N-Channel Enhancement Mode Field Effect Transistor FEATURES
Type CEPF640 CEBF640 CEFF640 VDSS 200V 200V 200V RDS(ON) 0.15Ω 0.15Ω 0.15Ω ID 19A 19A 19A d @VGS 10V 10V 10V
CEPF640/CEBF640 CEFF640
Super high dense cell design for extremely low RDS(ON). High power and current handing capability. Lead free product is acquired. TO-220 & TO-263 & TO-220F full-pak for through hole. G
G D S G
CEP SERIES TO-220
D
D
S CEB SERIES TO-263(DD-PAK)
G
D
S
CEF SERIES TO-220F
S
ABSOLUTE MAXIMUM RATINGS
Parameter Drain-Source Voltage Gate-Source Voltage Drain Current-Continuous Drain Current-Pulsed
a
Tc = 25 C unless otherwise noted Limit Symbol TO-220/263 VDS VGS ID IDM PD TJ,Tstg
e
TO-220F
Units V V
200
±20
19 76 125 1.0 -55 to 150 19 76 40 0.32
d d
A A W W/ C C
Maximum Power Dissipation @ TC = 25 C - Derate above 25 C Operating and Store Temperature Range
Thermal Characteristics
Parameter Thermal Resistance, Junction-to-Case Thermal Resistance, Junction-to-Ambient Symbol RθJC RθJA 1.0 62.5 Limit 3.1 65 Units C/W C/W
Details are subject to change without notice . 1
Rev 3. 2008.Oct. http://www.cetsemi.com
CEPF640/CEBF640 CEFF640
Electrical Characteristics
Parameter Off Characteristics Drain-Source Breakdown Voltage Zero Gate Voltage Drain Current Gate Body Leakage Current, Forward Gate Body Leakage Current, Reverse On Characteristics b Gate Threshold Voltage Static Drain-Source On-Resistance Dynamic Characteristics c Forward Transconductance Input Capacitance Output Capacitance Reverse Transfer Capacitance Switching Characteristics c Turn-On Delay Time Turn-On Rise Time Turn-Off Delay Time Turn-Off Fall Time Total Gate Charge Gate-Source Charge Gate-Drain Charge Drain-Source Diode Forward Current Drain-Source Diode Forward Voltage
b
Tc = 25 C unless otherwise noted Symbol BVDSS IDSS IGSSF IGSSR VGS(th) RDS(on) Test Condition VGS = 0V, ID = 250µA VDS = 160V, VGS = 0V VGS = 20V, VDS = 0V VGS = -20V, VDS = 0V VGS = VDS, ID = 250µA VGS = 10V, ID = 10A 2 0.125 Min 200 25 100 -100 4 0.150 Typ Max Units V
µA
4
nA nA V Ω
gFS Ciss Coss Crss td(on) tr td(off) tf Qg Qgs Qgd IS f VSD
VDS = 10V, ID = 9A VDS = 25V, VGS = 0V, f = 1.0 MHz
9 1955 355 55 21 5 66 11 44 8 14 19 42 10 132 22 57
S pF pF pF ns ns ns ns nC nC nC A V
VDD = 100V, ID = 11A, VGS = 10V, RGEN = 9.1Ω
VDS = 160V, ID = 19A, VGS = 10V
Drain-Source Diode Characteristics and Maximun Ratings VGS = 0V, IS = 19A g 1.5
Notes : a.Repetitive Rating : Pulse width limited by maximum junction temperature . b.Pulse Test : Pulse Width < 300µs, Duty Cycle < 2% . c.Guaranteed by design, not subject to production testing. d.Limited only by maximum temperature allowed . e .Pulse width limited by safe operating area . f .Full package IS(max) = 10.5A . g.Full package VSD test condition IS = 10.5A . i.L = 1mH, IAS = 25A, VDD = 25V, RG = 25Ω, Starting TJ = 25 C
2
CEPF640/CEBF640 CEFF640
12 10 8 6 4 2 0 0.0 VGS=10,9,8,7V 40 25 C
ID, Drain Current (A)
ID, Drain Current (A)
30 -55 C 20 TJ=125 C
VGS=6V
10
0.5
1.0
1.5
2.0
2.5
3.0
0
3
4
5
6
7
8
VDS, Drain-to-Source Voltage (V) Figure 1. Output Characteristics
3000 2500 2000 1500 1000 500 0 Coss Crss 0 5 10 15 20 25 3.0 2.5 2.0 1.5 1.0 0.5 0.0 -100
VGS, Gate-to-Source Voltage (V) Figure 2. Transfer Characteristics
ID=10A VGS=10V
Ciss
RDS(ON), Normalized RDS(ON), On-Resistance(Ohms)
C, Capacitance (pF)
-50
0
50
100
150
200
VDS, Drain-to-Source Voltage (V) Figure 3. Capacitance
1.3 1.2 1.1 1.0 0.9 0.8 0.7 0.6 -50 VDS=VGS
TJ, Junction Temperature( C) Figure 4. On-Resistance Variation with Temperature
VGS=0V
VTH, Normalized Gate-Source Threshold Voltage
IS, Source-drain current (A)
ID=250µA
10
1
10
0
-25
0
25
50
75
100
125
150
10
-1
0.4
0.6
0.8
1.0
1.2
1.4
TJ, Junction Temperature( C) Figure 5. Gate Threshold Variation with Temperature
VSD, Body Diode Forward Voltage (V) Figure 6. Body Diode Forward Voltage Variation with Source Current
3
CEPF640/CEBF640 CEFF640
VGS, Gate to Source Voltage (V)
10 8 6 4 2 0 VDS=160V ID=19A 10
2
RDS(ON)Limit
10ms 100ms 1ms
ID, Drain Current (A)
4
10
1
10ms DC
10 0 8 16 24 32 40 48 56 64
0
TC=25 C TJ=150 C Single Pulse 10
0
10
1
10
2
Qg, Total Gate Charge (nC) Figure 7. Gate Charge VDD t on V IN VGS RGEN G RL D VOUT td(on) VOUT
10%
VDS, Drain-Source Voltage (V) Figure 8. Maximum Safe Operating Area
toff tr
90%
td(off)
90% 10%
tf
INVERTED
90%
S
VIN
50% 10%
50%
PULSE WIDTH
Figure 9. Switching Test Circuit
Figure 10. Switching Waveforms
r(t),Normalized Effective Transient Thermal Impedance
10
0
D=0.5
0.2
10
-1
0.1 0.05 0.02 0.01 Single Pulse
PDM t1 t2
10
-2
1. RθJC (t)=r (t) * RθJC 2. RθJC=See Datasheet 3. TJM-TC = P* RθJC (t) 4. Duty Cycle, D=t1/t2
10
-5
10
-4
10
-3
10
-2
10
-1
10
0
10
1
Square Wave Pulse Duration (sec) Figure 11. Normalized Thermal Transient Impedance Curve
4