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TPS65177, TPS65177A
SLVSBC9C – MARCH 2012 – REVISED FEBRUARY 2016
TPS65177/A Fully I2C Programmable 6-CH LCD Bias IC for all Size TV
Including Gate Pulse Modulation
1 Features
2 Applications
•
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•
1
•
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•
•
•
•
•
•
•
•
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Enable / Disable
– TPS65177: AVI power cycle
– TPS65177A: VI power cycle or EN-pin
8.6-V to 14.7-V Input Voltage Range
Non-Synchronous Boost Converter (V(AVDD))
– Integrated Isolation Switch
– 13.5-V to 19.8-V Output Voltage (I2C)
– 15-V Default Output Voltage
– 4.25-A Switch Current Limit (I2C)
– High Voltage Stress Mode (I2C)
Synchronous Buck Converter (V(HAVDD))
– 4.8-V to 11.1-V Output Voltage (I2C)
– 7.5-V Default Output Voltage
– 1.7-A Switch Current Limit
– High Voltage Stress Mode (I2C)
Non-Synchronous Buck Converter (V(IO))
– 2.2-V to 3.7-V Output Voltage (I2C)
– 2.5-V Default Output Voltage
– 3-A Switch Current Limit
Synchronous Buck Converter (V(CORE))
– 0.8-V to 3.3-V Output Voltage (I2C)
– 1-V Default Output Voltage
– 2.5-A Switch Current Limit
Positive Charge-Pump Controller (V(GH))
– 20-V to 40-V Output Voltage (I2C)
– 28-V Default Output Voltage
– Temp. Compensation Offset 0-V to 15-V (I2C)
– 4-V Default Offset (28 V to 32 V)
Negative Charge-Pump Controller (V(GL))
– –14.5-V to –5.5-V Output Voltage (I2C)
– –7.9-V Default Output Voltage
Gate Pulse Modulation (GPM)
– Down to 0-V, 5-V, 10-V or 15-V (I2C)
– 0-V Default Discharge Voltage
Temperature Compensation for V(GH)
Thermal Shutdown
I2C Compatible Interface
EEPROM Memory
6-mm × 6-mm × 1-mm 40-Pin VQFN Package
GIP (Gate-in-Panel) LCD TVs
Non-GIP LCD TVs
3 Description
The TPS65177/A provides all supply rails needed by
a GIP (Gate-in-Panel) or non-GIP TFT-LCD panel. All
output voltages are I2C programmable.
V(IO) and V(CORE) for the T-CON, V(AVDD) and V(HAVDD)
for the Source Driver and the Gamma Buffer, V(GH)
and V(GL) for the Gate Driver or the Level Shifter. For
use with non-GIP technology Gate Pulse Modulation
(GPM) is implemented, for use with GIP technology
the V(GH) rail can be temperature compensated.
Furthermore a High Voltage Stress Mode (HVS) for
V(AVDD) and V(HAVDD) and an integrated V(AVDD)
Isolation Switch is implemented. V(CORE), V(HAVDD),
V(GH), V(GL), GPM and the V(GH) temperature
compensation can be enabled and disabled by I2C
programming.
A single BOM (Bill of Materials) can cover several
panel types and sizes whose desired output voltage
levels can be programmed in production and stored
in a non-volatile integrated memory.
Device Information(1)
PART NUMBER
PACKAGE
BODY SIZE (NOM)
TPS65177
VQFN (40 Pin)
6.00 mm x 6.00 mm
TPS65177A
VQFN (40 Pin)
6.00 mm x 6.00 mm
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
Block Diagram
VI
8.6 V to 14.7 V
I2 C
compatible
Boost Converter
Isolation Switch
V(AVDD)
13.5 V to 19 V, 2.2 A @ 18 V
Buck Converter 1
V(IO)
2.2 V to 3.7 V, 2.7 A @ 3.3 V
Buck Converter 2
(Synchronous)
V(CORE)
0.8 V to 3.3 V, 2.4 A @ 1.2 V
Buck Converter 3
(Synchronous)
V(HAVDD)
4.8 V to 11.1 V, 1 A @ 9 V
Positive Charge Pump
Controller
(Temp. Compensated)
V(GH)
20 V to 40 V, 200 mA
Negative Charge Pump
Controller
V(GL)
±5.5 V to ±14.5 V, 200 mA
Gate Pulse Modulation
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
TPS65177, TPS65177A
SLVSBC9C – MARCH 2012 – REVISED FEBRUARY 2016
www.ti.com
Table of Contents
1
2
3
4
5
6
Features ..................................................................
Applications ...........................................................
Description .............................................................
Revision History.....................................................
Pin Configuration and Functions .........................
Specifications.........................................................
6.1
6.2
6.3
6.4
6.5
6.6
6.7
6.8
7
1
1
1
2
3
5
Absolute Maximum Ratings ..................................... 5
ESD Ratings.............................................................. 5
Recommended Operating Conditions...................... 6
Thermal Information .................................................. 6
Electrical Characteristics.......................................... 7
I2C Interface Timing Characteristics ....................... 9
I2C Timing Diagram................................................... 9
Typical Characteristics ............................................ 10
Detailed Description ............................................ 12
7.1
7.2
7.3
7.4
Overview .................................................................
Functional Block Diagram .......................................
Feature Description.................................................
Device Functional Modes........................................
12
13
14
17
7.5 Gate Pulse Modulation (V(GHM)).............................. 31
7.6 Programming .......................................................... 33
7.7 Register Map........................................................... 42
8
Application and Implementation ........................ 46
8.1 Application Information............................................ 46
8.2 Typical Applications ................................................ 46
8.3 System Examples ................................................... 53
9 Power Supply Recommendations...................... 55
10 Layout................................................................... 56
10.1 Layout Guideline ................................................... 56
10.2 Layout Example .................................................... 56
11 Device and Documentation Support ................. 58
11.1
11.2
11.3
11.4
11.5
11.6
Related Links ........................................................
Third-Party Products Disclaimer ...........................
Community Resources..........................................
Trademarks ...........................................................
Electrostatic Discharge Caution ............................
Glossary ................................................................
58
58
58
58
58
58
12 Mechanical, Packaging, and Orderable
Information ........................................................... 58
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision B (January 2016) to Revision C
•
Page
Added TPS65177A device and changed Features description, color of several graphics ................................................... 1
Changes from Revision A (July 2012) to Revision B
Page
•
Added the ESD Ratings table, Features Description section, Device Functional Modes section, Application and
Implementation section, Power Supply Recommendation section, Layout section, Device and Documentation
Support section, and Mechanical, Packaging, and Orderable Information sections. ............................................................ 1
•
Added text to the Power-Up section, " If the EN pin is not connected to VIN...".................................................................. 14
Changes from Original (March 2012) to Revision A
Page
•
Changed PR equation ........................................................................................................................................................... 28
•
Deleted Inverting Doubler: VGL_max equation ........................................................................................................................ 29
•
Deleted Inverting Doubler: VGL_max equation ........................................................................................................................ 29
•
Deleted Inverting Doubler: PDIS equation.............................................................................................................................. 30
•
Deleted Inverting Doubler: PDIS equation.............................................................................................................................. 30
•
Changed PR equation ........................................................................................................................................................... 31
•
Changed Figure 46, Figure 47, ........................................................................................................................................... 53
•
Changed Figure 48............................................................................................................................................................... 56
2
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Product Folder Links: TPS65177 TPS65177A
TPS65177, TPS65177A
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SLVSBC9C – MARCH 2012 – REVISED FEBRUARY 2016
5 Pin Configuration and Functions
NC
SWBK1
SWBK1
VIO
INBK2
CTRL
VCORE
SWBK2
PGND2
EN
RHA Package
40 Pin (VQFN)
Top View
40
39
38
37
36
35
34
33
32
31
INBK1
1
30
VHAVDD
INBK1
2
29
PGND3
NC
3
28
SWBK3
SDA
4
27
NC
SCL
5
26
INBK3
Exposed Thermal PAD
8
23
VGH
AGND
9
22
DRV P
COMP
10
21
DRV N
12
13
14
15
16
17
18
19
20
VGL
11
NC
INV L
SWO
VGHM
SWI
24
SW
7
SW
HVS
PGND1
RE
PGND1
25
NTC
6
VL
A0
Pin Functions
PIN
NAME
NO.
INBK1
1, 2
TYPE
DESCRIPTION
—
Buck 1 converter (V(IO)) supply pin. This pin is internally connected to INBK3. Place a buffer capacitor close to
this pin.
Not connected.
NC
3
—
SDA
4
I/O
I2C data pin.
SCL
5
I
I2C clock pin.
A0
6
I
I2C address select pin.
HVS
7
I
Boost and Buck 3 converter High Voltage Stress Mode enable pin.
INVL
8
—
Internal logic supply pin. Place a buffer capacitor close to this pin.
Analog Ground pin. Internal circuitry uses this ground.
AGND
9
—
COMP
10
I/O
Boost converter (V(AVDD)) compensation pin.
VL
11
I/O
Internal 5 V regulator output pin. Connect a buffer capacitor to this pin.
NTC
12
I
Thermal Resistor sense pin.
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Product Folder Links: TPS65177 TPS65177A
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Pin Functions (continued)
PIN
TYPE
DESCRIPTION
NAME
NO.
PGND1
13, 14
—
Boost converter (V(AVDD)) Power Ground pin.
SW
15, 16
O
Boost converter (V(AVDD)) switch pin. Avoid long traces to the diode and inductor because this trace carries
switching waveforms that generate noise.
SWI
17
I
Isolation Switch input pin.
SWO
18
O
Isolation Switch output pin.
NC
19
—
Not connected.
VGL
20
I
Negative Charge Pump (V(GL)) voltage sense pin.
DRVN
21
O
Negative Charge Pump (V(GL)) base drive pin.
DRVP
22
I
Positive charge pump (V(GH)) base drive pin.
VGH
23
I
Positive charge pump (V(GH)) output voltage sense and Gate Pulse Modulation supply pin.
VGHM
24
I/O
RE
25
O
Slope adjustment of Gate Pulse Modulation.
INBK3
26
—
Buck 3 converter (V(HAVDD)) supply pin. This pin is internally connected to INBK1. Place a buffer capacitor
close to this pin.
NC
27
—
Not connected.
SWBK3
28
O
Buck 3 Converter (V(HAVDD)) switch pin. Avoid long traces to the inductor because this trace carries switching
waveforms that generate noise.
PGND3
29
—
Buck 3 Converter (V(HAVDD)) Power Ground pin.
VHAVDD
30
I
Buck 3 Converter (V(HAVDD)) voltage sense pin.
EN
31
I
Enable of Isolation Switch, Boost converter and Buck 3 converter.
PGND2
32
—
Buck 2 converter (V(CORE)) Power Ground pin.
SWBK2
33
O
Buck 2 converter (V(CORE)) switch pin. Avoid long traces to the inductor because this trace carries switching
waveforms that generate noise.
VCORE
34
I
Buck 2 converter (V(CORE)) output voltage sense pin.
CTRL
35
I
Gate Pulse Modulation control pin.
INBK2
36
—
VIO
37
I
Buck 1 converter (V(IO)) output voltage sense pin.
38, 39
O
Buck 1 converter (V(IO)) switch pin. Avoid long traces to the diode and inductor because this trace carries
switching waveforms that generate noise.
40
—
Not connected.
Exposed thermal
pad
—
The Exposed thermal pad is connected to AGND.
SWBK1
NC
4
Gate Pulse Modulation output pin.
Buck 2 converter (V(CORE)) supply pin. Place a buffer capacitor close to this pin.
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Product Folder Links: TPS65177 TPS65177A
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SLVSBC9C – MARCH 2012 – REVISED FEBRUARY 2016
6 Specifications
6.1
Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)
(1)
VALUE
UNIT
MIN
MAX
–0.3
20
V
–2
18
V
COMP, EN, A0, SDA, SCL, CTRL, SWBK2, VCORE, INBK2, DRVN, NTC
–0.3
7
V
VL
–0.3
5.5
V
DRVP, VGH, VGHM, RE
–0.3
40
V
VGL
–15
0.3
V
Operating junction temperature range
–40
150
°C
Storage temperature range, Tstg
–65
150
°C
VIO, INBK1, HVS, INVL, INBK3, SWBK3, VHAVDD, SW, SWI, SWO
SWBK1
Pin Voltage
(1)
(2)
(2)
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating
conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
With respect to the GND pin.
6.2 ESD Ratings
VALUE
V(ESD)
(1)
(2)
Electrostatic discharge
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1)
±2000
Charged-device model (CDM), per JEDEC specification JESD22C101 (2)
±700
UNIT
V
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
Copyright © 2012–2016, Texas Instruments Incorporated
Product Folder Links: TPS65177 TPS65177A
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6.3
www.ti.com
Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN
TYP
MAX
VI
Supply input voltage range
8.6
12
14.7
UNIT
V
C(VL)
Internal 5 V regulator (VL) buffer capacitance (after DC-Bias derating)
0.1
1
4.7
µF
BOOST CONVERTER
V(AVDD)
Boost output voltage range
L
Boost inductor (inductor value that can be used)
13.5
4.7
6.8
19.8
V
10
µH
CI
Input capacitor placed at the inductor (ceramic capacitor value)
4.7
10
C(SWI)
Isolation Switch input capacitor (ceramic capacitor value)
4.7
10
100
µF
C(SWO)
Isolation Switch output capacitor (ceramic capacitor value)
20
40
200
µF
3.7
V
10
µH
µF
BUCK 1 CONVERTER
V(IO)
Buck 1 output voltage range
2.2
L
Buck 1 inductor (inductor value that can be used)
4.7
6.8
CI
Buck 1 input capacitor (ceramic capacitor value)
4.7
10
COUT
Buck 1 output capacitor (ceramic capacitor value)
20
30
µF
100
µF
BUCK 2 CONVERTER
V(CORE)
Buck 2 output voltage range
0.8
L
Buck 2 inductor (inductor value that can be used)
4.7
6.8
CI
Buck 2 input capacitor (ceramic capacitor value)
4.7
10
COUT
Buck 2 output capacitor (ceramic capacitor value)
10
20
3.3
V
10
µH
µF
50
µF
BUCK 3 CONVERTER
V(HAVDD)
Buck 3 output voltage range
4.8
L
Buck 3 inductor (inductor value that can be used)
4.7
6.8
CIN
Buck 3 input capacitor (ceramic capacitor value)
4.7
10
COUT
Buck 3 output capacitor (ceramic capacitor value)
4.7
10
11.1
V
10
µH
µF
50
µF
NEGATIVE CHARGE PUMP CONTROLLER
V(GL)
Controller output voltage range
C(FLY)
Flying capacitor (ceramic capacitor value)
–5.5
–14.5
V
0.1
0.47
4.7
µF
R(switch)
COUT
Resistance to the switch pin
0
2.2
20
Ω
Output capacitor (ceramic capacitor value)
1
4.7
50
µF
40
V
POSITIVE CHARGE PUMP CONTROLLER
V(GH)
Controller output voltage range
20
V(GH_offset)
Temperature compensation V(GH) positive offset
C(FLY)
Flying capacitor (ceramic capacitor value)
R(switch)
COUT
15
V
0.1
0
0.47
4.7
µF
Resistance to the switch pin
0
2.2
20
Ω
Output capacitor (ceramic capacitor value)
1
4.7
50
µF
TEMPERATURE
TA
Operating ambient temperature
–40
85
°C
TJ
Operating junction temperature
–40
125
°C
6.4 Thermal Information
RHA (VQFN)
THERMAL METRIC (1)
40 PINS
UNIT
RθJA
Junction-to-ambient thermal resistance
32.8
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
20.3
°C/W
RθJB
Junction-to-board thermal resistance
7.9
°C/W
ψJT
Junction-to-top characterization parameter
0.3
°C/W
ψJB
Junction-to-board characterization parameter
7.8
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
2.6
°C/W
(1)
6
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
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6.5
SLVSBC9C – MARCH 2012 – REVISED FEBRUARY 2016
Electrical Characteristics
VI = 12 V, EN = 3.3 V, V(AVDD) = 18 V, V(HAVDD) = 9 V, V(IO) = 3.3 V, V(CORE) = 1.2 V, V(GH) = 28 V, V(GL) = –10.3 V, TA = –40°C
to 85°C, typical values are at TA = 25°C (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
14.7
V
8.6
V
SUPPLY CURRENT
VI
VIT+
VIT–
Operating input voltage
8.6
Undervoltage lockout threshold (UVLO)
Thermal shutdown
VI rising
8
8.3
Hysteresis VI falling
0.75
V
Junction temperature rising
150
ºC
LOGIC SIGNALS
VIH
High-level input
voltage
EN, HVS, SDA, SCL,
A0, CTRL
VIL
Low-level input
voltage
EN, HVS, A0, CTRL
2
V
SDA, SCL
1
V
0.9
V
5.1
V
INTERNAL REGULATOR
V(VL)
Internal supply
4.9
5
ISOLATION SWITCH
rDS(ON)
MOSFET on-resistance
I(SWI) = 1 A
100
mΩ
BOOST CONVERTER (V(AVDD))
V(AVDD)
Switching frequency
600
750
900
kHz
Output voltage range
13.5
18
19
V
19.8
V
0
3
V
20.5
22.5
V
Output voltage range for max. 500h
High Voltage Stress Mode V(AVDD) positive
offset
Switch overvoltage protection
At SW pin, V(AVDD) rising
Output voltage tolerance
At TJ = 0 ºC to 85 ºC
1%
Feedback input bias current
rDS(on)
MOSFET on-resistance
I(SW) = current limit
MOSFET current limit
At TJ = 0 ºC to 85 ºC
MOSFET current limit negative offset
4.25
350
600
µA
100
200
mΩ
5
5.75
A
0
Line Regulation
8.6 V ≤ VI ≤ 14.7 V, IOUT = 500 mA
Load Regulation
1 mA ≤ IOUT ≤ 2 A
2.8
A
0.001
%/V
0.08
%/A
BUCK1 CONERTER (V(IO))
V(IO)
Switching frequency
600
750
900
kHz
Output voltage range
2.2
3.3
3.7
V
Output voltage tolerance
At TJ = 0 ºC to 85ºC
I
Feedback input bias current
rDS(on)
MOSFET on-resistance
I(SWBK1) = current limit
MOSFET current limit
At TJ = 0 ºC to 85 ºC
Line Regulation
8.6 V ≤ VI ≤ 14.7 V, IOUT = 500 mA
Load Regulation
1 mA ≤ IOUT ≤ 2 A
2%
2.8
10
200
µA
200
300
mΩ
3.5
4.2
A
0.002
%/V
0.07
%/A
BUCK2 CONVERTER (V(CORE))
V(CORE)
Switching frequency
0.5
1
2
Output voltage range
0.8
1.2
3.3
Output voltage tolerance
At TJ = 0 ºC to 85 ºC
MOSFET on-resistance
I(SWBK2) = current limit
MOSFET current limit
At TJ = 0 ºC to 85 ºC
Line Regulation
2.2 V ≤ VI ≤ 3.7 V, IOUT = 500 mA
Load Regulation
1 mA ≤ IOUT ≤ 1.5 A
Copyright © 2012–2016, Texas Instruments Incorporated
Product Folder Links: TPS65177 TPS65177A
V
2%
Feedback input bias current
rDS(on)
MHz
2.5
20
200
µA
175
300
mΩ
3
3.5
A
0.001
%/V
0.2
%/A
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Electrical Characteristics (continued)
VI = 12 V, EN = 3.3 V, V(AVDD) = 18 V, V(HAVDD) = 9 V, V(IO) = 3.3 V, V(CORE) = 1.2 V, V(GH) = 28 V, V(GL) = –10.3 V, TA = –40°C
to 85°C, typical values are at TA = 25°C (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Switching frequency
0.5
Output voltage range
4.8
1
2
MHz
9
11.1
V
1.5
V
BUCK3 CONVERTER (V(HAVDD))
V(HAVDD)
Output Voltage Stress Mode V(HAVDD) positive
offset
Output voltage tolerance
0
At TJ = 0 ºC to 85 ºC
1.5%
Feedback input bias current
rDS(on)
MOSFET on-resistance
I(SWBK3) = current limit
MOSFET current limit
At TJ = 0 ºC to 85 ºC
Line Regulation
8.6 V ≤ VI ≤ 14.7 V, IOUT = 500 mA
Load Regulation
1 mA ≤ IOUT ≤ 1 A
1.2
90
200
µA
300
500
mΩ
1.5
1.8
A
0.002
%/V
0.05
%/A
NEGATIVE CHARGE PUMP CONTROLLER (V(GL))
V(GL)
Output voltage range
–5.5
Output voltage tolerance
50
Max. DRVN drive current
–14.5
V
2.5%
Feedback input bias current
I(DRVN)
–10.3
At TJ = 0 ºC to 85 ºC
V(DRVN) = 0.6 V
5
Resistor DRVN to GND
50
100
200
µA
10
mA
200
kΩ
Line Regulation
8.6 V ≤ VI ≤ 14.7 V, IOUT = 50 mA
0.015
%/V
Load Regulation
1 mA ≤ IOUT ≤ 100 mA
0.002
%/mA
POSITIVE CHARGE PUMP CONTROLLER (V(GH))
V(GH)
Output voltage range
V(GH_offset)
Temp. compensation V(GH) positive offset
V(GH_offset) = 8 V
20
28
35
V
0
8
15
V
40
V
Max. output voltage including V(GH_offset)
Output voltage tolerance
At TJ = 0 ºC to 85 ºC
2.5%
Feedback input bias current
I(DRVP)
120
5
200
µA
10
mA
Max. DRVP drive current
V(DRVP) = 17 V
Line Regulation
8.6 V ≤ VI ≤ 14.7 V, IOUT = 50 mA
0.001
%/V
Load Regulation
1 mA ≤ IOUT ≤ 100 mA
0.001
%/mA
GATE PULSE MODULATION (V(GHM))
Gate Pulse Modulation falling limit
V(GHM) = 15 V
5
15
V
rDS(ON)M1
VGH to VGHM on-resistance
CTRL = 3.3 V, I(VGHM) = 20 mA,
V(GH) = 28 V
3
5
Ω
rDS(ON)M2
VGHM to RE on-resistance
CTRL = GND, I(RE) = 20 mA, V(GHM) =
15 V
3
5
Ω
CTRL to VGHM propagation delay
CTRL rising
250
360
ns
8
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150
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I2C Interface Timing Characteristics
6.6
(1)
PARAMETER
fSCL
TEST CONDITIONS
SCL clock frequency
MAX
UNIT
Standard mode
MIN
TYP
100
kHz
Fast mode
400
kHz
1
MHz
Fast mode plus
tLOW
LOW period of the SCL clock
tHIGH
HIGH period of the SCL clock
tBUF
Bus free time between a STOP and START condition
thd:STA
Hold time for a repeated START condition
tsu:STA
Setup time for a repeated START condition
tsu:STO
Setup time for STOP condition
thd:DAT
Data hold time
tsu:DAT
Data setup time
CB
Capacitive load for SDA and SCL
tRCL1
Rise time of SCL signal after a repeated START
condition and after an acknowledge bit
tRCL
Rise time of SCL signal
tFCL
Fall time of SCL signal
tRDA
Rise time of SDA signal
tFDA
(1)
Fall time of SDA signal
Standard mode
4.7
µs
Fast mode
1.3
µs
Standard mode
4.0
µs
Fast mode
600
ns
Standard mode
4.7
µs
Fast mode
1.3
µs
Standard mode
4.0
µs
Fast mode
600
ns
Standard mode
4.7
µs
Fast mode
600
ns
Standard mode
4.0
µs
Fast mode
600
ns
Standard mode
0
3.45
µs
Fast mode
0
0.9
µs
Standard mode
250
Fast mode
100
ns
ns
400
pF
Standard mode
20 + 0.1CB
1000
ns
Fast mode
20 + 0.1CB
1000
ns
Standard mode
20 + 0.1CB
1000
ns
Fast mode
20 + 0.1CB
300
ns
Standard mode
20 + 0.1CB
300
ns
Fast mode
20 + 0.1CB
300
ns
Standard mode
20 + 0.1CB
1000
ns
Fast mode
20 + 0.1CB
300
ns
Standard mode
20 + 0.1CB
300
ns
Fast mode
20 + 0.1CB
300
ns
Industry standard I2C timing characteristics. Not tested in production.
6.7 I2C Timing Diagram
SDA
tf
tLOW
tr
tsu;DAT
tf
tBUF
tr
thd;STA
SCL
S
thd;STA
thd;DAT
tsu;STA
HIGH
tsu;STO
Sr
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6.8 Typical Characteristics
VI = 12 V unless otherwise noted.
0.25
10
9
0.2
8
rDS(on) (:)
rDS(on) (:)
7
0.15
0.1
6
5
4
3
0.05
2
1
0
-50
-25
0
25
50
75
Junction Temperature (qC)
100
0
-50
125
-25
0.25
0.2
0.2
0.15
0.15
0.1
0.05
125
D002
0.1
0.05
0
-50
-25
0
25
50
75
Junction Temperature (qC)
100
0
-50
125
-25
0
25
50
75
Junction Temperature (qC)
D003
Figure 3. V(IO) Buck 1 Converter NMOS rDS(on)
100
125
D004
Figure 4. V(CORE) Buck 2 Converter NMOS rDS(on)
0.25
0.5
0.2
0.4
0.15
0.3
rDS(on) (:)
rDS(on) (:)
100
Figure 2. V(AVDD) Boost Converter PMOS rDS(on)
0.25
rDS(on) (:)
rDS(on) (:)
Figure 1. V(AVDD) Boost Converter NMOS rDS(on)
0.1
0.05
0.2
0.1
0
-50
-25
0
25
50
75
Junction Temperature (qC)
100
125
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0
-50
-25
0
25
50
75
Junction Temperature (qC)
D005
Figure 5. V(CORE) Buck 2 Converter PMOS rDS(on)
10
0
25
50
75
Junction Temperature (qC)
D001
100
125
D006
Figure 6. V(HAVDD) Buck 3 Converter NMOS rDS(on)
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Typical Characteristics (continued)
VI = 12 V unless otherwise noted.
0.5
10
9
0.4
8
IDRVP (mA)
rDS(on) (:)
7
0.3
0.2
6
5
4
3
0.1
2
1
0
-50
-25
0
25
50
75
Junction Temperature (qC)
100
125
0
-50
-25
D007
Figure 7. V(HAVDD) Buck 3 Converter PMOS rDS(on)
0
25
50
75
Junction Temperature (qC)
100
125
D008
Figure 8. V(GH) charge-pump DRVP drive current
10
9
8
IDRVP (mA)
7
6
5
4
3
2
1
0
-50
-25
0
25
50
75
Junction Temperature (qC)
100
125
D009
Figure 9. V(GL) charge-pump DRVN drive current
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7 Detailed Description
7.1 Overview
The TPS65177/A provides all supply rails needed by a GIP (Gate-in-Panel) or non-GIP TFT-LCD panel. All
output voltages are I2C programmable.
V(IO) and V(CORE) for the T-CON, V(AVDD) and V(HAVDD) for the Source Driver and the Gamma Buffer, V(GH) and
V(GL) for the Gate Driver or the Level Shifter. For use with non-GIP technology Gate Pulse Modulation (GPM) is
implemented, for use with GIP technology the V(GH) rail can be temperature compensated. Furthermore a High
Voltage Stress Mode (HVS) for V(AVDD) and V(HAVDD) and an integrated V(AVDD) Isolation Switch is implemented.
V(CORE), V(HAVDD), V(GH), V(GL), GPM and the V(GH) temperature compensation can be enabled and disabled by I2C
programming.
A single BOM (Bill of Materials) can cover several panel types and sizes whose desired output voltage levels can
be programmed in production and stored in a non-volatile integrated memory.
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7.2 Functional Block Diagram
INVL
VREF
Undervoltage
Lockout
typ. 8.3V
Bandgap
AGND
SW Soft-Star t
completed
Star t
Boost
SDA
2.5V
I2C
Address select
N-MOS
INBK2
D
S
N-MOS
D
S
PGND2
DRVP
5mA
100µA
CTRL
Limit
1V
Error
VREF
VGH
VGHM
Sh ort
Limit voltage
0V, 5V, 10V, 15V
RE
Short
Sh ort
Short
PGND1
INBK3
S
D
Buck 3
Control Logic
Error
SWBK3
D
TOFF
Control
S
PGND3
Boost Soft-Star t
completed
40%
80%
(50ms)
GPM
Control Logic
PGND1
S
6V
1.25V
Sh ort
Soft-Star t
typ. 1.5ms
Pos. CP
Control Logic
D
SWO
Soft-Star t
3ms
1V clamp VGH_LOW
2V clamp VGH_HIGH
SW
Soft-Star t
10/20ms
Buck 2
Control Logic
SWBK2
NTC
750kHz
Oscillator
Sh ort
Error
SW
D
Boost
Control Logic
VREF VSWO (Boost)
VHAVDD
Sh ort
Error
VGL
Limit
300µA
Neg. CP
Control Logic
Soft-Star t
typ. 1.5ms
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100k
VREF
VCORE
S
N-MOS
Soft-Star t
3ms
OVP
P-MOS
S
INBK1
Sh ort
40%
80%
(50ms)
D
SWI
Soft-Star t 10ms
Error
Buck 1
Control Logic
Power Good
SWBK1
P-MOS
40%
80%
(50ms)
SWBK1
Sh ort
SWO
Logic
N-MOS
Error
Star t
Buck2
200mA
VREF
VREF
VIO
6V
40%
80%
(50ms)
HVS
40%
80%
(50ms)
COMP
Soft-Star t
completed
Power
Good Enable
Star t pos.
Charge Pump
GPM
Soft-Star t
completed
VREF
I2C
Interface
SCL
Star t neg.
Charge Pump
Limit
Star t Buck 3
and ISO SW
A0
Power
Good
OR
40%
80%
(50ms)
AND
Soft-Star t
completed
P-MOS
Star t Timer
2.5ms
EN
Star t
Buck1
21.5V
Thermal
Shutdown
typ. 150ºC
-1V
Regulator
VL = 5V
for logic
VL
DRVN
5mA
INVL
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7.3 Feature Description
7.3.1 Power-Up
When VI rises above the UVLO (undervoltage lockout) the device loads the stored values in the non-volatile
Initial Value register into the volatile DAC register. When all data is written the power-up sequencing starts with
enabling the buck 1 converter (V(IO)), which ramps up its output voltage in 3 ms. When the output is in regulation
the buck 2 converter (V(CORE)) starts and ramps up its output voltage in 3 ms, when its output voltage is in
regulation the negative charge pump controller starts and V(GL) is declining in typ. 1.5 ms until the output voltage
is in regulation. In case V(GL) is driven by the boost switch pin (SW) V(GL) starts declining when the boost starts
switching.
When the enable pin (EN) is pulled “high” the isolation switch closes smoothly so that after typ. 10 ms its output
(V(AVDD)) is at VI level, then the boost converter (V(AVDD)) starts and its output voltage (V(AVDD)) ramps linearly in
10 ms or 20 ms (programmable by I2C) until it is in regulation. Then the positive charge pump controller starts
and V(GH) is rising in typ. 1.5 ms until the output voltage is in regulation. To ensure proper sequencing even if EN
is pulled “high” already at the beginning (e.g. connected to VI) the start of the boost converter V(AVDD) is blocked
until V(GL) is Power Good or 2.5 ms have passed since V(GL) was enabled.
If the EN pin is not connected to VI, the device detects a collapsed V(AVDD) voltage about 40 ms after EN is pulled
low. This function prevents the panel to restart without a proper power supply reset. The device partially shuts
down as described in the Short-Circuit and Overload Protection section. The device is in a latched state and only
a power cycle can restart the V(AVDD), V(HAVDD), V(GH) and V(GL) rail.
When V(GL) is driven by the boost switch pin (SW) the EN-pin should be connected to VI, otherwise V(GL) detects
a short when EN is pulled low as the V(GL) voltage collapses. V(GL) collapses because the supporting switch node
(SW) stops switching and the device partially shuts down as described in the Short-Circuit and Overload
Protection section. The device is in a latched state and only a power cycle can restart the V(AVDD), V(HAVDD), V(GH)
and V(GL) rail.
The buck 2 and buck 3 converter as the negative and positive charge pump controller can be disabled by I2C. If
disabled they are skipped in the sequencing (e.g. disabled buck 2 → buck 1 is in regulation → start neg. CP).
The Gate Pulse Modulation block is disabled when VI is below UVLO or EN is “low” and enabled when V(GH) is in
regulation. When the block is disabled by UVLO the high side switch of the Gate Pulse Modulation is turned on
and the output VGHM is connected to the VGH pin, when the block is disabled by pulling the EN pin “low” the
low side switch is turned on and the output VGHM is connected to the RE pin.
7.3.1.1 TPS65177
If the EN pin is not connected to VI, the device detects a collapsed V(AVDD) voltage about 40 ms after EN is pulled
low. This function prevents the panel to restart without a proper power supply reset. The device partially shuts
down as described in the Short-Circuit and Overload Protection section. The device is in a latched state and only
a power cycle can restart the V(AVDD), V(HAVDD), V(GH) and V(GL) rail.
7.3.1.2 TPS65177A
The device can be restarted without a power cycle, however note that when V(GL) is driven by the boost switch
pin (SW) the EN-pin should be connected to VI. If the EN-pin is not connected to VI the V(GL) protection detects a
short when EN is pulled low as the V(GL) voltage collapses. V(GL) collapses because the supporting switch node
(SW) stops switching and the device partially shuts down as described in the Short-Circuit and Overload
Protection section. The device is in a latched state and only a power cycle can restart the V(AVDD), V(HAVDD), V(GH)
and V(GL) rail.
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Feature Description (continued)
VI
UVLO
UVLO
3ms
V(IO)
3ms
V(CORE)
Using SWBK1 switch node
Using SW switch node
V(GL)
Power-Good
~1.5ms
Timer 2.5ms
EN
V(AVDD)
Enable Signal blocked
until V(GL) Power-Good
or Timer expired
10ms
10ms,
20ms
~1.5ms
V(HAVDD)
V(GH)
CTRL
VGHM
Figure 10. TPS65177 Power-up Sequencing
VI
UVLO
UVLO
3ms
V(IO)
3ms
V(CORE)
Using SWBK1 switch node
Using SW switch node
V(GL)
Power-Good
~1.5ms
Timer 2.5ms
EN
V(AVDD)
Enable Signal blocked
until V(GL) Power-Good
or Timer expired
10ms
10ms
10ms,
20ms
10ms,
20ms
~1.5ms
V(HAVDD)
Using SW switch node
~1.5ms
Using SW switch node
V(GH)
CTRL
Using SW switch node
VGHM
Figure 11. TPS65177A Power-up Sequencing
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Feature Description (continued)
7.3.2 Power-Down
When VI falls below the UVLO threshold all blocks are disabled and the discharge rate is given by the output
load and the output capacitors. The Gate Pulse Modulation output V(GHM) follows V(GH).
7.3.3 Thermal Shutdown
A thermal shutdown is implemented to prevent damage because of excessive heat and power dissipation. Once
a temperature of typically 150 ºC is exceeded the device shuts down and stays off. VI must fall below
Undervoltage lockout threshold (UVLO) to reset the thermal shutdown.
7.3.4 Undervoltage Lockout
To avoid mis-operation of the device at low input voltages an undervoltage lockout is included, which shuts down
the device at voltages lower than typically 8.3 V.
7.3.5 Short-Circuit and Overload Protection
7.3.5.1 Boost Converter (V(AVDD)):
When V(SWO) < 40% of its nominal value
→ Shut down Boost, Isolation Switch, Buck3, neg. and pos.
Charge Pump controller (Buck 1 and Buck 2 keep working)
→ latched condition, only triggering UVLO enables the
device again.
When V(SWO) < 80% of its nominal value for
longer than 50 ms (overload)
→ Shut down Boost, Isolation Switch, Buck3, neg. and pos.
Charge Pump controller (Buck 1 and Buck 2 keep working)
→ latched condition, only triggering UVLO enables the
device again.
7.3.5.2 Buck 1 Converter (V(IO)):
When V(IO) < 40% of its nominal value
→ Shut down the whole device → latched condition, only
triggering UVLO enables the device again.
When V(IO) < 80% of its nominal value for
longer than 50 ms (overload)
→ Shut down the whole device → latched condition, only
triggering UVLO enables the device again.
7.3.5.3 Buck 2 Converter (V(CORE)):
When V(CORE) < 40% of its nominal value
→ Shut down the whole device → latched condition, only
triggering UVLO enables the device again.
When V(CORE) < 80% of its nominal value for
longer than 50 ms (overload)
→ Shut down the whole device → latched condition, only
triggering UVLO enables the device again.
7.3.5.4 Buck 3 Converter (V(HAVDD)):
When V(HAVDD) < 40% of its nominal value
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→ Shut down Buck3, Isolation Switch, Boost, neg. and pos.
Charge Pump controller (Buck 1 and Buck 2 keep working)
→ latched condition, only triggering UVLO enables the
device again.
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Feature Description (continued)
When V(HAVDD) < 80% of its nominal value
for longer than 50 ms (overload)
→ Shut down Buck3, Isolation Switch, Boost, neg. and pos.
Charge Pump controller (Buck 1 and Buck 2 keep working)
→ latched condition, only triggering UVLO enables the
device again.
7.3.5.5 Positive Charge-Pump Controller (V(GH)):
When V(GH) < 40% of its nominal value
→ Shut down pos. Charge Pump, Isolation Switch, Boost,
Buck3, neg. Charge Pump controller (Buck1 and Buck2
keep working) → latched condition, only triggering UVLO
enables the device again.
When V(GH) < 80% of its nominal value for
longer than 50 ms (overload)
→ Shut down pos. Charge Pump, Isolation Switch, Boost,
Buck3, neg. Charge Pump controller (Buck1 and Buck2
keep working) → latched condition, only triggering UVLO
enables the device again.
7.3.5.6 Negative Charge-Pump Controller (V(GL)):
When V(GL) < 40% of its nominal value
→ Shut down neg. Charge Pump, Isolation Switch, Boost,
Buck3, pos. Charge Pump controller (Buck1 and Buck2 keep
working) → latched condition, only triggering UVLO enables
the device again.
When V(GL) < 80% of its nominal value for
longer than 50 ms (overload)
→ Shut down neg. Charge Pump, Isolation Switch, Boost,
Buck3, pos. Charge Pump controller (Buck1 and Buck2 keep
working) → latched condition, only triggering UVLO enables
the device again.
Programmed voltage
80% of Programmed voltage
Overload
detection
40% of Programmed voltage
Short-Circuit
detection
GND
Figure 12. Short-Circuit Levels Overview
7.4 Device Functional Modes
7.4.1 Boost Converter (V(AVDD))
The quasi-synchronous current mode boost converter operates with Pulse Width Modulation (PWM) with a fixed
frequency of 750 kHz. For maximum design flexibility and stability with different external components, the
converter uses external loop compensation by a simple RC circuit. The converter has an input-to-output switch at
the output rail to disconnect its output.
7.4.1.1 Soft-Start
The boost converter is enabled by the EN-pin, the startup is done in two steps:
1. Input-to-output isolation switch soft-start
The isolation switch is turned on slowly in 10 ms
2. Boost converter soft-start
When the isolation switch is fully turned on (after 10 ms) the boost converter starts switching and ramps up
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Device Functional Modes (continued)
its output voltage V(AVDD) from VI to the programmed voltage value in 10 or 20 ms (programmable by I2C).
7.4.1.2 Compensation
The regulator loop can be compensated by adjusting the external RC circuit connected to the COMP pin. The
COMP-pin is the output of the transconductance error amplifier. The compensation capacitor adjusts the low
frequency gain and the resistor the high frequency gain. Lower output voltages require a higher gain and
therefore a smaller compensation capacitor. A good start working for most applications is C(COMP) = 470 pF and
R(COMP) = 75 kΩ. In case of a high noise level an additional 22-pF capacitor can be put between the COMP-pin
and GND to filter the high frequency noise. The cut-off frequency can be calculated as follows:
1
fZ =
2 ´ p ´ R COMP ´ CCOMP
(1)
7.4.1.3 Setting the Output Voltage V(AVDD)
The output voltage is programmable by I2C between 13.5 V and 19.8 V in 100 mV steps.
7.4.1.4 High Voltage Stress Mode (HVS)
By pulling the HVS-pin “high” an I2C programmable offset voltage is added to the set boost and buck 3
converters output voltage V(AVDD) and V(HAVDD). The offset voltages are programmable independently.
7.4.1.5 Programmable Current Limit
The current limit of typ. 5 A can be reduced by I2C programming in 400 mA steps down to 2.2 A to support
smaller inductors with lower saturation current.
7.4.1.6 Design Procedure
The first step in the design procedure is to verify whether the maximum possible output current of the boost
converter supports the specific application requirements.
1. Converter Duty Cycle: D = 1 -
VIN ´ h
VAVDD
VIN ´ D
2. Inductor ripple current: DIL =
fs ´ L
æ
DI
L
ç
3. Maximum output current: IOUT _ m ax = ç ILIM _ m in - 2
è
I
DIL
4. Peak switch current: ISWPEAK = OUT +
1 - D
2
SPACER
ö
÷ ´ (1 - D)
÷
ø
η = Estimated boost converter efficiency (use the number from the efficiency plots or 0.9 as an estimation)
ƒs = Switching frequency (typ. 750 kHz)
L = Selected inductor value (typ. 6.8 µH)
ILIM_min: Minimum current limit
ISWPEAK = Peak switch current for the used output current (must be < ILIM_min = 4.25 A)
ΔIL = Inductor peak-to-peak ripple current
The peak switch current ISWPEAK is the current that the integrated switch, the inductor and the external Schottky
diode have to be able to handle. The calculation must be done for the minimum input voltage where the peak
switch current is the highest.
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Device Functional Modes (continued)
7.4.1.7 Inductor Selection
Inductor value:
4.7 µH ≤ L ≤ 10 µH
The higher the inductor value the lower the inductor current ripple
and the output voltage ripple but the slower the transient
response.
Saturation current:
ISAT ≥ ISWPEAK
or
ISAT ≥ ILIM_max
The inductor saturation current must be higher than the switch
peak current for the max. peak output current or as a more
conservative approach higher than the max. switch current limit.
DC resistance:
The lower the inductors resistance the lower the losses and the higher the efficiency.
(1)
INDUCTANCE
SUPPLIER (1)
COMPONENT CODE
SIZE (L x W x H mm)
DCR Typ. (mΩ)
ISAT (A)
6.8 µH
Sumida
CDRH105R
10.5 x 10.3 x 5.1
14
5.4
6.8 µH
Sumida
CDRH10D43R
10.8 x 10.5 x 4.5
20
7
10 µH
Sumida
CDRH10D43R
10.8 x 10.5 x 4.5
26
5.2
6.8 µH
Chilisin
SCDS105R
10.5 x 10.3 x 5.1
14
5.4
6.8 µH
Chilisin
SCDS104R
10.5 x 10.3 x 4
21
5
10 µH
Chilisin
SCDS105R
10.5 x 10.3 x 5.1
22
4.45
See Third-Party Products disclaimer
7.4.1.8 Rectifier Diode Selection
7.4.1.8.1 Diode Type
Schottky or Super Barrier Rectifier (SBR) for better efficiency
7.4.1.8.2 Forward Voltage
The lower the forward voltage VF the higher the efficiency and the lower the diode temperature.
7.4.1.8.3 Reverse Voltage
VR must be higher than the output voltage and should be higher than the OVP voltage 22.5 V
7.4.1.8.4 Thermal Characteristics
The diode must be able to handle the dissipated power of:
PD = VF x IOUT
(2)
Table 1. Diodes
(1)
VR / IAVG
VF Typ. at 25°C
30 V / 3 A
0.39 V at 3 A
30 V / 3 A
0.39 V at 3 A
40 V / 3 A
0.38 V at 3 A
40 V / 2 A
0.5 V at 2 A
COMPONENT CODE
SUPPLIER (1)
RθJL
SIZE
SBR3U30P1
5 °C/W
PowerDI® 123
Diodes
SSM33LSPT
18 °C/W
SMA-S
Chenmko
SSM34LAS
18 °C/W
SMA-S
Chenmko
SSM24APT
20 °C/W
SMA-S
Chenmko
See Third-Party Products disclaimer
7.4.1.9 Output Capacitor Selection
For best output voltage filtering, low ESR ceramic capacitors are recommended. Four 10 µF (or two 22 µF)
ceramic capacitors work for most applications. To improve the load transient response more capacitance can be
added. Between the rectifier diode and the SWI-pin one 10 µF capacitor is required.
To calculate the output voltage ripple the following equations can be used:
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I
V
V
DVC_ RIPPLE = AVDD - IN ´ OUT + D VC _ ESR
VAVDD ´ fS
C OUT
(1)
DVC _ESR = ISWPEAK ´ R C_ ESR
(3)
CAPACITOR
VOLTAGE RATING
TEMPERATURE CHARACTERISTICS
SUPPLIER (1)
COMPONENT CODE
10 µF / 1206
25 V
X5R
Murata
GRM31CR61E106KA12
10 µF / 1206
25 V
X7R
Taiyo Yuden
TMK316AB7106KL
See Third-Party Products disclaimer.
7.4.2 Buck 1 Converter (V(IO))
The non-synchronous current mode buck 1 converter operates with Pulse Width Modulation (PWM) with a fixed
frequency of 750 kHz. The converter features integrated soft-start, bootstrap and compensation to minimize
external component and pin count.
The buck 1 converter operates in Discontinuous Conduction Mode (DCM) or Continuous Conduction Mode
(CCM) depending on the load current. For low load currents the converter operates in DCM. In this mode the
inductor current reaches 0 A when the switch is turned off. With increasing load current the inductor current
finally does not reach 0 A anymore but is always positive and then the converter operates in CCM. The switch
node waveforms for DCM and CCM operation are shown in Figure 23 and Figure 24. The ringing during DCM (at
light load) is normal for this operating mode, it occurs because of parasitic capacitance in the PCB layout.
Because there is very little energy contained in the ringing waveform it does not significantly affect EMI
performance.
Minimum output current for DCM: MIDCM =
VI N - VI O
V
´ IO
2 ´ L ´ fS
VIN
For low load currents when the minimum on time is not sufficient, the buck 1 converter uses a skip mode to be
able to regulate its output voltage V(IO). During the skip mode the converter switches for a few cycles to raise the
output voltage then it stops switching until the output voltage falls below a given threshold and the converter
starts switching again. Due to this behavior the output voltage ripple can be slightly higher during skip mode.
7.4.2.1 Soft-Start
The buck 1 converter is enabled with the undervoltage lockout (UVLO). It starts switching and ramps up its
output voltage V(IO) linearly in 3 ms to the programmed voltage value.
7.4.2.2 Setting the Output Voltage V(IO)
The output voltage is programmable by I2C between 2.2 V and 3.7 V in 100 mV steps.
7.4.2.3 Design Procedure
The first step in the design procedure is to verify whether the maximum possible output current of the buck 1
converter supports the specific application requirements. Because the buck 2 converter is supplied by the buck 1
converter and the negative charge pump is driven from the buck 1 converter’s switch node the effective output
current I(IO) is higher than the buck 1 output current alone.
1. Converter Duty Cycle: D =
VIO
VIN ´ η
2. Inductor ripple current: DIL =
(VIN - VIO )´ D
fS ´ L
3. Maximum output current: IOUT_max = ILIM_min -
DIL
2
ΔIL
4. Peak switch current: I
SWPEAK = IOUT + 2
5. Effective output current:
IBUCK1_EFFECTIVE = IOUT_BUCK1 + IIN_BUCK2 +
VIN ´ IGL
VIO
spacer
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η = Estimated boost converter efficiency (use the number from the efficiency plots or 0.8 as an estimation)
ƒs = Switching frequency (typ. 750 kHz)
L = Selected inductor value (typ. 6.8 µH)
ILIM_min: Minimum current limit (3 A)
ISWPEAK = Peak switch current for the used output current (must be < ILIM_min = 3 A)
ΔIL = Inductor peak-to-peak ripple current
The peak switch current ISWPEAK is the current that the integrated switch, the inductor and the external Schottky
diode have to be able to handle. The calculation must be done for the maximum input voltage where the peak
switch current is the highest.
7.4.2.4 Inductor Selection
Inductor value:
4.7 µH ≤ L ≤ 10 µH
The higher the inductor value the lower the inductor current ripple
and the output voltage ripple but the slower the transient response.
Saturation
current:
ISAT ≥ ISWPEAK
or
ISAT ≥ ILIM_max
The inductor saturation current must be higher than the switch peak
current for the max. peak output current or as a more conservative
approach higher than the max. switch current limit.
DC resistance:
The lower the inductors resistance the lower the losses and the higher the efficiency.
(1)
INDUCTANCE
SUPPLIER (1)
COMPONENT CODE
SIZE (L x W x H mm)
DCR Typ. (mΩ)
ISAT (A)
6.8 µH
Sumida
CDRH8D43
8.3 x 8.3 x 4.5
20
4.4
10 µH
Sumida
CDRH8D43
8.3 x 8.3 x 4.5
29
4
6.8 µH
Chilisin
SCPS0740T
7.5 x 7.8 x 4
28
3.9
See Third-Party Products disclaimer
7.4.2.5 Rectifier Diode Selection
7.4.2.5.1 Diode Type
Schottky or Super Barrier Rectifier (SBR) for better efficiency
7.4.2.5.2 Forward Voltage
The lower the forward voltage VF the higher the efficiency and the lower the diode temperature.
7.4.2.5.3 Reverse Voltage
VR must be higher than the output voltage
7.4.2.5.4 Forward Current
The average rectified forward current IAVG must be higher than IOUT × (1 – D)
7.4.2.5.5 Thermal Characteristics
The diode must be able to handle the dissipated power of:
PD = VF x IOUT × (1 – D)
(4)
Table 2. Diodes
(1)
VR / IAVG
VF typ. at 25°C
COMPONENT CODE
RθJL
SIZE
SUPPLIER (1)
30 V / 3 A
0.39 V at 3 A
SBR3U30P1
5 °C/W
PowerDI® 123
Diodes
30 V / 3 A
0.39 V at 3 A
SSM33LSPT
18 °C/W
SMA-S
Chenmko
40 V / 3 A
0.38 V at 3 A
SSM34LAS
18 °C/W
SMA-S
Chenmko
40 V / 2 A
0.5 V at 2 A
SSM24APT
20 °C/W
SMA-S
Chenmko
See Third-Party Products disclaimer
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7.4.2.6 Output Capacitor Selection
For best output voltage filtering low ESR ceramic capacitors are recommended. Three 10 µF (or two 22 µF)
ceramic capacitors work for most applications. To improve the load transient response more capacitance can be
added.
To calculate the output voltage ripple the following equations can be used:
ΔVC_RIPPLE =
(1)
VIO
I
´ OUT + Δ VC_ESR
VIN ´ fS
COUT
Δ VC_ESR = ISW PEAK ´ RC_ESR
(5)
CAPACITOR
VOLTAGE RATING
TEMPERATURE CHARACTERISTICS
SUPPLIER (1)
COMPONENT CODE
10 µF / 1206
6.3 V
X5R
Murata
GRM219R60J106KE19
10 µF / 1206
6.3 V
X7R
Taiyo Yuden
JMK212AB7106KG
See Third-Party Products disclaimer
7.4.3 BUCK 2 CONVERTER (V(CORE))
The synchronous current mode buck 2 converter operates with Pulse Frequency Modulation (PFM) with a fixed
off-time and a typ. frequency of 1 MHz. The converter features integrated soft-start, bootstrap and compensation
to minimize external component and pin count. It is supplied by the buck 1 converter’s output.
If not needed the buck 2 converter can be disabled by I2C.
7.4.3.1 Soft-Start
The buck 2 converter is enabled when the buck 1 converter is in regulation. It starts switching and ramps up its
output voltage V(CORE) linearly in 3ms to the programmed voltage value.
7.4.3.2 Setting the Output Voltage V(CORE)
The output voltage is programmable by I2C between 0.8 V and 3.3 V in 100 mV steps.
7.4.3.3 Design Procedure
The first step in the design procedure is to verify whether the maximum possible output current of the buck 2
converter supports the specific application requirements.
1. Switching frequency: MfS =
2. Converter Duty Cycle: MD =
3. Inductor ripple current: MΔIL =
( VIO - VCORE ) ´ (1.17VCORE + 0.22 )
VIO
MHz
VCORE
VIO ´ η
(VIO - VCOR E ) ´ D
fS ´ L
4. Maximum output current: MIOUT_ m ax = IL IM _m in - ΔIL
2
ΔIL
5. Peak switch current: MI
SWPEAK = IOUT + 2
spacer
η = Estimated boost converter efficiency (use the number from the efficiency plots or 0.8 as an estimation)
L = Selected inductor value (typ. 6.8 µH)
ILIM_min: Minimum current limit (2.5A)
ISWPEAK = Peak switch current for the used output current (must be < ILIM_min = 2.5 A)
ΔIL = Inductor peak-to-peak ripple current
The peak switch current ISWPEAK is the current that the switch and the inductor have to be able to handle.
22
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SLVSBC9C – MARCH 2012 – REVISED FEBRUARY 2016
7.4.3.4 Inductor Selection
Inductor value:
4.7µH ≤ L ≤ 10µH
The higher the inductor value the lower the inductor current ripple and
the output voltage ripple but the slower the transient response.
Saturation
current:
ISAT ≥ ISWPEAK
or
ISAT ≥ ILIM_max
The inductor saturation current must be higher than the switch peak
current for the max. peak output current or as a more conservative
approach higher than the max. switch current limit.
DC resistance:
The lower the inductors resistance the lower the losses and the higher the efficiency.
(1)
INDUCTANCE
SUPPLIER (1)
COMPONENT CODE
SIZE (L x W x H mm)
DCR typ. (mΩ)
ISAT (A)
4.7 µH
Sumida
CDRH5D28R/HP
6.2 x 6.2 x 3
35
3.7
6.8 µH
Sumida
CDRH5D28R/HP
6.2 x 6.2 x 3
49
3.1
4.7 µH
Chilisin
SCPS0725T
7.8 x 7.7 x 2.5
40
4
6.8 µH
Chilisin
SCPS0725T
7.8 x 7.7 x 2.5
66
3.5
4.7 µH
Chilisin
LVS606028
6.2 x 6.2 x 2.2
38
3.7
6.8 µH
Chilisin
LVS606028
6.2 x 6.2 x 2.2
50
3.1
4.7 µH
Mag Layers
MSCDRI-7025AL
8 x 8 x 2.5
45
3.5
6.8 µH
Mag Layers
MSCDRI-7025AL
8 x 8 x 2.5
63
3.1
See Third-Party Products disclaimer
7.4.3.5 Output Capacitor Selection
For best output voltage filtering low ESR ceramic capacitors are recommended. Three 10 µF (or one 22 µF)
ceramic capacitors work for most applications. To improve the load transient response more capacitance can be
added.
To calculate the output voltage ripple the following equations can be used:
ΔVC_RIPPLE =
(1)
VC ORE
I
´ OUT + ΔVC_ESR
VIO ´ fS
C OU T
ΔVC_ESR = ISWPEAK ´ R C_ESR
(6)
SUPPLIER (1)
COMPONENT CODE
X5R
Murata
GRM219R60J106KE19
X7R
Taiyo Yuden
JMK212AB7106KG
CAPACITOR
VOLTAGE RATING
TEMPERATURE CHARACTERISTICS
10 µF / 1206
6.3 V
10 µF / 1206
6.3 V
See Third-Party Products disclaimer
7.4.4 Buck 3 Converter (V(HAVDD))
The synchronous current mode buck 3 converter operates with Pulse Frequency Modulation (PFM) with a fixed
off-time and a typ. frequency of 1 MHz. The converter features integrated soft-start, bootstrap and compensation
to minimize external component and pin count.
If not needed the buck 3 converter can be disabled by I2C.
7.4.4.1 Soft-Start
The buck 3 converter is enabled together with the boost converter. It starts switching and ramps up its output
voltage V(HAVDD) to the programmed voltage value tracking the boost converters output voltage V(AVDD).
7.4.4.2 Setting the Output Voltage V(HAVDD)
The output voltage is programmable by I2C between 4.8 V and 11.1 V in 100 mV steps.
7.4.4.3 High Voltage Stress Mode (HVS)
By pulling the HVS-pin “high” an I2C programmable offset voltage is added to the set boost and buck 3
converters output voltage V(AVDD) and V(HAVDD). The offset voltages are programmable independently.
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7.4.4.4 Design Procedure
The first step in the design procedure is to verify whether the maximum possible output current of the buck 3
converter supports the specific application requirements.
1. Switching frequency: MfS =
0.76 ´ VHAVDD ´ VIN - VHAVDD
2. Converter Duty Cycle: M D =
MHz
VIN
VHAVDD
VIN ´ η
3. Inductor ripple current: M ΔIL =
( VIN - VHAVDD) ´ D
fS ´ L
4. Maximum output current: MIOUT_max = ILIM_min -
ΔIL
2
DI
5. Peak switch current: M ISWPEAK = IOUT + L
2
spacer
η = Estimated boost converter efficiency (use the number from the efficiency plots or 0.8 as an estimation)
fS: Switching frequency (typ. 1 MHz)
L = Selected inductor value (typ. 6.8 µH)
ILIM_min: Minimum current limit (1.7 A)
ISWPEAK = Peak switch current for the used output current (must be < ILIM_min = 1.7 A)
ΔIL = Inductor peak-to-peak ripple current
The peak switch current ISWPEAK is the current that the switch and the inductor have to be able to handle.
7.4.4.5 Inductor Selection
Inductor value:
4.7 µH ≤ L ≤ 10 µH
The higher the inductor value the lower the inductor current ripple
and the output voltage ripple but the slower the transient response.
Saturation
current:
ISAT ≥ ISWPEAK
or
ISAT ≥ ILIM_max
The inductor saturation current must be higher than the switch peak
current for the max. peak output current or as a more conservative
approach higher than the max. switch current limit.
DC resistance:
The lower the inductors resistance the lower the losses and the higher the efficiency.
(1)
INDUCTANCE
SUPPLIER (1)
COMPONENT CODE
SIZE (L x W x H mm)
DCR typ. (mΩ)
ISAT (A)
4.7 µH
Chilisin
SCDS6D28T
7x7x3
25
2.5
6.8 µH
Chilisin
SCDS6D28T
7x7x3
40
2.1
4.7 µH
Chilisin
SCPS0725T
7.8 x 7.7 x 2.5
40
4
6.8 µH
Chilisin
SCPS0725T
7.8 x 7.7 x 2.5
66
3.5
4.7 µH
Chilisin
LVS404018
4.2 x 4.2 x 2
90
2
6.8 µH
Chilisin
LVS404018
4.2 x 4.2 x 2
110
1.6
4.7 µH
Mag Layers
MSCDRI-7025AL
8 x 8 x 2.5
45
3.5
6.8 µH
Mag Layers
MSCDRI-7025AL
8 x 8 x 2.5
63
3.1
See Third-Party Products disclaimer
7.4.4.6 Output Capacitor Selection
For best output voltage filtering low ESR ceramic capacitors are recommended. One 10 µF ceramic capacitor
works for most applications. To improve the load transient response more capacitance can be added.
To calculate the output voltage ripple the following equations can be used:
24
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ΔVC_RIPPLE =
(1)
SLVSBC9C – MARCH 2012 – REVISED FEBRUARY 2016
VHAVDD
I
´ OUT + Δ VC_ESR
VIN ´ fS
COUT
Δ VC_ESR = ISW PEAK ´ RC_ESR
(7)
CAPACITOR
VOLTAGE RATING
TEMPERATURE CHARACTERISTICS
SUPPLIER (1)
COMPONENT CODE
10 µF / 1206
16 V
X5R
Murata
GRM31CR61C106KA88
10 µF / 1206
16 V
X7R
Taiyo Yuden
EMK316AB7106KL
See Third-Party Products disclaimer
7.4.5 Positive Charge Pump Controller (V(GH)) with Temperature Compensation
The positive charge pump is driven from the boost converter’s switch node and regulated by controlling the
current through an external PNP transistor. The controller is optimized for transistors with a DC gain (hFE)
between 100 and 300, a base drive current up to 5 mA is supported. A temperature compensation for its output
voltage V(GH) is implemented and the levels of the output voltages are programmed by I2C.
The positive charge pump and the temperature compensation function can be disabled by I2C separately.
7.4.5.1 Soft-Start
The positive charge pump controller is enabled when the boost converter is in regulation. The output voltage
V(GH) ramps up to the programmed voltage in typ. 1.5 ms.
7.4.5.2 Setting the Output Voltage V(GH)
The low voltage V(GH_LOW) at high temperature is programmed directly by I2C from 20 V to 35 V in 1 V steps, the
high voltage V(GH_HIGH) at low temperature is programmed with a positive offset voltage of 1 V steps relative to
V(GH_LOW). An external NTC thermistor with a resistor network (RP and RL) sets the temperatures when V(GH_LOW)
(VNTC ≤ 1 V, hot) and V(GH_HIGH) (VNTC ≥ 2 V, cold) are reached. To achieve a linear curve between V(GH_LOW) and
V(GH_HIGH) a suitable linearalization resistor parallel to the NTC must be used.
NTC
VL
RL
RP
NTC
RT0 is the resistance at an absolute temperature T0 in
Kelvin (normally 25°C)
T is the temperature in Kelvin (°C + 273.15 K/°C)
B is a material constant provided by the NTC supplier
VL: Internal supply voltage VL = 5 V
RNTC(T) = RT ´ e
1
1ö
- ÷÷
T
Tø
è 0
0
RP =
VL ´ RNTC (THOT ) ´ RNTC(TCOLD )
VL ´ R NTC(TCOLD ) - 2VL ´ R NTC(THOT ) + 2RNTC(THOT ) - 2RNTC(TCOLD)
RL =
RP ´ RNTC (THOT ) ´ (VL - 1V)
RP + RNTC (THOT )
RNTC(THOT): NTC resistance hot
RNTC(TCOLD): NTC resistance cold
æ
-B ´çç
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NTC
VL
121kW
402 kW
NTC 10 kW
NCP18XH103F03RB
NTC
VL
35.7 kW
80.6kW
NTC 10 kW
NCP18XH103F03RB
NTC
VL
14 kW
137kW
NTC 10 kW
NCP18XH103F03RB
7.4.5.3 Design Procedure
1. Supported max. output voltage
The maximum possible output voltage is calculated as follows:
IGH
1 ö
æ1
Doubler Mode: VGH _ max = VINPU T + VAVDD – 2VF - VQ - R ´ IGH ´ ç +
÷ - C´f
D
1
D
è
ø
S
1 ö 2IGH
æ1
Tripler Mode: VGH _ max = VIN PUT + 2VAVDD – 4VF - VQ - 2R ´ IGH ´ ç +
÷è D 1 - D ø C ´ fS
26
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SLVSBC9C – MARCH 2012 – REVISED FEBRUARY 2016
VF: Diode forward voltage
R: Switch node resistor
VINPUT: Transistor emitter voltage
D: Boost duty cycle
C: Flying capacitor value
fS: Boost switching frequency (750kHz)
VQ: Collector-emitter saturation voltage
2. Diode selection
Diode type: No specific type required
Forward voltage: The lower the forward voltage VF the higher the maximum output voltage
Reverse voltage: VR must be higher than the switching voltage applied at the flying capacitor
Forward current: The average forward current IAVG must be higher than the output current IOUT
Thermal characteristics: The diode must be able to handle the dissipated power of PD = VF × IOUT
Peak currents of up to some amps through the diodes can occur during start-up for a few cycles. This
condition lasts for