CAT25C65Y14A-1.8TE13

CAT25C33/65 32K/64K-Bit SPI Serial CMOS EEPROM FEATURES s 10 MHz SPI compatible s 1.8 to 6.0 volt operation s Hardware and software protection s Low power CMOS technology s SPI modes (0,0 &1,1) s Commercial, industrial, automotive and extended s 1,000,000 program/erase cycles s 100 year data tetention s Self-timed write cycle s 8-pin DIP/SOIC and 14-pin TSSOP s 64-byte page write buffer s Block write protection H GEN FR ALO EE LE A D F R E ETM temperature ranges – Protect first page, last page, any 1/4 or lower 1/2 of EEPROM array DESCRIPTION The CAT25C33/65 is a 32K/64K-Bit SPI Serial CMOS EEPROM internally organized as 4Kx8/8Kx8 bits. Catalyst’s advanced CMOS Technology substantially reduces device power requirements. The CAT25C33/ 65 features a 64-byte page write buffer. The device operates via the SPI bus serial interface and is enabled though a Chip Select (CS). In addition to the Chip Select, the clock input (SCK), data in (SI) and data out (SO) are required to access the device. The HOLD pin may be used to suspend any serial communication without resetting the serial sequence. The CAT25C32/64 is designed with software and hardware write protection features including Block write protection. The device is available in 8-pin DIP, 8-pin SOIC, 14-pin TSSOP and 20-pin TSSOP packages. PIN CONFIGURATION SOIC Package (S, V) CS SO WP VSS 1 2 3 4 8 7 6 5 VCC HOLD SCK SI BLOCK DIAGRAM CS SO NC NC NC WP VSS TSSOP Package (U14, Y14) 1 2 3 4 5 6 7 14 13 12 11 10 9 8 VCC HOLD NC NC NC SCK SI SO SI CS WP HOLD SCK SENSE AMPS SHIFT REGISTERS WORD ADDRESS BUFFERS COLUMN DECODERS DIP Package (P, L) CS SO WP VSS 1 2 3 4 8 7 6 5 VCC HOLD SCK SI I/O CONTROL SPI CONTROL LOGIC BLOCK PROTECT LOGIC CONTROL LOGIC XDEC E2PROM ARRAY PIN FUNCTIONS Pin Name SO SCK WP VCC VSS CS SI HOLD NC Function Serial Data Output Serial Clock Write Protect +1.8V to +6.0V Power Supply Ground Chip Select Serial Data Input Suspends Serial Input No Connect STATUS REGISTER DATA IN STORAGE HIGH VOLTAGE/ TIMING CONTROL © 2004 by Catalyst Semiconductor, Inc. Characteristics subject to change without notice Doc No. 1000, Rev. F CAT25C33/65 ABSOLUTE MAXIMUM RATINGS* Temperature Under Bias ................. –55°C to +125°C Storage Temperature ....................... –65°C to +150°C Voltage on any Pin with Respect to VSS1) ................... –2.0V to +VCC +2.0V VCC with Respect to VSS ................................ –2.0V to +7.0V Package Power Dissipation Capability (Ta = 25°C) ................................... 1.0W Lead Soldering Temperature (10 secs) ............ 300°C Output Short Circuit Current(2) ........................ 100 mA RELIABILITY CHARACTERISTICS Symbol NEND(3) TDR(3) VZAP(3) ILTH(3)(4) Parameter Endurance Data Retention ESD Susceptibility Latch-Up Min. 1,000,000 100 2000 100 Max. *COMMENT Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability. Units Cycles/Byte Years Volts mA Reference Test Method MIL-STD-883, Test Method 1033 MIL-STD-883, Test Method 1008 MIL-STD-883, Test Method 3015 JEDEC Standard 17 D.C. OPERATING CHARACTERISTICS VCC = +1.8V to +6.0V, unless otherwise specified. Limits Symbol ICC1 ICC2 ISB(5) ILI ILO VIL(3) VIH(3) VOL1 VOH1 VOL2 VOH2 Parameter Power Supply Current (Operating Write) Power Supply Current (Operating Read) Power Supply Current (Standby) Input Leakage Current Output Leakage Current Input Low Voltage Input High Voltage Output Low Voltage Output High Voltage Output Low Voltage Output High Voltage VCC-0.2 VCC - 0.8 0.2 -1 VCC x 0.7 Min. Typ. Max. 10 2 1 2 3 VCC x 0.3 VCC + 0.5 0.4 Units mA mA µA µA µA V V V V V V 4.5V≤VCC