CAT25C128X-GT3

CAT25C128/256 CAT25C128/256 128K/256K-Bit SPI Serial CMOS EEPROM FEATURES I 5 MHz SPI Compatible I 1.8 to 5.5 Volt Operation I Hardware and Software Protection I Low Power CMOS Technology I SPI Modes (0,0 &1,1) I Industrial and Automotive I Self-Timed Write Cycle I 64-Byte Page Write Buffer I Block Write Protection – Protect 1/4, 1/2 or all of EEPROM Array I 100,000 Program/Erase Cycles I 100 Year Data Retention I RoHS-compliant packages Temperature Ranges DESCRIPTION The CAT25C128/256 is a 128K/256K-Bit SPI Serial CMOS EEPROM internally organized as 16Kx8/32Kx8 bits. Catalyst’s advanced CMOS Technology substantially reduces device power requirements. The CAT25C128/256 features a 64-byte page write buffer. The device operates via the SPI bus serial interface and is enabled through a Chip Select (CS). In addition to the Chip Select, the clock input (SCK), data in (SI) and data out (SO) are required to access the device. The HOLD pin may be used to suspend any serial communication without resetting the serial sequence. The CAT25C128/256 is designed with software and hardware write protection features including Block Lock protection. The device is available in 8-pin DIP, 8-pin SOIC, 14-pin TSSOP and 20-pin TSSOP packages. PIN CONFIGURATION SOIC Package (V**, X) CS SO WP VSS 1 2 3 4 8 7 6 5 VCC HOLD SCK SI BLOCK DIAGRAM 1 2 3 4 5 6 7 14 13 12 11 10 9 8 TSSOP Package (Y14)** CS SO NC NC NC WP VSS V CC HOLD NC NC NC SCK SI SENSE AMPS SHIFT REGISTERS WORD ADDRESS BUFFERS COLUMN DECODERS DIP Package (L) CS SO WP SS 1 2 3 4 8 7 6 5 VCC HOLD SCK SI TSSOP Package (Y20)** NC CS SO SO NC NC WP VSS NC NC 1 2 3 4 5 6 7 8 9 10 20 19 18 17 16 15 14 13 12 11 **CAT25C128 only. NC V CC HOLD HOLD NC NC SCK SI NC NC SO SI CS WP HOLD SCK I/O CONTROL SPI CONTROL LOGIC BLOCK PROTECT LOGIC CONTROL LOGIC XDEC EE PROM ARRAY PIN FUNCTIONS Pin Name SO SCK WP VCC VSS CS SI HOLD NC Function Serial data Output Serial Clock Write Protect Power Supply Ground Chip Select Serial Data Input Suspends Serial Input No Connect DATA IN STORAGE HIGH VOLTAGE/ TIMING CONTROL STATUS REGISTER For Ordering Information details, see page 11. © 2005 by Catalyst Semiconductor, Inc. Characteristics subject to change without notice 1 Document No. 1018, Rev. I CAT25C128/256 ABSOLUTE MAXIMUM RATINGS* Temperature Under Bias ................. –55°C to +125°C Storage Temperature ....................... –65°C to +150°C Voltage on any Pin with Respect to VSS1) ................... –2.0V to +VCC +2.0V VCC with Respect to VSS ................................ –2.0V to +7.0V Package Power Dissipation Capability (Ta = 25°C) ................................... 1.0W Lead Soldering Temperature (10 secs) ............ 300°C Output Short Circuit Current(2) ........................ 100 mA RELIABILITY CHARACTERISTICS Symbol NEND (3) *COMMENT Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability. Parameter Endurance Data Retention ESD Susceptibility Latch-Up Min. 100,000 100 2000 100 Max. Units Cycles/Byte Years Volts mA TDR(3) VZAP(3) ILTH(3)(4) D.C. OPERATING CHARACTERISTICS VCC = +1.8V to +5.5V, unless otherwise specified. Limits Symbol ICC1 ICC2 ISB(5) ILI ILO VIL(3) VIH(3) VOL1 VOH1 VOL2 VOH2 Parameter Power Supply Current (Operating Write) Power Supply Current (Operating Read) Power Supply Current (Standby) Input Leakage Current Output Leakage Current Input Low Voltage Input High Voltage Output Low Voltage Output High Voltage Output Low Voltage Output High Voltage VCC-0.2 VCC - 0.8 0.2 -1 VCC x 0.7 Min. Typ. Max. 10 2 1 2 3 VCC x 0.3 VCC + 0.5 0.4 Units mA mA µA µA µA V V V V V V 4.5V≤VCC