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UCC27321, UCC27322
UCC37321, UCC37322
SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016
UCC2732x/UCC3732x Single 9-A High-Speed Low-Side Mosfet Driver With Enable
1 Features
2 Applications
•
•
•
•
•
•
•
1
•
•
•
•
•
•
•
•
•
Industry-Standard Pin-Out With Addition of Enable
Function
High-Peak Current Drive Capability of ±9 A at
theMiller plateau region Using TrueDrive
Efficient Constant Current Sourcing Using a
Unique BiPolar and CMOS Output Stage
TTL/CMOS Compatible Inputs Independent of
Supply Voltage
20-ns Typical Rise and Fall Times With 10-nF
Load
Typical Propagation Delay Times of 25 ns With
Input Falling and 35 ns With Input Rising
4-V to 15-V Supply Voltage
Available in Thermally Enhanced MSOP
PowerPAD™ Package With 4.7°C/W θjc
Rated From –40°C to +105°C
Pb-Free Finish (CU NIPDAU) on 8-pin SOIC and
PDIP Packages
Switch Mode Power Supplies
DC-DC Converters
Motor Controllers
Class-D Switching Amplifiers
Line Drivers
Pulse Transformer Drivers
3 Description
The UCC2732x/UCC3732x family of high-speed
drivers deliver 9 A of peak drive current in an industry
standard pinout. These drivers can drive the largest
of MOSFETs for systems requiring extreme Miller
current due to high dV/dt transitions. This eliminates
additional external circuits and can replace multiple
components to reduce space, design complexity, and
assembly cost. Two standard logic options are
offered, inverting (UCC37321) and noninverting
(UCC37322).
Device Information(1)
PART
NUMBER
UCC2732x
UCC3732x
PACKAGE
BODY SIZE (NOM)
MSOP-PowerPAD (8)
3.00 mm × 3.00 mm
SOIC (8)
3.91 mm × 4.90 mm
PDIP (8)
6.35 mm × 9.81 mm
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
Block Diagram
VDD
1
8
VDD
INVERTING
7 OUT
VDD
IN
2
ENBL
3
AGND
4
NON-INVERTING
6 OUT
RENBL
100 kΩ
5
PGND
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
UCC27321, UCC27322
UCC37321, UCC37322
SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016
www.ti.com
Table of Contents
1
2
3
4
5
6
7
8
Features ..................................................................
Applications ...........................................................
Description .............................................................
Revision History.....................................................
Description (continued).........................................
Pin Configuration and Functions .........................
Specifications.........................................................
1
1
1
2
3
3
4
7.1
7.2
7.3
7.4
7.5
7.6
7.7
7.8
4
4
4
4
5
6
6
8
Absolute Maximum Ratings ......................................
ESD Ratings..............................................................
Recommended Operating Conditions.......................
Thermal Information ..................................................
Electrical Characteristics...........................................
Switching Characteristics ..........................................
Power Dissipation Ratings ........................................
Typical Characteristics ..............................................
Detailed Description ............................................ 12
8.1 Overview ................................................................. 12
8.2 Functional Block Diagram ....................................... 12
8.3 Feature Description................................................. 12
8.4 Device Functional Modes........................................ 14
9
Application and Implementation ........................ 15
9.1 Application Information............................................ 15
9.2 Typical Application ................................................. 15
10 Power Supply Recommendations ..................... 19
11 Layout................................................................... 19
11.1 Layout Guidelines ................................................. 19
11.2 Layout Example .................................................... 20
11.3 Thermal Information .............................................. 20
12 Device and Documentation Support ................. 21
12.1
12.2
12.3
12.4
12.5
12.6
12.7
Device Support......................................................
Documentation Support ........................................
Related Links ........................................................
Community Resources..........................................
Trademarks ...........................................................
Electrostatic Discharge Caution ............................
Glossary ................................................................
21
21
21
21
21
22
22
13 Mechanical, Packaging, and Orderable
Information ........................................................... 22
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision G (May 2013) to Revision H
•
Page
Added ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation
section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and
Mechanical, Packaging, and Orderable Information section. ................................................................................................. 1
Changes from Revision F (March 2012) to Revision G
Page
•
Updated AGND pin description. ............................................................................................................................................ 3
•
Changed minimum value for input voltage from –5 to –0.3 V in the Absolute Maximum Ratings table. ............................... 4
•
Added CLOAD = 10 nF to Fall Time vs Supply Voltage graph ................................................................................................. 8
•
Changed Changed x-axis values from 1, 10, 100 to 0.1, 1, 10 in Rise Time vs Load Capacitance graph ........................... 8
•
Changed Changed x-axis values from 1, 10, 100 to 0.1, 1, 10 in Fall Time vs Output Capacitance graph .......................... 8
2
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UCC27321, UCC27322
UCC37321, UCC37322
www.ti.com
SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016
5 Description (continued)
Using a design that inherently minimizes shoot-through current, the outputs of these can provide high gate drive
current where it is most needed at theMiller plateau region during the MOSFET switching transition. A unique
hybrid output stage paralleling bipolar and MOSFET transistors (TrueDrive) allows efficient current delivery at low
supply voltages. With this drive architecture, UCC3732x can be used in industry standard 6-A, 9-A and many 12A driver applications. Latch up and ESD protection circuitries are also included. Finally, the UCC3732x provides
an enable (ENBL) function to have better control of the operation of the driver applications. ENBL is implemented
on pin 3, which was previously left unused in the industry standard pinout. It is internally pulled up to VDD for
active high logic and can be left open for standard operation.
In addition to the 8-pin SOIC (D) and 8-pin PDIP (P) package offerings, the UCC3732x also comes in the
thermally enhanced but tiny 8-pin MSOP PowerPAD™ (DGN) package. The PowerPAD package drastically
lowers the thermal resistance to extend the temperature operation range and improve the long-term reliability.
6 Pin Configuration and Functions
P, D, and DGN Packages
8-Pin PDIP, SOIC, and MSOP With PowerPAD
Top View
VDD
IN
ENBL
AGND
1
8
2
7
3
6
4
5
VDD
OUT
OUT
PGND
Pin Functions
PIN
NAME
NO.
I/O
DESCRIPTION
AGND
4
—
The AGND and the PGND must be connected by a single thick trace directly under the
device. There must be a low ESR, low ESL capacitor of 0.1 µF between VDD (pin 8) and
PGND and a separate 0.1-µF capacitor between VDD (pin 1) and AGND. The power
MOSFETs must be located on the PGND side of the device while the control circuit must be
on the AGND side of the device. The control circuit ground must be common with the AGND
while the PGND must be common with the source of the power FETs.
ENBL
3
I
Enable input for the driver with logic compatible threshold and hysteresis. The driver output
can be enabled and disabled with this pin. It is internally pulled up to VDD with 100-kΩ
resistor for active high operation. When the device is disabled, the output state is, low
regardless of the input state.
IN
2
I
Input signal of the driver which has logic compatible threshold and hysteresis.
6, 7
O
Driver outputs that must be connected together externally. The output stage is capable of
providing 9-A peak drive current to the gate of a power MOSFET.
5
—
Common ground for output stage. This ground must be connected very closely to the source
of the power MOSFET which the driver is driving. Grounds are separated to minimize ringing
affects due to output switching di/dt which can affect the input threshold.
1, 8
I
Supply voltage and the power input connections for this device. Two pins must be connected
together externally.
OUT
PGND
VDD
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UCC37321, UCC37322
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7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)
(1) (2)
MIN
MAX
UNIT
–0.3
16
V
0.6
A
Input voltage (IN), VIN
–0.3
6 V or VDD + 0.3 (3)
V
Enable voltage (ENBL)
–0.3
6 V or VDD + 0.3 (3)
V
650
mW
Supply voltage, VDD
Output current (OUT) DC, IOUT_DC
D package
Power dissipation at TA = 25°C
DGN package
P package
Lead temperature (soldering, 10 s)
3
W
350
mW
300
°C
Junction operating temperature, TJ
–55
150
°C
Storage temperature, Tstg
–65
150
°C
(1)
(2)
(3)
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating ConditionsRecommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may
affect device reliability.
All voltages are with respect to GND. Currents are positive into, negative out of the specified terminal.
Whichever is larger
7.2 ESD Ratings
VALUE
V(ESD)
(1)
(2)
Electrostatic discharge
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1)
±2500
Charged-device model (CDM), per JEDEC specification JESD22C101 (2)
±1500
UNIT
V
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
7.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN
Supply voltage, VDD
NOM
MAX
4.5
15
UNIT
V
7.4 Thermal Information
UCC27322
THERMAL METRIC
(1)
UCC27321
D (SOIC)
P (PDIP)
DGN (MSOPPowerPAD)
UNIT
8 PINS
8 PINS
8 PINS
RθJA
Junction-to-ambient thermal resistance
56.6
55.9
56.7
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
52.8
45.3
52.9
°C/W
RθJB
Junction-to-board thermal resistance
32.6
32.6
32.7
°C/W
ψJT
Junction-to-top characterization parameter
1.8
23.0
1.8
°C/W
ψJB
Junction-to-board characterization parameter
32.3
32.5
32.4
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
5.9
—
5.9
°C/W
(1)
4
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
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UCC27321, UCC27322
UCC37321, UCC37322
www.ti.com
SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016
7.5 Electrical Characteristics
VDD = 4.5 V to 15 V, TA = –40°C to +105°C for UCC2732x, TA = 0°C to 70°C for UCC3732x, TA = TJ, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
INPUT (IN)
VIN_H, logic 1 input threshold
2
V
VIN_L, logic 0 input threshold
0 V ≤ VIN ≤ VDD
Input current
–10
1
V
10
µA
150
300
mV
0
OUTPUT (OUT)
Peak output current (1) (2)
VDD = 14 V,
VOH, output high level
VOH = VDD – VOUT, IOUT = –10 mA
VOL, output low level
IOUT = 10 mA
11
25
mV
Output resistance high (3)
IOUT = –10 mA, VDD = 14 V
15
25
Ω
Output resistance low (3)
IOUT = 10 mA, VDD = 14 V
1.1
2.2
Ω
Latch--up protection
(1)
9
A
500
mA
OVERALL
IN = LOW, EN = LOW, VDD = 15 V
150
225
UCC37321 IN = HIGH, EN = LOW, VDD = 15 V
UCC27321 IN = LOW, EN = HIGH, VDD = 15 V
440
650
370
550
IN = HIGH, EN = HIGH, VDD = 15 V
370
550
IN = LOW, EN = LOW, VDD = 15 V
150
225
UCC37322 IN = HIGH, EN = LOW, VDD = 15 V
UCC27322 IN = LOW, EN = HIGH, VDD = 15 V
450
650
75
125
IN = HIGH, EN = HIGH, VDD = 15 V
675
1000
IDD, static operating current
µA
ENABLE (ENBL)
VIN_H, high-level input voltage
LOW to HIGH transition
1.7
2.2
2.7
VIN_L, low-level input voltage
HIGH to LOW transition
1.1
1.6
2
0.25
0.55
0.90
75
100
135
Hysteresis
RENBL, enable impedance
(1)
(2)
(3)
VDD = 14 V, ENBL = GND
V
V
kΩ
Ensured by design. Not tested in production.
The pullup and pulldown circuits of the driver are bipolar and MOSFET transistors in parallel. The peak output current rating is the
combined current from the bipolar and MOSFET transistors.
The pullup and pulldown circuits of the driver are bipolar and MOSFET transistors in parallel. The output resistance is the RDS(ON) of the
MOSFET transistor when the voltage on the driver output is less than the saturation voltage of the bipolar transistor.
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7.6 Switching Characteristics
over operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
ENABLE (ENBL)
tD3, propagation delay time (1)
CLOAD = 10 nF
60
90
ns
tD4, propagation delay time (1)
CLOAD = 10 nF
60
90
ns
tR, rise time (OUT)
CLOAD = 10 nF
20
70
ns
tF, fall time (OUT)
CLOAD = 10 nF
20
30
ns
tD1, propagation delay, IN rising (IN to OUT)
CLOAD = 10 nF
25
70
ns
tD2, propagation delay, IN falling (IN to OUT)
CLOAD = 10 nF
35
70
ns
SWITCHING TIME (2)
(1)
(2)
See Figure 2.
See Figure 1 for switching waveforms.
7.7 Power Dissipation Ratings
PACKAGE
SUFFIX
θjc (°C/W)
θja (°C/W)
Power Rating
(mW)
TA = 70°C (1)
Derating Factor
Above
70°C (mW/°C) (1)
SOIC-8
D
42
84 to 160 (2)
344 to 655 (2)
6.25 to 11.9 (2)
PDIP-8
P
49
110
500
9
MSOP PowerPAD-8
DGN
4.7
50 to 59
1370
17.1
(1)
(2)
125°C operating junction temperature is used for power rating calculations
The range of values indicates the effect of the printed-circuit-board. These values are intended to give the system designer an indication
of the best and worst case conditions. In general, the system designer should attempt to use larger traces on the printed-circuit-board
where possible to spread the heat away form the device more effectively. For additional information on device temperature
management, see the Packaging Information section of the Power Supply Control Products Data Book, (SLUD003).
(a)
( b)
5V
IN
0V
VTH
VTH
tD1
tD2
VTH
IN
VTH
tD1
tD2
tF
VDD
80%
80%
tR
OUT
20%
80%
OUT
80%
tR
tF
20%
0V
The 20% and 80% thresholds depict the dynamics of the BiPolar output devices that dominate the power MOSFET
transition through the Miller regions of operation.
Figure 1. Switching Waveforms for (a) Inverting Input to (b) Output Times
6
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5V
ENBL
VIN_L
VIN_H
0V
tD3
tD4
VDD
80%
OUT
80%
tR
tF
20%
0V
The 20% and 80% thresholds depict the dynamics of the BiPolar output devices that dominate the power MOSFET
transition through the Miller regions of operation.
Figure 2. Switching Waveform for Enable to Output
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7.8 Typical Characteristics
700
700
600
ENBL = 0V
IN = 5V
500
400
IDD – InputCurrentIdle – μA
IDD – InputCurrentIdle – μA
600
ENBL = VDD
IN = 5V
300
ENBL = 0V
IN = 0V
200
400
ENBL = 0V
IN = 0V
300
ENBL = VDD
IN = 5V
200
ENBL = VDD , IN = 0V
100
100
ENBL = VDD , IN = 0V
0
0
2
0
4
6
8
10
12
VDD – Supply Voltage – V
14
16
0
700
700
IDD – InputCurrentIdle – μA
800
ENBL = LO
IN = HI
ENBL = HI
IN = LO
ENBL = HI
IN = HI
500
400
ENBL = LO
IN = LO
300
4
6
8
10
200
0
-- 50
16
ENBL = HIIGH
IN =HIIGH
600
ENBL = LOW
500
IN = HIIGH
400
ENBL = LOW
IN = LOW
300
ENBL = HIIGH
IN = LOW
200
-- 25
0
25
50
75
100
0
-- 50
125
-- 25
TJ – Temperature – °C
0
25
50
100
75
125
TJ – Temperature – °C
Figure 5. Input Current Idle vs Temperature (UCCx7321)
Figure 6. Input Current Idle vs Temperature (UCCx7322)
70
70
C LOAD = 10 nF
CLOAD = 10 n F
60
60
tA = – 40°C
50
tR – Fall Time – ns
50
tR – Rise Time – ns
14
100
100
40
tA = 105°C
tA = 25°C
30
40
30
tA = 105°C
tA = 25°C
20
20
tA = 0°C
10
10
tA = 0°C
tA = –40°C
0
0
4
6
8
10
12
14
16
VDD – Supply Voltage – V
Figure 7. Rise Time vs Supply Voltage
8
12
Figure 4. Input Current Idle vs Supply Voltage (UCCx7322)
800
600
2
VDD – Supply Voltage – V
Figure 3. Input Current Idle vs Supply Voltage (UCCx7321)
IDD – InputCurrentIdle – μA
ENBL = 0V
IN = 5V
500
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4
6
8
10
12
VDD -- Supply Voltage -- V
14
16
Figure 8. Fall Time vs Supply Voltage
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UCC37321, UCC37322
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Typical Characteristics (continued)
40
200
VDD = 5 V
VDD = 5 V
160
VDD = 10 V
VDD = 10 V
VDD = 15 V
tR – Fall Time – ns
tR – Rise Time – ns
30
VDD = 15 V
20
120
80
10
40
0
0.1
1
0
10
0.1
1
CLOAD – Load Capacitance – nF
CLOAD –- Load Capacitance – nF
10
Figure 10. Fall Time vs Output Capacitance
Figure 9. Rise Time vs Load Capacitance
70
70
CLOAD = 10 n F
CLOAD = 10 n F
tA = 105°C
60
60
tA = 25°C
50
tD2 – Delay Time -- ns
tD1 -– Delay Time -- ns
tA = 105°C
50
tA = 25°C
40
30
20
40
30
tA = 0°C
20
tA = –40°C
tA = –40°C
10
10
tA = 0°C
0
0
4
6
8
10
12
14
16
4
VDD – Supply Voltage – V
8
10
12
14
16
VDD – Supply Voltage – V
Figure 11. tD1 Delay Time vs Supply Voltage
Figure 12. tD2 Delay Time vs Supply Voltage
70
70
60
60
VDD = 5 V
50
VDD = 5 V
tD2 – Delay Time – ns
tD1 – Delay Time –- ns
6
VDD = 10 V
40
30
20
50
40
30
VDD = 15 V
VDD = 10 V
20
VDD = 15 V
10
10
0
1
10
100
CLOAD – Load Capacitance – nF
Figure 13. tD1 Delay Time vs Load Capacitance
Copyright © 2002–2016, Texas Instruments Incorporated
0
1
10
CLOAD – Load Capacitance – nF
100
Figure 14. tD2 Delay Time vs Load Capacitance
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Typical Characteristics (continued)
2.0
50
45
VDD = 15 V
CLOAD = 10 n F
TA = 25°C
tD2
Propagation Time -- ns
tRISE
35
30
25
20
15
10
tFALL
tD1
1.9
VON – Input Threshold Voltage – V
40
1.8
1.7
1.6
1.5
VDD = 10 V
VDD = 4. 5 V
1.4
1.3
5
0
0
5
10
VIN(peak) – Peak Input Voltage – V
1.2
--50
15
-- 25
0
25
50
75
100
125
TJ – Temperature – °C
Figure 15. Propagation Times vs Peak Input Voltage
Figure 16. Input Threshold vs Temperature
150
3.0
140
ENBL -- ON
2.5
130
RENBL – Enable Resistance – Ω
Enable thresholdand hysteresis – V
VDD = 15 V
2.0
1.5
1.0
ENBL -- OFF
120
110
100
90
80
70
0.5
60
ENBL -- HYSTERESIS
0
-- 50
-- 25
0
25
50
75
TJ – Temperature –°C
100
50
-- 50
125
--25
0
25
50
75
Figure 17. Enable Threshold and Hysteresis vs Temperature
125
Figure 18. Enable Resistance vs Temperature
IN = GND
ENBL = VDD
VDD – Input Voltage – V
1 V/div
IN = GND
ENBL = V DD
VDD – Input Voltage – V
1 V/div
100
TJ – Temperature – °C
VDD
OUT
OUT
0V
0V
10 nF Between Output and GND
50 μs/div
Figure 19. Output Behavior vs VDD (UCC37321)
10
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VDD
10 nF Between Output and GND
50 μs/div
Figure 20. Output Behavior vs VDD (UCC37321)
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Typical Characteristics (continued)
IN = VDD
ENBL = VDD
VDD – Supply Voltage – V
1 V/div
VDD – Supply Voltage – V
1 V/div
IN = VDD
ENBL = VDD
VDD
OUT
VDD
OUT
0V
0V
10 nF Between Output and GND
50 μs/div
Figure 21. Output Behavior vs VDD (Inverting)
10 nF Between Output and GND
50 μs/div
Figure 22. Output Behavior vs VDD (Inverting)
IN = GND
ENBL = VDD
VDD
OUT
0V
VDD – Supply Voltage – V
1 V/div
VDD – Supply Voltage – V
1 V/div
IN = GND
ENBL = VDD
VDD
OUT
0V
10 nF Between Output and GND
50 μs/div
10 nF Between Output and GND
50 μs/div
Figure 23. Output Behavior vs VDD (Noninverting)
Figure 24. Output Behavior vs VDD (Noninverting)
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8 Detailed Description
8.1 Overview
The UCC37321 and UCC37322 drivers serve as an interface between low-power controllers and power
MOSFETs. They can also be used as an interface between DSPs and power MOSFETs. High-frequency power
supplies often require high-speed, high-current drivers such as the UCC3732x family. A leading application is the
need to provide a high power buffer stage between the PWM output of the control device and the gates of the
primary power MOSFET or IGBT switching devices. In other cases, the device drives the power device gates
through a drive transformer. Synchronous rectification supplies must simultaneously drive multiple devices which
can present an extremely large load to the control circuitry.
The inverting driver (UCC37321) is useful for generating inverted gate drive signals from controllers that have
only outputs of the opposite polarity. For example, this driver can provide a gate signal for ground referenced,
N-channel synchronous rectifier MOSFETs in buck derived converters. This driver can also be used for
generating a gate drive signal for a P-channel MOSFET from a controller that is designed for N-channel
applications.
MOSFET gate drivers are generally used when it is not feasible to have the primary PWM regulator device
directly drive the switching devices for one or more reasons. The PWM device may not have the brute drive
capability required for the intended switching MOSFET, limiting the switching performance in the application. In
other cases there may be a desire to minimize the effect of high-frequency switching noise by placing the high
current driver physically close to the load. Also, newer devices that target the highest operating frequencies may
not incorporate onboard gate drivers at all. Their PWM outputs are only intended to drive the high impedance
input to a driver such as the UCC3732x. Finally, the control device may be under thermal stress due to power
dissipation, and an external driver can help by moving the heat from the controller to an external package.
8.2 Functional Block Diagram
VDD
1
8
VDD
INVERTING
7 OUT
VDD
IN
2
ENBL
3
AGND
4
NON-INVERTING
6 OUT
RENBL
100 kΩ
5
PGND
8.3 Feature Description
8.3.1 Input Stage
The IN threshold has a 3.3-V logic sensitivity over the full range of VDD voltages; yet, it is equally compatible
with 0 V to VDD signals. The inputs of UCC3732x family of drivers are designed to withstand 500-mA reverse
current without either damage to the device or logic upset. In addition, the input threshold turnoff of the
UCC3732x has been slightly raised for improved noise immunity. The input stage of each driver must be driven
by a signal with a short rise or fall time. This condition is satisfied in typical power supply applications, where the
input signals are provided by a PWM controller or logic gates with fast transition times (< 200 ns). The IN input of
the driver functions as a digital gate, and it is not intended for applications where a slow changing input voltage is
used to generate a switching output when the logic threshold of the input section is reached. While this may not
be harmful to the driver, the output of the driver may switch repeatedly at a high frequency.
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Feature Description (continued)
Users should not attempt to shape the input signals to the driver in an attempt to slow down (or delay) the signal
at the output. If limiting the rise or fall times to the power device is desired, then an external resistance can be
added between the output of the driver and the load device, which is generally a power MOSFET gate. The
external resistor may also help remove power dissipation from the device package, as discussed in Thermal
Information.
8.3.2 Output Stage
The TrueDrive output stage is capable of supplying ±9-A peak current pulses; it swings to both VDD and GND
and can encourage even the most stubborn MOSFETs to switch. The pullup and pulldown circuits of the driver
are constructed of bipolar and MOSFET transistors in parallel. The peak output current rating is the combined
current from the bipolar and MOSFET transistors. The output resistance is the RDS(ON) of the MOSFET transistor
when the voltage on the driver output is less than the saturation voltage of the bipolar transistor. Each output
stage also provides a very low impedance to overshoot and undershoot due to the body diode of the internal
MOSFET. This means that in many cases, external-schottky-clamp diodes are not required.
This unique BiPolar and MOSFET hybrid output architecture (TrueDrive) allows efficient current sourcing at low
supply voltages. The UCC3732x family delivers 9 A of gate drive where it is most needed during the MOSFET
switching transition – at the Miller plateau region – providing improved efficiency gains.
8.3.3 Source and Sink Capabilities during Miller Plateau
Large power MOSFETs present a significant load to the control circuitry. Proper drive is required for efficient,
reliable operation. The UCC3732x drivers have been optimized to provide maximum drive to a power MOSFET
during the Miller plateau region of the switching transition. This interval occurs while the drain voltage is swinging
between the voltage levels dictated by the power topology, requiring the charging or discharging of the drain-gate
capacitance with current supplied or removed by the driver device.
Two circuits are used to test the current capabilities of the UCC3732x driver (see Reference (1)) . In each case
external circuitry is added to clamp the output near 5 V while the device is sinking or sourcing current. An input
pulse of 250 ns is applied at a frequency of 1 kHz in the proper polarity for the respective test. In each test there
is a transient period where the current peaked up and then settled down to a steady-state value. The noted
current measurements are made at a time of 200 ns after the input pulse is applied, after the initial transient.
The circuit in Figure 25 is used to verify the current sink capability when the output of the driver is clamped
around 5 V, a typical value of gate-source voltage during the Miller plateau region. The UCC37321 is found to
sink 9 A at VDD = 15 V.
VDD
UCC37321
INPUT
1 VDD
2
VDD 8
OUT
IN
OUT
3 ENBL
4
DSCHOTTKY
C2
1 μF
6
PGND 5
AGND
10 Ω
7
C3
100 μF
+
VSUPPLY
5.5 V
VSNS
1 μF
CER
100 μF
AL EL
RSNS
0.1 Ω
UDG-- 01113
Figure 25. Sink Current Test Circuit
The circuit in Figure 26 is used to test the current source capability with the output clamped to around 5 V with a
string of Zener diodes. The UCC37321 is found to source 9 A at VDD = 15 V.
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Feature Description (continued)
VDD
UCC37321
INPUT
1
VDD
VDD 8
IN
OUT
DSCHOTTKY
2
7
C2
1μ F
OUT
3
4
ENBL
AGND
6
C3
100 μF
4.5 V
DADJ
PGND 5
VSNS
1μ F
CER
100 μF
AL EL
RSNS
0.1 Ω
UDG-- 01114
Figure 26. Source Current Test Circuit
Note that the current sink capability is slightly stronger than the current source capability at lower VDD. This is
due to the differences in the structure of the bipolar-MOSFET power output section, where the current source is
a P-channel MOSFET and the current sink has an N-channel MOSFET.
In most it is advantageous that the turnoff capability of a driver is stronger than the turnon capability. This helps
to ensure that the MOSFET is held OFF during common power supply transients which may turn the device back
ON.
8.3.4 Enable
The UCC37321/2 provides an enable input for improved control of the driver operation. This input also
incorporates logic compatible thresholds with hysteresis. It is internally pulled up to VDD with 100-kΩ resistor for
active high operation. When ENBL is high, the device is enabled and when ENBL is low, the device is disabled.
The default state of the ENBL pin is to enable the device and therefore it can be left open for standard operation.
The output state when the device is disabled is low regardless of the input state. See Table 1 for the operation
using enable logic.
ENBL input is compatible with both logic signals and slow changing analog signals. It can be directly driven or a
power-up delay can be programmed with a capacitor between ENBL and AGND.
8.4 Device Functional Modes
Table 1 lists the logic of this device.
Table 1. Device Logic Table
INVERTING
UCC37321
NON-INVERTING
UCC37322
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ENBL
IN
OUT
0
0
0
0
1
0
1
0
1
1
1
0
0
0
0
0
1
0
1
0
0
1
1
1
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9 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information
High-current gate driver devices are required in switching power applications for a variety of reasons. To enable
fast switching of power devices and reduce associated power losses, a powerful gate driver can be employed
between the PWM output of controllers or signal isolation devices and the gates of the power semiconductor
devices. Further, gate drivers are indispensable when sometimes it is just not feasible to have the PWM
controller directly drive the gates of the switching devices. The situation may be encountered because the PWM
signal from a digital controller or signal isolation device is often a 3.3-V or 5-V logic signal which is not capable of
effectively turning on a power switch. A level-shifting circuitry is needed to boost the logic-level signal to the gatedrive voltage to fully turn on the power device and minimize conduction losses. Traditional buffer drive circuits
based on NPN/PNP bipolar, (or P- N- channel MOSFET), transistors in totem-pole arrangement, being emitter
follower configurations, prove inadequate for this because they lack level-shifting capability and low-drive voltage
protection. Gate drivers effectively combine both the level-shifting and buffer drive functions. Gate drivers may
also minimize the effect of switching noise by locating the high-current driver physically close to the power
switch, drive gate-driver transformers and control floating power device gates, reducing power dissipation and
thermal stress in controllers by absorbing gate-charge power losses.
In summary gate drivers are extremely important components in switching power combining benefits of highperformance, low-cost, low component count, board-space reduction, and simplified system design.
9.2 Typical Application
8 VDD
1 VDD
C2
OUT
6
OUT
7
Q1
R4
UCC27322D
2
INPUT
3
IN
AGND
4
ENBL
PGND
5
ENABLE
Figure 27. Typical Application Diagram of UCC27322 and UCC37322
9.2.1 Design Requirements
When selecting the proper gate driver device for an end application, some design considerations must be
evaluated first to make the most appropriate selection. The following design parameters should be used when
selecting the proper gate driver device for an end application: input-to-output configuration, the input threshold
type, bias supply voltage levels, peak source and sink currents, availability of independent enable and disable
functions, propagation delay, power dissipation, and package type. See the example design parameters and
requirements in Table 2.
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Table 2. Design Parameters
(1)
DESIGN PARAMETER
EXAMPLE VALUE
Input-to-output configuration
Noninverting
Input threshold type
CMOS
Bias supply voltage levels
12 V
dVDS/dt (1)
20 V/ns
Enable function
Yes
Propagation delay
< 50 ns
Power dissipation
< 0.45 W
Package type
SOIC (8)
dVDS/dt is a typical requirement for a given design. This value can
be used to find the peak source/sink currents needed as shown in
Peak Source and Sink Currents.
9.2.2 Detailed Design Procedure
9.2.2.1 Input-to-Output Configuration
The design should specify which type of input-to-out configuration should be used. If turning on the power
MOSFET or IGBT when the input signal is in high state is preferred, then a device capable of the noninverting
configuration must be selected. If turning off the power MOSFET or IGBT when the input signal is in high state is
preferred, then a device capable of the inverting configuration must be chosen. Based on this noninverting
requirement of this application, the proper device out of the UCC27322 or UCC37322 should be selected.
9.2.2.2 Input Threshold Type
The type of input voltage threshold determines the type of controller that can be used with the gate driver device.
The UCC2732x and UCC3732x devices feature a TTL and CMOS-compatible input threshold logic, with wide
hysteresis. The threshold voltage levels are low voltage and independent of the VDD supply voltage, which allows
compatibility with both logic-level input signals from microcontrollers as well as higher-voltage input signals from
analog controllers. See Electrical Characteristics for the actual input threshold voltage levels and hysteresis
specifications for the UCC2732x and UCC3732x devices.
9.2.2.3 VDD Bias Supply Voltage
The bias supply voltage to be applied to the VDD pins of the device must never exceed the values listed in
Recommended Operating Conditions. However, different power switches require different voltage levels to be
applied at the gate. With a wide operating range from 4.5 V to 15 V, the UCC2732x and UCC3732x can be used
to drive a variety of power switches, such as Si MOSFETs (for example, Vgs = 4.5 V, 10 V, 12 V), IGBTs
(VGE=15 V), and wide-bandgap power semiconductors (such as GaN, certain types of which allow no higher than
6 V to be applied to the gate terminals).
9.2.2.4 Peak Source and Sink Currents
Generally, the switching speed of the power switch during turnon and turnoff must be as fast as possible to
minimize switching power losses. The gate driver device must be able to provide the required peak current for
achieving the targeted switching speeds for the targeted power MOSFET.
Using the example of a power MOSFET, the system requirement for the switching speed is typically described in
terms of the slew rate of the drain-to-source voltage of the power MOSFET (such as dvDS/dt). For example, the
system requirement might state that a SPP20N60C3 power MOSFET must be turned on with a Dvds/dt of 20
V/ns or higher under a DC bus voltage of 400 V in a continuous-conduction-mode (CCM) boost PFC-converter
application. This type of application is an inductive hard-switching application and reducing switching power loss
is critical. This requirement means that the entire drain-to-source voltage swing during power MOSFET turnon
event (from 400 V in the OFF state to VDS(on) in ON state) must be completed in approximately 20 ns or less.
When the drain-to-source voltage swing occurs, the Miller charge of the power MOSFET (Qgd parameter in
SPP20N60C3 power MOSFET data sheet is 33 nC typically) is supplied by the peak current of gate driver.
According to power MOSFET inductive switching mechanism, the gate-to-source voltage of the power MOSFET
at this time is the Miller plateau voltage, which is typically a few volts higher than the threshold voltage of the
power MOSFET, VGS(th)).
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To achieve the targeted Dvds/dt, the gate driver must be capable of providing the Qgd charge in 20 ns or less. In
other words, a peak current of 1.65 A (= 33 nC) / 20 ns) or higher must be provided by the gate driver. The
UCC2732x and UCC3732x devices can provide 9-A peak sourcing/sinking current which clearly exceeds the
design requirement and has the capability to meet the switching speed needed. This 9-A peak sourcing/sinking
current provides an extra margin against part-to-part variations in the Qgd parameter of the power MOSFET along
with additional flexibility to insert external gate resistors and fine tune the switching speed for efficiency versus
EMI optimizations. However, in practical designs the parasitic trace in the gate driver circuit of the PCB will have
a definitive role to play on the power MOSFET switching speed. The effort of this trace inductance is to limit the
di/dt of the output current pulse of the gate driver. To illustrate this effect, consider output current pulse waveform
from the gate driver to be approximated to a triangular profile, where the area under the triangle (0.5 × IPEAK ×
time) would equal the total gate charge of the power MOSFET (Qg parameter in SPP20N60C3 power MOSFET
data sheet= 87 nC typically). If the parasitic trace inductance limits the di/dt then a situation may occur in which
the full peak current capability of the gate driver is not fully achieved in the time required to deliver the Qg
required for the power MOSFET switching. In other words, the time parameter in the equation would dominate
and the IPEAK value of the current pulse would be much less than the true peak current capability of the device,
while the required Qg is still delivered. Because of this, the desired switching speed may not be realized, even
when theoretical calculations indicate the gate driver can achieve the targeted witching speed. Thus, placing the
gate driver device very close to the power MOSFET and designing a tight gate drive-loop with minimal PCB trace
inductance is important to realize the full peak-current capability of the gate driver.
9.2.2.5 Enable and Disable Function
Certain applications demand independent control of the output state of the driver without involving the input
signal. A pin which offers enable and disable functions achieves the requirements. For these applications, the
UCC2732x and UCC3732x are suitable as they feature an input pin and an Enable pin.
9.2.2.6 Propagation Delay
The acceptable propagation delay from the gate driver is dependent on the switching frequency at which it is
used and the acceptable level of pulse distortion to the system. The UCC2732x and UCC3732x devices feature
25-ns turnon propagation delay and 35-ns turnoff propagation delay (typical), which ensure very little distortion
and allow operation at higher frequencies. See Electrical Characteristics for the propagation and Switching
Characteristics of the UCC2732x and UCC3732x devices.
9.2.2.7 Power Dissipation
The UCC3732x family of drivers are capable of delivering 9-A of current to a MOSFET gate for a period of
several hundred nanoseconds. High peak current is required to turn an N-channel device ON quickly. Then, to
turn the device OFF, the driver is required to sink a similar amount of current to ground. This repeats at the
operating frequency of the power device. An N-channel MOSFET is used in this discussion because it is the
most common type of switching device used in high-frequency power conversion equipment.
References (1) and (2) contain detailed discussions of the drive current required to drive a power MOSFET and
other capacitive-input switching devices. Much information is provided in tabular form to give a range of the
current required for various devices at various frequencies. The information pertinent to calculating gate drive
current requirements will be summarized here; the original document is available from the TI website.
When a driver device is tested with a discrete, capacitive load it is a fairly simple matter to calculate the power
that is required from the bias supply. The energy that must be transferred from the bias supply to charge the
capacitor is given by Equation 1.
1
E = CV2
2
where
•
•
C is the load capacitor
V is the bias voltage feeding the driver
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There is an equal amount of energy transferred to ground when the capacitor is discharged. This leads to a
power loss given by Equation 2.
1
P = 2 ´ CV2f
2
where
•
f is the switching frequency
(2)
This power is dissipated in the resistive elements of the circuit. Thus, with no external resistor between the driver
and gate, this power is dissipated inside the driver. Half of the total power is dissipated when the capacitor is
charged, and the other half is dissipated when the capacitor is discharged. An example using the conditions of
the previous gate-drive waveform should help clarify this.
With VDD = 12 V, CLOAD = 10 nF, and f = 300 kHz, the power loss can be calculated as shown in Equation 4.
P = 10 nF × (12)2 × (300 kHz) = 0.432 W
(3)
With a 12-V supply, this would equate, as shown in Equation 4, to a current of:
P
0.432 W
I=
=
= 0.036A
V
12 V
(4)
The switching load presented by a power MOSFETcan be converted to an equivalent capacitance by examining
the gate charge required to switch the device. This gate charge includes the effects of the input capacitance plus
the added charge needed to swing the drain of the device between the ON and OFF states. Most manufacturers
provide specifications that provide the typical and maximum gate charge, in nC, to switch the device under
specified conditions. Using the gate charge Qg, one can determine the power that must be dissipated when
charging a capacitor. This is done by using the equivalence Qg = CeffV to provide Equation 5 for power.
P = C × V2 × f = Qg × V × f
(5)
Equation 5 allows a power designer to calculate the bias power required to drive a specific MOSFET gate at a
specific bias voltage.
9.2.3 Application Curves
IN = VDD
ENBL = VDD
VDD – Input Voltage – V
1 V/div
VDD – Input Voltage – V
1 V/div
IN = VDD
ENBL = VDD
VDD
VDD
OUT
10 nF Between Output and GND
50 μs/div
Figure 28. Output Behavior vs VDD (UCC37322)
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0V
0V
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10 nF Between Output and GND
50 μs/div
Figure 29. Output Behavior vs VDD (UCC37322)
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10 Power Supply Recommendations
Although quiescent VDD current is very low, total supply current is higher, depending on OUTA and OUTB
current and the operating frequency. Total VDD current is the sum of quiescent VDD current and the average
OUT current. Knowing the operating frequency and the MOSFET gate charge (Qg), average OUT current can be
calculated using Equation 6.
IOUT = Qg × f
where
•
f is frequency
(6)
For the best high-speed circuit performance, TI recommends two VDD bypass capacitors to prevent noise
problems. TI also highly recommends using surface mount components. A 0.1-µF ceramic capacitor must be
placed closest to the VDD to ground connection. In addition, a larger capacitor (such as 1 µF) with relatively low
ESR should be connected in parallel to help deliver the high current peaks to the load. The parallel combination
of capacitors presents a low impedance characteristic for the expected current levels in the driver application.
11 Layout
11.1 Layout Guidelines
It can be a significant challenge to avoid the overshoot, undershoot, and ringing issues that can arise from circuit
layout. The low impedance of these drivers and their high di/dt can induce ringing between parasitic inductances
and capacitances in the circuit. Utmost care must be used in the circuit layout.
In general, position the driver physically as close to its load as possible. Place a 1-µF bypass capacitor as close
to the output side of the driver as possible, connecting it to pins 1 and 8. Connect a single trace between the two
VDD pins (pin 1 and pin 8); connect a single trace between PGND and AGND (pin 5 and pin 4). If a ground
plane is used, it may be connected to AGND; do not extend the plane beneath the output side of the package
(pins 5 – 8). Connect the load to both OUT pins (pins 7 and 6) with a single trace on the adjacent layer to the
component layer; route the return current path for the output on the component side, directly over the output
path.
Extreme conditions may require decoupling the input power and ground connections from the output power and
ground connections. The UCCx732x has a feature that allows the user to take these extreme measures, if
necessary. There is a small amount of internal impedance of about 15 Ω between the AGND and PGND pins;
there is also a small amount of impedance (approximately 30 Ω) between the two VDD pins. To take advantage
of this feature, connect a 1-µF bypass capacitor between VDD and PGND (pins 5 and 8) and connect a 0.1-µF
bypass capacitor between VDD and AGND (pins 1 and 4). Further decoupling can be achieved by connecting
between the two VDD pins with a jumper that passes through a 40-MHz ferrite bead and connect bias power only
to pin 8. Even more decoupling can be achieved by connecting between AGND and PGND with a pair of antiparallel diodes (anode connected to cathode and cathode connected to anode).
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11.2 Layout Example
Figure 30. Layout Recommendation
11.3 Thermal Information
The useful range of a driver is greatly affected by the drive power requirements of the load and the thermal
characteristics of the device package. For a power driver to be useful over a particular temperature range the
package must allow for the efficient removal of the heat produced while keeping the junction temperature within
rated limits. The UCC3732x family of drivers is available in three different packages to cover a range of
application requirements.
As shown in the power dissipation rating table, the 8-pin SOIC (D) and 8-pin PDIP (P) packages each have a
power rating of around 0.5 W with TA = 70°C. This limit is imposed in conjunction with the power derating factor
also given in the table. The power dissipation in our earlier example is 0.432 W with a 10-nF load, 12 VDD,
switched at 300 kHz. Thus, only one load of this size could be driven using the D or P package. The difficulties
with heat removal limit the drive available in the D or P packages.
The 8-pin MSOP PowerPAD (DGN) package significantly relieves this concern by offering an effective means of
removing the heat from the semiconductor junction. As illustrated in Reference (3), the PowerPAD packages
offer a leadframe die pad that is exposed at the base of the package. This pad is soldered to the copper on the
PC board directly underneath the device package, reducing the θjc down to 4.7°C/W. Data is presented in
Reference (3) to show that the power dissipation can be quadrupled in the PowerPAD configuration when
compared to the standard packages. The PC board must be designed with thermal lands and thermal vias to
complete the heat removal subsystem, as summarized in Reference (4) .This allows a significant improvement in
heatsinking over that available in theDor P packages, and is shown to more than double the power capability of
the D and P packages.
The PowerPAD is not directly connected to any leads of the package. However, it is electrically and thermally
connected to the substrate which is the ground of the device.
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12 Device and Documentation Support
12.1 Device Support
12.1.1 Related Products
PRODUCT
DESCRIPTION
PACKAGES
UCC37323/4/5
Dual 4-A Low-Side Drivers
MSOP–8 PowerPAD, SOIC–8, PDIP–8
UCC27423/4/5
Dual 4-A Low-Side Drivers with Enable
MSOP–8 PowerPAD, SOIC–8, PDIP–8
TPS2811/12/13
Dual 2-A Low-Side Drivers with Internal Regulator
TSSOP–8, SOIC–8, PDIP–8
TPS2814/15
Dual 2-A Low-Side Drivers with Two Inputs per Channel
TSSOP–8, SOIC–8, PDIP–8
TPS2816/17/18/19
Single 2-A Low-Side Driver with Internal Regulator
5-Pin SOT–23
TPS2828/29
Single 2-A Low-Side Driver
5-Pin SOT–23
12.2 Documentation Support
12.2.1 Related Documentation
For related documentation see the following:
(1)
(2)
(3)
(4)
(5)
SEM-1400, Topic 2, A Design and Application Guide for High Speed Power MOSFET Gate Drive Circuits
U-137, Practical Considerations in High PerformanceMOSFET, IGBT andMCTGateDrive Circuits, by Bill Andreycak (SLUA105)
Technical Brief, PowerPad Thermally Enhanced Package (SLMA002)
Application Brief, PowerPAD Made Easy (SLMA004)
Data Book, Power Supply Control Products, (SLUD003)
12.3 Related Links
The table below lists quick access links. Categories include technical documents, support and community
resources, tools and software, and quick access to sample or buy.
Table 3. Related Links
PARTS
PRODUCT FOLDER
SAMPLE & BUY
TECHNICAL
DOCUMENTS
TOOLS &
SOFTWARE
SUPPORT &
COMMUNITY
UCC27321
Click here
Click here
Click here
Click here
Click here
UCC27322
Click here
Click here
Click here
Click here
Click here
UCC37321
Click here
Click here
Click here
Click here
Click here
UCC37322
Click here
Click here
Click here
Click here
Click here
12.4 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
12.5 Trademarks
PowerPAD, E2E are trademarks of Texas Instruments.
All other trademarks are the property of their respective owners.
Copyright © 2002–2016, Texas Instruments Incorporated
Submit Documentation Feedback
21
UCC27321, UCC27322
UCC37321, UCC37322
SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016
www.ti.com
12.6 Electrostatic Discharge Caution
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
12.7 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
13 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
22
Submit Documentation Feedback
Copyright © 2002–2016, Texas Instruments Incorporated
PACKAGE OPTION ADDENDUM
www.ti.com
16-Nov-2022
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
Samples
(4/5)
(6)
UCC27321D
ACTIVE
SOIC
D
8
75
RoHS & Green
Call TI | NIPDAU
Level-1-260C-UNLIM
-40 to 105
27321
Samples
UCC27321DGN
ACTIVE
HVSSOP
DGN
8
80
RoHS & Green
NIPDAUAG
Level-1-260C-UNLIM
-40 to 105
27321
Samples
UCC27321DGNR
ACTIVE
HVSSOP
DGN
8
2500
RoHS & Green
NIPDAUAG
Level-1-260C-UNLIM
-40 to 105
27321
Samples
UCC27321DR
ACTIVE
SOIC
D
8
2500
RoHS & Green
Call TI | NIPDAU
Level-1-260C-UNLIM
-40 to 105
27321
Samples
UCC27321P
ACTIVE
PDIP
P
8
50
RoHS & Green
NIPDAU
N / A for Pkg Type
-40 to 105
UCC27321P
Samples
UCC27321PE4
ACTIVE
PDIP
P
8
50
RoHS & Green
NIPDAU
N / A for Pkg Type
-40 to 105
UCC27321P
Samples
UCC27322D
ACTIVE
SOIC
D
8
75
RoHS & Green
Call TI | NIPDAU
Level-1-260C-UNLIM
-40 to 105
27322
Samples
UCC27322DGN
ACTIVE
HVSSOP
DGN
8
80
RoHS & Green
NIPDAUAG
Level-1-260C-UNLIM
-40 to 105
27322
Samples
UCC27322DGNR
ACTIVE
HVSSOP
DGN
8
2500
RoHS & Green
NIPDAUAG
Level-1-260C-UNLIM
-40 to 105
27322
Samples
UCC27322DR
ACTIVE
SOIC
D
8
2500
RoHS & Green
Call TI | NIPDAU
Level-1-260C-UNLIM
-40 to 105
27322
Samples
UCC27322DRG4
ACTIVE
SOIC
D
8
2500
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 105
27322
Samples
UCC27322P
ACTIVE
PDIP
P
8
50
RoHS & Green
NIPDAU
N / A for Pkg Type
-40 to 105
UCC27322P
Samples
UCC27322PE4
ACTIVE
PDIP
P
8
50
RoHS & Green
NIPDAU
N / A for Pkg Type
-40 to 105
UCC27322P
Samples
UCC37321D
ACTIVE
SOIC
D
8
75
RoHS & Green
Call TI | NIPDAU
Level-1-260C-UNLIM
0 to 70
37321
Samples
UCC37321DGN
ACTIVE
HVSSOP
DGN
8
80
RoHS & Green
NIPDAUAG
Level-1-260C-UNLIM
0 to 70
37321
Samples
UCC37321DGNR
ACTIVE
HVSSOP
DGN
8
2500
RoHS & Green
NIPDAUAG
Level-1-260C-UNLIM
0 to 70
37321
Samples
UCC37321DR
ACTIVE
SOIC
D
8
2500
RoHS & Green
Call TI | NIPDAU
Level-1-260C-UNLIM
0 to 70
37321
Samples
UCC37321P
ACTIVE
PDIP
P
8
50
RoHS & Green
NIPDAU
N / A for Pkg Type
0 to 70
UCC37321P
Samples
UCC37322D
ACTIVE
SOIC
D
8
75
RoHS & Green
Call TI | NIPDAU
Level-1-260C-UNLIM
0 to 70
37322
Samples
UCC37322DG4
ACTIVE
SOIC
D
8
75
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
0 to 70
37322
Samples
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com
16-Nov-2022
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
Samples
(4/5)
(6)
UCC37322DGN
ACTIVE
HVSSOP
DGN
8
80
RoHS & Green
NIPDAUAG
Level-1-260C-UNLIM
0 to 70
37322
Samples
UCC37322DGNG4
ACTIVE
HVSSOP
DGN
8
80
RoHS & Green
NIPDAUAG
Level-1-260C-UNLIM
0 to 70
37322
Samples
UCC37322DGNR
ACTIVE
HVSSOP
DGN
8
2500
RoHS & Green
NIPDAUAG
Level-1-260C-UNLIM
0 to 70
37322
Samples
UCC37322DGNRG4
ACTIVE
HVSSOP
DGN
8
2500
RoHS & Green
NIPDAUAG
Level-1-260C-UNLIM
0 to 70
37322
Samples
UCC37322DR
ACTIVE
SOIC
D
8
2500
RoHS & Green
Call TI | NIPDAU
Level-1-260C-UNLIM
0 to 70
37322
Samples
UCC37322P
ACTIVE
PDIP
P
8
50
RoHS & Green
NIPDAU
N / A for Pkg Type
0 to 70
UCC37322P
Samples
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of