TS3DDR3812
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SCDS314B – FEBRUARY 2011 – REVISED MAY 2013
12-Channel, 1:2 MUX/DEMUX Switch for DDR3 Applications
Check for Samples: TS3DDR3812
FEATURES
APPLICATIONS
•
•
•
•
•
•
•
•
•
•
B0
C1
B1
41
40
39
38
B2
A0
2
37
C2
A1
3
36
B3
A2
4
35
C3
A3
5
34
B4
A4
6
33
C4
A5
7
32
B5
31
C5
30
VCC
EN
8
SEL1
9
SEL2
10
29
B6
A6
11
28
C6
A7
12
27
B7
A8
13
26
C7
A9
14
25
B8
A10
15
24
C8
A11
16
23
B9
VCC
17
22
C9
GND
18
19
20
21
B10
•
•
42
1
VCC
C10
•
Figure 1. RUA PACKAGE
(TOP VIEW)
B11
•
DDR3 Signal Switching
DIMM Modules
Notebook/Desktop PCs
Servers
C0
•
•
•
•
Compatible with DDR3 SDRAM Standard
(JESD79-3D)
Wide Bandwidth of 1.675 GHz
Low Propagation Delay (tpd = 40 ps Typ)
Low Bit-to-Bit Skew (tsk(o) = 6 ps Typ)
Low and Flat ON-State Resistance
(rON = 8 Ω Typ)
Low Input/Output Capacitance
(CON = 5.6 pF Typ)
Low Crosstalk (XTALK = –43 dB,
Typ at 250 MHz)
VCC Operating Range from 3 V to 3.6 V
Rail-to-Rail Switching on Data I/O Ports
(0 to VCC)
Separate Switch Control Logic for Upper and
Lower 6-Channels
Dedicated Enable Logic Supports Hi-Z Mode
IOFF Protection Prevents Current Leakage in
Powered Down State (VCC = 0 V)
ESD Performance Tested Per JESD22
– 2000 V Human Body Model
(A114B, Class II)
– 1000 V Charged Device Model (C101)
42-pin RUA Package (9 × 3.5 mm, 0.5 mm
Pitch)
C11
1
DESCRIPTION
The TS3DDR3812 is a 12-channel, 1:2 multiplexer/demultiplexer switch designed for DDR3 applications. It
operates from a 3 to 3.6 V supply and offers low and flat ON-state resistance as well as low I/O capacitance
which allow it to achieve a typical bandwidth of 1.675 GHz.
Channels A0 through A11 are divided into two banks of six bits and are independently controlled via two digital
inputs called SEL1 and SEL2. These select inputs control the switch position of each 6-bit DDR3 source and
allow them to be routed to one of two end-points. Alternatively, the switch can be used to connect a single
endpoint to one of two 6-bit DDR3 sources. For switching 12-bit DDR3 sources, simply connect SEL1 and SEL2
together externally and control all 12 channels with a single GPIO input. An EN input allows the entire chip to be
placed into a high-impedance (Hi-Z) state while not in use.
These characteristics make the TS3DDR3812 an excellent choice for use in memory, analog/digital video, LAN,
and other high-speed signal switching applications.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2011–2013, Texas Instruments Incorporated
TS3DDR3812
SCDS314B – FEBRUARY 2011 – REVISED MAY 2013
www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
ORDERING INFORMATION
For package and ordering information, see the Package Option Addendum at the end of this document.
Figure 2. LOGIC DIAGRAM
A0
B0
A1
B1
A2
B2
A3
A4
B3
B4
A5
B5
C0
C1
C2
C3
C4
C5
A6
A7
B6
B7
A8
B8
A9
A 10
B9
B10
A 11
B11
C6
C7
C8
C9
C10
C11
EN
SEL1
SEL2
Control Logic
FUNCTION TABLE
EN
SEL1
SEL2
FUNCTION
L
X
X
A0 to A11, B0 to B11, and C0 to C11 are Hi-Z
H
L
L
A0 to A5 = B0 to B5 and A6 to A11 = B6 to B11
H
L
H
A0 to A5 = B0 to B5 and A6 to A11 = C6 to C11
H
H
L
A0 to A5 = C0 to C5 and A6 to A11 = B6 to B11
H
H
H
A0 to A5 = C0 to C5 and A6 to A11 = C6 to C11
TERMINAL FUNCTIONS
PIN
NAME
2
NUMBER
DESCRIPTION
VCC
1,17, 30
Supply Voltage
GND
ThermalPad
Ground
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TERMINAL FUNCTIONS (continued)
PIN
NAME
NUMBER
DESCRIPTION
EN
8
Enable Input
SEL1
9
Select Input
SEL2
10
Select Input
A0, A1, A2, A3, A4, A5, A6, A7, A8, A9, A10, A11
2, 3, 4, 5, 6, 7, 11, 12, 13, 14, 15, 16
Data I/Os
B0, B1, B2, B3, B4, B5, B6, B7, B8, B9, B10, B11
41, 39, 38, 36, 34, 32, 29, 27, 25, 23, 21, 19
Data I/Os
C0, C1, C2, C3, C4, C5, C6, C7, C8, C9, C10, C11
42, 40, 37, 35, 33, 31, 28, 26, 24, 22, 20, 18
Data I/Os
ABSOLUTE MAXIMUM RATINGS (1)
over operating free-air temperature range (unless otherwise noted)
VCC
Supply voltage range
VI/O
Analog voltage range (2) (3) (4)
(2) (3)
MIN
MAX
–0.5
4.6
V
A, B, C
–0.5
7
V
SEL1, SEL2
–0.5
VIN
Digital input voltage range
II/OK
Analog port diode current
VI/O < 0
–50
mA
IIK
Digital input clamp current
VIN < 0
–50
mA
–128
128
mA
–100
100
mA
31.8
°C/W
150
°C
(5)
II/O
On-state switch current
IDD, IGND
Continuous current through VDD or GND
θJA
Package thermal impedance (6)
Tstg
Storage temperature range
(1)
(2)
(3)
(4)
(5)
(6)
A, B, C
RUA package
–65
7
UNIT
V
Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltages are with respect to ground, unless otherwise specified.
The input and output voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
VI and VO are used to denote specific conditions for VI/O.
II and IO are used to denote specific conditions for II/O
The package thermal impedance is calculated in accordance with JESD 51-7.
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RECOMMENDED OPERATING CONDITIONS (1)
MIN
MAX
VCC
Supply voltage
3
3.6
V
VIH
High-level control input voltage SEL1, SEL2
2
5.5
V
VIL
Low-level control input voltage SEL1, SEL2
0
0.8
V
VIN
Input voltage
0
5.5
V
VI/O
Input/Output voltage
0
VCC
V
TA
Operating free-air temperature
–40
85
°C
(1)
SEL1, SEL2
UNIT
All unused control inputs of the device must be held at VDD or GND to ensure proper device operation. Refer to the TI application report,
Implications of Slow or Floating CMOS Inputs, literature number SCBA004
ELECTRICAL CHARACTERISTICS
over recommended operating free-air temperature range, VCC = 3.3 V ± 0.3 V (unless otherwise noted)
TEST CONDITIONS (1)
PARAMETER
MIN TYP (2) MAX
VIK
Digital input clamp voltage
SEL1, SEL2 VCC = 3.6 V, IIN = –18 mA
RON
ON-state resistance
A, B, C
VCC = 3 V, 1.5 V ≤ VI/O ≤ VCC,
II/O = -40 mA
–1.2
–0.8
RON(flat) (3)
ON-state resistance flatness
A, B, C
VCC = 3 V, VI/O = 1.5 V and VCC,
II/O = –40 mA
1.5
ΔRON (4)
On-state resistance match
between channels
A, B, C
VCC = 3 V, 1.5 V ≤ VI/O ≤ VCC,
II/O = –40 mA
0.4
IIH
Digital input high leakage
current
IIL
8
UNIT
V
12
Ω
Ω
1
Ω
SEL1, SEL2 VCC = 3.6 V , VIN = VDD
±1
µA
Digital input low leakage
current
SEL1, SEL2 VCC = 3.6 V, VIN = GND
±1
µA
IOFF
Leakage under power off
conditions
All outputs
±1
µA
CIN
Digital input capacitance
SEL1, SEL2 f = 1 MHz, VIN = 0 V
3.2
pF
COFF
Switch OFF capacitance
A, B, C
f = 1 MHz, VI/O = 0 V, Output is open,
Switch is OFF
2
pF
CON
Switch ON capacitance
A, B, C
f = 1 MHz, VI/O = 0 V, Output is open,
Switch is ON
5.6
pF
ICC
VCC supply current
VCC = 3.6 V, II/O = 0, VIN = VDD or GND
300
(1)
(2)
(3)
(4)
4
VCC = 0 V, VI/O = 0 to 3.6 V, VIN = 0 to 5.5 V
2.6
400
µA
VI, VO, II, and IO refer to I/O pins, VIN refers to the control inputs
All typical values are at VCC = 3.3V (unless otherwise noted), TA = 25°C
RON(FLAT) is the difference of RON in a given channel at specified voltages.
ΔRON is the difference of RON from center port (A5, A6) to any other ports.
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SWITCHING CHARACTERISTICS
Over recommended operation free-air temperature range, VCC = 3.3 V ± 0.3 V, RL = 200 Ω, CL = 4 pF (unless otherwise
noted) (see Figure 7 and Figure 9)
PARAMETER
tpd (2)
FROM
(INPUT)
TO
(OUTPUT)
MIN TYP (1)
MAX
A or B,C
B,C or A
SEL1
A0-5 or B0-5, C0-5
2
7
ns
SEL2
A6-11 or B6-11, C6-11
2
7
ns
SEL1
A0-5 or B0-5, C0-5
2
5
ns
SEL2
A6-11 or B6-11, C6-11
2
5
ns
tsk(o) (3)
A or B,C
B, C or A
6
30
ps
(4)
A or B, C
B, C or A
6
30
ps
tPZH, tPZL
tPHZ, tPLZ
tsk(p)
(1)
(2)
(3)
(4)
40
UNIT
ps
All typical values are at VCC = 3.3V (unless otherwise noted), TA = 25°C.
The propagation delay is the calculated RC time constant of the typical ON-State resistance of the switch and the specified load
capacitance when driven by an ideal voltage source (zero output impedance).
Output skew between center port (A5, A6) and any other channel.
Skew between opposite transitions of the same output |tPHL – tPLH|
DYNAMIC CHARACTERISTICS
over recommended operating free-air temperature range, VCC = 3.3 V ± 0.3 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
XTALK
RL = 50 Ω, f = 250 MHz (see Figure 11)
OIRR
RL = 50 Ω, f = 250 MHz (see Figure 12)
BW
RL = 50 Ω, Switch ON (see Figure 10)
(1)
TYP (1)
UNIT
–43
dB
–42
dB
1.675
GHz
All Typical Values are at VCC = 3.3 V (unless otherwise noted), TA = 25°C.
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OPERATING CHARACTERISTICS
0
0
-20
-2
Attenuation - dB
Attenuation - dB
-40
-4
-6
-60
-80
-8
-100
-10
-120
-12
1.00E+05 1.00E+06 1.00E+07 1.00E+08 1.00E+09 1.00E+10
f - Frequency - Hz
-140
1.00E+05 1.00E+06 1.00E+07 1.00E+08 1.00E+09 1.00E+10
f - Frequency - Hz
Figure 3. Gain vs Frequency
Figure 4. Off Isolation vs Frequency
9.0
0
8.8
-20
8.6
8.4
RON - W
Attenuation - dB
-40
-60
8.2
-80
8.0
-100
7.8
-120
7.6
-140
1.00E+05 1.00E+06 1.00E+07 1.00E+08 1.00E+09 1.00E+10
f - Frequency - Hz
7.4
1.4
Figure 5. Crosstalk vs Frequency
6
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1.9
2.9
2.4
VI - Input Voltage - V
3.4
Figure 6. RON vs VIN
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SCDS314B – FEBRUARY 2011 – REVISED MAY 2013
PARAMETER MEASUREMENT INFORMATION
Enable and Disable Times
VDD
Input Generator
VIN
50 Ω
50 Ω
VG1
TEST CIRCUIT
DUT
2 × VDD
Input Generator
S1
RL
VO
VI
GND
50 Ω
CL
(see Note A)
50 Ω
VG2
RL
TEST
VDD
S1
RL
Vin
CL
V∆
t PLZ/t PZL
3.3 V ± 0.3 V
2 × VDD
200 Ω
GND
4 pF
0.3 V
t PHZ/t PZH
3.3 V ± 0.3 V
GND
200 Ω
VDD
4 pF
0.3 V
VSEL
VO
3.33 V
Output Control
(VIN)
1.65 V
1.65 V
0V
Output
Waveform 1
S1 at 2 x VCC
(see Note B)
t PZL
t PLZ
VOH
VDC/2
t PZH
VO
Open
Output
Waveform 2
S1 at GND
(see Note B)
VOL + 0.3 V
VOL
t PHZ
VCC/2
VOH - 0.3 V
VOH
VOL
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low, except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high, except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics:PRR ≤10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf ≤ 2.5 ns.
D. The outputs are measured one at a time, with one transition per measurement.
E. tPLZ and tPHZ are the same as tdis.
F. tPZL and tPZH are the same as ten.
Figure 7. Test Circuit and Voltage Waveforms
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PARAMETER MEASUREMENT INFORMATION (continued)
Figure 8. Skew
VDD
Input Generator
VSEL
50 Ω
50 Ω
VG1
TEST CIRCUIT
DUT
2 × VDD
Input Generator
50 Ω
t sk(o)
t sk(p)
RL
S1
RL
Vin
CL
3.3 V ± 0.3 V
Open
200 Ω
VCC or GND
4 pF
3.3 V ± 0.3V
Open
200 Ω
VCC or GND
4 pF
VCC
3.5 V
2.5 V
1.5 V
Data In at
Ax or Ay
t PLHx
t PHLx
VOH
(VOH + VOL)/2
VOL
Data Out at
XB 1 or XB 2
t sk(o)
VO
CL
(see Note A)
50 Ω
TEST
VO
Open
GND
VG2
VI
S1
RL
VO
VI
Input
t sk(o)
VOH
(VOH + VOL)/2
VOL
Data Out at
YB 1 or YB 2
t PLHy
3.5 V
2.5 V
1.5 V
t PHLy
t PLH
VOH
(VOH + VOL)/2
VOL
Output
t sk(o) = t PLHy − tPLHx or t PHLy − tPHLx
VOLTAGE WAVEFORMS
OUTPUT SKEW (t sk(o))
t PHL
t sk(p) = t PHL − tPLH
VOLTAGE WAVEFORMS
PULSE SKEW [t sk(p)]
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low, except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high, except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf ≤ 2.5 ns.
D. The outputs are measured one at a time, with one transition per measurement.
Figure 9. Test Circuit andf Voltage Waveforms
8
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PARAMETER MEASUREMENT INFORMATION (continued)
EXT TRIGGER
BIAS
VBIAS
Network Analyzer
(HP8753ES)
P1
P2
VCC
AX
BX
DUT
SEL
VSEL
Figure 10. Test Circuit for Frequency Response (BW)
Frequency response is measured at the output of the ON channel. For example, when VSEL = 0 and A0 is the
input, the output is measured at B0. All unused analog I/O ports are left open.
HP8753ES Setup
Average = 4
RBW = 3 kHz
VBIAS = 0.35 V
ST = 2 s
P1 = 0 dBM
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PARAMETER MEASUREMENT INFORMATION (continued)
EXT TRIGGER
BIAS
VBIAS
Network Analyzer
(HP8753ES)
P1
P2
VCC
A0
BX
RL = 50 W
A1
BX
BX
BX
A2
BX
RL = 50 W
A3
BX
BX
SEL
BX
VSEL
A. CL includes probe and jig capacitance.
B. A 50 W termination resistor is needed to match the loading of the network analyzer.
Figure 11. Test Circuit for Crosstalk (XTALK)
Crosstalk is measured at the output of the nonadjacent ON channel. For example, when VSEL = 0 and A1 is the
input, the output is measured at A3. All unused analog input (A) ports are connected to GND, and output (B)
ports are left open.
HP8753ES Setup
Average = 4
RBW = 3 kHz
VBIAS = 0.35 V
ST = 2 s
P1 = 0 dBM
10
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SCDS314B – FEBRUARY 2011 – REVISED MAY 2013
PARAMETER MEASUREMENT INFORMATION (continued)
EXT TRIGGER
BIAS
VBIAS
Network Analyzer
(HP8753ES)
P1
P2
VDD
A0
0B1
RL = 50 W
A1
1B1
DUT
0B2
1BX2
SEL
VSEL
A. CL includes probe and jig capacitance.
B. A 50 W termination resistor is needed to match the loading of the network analyzer.
Figure 12. Test Circuit for OFF Isolation (OIRR)
OFF isolation is measured at the output of the OFF channel. For example, when VSEL = GND and A1 is the input,
the output is measured at 1B2. All unused analog input (A) ports are connected to ground, and output (B) ports
are left open.
HP8753ES Setup
Average = 4
RBW = 3 kHz
VBIAS = 0.35 V
ST = 2 s
P1 = 0 dBM
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REVISION HISTORY
Changes from Revision A (March 2012) to Revision B
•
12
Page
Changed Low B Low Bit-to-Bit Skew in the FEATURES list from (tsk(o) = 6 ps Max) to (tsk(o) = 6 ps Typ) ........................... 1
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PACKAGE OPTION ADDENDUM
www.ti.com
10-Dec-2020
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
(4/5)
(6)
TS3DDR3812RUAR
ACTIVE
WQFN
RUA
42
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
SL812
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
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