revision C Page • Added links to reference App Notes in the Features and Description sections ..................................................................... 1 • Removed the Product Preview note from Device Version B,D,E in the Device Comparison Table ...................................... 3 • Updated the Absolute Maximum Ratings and Electrical Characteristics tables in the Specifications section ....................... 6 • Updated Figure 7.................................................................................................................................................................. 13 • Added paragragh to the Undervoltage Lockout (UVLO) section .......................................................................................... 22 • Added app note link to Figure 41 title .................................................................................................................................. 24 Changes from Revision A (December 2018) to Revision B • Deleted note from Device Version C in the Device Comparison Table ................................................................................ 3 Changes from Original (September 2017) to Revision A • 2 Page Page Changed from Advance Information to Production Data ....................................................................................................... 1 Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 TPS1HA08-Q1 www.ti.com SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 5 Device Comparison Table Device Version Full Device Number Current Limit (ICL) Overcurrent Behavior Watchdog Feature A TPS1HA08A-Q1 20 A Disable Switch Immediately Disabled B TPS1HA08B-Q1 80 A Disable Switch Immediately Disabled C TPS1HA08C-Q1 20 A Clamp Current at ICL until Thermal Shutdown Disabled D TPS1HA08D-Q1 80 A Clamp Current at ICL until Thermal Shutdown Disabled E TPS1HA08E-Q1 20 A Disable Switch Immediately Enabled Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 3 TPS1HA08-Q1 SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 www.ti.com 6 Pin Configuration and Functions PWP Package 16-Pin HTSSOP Top View GND 1 16 DIA_EN SNS 2 15 SEL2 LATCH 3 14 SEL1 EN 4 13 NC VBB ST 5 12 NC VOUT 6 11 VOUT VOUT 7 10 VOUT VOUT 8 9 VOUT Pin Functions PIN 4 I/O DESCRIPTION NO. NAME 1 GND — Device ground 2 SNS O Sense output 3 LATCH I Sets fault handling behavior (latched or auto-retry) 4 EN I Switch control input, active high 5 ST O Switch diagnostic feedback, active low 6, 7, 8, 9, 10, 11 VOUT O Switch output 12 NC -- No Connect 13 NC -- No Connect 14 SEL1 I Diagnostics Select 1 15 SEL2 I Diagnostics Select 2 16 DIA_EN I Diagnostic enable, active high Exposed pad VBB I Power supply input Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 TPS1HA08-Q1 www.ti.com SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 6.1 Recommended Connections for Unused Pins The device is designed to provide an enhanced set of diagnostic and protection features. However, if the system design only allows for a limited number of I/O connections, some pins may be considered as optional. Table 1. Connections for Optional Pins PIN NAME CONNECTION IF NOT USED SNS Ground through 1-kΩ resistor LATCH Float or ground through RPROT resistor IMPACT IF NOT USED Analog sense is not available. With LATCH unused, the device will auto-retry after a fault. If latched behavior is desired it is possible to use one microcontroller output to control the latch function of several high-side channels. All faults are indicated by the analog SNS pin. The ST pin provides the additional benefits: • Provide fault indication when DIA_EN = 0 • Provide fault indication regardless of SELx pin conditions • Provide fault indication to a simple digital I/O (rather than ADC or comparator used with the SNS signal) ST Float SEL1 Float or ground through RPROT resistor SEL1 selects between the VBB and TJ sensing features. With SEL1 unused, only load diagnostics are available. SEL2 Ground through RPROT resistor With SEL2 = 0 V, VBB measurement diagnostics are not available. DIA_EN Float or ground through RPROT resistor With DIA_EN unused, analog sense, open-load and short-to-battery diagnostics are not available. RPROT is used to protect the pins from excess current flow during reverse battery conditions, for more information please see the section on Reverse Battery protection. Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 5 TPS1HA08-Q1 SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 www.ti.com 7 Specifications 7.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) MIN MAX UNIT VBB Maximum continuous supply voltage VLD Load dump voltage VRev Reverse battery voltage, VREV ≤ 3 minutes VEN Enable pin voltage –1 7 V VLATCH LATCH pin voltage –1 7 V VST Status pin voltage –1 7 (2) V VDIA_EN Diagnostic Enable pin voltage –1 7 V VSNS Sense pin voltage –1 7 V VSEL1, VSEL2 Select pin voltage –1 7 V IGND Reverse ground current ISO16750-2:2010(E) Energy dissipation during turn-off TJ Maximum junction temperature Tstg Storage temperature (1) (2) V 40 V –18 V VBB < 0 V ETOFF 36 –50 mA Single pulse, LOUT = 5 mH, TA = 125°C 95 mJ Repetitive pulse, 10 Hz, LOUT = 5 mH, TA = 125°C 56 mJ 150 °C 150 °C –65 Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. These pins are adjacent to pins that will handle high-voltages. In the event of a pin-to-pin short, there will not be device damage. 7.2 ESD Ratings VALUE V(ESD) Electrostatic discharge Human-body model (HBM), per AEC Q100-002 (1) Charged-device model (CDM), per AEC Q100-011 (1) All pins except exposed pad and pins 6 to 11 ±2000 Exposed pad and pins 6 to 11 ±4000 All pins ±750 UNIT V AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification. 7.3 Recommended Operating Conditions over operating free-air temperature range (unless otherwise noted) MIN MAX 8 18 V 3 28 V Enable voltage –1 5.5 V VLATCH LATCH voltage –1 5.5 V VDIA_EN Diagnostic enable voltage –1 5.5 V VSEL1, VSEL2 Select voltage –1 5.5 V VST Status voltage 0 5.5 V VSNS Sense voltage –1 VSNSclamp V IMAX Continuous load current 0 10 A VBB Nominal supply voltage VBB Extended operating range VEN (1) 6 (1) TA = 70°C UNIT Device will function within extended operating range, however some parametric values might not apply Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 TPS1HA08-Q1 www.ti.com SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 7.4 Thermal Information TPS1HA08-Q1 THERMAL METRIC (1) (2) PWP (HTSSOP) UNIT 16 PINS RθJA Junction-to-ambient thermal resistance 32.8 °C/W RθJC(top) Junction-to-case (top) thermal resistance 30.7 °C/W RθJB Junction-to-board thermal resistance 9.3 °C/W ψJT Junction-to-top characterization parameter 2.6 °C/W ψJB Junction-to-board characterization parameter 9.4 °C/W RθJC(bot) Junction-to-case (bottom) thermal resistance 1.0 °C/W (1) (2) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report. The thermal parameters are based on a 4-layer PCB according to the JESD51-5 and JESD51-7 standards. 7.5 Electrical Characteristics VBB = 8 V to 18 V, TJ = –40°C to 150°C (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT INPUT VOLTAGE AND CURRENT VClamp VDS clamp voltage 58 V VUVLOF VBB undervoltage lockout falling 2.5 3 V VUVLOR VBB undervoltage lockout rising 2.5 3 V VBB = 13.5 V, TJ = 25°C VEN = VDIA_EN = 0 V, VOUT = 0 V 0.5 µA VBB = 13.5 V, TJ = 85°C VEN = VDIA_EN = 0 V, VOUT = 0 V 0.5 µA VBB = 13.5 V, TJ = 125°C, VEN = VDIA_EN = 0 V, VOUT = 0 V 3 µA 0.5 µA 3 µA ISB IOUT(standby) Standby current (includes MOSFET leakage) Output leakage current 40 VBB = 13.5 V, TJ = 25°C VEN = VDIA_EN = 0 V, VOUT = 0 V 0.01 VBB = 13.5 V, TJ = 125°C VEN = VDIA_EN = 0 V, VOUT = 0 V IDIA Current consumption in diagnostic mode VBB = 13.5 V, ISNS = 0 mA VEN = 0 V, VDIA_EN = 5 V, VOUT = 0V 3 6 mA IQ Quiescent current VBB = 13.5 V VEN = VDIA_EN = 5 V, IOUT = 0 A, VSELX = 0 V 3 6 mA tSTBY Standby mode delay time VEN = VDIA_EN = 0 V to Standby 20 ms RON CHARACTERISTICS TJ = 25°C, 6 V ≤ VBB ≤ 28 V On-resistance T = 150°C, 6 V ≤ VBB ≤ 28 V Includes MOSFET and package J TJ = 25°C, 3 V ≤ VBB ≤ 6 V 9 RON RON(REV) On-resistance during reverse polarity TJ = 25°C, -18 V ≤ VBB ≤ -8 V 9 TJ = 105°C, -18 V ≤ VBB ≤ -8 V mΩ 20 mΩ 15 mΩ mΩ 20 mΩ CURRENT SENSE CHARACTERISTICS KSNS Current sense ratio IOUT / ISNS 4600 Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 7 TPS1HA08-Q1 SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 www.ti.com Electrical Characteristics (continued) VBB = 8 V to 18 V, TJ = –40°C to 150°C (unless otherwise noted) PARAMETER TEST CONDITIONS MIN –5 –5 IOUT = 3 A 5 –5 5 –5 5 –12 –42 % mA 12 0.022 IOUT = 100 mA % mA 0.065 IOUT = 300 mA % mA 0.217 IOUT = 1 A % mA 0.65 VEN = VDIA_EN = 5 V, VSEL1 = VSEL2 = 0 V UNIT mA 5 1.74 IOUT = 8 A Current sense current and current sense accuracy MAX 4.35 IOUT = 20 A ISNSI TYP % mA 42 % TJ SENSE CHARACTERISTICS ISNST Temperature sense current dISNST/dT VDIA_EN = 5 V, VSEL1 = 5 V, VSEL2 =0V TJ = –40°C 0.12 mA TJ = 25°C 0.85 mA TJ = 85°C 1.52 mA TJ = 150°C 2.25 Coefficient mA 0.0112 mA/°C VBB SENSE CHARACTERISTICS ISNSV Voltage sense current dISNSV/dV VDIA_EN = 5 V, VSEL1 = 5 V, VSEL2 =5V VBB = 3 V 0.26 mA VBB = 8 V 0.69 mA VBB = 13.5 V 1.17 mA VBB = 18 V 1.56 mA VBB = 28 V 2.43 Coefficient mA 0.0867 mA/V SNS CHARACTERISTICS ISNSFH ISNS fault high level VDIA_EN = 5 V, VSEL1 = 0 V, VSEL2 = 0 6 ISNSleak ISNS leakage VDIA_EN = 0 V 0 VSNSclamp VSNS clamp 6.9 7.6 mA 1 µA 5.9 V CURRENT LIMIT CHARACTERISTICS TJ = –40°C Device Version B/D ICL Current Limit 75.5 88.8 102.1 TJ = 25°C 68 80 92 TJ = 150°C 51 60 69 27.8 TJ = –40°C Device Version A/C/E A 16 22.2 TJ = 25°C 14.4 20 25 TJ = 150°C 10.8 15 18.8 2 2.5 4 V 300 500 700 µs A ST PIN CHARACTERISTICS VOL Open-load detection voltage VEN = 0 V, VDIA_EN = 5 V tOL1 OL and STB indication time switch disabled From falling edge of EN VEN= 5 V to 0 V, VDIA_EN = 5 V, VSELx = 00 IOUT = 0 mA, VOUT = 4 V tOL2 OL and STB indication time switch disabled From rising edge of DIA_EN VEN = 0 V, VDIA_EN = 0 V to 5 V, VSELx = 00 IOUT = 0 mA, VOUT = 4 V 50 µs tOL3 OL and STB indication time switch disabled From rising edge of VOUT VEN = 0 V, VDIA_EN = 5 V, VSELx = 00 IOUT = 0 mA, VOUT = 0 V to 4 V 50 µs TABS Thermal shutdown THYS Thermal shutdown hysteresis 160 tRETRY Retry time Minimum time from fault shutdown to switch re-enable (for thermal shutdown, current limit, and energy limit) tWD Watchdog timer Device version E 8 °C 20 Submit Documentation Feedback °C 1 2 3 ms 350 400 450 ms Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 TPS1HA08-Q1 www.ti.com SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 Electrical Characteristics (continued) VBB = 8 V to 18 V, TJ = –40°C to 150°C (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT EN PIN CHARACTERISTICS (1) VIL, EN Input voltage low level VIH, Input voltage high level No GND network Diode Input voltage hysteresis No GND network Diode 250 mV IIL, EN Input current low level VEN = 0.8 V 0.8 µA IIH, Input current high level VEN = 2.0 V 2 µA 1 MΩ EN VIHYS, EN EN REN 0.8 V Internal pulldown resistor DIA_EN PIN CHARACTERISTICS (1) VIL, DIA_EN Input voltage low level No GND network Diode VIH, DIA_EN Input voltage high level No GND network Diode VIHYS, DIA_EN V 2 0.8 V 2 V Input voltage hysteresis 250 mV µA IIL, DIA_EN Input current low level VDIA_EN = 0.8 V 0.8 IIH, Input current high level VDIA_EN = 2.0 V 2 µA 1 MΩ DIA_EN RDIA_EN Internal pulldown resistor SEL1 AND SEL2 PIN CHARACTERISTICS VIL, SELx Input voltage low level VIH, Input voltage high level SELx VIHYS, SELx (1) No GND network Diode 0.8 V 2 V Input voltage hysteresis 250 mV µA IIL, SELx Input current low level VSELx = 0.8 V 0.8 IIH, Input current high level VSELx = 2.0 V 2 µA 1 MΩ SELx RSELx Internal pulldown resistor LATCH PIN CHARACTERISTICS (1) VIL, LATCH Input voltage low level No GND network Diode VIH, LATCH Input voltage high level No GND network Diode VIHYS, LATCH Input voltage hysteresis IIL, LATCH Input current low level IIH, LATCH Input current high level RLATCH Internal pulldown resistor ST PIN CHARACTERISTICS VOL, ST ISTleak (1) 0.8 V 2 V 250 mV VLATCH = 0.8 V 0.8 µA VLATCH = 2.0 V 2 µA 1 MΩ (1) Output voltage low level IST = 1 mA Leakage current VST = 5 V 0.4 V 2 µA VBB = 3 to 28 V 7.6 Switching Characteristics VBB = 13.5 V, TJ = –40°C to 150°C (unless otherwise noted) MIN TYP MAX UNIT tDR Turn-on delay time PARAMETER VBB = 13.5 V, RL = 2.6 Ω TEST CONDITIONS 20 70 100 µs tDF Turn-off delay time VBB = 13.5 V, RL = 2.6 Ω 20 50 100 µs SRR VOUT rising slew rate VBB = 13.5 V, 20% to 80% of VOUT, RL = 2.6 Ω 0.1 0.35 0.7 V/µs SRF VOUT falling slew rate VBB = 13.5 V, 80% to 20% of VOUT, RL = 2.6 Ω 0.1 0.5 0.7 V/µs tON Turn-on time VBB = 13.5 V, RL = 2.6 Ω 39 80 145 µs tOFF Turn-off time VBB = 13.5 V, RL = 2.6 Ω 39 75 145 µs tON - tOFF Turn-on and off matching 200-µs enable pulse –50 0 50 EON Switching energy losses during turn-on VBB = 13.5 V, RL = 2.6 Ω 0.4 mJ EOFF Switching energy losses during turn-off VBB = 13.5 V, RL = 2.6 Ω 0.4 mJ Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 µs 9 TPS1HA08-Q1 SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 www.ti.com 7.7 SNS Timing Characteristics VBB = 8 to 18 V, TJ = –40°C to 150°C (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT SNS TIMING - CURRENT SENSE tSNSION1 Settling time from rising edge of DIA_EN VEN = 5 V, VDIA_EN = 0 V to 5 V RSNS = 1 kΩ, RL = 2.6 Ω tSNSION2 Settling time from rising edge of EN tSNSION3 40 µs VEN = VDIA_EN = 0 V to 5 V RSNS = 1 kΩ, RL = 2.6 Ω 180 µs Settling time from rising edge of EN VEN = 0 V to 5 V, VDIA_EN = 5 V RSNS = 1 kΩ, RL = 2.6 Ω 180 µs tSNSIOFF1 Settling time from falling edge of DIA_EN VEN = 5 V, VDIA_EN = 5 V to 0 V RSNS = 1 kΩ, RL = 2.6 Ω 20 µs tSETTLEH Settling time from rising edge of load step VEN = 5 V, VDIA_EN = 5 V RSNS = 1 kΩ, IOUT = 1 A to 5 A 20 µs tSETTLEL Settling time from falling edge of load step VEN = 5 V, VDIA_EN = 5 V RSNS = 1 kΩ, IOUT = 5 A to 1 A 20 µs SNS TIMING - TEMPERATURE SENSE tSNSTON1 Settling time from rising edge of DIA_EN VEN = 5 V, VDIA_EN = 0 V to 5 V RSNS = 1 kΩ 40 µs tSNSTON2 Settling time from rising edge of DIA_EN VEN = 0 V, VDIA_EN = 0 V to 5 V RSNS = 1 kΩ 70 µs tSNSTOFF Settling time from falling edge of DIA_EN VEN = X, VDIA_EN = 5 V to 0 V RSNS = 1 kΩ 20 µs SNS TIMING - VOLTAGE SENSE tSNSVON1 Settling time from rising edge of DIA_EN VEN = 5 V, VDIA_EN = 0 V to 5 V RSNS = 1 kΩ 40 µs tSNSVON2 Settling time from rising edge of DIA_EN VEN = 0 V, VDIA_EN = 0 V to 5 V RSNS = 1 kΩ 70 µs tSNSVOFF Settling time from falling edge of DIA_EN VEN = X, VDIA_EN = 5 V to 0 V RSNS = 1 kΩ 20 µs Settling time from temperature sense to current sense VEN= X, VDIA_EN = 5 V VSEL1 = 5 V to 0 V, VSEL2 = 0 V RSNS = 1 kΩ, RL = 2.6 Ω 60 µs Settling time from temperature sense to voltage sense VEN = X, VDIA_EN = 5 V VSEL1 = 5 V, VSEL2 = 0 V to 5 V RSNS = 1 kΩ 60 µs Settling time from voltage sense to temperature sense VEN = X, VDIA_EN = 5 V VSEL1 = 5 V, VSEL2 = 5 V to 0 V RSNS = 1 kΩ 60 µs Settling time from voltage sense to current sense VEN = X, VDIA_EN = 5 V VSEL1 = VSEL2 = 5 V to 0 V, RSNS = 1 kΩ, RL = 2.6 Ω 60 µs Settling time from current sense to temperature sense VEN = X, VDIA_EN = 5 V VSEL1 = 0 V to 5 V, VSEL2 = 0 V RSNS = 1 kΩ, RL = 2.6 Ω 60 µs Settling time from current sense to voltage sense VEN = X, VDIA_EN = 5 V VSEL1 = VSEL2 = 0 V to 5 V RSNS = 1 kΩ, RL = 2.6 Ω 60 µs SNS TIMING - MULTIPLEXER tMUX 10 Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 TPS1HA08-Q1 www.ti.com SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 VEN VDIA_EN IOUT ISNS tSNSION1 tSNSION2 tSETTLEH tSETTLEL tSNSTON1 tSNSTON2 tSNSION3 tSNSIOFF1 VEN VDIA_EN IOUT ISNS VEN VDIA_EN TJ ISNS tSNSTOFF NOTES: Rise and fall times of control signals are 100 ns. Control signals include: EN, DIA_EN, SEL1, SEL2. SEL1 and SEL2 must be set to the appropriate values. The temperature sense timing diagram can also be used to depict the voltage sense timings. Figure 1. SNS Timing Characteristics Definitions Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 11 TPS1HA08-Q1 SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 VEN(1) www.ti.com 50% 50% 90% 90% tDR tDF VOUT 10% 10% tON tOFF Rise and fall time of VEN is 100 ns. Figure 2. Switching Characteristics Definitions 7.8 Typical Characteristics 1.25 2.65 1 2.6 0.75 ISB (µA) UVLO Falling (V) 2.7 2.55 2.5 VBB 8V 13.5 V 18 V 0.5 0.25 2.45 -40 -10 20 VBB = 13.5 V to 0 V VEN = 5 V 50 80 Temperature (°C) 110 0 -40 140 ROUT = 1 kΩ VDIAG__EN = 0 V 0 VOUT = 0 V Figure 3. Falling Undervoltage Lockout (VUVLOF) vs Temperature 20 40 60 Temperature (°C) 80 100 120 SLVS VEN = 0 V VDIAG_EN = 0 V Figure 4. Standby Current (ISB) vs Temperature 5 0.8 8V 13.5 V 18 V VBB 8V 13.5 V 18 V 0.6 4 IQ (mA) IOUT(standby) (PA) -20 SLVS 0.4 3 0.2 0 -40 -20 VOUT = 0 V 0 20 40 60 Temperature (qC) VEN = 0 V 80 100 120 -20 0 SLVS VDIAG_EN = 0 V Figure 5. Output Leakage Current (IOUT(standby)) vs Temperature 12 2 -40 IOUT = 0 A RSNS = 1 kΩ 20 40 60 Temperature (qC) VEN = 5 V VSEL1 = VSEL2 = 0 V 80 100 120 SLVS VDIAG_EN = 5 V Figure 6. Quiescent Current (IQ) vs Temperature Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 TPS1HA08-Q1 www.ti.com SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 Typical Characteristics (continued) 20 18 VBB 8V 13.5 V 18 V 16 16 RON (m:) RON (m:) 14 12 12 -40qC 25qC 60qC 85qC 105qC 125qC 150qC 8 10 4 8 6 -40 0 -15 10 IOUT = 200 mA RSNS = 1 kΩ 35 60 85 Temperature (qC) 110 135 150 0 4 8 SLVS VEN = 5 V VDIAG_EN = 0 V IOUT = 200 mA RSNS = 1 kΩ Figure 7. On Resistance (RON) vs Temperature 12 16 VBB (V) 20 VEN = 5 V VBB = 13.5 V 24 28 SLVS VDIAG_EN = 0 V Figure 8. On Resistance (RON) vs VBB 55 75 54.5 54 TOFF Delay (Ps) TON Delay (Ps) 73 71 69 53.5 53 52.5 52 67 51.5 65 -40 -15 10 ROUT = 2.6 Ω RSNS = 1 kΩ 35 60 85 Temperature (qC) VEN = 0 V to 5 V VBB = 13.5 V 110 51 -40 135 150 -15 10 SLVS VDIAG_EN = 0 V ROUT = 2.6 Ω RSNS = 1 kΩ Figure 9. Turn-on Delay Time (tDR) vs Temperature 35 60 85 Temperature (qC) VEN = 5 V to 0 V VBB = 13.5 V 110 135 150 SLVS VDIAG_EN = 0 V Figure 10. Turn-off Delay Time (tDF) vs Temperature 0.5 0.37 VOUT Slew Rate Falling (V/Ps) VOUT Slew Rate Rising (V/Ps) 0.495 0.36 0.35 0.34 0.33 0.49 0.485 0.48 0.475 0.47 0.465 0.46 0.455 0.32 -40 -15 ROUT = 2.6 Ω RSNS = 1 kΩ 10 35 60 85 Temperature (qC) VEN = 0 V to 5 V VBB = 13.5 V 110 135 150 0.45 -40 -15 SLVS VDIAG_EN = 0 V Figure 11. VOUT Slew Rate Rising (SRR) vs Temperature ROUT = 2.6 Ω RSNS = 1 kΩ 10 35 60 85 Temperature (qC) VEN = 5 V to 0 V VBB = 13.5 V 110 135 150 SLVS VDIAG_EN = 0 V Figure 12. VOUT Slew Rate Falling (SRF) vs Temperature Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 13 TPS1HA08-Q1 SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 www.ti.com Typical Characteristics (continued) 76.5 83 82 75 80 Turn-off Time (Ps) Turn-on Time (Ps) 81 79 78 77 76 75 73.5 72 74 73 72 -40 -15 10 ROUT = 2.6 Ω RSNS = 1 kΩ 35 60 85 Temperature (qC) 110 70.5 -40 135 VEN = 0 V to 5 V VBB = 13.5 V VDIAG_EN = 0 V 10 ROUT = 2.6 Ω RSNS = 1 kΩ Figure 13. Turn-on Time (tON) vs Temperature 35 60 85 Temperature (qC) VEN = 5 V to 0 V VBB = 13.5 V 110 135 150 SLVS VDIAG_EN = 0 V Figure 14. Turn-off Time (tOFF) vs Temperature 0.2 10 -40qC 25qC 60qC 85qC 105qC 125qC 150qC 0.18 0.16 8 0.14 6 ISNSI (mA) Turn-on and off matching (Ps) -15 SLVS 4 0.12 0.1 0.08 0.06 0.04 2 0.02 0 -40 0 -15 10 ROUT = 2.6 Ω RSNS = 1 kΩ 35 60 85 Temperature (qC) VEN = 0 V to 5 V and 5 V to 0 V VBB = 13.5 V 110 0 135 150 VDIAG_EN = 0 V 200 VSEL1 = VSEL2 = 0 V RSNS = 1 kΩ 300 400 500 600 ILOAD (mA), VBB=13.5 VEN = 5 V VBB = 13.5 V 700 800 900 SLVS VDIAG_EN = 5 V Figure 16. Current Sense Output Current (ISNSI ) vs Load Current (IOUT) across Temperature Figure 15. Turn-on and Turn-off Matching (tON - tOFF) vs Temperature 3 0.2 VBB 8V 13.5 V 18 V 0.18 0.16 2.5 0.14 8V 13.5 V 18 V 2 ISNST (mA) ISNSI (mA) 100 SLVS 0.12 0.1 0.08 1.5 1 0.06 0.04 0.5 0.02 0 0 100 200 VSEL1 = VSEL2 = 0 V RSNS = 1 kΩ 300 400 500 ILOAD (mA) VEN = 5 V TA = 25°C 600 700 800 900 -15 10 SLVS VDIAG_EN = 5 V Figure 17. Current Sense Output Current (ISNSI) vs Load Current (IOUT) across VBB 14 0 -40 VSEL1 = 5 V RSNS = 1 kΩ 35 60 85 Temperature (qC) VSEL2 = 0 V VEN = 0 V 110 135 150 SLVS VDIAG_EN = 5 V Figure 18. Temperature Sense Output Current (ISNST) vs Temperature Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 TPS1HA08-Q1 www.ti.com SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 Typical Characteristics (continued) 2.5 6.95 -40qC 25qC 60qC 85qC 105qC 125qC 150qC 1.5 6.85 ISNSFH (mA) ISNSV (mA) 2 8V 13.5 V 18 V 6.9 1 6.8 6.75 6.7 0.5 6.65 0 0 4 8 VSEL1 = VSEL2 = 5 V RSNS = 1 kΩ 12 16 VBB (V) 20 VEN = 0 V IOUT = 0 A 24 6.6 -40 28 VDIAG_EN = 5 V 35 60 85 Temperature (qC) 110 135 150 SLVS VEN = 0 V VOUT Floating VDIAG_EN = 5 V Figure 20. Fault High Output Current (ISNSFH) vs Temperature 6.4 26 8V 13.5 V 18 V 24 ILIM (A) (Version A/C) 6.3 6.2 VSNS Clamp (V) 10 VSEL1 = VSEL2 = 0 V RSNS = 500 Ω Figure 19. Voltage Sense Output Current (ISNSV) vs VBB 6.1 6 5.9 5.8 22 20 18 16 14 12 5.7 -40 -15 10 VSEL1 = VSEL2 = 0 V RSNS = 10 kΩ 35 60 85 Temperature (qC) VEN = 5 V IOUT = 4 A 110 10 -40 135 150 -15 10 SLVS VDIAG_EN = 5 V VBB = 13.5 V Device Version C Figure 21. Sense Pin Clamp Voltage (VSNSCLAMP) vs Temperature 35 60 85 Temperature (qC) VOUT = 0 V VEN = 5 V 110 135 150 SLVS VDIAG_EN = 0 V VLATCH = 5 V Figure 22. Current Limit (ICL) vs Temperature 1.54 2.85 VBB 8V 13.5 V 18 V 2.75 VBB 8V 13.5 V 18 V 1.535 1.53 1.525 2.65 VIL (V) VOL Threshold (V) -15 SLVS 1.52 1.515 1.51 2.55 1.505 1.5 2.45 1.495 2.35 -40 -15 VEN = 0 V VDIAG_EN= 5 V 10 35 60 85 Temperature (qC) VOUT = 0 V to 5 V VSEL1 = VSEL2 = 0 V 110 135 150 1.49 -40 -15 10 SLVS IOUT = 0 A VEN = 3.3 V to 0 V ROUT = 1 kΩ Figure 23. Open Load Detection Voltage (VOL) vs Temperature 35 60 85 Temperature (qC) VOUT = 0 V 110 135 150 SLVS VDIAG_EN = 0 V Figure 24. VIL vs Temperature Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 15 TPS1HA08-Q1 SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 www.ti.com Typical Characteristics (continued) 325 1.86 1.85 VBB 8V 13.5 V 18 V VBB 8V 13.5 V 18 V 320 315 VHYST (mV) VIH (V) 1.84 1.83 1.82 305 300 1.81 1.8 -40 310 295 -15 10 VEN = 0 V to 3.3 V ROUT = 1 kΩ 35 60 85 Temperature (qC) 110 290 -40 135 150 -15 VOUT = 0 V VDIAG_EN = 0 V VEN = 0 V to 3.3 V and 3.3 V to 0 V ROUT = 1 kΩ Figure 25. VIH vs Temperature 3.2 IIH (PA) IIL (PA) 135 150 SLVS VOUT = 0 V VDIAG_EN = 0 V 8V 13.5 V 18 V 2.8 1 2.4 0.8 2 0.6 1.6 -15 VEN = 0.8 V ROUT = 1 kΩ 10 35 60 85 Temperature (qC) 110 135 150 1.2 -40 -15 10 SLVS VOUT = 0 V VDIAG_EN = 0 V VEN = 2 V ROUT = 1 kΩ Figure 27. IIL vs Temperature ROUT = 2.6 Ω RSNS = 1 kΩ VDIA_EN = 5 V VSEL1 = VSEL2 = 0 V Figure 29. Turn-on Time (tON) 16 110 3.6 8V 13.5 V 18 V 1.2 0.4 -40 35 60 85 Temperature (qC) Figure 26. VIHYS vs Temperature 1.6 1.4 10 SLVS 35 60 85 Temperature (qC) 110 135 150 SLVS VOUT = 0 V VDIAG_EN = 0 V Figure 28. IIH vs Temperature ROUT = 2.6 Ω RSNS = 1 kΩ VDIA_EN = 5 V VSEL1 = VSEL2 = 0 V Figure 30. Turn-off Time (tOFF) and Sense Settle Time (tSNSION2) Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 TPS1HA08-Q1 www.ti.com SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 Typical Characteristics (continued) VDIA_EN= 0 V to 5 V VSEL1 = VSEL2 = 0 V IOUT = 1 A to 5 A Figure 31. ISNS Settling Time (tSNSION1) on DIA_EN Transition RSNS = 1 kΩ VDIA_EN = 5 V VSEL1 = VSEL2 = 0 V Figure 32. ISNS Settling Time (tSETTLEH) on Rising Load Step 100 11 IVBB (A) 10 ST (V) SNS (V) 9 EN (V) 8 90 80 Current (A) 70 60 7 50 6 40 5 30 4 20 3 10 2 0 1 -10 0 -20 0 VOUT = VBB VEN = 0 V RSNS = 1 kΩ VDIAG_EN = 5 V VSEL1 = VSEL2 = 0 V VBB = 13.5 V VEN = 0 V to 5 V Figure 33. Open Load Detection Time (tOL2) on Rising DIAG_EN Current (A) 20 15 12 10 8 5 4 0.0004 BPer B Device Version TA = 25°C VOUT = 0 V 15 10 10 5 5 0 0 -5 -5 -10 -10 -15 -15 -20 -20 IVBB VBB -25 VOUT -30 EN -35 0.0056 -25 0 0 -5 0 0.00015 VBB = 13.5 V VEN = 0 V to 5 V 0.0003 0.00045 Time (s) 0.0006 C Device Version TA = 25°C -1 0.0005 15 Current (A) 25 0.0002 0.0003 Time (s) Figure 34. Short Circuit Behavior with B Device Version 24 IVBB (A) ST (V) 20 SNS (V) EN (V) 16 Voltage (V) 30 0.0001 -4 0.00075 -30 -35 0.0008 0.0016 0.0024 C_Pe VOUT = 0 V Voltage (V) RSNS = 1 kΩ VBB = 13.5 V VEN = 0 V to 5 V, 5 V to 0 V 0.0032 0.004 Time (s) TA = 125°C 0.0048 Voltage (V) ROUT = 2.6 Ω Indu LOUT = 5 mH Figure 35. Short Circuit Behavior with C Device Version Figure 36. Inductive Load Demagnetization Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 17 TPS1HA08-Q1 SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 www.ti.com 8 Parameter Measurement Information IBB ISNS ILATCH DIA_EN SNS SEL2 LATCH SEL1 IDIA_EN ISEL2 ISEL1 IOUT ST VOUT GND IGND VST VEN VSEL1 IST VLATCH VSNS VBB VOUT VDIA_EN EN VSEL2 IEN VBB Figure 37. Parameter Definitions 18 Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 TPS1HA08-Q1 www.ti.com SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 9 Detailed Description 9.1 Overview The device is a single-channel smart high-side power switch intended for use with 12 V automotive batteries. Many protection and diagnostic features are integrated in the device. Diagnostics features include the analog SNS output and the open-drain fault indication (ST). The analog SNS output is capable of providing a signal that is proportional to device temperature, supply voltage, or load current. The high-accuracy load current sense allows for diagnostics of complex loads. This device includes protection through thermal shutdown, current limit, transient withstand, and reverse battery operation. For more details on the protection features, refer to the Feature Description and Application Information sections of the document. 9.1.1 Device Nomenclature The is one device in the TI family of Smart High Side Switches. Figure 38 shows the family part number nomenclature and explains how to determine device characteristics from the part number for TI Smart High Side Switches. TPS 1 H A 08 X Q PWPR Q1 Prefix Auto Qual No. of Channels Packaging H 12-V HSS T 24-V HSS AEC Temp Grade Generation Version RON (PŸ) Figure 38. Naming Convention Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 19 TPS1HA08-Q1 SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 www.ti.com 9.2 Functional Block Diagram VBB VBB to GND Clamp Internal Power Supply VBB to VOUT Clamp GND VOUT Gate Driver Power FET EN Current Limit LATCH Energy Limit DIA_EN Thermal Shutdown SEL1 SEL2 VBB Open-load / Short-to-Bat Detection Voltage Sense Fault Indication SNS SNS Mux ST Current Sense Temperature Sense 20 Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 TPS1HA08-Q1 www.ti.com SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 9.3 Feature Description 9.3.1 Protection Mechanisms The is designed to operate in the automotive environment. The protection mechanisms allow the device to be robust against many system-level events such as load dump, reverse battery, short-to-ground and more. There are three protection features which, if triggered, will cause the switch to automatically disable: • Thermal Shutdown • Current Limit (Versions A,B,E) • Energy Limit When any of these protections are triggered, the device will enter the FAULT state. In the FAULT state, the fault indication will be available on both the SNS pin and the ST pin (see the diagnostic section of the data sheet for more details). The switch is no longer held off and the fault indication is reset when all of the below conditions are met: • LATCH pin is low • tRETRY has expired • All faults are cleared (thermal shutdown, current limit, energy limit) 9.3.1.1 Thermal Shutdown The includes temperature sensors on the FET and inside of the device controller. When TJ,FET > TABS, the device will see a thermal shutdown fault. After the fault is detected, the switch will turn off. The fault is cleared when the switch temperature decreases by the hysteresis value, THYS. 9.3.1.2 Current Limit When IOUT reaches the current limit threshold, ICL, the device can switch off immediately (Versions A,B,E), or the device can remain enabled and limit IOUT (Versions C/D) to ICL (see Device Comparison Table section for more details). In the case that the device remains enabled and limits IOUT, the thermal shutdown and/or energy limit protection feature may be triggered due to the high amount of power dissipation in the device. During a short circuit event, the device will hit the ICL threshold that is listed in the Specifications (for the given device version) and then turn the output off or regulate the output current to protect the device. The device will register a short circuit event when the output current exceeds ICL, however the measured maximum current may exceed the ICL threshold due to the deglitch filter and turn-off time. The device is guaranteed to protect itself during a short circuit event over the nominal supply voltage range (as defined in the Specifications section) at 125°C. 9.3.1.2.1 Current Limit Foldback The implements a current limit foldback feature that is designed to protect the device in the case of a long-term fault condition. If the device undergoes three consecutive fault shutdown events (any of thermal shutdown, current limit, or energy limit), the current limit will be reduced to half of the original value. The device will revert back to the original current limit threshold if either of the following occurs: • The device goes to Standby Delay. • The switch turns-on and turns-off without any fault occurring. 9.3.1.2.2 Selectable Current Limit Threshold The offers two current limit thresholds. The high threshold is designed to allow for a large transient load current (for example, inrush current of a 65-W bulb). The low threshold is designed to provide improved system-level protection for loads that do not have large transient currents (for example, heating element). The lower threshold can allow for reduced size/cost in the current carrying components such as PCB traces and module connectors. Version A (20 A current limit) is ideal for charging capacitors, as it will enable the device to prevent inrush current and clamp the overcurrent to linearly charge the capacitor. Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 21 TPS1HA08-Q1 SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 www.ti.com Feature Description (continued) 9.3.1.2.3 Undervoltage Lockout (UVLO) The device monitors the supply voltage VBB to prevent unpredicted behaviors in the event that the supply voltage is too low. When the supply voltage falls down to VUVLOF, the output stage is shut down automatically. When the supply rises up to VUVLOR, the device turns back on. During an initial ramp of VBB from 0 V at a ramp rate slower than 1 V/ms, VEN pin will have to be held low until VBB is above UVLO threshold (with respect to board ground) and the supply voltage to the device has reliably reached above the UVLO condition. For best operation, ensure that VBB has risen above UVLO before setting the VEN pin to high. 9.3.1.2.4 VBB during Short-to-Ground When VOUT is shorted to ground, the module power supply (VBB) can have a transient decrease. This is caused by the sudden increase in current flowing through the wiring harness cables. To achieve ideal system behavior, it is recommended that the module maintain VBB > 3 V during VOUT short-to-ground. This is typically accomplished by placing bulk capacitance on the power supply node. 9.3.1.3 Energy Limit The energy limiting feature is implemented to protect the switch from excessive stress. The device will continuously monitor the amount of energy dissipated in the FET. If the energy limit threshold is reached, the switch will automatically disable. In practice, the energy limit will only be reached during a fault event such as short-to-ground. Energy limit events have the same system-level behavior as thermal shutdown events. 9.3.1.4 Voltage Transients The contains two voltage clamps which protect the device against system-level voltage transients. The clamp from VBB to GND is primarily used to protect the controller from positive transients on the supply line (for example, ISO7637-2). The clamp from VBB to VOUT is primarily used to limit the voltage across the FET when switching off an inductive load. Both clamp levels are set to protect the device during these fault conditions. If the voltage potential from VBB to GND exceeds the VBB clamp level, the clamp will allow current to flow through the device from VBB to GND (Path 2). If the voltage potential from VBB to VOUT exceeds VCLAMP, the power FET will allow current to flow from VBB to VOUT (Path 3). Ri Positive Supply Transient (e.g. ISO7637 pulse 2a/3b) (1) VBB VDS Clamp (3) (2) Controller VBB Clamp VOUT Load GND Figure 39. Current Path During Supply Voltage Transient 22 Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 TPS1HA08-Q1 www.ti.com SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 Feature Description (continued) 9.3.1.4.1 Load Dump The is tested according to ISO 16750-2:2010(E) suppressed load dump pulse. The device supports up to 40 V load dump transient. The switch will maintain normal operation during the load dump pulse. If the switch is enabled, it will stay enabled. If the switch is disabled, it will stay disabled. 9.3.1.4.2 Driving Inductive and Capacitive Loads 15 15 10 10 5 5 0 0 -5 -5 -10 -10 -15 -15 -20 -20 IVBB VBB -25 VOUT -30 EN -35 0.0056 -25 -30 -35 0.0008 0.0016 0.0024 0.0032 0.004 Time (s) 0.0048 Voltage (V) Current (A) When switching off an inductive load, the inductor may impose a negative voltage on the output of the switch. The includes a voltage clamp to limit voltage across the FET. The maximum acceptable load inductance is a function of the device robustness. With a 5 mH load, the can withstand a single pulse of 95 mJ inductive dissipation at 125°C and can withstand 56 mJ of inductive dissipation with a 10 Hz repetitive pulse. If the application parameters exceed this device limit, it is necessary to use a protection device like a freewheeling diode to dissipate the energy stored in the inductor. Figure 40 shows the discharging a 5 mH load that is driven at 5 A. Indu Figure 40. Inductive Discharge (5 mH, 5 A) In addition, the current limit provides an ideal way to charge a capacitive load safely with limited inrush current. With no protection, charging a large capacitive load can lead to high inrush currents that pull a supply down, however by using the low current limit device options the capacitive load can be safely charged. For more information on driving inductive or capacitive loads, reference TI's "How To Drive Inductive, Capacitive, and Lighting Loads with Smart High Side Switch application report. 9.3.1.5 Reverse Battery In the reverse battery condition, the switch will automatically be enabled (regardless of EN status) to prevent power dissipation inside the MOSFET body diode. In many applications (for example, resistive load), the full load current may be present during reverse battery. In order to activate the automatic switch on feature, the SEL2 pin must have a path to module ground. This may be path 1 as shown below, or, if the SEL2 pin is unused, the path may be through RPROT to module ground. Protection features (for example, thermal shutdown) are not available during reverse battery. Care must be taken to ensure that excessive power is not dissipated in the switch during the reverse battery condition. Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 23 TPS1HA08-Q1 SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 www.ti.com Feature Description (continued) There are two options for blocking reverse current in the system. Option 1 is to place a blocking device (FET or diode) in series with the battery supply. This will block all current paths. Option 2 is to place a blocking diode in series with the GND node of the high-side switch. This method will protect the controller portion of the switch (path 2), but it will not prevent current from flowing through the load (path 3). The diode used for Option 2 may be shared amongst multiple high-side switches. Path 1 shown in Figure 41 is blocked inside of the device. Reverse blocking FET or diode BAT Option 1 0V VBB µC VDD (3) (2) Controller GPIO GPIO RPROT VOUT VBB Clamp Load (1) GND Option 2 13.5V Figure 41. Current Path During Reverse Battery 9.3.1.6 Fault Event – Timing Diagrams NOTE All timing diagrams assume that the SELx pins are set to 00. The LATCH, DIA_EN, and EN pins are controlled by the user. The timing diagrams represent a possible use-case. Figure 42 shows the immediate current limit switch off behavior of Versions A,B,E. The diagram also illustrates the retry behavior. As shown, the switch will remain latched off until the LATCH pin is low. 24 Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 TPS1HA08-Q1 www.ti.com SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 Feature Description (continued) µC resets the latch LATCH DIA_EN ISNSFH SNS High-z Current Sense High-z High-z Current Sense High-z ST VOUT EN tRETRY ICL IOUT t Load reaches limit. Switch is Disabled. Switch follows EN. Normal operation. Figure 42. Current Limit – Version A,B,E - Latched Behavior Figure 43 shows the immediate current limit switch off behavior of versions A,B,E. In this example, LATCH is tied to GND; hence, the switch will retry after the fault is cleared and tRETRY has expired. Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 25 TPS1HA08-Q1 SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 www.ti.com Feature Description (continued) DIA_EN ISNSFH SNS High-z Current Sense High-z High-z Current Sense High-z ST VOUT EN tRETRY ICL IOUT t Load reaches limit. Switch is Disabled. Switch follows EN. Normal operation. Figure 43. Current Limit – Version A,B,E - LATCH = 0 Figure 44 shows the active current limiting behavior of versions C,D. In versions C,D, the switch will not shutdown until either the energy limit or the thermal shutdown is reached. 26 Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 TPS1HA08-Q1 www.ti.com SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 Feature Description (continued) µC resets the latch LATCH DIA_EN ISNSFH SNS High-z Current Sense High-z High-z Current Sense High-z ST VOUT EN TABS THYS TJ tRETRY ICL IOUT t Load reaches limit. Current is limited. Temp reaches limit. Switch is disabled. Temp decreases by THYS Switch follows EN. Normal operation. Figure 44. Current Limit – Version C,D - Latched Behavior Figure 45 shows the active current limiting behavior of versions C,D. The switch will not shutdown until either thermal shutdown or energy limit is tripped. In this example, LATCH is tied to GND. Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 27 TPS1HA08-Q1 SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 www.ti.com Feature Description (continued) DIA_EN ISNSFH SNS High-z Current Sense ISNSFH High-z High-z Current Sense High-z ST VOUT EN TABS THYS TJ tRETRY ICL IOUT t Load reaches limit. Current is limited. Temp reaches limit. Switch is disabled. TJ decreases by THYS Switch follows EN. Normal operation. Figure 45. Current Limit – Version C,D - LATCH = 0 When the switch retries after a shutdown event, the SNS fault indication will remain until VOUT has risen to VBB – 1.8 V. Once VOUT has risen, the SNS fault indication is reset and current sensing is available. ST fault indication is reset as soon as the switch is re-enabled (does not wait for VOUT to rise). If there is a short-to-ground and VOUT is not able to rise, the SNS fault indication will remain indefinitely. The following diagram illustrates auto-retry behavior and provides a zoomed-in view of the fault indication during retry. NOTE Figure 46 assumes that tRETRY has expired by the time that TJ reaches the hysteresis threshold. LATCH = 0 V and DIA_EN = 5 V 28 Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 TPS1HA08-Q1 www.ti.com SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 Feature Description (continued) ISNSFH ISNSFH ISNSFH ISNSFH SNS ST VOUT EN TABS THYS TJ t ISNSFH ISNSI SNS ST VBB ± 1.8 V VOUT EN TABS THYS TJ t Figure 46. Fault Indication During Retry 9.3.2 Diagnostic Mechanisms 9.3.2.1 VOUT Short-to-Battery and Open-Load 9.3.2.1.1 Detection With Switch Enabled When the switch is enabled, the VOUT short-to-battery and open-load conditions can be detected with the current sense feature. In both cases, the load current will be measured through the SNS pin and will be below the expected value. Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 29 TPS1HA08-Q1 SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 www.ti.com Feature Description (continued) 9.3.2.1.2 Detection With Switch Disabled While the switch is disabled, if DIA_EN is high, an internal comparator will detect the condition of VOUT. If the load is disconnected (open load condition) or there is a short to battery the OUT voltage will be higher than the open load threshold (VOL,off) and a fault is indicated on the SNS pin. An internal pull-up of 1 MΩ is in series with an internal MOSFET switch, so no external component is required if only a completely open load needs to be detected. However, if there is significant leakage or other current draw even when the load is disconnected, a lower value pull-up resistor and switch can be added externally to set the VOUT voltage above the VOL,off during open load conditions. (1) This figure assumes that the device ground and the load ground are at the same potential. In application, there may be a ground shift voltage of 1 V to 2 V. Figure 47. Short to Battery and Open Load Detection The detection circuitry is only enabled when DIA_EN = HIGH and EN = LOW. If VOUT > VOL, the SNS pin will go to the fault level. If VOUT < VOL, then there is no fault indication. The fault indication will only occur if the SEL1 pin is set to diagnose the channel. While the switch is disabled and DIA_EN is high, the fault indication mechanisms will continuously represent the present status. For example, if VOUT decreases from >VOL to 200µs ENABLE PWM (up to 99% duty cycle) VOUT t < tWD On (100% Duty Cycle) 5µs < t < 20µs(1) ENABLE VOUT t = tWD ENABLE Fault Condition VOUT t = tWD ENABLE Fault Recovery VOUT The watchdog feature requires that a PWM is applied to the switch enable pin. To maintain VOUT at 100% duty cycle, the microcontroller should periodically apply a short pulse to the enable pin. This short pulse will reset the watchdog timer, but will not cause the switch to turn-off. The pulse must be >5 μs to ensure that it is recognized by the device. There is no upper limit on the pulse width; however, if the pulse is longer than 20 μs, the switch may start to transition from enabled to disabled. Figure 51. Enable Watchdog - Overview Figure 52 illustrates the behavior of the watchdog feature. Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 35 TPS1HA08-Q1 SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 www.ti.com DIA_EN ISNSFH SNS High-z Current Sense High-z High-z Current Sense High-z ST VOUT t = tWD EN t (QDEOH SLQ LV KLJK IRU W • WWD. Switch is disabled until a rising edge of EN. Normal operation. Figure 52. Enable Watchdog Timing Diagram 9.4 Device Functional Modes 9.4.1 Off Off state occurs when the device is not powered. 9.4.2 Standby Standby state is a low-power mode used to reduce power consumption to the lowest level. Diagnostic capabilities are not available in Standby mode. 9.4.3 Diagnostic Diagnostic state may be used to perform diagnostics while the switch is disabled. 9.4.4 Standby Delay The Standby Delay state is entered when EN and DIA_EN are low. After tSTBY, if the EN and DIA_EN pins are still low, the device will go to Standby State. 9.4.5 Active In Active state, the switch is enabled. The diagnostic functions may be turned on or off during Active state. 9.4.6 Fault The Fault state is entered if a fault shutdown occurs (thermal shutdown, current limit, energy limit). After all faults are cleared, the LATCH pin is low, and the retry timer has expired, the device will transition out of Fault state. If the Enable pin is high, the switch will re-enable. If the Enable pin is low, the switch will remain off. 36 Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 TPS1HA08-Q1 www.ti.com SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 Device Functional Modes (continued) VBB < UVLO OFF ANY STATE VBB > UVLO EN = Low DIA_EN = Low t > tSTBY STANDBY EN = Low DIA_EN = High EN = Low DIA_EN = Low EN = High DIA_EN = X DIAGNOSTIC STANDBY DELAY EN = Low DIA_EN = High EN = High DIA_EN = X EN = Low DIA_EN = High ACTIVE EN = Low DIA_EN = Low EN = High DIA_EN = X !OT_ABS & !OT_REL & !ILIM & !ELIMIT & LATCH = Low & tRETRY expired OT_ABS || OT_REL || ILIM || ELIMIT FAULT Figure 53. State Diagram Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 37 TPS1HA08-Q1 SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 www.ti.com 10 Application and Implementation NOTE Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes. Customers should validate and test their design implementation to confirm system functionality. 10.1 Application Information VBB BAT DIA_EN RPROT CVBB SEL1 RPROT GND RGND SEL2 RPROT DGND (1) EN RPROT Microcontroller (1) LATCH Load RPROT VOUT COUT RPU ST RPROT Legend ADC SNS RPROT Chassis GND RSNS Module GND Device GND CSNS (1) With the ground protection network, the device ground will be offset relative to the microcontroller ground. With the ground protection network, the device ground will be offset relative to the microcontroller ground. Figure 54. System Diagram Table 4. Recommended External Components COMPONENT TYPICAL VALUE RPROT 15 kΩ Protect microcontroller and device I/O pins RSNS 1 kΩ Translate the sense current into sense voltage RPU 10 kΩ Provide pull-up source for open-drain output CSNS 100 pF - 10 nF RGND 4.7 kΩ DGND BAS21 Diode CVBB COUT 38 PURPOSE Low-pass filter for the ADC input Stabilize GND potential during turn-off of inductive load Protects device during reverse battery 220 nF to Device GND Filtering of voltage transients (for example, ESD, ISO7637-2) and improved emissions 100 nF to Module GND Stabilize the input supply and filter out low frequency noise. 22 nF Filtering of voltage transients (for example, ESD, ISO7637-2) Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 TPS1HA08-Q1 www.ti.com SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 10.1.1 Ground Protection Network As discussed in the section regarding Reverse Battery, DGND may be used to prevent excessive reverse current from flowing into the device during a reverse battery event. Additionally, RGND is placed in parallel with DGND if the switch is used to drive an inductive load. The ground protection network (DGND and RGND) may be shared amongst multiple high-side switches. A minimum value for RGND may be calculated by using the absolute maximum rating for IGND. During the reverse battery condition, IGND = VBB / RGND: RGND ≥ VBB / IGND • Set VBB = –13.5 V • Set IGND = –50 mA (absolute maximum rating) RGND ≥ –13.5 V / –50 mA = 270 Ω (1) In this example, it is found that RGND must be at least 270 Ω. It is also necessary to consider the power dissipation in RGND during the reverse battery event: PRGND = VBB2 / RGND (2) 2 PRGND = (13.5 V) / 270 Ω = 0.675 W In practice, RGND may not be rated for such a high power. In this case, a larger resistor value should be selected. 10.1.2 Interface With Microcontroller The ground protection network will cause the device ground to be at a higher potential than the module ground (and microcontroller ground). This offset will impact the interface between the device and the microcontroller. Logic pin voltage will be offset by the forward voltage of the diode. For input pins (for example, EN), the designer must consider the VIH specification of the switch and the VOH specification of the microcontroller. For a system that does not include DGND, it is required that VOH > VIH. For a system that does include DGND, it is required that VOH > (VIH + VF). VF is the forward voltage of DGND. For use of the status pin, ST, a similar consideration is necessary. The designer must consider the VOL, ST specification and the VIL specification of the microcontroller. For a system that includes DGND, it is required that VOL, ST + VF < VIL, µC. The sense resistor, RSNS, should be terminated to the microcontroller ground. In this case, the ADC can accurately measure the SNS signal even if there is an offset between the microcontroller ground and the device ground. 10.1.3 I/O Protection RPROT is used to protect the microcontroller I/O pins during system-level voltage transients such as ISO pulses or reverse battery. A large resistance value ensures that current through the pin is limited to a safe level. 10.1.4 Inverse Current Inverse current occurs when 0 V < VBB < VOUT. In this case, current may flow from VOUT to VBB. Inverse current cannot be caused by a purely resistive load. However, a capacitive or inductive load can cause inverse current. For example, if there is a significant amount of load capacitance and the VBB node has a transient droop, VOUT may be greater than VBB. will not detect inverse current. When the switch is enabled, inverse current will pass through the switch. When the switch is disabled, inverse current may pass through the MOSFET body diode. The device will continue operating in the normal manner during an inverse current event. 10.1.5 Loss of GND The ground connection may be lost either on the device level or on the module level. If the ground connection is lost, both switches will be disabled. If the switch was already disabled when the ground connection was lost, the switch will remain disabled. When the ground is reconnected, normal operation will resume. Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 39 TPS1HA08-Q1 SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 www.ti.com 10.1.6 Automotive Standards 10.1.6.1 ISO7637-2 is tested according to the ISO7637-2:2011 (E) standard. The test pulses are applied both with the switches enabled and disabled. The test setup includes only the DUT and minimal external components: CVBB, COUT, DGND, and RGND. Status II is defined in ISO 7637-1 Function Performance Status Classification (FPSC) as: “The function does not perform as designed during the test but returns automatically to normal operation after the test”. Table 5. ISO7637-2:2011 (E) Results TEST PULSE SEVERITY LEVEL WITH STATUS II FUNCTIONAL PERFORMANCE LEVEL US MINIMUM NUMBER OF PULSES OR TEST TIME IV –150 V 500 pulses 2a III +55 V 2b IV +10 V 3a III 3b III TEST PULSE 1 BURST CYCLE / PULSE REPETITION TIME MIN MAX 0.5 s -- 500 pulses 0.20 5s 10 pulses 0.5 s 5s –165 V 1 hour 90 ms 100 ms +112 V 1 hour 90 ms 100 ms 10.1.6.2 AEC – Q100-012 Short Circuit Reliability The is tested according to the AEC - Q100-012 Short Circuit Reliability standard. This test is performed to demonstrate the robustness of the device against VOUT short-to-ground events. Test results are summarized in Table 6. For further details, refer to the AEC - Q100-012 standard document or TI's Short Circuit Reliability Test for Smart Power Switches application report. Test conditions: • LATCH = 0 V • TA = –40ºC • 10 units from 3 separate lots for a total of 30 units • Lsupply = 5 μH, Rsupply = 10 mΩ • VBB = 14 V Test procedure: • Parametric data is collected on each unit pre-stress • Each unit is enabled into a short circuit with the required short circuit cycles or duration as specified • Parametric data is re-collected on each unit post-stress to verify that no parametric shift is observed The cold repetitive test is run at –40ºC which is the worst case condition for the . The current limit threshold is highest at cold temperature; hence, the short-circuit pulse contains more energy at cold temperature. The cold repetitive test refers to the device being given time to cool down between pulses, within than being run at a cold temperature. The load short circuit is the worst case situation, since the energy stored in the cable inductance can cause additional harm. The fast response of the device ensures current limiting occurs quickly and at a current close to the load short condition. In addition, the hot repetitive test is performed as well. Table 6. AEC - Q100-012 Test Results TEST LOCATION OF SHORT DEVICE VERSION NO. OF CYCLES NO. OF UNITS NO. OF FAILS Cold Repetitive - Long Pulse Load Short Circuit, Lshort = 5 μH, Rshort = 100 mΩ, TA = –40ºC D 200 k 30 0 Hot Repetitive - Long Pulse Terminal Short Circuit, Lshort = 5 μH, Rshort = 100 mΩ, TA = 25ºC D 100 hours 30 0 40 Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 TPS1HA08-Q1 www.ti.com SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 10.1.7 Thermal Information When outputting current, the will heat up due to the power dissipation. Figure 55 shows the transient thermal impedance curve that can be used to determine the device temperature during 1 W pulse of a given length. 35 30 ZTTJ (qC/W) 25 20 15 10 5 0 0.0001 0.001 0.002 0.005 0.01 0.02 0.05 0.1 0.2 0.3 0.5 Time (s) 1 2 3 4 5 67 10 20 30 50 100 200 400 TPS1 Figure 55. Transient Thermal Impedance 10.2 Typical Application This application example demonstrates how the device can be used to power resistive heater loads as in seat heaters. Figure 56 shows a typical application where the load is a resistive seat heater. This document highlights the basics of this type of application, however for a more detailed discussion reference TI's Smart Power Switch Seat Heater Reference Design. DIA_EN SEL1 SEL2 µC SNS ST LATCH TPS1HA08-Q1 EN 12-V Battery VBB VOUT GND Load Figure 56. Block Diagram for Powering Heater Loads Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 41 TPS1HA08-Q1 SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 www.ti.com Typical Application (continued) 10.2.1 Design Requirements For this design example, use the input parameters shown in Table 7. Table 7. Design Parameters DESIGN PARAMETER EXAMPLE VALUE VBB 12.8 V Heater Load 90 W max Load Current Sense 100 mA to 20 A Ambient temperature 85°C RθJA 32.8°C/W (depending on PCB) 10.2.2 Detailed Design Procedure 10.2.2.1 Thermal Considerations The DC current under maximum load power condition will be around 7.03 A. Power dissipation in the switch is calculated in Equation 3. RON is assumed to be 20 mΩ because this is the maximum specification. In practice, RON will be lower. PFET = I2 × RON PFET = (7.03 A)2 × 20 mΩ = 0.988 W (3) (4) The junction temperature of the device can be calculated using Equation 5 and the RθJA value from the Specifications section. TJ = TA + RθJA × PFET TJ = 85°C + 32.8°C/W × 0.988 W = 117.4°C (5) The maximum junction temperature rating for device is TJ = 150°C. Based on the above example calculation, the device temperature will stay below the maximum rating. 10.2.2.2 Diagnostics If the resistive heating load is disconnected (heater malfunction), an alert is desired. Open-load detection can be performed in the switch-enabled state via the current sense feature of the device. Alternatively, under open load condition in off-state with diagnostics enabled, the current in the SNS pin will be the fault current and the can be detected from the sense voltage measurement. 10.2.2.2.1 Selecting the RISNS Value Table 8 shows the requirements for the load current sense in this application. The KSNS value is specified for the device and can be found in the Specifications section. Table 8. RSNS Calculation Parameters PARAMETER EXAMPLE VALUE Current Sense Ratio (KSNS) 4600 Largest diagnosable load current 20 A Smallest diagnosable load current 50 mA Full-scale ADC voltage 5V ADC resolution 10 bit The load current measurement requirements of 20 A ensures that current can be sensed up to the 20 A current limit, while the low level of 100 mA allows for accurate measurement of low load currents. The RSNS resistor value should be selected such that the largest diagnosable load current puts VSNS at about 90% of the ADC full-scale. With this design, any ADC value above 90% can be considered a fault. Additionally, the RSNS resistor value should ensure that the smallest diagnosable load current does not cause VSNS to fall below 1 LSB of the ADC. With the given example values, a 1-kΩ sense resistor satisfies both requirements shown in Table 9. 42 Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 TPS1HA08-Q1 www.ti.com SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 Table 9. VSNS Calculation LOAD (A) SENSE RATIO ISNS (mA) RSNS (Ω) VSNS (V) % OF 5-V ADC 0.050 4600 0.011 1000 0.011 0.22% 20.000 4600 4.348 1000 4.348 87% 10.2.3 Application Curves Figure 57 shows the behavior of the in this application when the MCU provides an enable pulse to beginning heating the resistive element. Shortly after the EN pin goes high, the load current begins to flow and the SNS pin measures the output current. Figure 57. Heater Turn-on Time By measuring the voltage on the SNS pin, the can communicate back to the system MCU what the load current is. Figure 58 shows that when the seat heater approaches full load and IOUT jumps from a low load current of 1 A up to a 5 A load current, the load step is mirrored on the SNS pin. Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 43 TPS1HA08-Q1 SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 www.ti.com Figure 58. SNS Response During Heater Load Step One common concern in these type of applications is that the heating element can accidentally lose connection, creating an open load situation. In this case, it is ideal for the to recognize that the load has been removed and report a FLT to the MCU. Figure 59 shows the behavior of the when there is no load attached. As soon as the DIAG_EN pin is engaged, the SNS output goes high and the ST output engages low. By monitoring these pins, the MCU can recognize there is a fault and notify the user that maintenance is required. Figure 59. Open Load Detection If Heating Element is Missing 44 Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 TPS1HA08-Q1 www.ti.com SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 30 20 24 IVBB (A) ST (V) 20 SNS (V) EN (V) 16 15 12 10 8 5 4 0 0 Current (A) 25 -5 0 0.00015 0.0003 0.00045 Time (s) 0.0006 Voltage (V) Importantly, the will also protect the system in the event of a short-circuit. Figure 60 shows the behavior of the device if it is enabled into a short circuit condition. If this is using the device option C, the current will be clamped to the current limit ICL until it hits an over temperature event, at which point it will shut down. In this way, the system is protected from unchecked overcurrent in the event of a short circuit. -4 0.00075 C_Pe Figure 60. Overcurrent Behavior During Short Circuit Event 11 Power Supply Recommendations The is designed to operate in a 12-V automotive system. The nominal supply voltage range is 8 V to 18 V. The device is also designed to withstand voltage transients beyond this range. When operating outside of the nominal voltage range, the device will exhibit normal functional behavior. However, parametric specifications may not be guaranteed. Table 10. Operating Voltage Range VBB Voltage Range Note 3 V to 8 V Transients such as cold crank and start-stop, functional operation guaranteed but some parametric specifications may not apply. The device is completely short-circuit protected up to 125°C 8 V to 18 V Nominal supply voltage, all parametric specifications apply. The device is completely short-circuit protected up to 125°C 18 V to 40 V Transients such as jump-start and load-dump, functional operation guaranteed but some parametric specifications may not apply Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 45 TPS1HA08-Q1 SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 www.ti.com 12 Layout 12.1 Layout Guidelines To achieve optimal thermal performance, connect the exposed pad to a large copper pour. On the top PCB layer, the pour may extend beyond the pad dimensions as shown in the example below. In addition to this, it is recommended to also have a VBB plane either on one of the internal PCB layers or on the bottom layer. Vias should connect this plane to the top VBB pour. has 6 VOUT pins. All VOUT pins must be shorted together on the PCB. Additionally, the layout should ensure that the current path is symmetrical for both sides of the device. If the path is not symmetrical, there will be some imbalance in current spreading across the power FET. This can impact accuracy of the current sense measurement. 12.2 Layout Example GND DIA_EN SNS SEL2 LATCH SEL1 To µC To µC EN NC VBB ST NC VOUT VOUT VOUT VOUT VOUT VOUT Figure 61. PWP Layout Example 46 Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 TPS1HA08-Q1 www.ti.com SLVSDM4D – NOVEMBER 2018 – REVISED DECEMBER 2019 13 Device and Documentation Support 13.1 Device Support 13.1.1 Related Documentation For related documentation see the following: • TI's "How To Drive Inductive, Capacitive, and Lighting Loads with Smart High Side Switch • Short Circuit Reliability Test for Smart Power Switches • TI's Smart Power Switch Seat Heater Reference Design • Reverse Battery Protection for High Side Switches 13.2 Trademarks All trademarks are the property of their respective owners. 13.3 Electrostatic Discharge Caution These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. 13.4 Glossary SLYZ022 — TI Glossary. This glossary lists and explains terms, acronyms, and definitions. 14 Mechanical, Packaging, and Orderable Information The following pages include mechanical, packaging, and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation. Submit Documentation Feedback Copyright © 2018–2019, Texas Instruments Incorporated Product Folder Links: TPS1HA08-Q1 47 PACKAGE OPTION ADDENDUM www.ti.com 10-Dec-2020 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan (2) Lead finish/ Ball material MSL Peak Temp Op Temp (°C) Device Marking (3) (4/5) (6) TPS1HA08AQPWPRQ1 ACTIVE HTSSOP PWP 16 3000 RoHS-Exempt & Green NIPDAU Level-3-260C-168HRS -40 to 125 1HA08A TPS1HA08BQPWPRQ1 ACTIVE HTSSOP PWP 16 3000 RoHS-Exempt & Green NIPDAU Level-3-260C-168HRS -40 to 125 1HA08B TPS1HA08CQPWPRQ1 ACTIVE HTSSOP PWP 16 3000 RoHS-Exempt & Green NIPDAU Level-3-260C-168HRS -40 to 125 1HA08C TPS1HA08DQPWPRQ1 ACTIVE HTSSOP PWP 16 3000 RoHS-Exempt & Green NIPDAU Level-3-260C-168HRS -40 to 125 1HA08D TPS1HA08EQPWPRQ1 ACTIVE HTSSOP PWP 16 3000 RoHS-Exempt & Green NIPDAU Level-3-260C-168HRS -40 to 125 1HA08E (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
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